TW202124939A - Atomic Absorption Spectrophotometer - Google Patents

Abstract

This atomic absorption spectrophotometer comprises an atomization unit, a nozzle, a nozzle movement mechanism, a position adjustment mechanism, at least one imaging unit, and a display. The atomization unit comprises a furnace having a hole part for sample insertion formed therein and atomizes a sample that has been introduced inside the furnace by heating the sample. The nozzle draws in and discharges the sample. The nozzle movement mechanism moves the nozzle to a position directly above the hole part. The position adjustment mechanism is capable of adjusting the relative position of the distal end of the nozzle in relation to the hole part by moving the nozzle movement mechanism. The at least one imaging unit is disposed such that when the distal end of the nozzle is positioned directly above the hole part, the distal end of the nozzle and the hole part are included in an imaging field of view. The display displays an image captured by the at least one imaging unit.

Description

Atomic Absorption Spectrophotometer

The present invention relates to an atomic absorption spectrophotometer.

Japanese Patent Publication No. 61-190856 (Patent Document 1) discloses an automatic sample injection device used in a furnace-type atomic absorption spectrophotometer. The automatic sample injection device described in Patent Document 1 includes an injection mechanism. The injection mechanism is configured to pass through a small diameter hole (sample injection hole) formed on the side surface of a cylindrical graphite tube to inject a liquid sample into the tube. Specifically, the arm of the injection mechanism holds the nozzle at the front end and is fixed to the arm rotation shaft. The injection mechanism moves the nozzle from a position directly above the container containing the sample to directly above the hole by the rotational movement of the arm rotation shaft, and then stops the rotation of the arm. Then, the injection mechanism lowers the arm, inserts the tip of the nozzle into the hole, and injects the sample into the tube from the nozzle.

[Prior Art Literature] [Patent Literature] [Patent Document 1] Japanese Patent Publication No. 61-190856

[The problem to be solved by the invention] However, in order to use the automatic sample injection device to inject a sample into the graphite tube, it is necessary to adjust the nozzle relative to the graphite tube in advance by moving the nozzle to a position directly above the hole of the graphite tube by the rotation of the arm. The relative position of the hole.

Previously, this position adjustment was performed by the user visually confirming the position of the hole, and moving the injection mechanism in the horizontal direction so that the tip of the nozzle was located directly above the hole.

However, the diameter of the hole is as small as about 1 mm to 2 mm. Therefore, it takes time and labor to confirm the position of the hole by the user's visual observation. As a result, the adjustment of the nozzle position is not necessarily an easy task. Therefore, there is a problem that it takes a long time to prepare for analysis, which reduces the efficiency of analysis work. In addition, in the position adjustment performed by the user's visual observation, there may be a case where a deviation from the position directly above the hole portion remains, and the accuracy of the position adjustment may be unstable.

The present invention was formed to solve the above-mentioned problems, and its purpose is to facilitate the position adjustment of the nozzle in an atomic absorption spectrophotometer and to improve the accuracy of the position adjustment.

[Means to solve the problem] The atomic absorption spectrophotometer of the first aspect of the present invention includes an atomization section, a nozzle, a nozzle moving mechanism, a position adjustment mechanism, at least one imaging section, and a display. The atomization part includes a furnace in which a hole for sample injection is formed, and the sample injected into the furnace is atomized by heating. The nozzle sucks and ejects the sample. The nozzle moving mechanism moves the nozzle to a position directly above the hole. The position adjustment mechanism is configured to be able to adjust the relative position of the tip of the nozzle with respect to the hole by moving the nozzle moving mechanism. At least one imaging unit is arranged so that the tip of the nozzle and the hole are included in the imaging field of view in a state where the tip of the nozzle is located directly above the hole. The display displays the captured images obtained by at least one imaging section.

[Effects of the invention] According to the present invention, in the atomic absorption spectrophotometer, the position adjustment of the nozzle can be made easy, and the accuracy of the position adjustment can be improved.

Hereinafter, the embodiments of the present disclosure will be described in detail with reference to the drawings. In addition, the same or equivalent parts in the drawings are marked with the same symbols, and the description is not repeated in principle.

[Embodiment 1] FIG. 1 is a diagram showing a schematic configuration of the atomic absorption spectrophotometer of the first embodiment. The atomic absorption spectrophotometer 100 of the first embodiment is a furnace-type atomic absorption spectrophotometer. In the furnace-type atomic absorption spectrophotometer, a sample is stored in a graphite tube, and the tube is heated to heat the sample to be atomized. The light is passed through atomic vapor to measure the absorbance.

