TWI788691B - Atomic Absorption Spectrophotometer - Google Patents

Abstract

An atomic absorption spectrophotometer, comprising: an atomization part, a nozzle, a spray A mouth moving mechanism, a position adjusting mechanism, at least one imaging unit, and a display. The atomization unit includes a furnace having a hole for sample injection, and atomizes the sample injected into the furnace by heating. The nozzle sucks and ejects the sample. The nozzle moving mechanism moves the nozzle to a position directly above the hole. The position adjusting mechanism is configured to be able to adjust the relative position of the tip of the nozzle with respect to the hole by moving the nozzle moving mechanism. At least one imaging unit is arranged so that the tip of the nozzle and the hole are included in the imaging field of view in a state where the tip of the nozzle is located directly above the hole. The display displays captured images obtained by at least one imaging unit.

Description

Atomic Absorption Spectrophotometer

The invention relates to an atomic absorption spectrophotometer.

Japanese Patent Application Laid-Open No. 61-190856 (Patent Document 1) discloses an automatic sample injection device used in a furnace-type atomic absorption spectrophotometer. The automatic sample injection device described in Patent Document 1 includes an injection mechanism. The injection mechanism is configured to inject a liquid sample into the tube by passing through a small-diameter hole (sample injection hole) formed on the side surface of the cylindrical graphite tube. Specifically, the arm of the injection mechanism holds the nozzle at the tip and is fixed to the arm rotation shaft. The injection mechanism moves the nozzle from a position directly above the container storing the sample to directly above the hole by the rotational movement of the arm rotation shaft, and then stops the rotation of the arm. Next, the injection mechanism lowers the arm to insert the tip of the nozzle into the hole, and injects the sample from the nozzle into the tube.

[Prior art literature] [Patent Document]

[Patent Document 1] Japanese Patent Application Publication No. 61-190856

However, in order to inject the sample into the graphite tube using the automatic sample injection device, it is necessary to adjust the position of the nozzle relative to the graphite tube in advance by rotating the arm to move the nozzle to a position directly above the hole of the graphite tube. The relative position of the hole.

Conventionally, this position adjustment has been performed by the user visually confirming the position of the hole, and moving the injection mechanism in the horizontal direction so that the tip of the nozzle is positioned directly above the hole.

However, the diameter of the hole is as small as about 1 mm to 2 mm. Therefore, it takes time and effort to confirm the position of the hole visually by the user. As a result, adjusting the position of the nozzle is not necessarily an easy task. Therefore, there is a problem that it takes a long time to prepare for the analysis, which reduces the efficiency of the analysis work. In addition, in the position adjustment performed by the user's eyes, there is a possibility that a deviation from the position directly above the hole may remain, and there is a concern that the accuracy of the position adjustment may not be stable.

The present invention is made to solve the above-mentioned problems, and an object of the present invention is to facilitate position adjustment of a nozzle and improve the accuracy of position adjustment in an atomic absorption spectrophotometer.

An atomic absorption spectrophotometer according to a first aspect of the present invention includes an atomization unit, a nozzle, a nozzle moving mechanism, a position adjustment mechanism, at least one imaging unit, and a display. The atomization unit includes a furnace having a hole for sample injection, and atomizes the sample injected into the furnace by heating. The nozzle sucks and ejects the sample. The nozzle moving mechanism moves the nozzle to a position directly above the hole. The position adjusting mechanism is configured to be able to adjust the front end of the nozzle relative to the nozzle by moving the nozzle moving mechanism. The relative position of the hole. At least one imaging unit is arranged so that the tip of the nozzle and the hole are included in the imaging field of view in a state where the tip of the nozzle is located directly above the hole. The display displays captured images obtained by at least one imaging unit.

According to the present invention, in the atomic absorption spectrophotometer, the position adjustment of the nozzle can be easily adjusted, and the accuracy of the position adjustment can be improved.

1: light source

2: Atomization Department

3: Optical splitter

4: Automatic sampler

5: Detector

6: Heater

8: drive

9: turntable

10: Position adjustment mechanism

12, 12A, 12B: camera department

14, 14A, 14B, 33, 34: mirrors

15: Controller

16: Display

18:Operation department

21: graphite tube

22, 25: Hole

23, 24: electrode

26: window panel

31: Entrance slit

32: Exit slit

35: Diffraction grating

40: Nozzle

41: Nozzle moving mechanism

42: arm

43:Rotary axis

44, 90: motor

92: platform

94a, 94b, 94c: container class

100: Atomic Absorption Spectrophotometer

150: Processor

152: memory

154: Input and output interface (I/F)

156: Communication interface (I/F)

P: job position

S01~S06: Steps

X, Y, Z: axes

FIG. 1 is a diagram showing a schematic configuration of an atomic absorption spectrophotometer according to a first embodiment.

FIG. 2 is a schematic diagram showing a configuration example of an atomization unit and an automatic sampler shown in FIG. 1 .

FIG. 3 is a schematic diagram showing a configuration example of an atomization unit and an automatic sampler shown in FIG. 1 .

FIG. 4 is a flowchart for explaining the processing procedure of nozzle position adjustment by the controller.

FIG. 5 is a diagram showing a schematic configuration of an atomic absorption spectrophotometer according to Embodiment 2. FIG.

FIG. 6 is a diagram showing a schematic configuration of an atomic absorption spectrophotometer according to Embodiment 3. FIG.

FIG. 7 is a diagram showing a schematic configuration of an atomic absorption spectrophotometer according to Embodiment 4. FIG.

Hereinafter, embodiments of the present disclosure will be described in detail with reference to the drawings. In addition, if the same symbol is marked on the same or a considerable part of the figure, it will not be repeated in principle. illustrate.

