TW202207343A - Substrate processing apparatus and substrate conveyance method - Google Patents
Substrate processing apparatus and substrate conveyance method Download PDFInfo
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- B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
- B25J—MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
- B25J11/00—Manipulators not otherwise provided for
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- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
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Abstract
Description
本發明係關於一種基板處理裝置及基板搬送方法。The present invention relates to a substrate processing apparatus and a substrate conveying method.
專利文獻1中記載之基板處理系統具備第1處理單元、第2處理單元、主搬送裝置、第1搬送裝置及第2搬送裝置。The substrate processing system described in
主搬送裝置具備保持晶圓之複數個(5個)晶圓保持部。主搬送裝置能於水平方向及鉛直方向上移動,且能以鉛直軸為中心迴旋,從而能使用晶圓保持部,於匣盒與交接模組之間同時搬送複數片晶圓。The main transfer device includes a plurality of (five) wafer holding sections that hold the wafers. The main transfer device can move in the horizontal direction and the vertical direction, and can rotate around the vertical axis, so that the wafer holder can be used to transfer a plurality of wafers simultaneously between the cassette and the transfer module.
第1搬送裝置具備1個晶圓保持部。而且,第1搬送裝置使用晶圓保持部,進行自交接模組取出晶圓並將其向第1處理單元搬送之處理、及將經第1處理單元處理過之晶圓自第1處理單元取出並向交接模組搬送之處理。因此,晶圓保持部於處理前之晶圓與處理後之晶圓之間係共用的。The first transfer device includes one wafer holding unit. Further, the first transfer device uses the wafer holding unit to perform processing of taking out the wafer from the transfer module and transferring the wafer to the first processing unit, and taking out the wafer processed by the first processing unit from the first processing unit And transfer to the transfer module. Therefore, the wafer holding portion is shared between the wafer before processing and the wafer after processing.
第2搬送裝置具備1個晶圓保持部。而且,第2搬送裝置使用晶圓保持部,進行自交接模組取出晶圓並將其向第2處理單元搬送之處理、及將經第2處理單元處理過之晶圓自第2處理單元取出並向交接模組搬送之處理。因此,晶圓保持部於處理前之晶圓與處理後之晶圓之間係共用的。The second transfer device includes one wafer holding unit. Furthermore, the second transfer device uses the wafer holding unit to perform processing of taking out the wafer from the transfer module and transferring the wafer to the second processing unit, and taking out the wafer processed by the second processing unit from the second processing unit. And transfer to the transfer module. Therefore, the wafer holding portion is shared between the wafer before processing and the wafer after processing.
以下,為求方便,著眼於第1搬送裝置及第1處理單元進行說明。 [先前技術文獻] [專利文獻]Hereinafter, for the sake of convenience, the description will focus on the first conveying device and the first processing unit. [Prior Art Literature] [Patent Literature]
[專利文獻1]日本專利特開2016-201526號公報[Patent Document 1] Japanese Patent Laid-Open No. 2016-201526
[發明所欲解決之問題][Problems to be Solved by Invention]
本案發明人著眼於第1搬送裝置具備複數個晶圓保持部(例如,3個以上晶圓保持部)之可能性、及處理前之晶圓與處理後之晶圓之間共用複數個晶圓保持部之可能性進行了探討。進而,本案發明人著眼於複數個晶圓保持部向複數個第1處理單元搬送複數片晶圓之動作進行了積極研究,以期提高第1搬送裝置(搬送機構)搬送晶圓(基板)之動作之產能。The inventors of the present application have paid attention to the possibility that the first transfer device includes a plurality of wafer holding parts (for example, three or more wafer holding parts), and that a plurality of wafers are shared between the wafer before processing and the wafer after processing The possibility of maintaining the department was explored. Furthermore, the inventors of the present application have made active studies focusing on the operation of transferring a plurality of wafers to a plurality of first processing units by the plurality of wafer holding units, in order to improve the operation of the first transfer device (transfer mechanism) for transferring wafers (substrates). production capacity.
本發明之目的在於,提供一種能提高搬送機構搬送基板之動作之產能之基板處理裝置及基板搬送方法。 [解決問題之技術手段]An object of the present invention is to provide a substrate processing apparatus and a substrate conveying method which can improve the productivity of the operation of conveying substrates by a conveying mechanism. [Technical means to solve problems]
根據本發明之一態樣,基板處理裝置具備基板載置部、複數個處理單元、及搬送機構。基板載置部供載置複數片基板。複數個處理單元各自處理上述基板。搬送機構於上述基板載置部與上述處理單元之間搬送上述基板。於1個搬送循環內,上述搬送機構自上述基板載置部接收由上述處理單元處理前之N(N為2以上之整數)片上述基板,將上述N片基板向上述複數個處理單元中之N個處理單元搬入,且自上述N個處理單元搬出由上述N個處理單元處理後之N片上述基板,將上述N片基板遞交至上述基板載置部。上述搬送機構具備複數個手。複數個手各自支持上述基板。上述複數個手包含第1非共用手、第2非共用手、及配置於上述第1非共用手與上述第2非共用手之間之M(M為1以上之整數)個共用手。上述第1非共用手、上述M個共用手及上述第2非共用手係沿著上下方向自上述第1非共用手至上述第2非共用手連續地配置。於上述1個搬送循環內,上述M個共用手於不同之時序支持由上述處理單元處理前之上述基板與處理後之上述基板。於上述1個搬送循環內,上述第1非共用手僅支持由上述處理單元處理前之上述基板。於上述1個搬送循環內,上述第2非共用手僅支持由上述處理單元處理後之上述基板。於上述搬送機構自上述基板載置部接收到上述N片基板之狀態下,上述第2非共用手未支持上述基板,而上述M個共用手及上述第1非共用手支持著上述基板。According to one aspect of the present invention, a substrate processing apparatus includes a substrate placing portion, a plurality of processing units, and a conveying mechanism. The substrate mounting portion is used to mount a plurality of substrates. The plurality of processing units each process the above-mentioned substrates. A conveyance mechanism conveys the said board|substrate between the said board|substrate mounting part and the said processing unit. In one transfer cycle, the transfer mechanism receives N (N is an integer of 2 or more) of the substrates before being processed by the processing unit from the substrate placement portion, and transfers the N substrates to one of the plurality of processing units. N number of processing units are carried in, and N pieces of the above-mentioned substrates processed by the above-mentioned N processing units are carried out from the above-mentioned N number of processing units, and the above-mentioned N pieces of substrates are delivered to the above-mentioned substrate placement portion. The above-mentioned conveyance mechanism includes a plurality of hands. Each of the plurality of hands supports the above-mentioned substrate. The plurality of hands includes a first non-shared hand, a second non-shared hand, and M (M is an integer of 1 or more) shared hands disposed between the first non-shared hand and the second non-shared hand. The first non-shared hand, the M shared hands, and the second non-shared hand are continuously arranged in the vertical direction from the first non-shared hand to the second non-shared hand. In the above-mentioned one transfer cycle, the above-mentioned M common hands support the above-mentioned substrate before being processed by the above-mentioned processing unit and the above-mentioned substrate after processing at different timings. In the above-mentioned one conveyance cycle, the above-mentioned first non-shared hand supports only the above-mentioned substrate before being processed by the above-mentioned processing unit. In the above-mentioned one conveyance cycle, the above-mentioned second non-shared hand supports only the above-mentioned substrate processed by the above-mentioned processing unit. When the conveying mechanism receives the N substrates from the substrate placement portion, the second non-shared hand does not support the substrate, and the M shared hands and the first non-shared hand support the substrate.
於本發明之一形態中,基板處理裝置中,較佳為:於上述1個搬送循環內,上述M個共用手及上述第1非共用手自上述基板載置部接收上述基板。較佳為:於上述1個搬送循環內,上述第2非共用手自上述處理單元搬出處理後之上述基板。較佳為:於上述1個搬送循環內,上述M個共用手中鄰接於上述第2非共用手之共用手向已被上述第2非共用手搬出上述基板之上述處理單元,搬入處理前之上述基板。較佳為:於上述1個搬送循環內,鄰接於上述第2非共用手之上述共用手自與已被上述共用手搬入處理前之上述基板之上述處理單元不同之上述處理單元,搬出處理後之上述基板。In one aspect of the present invention, in the substrate processing apparatus, it is preferable that the M shared hands and the first non-shared hand receive the substrate from the substrate placement portion within the one transfer cycle. It is preferable that in the said 1 conveyance cycle, the said 2nd non-shared hand carries out the said board|substrate after processing from the said processing unit. Preferably, in the above-mentioned 1 transfer cycle, the common hands adjacent to the second non-shared hands of the M common hands are loaded into the processing units from which the substrates have been carried out by the second non-shared hands into the above-mentioned processing units before processing. substrate. Preferably, within the one transfer cycle, the common hand adjacent to the second non-shared hand is removed from the processing unit that is different from the processing unit of the substrate before the processing by the common hand. the above-mentioned substrate.
於本發明之一形態中,基板處理裝置中,較佳為:上述M個共用手、上述第1非共用手及上述第2非共用手之合計個數係N+1個。較佳為:M=N-1。In one aspect of the present invention, in the substrate processing apparatus, it is preferable that the total number of the M shared hands, the first non-shared hands, and the second non-shared hands is N+1. Preferably: M=N-1.
於本發明之一形態中,基板處理裝置中,較佳為:上述複數個手之總數係2N個。In one aspect of the present invention, in the substrate processing apparatus, it is preferable that the total number of the plurality of hands is 2N.
於本發明之一形態中,基板處理裝置中,較佳為:N=2。In one aspect of the present invention, in the substrate processing apparatus, it is preferable that N=2.
於本發明之一形態中,基板處理裝置中,較佳為:進而具備控制上述搬送機構之控制部。較佳為:上述搬送機構受到上述控制部之控制,以第1基板搬送模式及第2基板搬送模式之任一模式動作。較佳為:上述第1基板搬送模式係將上述2N個手中之上述N+1個手使用為上述M個共用手、上述第1非共用手及上述第2非共用手之模式。較佳為:上述第2基板搬送模式係將上述2N個手中之N個手使用於僅支持由上述處理單元處理前之上述基板,並且將另N個手使用於僅支持由上述處理單元處理後之上述基板之模式。In one aspect of the present invention, the substrate processing apparatus preferably further includes a control unit that controls the conveyance mechanism. It is preferable that the said conveyance mechanism is controlled by the said control part, and it operates in any one mode of a 1st board|substrate conveyance mode and a 2nd board|substrate conveyance mode. Preferably, the first substrate transfer mode is a mode in which the N+1 hands out of the 2N hands are used as the M shared hands, the first non-shared hands, and the second non-shared hands. Preferably, in the second substrate transfer mode, N hands of the 2N hands are used for supporting only the substrate before being processed by the processing unit, and the other N hands are used for supporting only the substrate after being processed by the processing unit. The pattern of the above-mentioned substrate.
於本發明之一形態中,基板處理裝置中,較佳為:上述複數個手之總數係N+1個。In one aspect of the present invention, in the substrate processing apparatus, it is preferable that the total number of the plurality of hands is N+1.
根據本發明之另一態樣,基板搬送方法係藉由搬送機構執行者,上述搬送機構於供載置複數片基板之基板載置部與處理上述基板之複數個處理單元之間搬送上述基板。基板搬送方法包含如下步驟:於1個搬送循環內,自上述基板載置部接收由上述處理單元處理前之N(N為2以上之整數)片上述基板,將上述N片基板向上述複數個處理單元中之N個處理單元搬入,且自上述N個處理單元搬出由上述N個處理單元處理後之N片上述基板,將上述N片基板遞交至上述基板載置部。上述搬送機構具備各自支持上述基板之複數個手。上述複數個手包含第1非共用手、第2非共用手、及配置於上述第1非共用手與上述第2非共用手之間之M(M為1以上之整數)個共用手。上述第1非共用手、上述M個共用手及上述第2非共用手係沿著上下方向自上述第1非共用手至上述第2非共用手連續地配置。在將上述N片基板遞交至上述基板載置部之上述步驟中,於上述1個搬送循環內,上述M個共用手於不同之時序支持由上述處理單元處理前之上述基板與處理後之上述基板,於上述1個搬送循環內,上述第1非共用手僅支持由上述處理單元處理前之上述基板,於上述1個搬送循環內,上述第2非共用手僅支持由上述處理單元處理後之上述基板;於上述搬送機構自上述基板載置部接收到上述N片基板之狀態下,上述第2非共用手未支持上述基板,而上述M個共用手及上述第1非共用手支持著上述基板。According to another aspect of the present invention, the substrate conveying method is performed by a conveying mechanism that conveys the substrates between a substrate placement portion on which a plurality of substrates are placed and a plurality of processing units that process the substrates. The substrate transfer method includes the steps of: receiving N (N is an integer of 2 or more) of the substrates before being processed by the processing unit from the substrate placement unit in one transfer cycle, and transferring the N substrates to the plurality of substrates N processing units among the processing units are carried in, and N pieces of the substrates processed by the N processing units are carried out from the N processing units, and the N pieces of the substrates are delivered to the substrate placement portion. The said conveyance mechanism is equipped with the some hand which supports the said board|substrate, respectively. The plurality of hands includes a first non-shared hand, a second non-shared hand, and M (M is an integer of 1 or more) shared hands disposed between the first non-shared hand and the second non-shared hand. The first non-shared hand, the M shared hands, and the second non-shared hand are continuously arranged in the vertical direction from the first non-shared hand to the second non-shared hand. In the step of delivering the N substrates to the substrate placement section, the M shared hands support the substrates before processing by the processing unit and the substrates after processing at different timings within the one transfer cycle. For the substrate, in the above-mentioned one transfer cycle, the first non-shared hand supports only the substrate before being processed by the processing unit, and in the above-mentioned one transfer cycle, the second non-shared hand supports only the substrate processed by the processing unit. the above-mentioned substrate; when the above-mentioned conveying mechanism receives the above-mentioned N pieces of substrates from the above-mentioned substrate placing part, the above-mentioned second non-shared hand does not support the above-mentioned substrate, but the above-mentioned M common hands and the above-mentioned first non-shared hand support it the above-mentioned substrate.
