TWI826497B - Template for supporting mask and producing methoe thereof and producing method of mask integrated frame - Google Patents

Template for supporting mask and producing methoe thereof and producing method of mask integrated frame Download PDF

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Publication number
TWI826497B
TWI826497B TW108127575A TW108127575A TWI826497B TW I826497 B TWI826497 B TW I826497B TW 108127575 A TW108127575 A TW 108127575A TW 108127575 A TW108127575 A TW 108127575A TW I826497 B TWI826497 B TW I826497B
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mask
frame
template
metal film
manufacturing
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TW108127575A
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Chinese (zh)
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TW202020930A (en
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李炳一
李裕進
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南韓商Tgo科技股份有限公司
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
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  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Electroluminescent Light Sources (AREA)

Abstract

本發明是關於遮罩支撑模板與其製造方法及框架一體 型遮罩的製造方法。 The present invention relates to the integration of a mask support template, its manufacturing method and its frame. Method of manufacturing type mask.

本發明涉及的遮罩支撑模板的製造 方法,該模板(template)用於支撑OLED像素形成用遮罩並使其與框架對應,其中該方法包括以下步驟:(a)提供遮罩金屬膜;(b)將遮罩金屬膜黏合到一面形成有臨時黏合部的模板上;以及(c)在遮罩金屬膜上形成遮罩圖案,以製造遮罩。 Manufacturing of mask support templates related to the present invention Method, the template is used to support the OLED pixel forming mask and make it correspond to the frame, wherein the method includes the following steps: (a) providing a mask metal film; (b) bonding the mask metal film to one side on the template formed with the temporary adhesive portion; and (c) forming a mask pattern on the mask metal film to manufacture the mask.

Description

遮罩支撑模板與其製造方法及框架一體型遮罩的製造方法 Mask support template, method for manufacturing same, and method for manufacturing frame-integrated mask

本發明是關於遮罩支撑模板與其製造方法及框架一體型遮罩的製造方法。更加詳細而言,可以使遮罩不發生變形且可以穩定地得到支撐並移動,遮罩與框架形成一體時,能夠改善遮罩與框架的黏著性,且使各個遮罩之間的對準(align)精確的遮罩支撑模板與其製造方法及框架一體型遮罩的製造方法。 The present invention relates to a mask support template, a manufacturing method thereof, and a method for manufacturing a frame-integrated mask. More specifically, the mask can be stably supported and moved without deformation. When the mask and the frame are integrated, the adhesion between the mask and the frame can be improved, and the alignment between the masks can be improved ( align) accurate mask support template and its manufacturing method, as well as the manufacturing method of the frame-integrated mask.

作為OLED製造工藝中形成像素的技術,主要使用FMM(Fine Metal Mask)方法,該方法將薄膜形式的金屬遮罩(Shadow Mask,陰影遮罩)緊貼於基板並且在所需位置上沉積有機物。 As a technology for forming pixels in the OLED manufacturing process, the FMM (Fine Metal Mask) method is mainly used. This method attaches a metal mask (Shadow Mask) in the form of a thin film to the substrate and deposits organic matter at the desired location.

在現有的OLED製造工藝中,將遮罩製造成條狀、板狀等之後,將遮罩焊接固定到OLED像素沉積框架並使用。一個遮罩上可以具備與一個顯示器對應的多個單元。另外,為了製造大面積OLED,可將多個遮罩固定於OLED像素沉積框架,在固定於框架的過程中,拉伸各個遮罩,以使其變得平坦。調節拉伸力以使遮 罩的整體部分變得平坦是非常困難的作業。特別是,為了使各個單元全部變得平坦,同時對準尺寸僅為數μm至數十μm的遮罩圖案,需要微調施加到遮罩各側的拉伸力並且實時確認對準狀態的高度作業要求。 In the existing OLED manufacturing process, after the mask is manufactured into a strip shape, a plate shape, etc., the mask is welded and fixed to the OLED pixel deposition frame and used. A mask can have multiple units corresponding to one display. In addition, in order to manufacture large-area OLEDs, multiple masks can be fixed to the OLED pixel deposition frame. During the process of fixing to the frame, each mask is stretched to make it flat. Adjust the stretch force to cover Flattening the entire cover is a very difficult task. In particular, in order to make each unit flat while aligning a mask pattern with a size of only a few μm to tens of μm, it requires a high level of work to fine-tune the tensile force applied to each side of the mask and confirm the alignment status in real time. .

儘管如此,在將多個遮罩固定於一個框架過程中,仍然存在遮罩之間以及遮罩單元之間對準不好的問題。另外,在將遮罩焊接固定於框架的過程中,遮罩膜的厚度過薄且面積大,因此存在遮罩因荷重而下垂或者扭曲的問題,以及焊接過程中因焊接部分發生的皺紋、毛邊(burr)等使遮罩單元的對準錯開的問題等。 Nonetheless, in fixing multiple masks to a frame, there is still the problem of poor alignment between masks and between mask units. In addition, during the process of welding and fixing the mask to the frame, the thickness of the mask film is too thin and the area is large. Therefore, there are problems such as the mask sagging or twisting due to the load, and wrinkles and burrs caused by the welded parts during the welding process. (burr) and other problems that cause the alignment of the mask unit to shift.

在超高清的OLED中,現有的QHD(Quarter High Definition)畫質為500-600PPI(pixel per inch),像素的尺寸達到約30-50μm,而4K UHD(Ultra High Definition)、8K UHD高清具有比之更高的~860PPI,~1600PPI等的解析度。如此,考慮到超高清的OLED的像素尺寸,需要將各單元之間的對準誤差縮減為數μm程度,超出這一誤差將導致産品的不良,所以産率可能極低。因此,需要開發能夠防止遮罩的下垂或者扭曲等變形並且使對準精確的技術,以及將遮罩固定於框架的技術等。 Among ultra-high definition OLEDs, the existing QHD (Quarter High Definition) picture quality is 500-600PPI (pixel per inch), and the pixel size reaches about 30-50 μm, while 4K UHD (Ultra High Definition) and 8K UHD have higher than The higher resolution is ~860PPI, ~1600PPI, etc. In this way, considering the pixel size of ultra-high-definition OLED, the alignment error between each unit needs to be reduced to a few μm. Exceeding this error will lead to product defects, so the yield may be extremely low. Therefore, there is a need to develop technology that can prevent deformation such as sagging or twisting of the mask and achieve accurate alignment, as well as technology that can fix the mask to the frame, and the like.

因此,本發明是為瞭解决上述現有技術中的問題而提出的,使遮罩不發生變形且可以穩定地支撑並使其移動的遮罩支撑模板與其製造方法。 Therefore, the present invention has been proposed in order to solve the above-mentioned problems in the prior art, and provides a mask support template that can stably support and move the mask without deformation, and a method for manufacturing the same.

又,本發明的目的在於提供一種將遮罩黏合於框架上時能夠改善遮罩與框架的黏著性的遮罩支撑模板與其製造方法。 Furthermore, an object of the present invention is to provide a mask support template and a manufacturing method thereof that can improve the adhesion between the mask and the frame when the mask is bonded to the frame.

又,本發明的目的在於提供一種將遮罩黏合到框架上之後可反復使用的遮罩支撑模板與其製造方法。 Furthermore, an object of the present invention is to provide a mask support template and a manufacturing method thereof that can be used repeatedly after the mask is bonded to the frame.

又,本發明的目的在於提供一種遮罩與框架可構成一體型構造之框架一體型遮罩的製造方法。 Another object of the present invention is to provide a method for manufacturing a frame-integrated mask in which the mask and the frame can form an integrated structure.

又,本發明的目的在於提供一種防止遮罩下垂或扭曲等的變形,並且可準確地進行對準之框架一體型遮罩的製造方法。 Furthermore, an object of the present invention is to provide a method for manufacturing a frame-integrated mask that prevents deformation such as sagging or twisting of the mask and enables accurate alignment.

又,本發明的目的在於提供一種明顯縮短製造時間,並且使産率顯著提升之框架一體型遮罩的製造方法。 Furthermore, an object of the present invention is to provide a method for manufacturing a frame-integrated mask that significantly shortens the manufacturing time and significantly improves the productivity.

本發明的上述目的藉由一種遮罩支撑模板的製造方法達成,該模板(template)用於支撐OLED像素形成用遮罩並使其與框架對應,該方法包括以下步驟:(a)提供遮罩金屬膜;(b)將遮罩金屬膜黏合到一面形成有臨時黏合部的模板上;以及(c)在遮罩金屬膜上形成遮罩圖案,以製造遮罩。 The above object of the present invention is achieved by a method of manufacturing a mask support template, which is used to support the mask for forming OLED pixels and make it correspond to the frame. The method includes the following steps: (a) providing the mask Metal film; (b) bonding the mask metal film to a template with a temporary adhesive portion formed on one side; and (c) forming a mask pattern on the mask metal film to manufacture the mask.

步驟(b)與步驟(c)之間還可包括用於縮减黏合於模板上的遮罩金屬膜的厚度的步驟。 A step of reducing the thickness of the mask metal film adhered to the template may also be included between steps (b) and (c).

通過電鑄生成遮罩金屬膜時,步驟(a)可包括:(a1)在導電性單晶基材的至少一面形成遮罩金屬膜的步驟;以及(a2)從導 電性單晶基材分離遮罩金屬膜的步驟。 When the mask metal film is formed by electroforming, step (a) may include: (a1) forming a mask metal film on at least one side of the conductive single crystal substrate; and (a2) forming the mask metal film from the conductive single crystal substrate. The step of separating the mask metal film from the electrical single crystal substrate.

臨時黏合部可以是藉由加熱可分離的黏合劑或者黏合片材;藉由照射UV可分離的黏合劑或者黏合片材。 The temporary adhesive part can be an adhesive or an adhesive sheet that is detachable by heating; an adhesive or an adhesive sheet that is detachable by irradiating UV.

步驟(c)可包括:(c1)在遮罩金屬膜上形成圖案化的絕緣部的步驟;(c2)蝕刻從絕緣部之間露出的遮罩金屬膜的部分以形成遮罩圖案的步驟;以及(c3)去除絕緣部的步驟。 Step (c) may include: (c1) forming a patterned insulating portion on the mask metal film; (c2) etching a portion of the mask metal film exposed from between the insulating portions to form a mask pattern; and (c3) the step of removing the insulating portion.

臨時黏合部可於模板一整個面的上形成,遮罩金屬膜於整個臨時黏合部上黏合。 The temporary bonding part can be formed on an entire surface of the template, and the masking metal film is bonded on the entire temporary bonding part.

模板可包括晶圓、玻璃(glass)、氧化矽(silica)、耐熱玻璃、石英(quartz)、氧化鋁(Al2O3)、硼矽酸玻璃(borosilicate glass)、氧化鋯(zirconia)中的任意一種材料。 The template may include any material among wafer, glass, silica, heat-resistant glass, quartz, aluminum oxide (Al2O3), borosilicate glass, and zirconia. .

另外,本發明的上述目的藉由一種遮罩支撐模板達成,其支撐OLED像素形成用遮罩並使其與框架對應,該模板包括:一模板;一臨時黏合部,其形成於模板上;以及一遮罩,其藉由夾設臨時黏合部黏合到模板上,且形成有遮罩圖案。 In addition, the above object of the present invention is achieved by a mask support template that supports the mask for forming OLED pixels and makes it correspond to the frame. The template includes: a template; a temporary adhesive portion formed on the template; and A mask is bonded to the template by sandwiching a temporary adhesive part, and forms a mask pattern.

臨時黏合部可以是藉由加熱可分離的黏合劑或者黏合片材;藉由照射UV可分離的黏合劑或者黏合片材。 The temporary adhesive part can be an adhesive or an adhesive sheet that is detachable by heating; an adhesive or an adhesive sheet that is detachable by irradiating UV.

模板與遮罩的焊接部對應的部分可形成有鐳射貫穿孔。 A laser through hole may be formed in a portion of the template corresponding to the welding portion of the mask.

臨時黏合部可於模板一整個面上形成,遮罩金屬膜可於整個臨時黏合部上黏合。 The temporary bonding part can be formed on the entire surface of the template, and the masking metal film can be bonded on the entire temporary bonding part.

模板可包括晶圓、玻璃(glass)、氧化矽(silica)、耐熱 玻璃、石英(quartz)、氧化鋁(Al2O3)、硼矽酸玻璃(borosilicate glass)、氧化鋯(zirconia)中的任意一種材料。 The template may include wafers, glass, silica, heat-resistant glass, quartz, aluminum oxide (Al 2 O 3 ), borosilicate glass, zirconia. Any kind of material.

遮罩可包括形成有多個遮罩圖案的遮罩單元與遮罩單元周邊的虛設部。 The mask may include a mask unit formed with a plurality of mask patterns and a dummy portion around the mask unit.

另外,本發明的上述目的藉由一種框架一體型遮罩的製造方法達成,其使至少一個遮罩與用於支撐遮罩的框架形成為一體,該方法包括以下步驟:(a)提供遮罩金屬膜;(b)將遮罩金屬膜黏合到一面形成有臨時黏合部的模板上;(c)在遮罩金屬膜上形成遮罩圖案,以製造遮罩;(d)提供具有至少一個遮罩單元區域的框架;(e)將模板裝載於框架上,以使遮罩與框架的遮罩單元區域對應;以及(f)向遮罩的焊接部照射鐳射,以使遮罩黏合到框架上。 In addition, the above object of the present invention is achieved by a method for manufacturing a frame-integrated mask, which integrates at least one mask with a frame for supporting the mask. The method includes the following steps: (a) providing the mask Metal film; (b) bonding the mask metal film to a template with a temporary adhesive portion formed on one side; (c) forming a mask pattern on the mask metal film to manufacture the mask; (d) providing a mask with at least one mask the frame of the mask unit area; (e) loading the template on the frame so that the mask corresponds to the mask unit area of the frame; and (f) irradiating the laser to the welding portion of the mask to bond the mask to the frame .

步驟(d)可包括:(d1)提供包含中空區域的邊緣框架部;(d2)將平面狀的遮罩單元片材部連接於邊緣框架部;以及(d3)在遮罩單元片材部形成多個遮罩單元區域,以製造框架。 Step (d) may include: (d1) providing an edge frame part including a hollow area; (d2) connecting a planar mask unit sheet part to the edge frame part; and (d3) forming a frame on the mask unit sheet part Multiple mask unit areas to create a frame.

步驟(d)可包括:(d1)提供包含中空區域的邊緣框架部;以及(d2)將具有多個遮罩單元區域的遮罩單元片材部連接到邊緣框架部,以製造框架。 Step (d) may include: (d1) providing an edge frame part including a hollow area; and (d2) connecting a mask unit sheet part having a plurality of mask unit areas to the edge frame part to manufacture a frame.

臨時黏合部可以是藉由加熱可分離的黏合劑或者黏合片材;藉由照射UV可分離的黏合劑或者黏合片材。 The temporary adhesive part may be an adhesive or an adhesive sheet that is detachable by heating; an adhesive or an adhesive sheet that is detachable by irradiating UV.

照射到模板上部的鐳射可穿過鐳射貫穿孔並照射到遮罩的焊接部。 The laser irradiated to the upper part of the template can pass through the laser through hole and irradiate the welding part of the mask.

還可包括在步驟(f)之後對臨時黏合部進行加熱、化學處理、施加超聲波、施加UV中的任意一個,藉以分離遮罩與模板的步驟。 It may also include the step of heating, chemically treating, applying ultrasonic waves, or applying UV to the temporarily bonded portion after step (f) to separate the mask and the template.

遮罩與框架可以是恆範鋼(invar)、超恆範鋼(super invar)、鎳、鎳-鈷中任意一種材料。 The mask and frame can be made of any material including invar, super invar, nickel, or nickel-cobalt.

根據如上構成的本發明,可以使遮罩不發生變形且可以穩定地得到支撐並移動。 According to the present invention configured as above, the mask can be stably supported and moved without deformation.

又,根據本發明,將遮罩黏合到框架上時,能夠改善遮罩與框架的黏著性。 Furthermore, according to the present invention, when the mask is bonded to the frame, the adhesion between the mask and the frame can be improved.

