JP7645296B2 - ヨウ素含有金属化合物およびこれを含む薄膜蒸着用組成物 - Google Patents

ヨウ素含有金属化合物およびこれを含む薄膜蒸着用組成物 Download PDF

Info

Publication number
JP7645296B2
JP7645296B2 JP2023016388A JP2023016388A JP7645296B2 JP 7645296 B2 JP7645296 B2 JP 7645296B2 JP 2023016388 A JP2023016388 A JP 2023016388A JP 2023016388 A JP2023016388 A JP 2023016388A JP 7645296 B2 JP7645296 B2 JP 7645296B2
Authority
JP
Japan
Prior art keywords
alkyl
thin film
metal
independently
composition
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2023016388A
Other languages
English (en)
Japanese (ja)
Other versions
JP2023115908A (ja
Inventor
ヨン ヒ クォン
ユン ジェ イム
サン ヨン ジョン
テ ソク ビュン
サン チャン イ
サン イク イ
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
DNF Co Ltd
Original Assignee
DNF Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from KR1020230009308A external-priority patent/KR102822581B1/ko
Application filed by DNF Co Ltd filed Critical DNF Co Ltd
Publication of JP2023115908A publication Critical patent/JP2023115908A/ja
Priority to JP2024189001A priority Critical patent/JP2025003673A/ja
Application granted granted Critical
Publication of JP7645296B2 publication Critical patent/JP7645296B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • CCHEMISTRY; METALLURGY
    • C01INORGANIC CHEMISTRY
    • C01GCOMPOUNDS CONTAINING METALS NOT COVERED BY SUBCLASSES C01D OR C01F
    • C01G19/00Compounds of tin
    • C01G19/02Oxides
    • CCHEMISTRY; METALLURGY
    • C01INORGANIC CHEMISTRY
    • C01GCOMPOUNDS CONTAINING METALS NOT COVERED BY SUBCLASSES C01D OR C01F
    • C01G30/00Compounds of antimony
    • C01G30/004Oxides; Hydroxides; Oxyacids
    • C01G30/005Oxides
    • CCHEMISTRY; METALLURGY
    • C07ORGANIC CHEMISTRY
    • C07FACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
    • C07F5/00Compounds containing elements of Groups 3 or 13 of the Periodic Table
    • CCHEMISTRY; METALLURGY
    • C07ORGANIC CHEMISTRY
    • C07FACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
    • C07F5/00Compounds containing elements of Groups 3 or 13 of the Periodic Table
    • C07F5/003Compounds containing elements of Groups 3 or 13 of the Periodic Table without C-Metal linkages
    • CCHEMISTRY; METALLURGY
    • C07ORGANIC CHEMISTRY
    • C07FACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
    • C07F7/00Compounds containing elements of Groups 4 or 14 of the Periodic Table
    • C07F7/22Tin compounds
    • C07F7/2284Compounds with one or more Sn-N linkages
    • CCHEMISTRY; METALLURGY
    • C07ORGANIC CHEMISTRY
    • C07FACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
    • C07F9/00Compounds containing elements of Groups 5 or 15 of the Periodic Table
    • C07F9/90Antimony compounds
    • C07F9/902Compounds without antimony-carbon linkages
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/22Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
    • C23C16/30Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
    • C23C16/40Oxides
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/22Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
    • C23C16/30Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
    • C23C16/40Oxides
    • C23C16/407Oxides of zinc, germanium, cadmium, indium, tin, thallium or bismuth
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • C23C16/45523Pulsed gas flow or change of composition over time
    • C23C16/45525Atomic layer deposition [ALD]
    • C23C16/45527Atomic layer deposition [ALD] characterized by the ALD cycle, e.g. different flows or temperatures during half-reactions, unusual pulsing sequence, use of precursor mixtures or auxiliary reactants or activations
    • C23C16/45536Use of plasma, radiation or electromagnetic fields
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • C23C16/45523Pulsed gas flow or change of composition over time
    • C23C16/45525Atomic layer deposition [ALD]
    • C23C16/45553Atomic layer deposition [ALD] characterized by the use of precursors specially adapted for ALD

Landscapes

  • Chemical & Material Sciences (AREA)
  • Organic Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Inorganic Chemistry (AREA)
  • General Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Physics & Mathematics (AREA)
  • Plasma & Fusion (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical Vapour Deposition (AREA)
  • Formation Of Insulating Films (AREA)
  • Chemically Coating (AREA)
JP2023016388A 2022-02-08 2023-02-06 ヨウ素含有金属化合物およびこれを含む薄膜蒸着用組成物 Active JP7645296B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2024189001A JP2025003673A (ja) 2022-02-08 2024-10-28 ヨウ素含有金属化合物およびこれを含む薄膜蒸着用組成物

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
KR10-2022-0016153 2022-02-08
KR20220016153 2022-02-08
KR1020230009308A KR102822581B1 (ko) 2022-02-08 2023-01-25 요오드 함유 금속 화합물 및 이를 포함하는 박막 증착용 조성물
KR10-2023-0009308 2023-01-25

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2024189001A Division JP2025003673A (ja) 2022-02-08 2024-10-28 ヨウ素含有金属化合物およびこれを含む薄膜蒸着用組成物

Publications (2)

Publication Number Publication Date
JP2023115908A JP2023115908A (ja) 2023-08-21
JP7645296B2 true JP7645296B2 (ja) 2025-03-13

Family

ID=87521631

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2023016388A Active JP7645296B2 (ja) 2022-02-08 2023-02-06 ヨウ素含有金属化合物およびこれを含む薄膜蒸着用組成物
JP2024189001A Pending JP2025003673A (ja) 2022-02-08 2024-10-28 ヨウ素含有金属化合物およびこれを含む薄膜蒸着用組成物