[Embodiment 1]

FIG. 1 is a diagram showing a schematic configuration of an atomic absorption spectrophotometer according to a first embodiment. The atomic absorption spectrophotometer 100 of Embodiment 1 is a furnace type atomic absorption spectrophotometer. In the furnace-type atomic absorption spectrophotometer, a sample is accommodated in a graphite tube, and the tube is heated to heat and atomize the sample. The absorbance is measured by passing light through atomic vapor.

Referring to Fig. 1, atomic absorption spectrophotometer 100 comprises: light source 1, atomization part 2, spectrometer 3, automatic sampler 4, detector 5, heater 6, driver 8, position adjustment mechanism 10, imaging part 12, and controller 15.

The light source 1 includes a lamp that emits light of a wavelength specific to an element. The lamp is, for example, a hollow cathode lamp. Hollow cathode lamps emit light that contains a spectrum of bright lines.

The atomization unit 2 includes a cylindrical graphite tube 21 and is configured to heat and atomize a liquid sample injected into the graphite tube 21 . The graphite tube 21 corresponds to an embodiment of the "furnace". A hole 22 for sample injection (sample injection hole) is formed on the side surface of the graphite tube 21 . The hole portion 22 has a circular shape with a diameter of about 1 mm to 2 mm.

The automatic sampler 4 is configured to automatically perform the following operation: the sample is sucked from the sample container (not shown) containing the sample by the nozzle 40, and the sample is sucked into the atomization part 2. A sample is injected into the hole 22 of the graphite tube 21 . Specifically, the automatic sampler 4 includes a cylindrical nozzle 40 and a nozzle moving mechanism 41 . The nozzle 40 is connected to the front end portion of an unillustrated sampling channel, and sucks and discharges liquid. The sampling flow path is formed of, for example, a flexible tube, and a syringe pump is connected to the side opposite to the nozzle 40 for pumping. By the operation of the syringe pump, the nozzle 40 can suck and discharge the liquid.

The nozzle moving mechanism 41 includes an arm 42 , a rotating shaft 43 , and a motor 44 . Arm 42 supports nozzle 40 . The arm 42 is configured to be rotated around a rotation shaft 43 by a motor 44 and to be raised and lowered along the rotation shaft 43 . The driver 8 is connected to the motor 44 and drives the motor 44 according to a control command from the controller 15 . By turning the arm 42 of the motor 44 , the nozzle 40 can move between a position directly above the sample container (not shown) and a position directly above the hole 22 of the graphite tube 21 .

The position adjustment mechanism 10 is configured to be able to adjust the relative position of the nozzle 40 and the graphite tube 21 by moving the nozzle moving mechanism 41 (the arm 42 , the rotating shaft 43 and the motor 44 ). The position adjustment mechanism 10 includes, for example, an XY stage, and can move the nozzle moving mechanism 41 along two axes (X axis and Y axis) parallel to the optical axis of the light source 1 .

The heater 6 heats the graphite tube 21 by passing a current through the graphite tube 21 . As the sample in the graphite tube 21 is heated, elements in the sample are atomized.

The beam splitter 3 includes: an entrance slit 31 , an exit slit 32 , a mirror 33 , a mirror 34 , and a diffraction grating 35 . As shown in FIG. 1 , the light emitted from the light source 1 passes through the graphite tube 21 and is introduced into the beam splitter 3 . The light introduced into the beam splitter 3 passes through the slit opening of the entrance slit 31 , and enters the diffraction grating 35 via the reflection mirror 33 . By rotating the diffraction grating 35, the light of a specific wavelength selectively passes through the mirror 34 And pass through the slit opening of the exit slit 32. Light of a specific wavelength passing through the exit slit 32 reaches the detector 5 . When the detector 5 receives light of a specific wavelength from the beam splitter 3 , it outputs an electrical signal corresponding to the intensity of the received light to the controller 15 .

In addition, although not shown in the figure, appropriate converging optical systems are respectively disposed between the light source 1 and the atomization unit 2 and between the atomization unit 2 and the beam splitter 3, and are configured to appropriately condense the light. And import to the next paragraph.

The controller 15 controls the atomic absorption spectrophotometer 100 as a whole. The controller 15 includes: a processor 150 , a memory 152 , an input/output interface (I/F) 154 , and a communication interface (I/F) 156 as main components. These parts are connected so as to be able to communicate with each other via a bus bar (not shown).

The processor 150 is typically an arithmetic processing unit such as a central processing unit (Central Processing Unit, CPU) or a micro processing unit (Micro Processing Unit, MPU). The processor 150 controls the operation of each part of the atomic absorption spectrophotometer 100 by reading and executing the program stored in the memory 152 . Specifically, the processor 150 realizes various processes of the atomic absorption spectrophotometer 100 described later by executing the program. In addition, in the example of FIG. 1, although the structure of a single processor was shown as an example, the controller 15 may be set as the structure including a some processor.

The memory 152 is realized by using non-volatile memory such as random access memory (Random Access Memory, RAM), read only memory (Read Only Memory, ROM), and flash memory (flash memory). The memory 152 stores programs executed by the processor 150 or data used by the processor 150 .

The input/output I/F 154 is an interface for exchanging various data between the processor 150 and various parts such as the light source 1 , the detector 5 , the heater 6 , the driver 8 , and the position adjustment mechanism 10 .

The communication I/F 156 is an interface for exchanging various data between the atomic absorption spectrophotometer 100 and other devices, and is realized by an adapter or a connector. In addition, the communication method can be a wireless communication method such as a wireless area network (Local Area Network, LAN), or a wired communication method using a universal serial bus (Universal Serial Bus, USB).

A display 16 and an operation unit 18 are connected to the controller 15 . The display 16 includes a liquid crystal panel and the like. The operation unit 18 receives a user's operation input to the atomic absorption spectrophotometer 100 . The operation unit 18 typically includes a touch panel, a keyboard, a mouse, and the like.

