TWI791530B - Infrared-absorbing glass plate, manufacturing method thereof, and solid-state imaging device - Google Patents
Infrared-absorbing glass plate, manufacturing method thereof, and solid-state imaging device Download PDFInfo
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- 239000011521 glass Substances 0.000 title claims abstract description 169
- 238000003384 imaging method Methods 0.000 title claims abstract description 35
- 238000004519 manufacturing process Methods 0.000 title claims description 22
- 150000001450 anions Chemical class 0.000 claims abstract description 6
- 239000005303 fluorophosphate glass Substances 0.000 claims abstract description 6
- 229910052802 copper Inorganic materials 0.000 claims abstract description 5
- 239000000463 material Substances 0.000 claims description 33
- 239000003599 detergent Substances 0.000 claims description 18
- 238000005530 etching Methods 0.000 claims description 12
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- 125000002924 primary amino group Chemical class [H]N([H])* 0.000 claims description 5
- 239000011159 matrix material Substances 0.000 claims description 4
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- DWYMPOCYEZONEA-UHFFFAOYSA-L fluoridophosphate Chemical compound [O-]P([O-])(F)=O DWYMPOCYEZONEA-UHFFFAOYSA-L 0.000 description 6
- 230000003287 optical effect Effects 0.000 description 6
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- MGFYIUFZLHCRTH-UHFFFAOYSA-N nitrilotriacetic acid Chemical compound OC(=O)CN(CC(O)=O)CC(O)=O MGFYIUFZLHCRTH-UHFFFAOYSA-N 0.000 description 1
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- WVDDGKGOMKODPV-ZQBYOMGUSA-N phenyl(114C)methanol Chemical compound O[14CH2]C1=CC=CC=C1 WVDDGKGOMKODPV-ZQBYOMGUSA-N 0.000 description 1
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- 238000007569 slipcasting Methods 0.000 description 1
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- DZCAZXAJPZCSCU-UHFFFAOYSA-K sodium nitrilotriacetate Chemical compound [Na+].[Na+].[Na+].[O-]C(=O)CN(CC([O-])=O)CC([O-])=O DZCAZXAJPZCSCU-UHFFFAOYSA-K 0.000 description 1
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Images
Classifications
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- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C4/00—Compositions for glass with special properties
- C03C4/08—Compositions for glass with special properties for glass selectively absorbing radiation of specified wave lengths
- C03C4/082—Compositions for glass with special properties for glass selectively absorbing radiation of specified wave lengths for infrared absorbing glass
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B9/00—Machines or devices designed for grinding edges or bevels on work or for removing burrs; Accessories therefor
- B24B9/02—Machines or devices designed for grinding edges or bevels on work or for removing burrs; Accessories therefor characterised by a special design with respect to properties of materials specific to articles to be ground
- B24B9/06—Machines or devices designed for grinding edges or bevels on work or for removing burrs; Accessories therefor characterised by a special design with respect to properties of materials specific to articles to be ground of non-metallic inorganic material, e.g. stone, ceramics, porcelain
- B24B9/08—Machines or devices designed for grinding edges or bevels on work or for removing burrs; Accessories therefor characterised by a special design with respect to properties of materials specific to articles to be ground of non-metallic inorganic material, e.g. stone, ceramics, porcelain of glass
- B24B9/10—Machines or devices designed for grinding edges or bevels on work or for removing burrs; Accessories therefor characterised by a special design with respect to properties of materials specific to articles to be ground of non-metallic inorganic material, e.g. stone, ceramics, porcelain of glass of plate glass
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C15/00—Surface treatment of glass, not in the form of fibres or filaments, by etching
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C19/00—Surface treatment of glass, not in the form of fibres or filaments, by mechanical means
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C3/00—Glass compositions
- C03C3/12—Silica-free oxide glass compositions
- C03C3/23—Silica-free oxide glass compositions containing halogen and at least one oxide, e.g. oxide of boron
- C03C3/247—Silica-free oxide glass compositions containing halogen and at least one oxide, e.g. oxide of boron containing fluorine and phosphorus
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C4/00—Compositions for glass with special properties
- C03C4/08—Compositions for glass with special properties for glass selectively absorbing radiation of specified wave lengths
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D3/00—Other compounding ingredients of detergent compositions covered in group C11D1/00
- C11D3/16—Organic compounds
- C11D3/26—Organic compounds containing nitrogen
- C11D3/33—Amino carboxylic acids
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/20—Filters
- G02B5/22—Absorbing filters
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
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- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Organic Chemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- Materials Engineering (AREA)
- Geochemistry & Mineralogy (AREA)
- General Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Mechanical Engineering (AREA)
- Computer Hardware Design (AREA)
- Optics & Photonics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Electromagnetism (AREA)
- Ceramic Engineering (AREA)
- Inorganic Chemistry (AREA)
- Oil, Petroleum & Natural Gas (AREA)
- Wood Science & Technology (AREA)
- Glass Compositions (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Optical Filters (AREA)
- Surface Treatment Of Glass (AREA)
Abstract
本發明提供一種可謀求固體攝像元件裝置之小型化之紅外線吸收玻璃板。 本發明之紅外線吸收玻璃板1係具有相互對向之第1及第2主面1a、1b以及將第1及第2主面1a、1b連結之側面1c者,且係由以陽離子%計含有P5+ 10~70%、Al3+ 7~50%、Cu2+ 0.1~15%及以陰離子%計含有F- 10~90%、O2- 10~90%之氟磷酸鹽系玻璃所構成,厚度為0.2 mm以下,於側面1c不存在微裂。The present invention provides an infrared-absorbing glass plate capable of downsizing a solid-state imaging device. The infrared-absorbing glass plate 1 of the present invention has first and second main surfaces 1a, 1b facing each other and a side surface 1c connecting the first and second main surfaces 1a, 1b, and contains P 5+ 10~70%, Al 3+ 7~50%, Cu 2+ 0.1~15%, and fluorophosphate glass containing F - 10~90%, O 2- 10~90% in terms of anion % Composition, the thickness is 0.2 mm or less, and there are no microcracks on the side 1c.
Description
本發明係關於一種紅外線吸收玻璃板及其製造方法、以及使用該紅外線吸收玻璃板之固體攝像元件裝置。 The present invention relates to an infrared-absorbing glass plate, a manufacturing method thereof, and a solid-state imaging device using the infrared-absorbing glass plate.
