TWI816763B - Exposure device - Google Patents

Exposure device Download PDF

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Publication number
TWI816763B
TWI816763B TW108109069A TW108109069A TWI816763B TW I816763 B TWI816763 B TW I816763B TW 108109069 A TW108109069 A TW 108109069A TW 108109069 A TW108109069 A TW 108109069A TW I816763 B TWI816763 B TW I816763B
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exposure
substrate
stage
long
unit
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TW108109069A
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Chinese (zh)
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TW201942684A (en
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绿川悟
松永真一
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日商鷗爾熙製作所股份有限公司
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Priority claimed from JP2018065536A external-priority patent/JP7040981B2/en
Priority claimed from JP2018065540A external-priority patent/JP7037416B2/en
Priority claimed from JP2018182595A external-priority patent/JP7175149B2/en
Application filed by 日商鷗爾熙製作所股份有限公司 filed Critical 日商鷗爾熙製作所股份有限公司
Publication of TW201942684A publication Critical patent/TW201942684A/en
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Publication of TWI816763B publication Critical patent/TWI816763B/en

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    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/20Exposure; Apparatus therefor
    • G03F7/2051Exposure without an original mask, e.g. using a programmed deflection of a point source, by scanning, by drawing with a light beam, using an addressed light or corpuscular source
    • G03F7/2057Exposure without an original mask, e.g. using a programmed deflection of a point source, by scanning, by drawing with a light beam, using an addressed light or corpuscular source using an addressed light valve, e.g. a liquid crystal device
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/20Exposure; Apparatus therefor
    • G03F7/22Exposing sequentially with the same light pattern different positions of the same surface
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/20Exposure; Apparatus therefor
    • G03F7/24Curved surfaces
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F9/00Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Electronic Switches (AREA)
  • Magnetic Resonance Imaging Apparatus (AREA)
  • Gas-Filled Discharge Tubes (AREA)

Abstract

[課題]本發明提供曝光裝置。構成能夠抑制長基板的曲折前行的基板輸送系統。 [解決手段]在捲筒對捲筒輸送系統能夠與曝光載台(15)一起沿著基板輸送方向M移動的曝光裝置(10’)中,張力輥(36)設置於曝光載台(15)的下游側。並且,在捲筒對捲筒輸送系統的移動中,張力輥(36)相對於其他的輥而進行位置變動並施加張力,以抑制長基板W1、W2的撓曲。[Problem] The present invention provides an exposure device. Construct a substrate conveying system that can suppress long substrates from meandering. [Solution] In an exposure device (10') whose roll-to-roll conveyance system can move along the substrate conveyance direction M together with the exposure stage (15), the tension roller (36) is provided on the exposure stage (15) the downstream side. Furthermore, during the movement of the roll to the roll conveyance system, the tension roller ( 36 ) changes its position relative to the other rollers and applies tension to suppress the deflection of the long substrates W1 and W2 .

Description

曝光裝置Exposure device

本發明涉及通過捲筒對捲筒輸送系統(Roll to Roll carrier,RtoR輸送系統)來輸送撓性印刷基板等長基板(工件)的曝光裝置。The present invention relates to an exposure device that transports long substrates (workpieces) such as flexible printed circuit boards through a roll-to-roll carrier (RtoR transport system).

在具備捲筒對捲筒輸送系統的曝光裝置中,在曝光載台的上游側配置有供給卷軸(開卷捲筒),在下游側配置有收卷卷軸(收卷捲筒),在將印刷電路板等長基板捲繞在供給卷軸、收卷卷軸上之後,在從上游側向下游側輸送的同時進行曝光。In an exposure device equipped with a roll-to-roll conveyance system, a supply reel (unwinding reel) is disposed on the upstream side of the exposure stage, and a rewinding reel (rewinding reel) is disposed on the downstream side. After the printed circuit is After a long substrate such as a board is wound on a supply reel and a take-up reel, it is exposed while being conveyed from the upstream side to the downstream side.

具體而言,在使吸附支承長基板的背面的曝光載台沿著長基板輸送方向移動的同時,通過設置於長基板的上方的曝光頭而投影與投影區域(曝光物件區域)的位置對應的圖案光。當曝光載台移動到曝光完成位置時,曝光載台下降而返回到最初的曝光位置。通過反復進行相同的曝光動作,從而在整個長基板上形成圖案(例如,參照專利文獻1、2)。 [先前技術文獻] [專利文獻]Specifically, while the exposure stage that adsorbs and supports the back surface of the long substrate is moved along the long substrate conveyance direction, an exposure head installed above the long substrate projects an image corresponding to the position of the projection area (exposure object area). Patterned light. When the exposure stage moves to the exposure completion position, the exposure stage descends and returns to the initial exposure position. By repeating the same exposure operation, a pattern is formed on the entire long substrate (for example, see Patent Documents 1 and 2). [Prior technical literature] [Patent Document]

專利文獻1:日本特許公開第2015-222370號公報 專利文獻2:日本特許公開第2009-276522號公報Patent Document 1: Japanese Patent Publication No. 2015-222370 Patent Document 2: Japanese Patent Publication No. 2009-276522

以往的捲筒對捲筒輸送系統固定在曝光裝置的基座(殼體)上。因此,在曝光開始之前,長基板從供給卷軸間歇性地引出而向下游側送出。另外,在曝光結束之後,隨著曝光載台復位到上游側,有時會發生長基板向上游側反卷的情況。因這樣的基板的移動,導致在長基板曲折前行,還產生曝光位置偏離、長基板的翹曲、褶皺、擦痕等損傷。特別是,在使複數個長基板並行移動而同時曝光的情況下,難以調整曲折前行。Conventional roll-to-roll conveying systems were fixed to the base (casing) of the exposure device. Therefore, before the exposure is started, the long substrate is intermittently pulled out from the supply reel and sent downstream. In addition, after the exposure is completed, as the exposure stage returns to the upstream side, the long substrate may be rolled back toward the upstream side. Such movement of the substrate causes the long substrate to zigzag, causing deviations in the exposure position and damage to the long substrate such as warping, wrinkles, and scratches. In particular, when a plurality of long substrates are moved in parallel and exposed at the same time, it is difficult to adjust the meandering motion.

因此,需要構成能夠抑制長基板的曲折前行的基板輸送系統。Therefore, it is necessary to configure a substrate conveying system that can suppress the meandering of long substrates.

本發明的曝光裝置包括:曝光載台,其支承至少一個長基板,並能夠沿著基板輸送線而進行往返移動;至少一個卷軸對,其隔著曝光載台而對置配置,並輸送長基板;複數個輥,它們設置在卷軸對之間,並與長基板相接,卷軸對以及複數個輥能夠與曝光載台一起沿著基板輸送線而進行往返移動,複數個輥包括張力輥,在沿著基板輸送線而進行的往返移動中,該張力輥能夠相對於其他輥進行位置變動。The exposure device of the present invention includes: an exposure stage that supports at least one long substrate and can reciprocate along a substrate conveyance line; and at least one pair of reels that are oppositely arranged across the exposure stage and convey the long substrate. ; A plurality of rollers, which are arranged between pairs of reels and connected to the long substrate. The pair of reels and the plurality of rollers can move back and forth along the substrate conveying line together with the exposure stage. The plurality of rollers include tension rollers. During the reciprocating movement along the substrate conveyance line, the tension roller can change its position relative to other rollers.

曝光裝置可具備:載台移動機構,其使曝光載台沿著基板輸送線而進行往返移動;以及輸送部移動機構,其使卷軸對與曝光載台一起沿著基板輸送線而進行往返移動。The exposure apparatus may include a stage moving mechanism that reciprocates the exposure stage along the substrate conveyance line, and a conveyance unit moving mechanism that reciprocates the reel pair along with the exposure stage along the substrate conveyance line.

張力輥可配置於曝光載台的下游側。另外,張力輥可構成為偏心的輥。進而,對於張力輥,可限制其向上方的移動、例如沿著鉛直方向的移動。The tension roller may be arranged on the downstream side of the exposure stage. In addition, the tension roller can be designed as an eccentric roller. Furthermore, upward movement of the tension roller, for example, movement in the vertical direction can be restricted.

可具備供給側驅動機構,該供給側驅動機構對卷軸對的供給卷軸向與長基板的送出方向相反的方向施加扭矩。另外,可具備收卷側驅動機構,該收卷側驅動機構根據長基板的被計測出的張力來控制施加於卷軸對的收卷卷軸的扭矩量。A supply-side drive mechanism may be provided that applies torque to the supply reel of the pair of reels in a direction opposite to the feeding direction of the long substrate. In addition, a winding-side drive mechanism may be provided that controls the amount of torque applied to the winding reels of the pair of reels based on the measured tension of the long base plate.

例如,長基板可由並列的複數個長基板構成,張力輥可橫跨複數個長基板而配置。For example, the long base plate may be composed of a plurality of parallel long base plates, and the tension roller may be disposed across the plurality of long base plates.

複數個輥可具備張力測定輥,該張力測定輥配置於比張力輥靠下游側的位置,對長基板的張力進行計測。 [發明效果]The plurality of rollers may include a tension measuring roller disposed downstream of the tension roller to measure the tension of the long substrate. [Effects of the invention]

根據本發明,能夠構成可靠地抑制長基板的曲折前行的基板輸送系統。According to the present invention, it is possible to configure a substrate transport system that reliably suppresses the meandering of long substrates.

下面,參照附圖,對本發明的實施方式進行說明。Hereinafter, embodiments of the present invention will be described with reference to the drawings.

圖1是本實施方式的曝光裝置的概略性結構圖。圖2是示意性地示出曝光裝置的一部分的立體圖。圖3是曝光裝置的概略性方塊圖。FIG. 1 is a schematic structural diagram of the exposure apparatus according to this embodiment. FIG. 2 is a perspective view schematically showing a part of the exposure device. Fig. 3 is a schematic block diagram of the exposure device.

曝光裝置10為具備在輸送捲繞成捲筒狀的長基板W的同時進行曝光動作的捲筒對捲筒輸送系統的曝光裝置,該曝光裝置10具備基板供給部16、基板收卷部30、曝光部40。在此,長基板W由長條片狀的基板進行捲繞而形成為捲筒狀,該長條片狀的基板是在長條薄膜上形成銅薄膜層之後塗覆(或者粘貼)光阻等感光材料而成的。如圖2所示,長基板W由寬度相同的兩條(一對)基板W1、W2構成。The exposure device 10 is an exposure device provided with a roll-to-roll conveyance system that performs an exposure operation while conveying a long substrate W wound into a roll shape. The exposure device 10 includes a substrate supply unit 16, a substrate winding unit 30, Exposure part 40. Here, the long substrate W is formed into a roll by winding a long sheet-shaped substrate in which a copper thin film layer is formed on a long film and then photoresist or the like is coated (or pasted). Made of photosensitive materials. As shown in FIG. 2 , the long substrate W is composed of two (a pair) substrates W1 and W2 having the same width.

曝光載台(工作臺)15吸附長基板W的背面而將其保持為平坦,並可在背面吸附位置與從背面遠離的規定的離開位置之間在Z方向上進行升降,通過未圖示的升降機構而升降。如後述,曝光載台15被載台移動機構50支承,可沿著X方向而移動。此外,下面用“X”來表示沿著長基板W的輸送方向(輸送線)M的方向,用“Y”來表示垂直於輸送方向M的方向(基板寬度方向),並且由“Z”來表示垂直於X、Y的方向(鉛直方向)。The exposure stage (stage) 15 adsorbs the back surface of the long substrate W to keep it flat, and can move up and down in the Z direction between the back surface adsorption position and a predetermined separation position away from the back surface. Lifting mechanism. As will be described later, the exposure stage 15 is supported by the stage moving mechanism 50 and is movable in the X direction. In addition, below, “X” represents the direction along the conveyance direction (conveyance line) M of the long substrate W, “Y” represents the direction perpendicular to the conveyance direction M (substrate width direction), and “Z” represents Indicates the direction perpendicular to X and Y (vertical direction).

