TWI841206B - Substrate processing apparatus - Google Patents

Substrate processing apparatus Download PDF

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TWI841206B
TWI841206B TW112102577A TW112102577A TWI841206B TW I841206 B TWI841206 B TW I841206B TW 112102577 A TW112102577 A TW 112102577A TW 112102577 A TW112102577 A TW 112102577A TW I841206 B TWI841206 B TW I841206B
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conveying
carrier
space
unit
substrate
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TW112102577A
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TW202320213A (en
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河原啓之
菊本憲幸
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日商斯庫林集團股份有限公司
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Abstract

The present invention provides a substrate processing apparatus. A substrate processing apparatus (1) includes a first transport section (6a) and a second transport section (6b). The second transport section (6b) is located below the first transport section (6a). The first transport section (6a) includes a first transport space (61a), first transport FFUs (11 and 12), and a first floor section (71). The first transport FFUs (11 and 12) are located above the first transport space (61a). The first floor section (71) has a plurality of first through holes. The first floor section (71) is located below the first transport space (61a). The second transport section (6b) includes a second transport space (61b), second transport FFUs (13 and 14), a second floor section (72), and an exhaust fan (73). The second transport FFUs (13 and 14) are located below the first floor section (71). The second floor section (72) has a plurality of through holes. The second floor section (72) is located below the second transport space (61b). The exhaust fan (73) is located blow the second floor section (72.)

Description

基板處理裝置Substrate processing equipment

本發明係關於一種基板處理裝置。The present invention relates to a substrate processing device.

已知一種基板處理裝置,其具備上段之處理塊與下段之處理塊(例如,參照專利文獻1)。上段之處理塊及下段之處理塊分別具有處理基板之處理單元,基板處理裝置具備將基板搬送至上段側之處理單元之搬送裝置、及將基板搬送至下段側之處理單元之搬送裝置。上段側之搬送裝置於與上段之處理塊鄰接之搬送空間內移行,下段側之搬送裝置於與下段之處理塊鄰接之搬送空間內移行。上段側之搬送空間與下段側之搬送空間由間隔壁等區隔。  [先前技術文獻]  [專利文獻]A substrate processing device is known, which has an upper processing block and a lower processing block (for example, refer to patent document 1). The upper processing block and the lower processing block respectively have processing units for processing substrates, and the substrate processing device has a conveying device for conveying substrates to the processing unit on the upper side, and a conveying device for conveying substrates to the processing unit on the lower side. The conveying device on the upper side moves in a conveying space adjacent to the upper processing block, and the conveying device on the lower side moves in a conveying space adjacent to the lower processing block. The conveying space on the upper side and the conveying space on the lower side are separated by a partition wall or the like. [Prior art document] [Patent document]

[專利文獻1]日本專利特開2016-201526號公報[Patent Document 1] Japanese Patent Publication No. 2016-201526

[發明所欲解決之問題][The problem the invention is trying to solve]

然而,搬送裝置於上段側之搬送空間內移行有時會使上段側之搬送空間內之氣流混亂。同樣地,搬送裝置於下段側之搬送空間內移行有時會使下段側之搬送空間內之氣流混亂。因此,必須抑制上段側之搬送空間內之氣流混亂。同樣地,必須抑制下段側之搬送空間內之氣流混亂。However, the movement of the conveying device in the conveying space on the upper side may sometimes cause the airflow in the conveying space on the upper side to be disturbed. Similarly, the movement of the conveying device in the conveying space on the lower side may sometimes cause the airflow in the conveying space on the lower side to be disturbed. Therefore, it is necessary to suppress the airflow disturbance in the conveying space on the upper side. Similarly, it is necessary to suppress the airflow disturbance in the conveying space on the lower side.

本發明係鑒於上述問題而完成者,其目的在於提供一種能抑制上段側之搬送空間內之氣流混亂、及下段側之搬送空間內之氣流混亂之基板處理裝置。  [解決問題之技術手段]The present invention is made in view of the above-mentioned problem, and its purpose is to provide a substrate processing device that can suppress the airflow disorder in the upper section side conveying space and the airflow disorder in the lower section side conveying space. [Technical means for solving the problem]

根據本發明之一態樣,基板處理裝置處理基板。該基板處理裝置具備處理部、第1搬送部及第2搬送部。上述處理部處理上述基板。上述第1搬送部與上述處理部鄰接。上述第2搬送部與上述處理部鄰接,設置於上述第1搬送部之下方。上述第1搬送部具有第1基板搬送部、第1搬送空間、第1搬送風扇過濾單元及第1底部。上述第1基板搬送部搬送上述基板。於上述第1搬送空間內,收容上述第1基板搬送部。上述第1搬送風扇過濾單元設置於上述第1搬送空間之上方,自上述第1搬送空間之上方朝向下方供給氣體。上述第1底部具有複數個第1通過孔。上述第1底部設置於上述第1搬送空間之下方。上述第2搬送部具有第2基板搬送部、第2搬送空間、第2搬送風扇過濾單元、第2底部及排氣風扇。上述第2基板搬送部搬送上述基板。於上述第2搬送空間內,收容上述第2基板搬送部。上述第2搬送風扇過濾單元設置於上述第1底部之下方,自上述第2搬送空間之上方朝向下方供給氣體。上述第2底部具有複數個第2通過孔。上述第2底部設置於上述第2搬送空間之下方。上述排氣風扇設置於上述第2底部之下方。上述排氣風扇將通過上述複數個第2通過孔之氣體排出。According to one aspect of the present invention, a substrate processing device processes a substrate. The substrate processing device includes a processing unit, a first conveying unit, and a second conveying unit. The processing unit processes the substrate. The first conveying unit is adjacent to the processing unit. The second conveying unit is adjacent to the processing unit and is disposed below the first conveying unit. The first conveying unit has a first substrate conveying unit, a first conveying space, a first conveying fan filter unit, and a first bottom. The first substrate conveying unit conveys the substrate. The first substrate conveying unit is accommodated in the first conveying space. The first conveying fan filter unit is disposed above the first conveying space and supplies gas from the top of the first conveying space to the bottom. The first bottom has a plurality of first through holes. The first bottom is disposed below the first conveying space. The second conveying part comprises a second substrate conveying part, a second conveying space, a second conveying fan filter unit, a second bottom and an exhaust fan. The second substrate conveying part conveys the substrate. The second substrate conveying part is accommodated in the second conveying space. The second conveying fan filter unit is disposed below the first bottom and supplies gas from the top of the second conveying space to the bottom. The second bottom comprises a plurality of second through holes. The second bottom is disposed below the second conveying space. The exhaust fan is disposed below the second bottom. The exhaust fan exhausts the gas passing through the plurality of second through holes.

某實施方式中,上述第1搬送部進而具有與上述處理部鄰接之第1側壁部。上述第2搬送部進而具有與上述處理部鄰接之第2側壁部。上述第2側壁部設置於上述第1側壁部之下方。上述第1側壁部與上述第2側壁部中之至少一者進而具有間隙形成部。上述間隙形成部於上述第1側壁部與上述第2側壁部之間形成間隙。In one embodiment, the first conveying section further comprises a first side wall portion adjacent to the processing section. The second conveying section further comprises a second side wall portion adjacent to the processing section. The second side wall portion is disposed below the first side wall portion. At least one of the first side wall portion and the second side wall portion further comprises a gap forming portion. The gap forming portion forms a gap between the first side wall portion and the second side wall portion.

某實施方式中,上述第1搬送部與上述第2搬送部中之至少一者進而具有開口率調整構件。上述開口率調整構件調整上述間隙之開口率。In one embodiment, at least one of the first conveying unit and the second conveying unit further comprises an opening ratio adjusting member. The opening ratio adjusting member adjusts the opening ratio of the gap.

某實施方式中,上述第1搬送部具有複數個上述第1搬送風扇過濾單元。In one embodiment, the first conveying section includes a plurality of first conveying fan filter units.

某實施方式中,上述第1基板搬送部包含在上述第1搬送空間內移動之第1搬送機器人。上述複數個第1搬送風扇過濾單元以覆蓋上述第1搬送機器人之移動範圍之方式配置。In one embodiment, the first substrate transport unit includes a first transport robot that moves in the first transport space. The plurality of first transport fan filter units are arranged to cover a moving range of the first transport robot.

某實施方式中,上述第2搬送部具有複數個上述第2搬送風扇過濾單元。In one embodiment, the second conveying unit includes a plurality of second conveying fan filter units.

某實施方式中,上述第2基板搬送部包含在上述第2搬送空間內移動之第2搬送機器人。上述複數個第2搬送風扇過濾單元以覆蓋上述第2搬送機器人之移動範圍之方式配置。In one embodiment, the second substrate transport unit includes a second transport robot that moves in the second transport space. The plurality of second transport fan filter units are arranged to cover the moving range of the second transport robot.

某實施方式中,上述第1搬送部進而具有設置於上述第1底部之第1整流部。上述第1整流部對通過上述複數個第1通過孔之氣體進行整流。In one embodiment, the first conveying unit further includes a first rectifying unit provided at the first bottom portion. The first rectifying unit rectify the gas passing through the plurality of first passage holes.

某實施方式中,上述第2搬送風扇過濾單元具有風扇、箱狀構件及第2整流部。上述箱狀構件支持上述風扇。上述第2整流部設置於上述箱狀構件。上述第2整流部對通過上述複數個第1通過孔之氣體進行整流。In one embodiment, the second transport fan filter unit comprises a fan, a box-shaped member, and a second rectifying portion. The box-shaped member supports the fan. The second rectifying portion is provided on the box-shaped member. The second rectifying portion rectify the gas passing through the plurality of first through holes.

某實施方式中,上述第2搬送部進而具有頂部與第3整流部。於上述頂部設置上述第2搬送風扇過濾單元。上述第3整流部設置於上述頂部。上述第3整流部對通過上述複數個第1通過孔之氣體進行整流。In one embodiment, the second conveying part further comprises a top and a third rectifying part. The second conveying fan filter unit is disposed at the top. The third rectifying part is disposed at the top. The third rectifying part rectify the gas passing through the plurality of first through holes.

某實施方式中,上述基板處理裝置進而具備傳載部、第1傳送部及第2傳送部。上述傳載部進行上述基板之搬入及搬出。上述第1傳送部設置於上述傳載部與上述第1搬送部之間。於上述第1傳送部,暫時載置上述基板。上述第2傳送部設置於上述傳載部與上述第2搬送部之間。於上述第2傳送部,暫時載置上述基板。上述傳載部具有傳載搬送部、傳載空間及傳載風扇過濾單元部。上述傳載搬送部進行上述基板之搬入及搬出。於上述傳載空間內,收容上述傳載搬送部。上述傳載風扇過濾單元部設置於上述傳載空間之上方,自上述傳載空間之上方朝向下方供給氣體。In a certain embodiment, the substrate processing device further includes a carrier part, a first conveying part and a second conveying part. The carrier part carries out the loading and unloading of the substrate. The first conveying part is disposed between the carrier part and the first conveying part. The substrate is temporarily placed on the first conveying part. The second conveying part is disposed between the carrier part and the second conveying part. The substrate is temporarily placed on the second conveying part. The carrier part includes a carrier and conveying part, a carrier space and a carrier fan filter unit. The carrier and conveying part carries out the loading and unloading of the substrate. The carrier and conveying part is accommodated in the carrier space. The carrier fan filter unit is disposed above the carrier space to supply gas from the top of the carrier space to the bottom.

某實施方式中,上述傳載風扇過濾單元部具有第1傳載風扇過濾單元與第2傳載風扇過濾單元。上述第1傳載風扇過濾單元配置於與上述第1傳送部及上述第2傳送部側相反之側。上述第2傳載風扇過濾單元配置於上述第1傳送部及上述第2傳送部側。In one embodiment, the carrier fan filter unit has a first carrier fan filter unit and a second carrier fan filter unit. The first carrier fan filter unit is disposed on the side opposite to the first transmission part and the second transmission part. The second carrier fan filter unit is disposed on the side of the first transmission part and the second transmission part.

某實施方式中,上述傳載部進而具有第1開口與第2開口。上述第1開口與上述第1傳送部連通。上述第2開口與上述第2傳送部連通。上述第2開口設置於上述第1開口之下方。上述傳載風扇過濾單元部進而具有第3傳載風扇過濾單元。上述第3傳載風扇過濾單元於自正面觀察上述第1開口及上述第2開口時,配置於上述第1傳載風扇過濾單元及上述第2傳載風扇過濾單元之一側方。In a certain embodiment, the above-mentioned carrier part further has a first opening and a second opening. The above-mentioned first opening is connected to the above-mentioned first transmission part. The above-mentioned second opening is connected to the above-mentioned second transmission part. The above-mentioned second opening is arranged below the above-mentioned first opening. The above-mentioned carrier fan filter unit part further has a third carrier fan filter unit. The above-mentioned third carrier fan filter unit is arranged on one side of the above-mentioned first carrier fan filter unit and the above-mentioned second carrier fan filter unit when observing the above-mentioned first opening and the above-mentioned second opening from the front.

某實施方式中,上述傳載空間包含第1傳載空間與第2傳載空間。上述第2傳載空間於自正面觀察上述第1開口及上述第2開口時,位於上述第1傳載空間之一側方。上述第1傳載空間之最上部位於較上述第2傳載空間之最上部更靠上方。上述第1傳載風扇過濾單元及上述第2傳載風扇過濾單元自上述第1傳載空間之上方朝向下方供給氣體。上述第3傳載風扇過濾單元自上述第2傳載空間之上方朝向下方供給氣體。In a certain embodiment, the transfer space includes a first transfer space and a second transfer space. The second transfer space is located on one side of the first transfer space when the first opening and the second opening are observed from the front. The uppermost portion of the first transfer space is located higher than the uppermost portion of the second transfer space. The first transfer fan filter unit and the second transfer fan filter unit supply gas from the upper side of the first transfer space to the lower side. The third transfer fan filter unit supplies gas from the upper side of the second transfer space to the lower side.