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP2024189001A Pending JP2025003673A (ja) 2022-02-08 2024-10-28 ヨウ素含有金属化合物およびこれを含む薄膜蒸着用組成物

Country Status (4)

Country Link
US (1) US12384805B2 (https=)
JP (2) JP7645296B2 (https=)
CN (1) CN116574125B (https=)
TW (1) TWI904406B (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN121362212B (zh) * 2025-12-19 2026-04-10 苏州源展材料科技有限公司 一种异丙基三(二甲氨基)锡的制备方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20090162973A1 (en) 2007-12-21 2009-06-25 Julien Gatineau Germanium precursors for gst film deposition
US20140329357A1 (en) 2008-02-24 2014-11-06 Entegris, Inc. Tellurium compounds useful for deposition of tellurium containing materials

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1471063A1 (en) * 2003-02-28 2004-10-27 Exonhit Therapeutics S.A. Compounds and methods of treating cell proliferative diseases, retinopathies and arthritis
SG178736A1 (en) * 2007-10-31 2012-03-29 Advanced Tech Materials Amorphous ge/te deposition process
KR101726620B1 (ko) * 2008-06-24 2017-04-14 엘지디스플레이 주식회사 발광 표시 패널 및 그의 제조 방법
EP2139041B1 (en) * 2008-06-24 2015-08-19 LG Display Co., Ltd. Luminescence display panel and method for fabricating the same
WO2013056015A1 (en) * 2011-10-14 2013-04-18 Incyte Corporation Isoindolinone and pyrrolopyridinone derivatives as akt inhibitors
JPWO2017014170A1 (ja) * 2015-07-17 2018-04-26 武田薬品工業株式会社 複素環化合物
US9777373B2 (en) * 2015-12-30 2017-10-03 American Air Liquide, Inc. Amino(iodo)silane precursors for ALD/CVD silicon-containing film applications and methods of using the same
US9701695B1 (en) * 2015-12-30 2017-07-11 American Air Liquide, Inc. Synthesis methods for amino(halo)silanes
KR20180063754A (ko) * 2016-12-02 2018-06-12 삼성전자주식회사 주석 화합물, 그의 합성 방법, ald용 주석 전구체 화합물 및 함주석 물질막의 형성 방법
AR110412A1 (es) * 2016-12-22 2019-03-27 Orion Corp Inhibidores de la cyp11a1
JP7494805B2 (ja) * 2020-06-25 2024-06-04 信越化学工業株式会社 化学増幅レジスト材料及びパターン形成方法

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20090162973A1 (en) 2007-12-21 2009-06-25 Julien Gatineau Germanium precursors for gst film deposition
US20140329357A1 (en) 2008-02-24 2014-11-06 Entegris, Inc. Tellurium compounds useful for deposition of tellurium containing materials

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
C. C. HSU et al,Synthesis and Studies of Trimethylamine Adducts with Tin(II) Halides,Inorganic Chemistry,米国,ACS Publications,1977年10月01日,Vol. 16, 10,P.2529 - p.2534

Also Published As

Publication number Publication date
CN116574125B (zh) 2025-07-25
JP2025003673A (ja) 2025-01-09
US12384805B2 (en) 2025-08-12
JP2023115908A (ja) 2023-08-21
TWI904406B (zh) 2025-11-11
US20230250114A1 (en) 2023-08-10
CN116574125A (zh) 2023-08-11
TW202332680A (zh) 2023-08-16

Similar Documents

Publication Publication Date Title
JP7246929B2 (ja) 金属トリアミン化合物、その製造方法およびこれを含む金属含有薄膜蒸着用組成物
JP2025003673A (ja) ヨウ素含有金属化合物およびこれを含む薄膜蒸着用組成物
TWI850906B (zh) 用於沈積含錫薄膜之含錫先質及其相應沈積方法
KR102822581B1 (ko) 요오드 함유 금속 화합물 및 이를 포함하는 박막 증착용 조성물
JP7738107B2 (ja) アンチモニー含有薄膜蒸着用組成物およびそれを用いたアンチモニー含有薄膜の製造方法
KR102785094B1 (ko) 안티모니 함유 박막 증착용 조성물 및 이를 이용하는 안티모니 함유 박막의 제조방법
JP7822479B2 (ja) モリブデン化合物、その製造方法、およびそれを含む薄膜蒸着用組成物
KR20250000889A (ko) 안티모니 함유 박막 증착용 조성물 및 이를 이용하는 안티모니 함유 박막의 제조방법
TW202506700A (zh) 用於沉積含銻薄膜之組成物以及使用該組成物製造含銻薄膜之方法
JP7742191B2 (ja) モリブデン化合物、その製造方法、およびそれを含む薄膜の製造方法
KR102904483B1 (ko) 신규한 아미노알콕시실릴아민 화합물, 이의 제조방법 및 이를 포함하는 실리콘 함유 박막증착용 조성물
JP2024132524A (ja) アミノシルセスキオキサン
WO2023190386A1 (ja) 硫黄含有シロキサン、前記硫黄含有シロキサンを含むシリコン含有膜形成用の組成物、硫黄含有シロキサンの製造方法、シリコン含有膜、及びシリコン含有膜の製造方法
CN121866261A (zh) 具有改善的热和光稳定性的分子内稳定化单烷基金属化合物及其用途
CN117677729A (zh) 用于形成含硅膜的方法及由此形成的含硅膜

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20230206

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20240124

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20240227

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20240520

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20240730

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20241028

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20250204

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20250303

R150 Certificate of patent or registration of utility model

Ref document number: 7645296

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150