曝光部40配置在從長基板W1、W2在Z方向上離開了規定距離的部位,借助未圖示的框架而固定於基座(底座)10B。如圖3所示,曝光部40由複數個曝光頭構成,在各個曝光頭上規定了沿著輸送方向M的曝光區域,複數個曝光頭分別具備半導體雷射器等光源41、照明光學系統42、呈矩陣狀排列有複數個微鏡的數位微鏡裝置(DMD,Digital Micro-mirror Device)43、成像光學系統44等。光源41通過光源控制部110而被驅動。 The exposure unit 40 is arranged at a location separated from the long substrates W1 and W2 by a predetermined distance in the Z direction, and is fixed to the base (base) 10B via a frame (not shown). As shown in FIG. 3 , the exposure unit 40 is composed of a plurality of exposure heads. Each exposure head defines an exposure area along the conveyance direction M. The plurality of exposure heads are respectively equipped with a light source 41 such as a semiconductor laser, an illumination optical system 42, A digital micromirror device (DMD, Digital Micro-mirror Device) 43 in which a plurality of micromirrors are arranged in a matrix, an imaging optical system 44, and the like. The light source 41 is driven by the light source control unit 110 .

各個曝光頭的數位微鏡裝置43根據從曝光控制部120傳送而來的與曝光區域位置對應的描繪資料(柵格資料)來定位微鏡的姿態,由此將圖案光投影到長基板W1、W2。根據長基板W1、W2相對於曝光部40的相對移動對微鏡的姿態進行切換,從而進行對長基板W1、W2的感光材料的曝光(多次曝光等),由此形成圖案。控制器100(參照圖3)控制曝光裝置10的全部曝光動作。此外,也可以通過遮罩的曝光部而構成。 The digital micromirror device 43 of each exposure head positions the posture of the micromirror based on the drawing data (grid data) corresponding to the position of the exposure area transmitted from the exposure control unit 120, thereby projecting the pattern light onto the long substrate W1, W2. The posture of the micromirror is switched according to the relative movement of the long substrates W1 and W2 with respect to the exposure unit 40, thereby exposing the photosensitive material of the long substrates W1 and W2 (multiple exposures, etc.), thereby forming a pattern. The controller 100 (see FIG. 3 ) controls the entire exposure operation of the exposure device 10 . In addition, it may be configured by the exposure part of the mask.

基板供給部16具備:供給卷軸22A、22B,它們配置於曝光載台15的上游側;支承輥24;及驅動機構(未圖示),其使供給卷軸22A、22B分別進行軸旋轉。驅動機構例如由步進馬達等構成。通過基板供給部16而被懸臂支承的供給卷軸22A、22B分別以捲繞成捲筒狀的狀態保持並固定長基板W1、W2的未曝光部分,另外通過進行軸旋轉,能夠朝向下游側送出長基板W。此外,將在從曝光載台15觀察時的供給卷軸22A、22B側稱為“上游側”,將收卷卷軸32A、32B側稱為“下游側”。 The substrate supply unit 16 includes supply reels 22A and 22B arranged on the upstream side of the exposure stage 15 , a support roller 24 , and a drive mechanism (not shown) that causes the supply reels 22A and 22B to rotate their respective shafts. The driving mechanism is composed of, for example, a stepping motor or the like. The supply reels 22A and 22B, which are cantilevered by the substrate supply unit 16 , respectively hold and fix the unexposed portions of the long substrates W1 and W2 in a rolled state, and can feed the long substrates W1 and W2 downstream by rotating their shafts. Substrate W. In addition, the side of the supply reels 22A and 22B when viewed from the exposure stage 15 is called the "upstream side", and the side of the winding reels 32A and 32B is called the "downstream side".

基板收卷部30具備收卷卷軸32A、32B、支承輥34、以及驅動機構(未圖示),該驅動機構使配置於曝光載台15的下游側的收卷卷軸32A、32B分別進行軸旋轉。收卷卷軸32A、32B分別以捲繞成捲筒狀的狀態保持並固定長基板W1、W2的已曝光部分,另外通過軸旋轉對長基板W1、W2進行收卷。通過輸送控制部130(參照圖3)而對由基板供給部16、基板收卷部30進行的長基板W1、W2的收卷處理等進行控制。The substrate winding section 30 includes winding reels 32A and 32B, a support roller 34 , and a driving mechanism (not shown) that rotates the respective axis of the winding reels 32A and 32B arranged on the downstream side of the exposure stage 15 . The winding reels 32A and 32B respectively hold and fix the exposed portions of the long substrates W1 and W2 in a state of being wound into a roll shape, and also wind up the long substrates W1 and W2 by rotating the axis. The transport control unit 130 (see FIG. 3 ) controls the winding process of the long substrates W1 and W2 by the substrate supply unit 16 and the substrate winding unit 30 .

分別配置於供給卷軸22A、22B與曝光載台15、和收卷卷軸32A、32B與曝光載台15之間的支承輥24、34係支承長基板W1、W2,該支承輥24、34在輸送長基板W1、W2時構成為進行軸旋轉的自由輥。支承輥24、34的高度被調整為使得長基板W1、W2在曝光面的高度或者比曝光面的高度稍低的位置上向下游側移動,並且支承輥24、34分別通過基板供給部16、基板收卷部30而被懸臂支承。在長基板W1、W2上的支承輥24、34的區間T(參照圖1)的架設部分被施加適當的張力,從而長基板W1、W2以未發生褶皺、延長的狀態被輸送。The support rollers 24 and 34 respectively arranged between the supply reels 22A and 22B and the exposure stage 15 and the winding reels 32A and 32B and the exposure stage 15 support the long substrates W1 and W2. The support rollers 24 and 34 are conveying In the case of the long substrates W1 and W2, they are configured as free rollers for axis rotation. The heights of the support rollers 24 and 34 are adjusted so that the long substrates W1 and W2 move downstream at the height of the exposure surface or at a position slightly lower than the height of the exposure surface, and the support rollers 24 and 34 pass through the substrate supply parts 16 and 16 respectively. The substrate winding unit 30 is cantilevered. Appropriate tension is applied to the portions where the support rollers 24 and 34 are installed in the section T (see FIG. 1 ) on the long substrates W1 and W2, so that the long substrates W1 and W2 are conveyed in an elongated state without causing wrinkles.

供給卷軸22A、22B以及收卷卷軸32A、32B具備在基板安裝時供長基板W1、W2的捲筒狀捲繞部分固定的公知的驅動機構26A、26B以及36A、36B。另外,基板供給部16、基板收卷部30的各自的驅動機構使供給卷軸22A和收卷卷軸32A、供給卷軸22B和收卷卷軸32B分別同步旋轉,並間歇性地以規定長度輸送長基板W1、W2。The supply reels 22A and 22B and the take-up reels 32A and 32B are equipped with known drive mechanisms 26A, 26B and 36A, 36B for fixing the roll-shaped winding portions of the long substrates W1 and W2 when mounting the substrates. In addition, the respective driving mechanisms of the substrate supply unit 16 and the substrate rewinding unit 30 rotate the supply reel 22A and the rewinding reel 32A, the supply reel 22B and the rewinding reel 32B in synchronization, and intermittently transport the long substrate W1 by a predetermined length. , W2.

載台移動機構50具備裝備了對曝光載台15進行懸臂支承的升降機構(未圖示)的移動部件52、和設置在基座10B上的一對導軌54A、54B、以及致動器55。一對導軌54A、54B沿著X方向延伸,移動部件52可沿著導軌54A、54B而在X方向以及其相反方向上移動。致動器55例如由滾珠螺絲構成。The stage moving mechanism 50 includes a moving member 52 equipped with a lifting mechanism (not shown) that cantilever-supports the exposure stage 15 , a pair of guide rails 54A and 54B provided on the base 10B, and an actuator 55 . A pair of guide rails 54A and 54B extend along the X direction, and the moving member 52 can move in the X direction and the opposite direction along the guide rails 54A and 54B. The actuator 55 is composed of a ball screw, for example.

輸送部移動機構60具備板狀的移動部件62、設置在基座10B上的一對導軌64A、64B以及致動器65。基板供給部16和基板收卷部30搭載於移動部件62之上,一體地進行移動(聯動)。一對導軌64A、64B沿著X方向而延伸,移動部件62可沿著導軌64A、64B而在X方向以及其相反方向上移動。The transport unit moving mechanism 60 includes a plate-shaped moving member 62, a pair of guide rails 64A and 64B provided on the base 10B, and an actuator 65. The substrate supply unit 16 and the substrate winding unit 30 are mounted on the moving member 62 and move integrally (interlocked). The pair of guide rails 64A and 64B extend along the X direction, and the moving member 62 can move in the X direction and the opposite direction along the guide rails 64A and 64B.

設置在基座10B上的移動控制部70控制致動器55、65的驅動,以維持輸送系統(基板供給部16以及基板收卷部30)與曝光載台15的相對位置關係,即以將相對的距離間隔保持為固定的方式,對曝光載台15和基板供給部16、基板收卷部30的移動進行回饋控制。The movement control unit 70 provided on the base 10B controls the driving of the actuators 55 and 65 to maintain the relative positional relationship between the conveying system (the substrate supply unit 16 and the substrate winding unit 30) and the exposure stage 15, that is, to maintain the Feedback control is performed on the movement of the exposure stage 15 , the substrate supply unit 16 , and the substrate winding unit 30 while maintaining a fixed relative distance.

通過內置於致動器55、65的伺服馬達的同步控制而保持曝光載台15和基板供給部16(基板收卷部30)的沿著輸送方向M的相對距離間隔。另外,為了監視該相對距離間隔,位置檢測用光電感測器90配置在基板供給部16的與曝光載台15對置的側面上(參照圖2)。位置檢測用光電感測器90內置有LED等光源,對曝光載台15的側面進行照射。曝光載台15的側面被形成為,在光的照射位置為基準位置時和除此之外的位置時會產生光量差。移動控制部70在曝光載台15和基板供給部16的移動中通過檢測光量而監視是否保持著適當的相對距離間隔。The relative distance between the exposure stage 15 and the substrate supply unit 16 (substrate winding unit 30 ) along the conveyance direction M is maintained by synchronous control of the servo motors built in the actuators 55 and 65 . In addition, in order to monitor this relative distance interval, the position detection photoelectric sensor 90 is arranged on the side surface of the substrate supply unit 16 that faces the exposure stage 15 (see FIG. 2 ). The position detection photoelectric sensor 90 has a built-in light source such as an LED, and illuminates the side of the exposure stage 15 . The side surface of the exposure stage 15 is formed so that a difference in light intensity occurs between when the light irradiation position is the reference position and when it is at other positions. The movement control unit 70 monitors whether an appropriate relative distance is maintained by detecting the amount of light during movement of the exposure stage 15 and the substrate supply unit 16 .

在曝光載台15的支承輥24側設置有用於檢測長基板W1、W2的各自的端面位置的位置感測器80。位置感測器80例如由線感測器等透射型光電感測器構成。基板供給部16和基板收部30分別具備控制供給卷軸22A、22B和收卷卷軸32A、32B的軸向位置的機構(未圖示),根據所檢測到的端面位置而調整捲筒軸向位置,並修正曲折前行。A position sensor 80 for detecting the end surface positions of the long substrates W1 and W2 is provided on the support roller 24 side of the exposure stage 15 . The position sensor 80 is composed of a transmission photoelectric sensor such as a line sensor. The substrate supply unit 16 and the substrate collection unit 30 are respectively equipped with mechanisms (not shown) for controlling the axial positions of the supply reels 22A and 22B and the winding reels 32A and 32B, and adjust the axial positions of the reels based on the detected end surface positions. , and correct the twists and turns.

圖4是示出曝光開始時和曝光完成時的曝光載台以及輸送系統的位置的圖。FIG. 4 is a diagram showing the positions of the exposure stage and the transport system when exposure starts and when exposure is completed.

在曝光開始之前,曝光載台15吸附保持長基板W1、W2,供給卷軸22A、22B和收卷卷軸32A、32B由於沒有被驅動,因此被保持為靜止狀態。伴隨著曝光的開始,曝光載台15沿著X方向以規定速度移動。此時,基板供給部16以及基板收卷部30對應著曝光載台15的移動進行移動。Before the exposure is started, the exposure stage 15 adsorbs and holds the long substrates W1 and W2, and the supply reels 22A and 22B and the take-up reels 32A and 32B are not driven and therefore are maintained in a stationary state. Along with the start of exposure, the exposure stage 15 moves in the X direction at a predetermined speed. At this time, the substrate supply unit 16 and the substrate winding unit 30 move according to the movement of the exposure stage 15 .