某實施方式中,上述傳載搬送部包含傳載搬送機器人與導軌。上述傳載搬送機器人搬送上述基板。上述導軌於上下方向上引導上述傳載搬送機器人。上述第3傳載風扇過濾單元於自正面觀察上述第1開口及上述第2開口時,配置於與上述導軌側相反之側。In one embodiment, the carrier and transport section includes a carrier and transport robot and a guide rail. The carrier and transport robot transports the substrate. The guide rail guides the carrier and transport robot in a vertical direction. The third carrier fan filter unit is disposed on a side opposite to the guide rail side when the first opening and the second opening are viewed from the front.

某實施方式中,上述排氣風扇產生自上述傳載空間經由上述第2傳送部流向上述第2搬送空間之氣流。  [發明之效果]In one embodiment, the exhaust fan generates an airflow from the transfer space through the second transfer section to the second transfer space. [Effect of the Invention]

根據本發明之基板處理裝置,能抑制上段側之搬送空間內之氣流混亂、及下段側之搬送空間內之氣流混亂。According to the substrate processing apparatus of the present invention, it is possible to suppress airflow disturbance in the transfer space on the upper stage side and airflow disturbance in the transfer space on the lower stage side.

以下,參照圖式(圖1~圖13),對本發明之基板處理裝置之實施方式進行說明。但是,本發明並不限定於以下實施方式。再者,針對說明重複之部位,有時會適當省略說明。又,圖中,對相同或相當之部分標註相同之參考符號,不重複進行說明。Hereinafter, the implementation of the substrate processing device of the present invention will be described with reference to the drawings (FIG. 1 to FIG. 13). However, the present invention is not limited to the following implementation. Furthermore, for the parts that are described repeatedly, the description will sometimes be appropriately omitted. In addition, in the drawings, the same reference symbols are marked for the same or equivalent parts, and the description is not repeated.

本說明書中,為了便於理解,有時記載相互正交之X方向、Y方向及Z方向。典型而言,X方向及Y方向與水平方向平行,Z方向與鉛直方向平行。但是,並不意圖藉由該等方向之定義,來限定本發明之基板處理裝置於使用時之朝向。In this specification, for ease of understanding, mutually orthogonal X, Y, and Z directions are sometimes described. Typically, the X and Y directions are parallel to the horizontal direction, and the Z direction is parallel to the vertical direction. However, the definition of these directions is not intended to limit the orientation of the substrate processing device of the present invention when in use.

本實施方式中之「基板」能應用半導體晶圓、光罩用玻璃基板、液晶顯示用玻璃基板、電漿顯示用玻璃基板、FED(Field Emission Display,場發射顯示器)用基板、光碟用基板、磁碟用基板及磁光碟用基板等各種基板。以下,主要採用圓盤狀半導體晶圓之處理中所使用之基板處理裝置為例對本實施方式進行說明,但亦能同樣地應用於以上所例示之各種基板之處理中。又,基板之形狀亦能應用各種形狀。The "substrate" in this embodiment can be applied to various substrates such as semiconductor wafers, glass substrates for masks, glass substrates for liquid crystal displays, glass substrates for plasma displays, substrates for FED (Field Emission Display), substrates for optical disks, substrates for magnetic disks, and substrates for magneto-optical disks. In the following, this embodiment is mainly described using a substrate processing device used in processing a disk-shaped semiconductor wafer as an example, but it can also be similarly applied to the processing of various substrates exemplified above. In addition, the shape of the substrate can also be applied to various shapes.

[實施方式1]  以下,參照圖1~圖11,對本發明之實施方式1進行說明。首先,參照圖1,對本實施方式之基板處理裝置1進行說明。圖1係表示本實施方式之基板處理裝置1之整體構成之立體圖。基板處理裝置1處理基板W。如圖1所示,基板處理裝置1具備傳載塊3、傳送塊4、處理塊5、搬送塊6及多功能塊7。[Implementation method 1] Below, with reference to Figures 1 to 11, implementation method 1 of the present invention is described. First, with reference to Figure 1, a substrate processing device 1 of the present implementation method is described. Figure 1 is a three-dimensional diagram showing the overall structure of the substrate processing device 1 of the present implementation method. The substrate processing device 1 processes a substrate W. As shown in Figure 1, the substrate processing device 1 has a carrier block 3, a transfer block 4, a processing block 5, a transport block 6 and a multi-function block 7.

傳載塊3具備載具載置部31。本實施方式中,傳載塊3具備4個載具載置部31。於載具載置部31,載置載具C。載具C將複數片(例如,25片)基板W以積層之方式收納。載具C例如為FOUP(Front Opening Unified Pod,前開式晶圓傳送盒)。以下,將載置於載具載置部31之載具C記載為「載具C」。The carrier block 3 has a carrier placement portion 31. In the present embodiment, the carrier block 3 has four carrier placement portions 31. Carriers C are placed on the carrier placement portions 31. Carriers C store a plurality of substrates W (for example, 25) in a stacked manner. Carrier C is, for example, a FOUP (Front Opening Unified Pod). Hereinafter, carriers C placed on the carrier placement portions 31 are referred to as "carriers C".

傳載塊3將收納於載具C之處理前之基板W搬入至傳載塊3之內部空間。又,傳載塊3將處理後之基板W自傳載塊3之內部空間搬出至外部。具體而言,傳載塊3將處理後之基板W收納於載具C。傳載塊3係傳載部之一例。The carrier block 3 carries the substrate W before processing stored in the carrier C into the inner space of the carrier block 3. Also, the carrier block 3 carries the processed substrate W out of the inner space of the carrier block 3. Specifically, the carrier block 3 stores the processed substrate W in the carrier C. The carrier block 3 is an example of a carrier unit.

傳送塊4設置於傳載塊3與搬送塊6之間。傳載塊3、傳送塊4及搬送塊6沿X方向配置。具體而言,傳送塊4配置於傳載塊3之-X側,搬送塊6配置於傳送塊4之-X側。The conveying block 4 is disposed between the carrier block 3 and the conveying block 6. The carrier block 3, the conveying block 4 and the conveying block 6 are arranged along the X direction. Specifically, the conveying block 4 is arranged on the -X side of the carrier block 3, and the conveying block 6 is arranged on the -X side of the conveying block 4.

於傳送塊4中,暫時載置處理前之基板W及處理後之基板W。傳載塊3將處理前之基板W自載具C搬送至傳送塊4。又,傳載塊3將處理後之基板W自傳送塊4搬送至載具C。再者,傳送塊4亦可具備使基板W之正面及背面翻轉之機構。The substrate W before processing and the substrate W after processing are temporarily placed in the conveying block 4. The conveying block 3 transfers the substrate W before processing from the carrier C to the conveying block 4. Also, the conveying block 3 transfers the substrate W after processing from the conveying block 4 to the carrier C. Furthermore, the conveying block 4 may also have a mechanism for turning the front and back sides of the substrate W.

搬送塊6與處理塊5鄰接。搬送塊6將處理前之基板W自傳送塊4搬送至處理塊5。又,搬送塊6將處理後之基板W自處理塊5搬送至傳送塊4。The transfer block 6 is adjacent to the processing block 5. The transfer block 6 transfers the substrate W before processing from the transfer block 4 to the processing block 5. Also, the transfer block 6 transfers the substrate W after processing from the processing block 5 to the transfer block 4.

處理塊5處理基板W。處理塊5例如將基板W洗淨。處理塊5係處理部之一例。多功能塊7將處理液供給至處理塊5。處理液包含藥液。處理液亦可進而包含DIW(deionized water,去離子水)。多功能塊7亦可進一步將例如氮氣或空氣等氣體供給至處理塊5。The processing block 5 processes the substrate W. The processing block 5 cleans the substrate W, for example. The processing block 5 is an example of a processing unit. The multifunctional block 7 supplies a processing liquid to the processing block 5. The processing liquid includes a chemical solution. The processing liquid may further include DIW (deionized water). The multifunctional block 7 may further supply a gas such as nitrogen or air to the processing block 5.

本實施方式之基板處理裝置1具有2個處理塊5。2個處理塊5與搬送塊6鄰接。詳細而言,2個處理塊5中之一個相對於搬送塊6配置於-Y側,2個處理塊5中之另一個相對於搬送塊6配置於+Y側。以下,將相對於搬送塊6配置於-Y側之處理塊5記載為「-Y側之處理塊5」,將相對於搬送塊6配置於+Y側之處理塊5記載為「+Y側之處理塊5」。The substrate processing apparatus 1 of the present embodiment has two processing blocks 5. The two processing blocks 5 are adjacent to the conveying block 6. Specifically, one of the two processing blocks 5 is arranged on the -Y side relative to the conveying block 6, and the other of the two processing blocks 5 is arranged on the +Y side relative to the conveying block 6. Hereinafter, the processing block 5 arranged on the -Y side relative to the conveying block 6 is recorded as "the processing block 5 on the -Y side", and the processing block 5 arranged on the +Y side relative to the conveying block 6 is recorded as "the processing block 5 on the +Y side".

繼而,參照圖2,進一步對本實施方式之基板處理裝置1進行說明。圖2係本實施方式之基板處理裝置1之分解立體圖。Next, the substrate processing apparatus 1 of the present embodiment will be further described with reference to Fig. 2. Fig. 2 is an exploded perspective view of the substrate processing apparatus 1 of the present embodiment.

如圖2所示,2個處理塊5分別包含塔單元TW,該塔單元TW包含於上下方向(Z方向)上積層之複數個處理單元2。本實施方式中,-Y側之處理塊5包含2個塔單元TW1、TW3,+Y側之處理塊5包含2個塔單元TW2、TW4。2個塔單元TW1、TW3沿X方向配置。具體而言,塔單元TW3配置於塔單元TW1之-X側。2個塔單元TW2、TW4亦同樣,沿X方向配置。具體而言,塔單元TW4配置於塔單元TW2之-X側。As shown in FIG2 , the two processing blocks 5 each include a tower unit TW, and the tower unit TW includes a plurality of processing units 2 stacked in the up-down direction (Z direction). In this embodiment, the processing block 5 on the -Y side includes two tower units TW1 and TW3, and the processing block 5 on the +Y side includes two tower units TW2 and TW4. The two tower units TW1 and TW3 are arranged along the X direction. Specifically, the tower unit TW3 is arranged on the -X side of the tower unit TW1. The two tower units TW2 and TW4 are also arranged along the X direction. Specifically, the tower unit TW4 is arranged on the -X side of the tower unit TW2.

本實施方式中,各塔單元TW1~TW4具有4個處理單元2。以下,有時將4個塔單元TW1~TW4分別記載為「第1塔單元TW1~第4塔單元TW4」。In the present embodiment, each of the tower units TW1 to TW4 has four processing units 2. Hereinafter, the four tower units TW1 to TW4 may be respectively described as "first tower unit TW1 to fourth tower unit TW4".

繼而,參照圖3,進一步對本實施方式之基板處理裝置1進行說明。圖3係表示本實施方式之基板處理裝置1之內部構成之側視圖。詳細而言,圖3表示自+Y側觀察時之基板處理裝置1之內部構成。首先,參照圖3對傳載塊3及傳送塊4進行說明。Next, referring to FIG3 , the substrate processing apparatus 1 of the present embodiment will be further described. FIG3 is a side view showing the internal structure of the substrate processing apparatus 1 of the present embodiment. Specifically, FIG3 shows the internal structure of the substrate processing apparatus 1 when viewed from the +Y side. First, referring to FIG3 , the carrier block 3 and the transfer block 4 will be described.

如圖3所示,傳載塊3具備傳載空間3a與傳載搬送部32。傳送塊4具備上段傳送部41與下段傳送部42。上段傳送部41設置於下段傳送部42之上方(+Z側)。As shown in Fig. 3, the carrier block 3 includes a carrier space 3a and a carrier conveying portion 32. The conveying block 4 includes an upper conveying portion 41 and a lower conveying portion 42. The upper conveying portion 41 is disposed above the lower conveying portion 42 (on the +Z side).

於上段傳送部41,暫時載置處理前之基板W與處理後之基板W。同樣地,於下段傳送部42,暫時載置處理前之基板W與處理後之基板W。再者,上段傳送部41亦可具備使基板W之正面及背面翻轉之機構。同樣地,下段傳送部42亦可具備使基板W之正面及背面翻轉之機構。上段傳送部41係第1傳送部之一例,下段傳送部42係第2傳送部之一例。The upper conveyor 41 temporarily places substrates W before and after processing. Similarly, the lower conveyor 42 temporarily places substrates W before and after processing. Furthermore, the upper conveyor 41 may also have a mechanism for turning over the front and back sides of the substrate W. Similarly, the lower conveyor 42 may also have a mechanism for turning over the front and back sides of the substrate W. The upper conveyor 41 is an example of a first conveyor, and the lower conveyor 42 is an example of a second conveyor.

傳載搬送部32收容於傳載空間3a。傳載搬送部32將收納於載具C之處理前之基板W搬入傳載空間3a。又,傳載搬送部32將處理後之基板W自傳載空間3a搬出至外部。具體而言,傳載搬送部32將處理後之基板W收納於載具C。The carrier transport unit 32 is stored in the carrier space 3a. The carrier transport unit 32 carries the substrate W stored in the carrier C before processing into the carrier space 3a. In addition, the carrier transport unit 32 carries the processed substrate W out of the carrier space 3a. Specifically, the carrier transport unit 32 stores the processed substrate W in the carrier C.

又,傳載搬送部32將處理前之基板W搬送至上段傳送部41及下段傳送部42。傳載搬送部32將處理後之基板W自上段傳送部41及下段傳送部42搬送至載具C。Furthermore, the carrier transport unit 32 transports the substrate W before processing to the upper transport unit 41 and the lower transport unit 42. The carrier transport unit 32 transports the substrate W after processing from the upper transport unit 41 and the lower transport unit 42 to the carrier C.

