TWI788691B - 原子吸光分光光度計 - Google Patents

原子吸光分光光度計 Download PDF

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Publication number
TWI788691B
TWI788691B TW109126259A TW109126259A TWI788691B TW I788691 B TWI788691 B TW I788691B TW 109126259 A TW109126259 A TW 109126259A TW 109126259 A TW109126259 A TW 109126259A TW I788691 B TWI788691 B TW I788691B
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TW
Taiwan
Prior art keywords
nozzle
hole
imaging unit
tip
atomic absorption
Prior art date
Application number
TW109126259A
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English (en)
Chinese (zh)
Other versions
TW202124939A (zh
Inventor
太田黒敦彦
小林央祐
Original Assignee
日商島津製作所股份有限公司
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Publication of TW202124939A publication Critical patent/TW202124939A/zh
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Publication of TWI788691B publication Critical patent/TWI788691B/zh

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
TW109126259A 2019-12-19 2020-08-04 原子吸光分光光度計 TWI788691B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
PCT/JP2019/049826 WO2021124513A1 (ja) 2019-12-19 2019-12-19 原子吸光分光光度計
WOPCT/JP2019/049826 2019-12-19

Publications (2)

Publication Number Publication Date
TW202124939A TW202124939A (zh) 2021-07-01
TWI788691B true TWI788691B (zh) 2023-01-01

Family

ID=76478617

Family Applications (1)

Application Number Title Priority Date Filing Date
TW109126259A TWI788691B (zh) 2019-12-19 2020-08-04 原子吸光分光光度計

Country Status (4)

Country Link
JP (1) JP7331945B2 (ja)
CN (1) CN114829902A (ja)
TW (1) TWI788691B (ja)
WO (1) WO2021124513A1 (ja)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2023188553A1 (ja) * 2022-03-29 2023-10-05 株式会社島津製作所 原子吸光光度計

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61190856U (ja) * 1984-10-18 1986-11-27
US5985357A (en) * 1997-01-28 1999-11-16 Dainippon Screen Mfg. Co., Ltd. Treating solution supplying method and apparatus
JP2012032310A (ja) * 2010-07-30 2012-02-16 Sysmex Corp 検体処理装置

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5304350A (en) * 1992-01-16 1994-04-19 Kloehn Instrument Inc. Slide type analytic device, method, and preparation apparatus
JPH1073537A (ja) * 1996-08-30 1998-03-17 Shimadzu Corp 原子吸光分光光度計
JP4021335B2 (ja) * 2003-01-31 2007-12-12 ユニバーサル・バイオ・リサーチ株式会社 監視機能付分注装置および分注装置の監視方法
JP4646311B2 (ja) * 2005-11-22 2011-03-09 株式会社スギノマシン ノズル先端基準高さ位置調整装置及びサンプリング装置
JP6211391B2 (ja) 2013-10-31 2017-10-11 株式会社日立ハイテクノロジーズ 自動分析装置
JP6333584B2 (ja) 2014-03-11 2018-05-30 キヤノンメディカルシステムズ株式会社 臨床検査装置
DE102015117384B4 (de) 2015-10-14 2023-01-05 Analytik Jena Gmbh Verfahren zur spektralen Analyse von Proben mittels Graphitrohr
JP6701952B2 (ja) 2016-05-20 2020-05-27 株式会社島津製作所 原子吸光分光光度計

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61190856U (ja) * 1984-10-18 1986-11-27
US5985357A (en) * 1997-01-28 1999-11-16 Dainippon Screen Mfg. Co., Ltd. Treating solution supplying method and apparatus
JP2012032310A (ja) * 2010-07-30 2012-02-16 Sysmex Corp 検体処理装置

Also Published As

Publication number Publication date
JPWO2021124513A1 (ja) 2021-06-24
JP7331945B2 (ja) 2023-08-23
CN114829902A (zh) 2022-07-29
WO2021124513A1 (ja) 2021-06-24
TW202124939A (zh) 2021-07-01

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