TWI789834B - Substrate processing apparatus and substrate conveyance method - Google Patents

Substrate processing apparatus and substrate conveyance method Download PDF

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TWI789834B
TWI789834B TW110126448A TW110126448A TWI789834B TW I789834 B TWI789834 B TW I789834B TW 110126448 A TW110126448 A TW 110126448A TW 110126448 A TW110126448 A TW 110126448A TW I789834 B TWI789834 B TW I789834B
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substrate
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TW202207343A (en
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菊本憲幸
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日商斯庫林集團股份有限公司
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
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    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67739Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
    • H01L21/67745Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber characterized by movements or sequence of movements of transfer devices
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    • H01L21/67161Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B25HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
    • B25JMANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
    • B25J11/00Manipulators not otherwise provided for
    • B25J11/0095Manipulators transporting wafers
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B25HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
    • B25JMANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
    • B25J15/00Gripping heads and other end effectors
    • B25J15/0052Gripping heads and other end effectors multiple gripper units or multiple end effectors
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    • H01L21/67173Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers in-line arrangement
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    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67155Apparatus for manufacturing or treating in a plurality of work-stations
    • H01L21/67196Apparatus for manufacturing or treating in a plurality of work-stations characterized by the construction of the transfer chamber
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    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67703Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
    • H01L21/67706Mechanical details, e.g. roller, belt
    • HELECTRICITY
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    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67703Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
    • H01L21/67736Loading to or unloading from a conveyor
    • HELECTRICITY
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    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67739Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
    • H01L21/67742Mechanical parts of transfer devices
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    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67739Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
    • H01L21/67754Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber horizontal transfer of a batch of workpieces
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    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/687Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
    • H01L21/68707Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a robot blade, or gripped by a gripper for conveyance

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
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  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
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Abstract

The present invention provides a substrate processing apparatus and a substrate conveyance method. A second conveyance mechanism (23) of a substrate processing apparatus (100) includes a fist non-sharing hand (H_F), a second non-sharing hand (H_S), and M sharing hands (H_1 to H_M). In a first conveyance cycle, the M sharing hands (H_1 to H_M) support a substrate (W) yet to be processed and a processed substrate (W) at different timings. In the first conveyance cycle, the first non-sharing hand (H_F) supports only a substrate (W) yet to be processed. In the first conveyance cycle, the second non-sharing hand (H_S) supports only a processed substrate (W). In a state in which the second conveyance mechanism (23) receives N substrates (W) from a substrate placement section (29), the second sharing hand (H_S) does not support the substrates (W) while the M sharing hands (H_1 to H_M) and the first non-sharing hand (H_F) support the substrates (W).

Description

基板處理裝置及基板搬送方法Substrate processing apparatus and substrate transfer method

本發明係關於一種基板處理裝置及基板搬送方法。The invention relates to a substrate processing device and a substrate conveying method.

專利文獻1中記載之基板處理系統具備第1處理單元、第2處理單元、主搬送裝置、第1搬送裝置及第2搬送裝置。The substrate processing system described in Patent Document 1 includes a first processing unit, a second processing unit, a main transfer device, a first transfer device, and a second transfer device.

主搬送裝置具備保持晶圓之複數個(5個)晶圓保持部。主搬送裝置能於水平方向及鉛直方向上移動,且能以鉛直軸為中心迴旋,從而能使用晶圓保持部,於匣盒與交接模組之間同時搬送複數片晶圓。The main transfer device includes a plurality of (five) wafer holding units that hold wafers. The main transfer device can move in the horizontal direction and the vertical direction, and can rotate around the vertical axis, so that a plurality of wafers can be transferred between the cassette and the transfer module at the same time by using the wafer holding part.

第1搬送裝置具備1個晶圓保持部。而且,第1搬送裝置使用晶圓保持部,進行自交接模組取出晶圓並將其向第1處理單元搬送之處理、及將經第1處理單元處理過之晶圓自第1處理單元取出並向交接模組搬送之處理。因此,晶圓保持部於處理前之晶圓與處理後之晶圓之間係共用的。The first transfer device includes one wafer holding unit. Furthermore, the first transfer device uses the wafer holder to take out the wafer from the transfer module and transfer it to the first processing unit, and take out the wafer processed by the first processing unit from the first processing unit. And transfer to the handover module. Therefore, the wafer holder is shared between the unprocessed wafer and the processed wafer.

第2搬送裝置具備1個晶圓保持部。而且,第2搬送裝置使用晶圓保持部,進行自交接模組取出晶圓並將其向第2處理單元搬送之處理、及將經第2處理單元處理過之晶圓自第2處理單元取出並向交接模組搬送之處理。因此,晶圓保持部於處理前之晶圓與處理後之晶圓之間係共用的。The second transfer device includes one wafer holding unit. Furthermore, the second transfer device uses the wafer holder to take out the wafer from the transfer module and transfer it to the second processing unit, and take out the wafer processed by the second processing unit from the second processing unit. And transfer to the handover module. Therefore, the wafer holder is shared between the unprocessed wafer and the processed wafer.

以下,為求方便,著眼於第1搬送裝置及第1處理單元進行說明。 [先前技術文獻] [專利文獻]Hereinafter, for the sake of convenience, the description will focus on the first conveying device and the first processing unit. [Prior Art Literature] [Patent Document]

[專利文獻1]日本專利特開2016-201526號公報[Patent Document 1] Japanese Patent Laid-Open No. 2016-201526

[發明所欲解決之問題][Problem to be solved by the invention]

本案發明人著眼於第1搬送裝置具備複數個晶圓保持部(例如,3個以上晶圓保持部)之可能性、及處理前之晶圓與處理後之晶圓之間共用複數個晶圓保持部之可能性進行了探討。進而,本案發明人著眼於複數個晶圓保持部向複數個第1處理單元搬送複數片晶圓之動作進行了積極研究,以期提高第1搬送裝置(搬送機構)搬送晶圓(基板)之動作之產能。The inventors of the present application focused on the possibility that the first conveying device has a plurality of wafer holding parts (for example, more than 3 wafer holding parts), and shared a plurality of wafers between the pre-processed wafer and the processed wafer The possibility of keeping the part is explored. Furthermore, the inventors of the present application focused on the operation of transferring a plurality of wafers from a plurality of wafer holders to a plurality of first processing units, in order to improve the operation of transferring a wafer (substrate) by a first transfer device (transfer mechanism). of production capacity.

本發明之目的在於,提供一種能提高搬送機構搬送基板之動作之產能之基板處理裝置及基板搬送方法。 [解決問題之技術手段]An object of the present invention is to provide a substrate processing apparatus and a substrate conveying method capable of improving the throughput of a substrate conveying operation of a conveying mechanism. [Technical means to solve the problem]

根據本發明之一態樣,基板處理裝置具備基板載置部、複數個處理單元、及搬送機構。基板載置部供載置複數片基板。複數個處理單元各自處理上述基板。搬送機構於上述基板載置部與上述處理單元之間搬送上述基板。於1個搬送循環內,上述搬送機構自上述基板載置部接收由上述處理單元處理前之N(N為2以上之整數)片上述基板,將上述N片基板向上述複數個處理單元中之N個處理單元搬入,且自上述N個處理單元搬出由上述N個處理單元處理後之N片上述基板,將上述N片基板遞交至上述基板載置部。上述搬送機構具備複數個手。複數個手各自支持上述基板。上述複數個手包含第1非共用手、第2非共用手、及配置於上述第1非共用手與上述第2非共用手之間之M(M為1以上之整數)個共用手。上述第1非共用手、上述M個共用手及上述第2非共用手係沿著上下方向自上述第1非共用手至上述第2非共用手連續地配置。於上述1個搬送循環內,上述M個共用手於不同之時序支持由上述處理單元處理前之上述基板與處理後之上述基板。於上述1個搬送循環內,上述第1非共用手僅支持由上述處理單元處理前之上述基板。於上述1個搬送循環內,上述第2非共用手僅支持由上述處理單元處理後之上述基板。於上述搬送機構自上述基板載置部接收到上述N片基板之狀態下,上述第2非共用手未支持上述基板,而上述M個共用手及上述第1非共用手支持著上述基板。According to an aspect of the present invention, a substrate processing apparatus includes a substrate mounting unit, a plurality of processing units, and a transport mechanism. The substrate loading part is used for loading a plurality of substrates. The plurality of processing units each process the above-mentioned substrates. The transport mechanism transports the substrate between the substrate mounting unit and the processing unit. In one transfer cycle, the transfer mechanism receives N (N is an integer greater than or equal to 2) substrates before being processed by the processing unit from the substrate loading unit, and transfers the N substrates to one of the plurality of processing units. N processing units are carried in, and the N substrates processed by the N processing units are carried out from the N processing units, and the N substrates are delivered to the substrate loading part. The above-mentioned conveying mechanism has a plurality of hands. Each of the plurality of hands supports the above-mentioned substrate. The plurality of hands includes a first unshared hand, a second unshared hand, and M (M is an integer greater than 1) shared hands arranged between the first unshared hand and the second unshared hand. The first unshared hand, the M shared hands, and the second unshared hands are arranged continuously from the first unshared hand to the second unshared hand along the vertical direction. In the above one transfer cycle, the M shared hands support the substrate before processing and the substrate after processing by the processing unit at different timings. The first non-shared hand supports only the substrate before being processed by the processing unit in the one transfer cycle. In the above one transfer cycle, the second unshared hand supports only the substrate processed by the processing unit. In the state where the transfer mechanism has received the N substrates from the substrate mounting section, the second unshared hand does not support the substrate, but the M shared hands and the first unshared hand support the substrate.

於本發明之一形態中,基板處理裝置中,較佳為:於上述1個搬送循環內,上述M個共用手及上述第1非共用手自上述基板載置部接收上述基板。較佳為:於上述1個搬送循環內,上述第2非共用手自上述處理單元搬出處理後之上述基板。較佳為:於上述1個搬送循環內,上述M個共用手中鄰接於上述第2非共用手之共用手向已被上述第2非共用手搬出上述基板之上述處理單元,搬入處理前之上述基板。較佳為:於上述1個搬送循環內,鄰接於上述第2非共用手之上述共用手自與已被上述共用手搬入處理前之上述基板之上述處理單元不同之上述處理單元,搬出處理後之上述基板。In one aspect of the present invention, in the substrate processing apparatus, it is preferable that the M shared hands and the first non-shared hand receive the substrate from the substrate mounting portion within the one transfer cycle. Preferably, the second unshared hand carries out the processed substrate from the processing unit in the one transfer cycle. Preferably, in the above-mentioned 1 conveying cycle, the shared hand of the above-mentioned M shared hands adjacent to the above-mentioned second non-shared hand is carried into the above-mentioned processing unit before the processing of the above-mentioned substrate by the above-mentioned second non-shared hand. substrate. Preferably, in the above-mentioned one transfer cycle, the above-mentioned shared hand adjacent to the above-mentioned second non-shared hand is carried out from the above-mentioned processing unit different from the above-mentioned processing unit of the above-mentioned substrate that has been carried in by the above-mentioned shared hand before processing. The above-mentioned substrate.

於本發明之一形態中,基板處理裝置中,較佳為:上述M個共用手、上述第1非共用手及上述第2非共用手之合計個數係N+1個。較佳為:M=N-1。In one aspect of the present invention, in the substrate processing apparatus, preferably, the total number of the M shared hands, the first unshared hand, and the second unshared hand is N+1. Preferably: M=N−1.

於本發明之一形態中,基板處理裝置中,較佳為:上述複數個手之總數係2N個。In one aspect of the present invention, in the substrate processing apparatus, preferably, the total number of the plurality of hands is 2N.

於本發明之一形態中,基板處理裝置中,較佳為:N=2。In one aspect of the present invention, in the substrate processing apparatus, it is preferable that N=2.

於本發明之一形態中,基板處理裝置中,較佳為:進而具備控制上述搬送機構之控制部。較佳為:上述搬送機構受到上述控制部之控制,以第1基板搬送模式及第2基板搬送模式之任一模式動作。較佳為:上述第1基板搬送模式係將上述2N個手中之上述N+1個手使用為上述M個共用手、上述第1非共用手及上述第2非共用手之模式。較佳為:上述第2基板搬送模式係將上述2N個手中之N個手使用於僅支持由上述處理單元處理前之上述基板,並且將另N個手使用於僅支持由上述處理單元處理後之上述基板之模式。In one aspect of the present invention, it is preferable that the substrate processing apparatus further includes a control unit that controls the above-mentioned transport mechanism. Preferably, the transfer mechanism is controlled by the control unit to operate in any one of the first substrate transfer mode and the second substrate transfer mode. Preferably, the first substrate transfer mode is a mode in which the N+1 hands among the 2N hands are used as the M shared hands, the first unshared hand, and the second unshared hand. Preferably, in the second substrate transfer mode, N hands of the 2N hands are used to support only the substrate before being processed by the processing unit, and the other N hands are used to support only the substrate after being processed by the processing unit. The mode of the above-mentioned substrate.

於本發明之一形態中,基板處理裝置中,較佳為:上述複數個手之總數係N+1個。In one aspect of the present invention, in the substrate processing apparatus, preferably, the total number of the plurality of hands is N+1.

根據本發明之另一態樣,基板搬送方法係藉由搬送機構執行者,上述搬送機構於供載置複數片基板之基板載置部與處理上述基板之複數個處理單元之間搬送上述基板。基板搬送方法包含如下步驟:於1個搬送循環內,自上述基板載置部接收由上述處理單元處理前之N(N為2以上之整數)片上述基板,將上述N片基板向上述複數個處理單元中之N個處理單元搬入,且自上述N個處理單元搬出由上述N個處理單元處理後之N片上述基板,將上述N片基板遞交至上述基板載置部。上述搬送機構具備各自支持上述基板之複數個手。上述複數個手包含第1非共用手、第2非共用手、及配置於上述第1非共用手與上述第2非共用手之間之M(M為1以上之整數)個共用手。上述第1非共用手、上述M個共用手及上述第2非共用手係沿著上下方向自上述第1非共用手至上述第2非共用手連續地配置。在將上述N片基板遞交至上述基板載置部之上述步驟中,於上述1個搬送循環內,上述M個共用手於不同之時序支持由上述處理單元處理前之上述基板與處理後之上述基板,於上述1個搬送循環內,上述第1非共用手僅支持由上述處理單元處理前之上述基板,於上述1個搬送循環內,上述第2非共用手僅支持由上述處理單元處理後之上述基板;於上述搬送機構自上述基板載置部接收到上述N片基板之狀態下,上述第2非共用手未支持上述基板,而上述M個共用手及上述第1非共用手支持著上述基板。According to another aspect of the present invention, the substrate transfer method is performed by a transfer mechanism that transfers the substrate between a substrate loading unit for placing a plurality of substrates and a plurality of processing units for processing the substrate. The substrate transfer method includes the following steps: within one transfer cycle, receiving N (N is an integer greater than or equal to 2) substrates from the substrate loading unit before being processed by the processing unit, and transferring the N substrates to the plurality of substrates. N processing units among the processing units carry in, and carry out N substrates processed by the N processing units from the N processing units, and deliver the N substrates to the substrate loading unit. The transfer mechanism includes a plurality of hands each supporting the substrate. The plurality of hands includes a first unshared hand, a second unshared hand, and M (M is an integer greater than 1) shared hands arranged between the first unshared hand and the second unshared hand. The first unshared hand, the M shared hands, and the second unshared hands are arranged continuously from the first unshared hand to the second unshared hand along the vertical direction. In the above-mentioned step of delivering the above-mentioned N pieces of substrates to the above-mentioned substrate loading part, within the above-mentioned one transfer cycle, the above-mentioned M common hands support the above-mentioned substrates before processing and the above-mentioned substrates after processing by the processing unit at different timings. For substrates, in the above-mentioned one transfer cycle, the first non-shared hand only supports the above-mentioned substrate before being processed by the above-mentioned processing unit, and in the above-mentioned one transfer cycle, the above-mentioned second non-shared hand only supports the substrate after being processed by the above-mentioned processing unit The above-mentioned substrate; in the state where the above-mentioned transport mechanism receives the above-mentioned N substrates from the above-mentioned substrate loading part, the above-mentioned second non-shared hand does not support the above-mentioned substrate, and the above-mentioned M shared hands and the above-mentioned first non-shared hand are supported above substrate.

於本發明之一形態中,基板搬送方法中,較佳為:在將上述N片基板遞交至上述基板載置部之上述步驟中,於上述1個搬送循環內,上述M個共用手及上述第1非共用手自上述基板載置部接收上述基板,於上述1個搬送循環內,上述第2非共用手自上述處理單元搬出處理後之上述基板,於上述1個搬送循環內,上述M個共用手中鄰接於上述第2非共用手之共用手向已被上述第2非共用手搬出上述基板之上述處理單元,搬入處理前之上述基板,於上述1個搬送循環內,鄰接於上述第2非共用手之上述共用手自與已被上述共用手搬入處理前之上述基板之上述處理單元不同之上述處理單元,搬出處理後之上述基板。In one aspect of the present invention, in the substrate transfer method, it is preferable that in the step of delivering the N substrates to the substrate placement unit, the M shared hands and the The first unshared hand receives the above-mentioned substrate from the above-mentioned substrate loading part, and in the above-mentioned one conveying cycle, the above-mentioned second unshared hand carries out the processed above-mentioned substrate from the above-mentioned processing unit, and in the above-mentioned one conveying cycle, the above-mentioned M The shared hand adjacent to the second non-shared hand in the shared hand carries the substrate before processing into the processing unit that has carried the substrate out of the second non-shared hand, and is adjacent to the second non-shared hand in the above-mentioned one transfer cycle. 2. The shared hand that is not a shared hand carries out the processed substrate from the processing unit that is different from the processing unit that has carried the pre-processed substrate into the shared hand.

於本發明之一形態中,基板搬送方法中,較佳為:上述M個共用手、上述第1非共用手及上述第2非共用手之合計個數係N+1個。較佳為:M=N-1。In one aspect of the present invention, in the substrate transfer method, preferably, the total number of the M shared hands, the first unshared hands, and the second unshared hands is N+1. Preferably: M=N−1.

於本發明之一形態中,基板搬送方法中,較佳為上述複數個手之總數係2N個。In one aspect of the present invention, in the substrate transfer method, it is preferable that the total number of the plurality of hands is 2N.

於本發明之一形態中,基板搬送方法中,較佳為N=2。In one aspect of the present invention, in the substrate transfer method, it is preferable that N=2.

於本發明之一形態中,基板搬送方法中,較佳為:上述搬送機構以第1基板搬送模式及第2基板搬送模式任一模式動作。較佳為:上述第1基板搬送模式係將上述2N個手中之上述N+1個手使用為上述M個共用手、上述第1非共用手及上述第2非共用手之模式。較佳為:上述第2基板搬送模式係將上述2N個手中之N個手使用於僅支持由上述處理單元處理前之上述基板,並且將另N個手使用於僅支持由上述處理單元處理後之上述基板之模式。In one aspect of the present invention, in the substrate transfer method, preferably, the transfer mechanism operates in any one of the first substrate transfer mode and the second substrate transfer mode. Preferably, the first substrate transfer mode is a mode in which the N+1 hands among the 2N hands are used as the M shared hands, the first unshared hand, and the second unshared hand. Preferably, in the second substrate transfer mode, N hands of the 2N hands are used to support only the substrate before being processed by the processing unit, and the other N hands are used to support only the substrate after being processed by the processing unit. The mode of the above-mentioned substrate.

於本發明之一形態中,基板搬送方法中,較佳為:上述複數個手之總數係N+1個。 [發明之效果]In one aspect of the present invention, in the substrate transfer method, preferably, the total number of the plurality of hands is N+1. [Effect of Invention]

根據本發明之基板處理裝置及基板搬送方法,能提高搬送機構搬送基板之動作之產能。According to the substrate processing apparatus and the substrate conveying method of the present invention, the throughput of the substrate conveying operation of the conveying mechanism can be improved.

以下,參照圖式對本發明之實施方式進行說明。再者,圖中對相同或相當之部分標註了相同之參照符號,因此不重複進行說明。又,為了便於說明,圖式中酌情標記了三維正交座標系(X,Y,Z)。而且,於圖中,X軸及Y軸與水平方向平行,Z軸與鉛直方向平行。又,於實施方式之說明中,會酌情使用第1方向DX、第2方向DY及第3方向DZ。第1方向DX、第2方向DY及第3方向DZ相互正交。作為一例,第1方向DX及第2方向DY與水平方向大致平行,第3方向DZ與鉛直方向大致平行。為了便於說明,有時將第3方向DZ記作「上下方向DZ」。Hereinafter, embodiments of the present invention will be described with reference to the drawings. In addition, in the drawings, the same reference signs are attached to the same or corresponding parts, so the description thereof will not be repeated. Also, for convenience of description, a three-dimensional orthogonal coordinate system (X, Y, Z) is appropriately marked in the drawings. In addition, in the figure, the X-axis and the Y-axis are parallel to the horizontal direction, and the Z-axis is parallel to the vertical direction. In addition, in the description of the embodiment, the first direction DX, the second direction DY, and the third direction DZ will be used as appropriate. The first direction DX, the second direction DY, and the third direction DZ are perpendicular to each other. As an example, the first direction DX and the second direction DY are substantially parallel to the horizontal direction, and the third direction DZ is substantially parallel to the vertical direction. For convenience of description, the third direction DZ may be referred to as "up and down direction DZ".