又,根據本發明,將遮罩黏合於框架上之後可反復使用。 Furthermore, according to the present invention, the mask can be used repeatedly after being bonded to the frame.

又,根據本發明,遮罩與框架可構成一體型結構。 Furthermore, according to the present invention, the cover and the frame can form an integrated structure.

又,根據本發明,可防止遮罩下垂或扭曲等的變形,並且可準確地進行對準。 Furthermore, according to the present invention, it is possible to prevent the mask from deforming such as sagging or twisting, and to accurately align the mask.

又,根據本發明,可使製造時間顯著地縮短,且使 產率顯著上昇。 Furthermore, according to the present invention, the manufacturing time can be significantly shortened, and the Yield increased significantly.

50:模板(template) 50: template

51:鐳射貫穿孔 51:Laser through hole

55:臨時黏合部 55: Temporary bonding part

70:下部支撐體 70:Lower support body

100:遮罩 100:mask

110:遮罩膜 110: Masking film

200:框架 200:Frame

210:邊緣框架部 210: Edge frame part

220:遮罩單元片材部 220: Mask unit sheet part

221:邊緣片材部 221: Edge sheet part

223:第一柵格片材部 223: The first grid sheet department

225:第二柵格片材部 225: Second grid sheet part

1000:OLED像素沉積裝置 1000:OLED pixel deposition device

C:單元、遮罩單元 C: unit, mask unit

CM:化學處理 CM: chemical treatment

CR:遮罩單元區域 CR: Mask unit area

DM:虛設部、遮罩虛設部 DM: Dummy part, mask dummy part

ET:加熱 ET: heating

L:鐳射 L:Laser

R:邊緣框架部的中空區域 R: Hollow area of edge frame part

P:遮罩圖案 P: Mask pattern

US:施加超聲波 US: Apply ultrasonic waves

UV:施加UV UV: Apply UV

W:焊接 W: welding

WB:焊接焊珠 WB: welding beads

圖1是示出現有的OLED像素沉積用遮罩的概略圖。 FIG. 1 is a schematic diagram showing a conventional mask for OLED pixel deposition.

圖2是示出現有的將遮罩黏合到框架的過程的概略圖。 Figure 2 is a schematic diagram illustrating a conventional process of bonding a mask to a frame.

圖3是示出在現有的拉伸遮罩的過程中,發生單元之間的對準誤差的概略圖。 FIG. 3 is a schematic diagram illustrating the occurrence of alignment errors between units in a conventional stretching mask process.

圖4是示出本發明的一實施例涉及的框架一體型遮罩的主視圖以及側截面圖。 4 is a front view and a side cross-sectional view showing a frame-integrated cover according to an embodiment of the present invention.

圖5是示出本發明的一實施例涉及的框架的主視圖以及側截面圖。 5 is a front view and a side cross-sectional view showing the frame according to the embodiment of the present invention.

圖6是示出本發明的一實施例涉及的框架製造過程的概略圖。 FIG. 6 is a schematic diagram showing a frame manufacturing process according to an embodiment of the present invention.

圖7是示出本發明的另一實施例涉及的框架的製造過程的概略圖。 7 is a schematic diagram showing a manufacturing process of a frame according to another embodiment of the present invention.

圖8是示出現有的用於形成高解析度OLED的遮罩的概略圖。 FIG. 8 is a schematic diagram showing a conventional mask used to form a high-resolution OLED.

圖9是示出本發明的一實施例涉及的遮罩的概略圖。 FIG. 9 is a schematic diagram showing a mask according to an embodiment of the present invention.

圖10是示出本發明的一實施例涉及的以壓延(rolling)方式製造遮罩金屬膜的過程的概略圖。 FIG. 10 is a schematic diagram illustrating a process of manufacturing a mask metal film by rolling according to an embodiment of the present invention.

圖11是示出本發明的另一實施例涉及的以電鑄(electroforming)方式製造遮罩金屬膜的過程的概略圖。 FIG. 11 is a schematic diagram illustrating a process of manufacturing a mask metal film by electroforming according to another embodiment of the present invention.

圖12至圖13是示出本發明的一實施例涉及的將遮罩金屬膜黏合於模板上並形成遮罩以製造遮罩支撑模板的過程的概略圖。 12 to 13 are schematic diagrams illustrating a process of bonding a mask metal film to a template and forming a mask to manufacture a mask supporting template according to an embodiment of the present invention.

圖14是示出本發明的一實施例涉及的臨時黏合部的放大截面的概略圖。 FIG. 14 is a schematic diagram showing an enlarged cross-section of a temporary bonding portion according to an embodiment of the present invention.

圖15是示出本發明的一實施例涉及的將遮罩支撑模板裝載於框架上的過程的概略圖。 FIG. 15 is a schematic diagram illustrating a process of loading the mask support template on the frame according to an embodiment of the present invention.

圖16是示出本發明一實施例涉及的將模板裝載於框架上以使遮罩與框架的單元區域對應的狀態的概略圖。 16 is a schematic diagram illustrating a state in which a template is mounted on a frame so that a mask corresponds to a unit area of the frame according to an embodiment of the present invention.

圖17是示出本發明的一實施例涉及的將遮罩黏合於框架上之後分離遮罩與模板的過程的概略圖。 FIG. 17 is a schematic diagram illustrating the process of separating the mask and the template after the mask is bonded to the frame according to an embodiment of the present invention.

圖18是示出本發明的一實施例涉及的將遮罩黏合於框架上的狀態的概略圖。 FIG. 18 is a schematic diagram showing a state in which the mask is bonded to the frame according to an embodiment of the present invention.

圖19是示出本發明的一實施例涉及的利用框架一體型遮罩的OLED像素沉積裝置的概略圖。 FIG. 19 is a schematic diagram illustrating an OLED pixel deposition apparatus using a frame-integrated mask according to an embodiment of the present invention.

後述的對於本發明的詳細說明將參照附圖,該附圖將能夠實施本發明的特定實施例作為示例示出。充分詳細地說明這些實施例,以使所屬技術領域中具有通常知識者能夠實施本發明。應當理解,本發明的各種實施例雖然彼此不同,但是並非相互排斥。例如,在此記載的特定形狀、結構及特性與一實施例有關,在不脫離本發明的精神及範圍的情況下,能夠實現為其他實施例。另外,應當理解,各個公開的實施例中的個別構成要素的位置或配置,在不脫離本發明的精神及範圍的情況下,能夠進行變更。因此,後述的詳細說明不應被視為具有限制意義,只要適當地說明,則本發明的範圍僅由所附的申請專利範圍及與其等同的所有範圍限定。圖式中相似的符號從多方面表示相同或相似的功能,為了方便起見,長度、面積、厚度及其形狀可以誇大表示。 The following detailed description of the invention will be described with reference to the accompanying drawings, which illustrate by way of example specific embodiments in which the invention can be practiced. These embodiments are described in sufficient detail to enable those skilled in the art to practice the invention. It should be understood that the various embodiments of the invention, while different from each other, are not mutually exclusive. For example, the specific shapes, structures, and characteristics described here relate to one embodiment, and can be implemented in other embodiments without departing from the spirit and scope of the invention. In addition, it should be understood that the positions or arrangements of individual components in each disclosed embodiment can be changed without departing from the spirit and scope of the present invention. Therefore, the following detailed description should not be regarded as limiting, and as long as it is properly stated, the scope of the present invention is limited only by the appended claims and all equivalents thereto. Similar symbols in the drawings represent the same or similar functions in many aspects. For convenience, the length, area, thickness and shape can be exaggerated.

以下,將參照圖式對本發明的優選實施例進行詳細 說明,以便所屬技術領域中具有通常知識者能夠容易地實施本發明。 Below, preferred embodiments of the present invention will be described in detail with reference to the drawings. Description is provided so that those skilled in the art can easily implement the present invention.

圖1是示出現有的OLED像素沉積用遮罩的概略圖。 FIG. 1 is a schematic diagram showing a conventional mask for OLED pixel deposition.

參照圖1,現有的遮罩10可以以條式(Stick-Type)或者板式(Plate-Type)製造。圖1的(a)中示出的遮罩10作為條式遮罩,可以將條的兩側焊接固定於OLED像素沉積框架並使用。圖1的(b)中示出的遮罩100作為板式(Plate-Type)遮罩,可以使用於大面積的像素形成工藝。 Referring to FIG. 1 , the existing mask 10 can be manufactured in a stick-type or a plate-type. The mask 10 shown in (a) of FIG. 1 is a strip mask, and can be used by welding and fixing both sides of the strip to the OLED pixel deposition frame. The mask 100 shown in (b) of FIG. 1 is a plate-type mask and can be used in a large-area pixel forming process.

遮罩10的主體(Body,或者遮罩膜11)具備多個顯示單元C。一個單元C與智慧手機等的一個顯示器(display)對應。單元C中形成有像素圖案P,以便與顯示器的各個像素對應。放大單元C時,顯示與R、G、B對應的多個像素圖案P。作為一例,在單元C中形成有像素圖案P,以便具有70×140解析度。即,大量的像素圖案P形成集合,以構成一個單元C,並且多個單元C可以形成於遮罩10。 The main body (Body, or mask film 11) of the mask 10 is provided with a plurality of display units C. One unit C corresponds to one display (display) of a smartphone or the like. A pixel pattern P is formed in the cell C so as to correspond to each pixel of the display. When unit C is enlarged, multiple pixel patterns P corresponding to R, G, and B are displayed. As an example, the pixel pattern P is formed in the unit C so as to have a resolution of 70×140. That is, a large number of pixel patterns P form a set to constitute one unit C, and a plurality of units C may be formed on the mask 10 .

圖2是示出現有的將遮罩10黏合於框架20的過程的概略圖。圖3是示出在現有的拉伸F1~F2遮罩10的過程中發生單元之間的對準誤差的概略圖。以圖1的(a)示出的具備6個單元C(C1~C6)的條式遮罩10為例進行說明。 FIG. 2 is a schematic diagram showing a conventional process of bonding the mask 10 to the frame 20 . FIG. 3 is a schematic diagram illustrating the alignment error between units that occurs during stretching of the conventional masks F1 to F2 10 . An explanation will be given taking the strip mask 10 including six units C (C1 to C6) shown in FIG. 1(a) as an example.

參照圖2的(a),首先,應將條式遮罩10平坦地展開。沿著條式遮罩10的長軸方向施加拉伸力F1~F2,隨著拉伸,展開條式遮罩10。在該狀態下,將條式遮罩10裝載於方框形狀的框架20 上。條式遮罩10的單元C1~C6將位於框架20的框內部空白區域部分。框架20的尺寸可以足以使一個條式遮罩10的單元C1~C6位於框內部空白區域,也可以足以使多個條式遮罩10的單元C1~C6位於框內部空白區域。 Referring to (a) of FIG. 2 , first, the strip mask 10 should be unfolded flatly. Tensile forces F1 to F2 are applied along the long axis direction of the strip mask 10, and as the strip mask 10 is stretched, the strip mask 10 is unfolded. In this state, the strip mask 10 is mounted on the square-shaped frame 20 superior. The units C1 to C6 of the strip mask 10 will be located in the blank area inside the frame 20 . The size of the frame 20 may be sufficient to allow units C1 to C6 of one strip mask 10 to be located in the blank area inside the frame, or may be large enough to allow units C1 to C6 of multiple strip masks 10 to be located in the blank area inside the frame.

參照圖2的(b),微調施加到條式遮罩10的各側的拉伸力F1~F2,同時對準後,隨著焊接W條式遮罩10側面的一部分,將條式遮罩10和框架20彼此連接。圖2的(c)示出彼此連接的條式遮罩10和框架的側截面。 Referring to (b) of Figure 2, fine-tune the tensile forces F1~F2 applied to each side of the strip mask 10, and after aligning at the same time, along with welding a part of the side of the strip mask 10, the strip mask 10 is 10 and frame 20 are connected to each other. (c) of FIG. 2 shows a side section of the strip mask 10 and the frame connected to each other.

參照圖3,儘管微調施加到條式遮罩10的各側的拉伸力F1~F2,但是顯示出遮罩單元C1~C3彼此之間對準不好的問題。例如,單元C1~C3的圖案P之間的距離D1~D1"、D2~D2"彼此不同,或者圖案P歪斜。由於條式遮罩10具有包括多個(作為一例,為6個)單元C1~C6的大面積,且具有數十μm的非常薄的厚度,因此容易因荷重而下垂或者扭曲。另外,調節拉伸力F1~F2,以使各個單元C1~C6全部變得平坦,同時通過顯微鏡實施確認各個單元C1~C6之間的對準狀態是非常困難的作業。 Referring to Figure 3, although the tensile forces F1~F2 applied to each side of the strip mask 10 are fine-tuned, the problem of poor alignment of the mask units C1~C3 with each other is shown. For example, the distances D1 to D1" and D2 to D2" between the patterns P of the cells C1 to C3 are different from each other, or the patterns P are skewed. Since the strip mask 10 has a large area including a plurality (for example, 6 units) of cells C1 to C6 and has a very thin thickness of several dozen μm, it is easy to sag or twist due to load. In addition, it is a very difficult task to adjust the tensile forces F1 to F2 so that all the units C1 to C6 become flat, and at the same time to confirm the alignment status of the units C1 to C6 through a microscope.

因此,拉伸力F1~F2的微小誤差可能引起條式遮罩10各單元C1~C3的拉伸或者展開程度的誤差,由此,導致遮罩圖案P之間的距離D1~D1"、D2~D2"不同。雖然完美地對準以使誤差為0是非常困難的,但是為了避免尺寸為數μm至數十μm的遮罩圖案P對超高清OLED的像素工藝造成壞影響,對準誤差優選不大於3μm。將如此相鄰的單元之間的對準誤差稱為像素定位精度(pixel position accuracy,PPA)。 Therefore, slight errors in the tensile forces F1~F2 may cause errors in the degree of stretching or unfolding of each unit C1~C3 of the strip mask 10, thus causing the distances D1~D1" and D2 between the mask patterns P. ~D2" is different. Although it is very difficult to align perfectly so that the error is 0, in order to avoid the mask pattern P with a size of several μm to tens of μm from having a bad impact on the pixel process of ultra-high-definition OLED, the alignment error is preferably no more than 3 μm. The alignment error between such adjacent units is called pixel positioning accuracy (pixel position accuracy (PPA).

另外,將大概6-20個條式遮罩10分別連接在一個框架20,同時使多個條式遮罩10之間,以及條式遮罩10的多個單元C-C6之間的對準狀態精確是非常困難的作業,並且只能增加基於對準的工藝時間,這成為降低生産性的重要理由。 In addition, approximately 6-20 strip masks 10 are connected to one frame 20 respectively, and at the same time, the alignment between the multiple strip masks 10 and the multiple units C-C6 of the strip mask 10 is achieved. State accuracy is a very difficult task and only increases the process time based on alignment, which is an important reason for lowering productivity.

另一方面,將條式遮罩10連接固定到框架20後,施加到條式遮罩10的拉伸力F1~F2能夠反向地作用於框架20。即,由於拉伸力F1~F2而繃緊拉伸的條式遮罩10連接在框架20後,能夠將張力(tension)作用於框架20。通常,該張力不大,不會對框架20產生大的影響,但是在框架20的尺寸實現小型化且剛性變低的情況下,這種張力可能使框架20細微變形。如此,可能發生破壞多個單元C~C6間的對準狀態的問題。 On the other hand, after the strip mask 10 is connected and fixed to the frame 20 , the tensile forces F1 to F2 applied to the strip mask 10 can act on the frame 20 in the opposite direction. That is, after the strip mask 10 tautly stretched by the tensile forces F1 to F2 is connected to the frame 20 , tension can be applied to the frame 20 . Normally, this tension is not large and does not have a large impact on the frame 20 . However, when the size of the frame 20 is reduced and its rigidity becomes low, this tension may slightly deform the frame 20 . In this way, a problem may occur in which the alignment state between the plurality of units C to C6 is destroyed.

