JP4094617B2 - Test fixture - Google Patents

Description

  The present invention relates to a connection structure for holding an electronic device and contacting a transmission line connected to a measurement unit with each lead of the electronic device in order to measure the electrical characteristics of the electronic device having a plurality of leads. It is related with the test fixture which is a jig | tool thru | or instrument provided with.

  Generally, in order to measure the electrical characteristics of an electronic device, a signal generation unit that provides a measurement signal to the electronic device and a signal processing unit that measures a signal output from the electronic device are connected to leads that are external terminals of the electronic device. It is necessary to connect in a stable state. For this reason, a test fixture (inspection jig) is used for holding the electronic device in a predetermined position and for connecting and conducting the lead of the electronic device to the signal generation unit, the signal processing unit, and the power supply unit.

For example, according to the test fixture disclosed in Patent Document 1 below, an electronic device having a plurality of leads is placed on an insulating device support and formed on a pair of side surfaces of the device support, respectively. A plurality of leads are held in two rows in the plurality of grooves. Then, it is sandwiched from both sides by two measurement substrates each having a plurality of parallel conductive patterns, and the conductive pattern of each measurement substrate is pressed against each lead to achieve conduction. According to this configuration, since the conductive pattern of the measurement substrate and the lead are in contact with each other over the entire length, deformation such as bending or misalignment of the lead can be corrected, and the lead can be securely held at a predetermined position to conduct the measurement substrate. It is supposed that it can be brought into regular contact with the pattern, and accurate measurement can be performed without breaking impedance matching.
JP 2002-368422 A

  In the test fixture shown in FIG. 9, the substrate 101 is provided on the surface of the grounded metal main body 100, the through hole 102 is provided in the main body 100, and the opening 103 communicating with the through hole 102 is provided in the substrate 101. A socket 104, which is a metal cylinder, is attached to the opening 103 of the substrate 101 and provided in the through hole 102 away from the main body 100, and the central conductor 106 of the coaxial transmission line 105 is connected to the lower end of the socket 104. It is a thing. A metal spring contact 107 is integrally provided in the opening of the socket 104. According to this test fixture, when the lead 201 of the electronic device 200 is inserted from the opening of the socket 104 opened on the surface of the substrate 101, the metal spring contact 107 provided in the vicinity of the opening inside the socket 104 is connected to the lead 201. The center conductor 106 of the transmission line 105 and the lead 201 are electrically connected while holding the root.

  However, in the electronic device, even if the number and arrangement of the leads are the same in structure or outline, the distribution of signal lines inside the electronic device may be changed, and the input / output functions of each lead may change. is there. For example, in the electronic device, when the distribution of each lead of the RF line and the power supply line is changed, the test fixture having a structure in which the conductive pattern of the measurement substrate exemplified in Patent Document 1 is brought into contact with the lead of the electronic device. According to Cha, since the arrangement of each conductive pattern of the measurement substrate corresponding to each lead of the RF line and the power supply line is determined in advance, it cannot cope with the change of the signal line on the electronic device side as it is. Therefore, it becomes necessary to newly design and manufacture a measurement substrate having a conductive pattern compatible with the above.

  In addition, according to the test fixture having a structure in which the conductive pattern of the measurement substrate is brought into contact with the lead of the electronic device as exemplified in Patent Document 1, the bit rate of the signal that can be propagated is created in order to form the transmission line on the substrate. There is also a problem that there are restrictions.

  Further, according to the test fixture having a structure in which the lead of the electronic device is brought into contact with the conductive pattern of the measurement substrate as exemplified in Patent Document 1 over the entire length, the entire length of the lead is pressed against the conductive pattern of the measurement substrate. In addition, there is a problem that an excessive burden is applied to the structure on the test fixture side, particularly the conductive pattern of the measurement substrate serving as a contact point, and the life of the apparatus is adversely affected.