於本發明之一形態中,基板搬送方法中,較佳為:在將上述N片基板遞交至上述基板載置部之上述步驟中,於上述1個搬送循環內,上述M個共用手及上述第1非共用手自上述基板載置部接收上述基板,於上述1個搬送循環內,上述第2非共用手自上述處理單元搬出處理後之上述基板,於上述1個搬送循環內,上述M個共用手中鄰接於上述第2非共用手之共用手向已被上述第2非共用手搬出上述基板之上述處理單元,搬入處理前之上述基板,於上述1個搬送循環內,鄰接於上述第2非共用手之上述共用手自與已被上述共用手搬入處理前之上述基板之上述處理單元不同之上述處理單元,搬出處理後之上述基板。In one aspect of the present invention, in the substrate transfer method, preferably, in the step of delivering the N pieces of substrates to the substrate placement portion, in the one transfer cycle, the M shares share the hand and the The first non-shared hand receives the substrate from the substrate placement portion, and the second non-shared hand carries out the processed substrate from the processing unit in the one transport cycle, and the M The shared hand adjacent to the second non-shared hand in the shared hand is transported into the processing unit that has been transported out of the substrate by the second non-shared hand, and the substrate before processing is transported, within the one transfer cycle, adjacent to the second non-shared hand. 2. The shared hand of the non-shared hand carries out the processed substrate from the aforementioned processing unit different from the aforementioned processing unit of the aforementioned substrate before processing by the aforementioned shared hand.
於本發明之一形態中,基板搬送方法中,較佳為:上述M個共用手、上述第1非共用手及上述第2非共用手之合計個數係N+1個。較佳為:M=N-1。In one aspect of the present invention, in the substrate transfer method, it is preferable that the total number of the M shared hands, the first non-shared hands, and the second non-shared hands is N+1. Preferably: M=N-1.
於本發明之一形態中,基板搬送方法中,較佳為上述複數個手之總數係2N個。In one aspect of the present invention, in the substrate transfer method, it is preferable that the total number of the plurality of hands is 2N.
於本發明之一形態中,基板搬送方法中,較佳為N=2。In one aspect of this invention, in a board|substrate conveyance method, it is preferable that N=2.
於本發明之一形態中,基板搬送方法中,較佳為:上述搬送機構以第1基板搬送模式及第2基板搬送模式任一模式動作。較佳為:上述第1基板搬送模式係將上述2N個手中之上述N+1個手使用為上述M個共用手、上述第1非共用手及上述第2非共用手之模式。較佳為:上述第2基板搬送模式係將上述2N個手中之N個手使用於僅支持由上述處理單元處理前之上述基板,並且將另N個手使用於僅支持由上述處理單元處理後之上述基板之模式。In one aspect of the present invention, in the substrate conveyance method, preferably, the conveyance mechanism operates in either a first substrate conveyance mode or a second substrate conveyance mode. Preferably, the first substrate transfer mode is a mode in which the N+1 hands out of the 2N hands are used as the M shared hands, the first non-shared hands, and the second non-shared hands. Preferably, in the second substrate transfer mode, N hands of the 2N hands are used for supporting only the substrate before being processed by the processing unit, and the other N hands are used for supporting only the substrate after being processed by the processing unit. The pattern of the above-mentioned substrate.
於本發明之一形態中,基板搬送方法中,較佳為:上述複數個手之總數係N+1個。 [發明之效果]In one aspect of the present invention, in the substrate transfer method, it is preferable that the total number of the plurality of hands is N+1. [Effect of invention]
根據本發明之基板處理裝置及基板搬送方法,能提高搬送機構搬送基板之動作之產能。According to the substrate processing apparatus and the substrate conveying method of the present invention, the productivity of the operation of conveying the substrate by the conveying mechanism can be improved.
以下,參照圖式對本發明之實施方式進行說明。再者,圖中對相同或相當之部分標註了相同之參照符號,因此不重複進行說明。又,為了便於說明,圖式中酌情標記了三維正交座標系(X,Y,Z)。而且,於圖中,X軸及Y軸與水平方向平行,Z軸與鉛直方向平行。又,於實施方式之說明中,會酌情使用第1方向DX、第2方向DY及第3方向DZ。第1方向DX、第2方向DY及第3方向DZ相互正交。作為一例,第1方向DX及第2方向DY與水平方向大致平行,第3方向DZ與鉛直方向大致平行。為了便於說明,有時將第3方向DZ記作「上下方向DZ」。Hereinafter, embodiments of the present invention will be described with reference to the drawings. In addition, the same reference signs are attached to the same or corresponding parts in the drawings, and thus the description will not be repeated. In addition, for convenience of description, a three-dimensional orthogonal coordinate system (X, Y, Z) is indicated in the drawings as appropriate. In addition, in the figure, the X axis and the Y axis are parallel to the horizontal direction, and the Z axis is parallel to the vertical direction. In addition, in the description of the embodiment, the first direction DX, the second direction DY, and the third direction DZ are used as appropriate. The first direction DX, the second direction DY, and the third direction DZ are orthogonal to each other. As an example, the first direction DX and the second direction DY are substantially parallel to the horizontal direction, and the third direction DZ is substantially parallel to the vertical direction. For convenience of explanation, the third direction DZ may be referred to as "up-down direction DZ".
首先,參照圖1對本實施方式之基板處理裝置100進行說明。圖1係表示本實施方式之基板處理裝置100之內部之俯視圖。再者,本實施方式中,為了簡化圖式及說明,省略吸氣系統及排氣系統。First, the
圖1所示之基板處理裝置100處理基板W。基板W例如為半導體晶圓、液晶顯示裝置用基板、電漿顯示器用基板、場致發射顯示器(Field Emission Display:FED)用基板、光碟用基板、磁碟用基板、光磁碟用基板、光罩用基板、陶瓷基板或太陽電池用基板。The
基板處理裝置100具備移載傳送部1與處理部20。處理部20鄰接於移載傳送部1而配置。移載傳送部1向處理部20供給基板W。處理部20處理基板W。移載傳送部1自處理部20回收基板W。The
移載傳送部1具備複數個載具載置部3(例如,4個載具載置部3)。複數個載具載置部3沿著第1方向DX配置。複數個載具載置部3分別供載置複數個載具C。複數個載具C各自收容複數片基板W。本實施方式中,作為一例,複數個載具C各自收容25片基板W。載具C例如為FOUP(front opening unified pod,前開式單元匣)。The
移載傳送部1具備第1搬送室5。第1搬送室5位於複數個載具載置部3與處理部20之間。The
移載傳送部1至少具備1個第1搬送機構7。本實施方式中,作為一例,移載傳送部1具備1個第1搬送機構7。第1搬送機構7配置於第1搬送室5。第1搬送機構7搬送基板W。具體而言,第1搬送機構7於各載具C與處理部20之間搬送基板W。The
第1搬送機構7具備複數個第1手9、及第1手驅動部11。再者,圖1中僅示出了1個第1手9,其他第1手9之標記為求簡化被省略了。各第1手9支持1片基板W。本實施方式中,各第1手9將1片基板W以水平姿勢支持。第1手驅動部11連結於各第1手9。第1手驅動部11移動各第1手9。第1手驅動部11具備複數個電動馬達。The
其次,參照圖1及圖2對各第1手9及第1手驅動部11進行說明。圖2係沿著圖1之II-II線之剖視圖。Next, each of the
如圖2所示,複數個第1手9沿著上下方向DZ配置。本實施方式中,作為一例,第1搬送機構7具備5個第1手9。實際上,如下所述,複數個第1手9係於上下方向DZ上隔開間隔而配置。第1手驅動部11移動複數個第1手9時要維持複數個第1手9之上下方向DZ之間隔不變。各第1手9自載具C接收未處理之基板W,並將未處理之基板W向處理部20搬送。又,各第1手9自處理部20接收經處理部20處理過之處理後之基板W,並將其向載具C搬送。As shown in FIG. 2 , the plurality of
如圖1及圖2所示,第1手驅動部11具備軌道11a、水平移動部11b、垂直移動部11c、迴旋部11d、迴旋軸11e及進退部11f。As shown in FIGS. 1 and 2 , the first
軌道11a配置於第1搬送室5之底部。軌道11a沿著第1方向DX延伸。水平移動部11b支持於軌道11a。水平移動部11b沿著軌道11a於第1方向DX上移動。垂直移動部11c支持於水平移動部11b。垂直移動部11c相對於水平移動部11b在上下方向DZ上移動。The
迴旋部11d支持於垂直移動部11c。迴旋部11d相對於垂直移動部11c迴旋。迴旋部11d藉由迴旋軸11e被驅動,而繞迴旋軸線A1迴旋。迴旋軸線A1係沿著上下方向DZ延伸之假想線。The turning
進退部11f於由迴旋部11d之方向決定之水平之一個方向上往返移動。進退部11f連接於各第1手9。而且,進退部11f使各第1手9分別於由迴旋部11d之方向決定之水平之一個方向上往返移動。進退部11f連接於各第1手9。The advancing and retreating
如以上參照圖1及圖2所說明般,第1搬送機構7具備第1手驅動部11。因此,各第1手9能沿著上下方向DZ平行移動。該情形時,第1手驅動部11使複數個第1手9全體沿著上下方向DZ移動。又,各第1手9能繞迴旋軸線A1迴旋。該情形時,第1手驅動部11例如使複數個第1手9全體迴旋。而且,各第1手9能於水平之任意方向上平行移動。As described above with reference to FIGS. 1 and 2 , the
其次,參照圖1~圖4對處理部20進行說明。圖3係沿著圖1之III-III線之剖視圖。圖4係表示基板處理裝置100之側視圖。Next, the
如圖1、圖3及圖4所示,處理部20具備複數個處理單元21。複數個處理單元21各自一片一片地處理基板W。例如,各處理單元21利用處理液(例如,藥液)來處理基板W。本實施方式中,作為一例,處理部20具備24個處理單元21。As shown in FIGS. 1 , 3 and 4 , the
具體而言,處理部20具有複數個處理塔TW。作為一例,各處理塔TW由沿著上下方向DZ配置之K個處理單元21構成。本實施方式中,K係2以上之整數。於各處理塔TW中,K/2個處理單元21配置於下段LW,K/2個處理單元21配置於上段UP。Specifically, the
本實施方式中,作為一例,K=6,由6個處理單元21構成1個處理塔TW。而且,處理部20具有4個處理塔TW。有時將4個處理塔TW分別記作處理塔TW1、TW2、TW3、TW4。In the present embodiment, as an example, K=6, and one processing tower TW is constituted by six processing
處理塔TW1、TW2沿著第2方向DY配置。處理塔TW3、TW4沿著第2方向DY配置。處理塔TW1、TW2與處理塔TW3、TW4隔著第2搬送室31於第1方向DX上相對向。The treatment towers TW1 and TW2 are arranged along the second direction DY. The treatment towers TW3 and TW4 are arranged along the second direction DY. The processing towers TW1 and TW2 and the processing towers TW3 and TW4 face each other in the first direction DX with the