於數位相機或智慧型手機之相機等中,使用CCD(Charge Coupled Device,電荷耦合元件)或CMOS(Complementary Metal Oxide Semiconductor,互補金氧半導體)等固體攝像裝置。該等固體攝像元件裝置具有廣範圍之受光感度,故而為了符合人之視感,必須去除紅外線區域之光。於下述之專利文獻1中,揭示有包含氟磷酸鹽系玻璃之紅外線吸收玻璃板作為用以去除紅外線區域之光之近紅外線截止濾光片。於專利文獻1中,藉由物理研磨而使玻璃板之厚度減薄。 A solid-state imaging device such as a CCD (Charge Coupled Device) or a CMOS (Complementary Metal Oxide Semiconductor) is used in a camera of a digital camera or a smart phone. These solid-state imaging device devices have a wide range of light-receiving sensitivity, so in order to conform to human vision, it is necessary to remove light in the infrared region. Patent Document 1 below discloses an infrared-absorbing glass plate made of fluorophosphate-based glass as a near-infrared cut filter for cutting light in the infrared region. In Patent Document 1, the thickness of the glass plate is reduced by physical grinding.
[專利文獻1]日本專利特開2007-99604號公報 [Patent Document 1] Japanese Patent Laid-Open No. 2007-99604
近年來,對於固體攝像元件裝置,要求進一步之小型化。因此,對於構成固體攝像元件裝置之紅外線吸收玻璃板,亦要求進一步之薄型化。然而,於如專利文獻1般藉由物理研磨而減薄之方法中,若將玻璃板之厚度過於減薄,則有玻璃板產生破裂之情形。因此,有無法將玻璃板充分減薄,無法使固體攝像元件裝置充分小型化之情形。 In recent years, solid-state imaging device devices have been required to be further downsized. Therefore, further thinning is required also for the infrared-absorbing glass plate constituting the solid-state imaging device. However, in the thinning method by physical grinding like Patent Document 1, if the thickness of the glass plate is too thin, the glass plate may be broken. Therefore, the thickness of the glass plate cannot be sufficiently reduced, and the solid-state imaging device device may not be sufficiently miniaturized.
本發明之目的在於提供一種可謀求固體攝像元件裝置之小型化之紅外線吸收玻璃板及該紅外線吸收玻璃板之製造方法、以及固體攝像元件裝置。 An object of the present invention is to provide an infrared-absorbing glass plate capable of downsizing a solid-state imaging device, a method of manufacturing the infrared-absorbing glass plate, and a solid-state imaging device.
本發明之紅外線吸收玻璃板之特徵在於:其係具有相互對向之第1及第2主面、以及將上述第1及第2主面連結之側面者,且係由以陽離子%計含有P5+ 10~70%、Al3+ 7~50%、Cu2+ 0.1~15%及以陰離子%計含有F- 10~90%、O2- 10~90%之氟磷酸鹽系玻璃所構成,厚度為0.2mm以下,於上述側面不存在微裂。
The infrared-absorbing glass plate of the present invention is characterized in that it has first and second main surfaces facing each other, and a side surface connecting the first and second main surfaces, and contains P in terms of cation %. 5+ 10~70%, Al 3+ 7~50%, Cu 2+ 0.1~15%, and fluorophosphate
於藉由物理研磨將紅外線吸收玻璃板之厚度減薄之先前之方法中,若為了將玻璃板之厚度減薄至0.2mm以下而將載體之厚度減薄,則有載體產生破裂之情況。又,即便於可將玻璃板之厚度減薄之情形時,亦於自載體取出時玻璃板產生破裂。又,即便製作面積較大之玻璃板,亦於切斷時產生破裂。 In the conventional method of reducing the thickness of the infrared-absorbing glass plate by physical grinding, if the thickness of the carrier is reduced to reduce the thickness of the glass plate to 0.2 mm or less, the carrier may be broken. Also, even when the thickness of the glass plate can be reduced, the glass plate is cracked when taken out from the carrier. In addition, even if a glass plate with a large area is produced, it will be broken when cut.
針對此種問題,本發明者等發現:若使藉由物理研磨將厚度以某種程度減薄之氟磷酸鹽系玻璃母材浸漬於鹼性洗劑中,則可獲得厚度為0.2mm以下且不易產生破裂之玻璃板。關於該原因,可認為如下。 In view of such a problem, the present inventors have found that if the fluorophosphate-based glass base material whose thickness has been reduced to some extent by physical polishing is immersed in an alkaline detergent, a thickness of 0.2 mm or less and A glass plate that is not prone to breakage. The reason for this is considered as follows.
氟磷酸鹽系玻璃通常耐鹼性較高,但本發明之氟磷酸鹽系玻璃含有7陽離子%以上之降低耐鹼性之Al3+,故而耐鹼性較低。因此,認為於藉由鹼性洗劑進行之蝕刻步驟中,玻璃母材之微裂熔融,而於所獲得之紅外線吸收玻璃板之側面不存在微裂。認為藉由微裂消失而紅外線吸收玻璃板之破裂起點消失,故而紅外線吸收玻璃板之強度提高,即便厚度較薄亦不易破裂。 Fluorophosphate-based glass usually has high alkali resistance, but the fluorophosphate-based glass of the present invention contains more than 7 cations of Al 3+ which lowers the alkali resistance, so the alkali resistance is relatively low. Therefore, it is considered that the microcracks of the glass base material were melted in the etching step by the alkaline detergent, and no microcracks existed on the side surface of the obtained infrared-absorbing glass plate. It is believed that the origin of cracking of the infrared-absorbing glass plate disappears due to the disappearance of microcracks, so that the strength of the infrared-absorbing glass plate increases, and it is difficult to break even if the thickness is thin.
本發明之紅外線吸收玻璃板較佳為於上述第1及第2主面不存在研磨痕跡。 In the infrared-absorbing glass plate of the present invention, it is preferable that there are no grinding marks on the first and second main surfaces.
本發明之紅外線吸收玻璃板較佳為上述第1及第2主面之面積為100mm2以上且25000mm2以下。 In the infrared-absorbing glass plate of the present invention, it is preferable that the areas of the above-mentioned first and second main surfaces are not less than 100 mm 2 and not more than 25000 mm 2 .
本發明之紅外線吸收玻璃板較佳為支點間距離2.5mm時之三點撓曲強度為35N/mm2以上。 The infrared-absorbing glass plate of the present invention preferably has a three-point flexural strength of 35 N/mm 2 or more when the distance between fulcrums is 2.5 mm.
本發明之紅外線吸收玻璃板較佳為上述第1及第2主面之面積為1mm2以上且未達1000mm2。 In the infrared-absorbing glass plate of the present invention, it is preferable that the areas of the first and second main surfaces are 1 mm 2 or more and less than 1000 mm 2 .
本發明之紅外線吸收玻璃板較佳為用於固體攝像元件裝置。 The infrared-absorbing glass plate of the present invention is preferably used for a solid-state imaging device.