1, the atomic absorption spectrophotometer 100 includes: a light source 1, an atomization unit 2, a spectroscope 3, an autosampler 4, a detector 5, a heater 6, a driver 8, a position adjustment mechanism 10, an imaging unit 12, and Controller 15.

The light source 1 includes a lamp that emits light of a wavelength inherent to the element. The lamp is, for example, a hollow cathode lamp. The hollow cathode lamp emits light that contains the bright line spectrum.

The atomization section 2 includes a cylindrical graphite tube 21 and is configured to heat and atomize the liquid sample injected into the graphite tube 21. The graphite tube 21 corresponds to an example of the "furnace". On the side surface of the graphite tube 21, a hole 22 (sample injection hole) for sample injection is formed. The hole 22 has a circular shape with a diameter of about 1 mm to 2 mm.

The automatic sampler 4 is configured to automatically perform the following actions: the nozzle 40 is used to aspirate the sample from a sample container (not shown) containing the sample, and to inject the test sample into the hole 22 of the graphite tube 21 of the atomization section 2. Sample. Specifically, the autosampler 4 includes a cylindrical nozzle 40 and a nozzle moving mechanism 41. The nozzle 40 is connected to the tip portion of the sampling flow channel not shown, and sucks and ejects the liquid. The sampling flow path is formed by, for example, a flexible tube, and a syringe pump for causing a pumping action is connected to the side opposite to the nozzle 40. With this operation of the syringe pump, the nozzle 40 can be used to suck and eject the liquid.

The nozzle moving mechanism 41 includes an arm 42, a rotating shaft 43, and a motor 44. The arm 42 supports the nozzle 40. The arm 42 is configured to rotate around the rotating shaft 43 by the motor 44 and to move up and down along the rotating shaft 43. The driver 8 is connected to the motor 44 and drives the motor 44 according to a control command from the controller 15. By the rotation of the arm 42 of the motor 44, the nozzle 40 can be moved between a position directly above the sample container (not shown) and a position directly above the hole 22 of the graphite tube 21.

The position adjustment mechanism 10 is configured to be able to adjust the relative position of the nozzle 40 and the graphite tube 21 by moving the nozzle moving mechanism 41 (the arm 42, the rotating shaft 43, and the motor 44). The position adjustment mechanism 10 includes, for example, an XY stage, and can move the nozzle moving mechanism 41 to two axes (X-axis and Y-axis) parallel to the optical axis of the light source 1.

The heater 6 heats the graphite tube 21 by passing current through the graphite tube 21. When the sample in the graphite tube 21 is heated, the elements in the sample are atomized.

The beam splitter 3 includes: an entrance slit 31, an exit slit 32, a reflecting mirror 33, a reflecting mirror 34, and a diffraction grating 35. As shown in FIG. 1, the light emitted from the light source 1 passes through the graphite tube 21 and is introduced into the spectroscope 3. When the light introduced into the beam splitter 3 passes through the slit opening of the entrance slit 31, it enters the diffraction grating 35 via the reflecting mirror 33. By rotating the diffraction grating 35, light of a specific wavelength selectively passes through the slit opening of the exit slit 32 through the reflector 34. The light of the specific wavelength passing through the exit slit 32 reaches the detector 5. If the detector 5 receives light of a specific wavelength from the spectroscope 3, it outputs an electrical signal corresponding to the intensity of the received light to the controller 15.

In addition, although the illustration is omitted, between the light source 1 and the atomization section 2, and between the atomization section 2 and the beam splitter 3, appropriate condensing optical systems are respectively arranged to appropriately condense the light. And import into the next paragraph.

The controller 15 controls the entire atomic absorption spectrophotometer 100. The controller 15 includes a processor 150, a memory 152, an input/output interface (I/F) 154, and a communication interface (I/F) 156 as main components. These parts are connected in such a way that they can communicate with each other via a bus that is not shown in the figure.

The processor 150 is typically an arithmetic processing unit such as a central processing unit (CPU) or a micro processing unit (MPU). The processor 150 controls the operation of each part of the atomic absorption spectrophotometer 100 by reading and executing the program stored in the memory 152. Specifically, the processor 150 executes the program to realize each process of the atomic absorption spectrophotometer 100 described later. In addition, in the example of FIG. 1, although a single processor is illustrated, the controller 15 may also be configured to include a plurality of processors.

