TWI824790B - Connector - Google Patents

Abstract

A connector includes a circuit board and at least one movable probe kit. The movable probe kit is disposed on the circuit board and electrically connected to the circuit board. Each of the movable probe kit includes a probe and a spring. The probe has a front end and a back end. The forward platform of the front end includes a flat surface. The front end and the back end are a cylindrical shape respectively and the diameter of front end is greater than the diameter of the back end. The spring connects the back end of the probe and enables the probe to move relatively to the circuit board.

Description

connector

The present disclosure relates to a connector, and more specifically, to a connector for measuring impedance.

Probes have the advantages of high repeatability and good stability when measuring bare wires. They are often used to test the impedance value of wires that are about to be shipped out of the factory. However, traditional bare wire measurement probes protrude from the outer tube and are used to contact the bare wire to measure the impedance value.

However, during measurement, since the probe cannot be fully compressed into the outer tube, and the end of the probe is sharp and not specially designed, it is easy to cause reflection of the measurement signal due to manufacturing tolerances, such as impedance discontinuity during measurement. , and the high electromagnetic wave reflection makes it difficult to improve the stability of the measurement.

In view of this, one purpose of the present disclosure is to provide a connector that can solve the above problems.

In order to achieve the above object, according to some embodiments of the present disclosure, a connector includes a circuit board and at least one movable probe group. The movable probe groups are arranged on the circuit board and are electrically connected to the circuit board. Each movable probe group includes a probe and a spring. The probe includes a front end portion and a rear end portion. The front end surface of the front end portion includes a substantial plane. The front end portion and the rear end portion are respectively in the shape of a column and the front end portion is thicker than the rear end portion. A spring is connected to the rear end of the probe to allow movement of the probe relative to the circuit board.

In some embodiments, the above-mentioned connector further includes a conductive bushing fixed on the circuit board and electrically connected to the circuit board, wherein the conductive bushing has a front opening and a closed wall, wherein the probe is pressed to In the final compressed state, the distance between the front end of the probe and the conductive bushing is between 0 and 2 mm.

In some embodiments, the outer contour of the conductive bushing is a tube, and the outer contour of the front end of the probe matches the output contour of the front end of the conductive bushing.

In some embodiments, the spring is located within the conductive bushing and resists the base of the probe.

In some embodiments, when the front end of the probe is joined to the conductive bushing, the probe and the conductive bushing may form a cylinder with a continuous surface.

In some embodiments, when the probe is compressed to the final compression state, the substantial plane of the front end of the probe is flush with the edge of the circuit board.

In some embodiments, the connector is a measurement device. It further includes two connection ports, respectively used for cable connection; the number of movable probe groups is at least two, and the probes of the movable probe groups are arranged in parallel with each other.

In some embodiments, the circuit board has circuitry extending from the conductive bushing to one of the two connection ports.

To sum up, in the above-mentioned embodiments of the present disclosure, since the roots of the probes are contacted by springs, when multiple probes are in contact with the wire to be measured at the same time, if a slight tilt occurs, the base of the probes can be contacted by the springs. The spring pushes all probes into contact with the wire under test at the same time. In addition, since the end of the probe is substantially flat and the diameter of the end of the probe is thicker than the root of the probe, when the probe contacts the wire to be tested, it can more accurately contact the wire to be tested than a traditional probe, which can avoid errors caused by manufacturing tolerances. The measurement signal reflection (such as electromagnetic wave reflection) improves the repeatability and stability of the measurement and obtains a more continuous measurement impedance.

The following disclosure of embodiments provides many different implementations, or examples, for implementing various features of the provided subject matter. Specific examples of components and arrangements are described below to simplify the present application. Of course, these examples are examples only and are not intended to be limiting. Additionally, reference symbols and/or letters may be repeated in each instance. This repetition is for simplicity and clarity and does not by itself specify a relationship between the various embodiments and/or configurations discussed.