更具體而言,傳載搬送部32具有搬送基板W之傳載搬送機器人33、及導軌34。導軌34將傳載搬送機器人33於上下方向(Z方向)上引導。More specifically, the carrier transport section 32 includes a carrier transport robot 33 that transports the substrate W, and a guide rail 34. The guide rail 34 guides the carrier transport robot 33 in the up-down direction (Z direction).

傳載搬送機器人33沿導軌34升降。詳細而言,傳載搬送機器人33於能進出載具C之位置、能進出上段傳送部41之位置、及能進出下段傳送部42之位置之間升降。The carrier transport robot 33 moves up and down along the guide rail 34. Specifically, the carrier transport robot 33 moves up and down between a position where it can enter and exit the carrier C, a position where it can enter and exit the upper conveyor 41, and a position where it can enter and exit the lower conveyor 42.

傳載搬送機器人33移動至能進出載具C之位置,自載具C取出處理前之基板W。又,傳載搬送機器人33移動至能進出載具C之位置,將處理後之基板W收納於載具C。The carrier transfer robot 33 moves to a position where it can enter and exit the carrier C, and takes out the substrate W before being processed from the carrier C. Also, the carrier transfer robot 33 moves to a position where it can enter and exit the carrier C, and stores the substrate W after being processed in the carrier C.

傳載搬送機器人33移動至能進出上段傳送部41之位置,將處理前之基板W載置於上段傳送部41。又,傳載搬送機器人33移動至能進出上段傳送部41之位置,將處理後之基板W自上段傳送部41取出。The carrier transport robot 33 moves to a position where it can enter and exit the upper conveyor 41, and places the substrate W before processing on the upper conveyor 41. Also, the carrier transport robot 33 moves to a position where it can enter and exit the upper conveyor 41, and takes the substrate W after processing out of the upper conveyor 41.

傳載搬送機器人33移動至能進出下段傳送部42之位置,將處理前之基板W載置於下段傳送部42。又,傳載搬送機器人33移動至能進出下段傳送部42之位置,將處理後之基板W自下段傳送部42取出。The carrier transport robot 33 moves to a position where it can enter and exit the lower conveyor 42, and places the substrate W before processing on the lower conveyor 42. Also, the carrier transport robot 33 moves to a position where it can enter and exit the lower conveyor 42, and takes the substrate W after processing out of the lower conveyor 42.

繼而,參照圖3,進一步對傳送塊4及搬送塊6進行說明。如圖3所示,搬送塊6包含上段搬送部6a與下段搬送部6b。下段搬送部6b設置於上段搬送部6a之下方(-Z側)。上段傳送部41設置於傳載塊3與上段搬送部6a之間。下段傳送部42設置於傳載塊3與下段搬送部6b之間。Next, referring to FIG3 , the conveying block 4 and the conveying block 6 are further described. As shown in FIG3 , the conveying block 6 includes an upper conveying section 6a and a lower conveying section 6b. The lower conveying section 6b is disposed below the upper conveying section 6a (-Z side). The upper conveying section 41 is disposed between the conveying block 3 and the upper conveying section 6a. The lower conveying section 42 is disposed between the conveying block 3 and the lower conveying section 6b.

如參照圖1所說明,搬送塊6與處理塊5鄰接。因此,上段搬送部6a及下段搬送部6b與處理塊5鄰接。上段搬送部6a係第1搬送部之一例,下段搬送部6b係第2搬送部之一例。As described with reference to Fig. 1, the conveying block 6 is adjacent to the processing block 5. Therefore, the upper conveying section 6a and the lower conveying section 6b are adjacent to the processing block 5. The upper conveying section 6a is an example of a first conveying section, and the lower conveying section 6b is an example of a second conveying section.

詳細而言,上段搬送部6a與第1塔單元TW1之上兩個處理單元2、及第3塔單元TW3之上兩個處理單元2鄰接。上段搬送部6a亦與第2塔單元TW2之上兩個處理單元2(參照圖2)、及第4塔單元TW4之上兩個處理單元2(參照圖2)鄰接。以下,有時將第1塔單元TW1~第4塔單元TW4所包含之上兩個處理單元2記載為「上段之處理單元2」。Specifically, the upper conveying section 6a is adjacent to the two processing units 2 above the first tower unit TW1 and the two processing units 2 above the third tower unit TW3. The upper conveying section 6a is also adjacent to the two processing units 2 above the second tower unit TW2 (see FIG. 2 ) and the two processing units 2 above the fourth tower unit TW4 (see FIG. 2 ). Hereinafter, the two processing units 2 included in the first tower unit TW1 to the fourth tower unit TW4 are sometimes described as "the processing units 2 of the upper stage".

下段搬送部6b與第1塔單元TW1之下兩個處理單元2、及第3塔單元TW3之下兩個處理單元2鄰接。下段搬送部6b亦與第2塔單元TW2之下兩個處理單元2(參照圖2)、及第4塔單元TW4之下兩個處理單元2(參照圖2)鄰接。以下,有時將第1塔單元TW1~第4塔單元TW4所包含之下兩個處理單元2記載為「下段之處理單元2」。The lower conveying section 6b is adjacent to the two processing units 2 below the first tower unit TW1 and the two processing units 2 below the third tower unit TW3. The lower conveying section 6b is also adjacent to the two processing units 2 below the second tower unit TW2 (see FIG. 2 ) and the two processing units 2 below the fourth tower unit TW4 (see FIG. 2 ). Hereinafter, the two processing units 2 below included in the first tower unit TW1 to the fourth tower unit TW4 are sometimes described as "lower stage processing units 2".

上段搬送部6a具有搬送基板W之上段基板搬送部50a、及上段搬送空間61a。上段基板搬送部50a收容於上段搬送空間61a。上段基板搬送部50a於上段之處理單元2各者與上段傳送部41之間搬送基板W。上段基板搬送部50a係第1基板搬送部之一例,上段搬送空間61a係第1搬送空間之一例。The upper transfer unit 6a includes an upper substrate transfer unit 50a for transferring the substrate W, and an upper transfer space 61a. The upper substrate transfer unit 50a is accommodated in the upper transfer space 61a. The upper substrate transfer unit 50 a transfers the substrate W between each of the upper processing units 2 and the upper transfer unit 41 . The upper substrate transfer unit 50a is an example of a first substrate transfer unit, and the upper transfer space 61a is an example of a first transfer space.

上段基板搬送部50a具有上段搬送機器人51a、固定框52a及可動框53a。上段搬送機器人51a於上段搬送空間61a內移動。詳細而言,上段搬送機器人51a以能進出所有上段之處理單元2與上段傳送部41之方式,由固定框52a及可動框53a支持而移動自如。具體而言,固定框52a將可動框53a,使其於X方向上移動自如,可動框53a支持上段搬送機器人51a,使其於上下方向(Z方向)上移動自如。因此,上段搬送機器人51a於X方向及Z方向(上下方向)上移動。上段搬送機器人51a係第1搬送機器人之一例。The upper stage substrate transporting part 50a has an upper stage transporting robot 51a, a fixed frame 52a and a movable frame 53a. The upper stage transporting robot 51a moves in the upper stage transporting space 61a. In detail, the upper stage transporting robot 51a is supported by the fixed frame 52a and the movable frame 53a in such a manner that it can enter and exit all the upper stage processing units 2 and the upper stage conveying part 41 and can move freely. Specifically, the fixed frame 52a supports the movable frame 53a so that it can move freely in the X direction, and the movable frame 53a supports the upper stage transporting robot 51a so that it can move freely in the up and down direction (Z direction). Therefore, the upper stage transporting robot 51a moves in the X direction and the Z direction (up and down direction). The upper stage transporting robot 51a is an example of the first transporting robot.

下段搬送部6b具有搬送基板W之下段基板搬送部50b、及下段搬送空間61b。下段基板搬送部50b收容於下段搬送空間61b。下段基板搬送部50b於下段之處理單元2各者與下段傳送部42之間搬送基板W。下段基板搬送部50b係第2基板搬送部之一例,下段搬送空間61b係第2搬送空間之一例。The lower stage conveying section 6b includes a lower stage substrate conveying section 50b for conveying substrates W, and a lower stage conveying space 61b. The lower stage substrate conveying section 50b is accommodated in the lower stage conveying space 61b. The lower stage substrate conveying section 50b conveys substrates W between each of the lower stage processing units 2 and the lower stage conveying section 42. The lower stage substrate conveying section 50b is an example of a second substrate conveying section, and the lower stage conveying space 61b is an example of a second conveying space.

下段基板搬送部50b具有下段搬送機器人51b、固定框52b及可動框53b。下段搬送機器人51b於下段搬送空間61b內移動。詳細而言,下段搬送機器人51b以能進出所有下段之處理單元2、與下段傳送部42之方式,由固定框52b及可動框53b支持而移動自如。具體而言,固定框52b支持可動框53b,使其於X方向上移動自如,可動框53b支持下段搬送機器人51b,使其於上下方向(Z方向)上移動自如。因此,下段搬送機器人51b於X方向及Z方向(上下方向)上移動。下段搬送機器人51b係第2搬送機器人之一例。The lower stage substrate transporting part 50b has a lower stage transporting robot 51b, a fixed frame 52b and a movable frame 53b. The lower stage transporting robot 51b moves in the lower stage transporting space 61b. In detail, the lower stage transporting robot 51b is supported by the fixed frame 52b and the movable frame 53b in such a manner that it can enter and exit all the lower stage processing units 2 and the lower stage conveying part 42 and can move freely. Specifically, the fixed frame 52b supports the movable frame 53b so that it can move freely in the X direction, and the movable frame 53b supports the lower stage transporting robot 51b so that it can move freely in the up and down direction (Z direction). Therefore, the lower stage transporting robot 51b moves in the X direction and the Z direction (up and down direction). The lower stage transporting robot 51b is an example of a second transporting robot.

繼而,參照圖3,對上段搬送機器人51a及下段搬送機器人51b進行說明。上段搬送機器人51a具有基台部54、回轉基座55及臂56。基台部54支持於可動框53a。回轉基座55相對於基台部54於水平面內回轉自如地支持於基台部54。臂56相對於回轉基座55於水平面內進退自如地支持於回轉基座55。下段搬送機器人51b亦與上段搬送機器人51a同樣地,具有基台部54、回轉基座55及臂56。下段搬送機器人51b之構成與上段搬送機器人51a同樣,因此省略其說明。Next, referring to FIG. 3 , the upper transport robot 51a and the lower transport robot 51b are described. The upper transport robot 51a has a base portion 54, a rotating base 55, and an arm 56. The base portion 54 is supported by the movable frame 53a. The rotating base 55 is supported by the base portion 54 so as to be able to rotate freely in a horizontal plane relative to the base portion 54. The arm 56 is supported by the rotating base 55 so as to be able to move forward and backward freely in a horizontal plane relative to the rotating base 55. The lower transport robot 51b also has a base portion 54, a rotating base 55, and an arm 56, similarly to the upper transport robot 51a. The structure of the lower transport robot 51b is the same as that of the upper transport robot 51a, so its description is omitted.

繼而,參照圖4,進一步對本實施方式之基板處理裝置1進行說明。圖4係表示本實施方式之基板處理裝置1之內部構成之俯視圖。詳細而言,圖4表示自+Z側觀察時之基板處理裝置1之內部構成。首先,參照圖4對傳載搬送部32進行說明。Next, referring to FIG. 4 , the substrate processing apparatus 1 of this embodiment will be further described. FIG. 4 is a top view showing the internal structure of the substrate processing apparatus 1 of this embodiment. Specifically, FIG. 4 shows the internal structure of the substrate processing apparatus 1 when viewed from the +Z side. First, referring to FIG. 4 , the carrier transport unit 32 will be described.

如圖4所示,導軌34配置於傳送塊4之附近。詳細而言,導軌34配置於Y方向上之傳送塊4之中心之側方。本實施方式中,導軌34相對於Y方向上之傳送塊4之中心配置於+Y側。更具體而言,導軌34於自載具載置部31側(+X側)觀察之情形時,配置於傳送塊4中不與基板W之載置位置重疊之位置。As shown in FIG4 , the guide rail 34 is arranged near the conveying block 4. Specifically, the guide rail 34 is arranged on the side of the center of the conveying block 4 in the Y direction. In the present embodiment, the guide rail 34 is arranged on the +Y side relative to the center of the conveying block 4 in the Y direction. More specifically, the guide rail 34 is arranged at a position in the conveying block 4 that does not overlap with the placement position of the substrate W when viewed from the carrier placement portion 31 side (+X side).

傳載搬送機器人33具有基台部35、多關節臂36及手37。基台部35由導軌34支持而於上下方向(Z方向)上升降自如。基台部35沿導軌34於上下方向(Z方向)上升降。多關節臂36支持於基台部35。手37支持於多關節臂36之前端。多關節臂36使手37於X方向及Y方向上移動。The carrier transport robot 33 has a base 35, a multi-joint arm 36 and a hand 37. The base 35 is supported by a guide rail 34 and can be raised and lowered in the vertical direction (Z direction). The base 35 is raised and lowered in the vertical direction (Z direction) along the guide rail 34. The multi-joint arm 36 is supported by the base 35. The hand 37 is supported by the front end of the multi-joint arm 36. The multi-joint arm 36 allows the hand 37 to move in the X direction and the Y direction.