又,如圖1及圖2所示,處理部20進而具備複數個基板載置部29。本實施方式中,作為一例,處理部20具備2個基板載置部29。各基板載置部29可供載置複數片基板W。本實施方式中,作為一例,各基板載置部29可供載置20片基板W。各基板載置部29鄰接於第1搬送室5。Moreover, as shown in FIGS. 1 and 2 , the
以下,對於2個基板載置部29,有時將位於下段LW之基板載置部29記作「基板載置部29L」,將位於上段UP之基板載置部29記作「基板載置部29U」。Hereinafter, regarding the two
基板載置部29L配置於下段LW之第2搬送室31。基板載置部29U配置於上段UP之第2搬送室31。基板載置部29L與基板載置部29U沿著上下方向DZ配置於一條直線上。The
又,如圖2所示,處理部20進而具備複數個第2搬送機構23及複數個第2搬送室31。本實施方式中,作為一例,處理部20具備2個第2搬送機構23及2個第2搬送室31。第2搬送機構23相當於「搬送機構」之一例。Furthermore, as shown in FIG. 2 , the
2個第2搬送室31沿著上下方向DZ配置。各第2搬送室31沿著第2方向DY延伸。各第2搬送室31與第1搬送室5相連。The two
各第2搬送機構23搬送基板W。具體而言,第2搬送機構23於基板載置部29與處理單元21之間搬送基板W。以下,對於2個第2搬送機構23,有時將位於下段LW之第2搬送機構23記作「第2搬送機構23L」,將位於上段UP之第2搬送機構23記作「第2搬送機構23U」。Each
第2搬送機構23L配置於下段LW之第2搬送室31。第2搬送機構23U配置於上段UP之第2搬送室31。The
如圖1~圖3所示,各第2搬送機構23具備複數個第2手25、及第2手驅動部17。本實施方式中,作為一例,各第2搬送機構23具備4個第2手25。第2手25相當於「手」之一例。As shown in FIGS. 1 to 3 , each
各第2手25支持1片基板W。本實施方式中,各第2手25將1片基板W以水平姿勢支持。第2手驅動部17連結於各第2手25。第2手驅動部17移動各第2手25。第2手驅動部17具備複數個電動馬達。Each
具體而言,於各第2搬送機構23中,複數個第2手25沿著上下方向DZ配置。實際上,如下所述,於各第2搬送機構23中,複數個第2手25係於上下方向DZ上隔開間隔而配置。而且,第2手驅動部17移動複數個第2手25時要維持複數個第2手25之上下方向DZ之間隔不變。例如,第2手25自基板載置部29接收未處理之基板W,並將未處理之基板W向處理單元21搬送。例如,第2手25自處理單元21接收經處理單元21處理過之處理後之基板W,並將其遞交至基板載置部29。Specifically, in each of the
第2手驅動部17具備2個支柱27a、垂直移動部27b、水平移動部27c、迴旋部27d、迴旋軸27e及進退部27f。The 2nd
2個支柱27a配置於第2搬送室31。具體而言,2個支柱27a配置於第2搬送室31之內側面。2個支柱27a係於第2方向DY上隔開間隔而配置。各支柱27a沿著上下方向DZ延伸。垂直移動部27b支持於2個支柱27a。垂直移動部27b跨涉2個支柱27a而沿著第2方向DY延伸。垂直移動部27b沿著2個支柱27a於上下方向DZ上移動。水平移動部27c支持於垂直移動部27b。水平移動部27c沿著垂直移動部27b,於2個支柱27a之間在第2方向DY上移動。The two
迴旋部27d支持於水平移動部27c。迴旋部27d相對於水平移動部27c迴旋。迴旋部27d藉由迴旋軸27e被驅動,而繞迴旋軸線A2迴旋。迴旋軸線A2係沿著上下方向DZ延伸之假想線。The turning
進退部27f相對於迴旋部27d移動。進退部27f於由迴旋部27d之方向決定之水平之一個方向上往返移動。進退部27f連接於各第2手25。The advancing and retreating
如以上參照圖1~圖3所說明般,各第2搬送機構23具備第2手驅動部17。因此,各第2手25能沿著上下方向DZ平行移動。該情形時,第2手驅動部17使複數個第2手25全體沿著上下方向DZ移動。又,各第2手25能繞迴旋軸線A2迴旋。該情形時,第2手驅動部17例如使複數個第2手25全體迴旋。而且,各第2手25能於水平之任意方向上平行移動。As described above with reference to FIGS. 1 to 3 , each of the
此處,如圖1所示,基板處理裝置100進而具備控制部200。控制部200控制基板處理裝置100之各構成。具體而言,控制部200控制第1搬送機構7、第2搬送機構23及處理單元21。Here, as shown in FIG. 1 , the
控制部200例如為電腦。具體而言,控制部200具備處理器與記憶裝置。處理器例如包含CPU(Central Processing Unit,中央處理單元)。記憶裝置記憶資料及電腦程式。記憶裝置例如包含如半導體記憶體般之主記憶裝置,以及如半導體記憶體、固態驅動器及/或硬碟驅動器般之輔助記憶裝置。記憶裝置亦可包含可移動介質。記憶裝置相當於非暫時性電腦可讀取記憶介質之一例。The
具體而言,控制部200之處理器藉由執行記憶裝置中記憶之電腦程式,來控制第1搬送機構7、第2搬送機構23及處理單元21。Specifically, the processor of the
繼續參照圖1及圖2,對第1搬送機構7及第2搬送機構23搬送基板W時之整個流程進行說明。1 and 2, the entire flow of the
第1搬送機構7之第1手9自載具C接收未處理之複數片基板W,並將未處理之複數片基板W遞交至基板載置部29L或基板載置部29U。其結果,未處理之複數片基板W載置至基板載置部29L或基板載置部29U。本實施方式中,「未處理之基板」表示處理單元21尚未加以處理之基板W,即尚未經處理單元21處理之基板W。The
第2搬送機構23L之第2手25自基板載置部29L接收未處理之複數片基板W,並將未處理之基板W一片一片地向下段LW之各處理單元21搬入。然後,下段LW之各處理單元21處理未處理之基板W。The
又,第2搬送機構23L之第2手25自下段LW之各處理單元21搬出處理後之基板W,並將處理後之複數片基板W遞交至基板載置部29L。其結果,處理後之複數片基板W載置至基板載置部29L。Further, the
另一方面,第2搬送機構23U之第2手25自基板載置部29U接收未處理之複數片基板W,並將未處理之基板W一片一片地向上段UP之各處理單元21搬入。然後,上段UP之各處理單元21處理未處理之基板W。On the other hand, the
又,第2搬送機構23U之第2手25自上段UP之各處理單元21搬出處理後之基板W,並將處理後之複數片基板W遞交至基板載置部29U。其結果,處理後之複數片基板W載置至基板載置部29U。Further, the
第1搬送機構7之第1手9自基板載置部29L或基板載置部29U接收處理後之複數片基板W,並將處理後之複數片基板W遞交至載具C。其結果,處理後之複數片基板W收容至載具C。The
其次,參照圖5對處理單元21進行說明。圖5係表示處理單元21之內部之側視圖。如圖5所示,處理單元21具備處理殼體41、基板保持部43、旋轉驅動部45、第1噴嘴47、第1噴嘴移動部47a、第2噴嘴49、第2噴嘴移動部49a、第3噴嘴51、第3噴嘴移動部51a、第4噴嘴53、第4噴嘴移動部53a及承杯55。又,基板處理裝置100進而具備第1處理液供給配管473、第2處理液供給配管493、第3處理液供給配管513及沖洗液供給配管533。Next, the
處理殼體41具有箱形形狀。處理殼體41收容基板保持部43、旋轉驅動部45、第1噴嘴47、第1噴嘴移動部47a、第2噴嘴49、第2噴嘴移動部49a、第3噴嘴51、第3噴嘴移動部51a、第4噴嘴53、第4噴嘴移動部53a及承杯55。又,處理殼體41收容第1處理液供給配管473之一部分、第2處理液供給配管493之一部分、第3處理液供給配管513之一部分及沖洗液供給配管533之一部分。已由第2搬送機構23搬入至處理單元21之基板W收容於處理殼體41之內部。The
基板保持部43將基板W水平地保持。基板保持部43例如為真空式旋轉吸盤。再者,基板保持部43保持基板W之方式並不限定於真空式。基板保持部43保持基板W之方式例如亦可為夾持式或伯努利(Bernoulli)式。The
旋轉驅動部45使基板保持部43以旋轉軸線A3為中心而旋轉。其結果,基板W與基板保持部43以旋轉軸線A3為中心一體旋轉。旋轉軸線A3係沿著上下方向DZ延伸之假想線。旋轉驅動部45例如包含電動馬達。The rotation drive
第1噴嘴47自基板W之上方向基板W供給第1處理液。詳細而言,第1噴嘴47向旋轉中之基板W噴出第1處理液。第1噴嘴移動部47a使第1噴嘴47於處理位置與退避位置之間移動。第1噴嘴47移動至處理位置時,於俯視下與基板W相對向。第1噴嘴47移動至退避位置時,於俯視下不與基板W相對向。詳細而言,第1噴嘴47移動至退避位置時,於俯視下退避至基板W之周圍。The
具體而言,第1噴嘴移動部47a具有第1噴嘴臂471與第1噴嘴驅動部472。第1噴嘴臂471沿著大致水平方向延伸。於第1噴嘴臂471之前端部配置第1噴嘴47。第1噴嘴驅動部472使第1噴嘴臂471以沿著上下方向DZ延伸之旋轉軸線為中心而沿著大致水平面迴旋。其結果,第1噴嘴47沿著以上下方向DZ上延伸之旋轉軸線為中心之圓周方向,於圓周方向上移動。第1噴嘴驅動部472包含能正反旋轉之電動馬達。Specifically, the first
第1處理液供給配管473向第1噴嘴47供給第1處理液。第1處理液供給配管473係供第1處理液流通之管狀構件。本實施方式中,第1處理液係酸性液體。例如,第1處理液為氫氟酸(氟化氫酸)、硫酸與過氧化氫水之混合液(SPM)、硫酸、硫酸-過氧化氫水、氫氟酸-硝酸(氫氟酸與硝酸之混合液)、或鹽酸。The first processing
第2噴嘴49自基板W之上方向基板W供給第2處理液。詳細而言,第2噴嘴49向旋轉中之基板W噴出第2處理液。第2噴嘴移動部49a與第1噴嘴移動部47a同樣地,使第2噴嘴49於處理位置與退避位置之間移動。具體而言,第2噴嘴移動部49a與第1噴嘴移動部47a同樣地,具有第2噴嘴臂491與第2噴嘴驅動部492。第2噴嘴臂491及第2噴嘴驅動部492之構成與第1噴嘴臂471及第1噴嘴驅動部472相同,因此省略說明。The
第2處理液供給配管493向第2噴嘴49供給第2處理液。第2處理液供給配管493係供第2處理液流通之管狀構件。本實施方式中,第2處理液係鹼性液體。例如,第2處理液為氨水-過氧化氫水(SC1)、氨水、氟化銨溶液或四甲基氫氧化銨(TMAH)。The second processing
第3噴嘴51自基板W之上方向基板W供給第3處理液。詳細而言,第3噴嘴51向旋轉中之基板W噴出第3處理液。第3噴嘴移動部51a與第1噴嘴移動部47a同樣地,使第3噴嘴51於處理位置與退避位置之間移動。具體而言,第3噴嘴移動部51a與第1噴嘴移動部47a同樣地,具有第3噴嘴臂511與第3噴嘴驅動部512。第3噴嘴臂511及第3噴嘴驅動部512之構成與第1噴嘴臂471及第1噴嘴驅動部472相同,因此省略說明。The
第3處理液供給配管513向第3噴嘴51供給第3處理液。第3處理液供給配管513係供第3處理液流通之管狀構件。本實施方式中,第3處理液係有機溶劑。例如,第3處理液為異丙醇(IPA)、甲醇、乙醇、氫氟醚(HFE)或丙酮。The third processing
第4噴嘴53自基板W之上方向基板W供給沖洗液。詳細而言,第4噴嘴53向旋轉中之基板W噴出沖洗液。第4噴嘴移動部53a與第1噴嘴移動部47a同樣地,使第4噴嘴53於處理位置與退避位置之間移動。具體而言,第4噴嘴移動部53a與第1噴嘴移動部47a同樣地,具有第4噴嘴臂531與第4噴嘴驅動部532。第4噴嘴臂531及第4噴嘴驅動部532之構成與第1噴嘴臂471及第1噴嘴驅動部472相同,因此省略說明。The
沖洗液供給配管533向第4噴嘴53供給沖洗液。沖洗液供給配管533係供沖洗液流通之管狀構件。例如,沖洗液為純水、碳酸水、電解離子水、氫水、臭氧水、或經過稀釋之鹽酸水。The rinse
承杯55配置於基板保持部43之周圍。承杯55包圍保持於基板保持部43之基板W之側方。承杯55承接自旋轉中之基板W飛散之第1處理液~第3處理液、及沖洗液。The
其次,參照圖6對第1搬送機構7、第2搬送機構23L、23U、及基板載置部29L、29U進行說明。Next, the
圖6係表示第1搬送機構7、第2搬送機構23L、23U、及基板載置部29L、29U之側視圖。FIG. 6 is a side view showing the
如圖6所示,第1搬送機構7具備P個第1手9。於本說明書中,只要未特意明示,P即為2以上之整數,表示第1手9之總數。作為較佳之例,P個第1手9沿著上下方向DZ以相等間隔d配置。As shown in FIG. 6 , the
各第1手9支持處理前之基板W、或處理後之基板W。各第1手9一次支持1片基板W。Each of the
本實施方式中,作為一例,P=5,第1搬送機構7具備5個第1手9。In the present embodiment, as an example, P=5, and the
第2搬送機構23L及第2搬送機構23U各自具備Q個第2手25。於本說明書中,只要未特意明示,Q即為3以上之整數,表示第2搬送機構23L及第2搬送機構23U各自之第2手25之總數。作為較佳之例,Q個第2手25沿著上下方向DZ以相等間隔d配置。即,上下方向DZ上鄰接之2個第2手25之上下方向DZ之間隔係間隔d。各第2手25一次支持1片基板W。The
例如,Q個第2手25中之一部分第2手25既可用於支持處理前之基板W之情形時,亦可用於支持處理後之基板W之情形時。For example, a part of the
例如,亦可為Q個第2手25中之一部分第2手25僅支持處理前之基板W,另一部分第2手25僅支持處理後之基板W。For example, some of the
本實施方式中,作為一例,Q=4,第2搬送機構23L及第2搬送機構23U各自具備4個第2手25。In the present embodiment, as an example, Q=4, and each of the
以下,對於第2搬送機構23L及第2搬送機構23U各自之4個第2手25,分別由下而上依序記作第2手HA、第2手HB、第2手HC及第2手HD。Hereinafter, the four
基板載置部29L及基板載置部29U各自具備R個支持部291。於本說明書中,只要未特意明示,R即為2以上之整數,表示基板載置部29L及基板載置部29U各自之支持部291之總數。R例如為2以上之偶數。R個支持部291係沿著上下方向DZ隔開間隔而配置。作為較佳之例,R個支持部291沿著上下方向DZ以相等間隔d配置。即,上下方向DZ上鄰接之2個支持部291之上下方向DZ之間隔係間隔d。各支持部291支持1片基板W。具體而言,各支持部291將1片基板W以水平姿勢支持。Each of the
作為較佳之例,支持部291之間隔d、第1手9之間隔d及第2手25之間隔d大致相等。As a preferred example, the interval d between the
本實施方式中,作為一例,基板載置部29L及基板載置部29U各自之下段291A之R/2個支持部291支持處理前之基板W,上段291B之R/2個支持部291支持處理後之基板W。In the present embodiment, as an example, R/2
又,本實施方式中,作為一例,R=20,基板載置部29L及基板載置部29U各自具備20個支持部291。In addition, in the present embodiment, as an example, R=20, and each of the
再者,第1手9之間隔並不特別限定,例如,亦可不為相等間隔,還可只有一部分為相等間隔。又,第2手25之間隔並不特別限定,例如,亦可不為相等間隔,還可只有一部分為相等間隔。進而,支持部291之間隔並不特別限定,例如,亦可不為相等間隔,還可只有一部分為相等間隔。進而,相互鄰接之支持部291之間隔、相互鄰接之第1手9之間隔及相互鄰接之第2手25之間隔亦可不相等。In addition, the interval between the
其次,參照圖7對本實施方式之第1基板搬送方法之一例進行說明。於圖7之說明中,無需指明特定之基板W之情形時,簡記作「基板」。Next, an example of the first substrate conveyance method of the present embodiment will be described with reference to FIG. 7 . In the description of FIG. 7 , when there is no need to specify the situation of a specific substrate W, it is abbreviated as “substrate”.