In the atomic absorption spectrophotometer 100, during the quantitative analysis of the sample, after the sample is injected into the graphite tube 21 by the automatic sampler 4, a current is passed through the graphite tube 21 from the heater 6, whereby the graphite tube 21 Heating to high temperature (eg about 3000°C). Thereby, the sample is dried and ashed in the graphite tube 21, and elements in the sample are atomized. When the light emitted from the light source 1 passes through the graphite tube 21, the light of the wavelength specific to the elements contained in the sample is strongly absorbed. The light passing through the graphite tube 21 is subjected to wavelength dispersion by the spectrometer 3 , and light having a wavelength specific to the target element is selected and introduced to the detector 5 . The controller 15 can calculate the absorptivity from the difference in the light-receiving intensity of the detector 5 due to the presence or absence of the sample, and perform quantitative analysis on the sample based on the calculated absorptivity.

In the atomic absorption spectrophotometer 100 , the position of the nozzle 40 of the autosampler 4 relative to the hole 22 (sample injection hole) of the graphite tube 21 is adjusted before actual sample analysis. This position adjustment is performed before the analysis of the sample when the nozzle 40 and/or the graphite tube 21 have been replaced. Next, position adjustment of the nozzle 40 will be described.

2 and 3 are schematic diagrams showing configuration examples of the atomization unit 2 and the autosampler 4 shown in FIG. 1 . FIG. 2 schematically shows a cross section of the atomization part 2 . A schematic planar configuration of the auto sampler 4 is shown in FIG. 3 .

Referring to FIG. 2 , the atomization unit 2 includes: a graphite tube 21 , an electrode 23 , an electrode 24 , and a window plate 26 . The electrodes 23 and 24 hold both ends of the cylindrical graphite tube 21 . The window plate 26 is made of a transparent quartz plate, and is provided at both ends in the optical axis direction with the graphite tube 21 interposed therebetween.

A circular hole 25 is formed in the electrode 23 located on the upper side of the graphite tube 21 . The hole 25 is arranged at a position overlapping the hole 22 formed in the graphite tube 21 . The diameter of the hole portion 25 is equal to or greater than the diameter of the hole portion 22 . In addition, in order to allow the nozzle 40 to be inserted into the graphite tube 21 , the diameters of the hole 22 and the hole 25 are larger than the outer diameter of the nozzle 40 .

Referring to FIG. 3 , the automatic sampler 4 not only includes a nozzle moving mechanism 41 (arm 42 , rotating shaft 43 and motor 44 ), but also includes a turntable 9 . The turntable 9 includes a circular platform 92 and a motor 90 for rotating the platform 92 . Containers 94 a , 94 b , 94 c , . . . including sample containers containing liquid samples are placed on the table 92 . In addition, in the container class, there are: empty container, storage with inspection A container for a standard solution for preparation of a calibration curve, a container for a dilution series, etc.

By rotating the platform 92 with the motor 90, the selected container is moved to the working position P. By rotating the arm 42 with the motor 44 and moving the nozzle 40 to the working position P, the nozzle 40 can suck and discharge the liquid from the container moved to the working position P.

In the quantitative analysis of the sample, after the nozzle 40 is moved to the operation position P to suck the sample from the sample container, the nozzle 40 is moved to the front of the hole 22 of the graphite tube 21 by the rotation of the arm 42. upper position. The nozzle 40 is lowered at this position, the tip of the nozzle 40 is inserted into the hole 22 , and the sample is ejected from the nozzle 40 . After the sample is ejected, the nozzle 40 is returned to the working position P by rotating the arm 42 again. Thereby, a sample is injected into the graphite tube 21, and atomic absorption analysis is performed.

In addition, when a plurality of samples are continuously analyzed, the same operation is repeated for the next sample container. Furthermore, the step of washing the nozzle 40 with the cleaning liquid can be performed immediately before the continuous analysis, during the continuous analysis, or immediately after the continuous analysis.

In order to inject a sample using the automatic sampler 4, it is necessary to adjust the position of the nozzle 40 relative to the hole in advance in such a way that the nozzle 40 is moved to a position directly above the hole 22 of the graphite tube 21 by rotating the arm 42. The relative position of part 22. Previously, this position adjustment was performed by the user visually confirming the position of the hole 22 of the graphite tube 21, and the position adjustment mechanism 10 was operated so that the front end of the nozzle 40 was located directly above the hole 22, and the nozzle moving mechanism 41 2 axes parallel to the optical axis (X axis, Y-axis) direction movement.

However, since the diameter of the hole 22 is as small as about 1 mm to 2 mm, it takes time and effort to catch the position of the hole 22 visually by the user. As a result, adjusting the position of the nozzle 40 is not necessarily an easy task. Therefore, there is a problem that it takes a long time to prepare for the analysis, which reduces the efficiency of the analysis work. In addition, in the position adjustment performed by the user's visual observation, there may be cases where a deviation from the position directly above the hole portion 22 remains, and there is a concern that the accuracy of the position adjustment may not be stable.

Therefore, the atomic absorption spectrophotometer 100 according to Embodiment 1 includes the imaging unit 12 as a configuration for detecting the relative position of the nozzle 40 with respect to the hole portion 22 . The imaging unit 12 is provided so as to include the tip of the nozzle 40 in the imaging range (imaging field of view). Specifically, the imaging unit 12 is provided so that its focus position is located at the tip of the nozzle 40 . As shown in FIG. 2 , the imaging unit 12 is arranged so that the tip of the nozzle 40 and the hole 22 are included in the imaging field of view in a state where the tip of the nozzle 40 is located directly above the hole 22 .