The memory 152 is implemented by non-volatile memory such as random access memory (RAM), read only memory (ROM), and flash memory. The memory 152 stores programs executed by the processor 150 or data used by the processor 150.

The input/output I/F 154 is an interface for exchanging various data between the processor 150 and the light source 1, the detector 5, the heater 6, the driver 8, and the position adjustment mechanism 10.

The communication I/F 156 is an interface for exchanging various data between the atomic absorption spectrophotometer 100 and other devices, and is realized by an adapter or a connector. In addition, the communication method may be a wireless communication method such as a wireless local area network (Local Area Network, LAN), or a wired communication method using a universal serial bus (USB) or the like.

A display 16 and an operation unit 18 are connected to the controller 15. The display 16 includes a liquid crystal panel and the like. The operation unit 18 receives the user's operation input to the atomic absorption spectrophotometer 100. The operation unit 18 typically includes a touch panel, a keyboard, a mouse, and the like.

In the atomic absorption spectrophotometer 100, in the quantitative analysis of the sample, after the sample is injected into the graphite tube 21 by the automatic sampler 4, a current flows from the heater 6 to the graphite tube 21, thereby reducing the graphite tube 21 Heat to high temperature (for example, about 3000°C). Thereby, the sample is dried and ashed in the graphite tube 21, and further, the elements in the sample are atomized. When the light emitted from the light source 1 passes through the graphite tube 21, the light of the wavelength peculiar to the element contained in the sample is strongly absorbed. The light passing through the graphite tube 21 is wavelength-dispersed by the spectroscope 3, and light having a wavelength unique to the target element is selected and introduced to the detector 5. The controller 15 can calculate the absorbance based on the difference in the light received by the detector 5 caused by the presence or absence of the sample, and can quantitatively analyze the sample based on the calculated absorbance.

In the atomic absorption spectrophotometer 100, before the actual sample analysis, the position of the nozzle 40 of the autosampler 4 with respect to the hole 22 (sample injection hole) of the graphite tube 21 is adjusted. This position adjustment is performed before the analysis of the sample when the nozzle 40 and/or the graphite tube 21 have been replaced. Hereinafter, the position adjustment of the nozzle 40 will be described.

2 and 3 are schematic diagrams showing structural examples of the atomization unit 2 and the autosampler 4 shown in FIG. 1. The cross section of the atomization part 2 is schematically shown in FIG. 2. A schematic plan configuration of the autosampler 4 is shown in FIG. 3.

2, the atomization part 2 includes a graphite tube 21, an electrode 23, an electrode 24, and a window plate 26. The electrodes 23 and 24 hold both ends of the cylindrical graphite tube 21. The window plate 26 includes a transparent quartz plate, and is provided at both ends in the optical axis direction with the graphite tube 21 sandwiched therebetween.

The electrode 23 on the side surface of the upper side of the graphite tube 21 is formed with a hole 25 having a circular shape. The hole portion 25 is arranged at a position overlapping with the hole portion 22 formed in the graphite tube 21. The diameter of the hole 25 is greater than or equal to the diameter of the hole 22. In addition, in order to allow the nozzle 40 to be inserted into the graphite tube 21, the diameter of the hole portion 22 and the hole portion 25 is larger than the outer diameter of the nozzle 40.

Referring to FIG. 3, the autosampler 4 not only includes a nozzle moving mechanism 41 (an arm 42, a rotating shaft 43, and a motor 44 ), but also includes a turntable 9. The turntable 9 includes a circular platform 92 and a motor 90 for rotating the platform 92. On the platform 92, there are placed containers 94a, 94b, 94c, ... etc. including sample containers in which liquid samples are stored. In addition, there are cases in which containers include empty containers, containers containing standard solutions for calibration curve preparation, and containers containing dilution series.

By using the motor 90 to rotate the platform 92, the selected container moves to the working position P. By using the motor 44 to rotate the arm 42 to move the nozzle 40 to the working position P, the nozzle 40 can be used to suck and eject the liquid from the container moved to the working position P.

In the quantitative analysis of the sample, after the nozzle 40 is moved to the working position P and the sample is sucked from the sample container, the nozzle 40 is moved to the front of the hole 22 of the graphite tube 21 by the rotation of the arm 42 The upper position. At this position, the nozzle 40 is lowered, the tip of the nozzle 40 is inserted into the hole 22, and the sample is ejected from the nozzle 40. After the sample is ejected, the nozzle 40 is returned to the working position P by rotating the arm 42 again. Thereby, a sample is injected into the graphite tube 21, and atomic absorption analysis is performed.