本發明之紅外線吸收玻璃板之陣列具備:支持體、及以矩陣狀配置於上述支持體上之複數個上述本發明之紅外線吸收玻璃板。 The array of infrared-absorbing glass plates of the present invention includes: a support, and a plurality of the above-mentioned infrared-absorbing glass plates of the present invention arranged in a matrix on the support.
本發明之紅外線吸收玻璃板之製造方法具備:研磨步驟,其係對板狀之玻璃母材進行物理研磨,其中玻璃母材係由以陽離子%計含有P5+ 10~70%、Al3+ 7~50%、Cu2+ 0.1~15%及以陰離子%計含有F- 10~90%、O2- 10~90%之氟磷酸鹽系玻璃所構成;及蝕刻步驟,其係將經上述物理研磨之玻璃母材浸漬於鹼性洗劑中而進行蝕刻。
The manufacturing method of the infrared-absorbing glass plate of the present invention includes: a grinding step, which is to physically grind the plate-shaped glass base material, wherein the glass base material contains 10-70% of P 5+ and Al 3+ in terms of cation % 7~50%, Cu 2+ 0.1~15%, and fluorophosphate
本發明之紅外線吸收玻璃板之製造方法較佳為於上述研磨步驟中,藉由上述物理研磨而將上述玻璃母材之厚度調整為超過0.2mm且0.3mm以下。 In the manufacturing method of the infrared-absorbing glass plate of the present invention, it is preferable that in the grinding step, the thickness of the glass base material is adjusted to be more than 0.2 mm and not more than 0.3 mm by the physical grinding.
本發明之紅外線吸收玻璃板之製造方法較佳為於上述蝕刻步驟中,藉由將經上述物理研磨之玻璃母材浸漬於pH值為7.1以上之鹼性洗劑中而進行蝕刻。 In the method of manufacturing an infrared-absorbing glass plate of the present invention, etching is preferably carried out by immersing the above-mentioned physically ground glass base material in an alkaline detergent with a pH value of 7.1 or higher in the above-mentioned etching step.
上述鹼性洗劑較佳為含有胺基多羧酸之鹼性鹽。 The above-mentioned alkaline detergent is preferably an alkaline salt containing amino polycarboxylic acid.
本發明之固體攝像元件裝置具備依據本發明而構成之紅外線吸收玻璃板。 The solid-state imaging device device of the present invention includes an infrared-absorbing glass plate constructed according to the present invention.
根據本發明,可提供一種可謀求固體攝像元件裝置之小型化之紅外線吸收玻璃板。 According to the present invention, it is possible to provide an infrared-absorbing glass plate capable of downsizing a solid-state imaging device.
1:紅外線吸收玻璃板 1: Infrared absorbing glass plate
1a、1b:第1、第2主面 1a, 1b: the first and second main surfaces
1c:側面 1c: side
2:防反射膜 2: Anti-reflection film
3:紅外線反射膜 3: Infrared reflective film
10:固體攝像元件裝置 10: Solid-state imaging device
11:固體攝像元件 11: Solid-state imaging element
12:封裝體 12: Encapsulation
13:接著劑層 13: Adhesive layer
21:母玻璃板 21: Mother glass plate
21a、21b:第1、第2主面 21a, 21b: the first and second main surfaces
22、23:光學膜 22, 23: Optical film
30:支持體 30: support body
31:紅外線吸收玻璃板 31: Infrared absorbing glass plate
40:紅外線吸收玻璃板之陣列 40: Array of infrared absorbing glass plates
A:切割線 A: cutting line
圖1係表示本發明之紅外線吸收玻璃板的模式性立體圖。 Fig. 1 is a schematic perspective view showing an infrared-absorbing glass plate of the present invention.
圖2係表示本發明之紅外線吸收玻璃板之變化例的模式性剖面圖。 Fig. 2 is a schematic cross-sectional view showing a modified example of the infrared-absorbing glass plate of the present invention.
圖3係表示使用本發明之紅外線吸收玻璃板之固體攝像元件裝置的模式性剖面圖。 Fig. 3 is a schematic cross-sectional view showing a solid-state imaging device using the infrared-absorbing glass plate of the present invention.
圖4係用以說明本發明之紅外線吸收玻璃板之陣列之製造步驟的模式性剖面圖。 Fig. 4 is a schematic cross-sectional view for explaining the manufacturing steps of the array of infrared-absorbing glass plates of the present invention.
圖5係用以說明本發明之紅外線吸收玻璃板之陣列之製造步驟的模式性俯視圖。 Fig. 5 is a schematic plan view for explaining the manufacturing steps of the array of infrared-absorbing glass plates of the present invention.
圖6係表示本發明之紅外線吸收玻璃板之陣列的模式性俯視圖。 Fig. 6 is a schematic plan view showing an array of infrared-absorbing glass plates of the present invention.
以下,對較佳之實施形態進行說明。然而,以下之實施形態僅為例示,本發明並不限定於以下之實施形態。又,於各圖式中,具有實質上相同之功能之構件有以相同之符號進行參照之情形。 A preferred embodiment will be described below. However, the following embodiments are merely examples, and the present invention is not limited to the following embodiments. In addition, in each drawing, members having substantially the same functions may be referred to by the same symbols.
圖1係表示本發明之紅外線吸收玻璃板的模式性立體圖。如圖1所 示,紅外線吸收玻璃板1之平面形狀為矩形。紅外線吸收玻璃板1之角部亦可經倒角。 Fig. 1 is a schematic perspective view showing an infrared-absorbing glass plate of the present invention. As shown in Figure 1 As shown, the planar shape of the infrared-absorbing glass plate 1 is a rectangle. The corners of the infrared-absorbing glass plate 1 may also be chamfered.
紅外線吸收玻璃板1具有第1及第2主面1a、1b及側面1c。第1及第2主面1a、1b相互對向。於紅外線吸收玻璃板1中,第1及第2主面1a、1b均為光學面。側面1c將第1及第2主面1a、1b連結。
The infrared absorbing glass plate 1 has first and second
紅外線吸收玻璃板1係由含有CuO之氟磷酸鹽系玻璃構成。因此,紅外線吸收玻璃板1之紅外線吸收功能優異。 The infrared-absorbing glass plate 1 is made of CuO-containing fluorophosphate-based glass. Therefore, the infrared absorption function of the infrared absorption glass plate 1 is excellent.