首先,參照圖1對本實施方式之基板處理裝置100進行說明。圖1係表示本實施方式之基板處理裝置100之內部之俯視圖。再者,本實施方式中,為了簡化圖式及說明,省略吸氣系統及排氣系統。First, a substrate processing apparatus 100 according to this embodiment will be described with reference to FIG. 1 . FIG. 1 is a plan view showing the inside of a substrate processing apparatus 100 according to this embodiment. In addition, in this embodiment, in order to simplify drawing and description, an intake system and an exhaust system are abbreviate|omitted.

圖1所示之基板處理裝置100處理基板W。基板W例如為半導體晶圓、液晶顯示裝置用基板、電漿顯示器用基板、場致發射顯示器(Field Emission Display:FED)用基板、光碟用基板、磁碟用基板、光磁碟用基板、光罩用基板、陶瓷基板或太陽電池用基板。The substrate processing apparatus 100 shown in FIG. 1 processes a substrate W. As shown in FIG. The substrate W is, for example, a semiconductor wafer, a substrate for a liquid crystal display device, a substrate for a plasma display, a substrate for a field emission display (Field Emission Display: FED), a substrate for an optical disk, a substrate for a magnetic disk, a substrate for a magneto-optical disk, or an optical disk. Cover substrates, ceramic substrates, or solar cell substrates.

基板處理裝置100具備移載傳送部1與處理部20。處理部20鄰接於移載傳送部1而配置。移載傳送部1向處理部20供給基板W。處理部20處理基板W。移載傳送部1自處理部20回收基板W。The substrate processing apparatus 100 includes a transfer transfer unit 1 and a processing unit 20 . The processing unit 20 is arranged adjacent to the transfer transfer unit 1 . The transfer transfer unit 1 supplies the substrate W to the processing unit 20 . The processing unit 20 processes the substrate W. The transfer transfer unit 1 collects the substrate W from the processing unit 20 .

移載傳送部1具備複數個載具載置部3(例如,4個載具載置部3)。複數個載具載置部3沿著第1方向DX配置。複數個載具載置部3分別供載置複數個載具C。複數個載具C各自收容複數片基板W。本實施方式中,作為一例,複數個載具C各自收容25片基板W。載具C例如為FOUP(front opening unified pod,前開式單元匣)。The transfer transfer unit 1 includes a plurality of carrier placement units 3 (for example, four carrier placement units 3 ). The plurality of carrier mounting units 3 are arranged along the first direction DX. A plurality of carrier loading parts 3 are respectively used for loading a plurality of carriers C. As shown in FIG. Each of the plurality of carriers C accommodates a plurality of substrates W. FIG. In this embodiment, as an example, each of the plurality of carriers C accommodates 25 substrates W. As shown in FIG. The carrier C is, for example, a FOUP (front opening unified pod, front opening unit box).

移載傳送部1具備第1搬送室5。第1搬送室5位於複數個載具載置部3與處理部20之間。The transfer transfer unit 1 includes a first transfer chamber 5 . The first transfer chamber 5 is located between the plurality of carrier placement units 3 and the processing unit 20 .

移載傳送部1至少具備1個第1搬送機構7。本實施方式中,作為一例,移載傳送部1具備1個第1搬送機構7。第1搬送機構7配置於第1搬送室5。第1搬送機構7搬送基板W。具體而言,第1搬送機構7於各載具C與處理部20之間搬送基板W。The transfer transfer unit 1 includes at least one first conveyance mechanism 7 . In this embodiment, as an example, the transfer conveyance part 1 is equipped with the one 1st conveyance mechanism 7. As shown in FIG. The first transport mechanism 7 is arranged in the first transport chamber 5 . The first transport mechanism 7 transports the substrate W. Specifically, the first transport mechanism 7 transports the substrate W between each carrier C and the processing unit 20 .

第1搬送機構7具備複數個第1手9、及第1手驅動部11。再者,圖1中僅示出了1個第1手9,其他第1手9之標記為求簡化被省略了。各第1手9支持1片基板W。本實施方式中,各第1手9將1片基板W以水平姿勢支持。第1手驅動部11連結於各第1手9。第1手驅動部11移動各第1手9。第1手驅動部11具備複數個電動馬達。The first transport mechanism 7 includes a plurality of first hands 9 and a first hand drive unit 11 . Furthermore, only one first hand 9 is shown in FIG. 1 , and the marks of other first hands 9 are omitted for simplification. Each first hand 9 supports one substrate W. In this embodiment, each first hand 9 supports one substrate W in a horizontal posture. The first hand drive unit 11 is connected to each first hand 9 . The first hand driving unit 11 moves each first hand 9 . The first hand drive unit 11 includes a plurality of electric motors.

其次,參照圖1及圖2對各第1手9及第1手驅動部11進行說明。圖2係沿著圖1之II-II線之剖視圖。Next, each of the first hand 9 and the first hand drive unit 11 will be described with reference to FIGS. 1 and 2 . Fig. 2 is a sectional view along line II-II of Fig. 1 .

如圖2所示,複數個第1手9沿著上下方向DZ配置。本實施方式中,作為一例,第1搬送機構7具備5個第1手9。實際上,如下所述,複數個第1手9係於上下方向DZ上隔開間隔而配置。第1手驅動部11移動複數個第1手9時要維持複數個第1手9之上下方向DZ之間隔不變。各第1手9自載具C接收未處理之基板W,並將未處理之基板W向處理部20搬送。又,各第1手9自處理部20接收經處理部20處理過之處理後之基板W,並將其向載具C搬送。As shown in FIG. 2, the some 1st hand 9 is arrange|positioned along the up-down direction DZ. In this embodiment, as an example, the first transport mechanism 7 includes five first hands 9 . Actually, as described below, the plurality of first hands 9 are arranged at intervals in the vertical direction DZ. When the first hand drive unit 11 moves the plurality of first hands 9, the distance between the plurality of first hands 9 in the up and down direction DZ is kept constant. Each first hand 9 receives the unprocessed substrate W from the carrier C, and transports the unprocessed substrate W to the processing unit 20 . Moreover, each first hand 9 receives the processed substrate W processed by the processing part 20 from the processing part 20, and conveys it to the carrier C.

如圖1及圖2所示,第1手驅動部11具備軌道11a、水平移動部11b、垂直移動部11c、迴旋部11d、迴旋軸11e及進退部11f。As shown in FIG. 1 and FIG. 2 , the first hand drive unit 11 includes a rail 11a, a horizontal movement unit 11b, a vertical movement unit 11c, a turning unit 11d, a turning shaft 11e, and an advancing and retreating unit 11f.

軌道11a配置於第1搬送室5之底部。軌道11a沿著第1方向DX延伸。水平移動部11b支持於軌道11a。水平移動部11b沿著軌道11a於第1方向DX上移動。垂直移動部11c支持於水平移動部11b。垂直移動部11c相對於水平移動部11b在上下方向DZ上移動。The rail 11a is arranged at the bottom of the first transfer chamber 5 . The rail 11a extends along the first direction DX. The horizontal movement part 11b is supported by the rail 11a. The horizontal movement part 11b moves in the 1st direction DX along the rail 11a. The vertical movement part 11c is supported by the horizontal movement part 11b. The vertical movement part 11c moves to the up-down direction DZ with respect to the horizontal movement part 11b.

迴旋部11d支持於垂直移動部11c。迴旋部11d相對於垂直移動部11c迴旋。迴旋部11d藉由迴旋軸11e被驅動,而繞迴旋軸線A1迴旋。迴旋軸線A1係沿著上下方向DZ延伸之假想線。The turning part 11d is supported by the vertical movement part 11c. The turning part 11d turns with respect to the vertical movement part 11c. The turning part 11d is driven by the turning shaft 11e to turn around the turning axis A1. The axis of rotation A1 is an imaginary line extending along the vertical direction DZ.

進退部11f於由迴旋部11d之方向決定之水平之一個方向上往返移動。進退部11f連接於各第1手9。而且,進退部11f使各第1手9分別於由迴旋部11d之方向決定之水平之一個方向上往返移動。進退部11f連接於各第1手9。The forward and backward part 11f moves back and forth in one direction of the level determined by the direction of the turning part 11d. 11 f of advancing and retreating parts are connected to each 1st hand 9. As shown in FIG. And the forward and backward part 11f moves each first hand 9 back and forth in one direction of the level determined by the direction of the turning part 11d, respectively. 11 f of advancing and retreating parts are connected to each 1st hand 9. As shown in FIG.

如以上參照圖1及圖2所說明般,第1搬送機構7具備第1手驅動部11。因此,各第1手9能沿著上下方向DZ平行移動。該情形時,第1手驅動部11使複數個第1手9全體沿著上下方向DZ移動。又,各第1手9能繞迴旋軸線A1迴旋。該情形時,第1手驅動部11例如使複數個第1手9全體迴旋。而且,各第1手9能於水平之任意方向上平行移動。As described above with reference to FIGS. 1 and 2 , the first transport mechanism 7 includes the first hand drive unit 11 . Therefore, each first hand 9 can move in parallel along the vertical direction DZ. In this case, the first hand driving unit 11 moves the plurality of first hands 9 as a whole in the vertical direction DZ. Also, each first hand 9 can turn around the turning axis A1. In this case, the first hand drive unit 11 turns all the plurality of first hands 9 , for example. Moreover, each first hand 9 can move in parallel in any horizontal direction.

其次,參照圖1~圖4對處理部20進行說明。圖3係沿著圖1之III-III線之剖視圖。圖4係表示基板處理裝置100之側視圖。Next, the processing unit 20 will be described with reference to FIGS. 1 to 4 . Fig. 3 is a sectional view along line III-III of Fig. 1 . FIG. 4 is a side view of the substrate processing apparatus 100 .

如圖1、圖3及圖4所示,處理部20具備複數個處理單元21。複數個處理單元21各自一片一片地處理基板W。例如,各處理單元21利用處理液(例如,藥液)來處理基板W。本實施方式中,作為一例,處理部20具備24個處理單元21。As shown in FIGS. 1 , 3 and 4 , the processing unit 20 includes a plurality of processing units 21 . The plurality of processing units 21 each process the substrate W one by one. For example, each processing unit 21 processes the substrate W with a processing liquid (for example, chemical liquid). In this embodiment, as an example, the processing unit 20 includes 24 processing units 21 .

具體而言,處理部20具有複數個處理塔TW。作為一例,各處理塔TW由沿著上下方向DZ配置之K個處理單元21構成。本實施方式中,K係2以上之整數。於各處理塔TW中,K/2個處理單元21配置於下段LW,K/2個處理單元21配置於上段UP。Specifically, the processing unit 20 has a plurality of processing towers TW. As an example, each processing tower TW is comprised by the K processing unit 21 arrange|positioned along the up-down direction DZ. In this embodiment, K is an integer of 2 or more. In each processing tower TW, K/2 processing units 21 are arranged in the lower stage LW, and K/2 processing units 21 are arranged in the upper stage UP.

本實施方式中,作為一例,K=6,由6個處理單元21構成1個處理塔TW。而且,處理部20具有4個處理塔TW。有時將4個處理塔TW分別記作處理塔TW1、TW2、TW3、TW4。In the present embodiment, as an example, K=6, and one processing tower TW is constituted by six processing units 21 . Furthermore, the processing unit 20 has four processing towers TW. The four processing towers TW are sometimes referred to as processing towers TW1, TW2, TW3, and TW4, respectively.

處理塔TW1、TW2沿著第2方向DY配置。處理塔TW3、TW4沿著第2方向DY配置。處理塔TW1、TW2與處理塔TW3、TW4隔著第2搬送室31於第1方向DX上相對向。Processing tower TW1, TW2 is arrange|positioned along 2nd direction DY. Processing tower TW3, TW4 is arrange|positioned along 2nd direction DY. Processing towers TW1, TW2 and processing towers TW3, TW4 face each other in the first direction DX across the second transfer chamber 31 .

又,如圖1及圖2所示,處理部20進而具備複數個基板載置部29。本實施方式中,作為一例,處理部20具備2個基板載置部29。各基板載置部29可供載置複數片基板W。本實施方式中,作為一例,各基板載置部29可供載置20片基板W。各基板載置部29鄰接於第1搬送室5。Moreover, as shown in FIGS. 1 and 2 , the processing unit 20 further includes a plurality of substrate placement units 29 . In the present embodiment, as an example, the processing unit 20 includes two substrate placement units 29 . Each substrate loading portion 29 can place a plurality of substrates W thereon. In the present embodiment, as an example, 20 substrates W can be placed on each substrate mounting portion 29 . Each substrate loading unit 29 is adjacent to the first transfer chamber 5 .

以下,對於2個基板載置部29,有時將位於下段LW之基板載置部29記作「基板載置部29L」,將位於上段UP之基板載置部29記作「基板載置部29U」。Hereinafter, for the two substrate mounting portions 29, the substrate mounting portion 29 located in the lower stage LW may be referred to as the “substrate mounting portion 29L”, and the substrate mounting portion 29 located in the upper stage UP may be referred to as the “substrate mounting portion 29L”. 29U".

基板載置部29L配置於下段LW之第2搬送室31。基板載置部29U配置於上段UP之第2搬送室31。基板載置部29L與基板載置部29U沿著上下方向DZ配置於一條直線上。29 L of board|substrate placement parts are arrange|positioned in the 2nd transfer chamber 31 of lower stage LW. The substrate placement unit 29U is arranged in the second transfer chamber 31 of the upper stage UP. The substrate mounting portion 29L and the substrate mounting portion 29U are arranged on a straight line along the vertical direction DZ.

又,如圖2所示,處理部20進而具備複數個第2搬送機構23及複數個第2搬送室31。本實施方式中,作為一例,處理部20具備2個第2搬送機構23及2個第2搬送室31。第2搬送機構23相當於「搬送機構」之一例。Moreover, as shown in FIG. 2 , the processing unit 20 further includes a plurality of second transport mechanisms 23 and a plurality of second transport chambers 31 . In the present embodiment, the processing unit 20 includes two second transport mechanisms 23 and two second transport chambers 31 as an example. The second conveying mechanism 23 corresponds to an example of "conveying mechanism".

2個第2搬送室31沿著上下方向DZ配置。各第2搬送室31沿著第2方向DY延伸。各第2搬送室31與第1搬送室5相連。The two second transfer chambers 31 are arranged along the vertical direction DZ. Each second transfer chamber 31 extends along the second direction DY. Each second transfer chamber 31 is connected to the first transfer chamber 5 .

各第2搬送機構23搬送基板W。具體而言,第2搬送機構23於基板載置部29與處理單元21之間搬送基板W。以下,對於2個第2搬送機構23,有時將位於下段LW之第2搬送機構23記作「第2搬送機構23L」,將位於上段UP之第2搬送機構23記作「第2搬送機構23U」。Each second conveyance mechanism 23 conveys the substrate W. Specifically, the second transport mechanism 23 transports the substrate W between the substrate mounting unit 29 and the processing unit 21 . Hereinafter, for the two second conveying mechanisms 23, the second conveying mechanism 23 located in the lower stage LW may be referred to as "the second conveying mechanism 23L", and the second conveying mechanism 23 located in the upper stage UP may be referred to as "the second conveying mechanism 23L". 23U".

第2搬送機構23L配置於下段LW之第2搬送室31。第2搬送機構23U配置於上段UP之第2搬送室31。The 2nd conveyance mechanism 23L is arrange|positioned in the 2nd conveyance chamber 31 of the lower stage LW. The 2nd conveyance mechanism 23U is arrange|positioned in the 2nd conveyance chamber 31 of the upper stage UP.

如圖1~圖3所示,各第2搬送機構23具備複數個第2手25、及第2手驅動部17。本實施方式中,作為一例,各第2搬送機構23具備4個第2手25。第2手25相當於「手」之一例。As shown in FIGS. 1 to 3 , each second transport mechanism 23 includes a plurality of second hands 25 and a second hand drive unit 17 . In this embodiment, as an example, each second transport mechanism 23 is provided with four second hands 25 . The second hand 25 is equivalent to an example of "hand".

各第2手25支持1片基板W。本實施方式中,各第2手25將1片基板W以水平姿勢支持。第2手驅動部17連結於各第2手25。第2手驅動部17移動各第2手25。第2手驅動部17具備複數個電動馬達。Each second hand 25 supports one substrate W. In this embodiment, each second hand 25 supports one substrate W in a horizontal posture. The second hand drive unit 17 is connected to each second hand 25 . The second hand driving unit 17 moves each second hand 25 . The second hand drive unit 17 includes a plurality of electric motors.

具體而言,於各第2搬送機構23中,複數個第2手25沿著上下方向DZ配置。實際上,如下所述,於各第2搬送機構23中,複數個第2手25係於上下方向DZ上隔開間隔而配置。而且,第2手驅動部17移動複數個第2手25時要維持複數個第2手25之上下方向DZ之間隔不變。例如,第2手25自基板載置部29接收未處理之基板W,並將未處理之基板W向處理單元21搬送。例如,第2手25自處理單元21接收經處理單元21處理過之處理後之基板W,並將其遞交至基板載置部29。Specifically, in each second conveyance mechanism 23, a plurality of second hands 25 are arranged along the vertical direction DZ. Actually, as described below, in each of the second transport mechanisms 23, the plurality of second hands 25 are arranged at intervals in the vertical direction DZ. Furthermore, when the second hand drive unit 17 moves the plurality of second hands 25, the distance between the plurality of second hands 25 in the vertical direction DZ is kept constant. For example, the second hand 25 receives the unprocessed substrate W from the substrate mounting unit 29 and conveys the unprocessed substrate W to the processing unit 21 . For example, the second hand 25 receives the processed substrate W processed by the processing unit 21 from the processing unit 21 and delivers it to the substrate placement unit 29 .

第2手驅動部17具備2個支柱27a、垂直移動部27b、水平移動部27c、迴旋部27d、迴旋軸27e及進退部27f。The 2nd hand drive part 17 is equipped with the two support|pillars 27a, the vertical movement part 27b, the horizontal movement part 27c, the turning part 27d, the turning shaft 27e, and the advance-backward part 27f.

2個支柱27a配置於第2搬送室31。具體而言,2個支柱27a配置於第2搬送室31之內側面。2個支柱27a係於第2方向DY上隔開間隔而配置。各支柱27a沿著上下方向DZ延伸。垂直移動部27b支持於2個支柱27a。垂直移動部27b跨涉2個支柱27a而沿著第2方向DY延伸。垂直移動部27b沿著2個支柱27a於上下方向DZ上移動。水平移動部27c支持於垂直移動部27b。水平移動部27c沿著垂直移動部27b,於2個支柱27a之間在第2方向DY上移動。The two support columns 27a are arranged in the second transfer chamber 31 . Specifically, the two support columns 27a are arranged on the inner surface of the second transfer chamber 31 . The two pillars 27a are arranged at intervals in the second direction DY. Each strut 27a extends along the vertical direction DZ. The vertical movement part 27b is supported by two pillars 27a. The vertical movement part 27b extends along the second direction DY across the two pillars 27a. The vertical movement part 27b moves to the up-down direction DZ along the two support|pillars 27a. The horizontal movement part 27c is supported by the vertical movement part 27b. The horizontal moving part 27c moves along the vertical moving part 27b between the two pillars 27a in the second direction DY.

迴旋部27d支持於水平移動部27c。迴旋部27d相對於水平移動部27c迴旋。迴旋部27d藉由迴旋軸27e被驅動,而繞迴旋軸線A2迴旋。迴旋軸線A2係沿著上下方向DZ延伸之假想線。The turning part 27d is supported by the horizontal movement part 27c. The turning part 27d turns with respect to the horizontal movement part 27c. The turning part 27d is driven by the turning shaft 27e to turn around the turning axis A2. The axis of rotation A2 is an imaginary line extending along the vertical direction DZ.

進退部27f相對於迴旋部27d移動。進退部27f於由迴旋部27d之方向決定之水平之一個方向上往返移動。進退部27f連接於各第2手25。The advance and retreat part 27f moves with respect to the turning part 27d. The forward and backward part 27f moves back and forth in one direction of the level determined by the direction of the turning part 27d. The advancing and retreating portion 27f is connected to each second hand 25 .

如以上參照圖1~圖3所說明般,各第2搬送機構23具備第2手驅動部17。因此,各第2手25能沿著上下方向DZ平行移動。該情形時,第2手驅動部17使複數個第2手25全體沿著上下方向DZ移動。又,各第2手25能繞迴旋軸線A2迴旋。該情形時,第2手驅動部17例如使複數個第2手25全體迴旋。而且,各第2手25能於水平之任意方向上平行移動。As mentioned above with reference to FIGS. 1-3, each 2nd conveyance mechanism 23 is provided with the 2nd hand drive part 17. As shown in FIG. Therefore, each second hand 25 can move in parallel along the vertical direction DZ. In this case, the second hand drive unit 17 moves the plurality of second hands 25 as a whole in the vertical direction DZ. Also, each second hand 25 can turn around the turning axis A2. In this case, the second hand drive unit 17 turns all of the plurality of second hands 25 , for example. Furthermore, each second hand 25 can move in parallel in any horizontal direction.

此處,如圖1所示,基板處理裝置100進而具備控制部200。控制部200控制基板處理裝置100之各構成。具體而言,控制部200控制第1搬送機構7、第2搬送機構23及處理單元21。Here, as shown in FIG. 1 , the substrate processing apparatus 100 further includes a control unit 200 . The control unit 200 controls various components of the substrate processing apparatus 100 . Specifically, the control unit 200 controls the first transport mechanism 7 , the second transport mechanism 23 , and the processing unit 21 .