鑒於此,本發明提出能夠使遮罩100與框架200形成一體式結構的框架200以及框架一體型遮罩。與框架200形成一體的遮罩100不僅防止發生下垂或者扭曲等變形,並且能夠與框架200精確地對準。當遮罩100連接到框架200時,不對遮罩100施加任何拉伸力,因此遮罩100連接到框架200後,可以不對遮罩200施加引起變形的張力。並且,能夠顯著地縮短將遮罩100一體地連接到框架200上的製造時間,並且顯著提升産率。 In view of this, the present invention proposes a frame 200 and a frame-integrated mask that enable the mask 100 and the frame 200 to form an integrated structure. The mask 100 integrated with the frame 200 not only prevents deformation such as sagging or twisting, but also can be accurately aligned with the frame 200 . When the mask 100 is connected to the frame 200, no tensile force is applied to the mask 100. Therefore, after the mask 100 is connected to the frame 200, no tension causing deformation may be applied to the mask 200. Furthermore, the manufacturing time for integrally connecting the mask 100 to the frame 200 can be significantly shortened, and the productivity can be significantly improved.

圖4是示出本發明之一實施例涉及的框架一體型遮罩的主視圖(圖4的(a))以及側截面圖(圖4的(b)),圖5是示出本發明之一實施例涉及的框架的主視圖(圖5的(a))以及側截面圖(圖5的 b)。 4 is a front view ((a) of FIG. 4) and a side cross-sectional view ((b) of FIG. 4) showing the frame-integrated cover according to one embodiment of the present invention. A front view ((a) of Fig. 5) and a side cross-sectional view ((a) of Fig. 5) of the frame according to one embodiment. b).

參照圖4以及圖5,框架一體型遮罩可以包括多個遮罩100以及一個框架200。換句話說,將多個遮罩100分別黏合於框架200的形態。以下,為了便於說明,以四角形狀的遮罩100為例進行說明,但是遮罩100在黏合於框架200之前,可以是兩側具備用於夾持的突出部的條式遮罩形狀,遮罩100黏合於框架200後,可以去除突出部。 Referring to FIGS. 4 and 5 , the frame-integrated mask may include multiple masks 100 and one frame 200 . In other words, multiple masks 100 are respectively bonded to the frame 200 . In the following, for convenience of explanation, the quadrangular mask 100 will be described as an example. However, before the mask 100 is bonded to the frame 200, it may be a strip mask shape with protrusions for clamping on both sides. After 100 is bonded to the frame 200, the protrusions can be removed.

各個遮罩100上形成有多個遮罩圖案P,一個遮罩100可以形成有一個單元C。一個遮罩單元C可以與智慧手機等的一個顯示器對應。 A plurality of mask patterns P are formed on each mask 100, and one mask 100 may be formed with one unit C. One mask unit C can correspond to one display of a smartphone or the like.

遮罩100可以是熱膨脹係數約為1.0×10-6/℃的恆範鋼(invar)或約為1.0×10-7/℃的超恆範鋼(super invar)材料。由於這種材料的遮罩100的熱膨脹係數非常低,遮罩的圖案形狀因熱能變形的可能性小,在製造高解析度的OLED中,可以用作FMM(Fine Metal Mask)、陰影遮罩(Shadow Mask)。此外,考慮到最近開發在溫度變化值不大的範圍內實施像素沉積工藝的技術,遮罩100也可以是熱膨脹係數比之略大的鎳(Ni)、鎳-鈷(Ni-Co)等材料。遮罩100可使用由壓延(rolling)工藝或者電鑄(electroforming)生成的金屬片材(sheet)。下面通過圖9及圖10具體說明。 The mask 100 may be an invar material with a thermal expansion coefficient of approximately 1.0×10 -6 /°C or a super invar material with a thermal expansion coefficient of approximately 1.0×10 -7 /°C. Since the thermal expansion coefficient of the mask 100 of this material is very low, the pattern shape of the mask is less likely to be deformed by thermal energy. In the manufacture of high-resolution OLEDs, it can be used as FMM (Fine Metal Mask), shadow mask ( Shadow Mask). In addition, considering the recent development of technology for implementing a pixel deposition process within a range of small temperature changes, the mask 100 may also be made of materials such as nickel (Ni) or nickel-cobalt (Ni-Co) with a slightly larger thermal expansion coefficient. . The mask 100 may use a metal sheet produced by a rolling process or electroforming. The following will be explained in detail using FIGS. 9 and 10 .

框架200以能夠黏合多個遮罩100的形式形成。包括最週邊邊緣在內,框架200可以包括沿著第一方向(例如,橫向)、第二方向(例如,竪向)形成的多個角部。這種多個角部可以在框架 200上劃分用於黏合遮罩100的區域。 The frame 200 is formed in a form capable of bonding a plurality of masks 100 . Including the most peripheral edge, the frame 200 may include a plurality of corners formed along a first direction (eg, transverse direction) and a second direction (eg, vertical direction). This multiple corners can be in the frame 200 is used to divide the area for gluing the mask 100.

框架200可以包括大概呈四角形狀、方框形狀的邊緣框架部210。邊緣框架部210的內部可以是中空形狀。即,邊緣框架部210可以包括中空區域R。框架200可以由恒範鋼、超恒範鋼、鋁、鈦等金屬材料形成,考慮到熱變形,優選由與遮罩具有相同熱膨脹係數的恒範鋼、超恒範鋼、鎳、鎳-鈷等材料形成,這些材料均可應用於所有作為框架200的構成要素的邊緣框架部210、遮罩單元片材部220。 The frame 200 may include an edge frame portion 210 that is generally in a quadrangular shape or a square frame shape. The inside of the edge frame part 210 may have a hollow shape. That is, the edge frame part 210 may include the hollow region R. The frame 200 can be formed of constant steel, super constant steel, aluminum, titanium and other metal materials. Considering thermal deformation, it is preferably made of constant steel, super constant steel, nickel, nickel-cobalt which has the same thermal expansion coefficient as the mask. It is formed of other materials, and these materials can be applied to all edge frame parts 210 and mask unit sheet parts 220 that are components of the frame 200 .

另外,框架200具備多個遮罩單元區域CR,並且可以包括連接到邊緣框架部210的遮罩單元片材部220。遮罩單元片材部220與遮罩100相同,可通過壓延形成,或者通過電鑄等其他的成膜工藝形成。另外,遮罩單元片材部220可以通過鐳射劃綫、蝕刻等在平面狀片材(sheet)上形成多個遮罩單元區域CR後,連接到邊緣框架部210。或者,遮罩單元片材部220可以將平面狀的片材連接到邊緣框架部210後,通過鐳射劃線、蝕刻等形成多個遮罩單元區域CR。本說明書中主要對首先在遮罩單元片材部220形成多個遮罩單元區域CR後,連接到邊緣框架部210的情況進行說明。 In addition, the frame 200 is provided with a plurality of mask unit areas CR, and may include a mask unit sheet portion 220 connected to the edge frame portion 210 . The mask unit sheet portion 220 is the same as the mask 100 and can be formed by rolling or other film forming processes such as electroforming. In addition, the mask unit sheet portion 220 can be connected to the edge frame portion 210 after forming a plurality of mask unit regions CR on a planar sheet through laser scribing, etching, or the like. Alternatively, the mask unit sheet part 220 may connect a planar sheet to the edge frame part 210 and then form a plurality of mask unit regions CR through laser scribing, etching, or the like. This description will mainly describe a case where a plurality of mask unit regions CR are first formed on the mask unit sheet portion 220 and then connected to the edge frame portion 210 .

遮罩單元片材部220可以包括邊緣片材部221以及第一柵格片材部223、第二柵格片材部225中的至少一種。邊緣片材部221以及第一柵格片材部223、第二柵格片材部225是指在同一片材上劃分的各個部分,它們彼此之間形成為一體。 The mask unit sheet part 220 may include an edge sheet part 221 and at least one of a first grid sheet part 223 and a second grid sheet part 225 . The edge sheet portion 221, the first grid sheet portion 223, and the second grid sheet portion 225 are portions divided on the same sheet, and they are formed integrally with each other.

邊緣片材部221可以實質上連接到邊緣框架部210。 因此,邊緣片材部221可以具有與邊緣框架部210對應的大致四角形狀、方框形狀。 The edge sheet portion 221 may be substantially connected to the edge frame portion 210 . Therefore, the edge sheet portion 221 may have a substantially quadrangular shape or a square frame shape corresponding to the edge frame portion 210 .

另外,第一柵格片材部223可以沿著第一方向(橫向)延伸形成。第一柵格片材部223以直綫形態形成,其兩端可以連接到邊緣片材部221。當遮罩單元片材部220包括多個第一柵格片材部223時,各個第一柵格片材部223優選具有相同的間距。 In addition, the first grid sheet portion 223 may be formed to extend along the first direction (lateral direction). The first grid sheet part 223 is formed in a straight line shape, and both ends thereof may be connected to the edge sheet part 221 . When the mask unit sheet portion 220 includes a plurality of first grid sheet portions 223, each first grid sheet portion 223 preferably has the same pitch.

另外,進一步地,第二柵格片材部225可以沿著第二方向(竪向)延伸形成,第二栅格片材部225以直綫形態形成,其兩端可以連接到邊緣片材部221。第一柵格片材部223和第二柵格片材部225可以彼此垂直交叉。當遮罩單元片材部220包括多個第二柵格片材部225時,各個第二柵格片材部225間優選具有相同的間距。 In addition, further, the second grid sheet part 225 may be formed to extend along the second direction (vertical direction). The second grid sheet part 225 may be formed in a straight line, and both ends thereof may be connected to the edge sheet part 221 . The first grid sheet part 223 and the second grid sheet part 225 may perpendicularly cross each other. When the mask unit sheet portion 220 includes a plurality of second grid sheet portions 225, each second grid sheet portion 225 preferably has the same spacing.

另一方面,第一栅格片材部223之間的間距和第二柵格片材部225之間的間距,可以根據遮罩單元C的尺寸而相同或不同。 On the other hand, the spacing between the first grid sheet parts 223 and the spacing between the second grid sheet parts 225 may be the same or different according to the size of the mask unit C.

第一柵格片材部223以及第二柵格片材部225雖然具有薄膜形態的薄的厚度,但是垂直於長度方向的截面的形狀可以是諸如矩形、平行四邊形的四邊形形狀、三角形形狀等,邊、角的一部分可以形成圓形。截面形狀可以在鐳射劃綫、蝕刻等過程中進行調節。 Although the first grid sheet part 223 and the second grid sheet part 225 have a thin thickness in the form of a film, the shape of the cross section perpendicular to the longitudinal direction may be a rectangular shape, a parallelogram quadrilateral shape, a triangular shape, etc. Parts of the sides and corners can be rounded. The cross-sectional shape can be adjusted during laser scribing, etching, etc.

邊緣框架部210的厚度可以大於遮罩單元片材部220的厚度。由於邊緣框架部210負責框架200的整體剛性,可以以數 mm至數cm的厚度形成。 The thickness of the edge frame part 210 may be greater than the thickness of the mask unit sheet part 220 . Since the edge frame portion 210 is responsible for the overall rigidity of the frame 200, it can be Thickness ranging from mm to several centimeters is formed.

就遮罩單元片材部220而言,實際上製造厚片材的工藝困難,若過厚,則有可能在OLED像素沉積工藝中有機物源600(參照圖19)堵塞通過遮罩100的路徑。相反,若過薄,則有可能難以確保足以支撐遮罩100的剛性。由此,遮罩單元片材部220優選比邊緣框架部210的厚度薄,但是比遮罩100更厚。遮罩單元片材部220的厚度可以約為0.1mm至1mm。並且,第一柵格片材部223、第二柵格片材部225的寬度可以約為1~5mm。 As for the mask unit sheet part 220, it is actually difficult to manufacture a thick sheet. If it is too thick, the organic source 600 (see FIG. 19) may block the path through the mask 100 during the OLED pixel deposition process. On the contrary, if it is too thin, it may be difficult to ensure sufficient rigidity to support the mask 100 . Therefore, the mask unit sheet portion 220 is preferably thinner than the edge frame portion 210 but thicker than the mask 100 . The thickness of the mask unit sheet portion 220 may be approximately 0.1 mm to 1 mm. In addition, the width of the first grid sheet part 223 and the second grid sheet part 225 may be approximately 1 to 5 mm.

在平面狀片材中,除了邊緣片材部221、第一柵格片材部223、第二柵格片材部225佔據的區域以外,可以提供多個遮罩單元區域CR(CR11~CR56)。從另一個角度來說,遮罩單元區域CR可以是指在邊緣框架部210的中空區域R中,除了邊緣片材部221、第一柵格片材部223、第二柵格片材部225佔據的區域以外的空白區域。 In the planar sheet, in addition to the areas occupied by the edge sheet part 221, the first grid sheet part 223, and the second grid sheet part 225, a plurality of mask unit areas CR (CR11~CR56) can be provided . From another perspective, the mask unit area CR may refer to all parts of the hollow area R of the edge frame part 210 except the edge sheet part 221 , the first grid sheet part 223 , and the second grid sheet part 225 The empty space outside the occupied area.

隨著遮罩100的單元C與該遮罩單元區域CR對應,實質上可以用作通過遮罩圖案P沉積OLED的像素的通道。如前所述,一個遮罩單元C與智慧手機等的一個顯示器對應。一個遮罩100中可以形成有用於構成一個單元C的遮罩圖案P。或者,一個遮罩100具備多個單元C且各個單元C可以與框架200的各個單元區域CR對應,但是為了精確地對準遮罩100,需要避免大面積的遮罩100,優選為具備一個單元C的小面積遮罩100。或者,也可以是具有多個單元C的一個遮罩100與遮罩200的一個單元區域CR對應。此時,為 了精確地對準,可以考慮對應具有2-3個單元C的遮罩100。 As the cell C of the mask 100 corresponds to the mask cell region CR, it can essentially serve as a channel for depositing the pixels of the OLED through the mask pattern P. As mentioned above, one mask unit C corresponds to one display of a smartphone or the like. A mask pattern P constituting one unit C may be formed in one mask 100 . Alternatively, one mask 100 has multiple units C and each unit C can correspond to each unit area CR of the frame 200. However, in order to accurately align the mask 100, it is necessary to avoid a large area of the mask 100. It is preferable to have one unit. C's small area mask 100. Alternatively, one mask 100 having a plurality of cells C may correspond to one unit region CR of the mask 200 . At this time, for For accurate alignment, a corresponding mask 100 with 2-3 cells C may be considered.

遮罩200具備多個遮罩單元區域CR,可以將各個遮罩100以各個遮罩單元C與各個遮罩單元區域CR分別對應的方式黏合。各個遮罩100可以包括形成有多個遮罩圖案P的遮罩單元C以及遮罩單元C周邊的虛擬部(相當於除了單元C以外的遮罩膜110部分)。虛擬部可以只包括遮罩膜110,或者可以包括形成有與遮罩圖案P類似形態的規定的虛擬圖案的遮罩膜110。遮罩單元C與框架200的遮罩單元區域CR對應,虛擬部的一部分或者全部可以黏合於框架200(遮罩單元片材部220)。由此,遮罩100和框架200可以形成一體式結構。 The mask 200 has a plurality of mask unit areas CR, and each mask 100 can be bonded so that each mask unit C corresponds to each mask unit area CR. Each mask 100 may include a mask unit C in which a plurality of mask patterns P are formed, and a dummy portion around the mask unit C (corresponding to a portion of the mask film 110 other than the unit C). The dummy part may include only the mask film 110, or may include the mask film 110 in which a predetermined dummy pattern having a similar form to the mask pattern P is formed. The mask unit C corresponds to the mask unit area CR of the frame 200, and part or all of the dummy part may be adhered to the frame 200 (mask unit sheet part 220). Thus, the mask 100 and the frame 200 can form an integrated structure.

另一方面,根據另一實施例,框架不是以將遮罩單元片材部220黏合於邊緣框架部210的方式製造,而是可以使用在邊緣框架部210的中空區域R部分直接形成與邊緣框架部210成為一體的柵格框架(相當於柵格片材部223、225)的框架。這種形態的框架也包括至少一個遮罩單元區域CR,可以使遮罩100與遮罩單元區域CR對應,以製造框架一體型遮罩。 On the other hand, according to another embodiment, the frame is not manufactured by bonding the mask unit sheet portion 220 to the edge frame portion 210 , but can be directly formed with the edge frame using the hollow region R portion of the edge frame portion 210 The part 210 becomes a frame of an integrated grid frame (corresponding to the grid sheet parts 223 and 225). The frame of this form also includes at least one mask unit region CR, and the mask 100 can be made to correspond to the mask unit region CR to produce a frame-integrated mask.

