TWI799936B - 半導體裝置及形成半導體裝置之方法 - Google Patents
半導體裝置及形成半導體裝置之方法 Download PDFInfo
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- TWI799936B TWI799936B TW110128990A TW110128990A TWI799936B TW I799936 B TWI799936 B TW I799936B TW 110128990 A TW110128990 A TW 110128990A TW 110128990 A TW110128990 A TW 110128990A TW I799936 B TWI799936 B TW I799936B
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- H01L29/66227—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials the devices being controllable only by the electric current supplied or the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched, e.g. three-terminal devices
- H01L29/66409—Unipolar field-effect transistors
- H01L29/66477—Unipolar field-effect transistors with an insulated gate, i.e. MISFET
- H01L29/66484—Unipolar field-effect transistors with an insulated gate, i.e. MISFET with multiple gate, at least one gate being an insulated gate
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- H01L29/7869—Thin film transistors, i.e. transistors with a channel being at least partly a thin film having a semiconductor body comprising an oxide semiconductor material, e.g. zinc oxide, copper aluminium oxide, cadmium stannate
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- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Ceramic Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Chemical & Material Sciences (AREA)
- Materials Engineering (AREA)
- Thin Film Transistor (AREA)
Applications Claiming Priority (6)
Application Number | Priority Date | Filing Date | Title |
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US202063118141P | 2020-11-25 | 2020-11-25 | |
US63/118,141 | 2020-11-25 | ||
US202163134256P | 2021-01-06 | 2021-01-06 | |
US63/134,256 | 2021-01-06 | ||
US17/324,893 US11670720B2 (en) | 2020-11-25 | 2021-05-19 | Semiconductor device and method |
US17/324,893 | 2021-05-19 |
Publications (2)
Publication Number | Publication Date |
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TW202221794A TW202221794A (zh) | 2022-06-01 |
TWI799936B true TWI799936B (zh) | 2023-04-21 |
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Application Number | Title | Priority Date | Filing Date |
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TW110128990A TWI799936B (zh) | 2020-11-25 | 2021-08-05 | 半導體裝置及形成半導體裝置之方法 |
Country Status (5)
Country | Link |
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US (2) | US11670720B2 (zh) |
KR (1) | KR102597962B1 (zh) |
CN (1) | CN114188224A (zh) |
DE (1) | DE102021113520A1 (zh) |
TW (1) | TWI799936B (zh) |
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Publication number | Priority date | Publication date | Assignee | Title |
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WO2023219570A1 (en) * | 2022-05-12 | 2023-11-16 | Nanyang Technological University | Transistor and method of forming the same |
CN115483095A (zh) * | 2022-10-17 | 2022-12-16 | 珠海创飞芯科技有限公司 | 一种半导体器件及其制造方法 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20150062475A1 (en) * | 2013-09-05 | 2015-03-05 | Samsung Electronics Co., Ltd. | Thin film transistor and method of driving same |
US20180114839A1 (en) * | 2016-10-25 | 2018-04-26 | National Taiwan University | Field effect transistor using transition metal dichalcogenide and a method for manufacturing the same |
US20190019894A1 (en) * | 2012-04-06 | 2019-01-17 | Semiconductor Energy Laboratory Co., Ltd. | Insulating film, method for manufacturing semiconductor device, and semiconductor device |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7026713B2 (en) | 2003-12-17 | 2006-04-11 | Hewlett-Packard Development Company, L.P. | Transistor device having a delafossite material |
US7642573B2 (en) | 2004-03-12 | 2010-01-05 | Hewlett-Packard Development Company, L.P. | Semiconductor device |
KR101403409B1 (ko) | 2010-04-28 | 2014-06-03 | 한국전자통신연구원 | 반도체 장치 및 그 제조 방법 |
KR20170041433A (ko) | 2015-10-07 | 2017-04-17 | 경희대학교 산학협력단 | 듀얼 게이트 박막 트랜지스터 및 그의 제조 방법 |
US10134915B2 (en) | 2016-12-15 | 2018-11-20 | Taiwan Semiconductor Manufacturing Co., Ltd. | 2-D material transistor with vertical structure |
KR102418493B1 (ko) | 2017-10-24 | 2022-07-06 | 엘지디스플레이 주식회사 | 이차원 반도체를 포함하는 박막 트랜지스터 및 이를 포함하는 표시장치 |
JP2019161182A (ja) | 2018-03-16 | 2019-09-19 | 株式会社リコー | 電界効果型トランジスタ及びその製造方法、表示素子、表示装置、システム |
CN113196501A (zh) * | 2018-12-28 | 2021-07-30 | 株式会社半导体能源研究所 | 半导体装置以及半导体装置的制造方法 |
US20220149192A1 (en) * | 2020-11-09 | 2022-05-12 | Intel Corporation | Thin film transistors having electrostatic double gates |
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2021
- 2021-05-19 US US17/324,893 patent/US11670720B2/en active Active
- 2021-05-26 DE DE102021113520.6A patent/DE102021113520A1/de active Pending
- 2021-07-14 KR KR1020210092215A patent/KR102597962B1/ko active IP Right Grant
- 2021-08-05 TW TW110128990A patent/TWI799936B/zh active
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US20190019894A1 (en) * | 2012-04-06 | 2019-01-17 | Semiconductor Energy Laboratory Co., Ltd. | Insulating film, method for manufacturing semiconductor device, and semiconductor device |
US20150062475A1 (en) * | 2013-09-05 | 2015-03-05 | Samsung Electronics Co., Ltd. | Thin film transistor and method of driving same |
US20180114839A1 (en) * | 2016-10-25 | 2018-04-26 | National Taiwan University | Field effect transistor using transition metal dichalcogenide and a method for manufacturing the same |
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CN114188224A (zh) | 2022-03-15 |
US12027628B2 (en) | 2024-07-02 |
US11670720B2 (en) | 2023-06-06 |
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US20230253503A1 (en) | 2023-08-10 |
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US20220165871A1 (en) | 2022-05-26 |
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KR102597962B1 (ko) | 2023-11-02 |
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