控制部200例如為電腦。具體而言,控制部200具備處理器與記憶裝置。處理器例如包含CPU(Central Processing Unit,中央處理單元)。記憶裝置記憶資料及電腦程式。記憶裝置例如包含如半導體記憶體般之主記憶裝置,以及如半導體記憶體、固態驅動器及/或硬碟驅動器般之輔助記憶裝置。記憶裝置亦可包含可移動介質。記憶裝置相當於非暫時性電腦可讀取記憶介質之一例。The control unit 200 is, for example, a computer. Specifically, the control unit 200 includes a processor and a memory device. The processor includes, for example, a CPU (Central Processing Unit, central processing unit). The memory device stores data and computer programs. The memory device includes, for example, a main memory device such as a semiconductor memory, and an auxiliary memory device such as a semiconductor memory, a solid-state drive, and/or a hard disk drive. Memory devices may also include removable media. The memory device corresponds to an example of a non-transitory computer-readable memory medium.

具體而言,控制部200之處理器藉由執行記憶裝置中記憶之電腦程式,來控制第1搬送機構7、第2搬送機構23及處理單元21。Specifically, the processor of the control unit 200 controls the first conveying mechanism 7 , the second conveying mechanism 23 and the processing unit 21 by executing the computer program stored in the memory device.

繼續參照圖1及圖2,對第1搬送機構7及第2搬送機構23搬送基板W時之整個流程進行說明。With continued reference to FIGS. 1 and 2 , the overall flow when the substrate W is transported by the first transport mechanism 7 and the second transport mechanism 23 will be described.

第1搬送機構7之第1手9自載具C接收未處理之複數片基板W,並將未處理之複數片基板W遞交至基板載置部29L或基板載置部29U。其結果,未處理之複數片基板W載置至基板載置部29L或基板載置部29U。本實施方式中,「未處理之基板」表示處理單元21尚未加以處理之基板W,即尚未經處理單元21處理之基板W。The first hand 9 of the first transport mechanism 7 receives the unprocessed plurality of substrates W from the carrier C, and delivers the unprocessed plurality of substrates W to the substrate mounting part 29L or the substrate mounting part 29U. As a result, a plurality of unprocessed substrates W are placed on the substrate mounting portion 29L or the substrate mounting portion 29U. In this embodiment, “unprocessed substrate” means a substrate W that has not been processed by the processing unit 21 , that is, a substrate W that has not been processed by the processing unit 21 .

第2搬送機構23L之第2手25自基板載置部29L接收未處理之複數片基板W,並將未處理之基板W一片一片地向下段LW之各處理單元21搬入。然後,下段LW之各處理單元21處理未處理之基板W。The second hand 25 of the second conveyance mechanism 23L receives a plurality of unprocessed substrates W from the substrate mounting portion 29L, and carries the unprocessed substrates W one by one into each processing unit 21 of the lower stage LW. Then, each processing unit 21 of the lower stage LW processes the unprocessed substrate W.

又,第2搬送機構23L之第2手25自下段LW之各處理單元21搬出處理後之基板W,並將處理後之複數片基板W遞交至基板載置部29L。其結果,處理後之複數片基板W載置至基板載置部29L。In addition, the second hand 25 of the second transport mechanism 23L unloads the processed substrate W from each processing unit 21 of the lower stage LW, and delivers the processed plurality of substrates W to the substrate mounting portion 29L. As a result, the processed plurality of substrates W are placed on the substrate placement portion 29L.

另一方面,第2搬送機構23U之第2手25自基板載置部29U接收未處理之複數片基板W,並將未處理之基板W一片一片地向上段UP之各處理單元21搬入。然後,上段UP之各處理單元21處理未處理之基板W。On the other hand, the second hand 25 of the second transport mechanism 23U receives a plurality of unprocessed substrates W from the substrate mounting portion 29U, and carries the unprocessed substrates W one by one into each processing unit 21 of the upper stage UP. Then, each processing unit 21 of the upper stage UP processes the unprocessed substrate W.

又,第2搬送機構23U之第2手25自上段UP之各處理單元21搬出處理後之基板W,並將處理後之複數片基板W遞交至基板載置部29U。其結果,處理後之複數片基板W載置至基板載置部29U。In addition, the second hand 25 of the second transport mechanism 23U unloads the processed substrate W from each processing unit 21 of the upper stage UP, and delivers the processed plurality of substrates W to the substrate mounting unit 29U. As a result, the processed plurality of substrates W are placed on the substrate placement portion 29U.

第1搬送機構7之第1手9自基板載置部29L或基板載置部29U接收處理後之複數片基板W,並將處理後之複數片基板W遞交至載具C。其結果,處理後之複數片基板W收容至載具C。The first hand 9 of the first transport mechanism 7 receives the processed substrates W from the substrate mounting part 29L or the substrate mounting part 29U, and delivers the processed substrates W to the carrier C. As a result, the processed substrates W are housed in the carrier C.

其次,參照圖5對處理單元21進行說明。圖5係表示處理單元21之內部之側視圖。如圖5所示,處理單元21具備處理殼體41、基板保持部43、旋轉驅動部45、第1噴嘴47、第1噴嘴移動部47a、第2噴嘴49、第2噴嘴移動部49a、第3噴嘴51、第3噴嘴移動部51a、第4噴嘴53、第4噴嘴移動部53a及承杯55。又,基板處理裝置100進而具備第1處理液供給配管473、第2處理液供給配管493、第3處理液供給配管513及沖洗液供給配管533。Next, the processing unit 21 will be described with reference to FIG. 5 . FIG. 5 is a side view showing the interior of the processing unit 21 . As shown in FIG. 5 , the processing unit 21 includes a processing housing 41, a substrate holding portion 43, a rotational drive portion 45, a first nozzle 47, a first nozzle moving portion 47a, a second nozzle 49, a second nozzle moving portion 49a, a second nozzle moving portion 49a, 3. The nozzle 51, the third nozzle moving part 51a, the fourth nozzle 53, the fourth nozzle moving part 53a, and the cup holder 55. In addition, the substrate processing apparatus 100 further includes a first processing liquid supply pipe 473 , a second processing liquid supply pipe 493 , a third processing liquid supply pipe 513 , and a rinse liquid supply pipe 533 .

處理殼體41具有箱形形狀。處理殼體41收容基板保持部43、旋轉驅動部45、第1噴嘴47、第1噴嘴移動部47a、第2噴嘴49、第2噴嘴移動部49a、第3噴嘴51、第3噴嘴移動部51a、第4噴嘴53、第4噴嘴移動部53a及承杯55。又,處理殼體41收容第1處理液供給配管473之一部分、第2處理液供給配管493之一部分、第3處理液供給配管513之一部分及沖洗液供給配管533之一部分。已由第2搬送機構23搬入至處理單元21之基板W收容於處理殼體41之內部。The processing housing 41 has a box shape. The processing case 41 accommodates the substrate holding part 43, the rotation driving part 45, the first nozzle 47, the first nozzle moving part 47a, the second nozzle 49, the second nozzle moving part 49a, the third nozzle 51, and the third nozzle moving part 51a , the fourth nozzle 53, the fourth nozzle moving part 53a, and the cup holder 55. Furthermore, the processing case 41 accommodates a portion of the first processing liquid supply pipe 473 , a portion of the second processing liquid supply pipe 493 , a portion of the third processing liquid supply pipe 513 , and a portion of the rinse liquid supply pipe 533 . The substrate W carried into the processing unit 21 by the second transport mechanism 23 is accommodated in the processing housing 41 .

基板保持部43將基板W水平地保持。基板保持部43例如為真空式旋轉吸盤。再者,基板保持部43保持基板W之方式並不限定於真空式。基板保持部43保持基板W之方式例如亦可為夾持式或伯努利(Bernoulli)式。The substrate holding portion 43 holds the substrate W horizontally. The substrate holding unit 43 is, for example, a vacuum spin chuck. In addition, the method for holding the substrate W by the substrate holding part 43 is not limited to the vacuum type. The manner in which the substrate holding portion 43 holds the substrate W may be, for example, a clamping type or a Bernoulli type.

旋轉驅動部45使基板保持部43以旋轉軸線A3為中心而旋轉。其結果,基板W與基板保持部43以旋轉軸線A3為中心一體旋轉。旋轉軸線A3係沿著上下方向DZ延伸之假想線。旋轉驅動部45例如包含電動馬達。The rotation drive unit 45 rotates the substrate holding unit 43 around the rotation axis A3. As a result, the substrate W and the substrate holding portion 43 rotate integrally around the rotation axis A3. The axis of rotation A3 is an imaginary line extending along the vertical direction DZ. The rotation drive unit 45 includes, for example, an electric motor.

第1噴嘴47自基板W之上方向基板W供給第1處理液。詳細而言,第1噴嘴47向旋轉中之基板W噴出第1處理液。第1噴嘴移動部47a使第1噴嘴47於處理位置與退避位置之間移動。第1噴嘴47移動至處理位置時,於俯視下與基板W相對向。第1噴嘴47移動至退避位置時,於俯視下不與基板W相對向。詳細而言,第1噴嘴47移動至退避位置時,於俯視下退避至基板W之周圍。The first nozzle 47 supplies the first processing liquid to the substrate W from above the substrate W. As shown in FIG. Specifically, the first nozzle 47 sprays the first processing liquid toward the substrate W that is rotating. The 1st nozzle moving part 47a moves the 1st nozzle 47 between a processing position and a retracted position. When the first nozzle 47 moves to the processing position, it faces the substrate W in plan view. When the first nozzle 47 moves to the retreat position, it does not face the substrate W in plan view. Specifically, when the first nozzle 47 moves to the retracted position, it retracts to the periphery of the substrate W in plan view.

具體而言,第1噴嘴移動部47a具有第1噴嘴臂471與第1噴嘴驅動部472。第1噴嘴臂471沿著大致水平方向延伸。於第1噴嘴臂471之前端部配置第1噴嘴47。第1噴嘴驅動部472使第1噴嘴臂471以沿著上下方向DZ延伸之旋轉軸線為中心而沿著大致水平面迴旋。其結果,第1噴嘴47沿著以上下方向DZ上延伸之旋轉軸線為中心之圓周方向,於圓周方向上移動。第1噴嘴驅動部472包含能正反旋轉之電動馬達。Specifically, the first nozzle moving part 47 a has a first nozzle arm 471 and a first nozzle driving part 472 . The first nozzle arm 471 extends substantially horizontally. The first nozzle 47 is arranged at the front end of the first nozzle arm 471 . The first nozzle driving unit 472 turns the first nozzle arm 471 along a substantially horizontal plane around a rotation axis extending in the vertical direction DZ. As a result, the first nozzle 47 moves in the circumferential direction along the circumferential direction centered on the rotation axis extending in the vertical direction DZ. The first nozzle drive unit 472 includes an electric motor capable of forward and reverse rotation.

第1處理液供給配管473向第1噴嘴47供給第1處理液。第1處理液供給配管473係供第1處理液流通之管狀構件。本實施方式中,第1處理液係酸性液體。例如,第1處理液為氫氟酸(氟化氫酸)、硫酸與過氧化氫水之混合液(SPM)、硫酸、硫酸-過氧化氫水、氫氟酸-硝酸(氫氟酸與硝酸之混合液)、或鹽酸。The first processing liquid supply pipe 473 supplies the first processing liquid to the first nozzle 47 . The first processing liquid supply pipe 473 is a tubular member through which the first processing liquid flows. In this embodiment, the first treatment liquid is an acidic liquid. For example, the first treatment liquid is hydrofluoric acid (hydrofluoric acid), a mixture of sulfuric acid and hydrogen peroxide (SPM), sulfuric acid, sulfuric acid-hydrogen peroxide, hydrofluoric acid-nitric acid (a mixture of hydrofluoric acid and nitric acid) solution), or hydrochloric acid.

第2噴嘴49自基板W之上方向基板W供給第2處理液。詳細而言,第2噴嘴49向旋轉中之基板W噴出第2處理液。第2噴嘴移動部49a與第1噴嘴移動部47a同樣地,使第2噴嘴49於處理位置與退避位置之間移動。具體而言,第2噴嘴移動部49a與第1噴嘴移動部47a同樣地,具有第2噴嘴臂491與第2噴嘴驅動部492。第2噴嘴臂491及第2噴嘴驅動部492之構成與第1噴嘴臂471及第1噴嘴驅動部472相同,因此省略說明。The second nozzle 49 supplies the second processing liquid to the substrate W from above the substrate W. As shown in FIG. Specifically, the second nozzle 49 sprays the second processing liquid toward the substrate W that is rotating. The 2nd nozzle moving part 49a moves the 2nd nozzle 49 between a processing position and a retracted position similarly to the 1st nozzle moving part 47a. Specifically, the second nozzle moving part 49a has the second nozzle arm 491 and the second nozzle driving part 492 similarly to the first nozzle moving part 47a. The configurations of the second nozzle arm 491 and the second nozzle drive unit 492 are the same as those of the first nozzle arm 471 and the first nozzle drive unit 472 , and therefore description thereof will be omitted.

第2處理液供給配管493向第2噴嘴49供給第2處理液。第2處理液供給配管493係供第2處理液流通之管狀構件。本實施方式中,第2處理液係鹼性液體。例如,第2處理液為氨水-過氧化氫水(SC1)、氨水、氟化銨溶液或四甲基氫氧化銨(TMAH)。The second processing liquid supply pipe 493 supplies the second processing liquid to the second nozzle 49 . The second processing liquid supply pipe 493 is a tubular member through which the second processing liquid flows. In this embodiment, the second treatment liquid is an alkaline liquid. For example, the second treatment liquid is ammonia water-hydrogen peroxide water (SC1), ammonia water, ammonium fluoride solution, or tetramethylammonium hydroxide (TMAH).

第3噴嘴51自基板W之上方向基板W供給第3處理液。詳細而言,第3噴嘴51向旋轉中之基板W噴出第3處理液。第3噴嘴移動部51a與第1噴嘴移動部47a同樣地,使第3噴嘴51於處理位置與退避位置之間移動。具體而言,第3噴嘴移動部51a與第1噴嘴移動部47a同樣地,具有第3噴嘴臂511與第3噴嘴驅動部512。第3噴嘴臂511及第3噴嘴驅動部512之構成與第1噴嘴臂471及第1噴嘴驅動部472相同,因此省略說明。The third nozzle 51 supplies the third processing liquid to the substrate W from above the substrate W. As shown in FIG. Specifically, the third nozzle 51 sprays the third processing liquid toward the substrate W that is rotating. The 3rd nozzle moving part 51a moves the 3rd nozzle 51 between a processing position and a retracted position similarly to the 1st nozzle moving part 47a. Specifically, the third nozzle moving part 51a has the third nozzle arm 511 and the third nozzle driving part 512 similarly to the first nozzle moving part 47a. The configurations of the third nozzle arm 511 and the third nozzle drive unit 512 are the same as those of the first nozzle arm 471 and the first nozzle drive unit 472 , and therefore description thereof will be omitted.

第3處理液供給配管513向第3噴嘴51供給第3處理液。第3處理液供給配管513係供第3處理液流通之管狀構件。本實施方式中,第3處理液係有機溶劑。例如,第3處理液為異丙醇(IPA)、甲醇、乙醇、氫氟醚(HFE)或丙酮。The third processing liquid supply pipe 513 supplies the third processing liquid to the third nozzle 51 . The third processing liquid supply pipe 513 is a tubular member through which the third processing liquid flows. In this embodiment, the third treatment liquid is an organic solvent. For example, the third treatment liquid is isopropanol (IPA), methanol, ethanol, hydrofluoroether (HFE), or acetone.

第4噴嘴53自基板W之上方向基板W供給沖洗液。詳細而言,第4噴嘴53向旋轉中之基板W噴出沖洗液。第4噴嘴移動部53a與第1噴嘴移動部47a同樣地,使第4噴嘴53於處理位置與退避位置之間移動。具體而言,第4噴嘴移動部53a與第1噴嘴移動部47a同樣地,具有第4噴嘴臂531與第4噴嘴驅動部532。第4噴嘴臂531及第4噴嘴驅動部532之構成與第1噴嘴臂471及第1噴嘴驅動部472相同,因此省略說明。The fourth nozzle 53 supplies the rinse liquid to the substrate W from above the substrate W. As shown in FIG. Specifically, the fourth nozzle 53 sprays the rinse liquid toward the substrate W that is rotating. The 4th nozzle moving part 53a moves the 4th nozzle 53 between a processing position and a retracted position similarly to the 1st nozzle moving part 47a. Specifically, the fourth nozzle moving part 53a has the fourth nozzle arm 531 and the fourth nozzle driving part 532 similarly to the first nozzle moving part 47a. The configurations of the fourth nozzle arm 531 and the fourth nozzle drive unit 532 are the same as those of the first nozzle arm 471 and the first nozzle drive unit 472 , and therefore description thereof will be omitted.

沖洗液供給配管533向第4噴嘴53供給沖洗液。沖洗液供給配管533係供沖洗液流通之管狀構件。例如,沖洗液為純水、碳酸水、電解離子水、氫水、臭氧水、或經過稀釋之鹽酸水。The rinse liquid supply pipe 533 supplies the rinse liquid to the fourth nozzle 53 . The flushing liquid supply pipe 533 is a tubular member through which the flushing liquid flows. For example, the flushing liquid is pure water, carbonated water, ionized water, hydrogen water, ozone water, or diluted hydrochloric acid water.

承杯55配置於基板保持部43之周圍。承杯55包圍保持於基板保持部43之基板W之側方。承杯55承接自旋轉中之基板W飛散之第1處理液~第3處理液、及沖洗液。The cup holder 55 is disposed around the substrate holding portion 43 . The cup 55 surrounds the side of the substrate W held by the substrate holding portion 43 . The cup 55 receives the first to third processing liquids and the rinse liquid scattered from the rotating substrate W.

其次,參照圖6對第1搬送機構7、第2搬送機構23L、23U、及基板載置部29L、29U進行說明。Next, the first conveying mechanism 7 , the second conveying mechanisms 23L, 23U, and the substrate mounting portions 29L, 29U will be described with reference to FIG. 6 .

圖6係表示第1搬送機構7、第2搬送機構23L、23U、及基板載置部29L、29U之側視圖。FIG. 6 is a side view showing the first conveyance mechanism 7 , the second conveyance mechanisms 23L, 23U, and the substrate mounting portions 29L, 29U.

如圖6所示,第1搬送機構7具備P個第1手9。於本說明書中,只要未特意明示,P即為2以上之整數,表示第1手9之總數。作為較佳之例,P個第1手9沿著上下方向DZ以相等間隔d配置。As shown in FIG. 6 , the first transport mechanism 7 includes P first hands 9 . In this specification, unless otherwise specified, P is an integer of 2 or more, representing the total number of 9 in the first lot. As a preferable example, P first hands 9 are arranged at equal intervals d along the vertical direction DZ.

各第1手9支持處理前之基板W、或處理後之基板W。各第1手9一次支持1片基板W。Each first hand 9 supports the substrate W before processing or the substrate W after processing. Each first hand 9 supports one substrate W at a time.

本實施方式中,作為一例,P=5,第1搬送機構7具備5個第1手9。In this embodiment, as an example, P=5, and the 1st conveyance mechanism 7 is provided with 5 1st hands 9. As shown in FIG.

第2搬送機構23L及第2搬送機構23U各自具備Q個第2手25。於本說明書中,只要未特意明示,Q即為3以上之整數,表示第2搬送機構23L及第2搬送機構23U各自之第2手25之總數。作為較佳之例,Q個第2手25沿著上下方向DZ以相等間隔d配置。即,上下方向DZ上鄰接之2個第2手25之上下方向DZ之間隔係間隔d。各第2手25一次支持1片基板W。Each of the second transport mechanism 23L and the second transport mechanism 23U includes Q second hands 25 . In this specification, unless otherwise specified, Q is an integer of 3 or more, and represents the total number of the second hands 25 of each of the second conveying mechanism 23L and the second conveying mechanism 23U. As a preferable example, Q second hands 25 are arranged at equal intervals d along the vertical direction DZ. That is, the interval in the vertical direction DZ of two second hands 25 adjacent to the vertical direction DZ is the interval d. Each second hand 25 supports one substrate W at a time.

例如,Q個第2手25中之一部分第2手25既可用於支持處理前之基板W之情形時,亦可用於支持處理後之基板W之情形時。For example, part of the second hands 25 among the Q second hands 25 may be used to support the substrate W before processing, or may be used to support the substrate W after processing.

例如,亦可為Q個第2手25中之一部分第2手25僅支持處理前之基板W,另一部分第2手25僅支持處理後之基板W。For example, one part of the Q second hands 25 supports only the substrate W before processing, and the other part of the second hands 25 supports only the substrate W after processing.

本實施方式中,作為一例,Q=4,第2搬送機構23L及第2搬送機構23U各自具備4個第2手25。In the present embodiment, as an example, Q=4, and each of the second conveyance mechanism 23L and the second conveyance mechanism 23U includes four second hands 25 .

以下,對於第2搬送機構23L及第2搬送機構23U各自之4個第2手25,分別由下而上依序記作第2手HA、第2手HB、第2手HC及第2手HD。Hereinafter, the four second hands 25 of the second conveying mechanism 23L and the second conveying mechanism 23U are respectively denoted as the second hand HA, the second hand HB, the second hand HC, and the second hand from bottom to top. HD.

基板載置部29L及基板載置部29U各自具備R個支持部291。於本說明書中,只要未特意明示,R即為2以上之整數,表示基板載置部29L及基板載置部29U各自之支持部291之總數。R例如為2以上之偶數。R個支持部291係沿著上下方向DZ隔開間隔而配置。作為較佳之例,R個支持部291沿著上下方向DZ以相等間隔d配置。即,上下方向DZ上鄰接之2個支持部291之上下方向DZ之間隔係間隔d。各支持部291支持1片基板W。具體而言,各支持部291將1片基板W以水平姿勢支持。Each of the substrate mounting portion 29L and the substrate mounting portion 29U includes R support portions 291 . In this specification, unless otherwise specified, R is an integer of 2 or greater, and represents the total number of support portions 291 of each of the substrate mounting portion 29L and the substrate mounting portion 29U. R is, for example, an even number of 2 or more. The R support portions 291 are arranged at intervals along the vertical direction DZ. As a preferred example, the R supporting parts 291 are arranged at equal intervals d along the vertical direction DZ. That is, the interval in the vertical direction DZ between two adjacent supporting parts 291 in the vertical direction DZ is the interval d. Each supporting portion 291 supports one substrate W. As shown in FIG. Specifically, each supporting portion 291 supports one substrate W in a horizontal posture.