第1基板搬送方法利用在基板載置部29與處理單元21之間搬送基板之第2搬送機構23來執行。於第1基板搬送方法中,處理前之基板與處理後之基板之間共用M個第2手25,藉此搬送複數片基板。於本說明書中,只要未特意明示,M即為1以上之整數。第1基板搬送方法相當於「基板搬送方法」之一例。The first substrate transfer method is performed by the
圖7係表示第1基板搬送方法之整個流程之一例之圖。於圖7中,為求簡單,著眼於配置在下段LW之基板載置部29L、配置在下段LW之第2搬送機構23L、及配置在下段LW之複數個處理單元21中之處理單元21A、21B進行說明。處理單元21A與處理單元21B配置於不同之位置。又,基板載置部29L之下段291A供載置處理前之基板,基板載置部29L之上段291B供載置處理後之基板。FIG. 7 is a diagram showing an example of the entire flow of the first substrate transfer method. In FIG. 7 , for simplicity, attention is paid to the
又,於第1基板搬送方法之說明中,有時將第2手HA記作「第1非共用手HA」,將第2手HB記作「共用手HB」,將第2手HC記作「第2非共用手HC」。於圖7所示之例示性之第1基板搬送方法中,不使用第2手HD。Also, in the description of the first substrate transfer method, the second hand HA may be referred to as "1st non-shared hand HA", the second hand HB may be referred to as "shared hand HB", and the second hand HC may be referred to as "shared hand HB". "Second non-shared hand HC". In the exemplary 1st board|substrate conveyance method shown in FIG. 7, the 2nd hand HD is not used.
進而,於以下說明中,搬送循環CY表示如下順序之一輪動作:第2搬送機構23自基板載置部29接收未處理之基板,然後第2搬送機構23將未處理之基板向處理單元21搬入,並且第2搬送機構23自處理單元21搬出處理後之基板,然後第2搬送機構23將處理後之基板載置至基板載置部29。Furthermore, in the following description, the conveyance cycle CY represents one round of operations in the following sequence: the
如圖7所示,作為一例,於某個時序,於基板載置部29L之下段291A,沿著上下方向DZ載置有10片未處理之基板W1~W10,而於基板載置部29L之上段291B未載置基板。As shown in FIG. 7 , as an example, at a certain timing, 10 unprocessed substrates W1 to W10 are placed on the
於第1基板搬送方法中,1個搬送循環CY內,第2搬送機構23L向2個處理單元21A、21B搬入2片未處理之基板W1、W2,並自2個處理單元21A、21B搬出2片處理後之基板WX1、WX2。搬送循環CY重複執行。In the first substrate transfer method, in one transfer cycle CY, the
具體而言,於第1基板搬送方法中,1個搬送循環CY內,第2搬送機構23L自基板載置部29L接收處理單元21A、21B加以處理前之2片基板W1、W2,並將2片基板W1、W2向複數個處理單元21中之2個處理單元21A、21B搬入,且自2個處理單元21A、21B搬出2個處理單元21A、21B加以處理後之2片基板WX1、WX2,並將2片基板WX1、WX2遞交至基板載置部29L。Specifically, in the first substrate transfer method, within one transfer cycle CY, the
更具體而言,4個第2手HA~HD包含第1非共用手HA、共用手HB及第2非共用手HC。共用手HB配置於第1非共用手HA與第2非共用手HC之間。共用手HB在第1特定方向SD1上鄰接於第2非共用手HC。第1非共用手HA在第1特定方向SD1上鄰接於共用手HB。More specifically, the four second hands HA to HD include a first unshared hand HA, a shared hand HB, and a second unshared hand HC. The shared hand HB is arranged between the first unshared hand HA and the second unshared hand HC. The shared hand HB is adjacent to the second non-shared hand HC in the first specific direction SD1. The first non-shared hand HA is adjacent to the shared hand HB in the first specific direction SD1.
第1特定方向SD1表示自第2非共用手HC朝向第1非共用手HA之方向。另一方面,第2特定方向SD2係第1特定方向SD1之相反方向,表示自第1非共用手HA朝向第2非共用手HC之方向。第1特定方向SD1及第2特定方向SD2與上下方向DZ大致平行。例如,第1特定方向SD1表示下方向,第2特定方向SD2表示上方向。The first specific direction SD1 represents the direction from the second non-shared hand HC to the first non-shared hand HA. On the other hand, the second specific direction SD2 is the opposite direction to the first specific direction SD1, and represents the direction from the first non-shared hand HA toward the second non-shared hand HC. The first specific direction SD1 and the second specific direction SD2 are substantially parallel to the vertical direction DZ. For example, the first specific direction SD1 represents the downward direction, and the second specific direction SD2 represents the upward direction.
第1非共用手HA、共用手HB及第2非共用手HC係自第1非共用手HA至第2非共用手HC,沿著上下方向DZ連續地配置。The first non-shared hand HA, the shared hand HB, and the second non-shared hand HC are continuously arranged along the vertical direction DZ from the first non-shared hand HA to the second non-shared hand HC.
而且,於1個搬送循環CY內,第1非共用手HA僅支持處理單元21B加以處理前之基板W1。又,於1個搬送循環CY內,共用手HB於不同之時序支持由處理單元21A處理前之基板W2、及處理單元21B加以處理後之基板WX1。進而,於1個搬送循環CY內,第2非共用手HC僅支持處理單元21A加以處理後之基板WX2。In addition, within one conveyance cycle CY, the first non-shared hand HA supports only the substrate W1 before being processed by the
繼續參照圖7,對1個搬送循環CY內第2搬送機構23L之狀態ST1~ST4進行說明。With continued reference to FIG. 7 , the states ST1 to ST4 of the
於第2搬送機構23L已自基板載置部29L接收2片基板W1、W2之狀態ST1下,第2非共用手HC未支持基板W,而共用手HB及第1非共用手HA支持基板W1、W2。於第1基板搬送方法中,不使用第2手HD。In the state ST1 in which the
狀態ST1之後之狀態ST2表示由未支持基板之第2非共用手HC自處理單元21A搬出處理後之基板WX2,由共用手HB將處理前之基板W2搬入至同一個處理單元21A時第2搬送機構23L之狀態。The state ST2 after the state ST1 represents the second conveyance when the processed substrate WX2 is unloaded from the
狀態ST2之後之狀態ST3表示由在狀態ST2下未支持基板之共用手HB自處理單元21B搬出處理後之基板WX1,由第1非共用手HA將處理前之基板W1搬入至同一個處理單元21B時第2搬送機構23L之狀態。The state ST3 after the state ST2 indicates that the substrate WX1 after processing is carried out from the
狀態ST3之後之狀態ST4表示由共用手HB支持處理後之基板WX1,由第2非共用手HC支持處理後之基板WX2,而第1非共用手HA未支持基板時第2搬送機構23L之狀態。The state ST4 after the state ST3 represents the state of the
如以上參照圖7所說明般,根據本實施方式,基板處理裝置100之第2搬送機構23L具備於上下方向DZ上連續地配置之第1非共用手HA、共用手HB及第2非共用手HC。因此,對處理單元21A、21B執行基板W1、W2、WX1、WX2之搬出及搬入時,相較於處理前之基板與處理後之基板之間不共用手之情形而言,能縮短第1非共用手HA~第2非共用手HC(具體為第2手HA~HD)之上下方向DZ之移動距離。其結果,能提高第2搬送機構23L搬送基板W1、W2、WX1、WX2之動作之產能。參照圖8、圖9、圖11及圖12,列舉具體例對該點進行詳細說明。As described above with reference to FIG. 7 , according to the present embodiment, the
其次,參照圖8及圖9對第1基板搬送方法之一例進行詳細說明。於以下說明中,表示第1非共用手HA、共用手HB、第2非共用手HC及第2手HD全體之情形時,為了避免冗長,有時記作第2手HA~HD。又,於無需指明特定之基板W之情形時,簡記作「基板」。Next, an example of the first substrate transfer method will be described in detail with reference to FIGS. 8 and 9 . In the following description, when the first non-shared hand HA, the shared hand HB, the second non-shared hand HC, and the second hand HD are expressed as a whole, in order to avoid redundancy, they are sometimes referred to as the second hand HA to HD. In addition, when there is no need to specify a specific substrate W, it is abbreviated as "substrate".
圖8及圖9係表示第1基板搬送方法之一例之流程圖。如圖8及圖9所示,第1基板搬送方法於1個搬送循環CY內,包含步驟S1~步驟S12。於第1基板搬送方法中,不使用第2手HD。於步驟S1~步驟S12中,藉由受到控制部200控制之第2手驅動部17,第2手HA~HD得以移動。8 and 9 are flowcharts showing an example of the first substrate transfer method. As shown in FIGS. 8 and 9 , the first substrate conveyance method includes steps S1 to S12 in one conveyance cycle CY. In the 1st board|substrate conveyance method, a 2nd hand HD is not used. In steps S1 to S12, the second hands HA to HD are moved by the second
如圖8所示,於步驟S1中,第1非共用手HA支持處理前之基板W1,共用手HB支持處理前之基板W2。另一方面,第2非共用手HC未支持基板。第2非共用手HC與處理單元21A之搬送口41a相對向。然後,第2非共用手HC開始向位於處理單元21A內部之處理後之基板WX2移動。As shown in FIG. 8 , in step S1 , the first non-shared hand HA supports the substrate W1 before processing, and the shared hand HB supports the substrate W2 before processing. On the other hand, the second non-shared hand HC does not support the substrate. The second non-shared hand HC faces the
再者,步驟S1之第2手HA~HD之狀態表示圖7所示之狀態ST1之第2手HA~HD已移動至處理單元21A之位置之狀態。又,於基板WX2之處理中,搬送口41a被遮蔽構件(未圖示)堵塞。In addition, the state of the second hand HA to HD in step S1 indicates a state in which the second hand HA to HD of the state ST1 shown in FIG. 7 has moved to the position of the
接著,於步驟S2中,第2非共用手HC通過搬送口41a,自處理單元21A搬出處理後之基板WX2。Next, in step S2, the second non-shared hand HC carries out the processed substrate WX2 from the
接著,於步驟S3中,第2非共用手HC返回移動前之位置。然後,第2手HA~HD開始向第2特定方向SD2移動。Next, in step S3, the second non-shared hand HC returns to the position before the movement. Then, the second hands HA to HD start to move in the second specific direction SD2.
接著,於步驟S4中,第2手HA~HD向第2特定方向SD2移動距離d後停止。距離d大致等於第2非共用手HC與共用手HB之上下方向DZ之間隔d(圖6)。其結果,共用手HB與處理單元21A之搬送口41a相對向。然後,共用手HB開始向處理單元21A之內部移動。Next, in step S4, the second hands HA to HD move in the second specific direction SD2 by the distance d, and then stop. The distance d is approximately equal to the interval d in the vertical direction DZ between the second non-shared hand HC and the shared hand HB ( FIG. 6 ). As a result, the common hand HB faces the
接著,於步驟S5中,共用手HB通過搬送口41a,向處理單元21A搬入處理前之基板W2。Next, in step S5, the common hand HB carries the substrate W2 before processing into the
接著,於步驟S6中,共用手HB返回移動前之位置。然後,第2手HA~HD開始向下一個處理單元21B(圖9)移動。Next, in step S6, the shared hand HB returns to the position before the movement. Then, the second hands HA to HD start to move to the
接著,如圖9所示,於步驟S7中,第1非共用手HA支持處理前之基板W1,第2非共用手HC支持處理後之基板WX2。另一方面,共用手HB未支持基板。共用手HB與處理單元21B之搬送口41a相對向。然後,共用手HB開始向位於處理單元21B內部之處理後之基板WX1移動。Next, as shown in FIG. 9 , in step S7 , the first non-shared hand HA supports the substrate W1 before processing, and the second non-shared hand HC supports the substrate WX2 after processing. On the other hand, the shared hand HB does not support the substrate. The common hand HB faces the
再者,步驟S7之第2手HA~HD之狀態表示圖8所示之步驟S6之狀態之第2手HA~HD已移動至處理單元21B之位置之狀態。又,於基板WX1之處理中,搬送口41a被遮蔽構件(未圖示)堵塞。Furthermore, the state of the second hands HA to HD in step S7 indicates a state in which the second hands HA to HD in the state of step S6 shown in FIG. 8 have moved to the position of the
接著,於步驟S8中,共用手HB通過搬送口41a,自處理單元21B搬出處理後之基板WX1。Next, in step S8, the common hand HB carries out the processed substrate WX1 from the
接著,於步驟S9中,共用手HB返回移動前之位置。然後,第2手HA~HD開始向第2特定方向SD2移動。Next, in step S9, the shared hand HB returns to the position before the movement. Then, the second hands HA to HD start to move in the second specific direction SD2.