紅外線吸收玻璃板1之厚度為0.2mm以下。較佳為0.19mm以下,更佳為0.16mm以下。紅外線吸收玻璃板1由於厚度薄至0.2mm以下,故而於用於固體攝像元件裝置時,可謀求固體攝像元件裝置之小型化。再者,若厚度過薄,則有於搬送步驟中抬升紅外線吸收玻璃板1時容易產生破裂之情形,故而厚度較佳為0.05mm以上,更佳為0.08mm以上。 The thickness of the infrared-absorbing glass plate 1 is 0.2 mm or less. Preferably it is 0.19 mm or less, more preferably 0.16 mm or less. Since the infrared-absorbing glass plate 1 is as thin as 0.2 mm or less, when used in a solid-state imaging device, the size of the solid-state imaging device can be reduced. Furthermore, if the thickness is too thin, cracks may easily occur when the infrared-absorbing glass plate 1 is lifted during the conveying step, so the thickness is preferably at least 0.05 mm, more preferably at least 0.08 mm.
如此,紅外線吸收玻璃板1之紅外線吸收功能優異,且可謀求固體攝像元件裝置之小型化,故而可較佳地用於固體攝像元件裝置。 In this way, the infrared-absorbing glass plate 1 is excellent in the infrared-absorbing function, and since the solid-state imaging device can be downsized, it can be suitably used for the solid-state imaging device.
通常,氟磷酸鹽系玻璃係強度較低,若減薄則容易破裂,但於本發明中,於紅外線吸收玻璃板1之側面1c不存在微裂,故而即便將厚度設為0.2mm以下亦不易產生破裂。所謂微裂,係指長度為1~15μm之裂痕。微裂有於將紅外線吸收玻璃板1彎曲時成為破裂之起點之情況。尤其於在側
面1c存在微裂之情形時,容易成為破裂之起點。因此,於在側面1c不存在微裂之情形時,可不易產生紅外線吸收玻璃板1之破裂。再者,微裂之有無可藉由光學顯微鏡進行確認。
Generally, fluorophosphate-based glass has low strength and is easily broken if it is thinned. However, in the present invention, there are no microcracks on the
又,不僅是側面1c,於在第1及第2主面1a、1b存在微裂之情形時,亦有成為破裂之起點之情況。因此,就更不易產生紅外線吸收玻璃板1之破裂之觀點而言,更佳為除側面1c以外,於第1及第2主面1a、1b亦不存在微裂。
In addition, not only the
又,較佳為於紅外線吸收玻璃板1之第1及第2主面1a、1b,不存在製造時之研磨痕跡。於該情形時,可更不易產生紅外線吸收玻璃板1之破裂。就更不易產生紅外線吸收玻璃板1之破裂之觀點而言,更佳為除第1及第2主面1a、1b以外,於側面1c亦不存在研磨痕跡。再者,研磨痕跡可藉由原子力顯微鏡進行確認。
In addition, it is preferable that the first and second
紅外線吸收玻璃板1之支點間距離2.5mm時之三點撓曲強度較佳為35N/mm2以上,更佳為50N/mm2以上。於三點撓曲強度為上述下限以上之情形時,可更不易產生紅外線吸收玻璃板1之破裂。再者,紅外線吸收玻璃板1之三點撓曲強度之上限並無特別限制,就材料之性質而言,為450N/mm2左右。 The three-point flexural strength when the distance between the fulcrums of the infrared-absorbing glass plate 1 is 2.5 mm is preferably at least 35 N/mm 2 , more preferably at least 50 N/mm 2 . When the three-point flexural strength is more than the above lower limit, the infrared-absorbing glass plate 1 is less likely to be broken. Furthermore, the upper limit of the three-point flexural strength of the infrared-absorbing glass plate 1 is not particularly limited, but it is about 450 N/mm 2 in terms of the nature of the material.
以下,對構成紅外線吸收玻璃板1之材料更詳細地說明。 Hereinafter, materials constituting the infrared-absorbing glass plate 1 will be described in more detail.
材料之詳細情況: Details of materials:
紅外線吸收玻璃1以陽離子%計含有P5+ 10~70%、Al3+ 7~50%、Cu2+ 0.1~15%。以下,說明如上所述般限定玻璃組成之原因。 Infrared-absorbing glass 1 contains 10-70% of P 5+ , 7-50% of Al 3+ , and 0.1-15% of Cu 2+ in terms of cation %. Hereinafter, the reasons for limiting the glass composition as described above will be described.
P5+係用以形成玻璃骨架之成分。P5+之含量較佳為10~70%,更佳為18~63%,尤佳為25~55%。若P5+之含量過少,則有玻璃化變得不穩定之傾向。另一方面,若P5+之含量過多,則有耐失透性降低之傾向。 P 5+ is a component used to form a glass skeleton. The content of P 5+ is preferably 10-70%, more preferably 18-63%, and most preferably 25-55%. If the content of P 5+ is too small, vitrification tends to become unstable. On the other hand, when the content of P 5+ is too high, the devitrification resistance tends to decrease.
Al3+係降低耐鹼性之成分。Al3+之含量較佳為7~50%,更佳為7~31%,尤佳為7~16%。若Al3+之含量過少,則耐鹼性提高而難以利用鹼性洗劑進行蝕刻,故而難以將紅外線吸收玻璃板減薄。又,側面之微裂難以消失,故而紅外線吸收玻璃板之強度減弱而容易破裂。另一方面,若Al3+之含量過多,則有熔融性降低而熔融溫度上升之傾向。再者,若熔融溫度上升,則Cu離子容易被還原而由Cu2+轉變為Cu+,故而難以獲得所需之光學特性。具體而言,近紫外線~可見光區域內之透光率降低,或近紅外線吸收特性容易降低。 Al 3+ is a component that reduces alkali resistance. The content of Al 3+ is preferably 7-50%, more preferably 7-31%, and most preferably 7-16%. If the content of Al 3+ is too small, the alkali resistance is improved and it is difficult to etch with an alkaline detergent, so it is difficult to reduce the thickness of the infrared-absorbing glass plate. In addition, since microcracks on the side are difficult to disappear, the strength of the infrared-absorbing glass plate is weakened and easily broken. On the other hand, if the content of Al 3+ is too high, the meltability tends to decrease and the melting temperature tends to rise. Furthermore, if the melting temperature rises, Cu ions are easily reduced and converted from Cu 2+ to Cu + , so it is difficult to obtain desired optical properties. Specifically, the light transmittance in the near-ultraviolet to visible region decreases, or the near-infrared absorption property tends to decrease.
Cu2+係用以吸收近紅外線之成分。Cu2+之含量較佳為0.1~15%,更佳為2~13%,尤佳為4~10%。若Cu2+之含量過少,則難以獲得上述效果。另一方面,若Cu2+之含量過多,則紫外線~可見光區域之透光率容易降低。又,有耐失透性降低之傾向。 Cu 2+ is a component used to absorb near-infrared rays. The content of Cu 2+ is preferably 0.1-15%, more preferably 2-13%, and most preferably 4-10%. If the content of Cu 2+ is too small, it is difficult to obtain the above effects. On the other hand, if the content of Cu 2+ is too high, the light transmittance in the ultraviolet to visible light region is likely to decrease. Moreover, there exists a tendency for devitrification resistance to fall.