即,與曝光載台15同步地開始移動,並以保持基板供給部16以及基板收卷部30和曝光載台15的相對位置關係的方式,以與曝光載台15相同的速度在X方向上移動(並行)。因此,長基板W1、W2在曝光載台15的移動前以及曝光載台15的移動中不會被向下游側送出,相對於曝光載台15靜止。在曝光載台15的移動中,從曝光部40投影與各個曝光頭的曝光區域位置對應的圖案光。That is, the movement is started in synchronization with the exposure stage 15 , and the relative positional relationship between the substrate supply unit 16 and the substrate winding unit 30 and the exposure stage 15 is maintained at the same speed as the exposure stage 15 in the X direction. Move (parallel). Therefore, the long substrates W1 and W2 are not sent to the downstream side before the movement of the exposure stage 15 and during the movement of the exposure stage 15 , and are stationary with respect to the exposure stage 15 . During the movement of the exposure stage 15 , pattern light corresponding to the exposure area position of each exposure head is projected from the exposure unit 40 .

當曝光載台15和基板供給部16以及基板收卷部30到達曝光完成位置時,曝光載台15解除對長基板W1、W2的吸附支承並下降。然後,供給卷軸22A、22B和收卷卷軸32A、32B同步旋轉,長基板W1、W2被收卷卷軸32A、32B收卷規定長度的量。When the exposure stage 15, the substrate supply unit 16, and the substrate winding unit 30 reach the exposure completion position, the exposure stage 15 releases the suction support of the long substrates W1 and W2 and descends. Then, the supply reels 22A and 22B and the take-up reels 32A and 32B rotate synchronously, and the long substrates W1 and W2 are taken up by the take-up reels 32A and 32B by a predetermined length.

當向收卷卷軸32A、32B側的收卷結束時,曝光載台15和基板供給部16以及基板收卷部30同步移動,並返回到曝光開始位置。在此期間,供給卷軸22A、22B和收卷卷軸32A、32B由於沒有被驅動,因此成為靜止狀態。通過反復進行上述的曝光動作,從而在整個長基板W1、W2上形成圖案。When winding toward the winding reels 32A and 32B is completed, the exposure stage 15 moves synchronously with the substrate supply unit 16 and the substrate winding unit 30 and returns to the exposure start position. During this period, since the supply reels 22A and 22B and the take-up reels 32A and 32B are not driven, they become stationary. By repeating the above-described exposure operation, patterns are formed on the entire long substrates W1 and W2.

根據這樣的本實施方式,在具備對長基板W1、W2進行輸送的捲筒對捲筒輸送系統的曝光裝置10中,設置有用於保持設置於曝光載台15的上游側的供給卷軸22A、22B的基板供給部16,和用於保持設置於下游側的收卷卷軸32A、32B的基板收卷部30。在進行曝光動作時,曝光載台15通過載台移動機構50而在X方向上移動,同時基板供給部16以及基板收卷部30通過輸送部移動機構60而均在X方向上移動。According to this embodiment, in the exposure apparatus 10 provided with the roll-to-roll conveyance system for conveying the long substrates W1 and W2, the supply reels 22A and 22B for holding the supply reels 22A and 22B provided on the upstream side of the exposure stage 15 are provided. The substrate supply part 16 and the substrate rewinding part 30 for holding the rewinding reels 32A and 32B provided on the downstream side. During the exposure operation, the exposure stage 15 is moved in the X direction by the stage moving mechanism 50 , and the substrate supply unit 16 and the substrate winding unit 30 are both moved in the X direction by the conveying unit moving mechanism 60 .

由於基板輸送系統(基板供給部16、基板收卷部30)與曝光載台15一起移動,因此長基板W1、W2在曝光載台15的移動開始前以及移動中不會被向下游側送出。因此,以往的輸送系統那樣的曝光中的曲折前行被抑制,不會產生因曲折行進引起的曝光位置偏離或者因基板的褶皺而引起的翹曲等。另外,通過構成這樣的基板輸送系統,無需設置張力調節輥等機構,能夠通過簡單的結構來構建基板輸送系統。Since the substrate transport system (substrate supply unit 16 , substrate winding unit 30 ) moves together with the exposure stage 15 , the long substrates W1 and W2 are not sent out downstream before the movement of the exposure stage 15 starts and during the movement. Therefore, meandering during exposure like a conventional conveyance system is suppressed, and exposure position deviation due to meandering or warpage due to wrinkles in the substrate does not occur. In addition, by configuring such a substrate transportation system, there is no need to provide a mechanism such as a tension adjustment roller, and the substrate transportation system can be constructed with a simple structure.

基板供給部16和基板收卷部30在曝光中只要單向地將長基板W向下游側送出即可,無需進行回卷。因此,能夠實現抑制了長基板W的曲折前行的圖案曝光。特別適用於難以調整曲折前行之輸送兩條長基板W1、W2的曝光裝置。The substrate supply unit 16 and the substrate winding unit 30 only need to feed the long substrate W to the downstream side in one direction during exposure, and do not need to rewind it. Therefore, pattern exposure in which the long substrate W is suppressed from meandering can be achieved. It is especially suitable for the exposure device that transports two long substrates W1 and W2 in a zigzag manner that is difficult to adjust.

由於是基板輸送系統進行移動,因此可將基板輸送長度(供給卷軸22A、22B與收卷卷軸32A、32B之間的基板長度)構成為較短。通過使基板輸送長度較短,從而不容易產生長基板W1、W2的褶皺、拉伸等,可高精度地形成圖案。特別是,僅設置一個支承輥24、34就能夠構成送出長基板W1、W2的輸送系統。Since the substrate transport system moves, the substrate transport length (the substrate length between the supply reels 22A and 22B and the take-up reels 32A and 32B) can be configured to be short. By making the substrate conveyance length short, wrinkles, stretching, etc. of the long substrates W1 and W2 are less likely to occur, and patterns can be formed with high accuracy. In particular, it is possible to constitute a conveyance system for feeding long substrates W1 and W2 by providing only one support roller 24 and 34.

另外,在完成曝光動作之後,由於是在曝光載台15不吸附支承長基板W1、W2的期間內將長基板W1、W2送出到下游側而收卷的,因此能夠順利進行收卷。此時,基板輸送長度較短,因此可在短時間內完成收卷。In addition, after the exposure operation is completed, the long substrates W1 and W2 are sent out to the downstream side and wound up while the exposure stage 15 is not adsorbing and supporting the long substrates W1 and W2, so the winding can be performed smoothly. At this time, the substrate transport length is short, so the winding can be completed in a short time.

在本實施方式中,曝光載台15和基板輸送系統(基板供給部16、基板收卷部30)被載台移動機構50和輸送部移動機構60分別進行驅動。關於長基板W1、W2,供給卷軸22A、22B的捲筒狀部分、收卷卷軸32A、32B的捲筒狀部分的卷徑在長基板W1、W2向基板收卷部30收卷的過程中逐漸變化,從而重量平衡不是一定的。In this embodiment, the exposure stage 15 and the substrate transport system (substrate supply unit 16 and substrate winding unit 30 ) are driven by the stage moving mechanism 50 and the transport unit moving mechanism 60 respectively. Regarding the long substrates W1 and W2, the roll diameters of the roll-shaped portions of the supply reels 22A and 22B and the roll-shaped portions of the take-up reels 32A and 32B gradually increase while the long substrates W1 and W2 are being wound toward the substrate rewinding unit 30. changes, so the weight balance is not certain.

然而,通過設置與載台移動機構50不同的輸送部移動機構60,即便長基板W1、W2的重量平衡發生變化,也能夠防止對曝光載台15的移動控制產生影響。另外,能夠直接利用以往的載台移動機構來構建輸送系統。However, by providing the transport unit moving mechanism 60 that is different from the stage moving mechanism 50 , even if the weight balance of the long substrates W1 and W2 changes, it is possible to prevent the movement control of the exposure stage 15 from being affected. In addition, the conventional stage moving mechanism can be directly used to construct a transportation system.

另一方面,基板供給部16和基板收卷部30被固定支承於相同的移動部件62,並一體地進行移動。由於基板供給部16和基板收卷部30聯動,因此基板供給部16與基板收卷部30之間的相對位置關係不會發生變化,容易維持與曝光載台15之間的相對位置關係。另外,能夠將輸送部移動機構60統一為一個驅動系統。On the other hand, the substrate supply unit 16 and the substrate winding unit 30 are fixedly supported by the same moving member 62 and move integrally. Since the substrate supply part 16 and the substrate rewinding part 30 are interlocked, the relative positional relationship between the substrate supply part 16 and the substrate rewinding part 30 does not change, and the relative positional relationship with the exposure stage 15 is easily maintained. In addition, the transport unit moving mechanism 60 can be unified into one drive system.

另一方面,移動控制部70對控制致動器55、65進行驅動,以便在曝光載台15的移動中保持曝光載台15與基板供給部16以及基板收卷部30的相對位置關係。由此,抑制了供給卷軸22A、22B、收卷卷軸32A、32B靠近曝光載台15從而導致發生長基板W1、W2的延長、翹曲等情況,另外能夠防止曝光位置偏離。On the other hand, the movement control unit 70 drives the control actuators 55 and 65 so that the relative positional relationship between the exposure stage 15 and the substrate supply unit 16 and the substrate winding unit 30 is maintained during the movement of the exposure stage 15 . This prevents the supply reels 22A and 22B and the take-up reels 32A and 32B from approaching the exposure stage 15 to cause elongation and warping of the long substrates W1 and W2, and can prevent the exposure position from being displaced.

此外,移動控制部70可以在距離間隔為閾值以上時,控制移動速度、加速度。或者,控制供給卷軸22A、22B以及/或者收卷卷軸32A、32B的軸旋轉,從而調整為對長基板W1、W2施加適當的張力。In addition, the movement control unit 70 may control the movement speed and acceleration when the distance interval is equal to or greater than the threshold value. Alternatively, the shaft rotations of the supply reels 22A and 22B and/or the take-up reels 32A and 32B are controlled to adjust to apply appropriate tension to the long substrates W1 and W2.

不僅是兩條長基板W1、W2,還可將更複數個長基板並列地同時進行輸送,另外也可以採用輸送一個長基板的結構。關於基板供給部16和基板收卷部30,也可以不進行機械連結,使它們通過不同的移動機構進行移動。另外,可通過相同的移動機構使曝光載台15和基板供給部16、基板收卷部30移動。Not only the two long substrates W1 and W2, but also a plurality of long substrates can be transported side by side simultaneously, and a structure in which one long substrate is transported can also be adopted. The substrate supply unit 16 and the substrate winding unit 30 may not be mechanically connected and may be moved by different moving mechanisms. In addition, the exposure stage 15, the substrate supply unit 16, and the substrate winding unit 30 can be moved by the same moving mechanism.

在以上的實施方式中,是在曝光載台15的上游側設置基板供給部16,在下游側設置基板收卷部30,並以使長基板W1、W2向相同方向移動的方式驅動供給卷軸22A、22B和收卷卷軸32A、32B的,但也可使長基板W1和W2彼此向相反的方向移動。In the above embodiment, the substrate supply unit 16 is provided on the upstream side of the exposure stage 15 , the substrate winding unit 30 is provided on the downstream side, and the supply reel 22A is driven to move the long substrates W1 and W2 in the same direction. , 22B and the winding reels 32A, 32B, but the long substrates W1 and W2 can also be moved in opposite directions to each other.