作為較佳之例,支持部291之間隔d、第1手9之間隔d及第2手25之間隔d大致相等。As a preferable example, the distance d between the support parts 291, the distance d between the first hands 9 and the distance d between the second hands 25 are substantially equal.

本實施方式中,作為一例,基板載置部29L及基板載置部29U各自之下段291A之R/2個支持部291支持處理前之基板W,上段291B之R/2個支持部291支持處理後之基板W。In this embodiment, as an example, R/2 support parts 291 of the lower stage 291A of each of the substrate mounting part 29L and the substrate mounting part 29U support the substrate W before processing, and R/2 support parts 291 of the upper stage 291B support the processed substrate W. Substrate W afterwards.

又,本實施方式中,作為一例,R=20,基板載置部29L及基板載置部29U各自具備20個支持部291。In addition, in the present embodiment, R=20 as an example, and each of the substrate mounting portion 29L and the substrate mounting portion 29U includes 20 support portions 291 .

再者,第1手9之間隔並不特別限定,例如,亦可不為相等間隔,還可只有一部分為相等間隔。又,第2手25之間隔並不特別限定,例如,亦可不為相等間隔,還可只有一部分為相等間隔。進而,支持部291之間隔並不特別限定,例如,亦可不為相等間隔,還可只有一部分為相等間隔。進而,相互鄰接之支持部291之間隔、相互鄰接之第1手9之間隔及相互鄰接之第2手25之間隔亦可不相等。Furthermore, the intervals between the first hands 9 are not particularly limited, for example, they may not be equal intervals, and only part of them may be equal intervals. Also, the intervals between the second hands 25 are not particularly limited, for example, they may not be equal intervals, and only a part may be equal intervals. Furthermore, the intervals between the support parts 291 are not particularly limited, for example, the intervals may not be equal, and only part of them may be equal intervals. Furthermore, the distance between the adjacent supporting parts 291, the distance between the first hands 9 adjacent to each other, and the distance between the second hands 25 adjacent to each other may not be equal.

其次,參照圖7對本實施方式之第1基板搬送方法之一例進行說明。於圖7之說明中,無需指明特定之基板W之情形時,簡記作「基板」。Next, an example of the first substrate transfer method according to the present embodiment will be described with reference to FIG. 7 . In the description of FIG. 7 , when it is not necessary to specify a specific substrate W, it is simply referred to as "substrate".

第1基板搬送方法利用在基板載置部29與處理單元21之間搬送基板之第2搬送機構23來執行。於第1基板搬送方法中,處理前之基板與處理後之基板之間共用M個第2手25,藉此搬送複數片基板。於本說明書中,只要未特意明示,M即為1以上之整數。第1基板搬送方法相當於「基板搬送方法」之一例。The first substrate transfer method is performed by using the second transfer mechanism 23 that transfers the substrate between the substrate mounting unit 29 and the processing unit 21 . In the first substrate transfer method, M second hands 25 are shared between the unprocessed substrate and the processed substrate, thereby transferring a plurality of substrates. In this specification, unless otherwise specified, M is an integer of 1 or more. The first substrate transfer method corresponds to an example of the "substrate transfer method".

圖7係表示第1基板搬送方法之整個流程之一例之圖。於圖7中,為求簡單,著眼於配置在下段LW之基板載置部29L、配置在下段LW之第2搬送機構23L、及配置在下段LW之複數個處理單元21中之處理單元21A、21B進行說明。處理單元21A與處理單元21B配置於不同之位置。又,基板載置部29L之下段291A供載置處理前之基板,基板載置部29L之上段291B供載置處理後之基板。Fig. 7 is a diagram showing an example of the overall flow of the first substrate transfer method. In FIG. 7 , for the sake of simplicity, focus is placed on the substrate mounting portion 29L disposed in the lower LW, the second transport mechanism 23L disposed in the lower LW, and the processing unit 21A among the plurality of processing units 21 disposed in the lower LW, 21B for explanation. The processing unit 21A and the processing unit 21B are disposed in different positions. In addition, the lower stage 291A of the substrate mounting portion 29L is used for mounting the unprocessed substrate, and the upper portion 291B of the substrate mounting portion 29L is used for mounting the processed substrate.

又,於第1基板搬送方法之說明中,有時將第2手HA記作「第1非共用手HA」,將第2手HB記作「共用手HB」,將第2手HC記作「第2非共用手HC」。於圖7所示之例示性之第1基板搬送方法中,不使用第2手HD。Also, in the description of the first substrate transfer method, the second hand HA may be referred to as "the first non-shared hand HA", the second hand HB may be referred to as the "shared hand HB", and the second hand HC may be referred to as "Second non-shared hand HC". In the exemplary first substrate transfer method shown in FIG. 7 , the second hand HD is not used.

進而,於以下說明中,搬送循環CY表示如下順序之一輪動作:第2搬送機構23自基板載置部29接收未處理之基板,然後第2搬送機構23將未處理之基板向處理單元21搬入,並且第2搬送機構23自處理單元21搬出處理後之基板,然後第2搬送機構23將處理後之基板載置至基板載置部29。Furthermore, in the following description, the transfer cycle CY represents a round of operations in the following order: the second transfer mechanism 23 receives the unprocessed substrate from the substrate placement part 29, and then the second transfer mechanism 23 carries the unprocessed substrate into the processing unit 21 , and the second transport mechanism 23 unloads the processed substrate from the processing unit 21 , and then the second transport mechanism 23 places the processed substrate on the substrate mounting portion 29 .

如圖7所示,作為一例,於某個時序,於基板載置部29L之下段291A,沿著上下方向DZ載置有10片未處理之基板W1~W10,而於基板載置部29L之上段291B未載置基板。As shown in FIG. 7 , as an example, at a certain timing, 10 unprocessed substrates W1 to W10 are placed on the lower section 291A of the substrate mounting portion 29L along the up-down direction DZ, No substrate is placed on the upper stage 291B.

於第1基板搬送方法中,1個搬送循環CY內,第2搬送機構23L向2個處理單元21A、21B搬入2片未處理之基板W1、W2,並自2個處理單元21A、21B搬出2片處理後之基板WX1、WX2。搬送循環CY重複執行。In the first substrate transfer method, within one transfer cycle CY, the second transfer mechanism 23L carries in two unprocessed substrates W1, W2 to the two processing units 21A, 21B, and carries out two unprocessed substrates W1, W2 from the two processing units 21A, 21B. Substrates WX1 and WX2 after wafer processing. The transfer cycle CY is repeatedly executed.

具體而言,於第1基板搬送方法中,1個搬送循環CY內,第2搬送機構23L自基板載置部29L接收處理單元21A、21B加以處理前之2片基板W1、W2,並將2片基板W1、W2向複數個處理單元21中之2個處理單元21A、21B搬入,且自2個處理單元21A、21B搬出2個處理單元21A、21B加以處理後之2片基板WX1、WX2,並將2片基板WX1、WX2遞交至基板載置部29L。Specifically, in the first substrate transfer method, within one transfer cycle CY, the second transfer mechanism 23L receives the two substrates W1 and W2 before processing by the processing units 21A and 21B from the substrate mounting portion 29L, and transfers the two The substrates W1, W2 are carried into two processing units 21A, 21B among the plurality of processing units 21, and the two substrates WX1, WX2 processed by the two processing units 21A, 21B are carried out from the two processing units 21A, 21B, Then, the two substrates WX1 and WX2 are delivered to the substrate placement unit 29L.

更具體而言,4個第2手HA~HD包含第1非共用手HA、共用手HB及第2非共用手HC。共用手HB配置於第1非共用手HA與第2非共用手HC之間。共用手HB在第1特定方向SD1上鄰接於第2非共用手HC。第1非共用手HA在第1特定方向SD1上鄰接於共用手HB。More specifically, the four second hands HA to HD include the first unshared hand HA, the shared hand HB, and the second unshared hand HC. The shared hand HB is disposed between the first unshared hand HA and the second unshared hand HC. The shared hand HB is adjacent to the second non-shared hand HC in the first specific direction SD1. The first non-shared hand HA is adjacent to the shared hand HB in the first specific direction SD1.

第1特定方向SD1表示自第2非共用手HC朝向第1非共用手HA之方向。另一方面,第2特定方向SD2係第1特定方向SD1之相反方向,表示自第1非共用手HA朝向第2非共用手HC之方向。第1特定方向SD1及第2特定方向SD2與上下方向DZ大致平行。例如,第1特定方向SD1表示下方向,第2特定方向SD2表示上方向。The first specific direction SD1 indicates the direction from the second unshared hand HC toward the first unshared hand HA. On the other hand, the second specific direction SD2 is an opposite direction to the first specific direction SD1, and indicates a direction from the first unshared hand HA toward the second unshared hand HC. The first specific direction SD1 and the second specific direction SD2 are substantially parallel to the vertical direction DZ. For example, the first specific direction SD1 indicates the downward direction, and the second specific direction SD2 indicates the upward direction.

第1非共用手HA、共用手HB及第2非共用手HC係自第1非共用手HA至第2非共用手HC,沿著上下方向DZ連續地配置。The first unshared hand HA, the shared hand HB, and the second unshared hand HC are continuously arranged along the vertical direction DZ from the first unshared hand HA to the second unshared hand HC.

而且,於1個搬送循環CY內,第1非共用手HA僅支持處理單元21B加以處理前之基板W1。又,於1個搬送循環CY內,共用手HB於不同之時序支持由處理單元21A處理前之基板W2、及處理單元21B加以處理後之基板WX1。進而,於1個搬送循環CY內,第2非共用手HC僅支持處理單元21A加以處理後之基板WX2。And, in one conveyance cycle CY, the first non-shared hand HA supports only the substrate W1 before being processed by the processing unit 21B. Moreover, in one transfer cycle CY, the shared hand HB supports the substrate W2 before processing by the processing unit 21A and the substrate WX1 after processing by the processing unit 21B at different timings. Furthermore, in one conveyance cycle CY, the 2nd non-shared hand HC supports only the board|substrate WX2 processed by the processing unit 21A.

繼續參照圖7,對1個搬送循環CY內第2搬送機構23L之狀態ST1~ST4進行說明。Continuing to refer to FIG. 7 , states ST1 to ST4 of the second conveying mechanism 23L in one conveying cycle CY will be described.

於第2搬送機構23L已自基板載置部29L接收2片基板W1、W2之狀態ST1下,第2非共用手HC未支持基板W,而共用手HB及第1非共用手HA支持基板W1、W2。於第1基板搬送方法中,不使用第2手HD。In the state ST1 in which the second transport mechanism 23L has received the two substrates W1 and W2 from the substrate mounting section 29L, the substrate W is not supported by the second unshared hand HC, but the substrate W1 is supported by the shared hand HB and the first unshared hand HA. , W2. In the first board transfer method, the second hand HD is not used.

狀態ST1之後之狀態ST2表示由未支持基板之第2非共用手HC自處理單元21A搬出處理後之基板WX2,由共用手HB將處理前之基板W2搬入至同一個處理單元21A時第2搬送機構23L之狀態。The state ST2 following the state ST1 shows that the processed substrate WX2 is carried out from the processing unit 21A by the second non-shared hand HC that does not support the substrate, and the second conveyance occurs when the shared hand HB carries the unprocessed substrate W2 into the same processing unit 21A. The status of mechanism 23L.

狀態ST2之後之狀態ST3表示由在狀態ST2下未支持基板之共用手HB自處理單元21B搬出處理後之基板WX1,由第1非共用手HA將處理前之基板W1搬入至同一個處理單元21B時第2搬送機構23L之狀態。The state ST3 following the state ST2 shows that the shared hand HB that does not support the substrate in the state ST2 carries out the processed substrate WX1 from the processing unit 21B, and the unprocessed substrate W1 is carried into the same processing unit 21B by the first non-shared hand HA This is the state of the second conveying mechanism 23L.

狀態ST3之後之狀態ST4表示由共用手HB支持處理後之基板WX1,由第2非共用手HC支持處理後之基板WX2,而第1非共用手HA未支持基板時第2搬送機構23L之狀態。State ST4 following state ST3 represents the state of the second transport mechanism 23L when the shared hand HB supports the processed substrate WX1, the second non-shared hand HC supports the processed substrate WX2, and the first non-shared hand HA does not support the substrate. .

如以上參照圖7所說明般,根據本實施方式,基板處理裝置100之第2搬送機構23L具備於上下方向DZ上連續地配置之第1非共用手HA、共用手HB及第2非共用手HC。因此,對處理單元21A、21B執行基板W1、W2、WX1、WX2之搬出及搬入時,相較於處理前之基板與處理後之基板之間不共用手之情形而言,能縮短第1非共用手HA~第2非共用手HC(具體為第2手HA~HD)之上下方向DZ之移動距離。其結果,能提高第2搬送機構23L搬送基板W1、W2、WX1、WX2之動作之產能。參照圖8、圖9、圖11及圖12,列舉具體例對該點進行詳細說明。As described above with reference to FIG. 7 , according to the present embodiment, the second transport mechanism 23L of the substrate processing apparatus 100 includes the first unshared hand HA, the shared hand HB, and the second unshared hand arranged continuously in the vertical direction DZ. HC. Therefore, when the substrates W1 , W2 , WX1 , and WX2 are carried out and carried in to the processing units 21A, 21B, compared with the case where the substrates before processing and the substrates after processing do not share hands, the first non-stop time can be shortened. The moving distance of the shared hand HA to the second non-shared hand HC (specifically, the second hand HA to HD) in the up and down direction DZ. As a result, the throughput of the operation of transferring the substrates W1 , W2 , WX1 , and WX2 by the second transfer mechanism 23L can be improved. This point will be described in detail with reference to FIG. 8 , FIG. 9 , FIG. 11 , and FIG. 12 , citing specific examples.

其次,參照圖8及圖9對第1基板搬送方法之一例進行詳細說明。於以下說明中,表示第1非共用手HA、共用手HB、第2非共用手HC及第2手HD全體之情形時,為了避免冗長,有時記作第2手HA~HD。又,於無需指明特定之基板W之情形時,簡記作「基板」。Next, an example of the first substrate transfer method will be described in detail with reference to FIGS. 8 and 9 . In the following description, when all of the first unshared hand HA, the shared hand HB, the second unshared hand HC, and the second hand HD are shown, they are sometimes referred to as the second hands HA to HD in order to avoid redundancy. Also, when it is not necessary to designate a specific substrate W, it is simply referred to as "substrate".

圖8及圖9係表示第1基板搬送方法之一例之流程圖。如圖8及圖9所示,第1基板搬送方法於1個搬送循環CY內,包含步驟S1~步驟S12。於第1基板搬送方法中,不使用第2手HD。於步驟S1~步驟S12中,藉由受到控制部200控制之第2手驅動部17,第2手HA~HD得以移動。8 and 9 are flowcharts showing an example of the first substrate transfer method. As shown in FIGS. 8 and 9 , the first substrate transfer method includes step S1 to step S12 within one transfer cycle CY. In the first board transfer method, the second hand HD is not used. In steps S1 to S12, the second hands HA to HD are moved by the second hand drive unit 17 controlled by the control unit 200 .

如圖8所示,於步驟S1中,第1非共用手HA支持處理前之基板W1,共用手HB支持處理前之基板W2。另一方面,第2非共用手HC未支持基板。第2非共用手HC與處理單元21A之搬送口41a相對向。然後,第2非共用手HC開始向位於處理單元21A內部之處理後之基板WX2移動。As shown in FIG. 8 , in step S1 , the first non-shared hand HA supports the unprocessed substrate W1 , and the shared hand HB supports the unprocessed substrate W2 . On the other hand, the second non-shared hand HC does not support the substrate. The second non-shared hand HC faces the transfer port 41a of the processing unit 21A. Then, the second unshared hand HC starts moving toward the processed substrate WX2 located inside the processing unit 21A.

再者,步驟S1之第2手HA~HD之狀態表示圖7所示之狀態ST1之第2手HA~HD已移動至處理單元21A之位置之狀態。又,於基板WX2之處理中,搬送口41a被遮蔽構件(未圖示)堵塞。In addition, the state of the second hand HA-HD in step S1 represents the state in which the second hand HA-HD in the state ST1 shown in FIG. 7 has moved to the position of the processing unit 21A. In addition, during the processing of the substrate WX2, the transfer port 41a is blocked by a shielding member (not shown).

接著,於步驟S2中,第2非共用手HC通過搬送口41a,自處理單元21A搬出處理後之基板WX2。Next, in step S2, the 2nd non-shared hand HC carries out the processed board|substrate WX2 from the processing unit 21A through the conveyance port 41a.

接著,於步驟S3中,第2非共用手HC返回移動前之位置。然後,第2手HA~HD開始向第2特定方向SD2移動。Next, in step S3, the second non-shared hand HC returns to the position before the movement. Then, the second hands HA to HD start moving in the second specific direction SD2.

接著,於步驟S4中,第2手HA~HD向第2特定方向SD2移動距離d後停止。距離d大致等於第2非共用手HC與共用手HB之上下方向DZ之間隔d(圖6)。其結果,共用手HB與處理單元21A之搬送口41a相對向。然後,共用手HB開始向處理單元21A之內部移動。Next, in step S4, the second hands HA to HD move a distance d in the second specific direction SD2, and then stop. The distance d is approximately equal to the distance d between the second non-shared hand HC and the shared hand HB in the vertical direction DZ ( FIG. 6 ). As a result, the shared hand HB faces the transfer port 41a of the processing unit 21A. Then, the shared hand HB starts to move toward the inside of the processing unit 21A.

接著,於步驟S5中,共用手HB通過搬送口41a,向處理單元21A搬入處理前之基板W2。Next, in step S5, the common hand HB carries in the unprocessed substrate W2 into the processing unit 21A through the transfer port 41a.

接著,於步驟S6中,共用手HB返回移動前之位置。然後,第2手HA~HD開始向下一個處理單元21B(圖9)移動。Next, in step S6, the shared hand HB returns to the position before the movement. Then, the second hands HA to HD start moving to the next processing unit 21B (FIG. 9).

接著,如圖9所示,於步驟S7中,第1非共用手HA支持處理前之基板W1,第2非共用手HC支持處理後之基板WX2。另一方面,共用手HB未支持基板。共用手HB與處理單元21B之搬送口41a相對向。然後,共用手HB開始向位於處理單元21B內部之處理後之基板WX1移動。Next, as shown in FIG. 9 , in step S7 , the first unshared hand HA supports the unprocessed substrate W1 , and the second unshared hand HC supports the processed substrate WX2 . On the other hand, the shared hand HB does not support the substrate. The shared hand HB faces the transfer port 41a of the processing unit 21B. Then, the shared hand HB starts to move toward the processed substrate WX1 inside the processing unit 21B.

再者,步驟S7之第2手HA~HD之狀態表示圖8所示之步驟S6之狀態之第2手HA~HD已移動至處理單元21B之位置之狀態。又,於基板WX1之處理中,搬送口41a被遮蔽構件(未圖示)堵塞。In addition, the state of the second hand HA-HD in step S7 represents the state in which the second hand HA-HD in the state of step S6 shown in FIG. 8 has moved to the position of the processing unit 21B. In addition, during the processing of the substrate WX1, the transfer port 41a is blocked by a shielding member (not shown).

接著,於步驟S8中,共用手HB通過搬送口41a,自處理單元21B搬出處理後之基板WX1。Next, in step S8, the shared hand HB passes through the conveyance port 41a, and unloads the processed substrate WX1 from the processing unit 21B.

接著,於步驟S9中,共用手HB返回移動前之位置。然後,第2手HA~HD開始向第2特定方向SD2移動。Next, in step S9, the shared hand HB returns to the position before the movement. Then, the second hands HA to HD start moving in the second specific direction SD2.

接著,於步驟S10中,第2手HA~HD向第2特定方向SD2移動距離d後停止。距離d大致等於共用手HB與第1非共用手HA之上下方向DZ之間隔d(圖6)。其結果,第1非共用手HA與處理單元21B之搬送口41a相對向。然後,第1非共用手HA開始向處理單元21B之內部移動。Next, in step S10 , the second hands HA to HD move a distance d in the second specific direction SD2 and then stop. The distance d is approximately equal to the distance d between the shared hand HB and the first non-shared hand HA in the vertical direction DZ ( FIG. 6 ). As a result, the first non-shared hand HA faces the transfer port 41a of the processing unit 21B. Then, the first unshared hand HA starts to move to the inside of the processing unit 21B.

接著,於步驟S11中,第1非共用手HA通過搬送口41a,向處理單元21B搬入處理前之基板W1。Next, in step S11 , the first non-shared hand HA carries the unprocessed substrate W1 into the processing unit 21B through the transfer port 41 a.

接著,於步驟S12中,第1非共用手HA返回移動前之位置。然後,第2手HA~HD開始向基板載置部29L(圖7)移動。繼而,共用手HB及第2非共用手HC分別將基板WX1、WX2遞交至基板載置部29L。Next, in step S12, the first unshared hand HA returns to the position before the movement. Then, the second hands HA to HD start moving to the board mounting portion 29L ( FIG. 7 ). Next, the shared hand HB and the second non-shared hand HC deliver the substrates WX1 and WX2 to the substrate placement unit 29L, respectively.