除上述成分以外,亦可含有以下所示之各種成分。 In addition to the above-mentioned components, various components shown below may be contained.
Li+係降低熔融溫度之成分。Li+之含量較佳為0~30%,尤佳為0.1~25%。若Li+之含量過多,則有耐失透性降低之傾向。 Li + is a component that lowers the melting temperature. The content of Li + is preferably 0-30%, especially 0.1-25%. When the content of Li + is too large, the devitrification resistance tends to decrease.
Na+係與Li+同樣地降低熔融溫度之成分。Na+之含量較佳為0~30%,尤佳為0.1~20%。若Na+之含量過多,則有耐失透性降低之傾向。 Na + is a component that lowers the melting temperature similarly to Li + . The content of Na + is preferably 0-30%, particularly preferably 0.1-20%. When the content of Na + is too large, the devitrification resistance tends to decrease.
K+亦係與Li+同樣地降低熔融溫度之成分。K+之含量較佳為0~30%,尤佳為0.1~20%。若K+之含量過多,則有耐失透性降低之傾向。 K + is also a component that lowers the melting temperature similarly to Li + . The content of K + is preferably 0-30%, especially 0.1-20%. When the content of K + is too high, the devitrification resistance tends to decrease.
Mg2+係提高耐失透性之成分。Mg2+之含量較佳為0~20%,尤佳為0.1~11%。若Mg2+之含量過多,則玻璃化之穩定性容易降低。 Mg 2+ is a component that improves devitrification resistance. The content of Mg 2+ is preferably 0-20%, especially 0.1-11%. If the content of Mg 2+ is too high, the stability of vitrification is likely to decrease.
Ca2+係與Mg2+同樣地提高耐失透性之成分。Ca2+之含量較佳為0~12%,尤佳為0.1~10%。若Ca2+之含量過多,則玻璃化之穩定性容易降低。 Ca 2+ is a component that improves devitrification resistance similarly to Mg 2+ . The content of Ca 2+ is preferably 0-12%, especially 0.1-10%. If the content of Ca 2+ is too high, the stability of vitrification is likely to decrease.
Sr2+亦係與Mg2+同樣地提高耐失透性之成分。Sr2+之含量較佳為0~20%,尤佳為0.1~10%。若Sr2+之含量過多,則玻璃化之穩定性容易降低。 Sr 2+ is also a component that improves devitrification resistance similarly to Mg 2+ . The content of Sr 2+ is preferably 0-20%, especially 0.1-10%. If the content of Sr 2+ is too high, the stability of vitrification is likely to decrease.
Ba2+亦係與Mg2+同樣地提高耐失透性之成分。Ba2+之含量較佳為0~13%,尤佳為0.1~11%。若Ba2+之含量過多,則玻璃化之穩定性容易降 低。 Ba 2+ is also a component that improves devitrification resistance similarly to Mg 2+ . The content of Ba 2+ is preferably 0-13%, particularly preferably 0.1-11%. If the content of Ba 2+ is too high, the stability of vitrification is likely to decrease.
Zn2+亦係與Mg2+同樣地提高耐失透性之成分。Zn2+之含量較佳為0~10%,尤佳為0.1~5%。若Zn2+之含量過多,則玻璃化之穩定性容易降低。 Zn 2+ is also a component that improves devitrification resistance similarly to Mg 2+ . The content of Zn 2+ is preferably 0-10%, especially 0.1-5%. If the content of Zn 2+ is too high, the stability of vitrification is likely to decrease.
此外,於本發明之光學玻璃中,亦可於無損本發明之效果之範圍內含有Bi3+、La3+、Y3+、Gd3+、Te4+、Si4+、Ta5+、Nb5+、Ti4+、Zr4+或Sb3+等作為陽離子成分。具體而言,該等成分之含量分別較佳為0~3%,更佳為0~1%。 In addition, in the optical glass of the present invention, Bi 3+ , La 3+ , Y 3+ , Gd 3+ , Te 4+ , Si 4+ , Ta 5+ , Nb 5+ , Ti 4+ , Zr 4+ , or Sb 3+ are used as cationic components. Specifically, the contents of these ingredients are preferably 0-3%, more preferably 0-1%.
Pb成分(Pb2+等)及As成分(As3+等)為環境負荷物質,故而於本發明中較佳為實質上不含有。此處,所謂「實質上不含有」,意指不將該等成分刻意地添加至玻璃中,並非意指將不可避免之雜質完全排除。更客觀而言,意指包含雜質之該等成分之含量未達0.1%。 Since Pb components (Pb 2+ etc.) and As components (As 3+ etc.) are environmental load substances, it is preferable not to contain substantially in this invention. Here, the term "substantially not containing" means that these components are not intentionally added to the glass, and does not mean that inevitable impurities are completely excluded. More objectively, it means that the content of these ingredients including impurities does not reach 0.1%.
作為陰離子成分之組成,較佳為含有F- 10~90%、及O2- 10~90%,尤佳為含有F- 10~70%、及O2- 30~90%。若F-之含量過少(O2-之含量過多),則有耐失透性降低之傾向。另一方面,若F-之含量過多(O2-之含量過少),則玻璃化之穩定性容易降低。 The composition of the anion component preferably contains F - 10-90%, and O 2- 10-90%, and more preferably contains F - 10-70%, and O 2- 30-90%. If the F - content is too small (the O 2 - content is too high), the devitrification resistance tends to decrease. On the other hand, if the content of F - is too much (the content of O 2- is too small), the stability of vitrification is likely to decrease.
藉由具有上述組成,可達成可見光區域內之更高之透光率與紅外線區域內之更優異之光吸收特性兩者。具體而言,波長500nm下之透光率 較佳為75%以上,更佳為77%以上。另一方面,波長700nm下之透光率較佳為27%以下,更佳為25%以下,波長1200nm下之透光率較佳為38%以下,更佳為36%以下。 By having the above composition, both higher light transmittance in the visible light region and more excellent light absorption characteristics in the infrared region can be achieved. Specifically, the light transmittance at a wavelength of 500nm Preferably it is 75% or more, more preferably 77% or more. On the other hand, the light transmittance at a wavelength of 700nm is preferably not more than 27%, more preferably not more than 25%, and the light transmittance at a wavelength of 1200nm is preferably not more than 38%, more preferably not more than 36%.
變化例: Variation example:
圖2係表示本發明之紅外線吸收玻璃板之變化例之模式性剖面圖。 Fig. 2 is a schematic cross-sectional view showing a modified example of the infrared-absorbing glass plate of the present invention.
