JPH0627139A - Contact probe and electric connector using same - Google Patents

Abstract

PURPOSE:To measure even a low resistance value accurately with a contact probe for inspecting a circuit and a connector for mutual connection between printed boards, to reduce inspection errors, to reduce the deflection of the printed board and the like and to simplify handling. CONSTITUTION:A conductive plunger 1 is inserted into a barrel 3. Angular moment is generated in the plunger 1 with respect to the barrel 3. A plunger top 4, which reinforce 5 surface contact pressure, is provided at the tip of the plunger. Thus, the low resistance value, which is required in a probe 6 or a connector, is obtained. The surface contact pressure of a contactor is reinforced, and the load of a spring can be reduced by a large extent. The deflection of a printed board is decreased, and there is no measuring error. The handling is simple, and the multiple types can be readily obtained.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an electric connection by pressure-contacting an IC chip or the like to measure the resistance value of a disconnection or short circuit of the circuit network or only a specific portion of the integrated circuit network, or other device. Insert the contact probe into an insulating housing so that it is suitable for inspecting the presence or absence of a wire, the mounting direction, etc., and for interconnecting printed circuit boards (including flexible boards) in small electronic devices. It relates to a fixed electrical connector.

[0002]

2. Description of the Related Art A conventional contact probe uses a connector of a top touch connector in which a coil spring a and a plunger b pressed by the spring a are housed in a barrel c as shown in FIG. See also FIG.
As shown in 0, a circuit inspection probe pin is also known in which a ball d is inserted into the end face of the plunger b and a lateral load is generated on the plunger b by the bias of the spring a to strengthen the surface contact. . Further, as for the conventional connector, as shown in FIG. 11, an electric connector in which the connector shown in FIG. 9 is fitted and fixed in the insulating housing e is used in small electronic devices and the like.

[0003]

However, in this type of probe, the low resistance value required for the probe or the connector cannot be obtained in a satisfactory condition by the pressure contact connection between the plunger b and the spring a, and the plunger b and the barrel cannot be obtained. In the fitting gap with c, it was designed so that the resistance value required by the surface contact between the plunger b and the barrel c due to the tilting of the plunger b was obtained, so that there was a momentary disconnection between the printed circuit boards due to vibration or shock. Is likely to occur, the resistance value is likely to change, and there is a problem in accuracy. If measures such as thick plating are taken to prevent this, the cost will increase, and the ball that strengthens the surface contact between the plunger b and the barrel c. Enter Figure 1
In the structure of the contact probe for circuit inspection shown in 0, it cannot be used for the top touch connector in terms of space,
In order to stabilize the contact, the spring load must be large, and in such a case, when a multi-type connector or the like is used, the printed circuit board or the like is bent and the contact performance is hindered. The present invention is intended to accurately eliminate these conventional drawbacks, a stable resistance value required for a probe or a connector can be obtained, and a surface contact pressure between a plunger of a contactor and a barrel is strengthened, and The spring load between the plunger and the printed circuit board pattern can be greatly reduced, the board deflection can be reduced, there is no measurement error due to the contact probe, and there is no instantaneous disconnection between the printed circuit boards due to connector connection. Moreover, it is an object of the present invention to provide a compact contact probe or connector that can be easily multi-typed in an inexpensive form.

[0004]

SUMMARY OF THE INVENTION The present invention is a contact probe in which a conductive plunger is biased in one direction by a spring so as to be slidable in a conductive barrel, and the conductive plunger is inserted into the barrel. , A plunger top having a contact portion at a position deviated from the center axis of the plunger is provided at the tip of the plunger in order to generate a rotational moment with respect to the barrel and strengthen the surface contact pressure. And a connector in which the contact probe is fitted and fixed in an insulating housing.

[0005]

The conductive plunger 1 is held by the spring 2 in the conductive barrel 3 so as to be able to expand and contract. The plunger top 4 makes contact with the inspection point, and the pressure and stroke are due to the spring 2. With the shape of the plunger top 4, the plunger 1 can generate a rotation moment with respect to the barrel 3 to enhance the surface contact pressure, so that even a low resistance value can be measured accurately, and the inspection of circuit network disconnection or short circuit is simple. In addition, the spring load of the spring can be greatly reduced, the deflection of the printed circuit board or the like can be reduced, and the contact probe or connector can be easily made to have multiple cores.

[0006]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS A preferred embodiment of the present invention will be described with reference to FIGS. 1 and 2. A contact probe in which a conductive plunger 1 is biased in one direction by a spring 2 and slidably disposed on a conductive barrel 3. Therefore, the conductive plunger 1 is made of a hollow cylindrical body and is fitted into the barrel 3 to generate a rotational moment with respect to the barrel 3 to strengthen the surface contact pressure. The contact probe 6 is provided with the top 4 at the tip of the plunger.

In this case, the plunger top 4 is configured to have a curved top surface at a position deviated from the center axis 0 of the plunger 1, for example, a small spherical surface or an inclined end surface, and is rotated by the plunger 1. A moment is generated to positively strengthen the surface contact pressure between the plunger 1 and the barrel 3. That is, for example, when the plunger 1 is brought into contact with the pattern 14 of the printed circuit board 13 as a partner of the contact probe as shown in FIG.
By urging the plunger 1 with the spring 2 in the direction of arrow P, a rotational moment is applied to the plunger 1 in the direction of arrow Q of FIG. 1 with the inclined end surface 4a of FIG. 1 or the small spherical surface 4b of FIG. 2 as a fulcrum. The surface contact pressure at the sliding contact portion 4c between the plunger 1 and the barrel 3 is positively increased by being generated. Furthermore, due to the rotational moment generated in the plunger 1 every time the pattern 1 of the printed circuit board 13 is repeatedly connected to the plunger 1,
The pattern 14 and the inclined end surface 4a or the upper surface 4b of the small sphere have a cleaning effect as a contact. That is, each time the connection is repeated, the oxide film and the dust are removed from each connection surface, and the contact resistance value becomes lower and stabilized. Furthermore, in the above example, the mating connector of the contact probe is described as an embodiment in which a printed circuit board is used, but a mating connector including a contact having a contact plane may be used as the mating connector.