綜上所述,如圖8及圖9所示,於1個搬送循環CY內,執行步驟S1~步驟S12。其結果,於1個搬送循環CY內,能向2個處理單元21A、21B搬入2片未處理之基板W1、W2,並自2個處理單元21A、21B搬出2片處理後之基板WX1、WX2。In summary, as shown in FIGS. 8 and 9 , within one conveyance cycle CY, steps S1 to S12 are executed. As a result, in one transfer cycle CY, two unprocessed substrates W1, W2 can be loaded into the two processing units 21A, 21B, and two processed substrates WX1, WX2 can be unloaded from the two processing units 21A, 21B. .

特別值得一提的是,於本實施方式中,共用手HB於向處理單元21A搬入處理前之基板W2之動作與自處理單元21B搬出處理後之基板WX1之動作之間係共用的。因此,可朝向第1特定方向SD1,由第2非共用手HC至第1非共用手HA地,將其等依序用於基板WX2、WX1之搬出與基板W1、W2之搬入。It is particularly worth mentioning that in this embodiment, the common hand HB is shared between the operation of loading the unprocessed substrate W2 into the processing unit 21A and the operation of unloading the processed substrate WX1 from the processing unit 21B. Therefore, toward the first specific direction SD1, from the second unshared hand HC to the first unshared hand HA, they can be sequentially used for carrying out the substrates WX2, WX1 and carrying in the substrates W1, W2.

其結果,若欲於完成自處理單元21A搬出處理後之基板WX2之動作後,向同一個處理單元21A搬入處理前之基板W2,則共用手HB只要向第2特定方向SD2移動距離d(第2非共用手HC與共用手HB之間隔d)即可。同樣地,若欲於完成自處理單元21B搬出處理後之基板WX1之動作後,向同一個處理單元21B搬入處理前之基板W1,則第1非共用手HA只要向第2特定方向SD2移動距離d(共用手HB與第1非共用手HA之間隔d)即可。因此,相較於處理前之基板與處理後之基板之間不共用手之情形而言,能提高第2搬送機構23L搬送基板W1、W2、WX1、WX2之動作之產能。以下將與圖11及圖12所示之第2基板搬送方法比較而詳細說明該點。As a result, if it is desired to carry in the unprocessed substrate W2 to the same processing unit 21A after completing the operation of unloading the processed substrate WX2 from the processing unit 21A, the shared hand HB only needs to move the distance d to the second specific direction SD2 (the first 2 The distance d) between the non-shared hand HC and the shared hand HB is sufficient. Similarly, if it is desired to load the unprocessed substrate WX1 into the same processing unit 21B after the operation of unloading the processed substrate WX1 from the processing unit 21B, the first non-shared hand HA only needs to move the distance in the second specific direction SD2 d (distance d between the shared hand HB and the first non-shared hand HA) is enough. Therefore, compared with the case where the unprocessed substrate and the processed substrate do not share hands, the throughput of the operation of the second conveyance mechanism 23L to convey the substrates W1 , W2 , WX1 , and WX2 can be improved. This point will be described in detail below in comparison with the second substrate transfer method shown in FIGS. 11 and 12 .

又,於本實施方式中,就第1基板搬送方法而言,搬送循環CY(步驟S1~步驟S12)係一面變更處理單元21一面重複執行。In addition, in the present embodiment, in the first substrate transfer method, the transfer cycle CY (step S1 to step S12 ) is repeatedly executed while changing the processing unit 21 .

再者,第2搬送機構23U(圖6)與第2搬送機構23L同樣地,執行第1基板搬送方法。In addition, the 2nd conveyance mechanism 23U (FIG. 6) performs the 1st board|substrate conveyance method similarly to 23 L of 2nd conveyance mechanisms.

其次,參照圖10對本實施方式之第2基板搬送方法之一例進行說明。第2基板搬送方法利用在基板載置部29與處理單元21之間搬送基板W之第2搬送機構23來執行。於第2基板搬送方法中,Q個第2手25中,上下方向DZ上連續之一部分第2手25僅支持處理前之基板W,上下方向DZ上連續之另一部分第2手25僅支持處理後之基板W,藉此搬送複數片基板W。因此,於第2基板搬送方法中,處理後之基板W與處理前之基板W之間不共用第2手25。Next, an example of the second substrate transfer method according to this embodiment will be described with reference to FIG. 10 . The second substrate transfer method is performed using the second transfer mechanism 23 that transfers the substrate W between the substrate mounting unit 29 and the processing unit 21 . In the second substrate transfer method, among the Q second hands 25, one part of the second hands 25 continuous in the vertical direction DZ supports only the substrate W before processing, and the other part of the second hands 25 continuous in the vertical direction DZ supports only the processing Subsequent to the substrate W, a plurality of substrates W is conveyed by this. Therefore, in the second substrate transfer method, the second hand 25 is not shared between the substrate W after processing and the substrate W before processing.

圖10係表示第2基板搬送方法之整個流程之一例之圖。於圖10中,與圖7所示之情形同樣地,著眼於基板載置部29L、第2搬送機構23L、及處理單元21A、21B進行了圖示。又,基板載置部29L之下段291A供載置處理前之基板,基板載置部29L之上段291B供載置處理後之基板。進而,第2基板搬送方法中搬送循環CY之定義與第1基板搬送方法中搬送循環CY之定義相同。Fig. 10 is a diagram showing an example of the overall flow of the second substrate transfer method. In FIG. 10, similarly to the case shown in FIG. 7, it shows focusing on the board|substrate mounting part 29L, the 2nd conveyance mechanism 23L, and processing unit 21A, 21B. In addition, the lower stage 291A of the substrate mounting portion 29L is used for mounting the unprocessed substrate, and the upper portion 291B of the substrate mounting portion 29L is used for mounting the processed substrate. Furthermore, the definition of the transfer cycle CY in the second substrate transfer method is the same as the definition of the transfer cycle CY in the first substrate transfer method.

如圖10所示,作為一例,於某個時序,於基板載置部29L之下段291A,沿著上下方向DZ載置有10片未處理之基板W1~W10,而於基板載置部29L之上段291B未載置基板。As shown in FIG. 10 , as an example, at a certain timing, 10 unprocessed substrates W1 to W10 are placed on the lower section 291A of the substrate mounting portion 29L along the up-down direction DZ, No substrate is placed on the upper stage 291B.

於第2基板搬送方法中,與第1基板搬送方法同樣地,1個搬送循環CY內,第2搬送機構23L自基板載置部29L接收處理單元21A、21B加以處理前之2片基板W1、W2,並將2片基板W1、W2向複數個處理單元21中之2個處理單元21A、21B搬入,且自2個處理單元21A、21B搬出2個處理單元21A、21B加以處理後之2片基板WX1、WX2,並將2片基板WX1、WX2遞交至基板載置部29L。搬送循環CY重複執行。In the second substrate transfer method, similarly to the first substrate transfer method, within one transfer cycle CY, the second transfer mechanism 23L receives the two substrates W1, W1, W2, and carry two substrates W1, W2 into two processing units 21A, 21B among the plurality of processing units 21, and carry out two processing units 21A, 21B from the two processing units 21A, 21B for processing. The substrates WX1 and WX2 are delivered, and the two substrates WX1 and WX2 are delivered to the substrate placement unit 29L. The transfer cycle CY is repeatedly executed.

具體而言,於第2基板搬送方法中,1個搬送循環CY內,4個第2手HA~HD中,下段之上下方向DZ上連續之第2手HA、HB僅支持未處理之基板W1、W2。又,上段之上下方向DZ上連續之第2手HC、HD僅支持處理後之基板WX1、WX2。Specifically, in the second substrate transfer method, within one transfer cycle CY, among the four second hands HA to HD, the second hands HA, HB that are continuous in the vertical direction DZ of the lower stage support only the unprocessed substrate W1 , W2. Also, the second hands HC and HD that are continuous in the upper and lower directions DZ support only the processed substrates WX1 and WX2.

繼續參照圖10,對1個搬送循環CY內第2搬送機構23L之狀態ST11~ST14進行說明。Continuing to refer to FIG. 10 , states ST11 to ST14 of the second conveying mechanism 23L in one conveying cycle CY will be described.

於第2搬送機構23L已自基板載置部29L接收2片基板W1、W2之狀態ST11下,第2手HA、HB分別支持基板W1、W2,而第2手HC、HD未支持基板。In the state ST11 where the second transport mechanism 23L has received the two substrates W1 and W2 from the substrate mounting section 29L, the second hands HA and HB hold the substrates W1 and W2 respectively, while the second hands HC and HD do not hold the substrate.

狀態ST11之後之狀態ST12表示由第2手HD自處理單元21A搬出處理後之基板WX2,由第2手HB將處理前之基板W2搬入至同一個處理單元21A時第2搬送機構23L之狀態。The state ST12 following the state ST11 shows the state of the second transport mechanism 23L when the second hand HD unloads the processed substrate WX2 from the processing unit 21A, and the second hand HB carries the unprocessed substrate W2 into the same processing unit 21A.

狀態ST12之後之狀態ST13表示由第2手HC自處理單元21B搬出處理後之基板WX1,由第2手HA將處理前之基板W1搬入至同一個處理單元21B時第2搬送機構23L之狀態。The state ST13 following the state ST12 shows the state of the second transport mechanism 23L when the second hand HC unloads the processed substrate WX1 from the processing unit 21B, and the second hand HA carries the unprocessed substrate W1 into the same processing unit 21B.

狀態ST13之後之狀態ST14表示由第2手HC、HD支持處理後之基板WX1、WX2,而第2手HA、HB未支持基板時第2搬送機構23L之狀態。A state ST14 following the state ST13 shows the state of the second transport mechanism 23L when the processed substrates WX1 and WX2 are supported by the second hands HC and HD, but not supported by the second hands HA and HB.

如以上參照圖10所說明般,根據本實施方式,基板處理裝置100之第2搬送機構23L具備:用以支持處理前之基板W1、W2之專用之第2手HA、HB;及用以支持處理後之基板WX1、WX2之專用之第2手HC、HD。因此,能抑制處理單元21中之處理液經由處理後之基板WX1、WX2附著於第2手HA、HB。進而,能抑制新支持於第2手HA、HB之處理前之基板上附著處理液。As described above with reference to FIG. 10 , according to the present embodiment, the second transport mechanism 23L of the substrate processing apparatus 100 includes: dedicated second hands HA, HB for supporting the unprocessed substrates W1, W2; Second-hand HC and HD dedicated to processed substrates WX1 and WX2. Therefore, it is possible to suppress the processing liquid in the processing unit 21 from adhering to the second hands HA, HB via the processed substrates WX1, WX2. Furthermore, it is possible to suppress the adhesion of the treatment liquid to the newly supported substrate before the treatment of the second hand HA and HB.

其次,參照圖11及圖12對第2基板搬送方法之一例進行詳細說明。於以下說明中,無需指明特定之基板W之情形時,簡記作「基板」。Next, an example of the second substrate transfer method will be described in detail with reference to FIGS. 11 and 12 . In the following description, when it is not necessary to specify a specific substrate W, it is simply referred to as "substrate".

圖11及圖12係表示第2基板搬送方法之一例之流程圖。如圖11及圖12所示,第2基板搬送方法於1個搬送循環CY內,包含步驟S21~步驟S32。於步驟S21~步驟S32中,藉由受到控制部200控制之第2手驅動部17,第2手HA~HD得以移動。11 and 12 are flowcharts showing an example of the second substrate transfer method. As shown in FIGS. 11 and 12 , the second substrate transfer method includes step S21 to step S32 within one transfer cycle CY. In steps S21 to S32, the second hands HA to HD are moved by the second hand drive unit 17 controlled by the control unit 200 .

如圖11所示,於步驟S21中,第2手HA、HB分別支持處理前之基板W1、W2。另一方面,第2手HC、HD未支持基板。第2手HD與處理單元21A之搬送口41a相對向。然後,第2手HD開始向位於處理單元21A內部之處理後之基板WX2移動。As shown in FIG. 11 , in step S21 , the second hands HA and HB support the substrates W1 and W2 before processing, respectively. On the other hand, the second-hand HC and HD did not support the substrate. The second hand HD faces the transfer port 41a of the processing unit 21A. Then, the second hand HD starts to move toward the processed substrate WX2 inside the processing unit 21A.

再者,步驟S21之第2手HA~HD之狀態表示圖10所示之狀態ST11之第2手HA~HD已移動至處理單元21A之位置之狀態。In addition, the state of the second hand HA-HD in step S21 represents the state in which the second hand HA-HD in the state ST11 shown in FIG. 10 has moved to the position of the processing unit 21A.

接著,於步驟S22中,第2手HD通過搬送口41a,自處理單元21A搬出處理後之基板WX2。Next, in step S22, the second hand HD passes through the conveyance port 41a, and carries out the processed substrate WX2 from the processing unit 21A.

接著,於步驟S23中,第2手HD返回移動前之位置。然後,第2手HA~HD開始向第2特定方向SD2移動。Next, in step S23, the second hand HD returns to the position before the movement. Then, the second hands HA to HD start moving in the second specific direction SD2.

接著,於步驟S24中,第2手HA~HD向第2特定方向SD2移動距離2d(=2×d)後停止。距離2d大致等於第2手HD與第2手HB之上下方向DZ之間隔2d(圖6)。其結果,第2手HB與處理單元21A之搬送口41a相對向。然後,第2手HB開始向處理單元21A之內部移動。Next, in step S24, the second hands HA to HD move a distance of 2d (=2×d) in the second specific direction SD2 and then stop. The distance 2d is approximately equal to the distance 2d between the second hand HD and the second hand HB in the vertical direction DZ ( FIG. 6 ). As a result, the second hand HB faces the transfer port 41a of the processing unit 21A. Then, the second hand HB starts to move to the inside of the processing unit 21A.

接著,於步驟S25中,第2手HB通過搬送口41a,向處理單元21A搬入處理前之基板W2。Next, in step S25, the second hand HB carries in the unprocessed substrate W2 into the processing unit 21A through the transfer port 41a.

接著,於步驟S26中,第2手HB返回移動前之位置。然後,第2手HA~HD開始向下一個處理單元21B(圖12)移動。Next, in step S26, the second hand HB returns to the position before the movement. Then, the second hands HA to HD start moving to the next processing unit 21B (FIG. 12).

接著,如圖12所示,於步驟S27中,第2手HA支持處理前之基板W1,而第2手HB未支持基板。另一方面,第2手HC未支持基板,而第2手HD支持處理後之基板WX2。第2手HC與處理單元21B之搬送口41a相對向。然後,第2手HC開始向位於處理單元21B內部之處理後之基板WX1移動。Next, as shown in FIG. 12 , in step S27 , the second hand HA supports the substrate W1 before processing, while the second hand HB does not support the substrate. On the other hand, the 2nd hand HC did not support the substrate, while the 2nd hand HD supported the processed substrate WX2. The second hand HC faces the transfer port 41a of the processing unit 21B. Then, the second hand HC starts moving toward the processed substrate WX1 located inside the processing unit 21B.

再者,步驟S27之第2手HA~HD之狀態表示圖11所示之步驟S26之狀態之第2手HA~HD已移動至處理單元21B之位置之狀態。In addition, the state of the second hand HA-HD in step S27 represents the state in which the second hand HA-HD in the state of step S26 shown in FIG. 11 has moved to the position of the processing unit 21B.

接著,於步驟S28中,第2手HC通過搬送口41a,自處理單元21B搬出處理後之基板WX1。Next, in step S28, the 2nd hand HC carries out the processed board|substrate WX1 from the processing unit 21B through the conveyance port 41a.

接著,於步驟S29中,第2手HC返回移動前之位置。然後,第2手HA~HD開始向第2特定方向SD2移動。Next, in step S29, the second hand HC returns to the position before the movement. Then, the second hands HA to HD start moving in the second specific direction SD2.

接著,於步驟S30中,第2手HA~HD向第2特定方向SD2移動距離2d(=2×d)後停止。距離2d大致等於第2手HC與第2手HA之上下方向DZ之間隔2d(圖6)。其結果,第2手HA與處理單元21B之搬送口41a相對向。然後,第2手HA開始向處理單元21B之內部移動。Next, in step S30 , the second hands HA to HD move a distance of 2d (=2×d) in the second specific direction SD2 and then stop. The distance 2d is approximately equal to the distance 2d between the second hand HC and the second hand HA in the vertical direction DZ ( FIG. 6 ). As a result, the second hand HA faces the transfer port 41a of the processing unit 21B. Then, the second hand HA starts to move to the inside of the processing unit 21B.

接著,於步驟S31中,第2手HA通過搬送口41a,向處理單元21B搬入處理前之基板W1。Next, in step S31, the second hand HA carries in the unprocessed substrate W1 into the processing unit 21B through the transfer port 41a.

接著,於步驟S32中,第2手HA返回移動前之位置。然後,第2手HA~HD開始向基板載置部29L(圖10)移動。繼而,第2手HC、HD分別將基板WX1、WX2遞交至基板載置部29L。Next, in step S32, the second hand HA returns to the position before the movement. Then, the second hands HA to HD start moving to the board mounting portion 29L ( FIG. 10 ). Next, the second hands HC and HD deliver the substrates WX1 and WX2 to the substrate placement unit 29L, respectively.

綜上所述,如圖11及圖12所示,於1個搬送循環CY內,執行步驟S21~步驟S32。其結果,於1個搬送循環CY內,可由第2手HA、HB對2個處理單元21A、21B搬入2片未處理之基板W1、W2,並由第2手HC、HD自2個處理單元21A、21B搬出2片處理後之基板WX1、WX2。In summary, as shown in FIGS. 11 and 12 , within one conveyance cycle CY, steps S21 to S32 are executed. As a result, in one transfer cycle CY, two unprocessed substrates W1, W2 can be loaded into the two processing units 21A, 21B by the second hands HA, HB, and can be loaded from the two processing units by the second hands HC, HD. 21A, 21B carry out two processed substrates WX1, WX2.

又,於本實施方式中,第2基板搬送方法乃一面變更處理單元21,一面重複執行搬送循環CY(步驟S21~步驟S32)。In addition, in the present embodiment, the second substrate transfer method is to repeatedly execute the transfer cycle CY (step S21 to step S32 ) while changing the processing unit 21 .

再者,第2搬送機構23U(圖6)與第2搬送機構23L同樣地,執行第2基板搬送方法。In addition, the 2nd conveyance mechanism 23U (FIG. 6) performs the 2nd board|substrate conveyance method similarly to 23 L of 2nd conveyance mechanisms.

此處,參照圖8及圖11,比較第1基板搬送方法與第2基板搬送方法。如圖8之步驟S3、S4所示,共用手HB之上下方向DZ之移動距離為「d」。另一方面,如圖11之步驟S23、S24所示,第2手HB之移動距離為「2d」。因此,第1基板搬送方法中之共用手HB之移動距離d小於第2基板搬送方法中之第2手HB之移動距離2d。同樣地,如圖9之步驟S9、S10及圖12之步驟S29、S30所示,第1基板搬送方法中之第1非共用手HA之移動距離d小於第2基板搬送方法中之第2手HA之移動距離2d。Here, referring to FIG. 8 and FIG. 11 , the first substrate transfer method and the second substrate transfer method will be compared. As shown in steps S3 and S4 of FIG. 8 , the moving distance of the shared hand HB in the up and down direction DZ is "d". On the other hand, as shown in steps S23 and S24 of FIG. 11, the moving distance of the second hand HB is "2d". Therefore, the movement distance d of the shared hand HB in the first substrate transfer method is smaller than the movement distance 2d of the second hand HB in the second substrate transfer method. Similarly, as shown in steps S9 and S10 of FIG. 9 and steps S29 and S30 of FIG. 12 , the moving distance d of the first non-shared hand HA in the first substrate transfer method is smaller than that of the second hand in the second substrate transfer method. The moving distance of HA is 2d.

其結果,於第1基板搬送方法中,與第2基板搬送方法相比,能提高第2搬送機構23對基板W1、W2、WX1、WX2之搬送動作之產能。即,於第1基板搬送方法中,相較於處理前之基板與處理後之基板不共用手之情形而言,能提高第2搬送機構23對基板W1、W2、WX1、WX2之搬送動作之產能。As a result, in the first substrate conveyance method, compared with the second substrate conveyance method, the throughput of the conveyance operation of the substrates W1, W2, WX1, and WX2 by the second conveyance mechanism 23 can be improved. That is, in the first substrate transfer method, compared with the case where the substrate before processing and the substrate after processing do not share hands, the second transfer mechanism 23 can improve the transfer operation of the substrates W1, W2, WX1, WX2. production capacity.

例如,於第1基板搬送方法中,與第2基板搬送方法相比,相對於1個處理單元21,第2手HA~HD之上下方向DZ之移動距離短了「d」。而且,因搬送循環CY會重複執行,故相對於1個處理單元21移動距離縮短「d」對提高第2搬送機構23搬送基板之動作之產能有用。For example, in the first substrate transfer method, compared with the second substrate transfer method, the moving distance of the second hands HA to HD in the vertical direction DZ is shorter by "d" with respect to one processing unit 21 . Furthermore, since the transfer cycle CY is repeatedly executed, shortening the moving distance "d" relative to one processing unit 21 is useful for improving the throughput of the second transfer mechanism 23 for transferring substrates.