於圖2所示之變化例中,於紅外線吸收玻璃板1之第1主面1a上,設有防反射膜2。又,於紅外線吸收玻璃板1之第2主面1b上,設有紅外線反射膜3。
In the modified example shown in FIG. 2 , an antireflection film 2 is provided on the first
防反射膜2係具有降低反射率之功能之膜。關於防反射膜2,只要為與未設有防反射膜2時相比而設有防反射膜2時之反射率降低之膜即可,並非必須為反射率成為零之膜。並且,於本發明中,亦可不設置防反射膜2。 The anti-reflection film 2 is a film having a function of reducing reflectance. The antireflection film 2 may be a film whose reflectance is lowered when the antireflection film 2 is provided compared to the case where the antireflection film 2 is not provided, and is not necessarily a film whose reflectance becomes zero. Furthermore, in the present invention, the antireflection film 2 may not be provided.
防反射膜2例如可由將折射率相對較地之低折射率膜、與折射率相對較高之高折射率膜交替積層而成之介電多層膜所構成。上述介電多層膜之積層數並無特別限定,通常為3~5層左右。再者,防反射膜2亦可由折射率低於紅外線吸收玻璃板1之低折射率膜所構成。 The antireflection film 2 can be composed of, for example, a dielectric multilayer film in which a low-refractive-index film with a relatively relatively high refractive index and a high-refractive-index film with a relatively high refractive index are laminated alternately. The number of laminated layers of the above-mentioned dielectric multilayer film is not particularly limited, and is usually about 3 to 5 layers. Furthermore, the anti-reflection film 2 can also be made of a low-refractive-index film whose refractive index is lower than that of the infrared-absorbing glass plate 1 .
紅外線反射膜3係具有反射紅外線之功能之膜。紅外線反射膜3例如可由SiO2、Nb2O5或TiO2等構成。
The infrared
於本變化例中,只要以於光入射側成為防反射膜2、於光出射側成為紅外線反射膜3之方式將紅外線吸收玻璃板1設置於固體攝像元件裝置等中,則可使可見光充分地穿透,並且可有效率地截止紅外線。並且,由於紅外線吸收玻璃板1之厚度較薄,故而於用於固體攝像元件裝置中時,可謀求固體攝像元件裝置之小型化。
In this variation example, if the infrared-absorbing glass plate 1 is installed in a solid-state imaging device or the like so that the light-incident side becomes the anti-reflection film 2 and the light-emitting side becomes the
以下,對本發明之紅外線吸收玻璃板之製造方法進行說明。 Hereinafter, the manufacturing method of the infrared-absorbing glass plate of this invention is demonstrated.
首先,使以成為所需組成之方式製備之氟磷酸鹽系玻璃之原料粉末批料熔融,成形為板狀,藉此獲得玻璃母材。 First, a raw material powder batch of fluorophosphate glass prepared so as to have a desired composition is melted and formed into a plate shape to obtain a glass base material.
熔融溫度較佳為700~900℃,更佳為700~850℃。若熔融溫度過低,則有難以獲得均質之玻璃之情形。另一方面,若熔融溫度過高,則有Cu離子被還原而容易由Cu2+轉變為Cu+之情況,有難以獲得所需之光學特性之情形。 The melting temperature is preferably from 700 to 900°C, more preferably from 700 to 850°C. If the melting temperature is too low, it may be difficult to obtain homogeneous glass. On the other hand, if the melting temperature is too high, Cu ions may be reduced to easily convert from Cu 2+ to Cu + , and it may be difficult to obtain desired optical properties.
再者,作為成形方法,並無特別限定,例如可使用鑄漿法、輾平法、下拉法、或再拉法等成形方法。 In addition, it does not specifically limit as a forming method, For example, a forming method such as a slip casting method, a flattening method, a down-draw method, or a re-draw method can be used.
繼而,藉由物理研磨對以如上方式準備之板狀之玻璃母材進行研磨(研磨步驟)。於研磨步驟中,較佳為藉由物理研磨而將玻璃母材之厚度調 整為超過0.2mm且0.3mm以下。若藉由物理研磨將玻璃母材之厚度過於減薄,則有玻璃母材破裂之情況。又,若玻璃母材之厚度過厚,則有於下述蝕刻步驟中無法將玻璃板之厚度充分減薄之情況。 Next, the plate-shaped glass base material prepared in the above manner is ground by physical grinding (grinding step). In the grinding step, it is preferable to adjust the thickness of the glass base material by physical grinding. The whole is more than 0.2mm and less than 0.3mm. If the thickness of the glass base material is too thin by physical grinding, the glass base material may be broken. In addition, if the thickness of the glass base material is too thick, the thickness of the glass plate may not be sufficiently reduced in the following etching step.
於研磨步驟中,例如藉由拋光研磨將玻璃母材研磨至0.3mm左右之厚度,繼而藉由光學研磨而研磨至超過0.2mm且0.3mm以下之厚度,藉此可獲得經物理研磨之玻璃母材。 In the grinding step, for example, the glass base material is ground to a thickness of about 0.3 mm by polishing and grinding, and then ground to a thickness of more than 0.2 mm and less than 0.3 mm by optical grinding, thereby obtaining a physically ground glass mother material.
繼而,藉由將經物理研磨之玻璃母材以垂直豎立之狀態浸漬於鹼性洗劑中而進行蝕刻(蝕刻步驟)。藉此,可獲得厚度為0.2mm以下之本發明之紅外線吸收玻璃板。 Next, etching was performed by immersing the physically ground glass base material in an alkaline detergent in a vertically erected state (etching step). Thereby, the infrared-absorbing glass plate of this invention with a thickness of 0.2 mm or less can be obtained.
如此,於本發明之紅外線吸收玻璃板之製造方法中,可容易地製造先前難以獲得之厚度為0.2mm以下之紅外線吸收玻璃板。 In this manner, in the method for producing an infrared-absorbing glass plate of the present invention, an infrared-absorbing glass plate having a thickness of 0.2 mm or less, which has been difficult to obtain until now, can be easily produced.
作為鹼性洗劑,並無特別限定,例如可使用:Na、K等鹼性成分,或三乙醇胺、苄醇或乙二醇等界面活性劑,或含有水或醇等之鹼性洗劑。 The alkaline detergent is not particularly limited, and for example, alkaline components such as Na and K, surfactants such as triethanolamine, benzyl alcohol, or ethylene glycol, or alkaline detergents containing water or alcohol can be used.