Spatially relative terms such as “below,” “below,” “lower,” “above,” “upper,” and the like may be used herein for convenience of description, to describe The relationship of one element or feature to another element or feature is illustrated in the drawings. Spatially relative terms are intended to encompass different orientations of the device in use or operation in addition to the orientation illustrated in the figures. The device may be otherwise oriented (rotated 90 degrees or at other orientations) and the spatially relative descriptors used herein interpreted accordingly.

FIG. 1 illustrates a top view of a connector 100 according to an embodiment of the present disclosure. Figure 2 shows a schematic cross-sectional view of the connector 100 of Figure 1 along line 2-2. Referring to FIGS. 1 and 2 simultaneously, the connector 100 includes a circuit board 110 and movable probe sets 120a and 120b.

The movable probe sets 120a and 120b are connecting elements similar to pogo pins and have a telescopic function. The movable probe groups 120a respectively include probes 122a and springs 124a. The movable probe group 120b has the same structure as the movable probe group 120a, which will not be described again. In the following description, the movable probe group 120a is only used as an example for explanation.

The probe 122a includes a front end portion 122c (such as the end far away from the spring 124a) and a rear end portion 122d (such as the end close to the spring 124a), both of which are cylindrical, and the front end 122c and the rear end 122d are respectively cylindrical. shape, and the front end portion 122c is thicker than the rear end portion 122d, so that the two shapes are roughly T-shaped when viewed from above.

The material of the probe 122a is metal and has good electrical conductivity. The spring 124a resists the rear end 122d of the probe 122a to allow the probe 122a to move relative to the circuit board 110. When the front end 122c of the probe 122a is pressed, the spring 124a can contract; when the force on the front end 122c of the probe 122a is removed, the elastic restoring force of the spring 124a can push the probe 122a back to its original position.

In this embodiment, the connector 100 further includes a conductive bushing 126a, and the outer contour of the conductive bushing 126a is a tube body. The conductive bushing 126a is made of metal and has good conductivity. The conductive bushing 126a is fixed on the circuit board 110 and is electrically connected to the circuit board 110.

In addition, the conductive bushing 126a includes a sleeve, which includes a front opening 126c and a closing wall 126d. The front opening 126c is circular and can be inserted into the rear end 122d of the probe 122a. Spring 124a is located within conductive bushing 126a. In addition, a retaining wall 126e is provided at the rear of the sleeve, and the retaining wall 126e is in contact with the end of the spring 124a away from the probe 122a. That is to say, the spring 124a is located between the retaining wall 126e of the conductive bushing 126a and the rear end portion 122d of the probe 122a, and simultaneously abuts the retaining wall 126e of the conductive bushing 126a and the rear end portion 122d of the probe 122a. As such, the rear end 122d of the probe 122a is movably located in the conductive bushing 126a. When the front end 122c of the probe 122a does not contact the wire to be measured, the front end 122c of the probe 122a is not pressed, and the spring 124a located between the retaining wall 126e of the conductive bushing 126a and the rear end 122d of the probe 122a can The front end portion 122c of the probe 122a is made to protrude from the circuit board 110. In some embodiments, when not yet compressed, the distance d between the front end 122c of the probe 122a and the front opening 126c of the conductive bushing 126a is greater than 2 millimeters.