  Furthermore, as shown in FIG. 9, according to the test fixture having a structure in which the lead 201 of the electronic device 200 is inserted into the socket 104 having the metal spring contact 107, the spring contact 107 is attached as the electronic device 200 is inserted and removed. There was a problem that the connection was uncertain due to wear. Further, according to such a connection structure, the lead 201 of the electronic device 200 is connected to the socket 104 through the spring contact 107 at the root, but the long lead 201 has a tip (lower in the drawing) than the spring contact 107. ) Is not held and is free in the cylindrical socket 104. Therefore, most of the leads 201 are not in a state where the positional relationship with the surrounding structure such as the inner surface of the socket 104 is uniquely determined, which causes a problem of instability in high frequency measurement. .

  Therefore, the present invention has been made in view of the above situation, and even when the distribution of signal lines inside the electronic device is changed and the functions on the input / output of each lead are changed, contacts are provided as in the past. There is no need to change the design of the measured measurement board, the bit rate of the signal that can be propagated is higher, the stability in high frequency measurement is higher, and the burden on the test fixture side is higher than in the past. The purpose is to provide a test fixture that has a long service life for contacts and the like and can contribute to a reduction in inspection equipment costs.

Next, means for solving the above problems will be described with reference to the drawings corresponding to the embodiments.
A test fixture 1 according to claim 1 of the present invention is the test fixture 1 for measuring electrical characteristics of an electronic device 3 having a plurality of leads 2.
The first lead of the coaxial structure which is made of a cylindrical dielectric body in which the lead 2 is inserted from the opened one end and the tip of the lead 2 protrudes from the other open end is provided with a desired characteristic impedance together with the lead 2. A cylindrical body 5 constituting the transmission line;
A cylindrical contact member 26 that is removably inserted from one end of the lead 2 protruding from the other end of the cylindrical body 5 and contacts the inner surface;
A second transmission line 8 having a coaxial structure composed of a central conductor 7 and a dielectric 16 surrounding the central conductor 7, the tip of the central conductor 7 being connected to the other end of the contact member 26 ;
Comprising a housing 4 which is grounded housing a portion of the said cylindrical body 5 and the contact member 26 and the second transmission line 8, further
The contact member 26 has a tapered surface 26 a having an open inner surface at one end thereof, the center line of which is inconsistent with the center line of the lead 2 inserted through the cylindrical body 5, and the cylindrical body 5 is inserted. The leading end of the lead 2 is configured to abut against the tapered surface 26a of the contact member 26 .

The test fixture 1 according to claim 2 is:
In a test fixture 1 for measuring electrical characteristics of an electronic device 3 having a plurality of leads 2,
The first lead of the coaxial structure which is made of a cylindrical dielectric body in which the lead 2 is inserted from the opened one end and the tip of the lead 2 protrudes from the other open end is provided with a desired characteristic impedance together with the lead 2. A cylindrical body 5 constituting the transmission line;
A cylindrical contact member 6 detachably inserted from one end of the lead 2 projecting from the other end of the cylindrical body 5 and contacting the inner surface;
A second transmission line 8 having a coaxial structure composed of a central conductor 7 and a dielectric 16 surrounding the central conductor 7, and having a distal end portion of the central conductor 7 connected to the other end portion of the contact member 6;
The cylindrical body 5, the contact member 6, and a grounded housing 4 that houses a part of the second transmission line 8; and
When the lead 4 is provided movably in the housing 4 and moves toward the inside of the housing 4, the lead 2 having the tip inserted into the contact member 6 through the cylindrical body 5 is inserted. By pressing in the vicinity of the contact member 6, a pressing member 9 is provided for bringing the tip portion into contact with the inner surface of the contact member 6,
Inside the housing 4, the lead 2 is disposed in the vicinity of the lead 2 on the side opposite to the pressing member 9 with respect to the lead 2, and the periphery of the lead 2 is moved around the lead 2 moved by being pressed by the pressing member 9. It is characterized by having a holding member 20 made of a dielectric that is held in a predetermined position so as to be almost uniformly filled with a dielectric .