Here, in order to accurately detect the relative position of the tip of the nozzle 40 with respect to the hole 22 , it is desirable to dispose the imaging unit 12 as close as possible to the position immediately above the hole 22 . Therefore, the imaging unit 12 is disposed close to the position directly above the tip of the nozzle 40 . In the example of FIG. 2 , the imaging unit 12 is mounted on a portion of the arm 42 that is close to the position directly above the tip of the nozzle 40 . Thereby, in a state where the tip of the nozzle 40 is located directly above the hole 22 , the imaging unit 12 can be arranged close to the position directly above the hole 22 .

The imaging unit 12 includes an optical system such as a lens, and an imaging element. The imaging device is realized by, for example, a Charge Coupled Device (CCD) sensor, a Complementary Metal Oxide Semiconductor (CMOS) sensor, and the like. The imaging device generates a captured image by converting light incident through an optical system into electrical signals. The imaging unit 12 images the tip of the nozzle 40 to generate image data, and sends the generated image data to the controller 15 .

When the controller 15 receives image data from the imaging unit 12 , it displays the captured image on the display 16 . Thereby, the user can confirm the position of the tip of the nozzle 40 by referring to the captured image displayed on the monitor 16 . Therefore, the user can move the nozzle so that the tip of the nozzle 40 is located directly above the hole 22 by actuating the position adjustment mechanism 10 while confirming the relative position of the tip of the nozzle 40 with respect to the hole 22 . Mechanism 41 moves. Thereby, the position adjustment operation|work of the nozzle 40 becomes easy compared with the conventional position adjustment by visual inspection. As a result, the efficiency of the analysis work can be improved, and the accuracy of the position adjustment of the nozzle 40 can be improved.

In addition, the controller 15 can be configured to automatically adjust the position of the nozzle 40 by using a known image processing technique. Specifically, if the controller 15 acquires image data from the imaging unit 12, it uses image processing technology to select the tip of the nozzle 40 and the hole 22 from the image data, thereby obtaining the tip of the nozzle 40 and the hole. The positional relationship of the part 22. The controller 15 operates the position adjustment mechanism 10 so that the tip of the nozzle 40 is located at a preset reference position. This reference position can be based on the position of the nozzle 40 in the state where the nozzle 40 is located directly above the hole 22. The relative position of the front end and the hole portion 22 is set. Thereby, since the position adjustment work by the user is not required, the analysis efficiency can be further improved.

FIG. 4 is a flowchart for explaining the processing procedure of adjusting the position of the nozzle 40 by the controller 15 .

Referring to FIG. 4 , first, according to step S01 , the controller 15 sets the nozzle 40 on the upper portion of the hole 22 of the graphite tube 21 by rotating the arm 42 of the nozzle moving mechanism 41 .

Next, the controller 15 uses the imaging unit 12 to image the tip of the nozzle 40 according to step S02. In step S03 , the controller 15 selects the tip of the nozzle 40 and the hole 22 by performing known image processing on the image data captured by the imaging unit 12 . Based on the selection result, the controller 15 detects the relative position of the tip of the nozzle 40 with respect to the hole 22 .

The controller 15 calculates the amount of displacement of the position of the tip of the nozzle 40 from the reference position based on the detected relative position between the hole 22 and the tip of the nozzle 40 in step S04 .

The controller 15 advances to step S05, and adjusts the relative position of the nozzle 40 with respect to the hole part 22 based on the offset calculated in step S04 by operating the position adjustment mechanism 10. The position adjustment mechanism 10 moves the nozzle moving mechanism 41 in a direction in which the amount of displacement decreases. When the amount of deviation becomes equal to or less than a predetermined value through the adjustment in step S05, the controller 15 fixes the nozzle 40 at the position according to step S06, and ends the position adjustment.

As described above, the atomic absorption spectrophotometer according to Embodiment 1 100, it is possible to detect the relative position of the tip of the nozzle 40 relative to the hole 22 of the graphite tube 21 by using the imaging unit 12 that takes an image of the tip of the nozzle 40, so that the relative position of the nozzle 40 relative to the hole 22 can be determined. Easy to adjust. Thereby, the efficiency of the analysis work can be improved, and the accuracy of the position adjustment of the nozzle 40 can be improved.

Furthermore, in Embodiment 1, by mounting the imaging unit 12 on the arm 42, when the arm 42 is rotated to move the nozzle 40 to the operation position P, the imaging unit 12 is also moved away from the graphite tube 21 together with the nozzle 40, and toward the Turntable 9 side moves. That is, the nozzle moving mechanism 41 can also function as a moving mechanism of the imaging unit 12 .

When the imaging unit 12 is installed close to the position directly above the hole 22 , if the graphite tube 21 is heated to a high temperature, the imaging unit 12 may be overheated and damaged. Therefore, after the adjustment of the position of the nozzle 40 is completed, a movement mechanism for moving the imaging unit 12 away from the graphite tube 21 is required. In the atomic absorption spectrophotometer 100 of Embodiment 1, by using the nozzle moving mechanism 41 in common with the moving mechanism of the imaging unit 12, as described above, if the nozzle 40 is separated from the graphite tube 21, the imaging unit 12 and the graphite tube 21 can be increased. distance between tubes 21. Therefore, a moving mechanism for the imaging unit 12 is unnecessary. Thereby, with a simple structure, the imaging part 12 can be avoided from the graphite tube 21 which becomes high temperature at the time of sample analysis, and the imaging part 12 can be protected from overheating.

In addition, in Embodiment 1, the imaging unit 12 is mounted on the arm 42, and the imaging unit 12 is moved by the rotation of the arm 42. The atomic absorption spectrophotometer 100 may also include the imaging unit 12. The structure of the mobile mechanism. In this case, the moving mechanism of the imaging unit 12 is configured such that it can be located close to the position directly above the hole 22 and includes the tip of the nozzle 40 and the first edge of the hole 22 in the imaging field of view. position, and the second position farther away from the graphite tube 21 than the first position, the imaging Section 12 moves.