The connector 100 may be a connector between an impedance measuring device and a conductor to be measured. The connector 100 may further include two connection ports 140a and 140b, and the connection ports 140a and 140b are respectively used for electrical connection of the cables 142a and 142b of the impedance measuring device. The number of active probe groups 120a and 120b is at least two, and the probes 122a and 122b of the active probe groups 120a and 120b are arranged in parallel with each other. In Figure 1, only two active probe sets are shown, but this is not used to limit the disclosure. In addition, the circuit board 110 has circuits 130a and 130b. The circuit 130a is embedded and buried in the circuit board 110, and both ends of the circuit 130a extend to the surface of the circuit board 110 to electrically connect the movable probe set 120a and the connection port 140a respectively. In more detail, the circuits 130a and 130b extend from the conductive bushings 126a and 126b to one of the connection ports 140a and 140b, so the conductive bushing 126a can be electrically connected to the connection port 140a through the circuit 130a. The cross-sectional configuration of the movable probe set 120b, the circuit 130b, the connection port 140b and the cable 142b is the same as the configuration of the movable probe set 120a, the circuit 130a, the connection port 140a and the cable 142a in Figure 2 and will not be repeated. The connector 100 can be connected to an external impedance measuring device through the cables 142a and 142b, so as to measure the impedance value of the conductor under test that is in contact with the movable probe sets 120a and 120b.

Figure 3 shows a perspective view of the probe 122a of Figure 2 . Referring to FIG. 3 , the front end surface of the front end portion 122c of the probe 122a includes at least one substantial flat surface 122e. However, it should be noted that the end surface of the front end 122c does not need to be flat on the entire surface. As long as the circumferential part is relatively flat, a better effect can be achieved, and the center part of the end surface can be concave or hollowed. The impact on the implementation of the present invention is less obvious.

In this example, the front end portion 122c and the rear end portion 122d of the probe 122a are respectively cylindrical, and the diameter of the front end portion 122c is larger than the diameter of the rear end portion 122d of the probe 122a. By widening the front end 122c of the probe 122a and ensuring that the circumferential portion of the end surface of the front end 122c is relatively flat and becomes a substantial plane 122e, the impedance performance of the probe can be improved and measurement signals caused by manufacturing tolerances can be avoided. Reflection (such as electromagnetic wave reflection) improves the repeatability and stability of measurement and obtains a more continuous measurement impedance.

Figure 4 shows a perspective view of the movable probe set 120a of Figure 1 . Referring to Figure 4, the conductive bushing 126a is a hollow circular tube body, and the outer contour of the front end 122c of the probe 122a matches the output contour of one end of the conductive bushing 126a. The higher the matching degree of the two side surfaces. , the better the impedance performance. Ideally, the probe 122a performs best when the front end 122c and the conductive bushing 126a are combined into a cylinder and the outer surfaces of the two are continuous.

The so-called matching can be understood as the similarity in outline between the two. More specifically, in this case, the outer contours of the conductive bushing 126a and the outer contours of the front end 122c of the probe 122a are respectively cylindrical, and the difference in diameters R1 and R2 between them is less than or equal to 10%.

It should be understood that the connection relationships, materials and functions of the components that have been described will not be repeated and will be explained first. In the following description, the state of the connector 100 when used will be described.

FIG. 5 shows a cross-sectional view of the connector 100 of FIG. 2 in contact with the conductor 200 under test and compressed to the final compressed state. The final compressed state refers to the state when the probe 122a is pressed by the object to be tested (for example, the wire 200 to be tested) and cannot push the probe 122a further into the conductive bushing 126a.

Referring to Figure 5, in this example, the movable probe groups 120a and 120b are fixed far away from the edge of the circuit board 110. When the probe 122a is pressed to the final compression state by the wire to be tested 200, the probe 122a and the conductive lining The sleeve 126a forms a cylinder-like structure. When the minimum distance d between the front end 122c of the probe 122a and the conductive bushing 126a is 0 (directly connected), the best effect is achieved. However, as long as the minimum distance d is no more than 2 mm, the impedance improvement effect will still be limited to a certain extent. reserve. At the same time, in the final compressed state, the end surface of the front end 122c of the probe 122a is flush with the edge 110a of the circuit board 110. Such a design can improve the stability when measuring the impedance value of the conductor 200 under test. In addition, when the probe 122a is pressed to the final compressed state by the wire to be tested 200, it can be smoothly retracted into the conductive bushing 126a, and the front end 122c of the probe 122a may not be in contact with the circuit board 110 and electrically connected, but will be connected via The conductive bushing 126a sleeved on the rear end 122d of the probe 122a is electrically connected to the circuit board 110. This design can improve the impedance continuity problem to a certain extent. However, a design in which the front end 122c of the probe 122a can also contact the circuit board 110 can still be adopted.