以下,對框架一體型遮罩的製造過程進行說明。 The manufacturing process of the frame-integrated mask is explained below.

首先,可以提供圖4及圖5中所述的框架200。圖6是示出本發明的一實施例涉及的框架200的製造過程的概略圖。 First, the frame 200 described in Figures 4 and 5 can be provided. FIG. 6 is a schematic diagram showing the manufacturing process of the frame 200 according to an embodiment of the present invention.

參照圖6的(a),提供邊緣框架部210。邊緣框架部210可以是包括中空區域R的方框形狀。 Referring to (a) of FIG. 6 , an edge frame portion 210 is provided. The edge frame part 210 may have a square frame shape including a hollow region R.

其次,參照圖6的(b),製造遮罩單元片材部220。遮 罩單元片材部220使用壓延、電鑄或者其他的成膜工藝,製造平面狀的片材後,通過鐳射劃綫、蝕刻等去除遮罩單元區域CR部分,從而可以製造。本說明書中,以形成6×5的遮罩單元區域CR(CR11~CR56)為例進行說明。可以存在5個第一柵格片材部223以及4個第二柵格片材部225。 Next, referring to (b) of FIG. 6 , the mask unit sheet portion 220 is manufactured. cover The mask unit sheet portion 220 can be manufactured by using calendering, electroforming or other film forming processes to produce a planar sheet, and then removing the mask unit region CR portion by laser scribing, etching, or the like. In this specification, the formation of a 6×5 mask unit area CR (CR11~CR56) is taken as an example for explanation. There may be 5 first grid sheet parts 223 and 4 second grid sheet parts 225 .

然後,可以使遮罩單元片材部220與邊緣框架部210對應。在對應的過程中,可以在拉伸F1~F4遮罩單元片材部220的所有側部以使遮罩單元片材部220平坦伸展的狀態下,使邊緣片材部221與邊緣框架部210對應。在一側部也能以多個點(作為圖6的(b)的例,1~3點)夾持遮罩單元片材部220並進行拉伸。另一方面,也可以不是所有側部,而是沿著一部分側部方向,拉伸F1、F2遮罩單元片材部220。 Then, the mask unit sheet portion 220 can be made to correspond to the edge frame portion 210 . During the corresponding process, all sides of the mask unit sheet portion 220 of F1 to F4 can be stretched to make the mask unit sheet portion 220 flat and stretched, so that the edge sheet portion 221 and the edge frame portion 210 correspond. The mask unit sheet portion 220 can also be stretched by sandwiching the mask unit sheet portion 220 at a plurality of points (as an example in FIG. 6(b) , points 1 to 3) on one side. On the other hand, the mask unit sheet portions 220 F1 and F2 may be stretched along some of the side portions instead of all the side portions.

然後,使遮罩單元片材部220與邊緣框架部210對應時,可以將遮罩單元片材部220的邊緣片材部221以焊接W方式黏合。優選地,焊接W所有側部,以便遮罩單元片材部220牢固地黏合於邊緣框架部210。應當最大限度地接近框架部210的角部側進行焊接W,才能最大限度地減少邊緣框架部210和遮罩單元片材部220之間的翹起空間,並提升黏著性。焊接W部分可以以線(line)或者點(spot)形狀生成,具有與遮罩單元片材部220相同的材料,並可以成為將邊緣框架部210和遮罩單元片材部220連接成一體的媒介。 Then, when making the mask unit sheet part 220 correspond to the edge frame part 210, the edge sheet part 221 of the mask unit sheet part 220 can be bonded by welding W. Preferably, all sides of W are welded so that the mask unit sheet part 220 is firmly adhered to the edge frame part 210. The welding W should be performed as close as possible to the corner side of the frame part 210 in order to minimize the warp space between the edge frame part 210 and the mask unit sheet part 220 and improve the adhesion. The welded W part can be generated in a line or spot shape, has the same material as the mask unit sheet portion 220 , and can be integrated to connect the edge frame portion 210 and the mask unit sheet portion 220 medium.

圖7是示出本發明的另一實施例涉及的框架的製造 過程的概略圖。圖6的實施例首先製造具備遮罩單元區域CR的遮罩單元片材部220後黏合於邊緣框架部210,而圖7的實施例將平面狀的片材黏合於邊緣框架部210後形成遮罩單元區域CR部分。 Figure 7 is a diagram illustrating the manufacturing of a frame according to another embodiment of the present invention. Schematic diagram of the process. In the embodiment of FIG. 6 , the mask unit sheet portion 220 having the mask unit region CR is first manufactured and then bonded to the edge frame portion 210 . In the embodiment of FIG. 7 , a planar sheet is bonded to the edge frame portion 210 to form a mask. Hood unit area CR part.

首先,與圖6的(a)相同地提供包括中空區域R的邊緣框架部210。 First, the edge frame portion 210 including the hollow region R is provided in the same manner as in (a) of FIG. 6 .

然後,參照圖7的(a),可以使平面狀的片材(平面狀的遮罩單元片材部220’)與邊緣框架部210對應。遮罩單元片材部220’是還未形成遮罩單元區域CR的平面狀態。在對應的過程中,可以在拉伸F1~F4遮罩單元片材部220’的所有側部以使遮罩單元片材部220’平坦伸展狀態下,使其與邊緣框架部210對應。在一側部也能以多個點(作為圖7的(a)的例,1~3點)夾持單元片材部220’並進行拉伸。另一方面,也可以不是所有側部,而是沿著一部分側部方向,拉伸F1、F2遮罩單元片材部220’。 Then, referring to FIG. 7(a) , a planar sheet (planar mask unit sheet portion 220') can be made to correspond to the edge frame portion 210. The mask unit sheet portion 220' is in a planar state in which the mask unit region CR has not yet been formed. During the corresponding process, all side portions of the F1 to F4 mask unit sheet portions 220' can be stretched to make the mask unit sheet portion 220' in a flat and stretched state to correspond to the edge frame portion 210. The unit sheet portion 220' can also be stretched by sandwiching the unit sheet portion 220' at a plurality of points (as an example in FIG. 7(a), points 1 to 3) on one side. On the other hand, the mask unit sheet portions 220' of F1 and F2 may be stretched along some of the side portions instead of all the side portions.

然後,使遮罩單元片材部220’與邊緣框架部210對應時,可以將遮罩單元片材部220’的邊緣部分以焊接W方式進行黏合。優選地,焊接W所有側部,以便遮罩單元片材部220’牢固地黏合於邊緣框架部220。應當最大限度地接近邊緣框架部210的角部側進行焊接W,才能最大限度地減少邊緣框架部210和遮罩單元片材部220’之間的翹起空間,並提升黏著性。焊接W部分可以以線(line)或者點(spot)形狀生成,與遮罩單元片材部220’具有相同材料,並可以成為將邊緣框架部210和遮罩單元片材部220’連接成一體的媒介。 Then, when the mask unit sheet portion 220' is made to correspond to the edge frame portion 210, the edge portion of the mask unit sheet portion 220' can be bonded by welding W. Preferably, all sides of W are welded so that the mask unit sheet portion 220' is firmly adhered to the edge frame portion 220. The welding W should be performed as close as possible to the corner side of the edge frame part 210 to minimize the warp space between the edge frame part 210 and the mask unit sheet part 220' and improve the adhesion. The welded W part can be generated in the shape of a line or a spot, has the same material as the mask unit sheet part 220', and can connect the edge frame part 210 and the mask unit sheet part 220' into one body. medium.

然後,參照圖7的(b),在平面狀的片材(平面狀的遮罩單元片材部220’)上形成遮罩單元區域CR。通過鐳射劃線、蝕刻等去除遮罩單元區域CR部分的片材,從而可以形成遮罩單元區域CR。本說明書中,以形成6×5的遮罩單元區域CR(CR11~CR56)為例進行說明。當形成遮罩單元區域CR時,可以構成遮罩單元片材部220,其中,與邊緣框架部210焊接W的部分成為邊緣片材部221,並且具備5個第一柵格片材部223以及4個第二柵格片材部225。 Then, referring to FIG. 7(b) , the mask unit region CR is formed on the planar sheet (the planar mask unit sheet portion 220'). The mask unit region CR can be formed by removing the sheet of the mask unit region CR through laser scribing, etching, or the like. In this specification, the formation of a 6×5 mask unit area CR (CR11~CR56) is taken as an example for explanation. When the mask unit region CR is formed, the mask unit sheet portion 220 may be configured in which the portion welded W to the edge frame portion 210 becomes the edge sheet portion 221 and is provided with five first grid sheet portions 223 and 4 second grid sheet parts 225.

圖8是示出現有的用於形成高解析度OLED的遮罩的概略圖。 FIG. 8 is a schematic diagram showing a conventional mask used to form a high-resolution OLED.

為實現高解析度的OLED,圖案的尺寸逐漸變小,藉此所使用的遮罩金屬膜的厚度也有必要變薄。如圖8的(a)所示,若要實現高解析度的OLED像素6,則在遮罩10’上縮小像素間距與像素尺寸(PD->PD')。而且,為了防止因陰影效應導致的OLED像素6的沉積不均勻,有必要使遮罩10’的圖案傾斜地形成14。然而,具有約30~50μm的厚度T1,在較厚的遮罩10’上傾斜地形成圖案14的過程中,由於難以進行與細微像素間距PD'與像素尺寸匹配的圖案化13,因此將成為加工工藝中產率變差的原因。換而言之,為了具有細微的像素間距PD’的同時傾斜地形成圖案14,需要使用較薄厚度的遮罩10’。 In order to realize high-resolution OLEDs, the size of patterns is gradually becoming smaller, and therefore the thickness of the mask metal film used must also be thinned. As shown in (a) of FIG. 8 , in order to realize high-resolution OLED pixels 6 , the pixel pitch and pixel size on the mask 10 ′ are reduced (PD->PD′). Furthermore, in order to prevent uneven deposition of the OLED pixels 6 due to shadow effects, it is necessary to form the pattern 14 of the mask 10' obliquely. However, with a thickness T1 of about 30 to 50 μm , in the process of forming the pattern 14 obliquely on the thick mask 10', it is difficult to perform the patterning 13 matching the fine pixel pitch PD' and the pixel size, so it will It becomes the cause of poor productivity in the processing process. In other words, in order to form the pattern 14 obliquely while having a fine pixel pitch PD', it is necessary to use a thinner thickness mask 10'.

特別是,為了實現UHD級別的高解析度,如圖8的(b)所示,只有使用約為20μm以下的厚度T2的較薄的遮罩10’,才能夠進行細微的圖案化。而且,為了實現UHD以上的超高解析度,可 以考慮使用具有10μm左右厚度T2的較薄的遮罩10’。 In particular, in order to achieve UHD-level high resolution, as shown in (b) of FIG. 8 , fine patterning can be performed only by using a thin mask 10 ′ with a thickness T2 of approximately 20 μm or less. Furthermore, in order to achieve ultra-high resolution higher than UHD, it may be considered to use a thin mask 10' having a thickness T2 of about 10 μm .

圖9是示出本發明的一實施例涉及的遮罩100的概略圖。 FIG. 9 is a schematic diagram showing the mask 100 according to an embodiment of the present invention.

遮罩100可包括形成有多個遮罩圖案P的遮罩單元C與遮罩單元C周邊的虛設部DM。如上所述,可使用基於壓延工藝、電鑄等生成的金屬片材製造遮罩100,遮罩100上可形成有一個單元C。虛設部DM對應於除了單元C以外的遮罩膜110[遮罩金屬膜110]部分,可以只包括遮罩膜110或可包括形成有與遮罩圖案P相似形態的預定的虛設部圖案的遮罩膜110。虛設部DM與遮罩100的邊緣對應,因此虛設部DM的一部分或者全部可黏合於框架200[遮罩單元片材部220]上。 The mask 100 may include a mask unit C formed with a plurality of mask patterns P and a dummy portion DM around the mask unit C. As mentioned above, the mask 100 can be manufactured using a metal sheet generated based on a calendering process, electroforming, etc., and a unit C can be formed on the mask 100 . The dummy portion DM corresponds to the portion of the mask film 110 [mask metal film 110] other than the cell C, and may include only the mask film 110 or may include a mask in which a predetermined dummy portion pattern similar to the mask pattern P is formed. Cover film 110. The dummy part DM corresponds to the edge of the mask 100, so part or all of the dummy part DM can be adhered to the frame 200 [mask unit sheet part 220].

遮罩圖案P的寬度可以小於40μm,遮罩100的厚度可以約為2~50μm。由於框架200具備多個遮罩單元區域CR(CR11~CR56),因此也可以具有多個遮罩100,該遮罩100具有與各個遮罩單元區域CR(CR11~CR56)分別對應的遮罩單元C(C11~56)。 The width of the mask pattern P may be less than 40 μm, and the thickness of the mask 100 may be about 2~50 μm. Since the frame 200 has a plurality of mask unit areas CR (CR11~CR56), it may also have a plurality of masks 100, and the mask 100 has a mask unit corresponding to each mask unit area CR (CR11~CR56). C(C11~56).

由於遮罩100的一面101是與框架200接觸進行黏合的面,因此優選為平坦形狀。該一面101可通過後面所述的平坦化工藝變為平坦的同時進行鏡面化。遮罩100的另一面102可以與後面所述的模板50的一面相對。 Since one side 101 of the mask 100 is in contact with the frame 200 for bonding, it is preferably in a flat shape. This surface 101 can be made flat through a planarization process described later and can be mirror-finished at the same time. The other side 102 of the mask 100 may be opposite to one side of the template 50 described below.

下面,對製造框架一體型遮罩的一系列工藝進行說明,該工藝在製造遮罩金屬膜110’之後,將其支撑在模板50上以製 造遮罩100,且將支撐有遮罩100的模板50裝載於框架200上,並使遮罩100黏合於框架200上,藉以製造框架一體型遮罩。 Next, a series of processes for manufacturing a frame-integrated mask will be described. In this process, after manufacturing the mask metal film 110', it is supported on the template 50 to form the mask. The mask 100 is manufactured, and the template 50 supporting the mask 100 is loaded on the frame 200, and the mask 100 is bonded to the frame 200, thereby manufacturing a frame-integrated mask.

圖10是示出本發明的一實施例涉及的以壓延(rolling)方式製造遮罩金屬膜的過程的概略圖。圖11是示出本發明的另一實施例涉及的以電鑄(electroforming)方式製造遮罩金屬膜的過程的概略圖。 FIG. 10 is a schematic diagram illustrating a process of manufacturing a mask metal film by rolling according to an embodiment of the present invention. FIG. 11 is a schematic diagram illustrating a process of manufacturing a mask metal film by electroforming according to another embodiment of the present invention.

首先,可以準備遮罩金屬膜110。作為一實施例,可以壓延方式準備遮罩金屬膜110。 First, the mask metal film 110 may be prepared. As an embodiment, the mask metal film 110 can be prepared by calendering.

參照圖10的(a),可以將基於壓延工藝生成的金屬片材作為遮罩金屬膜110’使用。基於壓延工藝制得的金屬片材在製造工藝上可具有數十至數百μm的厚度。如前面所述的圖8中,為了實現UHD級別的高解析度,只有使用厚度為約20μm以下的較薄的遮罩金屬膜110,才能夠進行細微的圖案化,為了實現UHD以上的超高解析度,需要使用厚度為約10μm的較薄的遮罩金屬膜110。然而,由壓延(rolling)工藝生成的遮罩金屬膜110’具有約25~500μm的厚度,因此有必要使厚度變為更薄。 Referring to (a) of FIG. 10 , a metal sheet generated based on a calendering process can be used as the mask metal film 110 ′. The metal sheet produced based on the calendering process can have a thickness of tens to hundreds of μm in the manufacturing process. As mentioned above in Figure 8, in order to achieve high resolution at the UHD level, fine patterning can only be performed by using a relatively thin mask metal film 110 with a thickness of approximately 20 μm or less. In order to achieve UHD or higher resolution, Ultra-high resolution requires the use of a thinner mask metal film 110 with a thickness of about 10 μm . However, the mask metal film 110' generated by the rolling process has a thickness of about 25~500 μm , so it is necessary to make the thickness thinner.