In addition, when a plurality of samples are continuously analyzed, the same operation is repeated for the next sample container. Furthermore, immediately before the continuous analysis, in the middle of the continuous analysis, or immediately after the continuous analysis, the process of washing the nozzle 40 with the washing liquid can be performed.

In order to use the automatic sampler 4 to inject the sample, it is necessary to adjust the nozzle 40 relative to the hole in advance by moving the nozzle 40 to the position directly above the hole 22 of the graphite tube 21 by the rotation of the arm 42 The relative position of section 22. Previously, this position adjustment was performed by the user visually confirming the position of the hole 22 of the graphite tube 21, and the position adjustment mechanism 10 was operated so that the tip of the nozzle 40 was directly above the hole 22, and the nozzle moving mechanism 41 moves in the directions of two axes (X-axis, Y-axis) parallel to the optical axis.

However, since the diameter of the hole portion 22 is as small as about 1 mm to 2 mm, it takes time and effort to capture the position of the hole portion 22 by the user's visual observation. As a result, the position adjustment of the nozzle 40 is not necessarily an easy task. Therefore, there is a problem that it takes a long time to prepare for analysis, which reduces the efficiency of the analysis operation. In addition, in the position adjustment by the user's visual observation, there may be a case where an offset with respect to the position directly above the hole 22 remains, and the accuracy of the position adjustment may be unstable.

Therefore, the atomic absorption spectrophotometer 100 of the first embodiment includes an imaging unit 12 as a structure for detecting the relative position of the nozzle 40 with respect to the hole 22. The imaging unit 12 is provided so as to include the tip of the nozzle 40 in the imaging range (imaging field of view). Specifically, the imaging unit 12 is installed so that its focus position is located at the tip of the nozzle 40. As shown in FIG. 2, the imaging unit 12 is arranged so that the tip of the nozzle 40 and the hole 22 are included in the imaging field of view in a state where the tip of the nozzle 40 is located directly above the hole 22.

Here, in order to accurately detect the relative position of the tip of the nozzle 40 with respect to the hole 22, it is desirable to arrange the imaging section 12 as close as possible to the position directly above the hole 22. Therefore, the imaging unit 12 is arranged close to a position directly above the tip of the nozzle 40. In the example of FIG. 2, the imaging unit 12 is mounted on the portion of the arm 42 that is close to the position immediately above the tip of the nozzle 40. With this, in a state where the tip of the nozzle 40 is located directly above the hole 22, the imaging unit 12 can be arranged close to the position directly above the hole 22.

The imaging unit 12 includes an optical system such as a lens, and an imaging element. The imaging element is realized by, for example, a Charge Coupled Device (CCD) sensor, a Complementary Metal Oxide Semiconductor (CMOS) sensor, or the like. The imaging element generates a captured image by converting the light incident through the optical system into an electrical signal. The imaging unit 12 images the tip of the nozzle 40 to generate image data, and sends the generated image data to the controller 15.

When the controller 15 receives image data from the imaging unit 12, it displays the captured image on the display 16. Thereby, the user can confirm the position of the tip of the nozzle 40 by referring to the captured image displayed on the display 16. Therefore, the user can confirm the relative position of the tip of the nozzle 40 with respect to the hole 22 while operating the position adjustment mechanism 10 to move the nozzle so that the tip of the nozzle 40 is located directly above the hole 22 The mechanism 41 moves. Thereby, compared with the conventional position adjustment by visual observation, the position adjustment operation of the nozzle 40 becomes easy. As a result, the efficiency of the analysis work can be improved, and the accuracy of the position adjustment of the nozzle 40 can be improved.

In addition, the controller 15 can be configured to automatically adjust the position of the nozzle 40 by using a well-known image processing technique. Specifically, if the controller 15 obtains image data from the imaging unit 12, it uses image processing technology to select the tip of the nozzle 40 and the hole 22 from the image data, thereby obtaining the tip of the nozzle 40 and the hole. The positional relationship of the section 22. The controller 15 operates the position adjustment mechanism 10 so that the tip of the nozzle 40 is located at a predetermined reference position. This reference position can be set based on the relative position of the tip of the nozzle 40 and the hole 22 in a state where the nozzle 40 is located directly above the hole 22. Thereby, since the position adjustment work by the user is not required, the analysis efficiency can be further improved.