即,在曝光載台15的兩側設置兩對卷軸,以使一對卷軸對向X方向捲繞的方式設置供給卷軸、收卷卷軸,使另一對卷軸對向-X方向收卷的方式設置供給卷軸、收卷卷軸。在該情況下,使將基板供給裝置和基板收卷裝置的功能組合在一起的一對輸送裝置相對於曝光載台而移動。這樣,當構成為使長基板W1和W2彼此向相反方向移動時,能夠抑制長基板在曝光載台的上游側和下游側的重量平衡的變化。That is, two pairs of reels are provided on both sides of the exposure stage 15, the supply reel and the take-up reel are set up so that one pair of reels is wound in the X direction, and the other pair of reels is wound in the -X direction. Set up the supply reel and take-up reel. In this case, a pair of conveyance devices that combine the functions of the substrate supply device and the substrate winding device are moved relative to the exposure stage. In this way, when the long substrates W1 and W2 are configured to move in opposite directions, changes in the weight balance of the long substrates on the upstream side and the downstream side of the exposure stage can be suppressed.

另外,在以上的實施方式中,是通過使曝光載台15進行移動來實現長基板W1、W2與曝光部40的相對移動並進行曝光的,但也可以將曝光載台15固定於基座10B,使曝光部40通過未圖示的移動裝置而在基板輸送方向上移動,由此進行相對移動。在該情況下,基板供給部16和基板收卷部30以維持與曝光載台15之間的相對位置關係的方式被固定於基座10B。In addition, in the above embodiment, the exposure stage 15 is moved so that the long substrates W1 and W2 and the exposure part 40 are relatively moved and exposed. However, the exposure stage 15 may be fixed to the base 10B. , the exposure unit 40 is moved in the substrate conveying direction by a moving device (not shown), thereby performing relative movement. In this case, the substrate supply unit 16 and the substrate winding unit 30 are fixed to the base 10B so as to maintain the relative positional relationship with the exposure stage 15 .

接下來,利用圖5、6,對第二實施方式進行說明。在第二實施方式中,捲筒對捲筒輸送系統配置在曝光載台的曝光面以下。另外,設置有在曝光載台、基板供給裝置、以及基板收卷裝置進行移動時向長基板施加張力的張力輥。此外,在第一實施方式中,捲筒對捲筒輸送系統配置在曝光載台的曝光面以下。Next, the second embodiment will be described using FIGS. 5 and 6 . In the second embodiment, the roll-to-roll conveyance system is arranged below the exposure surface of the exposure stage. In addition, a tension roller that applies tension to the long substrate when the exposure stage, substrate supply device, and substrate winding device move is provided. Furthermore, in the first embodiment, the roll-to-roll conveyance system is arranged below the exposure surface of the exposure stage.

圖5是示出作為第二實施方式的曝光裝置的概略性立體圖。圖6是曝光裝置的概略性俯視圖。此外,第二實施方式的基板輸送方向與第一實施方式的輸送方向相反,基板供給裝置、基板收卷裝置的配置部位也與第一實施方式相反。對於相同的結構要件,使用與第一實施方式相同的符號。FIG. 5 is a schematic perspective view showing an exposure device according to a second embodiment. Fig. 6 is a schematic plan view of the exposure device. In addition, the substrate conveyance direction of the second embodiment is opposite to that of the first embodiment, and the placement locations of the substrate supply device and the substrate winding device are also opposite to those of the first embodiment. For the same structural elements, the same symbols as in the first embodiment are used.

與第一實施方式相同,曝光裝置10’具備基板供給部16、基板收卷部30,分別具備供給卷軸22A、22B、和收卷卷軸32A、32B。另一方面,通過設置於基板供給部16與基板收卷部30之間的輥支承裝置55來支承被構成為自由輥且配置於曝光載台15的兩端旁的支承輥24、34。Like the first embodiment, the exposure apparatus 10' includes a substrate supply unit 16 and a substrate winding unit 30, and includes supply reels 22A and 22B and winding reels 32A and 32B, respectively. On the other hand, the support rollers 24 and 34 configured as free rollers and arranged next to both ends of the exposure stage 15 are supported by the roller support device 55 provided between the substrate supply unit 16 and the substrate winding unit 30 .

基板供給部16(16A、16B)、基板收卷部30(30A、30B)、輥支承裝置55能夠通過輸送部移動機構60而向輸送方向M(X方向)及其相反方向移動。另外,曝光載台15能夠通過載台移動機構50向輸送方向M及其相反方向移動,與第一實施方式相同地,基板供給部16、基板收卷部30、輥支承裝置55能夠與曝光載台15同步地移動。The substrate supply unit 16 ( 16A, 16B), the substrate winding unit 30 ( 30A, 30B), and the roller support device 55 are movable in the transport direction M (X direction) and the opposite direction by the transport unit moving mechanism 60 . In addition, the exposure stage 15 can be moved in the conveying direction M and the opposite direction by the stage moving mechanism 50. Like the first embodiment, the substrate supply unit 16, the substrate winding unit 30, and the roller support device 55 can be moved together with the exposure stage 15. The stations 15 move synchronously.

在第二實施方式中,作為與長基板W1、W2相接的輥,不僅設置有支承輥24、34,而且還設置有張力輥36、張力測定輥37、張力測定輥39。張力輥36為自由輥,通過輥支承裝置55而被支承。In the second embodiment, not only the support rollers 24 and 34 but also the tension roller 36, the tension measuring roller 37, and the tension measuring roller 39 are provided as rollers in contact with the long substrates W1 and W2. The tension roller 36 is a free roller and is supported by a roller support device 55 .

張力測定輥39通過輥支承裝置30C而被支承,由兩個自由輥39A、39B構成。長基板W2以夾在兩個自由輥39A、39B之間的狀態被捲繞。張力測定輥37為自由輥,通過輥支承裝置55而被支承。張力測定輥37、39通過負荷感測器等已知的張力測定方法來測定長基板W1、W2的張力。The tension measuring roller 39 is supported by a roller support device 30C and is composed of two free rollers 39A and 39B. The long substrate W2 is wound while being sandwiched between two free rollers 39A and 39B. The tension measuring roller 37 is a free roller and is supported by the roller support device 55 . The tension measuring rollers 37 and 39 measure the tension of the long substrates W1 and W2 using a known tension measuring method such as a load cell.

如圖6所示,曝光部40設定於具備四個腳部46A~46D的台架45上。但是,圖5中未圖示台架45。台架45的腳部46A、46C(腳部46B、46D)的距離間隔被設定為能夠使長基板W1、W2以及捲筒對捲筒輸送系統穿過台架45的內部空間SJ。As shown in FIG. 6 , the exposure unit 40 is set on a stand 45 including four leg portions 46A to 46D. However, the stand 45 is not shown in FIG. 5 . The distance between the legs 46A and 46C (the legs 46B and 46D) of the gantry 45 is set to allow the long substrates W1 and W2 and the roll-to-roll conveyance system to pass through the internal space SJ of the gantry 45 .

另一方面,曝光光學系統的工作距離(WD)被設定為非常短的距離間隔(例如幾十毫米程度),因此台架45的高度不能被設定為遠遠超出曝光載台15的高度。因此,曝光載台15以靠近台架45的內面的方式通過。On the other hand, the working distance (WD) of the exposure optical system is set to a very short distance interval (for example, on the order of several tens of millimeters), so the height of the stage 45 cannot be set far beyond the height of the exposure stage 15 . Therefore, the exposure stage 15 passes close to the inner surface of the stage 45 .

在本實施方式中,構成捲筒對捲筒輸送系統的支承輥24、34、張力測定輥37、39、以及供給卷軸22A、22B、收卷卷軸32A、32B均配置在曝光載台15的曝光面EH以下(即以曝光面EH為基準的曝光部40的相反側)的空間。換言之,構成捲筒對捲筒輸送系統的部件不會實質性地超過曝光面EH(哪怕是一部分)。In this embodiment, the support rollers 24 and 34, the tension measuring rollers 37 and 39, the supply reels 22A and 22B, and the take-up reels 32A and 32B constituting the roll-to-roll conveyance system are all arranged on the exposure side of the exposure stage 15. The space below the surface EH (that is, the opposite side of the exposure portion 40 with the exposure surface EH as a reference). In other words, the components constituting the roll-to-roll conveying system will not substantially extend beyond the exposure surface EH (even partially).

這表示參與到長基板W1、W2的輸送中的RoR輸送系統的上表面是平坦的。因此,支承輥24、34、張力測定輥37、39能夠在不抵接到台架45的情況下向內部空間SJ移動。關於這一點基板供給部16、基板收卷部30、輥支承裝置55也是一樣的。This means that the upper surface of the RoR transport system involved in transporting the long substrates W1 and W2 is flat. Therefore, the backup rollers 24 and 34 and the tension measuring rollers 37 and 39 can move toward the internal space SJ without coming into contact with the stand 45 . This point is also the same for the substrate supply unit 16, the substrate winding unit 30, and the roller support device 55.

由於捲筒對捲筒輸送系統配置於曝光面EH的下方,因此供給卷軸22A、22B以對長基板W1、W2施加適當的張力的方式配置於台架45附近。收卷卷軸32A、32B也以使張力輥36、張力測定輥37、39位於中間的方式配置得盡可能靠近台架45。Since the roll-to-roll conveyance system is disposed below the exposure surface EH, the supply reels 22A and 22B are disposed near the stage 45 so as to apply appropriate tension to the long substrates W1 and W2. The winding reels 32A and 32B are also arranged as close as possible to the stand 45 so that the tension roller 36 and the tension measuring rollers 37 and 39 are located in the middle.

另一方面,為了對長基板W1、W2分別施加適當的張力,使供給卷軸22A、22B和收卷卷軸32A、32B分別被獨立地被驅動。另一方面,輸送部移動機構60僅配置於長基板W1、W2的一側,供給卷軸22A、22B以及收卷卷軸32A、32B被懸臂支承。On the other hand, in order to apply appropriate tension to the long substrates W1 and W2, the supply reels 22A and 22B and the take-up reels 32A and 32B are driven independently. On the other hand, the conveyance unit moving mechanism 60 is disposed only on one side of the long substrates W1 and W2, and the supply reels 22A and 22B and the take-up reels 32A and 32B are cantilevered.

因此,供給卷軸22A、22B和收卷卷軸32A、32B各自在基板輸送方向M上配置在不同的位置。另一方面,基於容易對長基板W1、W2施加相同的張力,此外還為了控制捲筒對捲筒輸送系統的垂直方向的高度等理由,配置設定成使供給卷軸22A、收卷卷軸32A的垂直方向的高度與供給卷軸22B、收卷卷軸32B的垂直方向的高度相等。Therefore, the supply reels 22A and 22B and the take-up reels 32A and 32B are respectively arranged at different positions in the substrate conveyance direction M. On the other hand, in order to easily apply the same tension to the long substrates W1 and W2 and to control the height of the roll in the vertical direction of the roll conveyance system, the arrangement is set so that the supply reel 22A and the winding reel 32A are vertical. The height in the direction is equal to the height in the vertical direction of the supply reel 22B and the take-up reel 32B.

長基板W2比長基板W1距基板供給部16、基板收卷部30更遠,供給卷軸22B、收卷卷軸32B的長度比供給卷軸22A、收卷卷軸32A的長度長,捲筒狀的長基板W2被支承在從基板供給部16、基板收卷部30離開的位置。因此,長基板W2容易在供給卷軸22B、收卷卷軸32B之間曲折前行。The long substrate W2 is farther from the substrate supply unit 16 and the substrate rewinding unit 30 than the long substrate W1. The lengths of the supply reel 22B and the rewinding reel 32B are longer than the lengths of the supply reel 22A and the rewinding reel 32A. The roll-shaped long substrate W2 is supported at a position separated from the substrate supply unit 16 and the substrate winding unit 30 . Therefore, the long substrate W2 easily meanders between the supply reel 22B and the take-up reel 32B.

為了防止該情況,以使供給卷軸22B、收卷卷軸32B的卷軸間距離比供給卷軸22A、收卷卷軸32A的卷軸間距離短的方式構成捲筒對捲筒輸送系統。即,在更靠近基板供給部16、基板收卷部30的部位支承捲筒狀的長基板W1的供給卷軸22A、收卷卷軸32A與供給卷軸22B、收卷卷軸32B相比位於距曝光部40更遠的外側。In order to prevent this, the roll-to-roll conveyance system is configured such that the distance between the supply reel 22B and the take-up reel 32B is shorter than the distance between the supply reel 22A and the take-up reel 32A. That is, the supply reel 22A and the take-up reel 32A that support the roll-shaped long substrate W1 are located closer to the substrate supply part 16 and the substrate take-up part 30 than the supply reel 22B and the take-up reel 32B are located farther from the exposure part 40 further outside.