[Embodiment 2]

In the first embodiment, the configuration in which the imaging unit 12 for imaging the tip of the nozzle 40 is mounted on the arm 42 has been exemplified. In Embodiment 2, the structure which uses the imaging part 12 and a reflection mirror together and images the front-end|tip of the nozzle 40 is demonstrated.

FIG. 5 is a diagram showing a schematic configuration of an atomic absorption spectrophotometer 100 according to the second embodiment. FIG. 5 schematically shows configuration examples of the atomization unit 2 and the autosampler 4 .

Compared with the atomic absorption spectrophotometer 100 of the first embodiment, the atomic absorption spectrophotometer 100 of Embodiment 2 is different in that it further includes a reflection mirror 14 . About other structures, since it is the same as Embodiment 1, description is not repeated.

Referring to FIG. 5 , atomic absorption spectrophotometer 100 according to Embodiment 2 includes mirror 14 and imaging unit 12 as a structure for detecting the relative position of nozzle 40 with respect to hole 22 . The reflection mirror 14 is provided at a position where it can reflect an image including the tip of the nozzle 40 . As shown in FIG. 5 , in a state where the nozzle 40 is located directly above the hole 22 , the reflection mirror 14 is arranged so that the tip of the nozzle 40 and the hole 22 are included in the reflected image.

The reflecting mirror 14 is disposed close to and directly above the tip of the nozzle 40 . In the example of FIG. 5 , the reflector 14 is mounted on a portion of the arm 42 that is close to the tip of the nozzle 40 and directly above. Thereby, in a state where the tip of the nozzle 40 is located directly above the hole 22 , the reflection mirror 14 can be arranged close to the position directly above the hole 22 .

The imaging unit 12 is provided at a position where a reflection image of the tip of the nozzle 40 obtained by the reflection mirror 14 can be obtained. As shown in FIG. 5 , when the nozzle 40 is moved to a position directly above the hole 22 , a reflection image including the tip of the nozzle 40 and the hole 22 is formed on the reflection mirror 14 . The imaging part 12 can detect the relative position of the nozzle 40 with respect to the hole part 22 by acquiring the reflection image of the reflection mirror 14. As shown in FIG.

The imaging unit 12 generates image data of the tip of the nozzle 40 based on the reflection image, and sends the generated image data to the controller 15 . The controller 15 displays the captured image obtained by the imaging unit 12 on the display 16 . Thereby, the user can confirm the position of the tip of the nozzle 40 by referring to the captured image displayed on the display 16 . Therefore, similarly to Embodiment 1, the user can position the tip of the nozzle 40 directly above the hole 22 by operating the position adjustment mechanism 10 while confirming the relative position of the tip of the nozzle 40 to the hole 22 . In this way, the nozzle moving mechanism 41 is moved.

Alternatively, the controller 15 can acquire the relative positions of the tip of the nozzle 40 and the hole 22 by performing known image processing on the image data acquired by the imaging unit 12 . Therefore, the controller 15 can automatically adjust the position of the tip of the nozzle 40 with respect to the hole 22 based on the acquired relative position.

As described above, according to the atomic absorption spectrophotometer 100 of Embodiment 2, the imaging unit 12 can image the tip of the nozzle 40 using the mirror 14, so the user can detect The relative position of the tip of the nozzle 40 with respect to the hole 22 of the graphite tube 21 . Therefore, the same effect as that of the atomic absorption spectrophotometer 100 of Embodiment 1 can be obtained.

Furthermore, according to the atomic absorption spectrophotometer 100 of Embodiment 2, the imaging unit 12 can be installed away from the graphite tube 21 by configuring the imaging unit 12 to obtain a reflection image of the tip of the nozzle 40 obtained by the reflecting mirror 14 . Therefore, since the imaging unit 12 can be provided at a greater distance from the graphite tube 21 which becomes high temperature during sample analysis, it is possible to protect the imaging unit 12 from overheating.

[Embodiment 3]

In the first embodiment, the configuration in which the front end of the nozzle 40 is imaged using one imaging unit 12 has been described, but it is also possible to use a plurality of imaging units 12 to image the front end of the nozzle 40 from a plurality of directions. camera structure.

FIG. 6 is a diagram showing a schematic configuration of an atomic absorption spectrophotometer 100 according to the third embodiment. FIG. 6 schematically shows configuration examples of the atomization unit 2 and the autosampler 4 .

The atomic absorption spectrophotometer 100 of Embodiment 3 differs from the atomic absorption spectrophotometer 100 of Embodiment 1 in that it includes a plurality of imaging units 12A, 12B. About other structures, since it is the same as Embodiment 1, description is not repeated. In addition, since the configurations of the imaging unit 12A and the imaging unit 12B are the same as those of the imaging unit 12 , description thereof will not be repeated.

Referring to FIG. 6 , imaging unit 12A and imaging unit 12B are arranged so as to include the tip of nozzle 40 in the imaging field of view. The imaging unit 12A and the imaging unit 12B are arranged so that the tip of the nozzle 40 and the hole 22 are included in the imaging field of view in a state where the tip of the nozzle 40 is located directly above the hole 22 .

However, the imaging unit 12A and the imaging unit 12B are arranged at different angles from each other. The front end of the nozzle 40 is imaged at a certain degree. In the example shown in FIG. 6 , the imaging unit 12A and the imaging unit 12B are arranged at a target position around the nozzle 40 . Both the imaging unit 12A and the imaging unit 12B are mounted on the arm 42 .