繼而,參照圖4對處理單元2進行說明。如圖4所示,處理單元2例如具備吸盤(suction chuck)21、擋板23及處理噴嘴25。吸盤21藉由抽真空而吸附基板W。吸盤21藉由未圖示之電動馬達而旋轉驅動。藉此,基板W於水平面內旋轉。處理噴嘴25藉由對基板W供給處理液,而對基板W進行處理。擋板23以包圍吸盤21之方式,配置於吸盤21之周圍。擋板23防止自處理噴嘴25供給至基板W之處理液向周圍飛散。Next, the processing unit 2 is described with reference to FIG4 . As shown in FIG4 , the processing unit 2 includes, for example, a suction chuck 21, a baffle 23, and a processing nozzle 25. The suction chuck 21 adsorbs the substrate W by vacuuming. The suction chuck 21 is rotationally driven by an electric motor (not shown). Thereby, the substrate W rotates in a horizontal plane. The processing nozzle 25 processes the substrate W by supplying a processing liquid to the substrate W. The baffle 23 is arranged around the suction chuck 21 in a manner of surrounding the suction chuck 21. The baffle 23 prevents the processing liquid supplied to the substrate W from the processing nozzle 25 from scattering around.

繼而,參照圖5,進一步對本實施方式之基板處理裝置1進行說明。圖5係表示基板處理裝置1之搬送塊6之內部構成之側視圖。詳細而言,圖5表示自+Y側觀察時之搬送塊6之內部構成。再者,圖5中,為了便於理解,未圖示上段基板搬送部50a及下段基板搬送部50b。Next, referring to FIG5 , the substrate processing apparatus 1 of the present embodiment will be further described. FIG5 is a side view showing the internal structure of the conveying block 6 of the substrate processing apparatus 1. Specifically, FIG5 shows the internal structure of the conveying block 6 when viewed from the +Y side. Furthermore, in FIG5 , for ease of understanding, the upper substrate conveying unit 50a and the lower substrate conveying unit 50b are not shown.

如圖5所示,上段搬送部6a進而具有2個上段FFU(風扇過濾單元)11、12及複數個上段沖孔板71。又,下段搬送部6b進而具有2個下段FFU13、14、複數個下段沖孔板72及複數個排氣風扇73。As shown in FIG5 , the upper conveying section 6a further includes two upper FFUs (fan filter units) 11 and 12 and a plurality of upper perforated plates 71. The lower conveying section 6b further includes two lower FFUs 13 and 14, a plurality of lower perforated plates 72 and a plurality of exhaust fans 73.

2個上段FFU11、12設置於上段搬送空間61a之上方。2個上段FFU11、12沿X方向配置。具體而言,2個上段FFU11、12以覆蓋參照圖3所說明之上段搬送機器人51a之移動範圍之方式配置。詳細而言,2個上段FFU11、12以覆蓋X方向上之上段搬送機器人51a之移動範圍之方式配置。The two upper FFUs 11 and 12 are arranged above the upper transport space 61a. The two upper FFUs 11 and 12 are arranged along the X direction. Specifically, the two upper FFUs 11 and 12 are arranged in a manner to cover the moving range of the upper transport robot 51a described with reference to FIG. 3. Specifically, the two upper FFUs 11 and 12 are arranged in a manner to cover the moving range of the upper transport robot 51a in the X direction.

2個上段FFU11、12自上段搬送空間61a之上方朝向下方供給氣體,而於上段搬送空間61a內產生降流。具體而言,2個上段FFU11、12抽吸設置基板處理裝置1之無塵室中之空氣,供給至上段搬送空間61a。因上段搬送空間61a內產生降流,而上段搬送空間61a中之風速之均勻性提高。結果,上段搬送空間61a之潔淨度提高。2個上段FFU11、12係第1搬送風扇過濾單元之一例。更詳細而言,2個上段FFU11、12分別具有風扇112、箱狀構件111及過濾器。風扇112支持於箱狀構件111之上部。風扇112抽吸無塵室中之空氣。風扇112所抽吸之空氣於箱狀構件111之內部空間中擴散,經由過濾器自箱狀構件111流出。The two upper FFUs 11 and 12 supply gas from the upper part of the upper transfer space 61a to the lower part, and generate a downflow in the upper transfer space 61a. Specifically, the two upper FFUs 11 and 12 suck the air in the clean room where the substrate processing device 1 is installed, and supply it to the upper transfer space 61a. Since a downflow is generated in the upper transfer space 61a, the uniformity of the wind speed in the upper transfer space 61a is improved. As a result, the cleanliness of the upper transfer space 61a is improved. The two upper FFUs 11 and 12 are an example of the first transfer fan filter unit. In more detail, the two upper FFUs 11 and 12 respectively have a fan 112, a box-shaped component 111 and a filter. The fan 112 is supported on the upper part of the box-shaped component 111. The fan 112 sucks the air in the clean room. The air sucked by the fan 112 diffuses in the inner space of the box-shaped component 111 and flows out of the box-shaped component 111 through the filter.

複數個上段沖孔板71設置於上段搬送空間61a之下方。上段沖孔板71具有於上下方向貫通上段沖孔板71之複數個通過孔。自2個上段FFU11、12供給至上段搬送空間61a之氣體於上段搬送空間61a內自上方流向下方,然後通過上段沖孔板71之通過孔。複數個上段沖孔板71係第1底部之一例,上段沖孔板71之通過孔係第1通過孔之一例。A plurality of upper perforated plates 71 are disposed below the upper transfer space 61a. The upper perforated plates 71 have a plurality of through holes that penetrate the upper perforated plates 71 in the up-down direction. The gas supplied from the two upper FFUs 11 and 12 to the upper transfer space 61a flows from the top to the bottom in the upper transfer space 61a, and then passes through the through holes of the upper perforated plates 71. The plurality of upper perforated plates 71 is an example of the first bottom portion, and the through holes of the upper perforated plates 71 are an example of the first through holes.

2個下段FFU13、14設置於下段搬送空間61b之上方。2個下段FFU13、14沿X方向配置。具體而言,2個下段FFU13、14以覆蓋參照圖3所說明之下段搬送機器人51b之移動範圍之方式配置。詳細而言,2個下段FFU13、14以覆蓋X方向上之下段搬送機器人51b之移動範圍之方式配置。The two lower section FFUs 13 and 14 are arranged above the lower section transport space 61b. The two lower section FFUs 13 and 14 are arranged along the X direction. Specifically, the two lower section FFUs 13 and 14 are arranged in a manner to cover the moving range of the lower section transport robot 51b described with reference to FIG. 3. Specifically, the two lower section FFUs 13 and 14 are arranged in a manner to cover the moving range of the lower section transport robot 51b in the X direction.

2個下段FFU13、14自下段搬送空間61b之上方朝向下方供給氣體,而於下段搬送空間61b內產生降流。具體而言,2個下段FFU13、14抽吸通過複數個上段沖孔板71之通過孔之氣體,供給至下段搬送空間61b。因下段搬送空間61b內產生降流,而下段搬送空間61b中之風速之均勻性提高。結果,下段搬送空間61b之潔淨度提高。又,下段FFU13、14自上段搬送空間61a向下段搬送空間61b排出氣體。因此,能於不使用設置基板處理裝置1之工廠之排氣資源之情形時,自上段搬送空間61a排出氣體。2個下段FFU13、14係第2搬送風扇過濾單元之一例。再者,2個下段FFU13、14分別與上段FFU11、12同樣地,具有風扇、箱狀構件及過濾器。下段FFU13、14之構成與上段FFU11、12同樣,因此省略此處之說明。The two lower FFUs 13 and 14 supply gas from the upper part of the lower transfer space 61b toward the lower part, and generate a downflow in the lower transfer space 61b. Specifically, the two lower FFUs 13 and 14 suck the gas that passes through the holes of the plurality of upper perforated plates 71 and supply it to the lower transfer space 61b. Since a downflow is generated in the lower transfer space 61b, the uniformity of the wind speed in the lower transfer space 61b is improved. As a result, the cleanliness of the lower transfer space 61b is improved. In addition, the lower FFUs 13 and 14 exhaust gas from the upper transfer space 61a to the lower transfer space 61b. Therefore, the gas can be exhausted from the upper transfer space 61a without using the exhaust resources of the factory where the substrate processing device 1 is installed. The two lower FFUs 13 and 14 are examples of the second conveying fan filter unit. The two lower FFUs 13 and 14 respectively have fans, box-shaped components and filters like the upper FFUs 11 and 12. The configuration of the lower FFUs 13 and 14 is the same as that of the upper FFUs 11 and 12, so the description here is omitted.

複數個下段沖孔板72設置於下段搬送空間61b之下方。下段沖孔板72具有於上下方向貫通下段沖孔板72之複數個通過孔。自2個下段FFU13、14供給至下段搬送空間61b之氣體於下段搬送空間61b內自上方流向下方,然後通過下段沖孔板72之通過孔。複數個下段沖孔板72係第2底部之一例,下段沖孔板72之通過孔係第2通過孔之一例。A plurality of lower perforated plates 72 are disposed below the lower transport space 61b. The lower perforated plates 72 have a plurality of through holes that penetrate the lower perforated plates 72 in the up-down direction. The gas supplied from the two lower FFUs 13 and 14 to the lower transport space 61b flows from the top to the bottom in the lower transport space 61b, and then passes through the through holes of the lower perforated plates 72. The plurality of lower perforated plates 72 is an example of the second bottom portion, and the through holes of the lower perforated plates 72 are an example of the second through holes.

複數個排氣風扇73設置於複數個下段沖孔板72之下方,將通過複數個下段沖孔板72之通過孔之氣體排出至搬送塊6之外部。更具體而言,複數個排氣風扇73將氣體排出至基板處理裝置1之外部。因此,能於不使用設置基板處理裝置1之工廠之排氣資源之情形時,自下段搬送空間61b排出氣體。A plurality of exhaust fans 73 are disposed below the plurality of lower perforated plates 72 to exhaust the gas passing through the holes of the plurality of lower perforated plates 72 to the outside of the transfer block 6. More specifically, the plurality of exhaust fans 73 exhaust the gas to the outside of the substrate processing apparatus 1. Therefore, the gas can be exhausted from the lower transfer space 61b without using the exhaust resources of the factory where the substrate processing apparatus 1 is installed.

根據本實施方式,上段FFU11、12於上段搬送空間61a內產生之降流(氣流)經由上段沖孔板71被下段FFU13、14抽吸,因此即使上段搬送機器人51a於上段搬送空間61a內移動,亦能抑制上段搬送空間61a內產生之降流(氣流)因上段搬送機器人51a之移動而混亂。同樣地,下段FFU13、14於下段搬送空間61b內產生之降流(氣流)經由下段沖孔板72被排氣風扇73抽吸,因此即使下段搬送機器人51b於下段搬送空間61b內移動,亦能抑制下段搬送空間61b中產生之降流(氣流)因下段搬送機器人51b之移動而混亂。According to the present embodiment, the downflow (airflow) generated by the upper FFU11, 12 in the upper transport space 61a is sucked by the lower FFU13, 14 through the upper perforated plate 71. Therefore, even if the upper transport robot 51a moves in the upper transport space 61a, the downflow (airflow) generated in the upper transport space 61a can be prevented from being disturbed by the movement of the upper transport robot 51a. Similarly, the downflow (airflow) generated by the lower FFU13 and 14 in the lower transport space 61b is sucked by the exhaust fan 73 through the lower perforated plate 72. Therefore, even if the lower transport robot 51b moves in the lower transport space 61b, the downflow (airflow) generated in the lower transport space 61b can be prevented from being disturbed by the movement of the lower transport robot 51b.

又,根據本實施方式,上段搬送部6a具備2個上段FFU11、12,因此能於上段搬送空間61a之較廣範圍內穩定地產生降流。同樣地,下段搬送部6b具備2個下段FFU13、14,因此能於下段搬送空間61b之較廣範圍內穩定地產生降流。Moreover, according to this embodiment, the upper conveying section 6a has two upper FFUs 11 and 12, so that the downward flow can be stably generated in a wide range of the upper conveying space 61a. Similarly, the lower conveying section 6b has two lower FFUs 13 and 14, so that the downward flow can be stably generated in a wide range of the lower conveying space 61b.

又,根據本實施方式,2個上段FFU11、12以覆蓋上段搬送機器人51a之移動範圍之方式配置,因此能進一步抑制上段搬送空間61a內產生之降流(氣流)混亂。同樣地,2個下段FFU13、14以覆蓋下段搬送機器人51b之移動範圍之方式配置,因此能進一步抑制下段搬送空間61b內產生之降流(氣流)混亂。Furthermore, according to the present embodiment, the two upper FFUs 11 and 12 are arranged to cover the moving range of the upper transport robot 51a, thereby further suppressing the downflow (airflow) turbulence generated in the upper transport space 61a. Similarly, the two lower FFUs 13 and 14 are arranged to cover the moving range of the lower transport robot 51b, thereby further suppressing the downflow (airflow) turbulence generated in the lower transport space 61b.

繼而,參照圖6~圖8,進一步對本實施方式之基板處理裝置1進行說明。圖6係表示基板處理裝置1之傳載塊3及傳送塊4之立體圖。Next, the substrate processing apparatus 1 of the present embodiment will be further described with reference to Fig. 6 to Fig. 8. Fig. 6 is a perspective view showing the carrier block 3 and the transfer block 4 of the substrate processing apparatus 1.

如圖6所示,傳載塊3進而具備傳載FFU部15。傳載FFU部15配置於參照圖3所說明之傳載空間3a之上方。傳載FFU部15自傳載空間3a之上方朝向下方供給氣體,而於傳載空間3a內產生降流。As shown in Fig. 6, the carrier block 3 further includes a carrier FFU unit 15. The carrier FFU unit 15 is disposed above the carrier space 3a described with reference to Fig. 3. The carrier FFU unit 15 supplies gas from the top to the bottom of the carrier space 3a, thereby generating a downflow in the carrier space 3a.