接著,於步驟S10中,第2手HA~HD向第2特定方向SD2移動距離d後停止。距離d大致等於共用手HB與第1非共用手HA之上下方向DZ之間隔d(圖6)。其結果,第1非共用手HA與處理單元21B之搬送口41a相對向。然後,第1非共用手HA開始向處理單元21B之內部移動。Next, in step S10 , the second hands HA to HD move the distance d in the second specific direction SD2 and then stop. The distance d is approximately equal to the interval d in the vertical direction DZ between the shared hand HB and the first non-shared hand HA ( FIG. 6 ). As a result, the first non-shared hand HA faces the
接著,於步驟S11中,第1非共用手HA通過搬送口41a,向處理單元21B搬入處理前之基板W1。Next, in step S11, the first non-shared hand HA carries the substrate W1 before processing into the
接著,於步驟S12中,第1非共用手HA返回移動前之位置。然後,第2手HA~HD開始向基板載置部29L(圖7)移動。繼而,共用手HB及第2非共用手HC分別將基板WX1、WX2遞交至基板載置部29L。Next, in step S12, the first non-shared hand HA returns to the position before the movement. Then, the second hands HA to HD start to move to the
綜上所述,如圖8及圖9所示,於1個搬送循環CY內,執行步驟S1~步驟S12。其結果,於1個搬送循環CY內,能向2個處理單元21A、21B搬入2片未處理之基板W1、W2,並自2個處理單元21A、21B搬出2片處理後之基板WX1、WX2。In summary, as shown in FIGS. 8 and 9 , steps S1 to S12 are executed within one conveyance cycle CY. As a result, in one transfer cycle CY, two unprocessed substrates W1 and W2 can be loaded into the two
特別值得一提的是,於本實施方式中,共用手HB於向處理單元21A搬入處理前之基板W2之動作與自處理單元21B搬出處理後之基板WX1之動作之間係共用的。因此,可朝向第1特定方向SD1,由第2非共用手HC至第1非共用手HA地,將其等依序用於基板WX2、WX1之搬出與基板W1、W2之搬入。It is worth mentioning that, in this embodiment, the common hand HB is shared between the operation of loading the pre-processed substrate W2 into the
其結果,若欲於完成自處理單元21A搬出處理後之基板WX2之動作後,向同一個處理單元21A搬入處理前之基板W2,則共用手HB只要向第2特定方向SD2移動距離d(第2非共用手HC與共用手HB之間隔d)即可。同樣地,若欲於完成自處理單元21B搬出處理後之基板WX1之動作後,向同一個處理單元21B搬入處理前之基板W1,則第1非共用手HA只要向第2特定方向SD2移動距離d(共用手HB與第1非共用手HA之間隔d)即可。因此,相較於處理前之基板與處理後之基板之間不共用手之情形而言,能提高第2搬送機構23L搬送基板W1、W2、WX1、WX2之動作之產能。以下將與圖11及圖12所示之第2基板搬送方法比較而詳細說明該點。As a result, if the unprocessed substrate W2 is to be loaded into the
又,於本實施方式中,就第1基板搬送方法而言,搬送循環CY(步驟S1~步驟S12)係一面變更處理單元21一面重複執行。In addition, in the present embodiment, in the first substrate transfer method, the transfer cycle CY (step S1 to step S12 ) is repeatedly executed while changing the
再者,第2搬送機構23U(圖6)與第2搬送機構23L同樣地,執行第1基板搬送方法。In addition, the
其次,參照圖10對本實施方式之第2基板搬送方法之一例進行說明。第2基板搬送方法利用在基板載置部29與處理單元21之間搬送基板W之第2搬送機構23來執行。於第2基板搬送方法中,Q個第2手25中,上下方向DZ上連續之一部分第2手25僅支持處理前之基板W,上下方向DZ上連續之另一部分第2手25僅支持處理後之基板W,藉此搬送複數片基板W。因此,於第2基板搬送方法中,處理後之基板W與處理前之基板W之間不共用第2手25。Next, an example of the second substrate transfer method of the present embodiment will be described with reference to FIG. 10 . The second substrate conveyance method is performed by the
圖10係表示第2基板搬送方法之整個流程之一例之圖。於圖10中,與圖7所示之情形同樣地,著眼於基板載置部29L、第2搬送機構23L、及處理單元21A、21B進行了圖示。又,基板載置部29L之下段291A供載置處理前之基板,基板載置部29L之上段291B供載置處理後之基板。進而,第2基板搬送方法中搬送循環CY之定義與第1基板搬送方法中搬送循環CY之定義相同。FIG. 10 is a diagram showing an example of the entire flow of the second substrate transfer method. In FIG. 10 , as in the case shown in FIG. 7 , it is illustrated focusing on the
如圖10所示,作為一例,於某個時序,於基板載置部29L之下段291A,沿著上下方向DZ載置有10片未處理之基板W1~W10,而於基板載置部29L之上段291B未載置基板。As shown in FIG. 10 , as an example, at a certain timing, 10 unprocessed substrates W1 to W10 are placed on the
於第2基板搬送方法中,與第1基板搬送方法同樣地,1個搬送循環CY內,第2搬送機構23L自基板載置部29L接收處理單元21A、21B加以處理前之2片基板W1、W2,並將2片基板W1、W2向複數個處理單元21中之2個處理單元21A、21B搬入,且自2個處理單元21A、21B搬出2個處理單元21A、21B加以處理後之2片基板WX1、WX2,並將2片基板WX1、WX2遞交至基板載置部29L。搬送循環CY重複執行。In the second substrate transfer method, in the same manner as in the first substrate transfer method, within one transfer cycle CY, the
具體而言,於第2基板搬送方法中,1個搬送循環CY內,4個第2手HA~HD中,下段之上下方向DZ上連續之第2手HA、HB僅支持未處理之基板W1、W2。又,上段之上下方向DZ上連續之第2手HC、HD僅支持處理後之基板WX1、WX2。Specifically, in the second substrate transfer method, in one transfer cycle CY, among the four second hands HA to HD, the second hands HA and HB consecutive in the upper and lower direction DZ of the lower stage support only the unprocessed substrate W1 , W2. In addition, the second hand HC and HD, which are continuous in the top-bottom direction DZ of the upper stage, support only the processed substrates WX1 and WX2 .
繼續參照圖10,對1個搬送循環CY內第2搬送機構23L之狀態ST11~ST14進行說明。With continued reference to FIG. 10 , the states ST11 to ST14 of the
於第2搬送機構23L已自基板載置部29L接收2片基板W1、W2之狀態ST11下,第2手HA、HB分別支持基板W1、W2,而第2手HC、HD未支持基板。In the state ST11 in which the
狀態ST11之後之狀態ST12表示由第2手HD自處理單元21A搬出處理後之基板WX2,由第2手HB將處理前之基板W2搬入至同一個處理單元21A時第2搬送機構23L之狀態。The state ST12 after the state ST11 shows the state of the
狀態ST12之後之狀態ST13表示由第2手HC自處理單元21B搬出處理後之基板WX1,由第2手HA將處理前之基板W1搬入至同一個處理單元21B時第2搬送機構23L之狀態。The state ST13 following the state ST12 shows the state of the
狀態ST13之後之狀態ST14表示由第2手HC、HD支持處理後之基板WX1、WX2,而第2手HA、HB未支持基板時第2搬送機構23L之狀態。The state ST14 after the state ST13 shows the state of the
如以上參照圖10所說明般,根據本實施方式,基板處理裝置100之第2搬送機構23L具備:用以支持處理前之基板W1、W2之專用之第2手HA、HB;及用以支持處理後之基板WX1、WX2之專用之第2手HC、HD。因此,能抑制處理單元21中之處理液經由處理後之基板WX1、WX2附著於第2手HA、HB。進而,能抑制新支持於第2手HA、HB之處理前之基板上附著處理液。As described above with reference to FIG. 10 , according to the present embodiment, the
其次,參照圖11及圖12對第2基板搬送方法之一例進行詳細說明。於以下說明中,無需指明特定之基板W之情形時,簡記作「基板」。Next, an example of the second substrate conveyance method will be described in detail with reference to FIGS. 11 and 12 . In the following description, when there is no need to specify the situation of a specific substrate W, it is abbreviated as "substrate".
圖11及圖12係表示第2基板搬送方法之一例之流程圖。如圖11及圖12所示,第2基板搬送方法於1個搬送循環CY內,包含步驟S21~步驟S32。於步驟S21~步驟S32中,藉由受到控制部200控制之第2手驅動部17,第2手HA~HD得以移動。11 and 12 are flowcharts showing an example of a second substrate transfer method. As shown in FIGS. 11 and 12 , the second substrate conveyance method includes steps S21 to S32 in one conveyance cycle CY. In steps S21 to S32 , the second hands HA to HD are moved by the second
如圖11所示,於步驟S21中,第2手HA、HB分別支持處理前之基板W1、W2。另一方面,第2手HC、HD未支持基板。第2手HD與處理單元21A之搬送口41a相對向。然後,第2手HD開始向位於處理單元21A內部之處理後之基板WX2移動。As shown in FIG. 11 , in step S21 , the second hands HA and HB support the substrates W1 and W2 before processing, respectively. On the other hand, the second-hand HC and HD do not support substrates. The second hand HD faces the
再者,步驟S21之第2手HA~HD之狀態表示圖10所示之狀態ST11之第2手HA~HD已移動至處理單元21A之位置之狀態。In addition, the state of the 2nd hand HA-HD of step S21 shows the state that the 2nd hand HA-HD of the state ST11 shown in FIG. 10 has moved to the position of the
接著,於步驟S22中,第2手HD通過搬送口41a,自處理單元21A搬出處理後之基板WX2。Next, in step S22, the second hand HD carries out the processed substrate WX2 from the
接著,於步驟S23中,第2手HD返回移動前之位置。然後,第2手HA~HD開始向第2特定方向SD2移動。Next, in step S23, the second hand HD returns to the position before the movement. Then, the second hands HA to HD start to move in the second specific direction SD2.
接著,於步驟S24中,第2手HA~HD向第2特定方向SD2移動距離2d(=2×d)後停止。距離2d大致等於第2手HD與第2手HB之上下方向DZ之間隔2d(圖6)。其結果,第2手HB與處理單元21A之搬送口41a相對向。然後,第2手HB開始向處理單元21A之內部移動。Next, in step S24 , the second hands HA to HD move in the second specific direction SD2 by a distance of 2d (=2×d), and then stop. The
接著,於步驟S25中,第2手HB通過搬送口41a,向處理單元21A搬入處理前之基板W2。Next, in step S25, the second hand HB carries the substrate W2 before processing into the
接著,於步驟S26中,第2手HB返回移動前之位置。然後,第2手HA~HD開始向下一個處理單元21B(圖12)移動。Next, in step S26, the second hand HB returns to the position before the movement. Then, the second hands HA to HD start to move to the
接著,如圖12所示,於步驟S27中,第2手HA支持處理前之基板W1,而第2手HB未支持基板。另一方面,第2手HC未支持基板,而第2手HD支持處理後之基板WX2。第2手HC與處理單元21B之搬送口41a相對向。然後,第2手HC開始向位於處理單元21B內部之處理後之基板WX1移動。Next, as shown in FIG. 12 , in step S27 , the second hand HA supports the substrate W1 before processing, while the second hand HB does not support the substrate. On the other hand, the second hand HC does not support the substrate, while the second hand HD supports the processed substrate WX2. The second hand HC faces the
再者,步驟S27之第2手HA~HD之狀態表示圖11所示之步驟S26之狀態之第2手HA~HD已移動至處理單元21B之位置之狀態。In addition, the state of the second hand HA to HD in step S27 indicates a state in which the second hand HA to HD in the state of step S26 shown in FIG. 11 has moved to the position of the
接著,於步驟S28中,第2手HC通過搬送口41a,自處理單元21B搬出處理後之基板WX1。Next, in step S28, the second hand HC carries out the processed substrate WX1 from the
接著,於步驟S29中,第2手HC返回移動前之位置。然後,第2手HA~HD開始向第2特定方向SD2移動。Next, in step S29, the second hand HC returns to the position before the movement. Then, the second hands HA to HD start to move in the second specific direction SD2.