因此,還可以執行使遮罩金屬膜110’的一面平坦化PS的工藝。在此,平坦化PS是指對遮罩金屬膜110’的一面(上面)進行鏡面化的同時去除遮罩金屬膜110’的上部的一部分以使厚度變薄。平坦化PS可藉由CMP(Chemical Mechanical Polishing)方法執行,只要是公知的CMP方法,無需特別限制均可使用。而且,可藉由化學濕蝕刻(chemical wet etching)或者乾蝕刻(dry etching)方法來 縮減遮罩金屬膜110’的厚度。除此以外,還可以使用使遮罩金屬膜110’的厚度變薄的可平坦化的其他工藝,對其沒有特別限制。 Therefore, a process of planarizing PS on one side of the mask metal film 110' may also be performed. Here, the planarization PS means mirroring one surface (upper surface) of the mask metal film 110' and removing a part of the upper part of the mask metal film 110' to reduce the thickness. Planarization PS can be performed by the CMP (Chemical Mechanical Polishing) method, and any known CMP method can be used without special restrictions. Moreover, it can be achieved by chemical wet etching or dry etching. Reduce the thickness of the mask metal film 110'. In addition to this, other planarization processes that can thin the thickness of the mask metal film 110' may also be used, and are not particularly limited.

在執行平坦化PS的過程中,作為一列,在CMP過程中,可控制遮罩金屬膜110’的上表面的表面粗糙度Ra。優選地,可進行使表面粗糙度進一步减少的鏡面化。或者,作為其他例子,藉由化學濕蝕刻或者乾蝕刻過程進行平坦化PS之後,可追加進行個別的CMP工藝等的拋光工藝,藉以减少表面粗糙度Ra。 In the process of performing planarization PS, as a column, in the CMP process, the surface roughness Ra of the upper surface of the mask metal film 110' can be controlled. Preferably, mirroring may be performed to further reduce surface roughness. Or, as another example, after planarizing the PS through a chemical wet etching or dry etching process, a polishing process such as an individual CMP process can be additionally performed to reduce the surface roughness Ra.

如此,可以使遮罩金屬膜110’的厚度減少至約50μm以下。藉此,遮罩金屬膜110的厚度優選為約2μm至50μm,更優選地,厚度可以為約5μm至20μm。然而,並非局限於此。 In this way, the thickness of the mask metal film 110' can be reduced to approximately 50 μm or less. Thereby, the thickness of the mask metal film 110 is preferably about 2 μm to 50 μm , and more preferably, the thickness may be about 5 μm to 20 μm . However, it is not limited to this.

參照圖10的(b),其與圖10的(a)相同,可藉由减少基於壓延工藝製造的遮罩金屬膜110’的厚度,以製造遮罩金屬膜110。惟,遮罩金屬膜110’是在藉由後面所述的模板50上夾設臨時黏合部55被黏合的狀態下,執行平坦化PS工藝以縮減厚度。 Referring to (b) of FIG. 10 , which is the same as (a) of FIG. 10 , the mask metal film 110 can be manufactured by reducing the thickness of the mask metal film 110' produced based on the calendering process. However, the mask metal film 110' is bonded by sandwiching the temporary bonding portion 55 on the template 50 to be described later, and then a planarization PS process is performed to reduce the thickness.

作為其他實施例,可以以電鑄方式準備遮罩金屬膜110。 As other embodiments, the mask metal film 110 may be prepared by electroforming.

參照圖11的(a),準備導電性基材21。為了執行電鑄(electroforming),母板的基材21可以是導電性材料。電鑄時,母板可以作為陰極(cathode)電極使用。 Referring to (a) of FIG. 11 , a conductive base material 21 is prepared. In order to perform electroforming, the base material 21 of the motherboard may be a conductive material. During electroforming, the motherboard can be used as a cathode electrode.

作為導電性材料,金屬可以在表面上生成金屬氧化物,可以在製造金屬過程中流入有雜質,多晶矽基材可以存在夾雜物或者晶界(Grain Boundary),導電性高分子基材含有雜質的可能 性高,並且强度、耐酸性等可能脆弱。將諸如金屬氧化物、雜質、夾雜物、晶界等的妨礙在母板(或者陰極)表面均勻形成電場的要素稱為”缺陷”(Defect)。由於缺陷(Defect),無法對上述材料的陰極施加均勻的電場,有可能導致不均勻地形成部分鍍膜110(遮罩金屬膜110)。 As a conductive material, metal can generate metal oxides on the surface, and impurities can flow into the metal during the manufacturing process. Polycrystalline silicon substrates can have inclusions or grain boundaries, and conductive polymer substrates may contain impurities. High resistance, strength, acid resistance, etc. may be fragile. Factors such as metal oxides, impurities, inclusions, grain boundaries, etc. that prevent the uniform formation of an electric field on the surface of the motherboard (or cathode) are called "defects". Due to defects, a uniform electric field cannot be applied to the cathode of the above-mentioned material, which may result in uneven formation of part of the plating film 110 (mask metal film 110).

在實現UHD級別以上的超高畫質像素中,鍍膜及鍍膜圖案(遮罩圖案P)的不均勻,有可能對形成像素產生不好的影響。例如,目前QHD畫質的情况為500~600PPI(pixel per inch),像素尺寸達到約30~50μm,4K UHD、8K UHD高畫質的情况具有比前者高的~860PPI、~1600PPI等的解析度。直接適用於VR機器上的微顯示器或者插入到VR機器而使用的微顯示器以約2000PPI以上級別的超高畫質為目標,像素的尺寸約為5~10μm。適用於其中的FMM、陰影遮罩的圖案寬度可以形成為數μm至數十μm尺寸,優選小於30μm的尺寸,因此數μm尺寸的缺陷也是在遮罩的圖案尺寸中佔據很大比重程度的尺寸。另外,為了去除上述材料的陰極的缺陷,可以進行用於去除金屬氧化物、雜質等的附加的工藝,該過程中有可能又引發陰極材料被蝕刻等的其他缺陷。 In achieving ultra-high image quality pixels above the UHD level, uneven coating and coating patterns (mask patterns P) may have a negative impact on the formation of pixels. For example, the current QHD image quality is 500~600PPI (pixel per inch), and the pixel size reaches about 30~50 μm . The 4K UHD and 8K UHD high image quality have higher than the former ~860PPI, ~1600PPI, etc. resolution. Microdisplays that are directly applicable to VR machines or used when inserted into VR machines aim at ultra-high image quality of about 2000PPI or above, and the pixel size is about 5~10 μm . The pattern width of the FMM and shadow mask applied thereto can be formed in a size of several μm to tens of μm, preferably less than 30 μm. Therefore, defects of several μm size also occupy a large proportion in the pattern size of the mask. In addition, in order to remove defects in the cathode made of the above-mentioned materials, additional processes for removing metal oxides, impurities, etc. may be performed. This process may cause other defects such as etching of the cathode material.

因此,本發明可以使用單晶材料的母板(或者陰極)。特別是,優選為單晶矽材料。可以對單晶矽材料的母板進行1019/cm3以上的高濃度摻雜,以便具有導電性。摻雜可以對整個母板進行,也可以僅對母板的表面部分進行。 Therefore, the present invention can use a mother plate (or cathode) of single crystal material. In particular, single crystal silicon material is preferred. The motherboard of single crystal silicon material can be doped at a high concentration of more than 10 19 /cm 3 to make it conductive. Doping can be done on the entire motherboard or only on the surface portion of the motherboard.

另外,單晶材料可使用Ti、Cu、Ag等金屬;GaN、 SiC、GaAs、GaP、AlN、InN、InP、Ge等半導體;石墨(graphite)、石墨烯(graphene)等碳材料;包含CH3NH3PbCl3、CH3NH3PbBr3、CH3NH3PbI3、SrTiO3等之鈣鈦礦(perovskite)結構等超導電體用單晶陶瓷;飛行器零部件用單晶超耐熱合金等。金屬、碳材料基本上是導電性材料。半導體材料的情况,為了具有導電性,可執行1019/cm3以上的高濃度摻雜。其他材料可藉由執行摻雜或形成氧空位(oxygen vacancy)等,藉以形成導電性。摻雜可對母板的整體上進行,亦可僅對母板的表面部分進行。 In addition, single crystal materials can use metals such as Ti, Cu, and Ag; semiconductors such as GaN, SiC, GaAs, GaP, AlN, InN, InP, and Ge; carbon materials such as graphite and graphene; including CH 3 Single crystal ceramics for superconductors such as NH 3 PbCl 3 , CH 3 NH 3 PbBr 3 , CH 3 NH 3 PbI 3 , SrTiO3 and other perovskite structures; single crystal super heat-resistant alloys for aircraft parts. Metal and carbon materials are basically conductive materials. In the case of semiconductor materials, in order to achieve conductivity, high concentration doping of 10 19 /cm 3 or more can be performed. Other materials can be conductive by performing doping or forming oxygen vacancy. Doping can be performed on the entire motherboard or only on a surface portion of the motherboard.

單晶材料由於沒有缺陷,電鑄時在表面全部形成均勻的電場,因此生成均勻的鍍膜110。通過均勻鍍膜而製造的框架一體型遮罩100、200可以進一步改善OLED像素的畫質水準。並且,由於無需進行去除、消除缺陷的附加工藝,可降低工藝費用,並提高生産性。 Since the single crystal material has no defects, a uniform electric field is formed on the entire surface during electroforming, thus forming a uniform coating 110 . The frame-integrated masks 100 and 200 manufactured by uniform coating can further improve the image quality level of OLED pixels. Furthermore, since there is no need to perform additional processes for removing and eliminating defects, process costs can be reduced and productivity can be improved.

再次參照圖10的(a),然後,將導電性基材21作為母板[陰極(Cathode Body)]使用,且使陽極(未圖示)相隔開地佈置,藉以可在導電性基材21上通過電鑄形成鍍膜110[或者遮罩金屬膜110]。鍍膜110可形成於導電性基材21的露出的上表面與側面,该導電性基材21與陽極相對佈置且可作用有電場。不僅是導電性基材21的側面,就連導電性基材21的下表面的一部分上也可以形成有鍍膜110。 Referring again to FIG. 10(a) , the conductive base material 21 is used as a motherboard (cathode body), and the anodes (not shown) are arranged at intervals, so that the conductive base material 21 can be A plating film 110 [or a mask metal film 110] is formed by electroforming. The coating 110 can be formed on the exposed upper surface and side surfaces of the conductive substrate 21 , which is arranged opposite to the anode and on which an electric field can act. The plating film 110 may be formed not only on the side surface of the conductive base material 21 but also on a part of the lower surface of the conductive base material 21 .

然後,用鐳射剪切D鍍膜110的邊緣部分或在鍍膜110上部形成光阻層,且僅蝕刻並去除D露出的鍍膜110的一部分。藉 此,如圖10的(b)所示,可以從導電性基材21分離鍍膜110。 Then, use a laser to cut the edge portion of the D coating film 110 or form a photoresist layer on top of the coating film 110, and only etch and remove the exposed portion of the D coating film 110. borrow Therefore, as shown in (b) of FIG. 10 , the plated film 110 can be separated from the conductive base material 21 .

另外,從導電性基材21分離鍍膜110之前,可進行熱處理H。本發明的特徵在於,在降低遮罩100的熱膨脹係數的同時為防止遮罩100及遮罩圖案P的熱引起的變形,從導電性基材21[或者母板、陰極]分離鍍膜110之前進行熱處理H。熱處理可在300℃至800℃的溫度下進行。 In addition, before separating the plated film 110 from the conductive base material 21, heat treatment H may be performed. A feature of the present invention is that in order to reduce the thermal expansion coefficient of the mask 100 and prevent thermal deformation of the mask 100 and the mask pattern P, the coating 110 is performed before separation from the conductive base material 21 [or motherboard, cathode]. Heat treatment H. Heat treatment can be carried out at temperatures from 300°C to 800°C.

通常,相比基於壓延生成的恒範鋼薄板,基於電鑄生成的恒範鋼薄板的熱膨脹係數更高。因此,可藉由對恒範鋼薄板進行熱處理,以降低熱膨脹係數,但該熱處理過程中恒範鋼薄板會産生剝離、變形等。這是因為,僅對恒範鋼薄板進行熱處理或對僅在導電性基材21的上表面上臨時黏合的恒範鋼薄板進行熱處理而産生的現象。然而,本發明中,不僅在導電性基材21的上表面而且還在側面與下表面的一部分上形成鍍膜110,因此即使進行熱處理H也不會發生剝離、變形等。換而言之,由於在導電性基材21與鍍膜110緊密地黏合的狀態下進行熱處理,因此具有能夠防止熱處理引起的剝離、變形等且能夠穩定地進行熱處理之優點。 In general, the thermal expansion coefficient of constant steel sheets produced by electroforming is higher than that of constant steel sheets produced by rolling. Therefore, the thermal expansion coefficient can be reduced by performing heat treatment on the Hengfan steel sheet. However, during the heat treatment process, the Hengfan steel sheet may peel, deform, etc. This is a phenomenon caused by heat treatment of only the constant steel thin plate or heat treatment of the constant steel thin plate temporarily bonded only on the upper surface of the conductive base material 21 . However, in the present invention, the plating film 110 is formed not only on the upper surface of the conductive base material 21 but also on part of the side surfaces and the lower surface, so even if the heat treatment H is performed, peeling, deformation, etc. will not occur. In other words, since the heat treatment is performed in a state where the conductive base material 21 and the plated film 110 are closely adhered, there is an advantage that peeling, deformation, etc. caused by the heat treatment can be prevented and the heat treatment can be performed stably.

由電鑄工藝生成的遮罩金屬膜110的厚度會比壓延工藝生成的薄。藉此,還可以省略縮減厚度的平坦化PS工藝,但根據鍍敷的遮罩金屬膜110’的表面層的成份,結晶結構/細微結構的不同蝕刻特性會不同,因此有必要藉由平坦化PS來控制表面特性、厚度。 The thickness of the mask metal film 110 produced by the electroforming process will be thinner than that produced by the calendering process. In this way, the planarization PS process to reduce the thickness can also be omitted. However, depending on the composition of the surface layer of the plated mask metal film 110', the etching characteristics will be different depending on the crystal structure/fine structure. Therefore, it is necessary to use planarization. PS to control surface properties and thickness.

圖12至圖13是示出本發明的一實施例涉及的將遮罩 金屬膜110黏合於模板50上並形成遮罩100以製造遮罩支撑模板的過程的概略圖。 12 to 13 are diagrams illustrating the masking process according to an embodiment of the present invention. Schematic diagram of the process of bonding the metal film 110 to the template 50 and forming the mask 100 to manufacture the mask support template.

參照圖12的(a),可提供模板50(template)。模板50是以使遮罩100附著並支撑於模板50的一面的狀態移動之媒介。模板50的一面優選為平坦形狀,以支撑平坦的遮罩100並使其移動。中心部50a與遮罩金屬膜110的遮罩單元C對應,邊緣部50b可以與遮罩金屬膜110的虛設部DM對應。模板50可以是尺寸大於遮罩金屬膜110之大平板形狀,以使遮罩金屬膜110整體上得到支撐。 Referring to (a) of Figure 12, a template 50 (template) may be provided. The template 50 is a medium that moves in a state where the mask 100 is attached and supported on one side of the template 50 . One side of the template 50 is preferably flat to support and move the flat mask 100 . The center portion 50 a corresponds to the mask unit C of the mask metal film 110 , and the edge portion 50 b may correspond to the dummy portion DM of the mask metal film 110 . The template 50 may be in the shape of a large flat plate with a size larger than that of the mask metal film 110, so that the mask metal film 110 can be supported as a whole.