According to the test fixture described in claim 1, since it has a coaxial structure, a signal having a higher bit rate can be propagated as compared with a test fixture using a transmission line formed on a substrate. Even if the distribution of signal lines inside the electronic device is changed, and the input / output functions and physical positions of each lead of the electronic device are changed, each lead is changed to a signal generator and signal processor. It is not necessary to change the structure as a test fixture having the function of connecting to the power supply unit or the power supply unit, and the connection destination of the second transmission path is changed or the parts holding the first and second transmission paths are penetrated This can be dealt with by changing the position of the hole, and it is possible to suppress the initial cost generation such as printed circuit board remake required in the same case in the test fixture using the transmission line constructed on the board.
Furthermore, when an electronic device is mounted on the test fixture, the lead inserted through the cylindrical body reliably contacts the conductive taper surface at one end of the contact member and conducts. The function as a test fixture connected to the signal generation unit and the signal processing unit can be surely ensured. In addition, since the tip of the lead is received by the taper surface, an allowable dimension range can be provided between the center line of the inserted lead and the center line of the contact member. Advantages in design and assembly accuracy can be obtained.

According to the test fixture described in claim 2, since it has a coaxial structure, a signal having a higher bit rate can be propagated as compared with a test fixture using a transmission line formed on a substrate. Even if the distribution of signal lines inside the electronic device is changed, and the input / output functions and physical positions of each lead of the electronic device are changed, each lead is changed to a signal generator and signal processor. It is not necessary to change the structure as a test fixture having the function of connecting to the power supply unit or the power supply unit, and the connection destination of the second transmission path is changed or the parts holding the first and second transmission paths are penetrated This can be dealt with by changing the position of the hole, and it is possible to suppress the initial cost generation such as printed circuit board remake required in the same case in the test fixture using the transmission line constructed on the board.
Furthermore, after the electronic device is mounted on the test fixture, if the pressing member is pushed inward of the housing, the lead inserted into the contact member through the cylindrical body is inserted into the contact member. The tip of the lead can be elastically deformed by pressing in the direction intersecting the central axis direction in the vicinity of the electronic device, so that the leading end of the lead can be surely brought into contact with the inner surface of the contact member and can be conducted. The function as a test fixture connected to the signal generation unit and the signal processing unit can be surely ensured.
Furthermore, when the lead inserted through the cylindrical body and having the tip inserted into the contact member is pressed by the pressing member in the vicinity of the contact member, it is received by the holding member on the side opposite to the side where the pressed lead is pressed. Therefore, the state in which the tip of the lead is in contact with the inner surface of the contact member can be stably held, and at the same time, there is no possibility that the lead is excessively deformed by pressing. Furthermore, since the pressing member is made of a dielectric together with the holding member, the lead can be uniformly surrounded by the dielectric at the pressing position, so that the coaxial structure including the cylindrical body and the lead and the second transmission line Therefore, it is more advantageous to achieve a desired performance as a test fixture.
In particular, in a state where the lead pressed by the pressing member is received and held by the holding member, the periphery of the lead is almost uniformly filled with a dielectric, and a coaxial structure including the cylindrical body and the lead or the second transmission line Therefore, it can be said that it is more advantageous in achieving a desired performance as a test fixture.

DESCRIPTION OF EMBODIMENTS Hereinafter, a preferred embodiment of a test fixture according to the present invention will be described in detail with reference to the drawings.
FIG. 1 is a perspective view showing an internal structure in a first example of an embodiment of a test fixture according to the present invention, FIG. 2 is a perspective view of the same, FIG. 3 is a sectional view in a state where a pressing member is not pushed in, and FIG. FIG. 5 is an enlarged sectional view showing the contact action near the contact member, FIG. 6 is an enlarged sectional view showing the contact action near the contact member in the second example of the embodiment, and FIG. FIG. 8 is an enlarged sectional view showing the contact action near the contact member in the third example of the embodiment, FIG. 8 is an enlarged sectional view showing the contact action near the contact member in the fourth example of the embodiment, and FIG. 9 is a conventional test fixture. It is sectional drawing which shows an example.