這樣,根據第二實施方式,在具備捲筒對捲筒輸送系統的曝光裝置10’中,構成捲筒對捲筒輸送系統的支承輥24、34、張力測定輥37、39、以及供給卷軸22A、22B、收卷卷軸32A、32B、基板供給部16、基板收卷部30、輥支承裝置55被配置在曝光載台15的曝光面EH以下的空間。In this way, according to the second embodiment, in the exposure device 10' provided with the roll-to-roll conveyance system, the support rollers 24 and 34, the tension measuring rollers 37 and 39, and the supply reel 22A constituting the roll-to-roll conveyance system , 22B, the winding reels 32A and 32B, the substrate supply unit 16 , the substrate winding unit 30 , and the roller support device 55 are arranged in a space below the exposure surface EH of the exposure stage 15 .

由此,能夠減小捲筒對捲筒輸送系統的沿著基板輸送方向M的裝置尺寸。即,設置空間配置於曝光面以下的捲筒對捲筒輸送系統中必然省略軋輥、張力調節輥,從而能夠使沿著基板輸送方向的裝置尺寸小型化。此外,本實施方式對於捲筒對捲筒輸送系統與曝光載台15不進行移動的以往的類型的捲筒對捲筒輸送系統也是有效的。Thereby, the device size of the roll-to-roll conveyance system along the substrate conveyance direction M can be reduced. That is, in the roll-to-roll conveyance system in which the installation space is arranged below the exposure surface, the nip roller and the tension adjustment roller are inevitably omitted, so that the size of the device along the substrate conveyance direction can be reduced. In addition, this embodiment is also effective for a conventional type of roll-to-roll conveyance system in which the exposure stage 15 does not move.

並且,在捲筒對捲筒輸送系統中,在輥組中與長基板W1、W2的表面相接的輥比以往的輸送系統少。由此,能夠抑制要形成圖案的基板表面被損傷。特別對於阻焊曝光有效。Furthermore, in the roll-to-roll conveyance system, there are fewer rollers in the roller group that are in contact with the surfaces of the long substrates W1 and W2 than in the conventional conveyance system. This can prevent the surface of the substrate on which the pattern is to be formed from being damaged. Especially effective for solder mask exposure.

並且,在第二實施方式中,通過設置有張力輥36的結構,在移動期間也能夠對長基板W1、W2施加適當的張力。下面,對張力輥36的作用以及供給卷軸22A、22B、收卷卷軸32A、32B的驅動進行說明。Furthermore, in the second embodiment, due to the structure in which the tension roller 36 is provided, appropriate tension can be applied to the long substrates W1 and W2 even during movement. Next, the function of the tension roller 36 and the driving of the supply reels 22A and 22B and the take-up reels 32A and 32B will be described.

張力輥36為對長基板W1、W2施加張力的輥,與長基板W1、W2的表面相接,並通過輥支承裝置55而支承為能夠相對於其他的輥進行位置變動的狀態。另外,張力輥36為偏心輥,以能夠進行擺動運動的方式被支承。The tension roller 36 is a roller that applies tension to the long substrates W1 and W2. The tension roller 36 is in contact with the surfaces of the long substrates W1 and W2 and is supported by the roller support device 55 so as to be positionally movable relative to other rollers. In addition, the tension roller 36 is an eccentric roller and is supported so as to be able to swing.

驅動供給卷軸22A、22B的驅動機構21A、21B分別設置於基板供給部16A、16B。驅動機構21A、21B具備單向離合器機構,以僅向基板輸送方向M的相反方向持續施加扭矩T的方式進行動作。扭矩T小於曝光載台15對長基板W1、W2的吸附力。例如,驅動機構21A、21B具備粉粒離合器,根據由張力測定輥37、39而測定的張力來控制粉粒離合器。Driving mechanisms 21A and 21B that drive the supply reels 22A and 22B are respectively provided in the substrate supply parts 16A and 16B. The drive mechanisms 21A and 21B are equipped with a one-way clutch mechanism and operate to continuously apply the torque T only in the opposite direction to the substrate conveyance direction M. The torque T is smaller than the adsorption force of the exposure stage 15 on the long substrates W1 and W2. For example, the drive mechanisms 21A and 21B are equipped with powder clutches, and the powder clutches are controlled based on the tension measured by the tension measuring rollers 37 and 39 .

另一方面,設置於基板收卷部30A、30B的收卷卷軸32A、32B的驅動機構31A、31B由伺服馬達機構構成。此外,驅動機構31A、31B根據由張力測定輥37、39測定的張力來調整收卷時等的扭矩量。On the other hand, the driving mechanisms 31A and 31B of the winding reels 32A and 32B provided in the substrate winding parts 30A and 30B are composed of servo motor mechanisms. In addition, the drive mechanisms 31A and 31B adjust the amount of torque during winding and the like based on the tension measured by the tension measuring rollers 37 and 39 .

如上述,輸送部移動機構60和載台移動機構50被各自構成,捲筒對捲筒輸送系統與曝光載台15同步地移動。因此,因移動時的控制問題等會產生同步偏差。即,曝光載台15比捲筒對捲筒輸送系統更快或更慢地移動。當發生同步偏差時,會導致長基板W1、W2的撓曲或者延長。為了防止該情況,使張力輥36進行位置變動以對長基板W1、W2施加張力。As described above, the conveyance unit moving mechanism 60 and the stage moving mechanism 50 are configured separately, and the roll-to-roll conveyance system moves in synchronization with the exposure stage 15 . Therefore, synchronization deviation may occur due to control problems during movement, etc. That is, the exposure stage 15 moves faster or slower than a roll-to-roll conveyor system. When synchronization deviation occurs, it will cause the long substrates W1 and W2 to deflect or extend. In order to prevent this, the position of the tension roller 36 is changed to apply tension to the long substrates W1 and W2.

張力輥36通過與未圖示的限制部件相接,鉛直方向上的移動被限制。在曝光載台15未吸附長基板W1、W2的狀態下,為了向與供給側相反的方向對供給卷軸22A、22B施加扭矩,與長基板W1、W2的表面相接的張力輥36向鉛直方向施力,維持與限制部件相接的狀態。長基板W1、W2成為在支承輥24、34之間施加了適當的張力的狀態。在曝光載台15吸附長基板W1、W2並移動的期間,同樣會維持施加張力的狀態。The movement of the tension roller 36 in the vertical direction is restricted by being in contact with a restriction member (not shown). In a state where the long substrates W1 and W2 are not adsorbed by the exposure stage 15, in order to apply torque to the supply reels 22A and 22B in the direction opposite to the supply side, the tension roller 36 in contact with the surfaces of the long substrates W1 and W2 is moved in the vertical direction. Apply force to maintain the state of contact with the restricting component. The long substrates W1 and W2 are in a state where appropriate tension is applied between the support rollers 24 and 34 . While the exposure stage 15 is adsorbing the long substrates W1 and W2 and moving, the state of applying tension is also maintained.

另一方面,在因同步偏差而導致捲筒對捲筒輸送系統比曝光載台15延遲的情況下,即,在曝光載台15靠近捲筒對捲筒輸送系統的情況下,由於曝光載台15吸附著長基板W1、W2而移動,因此長基板W1、W2欲撓曲。此時,張力輥36發生擺動,從上限位置發生變動。其結果,長基板W1、W2不發生撓曲而被施加有適當的張力。On the other hand, in the case where the roll-to-roll conveyance system is delayed from the exposure stage 15 due to synchronization deviation, that is, in the case where the exposure stage 15 is close to the roll-to-roll conveyance system, due to the exposure stage 15 15 adsorbs and moves the long substrates W1 and W2, so the long substrates W1 and W2 tend to bend. At this time, the tension roller 36 swings and moves from the upper limit position. As a result, appropriate tension is applied to the long substrates W1 and W2 without deflection.

相反地,在因同步偏差而導致捲筒對捲筒輸送系統比曝光載台15提前移動的情況下,即,在曝光載台15從捲筒對捲筒輸送系統遠離的情況下,驅動機構21A、21B對供給卷軸22A、22B向與長基板的送出方向相反的方向施加扭矩T,因此長基板W1、W2在支承輥24和供給卷軸22A、22B之間不發生撓曲,會被維持適當的張力。On the contrary, when the roll-to-roll conveyance system moves ahead of the exposure stage 15 due to synchronization deviation, that is, when the exposure stage 15 moves away from the roll-to-roll conveyance system, the driving mechanism 21A , 21B applies torque T to the supply reels 22A and 22B in the direction opposite to the feeding direction of the long substrates. Therefore, the long substrates W1 and W2 do not deflect between the support roller 24 and the supply reels 22A and 22B, and are maintained appropriately. Tension.

另一方面,通過設置張力輥36,會緩解張力輥36與張力測定輥39之間的長基板W1、W2的傾斜。因此,構成為通過將長基板W1、W2夾在輥39A、39B之間而形成角度從而能夠測定準確的張力。On the other hand, by providing the tension roller 36 , the inclination of the long substrates W1 and W2 between the tension roller 36 and the tension measuring roller 39 is alleviated. Therefore, it is configured so that accurate tension can be measured by sandwiching the long substrates W1 and W2 between the rollers 39A and 39B to form an angle.

這樣,根據第二實施方式,在捲筒對捲筒輸送系統可以與曝光載台15一起沿著基板輸送方向M移動的曝光裝置10’中,張力輥36設置於曝光載台15的下游側。並且,在捲筒對捲筒輸送系統的移動中,張力輥36相對於其他的輥發生位置變動而施加張力,以抑制長基板W1、W2的撓曲。Thus, according to the second embodiment, in the exposure device 10' in which the roll-to-roll conveyance system can move along the substrate conveyance direction M together with the exposure stage 15, the tension roller 36 is provided on the downstream side of the exposure stage 15. Furthermore, during the movement of the roll to the roll conveyance system, the tension roller 36 changes its position relative to the other rollers and applies tension to suppress the deflection of the long substrates W1 and W2.

在多數情況下,與使曝光載台15移動相比,使捲筒對捲筒輸送系統移動更需要驅動力。因此,容易產生使曝光載台15靠近捲筒對捲筒輸送系統的同步偏差。因此,通過將張力輥36配置於曝光載台15的下游側,從而能夠有效地施加張力。In most cases, moving the roll-to-roll conveyor system requires more driving force than moving the exposure stage 15 . Therefore, synchronization deviation of the exposure stage 15 in the roll-to-roll conveying system is likely to occur. Therefore, by disposing the tension roller 36 on the downstream side of the exposure stage 15, tension can be applied effectively.

另外,驅動機構21A、21B僅在與基板輸送方向相反的方向上持續對供給卷軸22A、22B施加扭矩,從而即便未將張力輥設置在曝光載台15的上游側,也能夠在發生同步偏差時施加張力。In addition, the drive mechanisms 21A and 21B continue to apply torque to the supply reels 22A and 22B only in the direction opposite to the substrate conveyance direction. Therefore, even if the tension roller is not provided on the upstream side of the exposure stage 15, synchronization deviation can be detected when synchronization deviation occurs. Apply tension.

並且,張力輥36通過偏心輥的結構而擺動,進行等時性移動。由此,能夠容易地持續施加適當的張力。並且,該張力輥36以橫跨長基板W1、W2的方式配置,從而能夠對長基板W1、W2施加相同的張力。Furthermore, the tension roller 36 swings due to the structure of the eccentric roller and moves isochronously. This makes it easy to continuously apply appropriate tension. Furthermore, the tension roller 36 is disposed across the long substrates W1 and W2, so that the same tension can be applied to the long substrates W1 and W2.

此外,也可以不由偏心輥來構成張力輥36,可以使張力輥36沿著鉛直方向進行位置變動。另外,也可以在上游側設置張力輥,並且,對載台移動機構50和輸送部移動機構60被形成為一體的移動機構也適用。In addition, the tension roller 36 may not be configured as an eccentric roller, and the position of the tension roller 36 may be changed in the vertical direction. In addition, a tension roller may be provided on the upstream side, and it is also applicable to a moving mechanism in which the stage moving mechanism 50 and the conveying unit moving mechanism 60 are integrated.