模板50優選由透明的材料構成,藉以在將遮罩100與框架200對準且黏合的過程以便於觀測視覺(vision)等。而且,若是透明的材料,則還可以使鐳射貫穿。作為透明的材料,可以使用玻璃(glass)、氧化矽(silica)、耐熱玻璃、石英(quartz)、氧化鋁(Al2O3)、硼矽酸玻璃(borosilicate glass)、氧化鋯(zirconia)等材料。作為一例,模板50可以使用硼矽酸玻璃中具有優秀的耐熱性、化學耐久性、機械强度、透明性等的BOROFLOAT®33材料。而且,BOROFLOAT®33的熱膨脹係數約為3.3,與恆範鋼遮罩金屬膜110的熱膨脹係數差异少,具有便於控制遮罩金屬膜110的優點。 The template 50 is preferably made of a transparent material to facilitate vision during the process of aligning and bonding the mask 100 with the frame 200 . Moreover, if it is a transparent material, the laser can also penetrate it. As a transparent material, glass, silica, heat-resistant glass, quartz, aluminum oxide (Al 2 O 3 ), borosilicate glass, zirconia, etc. can be used. Material. As an example, the template 50 can use BOROFLOAT ® 33 material among borosilicate glass which has excellent heat resistance, chemical durability, mechanical strength, transparency, etc. Moreover, the thermal expansion coefficient of BOROFLOAT ® 33 is about 3.3, which is less different from the thermal expansion coefficient of the Hengfan steel mask metal film 110, and has the advantage of easy control of the mask metal film 110.

另外,模板50與遮罩金屬膜110接觸的一面可以是鏡面,以使與遮罩金屬膜110[或者遮罩100]之間的界面之間不産生空隙(air gap)。基於此,模板50的一面的表面粗糙度Ra可以為100nm以下。為了實現表面粗糙度Ra為100nm以下的模板50,模板50可以使用晶圓(wafer)。晶圓(wafer)的表面粗糙度Ra約為10nm,且市面 上的産品較多,表面處理工藝已被習知,故可作為模板50使用。模板50的表面粗糙度Ra是nm級,因此不存在空隙AG或空隙AG幾乎不存在,容易基於鐳射焊接生成焊接焊珠WB,故對遮罩圖案P的對準誤差不產生影響。 In addition, the surface of the template 50 that is in contact with the mask metal film 110 may be a mirror surface so that no air gap is generated at the interface with the mask metal film 110 [or the mask 100 ]. Based on this, the surface roughness Ra of one side of the template 50 may be 100 nm or less. In order to realize the template 50 having a surface roughness Ra of 100 nm or less, a wafer may be used for the template 50 . The surface roughness Ra of the wafer is about 10nm, and the market There are many products on the market, and the surface treatment process is well known, so it can be used as a template 50. The surface roughness Ra of the template 50 is at the nm level, so there is no gap AG or almost no gap AG, and welding beads WB are easily generated by laser welding, so the alignment error of the mask pattern P is not affected.

模板50上可形成有鐳射貫穿孔51,以使從模板50的上部照射的鐳射L到達遮罩100的焊接部(執行焊接的區域)。鐳射貫穿孔51可與焊接部的位置及個數對應地形成於模板50上。焊接部可以規定的間隔在遮罩100的邊緣或虛擬部DM的部分上佈置多個,因此鐳射貫穿孔51亦可以與其對應且相隔規定間隔地形成多個。作為一例,焊接部在遮罩100的兩側(左側/右側)虛擬部DM的部分以規定間隔佈置多個,因此鐳射貫穿孔51亦可以在模板50的兩側(左側/右側)以規定間隔形成多個。 A laser through hole 51 may be formed on the template 50 so that the laser L irradiated from an upper portion of the template 50 reaches the welding portion (area where welding is performed) of the mask 100 . The laser through holes 51 can be formed on the template 50 corresponding to the position and number of the welding parts. A plurality of welding portions can be arranged at predetermined intervals on the edge of the mask 100 or on the portion of the dummy portion DM. Therefore, a plurality of laser through holes 51 can also be formed corresponding to the welding portions at predetermined intervals. As an example, a plurality of welding portions are arranged at predetermined intervals on both sides (left/right) of the mask 100 in the dummy portion DM. Therefore, the laser through holes 51 can also be provided at predetermined intervals on both sides (left/right) of the template 50 Form multiple.

鐳射貫穿孔51並非一定與焊接部的位置及個數對應。例如,亦可以僅對鐳射貫穿孔51中的一部分照射鐳射L以進行焊接。另外,不與焊接部對應的鐳射貫穿孔51中一部分在對準遮罩100與模板50時亦可代替對準標記而使用。若模板50的材料對鐳射L光透明,則亦可以不形成鐳射貫穿孔51。 The laser through holes 51 do not necessarily correspond to the position and number of the welding parts. For example, only a part of the laser through hole 51 may be irradiated with the laser L to perform welding. In addition, a part of the laser through holes 51 that does not correspond to the welding part may be used instead of the alignment mark when aligning the mask 100 and the template 50 . If the material of the template 50 is transparent to the laser L light, the laser through hole 51 does not need to be formed.

模板50的一面上可形成有臨時黏合部55。臨時黏合部55可於模板50的一整個面上形成。遮罩100[遮罩金屬膜110]可於整個臨時黏合部55上黏合。在遮罩100黏合於框架200之前,臨時黏合部55使遮罩100[或者遮罩金屬膜110]臨時黏合於模板50的一面並支撐在模板50上。 A temporary adhesive portion 55 may be formed on one side of the template 50 . The temporary bonding portion 55 can be formed on an entire surface of the template 50 . The mask 100 [mask metal film 110] can be bonded on the entire temporary bonding portion 55. Before the mask 100 is bonded to the frame 200 , the temporary bonding portion 55 temporarily bonds the mask 100 [or the mask metal film 110 ] to one side of the template 50 and supports it on the template 50 .

臨時黏合部55可使用藉由加熱可分離的黏合劑或者黏合片材;藉由照射UV可分離的黏合劑或者黏合片材。 The temporary adhesive portion 55 may use an adhesive or adhesive sheet that is detachable by heating; an adhesive or adhesive sheet that is detachable by UV irradiation.

作為一例,臨時黏合部55可使用液態蠟(liquid wax)。液態蠟可以使用與在半導體晶圓拋光步驟等中使用的蠟相同的蠟,其種類沒有特別限制。液態蠟主要包含作為用於控制與維持力有關的黏著力、耐衝擊性等的樹脂成份的丙烯酸、醋酸乙烯酯、尼龍及各種聚合物等物質及溶劑。作為一例,臨時黏合部55作為樹脂成份可使用丙烯腈-丁二烯橡膠(ABR,Acrylonitrile butadiene rubber)且作為溶劑成份可使用含有n-丙醇的SKYLIQUID ABR-4016。液態蠟可使用旋轉塗布形成於臨時黏合部55上。 As an example, liquid wax can be used for the temporary bonding portion 55 . The liquid wax may be the same wax used in the semiconductor wafer polishing step and the like, and the type thereof is not particularly limited. Liquid wax mainly contains substances such as acrylic acid, vinyl acetate, nylon, various polymers and solvents, which are resin components used to control adhesion and impact resistance related to maintenance. As an example, the temporary adhesive portion 55 can use acrylonitrile butadiene rubber (ABR) as a resin component and SKYLIQUID ABR-4016 containing n-propanol as a solvent component. The liquid wax can be formed on the temporary adhesive portion 55 using spin coating.

作為液態蠟的臨時黏合部55在高於85℃~100℃的溫度下其粘性變低,而在低於85℃的溫度下粘性變大,一部分像固體一樣變硬,且可以使遮罩金屬膜110’與模板50固定並黏合。 As a liquid wax, the temporary adhesive part 55 becomes less viscous at temperatures higher than 85°C to 100°C, and becomes more viscous at temperatures lower than 85°C. Part of it becomes hard like a solid, and can make the mask metal The membrane 110' is fixed and bonded to the template 50.

然後,參照圖12的(b),可以使遮罩金屬膜110’黏合於模板50上。將液態蠟加熱到85℃以上且使遮罩金屬膜110’接觸模板50之後,將遮罩金屬膜110’與模板50通過輥子之間以進行黏合。 Then, referring to (b) of FIG. 12, the mask metal film 110' can be bonded to the template 50. After the liquid wax is heated to above 85°C and the mask metal film 110' contacts the template 50, the mask metal film 110' and the template 50 are passed between rollers for bonding.

根據一實施例,在約120℃的溫度下對模板50烘焙(baking)60秒,使臨時黏合部55的溶劑氣化,並直接進行遮罩金屬膜的層壓(lamination)工藝。層壓可藉由在一面形成有臨時黏合部55的模板50上裝載遮罩金屬膜110’,並將其通過約100℃的上部輥(roll)與約0℃的下部輥之間來執行。其結果,遮罩金屬膜110’可藉由在模板50上夾設臨時黏合部55而接觸。 According to one embodiment, the template 50 is baked at a temperature of approximately 120° C. for 60 seconds to vaporize the solvent in the temporary adhesive portion 55 , and a lamination process of the mask metal film is directly performed. Lamination can be performed by loading the mask metal film 110' on the template 50 with the temporary adhesive portion 55 formed on one side, and passing it between an upper roll at about 100°C and a lower roll at about 0°C. As a result, the mask metal film 110' can be brought into contact by sandwiching the temporary adhesive portion 55 on the template 50.

圖14是示出本發明的一實施例涉及的臨時黏合部55的放大截面的概略圖。作為又一例,臨時黏合部55可使用熱分離膠帶(thermal release tape)。熱分離膠帶是中間佈置有PET膜等的基膜56,基膜56的兩面佈置有可熱分離的粘著層57a、57b(thermal release adhesive),而黏著層57a、57b的外廓可佈置有分離膜/離型膜58a、58b。其中,基膜56的兩面上佈置的粘著層57a、57b的分離溫度可相互不同。 FIG. 14 is a schematic diagram showing an enlarged cross-section of the temporary bonding portion 55 according to an embodiment of the present invention. As another example, thermal release tape may be used for the temporary bonding portion 55 . The thermal release tape is a base film 56 with a PET film or the like arranged in the middle. The base film 56 is provided with heat-separable adhesive layers 57a and 57b (thermal release adhesive) on both sides, and the outer contours of the adhesive layers 57a and 57b are arranged with Separation membrane/release membrane 58a, 58b. Among them, the separation temperatures of the adhesive layers 57a and 57b arranged on both sides of the base film 56 may be different from each other.

根據一實施例,在去除分離膜/離型膜58a、58b的狀態下,熱分離膠帶的下表面[第二粘著層57b]黏合於模板50上,熱分離膠帶的上表面[第一粘著層57a]可黏合於遮罩金屬膜110’上。第一粘著層57a與第二粘著層57b的分離溫度互不相同,因此在後面所述的圖17中,從遮罩100分離模板50時,隨著對第一粘著層57a加熱,遮罩100可從模板50及臨時黏合部55分離出來。 According to an embodiment, in the state of removing the separation films/release films 58a, 58b, the lower surface of the thermal release tape [the second adhesive layer 57b] is bonded to the template 50, and the upper surface of the thermal release tape [the first adhesive layer] is bonded to the template 50. The adhesive layer 57a] can be bonded to the mask metal film 110'. The separation temperatures of the first adhesive layer 57a and the second adhesive layer 57b are different from each other. Therefore, when the template 50 is separated from the mask 100 in FIG. 17 described later, as the first adhesive layer 57a is heated, The mask 100 can be separated from the template 50 and the temporary adhesive portion 55 .

接著,進一步參照圖12的(b),可以使遮罩金屬膜110’的一面平坦化PS。如上所述,圖10中由壓延工藝制得之遮罩金屬膜110’可藉由平坦化PS工藝縮減其厚度(110'->110)。而且,由電鑄工藝制得之遮罩金屬膜110也可以進行平坦化PS工藝,藉以控制其表面特性、厚度。 Next, referring further to FIG. 12(b), one side of the mask metal film 110' can be planarized PS. As mentioned above, the thickness of the mask metal film 110' produced by the calendering process in Figure 10 can be reduced by the planarization PS process (110'->110). Moreover, the mask metal film 110 produced by the electroforming process can also be subjected to a planarization PS process to control its surface characteristics and thickness.

藉此,如圖12的(c)所示,隨著遮罩金屬膜110’的厚度縮減(110'->110),遮罩金屬膜110的厚度變為約5μm至20μm。 Thereby, as shown in FIG. 12(c) , as the thickness of the mask metal film 110' decreases (110'->110), the thickness of the mask metal film 110 becomes about 5 μm to 20 μm .

然後,參照圖13的(d),可以在遮罩金屬膜110上形成圖案化的絕緣部25。絕緣部25可利用印刷法等由光阻材料形成。 Then, referring to (d) of FIG. 13 , the patterned insulating portion 25 may be formed on the mask metal film 110 . The insulating portion 25 can be formed of a photoresist material using a printing method or the like.

接著,可進行遮罩金屬膜110的蝕刻。可使用幹蝕刻、濕蝕刻等方法,對其沒有特別限制,蝕刻結果,在絕緣部25之間的空位置26上露出的遮罩金屬膜110部分被蝕刻。遮罩金屬膜110的被蝕刻部分構成遮罩圖案P,藉以可製造形成有多個遮罩圖案P的遮罩100。 Next, the mask metal film 110 may be etched. Dry etching, wet etching, or other methods may be used without particular limitation. As a result of the etching, the portion of the mask metal film 110 exposed in the vacant positions 26 between the insulating portions 25 is etched. The etched portion of the mask metal film 110 forms the mask pattern P, whereby the mask 100 formed with a plurality of mask patterns P can be manufactured.

然後,參照圖13的(e),藉由去除絕緣部25,可完成支撐遮罩100的模板50的製造。 Then, referring to (e) of FIG. 13 , by removing the insulating portion 25 , the manufacturing of the template 50 supporting the mask 100 can be completed.

由於框架200具備多個遮罩單元區域CR(CR11~CR56),因此也可以形成多個具有與各個遮罩單元區域CR(CR11~CR56)分別對應的遮罩單元C(C11~56)的遮罩100。而且,可具備分別支撐多個遮罩100的多個模板50。 Since the frame 200 has multiple mask unit areas CR (CR11~CR56), multiple mask units C (C11~56) corresponding to each mask unit area CR (CR11~CR56) can also be formed. Cover 100. Furthermore, a plurality of templates 50 each supporting a plurality of masks 100 may be provided.

圖15是示出本發明的一實施例涉及的將遮罩支撑模板裝載於框架上的過程的概略圖。 FIG. 15 is a schematic diagram illustrating a process of loading the mask support template on the frame according to an embodiment of the present invention.

參照圖15,模板50可藉由真空吸盤90移送。用真空吸盤90吸附黏合有遮罩100的模板50的面的相反面並進行移送。真空吸盤90可以與向x、y、z、θ軸移動的移動手段(未圖示)連接。而且,真空吸盤90可吸附模板50並與能夠進行翻轉(flip)的翻轉手段(未圖示)連接。如圖15的(b)所示,真空吸盤90即使在吸附模板50並使其翻轉之後向框架200移送的過程中,也不會影響遮罩100的黏合狀態與對準狀態 Referring to FIG. 15 , the template 50 can be transferred by a vacuum suction cup 90 . The surface opposite to the surface of the template 50 to which the mask 100 is bonded is sucked by the vacuum suction cup 90 and transferred. The vacuum suction cup 90 may be connected to moving means (not shown) that move in the x, y, z, and θ axes. Furthermore, the vacuum suction cup 90 can adsorb the template 50 and is connected to a flipping means (not shown) capable of flipping. As shown in (b) of FIG. 15 , the vacuum suction cup 90 does not affect the bonding state and alignment state of the mask 100 even when the template 50 is adsorbed and turned over and then transferred to the frame 200 .

圖16是示出本發明一實施例涉及的將模板裝載於框架上以使遮罩與框架的單元區域對應的狀態的概略圖。圖16雖示 出將一個遮罩100與單元區域CR對應/黏合的例子,但也可以進行將多個遮罩100同時與所有單元區域CR分別對應以使遮罩100黏合於框架200上的過程。此時,可具有用於分別支撐多個遮罩100的多個模板50。 16 is a schematic diagram illustrating a state in which a template is mounted on a frame so that a mask corresponds to a unit area of the frame according to an embodiment of the present invention. Figure 16 shows The following is an example of associating/gluing one mask 100 to the unit area CR, but it is also possible to perform a process of corresponding multiple masks 100 to all unit areas CR at the same time so that the masks 100 are adhered to the frame 200 . At this time, there may be a plurality of templates 50 for supporting a plurality of masks 100 respectively.