(1) First embodiment (FIGS. 1 to 5)
As schematically shown in FIG. 2, the test fixture 1 of this example has a plurality of (for example, 4 to 5 in this example) leads 2 from one end face of a substantially cylindrical main body substantially perpendicular to the main body. In order to measure the electrical characteristics of the electronic device 3 derived in a predetermined arrangement, the electronic device 3 is held in the main body, and the respective transmission paths of the coaxial structure are brought into contact / conduction with the leads 2 in the main body. It is the instrument (jig) used.

  As shown in FIG. 2, the test fixture 1 has a substantially cylindrical housing 4 as a main body for holding the electronic device 3 as shown in FIG. 2, and only the internal structure shown in FIG. The cylindrical body 5 into which the lead 2 of the electronic device 3 attached to the housing 4 is inserted, the contact member 6 to which the tip of the lead 2 protruding from the cylindrical body 5 is connected, and the central conductor 7 to the contact member 6 Are connected to the transmission line 8 and a pressing member 9 that presses the lead 2 in the vicinity of the contact member 6 to contact the contact member 6.

  As shown in a specific structure in FIG. 3, the casing 4 serving as a main body is a two-stage metal cylinder composed of a small-diameter upper body 10 and a large-diameter lower body 11, and has a screw structure not shown in detail. Can be connected vertically and can be freely divided into two, and the inside thereof has a plurality of through holes 12 and 13 arranged in the same manner and in the same number as the lead 2 penetrating vertically from the upper body 10 to the lower body 11. Is provided.

  As shown in FIG. 3, each through-hole 12 of the upper body 10 of the housing 4 is provided with a cylindrical body 5 made of a dielectric. The length of the cylindrical body 5 is slightly shorter than the lead 2 of the electronic device 3, and the inner diameter of the central hole penetrating vertically in the cylindrical body 5 is substantially coincident with the outer shape of the lead 2. A tapered surface 14 is formed in the opening of one end portion of 5. Therefore, the lead 2 of the electronic device 3 can be easily inserted from one end of the cylindrical body 5 with the tapered surface 14 as a guide, and the lead 2 is in contact with the upper surface of the upper body 10 of the housing 4 until the lower surface of the main body 3a of the electronic device 3 abuts. When 2 is inserted into the cylindrical body 5, the leading end of the lead 2 protrudes from the other end of the cylindrical body 5 by a predetermined dimension inside the housing 4.

  It should be noted that the material, the outer diameter, the length, and the like as the dielectric of the cylindrical body 5 are appropriately set so as to constitute the first transmission line of the coaxial structure having the desired characteristic impedance together with the inserted lead 2. Needless to say, it is set.

  As shown in FIG. 3, a cylindrical contact member 6 made of metal and vertically penetrated is provided in the lower body 11 of the housing 4 for each through hole 13 apart from the inner surface of the housing 4. Yes. And the front-end | tip part of the lead | read | reed 2 protruded from the other end part of the cylindrical body 5 is comprised so that it can insert in the center hole from the one end part which the contact member 6 opened, and can contact with the inner surface of a center hole. ing. In this example, the inner diameter of the center hole of the contact member 6 is larger than the outer diameter of the lead 2, and when the lead 2 is inserted into the contact member 6 with the center aligned, the lead is not distorted with respect to the center axis. 2 does not contact the inner surface of the center hole of the contact member 6. FIG. 3 shows a state in which the lead 2 is inserted into the contact member 6 and they are not in contact with each other. In addition, a portion where the lead 2 is exposed exists between the cylindrical body 5 and the contact member 6.