以上,參照圖7~圖12對第1基板搬送方法及第2基板搬送方法進行了說明。例如,設定為第2搬送機構23執行第1基板搬送方法及第2基板搬送方法任一者後,基板處理裝置100被廠商交付給使用者。即,對基板處理裝置100安裝第1基板搬送方法及第2基板搬送方法任一者。As above, the first substrate transfer method and the second substrate transfer method have been described with reference to FIGS. 7 to 12 . For example, it is assumed that the substrate processing apparatus 100 is delivered to the user by the manufacturer after the second transport mechanism 23 executes either the first substrate transport method or the second substrate transport method. That is, either one of the first substrate transfer method and the second substrate transfer method is installed in the substrate processing apparatus 100 .

但亦可對基板處理裝置100安裝第1基板搬送方法及第2基板搬送方法兩者,而選擇性地執行第1基板搬送方法及第2基板搬送方法。該情形時,使用者可視狀況選擇理想之基板搬送方法。其結果,能提高使用者之便利性。However, both the first substrate transfer method and the second substrate transfer method may be installed in the substrate processing apparatus 100 to selectively execute the first substrate transfer method and the second substrate transfer method. In this case, the user can select an ideal substrate transfer method depending on the situation. As a result, user convenience can be improved.

於以上參照圖7~圖9例示性地說明之第1基板搬送方法中,使用了3個第2手25。但第1基板搬送方法並不限定於使用3個第2手25之情形,而可如圖13所示予以泛化。又,於以下說明中,將1個搬送循環CY內被執行基板W之搬入及搬出之處理單元21之數量記作「N」。於本說明書中,只要未特意明示,N即為2以上之整數。著眼於N個處理單元21進行說明。又,為了讓讀者容易理解,著眼於複數個(Q個)第2手25中用於第1基板搬送方法之N+1個第2手25進行說明。In the first substrate transfer method exemplarily described with reference to FIGS. 7 to 9 , three second hands 25 are used. However, the first substrate transfer method is not limited to the case where three second hands 25 are used, but can be generalized as shown in FIG. 13 . In addition, in the following description, the number of processing units 21 to which substrates W are carried in and carried out in one conveyance cycle CY is represented as "N". In this specification, N is an integer of 2 or more unless otherwise specified. The description will focus on N processing units 21 . In addition, in order to facilitate the reader's understanding, the description will focus on N+1 second hands 25 used in the first substrate transfer method among the plurality of (Q) second hands 25 .

圖13係用以將第1基板搬送方法泛化而加以說明之圖。圖13中示出了複數個第2搬送機構23中之1個第2搬送機構23。如圖13所示,於第1基板搬送方法中,1個搬送循環CY內,第2搬送機構23自基板載置部29接收處理單元21加以處理前之N片基板W,並將N片基板W向複數個處理單元21中之N個處理單元21_1~21_N搬入,且自N個處理單元21_1~21_N搬出N個處理單元21_1~21_N加以處理後之N片基板W,並將N片處理後之基板W遞交至基板載置部29。FIG. 13 is a diagram for explaining generalization of the first substrate transfer method. In FIG. 13, one 2nd conveyance mechanism 23 among several 2nd conveyance mechanisms 23 is shown. As shown in FIG. 13 , in the first substrate transfer method, within one transfer cycle CY, the second transfer mechanism 23 receives N substrates W from the substrate mounting portion 29 before being processed by the processing unit 21, and transfers the N substrates W is loaded into the N processing units 21_1-21_N among the plurality of processing units 21, and N pieces of substrates W processed by the N processing units 21_1-21_N are taken out from the N processing units 21_1-21_N, and the N pieces of substrates W are processed The substrate W is delivered to the substrate mounting part 29 .

再者,N個處理單元21_1~21_N可為基板處理裝置100所具備之複數個處理單元21中之一部分處理單元21(處理單元21之總數>N),亦可為所有處理單元21(處理單元21之總數=N)。Furthermore, the N processing units 21_1˜21_N may be some processing units 21 (the total number of processing units 21 > N) among the plurality of processing units 21 possessed by the substrate processing apparatus 100, or all processing units 21 (processing units Total number of 21 = N).

複數個第2手25包含第1非共用手H_F、M個共用手H_1~H_M、及第2非共用手H_S。M係1以上之整數。M個共用手H_1~H_M配置於第1非共用手H_F與第2非共用手H_S之間。The plurality of second hands 25 include a first unshared hand H_F, M shared hands H_1 to H_M, and a second unshared hand H_S. M is an integer of 1 or more. The M shared hands H_1 to H_M are arranged between the first unshared hand H_F and the second unshared hand H_S.

第1非共用手H_F、M個共用手H_1~H_M、及第2非共用手H_S之合計個數係N+1個。又,M=N-1。即,第2搬送機構23具備N-1個共用手H_1~H_M。The total number of the first unshared hand H_F, the M shared hands H_1 to H_M, and the second unshared hand H_S is N+1. Also, M=N-1. That is, the 2nd conveyance mechanism 23 is equipped with N-1 shared hands H_1-H_M.

再者,N+1個第2手25(第1非共用手H_F、共用手H_1~H_M、及第2非共用手H_S)可為第2搬送機構23所具備之複數個(Q個)第2手25中之一部分第2手25,亦可為所有第2手25。Furthermore, the N+1 second hands 25 (the first non-shared hands H_F, the shared hands H_1 to H_M, and the second non-shared hands H_S) can be a plurality of (Q) second hands possessed by the second transport mechanism 23 Part of the 25 in the second hand 25, or all the 25 in the second hand.

第1非共用手H_F、M個共用手H_1~H_M、及第2非共用手H_S係自第1非共用手H_F至第2非共用手H_S,沿著上下方向DZ連續地配置。The first unshared hand H_F, the M shared hands H_1 to H_M, and the second unshared hand H_S are continuously arranged along the vertical direction DZ from the first unshared hand H_F to the second unshared hand H_S.

而且,於第2搬送機構23已自基板載置部29接收處理前之N片基板W之狀態下,第2非共用手H_S未支持基板W,而M個共用手H_1~H_M、及第1非共用手H_F支持基板W。即,M個共用手H_1~H_M、及第1非共用手H_F支持N片基板W。Moreover, in the state where the second conveying mechanism 23 has received N substrates W before processing from the substrate mounting section 29, the second non-shared hand H_S does not support the substrate W, and the M shared hands H_1 to H_M, and the first The substrate W is supported by the non-shared hand H_F. That is, the M shared hands H_1 to H_M and the first unshared hand H_F support N substrates W. FIG.

於1個搬送循環CY內,M個共用手H_1~H_M於不同之時序支持處理單元21加以處理前之基板W與處理後之基板W。In one transfer cycle CY, the M shared hands H_1 ˜ H_M support the processing unit 21 at different timings to process the substrate W before processing and the substrate W after processing.

於1個搬送循環CY內,第1非共用手H_F僅支持處理單元21加以處理前之基板W。In one transfer cycle CY, the first unshared hand H_F supports only the substrate W before being processed by the processing unit 21 .

於1個搬送循環CY內,第2非共用手H_S僅支持處理單元21加以處理後之基板W。In one transfer cycle CY, the second unshared hand H_S supports only the substrate W processed by the processing unit 21 .

繼續參照圖13,對第1基板搬送方法中第2搬送機構23之動作進行詳細說明。Continuing to refer to FIG. 13 , the operation of the second transfer mechanism 23 in the first substrate transfer method will be described in detail.

於1個搬送循環CY內,M個共用手H_1~H_M、及第1非共用手H_F各自從基板載置部29接收處理前之基板W。In one transfer cycle CY, each of the M shared hands H_1 to H_M and the first unshared hand H_F receives the unprocessed substrate W from the substrate placement unit 29 .

於1個搬送循環CY內,第2非共用手H_S移動至與處理單元21_1之搬送口41a相對向之位置,而自處理單元21_1搬出處理後之基板W。In one transfer cycle CY, the second non-shared hand H_S moves to a position facing the transfer port 41a of the processing unit 21_1, and the processed substrate W is carried out from the processing unit 21_1.

於1個搬送循環CY內,藉由使N+1個第2手25向第2特定方向SD2移動距離d,M個共用手H_1~H_M中鄰接於第2非共用手H_S之共用手H_M移動至與處理單元21_1之搬送口41a相對向之位置。距離d表示上下方向DZ上鄰接之第2手25之間隔。然後,共用手H_M向已被第2非共用手H_S搬出基板W之處理單元21_1,搬入處理前之基板W。處理單元21_1處理基板W。In one conveying cycle CY, by moving the N+1 second hands 25 to the second specified direction SD2 for a distance d, the shared hand H_M adjacent to the second non-shared hand H_S among the M shared hands H_1 to H_M moves to the same position as the second non-shared hand H_S. The position where the transfer port 41a of the processing unit 21_1 faces. The distance d represents the interval between the adjacent second hands 25 in the vertical direction DZ. Then, the shared hand H_M carries the unprocessed substrate W into the processing unit 21_1 from which the substrate W has been carried out by the second non-shared hand H_S. The processing unit 21_1 processes the substrate W.

於1個搬送循環CY內,藉由使N+1個第2手25移動,鄰接於第2非共用手H_S之共用手H_M移動至與處理單元21_2之搬送口41a相對向之位置,處理單元21_2係與已被共用手H_M搬入處理前之基板W之處理單元21_1不同之處理單元。然後,共用手H_M自處理單元21_2搬出處理後之基板W。In one transfer cycle CY, by moving N+1 second hands 25, the shared hand H_M adjacent to the second non-shared hand H_S moves to a position opposite to the transfer port 41a of the processing unit 21_2, and the processing unit 21_2 is A processing unit different from the processing unit 21_1 of the pre-processed substrate W carried in by the common hand H_M. Then, the shared hand H_M unloads the processed substrate W from the processing unit 21_2.

於1個搬送循環CY內,藉由使N+1個第2手25向第2特定方向SD2移動距離d,M個共用手H_1~H_M中鄰接於共用手H_M之共用手H_M-1移動至與處理單元21_2之搬送口41a相對向之位置。共用手H_M-1在第1特定方向SD1上鄰接於共用手H_M。然後,共用手H_M-1向已被共用手H_M搬出基板W之處理單元21_2,搬入處理前之基板W。處理單元21_2處理基板W。In one conveying cycle CY, by moving the N+1 second hands 25 to the second specific direction SD2 for a distance d, the shared hand H_M-1 adjacent to the shared hand H_M among the M shared hands H_1 to H_M moves to and processes The position where the transfer port 41a of the unit 21_2 faces. The shared hand H_M-1 is adjacent to the shared hand H_M in the first specific direction SD1. Then, the shared hand H_M-1 carries the substrate W before processing into the processing unit 21_2 from which the substrate W has been carried out by the shared hand H_M. The processing unit 21_2 processes the substrate W.

於1個搬送循環CY內,藉由使N+1個第2手25移動,鄰接於共用手H_M之共用手H_M-1移動至與處理單元21_3之搬送口41a相對向之位置,處理單元21_3係與已被共用手H_M-1搬入處理前之基板W之處理單元21_2不同之處理單元。然後,共用手H_M-1自處理單元21_3搬出處理後之基板W。In one transfer cycle CY, by moving N+1 second hands 25, the shared hand H_M-1 adjacent to the shared hand H_M moves to a position opposite to the transfer port 41a of the processing unit 21_3, and the processing unit 21_3 is connected to the transfer port 41a of the processing unit 21_3. A processing unit different from the processing unit 21_2 of the substrate W before processing has been carried in by the common hand H_M-1. Then, the shared hand H_M-1 unloads the processed substrate W from the processing unit 21_3.

於1個搬送循環CY內,藉由使N+1個第2手25向第2特定方向SD2移動距離d,鄰接於共用手H_M-1之共用手H_M-2移動至與處理單元21_3之搬送口41a相對向之位置。共用手H_M-2在第1特定方向SD1上鄰接於共用手H_M-1。然後,共用手H_M-2向已被共用手H_M-1搬出基板W之處理單元21_3,搬入處理前之基板W。處理單元21_3處理基板W。In one transfer cycle CY, by moving N+1 second hands 25 to the second specified direction SD2 by a distance d, the shared hand H_M-2 adjacent to the shared hand H_M-1 moves to the transfer port 41a of the processing unit 21_3 relative position. The shared hand H_M-2 is adjacent to the shared hand H_M-1 in the first specific direction SD1. Then, the shared hand H_M-2 carries in the substrate W before processing to the processing unit 21_3 from which the substrate W has been carried out by the shared hand H_M-1. The processing unit 21_3 processes the substrate W.

於1個搬送循環CY內,藉由使N+1個第2手25移動,鄰接於共用手H_M-1之共用手H_M-2移動至與處理單元21_4之搬送口41a相對向之位置,處理單元21_4係與已被共用手H_M-2搬入處理前之基板W之處理單元21_3不同之處理單元。然後,共用手H_M-2自處理單元21_4搬出處理後之基板W。In one transfer cycle CY, by moving N+1 second hands 25, the shared hand H_M-2 adjacent to the shared hand H_M-1 moves to a position opposite to the transfer port 41a of the processing unit 21_4, and the processing unit 21_4 It is a different processing unit 21_3 from the processing unit 21_3 of the pre-processed substrate W carried in by the common hand H_M-2. Then, the shared hand H_M-2 unloads the processed substrate W from the processing unit 21_4.

自此以後同樣地,於1個搬送循環CY內,藉由共用手H_M-3~H_2,對處理單元21_4~21_N-1進行基板W之搬入及搬出。處理單元21_4~21_N-1處理基板W。From then on, in one transfer cycle CY, the substrate W is carried in and out to the processing units 21_4 to 21_N-1 by the shared hands H_M-3 to H_2. The processing units 21_4 to 21_N-1 process the substrate W.

然後,於1個搬送循環CY內,藉由使N+1個第2手25移動,鄰接於共用手H_2之共用手H_1,即鄰接於第1非共用手H_F之共用手H_1移動至與處理單元21_N之搬送口41a相對向之位置,處理單元21_N係與已被共用手H_2搬出基板W之處理單元21_N-1不同之處理單元。共用手H_1在第1特定方向SD1上鄰接於共用手H_2。然後,共用手H_1自處理單元21_N搬出處理後之基板W。Then, in one conveying cycle CY, by moving N+1 second hands 25, the shared hand H_1 adjacent to the shared hand H_2, that is, the shared hand H_1 adjacent to the first non-shared hand H_F is moved to the processing unit 21_N The position opposite to the transfer port 41a is the processing unit 21_N which is different from the processing unit 21_N-1 from which the substrate W has been carried out by the shared hand H_2. The shared hand H_1 is adjacent to the shared hand H_2 in the first specific direction SD1. Then, the shared hand H_1 unloads the processed substrate W from the processing unit 21_N.

即,於1個搬送循環CY內,共用手H_1自第N個處理單元21_N搬出處理後之基板W。That is, the shared hand H_1 carries out the processed substrate W from the Nth processing unit 21_N in one transfer cycle CY.

然後,於1個搬送循環CY內,藉由使N+1個第2手25向第2特定方向SD2移動距離d,第1非共用手H_F移動至與處理單元21_N之搬送口41a相對向之位置。繼而,第1非共用手H_F向已被鄰接於第1非共用手H_F之共用手H_1搬出基板W之處理單元21_N,搬入處理前之基板W。處理單元21_N處理基板W。Then, by moving the N+1 second hands 25 in the second specific direction SD2 by a distance d in one transfer cycle CY, the first unshared hand H_F moves to a position facing the transfer port 41a of the processing unit 21_N. Next, the first unshared hand H_F carries the unprocessed substrate W into the processing unit 21_N from which the substrate W has been unloaded by the shared hand H_1 adjacent to the first unshared hand H_F. The processing unit 21_N processes the substrate W.

即,於1個搬送循環CY內,第1非共用手H_F向第N個處理單元21_N搬入處理前之基板W。That is, in one conveyance cycle CY, the first non-shared hand H_F carries the unprocessed substrate W into the N-th processing unit 21_N.

然後,M個共用手H_1~H_M、及第2非共用手H_S將處理後之N片基板W遞交至基板載置部29。Then, the M shared hands H_1 ˜ H_M and the second unshared hand H_S deliver the processed N substrates W to the substrate placement unit 29 .

如以上參照圖13所說明般,本實施方式中,共用手H_1~H_M於向處理單元21_1~處理單元21_N-1搬入處理前之基板W之動作與自處理單元21_2~處理單元21_N搬出處理後之基板W之動作之間係共用的。因此,可朝向第1特定方向SD1,由第2非共用手H_S至第1非共用手H_F地,將其等依序用於基板W之搬出與基板W之搬入。As described above with reference to FIG. 13 , in the present embodiment, the shared hands H_1 to H_M are used for carrying in the substrate W before processing to the processing units 21_1 to 21_N-1 and carrying out the substrate W after processing from the processing units 21_2 to 21_N. The actions of the substrate W are shared. Therefore, toward the first specific direction SD1, the second unshared hand H_S to the first unshared hand H_F can be used for carrying out and carrying in the substrate W in sequence.

其結果,若欲於完成自處理單元21搬出處理後之基板W之動作後,向同一個處理單元21搬入處理前之基板W,則共用手H_1~H_M、及第1非共用手H_F只要向第2特定方向SD2移動距離d(第2手25之間隔d)即可。因此,相較於處理前之基板W與處理後之基板W之間不共用手之情形(例如,第2基板搬送方法)而言,能提高第2搬送機構23L搬送基板W之動作之產能。As a result, if it is desired to load the unprocessed substrate W into the same processing unit 21 after the operation of unloading the processed substrate W from the processing unit 21, the shared hands H_1 to H_M and the first non-shared hand H_F only need to transfer the processed substrate W to the same processing unit 21. The movement distance d (interval d between the second hands 25) in the second specific direction SD2 is sufficient. Therefore, compared with the case where the unprocessed substrate W and the processed substrate W do not share hands (for example, the second substrate conveying method), the throughput of the operation of conveying the substrate W by the second conveying mechanism 23L can be improved.

其次,於已將第1基板搬送方法泛化之情形時,參照圖14~圖16,對第2手25之總數Q、第1基板搬送方法中使用之第2手25之數量、及第2基板搬送方法中使用之第2手25之數量之關係進行說明。圖14~圖16中示出了複數個第2搬送機構23中之1個第2搬送機構23。又,將1個搬送循環CY內被執行基板W之搬入及搬出之處理單元21之數量記作「N」。Next, when the first board transfer method has been generalized, referring to FIGS. The relationship between the number of second hands 25 used in the substrate transfer method will be described. 14-16 has shown the 2nd conveyance mechanism 23 which is one of the some 2nd conveyance mechanisms 23. As shown in FIG. In addition, the number of processing units 21 for carrying in and carrying out the substrate W in one transport cycle CY is represented as "N".

圖14係表示第2搬送機構23具備2N個第2手25之情形時,第2手25之總數Q、第1基板搬送方法中使用之第2手25之數量、及第2基板搬送方法中使用之第2手25之數量之關係之圖。14 shows that when the second conveying mechanism 23 has 2N second hands 25, the total number Q of the second hands 25, the number of second hands 25 used in the first substrate conveying method, and the number of second hands 25 used in the second substrate conveying method A graph of the relationship between the quantity of the second lot 25 used.

如圖14所示,Q=2×N=2N。因此,第2搬送機構23所具備之複數個第2手25之總數Q為2N個。即,第2搬送機構23具備2N個第2手25。於此例中,N係2以上之整數。As shown in FIG. 14, Q=2×N=2N. Therefore, the total number Q of the plurality of second hands 25 included in the second transport mechanism 23 is 2N. That is, the second transport mechanism 23 includes 2N second hands 25 . In this example, N is an integer of 2 or more.

而且,於將第1基板搬送方法安裝於基板處理裝置100之情形時,2N個第2手25包含第1非共用手H_F、M個共用手H_1~H_M、及第2非共用手H_S。M係1以上之整數。Furthermore, when the first substrate transfer method is installed in the substrate processing apparatus 100, the 2N second hands 25 include the first unshared hand H_F, the M shared hands H_1 to H_M, and the second unshared hand H_S. M is an integer of 1 or more.

第1非共用手H_F、M個共用手H_1~H_M、及第2非共用手H_S之合計個數係N+1個。又,M=N-1。即,第2搬送機構23具備N-1個共用手H_1~H_M。再者,於第1基板搬送方法中,不使用Q個(=2N個)第2手25中之N-1個第2手25。The total number of the first unshared hand H_F, the M shared hands H_1 to H_M, and the second unshared hand H_S is N+1. Also, M=N-1. That is, the 2nd conveyance mechanism 23 is equipped with N-1 shared hands H_1-H_M. In addition, in the 1st board|substrate conveyance method, N-1 second hands 25 among Q (=2N) second hands 25 are not used.

另一方面,於將第2基板搬送方法安裝於基板處理裝置100之情形時,例如,2N個第2手25中,上下方向DZ上連續之N個第2手25(例如,下段之第2手25)支持處理前之基板W,上下方向DZ上連續之另N個第2手25(例如,上段之第2手25)支持處理後之基板W。On the other hand, when the second substrate transfer method is installed in the substrate processing apparatus 100, for example, among the 2N second hands 25, N second hands 25 consecutive in the vertical direction DZ (for example, the second hand 25 in the lower row) The hand 25) supports the substrate W before processing, and another N second hands 25 (for example, the second hand 25 in the upper row) that are continuous in the vertical direction DZ support the substrate W after processing.