The imaging unit 12A and the imaging unit 12B respectively image the tip of the nozzle 40 to generate image data, and transmit the generated image data to the controller 15 . When the controller 15 receives the image data from the imaging unit 12A and the imaging unit 12B, it displays the two captured images on the display 16 .

The user can confirm the position of the tip of the nozzle 40 by referring to the two captured images displayed on the display 16 . Since the two captured images capture the tip of the nozzle 40 from different angles, the relative position of the tip of the nozzle 40 to the hole 22 is different. The user can confirm the position of the tip of the nozzle 40 based on the two relative positions respectively obtained from the two captured images.

As described in Embodiment 1, in order to accurately detect the relative position of the tip of the nozzle 40 with respect to the hole 22, it is ideal to arrange the imaging unit 12 close to the position directly above the hole 22, but there are constraints due to the arrangement of the imaging unit 12. , and it is difficult to bring the imaging unit 12 close to the position directly above the hole 22 . In this case, as shown in FIG. 6 , by providing a plurality of imaging units 12A, 12B, and setting images of the front end of the nozzle 40 from different angles, the position of the nozzle 40 can be detected from multiple directions. The relative position of the tip with respect to the hole 22 is obtained based on values derived from a plurality of detection results, and the relative position of the tip of the nozzle 40 with respect to the hole 22 is obtained. For example, the controller 15 can use a known image processing technique to synthesize multiple captured images obtained by the multiple imaging units 12A, 12B, thereby generating An image captured at the tip of the nozzle 40 is placed. Thereby, the user can detect the relative position of the tip of the nozzle 40 with respect to the hole 22 based on the synthetic image displayed on the display 16 . Therefore, in Embodiment 3, as in Embodiment 1, the user can operate the position adjustment mechanism 10 while confirming the relative position of the tip of the nozzle 40 with respect to the hole 22 so that the tip of the nozzle 40 is positioned at the position. The nozzle moving mechanism 41 is moved so that the position directly above the hole portion 22 is maintained.

In addition, the controller 15 can be configured to automatically adjust the position of the nozzle 40 by using a known image processing technique. Specifically, when the controller 15 acquires image data from the imaging unit 12A and the imaging unit 12B, the nozzle 40 viewed from the position directly above the hole portion 22 is generated by synthesizing these two types of image data. The front end and the image of the hole 22. The controller 15 acquires the relative position of the tip of the nozzle 40 and the hole 22 based on the generated image, and operates the position adjustment mechanism 10 so that the tip of the nozzle 40 is located at a preset reference position.

As described above, according to the atomic absorption spectrophotometer 100 of Embodiment 3, based on the captured images obtained by the plurality of imaging units 12A and 12B that respectively image the tip of the nozzle 40, it is possible to detect the relative position of the tip of the nozzle 40 relative to the graphite. The relative position of the hole portion 22 of the pipe 21. Therefore, the same effect as that of the atomic absorption spectrophotometer 100 of Embodiment 1 is exhibited.

In addition, according to the atomic absorption spectrophotometer 100 according to Embodiment 3, since the moving mechanism of the plurality of imaging sections 12A, 12B is shared with the nozzle moving mechanism 41, if the nozzle 40 is separated from the graphite tube 21, the number of imaging sections 12A, imaging sections 12A, and imaging section 12A can be increased. The distance between the portion 12B and the graphite tube 21. Thereby, with a simple structure, it is possible to make an image The unit 12A and the imaging unit 12B are evacuated from the graphite tube 21 which becomes high temperature during sample analysis, and the imaging unit 12A and the imaging unit 12B are protected from overheating.

Furthermore, in Embodiment 3, by mounting the imaging unit 12A and the imaging unit 12B on the arm 42, the imaging unit 12A and the imaging unit 12B are moved by the rotation of the arm 42, but an atomic absorption light may also be used. The spectrophotometer 100 also includes a structure of a moving mechanism of the imaging unit 12A and the imaging unit 12B. In this case, the moving mechanism of the imaging unit 12A and the imaging unit 12B is configured such that the first position close to the hole 22 and capable of including the tip of the nozzle 40 in the imaging field of view is farther away from the graphite than the first position. Between the second positions of the tube 21, the imaging unit 12A and the imaging unit 12B are moved.

Furthermore, according to the atomic absorption spectrophotometer 100 according to Embodiment 3, by synthesizing a plurality of captured images to generate an image of the tip of the nozzle 40 and the hole 22 viewed from a position directly above the hole 22, it is convenient to Even when the arrangement of the imaging unit is restricted, it is possible to detect the relative position of the tip of the nozzle 40 with respect to the hole 22 .

In addition, in the example of FIG. 6, the structure which provided two imaging parts 12A, 12B was demonstrated, but the number of imaging parts is not limited to this, The structure which provided three or more imaging parts is also possible.

[Embodiment 4]

FIG. 7 is a diagram showing a schematic configuration of an atomic absorption spectrophotometer 100 according to Embodiment 4. FIG. FIG. 7 schematically shows configuration examples of the atomization unit 2 and the autosampler 4 .

The atomic absorption spectrophotometer 100 of Embodiment 4 is different from that of Embodiment 1 Compared with the atomic absorption spectrophotometer 100 , it is different in that it includes a plurality of imaging units 12A, 12B and a plurality of mirrors 14A, 14B. About other structures, since it is the same as Embodiment 1, description is not repeated. In addition, since the configurations of the imaging unit 12A and the imaging unit 12B are the same as those of the imaging unit 12 , description thereof will not be repeated.