Specifically, since the conductive bushing 126a is sleeved on the rear end 122d of the probe 122a, the spring 124a is located between the retaining wall 126e of the conductive bushing 126a and the rear end 122d of the probe 122a, and the front end of the probe 122a 122c includes a substantial plane 122e. Therefore, when the probe 122a contacts the conductor 200 to be measured, it can contact the conductor 200 to be measured more accurately than a traditional probe. This can avoid measurement signal reflection (such as electromagnetic wave reflection) caused by manufacturing tolerances, making the measurement more accurate. Repeatability and stability are improved, resulting in more continuous measured impedance. In addition, since the probe 122a, spring 124a, conductive bushing 126a, circuit 130a, connection port 140a and cable 142a are all made of metal, the measured impedance value can be determined according to the probe 122a, spring 124a, conductive bushing 126a , the impedance values of the circuit 130a, the connection port 140a and the cable 142a themselves provide compensation, making the measurement results accurate and highly referential.

FIG. 6 shows a partially enlarged top view of the movable probe groups 120a and 120b of the connector 100 in FIG. 1 when they are compressed by the wire to be tested 200 and tilt slightly. Referring to FIG. 6 , when the movable probe groups 120 a and 120 b do not make frontal contact with the conductor 200 to be measured along the length direction of the conductor 200 during measurement, the contact probes 122 a and 122 a and 122 a and 122 b are located in the conductive bushings 126 a and 126 b. The springs 124a and 124b of 122b can push the probes 122a and 122b, and the probes 122a and 122b have a larger diameter front end 122c and a substantially flat surface 122e (see Figure 3), so the probes 122a and 122b can still move toward the probe even if they are tilted. The probes 122a and 122b can still stably measure the impedance value of the conductor 200 under test.

In some embodiments, the reason for the slight tilt of the movable probe sets 120a and 120b of the connector 100 may be the manufacturing tolerance of the conductor 200 under test, the offset of the conductor 200 under test, or the movable probe sets 120a and 120b. deflection, but because the springs 124a and 124b of the connector 100 can push the probes 122a and 122b outward respectively, the probes 122a and 122a with the larger diameter front end 122c and the substantially flat surface 122e (see Figure 3) 122b provides a larger contact area, so the probes 122a and 122b can contact the conductive parts of the conductor 200 under test in a state where the movable probe groups 120a and 120b are not in front contact with the conductive parts 220a and 220b of the conductor 200 to be tested. 220a and 220b maintain contact, thereby measuring the impedance value of the conductor 200 to be measured, so that the measurement result is accurate and has high reference.

Figure 7 shows the impedance change of the connector 100 of Figure 5 when measuring the conductor 200 under test. Referring to Figures 5 and 7 at the same time, when the connector 100 contacts the wire 200 to be tested, the front end 122c of the probe 122a is a substantially flat surface 122e and the diameter of the front end 122c of the probe 122a is larger than the rear end of the probe 122a. The portion 122d is thick, so when the probe 122a contacts the wire 200 to be tested, it can contact the wire 200 to be tested more reliably than a traditional probe. This can avoid measurement signal reflection (such as electromagnetic wave reflection) caused by manufacturing tolerances, making the measurement repeatable. Improved performance and stability, resulting in more continuous measured impedance. In Figure 7, the true impedance value of the conductor 200 under test is approximately 58. Due to the reduction of measurement signal reflection, the data point P at the moment of contact can be reduced from a value of about 95 when the traditional probe is in contact to a value near 60, which is closer to the real impedance.