  As shown in FIGS. 1 to 4, the peripheral wall of the lower body 11 of the housing 4 has a two-stage cylindrical mounting hole 15 having a stepped portion having a small diameter inwardly. Each through hole 13 is formed along the radial direction and communicates with each through hole 13 and the outside of the housing 4. Each attachment hole 15 is formed at a position corresponding to a portion where the lead 2 is exposed between the cylindrical body 5 and the contact member 6. The mounting hole 15 is provided with a two-stage cylindrical pressing member 9 having a stepped portion having a small diameter inward. The pressing member 9 has a predetermined resistance force (frictional force). Can be slid in the mounting hole 15 and fixed at a desired pressing position with a predetermined resistance (frictional force). The pressing member 9 set at the pressing position presses the lead 2 between the cylindrical body 5 and the contact member 6 from the side (that is, from a direction crossing the longitudinal direction of the lead) by the tip portion, and elastically presses the lead 2. The tip 2 of the lead 2 can be brought into contact with the inner peripheral surface of the center hole of the contact member 6 to be reliably conducted (FIG. 4).

  In this example, the fixing of the position of the pressing member 9 is based on friction between the mounting hole 15, but a return spring and a locking mechanism for fixing the position are provided between the mounting hole 15 and the pressing member 9. The position of the pressing member 9 pushed into the fixed position may be fixed by the locking means, and when the locking means is released, the pressing member 9 may be configured to return to the outer original position by the return spring.

  As shown in FIGS. 3 and 4, each through-hole 13 opened at the lower end of the lower body 11 of the housing 4 has a coaxial structure including a center conductor 7 and a dielectric 16 surrounding the center conductor 7. The transmission path is inserted and connected. Inside the housing 4, the center conductor 7 is exposed and protrudes at the tip of the transmission line 8, and the tip of the center conductor 7 is inserted into the opening at the other end of the contact member 6 to be connected and conducted. Yes.

  As shown in FIG. 5, the connection between the center conductor 7 of the transmission line 8 and the contact member 6 is realized by a detachable structure in this example. That is, a slit 17 (open groove) communicating with the opening is formed in the opening at the other end of the contact member 6, and the contact member 6 is inserted when the center conductor 7 is inserted into the other end of the contact member 6. Is elastically deformed to obtain a spring property for securely holding the central conductor 7.

  According to the test fixture 1 of this example described above, since it has a coaxial structure, a signal with a higher bit rate can be propagated compared to a test fixture using a transmission line configured on a substrate. Even if the distribution of signal lines inside the electronic device is changed, and the input / output functions and physical positions of each lead of the electronic device are changed, each lead is changed to a signal generator and signal processor. There is no need to change the structure as a test fixture having a function of connecting to the power supply unit or the power supply unit, and the connection destination of the second transmission path, or the through hole of the component that holds the first and second transmission paths Therefore, it is possible to suppress the initial cost generation such as the printed circuit board remake required in the same case in the test fixture using the transmission line configured on the board.

  Further, after the electronic device 3 is mounted on the test fixture 1, if the pressing member 9 is pushed inward of the housing 4, the tip is inserted into the contact member 6 through the cylindrical body 5. The lead 2 is pressed from the side in the vicinity of the contact member 6 to elastically deform the tip side, and the tip 2 of the lead 2 can be brought into contact with the inner surface of the contact member 6 to be conducted. The function as the test fixture 1 for connecting the lead 2 of the electronic device 3 to the transmission line 8 connected to the signal generation unit or the signal processing unit can be ensured.

  Further, compared to such a connection structure, that is, a structure in which the lead 2 is directly slidably inserted into the hole of the contact member 6 to make contact, the lead 2 does not necessarily contact the hole of the contact member 6 directly. Alternatively, the structure in which the lead 2 is inserted into the center hole of the contact member 6 with only partial contact, and then the lead 2 is pressed and the tip thereof is pressed against the inner peripheral surface of the contact member 6. There is little stress such as sliding applied to the contact member 6, it is difficult to wear, and the life is also extended.

  In addition, as described above, the structure of the present example can be said to have a long life of the contact member 6, but if the number of times the electronic device 3 is inserted and removed from the test fixture 1 still increases, There is a case where the inner peripheral surface is worn and parts need to be replaced. In such a case, according to this example, the other end of the contact member 6 is opened to form a slit 17 and is sandwiched between the center conductor 7 of the transmission line 8 with an appropriate elastic force. However, the contact member 6 inserted into the center conductor 7 of the second transmission line 8 can be extracted without damaging the center conductor 7 and the like. Therefore, it is possible to easily attach the new contact member 6 to the central conductor 7 as a replacement part.