更具體而言,傳載FFU部15具有第1傳載FFU16、第2傳載FFU17及第3傳載FFU18。第1傳載FFU16及第2傳載FFU17抽吸設置基板處理裝置1之無塵室中之空氣,供給至傳載空間3a。再者,第1傳載FFU16、第2傳載FFU17及第3傳載FFU18分別與上段FFU11、12同樣地,具有風扇112、箱狀構件111及過濾器。第1傳載FFU16、第2傳載FFU17及第3傳載FFU18之構成與上段FFU11、12相同,因此省略其說明。More specifically, the carrier FFU section 15 includes a first carrier FFU 16, a second carrier FFU 17, and a third carrier FFU 18. The first carrier FFU 16 and the second carrier FFU 17 suck air in the clean room of the substrate processing apparatus 1 and supply the air to the carrier space 3a. Furthermore, the first carrier FFU 16, the second carrier FFU 17, and the third carrier FFU 18 respectively include a fan 112, a box-shaped member 111, and a filter, similarly to the upper stage FFU 11 and 12. The configurations of the first carrier FFU 16, the second carrier FFU 17, and the third carrier FFU 18 are the same as those of the upper stage FFU 11 and 12, and thus their description is omitted.

第1傳載FFU16配置於與傳送塊4側相反之側,第2傳載FFU17配置於傳送塊4側。換言之,第1傳載FFU16配置於與參照圖3所說明之上段傳送部41及下段傳送部42相反之側。第2傳載FFU17配置於參照圖3所說明之上段傳送部41及下段傳送部42側。關於第3傳載FFU18,參照圖8於下文中敍述。The first carrier FFU 16 is arranged on the side opposite to the conveying block 4, and the second carrier FFU 17 is arranged on the side of the conveying block 4. In other words, the first carrier FFU 16 is arranged on the side opposite to the upper conveying section 41 and the lower conveying section 42 described with reference to FIG. 3. The second carrier FFU 17 is arranged on the side of the upper conveying section 41 and the lower conveying section 42 described with reference to FIG. 3. The third carrier FFU 18 will be described below with reference to FIG. 8.

圖7係表示本實施方式之基板處理裝置1之內部構成之另一側視圖。詳細而言,圖7表示自+Y側觀察時之基板處理裝置1之內部構成。再者,於圖7中,為了便於理解,未圖示傳載搬送部32、上段基板搬送部50a及下段基板搬送部50b。FIG7 is another side view showing the internal structure of the substrate processing apparatus 1 of the present embodiment. Specifically, FIG7 shows the internal structure of the substrate processing apparatus 1 when viewed from the +Y side. In addition, in FIG7, for ease of understanding, the carrier conveyor 32, the upper substrate conveyor 50a, and the lower substrate conveyor 50b are not shown.

如圖6及圖7所示,上段傳送部41具有上段開口41a與上段傳送空間41b,下段傳送部42具有下段開口42a與下段傳送空間42b。上段傳送空間41b經由上段開口41a與上段搬送空間61a連通。下段傳送空間42b經由下段開口42a與下段搬送空間61b連通。As shown in Fig. 6 and Fig. 7, the upper conveying part 41 has an upper opening 41a and an upper conveying space 41b, and the lower conveying part 42 has a lower opening 42a and a lower conveying space 42b. The upper conveying space 41b is connected to the upper conveying space 61a through the upper opening 41a. The lower conveying space 42b is connected to the lower conveying space 61b through the lower opening 42a.

又,如圖7所示,傳載塊3具有第1開口3b與第2開口3c。第1開口3b與上段傳送部41之上段傳送空間41b連通。因此,傳載空間3a經由第1開口3b與上段傳送空間41b連通。第2開口3c設置於第1開口3b之下方,與下段傳送部42之下段傳送空間42b連通。因此,傳載空間3a經由第2開口3c與下段傳送空間42b連通。As shown in FIG7 , the carrier block 3 has a first opening 3b and a second opening 3c. The first opening 3b is connected to the upper conveying space 41b of the upper conveying section 41. Therefore, the carrier space 3a is connected to the upper conveying space 41b via the first opening 3b. The second opening 3c is provided below the first opening 3b and is connected to the lower conveying space 42b of the lower conveying section 42. Therefore, the carrier space 3a is connected to the lower conveying space 42b via the second opening 3c.

根據本實施方式,傳載塊3具備第1傳載FFU16及第2傳載FFU17,因此於傳載空間3a內,可於載具載置部31側與傳送塊4側產生降流。又,藉由利用第2傳載FFU17於傳送塊4側產生降流,可產生經由上段傳送空間41b及下段傳送空間42b自傳載空間3a流向上段搬送空間61a及下段搬送空間61b之氣流。According to the present embodiment, the carrier block 3 has the first carrier FFU 16 and the second carrier FFU 17, so that in the carrier space 3a, a downflow can be generated on the carrier placement portion 31 side and the conveying block 4 side. In addition, by using the second carrier FFU 17 to generate a downflow on the conveying block 4 side, an airflow can be generated from the carrier space 3a to the upper conveying space 61a and the lower conveying space 61b via the upper conveying space 41b and the lower conveying space 42b.

繼而,參照圖7,進一步對排氣風扇73進行說明。本實施方式中,排氣風扇73以抽吸下段傳送部42之下段傳送空間42b內之氣體之排氣量驅動。因此,藉由排氣風扇73之驅動,而下段傳送部42之下段傳送空間42b內之氣體流向下段搬送空間61b。結果,氣體經由下段傳送空間42b自傳載空間3a流向下段搬送空間61b。亦即,排氣風扇73產生經由下段傳送空間42b自傳載空間3a流向下段搬送空間61b之氣流。根據本實施方式,能更確實地產生經由下段傳送空間42b自傳載空間3a流向下段搬送空間61b之氣流。Next, referring to FIG. 7 , the exhaust fan 73 is further described. In the present embodiment, the exhaust fan 73 is driven by the exhaust volume of the gas in the lower transfer space 42b of the lower transfer section 42. Therefore, by driving the exhaust fan 73, the gas in the lower transfer space 42b of the lower transfer section 42 flows to the lower transfer space 61b. As a result, the gas flows from the carrying space 3a to the lower transfer space 61b via the lower transfer space 42b. That is, the exhaust fan 73 generates an airflow that flows from the carrying space 3a to the lower transfer space 61b via the lower transfer space 42b. According to the present embodiment, an airflow that flows from the carrying space 3a to the lower transfer space 61b via the lower transfer space 42b can be generated more reliably.

繼而,參照圖6及圖8,進一步對傳載FFU部15進行說明。圖8係表示基板處理裝置1之傳載塊3之內部構成之前視圖。詳細而言,圖8表示自+X側觀察時之傳載塊3之內部構成。再者,圖8中,為了便於理解,未圖示傳載搬送機器人33。Next, the carrier FFU unit 15 is further described with reference to FIG6 and FIG8. FIG8 is a front view showing the internal structure of the carrier block 3 of the substrate processing apparatus 1. Specifically, FIG8 shows the internal structure of the carrier block 3 when viewed from the +X side. In FIG8, for ease of understanding, the carrier transfer robot 33 is not shown.

如圖6及圖8所示,第3傳載FFU18設置於傳載塊3之內部。具體而言,第3傳載FFU18於自正面觀察第1開口3b及第2開口3c時,配置於第1傳載FFU16及第2傳載FFU17之一側方(-Y側)。因此,根據本實施方式,藉由傳載FFU部15,能於傳載空間3a之較廣範圍內產生降流。As shown in FIG6 and FIG8, the third carrier FFU 18 is disposed inside the carrier block 3. Specifically, the third carrier FFU 18 is disposed on one side (-Y side) of the first carrier FFU 16 and the second carrier FFU 17 when the first opening 3b and the second opening 3c are viewed from the front. Therefore, according to this embodiment, the carrier FFU section 15 can generate a downflow in a wider range of the carrier space 3a.

詳細而言,傳載塊3進而具備電氣零件群38。又,傳載空間3a包含第1傳載空間3a1與第2傳載空間3a2。Specifically, the carrier block 3 further includes an electrical component group 38. In addition, the carrier space 3a includes a first carrier space 3a1 and a second carrier space 3a2.

電氣零件群38包含複數個電氣零件。電氣零件群38於自正面觀察第1開口3b及第2開口3c時,設置於第1開口3b及第2開口3c之一側方(-Y側)。The electrical component group 38 includes a plurality of electrical components and is disposed on one side (-Y side) of the first opening 3b and the second opening 3c when the first opening 3b and the second opening 3c are viewed from the front.

第2傳載空間3a2為電氣零件群38下方之空間,第1傳載空間3a1為其餘空間。因此,第2傳載空間3a2於自正面觀察第1開口3b及第2開口3c時,位於第1傳載空間3a1之一側方(-Y側),第1傳載空間3a1之最上部位於較第2傳載空間3a2之最上部更靠上方。The second transfer space 3a2 is the space below the electrical component group 38, and the first transfer space 3a1 is the remaining space. Therefore, when the first opening 3b and the second opening 3c are viewed from the front, the second transfer space 3a2 is located on one side (-Y side) of the first transfer space 3a1, and the uppermost portion of the first transfer space 3a1 is located higher than the uppermost portion of the second transfer space 3a2.

第1傳載FFU16及第2傳載FFU17設置於第1傳載空間3a1之上方。第1傳載FFU16及第2傳載FFU17自第1傳載空間3a1之上方朝向下方供給氣體,而於第1傳載空間3a1內產生降流。The first carrier FFU 16 and the second carrier FFU 17 are disposed above the first carrier space 3a1. The first carrier FFU 16 and the second carrier FFU 17 supply gas from the top to the bottom of the first carrier space 3a1, thereby generating a downflow in the first carrier space 3a1.

藉由第1傳載FFU16及第2傳載FFU17而產生之氣流(降流)難以到達電氣零件群38下方之空間(第2傳載空間3a2)。第3傳載FFU18配置於電氣零件群38之下方。上述第3傳載FFU18自第2傳載空間3a2之上方朝向下方供給氣體,而於第2傳載空間3a2內產生降流。The airflow (downflow) generated by the first carrier FFU 16 and the second carrier FFU 17 is difficult to reach the space (second carrier space 3a2) below the electrical component group 38. The third carrier FFU 18 is arranged below the electrical component group 38. The third carrier FFU 18 supplies gas from the top to the bottom of the second carrier space 3a2, and generates a downflow in the second carrier space 3a2.

根據本實施方式,傳載塊3具備第3傳載FFU18,因此能夠於傳載空間3a中之藉由第1傳載FFU16及第2傳載FFU17而產生之氣流(降流)難以到達之空間(第2傳載空間3a2)內,更確實地產生降流。According to the present embodiment, the carrier block 3 is provided with the third carrier FFU18, so that the downflow can be more reliably generated in the space (the second carrier space 3a2) in the carrier space 3a where the airflow (downflow) generated by the first carrier FFU16 and the second carrier FFU17 is difficult to reach.

又,本實施方式中,自正面觀察第1開口3b及第2開口3c時,第3傳載FFU18配置於與導軌34相反之側。具體而言,如圖8所示,導軌34於自正面觀察第1開口3b及第2開口3c時,以與第1開口3b及第2開口3c之一(+Y側之)端重疊之方式設置。導軌34沿上下方向(Z方向)延伸,因此藉由第1傳載FFU16及第2傳載FFU17而產生之氣流容易沿導軌34於上下方向(Z方向)流動。另一方面,於第2傳載空間3a2(與導軌34相反之側之空間)內,即使藉由第1傳載FFU16及第2傳載FFU17而產生之氣流流入,氣流亦會擴散,而難以產生降流。In addition, in the present embodiment, when the first opening 3b and the second opening 3c are observed from the front, the third carrier FFU 18 is arranged on the side opposite to the guide rail 34. Specifically, as shown in FIG8 , the guide rail 34 is arranged to overlap with one end (on the +Y side) of the first opening 3b and the second opening 3c when the first opening 3b and the second opening 3c are observed from the front. The guide rail 34 extends in the up-down direction (Z direction), so the airflow generated by the first carrier FFU 16 and the second carrier FFU 17 easily flows in the up-down direction (Z direction) along the guide rail 34. On the other hand, in the second carrier space 3a2 (the space on the opposite side of the guide rail 34), even if the airflow generated by the first carrier FFU 16 and the second carrier FFU 17 flows in, the airflow will diffuse and it will be difficult to generate a downward flow.

根據本實施方式,由於第3傳載FFU18於第2傳載空間3a2內產生降流,故而於傳載空間3a內,能減少難以產生降流之空間。According to the present embodiment, since the third carrier FFU 18 generates a downflow in the second carrier space 3a2, the space in which it is difficult to generate a downflow can be reduced in the carrier space 3a.

繼而,參照圖5、圖7及圖9~圖11,進一步對本實施方式之基板處理裝置1進行說明。圖9係表示基板處理裝置1之搬送塊6之立體圖。如圖9所示,上段搬送部6a具有上段側壁部611,下段搬送部6b具有下段側壁部612。下段側壁部612設置於上段側壁部611之下方,上段側壁部611及下段側壁部612與參照圖1及圖2所說明之處理塊5鄰接。上段側壁部611係第1側壁部之一例,下段側壁部612係第2側壁部之一例。更具體而言,上段側壁部611包含+Y側之上段側壁部611與-Y側之上段側壁部611。+Y側之上段側壁部611構成上段搬送部6a之+Y側之側壁,-Y側之上段側壁部611構成上段搬送部6a之-Y側之側壁。同樣地,下段側壁部612包含+Y側之下段側壁部612與-Y側之下段側壁部612。+Y側之下段側壁部612構成下段搬送部6b之+Y側之側壁,-Y側之下段側壁部612構成下段搬送部6b之-Y側之側壁。Next, the substrate processing device 1 of the present embodiment is further described with reference to Fig. 5, Fig. 7, and Fig. 9 to Fig. 11. Fig. 9 is a three-dimensional view showing the conveying block 6 of the substrate processing device 1. As shown in Fig. 9, the upper conveying portion 6a has an upper side wall portion 611, and the lower conveying portion 6b has a lower side wall portion 612. The lower side wall portion 612 is disposed below the upper side wall portion 611, and the upper side wall portion 611 and the lower side wall portion 612 are adjacent to the processing block 5 described with reference to Fig. 1 and Fig. 2. The upper side wall portion 611 is an example of the first side wall portion, and the lower side wall portion 612 is an example of the second side wall portion. More specifically, the upper side wall portion 611 includes an upper side wall portion 611 on the +Y side and an upper side wall portion 611 on the -Y side. The upper side wall portion 611 on the +Y side constitutes the side wall on the +Y side of the upper conveying portion 6a, and the upper side wall portion 611 on the -Y side constitutes the side wall on the -Y side of the upper conveying portion 6a. Similarly, the lower side wall portion 612 includes a lower side wall portion 612 on the +Y side and a lower side wall portion 612 on the -Y side. The lower side wall portion 612 on the +Y side constitutes the side wall on the +Y side of the lower conveying portion 6b, and the lower side wall portion 612 on the -Y side constitutes the side wall on the -Y side of the lower conveying portion 6b.