The foregoing outlines features of several embodiments so that those skilled in the art may better understand aspects of the present disclosure. Those skilled in the art should appreciate that they may readily use the present disclosure as a basis for designing or modifying other processes and structures for carrying out the same purposes and/or achieving the same advantages of the embodiments introduced herein. Those skilled in the art should also recognize that such equivalent constructions do not depart from the spirit and scope of the present disclosure, and that they can be variously changed, substituted, and altered herein without departing from the spirit and scope of the present disclosure.

100:Connector

110:Circuit board

110a: Edge

120a, 120b: active probe set

122a, 122b: probe

122c: front end

122d: rear end

122e:Substantial plane

124a, 124b: spring

126a, 126b: conductive bushing

126c: Front opening

126d: closed wall

126e: retaining wall

130a, 130b: circuit

140a, 140b: port

142a, 142b: Cable

200: Wire to be tested

220a, 220b: Conductive part

2-2: Line segment

d: distance

P: data point

R1: diameter

R2: diameter

Aspects of the present disclosure are best understood from the following description of implementations when read in conjunction with the accompanying figures. Note that in accordance with standard practice in this industry, various features are not drawn to scale. In fact, the dimensions of the various features may be arbitrarily increased or reduced for clarity of discussion. Figure 1 illustrates a top view of a connector according to an embodiment of the present disclosure. Figure 2 shows a schematic cross-sectional view of the connector in Figure 1 along line 2-2. Figure 3 shows a perspective view of the probe of Figure 2 . Figure 4 shows a perspective view of the movable probe set in Figure 1 . Figure 5 shows a cross-sectional view of the connector of Figure 2 in contact with the wire under test and compressed to the final compressed state. Figure 6 shows a partially enlarged top view of the connector in Figure 1 when the movable probe set is compressed by the wire to be tested and tilts slightly. Figure 7 shows the impedance change of the connector in Figure 5 when measuring the conductor under test.

Domestic storage information (please note in order of storage institution, date and number) without Overseas storage information (please note in order of storage country, institution, date, and number) without

100:Connector

110:Circuit board

120a:Active probe set

122a:Probe

122c: front end

122d: rear end

124a: spring

126a: Conductive bushing

126c: Front opening

126d: closed wall

126e: retaining wall

130a:Circuit

140a:Connection port

142a:Cable

d: distance

Claims (7)

A connector, including: a circuit board; at least one movable probe group, arranged on the circuit board and electrically connected to the circuit board, each of the movable probe groups respectively includes: a probe, the probe includes A front end portion and a rear end portion, the front end surface of the front end portion includes a substantial plane, the front end portion and the rear end portion are respectively in the shape of a column and the front end portion is thicker than the rear end portion; and a spring, and the rear end portion The rear end of the probe is connected to allow the probe to move relative to the circuit board; and a conductive bushing fixed on the circuit board and electrically connected to the circuit board, wherein the conductive bushing has a front opening Closing wall, wherein when the probe is pressed to the final compressed state, the minimum distance between the front end of the probe and the conductive bushing is between 0 and 2 mm. The connector of claim 1, wherein the conductive bushing is a tube, and the outer contour of the front end of the probe matches the outer contour of one end of the conductive bushing. The connector of claim 2, wherein the spring is located in the conductive bushing and resists the rear end of the probe. The connector of claim 2, wherein when the front end of the probe is engaged with the conductive bushing, the probe and the conductive bushing can Form a cylinder with a continuous surface. The connector of claim 2, wherein when the probe is compressed to the final compression state, the substantial plane of the end of the probe is flush with an edge of the circuit board. The connector of claim 1, which is a measuring device and further includes: two connection ports, respectively used for connecting a cable; the number of the movable probe groups is at least two, and the The probes of some active probe groups are set up in parallel with each other. The connector of claim 6, wherein the circuit board has at least one circuit extending from the conductive bushing to one of the two connection ports.

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