(2) Second embodiment (FIG. 6)
The test fixture 1 of this example is obtained by adding a holding member 20 as shown in FIG. 6 to the first example described with reference to FIGS. 1 to 5, and is a modification of the first example. It can be said.
As shown in FIG. 6, in the housing 4, a holding member 20 that holds the lead 2 pressed by the pressing member 9 is located at a position opposite to the pressing member 9 with respect to the lead 2. It is provided close to. The holding member 20 is a semi-cylindrical member having an inner peripheral surface whose outer shape matches that of the lead 2 and is made of a dielectric.

  Here, assuming that the pressing member 9 is also made of a dielectric, the periphery of the lead 2 is almost uniformly filled with a dielectric when the lead 2 pressed by the pressing member 9 is received and held by the holding member 20. In this state, structural continuity with respect to the coaxial structure of the cylindrical body 5 and the lead 2 and the coaxial structure of the second transmission line 8 is obtained, so that it is more advantageous for achieving the desired performance as the test fixture 1. It can be said.

  In addition, when the lead 2 having the tip inserted into the contact member 6 is pressed by the pressing member 9 through the cylindrical body 5, it is received by the holding member 20 on the side opposite to the side where the pressed lead 2 is pressed. Therefore, the state in which the tip of the lead 2 is in contact with the inner surface of the contact member 6 can be stably held, and at the same time, there is no risk of the lead 2 being excessively deformed by pressing, and the contact member. The load applied to 6 is not excessive.

(3) Third embodiment (FIG. 7)
The test fixture 1 of this example uses a contact structure as shown in FIG. 7 instead of the first example described with reference to FIGS. I can say that.
As shown in FIG. 7, the contact structure of this example is aligned with the cylindrical contact member 6 and inserted into the tip of the lead 2 as in the first example. The inserted lead 2 is configured to abut on the inner peripheral surface of the contact member 6 by making its central axis oblique to the central axis of the contact member 6.

  When the electronic device 3 is attached to the test fixture 1 of the present example, the lead 2 inserted through the cylindrical body 5 has one end of the contact member 6 with its central axis being oblique to the central axis of the contact member 6. Therefore, the leading end of the lead 2 can be brought into direct contact with the inner peripheral surface of the contact member 6 and can be electrically connected to the lead 2 of the electronic device 3, the signal generating unit, and the signal processing unit. Connection with the connected transmission line 8 is ensured.

(4) Fourth embodiment (FIG. 8)
The test fixture 1 of this example uses the contact member 6 and the contact structure having the structure shown in FIG. 8 in the first example described with reference to FIGS. It can be said that this is a modification of the example.
As shown in FIG. 8, the contact member 26 and the contact structure of this example are not inserted into the tip of the lead 2 with the axial center aligned with the cylindrical contact member 6 as in the first example. The contact member 26 of this example is a tapered surface 26a having an inner surface opened at one end thereof, and a central hole 26b continuous with the tapered surface 26a is opened at the other end portion as it is and opened at the other end portion. The center conductor 7 of the transmission line 8 is inserted into the center hole 26b and is in conduction. In the housing 4, the center hole 26 b of the contact member 26 and the center line of the center conductor 7 are configured to be inconsistent with the center line of the lead 2 inserted through the cylindrical body 5.

  When the electronic device 3 is mounted on the test fixture 1 of this example, the tip of the lead 2 inserted through the cylindrical body 5 abuts on the taper surface 26a of the contact member 26, so the tip of the lead 2 is a contact point. The inner surface of the member 26 can be surely brought into direct contact and conducted, so that the connection between the lead 2 of the electronic device 3 and the transmission line 8 connected to the signal generating unit and the signal processing unit is ensured.