接著,於步驟S30中,第2手HA~HD向第2特定方向SD2移動距離2d(=2×d)後停止。距離2d大致等於第2手HC與第2手HA之上下方向DZ之間隔2d(圖6)。其結果,第2手HA與處理單元21B之搬送口41a相對向。然後,第2手HA開始向處理單元21B之內部移動。Next, in step S30 , the second hands HA to HD move in the second specific direction SD2 by a distance of 2d (=2×d), and then stop. The
接著,於步驟S31中,第2手HA通過搬送口41a,向處理單元21B搬入處理前之基板W1。Next, in step S31, the second hand HA carries the substrate W1 before processing into the
接著,於步驟S32中,第2手HA返回移動前之位置。然後,第2手HA~HD開始向基板載置部29L(圖10)移動。繼而,第2手HC、HD分別將基板WX1、WX2遞交至基板載置部29L。Next, in step S32, the second hand HA returns to the position before the movement. Then, the second hands HA to HD start to move to the
綜上所述,如圖11及圖12所示,於1個搬送循環CY內,執行步驟S21~步驟S32。其結果,於1個搬送循環CY內,可由第2手HA、HB對2個處理單元21A、21B搬入2片未處理之基板W1、W2,並由第2手HC、HD自2個處理單元21A、21B搬出2片處理後之基板WX1、WX2。In summary, as shown in FIGS. 11 and 12 , steps S21 to S32 are executed in one conveyance cycle CY. As a result, within one conveyance cycle CY, two unprocessed substrates W1 and W2 can be conveyed into the two
又,於本實施方式中,第2基板搬送方法乃一面變更處理單元21,一面重複執行搬送循環CY(步驟S21~步驟S32)。In addition, in this embodiment, the 2nd board|substrate conveyance method repeatedly performs conveyance cycle CY (step S21 - step S32), changing the
再者,第2搬送機構23U(圖6)與第2搬送機構23L同樣地,執行第2基板搬送方法。In addition, the
此處,參照圖8及圖11,比較第1基板搬送方法與第2基板搬送方法。如圖8之步驟S3、S4所示,共用手HB之上下方向DZ之移動距離為「d」。另一方面,如圖11之步驟S23、S24所示,第2手HB之移動距離為「2d」。因此,第1基板搬送方法中之共用手HB之移動距離d小於第2基板搬送方法中之第2手HB之移動距離2d。同樣地,如圖9之步驟S9、S10及圖12之步驟S29、S30所示,第1基板搬送方法中之第1非共用手HA之移動距離d小於第2基板搬送方法中之第2手HA之移動距離2d。Here, with reference to FIGS. 8 and 11 , the first substrate conveyance method and the second substrate conveyance method are compared. As shown in steps S3 and S4 in FIG. 8 , the moving distance of the shared hand HB in the up-down direction DZ is "d". On the other hand, as shown in steps S23 and S24 of FIG. 11 , the moving distance of the second hand HB is "2d". Therefore, the moving distance d of the common hand HB in the first substrate transfer method is smaller than the moving
其結果,於第1基板搬送方法中,與第2基板搬送方法相比,能提高第2搬送機構23對基板W1、W2、WX1、WX2之搬送動作之產能。即,於第1基板搬送方法中,相較於處理前之基板與處理後之基板不共用手之情形而言,能提高第2搬送機構23對基板W1、W2、WX1、WX2之搬送動作之產能。As a result, in the first substrate conveyance method, the throughput of the conveyance operation of the substrates W1, W2, WX1, and WX2 by the
例如,於第1基板搬送方法中,與第2基板搬送方法相比,相對於1個處理單元21,第2手HA~HD之上下方向DZ之移動距離短了「d」。而且,因搬送循環CY會重複執行,故相對於1個處理單元21移動距離縮短「d」對提高第2搬送機構23搬送基板之動作之產能有用。For example, in the first substrate transfer method, compared with the second substrate transfer method, the moving distance in the vertical direction DZ of the second hands HA to HD is shorter by "d" with respect to one
以上,參照圖7~圖12對第1基板搬送方法及第2基板搬送方法進行了說明。例如,設定為第2搬送機構23執行第1基板搬送方法及第2基板搬送方法任一者後,基板處理裝置100被廠商交付給使用者。即,對基板處理裝置100安裝第1基板搬送方法及第2基板搬送方法任一者。As mentioned above, the 1st board|substrate conveyance method and the 2nd board|substrate conveyance method were demonstrated with reference to FIGS. 7-12. For example, when the
但亦可對基板處理裝置100安裝第1基板搬送方法及第2基板搬送方法兩者,而選擇性地執行第1基板搬送方法及第2基板搬送方法。該情形時,使用者可視狀況選擇理想之基板搬送方法。其結果,能提高使用者之便利性。However, both the first substrate conveyance method and the second substrate conveyance method may be attached to the
於以上參照圖7~圖9例示性地說明之第1基板搬送方法中,使用了3個第2手25。但第1基板搬送方法並不限定於使用3個第2手25之情形,而可如圖13所示予以泛化。又,於以下說明中,將1個搬送循環CY內被執行基板W之搬入及搬出之處理單元21之數量記作「N」。於本說明書中,只要未特意明示,N即為2以上之整數。著眼於N個處理單元21進行說明。又,為了讓讀者容易理解,著眼於複數個(Q個)第2手25中用於第1基板搬送方法之N+1個第2手25進行說明。In the first substrate transfer method exemplarily described above with reference to FIGS. 7 to 9 , three
圖13係用以將第1基板搬送方法泛化而加以說明之圖。圖13中示出了複數個第2搬送機構23中之1個第2搬送機構23。如圖13所示,於第1基板搬送方法中,1個搬送循環CY內,第2搬送機構23自基板載置部29接收處理單元21加以處理前之N片基板W,並將N片基板W向複數個處理單元21中之N個處理單元21_1~21_N搬入,且自N個處理單元21_1~21_N搬出N個處理單元21_1~21_N加以處理後之N片基板W,並將N片處理後之基板W遞交至基板載置部29。FIG. 13 is a diagram for explaining the generalization of the first substrate transfer method. FIG. 13 shows one
再者,N個處理單元21_1~21_N可為基板處理裝置100所具備之複數個處理單元21中之一部分處理單元21(處理單元21之總數>N),亦可為所有處理單元21(處理單元21之總數=N)。Furthermore, the N processing units 21_1 to 21_N may be a part of the processing units 21 (the total number of the
複數個第2手25包含第1非共用手H_F、M個共用手H_1~H_M、及第2非共用手H_S。M係1以上之整數。M個共用手H_1~H_M配置於第1非共用手H_F與第2非共用手H_S之間。The plurality of
第1非共用手H_F、M個共用手H_1~H_M、及第2非共用手H_S之合計個數係N+1個。又,M=N-1。即,第2搬送機構23具備N-1個共用手H_1~H_M。The total number of the first non-shared hands H_F, the M shared hands H_1 to H_M, and the second non-shared hands H_S is N+1. Also, M=N-1. That is, the
再者,N+1個第2手25(第1非共用手H_F、共用手H_1~H_M、及第2非共用手H_S)可為第2搬送機構23所具備之複數個(Q個)第2手25中之一部分第2手25,亦可為所有第2手25。Furthermore, the N+1 second hands 25 (the first non-shared hand H_F, the shared hands H_1 to H_M, and the second non-shared hand H_S) may be a plurality of (Q) second hands included in the
第1非共用手H_F、M個共用手H_1~H_M、及第2非共用手H_S係自第1非共用手H_F至第2非共用手H_S,沿著上下方向DZ連續地配置。The first unshared hand H_F, the M shared hands H_1 to H_M, and the second unshared hand H_S are continuously arranged in the vertical direction DZ from the first unshared hand H_F to the second unshared hand H_S.
而且,於第2搬送機構23已自基板載置部29接收處理前之N片基板W之狀態下,第2非共用手H_S未支持基板W,而M個共用手H_1~H_M、及第1非共用手H_F支持基板W。即,M個共用手H_1~H_M、及第1非共用手H_F支持N片基板W。In addition, in a state where the
於1個搬送循環CY內,M個共用手H_1~H_M於不同之時序支持處理單元21加以處理前之基板W與處理後之基板W。In one transport cycle CY, the M shared hands H_1 to H_M support the
於1個搬送循環CY內,第1非共用手H_F僅支持處理單元21加以處理前之基板W。In one transfer cycle CY, the first non-shared hand H_F supports only the substrate W before being processed by the
於1個搬送循環CY內,第2非共用手H_S僅支持處理單元21加以處理後之基板W。In one transfer cycle CY, the second non-shared hand H_S supports only the substrate W processed by the
繼續參照圖13,對第1基板搬送方法中第2搬送機構23之動作進行詳細說明。13, the operation of the
於1個搬送循環CY內,M個共用手H_1~H_M、及第1非共用手H_F各自從基板載置部29接收處理前之基板W。In one conveyance cycle CY, each of the M shared hands H_1 to H_M and the first non-shared hand H_F receives the substrate W before processing from the
於1個搬送循環CY內,第2非共用手H_S移動至與處理單元21_1之搬送口41a相對向之位置,而自處理單元21_1搬出處理後之基板W。In one transfer cycle CY, the second non-shared hand H_S moves to a position facing the
於1個搬送循環CY內,藉由使N+1個第2手25向第2特定方向SD2移動距離d,M個共用手H_1~H_M中鄰接於第2非共用手H_S之共用手H_M移動至與處理單元21_1之搬送口41a相對向之位置。距離d表示上下方向DZ上鄰接之第2手25之間隔。然後,共用手H_M向已被第2非共用手H_S搬出基板W之處理單元21_1,搬入處理前之基板W。處理單元21_1處理基板W。In one conveyance cycle CY, by moving the N+1
於1個搬送循環CY內,藉由使N+1個第2手25移動,鄰接於第2非共用手H_S之共用手H_M移動至與處理單元21_2之搬送口41a相對向之位置,處理單元21_2係與已被共用手H_M搬入處理前之基板W之處理單元21_1不同之處理單元。然後,共用手H_M自處理單元21_2搬出處理後之基板W。In one transfer cycle CY, by moving N+1
於1個搬送循環CY內,藉由使N+1個第2手25向第2特定方向SD2移動距離d,M個共用手H_1~H_M中鄰接於共用手H_M之共用手H_M-1移動至與處理單元21_2之搬送口41a相對向之位置。共用手H_M-1在第1特定方向SD1上鄰接於共用手H_M。然後,共用手H_M-1向已被共用手H_M搬出基板W之處理單元21_2,搬入處理前之基板W。處理單元21_2處理基板W。In one conveyance cycle CY, by moving the N+1
於1個搬送循環CY內,藉由使N+1個第2手25移動,鄰接於共用手H_M之共用手H_M-1移動至與處理單元21_3之搬送口41a相對向之位置,處理單元21_3係與已被共用手H_M-1搬入處理前之基板W之處理單元21_2不同之處理單元。然後,共用手H_M-1自處理單元21_3搬出處理後之基板W。In one transfer cycle CY, by moving N+1
於1個搬送循環CY內,藉由使N+1個第2手25向第2特定方向SD2移動距離d,鄰接於共用手H_M-1之共用手H_M-2移動至與處理單元21_3之搬送口41a相對向之位置。共用手H_M-2在第1特定方向SD1上鄰接於共用手H_M-1。然後,共用手H_M-2向已被共用手H_M-1搬出基板W之處理單元21_3,搬入處理前之基板W。處理單元21_3處理基板W。In one transfer cycle CY, by moving the N+1
於1個搬送循環CY內,藉由使N+1個第2手25移動,鄰接於共用手H_M-1之共用手H_M-2移動至與處理單元21_4之搬送口41a相對向之位置,處理單元21_4係與已被共用手H_M-2搬入處理前之基板W之處理單元21_3不同之處理單元。然後,共用手H_M-2自處理單元21_4搬出處理後之基板W。In one transfer cycle CY, by moving N+1
自此以後同樣地,於1個搬送循環CY內,藉由共用手H_M-3~H_2,對處理單元21_4~21_N-1進行基板W之搬入及搬出。處理單元21_4~21_N-1處理基板W。From then on, the substrates W are carried in and out of the processing units 21_4 to 21_N-1 by the shared hands H_M-3 to H_2 in the same manner in one conveyance cycle CY. The processing units 21_4 to 21_N-1 process the substrate W.
然後,於1個搬送循環CY內,藉由使N+1個第2手25移動,鄰接於共用手H_2之共用手H_1,即鄰接於第1非共用手H_F之共用手H_1移動至與處理單元21_N之搬送口41a相對向之位置,處理單元21_N係與已被共用手H_2搬出基板W之處理單元21_N-1不同之處理單元。共用手H_1在第1特定方向SD1上鄰接於共用手H_2。然後,共用手H_1自處理單元21_N搬出處理後之基板W。Then, within one conveyance cycle CY, by moving N+1
即,於1個搬送循環CY內,共用手H_1自第N個處理單元21_N搬出處理後之基板W。That is, in one conveyance cycle CY, the common hand H_1 carries out the processed substrate W from the Nth processing unit 21_N.
然後,於1個搬送循環CY內,藉由使N+1個第2手25向第2特定方向SD2移動距離d,第1非共用手H_F移動至與處理單元21_N之搬送口41a相對向之位置。繼而,第1非共用手H_F向已被鄰接於第1非共用手H_F之共用手H_1搬出基板W之處理單元21_N,搬入處理前之基板W。處理單元21_N處理基板W。Then, within one transfer cycle CY, by moving N+1
即,於1個搬送循環CY內,第1非共用手H_F向第N個處理單元21_N搬入處理前之基板W。That is, within one transfer cycle CY, the first non-shared hand H_F transfers the substrate W before processing to the Nth processing unit 21_N.