然後,參照圖16,可以使遮罩100與框架200的一個遮罩單元區域CR對應。可藉由將模板50裝載於框架200[或者遮罩單元片材部220]上,實現遮罩100與遮罩單元區域CR的對應。控制模板50/真空吸盤90的位置的同時通過顯微鏡觀察遮罩100是否與遮罩單元區域CR對應。由於模板50擠壓遮罩100,因此遮罩100與框架200可緊密地抵接。 Then, referring to FIG. 16 , the mask 100 can be made to correspond to one mask unit area CR of the frame 200 . Correspondence between the mask 100 and the mask unit area CR can be achieved by loading the template 50 on the frame 200 [or the mask unit sheet part 220]. While controlling the position of the template 50/vacuum suction cup 90, observe through a microscope whether the mask 100 corresponds to the mask unit area CR. Since the template 50 presses the mask 100, the mask 100 and the frame 200 can be tightly abutted.

另一方面,亦可以在框架200下部佈置下部支撑體70。下部支撑體70具有可進入框架邊緣部210的中空區域R內部的尺寸且具有平坦的形狀。而且,下部支撑體70的上面亦可形成有與遮罩單元片材部220的形狀對應的規定支撐槽(未圖示)。此時,邊緣片材部221、第一柵格片材部223及第二柵格片材部225插入支撐槽內,藉以使遮罩單元片材部220更好地固定。 On the other hand, the lower support body 70 may also be arranged under the frame 200 . The lower support body 70 has a size that can enter the inside of the hollow region R of the frame edge portion 210 and has a flat shape. Furthermore, a predetermined support groove (not shown) corresponding to the shape of the mask unit sheet portion 220 may be formed on the upper surface of the lower support body 70 . At this time, the edge sheet part 221, the first grid sheet part 223 and the second grid sheet part 225 are inserted into the support groove, so that the mask unit sheet part 220 is better fixed.

下部支撑體70可擠壓與遮罩100接觸的遮罩單元區域CR的相反面。即,下部支撑體70沿上部方向支撑遮罩單元片材部220,藉以防止遮罩100的黏合過程中遮罩單元片材部220向下部下垂。與此同時,下部支撑體70與模板50以相互相反的方向擠壓遮罩100的邊緣部分及框架200[或者遮罩單元片材部220],故不會破壞遮罩100的對準狀態並使其保持對準。 The lower support body 70 may press the opposite surface of the mask unit region CR in contact with the mask 100 . That is, the lower support body 70 supports the mask unit sheet portion 220 in the upper direction, thereby preventing the mask unit sheet portion 220 from sagging downward during the bonding process of the mask 100 . At the same time, the lower support 70 and the template 50 press the edge portion of the mask 100 and the frame 200 [or the mask unit sheet portion 220] in opposite directions, so the alignment of the mask 100 will not be destroyed and the Keep it aligned.

如此,僅藉由模板50上附著遮罩100且將模板50裝載於框架200上就可以完成使遮罩100與框架200的遮罩單元區域CR對應的過程,此過程對遮罩100不施加任何拉伸力。 In this way, the process of making the mask 100 correspond to the mask unit area CR of the frame 200 can be completed only by attaching the mask 100 to the template 50 and loading the template 50 on the frame 200. This process does not impose any influence on the mask 100. Tensile force.

接著,向遮罩100照射鐳射L,以使遮罩100藉由鐳射焊接黏合於框架200。被鐳射焊接的遮罩的焊接部部分生成焊接焊珠WB,焊接焊珠WB可具有與遮罩100/框架200相同的材料且與遮罩100/框架200連接成一體。 Next, the laser L is irradiated to the mask 100, so that the mask 100 is bonded to the frame 200 through laser welding. The welding portion of the laser welded mask generates welding beads WB, which may have the same material as the mask 100/frame 200 and be integrated with the mask 100/frame 200.

圖17是示出本發明的一實施例涉及的將遮罩100黏合於框架200上之後分離遮罩100與模板50的過程的概略圖。 FIG. 17 is a schematic diagram illustrating the process of separating the mask 100 and the template 50 after the mask 100 is bonded to the frame 200 according to an embodiment of the present invention.

參照圖17,在使遮罩100黏合於框架200之後,可分離(debonding)遮罩100與模板50。遮罩100與模板50之間的分離可藉由對臨時黏合部55進行加熱ET、化學處理CM、施加超聲波US、施加UV中的至少一個來實現。由於遮罩100保持與框架200黏合的狀態,因此可以只抬起模板50。作為一例,若施加比85℃~100℃高的熱ET,則臨時黏合部55的粘性下降,且遮罩100與模板50的黏著力邊弱,故可以分離遮罩100與模板50。作為其他例子,將臨時黏合部55浸漬CM於IPA、丙酮、乙醇等化學物質中,藉以由溶解、去除臨時黏合部55等方式分離遮罩100與模板50。作為又一例,若施加超聲波US或施加UVUV,則遮罩100與模板50間的黏著力變弱,故可使遮罩100與模板50分離。 Referring to FIG. 17 , after the mask 100 is bonded to the frame 200 , the mask 100 and the template 50 can be debonded. The separation between the mask 100 and the template 50 can be achieved by at least one of heating ET, chemical treatment CM, applying ultrasonic waves US, and applying UV to the temporary bonding portion 55 . Since the mask 100 remains adhered to the frame 200, only the template 50 can be lifted. As an example, if a thermal ET higher than 85° C. to 100° C. is applied, the viscosity of the temporary bonding portion 55 decreases, and the adhesive force between the mask 100 and the template 50 becomes weaker, so the mask 100 and the template 50 can be separated. As another example, the temporary adhesive portion 55 is immersed in CM in chemical substances such as IPA, acetone, ethanol, etc., so as to separate the mask 100 and the template 50 by dissolving and removing the temporary adhesive portion 55 . As another example, if ultrasonic waves US or UVUV are applied, the adhesive force between the mask 100 and the template 50 becomes weak, so the mask 100 and the template 50 can be separated.

進一步而言,由於使遮罩100與模板50黏合的臨時黏合部55是TBDB黏合材料(temporary bonding&debonding adhesive), 故可以使用各種分離(debonding)方法。 Furthermore, since the temporary bonding portion 55 that bonds the mask 100 and the template 50 is a TBDB adhesive material (temporary bonding & debonding adhesive), Therefore, various debonding methods can be used.

作為一例,可使用基於化學處理CM的溶劑剝離(Solvent Debonding)方法。藉由溶劑(solvent)的滲透導致臨時黏合部55溶解以實現剝離。此時,由於遮罩100上形成有圖案P,因此溶劑將通過遮罩圖案P及遮罩100與模板50間的界面滲透。溶劑剝離可在常溫(room temperature)下進行且無需其他的複雜剝離設備,故相比於其他剝離方法具有經濟性。 As an example, a solvent debonding method based on chemically treated CM can be used. The temporary adhesive portion 55 is dissolved by penetration of a solvent to achieve peeling. At this time, since the pattern P is formed on the mask 100 , the solvent will penetrate through the mask pattern P and the interface between the mask 100 and the template 50 . Solvent stripping can be performed at room temperature and does not require other complex stripping equipment, so it is more economical than other stripping methods.

作為又一例,可使用基於加熱ET的熱剝離(Heat Debonding)方法。用高溫的熱誘導臨時黏合部55的分解,若遮罩100與模板50間的黏著力减少,可向上下方向或者左右方向進行剝離。 As another example, a heat debonding method based on heating ET can be used. High-temperature heat induces the decomposition of the temporary adhesive portion 55, and if the adhesive force between the mask 100 and the template 50 is reduced, the mask 100 can be peeled off in the vertical or left-right direction.

作為又一例,可使用基於加熱ET、施加UVUV等的剝離黏合劑之剝離(Peelable Adhesive Debonding)方法。若臨時黏合部55是熱分離膠帶,則可藉由剝離黏合劑之剝離方法進行剝離,該方法與熱剝離方法相同,無需高溫的熱處理及昂貴的熱處理設備且工藝相對簡單。 As another example, a Peelable Adhesive Debonding method based on heating ET, applying UVUV, or the like can be used. If the temporary adhesive part 55 is a thermal release tape, it can be peeled off by a peeling method of peeling off the adhesive. This method is the same as the thermal peeling method, and does not require high-temperature heat treatment and expensive heat treatment equipment, and the process is relatively simple.

作為又一例,可以使用基於化學處理CM、施加超聲波US、施加UVUV等的常溫剝離(Room Temperature Debonding)方法。若對遮罩100或者模板50的一部分(中心部)處理non-sticky,則只有邊緣部分藉由臨時黏合部55被黏合。另外,剝離時邊緣部分上有溶劑滲透,因此可藉由臨時黏合部55的溶解實現剝離。該方法具有以下優點:在進行粘合與剝離的過程中,除了遮罩100、模板50的邊緣區域以外的剩餘部分不會發生直接損傷或者剝離時由於黏 合材料殘渣(residue)引起的缺陷等。而且,該方法與熱剝離方法不同,由於剝離時無需進行高溫的熱處理過程,故具有能夠相對减少工藝費用的優點。 As another example, a room temperature debonding method based on chemical treatment CM, application of ultrasonic waves US, application of UVUV, etc. can be used. If a part (center part) of the mask 100 or the template 50 is processed to be non-sticky, only the edge part is adhered by the temporary adhesive part 55 . In addition, since solvent penetrates into the edge portion during peeling, peeling can be achieved by dissolving the temporary adhesive portion 55 . This method has the following advantages: during the bonding and peeling process, the remaining parts except the edge areas of the mask 100 and the template 50 will not be directly damaged or will not be damaged due to adhesion during peeling. Defects caused by composite material residue (residue), etc. Moreover, this method is different from the thermal stripping method in that it does not require a high-temperature heat treatment process during stripping, so it has the advantage of relatively reducing process costs.

圖18是示出本發明的一實施例涉及的將遮罩100黏合於框架200上的狀態的概略圖。 FIG. 18 is a schematic diagram showing a state in which the mask 100 is adhered to the frame 200 according to an embodiment of the present invention.

參照圖18,一個遮罩100可黏合於框架200的一個單元區域CR上。 Referring to FIG. 18 , a mask 100 may be bonded to a unit region CR of the frame 200 .

由於框架200的遮罩單元片材部220具有薄的厚度,在對遮罩100施加拉伸力的狀態下,黏合於遮罩單元片材部220時,遮罩100中殘存的拉伸力作用於遮罩單元片材部220以及遮罩單元區域CR,也有可能使它們變形。因此,應該在對遮罩100不施加拉伸力的狀態下,將遮罩100黏合於遮罩單元片材部220。本發明僅藉由模板50上附著遮罩100且將模板50裝載於框架200上就可以完成使遮罩100與框架200的遮罩單元區域CR對應的過程,此過程對遮罩100不施加任何拉伸力。由此,可以防止因施加到遮罩100的拉伸力作為張力(tension)反向作用於框架200而導致框架200(或者遮罩單元片材部220)變形。 Since the mask unit sheet portion 220 of the frame 200 has a thin thickness, when the mask 100 is adhered to the mask unit sheet portion 220 with a tensile force applied, the tensile force remaining in the mask 100 acts. The mask unit sheet portion 220 and the mask unit region CR may be deformed. Therefore, the mask 100 should be adhered to the mask unit sheet portion 220 without applying tensile force to the mask 100 . The present invention can complete the process of making the mask 100 correspond to the mask unit area CR of the frame 200 by only attaching the mask 100 to the template 50 and loading the template 50 on the frame 200. This process does not impose any influence on the mask 100. Tensile force. This can prevent the frame 200 (or the mask unit sheet portion 220 ) from deforming due to the tensile force applied to the mask 100 acting in reverse on the frame 200 as tension.

現有的圖1的遮罩10包括6個單元C1~C6,因此具有較長的長度,而本發明的遮罩100包括一個單元C,因此具有較短的長度,因此PPA(pixel position accuracy)扭曲的程度會變小。假設包括多個單元C1~C6、...的遮罩10的長度為1m,並且在1m的總長度中發生10μm的PPA誤差,則本發明的遮罩100可以隨著相對長度 減小(相當於單元C數量減少)而使上述誤差範圍1/n。例如,本發明的遮罩100長度為100mm,則具有從現有的遮罩10的1m減小為1/10的長度,因此在100mm的總長度中發生1μm的PPA誤差,使對準誤差顯著下降。 The existing mask 10 of FIG. 1 includes six units C1 to C6 and therefore has a longer length, while the mask 100 of the present invention includes one unit C and therefore has a shorter length, so the PPA (pixel position accuracy) is distorted. will become smaller. Assuming that the length of the mask 10 including multiple units C1 ~ C6, ... is 1 m, and a PPA error of 10 μm occurs in the total length of 1 m, the mask 100 of the present invention can be adjusted with the relative length Reduce (equivalent to a reduction in the number of units C) to make the above error range 1/n. For example, if the length of the mask 100 of the present invention is 100 mm, it has a length reduced from 1 m of the existing mask 10 to 1/10. Therefore, a PPA error of 1 μm occurs in the total length of 100 mm, significantly reducing the alignment error. .

另一方面,遮罩100具備多個單元C,若即使各個單元C與框架200的各個單元區域CR對應,對準誤差仍處於最小化範圍內,則遮罩100也可以與框架200的多個遮罩單元區域CR對應。或者,具有多個單元C的遮罩100也可以與一個遮罩單元區域CR對應。在這種情况下,考慮到基於對準的工藝時間和生産性,遮罩100優選具備盡可能少量的單元C。 On the other hand, the mask 100 is provided with a plurality of units C. Even if each unit C corresponds to each unit area CR of the frame 200, if the alignment error is still within a minimized range, the mask 100 may be matched with a plurality of units C of the frame 200. Corresponds to the mask unit area CR. Alternatively, the mask 100 having a plurality of cells C may correspond to one mask unit region CR. In this case, in consideration of process time and productivity based on alignment, the mask 100 is preferably provided with as few cells C as possible.

就本發明而言,由於只需匹配遮罩100的一個單元C並確認對準狀態即可,因此與同時匹配多個單元C(C1~C6)並需要確認全部對準狀態的現有方法相比,可以顯著縮短製造時間。 As far as the present invention is concerned, since only one unit C of the mask 100 needs to be matched and the alignment status is confirmed, compared with the existing method of matching multiple units C (C1~C6) at the same time and needing to confirm all the alignment statuses , which can significantly shorten manufacturing time.

即,本發明的框架一體型遮罩的製造方法與現有方法相比,能夠明顯縮短時間,該現有方法通過使包含於6個遮罩100的各個單元C11~C16分別與一個單元區域CR11~CR16對應並確認各個對準狀態的6次過程,同時匹配6個單元C1~C6,並且需要同時確認6個單元C1~C6的對準狀態。 That is, the manufacturing method of the frame-integrated mask of the present invention can significantly shorten the time compared with the conventional method in which each unit C11 to C16 included in the six masks 100 is connected to one unit region CR11 to CR16 respectively. Corresponding to and confirming each alignment status 6 times, 6 units C1~C6 are matched at the same time, and the alignment status of 6 units C1~C6 needs to be confirmed at the same time.

另外,在本發明的框架一體型遮罩的製造方法中,使30個遮罩100分別與30個單元區域CR(CR11~CR56)對應並對準的30次的過程中的產品產率,會明顯高於使分別包括6個單元C1~C6的5個遮罩10(參照圖2的(a))與框架20對應並對準的5次過程中的現 有產品的產率。由於在每次對應於6個單元C的區域中對準6個單元C1~C6的現有方法是明顯繁瑣、困難的作業,因此産品産率低。 In addition, in the manufacturing method of the frame-integrated mask of the present invention, the product yield in the 30 processes of corresponding and aligning the 30 masks 100 to the 30 unit areas CR (CR11 to CR56) will decrease. It is significantly higher than the actual result in the five processes of corresponding and aligning the five masks 10 (refer to (a) of FIG. 2 ) including the six units C1 to C6 respectively with the frame 20. There is a product yield. Since the existing method of aligning 6 units C1 to C6 in an area corresponding to 6 units C at a time is an obviously tedious and difficult operation, the product yield is low.