如以上參照圖14所說明般,根據本實施方式,藉由將第2手25之總數Q設定為2N個,對基板處理裝置100安裝第2基板搬送方法時,能使用所有第2手25。其結果,於第2基板搬送方法中,能提高搬送基板W時之產能。又,藉由使第2搬送機構23預先具備2N個第2手25,對基板處理裝置100安裝第1基板搬送方法時,無需增加新的第2手25,便可使用現有之N+1個第2手25。As described above with reference to FIG. 14 , according to the present embodiment, by setting the total number Q of the second hands 25 to 2N, all the second hands 25 can be used when the second substrate transfer method is installed on the substrate processing apparatus 100 . As a result, in the second substrate transfer method, the throughput at the time of transferring the substrate W can be improved. Also, by pre-equipping the second transfer mechanism 23 with 2N second hands 25, when the first substrate transfer method is installed on the substrate processing apparatus 100, the existing N+1 second hands 25 can be used without adding new second hands 25. hand 25.

例如,於N=2之情形時,可利用第1非共用手H_F、1個共用手H_1、及第2非共用手H_S來執行第1基板搬送方法。即,能以最小構成之第2手25來執行第1基板搬送方法。因此,能降低第2搬送機構23之成本。For example, in the case of N=2, the first substrate transfer method can be performed using the first unshared hand H_F, one shared hand H_1, and the second unshared hand H_S. That is, the first substrate transfer method can be performed with the second hand 25 having the minimum configuration. Therefore, the cost of the second transport mechanism 23 can be reduced.

此處,例如,對基板處理裝置100安裝參照圖14所說明之第1基板搬送方法及第2基板搬送方法任一者。Here, for example, either one of the first substrate transfer method and the second substrate transfer method described with reference to FIG. 14 is installed in the substrate processing apparatus 100 .

但亦可對基板處理裝置100安裝第1基板搬送方法及第2基板搬送方法兩者。However, both the first substrate transfer method and the second substrate transfer method may be installed in the substrate processing apparatus 100 .

具體而言,第2搬送機構23亦可受到控制部200之控制,而以第1基板搬送模式MD1及第2基板搬送模式MD2任一模式動作。Specifically, the second transport mechanism 23 may be controlled by the control unit 200 to operate in any one of the first substrate transport mode MD1 and the second substrate transport mode MD2 .

第1基板搬送模式MD1係第2搬送機構23執行第1基板搬送方法之模式。具體而言,第1基板搬送模式MD1係2N個第2手25中之N+1個第2手25作為第1非共用手H_F、M個共用手H_1~H_M、及第2非共用手H_S來使用之模式。The first board transfer mode MD1 is a mode in which the second transfer mechanism 23 executes the first board transfer method. Specifically, in the first substrate transfer mode MD1, N+1 second hands 25 out of 2N second hands 25 are used as the first unshared hand H_F, the M shared hands H_1 to H_M, and the second unshared hand H_S mode.

第2基板搬送模式MD2係第2搬送機構23執行第2基板搬送方法之模式。具體而言,第2基板搬送模式MD2係將2N個第2手25中之N個第2手25用以僅支持處理單元21加以處理前之基板W,並且將另N個第2手25用以僅支持處理單元21加以處理後之基板W之模式。The second substrate transfer mode MD2 is a mode in which the second transfer mechanism 23 executes the second substrate transfer method. Specifically, in the second substrate transfer mode MD2, N second hands 25 among the 2N second hands 25 are used to support only the substrate W before processing by the processing unit 21, and the other N second hands 25 are used to The mode supports only the substrate W processed by the processing unit 21 .

使用者藉由操作控制部200,可使第2搬送機構23以第1基板搬送模式MD1動作,亦可使其以第2基板搬送模式MD2動作。因此,能提高使用者之便利性。又,對於基板處理裝置100之廠商而言亦同樣如此,可藉由操作控制部200,而設定為第1基板搬送模式MD1及第2基板搬送模式MD2任一者後出貨。因此,能提高廠商之便利性。By operating the control unit 200 , the user can operate the second transport mechanism 23 in the first substrate transport mode MD1 or in the second substrate transport mode MD2 . Therefore, the convenience of the user can be improved. Also, the manufacturer of the substrate processing apparatus 100 can set the first substrate transfer mode MD1 or the second substrate transfer mode MD2 by operating the control unit 200 and then ship. Therefore, the convenience for manufacturers can be improved.

圖15係表示第2搬送機構23具備N+1個第2手25,且N為奇數之情形時,第2手25之總數Q、第1基板搬送方法中使用之第2手25之數量、及第2基板搬送方法中使用之第2手25之數量之關係之圖。15 shows that the second transfer mechanism 23 has N+1 second hands 25, and when N is an odd number, the total number Q of the second hands 25, the number of the second hands 25 used in the first substrate transfer method, and the 2 A graph showing the relationship between the number of second hands 25 used in the substrate transfer method.

如圖15所示,Q=N+1。因此,於第2搬送機構23中,複數個第2手25之總數Q係N+1個。即,第2搬送機構23具備N+1個第2手25。於此例中,N係3以上之奇數。As shown in FIG. 15, Q=N+1. Therefore, in the second transport mechanism 23, the total number Q of the plurality of second hands 25 is N+1. That is, the second transport mechanism 23 includes N+1 second hands 25 . In this example, N is an odd number of 3 or more.

而且,於將第1基板搬送方法安裝於基板處理裝置100之情形時,N+1個第2手25包含第1非共用手H_F、M個共用手H_1~H_M、及第2非共用手H_S。M係1以上之整數。Furthermore, when the first substrate transfer method is installed in the substrate processing apparatus 100, the N+1 second hands 25 include the first unshared hand H_F, M shared hands H_1 to H_M, and the second unshared hand H_S. M is an integer of 1 or more.

第1非共用手H_F、M個共用手H_1~H_M、及第2非共用手H_S之合計個數係N+1個。又,M=N-1。即,第2搬送機構23具備N-1個共用手H_1~H_M。特別值得一提的是,於第1基板搬送方法中,使用Q個(=N+1個)第2手25中所有之第2手25。即,根據本實施方式,執行第1基板搬送方法時之第2手25之數量已最佳化,不存在多餘之第2手25。因此,能降低第2搬送機構23之成本。The total number of the first unshared hand H_F, the M shared hands H_1 to H_M, and the second unshared hand H_S is N+1. Also, M=N-1. That is, the 2nd conveyance mechanism 23 is equipped with N-1 shared hands H_1-H_M. In particular, in the first substrate transfer method, all the second lots 25 among Q (=N+1) second lots 25 are used. That is, according to the present embodiment, the number of second hands 25 is optimized when performing the first substrate transfer method, and there are no redundant second hands 25 . Therefore, the cost of the second transport mechanism 23 can be reduced.

另一方面,於將第2基板搬送方法安裝於基板處理裝置100之情形時,例如,N+1個第2手25中,沿著上下方向DZ連續之(N+1)/2個第2手25(例如,下段之第2手25)支持處理前之基板W,沿著上下方向DZ連續之另(N+1)/2個第2手25(例如,上段之第2手25)支持處理後之基板W。On the other hand, when the second substrate transfer method is installed in the substrate processing apparatus 100, for example, among N+1 second hands 25, (N+1)/2 second hands 25 (for example, , the second hand 25 in the lower paragraph supports the substrate W before processing, and another (N+1)/2 second hands 25 (for example, the second hand 25 in the upper paragraph) that are continuous along the vertical direction DZ support the processed substrate W.

此處,例如,對基板處理裝置100安裝參照圖15所說明之第1基板搬送方法及第2基板搬送方法任一者。Here, for example, either one of the first substrate transfer method and the second substrate transfer method described with reference to FIG. 15 is installed in the substrate processing apparatus 100 .

其中,與圖14所說明之情形同樣地,第2搬送機構23亦可受到控制部200之控制,而以第1基板搬送模式MD10及第2基板搬送模式MD20任一模式動作。Herein, similarly to the situation described in FIG. 14 , the second transport mechanism 23 can also be controlled by the control unit 200 to operate in any one of the first substrate transport mode MD10 and the second substrate transport mode MD20 .

第1基板搬送模式MD10係第2搬送機構23執行第1基板搬送方法之模式。具體而言,第1基板搬送模式MD10係Q個(=N+1個)第2手25全部作為第1非共用手H_F、M個共用手H_1~H_M、及第2非共用手H_S來使用之模式。The first board transfer mode MD10 is a mode in which the second transfer mechanism 23 executes the first board transfer method. Specifically, the first substrate transfer mode MD10 is a mode in which all Q (=N+1) second hands 25 are used as the first unshared hand H_F, M shared hands H_1 to H_M, and the second unshared hand H_S .

第2基板搬送模式MD20係第2搬送機構23執行第2基板搬送方法之模式。具體而言,第2基板搬送模式MD20係將Q個(=N+1個)第2手25中上下方向DZ上連續之(N+1)/2個第2手25用以僅支持處理單元21加以處理前之基板W,並且將上下方向DZ上連續之另(N+1)/2個第2手25用以僅支持處理單元21加以處理後之基板W之模式。The second substrate transfer mode MD20 is a mode in which the second transfer mechanism 23 executes the second substrate transfer method. Specifically, in the second substrate transfer mode MD20, the (N+1)/2 second hands 25 that are continuous in the vertical direction DZ among Q (=N+1) second hands 25 are used to support only the processing unit 21 before processing. The substrate W, and the other (N+1)/2 second hands 25 continuous in the vertical direction DZ are used to support only the substrate W processed by the processing unit 21 .

於安裝第1基板搬送模式MD10及第2基板搬送模式MD20兩者之情形時,與安裝第1基板搬送模式MD1及第2基板搬送模式MD2兩者之情形同樣地,能提高使用者及廠商之便利性。When installing both the first board transfer mode MD10 and the second board transfer mode MD20, as in the case of installing both the first board transfer mode MD1 and the second board transfer mode MD2, the user and the manufacturer can be improved. convenience.

圖16係表示第2搬送機構23具備N+1個第2手25,且N為偶數之情形時,第2手25之總數Q、第1基板搬送方法中使用之第2手25之數量、及第2基板搬送方法中使用之第2手25之數量之關係之圖。16 shows that the second transfer mechanism 23 has N+1 second hands 25, and when N is an even number, the total number Q of the second hands 25, the number of the second hands 25 used in the first substrate transfer method, and the 2 A graph showing the relationship between the number of second hands 25 used in the substrate transfer method.

如圖16所示,Q=N+1。因此,於第2搬送機構23中,複數個第2手25之總數Q係N+1個。即,第2搬送機構23具備N+1個第2手25。於此例中,N係2以上之偶數。As shown in FIG. 16, Q=N+1. Therefore, in the second transport mechanism 23, the total number Q of the plurality of second hands 25 is N+1. That is, the second transport mechanism 23 includes N+1 second hands 25 . In this example, N is an even number of 2 or more.

而且,於將第1基板搬送方法安裝於基板處理裝置100之情形時,N為偶數時之第1非共用手H_F、M個共用手H_1~H_M、及第2非共用手H_S與參照圖15所說明之N為奇數時之第1非共用手H_F、M個共用手H_1~H_M、及第2非共用手H_S相同。Moreover, when the first substrate transfer method is installed in the substrate processing apparatus 100, when N is an even number, the first unshared hand H_F, the M shared hands H_1 to H_M, and the second unshared hand H_S are the same as those shown in FIG. 15 . The first unshared hand H_F, the M shared hands H_1 to H_M, and the second unshared hand H_S are the same when N is an odd number.

另一方面,於將第2基板搬送方法安裝於基板處理裝置100之情形時,例如,N+1個第2手25中,上下方向DZ上連續之N/2個第2手25(例如,下段之第2手25)支持處理前之基板W,上下方向DZ上連續之另N/2個第2手25支持處理後之基板W。而且,不使用最上段之第2手25或最下段之第2手25。On the other hand, when the second substrate transfer method is installed in the substrate processing apparatus 100, for example, among the N+1 second hands 25, N/2 second hands 25 consecutive in the vertical direction DZ (for example, the lower row The second hand 25) supports the substrate W before processing, and another N/2 second hands 25 continuous in the vertical direction DZ support the substrate W after processing. Moreover, the second hand 25 of the uppermost stage or the second hand 25 of the lowest stage are not used.

此處,例如,對基板處理裝置100安裝參照圖16所說明之第1基板搬送方法及第2基板搬送方法任一者。Here, for example, either one of the first substrate transfer method and the second substrate transfer method described with reference to FIG. 16 is installed in the substrate processing apparatus 100 .

其中,與圖14所說明之情形同樣地,第2搬送機構23亦可受到控制部200之控制,而以第1基板搬送模式MD100及第2基板搬送模式MD200任一模式動作。Herein, similarly to the situation described in FIG. 14 , the second transport mechanism 23 can also be controlled by the control unit 200 to operate in any one of the first substrate transport mode MD100 and the second substrate transport mode MD200 .

第1基板搬送模式MD100與參照圖15所說明之第1基板搬送模式MD10相同。The first board transfer mode MD100 is the same as the first board transfer mode MD10 described with reference to FIG. 15 .

第2基板搬送模式MD200係將Q個(=N+1個)第2手25中上下方向DZ上連續之N/2個第2手25用以僅支持處理單元21加以處理前之基板W,並且將上下方向DZ上連續之另N/2個第2手25用以僅支持處理單元21加以處理後之基板W之模式。The second substrate transfer mode MD200 is to use Q (= N + 1) second hands 25 consecutive N/2 second hands 25 in the vertical direction DZ to support only the substrate W before processing by the processing unit 21, and transfer Another N/2 second hands 25 continuous in the vertical direction DZ are used to support only the substrate W processed by the processing unit 21 .

於安裝第1基板搬送模式MD100及第2基板搬送模式MD200兩者之情形時,與安裝第1基板搬送模式MD1及第2基板搬送模式MD2兩者之情形同樣地,能提高使用者及廠商之便利性。When both the first board transfer mode MD100 and the second board transfer mode MD200 are installed, similarly to the case where both the first board transfer mode MD1 and the second board transfer mode MD2 are installed, the user and the manufacturer can be improved. convenience.

以上,參照圖式(圖1~圖16)對本發明之實施方式進行了說明。但本發明並不限於上述實施方式,而可於不脫離其主旨之範圍內以各種形態予以實施(例如,下述(1)~(4))。又,上述實施方式中揭示之複數個構成要素可適當改變。例如,可將某實施方式所示之所有構成要素中之某構成要素添加至其他實施方式之構成要素中,或可將某實施方式所示之所有構成要素中之若干構成要素自實施方式抹除。The embodiments of the present invention have been described above with reference to the drawings ( FIGS. 1 to 16 ). However, this invention is not limited to the said embodiment, It can implement in various forms in the range which does not deviate from the summary (for example, following (1)-(4)). In addition, the plurality of components disclosed in the above-mentioned embodiments can be appropriately changed. For example, some constituent elements among all constituent elements shown in a certain embodiment may be added to constituent elements in another embodiment, or some constituent elements among all constituent elements shown in a certain embodiment may be deleted from the embodiment. .

為了使發明容易理解,圖式係模式性表示出各個構成要素,且為了方便繪圖,圖示之各構成要素之厚度、長度、個數、間隔等有時與實際不同。又,上述實施方式中所示之各構成要素之構成僅為一例,並不特別限定,當然可於不實質脫離本發明效果之範圍內進行各種變更。In order to make the invention easier to understand, the drawings schematically show each constituent element, and for the convenience of drawing, the thickness, length, number, interval, etc. of each constituent element shown in the illustration may be different from the actual ones. Moreover, the structure of each component shown in the said embodiment is an example, and is not specifically limited, It goes without saying that various changes can be made in the range which does not substantially deviate from the effect of this invention.

(1)於參照圖13所說明之第1基板搬送方法中,第2搬送機構23可具備第1特定方向SD1上連續於第1非共用手H_F之1個或複數個第2手25,亦可具備第2特定方向SD2上連續於第2非共用手H_S之1個或複數個第2手25。於參照圖7~圖9所說明之第2搬送機構23中同樣如此。(1) In the first substrate transfer method described with reference to FIG. 13 , the second transfer mechanism 23 may include one or a plurality of second hands 25 continuously on the first non-shared hand H_F in the first specific direction SD1, or One or a plurality of second hands 25 consecutive to the second non-shared hand H_S in the second specific direction SD2 may be provided. The same applies to the second transport mechanism 23 described with reference to FIGS. 7 to 9 .

(2)於圖13中,就第1基板搬送方法而言,將N+1個第2手25中最下段之第2手25設定為第1非共用手H_F,將最上段之第2手25設定為第2非共用手H_S(第1形態)。但亦可將N+1個第2手25中最下段之第2手25設定為第2非共用手H_S,將最上段之第2手25設定為第1非共用手H_F(第2形態)。(2) In FIG. 13 , for the first substrate transfer method, the second hand 25 at the bottom of the N+1 second hands 25 is set as the first non-shared hand H_F, and the second hand 25 at the top is set It is the second non-shared hand H_S (first form). But it is also possible to set the second hand 25 at the bottom of the N+1 second hands 25 as the second non-shared hand H_S, and set the second hand 25 at the top as the first non-shared hand H_F (second form).

該情形時,第1特定方向SD1及第2特定方向SD2與圖13之情形相反。即,第1特定方向SD1表示上方向,第2特定方向SD2表示下方向。又,該情形時,於圖13中,共用手25之參照符號由上而下依序為「H_1~H_M」,處理單元21之參照符號由上而下依序為「21_1~21_N」。In this case, the first specific direction SD1 and the second specific direction SD2 are opposite to those in FIG. 13 . That is, the first specific direction SD1 indicates the upward direction, and the second specific direction SD2 indicates the downward direction. In this case, in FIG. 13 , the reference symbols of the shared hand 25 are "H_1-H_M" from top to bottom, and the reference symbols of the processing unit 21 are "21_1-21_N" from top to bottom.

又,於重複執行搬送循環CY之情形時,亦可使第1形態與第2形態混合存在,而執行第1基板搬送方法。Also, when the transfer cycle CY is repeatedly executed, the first substrate transfer method may be executed while the first form and the second form are mixed.

再者,對於參照圖7~圖9所說明之第2搬送機構23而言亦同樣如此,於第1基板搬送方法中亦可採用第2形態。例如,亦可將第2手HC設定為第1非共用手,將第2手HA設定為第2非共用手。又,於參照圖7~圖9所說明之第2搬送機構23中,亦可不使用第2手HA,而使用第2手HB~第2手HC來執行第1基板搬送方法。In addition, the same applies to the second conveyance mechanism 23 described with reference to FIGS. 7 to 9 , and the second form can also be adopted in the first substrate conveyance method. For example, the second hand HC may be set as the first unshared hand, and the second hand HA may be set as the second unshared hand. In addition, in the second transfer mechanism 23 described with reference to FIGS. 7 to 9 , the first substrate transfer method may be performed using the second hands HB to HC instead of the second hand HA.

(3)圖1所示之控制部200可按照預先設定之排程來決定1個搬送循環CY內被進行基板W之搬出及搬入之處理單元21,亦可採用事件驅動方式來加以決定。所謂事件驅動方式係指,於決定被進行基板W之搬出及搬入之處理單元21之時間點,自複數個處理單元21中決定出最佳之處理單元21之方式。(3) The control unit 200 shown in FIG. 1 can determine the processing unit 21 to carry out and carry in the substrate W in one transport cycle CY according to a preset schedule, and can also use an event-driven method to determine. The event-driven method refers to a method of determining the optimum processing unit 21 among a plurality of processing units 21 at the time point of determining the processing unit 21 to be carried out and carried in the substrate W.

(4)圖1~圖3所示之第1手驅動部11之構成並不特別限定,只要能驅動第1手9即可。例如,亦可為5個第1手9之迴旋軸全部共通。例如,只要迴旋軸線一致,還可為5個第1手9中上下方向DZ上連續之4個第1手9之迴旋軸共通,而另1個第1手9之迴旋軸不同。同樣地,第2手驅動部17之構成並不特別限定,只要能驅動第2手25即可。 [產業上之可利用性](4) The configuration of the first hand drive unit 11 shown in FIGS. 1 to 3 is not particularly limited as long as it can drive the first hand 9 . For example, it is also possible to share all the axes of rotation of the five first hands 9 . For example, as long as the axes of rotation are consistent, the axes of rotation of the four consecutive first hands 9 in the up-down direction DZ among the five first hands 9 may be common, while the axes of rotation of the other first hands 9 are different. Likewise, the configuration of the second hand drive unit 17 is not particularly limited as long as it can drive the second hand 25 . [Industrial availability]

本發明係關於一種基板處理裝置及基板搬送方法,其具有產業上之可利用性。The present invention relates to a substrate processing device and a substrate conveying method, which have industrial applicability.