作為鹼性洗劑中所含之鹼性成分,較佳為含有胺基多羧酸等螯合劑之鹼性鹽。作為胺基多羧酸之鹼性鹽,可列舉:二乙三胺五乙酸、乙二胺四乙酸、三乙四胺六乙酸、次氮基三乙酸等之鈉鹽及鉀鹽。該等中,可較佳地使用二乙三胺五乙酸五鈉、乙二胺四乙酸四鈉、三乙四胺六乙酸六鈉、次氮基三乙酸三鈉,可尤佳地使用二乙三胺五乙酸五鈉。 As the alkaline component contained in the alkaline detergent, an alkaline salt containing a chelating agent such as amino polycarboxylic acid is preferable. Examples of the basic salt of aminopolycarboxylic acid include sodium salts and potassium salts of diethylenetriaminepentaacetic acid, ethylenediaminetetraacetic acid, triethylenetetraminehexaacetic acid, and nitrilotriacetic acid. Among them, pentasodium diethylenetriaminepentaacetate, tetrasodium ethylenediaminetetraacetate, hexasodium triethylenetetraminehexaacetate, trisodium nitrilotriacetate can be preferably used, and diethyl Pentasodium triaminepentaacetate.
鹼性洗劑中之浸漬溫度並無特別限定,例如可設為20~40℃。 The immersion temperature in the alkaline detergent is not particularly limited, for example, it can be set at 20-40°C.
鹼性洗劑中之浸漬時間並無特別限定,例如可設為1~30小時。再者,經物理研磨之玻璃母材較理想為以垂直豎立之狀態浸漬於鹼性洗劑中1~30小時後,上下反轉並浸漬相同時間。於該情形時,可獲得厚度分佈更均勻之紅外線吸收玻璃板。 The immersion time in the alkaline detergent is not particularly limited, and may be, for example, 1 to 30 hours. Furthermore, it is ideal for the physically ground glass base material to be immersed in alkaline detergent for 1 to 30 hours in a vertical standing state, then reversed upside down and immersed for the same time. In this case, an infrared-absorbing glass plate with a more uniform thickness distribution can be obtained.
就更不易存在微裂,更不易產生所獲得之紅外線吸收玻璃板之破裂之觀點而言,上述鹼性洗劑之pH值較佳為7.1以上,更佳為8.0以上。 From the standpoint of being less likely to have microcracks and less prone to breakage of the obtained infrared-absorbing glass plate, the pH of the alkaline lotion is preferably 7.1 or higher, more preferably 8.0 or higher.
又,上述方法中所獲得之紅外線吸收玻璃板難以產生破裂,故而可增大第1及第2主面之面積。例如,第1及第2主面之面積可設為100mm2以上且25000mm2以下。第1及第2主面之面積之更佳範圍為400mm2以上且25000mm2以下,更佳為1000mm2以上且25000mm2以下,進而較佳為2500mm2以上且25000mm2以下,尤佳為5000mm2以上且25000mm2以下。對於第1及第2主面之面積較大之紅外線吸收玻璃板而言,由於亦不易產生破裂,故而可切斷為所需之大小而使用。於該情形時,可進一步高效率地製造紅外線吸收玻璃板。再者,切斷後之第1及第2主面之面積較佳為1mm2以上且未達1000mm2。 In addition, since the infrared-absorbing glass plate obtained by the above method is less likely to be cracked, the areas of the first and second main surfaces can be increased. For example, the areas of the first and second principal surfaces can be set to be not less than 100 mm 2 and not more than 25000 mm 2 . The area of the first and second main surfaces is more preferably in the range of 400 mm 2 to 25000 mm 2 , more preferably 1000 mm 2 to 25000 mm 2 , further preferably 2500 mm 2 to 25000 mm 2 , most preferably 5000 mm 2 Above and below 25000mm2 . Infrared-absorbing glass plates with relatively large first and second main surfaces are also less likely to be cracked, so they can be cut into desired sizes for use. In this case, an infrared-absorbing glass plate can be manufactured more efficiently. Furthermore, the areas of the first and second main surfaces after cutting are preferably not less than 1 mm 2 and less than 1000 mm 2 .
圖3係表示使用本發明之紅外線吸收玻璃板之固體攝像元件裝置的模
式性剖面圖。如圖3所示般,固體攝像元件裝置10具備紅外線吸收玻璃板1、固體攝像元件11、封裝體12及接著劑層13。
Fig. 3 is a schematic diagram showing a solid-state imaging device using an infrared-absorbing glass plate of the present invention.
Formal cross-section. As shown in FIG. 3 , the solid-
封裝體12係由陶瓷構成。於封裝體12之內部收納有固體攝像元件11。又,於封裝體12之開口部設有紅外線吸收玻璃板1。再者,封裝體12與紅外線吸收玻璃板1係藉由接著劑層13而接合。接著劑層13可由適當之紫外線硬化型樹脂、或熱硬化性樹脂而構成。
The
固體攝像元件裝置10係於固體攝像元件11之光入射側設有紅外線吸收玻璃板1,故而可充分吸收紅外線區域之光並使光入射至固體攝像元件11。又,如上所述般構成固體攝像元件裝置10之紅外線吸收玻璃板1之厚度薄至0.2mm以下,故而固體攝像元件裝置10可實現小型化。再者,作為紅外線吸收玻璃板1,亦可採用圖2所示之設有防反射膜、紅外線反射膜之紅外線吸收玻璃板。
The solid-
圖4係用以說明本發明之紅外線吸收玻璃板之陣列之製造步驟的模式性剖面圖。又,圖5係用以說明本發明之紅外線吸收玻璃板之陣列之製造步驟的模式性俯視圖。用於智慧型手機之相機等中之紅外線吸收玻璃板通常為較小之尺寸。因此,亦可製作包含可採取複數個玻璃板之尺寸之紅外線吸收玻璃之母玻璃板,並藉由切割等將其進行分割,製造經單片化之紅外線吸收玻璃板之陣列,並各紅外線吸收玻璃板自陣列取出而使用。以下,對紅外線吸收玻璃板之陣列之製造方法進行說明。 Fig. 4 is a schematic cross-sectional view for explaining the manufacturing steps of the array of infrared-absorbing glass plates of the present invention. 5 is a schematic plan view for explaining the manufacturing steps of the array of infrared-absorbing glass plates of the present invention. Infrared-absorbing glass plates used in cameras and the like for smartphones are generally of smaller size. Therefore, it is also possible to manufacture a mother glass plate including infrared-absorbing glass of a size that can take a plurality of glass plates, and divide it by cutting or the like to manufacture an array of individualized infrared-absorbing glass plates, and each infrared-absorbing The glass plate was removed from the array for use. Hereinafter, a method of manufacturing an array of infrared-absorbing glass plates will be described.