Referring to FIG. 7 , atomic absorption spectrophotometer 100 according to Embodiment 4 includes: mirror 14A, mirror 14B, and imaging unit 12A, imaging unit 12B as a structure for detecting the positional relationship of nozzle 40 relative to hole 22 . The reflecting mirror 14A and the reflecting mirror 14B are provided at positions where they can reflect an image including the tip of the nozzle 40 . As shown in FIG. 7 , reflecting mirror 14A and reflecting mirror 14B are arranged so that the tip of nozzle 40 and hole 22 are included in the image when nozzle 40 is located directly above hole 22 . However, the reflection mirror 14A and the reflection mirror 14B are disposed so as to reflect an image including the tip of the nozzle 40 at angles different from each other. In the example of FIG. 7 , both the mirror 14A and the mirror 14B are mounted on the arm 42 .

The imaging unit 12A is installed at a position where an image reflected by the mirror 14A can be obtained. The imaging unit 12B is installed at a position where an image reflected by the mirror 14B can be obtained. As shown in FIG. 7 , when the nozzle 40 is moved to a position directly above the hole 22 , the reflection mirror 14A and the reflection mirror 14B respectively form an image including the tip of the nozzle 40 and the hole 22 . The imaging part 12A can detect the positional relationship of the nozzle 40 with respect to the hole part 22 by acquiring the image reflected by the reflection mirror 14A. The imaging part 12B can detect the positional relationship of the nozzle 40 with respect to the hole part 22 by acquiring the image reflected by the reflection mirror 14B.

The imaging unit 12A and the imaging unit 12B image the tip of the nozzle 40 to An image material is generated, and the generated image material is sent to the controller 15 . When the controller 15 receives the image data from the imaging unit 12A and the imaging unit 12B, it displays the two captured images on the display 16 .

The user can confirm the position of the tip of the nozzle 40 by referring to the two captured images displayed on the display 16 . Since the two captured images capture the tip of the nozzle 40 from different angles, the positional relationship of the tip of the nozzle 40 with respect to the hole 22 is different. The user can confirm the position of the tip of the nozzle 40 based on the two positional relationships obtained from the two captured images.

When it is difficult to bring the imaging unit 12 close to the position directly above the hole 22, it is possible to set the nozzle 40 from different angles by using the plurality of mirrors 14A, 14B and the plurality of imaging units 12A, 12B in combination. The structure in which the front end is photographed detects the positional relationship of the front end of the nozzle 40 relative to the hole 22 from multiple directions, and based on a value (for example, an average value) calculated based on a plurality of detection results, the positional relationship of the front end of the nozzle 40 relative to the hole portion 22 is obtained. The positional relationship of the hole portion 22 . Therefore, in Embodiment 4, as in Embodiment 1, the user can position the nozzle 40 in the hole by actuating the position adjustment mechanism 10 while confirming the positional relationship of the tip of the nozzle 40 with respect to the hole 22 . 22, the nozzle moving mechanism 41 is moved.

In addition, the controller 15 can be configured to automatically adjust the position of the nozzle 40 by using a known image processing technique. Specifically, when the controller 15 acquires image data from the imaging unit 12A and the imaging unit 12B, the tip of the nozzle 40 and the hole 22 are selected using an image processing technique for each image data. The controller 15 acquires the position relationship between the tip of the nozzle 40 and the hole 22 based on a plurality of selection results. The position adjustment mechanism 10 is operated so that the tip of the nozzle 40 is located at a preset reference position.

As described above, according to the atomic absorption spectrophotometer 100 of Embodiment 4, it is possible to detect the relative position of the tip of the nozzle 40 relative to the graphite tube 21 based on the captured images obtained by a plurality of imaging units that respectively image the tip of the nozzle 40 . The relative position of the hole 22. Therefore, the same effect as that of the atomic absorption spectrophotometer 100 of Embodiment 1 is exhibited.

Furthermore, according to the atomic absorption spectrophotometer 100 according to Embodiment 4, by configuring the plurality of imaging units 12A, 12B to acquire the reflected images of the tip of the nozzle 40 obtained by the plurality of mirrors 14A, 14B, respectively, the The plurality of imaging units 12A, 12B are provided away from the graphite tube 21 . Therefore, since the imaging unit 12A and the imaging unit 12B can be provided at a greater distance from the graphite tube 21 which becomes high temperature during sample analysis, it is possible to protect the imaging unit 12A and the imaging unit 12B from overheating.

In addition, in the example of FIG. 7, the configuration of setting two mirrors 14A, 14B and two imaging units 12A, 12B has been described, but the number of mirrors and imaging units is not limited thereto, and may also be A structure in which three or more mirrors and three or more imaging units are installed.

[form]

According to the understanding of those skilled in the art, the exemplary embodiments described above are specific examples of the following forms.

(Item 1) An atomic absorption spectrophotometer comprising: an atomization unit, a nozzle, a nozzle moving mechanism, a position adjustment mechanism, at least one imaging unit, and monitor. The atomization unit includes a furnace in which a hole for sample injection is formed, and atomizes the sample injected into the furnace by heating. The nozzle sucks and ejects the sample. The nozzle moving mechanism moves the nozzle to a position directly above the hole. The position adjusting mechanism is configured to be able to adjust the relative position of the tip of the nozzle with respect to the hole by moving the nozzle moving mechanism. At least one imaging unit is arranged so that the tip of the nozzle and the hole are included in the imaging field of view in a state where the tip of the nozzle is located directly above the hole. The display displays captured images obtained by at least one imaging unit.

According to the atomic absorption spectrophotometer described in item 1, the relative position of the tip of the nozzle with respect to the hole of the furnace can be detected by using at least one imaging unit that takes an image of the tip of the nozzle, so that the nozzle can be adjusted relative to the hole. The relative position adjustment becomes easy. Thereby, the efficiency of analysis work can be improved, and the accuracy of position adjustment of the nozzle can be improved.

(Item 2) The atomic absorption spectrophotometer described in Item 1 further includes: a moving mechanism for moving at least one imaging unit to a first position close to the position directly above the hole, compared with the first position while moving between a second location away from the furnace.