圖10(a)係表示上段側壁部611及下段側壁部612之剖面之圖。詳細而言,圖10(a)表示+Y側之上段側壁部611之剖面及+Y側之下段側壁部612之剖面。Fig. 10(a) is a diagram showing a cross section of the upper side wall portion 611 and the lower side wall portion 612. Specifically, Fig. 10(a) shows a cross section of the upper side wall portion 611 on the +Y side and a cross section of the lower side wall portion 612 on the +Y side.

如圖10(a)所示,上段側壁部611具有上段間隙形成部611a,下段側壁部612具有下段間隙形成部612a。上段間隙形成部611a與下段間隙形成部612a於上下方向(Z方向)上對向,於上段間隙形成部611a與下段間隙形成部612a之間形成間隙63。間隙63與配置參照圖5所說明之下段FFU13、14之空間連通。又,間隙63與搬送塊6之外部連通。詳細而言,間隙63經由搬送塊6與處理塊5之間隙,與基板處理裝置1之外部連通。As shown in FIG10( a), the upper side wall portion 611 has an upper gap forming portion 611a, and the lower side wall portion 612 has a lower gap forming portion 612a. The upper gap forming portion 611a and the lower gap forming portion 612a are opposite to each other in the up-down direction (Z direction), and a gap 63 is formed between the upper gap forming portion 611a and the lower gap forming portion 612a. The gap 63 is connected to the space of the lower FFU 13 and 14 described with reference to FIG5 . In addition, the gap 63 is connected to the outside of the conveying block 6. Specifically, the gap 63 is connected to the outside of the substrate processing device 1 via the gap between the conveying block 6 and the processing block 5.

更具體而言,+Y側之上段側壁部611具有複數個上段間隙形成部611a,+Y側之下段側壁部612具有複數個下段間隙形成部612a。同樣地,-Y側之上段側壁部611具有複數個上段間隙形成部611a,-Y側之下段側壁部612具有複數個下段間隙形成部612a。+Y側之複數個上段間隙形成部611a及+Y側之複數個下段間隙形成部612a沿X方向設置。-Y側之複數個上段間隙形成部611a及-Y側之複數個下段間隙形成部612a亦同樣,沿X方向設置。More specifically, the upper section side wall portion 611 on the +Y side has a plurality of upper section gap forming portions 611a, and the lower section side wall portion 612 on the +Y side has a plurality of lower section gap forming portions 612a. Similarly, the upper section side wall portion 611 on the -Y side has a plurality of upper section gap forming portions 611a, and the lower section side wall portion 612 on the -Y side has a plurality of lower section gap forming portions 612a. The plurality of upper section gap forming portions 611a on the +Y side and the plurality of lower section gap forming portions 612a on the +Y side are arranged along the X direction. The plurality of upper section gap forming portions 611a on the -Y side and the plurality of lower section gap forming portions 612a on the -Y side are also arranged along the X direction.

根據本實施方式,能使自上段搬送空間61a流入配置下段FFU13、14之空間內之氣體之一部分,經由複數個間隙63逸出至搬送塊6之外部。結果,氣體容易自參照圖7所說明之上段傳送空間41b流向上段搬送空間61a,氣體不易滯留於上段傳送空間41b內。因此,能更確實地產生經由上段傳送空間41b自傳載空間3a流向上段搬送空間61a之氣流。According to the present embodiment, a part of the gas flowing from the upper transfer space 61a into the space where the lower FFUs 13 and 14 are arranged can escape to the outside of the transfer block 6 through the plurality of gaps 63. As a result, the gas can easily flow from the upper transfer space 41b described with reference to FIG. 7 to the upper transfer space 61a, and the gas is not easily retained in the upper transfer space 41b. Therefore, the airflow flowing from the carrying space 3a to the upper transfer space 61a through the upper transfer space 41b can be more reliably generated.

進而,本實施方式中,如圖9所示,上段搬送部6a具有複數個開口率調整構件62。複數個開口率調整構件62與複數個間隙63一一對應。開口率調整構件62調整對應之間隙63之開口率。Furthermore, in this embodiment, as shown in Fig. 9 , the upper conveying section 6a has a plurality of opening ratio adjusting members 62. The plurality of opening ratio adjusting members 62 correspond one to one with the plurality of gaps 63. The opening ratio adjusting members 62 adjust the opening ratio of the corresponding gaps 63.

具體而言,開口率調整構件62各者以從Y方向觀察時與對應之間隙63之重疊狀態改變之方式,相對於上段側壁部611於上下方向(Z方向)滑動自如地被支持於上段側壁部611上。藉由使開口率調整構件62滑動,可調整對應之間隙63之開口率。例如,作業人員使開口率調整構件62於上下方向(Z方向)滑動,而調整對應之間隙63之開口率。Specifically, each of the opening ratio adjusting members 62 is supported on the upper side wall portion 611 so as to be able to slide freely in the vertical direction (Z direction) relative to the upper side wall portion 611 in such a manner that the overlapping state with the corresponding gap 63 when viewed from the Y direction changes. By sliding the opening ratio adjusting member 62, the opening ratio of the corresponding gap 63 can be adjusted. For example, the operator slides the opening ratio adjusting member 62 in the vertical direction (Z direction) to adjust the opening ratio of the corresponding gap 63.

圖10(b)係表示開口率調整構件62之立體圖。詳細而言,圖10(b)表示使間隙63開放一半之開口率調整構件62。再者,圖10(a)亦同樣表示使間隙63開放一半之開口率調整構件62。Fig. 10(b) is a perspective view showing the opening ratio adjusting member 62. Specifically, Fig. 10(b) shows the opening ratio adjusting member 62 with the gap 63 opened halfway. Fig. 10(a) also shows the opening ratio adjusting member 62 with the gap 63 opened halfway.

如圖10(b)所示,開口率調整構件62具有板部62a與遮蔽部62b。板部62a沿Z方向延伸。遮蔽部62b沿X方向延伸。遮蔽部62b連接於板部62a之下端。As shown in FIG. 10( b ), the opening ratio adjustment member 62 includes a plate portion 62 a and a shielding portion 62 b . The plate portion 62 a extends along the Z direction. The shielding portion 62 b extends along the X direction. The shielding portion 62 b is connected to the lower end of the plate portion 62 a .

開口率調整構件62於間隙63之上方藉由未圖示之固定部而固定於上段側壁部611。於固定部設置有於Z方向上貫通之貫通孔,開口率調整構件62之板部62a滑動自如地插入固定部之貫通孔。The opening ratio adjustment member 62 is fixed to the upper side wall portion 611 by a fixing portion (not shown) above the gap 63. A through hole is provided in the fixing portion to penetrate in the Z direction, and the plate portion 62a of the opening ratio adjustment member 62 is slidably inserted into the through hole of the fixing portion.

於固定部例如亦可設置用於將板部62a固定於貫通孔之螺絲機構。或者,亦可於板部62a設置正齒輪,於固定部設置齒輪,藉由板部62a與固定部,構成所謂之齒條與小齒輪機構。於該情形時,亦可藉由手動或馬達使設置於固定部之齒輪旋轉,而使開口率調整構件62於Z方向上滑動。For example, a screw mechanism for fixing the plate portion 62a to the through hole may be provided at the fixing portion. Alternatively, a spur gear may be provided at the plate portion 62a, and a gear may be provided at the fixing portion, so that the plate portion 62a and the fixing portion form a so-called rack and pinion mechanism. In this case, the gear provided at the fixing portion may be rotated manually or by a motor to slide the opening ratio adjustment member 62 in the Z direction.

固定部理想為設置於如下位置,即,藉由使板部62a相對於固定部滑動,能使自Y方向觀察時遮蔽部62b與間隙63之重疊情況更大幅度地變化的位置。例如,理想為以如下方式配置固定部,即,於開口率調整構件62為某一狀態之情形時,自Y方向觀察時遮蔽部62b完全遮蔽間隙63,於開口率調整構件62為另一狀態之情形時,遮蔽部62b使間隙63完全開放。The fixing portion is preferably disposed at a position where the overlap between the shielding portion 62b and the gap 63 can be changed more significantly when viewed from the Y direction by sliding the plate portion 62a relative to the fixing portion. For example, the fixing portion is preferably arranged in such a manner that when the opening ratio adjusting member 62 is in a certain state, the shielding portion 62b completely shields the gap 63 when viewed from the Y direction, and when the opening ratio adjusting member 62 is in another state, the shielding portion 62b completely opens the gap 63.

圖11(a)係表示上段側壁部611及下段側壁部612之剖面之另一圖。圖11(b)係表示開口率調整構件62之另一狀態之立體圖。詳細而言,圖11(a)表示將間隙63封閉之開口率調整構件62。圖11(b)亦同樣,表示將間隙63封閉之開口率調整構件62。Fig. 11(a) is another view showing the cross section of the upper side wall portion 611 and the lower side wall portion 612. Fig. 11(b) is a three-dimensional view showing another state of the opening ratio adjustment member 62. Specifically, Fig. 11(a) shows the opening ratio adjustment member 62 closing the gap 63. Fig. 11(b) also shows the opening ratio adjustment member 62 closing the gap 63.

如圖10(a)及圖10(b)所示,開口率調整構件62使間隙63開放,藉此氣體經由間隙63自配置下段FFU13、14之空間(參照圖5)向搬送塊6之外部流出。另一方面,如圖11(a)及圖11(b)所示,開口率調整構件62遮斷間隙63,藉此經由間隙63之氣體流出被阻止。As shown in Fig. 10(a) and Fig. 10(b), the opening ratio adjusting member 62 opens the gap 63, whereby the gas flows out from the space where the lower stage FFU 13 and 14 are arranged (see Fig. 5) to the outside of the conveying block 6 through the gap 63. On the other hand, as shown in Fig. 11(a) and Fig. 11(b), the opening ratio adjusting member 62 blocks the gap 63, whereby the gas outflow through the gap 63 is prevented.

根據本實施方式,搬送塊6具備開口率調整構件62,藉此能調整間隙63之開口率,而調整氣體自配置下段FFU13、14之空間向搬送塊6外部之流出容易度。因此,能調整氣體每單位時間自配置下段FFU13、14之空間向搬送塊6外部之流出量。藉此,能調整間隙63之開口率,而更確實地產生經由上段傳送空間41b自傳載空間3a流向上段搬送空間61a之氣流。According to the present embodiment, the conveying block 6 has an opening ratio adjustment member 62, by which the opening ratio of the gap 63 can be adjusted, and the ease of gas outflow from the space where the lower FFUs 13 and 14 are arranged to the outside of the conveying block 6 can be adjusted. Therefore, the amount of gas outflow per unit time from the space where the lower FFUs 13 and 14 are arranged to the outside of the conveying block 6 can be adjusted. In this way, the opening ratio of the gap 63 can be adjusted, and the airflow from the carrier space 3a to the upper conveying space 61a via the upper conveying space 41b can be more reliably generated.

以上,參照圖1~圖11對本發明之實施方式1進行說明。根據本實施方式,能抑制上段搬送空間61a內產生之降流(氣流)混亂、及下段搬送空間61b內產生之降流(氣流)混亂。The first embodiment of the present invention has been described above with reference to Fig. 1 to Fig. 11. According to this embodiment, it is possible to suppress the downflow (airflow) turbulence generated in the upper transfer space 61a and the downflow (airflow) turbulence generated in the lower transfer space 61b.

再者,本實施方式中,上段側壁部611具有上段間隙形成部611a,下段側壁部612具有下段間隙形成部612a,但亦可僅使上段側壁部611具有形成間隙63之結構或形狀,還可僅使下段側壁部612具有形成間隙63之結構或形狀。Furthermore, in the present embodiment, the upper side wall portion 611 has an upper gap forming portion 611a, and the lower side wall portion 612 has a lower gap forming portion 612a, but only the upper side wall portion 611 may have a structure or shape for forming the gap 63, or only the lower side wall portion 612 may have a structure or shape for forming the gap 63.

又,本實施方式中,搬送塊6具有複數個間隙63,但搬送塊6亦可具有1個間隙63。Furthermore, in the present embodiment, the conveying block 6 has a plurality of gaps 63 , but the conveying block 6 may also have one gap 63 .

又,本實施方式中,搬送塊6於+Y側及-Y側這兩側具有間隙63,但搬送塊6亦可僅於+Y側及-Y側中之一側具有間隙63。Furthermore, in the present embodiment, the conveying block 6 has the gap 63 on both the +Y side and the -Y side, but the conveying block 6 may have the gap 63 only on one of the +Y side and the -Y side.

又,本實施方式中,開口率調整構件62於上下方向上滑動,但開口率調整構件62滑動之方向並不限定於上下方向。開口率調整構件62只要能以可調整對應之間隙63之開口率之方式滑動即可。例如,開口率調整構件62亦可由上段側壁部611支持而於X方向上滑動自如。In addition, in the present embodiment, the opening ratio adjustment member 62 slides in the vertical direction, but the sliding direction of the opening ratio adjustment member 62 is not limited to the vertical direction. The opening ratio adjustment member 62 can slide in a manner that can adjust the opening ratio of the corresponding gap 63. For example, the opening ratio adjustment member 62 can also be supported by the upper side wall portion 611 and slide freely in the X direction.