然後,M個共用手H_1~H_M、及第2非共用手H_S將處理後之N片基板W遞交至基板載置部29。Then, the M shared hands H_1 to H_M and the second non-shared hand H_S deliver the processed N substrates W to the
如以上參照圖13所說明般,本實施方式中,共用手H_1~H_M於向處理單元21_1~處理單元21_N-1搬入處理前之基板W之動作與自處理單元21_2~處理單元21_N搬出處理後之基板W之動作之間係共用的。因此,可朝向第1特定方向SD1,由第2非共用手H_S至第1非共用手H_F地,將其等依序用於基板W之搬出與基板W之搬入。As described above with reference to FIG. 13 , in this embodiment, the operations of the shared hands H_1 to H_M in carrying the substrate W before processing to the processing unit 21_1 - the processing unit 21_N-1 and after the processing from the processing unit 21_2 - the processing unit 21_N are carried out. The actions of the substrate W are shared among them. Therefore, toward the first specific direction SD1, from the second non-shared hand H_S to the first non-shared hand H_F, the second non-shared hand H_S to the first non-shared hand H_F can be used for carrying out the substrate W and carrying in the substrate W in sequence.
其結果,若欲於完成自處理單元21搬出處理後之基板W之動作後,向同一個處理單元21搬入處理前之基板W,則共用手H_1~H_M、及第1非共用手H_F只要向第2特定方向SD2移動距離d(第2手25之間隔d)即可。因此,相較於處理前之基板W與處理後之基板W之間不共用手之情形(例如,第2基板搬送方法)而言,能提高第2搬送機構23L搬送基板W之動作之產能。As a result, if the unprocessed substrate W is to be loaded into the
其次,於已將第1基板搬送方法泛化之情形時,參照圖14~圖16,對第2手25之總數Q、第1基板搬送方法中使用之第2手25之數量、及第2基板搬送方法中使用之第2手25之數量之關係進行說明。圖14~圖16中示出了複數個第2搬送機構23中之1個第2搬送機構23。又,將1個搬送循環CY內被執行基板W之搬入及搬出之處理單元21之數量記作「N」。Next, when the first substrate transfer method has been generalized, referring to FIGS. 14 to 16 , the total number Q of the
圖14係表示第2搬送機構23具備2N個第2手25之情形時,第2手25之總數Q、第1基板搬送方法中使用之第2手25之數量、及第2基板搬送方法中使用之第2手25之數量之關係之圖。14 shows the total number Q of the
如圖14所示,Q=2×N=2N。因此,第2搬送機構23所具備之複數個第2手25之總數Q為2N個。即,第2搬送機構23具備2N個第2手25。於此例中,N係2以上之整數。As shown in FIG. 14 , Q=2×N=2N. Therefore, the total number Q of the plurality of
而且,於將第1基板搬送方法安裝於基板處理裝置100之情形時,2N個第2手25包含第1非共用手H_F、M個共用手H_1~H_M、及第2非共用手H_S。M係1以上之整數。Furthermore, when the first substrate transfer method is installed in the
第1非共用手H_F、M個共用手H_1~H_M、及第2非共用手H_S之合計個數係N+1個。又,M=N-1。即,第2搬送機構23具備N-1個共用手H_1~H_M。再者,於第1基板搬送方法中,不使用Q個(=2N個)第2手25中之N-1個第2手25。The total number of the first non-shared hands H_F, the M shared hands H_1 to H_M, and the second non-shared hands H_S is N+1. Also, M=N-1. That is, the
另一方面,於將第2基板搬送方法安裝於基板處理裝置100之情形時,例如,2N個第2手25中,上下方向DZ上連續之N個第2手25(例如,下段之第2手25)支持處理前之基板W,上下方向DZ上連續之另N個第2手25(例如,上段之第2手25)支持處理後之基板W。On the other hand, when the second substrate transfer method is installed in the
如以上參照圖14所說明般,根據本實施方式,藉由將第2手25之總數Q設定為2N個,對基板處理裝置100安裝第2基板搬送方法時,能使用所有第2手25。其結果,於第2基板搬送方法中,能提高搬送基板W時之產能。又,藉由使第2搬送機構23預先具備2N個第2手25,對基板處理裝置100安裝第1基板搬送方法時,無需增加新的第2手25,便可使用現有之N+1個第2手25。As described above with reference to FIG. 14 , according to the present embodiment, by setting the total number Q of the
例如,於N=2之情形時,可利用第1非共用手H_F、1個共用手H_1、及第2非共用手H_S來執行第1基板搬送方法。即,能以最小構成之第2手25來執行第1基板搬送方法。因此,能降低第2搬送機構23之成本。For example, in the case of N=2, the first substrate transfer method can be performed using the first non-shared hand H_F, the one shared hand H_1, and the second non-shared hand H_S. That is, the 1st board|substrate conveyance method can be performed with the
此處,例如,對基板處理裝置100安裝參照圖14所說明之第1基板搬送方法及第2基板搬送方法任一者。Here, for example, any one of the first substrate transfer method and the second substrate transfer method described with reference to FIG. 14 is mounted on the
但亦可對基板處理裝置100安裝第1基板搬送方法及第2基板搬送方法兩者。However, both the 1st board|substrate conveyance method and the 2nd board|substrate conveyance method may be attached to the board|
具體而言,第2搬送機構23亦可受到控制部200之控制,而以第1基板搬送模式MD1及第2基板搬送模式MD2任一模式動作。Specifically, the
第1基板搬送模式MD1係第2搬送機構23執行第1基板搬送方法之模式。具體而言,第1基板搬送模式MD1係2N個第2手25中之N+1個第2手25作為第1非共用手H_F、M個共用手H_1~H_M、及第2非共用手H_S來使用之模式。The first substrate conveyance mode MD1 is a mode in which the
第2基板搬送模式MD2係第2搬送機構23執行第2基板搬送方法之模式。具體而言,第2基板搬送模式MD2係將2N個第2手25中之N個第2手25用以僅支持處理單元21加以處理前之基板W,並且將另N個第2手25用以僅支持處理單元21加以處理後之基板W之模式。The second substrate conveyance mode MD2 is a mode in which the
使用者藉由操作控制部200,可使第2搬送機構23以第1基板搬送模式MD1動作,亦可使其以第2基板搬送模式MD2動作。因此,能提高使用者之便利性。又,對於基板處理裝置100之廠商而言亦同樣如此,可藉由操作控制部200,而設定為第1基板搬送模式MD1及第2基板搬送模式MD2任一者後出貨。因此,能提高廠商之便利性。By operating the
圖15係表示第2搬送機構23具備N+1個第2手25,且N為奇數之情形時,第2手25之總數Q、第1基板搬送方法中使用之第2手25之數量、及第2基板搬送方法中使用之第2手25之數量之關係之圖。15 shows the total number Q of the
如圖15所示,Q=N+1。因此,於第2搬送機構23中,複數個第2手25之總數Q係N+1個。即,第2搬送機構23具備N+1個第2手25。於此例中,N係3以上之奇數。As shown in FIG. 15, Q=
而且,於將第1基板搬送方法安裝於基板處理裝置100之情形時,N+1個第2手25包含第1非共用手H_F、M個共用手H_1~H_M、及第2非共用手H_S。M係1以上之整數。Furthermore, when the first substrate transfer method is installed in the
第1非共用手H_F、M個共用手H_1~H_M、及第2非共用手H_S之合計個數係N+1個。又,M=N-1。即,第2搬送機構23具備N-1個共用手H_1~H_M。特別值得一提的是,於第1基板搬送方法中,使用Q個(=N+1個)第2手25中所有之第2手25。即,根據本實施方式,執行第1基板搬送方法時之第2手25之數量已最佳化,不存在多餘之第2手25。因此,能降低第2搬送機構23之成本。The total number of the first non-shared hands H_F, the M shared hands H_1 to H_M, and the second non-shared hands H_S is N+1. Also, M=N-1. That is, the
另一方面,於將第2基板搬送方法安裝於基板處理裝置100之情形時,例如,N+1個第2手25中,沿著上下方向DZ連續之(N+1)/2個第2手25(例如,下段之第2手25)支持處理前之基板W,沿著上下方向DZ連續之另(N+1)/2個第2手25(例如,上段之第2手25)支持處理後之基板W。On the other hand, when the second substrate conveyance method is installed in the
此處,例如,對基板處理裝置100安裝參照圖15所說明之第1基板搬送方法及第2基板搬送方法任一者。Here, for example, any one of the first substrate transfer method and the second substrate transfer method described with reference to FIG. 15 is attached to the
其中,與圖14所說明之情形同樣地,第2搬送機構23亦可受到控制部200之控制,而以第1基板搬送模式MD10及第2基板搬送模式MD20任一模式動作。14 , the
第1基板搬送模式MD10係第2搬送機構23執行第1基板搬送方法之模式。具體而言,第1基板搬送模式MD10係Q個(=N+1個)第2手25全部作為第1非共用手H_F、M個共用手H_1~H_M、及第2非共用手H_S來使用之模式。The first substrate conveyance mode MD10 is a mode in which the
第2基板搬送模式MD20係第2搬送機構23執行第2基板搬送方法之模式。具體而言,第2基板搬送模式MD20係將Q個(=N+1個)第2手25中上下方向DZ上連續之(N+1)/2個第2手25用以僅支持處理單元21加以處理前之基板W,並且將上下方向DZ上連續之另(N+1)/2個第2手25用以僅支持處理單元21加以處理後之基板W之模式。The second substrate conveyance mode MD20 is a mode in which the
於安裝第1基板搬送模式MD10及第2基板搬送模式MD20兩者之情形時,與安裝第1基板搬送模式MD1及第2基板搬送模式MD2兩者之情形同樣地,能提高使用者及廠商之便利性。In the case of mounting both the first board conveyance mode MD10 and the second board conveyance mode MD20, as in the case of mounting both the first board conveyance mode MD1 and the second board conveyance mode MD2, it is possible to improve the user and manufacturer's convenience. Convenience.
圖16係表示第2搬送機構23具備N+1個第2手25,且N為偶數之情形時,第2手25之總數Q、第1基板搬送方法中使用之第2手25之數量、及第2基板搬送方法中使用之第2手25之數量之關係之圖。16 shows the total number Q of the
如圖16所示,Q=N+1。因此,於第2搬送機構23中,複數個第2手25之總數Q係N+1個。即,第2搬送機構23具備N+1個第2手25。於此例中,N係2以上之偶數。As shown in FIG. 16, Q=
而且,於將第1基板搬送方法安裝於基板處理裝置100之情形時,N為偶數時之第1非共用手H_F、M個共用手H_1~H_M、及第2非共用手H_S與參照圖15所說明之N為奇數時之第1非共用手H_F、M個共用手H_1~H_M、及第2非共用手H_S相同。Furthermore, when the first substrate transfer method is installed in the
另一方面,於將第2基板搬送方法安裝於基板處理裝置100之情形時,例如,N+1個第2手25中,上下方向DZ上連續之N/2個第2手25(例如,下段之第2手25)支持處理前之基板W,上下方向DZ上連續之另N/2個第2手25支持處理後之基板W。而且,不使用最上段之第2手25或最下段之第2手25。On the other hand, when the second substrate conveyance method is installed in the
此處,例如,對基板處理裝置100安裝參照圖16所說明之第1基板搬送方法及第2基板搬送方法任一者。Here, for example, any one of the first substrate transfer method and the second substrate transfer method described with reference to FIG. 16 is mounted on the
其中,與圖14所說明之情形同樣地,第2搬送機構23亦可受到控制部200之控制,而以第1基板搬送模式MD100及第2基板搬送模式MD200任一模式動作。14, the
第1基板搬送模式MD100與參照圖15所說明之第1基板搬送模式MD10相同。The first substrate conveyance mode MD100 is the same as the first substrate conveyance mode MD10 described with reference to FIG. 15 .
第2基板搬送模式MD200係將Q個(=N+1個)第2手25中上下方向DZ上連續之N/2個第2手25用以僅支持處理單元21加以處理前之基板W,並且將上下方向DZ上連續之另N/2個第2手25用以僅支持處理單元21加以處理後之基板W之模式。In the second substrate transfer mode MD200, N/2 consecutive
於安裝第1基板搬送模式MD100及第2基板搬送模式MD200兩者之情形時,與安裝第1基板搬送模式MD1及第2基板搬送模式MD2兩者之情形同樣地,能提高使用者及廠商之便利性。In the case of mounting both the first board transport mode MD100 and the second board transport mode MD200, as in the case of mounting both the first board transport mode MD1 and the second board transport mode MD2, it is possible to improve the user and manufacturer's convenience. Convenience.
以上,參照圖式(圖1~圖16)對本發明之實施方式進行了說明。但本發明並不限於上述實施方式,而可於不脫離其主旨之範圍內以各種形態予以實施(例如,下述(1)~(4))。又,上述實施方式中揭示之複數個構成要素可適當改變。例如,可將某實施方式所示之所有構成要素中之某構成要素添加至其他實施方式之構成要素中,或可將某實施方式所示之所有構成要素中之若干構成要素自實施方式抹除。The embodiments of the present invention have been described above with reference to the drawings ( FIGS. 1 to 16 ). However, the present invention is not limited to the above-described embodiments, and can be implemented in various forms within a range that does not deviate from the gist (for example, the following (1) to (4)). In addition, a plurality of constituent elements disclosed in the above-described embodiments can be appropriately changed. For example, some of the constituent elements shown in a certain embodiment may be added to the constituent elements of other embodiments, or some of the constituent elements of all the constituent elements shown in a certain embodiment may be deleted from the embodiment. .