接下來,利用圖7,對第三實施方式進行說明。在第三實施方式中,輸送部移動機構設置於支承曝光部的台架的外側。Next, the third embodiment will be described using FIG. 7 . In the third embodiment, the transport unit moving mechanism is provided outside the stage that supports the exposure unit.

圖7是第三實施方式的曝光裝置的概略性立體圖。FIG. 7 is a schematic perspective view of the exposure device according to the third embodiment.

曝光裝置10”具備驅動供給卷軸22A、22B,並被對置配置的一對基板供給裝置120X、120Y、和驅動收卷卷軸32A、32B並被對置配置的一對基板收卷裝置130X、130Y。輸送部移動機構60由在曝光部40的台架45的外側沿基板輸送方向M並列的一對輸送部移動機構60X、60Y構成。The exposure apparatus 10″ includes a pair of substrate supply devices 120X and 120Y that drive the supply reels 22A and 22B and are arranged opposite to each other, and a pair of substrate rewinding devices 130X and 130Y that drive the rewinding reels 32A and 32B and are arranged opposite to each other. The conveying unit moving mechanism 60 is composed of a pair of conveying unit moving mechanisms 60X and 60Y arranged in parallel along the substrate conveying direction M outside the stage 45 of the exposure unit 40 .

分別配置於一對輸送部移動機構60X、60Y的基板供給裝置120A1、120A2從兩側支承供給卷軸22A。另外,供給卷軸22A的軸部具備與基板供給裝置120A1、120A2的距離間隔對應的長度。供給卷軸22B也通過基板供給裝置120B1、120B2而從兩側被支承。The substrate supply devices 120A1 and 120A2 respectively arranged in the pair of conveyance unit moving mechanisms 60X and 60Y support the supply reel 22A from both sides. In addition, the shaft portion of the supply reel 22A has a length corresponding to the distance between the substrate supply devices 120A1 and 120A2. The supply reel 22B is also supported from both sides by the substrate supply devices 120B1 and 120B2.

同樣地,分別配置於一對輸送部移動機構60X、60Y的基板收卷裝置130B1、130B2從兩側支承收卷卷軸32B,分別配置於輸送部移動機構60X、60Y的基板收卷裝置130A1、130A2從兩側支承收卷卷軸32A。輸送部移動機構60X可沿著導軌61X而向基板輸送方向M和與其相反的方向進行移動,輸送部移動機構60Y可沿著導軌61Y而向基板輸送方向M和與其相反的方向進行移動。Similarly, the substrate rewinding devices 130B1 and 130B2 respectively arranged on the pair of conveying unit moving mechanisms 60X and 60Y support the rewinding reel 32B from both sides, and the substrate rewinding devices 130A1 and 130A2 respectively arranged on the conveying unit moving mechanisms 60X and 60Y The winding reel 32A is supported from both sides. The conveyance unit moving mechanism 60X is movable along the guide rail 61X in the substrate conveyance direction M and in the opposite direction, and the conveyance unit moving mechanism 60Y is movable in the substrate conveyance direction M and in the opposite direction along the guide rail 61Y.

輸送部移動機構60X、60Y彼此同步地移動。由此,與第一、第二實施方式同樣地,捲筒對捲筒輸送系統能夠與曝光載台15一起向基板輸送方向M移動。但是,由於導軌61X、61Y配置於台架45的周圍,因此供給卷軸22B、收卷卷軸32B為了不與台架45接觸而被限制了移動範圍。在此,支承輥24、34安裝於曝光載台15。The transport unit moving mechanisms 60X and 60Y move in synchronization with each other. Thereby, similarly to the first and second embodiments, the roll-to-roll conveyance system can move in the substrate conveyance direction M together with the exposure stage 15 . However, since the guide rails 61X and 61Y are arranged around the gantry 45, the movement ranges of the supply reel 22B and the rewinding spool 32B are limited so as not to come into contact with the gantry 45. Here, the support rollers 24 and 34 are attached to the exposure stage 15 .

通過採用輸送部移動機構60X、60Y不通過台架45的下方的結構,從而能夠抑制在輸送部移動機構60X、60Y進行動作時向曝光部40傳遞振動,對圖案曝光產生影響的情況。另外,能夠確保台架45的內部空間SJ的空間,由此也能夠輸送如3條、4條這樣的複數個長基板。By adopting a structure in which the transport unit moving mechanisms 60X and 60Y do not pass under the gantry 45 , it is possible to suppress vibrations from being transmitted to the exposure unit 40 and affecting pattern exposure when the transport unit moving mechanisms 60X and 60Y operate. In addition, the internal space SJ of the gantry 45 can be secured, and thus a plurality of long substrates such as three or four can be transported.

另一方面,基板供給裝置120A1、120A2能夠分別通過致動器180A1、180A2進行移動,基板供給裝置120B1、120B2能夠分別沿著致動器180B1、180B2進行移動。同樣地,基板收卷裝置130A1、130A2能夠分別沿著致動器190A1、190A2進行移動,基板供給裝置130B1、130B2能夠分別沿著致動器190B1、190B2進行移動。On the other hand, the substrate supply devices 120A1 and 120A2 are respectively movable by the actuators 180A1 and 180A2, and the substrate supply devices 120B1 and 120B2 are respectively movable along the actuators 180B1 and 180B2. Similarly, the substrate winding devices 130A1 and 130A2 are respectively movable along the actuators 190A1 and 190A2, and the substrate supply devices 130B1 and 130B2 are respectively movable along the actuators 190B1 and 190B2.

供給側的致動器180A1、180A2、180B1、180B2、收卷側的致動器190A1、190A2、190B1、190B2均可使基板供給裝置120X、120Y以及基板收卷裝置130X、130Y沿著與基板輸送方向M正交的方向(以下,稱為基板輸送正交方向)N移動。另外,致動器均可由滾珠螺絲等構成。The supply-side actuators 180A1, 180A2, 180B1, 180B2, and the winding-side actuators 190A1, 190A2, 190B1, and 190B2 can all transport the substrates along the substrate supply devices 120X, 120Y and the substrate winding devices 130X, 130Y. N moves in the direction orthogonal to the direction M (hereinafter referred to as the substrate conveyance orthogonal direction). In addition, the actuators may be composed of ball screws or the like.

基板供給裝置120X、120Y以及基板收卷裝置130X、130Y通過相同的動作而沿著基板輸送正交方向N移動。即,以啟動時刻、移動速度、停止時刻相同的方式進行移動。由此,捲筒對捲筒輸送系統整體上一體地沿著基板輸送正交方向N進行移動。The substrate supply devices 120X and 120Y and the substrate winding devices 130X and 130Y move along the substrate conveyance orthogonal direction N by the same operation. That is, the movement is performed with the same start time, moving speed, and stop time. Thereby, the entire roll-to-roll conveyance system moves integrally along the substrate conveyance orthogonal direction N.

曝光載台15可通過載台移動機構50沿著基板輸送垂直方向N和其相反方向移動。並且,基板供給裝置120X、120Y以及基板收卷裝置130X、130Y可通過移動控制部70而與曝光載台15同步地移動。The exposure stage 15 is movable along the substrate transport vertical direction N and in the opposite direction by the stage moving mechanism 50 . Furthermore, the substrate supply devices 120X and 120Y and the substrate winding devices 130X and 130Y can be moved in synchronization with the exposure stage 15 by the movement control unit 70 .

由於捲筒對捲筒輸送系統與曝光載台15一起在基板輸送方向M以及基板輸送正交方向N上移動,因此對長基板W1、W2也能夠進行多路徑曝光。即,與對矩形形狀基板的曝光同樣地,在沿著基板輸送方向M而曝光某個掃描帶之後,使曝光載台15沿著基板輸送正交方向N移動,由此能夠曝光相鄰的掃描帶。Since the roll-to-roll conveyance system moves together with the exposure stage 15 in the substrate conveyance direction M and the substrate conveyance orthogonal direction N, multi-path exposure can also be performed on long substrates W1 and W2. That is, similarly to the exposure of a rectangular-shaped substrate, after a certain scan zone is exposed along the substrate conveyance direction M, the exposure stage 15 is moved along the substrate conveyance orthogonal direction N, whereby the adjacent scan zone can be exposed. belt.

曝光時的照射區域(曝光區域)尺寸依賴於曝光部40的光學系統、曝光特性(光強度、感光量等),有時不能確保與所使用的長基板的寬度匹配的尺寸。在曝光區域不能覆蓋長基板的整個寬度的情況下,通過執行多路徑曝光而能夠在長基板W1、W2的整個寬度上形成圖案。The size of the irradiation area (exposure area) during exposure depends on the optical system of the exposure unit 40 and exposure characteristics (light intensity, photosensitivity, etc.), and it may not be possible to ensure a size that matches the width of the long substrate used. In the case where the exposure area cannot cover the entire width of the long substrate, patterns can be formed over the entire width of the long substrates W1, W2 by performing multi-path exposure.

這樣,根據第三實施方式,在具備捲筒對捲筒輸送系統的曝光裝置10”中,輸送部移動機構60X、60Y配置在曝光部40的台架45的外側,一對基板供給裝置120X、120Y、一對基板收卷裝置130X、130Y不會穿過台架45的下方。另外,基板供給裝置120X、120Y和基板收卷裝置130X、130Y同步地在基板輸送正交方向N上移動,使捲筒對捲筒輸送系統與曝光載台15一起沿著基板輸送正交方向N移動。In this way, according to the third embodiment, in the exposure apparatus 10" provided with the roll-to-roll conveyance system, the conveyance unit moving mechanisms 60X and 60Y are arranged outside the gantry 45 of the exposure unit 40, and the pair of substrate supply devices 120X, 120Y and a pair of substrate winding devices 130X and 130Y do not pass under the gantry 45. In addition, the substrate supply devices 120X and 120Y and the substrate winding devices 130X and 130Y move synchronously in the substrate conveyance orthogonal direction N, so that The roll-to-roll conveyance system moves along the substrate conveyance orthogonal direction N together with the exposure stage 15 .

即使在第二實施方式中,也能夠構成為將輸送部移動機構60設置在台架45的外側而使之移動。 Also in the second embodiment, the transport unit moving mechanism 60 can be provided outside the gantry 45 and can be configured to move the gantry 45 .

接下來,利用圖8~10,對第四實施方式的曝光裝置進行說明。在第四實施方式中,曝光載台和輸送系統均沿著與輸送方向(M)正交的方向(Y)而移動。 Next, the exposure device of the fourth embodiment will be described using FIGS. 8 to 10 . In the fourth embodiment, both the exposure stage and the transport system move along the direction (Y) orthogonal to the transport direction (M).

圖8是從第四實施方式中的曝光裝置的上方觀察時的概略性俯視圖,圖9是從第四實施方式中的曝光裝置的側面觀察時的概略性俯視圖。圖10是第四實施方式中的曝光裝置的概略性方塊圖。 FIG. 8 is a schematic plan view when viewed from above the exposure device in the fourth embodiment, and FIG. 9 is a schematic plan view when viewed from the side of the exposure device in the fourth embodiment. FIG. 10 is a schematic block diagram of the exposure device in the fourth embodiment.

曝光裝置10’具備曝光部140、基板供給/收卷部150。在此,曝光部140由六個曝光頭140A~140F構成,並沿著輸送方向M而排列成鋸齒形。來自光源41的光被向各個曝光頭引導,從各個曝光頭向規定的曝光區域投影圖案光。 The exposure device 10' includes an exposure part 140 and a substrate supply/rewinding part 150. Here, the exposure unit 140 is composed of six exposure heads 140A to 140F, which are arranged in a zigzag shape along the conveyance direction M. Light from the light source 41 is guided to each exposure head, and pattern light is projected from each exposure head to a predetermined exposure area.