又,本實施方式中,上段搬送部6a具有開口率調整構件62,但亦可使下段搬送部6b具有開口率調整構件62,還可使上段搬送部6a及下段搬送部6b兩者具有開口率調整構件62。In the present embodiment, the upper conveying section 6a has the opening ratio adjusting member 62, but the lower conveying section 6b may also have the opening ratio adjusting member 62, or both the upper conveying section 6a and the lower conveying section 6b may have the opening ratio adjusting member 62.

[實施方式2]  繼而,參照圖12及圖13對本發明之實施方式2進行說明。但是,對與實施方式1不同之事項進行說明,省略對於與實施方式1相同之事項之說明。實施方式2與實施方式1不同,於搬送塊6中設置第1整流部81~第3整流部83。[Implementation method 2] Next, implementation method 2 of the present invention is described with reference to Figures 12 and 13. However, matters different from implementation method 1 are described, and descriptions of matters the same as implementation method 1 are omitted. Implementation method 2 is different from implementation method 1 in that the first rectifying section 81 to the third rectifying section 83 are provided in the conveying block 6.

圖12係將本實施方式之基板處理裝置1所具備之搬送塊6之一部分放大來表示之圖。詳細而言,圖12係將自+Y側觀察時之搬送塊6之一部分放大來表示。如圖12所示,本實施方式中,上段搬送部6a進而具有設置於上段沖孔板71之第1整流部81。第1整流部81自上段沖孔板71向下方突出。第1整流部81亦可由上段沖孔板71之框體之彎折部構成。FIG. 12 is a diagram showing a part of the conveying block 6 provided in the substrate processing apparatus 1 of the present embodiment in an enlarged manner. Specifically, FIG. 12 is a diagram showing a part of the conveying block 6 when viewed from the +Y side in an enlarged manner. As shown in FIG. 12, in the present embodiment, the upper conveying portion 6a further includes a first rectifying portion 81 disposed on the upper perforated plate 71. The first rectifying portion 81 protrudes downward from the upper perforated plate 71. The first rectifying portion 81 may also be formed by a bent portion of the frame of the upper perforated plate 71.

第1整流部81將通過上段沖孔板71之通過孔之氣體整流。詳細而言,第1整流部81以使通過上段沖孔板71之通過孔之氣體朝向下段FFU13或下段FFU14流動之方式,將通過上段沖孔板71之通過孔之氣體整流。因此,根據本實施方式,下段FFU13及下段FFU14能高效率地抽吸通過上段沖孔板71之通過孔之氣體。The first rectifying section 81 rectify the gas passing through the holes of the upper perforated plate 71. Specifically, the first rectifying section 81 rectify the gas passing through the holes of the upper perforated plate 71 so that the gas passing through the holes of the upper perforated plate 71 flows toward the lower FFU 13 or the lower FFU 14. Therefore, according to this embodiment, the lower FFU 13 and the lower FFU 14 can efficiently suck the gas passing through the holes of the upper perforated plate 71.

本實施方式中,下段FFU13、14進而具有第2整流部82。具體而言,下段FFU13、14分別具有風扇112、箱狀構件111、第2整流部82及過濾器。第2整流部82設置於箱狀構件111。第2整流部82自箱狀構件111向上方突出。In this embodiment, the lower FFU 13, 14 further includes a second rectifying portion 82. Specifically, the lower FFU 13, 14 includes a fan 112, a box-shaped member 111, a second rectifying portion 82, and a filter. The second rectifying portion 82 is provided in the box-shaped member 111. The second rectifying portion 82 protrudes upward from the box-shaped member 111.

第2整流部82將通過上段沖孔板71之通過孔之氣體整流。詳細而言,第2整流部82以使通過上段沖孔板71之通過孔之氣體朝向風扇112流動之方式,將通過上段沖孔板71之通過孔之氣體整流。因此,根據本實施方式,下段FFU13及下段FFU14能高效率地抽吸通過上段沖孔板71之通過孔之氣體。The second rectifying section 82 rectify the gas passing through the holes of the upper perforated plate 71. Specifically, the second rectifying section 82 rectify the gas passing through the holes of the upper perforated plate 71 so that the gas passing through the holes of the upper perforated plate 71 flows toward the fan 112. Therefore, according to this embodiment, the lower FFU 13 and the lower FFU 14 can efficiently suck the gas passing through the holes of the upper perforated plate 71.

再者,箱狀構件111支持風扇112。具體而言,風扇112支持於箱狀構件111之上部。過濾器收容於箱狀構件111之內部。風扇112所抽吸之空氣於箱狀構件111之內部空間中擴散,經由過濾器自箱狀構件111流出。Furthermore, the box-shaped member 111 supports the fan 112. Specifically, the fan 112 is supported on the upper portion of the box-shaped member 111. The filter is accommodated inside the box-shaped member 111. The air sucked by the fan 112 diffuses in the inner space of the box-shaped member 111 and flows out of the box-shaped member 111 through the filter.

圖13係將本實施方式之搬送塊6之一部分放大來表示之另一圖。詳細而言,圖13將自-X側觀察時之搬送塊6之一部分放大來表示。如圖13所示,下段搬送部6b進而具有頂部613及第3整流部83。於頂部613,設置有下段FFU13、14及第3整流部83。FIG. 13 is another diagram showing a part of the conveying block 6 of the present embodiment in an enlarged manner. Specifically, FIG. 13 shows a part of the conveying block 6 when viewed from the -X side in an enlarged manner. As shown in FIG. 13 , the lower conveying section 6b further has a top section 613 and a third rectifying section 83. The lower FFUs 13 and 14 and the third rectifying section 83 are provided at the top section 613.

第3整流部83將通過上段沖孔板71之通過孔之氣體整流。詳細而言,第3整流部83以使通過上段沖孔板71之通過孔之氣體朝向下段FFU13、14流動之方式,將通過上段沖孔板71之通過孔之氣體整流。因此,根據本實施方式,下段FFU13及下段FFU14能高效率地抽吸通過上段沖孔板71之通過孔之氣體。The third rectifying section 83 rectify the gas passing through the holes of the upper perforated plate 71. Specifically, the third rectifying section 83 rectify the gas passing through the holes of the upper perforated plate 71 so that the gas passing through the holes of the upper perforated plate 71 flows toward the lower FFUs 13 and 14. Therefore, according to this embodiment, the lower FFUs 13 and 14 can efficiently suck the gas passing through the holes of the upper perforated plate 71.

以上,參照圖12及圖13對本發明之實施方式2進行說明。根據本實施方式,下段FFU13及下段FFU14能高效率地抽吸通過上段沖孔板71之通過孔之氣體。The second embodiment of the present invention is described above with reference to Fig. 12 and Fig. 13. According to the present embodiment, the lower FFU 13 and the lower FFU 14 can efficiently suck the gas passing through the holes of the upper perforated plate 71.

再者,本實施方式中,於搬送塊6中設置有第1整流部81~第3整流部83,但亦可將第1整流部81~第3整流部83中之1個或2個設置於搬送塊6中。Furthermore, in the present embodiment, the first to third rectifying sections 81 to 83 are provided in the conveying block 6 , but one or two of the first to third rectifying sections 81 to 83 may be provided in the conveying block 6 .

以上,參照圖式(圖1~圖13)對本發明之實施方式進行說明。但是,本發明並不限定於上述實施方式,可於不脫離其主旨之範圍內以各種方式實施。又,能適當改變上述實施方式所揭示之複數個構成要素。例如,亦可將某實施方式所示之全部構成要素中之某一構成要素追加為另一實施方式之構成要素,或者亦可將某實施方式所示之全部構成要素中之若干構成要素自實施方式中刪除。The embodiments of the present invention are described above with reference to the drawings (FIG. 1 to FIG. 13). However, the present invention is not limited to the above embodiments, and can be implemented in various ways within the scope of the gist thereof. In addition, the plurality of constituent elements disclosed in the above embodiments can be appropriately changed. For example, a certain constituent element among all constituent elements shown in a certain embodiment can be added as a constituent element of another embodiment, or some constituent elements among all constituent elements shown in a certain embodiment can be deleted from the embodiment.

圖式係為了便於理解發明,而以各構成要素為主體模式性地表示,圖示之各構成要素之厚度、長度、個數、間隔等有時為了便於製作圖式而與實物不同。又,上述實施方式所示之各構成要素之構成係一例,並無特別限定,當然能於實質上不脫離本發明之效果之範圍內進行各種變更。The drawings are mainly schematic representations of the components for the purpose of facilitating the understanding of the invention. The thickness, length, number, spacing, etc. of the components shown in the drawings may be different from the actual objects for the convenience of drawing. In addition, the configuration of the components shown in the above-mentioned embodiments is an example and is not particularly limited. Various changes can be made within the scope of the effects of the invention.

例如,於參照圖1~圖13所說明之實施方式中,上段搬送部6a具備2個上段FFU11、12,但上段搬送部6a亦可具備1個上段FFU,還可具備3個以上之上段FFU。同樣地,下段搬送部6b具備2個下段FFU13、14,但下段搬送部6b亦可具備1個下段FFU,還可具備3個以上之下段FFU。For example, in the embodiment described with reference to Fig. 1 to Fig. 13, the upper conveying section 6a has two upper FFUs 11 and 12, but the upper conveying section 6a may also have one upper FFU, or may have three or more upper FFUs. Similarly, the lower conveying section 6b has two lower FFUs 13 and 14, but the lower conveying section 6b may also have one lower FFU, or may have three or more lower FFUs.

又,於參照圖1~圖13所說明之實施方式中,上段搬送部6a具備複數個上段沖孔板71,但上段搬送部6a亦可具備1個上段沖孔板。同樣地,下段搬送部6b具備複數個下段沖孔板72,但下段搬送部6b亦可具備1個下段沖孔板。In the embodiment described with reference to Fig. 1 to Fig. 13, the upper conveying part 6a has a plurality of upper punching plates 71, but the upper conveying part 6a may also have one upper punching plate. Similarly, the lower conveying part 6b has a plurality of lower punching plates 72, but the lower conveying part 6b may also have one lower punching plate.

又,於參照圖1~圖13所說明之實施方式中,下段搬送部6b具備2個排氣風扇73,但下段搬送部6b亦可具備1個排氣風扇73,還可具備3個以上之排氣風扇73。  [產業上之可利用性]Furthermore, in the embodiment described with reference to FIGS. 1 to 13 , the lower conveying section 6 b has two exhaust fans 73 , but the lower conveying section 6 b may also have one exhaust fan 73 , or may have three or more exhaust fans 73 . [Industrial Applicability]

本發明可用於處理基板之裝置。The present invention can be used in a device for processing a substrate.

1:基板處理裝置 2:處理單元 3:傳載塊 3a:傳載空間 3a1:第1傳載空間 3a2:第2傳載空間 3b:第1開口 3c:第2開口 4:傳送塊 5:處理塊 6:搬送塊 6a:上段搬送部 6b:下段搬送部 7:多功能塊 11:上段FFU 12:上段FFU 13:下段FFU 14:下段FFU 15:傳載FFU部 16:第1傳載FFU 17:第2傳載FFU 18:第3傳載FFU 21:吸盤 23:擋板 25:處理噴嘴 31:載具載置部 32:傳載搬送部 33:傳載搬送機器人 34:導軌 35:基台部 36:多關節臂 37:手 38:電氣零件群 41:上段傳送部 41a:上段開口 41b:上段傳送空間 42:下段傳送部 42a:下段開口 42b:下段傳送空間 50a:上段基板搬送部 50b:下段基板搬送部 51a:上段搬送機器人 51b:下段搬送機器人 52a:固定框 52b:固定框 53a:可動框 53b:可動框 54:基台部 55:回轉基座 56:臂 61a:上段搬送空間 61b:下段搬送空間 62:開口率調整構件 62a:板部 62b:遮蔽部 63:間隙 71:上段沖孔板 72:下段沖孔板 73:排氣風扇 81:第1整流部 82:第2整流部 83:第3整流部 111:箱狀構件 112:風扇 611:上段側壁部 611a:上段間隙形成部 612:下段側壁部 612a:下段間隙形成部 613:頂部 C:載具 TW,TW1,TW2,TW3,TW4:塔單元 W:基板1: substrate processing device 2: processing unit 3: carrier block 3a: carrier space 3a1: first carrier space 3a2: second carrier space 3b: first opening 3c: second opening 4: transfer block 5: processing block 6: transport block 6a: upper transport unit 6b: lower transport unit 7: multi-function block 11: upper FFU 12: upper FFU 13: lower FFU 14: lower FFU 15: carrier FFU unit 16: first carrier FFU 17: second carrier FFU 18: third carrier FFU 21: suction cup 23: baffle 25: processing nozzle 31: carrier placement unit 32: carrier transport unit 33: carrier transport robot 34: Guide rail 35: Base 36: Multi-joint arm 37: Hand 38: Electric parts group 41: Upper conveying part 41a: Upper opening 41b: Upper conveying space 42: Lower conveying part 42a: Lower opening 42b: Lower conveying space 50a: Upper substrate conveying part 50b: Lower substrate conveying part 51a: Upper conveying robot 51b: Lower conveying robot 52a: Fixed frame 52b: Fixed frame 53a: Movable frame 53b: Movable frame 54: Base 55: Rotating base 56: Arm 61a: Upper conveying space 61b: Lower conveying space 62: Opening ratio adjustment member 62a: Plate 62b: Shielding part 63: Gap 71: Upper perforated plate 72: Lower perforated plate 73: Exhaust fan 81: First rectifying section 82: Second rectifying section 83: Third rectifying section 111: Box-shaped member 112: Fan 611: Upper sidewall 611a: Upper gap forming section 612: Lower sidewall 612a: Lower gap forming section 613: Top C: Carrier TW, TW1, TW2, TW3, TW4: Tower unit W: Substrate