首先,作為玻璃母材,準備包含經鹼性洗淨之紅外線吸收玻璃之母玻璃板21。於母玻璃板21之第1主面21a及第2主面21b之上,亦可視需要而設置防反射膜或紅外線反射膜等光學膜22及23。
First, as a glass base material, a
使設有光學膜22及23之母玻璃板21接著於支持體30上。作為支持體30,例如可使用藉由紫外線照射而接著強度降低之UV(Ultraviolet,紫外線)型。
The
繼而,利用晶圓切割機等將支持體30上之母玻璃板21沿著切割線A切斷,分割為以矩陣狀配置之複數個紅外線吸收玻璃板31。
Next, the
繼而,將接著於支持體30之經單片化之複數個紅外線吸收玻璃板31與支持體30一同浸漬於上述鹼性洗劑中,對紅外線吸收玻璃板31之側面進行蝕刻。繼而,可將因切割而於側面產生之微裂等去除。因此,可製成不易產生破裂之紅外線吸收玻璃板31。
Next, the plurality of infrared-absorbing
再者,亦可藉由雷射照射而將母玻璃板21切斷。於藉由雷射照射進行切斷之情形時,於切斷面不易產生微裂等,故而亦可省略蝕刻步驟。
Furthermore, the
圖6係表示以如上之方式製作之本發明之紅外線吸收玻璃板之陣列的模式性俯視圖。本實施形態之紅外線吸收玻璃板之陣列40具備支持體30、及以矩陣狀配置於支持體30上之複數個紅外線吸收玻璃板31。再
者,於使用UV帶作為支持體30之情形時,可藉由照射紫外線而降低接著強度,將紅外線吸收玻璃板31容易地自支持體30取下。
Fig. 6 is a schematic plan view showing an array of infrared-absorbing glass plates of the present invention produced as described above. The
以下,基於實施例說明本發明。再者,本發明並不限定於以下之實施例。 Hereinafter, the present invention will be described based on examples. Furthermore, the present invention is not limited to the following examples.
表1係表示本發明之實施例(試樣No.1~10)及比較例(試樣No.11)。 Table 1 shows the examples (sample No.1-10) and comparative example (sample No.11) of the present invention.
將以成為表1所示之玻璃組成之方式製備之原料粉末批料於溫度700~850℃下熔融,藉由碾平法而成形為板狀,獲得板狀之玻璃母材。 The raw material powder batch prepared in such a way as to become the glass composition shown in Table 1 was melted at a temperature of 700~850°C, and formed into a plate by a flattening method to obtain a plate-shaped glass base material.
使用切片機將所獲得之玻璃母材切斷為125.1mm見方之大小,將經切斷之玻璃母材載置於已安裝於雙面研磨機之下壓盤的載體之孔部,於其上放下上壓盤並施加壓力,一面使上壓盤、下壓盤及載體旋轉,一面使包含Al2O3之研磨液流動並且對兩面進行研磨,將玻璃母材之厚度調整為0.3mm。繼而,藉由CeO2進一步對玻璃母材進行研磨,將玻璃母材之厚度調整為0.25mm。 Use a slicer to cut the obtained glass base material into a size of 125.1mm square, and place the cut glass base material on the hole of the carrier that has been installed on the lower platen of the double-sided grinder, and place it on it Put down the upper platen and apply pressure, while rotating the upper platen, lower platen and the carrier, while flowing the polishing liquid containing Al 2 O 3 and grinding both sides, the thickness of the glass base material is adjusted to 0.3mm. Then, the glass base material was further ground with CeO 2 to adjust the thickness of the glass base material to 0.25 mm.
繼而,使經研磨之玻璃母材於溫度30℃下於以質量%計具有胺基多羧酸之鹼性鹽為37%、三乙醇胺為20%、及水為43%之組成的鹼性洗劑中浸漬14小時,獲得具有125mm見方之大小、表1所示之厚度之紅外線吸收玻璃板(各30片)。 Then, the ground glass base material is subjected to an alkaline washing process at a temperature of 30° C., in which the basic salt of an amino polycarboxylic acid is 37%, triethanolamine is 20%, and water is 43%. Infrared-absorbing glass plates (30 sheets each) having a size of 125 mm square and a thickness shown in Table 1 were obtained by immersing them in the solvent for 14 hours.
於上述鹼性洗劑中,包含二乙三胺五乙酸五鈉作為胺基多羧酸之鹼性鹽。 In the above-mentioned alkaline lotion, pentasodium diethylenetriaminepentaacetate is included as an alkaline salt of amino polycarboxylic acid.
利用光學顯微鏡觀察所獲得之紅外線吸收玻璃板(30片)之側面,藉此判斷微裂之有無。 The side surfaces of the obtained infrared-absorbing glass plates (30 pieces) were observed with an optical microscope to determine the presence or absence of microcracks.
又,針對所獲得之紅外線吸收玻璃板(30片),測定支點間距離2.5mm時之三點撓曲強度,算出平均值。 Also, for the obtained infrared-absorbing glass plates (30 sheets), three-point flexural strengths at a distance between fulcrums of 2.5 mm were measured, and an average value was calculated.
如由表1所表明,作為本發明之實施例之No.1~10之試樣之厚度薄至0.16mm以下,受到鹼性洗劑蝕刻。又,於側面不存在微裂,儘管厚度較 薄但三點撓曲強度亦高至121N/mm2以上。 As shown in Table 1, the samples of Nos. 1 to 10, which are examples of the present invention, had a thickness as thin as 0.16 mm or less, and were etched by alkaline detergent. Also, there are no microcracks on the side surface, and the three-point flexural strength is as high as 121N/mm 2 or more despite its thin thickness.
另一方面,作為比較例之No.11之試樣係厚度與蝕刻前相同而為0.25mm,未受到鹼性洗劑蝕刻。又,於側面存在1~10μm左右之微裂,三點撓曲強度低至25N/mm2。 On the other hand, the thickness of the sample of No. 11 which is a comparative example is the same as before etching, 0.25 mm, and it was not etched by alkaline lotion. Also, there are microcracks of about 1-10 μm on the side surface, and the three-point flexural strength is as low as 25N/mm 2 .
1‧‧‧紅外線吸收玻璃板 1‧‧‧Infrared Absorbing Glass Plate
1a、1b‧‧‧第1、第2主面 1a, 1b‧‧‧1st and 2nd main face
1c‧‧‧側面 1c‧‧‧side
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JP7452428B2 (en) * | 2018-09-20 | 2024-03-19 | 日本電気硝子株式会社 | Manufacturing method of infrared absorbing glass |
JP7260852B2 (en) * | 2019-07-31 | 2023-04-19 | 日本電気硝子株式会社 | Glass plate etching method |
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Also Published As
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KR20200054911A (en) | 2020-05-20 |
JP2019055889A (en) | 2019-04-11 |
CN111108075A (en) | 2020-05-05 |
TW201918463A (en) | 2019-05-16 |
WO2019058858A1 (en) | 2019-03-28 |
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