  Further, since the tip of the lead 2 is received by the tapered surface 26a, an allowable dimension range is provided for the deviation set between the center line of the inserted lead 2 and the center line of the contact member 26. Therefore, advantages in design and assembly accuracy of the test fixture 1 can be obtained.

FIG. 1 is a perspective view showing an internal structure in a first example of an embodiment of a test fixture according to the present invention. FIG. 2 is an external perspective view of the same. FIG. 3 is a cross-sectional view in a state where the pressing member is not pushed. FIG. 4 is a cross-sectional view when the pressing member is pushed. FIG. 5A is an enlarged sectional view showing the contact action in the vicinity of the contact member, and FIG. 5B is a plan view of the contact member. FIG. 6A is an enlarged cross-sectional view showing the contact action in the vicinity of the contact member in the second example of the embodiment, and FIG. 6B is a cross-sectional view taken along the line bb in FIG. FIG. 7 is a cross-sectional view showing a third example of the embodiment. FIG. 8 is an enlarged cross-sectional view showing the contact action near the contact member in the fourth example of the embodiment. FIG. 9 is a cross-sectional view showing an example of a conventional test fixture.

Explanation of symbols

DESCRIPTION OF SYMBOLS 1 ... Test fixture 2 ... Lead which comprises a part of 1st transmission line 3 ... Electronic device 4 ... Case 5 ... Cylindrical body which comprises a part of 1st transmission line 6,26 ... Contact member 7 ... Central conductor 8 ... second transmission line 9 ... pressing member 26a ... tapered surface 16 ... dielectric 17 ... slit 20 ... holding member

Claims (2)

In a test fixture (1) for measuring electrical characteristics of an electronic device (3) having a plurality of leads (2),
A first transmission line having a coaxial structure made of a cylindrical dielectric body in which the lead is inserted from one open end and the leading end of the lead protrudes from the other open end, and having a desired characteristic impedance together with the lead A cylindrical body (5) comprising:
A cylindrical contact member (26) that is removably inserted from one end of the lead that protrudes from the other end of the cylindrical body and contacts the inner surface;
A second transmission line (8) having a coaxial structure composed of a central conductor (7) and a dielectric (16) surrounding the central conductor, the tip of the central conductor being connected to the other end of the contact member When,
; And a grounded housing for accommodating a part of the said contact member and said cylindrical member second transmission line (4), further,
The contact member (26) has a tapered surface (26a) having an inner surface opened at one end thereof, and the center line of the contact member (26) is inconsistent with the center line of the lead (2) inserted through the cylindrical body (5). A test fixture (1) , wherein a tip end portion of the lead inserted through the cylindrical body is configured to contact the tapered surface of the contact member . In a test fixture (1) for measuring electrical characteristics of an electronic device (3) having a plurality of leads (2),
A first transmission line having a coaxial structure made of a cylindrical dielectric body in which the lead is inserted from one open end and the leading end of the lead protrudes from the other open end, and having a desired characteristic impedance together with the lead A cylindrical body (5) comprising:
A cylindrical contact member (6) that is removably inserted from one end of the lead that protrudes from the other end of the cylindrical body and contacts the inner surface;
A second transmission line (8) having a coaxial structure composed of a central conductor (7) and a dielectric (16) surrounding the central conductor, the tip of the central conductor being connected to the other end of the contact member When,
The cylindrical body, the contact member, and a grounded housing (4) that houses a part of the second transmission line, and
When the casing (4) is movably provided and moves inward of the casing, the cylindrical body (5) is inserted and its tip is inserted into the contact member (6). By pressing the lead (2) in the vicinity of the contact member, a pressing member (9) for bringing the tip portion into contact with the inner surface of the contact member is provided,
Inside the housing (4), the lead (2) is arranged in the vicinity of the lead on the opposite side of the pressing member (9), and the lead moved by being pressed by the pressing member is moved to the lead. A test fixture (1) having a holding member (20) made of a dielectric material that is held in a predetermined position so that the periphery thereof is almost uniformly filled with a dielectric material .

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