為了使發明容易理解,圖式係模式性表示出各個構成要素,且為了方便繪圖,圖示之各構成要素之厚度、長度、個數、間隔等有時與實際不同。又,上述實施方式中所示之各構成要素之構成僅為一例,並不特別限定,當然可於不實質脫離本發明效果之範圍內進行各種變更。In order to make the invention easy to understand, the drawings schematically show each constituent element, and for the convenience of drawing, the thickness, length, number, interval, etc. of each constituent element shown in the drawings may be different from actual ones. In addition, the structure of each component shown in the above-mentioned embodiment is only an example, and is not specifically limited, Of course, various changes can be added in the range which does not deviate substantially from the effect of this invention.
(1)於參照圖13所說明之第1基板搬送方法中,第2搬送機構23可具備第1特定方向SD1上連續於第1非共用手H_F之1個或複數個第2手25,亦可具備第2特定方向SD2上連續於第2非共用手H_S之1個或複數個第2手25。於參照圖7~圖9所說明之第2搬送機構23中同樣如此。(1) In the first substrate transfer method described with reference to FIG. 13 , the
(2)於圖13中,就第1基板搬送方法而言,將N+1個第2手25中最下段之第2手25設定為第1非共用手H_F,將最上段之第2手25設定為第2非共用手H_S(第1形態)。但亦可將N+1個第2手25中最下段之第2手25設定為第2非共用手H_S,將最上段之第2手25設定為第1非共用手H_F(第2形態)。(2) In FIG. 13 , in terms of the first substrate transfer method, the
該情形時,第1特定方向SD1及第2特定方向SD2與圖13之情形相反。即,第1特定方向SD1表示上方向,第2特定方向SD2表示下方向。又,該情形時,於圖13中,共用手25之參照符號由上而下依序為「H_1~H_M」,處理單元21之參照符號由上而下依序為「21_1~21_N」。In this case, the first specific direction SD1 and the second specific direction SD2 are opposite to the case of FIG. 13 . That is, the first specific direction SD1 represents the upward direction, and the second specific direction SD2 represents the downward direction. In this case, in FIG. 13 , the reference symbols of the shared
又,於重複執行搬送循環CY之情形時,亦可使第1形態與第2形態混合存在,而執行第1基板搬送方法。Moreover, when performing the conveyance cycle CY repeatedly, the 1st form and the 2nd form may be mixed, and the 1st board|substrate conveyance method may be performed.
再者,對於參照圖7~圖9所說明之第2搬送機構23而言亦同樣如此,於第1基板搬送方法中亦可採用第2形態。例如,亦可將第2手HC設定為第1非共用手,將第2手HA設定為第2非共用手。又,於參照圖7~圖9所說明之第2搬送機構23中,亦可不使用第2手HA,而使用第2手HB~第2手HC來執行第1基板搬送方法。In addition, the same applies to the
(3)圖1所示之控制部200可按照預先設定之排程來決定1個搬送循環CY內被進行基板W之搬出及搬入之處理單元21,亦可採用事件驅動方式來加以決定。所謂事件驅動方式係指,於決定被進行基板W之搬出及搬入之處理單元21之時間點,自複數個處理單元21中決定出最佳之處理單元21之方式。(3) The
(4)圖1~圖3所示之第1手驅動部11之構成並不特別限定,只要能驅動第1手9即可。例如,亦可為5個第1手9之迴旋軸全部共通。例如,只要迴旋軸線一致,還可為5個第1手9中上下方向DZ上連續之4個第1手9之迴旋軸共通,而另1個第1手9之迴旋軸不同。同樣地,第2手驅動部17之構成並不特別限定,只要能驅動第2手25即可。
[產業上之可利用性](4) The configuration of the first
本發明係關於一種基板處理裝置及基板搬送方法,其具有產業上之可利用性。The present invention relates to a substrate processing apparatus and a substrate transfer method, which have industrial applicability.
1:移載傳送部 3:載具載置部 5:第1搬送室 7:第1搬送機構 9:第1手 11:第1手驅動部 11a:軌道 11b:水平移動部 11c:垂直移動部 11d:迴旋部 11e:迴旋軸 11f:進退部 17:第2手驅動部 20:處理部 21:處理單元 21A:處理單元 21B:處理單元 21_1~21_N:處理單元 23:第2搬送機構(搬送機構) 23L:第2搬送機構(搬送機構) 23U:第2搬送機構(搬送機構) 25:第2手(手、第1非共用手、第2非共用手、共用手) 27a:支柱 27b:垂直移動部 27c:水平移動部 27d:迴旋部 27e:迴旋軸 27f:進退部 29:基板載置部 29L:基板載置部 29U:基板載置部 31:第2搬送室 41:處理殼體 41a:搬送口 43:基板保持部 45:旋轉驅動部 47:第1噴嘴 47a:第1噴嘴移動部 49:第2噴嘴 49a:第2噴嘴移動部 51:第3噴嘴 51a:第3噴嘴移動部 53:第4噴嘴 53a:第4噴嘴移動部 55:承杯 100:基板處理裝置 200:控制部 291:支持部 291A:基板載置部之下段 291B:基板載置部之上段 471:第1噴嘴臂 472:第1噴嘴驅動部 473:第1處理液供給配管 491:第2噴嘴臂 492:第2噴嘴驅動部 493:第2處理液供給配管 511:第3噴嘴臂 512:第3噴嘴驅動部 513:第3處理液供給配管 531:第4噴嘴臂 532:第4噴嘴驅動部 533:沖洗液供給配管 C:載具 TW:處理塔 TW1~TW4:處理塔 W:基板 W1~W10:基板 WX1:基板 WX2:基板 HA~HD:第2手(手、第1非共用手、第2非共用手、共用手) H_1~H_M:第2手(手、第1非共用手、第2非共用手、共用手) H_F:第2手(手、第1非共用手、第2非共用手、共用手) H_S:第2手(手、第1非共用手、第2非共用手、共用手)1: Transfer and transfer part 3: Vehicle mounting part 5: 1st transfer room 7: 1st conveying mechanism 9: 1st hand 11: 1st hand drive part 11a: Orbits 11b: Horizontal moving part 11c: Vertical moving part 11d: Swirl 11e: Rotary axis 11f: Advance and retreat department 17: Second hand drive 20: Processing Department 21: Processing unit 21A: Processing unit 21B: Processing unit 21_1~21_N: Processing unit 23: Second conveying mechanism (conveying mechanism) 23L: Second conveying mechanism (conveying mechanism) 23U: Second conveying mechanism (conveying mechanism) 25: 2nd hand (hand, 1st non-shared hand, 2nd non-shared hand, shared hand) 27a: Pillar 27b: Vertical moving part 27c: Horizontal moving part 27d: Circumference 27e: Rotary axis 27f: Advance and retreat department 29: Substrate mounting part 29L: Substrate mounting part 29U: Substrate mounting part 31: 2nd transfer room 41: Handling the shell 41a: transfer port 43: Substrate holding part 45: Rotary drive part 47: 1st Nozzle 47a: 1st nozzle moving part 49: No. 2 Nozzle 49a: Second nozzle moving part 51: 3rd Nozzle 51a: 3rd nozzle moving part 53: 4th Nozzle 53a: Fourth nozzle moving part 55: Cheng Cup 100: Substrate processing device 200: Control Department 291: Support Department 291A: Lower section of substrate placement section 291B: Upper section of substrate placement portion 471: 1st Nozzle Arm 472: 1st Nozzle Drive 473: 1st treatment liquid supply piping 491: 2nd Nozzle Arm 492: Second Nozzle Drive 493: Second treatment liquid supply piping 511: 3rd Nozzle Arm 512: 3rd Nozzle Drive 513: The third processing liquid supply piping 531: 4th Nozzle Arm 532: Fourth Nozzle Drive 533: Rinse fluid supply piping C: vehicle TW: processing tower TW1~TW4: Processing tower W: substrate W1~W10: Substrate WX1: Substrate WX2: Substrate HA~HD: 2nd hand (hand, 1st non-shared hand, 2nd non-shared hand, shared hand) H_1~H_M: 2nd hand (hand, 1st non-shared hand, 2nd non-shared hand, shared hand) H_F: 2nd hand (hand, 1st non-shared hand, 2nd non-shared hand, shared hand) H_S: 2nd hand (hand, 1st non-shared hand, 2nd non-shared hand, shared hand)
圖1係表示本發明之實施方式的基板處理裝置之內部之俯視圖。 圖2係沿著圖1之II-II線之剖視圖。 圖3係沿著圖1之III-III線之剖視圖。 圖4係表示本實施方式之基板處理裝置之側視圖。 圖5係表示本實施方式之處理單元之內部之側視圖。 圖6係表示本實施方式之基板處理裝置之第1搬送機構、基板載置部及第2搬送機構之側視圖。 圖7係表示本實施方式之基板處理裝置所執行之第1基板搬送方法的整個流程之一例之圖。 圖8係表示本實施方式之基板處理裝置所執行之第1基板搬送方法之前段之流程圖。 圖9係表示本實施方式之基板處理裝置所執行之第1基板搬送方法之後段之流程圖。 圖10係表示本實施方式之基板處理裝置所執行之第2基板搬送方法的整個流程之一例之圖。 圖11係表示本實施方式之基板處理裝置所執行之第2基板搬送方法之前段之流程圖。 圖12係表示本實施方式之基板處理裝置所執行之第2基板搬送方法之後段之流程圖。 圖13係用以將本實施方式之基板處理裝置所執行之第1基板搬送方法泛化而加以說明之圖。 圖14係表示本實施方式之第2搬送機構具備2N個第2手之情形時,第2手之總數、第1基板搬送方法中使用之第2手之數量、及第2基板搬送方法中使用之第2手之數量之關係之圖。 圖15係表示本實施方式之第2搬送機構具備N+1個第2手,且N為奇數之情形時,第2手之總數、第1基板搬送方法中使用之第2手之數量、及第2基板搬送方法中使用之第2手之數量之關係之圖。 圖16係表示本實施方式之第2搬送機構具備N+1個第2手,且N為偶數之情形時,第2手之總數、第1基板搬送方法中使用之第2手之數量、及第2基板搬送方法中使用之第2手之數量之關係之圖。FIG. 1 is a plan view showing the inside of a substrate processing apparatus according to an embodiment of the present invention. FIG. 2 is a cross-sectional view taken along line II-II of FIG. 1 . FIG. 3 is a cross-sectional view taken along line III-III of FIG. 1 . FIG. 4 is a side view showing the substrate processing apparatus of the present embodiment. FIG. 5 is a side view showing the inside of the processing unit of the present embodiment. FIG. 6 is a side view showing a first conveyance mechanism, a substrate placement portion, and a second conveyance mechanism of the substrate processing apparatus according to the present embodiment. FIG. 7 is a diagram showing an example of the entire flow of the first substrate conveying method executed by the substrate processing apparatus of the present embodiment. FIG. 8 is a flowchart showing the first stage of the first substrate conveying method executed by the substrate processing apparatus of the present embodiment. FIG. 9 is a flowchart showing the second stage of the first substrate conveyance method executed by the substrate processing apparatus of the present embodiment. FIG. 10 is a diagram showing an example of the entire flow of the second substrate transfer method executed by the substrate processing apparatus of the present embodiment. FIG. 11 is a flowchart showing the first stage of the second substrate conveyance method executed by the substrate processing apparatus of the present embodiment. FIG. 12 is a flowchart showing the second stage of the second substrate transfer method executed by the substrate processing apparatus of the present embodiment. FIG. 13 is a diagram for generalizing and explaining the first substrate conveying method executed by the substrate processing apparatus of the present embodiment. 14 shows the total number of second hands, the number of second hands used in the first substrate transfer method, and the number of second hands used in the second substrate transfer method when the second transfer mechanism of the present embodiment has 2N second hands The graph of the relationship between the quantity of the second hand. 15 shows the total number of second hands, the number of second hands used in the first substrate transfer method, and the number of second hands when N is an odd number of the second transfer mechanism of the present embodiment A diagram showing the relationship between the quantity of the second hand used in the substrate transfer method. 16 shows the total number of second hands, the number of second hands used in the first substrate transfer method, and the second A diagram showing the relationship between the quantity of the second hand used in the substrate transfer method.
21:處理單元 21: Processing unit
21_1~21_N:處理單元 21_1~21_N: Processing unit
23:第2搬送機構(搬送機構) 23: Second conveying mechanism (conveying mechanism)
25:第2手(手、第1非共用手、第2非共用手、共用手) 25: 2nd hand (hand, 1st non-shared hand, 2nd non-shared hand, shared hand)
29:基板載置部 29: Substrate mounting part
41a:搬送口 41a: transfer port
H_F:第2手(手、第1非共用手、第2非共用手、共用手) H_F: 2nd hand (hand, 1st non-shared hand, 2nd non-shared hand, shared hand)
H_S:第2手(手、第1非共用手、第2非共用手、共用手) H_S: 2nd hand (hand, 1st non-shared hand, 2nd non-shared hand, shared hand)
H_1~H_M:第2手(手、第1非共用手、第2非共用手、共用手) H_1~H_M: 2nd hand (hand, 1st non-shared hand, 2nd non-shared hand, shared hand)
W:基板 W: substrate
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