圖1係表示本發明之實施方式1之基板處理裝置之整體構成的立體圖。  圖2係本發明之實施方式1之基板處理裝置之分解立體圖。  圖3係表示本發明之實施方式1之基板處理裝置之內部構成的側視圖。  圖4係表示本發明之實施方式1之基板處理裝置之內部構成的俯視圖。  圖5係表示基板處理裝置之搬送塊之內部構成之側視圖。  圖6係表示基板處理裝置之傳載塊及傳送塊之立體圖。  圖7係表示本發明之實施方式1之基板處理裝置之內部構成的另一側視圖。  圖8係表示基板處理裝置之傳載塊之內部構成之前視圖。  圖9係表示基板處理裝置之搬送塊之立體圖。  圖10中,(a)係表示上段側壁部及下段側壁部之剖面之圖。(b)係表示開口率調整構件之立體圖。  圖11中,(a)係表示上段側壁部及下段側壁部之剖面之另一圖。(b)係表示開口率調整構件之另一狀態之立體圖。  圖12係將本發明之實施方式2之基板處理裝置所具備之搬送塊之一部分放大來表示之圖。  圖13係將本發明之實施方式2之基板處理裝置所具備之搬送塊之一部分放大來表示之另一圖。Figure 1 is a perspective view showing the overall structure of a substrate processing apparatus according to embodiment 1 of the present invention. Figure 2 is an exploded perspective view of the substrate processing apparatus according to embodiment 1 of the present invention. Figure 3 is a side view showing the internal structure of the substrate processing apparatus according to embodiment 1 of the present invention. Figure 4 is a top view showing the internal structure of the substrate processing apparatus according to embodiment 1 of the present invention. Figure 5 is a side view showing the internal structure of a transfer block of the substrate processing apparatus. Figure 6 is a perspective view showing a carrier block and a transfer block of the substrate processing apparatus. Figure 7 is another side view showing the internal structure of the substrate processing apparatus according to embodiment 1 of the present invention. Figure 8 is a front view showing the internal structure of the carrier block of the substrate processing apparatus. 9 is a perspective view showing a conveying block of a substrate processing apparatus.   In FIG. 10, (a) is a view showing a cross section of an upper side wall portion and a lower side wall portion. (b) is a perspective view showing an opening ratio adjusting component.   In FIG. 11, (a) is another view showing a cross section of an upper side wall portion and a lower side wall portion. (b) is a perspective view showing another state of the opening ratio adjusting component.   FIG. 12 is a view showing an enlarged portion of a conveying block provided in a substrate processing apparatus of embodiment 2 of the present invention.   FIG. 13 is another view showing an enlarged portion of a conveying block provided in a substrate processing apparatus of embodiment 2 of the present invention.

1:基板處理裝置 1: Substrate processing equipment

6:搬送塊 6: Transport block

6a:上段搬送部 6a: Upper conveying section

6b:下段搬送部 6b: Lower conveying section

11:上段FFU 11: Upper FFU

12:上段FFU 12: Upper FFU

13:下段FFU 13: Lower FFU

14:下段FFU 14: Lower FFU

61a:上段搬送空間 61a: Upper transport space

61b:下段搬送空間 61b: Lower transport space

71:上段沖孔板 71: Upper punching plate

72:下段沖孔板 72: Lower punching plate

73:排氣風扇 73:Exhaust fan

111:箱狀構件 111: Box-shaped component

112:風扇 112: Fan

Claims (13)

一種基板處理裝置,其係處理基板者,且具備:處理部,其處理上述基板;第1搬送部,其與上述處理部鄰接;第2搬送部,其與上述處理部鄰接,設置於上述第1搬送部之下方;傳載部,其進行上述基板之搬入及搬出;第1傳送部,其設置於上述傳載部與上述第1搬送部之間,暫時載置上述基板;及第2傳送部,其設置於上述傳載部與上述第2搬送部之間,暫時載置上述基板;且上述第1搬送部具有:第1基板搬送部,其搬送上述基板;第1搬送空間,其收容上述第1基板搬送部;第1搬送風扇過濾單元,其設置於上述第1搬送空間之上方,自上述第1搬送空間之上方朝向下方供給氣體;第1底部,其具有複數個第1通過孔,設置於上述第1搬送空間之下方;及第1側壁部,其與上述處理部鄰接;上述第2搬送部具有:第2基板搬送部,其搬送上述基板;第2搬送空間,其收容上述第2基板搬送部;第2搬送風扇過濾單元,其設置於上述第1底部之下方,自上述第2搬 送空間之上方朝向下方供給氣體;第2底部,其具有複數個第2通過孔,設置於上述第2搬送空間之下方;排氣風扇,其設置於上述第2底部之下方,將通過上述複數個第2通過孔之氣體排出;及第2側壁部,其與上述處理部鄰接且設置於上述第1側壁部之下方;且上述第1側壁部與上述第2側壁部之至少一者進而具有於上述第1側壁部與上述第2側壁部之間形成間隙的間隙形成部;上述第1搬送部與上述第2搬送部之至少一者進而具有調整上述間隙之開口率的開口率調整構件;上述傳載部具有:傳載搬送部,其進行上述基板之搬入及搬出;傳載空間,其收容上述傳載搬送部;以及傳載風扇過濾單元部,其設置於上述傳載空間之上方,自上述傳載空間之上方朝向下方供給氣體。 A substrate processing device, which processes substrates, comprises: a processing unit, which processes the substrates; a first conveying unit, which is adjacent to the processing unit; a second conveying unit, which is adjacent to the processing unit and is disposed below the first conveying unit; a transfer unit, which carries in and carries out the substrates; the first conveying unit, which is disposed between the transfer unit and the first conveying unit and temporarily carries the substrates; and the second conveying unit, which is disposed between the transfer unit and the second conveying unit and temporarily carries the substrates; and the first The conveying part comprises: a first substrate conveying part, which conveys the substrate; a first conveying space, which accommodates the first substrate conveying part; a first conveying fan filter unit, which is arranged above the first conveying space and supplies gas from the top to the bottom of the first conveying space; a first bottom, which has a plurality of first through holes, and is arranged below the first conveying space; and a first side wall part, which is adjacent to the processing part; the second conveying part comprises: a second substrate conveying part, which conveys the substrate; a second conveying space, which The second substrate conveying section is provided to accommodate the second substrate conveying section; the second conveying fan filter unit is provided below the first bottom and supplies gas from the upper part of the second conveying space to the lower part; the second bottom has a plurality of second through holes and is provided below the second conveying space; the exhaust fan is provided below the second bottom and exhausts the gas passing through the plurality of second through holes; and the second side wall is adjacent to the processing section and provided below the first side wall; and the first side wall is connected to the second At least one of the sidewalls further comprises a gap forming portion for forming a gap between the first sidewall and the second sidewall; at least one of the first conveying portion and the second conveying portion further comprises an opening ratio adjusting member for adjusting the opening ratio of the gap; the carrier portion comprises: a carrier conveying portion for carrying in and out the substrate; a carrier space for accommodating the carrier conveying portion; and a carrier fan filter unit portion, which is disposed above the carrier space and supplies gas from the top of the carrier space to the bottom. 如請求項1之基板處理裝置,其中上述第1搬送部具有複數個上述第1搬送風扇過濾單元。 A substrate processing device as claimed in claim 1, wherein the first transport section has a plurality of the first transport fan filter units. 如請求項2之基板處理裝置,其中上述第1基板搬送部包含在上述第1搬送空間內移動之第1搬送機器人,且上述複數個第1搬送風扇過濾單元以覆蓋上述第1搬送機器人之移動 範圍之方式配置。 A substrate processing device as claimed in claim 2, wherein the first substrate transport unit includes a first transport robot moving in the first transport space, and the plurality of first transport fan filter units are arranged in a manner to cover the moving range of the first transport robot. 如請求項1之基板處理裝置,其中上述第2搬送部具有複數個上述第2搬送風扇過濾單元。 A substrate processing device as claimed in claim 1, wherein the second transport section has a plurality of the second transport fan filter units. 如請求項4之基板處理裝置,其中上述第2基板搬送部包含在上述第2搬送空間內移動之第2搬送機器人,且上述複數個第2搬送風扇過濾單元以覆蓋上述第2搬送機器人之移動範圍之方式配置。 A substrate processing device as claimed in claim 4, wherein the second substrate transport unit includes a second transport robot moving in the second transport space, and the plurality of second transport fan filter units are arranged in a manner to cover the moving range of the second transport robot. 如請求項1至5中任一項之基板處理裝置,其中上述第1搬送部進而具有設置於上述第1底部之第1整流部,且上述第1整流部對通過上述複數個第1通過孔之氣體進行整流。 A substrate processing device as claimed in any one of claims 1 to 5, wherein the first conveying unit further comprises a first rectifying unit disposed at the first bottom, and the first rectifying unit rectify the gas passing through the plurality of first through holes. 如請求項1至5中任一項之基板處理裝置,其中上述第2搬送風扇過濾單元具有風扇、支持上述風扇之箱狀構件、及設置於上述箱狀構件之第2整流部,且上述第2整流部對通過上述複數個第1通過孔之氣體進行整流。 A substrate processing device as claimed in any one of claims 1 to 5, wherein the second transport fan filter unit has a fan, a box-shaped component supporting the fan, and a second rectifying section disposed on the box-shaped component, and the second rectifying section rectify the gas passing through the plurality of first through holes. 如請求項1至5中任一項之基板處理裝置,其中上述第2搬送部進而具有:頂部,其供設置上述第2搬送風扇過濾單元;及第3整流部,其設置於上述頂部;且 上述第3整流部對通過上述複數個第1通過孔之氣體進行整流。 A substrate processing device as claimed in any one of claims 1 to 5, wherein the second transport unit further comprises: a top portion for mounting the second transport fan filter unit; and a third rectifying unit disposed on the top portion; and the third rectifying unit rectifying the gas passing through the plurality of first through holes. 如請求項1至5中任一項之基板處理裝置,其中上述傳載風扇過濾單元部具有:第1傳載風扇過濾單元,其配置於與上述第1傳送部及上述第2傳送部側相反之側;及第2傳載風扇過濾單元,其配置於上述第1傳送部及上述第2傳送部側。 A substrate processing device as claimed in any one of claims 1 to 5, wherein the carrier fan filter unit has: a first carrier fan filter unit, which is arranged on the side opposite to the first conveying part and the second conveying part; and a second carrier fan filter unit, which is arranged on the side of the first conveying part and the second conveying part. 如請求項9之基板處理裝置,其中上述傳載部進而具有:第1開口,其與上述第1傳送部連通;及第2開口,其設置於上述第1開口之下方,與上述第2傳送部連通;且上述傳載風扇過濾單元部進而具有第3傳載風扇過濾單元,自正面觀察上述第1開口及上述第2開口時,上述第3傳載風扇過濾單元配置於上述第1傳載風扇過濾單元及上述第2傳載風扇過濾單元之一側方。 As in claim 9, the substrate processing device, wherein the carrier part further comprises: a first opening, which is connected to the first conveying part; and a second opening, which is arranged below the first opening and is connected to the second conveying part; and the carrier fan filter unit part further comprises a third carrier fan filter unit, and when the first opening and the second opening are observed from the front, the third carrier fan filter unit is arranged on one side of the first carrier fan filter unit and the second carrier fan filter unit. 如請求項10之基板處理裝置,其中上述傳載空間包含:第1傳載空間;及第2傳載空間,其於自正面觀察上述第1開口及上述第2開口時,位於上述第1傳載空間之一側方;且上述第1傳載空間之最上部位於較上述第2傳載空間之最上部更靠上方,上述第1傳載風扇過濾單元及上述第2傳載風扇過濾單元自上述第1傳 載空間之上方朝向下方供給氣體,上述第3傳載風扇過濾單元自上述第2傳載空間之上方朝向下方供給氣體。 The substrate processing device of claim 10, wherein the transfer space includes: a first transfer space; and a second transfer space, which is located on one side of the first transfer space when the first opening and the second opening are observed from the front; and the uppermost portion of the first transfer space is located higher than the uppermost portion of the second transfer space, the first transfer fan filter unit and the second transfer fan filter unit supply gas from the upper part of the first transfer space to the lower part, and the third transfer fan filter unit supplies gas from the upper part of the second transfer space to the lower part. 如請求項10之基板處理裝置,其中上述傳載搬送部包含:傳載搬送機器人,其搬送上述基板;及導軌,其於上下方向上引導上述傳載搬送機器人;且上述第3傳載風扇過濾單元於自正面觀察上述第1開口及上述第2開口時,配置於與上述導軌側相反之側。 The substrate processing device of claim 10, wherein the carrier and transport section includes: a carrier and transport robot that transports the substrate; and a guide rail that guides the carrier and transport robot in the up and down directions; and the third carrier fan filter unit is disposed on the side opposite to the guide rail side when the first opening and the second opening are observed from the front. 如請求項1至5中任一項之基板處理裝置,其中上述排氣風扇產生自上述傳載空間經由上述第2傳送部流向上述第2搬送空間之氣流。 A substrate processing device as claimed in any one of claims 1 to 5, wherein the exhaust fan generates an airflow from the transfer space through the second transfer section to the second transfer space.
TW112102577A 2020-07-29 2021-07-19 Substrate processing apparatus TWI841206B (en)

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JP2020128239A JP2022025427A (en) 2020-07-29 2020-07-29 Substrate processing apparatus
JP2020-128239 2020-07-29

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TWI841206B true TWI841206B (en) 2024-05-01

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Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040144316A1 (en) 2003-01-24 2004-07-29 Soo-Woong Lee Apparatus for processing a substrate

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040144316A1 (en) 2003-01-24 2004-07-29 Soo-Woong Lee Apparatus for processing a substrate

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