1:移載傳送部 3:載具載置部 5:第1搬送室 7:第1搬送機構 9:第1手 11:第1手驅動部 11a:軌道 11b:水平移動部 11c:垂直移動部 11d:迴旋部 11e:迴旋軸 11f:進退部 17:第2手驅動部 20:處理部 21:處理單元 21A:處理單元 21B:處理單元 21_1~21_N:處理單元 23:第2搬送機構(搬送機構) 23L:第2搬送機構(搬送機構) 23U:第2搬送機構(搬送機構) 25:第2手(手、第1非共用手、第2非共用手、共用手) 27a:支柱 27b:垂直移動部 27c:水平移動部 27d:迴旋部 27e:迴旋軸 27f:進退部 29:基板載置部 29L:基板載置部 29U:基板載置部 31:第2搬送室 41:處理殼體 41a:搬送口 43:基板保持部 45:旋轉驅動部 47:第1噴嘴 47a:第1噴嘴移動部 49:第2噴嘴 49a:第2噴嘴移動部 51:第3噴嘴 51a:第3噴嘴移動部 53:第4噴嘴 53a:第4噴嘴移動部 55:承杯 100:基板處理裝置 200:控制部 291:支持部 291A:基板載置部之下段 291B:基板載置部之上段 471:第1噴嘴臂 472:第1噴嘴驅動部 473:第1處理液供給配管 491:第2噴嘴臂 492:第2噴嘴驅動部 493:第2處理液供給配管 511:第3噴嘴臂 512:第3噴嘴驅動部 513:第3處理液供給配管 531:第4噴嘴臂 532:第4噴嘴驅動部 533:沖洗液供給配管 C:載具 TW:處理塔 TW1~TW4:處理塔 W:基板 W1~W10:基板 WX1:基板 WX2:基板 HA~HD:第2手(手、第1非共用手、第2非共用手、共用手) H_1~H_M:第2手(手、第1非共用手、第2非共用手、共用手) H_F:第2手(手、第1非共用手、第2非共用手、共用手) H_S:第2手(手、第1非共用手、第2非共用手、共用手)1: transfer transmission part 3: Carrier loading part 5: The first transfer room 7: The first conveying mechanism 9: 1st hand 11: 1st hand drive unit 11a: track 11b: horizontal movement part 11c: vertical movement part 11d: Convolution 11e: rotary axis 11f: advance and retreat department 17: 2nd hand drive unit 20: Processing Department 21: Processing unit 21A: Processing unit 21B: Processing unit 21_1~21_N: processing unit 23: Second conveying mechanism (conveying mechanism) 23L: The second conveying mechanism (conveying mechanism) 23U: The second conveying mechanism (conveying mechanism) 25: 2nd hand (hand, 1st non-shared hand, 2nd non-shared hand, shared hand) 27a: Pillars 27b: Vertical movement part 27c: horizontal movement part 27d: Convolution 27e: rotary axis 27f: advance and retreat department 29: Substrate loading part 29L: Substrate loading part 29U: Substrate mounting part 31: The second transfer room 41: Handling the shell 41a: transfer port 43: Substrate holding part 45:Rotary drive unit 47: No. 1 nozzle 47a: 1st nozzle moving part 49: No. 2 nozzle 49a: The second nozzle moving part 51: No. 3 nozzle 51a: The third nozzle moving part 53: No. 4 nozzle 53a: No. 4 nozzle moving part 55: Cheng Cup 100: Substrate processing device 200: control department 291: Support Department 291A: The lower part of the substrate loading part 291B: The upper part of the substrate loading part 471: 1st nozzle arm 472: Nozzle drive unit 1 473: 1st treatment liquid supply piping 491: Nozzle arm 2 492: The second nozzle drive unit 493: Second processing liquid supply piping 511: 3rd nozzle arm 512: The third nozzle drive unit 513: The third processing liquid supply pipe 531: No. 4 nozzle arm 532: The 4th nozzle drive unit 533: Flushing fluid supply piping C: vehicle TW: processing tower TW1~TW4: processing tower W: Substrate W1~W10: Substrate WX1: Substrate WX2: Substrate HA~HD: 2nd hand (hand, 1st non-shared hand, 2nd non-shared hand, shared hand) H_1~H_M: 2nd hand (hand, 1st non-shared hand, 2nd non-shared hand, shared hand) H_F: Hand 2 (Hand, 1st Unshared Hand, 2nd Unshared Hand, Shared Hand) H_S: Hand 2 (Hand, 1st Unshared Hand, 2nd Unshared Hand, Shared Hand)

圖1係表示本發明之實施方式的基板處理裝置之內部之俯視圖。 圖2係沿著圖1之II-II線之剖視圖。 圖3係沿著圖1之III-III線之剖視圖。 圖4係表示本實施方式之基板處理裝置之側視圖。 圖5係表示本實施方式之處理單元之內部之側視圖。 圖6係表示本實施方式之基板處理裝置之第1搬送機構、基板載置部及第2搬送機構之側視圖。 圖7係表示本實施方式之基板處理裝置所執行之第1基板搬送方法的整個流程之一例之圖。 圖8係表示本實施方式之基板處理裝置所執行之第1基板搬送方法之前段之流程圖。 圖9係表示本實施方式之基板處理裝置所執行之第1基板搬送方法之後段之流程圖。 圖10係表示本實施方式之基板處理裝置所執行之第2基板搬送方法的整個流程之一例之圖。 圖11係表示本實施方式之基板處理裝置所執行之第2基板搬送方法之前段之流程圖。 圖12係表示本實施方式之基板處理裝置所執行之第2基板搬送方法之後段之流程圖。 圖13係用以將本實施方式之基板處理裝置所執行之第1基板搬送方法泛化而加以說明之圖。 圖14係表示本實施方式之第2搬送機構具備2N個第2手之情形時,第2手之總數、第1基板搬送方法中使用之第2手之數量、及第2基板搬送方法中使用之第2手之數量之關係之圖。 圖15係表示本實施方式之第2搬送機構具備N+1個第2手,且N為奇數之情形時,第2手之總數、第1基板搬送方法中使用之第2手之數量、及第2基板搬送方法中使用之第2手之數量之關係之圖。 圖16係表示本實施方式之第2搬送機構具備N+1個第2手,且N為偶數之情形時,第2手之總數、第1基板搬送方法中使用之第2手之數量、及第2基板搬送方法中使用之第2手之數量之關係之圖。FIG. 1 is a plan view showing the inside of a substrate processing apparatus according to an embodiment of the present invention. Fig. 2 is a sectional view along line II-II of Fig. 1 . Fig. 3 is a sectional view along line III-III of Fig. 1 . FIG. 4 is a side view showing the substrate processing apparatus of this embodiment. Fig. 5 is a side view showing the inside of the processing unit of this embodiment. FIG. 6 is a side view showing the first conveying mechanism, the substrate placing unit, and the second conveying mechanism of the substrate processing apparatus according to the present embodiment. FIG. 7 is a diagram showing an example of the overall flow of the first substrate transfer method performed by the substrate processing apparatus of the present embodiment. FIG. 8 is a flowchart showing the first stage of the first substrate transfer method performed by the substrate processing apparatus of the present embodiment. FIG. 9 is a flowchart showing a subsequent stage of the first substrate transfer method performed by the substrate processing apparatus of the present embodiment. FIG. 10 is a diagram showing an example of the overall flow of the second substrate transfer method executed by the substrate processing apparatus of the present embodiment. FIG. 11 is a flowchart showing the first stage of the second substrate transfer method performed by the substrate processing apparatus of the present embodiment. FIG. 12 is a flowchart showing a subsequent stage of the second substrate transfer method performed by the substrate processing apparatus of the present embodiment. FIG. 13 is a diagram for generalizing and describing the first substrate transfer method performed by the substrate processing apparatus of the present embodiment. FIG. 14 shows the total number of second hands, the number of second hands used in the first substrate transfer method, and the number of second hands used in the second substrate transfer method when the second transfer mechanism of this embodiment has 2N second hands. The graph of the relationship between the quantity of the second lot. FIG. 15 shows the total number of second hands, the number of second hands used in the first substrate transfer method, and the number of second hands used in the first substrate transfer method when the second transfer mechanism of this embodiment has N+1 second hands, and N is an odd number. A graph of the relationship between the number of second hands used in the substrate transfer method. FIG. 16 shows the total number of second hands, the number of second hands used in the first substrate transfer method, and the number of second hands used in the first substrate transfer method when the second transfer mechanism of this embodiment has N+1 second hands, and N is an even number. A graph of the relationship between the number of second hands used in the substrate transfer method.

21:處理單元 21: Processing unit

21_1~21_N:處理單元 21_1~21_N: processing unit

23:第2搬送機構(搬送機構) 23: Second conveying mechanism (conveying mechanism)

25:第2手(手、第1非共用手、第2非共用手、共用手) 25: 2nd hand (hand, 1st non-shared hand, 2nd non-shared hand, shared hand)

29:基板載置部 29: Substrate loading part

41a:搬送口 41a: transfer port

H_F:第2手(手、第1非共用手、第2非共用手、共用手) H_F: Hand 2 (Hand, 1st Unshared Hand, 2nd Unshared Hand, Shared Hand)

H_S:第2手(手、第1非共用手、第2非共用手、共用手) H_S: Hand 2 (Hand, 1st Unshared Hand, 2nd Unshared Hand, Shared Hand)

H_1~H_M:第2手(手、第1非共用手、第2非共用手、共用手) H_1~H_M: 2nd hand (hand, 1st non-shared hand, 2nd non-shared hand, shared hand)

W:基板 W: Substrate

Claims (14)

一種基板處理裝置,其具備:基板載置部,其供載置複數片基板;複數個處理單元,其等各自處理上述基板;及搬送機構,其於上述基板載置部與上述處理單元之間搬送上述基板;且於1個搬送循環內,上述搬送機構自上述基板載置部接收由上述處理單元處理前之N(N為2以上之整數)片上述基板,將上述N片基板向上述複數個處理單元中之N個處理單元搬入,且自上述N個處理單元搬出由上述N個處理單元處理後之N片上述基板,將上述N片基板遞交至上述基板載置部;上述搬送機構具備各自支持上述基板之複數個手,上述複數個手包含第1非共用手、第2非共用手、及配置於上述第1非共用手與上述第2非共用手之間之M(M為1以上之整數)個共用手,上述第1非共用手、上述M個共用手及上述第2非共用手係沿著上下方向自上述第1非共用手至上述第2非共用手連續地配置;於上述1個搬送循環內,上述M個共用手於不同之時序支持由上述處理單元處理前之上述基板與處理後之上述基板,於上述1個搬送循環內,上述第1非共用手僅支持由上述處理單元處理前之上述基板,於上述1個搬送循環內,上述第2非共用手僅支持由上述處理單元處理後之上述基板, 於上述搬送機構自上述基板載置部接收到上述N片基板之狀態下,上述第2非共用手未支持上述基板,而上述M個共用手及上述第1非共用手支持著上述基板。 A substrate processing apparatus comprising: a substrate mounting portion for mounting a plurality of substrates; a plurality of processing units each processing the substrate; and a transport mechanism disposed between the substrate mounting portion and the processing unit Transporting the above-mentioned substrates; and within one transport cycle, the above-mentioned transport mechanism receives N (N is an integer greater than or equal to 2) pieces of the above-mentioned substrates before being processed by the above-mentioned processing unit from the above-mentioned substrate loading part, and transfers the above-mentioned N pieces of substrates to the above-mentioned multiple N processing units among the processing units are carried in, and the N substrates processed by the N processing units are carried out from the N processing units, and the N substrates are delivered to the substrate loading part; the conveying mechanism has A plurality of hands each supporting the above-mentioned substrate, the plurality of hands include a first non-shared hand, a second non-shared hand, and an M arranged between the first non-shared hand and the second non-shared hand (M is 1 The above integer) shared hands, the above-mentioned first non-shared hand, the above-mentioned M shared hands and the above-mentioned second non-shared hand are arranged continuously along the vertical direction from the above-mentioned first non-shared hand to the above-mentioned second non-shared hand; In the above-mentioned one transfer cycle, the above-mentioned M shared hands support the above-mentioned substrate before processing and the above-mentioned substrate after processing by the above-mentioned processing unit at different timings; The substrate before being processed by the processing unit, within the one transfer cycle, the second unshared hand supports only the substrate processed by the processing unit, In the state where the transfer mechanism has received the N substrates from the substrate mounting section, the second unshared hand does not support the substrate, but the M shared hands and the first unshared hand support the substrate. 如請求項1之基板處理裝置,其中於上述1個搬送循環內,上述M個共用手及上述第1非共用手自上述基板載置部接收上述基板,於上述1個搬送循環內,上述第2非共用手自上述處理單元搬出處理後之上述基板,於上述1個搬送循環內,上述M個共用手中鄰接於上述第2非共用手之共用手向已被上述第2非共用手搬出上述基板之上述處理單元,搬入處理前之上述基板,於上述1個搬送循環內,鄰接於上述第2非共用手之上述共用手自與已被上述共用手搬入處理前之上述基板之上述處理單元不同之上述處理單元,搬出處理後之上述基板。 The substrate processing apparatus according to claim 1, wherein in the above-mentioned one conveying cycle, the above-mentioned M shared hands and the above-mentioned first non-shared hands receive the above-mentioned substrate from the above-mentioned substrate loading part, and in the above-mentioned one conveying cycle, the above-mentioned first 2 The non-shared hands carry out the processed substrates from the above-mentioned processing unit. In the above-mentioned 1 transfer cycle, the shared hands adjacent to the second non-shared hands of the above-mentioned M shared hands are carried out by the second non-shared hands. The above-mentioned processing unit of the substrate, the above-mentioned substrate before processing is loaded into the above-mentioned processing unit of the above-mentioned substrate before processing, within the above-mentioned one transfer cycle, the above-mentioned shared hand adjacent to the above-mentioned second non-shared hand and the above-mentioned processing unit of the above-mentioned substrate before being processed by the above-mentioned shared hand The different processing units unload the processed substrates. 如請求項1或2之基板處理裝置,其中上述共用手、上述第1非共用手及上述第2非共用手之合計個數係N+1個,且上述共用手係M個,上述第1非共用手係1個,上述第2非共用手係1個;且M=N-1。 The substrate processing device according to claim 1 or 2, wherein the total number of the above-mentioned shared hands, the above-mentioned first non-shared hands and the above-mentioned second non-shared hands is N+1, and the above-mentioned shared hands are M, and the above-mentioned first 1 non-shared hand, and 1 second non-shared hand above; and M=N-1. 如請求項3之基板處理裝置,其中上述複數個手包含上述M個共用手、上述1個第1非共用手、上述1個第2非共用手、及其他手;且 上述複數個手之總數係2N個。 The substrate processing device according to claim 3, wherein the plurality of hands includes the M shared hands, the first unshared hand, the second unshared hand, and other hands; and The total number of the above plural hands is 2N. 如請求項4之基板處理裝置,其中N=2。 The substrate processing device according to claim 4, wherein N=2. 如請求項4之基板處理裝置,其進而具備控制上述搬送機構之控制部,且上述搬送機構受到上述控制部之控制,以第1基板搬送模式及第2基板搬送模式之任一模式動作,上述第1基板搬送模式係將上述2N個手中之上述N+1個手使用為上述M個共用手、上述第1非共用手及上述第2非共用手之模式,上述第2基板搬送模式係將上述2N個手中之N個手使用於僅支持由上述處理單元處理前之上述基板,並且將另N個手使用於僅支持由上述處理單元處理後之上述基板之模式。 The substrate processing apparatus according to claim 4, further comprising a control unit for controlling the transport mechanism, and the transport mechanism is controlled by the control unit to operate in any one of the first substrate transport mode and the second substrate transport mode, the above The first substrate transfer mode is a mode in which the above-mentioned N+1 hands among the above-mentioned 2N hands are used as the above-mentioned M shared hands, the above-mentioned first non-shared hand, and the above-mentioned second non-shared hand. The above-mentioned second substrate transfer mode is to use N hands of the 2N hands are used to support only the substrate before being processed by the processing unit, and the other N hands are used to only support the substrate after being processed by the processing unit. 如請求項3之基板處理裝置,其中上述複數個手之總數係N+1個。 The substrate processing apparatus according to claim 3, wherein the total number of the plurality of hands is N+1. 一種基板搬送方法,其係藉由搬送機構執行者,上述搬送機構於供載置複數片基板之基板載置部與處理上述基板之複數個處理單元之間搬送上述基板;且該基板搬送方法包含如下步驟:於1個搬送循環內,自上述基板載置部接收由上述處理單元處理前之N(N為2以上之整數)片上述基板,將上述N片基板向上述複數個處理單元中之N個處理單元搬入,且自上述N個處理單元搬出由上述N個處理單元處理後之N片上述基板,將上述N片基板 遞交至上述基板載置部;上述搬送機構具備各自支持上述基板之複數個手,上述複數個手包含第1非共用手、第2非共用手、及配置於上述第1非共用手與上述第2非共用手之間之M(M為1以上之整數)個共用手,上述第1非共用手、上述M個共用手及上述第2非共用手係沿著上下方向自上述第1非共用手至上述第2非共用手連續地配置;在將上述N片基板遞交至上述基板載置部之上述步驟中,於上述1個搬送循環內,上述M個共用手於不同之時序支持由上述處理單元處理前之上述基板與處理後之上述基板,於上述1個搬送循環內,上述第1非共用手僅支持由上述處理單元處理前之上述基板,於上述1個搬送循環內,上述第2非共用手僅支持由上述處理單元處理後之上述基板,於上述搬送機構自上述基板載置部接收到上述N片基板之狀態下,上述第2非共用手未支持上述基板,而上述M個共用手及上述第1非共用手支持著上述基板。 A substrate transfer method, which is performed by a transfer mechanism, the transfer mechanism transfers the substrate between a substrate mounting portion for placing a plurality of substrates and a plurality of processing units for processing the substrate; and the substrate transfer method includes The following steps are as follows: within one transport cycle, receive N (N is an integer greater than 2) pieces of the above-mentioned substrates from the above-mentioned substrate loading part before being processed by the above-mentioned processing unit, and transfer the above-mentioned N pieces of substrates to one of the above-mentioned plurality of processing units N processing units are carried in, and N pieces of the above-mentioned substrates processed by the above-mentioned N processing units are carried out from the above-mentioned N processing units, and the above-mentioned N pieces of substrates are Handed over to the above-mentioned substrate placement section; the above-mentioned conveying mechanism has a plurality of hands that each support the above-mentioned substrate, and the above-mentioned plurality of hands include a first unshared hand, a second unshared hand, and are arranged between the first unshared hand and the above-mentioned second unshared hand. 2 M (M is an integer greater than 1) shared hands between the non-shared hands, the first non-shared hand, the M shared hands and the second The hand is arranged continuously to the second non-shared hand; in the above-mentioned step of delivering the above-mentioned N substrates to the above-mentioned substrate loading part, in the above-mentioned one transfer cycle, the above-mentioned M shared hands are supported by the above-mentioned The above-mentioned substrate before processing by the processing unit and the above-mentioned substrate after processing, in the above-mentioned one transfer cycle, the first non-shared hand only supports the above-mentioned substrate before processing by the above-mentioned processing unit, and in the above-mentioned one transfer cycle, the above-mentioned first 2. The unshared hand supports only the substrates processed by the processing unit. In the state where the transfer mechanism receives the N substrates from the substrate loading section, the second unshared hand does not support the substrates, and the M The first shared hand and the first non-shared hand support the substrate. 如請求項8之基板搬送方法,其中在將上述N片基板遞交至上述基板載置部之上述步驟中,於上述1個搬送循環內,上述M個共用手及上述第1非共用手自上述基板載置部接收上述基板,於上述1個搬送循環內,上述第2非共用手自上述處理單元搬出處理後之上述基板, 於上述1個搬送循環內,上述M個共用手中鄰接於上述第2非共用手之共用手向已被上述第2非共用手搬出上述基板之上述處理單元,搬入處理前之上述基板,於上述1個搬送循環內,鄰接於上述第2非共用手之上述共用手自與已被上述共用手搬入處理前之上述基板之上述處理單元不同之上述處理單元,搬出處理後之上述基板。 The substrate transfer method according to claim 8, wherein in the step of delivering the N substrates to the substrate placement part, within the transfer cycle, the M shared hands and the first non-shared hands are transferred from the above The substrate loading unit receives the substrate, and the second unshared hand unloads the processed substrate from the processing unit within the one transfer cycle, In the above-mentioned 1 transfer cycle, the shared hand adjacent to the second non-shared hand in the M shared hands carries the substrate before processing into the processing unit that has been unloaded by the second non-shared hand. In one transport cycle, the shared hand adjacent to the second non-shared hand unloads the processed substrate from the processing unit different from the processing unit that has carried the substrate into the pre-processed substrate by the shared hand. 如請求項8或9之基板搬送方法,其中上述共用手、上述第1非共用手及上述第2非共用手之合計個數係N+1個,且上述共用手係M個,上述第1非共用手係1個,上述第2非共用手係1個;且M=N-1。 The substrate transfer method of claim 8 or 9, wherein the total number of the above-mentioned shared hand, the above-mentioned first non-shared hand and the above-mentioned second non-shared hand is N+1, and the above-mentioned shared hand is M, and the above-mentioned first 1 non-shared hand, and 1 second non-shared hand above; and M=N-1. 如請求項10之基板搬送方法,其中上述複數個手包含上述M個共用手、上述1個第1非共用手、上述1個第2非共用手、及其他手;且上述複數個手之總數係2N個。 The method for conveying substrates according to claim 10, wherein the plurality of hands includes the aforementioned M shared hands, the aforementioned 1st non-shared hand, the aforementioned 1st second non-shared hand, and other hands; and the total number of the aforementioned plurality of hands Department of 2N. 如請求項11之基板搬送方法,其中N=2。 The substrate transfer method according to claim 11, wherein N=2. 如請求項11之基板搬送方法,其中上述搬送機構以第1基板搬送模式及第2基板搬送模式之任一模式動作,上述第1基板搬送模式係將上述2N個手中之上述N+1個手使用為上述M個共用手、上述第1非共用手及上述第2非共用手之模式, 上述第2基板搬送模式係將上述2N個手中之N個手使用於僅支持由上述處理單元處理前之上述基板,並且將另N個手使用於僅支持由上述處理單元處理後之上述基板之模式。 The substrate transfer method according to claim 11, wherein the transfer mechanism operates in any one of the first substrate transfer mode and the second substrate transfer mode, and the first substrate transfer mode is to transfer the N+1 hands of the 2N hands Use the above-mentioned M shared hands, the above-mentioned first non-shared hand and the above-mentioned second non-shared hand, The second substrate transfer mode is to use N hands of the 2N hands to support only the substrates before being processed by the processing unit, and use the other N hands to support only the substrates processed by the processing unit. model. 如請求項10之基板搬送方法,其中上述複數個手之總數係N+1個。The substrate transfer method according to claim 10, wherein the total number of the plurality of hands is N+1.
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