According to the atomic absorption spectrophotometer described in item 2, after the position adjustment of the nozzle is completed, the distance between the furnace and each imaging unit can be increased by the moving mechanism. Thereby, at least one imaging part can be avoided from the furnace which becomes high temperature at the time of analysis of a sample, and at least one imaging part can be protected from overheating.

(Item 3) In the atomic absorption spectrophotometer according to Item 2, the nozzle moving mechanism is configured to be able to move the nozzle between a position directly above the hole and a position directly above the container containing the sample. Camera moving mechanism and nozzle moving mechanism shared.

According to the atomic absorption spectrophotometer described in item 3, since the nozzle moving mechanism is shared with the moving mechanism of at least one imaging unit, the distance between each imaging unit and the furnace can be increased by keeping the nozzle away from the furnace. Therefore, there is no need for a moving mechanism for the imaging unit. Thereby, with a simple structure, at least one imaging unit can be withdrawn from a furnace which becomes high temperature during sample analysis.

(Item 4) In the atomic absorption spectrophotometer according to Item 3, the nozzle moving mechanism includes: an arm supporting the nozzle. The nozzle moving mechanism is configured to be able to move the nozzle between a position directly above the hole and a position directly above the container containing the sample by moving the arm. At least one imaging unit is mounted on the arm.

According to the atomic absorption spectrophotometer described in item 4, the distance between each imaging unit and the furnace can be increased by moving the arm to move the nozzle from a position directly above the hole. Therefore, with a simple structure, at least one imaging unit can be withdrawn from a furnace that becomes high temperature during sample analysis.

(Item 5) The atomic absorption spectrophotometer described in Item 1 further includes: at least one mirror. At least one mirror forms a reflected image of the tip of the nozzle. At least one imaging unit is provided corresponding to the at least one reflecting mirror, and obtains a reflection image of the corresponding reflecting mirror.

According to the atomic absorption spectrophotometer described in item 5, since at least one imaging unit can use at least one mirror to image the tip of the nozzle, it is possible to detect the tip of the nozzle based on the captured image obtained by the at least one imaging unit. The relative position of the hole with respect to the furnace. Therefore, it is possible to make the nozzle relative to the hole relatively The adjustment of the position becomes easy. In addition, at least one imaging unit can be installed at a distance from the furnace by setting at least one imaging unit to obtain a reflection image of the tip of the nozzle by at least one reflecting mirror, respectively. Therefore, since at least one imaging unit can be installed at a distance from a furnace that becomes high in temperature during sample analysis, it is possible to protect each imaging unit from overheating.

(Item 6) In the atomic absorption spectrophotometer according to Item 5, the nozzle moving mechanism includes: an arm supporting the nozzle. The nozzle moving mechanism is configured to be able to move the nozzle between a position directly above the hole and a position directly above the container containing the sample by moving the arm. At least one mirror is mounted on the arm.

According to the atomic absorption spectrophotometer described in item 6, the distance between each mirror and the furnace can be increased by moving the arm to move the nozzle from the position directly above the hole. Therefore, with a simple structure, at least one reflecting mirror can be withdrawn from the furnace which becomes high temperature during sample analysis.

(Item 7) The atomic absorption spectrophotometer described in Items 1 to 6 further includes: a controller. The controller detects a relative position of the tip of the nozzle with respect to the hole based on a captured image obtained by at least one imaging unit. The controller activates the position adjustment mechanism according to the detected displacement of the relative position from the reference position.

According to the atomic absorption spectrophotometer described in item 7, since the position adjustment operation of the nozzle by the user is unnecessary, the analysis efficiency can be further improved.

In addition, with regard to the first to fourth embodiments and modified examples, it is predetermined from the beginning of the application, including combinations not mentioned in the specification, and within the range that does not cause disadvantages or contradictions, the above-mentioned embodiments are combined. Instructions are properly structured combination.

It should be considered that the embodiment disclosed this time is an illustration in all points and is not restrictive. The scope of the present invention is shown not by the above description but by the patent claims, and it is intended that the meanings equivalent to the patent claims and all changes within the scope are included.

2: Atomization Department

10: Position adjustment mechanism

12: Camera Department

15: Controller

16: Display

18:Operation Department

21: graphite tube

22, 25: Hole

23, 24: electrode

26: window panel

40: Nozzle

41: Nozzle moving mechanism

42: arm

43:Rotary axis

44: motor

X, Y, Z: axes

Claims (3)

An atomic absorption spectrophotometer, characterized by comprising: an atomization part, including: a furnace formed with a hole for sample injection, and atomizing the sample injected into the furnace by heating; a nozzle for sucking and ejecting a sample; a nozzle moving mechanism for moving the nozzle to a position directly above the hole; a position adjustment mechanism for adjusting the The relative position of the front end of the nozzle with respect to the hole; at least one imaging unit is arranged so as to include the front end of the nozzle and the hole in the imaging field of view; Take an image; and at least one mirror, forming a reflection image of the front end of the nozzle; and the at least one imaging unit is respectively set corresponding to the at least one mirror, and obtains the reflection of the corresponding mirror picture. The atomic absorption spectrophotometer according to claim 1, wherein the nozzle moving mechanism includes an arm supporting the nozzle, and the nozzle moving mechanism is configured to be able to move the nozzle by rotating the arm. The nozzle moves between a position directly above the hole and a position directly above the container containing the sample, and the at least one mirror is mounted on the arm. The atomic absorption spectrophotometer as described in claim 1 or claim 2, further comprising: a controller, The controller detects a relative position of the tip of the nozzle with respect to the hole based on the captured image obtained by the at least one imaging unit, and based on a relative position of the detected relative position relative to a reference position, offset, so that the position adjustment mechanism works.

Images