In the embodiment shown in FIG. 3, the hollow cylindrical body of the plunger 1 has a plunger top 4 whose diameter is reduced to a small diameter, and the step portion 5 of the diameter change is gently bent, and there is a discrepancy. The plunger top 4 has a ring portion which is inclined at 5 to 10 degrees with respect to the horizontal plane.
The tip ₁ is inclined at an angle of 4 degrees and the outer circumference is rounded with a radius 41, and the step portion 5 has a tip surface where the apex portion is located on the side close to the tip portion, so that the plunger 1 easily generates a rotation moment. I am doing it.

In the embodiment shown in FIG. 4, the tip end of a spherical surface formed with an opening angle of 90 to 120 degrees centering on the center axis 0 of the plunger 1 is used as the plunger top 4, and a predetermined angle from the center axis 0 is provided. The plunger 1 is apt to generate a rotational moment by using a tip contactor which is displaced in the tilt direction toward one of θ, for example, 1 to 5 degrees, preferably 3 degrees. In this case, the step portion 5 is provided as a tapered ring portion as the plunger top 4 having a small diameter at its tip.

As the conductive plunger 1, it is possible to use a columnar body having a projecting plunger top 4 and a spring receiving portion formed by providing a cylindrical protrusion on the other end with a small diameter. Not only the contact probe but also a connector provided with the conductive barrel 3 having the conductive plunger can be used. Further, the conductive barrel 3 is used by inserting it into a socket (not shown) as needed, and when it is desired to change the contact pressure or stroke, the barrel is pulled out from the socket to have another desired pressure or the like. It can be exchanged and replaced. To replace the plunger 1 with a different plunger top 4, the barrel 1 may be taken out from the socket, and then the plunger 1 may be extracted and replaced.

In the embodiment shown in FIGS. 5 to 7, a plurality of contact probes 6 of FIG. 1 are fitted and fixed in the insulative housing 7 to form a multi-core connector, which is provided with a fitting insertion hole 8. The contact probe 6 is fitted and fixed in the flexible housing 7 to form a connector 9. An example of using the connector 9 is shown in FIG. 7. The terminal portion 12 of the connector 9 is inserted into the board hole 11 of the one printed board 10 and the printed board 10 and the connector 9 can be electrically connected by soldering or the like. I am trying. The contact pattern 14 is arranged on the other printed circuit board 13 at a position facing the plunger 4 of the contact probe 6, and by pressing the printed circuit board 13 in the movable direction of the plunger 4 as shown in FIG. The printed circuit board 10 and the printed circuit board 11 can be electrically connected via the plunger 4.

[0012]

According to the present invention, a conductive plunger is fitted in a barrel, and a plunger top for generating a rotational moment with respect to the barrel to enhance the surface contact pressure is provided at the tip of the plunger. The stable low resistance value required for the probe or connector is obtained, the surface contact pressure between the plunger of the contact and the barrel is strengthened, and the spring load between the plunger and the printed circuit board pattern is large. A compact contact probe or connector that is easy to handle and easy to multi-type because the board deflection can be reduced, there is no measurement error due to the contact probe, instantaneous disconnection between boards due to connector connection is eliminated Can be produced in. Furthermore, a cleaning effect is produced on each contact surface due to the generation of the rotation moment, so that the probe or connector can be stabilized with a lower contact resistance value and higher reliability.

[Brief description of drawings]

FIG. 1 is a vertical sectional view showing an embodiment of the present invention.

FIG. 2 is an enlarged vertical cross-sectional view of a contact according to an embodiment.

FIG. 3 is an enlarged vertical sectional view of a contact according to another embodiment.

FIG. 4 is an enlarged vertical cross-sectional view of a contact of still another embodiment.

FIG. 5 is a perspective view of another embodiment of the present invention in a partially cutaway separated state.

FIG. 6 is a perspective view showing an assembled state of FIG.

FIG. 7 is an exploded perspective view showing a usage state of the example of FIG.

FIG. 8 is a vertical cross-sectional view showing a connection state of the example of FIG.

FIG. 9 is a vertical cross-sectional view of a conventional contact probe.

FIG. 10 is a vertical cross-sectional view of another example of a conventional contact probe.

FIG. 11 is a vertical sectional view of a conventional connector.

[Explanation of symbols]

 1 Plunger 2 Spring 3 Barrel 4 Plunger top 5 Step 6 Contact probe 7 Insulating housing 8 Fitting hole 9 Connector

 ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Inventor Kenji Katayose 5-5-23 Osaki, Shinagawa-ku, Tokyo Hirose Electric Co., Ltd.

Claims (4)

[Claims] 1. A contact probe in which a conductive plunger is biased in one direction by a spring so as to be slidably mounted on a conductive barrel, the tip of the conductive plunger being provided with:
A contact probe comprising a plunger top having a contact portion at a position deviated from the center axis of the plunger. 2. The contact probe according to claim 1, wherein the plunger top has a contact portion formed on a curved top surface or an inclined end surface at a position deviated from the center axis of the plunger. 3. The plunger top has a spherical shape formed with a radius centered on the center axis of the plunger, and has a contact portion that is displaced from the center axis by a predetermined angle in the tilt direction. Contact probe. 4. An electrical connector, wherein the contact probe according to claim 1, 2 or 3 is fitted and fixed in an insulating housing under a single-core or multi-core state.