基板供給/收卷部150具備供給卷軸22、收卷卷軸32、支承輥24、34,與第一實施方式同樣地,對長基板W進行送出和收卷。基板供給/收卷部150以及曝光載台15一併設置於中間基座170。 The substrate supply/rewinding unit 150 is provided with a supply reel 22, a rewinding reel 32, and support rollers 24 and 34, and similarly to the first embodiment, feeds out and rewinds the long substrate W. The substrate supply/rewinding unit 150 and the exposure stage 15 are provided together on the intermediate base 170 .

載台/輸送部移動機構(第一移動機構)160是用於使曝光載台以及基板供給/收卷部150在與輸送方向M交叉的方向上移動的機構。第一移動機構160具備在與輸送方向M正交的方向上延伸的導軌62A、62B和未圖示的致動器(例如,線性馬達)。中間基座170能夠通過設置於基座10B的載台/輸送部移動機構160在與輸送方向M正交的方向Y上進行往返移動。 The stage/conveying unit moving mechanism (first moving mechanism) 160 is a mechanism for moving the exposure stage and the substrate supply/winding unit 150 in a direction intersecting the conveying direction M. The first moving mechanism 160 includes guide rails 62A and 62B extending in a direction orthogonal to the conveyance direction M and an actuator (eg, a linear motor) not shown. The intermediate base 170 can reciprocate in the direction Y orthogonal to the conveying direction M by the stage/conveying unit moving mechanism 160 provided on the base 10B.

通過使中間基座170相對於曝光裝置10’的基座10B而移動,而使包括曝光載台15、供給卷軸22、收卷卷軸32在內的基板供給/輸送部20相對於曝光部140而進行相對移動。曝光部140在曝光載台15進行相對移動的期間內投影圖案光。By moving the intermediate base 170 relative to the base 10B of the exposure device 10', the substrate supply/transport unit 20 including the exposure stage 15, the supply reel 22, and the winding reel 32 is moved relative to the exposure unit 140. Perform relative movement. The exposure unit 140 projects pattern light while the exposure stage 15 moves relatively.

複數個對準照相機82配置在沿著曝光載台15的輸送方向M的端面附近,檢測長基板W的曝光位置。另外,照相機標度部84也沿著曝光載台15的輸送方向M而配置在端面附近,該照相機標度部84具備設置有照相機基準位置的測定標記的照相機標度、或是用於測定曝光頭的曝光位置的誤差而修正描繪資料的感測器單元等。A plurality of alignment cameras 82 are arranged near the end surface along the conveyance direction M of the exposure stage 15 to detect the exposure position of the long substrate W. In addition, the camera scale portion 84 is also disposed near the end surface along the conveyance direction M of the exposure stage 15. The camera scale portion 84 includes a camera scale provided with a measurement mark for a camera reference position, or is used to measure exposure. The sensor unit, etc., which corrects the drawing data due to errors in the exposure position of the head.

在開始曝光之後,中間基座170相對於曝光部140進行相對移動,當結束曝光時,中間基座170返回到原來的位置。並且,當將長基板W輸送規定長度時,開始進行曝光動作。通過反復進行該動作,在長基板W上形成圖案。After the exposure is started, the intermediate base 170 moves relative to the exposure part 140, and when the exposure is completed, the intermediate base 170 returns to the original position. Then, when the long substrate W is conveyed to a predetermined length, the exposure operation is started. By repeating this operation, a pattern is formed on the long substrate W.

這樣,根據本實施方式,在具備曝光部140、基板供給/收卷部150的曝光裝置10’中,基板供給/收卷部150和曝光載台15一體地沿著與基板輸送方向M正交的方向進行往返移動。曝光部140根據曝光載台15的相對移動對長基板W進行曝光。In this way, according to this embodiment, in the exposure apparatus 10' including the exposure unit 140 and the substrate supply/windup unit 150, the substrate supply/windup unit 150 and the exposure stage 15 are integrated along a direction orthogonal to the substrate conveyance direction M. direction to move back and forth. The exposure unit 140 exposes the long substrate W according to the relative movement of the exposure stage 15 .

這樣,通過使曝光部140沿著與基板輸送方向M正交的方向掃描,從而能夠使曝光裝置10’小型化。另外,由於曝光部140沒有被設置於曝光載台15的上方,因此能夠自由設定曝光部140的結構。另外,由於不將對準照相機82設置於長基板W的上方,因此能夠縮短曝光載台15的輸送方向上的長度。並且,無需將照相機標度部84配置於長基板W的上方,無需設置用於避讓長基板W的U字型路徑,在長基板W上不會被施加應力。In this way, by scanning the exposure unit 140 in the direction orthogonal to the substrate conveyance direction M, the exposure device 10' can be miniaturized. In addition, since the exposure unit 140 is not provided above the exposure stage 15, the structure of the exposure unit 140 can be freely set. In addition, since the alignment camera 82 is not provided above the long substrate W, the length of the exposure stage 15 in the conveyance direction can be shortened. In addition, there is no need to arrange the camera scale portion 84 above the long substrate W, and there is no need to provide a U-shaped path for avoiding the long substrate W. Therefore, no stress is applied to the long substrate W.

在第四實施方式中,是通過使曝光載台15和基板供給/輸送部150進行移動來實現長基板W和曝光部140的相對移動並進行了曝光,但也可以將曝光載台15固定於基座10B,使曝光部40通過未圖示的移動裝置而在與輸送方向M正交的方向上移動。另外,也可以如第一實施方式那樣,由兩條基板來構成長基板W。在該情況下,曝光部40對兩條基板同時進行曝光。In the fourth embodiment, the exposure stage 15 and the substrate supply/transport unit 150 are moved to realize relative movement of the long substrate W and the exposure unit 140 and to perform exposure. However, the exposure stage 15 may be fixed to The base 10B moves the exposure unit 40 in a direction orthogonal to the conveyance direction M by a moving device (not shown). Alternatively, like the first embodiment, the long substrate W may be composed of two substrates. In this case, the exposure unit 40 exposes the two substrates simultaneously.

接下來,利用圖11~13,對第五實施方式進行說明。在第五實施方式中,輸送系統沿著基板輸送方向而移動,並且曝光部沿著與基板輸送方向正交的方向移動。Next, the fifth embodiment will be described using FIGS. 11 to 13 . In the fifth embodiment, the transportation system moves along the substrate transportation direction, and the exposure unit moves in the direction orthogonal to the substrate transportation direction.

圖11是第五實施方式中的曝光裝置的方塊圖。曝光裝置10”是對兩個長基板W1、W2進行曝光的曝光裝置,具備曝光部240和基板供給/收卷部220。在此,曝光部240由4個曝光頭240A~240D構成,並沿著輸送方向M而被交錯排列。Fig. 11 is a block diagram of the exposure device in the fifth embodiment. The exposure device 10" is an exposure device that exposes two long substrates W1 and W2, and is provided with an exposure section 240 and a substrate supply/rewinding section 220. Here, the exposure section 240 is composed of four exposure heads 240A to 240D. are staggered along the conveying direction M.

基板供給/收卷部220具備供給卷軸22、收卷卷軸32、支承輥24、34,與第一實施方式同樣地,對長基板W1、W2進行送出和收卷。基板供給/收卷部220和曝光載台15一併設置在中間基座270。The substrate supply/rewinding unit 220 is provided with a supply reel 22, a rewinding reel 32, and support rollers 24 and 34, and similarly to the first embodiment, feeds out and rewinds the long substrates W1 and W2. The substrate supply/rewinding unit 220 and the exposure stage 15 are provided together on the intermediate base 270 .

曝光部移動機構(第二移動機構)250使曝光部240沿著與輸送方向M正交的方向移動。The exposure unit moving mechanism (second moving mechanism) 250 moves the exposure unit 240 in a direction orthogonal to the conveyance direction M.

圖12、圖13是表示第五實施方式中的曝光裝置的曝光動作的圖。12 and 13 are diagrams showing the exposure operation of the exposure device in the fifth embodiment.

當在曝光部240靜止的狀態下、中間基座270沿著輸送方向M而移動時,曝光部240進行掃描,由此在長基板W1的區域EA1形成圖案(參照(A)、(B))。之後,在中間基座270靜止的狀態下曝光部40沿著與輸送方向M正交的方向移動,並在長基板W2的上方停止(參照(C))。When the intermediate base 270 moves along the conveyance direction M while the exposure unit 240 is stationary, the exposure unit 240 scans to form a pattern in the area EA1 of the long substrate W1 (see (A) and (B)). . Thereafter, the exposure unit 40 moves in the direction orthogonal to the conveyance direction M while the intermediate base 270 is stationary, and stops above the long substrate W2 (see (C)).

中間基座270本次沿著與輸送方向M相反的方向而移動。在此期間,曝光部240在曝光區域E2形成圖案(參照(D))。當曝光部40再次向長基板W1的上方移動時,中間基座270沿著輸送方向M而移動。在此期間,曝光部340在曝光區域EA3形成圖案(參照(E)、(F))。The intermediate base 270 moves in the opposite direction to the conveyance direction M this time. During this period, the exposure unit 240 forms a pattern in the exposure area E2 (see (D)). When the exposure part 40 moves above the long substrate W1 again, the intermediate base 270 moves along the conveyance direction M. During this period, the exposure unit 340 forms a pattern in the exposure area EA3 (see (E) and (F)).

接著,曝光部240向長基板W2移動,中間基座20向與輸送方向M相反的方向移動。在此期間,曝光部240在曝光區域EA4形成圖案(參照(G)、(H))。通過持續地、反復進行這樣的曝光部240和中間基座270的交替移動,從而在長基板W1、W2雙方上依序形成圖案。 Next, the exposure part 240 moves toward the long substrate W2, and the intermediate base 20 moves in the direction opposite to the conveyance direction M. During this period, the exposure unit 240 forms a pattern in the exposure area EA4 (see (G) and (H)). By continuously repeating such alternating movements of the exposure part 240 and the intermediate base 270 , patterns are sequentially formed on both the long substrates W1 and W2 .

這樣,根據第五實施方式,通過使曝光部240和曝光載台15在X、Y方向上移動,從而即便是曝光區域比較小的曝光部40的結構,也能夠對長基板W1、W2雙方進行曝光。 In this way, according to the fifth embodiment, by moving the exposure section 240 and the exposure stage 15 in the X and Y directions, even if the exposure section 40 has a relatively small exposure area, both long substrates W1 and W2 can be processed. exposure.

此外,也可以採用如下方式:曝光載台15和基板供給/收卷部220在與基板輸送方向M正交的方向上移動,曝光部240沿著基板輸送方向M而移動。另外,也可以是,基板供給/收卷部220在基板輸送方向M以及與之正交的方向上移動,也可以相反地使曝光部240在基板輸送方向M以及與之正交的方向上移動。 Alternatively, the exposure stage 15 and the substrate supply/rewinding unit 220 may move in a direction orthogonal to the substrate transportation direction M, and the exposure unit 240 may move along the substrate transportation direction M. In addition, the substrate feeding/rewinding unit 220 may move in the substrate conveying direction M and a direction orthogonal thereto, and conversely, the exposure unit 240 may move in the substrate conveying direction M and a direction orthogonal thereto. .