另外,在圖12的(b)步驟中,如上所述,藉由層壓工藝將遮罩金屬膜110黏合於模板50上時,遮罩金屬膜110上會施加有約100℃的溫度。基於此,遮罩金屬膜110在施加有一部分拉伸力的狀態下黏合於模板50上。之後,遮罩100黏合與框架200上,若遮罩100與模板50分離,則遮罩100將會收縮預定程度。 In addition, in step (b) of FIG. 12 , as mentioned above, when the mask metal film 110 is bonded to the template 50 through a lamination process, a temperature of about 100° C. is applied to the mask metal film 110 . Based on this, the mask metal film 110 is adhered to the template 50 while applying a part of the tensile force. Afterwards, the mask 100 is bonded to the frame 200. If the mask 100 is separated from the template 50, the mask 100 will shrink to a predetermined degree.

當個遮罩100分別黏合於與其對應的遮罩單元區域CR之後,使模板50與遮罩100分離時,多個遮罩100沿著相反方向施加收縮的張力,故該力被抵銷,因此在遮罩單元片材部220不發生變形。例如,在附著於CR11單元區域的遮罩100與附著於CR12單元區域的遮罩100之間的第一柵格片材部223中,向附著於CR11單元區域的遮罩100的右側方向作用的張力與向附著於CR12單元區域的遮罩100的左側方向作用的張力相互抵消。由此,最大限度地降低基於張力的框架200[或者遮罩單元片材部220]變形,從而能夠最大限度地降低遮罩100[或者遮罩圖案P]的對準誤差。 When each mask 100 is respectively adhered to its corresponding mask unit area CR and the template 50 is separated from the mask 100, the multiple masks 100 exert contraction tension in opposite directions, so the force is offset. Therefore, No deformation occurs in the mask unit sheet portion 220 . For example, in the first grid sheet portion 223 between the mask 100 attached to the CR11 unit area and the mask 100 attached to the CR12 unit area, the mask 100 attached to the CR11 unit area acts in the right direction. The tension and the tension acting in the left direction of the mask 100 attached to the CR12 unit area cancel each other out. Thereby, the deformation of the frame 200 [or the mask unit sheet part 220 ] due to tension is minimized, so that the alignment error of the mask 100 [or the mask pattern P] can be minimized.

圖19是示出本發明之一實施例涉及之利用框架一體型遮罩100、200的OLED像素沉積裝置1000的概略圖。 FIG. 19 is a schematic diagram illustrating an OLED pixel deposition apparatus 1000 using frame-integrated masks 100 and 200 according to an embodiment of the present invention.

參照圖19,OLED像素沉積裝置1000包括:磁板300,其容納有磁體310,並且排布有冷却水管350;沉積源供給部500,其從磁板300的下部供給有機物源600。 Referring to FIG. 19 , the OLED pixel deposition device 1000 includes: a magnetic plate 300 that houses the magnet 310 and is arranged with cooling water pipes 350 ; and a deposition source supply part 500 that supplies the organic source 600 from the lower part of the magnetic plate 300 .

磁板300與沉積源供給部500之間可以插入有用於沉 積有機物源600的玻璃等目標基板900。目標基板900上可以以緊貼或非常接近的方式配置有使有機物源600按不同像素沉積的框架一體型遮罩100、200[或者FMM]。磁體310可以産生磁場,並藉由磁場緊貼到目標基板900上。 A device for sedimentation may be inserted between the magnetic plate 300 and the deposition source supply part 500. A target substrate 900 such as glass on which the organic source 600 is deposited. The target substrate 900 may be provided with a frame-integrated mask 100 or 200 [or FMM] that allows the organic source 600 to be deposited in different pixels in a close or very close manner. The magnet 310 can generate a magnetic field and adhere to the target substrate 900 through the magnetic field.

沉積源供給部500可以往返左右路徑並供給有機物源600,由沉積源供給部500供給的有機物源600可以通過形成於框架一體型遮罩100、200的圖案P並沉積於目標基板900的一側。通過框架一體型遮罩100、200的圖案P後之被沉積的有機物源600,可以用作OLED的像素700。 The deposition source supply unit 500 can reciprocate the left and right paths and supply the organic source 600 . The organic source 600 supplied from the deposition source supply unit 500 can pass through the pattern P formed on the frame-integrated masks 100 and 200 and be deposited on one side of the target substrate 900 . The organic source 600 deposited after passing through the pattern P of the frame-integrated mask 100, 200 can be used as the pixel 700 of the OLED.

為了防止由於陰影效應(Shadow Effect)發生的像素700的不均勻沉積,框架一體型遮罩100、200的圖案可以傾斜地形成S[或者以錐形S形成]。沿著傾斜表面,在對角綫方向上通過圖案的有機物源600,也可以有助於像素700的形成,因此,能夠整體上厚度均勻地沉積像素700。 In order to prevent uneven deposition of the pixels 700 due to the shadow effect (Shadow Effect), the pattern of the frame-integrated mask 100, 200 may be formed obliquely S [or formed in a tapered S]. The organic matter source 600 passing through the pattern in the diagonal direction along the inclined surface may also contribute to the formation of the pixel 700, so that the pixel 700 can be deposited with a uniform thickness overall.

在高於像素沉積工藝溫度的第一溫度下,遮罩100黏合固定於框架200,因此即使提升至用於沉積像素工藝的溫度,也對遮罩圖案P的位置幾乎不構成影響,遮罩100和相鄰的遮罩100之間的PPA能夠保持為不超過3μm。 At the first temperature higher than the pixel deposition process temperature, the mask 100 is adhesively fixed to the frame 200 . Therefore, even if the temperature is raised to the temperature used for the pixel deposition process, it will have almost no impact on the position of the mask pattern P. The mask 100 The PPA between the adjacent mask 100 can be maintained at no more than 3 μm.

如上所述,本發明列舉了優選實施例進行圖示和說明,但是不限於上述實施例,在不脫離本發明的精神的範圍內,該技術領域中具有通常知識者能夠進行各種變形和變更。這種變形及變更均落在本發明和所附的申請專利範圍的範圍內。 As mentioned above, the present invention has been illustrated and described by enumerating preferred embodiments, but is not limited to the above-described embodiments. A person skilled in the art can make various modifications and changes without departing from the spirit of the present invention. Such deformations and changes are within the scope of the present invention and the appended patent applications.

50:模板(template) 50: template

51:鐳射貫穿孔 51:Laser through hole

55:臨時黏合部 55: Temporary bonding part

25:絕緣部 25:Insulation Department

26:絕緣部之間的空位置 26: Empty space between insulating parts

100:遮罩 100:mask

110:遮罩膜 110: Masking film

C:單元、遮罩單元 C: unit, mask unit

DM:虛設部、遮罩虛設部 DM: Dummy part, mask dummy part

P:遮罩圖案 P: Mask pattern

Claims (18)

一種遮罩支撑模板的製造方法,該模板(template)用於支撐OLED像素形成用遮罩並使其與框架對應,其中該方法包括以下步驟:(a)提供遮罩金屬膜;(b)將遮罩金屬膜黏合到一面形成有臨時黏合部的模板上;以及(c)在遮罩金屬膜上形成遮罩圖案,以製造遮罩,其中步驟(c)包括:(c1)在遮罩金屬膜上形成圖案化的絕緣部的步驟;(c2)蝕刻從絕緣部之間露出的遮罩金屬膜的部分以形成遮罩圖案的步驟;以及(c3)去除絕緣部的步驟。 A method of manufacturing a mask support template, the template is used to support a mask for OLED pixel formation and make it correspond to a frame, wherein the method includes the following steps: (a) providing a mask metal film; (b) applying The mask metal film is bonded to a template with a temporary adhesive portion formed on one side; and (c) forming a mask pattern on the mask metal film to manufacture the mask, wherein step (c) includes: (c1) forming a mask on the mask metal film The steps of forming a patterned insulating portion on the film; (c2) etching the portion of the mask metal film exposed from between the insulating portions to form a mask pattern; and (c3) removing the insulating portion. 如請求項1所述的遮罩支撑模板的製造方法,其中步驟(b)與步驟(c)之間還包括:用於缩减黏合於模板上的遮罩金屬膜的厚度的步驟。 The manufacturing method of a mask supporting template as claimed in claim 1, wherein between step (b) and step (c), a step of reducing the thickness of the mask metal film adhered to the template is further included. 如請求項1所述的遮罩支撑模板的製造方法,其中通過電鑄生成遮罩金屬膜時,步驟(a)包括:(a1)在導電性單晶基材的至少一面形成遮罩金屬膜的步驟;以及(a2)從導電性單晶基材分離遮罩金屬膜的步驟。 The manufacturing method of a mask support template as claimed in claim 1, wherein when the mask metal film is generated by electroforming, step (a) includes: (a1) forming a mask metal film on at least one side of the conductive single crystal substrate The step of; and (a2) the step of separating the mask metal film from the conductive single crystal substrate. 如請求項1所述的遮罩支撑模板的製造方法, 其中臨時黏合部是藉由加熱可分離的黏合劑或者黏合片材;藉由照射UV可分離的黏合劑或者黏合片材。 The manufacturing method of the mask support template as described in claim 1, The temporary adhesive part is an adhesive or adhesive sheet that can be separated by heating; an adhesive or adhesive sheet that can be separated by UV irradiation. 如請求項1所述的遮罩支撑模板的製造方法,其中臨時黏合部於模板一整個面上形成,遮罩金屬膜於整個臨時黏合部上黏合。 The manufacturing method of a mask support template as described in claim 1, wherein the temporary bonding portion is formed on an entire surface of the template, and the mask metal film is bonded on the entire temporary bonding portion. 如請求項1所述的遮罩支撑模板的製造方法,其中模板包括晶圓、玻璃(glass)、氧化矽(silica)、耐熱玻璃、石英(quartz)、氧化鋁(Al2O3)、硼矽酸玻璃(borosilicate glass)、氧化鋯(zirconia)中的任意一種材料。 The manufacturing method of the mask support template as described in claim 1, wherein the template includes wafer, glass, silica, heat-resistant glass, quartz, aluminum oxide (Al2O3), borosilicate glass (borosilicate glass), zirconia (zirconia) any material. 一種遮罩支撐模板,其支撐OLED像素形成用遮罩並使其與框架對應,其中該模板包括:一模板;一臨時黏合部,其形成於模板上;以及一遮罩,其藉由夾設臨時黏合部黏合到模板上,且形成有遮罩圖案,其中該模板與該遮罩的焊接部對應的部分形成有鐳射貫穿孔。 A mask support template that supports a mask for forming OLED pixels and makes it correspond to a frame, wherein the template includes: a template; a temporary adhesive portion formed on the template; and a mask that is sandwiched The temporary bonding part is bonded to the template and forms a mask pattern, wherein a laser through hole is formed in a part of the template corresponding to the welding part of the mask. 如請求項7所述的遮罩支撑模板,其中臨時黏合部是藉由加熱可分離的黏合劑或者黏合片材;藉由照射UV可分離的黏合劑或者黏合片材。 The mask support template as claimed in claim 7, wherein the temporary adhesive portion is an adhesive or adhesive sheet that is detachable by heating; an adhesive or adhesive sheet that is detachable by irradiating UV. 如請求項7所述的遮罩支撑模板,其中臨時黏合部於模板一整個面上形成,遮罩金屬膜於整個臨時黏合部上黏 合。 The mask support template as claimed in claim 7, wherein the temporary adhesive portion is formed on an entire surface of the template, and the mask metal film is adhered to the entire temporary adhesive portion. combine. 如請求項7所述的遮罩支撑模板,其中模板包括晶圓、玻璃(glass)、氧化矽(silica)、耐熱玻璃、石英(quartz)、氧化鋁(Al2O3)、硼矽酸玻璃(borosilicate glass)、氧化鋯(zirconia)中的任意一種材料。 The mask support template as described in claim 7, wherein the template includes wafer, glass, silica, heat-resistant glass, quartz, aluminum oxide (Al 2 O 3 ), borosilicate glass (borosilicate glass), zirconia (zirconia) any material. 如請求項7所述的遮罩支撑模板,其中遮罩包括形成有多個遮罩圖案的遮罩單元與遮罩單元周邊的虛設部。 The mask support template according to claim 7, wherein the mask includes a mask unit formed with a plurality of mask patterns and a dummy portion around the mask unit. 一種框架一體型遮罩的製造方法,其使至少一個遮罩與用於支撐遮罩的框架形成為一體,其中該方法包括以下步驟:(a)提供遮罩金屬膜;(b)將遮罩金屬膜黏合到一面形成有臨時黏合部的模板上;(c)在遮罩金屬膜上形成遮罩圖案,以製造遮罩;(d)提供具有至少一個遮罩單元區域的框架;(e)將模板裝載於框架上,以使遮罩與框架的遮罩單元區域對應;以及(f)向遮罩的焊接部照射鐳射,以使遮罩黏合到框架上。 A method of manufacturing a frame-integrated mask, which integrates at least one mask with a frame used to support the mask, wherein the method includes the following steps: (a) providing a mask metal film; (b) converting the mask The metal film is bonded to a template with a temporary adhesive portion formed on one side; (c) forming a mask pattern on the mask metal film to manufacture the mask; (d) providing a frame with at least one mask unit area; (e) Loading the template on the frame so that the mask corresponds to the mask unit area of the frame; and (f) irradiating the laser to the welding portion of the mask to bond the mask to the frame. 如請求項12所述的框架一體型遮罩的製造方法,其中步驟(d)包括:(d1)提供包含中空區域的邊緣框架部;(d2)將平面狀的遮罩單元片材部連接於邊緣框架部;以及(d3)在遮罩單元片材部形成多個遮罩單元區域,以製造框架。 The manufacturing method of a frame-integrated mask according to claim 12, wherein step (d) includes: (d1) providing an edge frame part including a hollow area; (d2) connecting the planar mask unit sheet part to edge frame portion; and (d3) forming a plurality of mask unit areas in the mask unit sheet portion to manufacture a frame. 如請求項12所述的框架一體型遮罩的製造方法,其中步驟(d)包括:(d1)提供包含中空區域的邊緣框架部;以及(d2)將具有多個遮罩單元區域的遮罩單元片材部連接到邊緣框架部,以製造框架。 The manufacturing method of a frame-integrated mask according to claim 12, wherein step (d) includes: (d1) providing an edge frame part including a hollow area; and (d2) converting a mask having a plurality of mask unit areas The unit sheet parts are connected to the edge frame parts to make the frame. 如請求項12所述的框架一體型遮罩的製造方法,其中臨時黏合部是藉由加熱可分離的黏合劑或者黏合片材;藉由照射UV可分離的黏合劑或者黏合片材。 The manufacturing method of a frame-integrated mask as claimed in claim 12, wherein the temporary adhesive part is an adhesive or adhesive sheet that is detachable by heating; an adhesive or adhesive sheet that is detachable by irradiating UV. 如請求項12所述的框架一體型遮罩的製造方法,其中照射到模板上部的鐳射穿過鐳射貫穿孔並照射到遮罩的焊接部。 The manufacturing method of a frame-integrated mask as claimed in claim 12, wherein the laser irradiated to the upper part of the template passes through the laser through hole and irradiates the welding part of the mask. 如請求項12所述的框架一體型遮罩的製造方法,其中還包括在步驟(f)之後對臨時黏合部進行加熱、化學處理、施加超聲波、施加UV中的任意一個,藉以分離遮罩與模板的步驟。 The manufacturing method of the frame-integrated mask as described in claim 12, which further includes subjecting the temporary bonding portion to any one of heating, chemical treatment, ultrasonic application, and UV application after step (f), thereby separating the mask and Template steps. 如請求項12所述的框架一體型遮罩的製造方法,其中遮罩與框架是恆範鋼(invar)、超恆範鋼(super invar)、鎳、鎳-鈷中任意一種材料。 The manufacturing method of a frame-integrated mask as described in claim 12, wherein the mask and the frame are made of any one of invar steel (invar), super invar steel (super invar), nickel, and nickel-cobalt.
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