10:曝光裝置 10:Exposure device

15:曝光載台 15: Exposure stage

16:基板供給裝置(基板供給部) 16: Substrate supply device (substrate supply unit)

22A、22B:供給卷軸 22A, 22B: Supply reel

26A、26B:驅動機構(供給側驅動機構) 26A, 26B: Drive mechanism (supply side drive mechanism)

30:基板收卷裝置(基板收卷部) 30: Substrate rewinding device (substrate rewinding section)

32A、32B:收卷卷軸 32A, 32B: Rewinding reel

36‧‧‧張力輥 36A、36B‧‧‧驅動機構(收卷側驅動機構) 37‧‧‧張力測定輥 39‧‧‧張力測定輥 40、140、240‧‧‧曝光部 45‧‧‧台架 50‧‧‧載台移動機構 60‧‧‧輸送部移動機構 70‧‧‧移動控制部 120X、120Y‧‧‧基板供給裝置 130X、130Y‧‧‧基板收卷裝置 180A1、180A2‧‧‧致動器 180B1、180B2‧‧‧致動器 190A1、190A2‧‧‧致動器 190B1、190B2‧‧‧致動器 W1、W2‧‧‧長基板 20、150‧‧‧基板供給/輸送部 150、220‧‧‧基板供給/收卷部 160‧‧‧載台/輸送部移動機構(第一移動機構) 250‧‧‧曝光部移動機構(第二移動機構)36‧‧‧Tension roller 36A, 36B‧‧‧Driving mechanism (rewinding side driving mechanism) 37‧‧‧Tension measuring roller 39‧‧‧Tension measuring roller 40, 140, 240‧‧‧Exposure Department 45‧‧‧Stand 50‧‧‧Carrier moving mechanism 60‧‧‧Conveying part moving mechanism 70‧‧‧Mobile Control Department 120X, 120Y‧‧‧Substrate supply device 130X, 130Y‧‧‧Substrate rewinding device 180A1, 180A2‧‧‧actuator 180B1, 180B2‧‧‧actuator 190A1, 190A2‧‧‧actuator 190B1, 190B2‧‧‧actuator W1, W2‧‧‧Long substrate 20. 150‧‧‧Substrate supply/conveying department 150, 220‧‧‧Substrate supply/winding section 160‧‧‧Carrier/conveyor moving mechanism (first moving mechanism) 250‧‧‧Exposure part moving mechanism (second moving mechanism)

圖1是本實施方式的曝光裝置的概略性結構圖。 圖2是示意性地示出曝光裝置的一部分的立體圖。 圖3是曝光裝置的概略性方塊圖。 圖4是示出曝光開始時和曝光完成時的曝光載台和輸送系統的位置的圖。 圖5是第二實施方式的曝光裝置的概略性立體圖。 圖6是第二實施方式的曝光裝置的概略性俯視圖。 圖7是第三實施方式的曝光裝置的概略性立體圖。 圖8是從上方觀察第四實施方式的曝光裝置時的概略性俯視圖。 圖9是從側面觀察第四實施方式的曝光裝置時的概略性俯視圖。 圖10是第四實施方式的曝光裝置的概略性方塊圖。 圖11是第五實施方式的曝光裝置的概略性方塊圖。 圖12是示出第五實施方式的曝光裝置的曝光動作的圖。 圖13是示出第五實施方式的曝光裝置的曝光動作的圖。FIG. 1 is a schematic structural diagram of the exposure apparatus according to this embodiment. FIG. 2 is a perspective view schematically showing a part of the exposure device. Fig. 3 is a schematic block diagram of the exposure device. 4 is a diagram showing the positions of the exposure stage and the transport system at the start of exposure and at the completion of exposure. FIG. 5 is a schematic perspective view of the exposure device according to the second embodiment. FIG. 6 is a schematic plan view of the exposure device according to the second embodiment. FIG. 7 is a schematic perspective view of the exposure device according to the third embodiment. FIG. 8 is a schematic plan view of the exposure device according to the fourth embodiment when viewed from above. FIG. 9 is a schematic plan view when the exposure device according to the fourth embodiment is viewed from the side. FIG. 10 is a schematic block diagram of the exposure device according to the fourth embodiment. FIG. 11 is a schematic block diagram of the exposure device according to the fifth embodiment. FIG. 12 is a diagram showing the exposure operation of the exposure device according to the fifth embodiment. FIG. 13 is a diagram showing the exposure operation of the exposure device according to the fifth embodiment.

10’‧‧‧曝光裝置 10’‧‧‧Exposure device

15‧‧‧曝光載台 15‧‧‧Exposure stage

22A、22B‧‧‧供給卷軸 22A, 22B‧‧‧Supply reel

24、34‧‧‧支承輥 24, 34‧‧‧Backup roller

26A、26B‧‧‧驅動機構(供給側驅動機構) 26A, 26B‧‧‧Drive mechanism (supply side drive mechanism)

32A、32B‧‧‧收卷卷軸 32A, 32B‧‧‧Rewinding reel

36‧‧‧張力輥 36‧‧‧Tension roller

36A、36B‧‧‧驅動機構(收卷側驅動機構) 36A, 36B‧‧‧Driving mechanism (rewinding side driving mechanism)

37‧‧‧張力測定輥 37‧‧‧Tension measuring roller

39‧‧‧張力測定輥 39‧‧‧Tension measuring roller

39A、39B‧‧‧自由輥 39A, 39B‧‧‧Free roller

40‧‧‧曝光部 40‧‧‧Exposure Department

45‧‧‧台架 45‧‧‧Stand

46A~46D‧‧‧腳部 46A~46D‧‧‧Feet

EH‧‧‧曝光面 EH‧‧‧Exposed surface

M‧‧‧基板輸送方向 M‧‧‧Substrate conveying direction

SJ‧‧‧內部空間 SJ‧‧‧Internal space

T‧‧‧區間 T‧‧‧Interval

W1、W2‧‧‧長基板 W1, W2‧‧‧Long substrate

Claims (18)

一種曝光裝置,其特徵在於,包括:曝光載台,其支承至少一個長基板,並能夠沿著基板輸送線而進行往返移動;至少一個卷軸對,隔著所述曝光載台而對置配置,並輸送所述長基板;複數個輥,設置在所述卷軸對之間,並與所述長基板相接;載台移動機構,使所述曝光載台沿著基板輸送線而進行往返移動;以及輸送部移動機構,係與所述載台移動機構相異,使所述卷軸對以及支承所述複數個輥的輥支承裝置,與所述曝光載台一起沿著基板輸送線而進行往返移動;所述卷軸對以及所述複數個輥係,以所述卷軸對以及所述輥支承裝置與所述曝光載台的相對的距離間隔保持為固定的方式,與所述曝光載台一起沿著基板輸送線而進行往返移動,所述複數個輥包括張力輥,在沿著基板輸送線進行的往返移動中,該張力輥能夠相對於其他輥進行位置變動。 An exposure device, characterized in that it includes: an exposure stage that supports at least one long substrate and can reciprocate along a substrate conveying line; and at least one pair of reels arranged opposite to each other across the exposure stage, and transport the long substrate; a plurality of rollers are arranged between the pair of rollers and connected with the long substrate; a stage moving mechanism allows the exposure stage to move back and forth along the substrate conveying line; and a transport unit moving mechanism that is different from the stage moving mechanism and allows the pair of reels and a roller support device that supports the plurality of rollers to reciprocate along the substrate transportation line together with the exposure stage. ; The pair of reels and the plurality of roller systems move together with the exposure stage in such a way that the relative distance between the pair of reels and the roller support device and the exposure stage is kept constant. The plurality of rollers include a tension roller that can move back and forth along the substrate transportation line. The tension roller can change its position relative to the other rollers during the reciprocation movement along the substrate transportation line. 如申請專利範圍第1項所述的曝光裝置,其中,所述張力輥藉由與限制部件相接,鉛直上方向的移動被限制。 The exposure device according to claim 1, wherein the vertical movement of the tension roller is restricted by being in contact with the restricting member. 如申請專利範圍第2項所述的曝光裝置,其中,所述張力輥配置於所述曝光載台的下游側。 The exposure device according to claim 2, wherein the tension roller is disposed downstream of the exposure stage. 如申請專利範圍第3項所述的曝光裝置,其中,所述張力輥是偏心的張力輥。 The exposure device as described in item 3 of the patent application, wherein the tension roller is an eccentric tension roller. 如申請專利範圍第4項所述的曝光裝置,其中, 所述張力輥向上方的移動被限制。 The exposure device as described in item 4 of the patent application scope, wherein, The upward movement of the tension roller is restricted. 如申請專利範圍第5項所述的曝光裝置,更包括:供給側驅動機構,對所述卷軸對的供給卷軸向與所述長基板的送出方向相反的方向施加扭矩。 The exposure apparatus according to claim 5 of the patent application further includes: a supply-side driving mechanism for applying torque to the supply reel of the reel pair in a direction opposite to the feeding direction of the long substrate. 如申請專利範圍第6項所述的曝光裝置,更包括:收卷側驅動機構,根據所述長基板的被計測到的張力對施加於所述卷軸對的收卷卷軸的扭矩量進行控制。 The exposure device as described in claim 6 of the patent application further includes: a winding-side driving mechanism that controls the amount of torque applied to the winding reels of the pair of reels based on the measured tension of the long substrate. 如申請專利範圍第7項所述的曝光裝置,更包括:所述複數個輥包括張力測定輥,該張力測定輥配置在比所述張力輥靠下游側的位置,並對所述長基板的張力進行計測。 The exposure device according to claim 7, further comprising: the plurality of rollers including a tension measuring roller, the tension measuring roller being disposed downstream of the tension roller and measuring the length of the long substrate. Tension is measured. 如申請專利範圍第1至8項中的任一項所述的曝光裝置,其中,所述長基板由並列的複數個長基板構成,所述張力輥橫跨所述複數個長基板。 The exposure device according to any one of claims 1 to 8, wherein the long substrate is composed of a plurality of parallel long substrates, and the tension roller spans the plurality of long substrates. 如申請專利範圍第1項所述的曝光裝置,更包括:相對移動部,在曝光動作時使所述曝光載台和所述卷軸對相對於曝光部而沿著與基板輸送方向正交的方向進行相對移動。 The exposure device as claimed in claim 1, further comprising: a relative movement unit that moves the exposure stage and the reel pair relative to the exposure unit along a direction orthogonal to the substrate conveying direction during the exposure operation. Perform relative movement. 如申請專利範圍第10項所述的曝光裝置,其中,所述相對移動部包括第一移動機構,該第一移動機構使所述卷軸對和所述曝光載台相對於裝置基座而沿著與基板輸送方向正交的方向進行移動。 The exposure device according to claim 10, wherein the relative movement part includes a first movement mechanism that moves the reel pair and the exposure stage along a direction relative to the device base. Move in the direction orthogonal to the substrate conveying direction. 如申請專利範圍第10項所述的曝光裝置,更包括:第二移動機構,使所述曝光部相對於裝置基座而沿著與基板輸送方向正交的方向進行移動。 The exposure device according to claim 10 further includes: a second moving mechanism that moves the exposure part relative to the device base in a direction orthogonal to the substrate conveying direction. 如申請專利範圍第10至12項中的任一項所述的曝光裝置,更包括:複數個對準用照相機,檢測所述長基板的位置,並沿著所述基板輸送方向而並列地配置。 The exposure device according to any one of claims 10 to 12 of the patent application further includes: a plurality of alignment cameras that detect the position of the long substrate and are arranged side by side along the substrate conveying direction. 如申請專利範圍第13項所述的曝光裝置,更包括:照相機標度部,設置在所述曝光載台的沿著基板輸送方向的側面附近,用於獲得所述對準用照相機的位置資訊。 The exposure device as claimed in claim 13 of the patent application further includes: a camera scale unit, which is disposed near the side of the exposure stage along the substrate conveying direction for obtaining position information of the alignment camera. 如申請專利範圍第2項所述的曝光裝置,其中,所述輸送部移動機構更包括導軌,所述輸送部移動機構可沿著所述導軌而向基板輸送方向和與其相反的方向進行移動;所述輸送部移動機構的所述導軌設置在支承曝光部的台架的外側。 The exposure device according to claim 2, wherein the conveying part moving mechanism further includes a guide rail, and the conveying part moving mechanism can move along the guide rail in the substrate conveying direction and in the opposite direction; The guide rail of the transport unit moving mechanism is provided outside a stand that supports the exposure unit. 如申請專利範圍第15項所述的曝光裝置,其中,所述輸送部移動機構使基板供給部和基板收卷部沿著基板輸送線和基板輸送正交線而移動。 The exposure apparatus according to claim 15, wherein the conveyance unit moving mechanism moves the substrate supply unit and the substrate winding unit along the substrate conveyance line and the substrate conveyance orthogonal line. 如申請專利範圍第16項所述的曝光裝置,其中,所述載台移動機構使所述曝光載台沿著基板輸送線和基板輸送正交線而移動。 The exposure apparatus according to claim 16, wherein the stage moving mechanism moves the exposure stage along the substrate conveyance line and the substrate conveyance orthogonal line. 如申請專利範圍第15至17項中的任一項所述的曝光裝置,其中,所述長基板由並列的複數個長基板構成。 The exposure device according to any one of claims 15 to 17, wherein the long substrate is composed of a plurality of parallel long substrates.
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