FIG. 4 is a flowchart for explaining the processing procedure of the position adjustment of the nozzle 40 by the controller 15.

Referring to FIG. 4, first, according to step S01, the controller 15 rotates the arm 42 of the nozzle moving mechanism 41 to install the nozzle 40 on the upper portion of the hole 22 of the graphite tube 21.

Next, the controller 15 uses the imaging unit 12 to image the tip of the nozzle 40 in accordance with step S02. In step S03, the controller 15 selects the tip of the nozzle 40 and the hole 22 by performing known image processing on the image data obtained by the imaging by the imaging unit 12. The controller 15 detects the relative position of the tip of the nozzle 40 with respect to the hole 22 based on the selection result.

The controller 15 calculates the offset amount of the position of the tip of the nozzle 40 from the reference position based on the detected relative position of the hole 22 and the tip of the nozzle 40 according to step S04.

The controller 15 proceeds to step S05, and by operating the position adjustment mechanism 10, the relative position of the nozzle 40 with respect to the hole 22 is adjusted based on the offset calculated in step S04. The position adjustment mechanism 10 moves the nozzle moving mechanism 41 in a direction in which the offset amount is reduced. If the offset amount becomes less than or equal to the predetermined value by the adjustment in step S05, the controller 15 fixes the nozzle 40 at this position according to step S06, and ends the position adjustment.

As described above, according to the atomic absorption spectrophotometer 100 of the first embodiment, it is possible to detect the relative position of the tip of the nozzle 40 with respect to the hole 22 of the graphite tube 21 by using the imaging unit 12 that images the tip of the nozzle 40. Therefore, the adjustment of the relative position of the nozzle 40 with respect to the hole 22 can be made easy. Thereby, the efficiency of the analysis work can be improved, and the accuracy of the position adjustment of the nozzle 40 can be improved.

Furthermore, in the first embodiment, by mounting the imaging unit 12 on the arm 42, when the arm 42 is rotated to move the nozzle 40 to the working position P, together with the nozzle 40, the imaging unit 12 also moves away from the graphite tube 21 and moves toward The turntable 9 moves sideways. That is, the nozzle moving mechanism 41 may also function as a moving mechanism of the imaging unit 12.

When the imaging unit 12 is installed close to the position directly above the hole 22, if the graphite tube 21 is heated to become a high temperature, the imaging unit 12 may be overheated and damaged. Therefore, when the position adjustment of the nozzle 40 is completed, a moving mechanism for moving the imaging unit 12 away from the graphite tube 21 is required. In the atomic absorption spectrophotometer 100 of the first embodiment, by sharing the nozzle moving mechanism 41 and the moving mechanism of the imaging unit 12, if the nozzle 40 is separated from the graphite tube 21 as described above, the imaging unit 12 and graphite can be increased. The distance between the tubes 21. Therefore, the moving mechanism of the imaging unit 12 is not required. Thereby, with a simple structure, the imaging part 12 can be withdrawn from the graphite tube 21 which becomes a high temperature at the time of sample analysis, and the imaging part 12 can be protected from overheating.

In addition, in Embodiment 1, the imaging unit 12 is mounted on the arm 42 and the imaging unit 12 is moved by the rotation of the arm 42. Alternatively, the atomic absorption spectrophotometer 100 may additionally include the imaging unit 12. The structure of the mobile mechanism. In this case, the moving mechanism of the imaging unit 12 is configured to be able to approach the position immediately above the hole 22 and include the tip of the nozzle 40 and the first position of the hole 22 in the imaging field of view, compared to the first position. The imaging unit 12 is moved between the second position away from the graphite tube 21.

[Embodiment 2] In the first embodiment described above, the configuration in which the imaging unit 12 that takes an image of the tip of the nozzle 40 is mounted on the arm 42 has been exemplified. In the second embodiment, a configuration in which the imaging unit 12 and a mirror are used in combination to image the tip of the nozzle 40 will be described.

FIG. 5 is a diagram showing a schematic configuration of the atomic absorption spectrophotometer 100 of the second embodiment. FIG. 5 schematically shows a configuration example of the atomization unit 2 and the auto sampler 4.

Compared with the atomic absorption spectrophotometer 100 of the first embodiment, the atomic absorption spectrophotometer 100 of the second embodiment is different in that it further includes a mirror 14. The other structure is the same as that of the first embodiment and the description will not be repeated.

5, the atomic absorption spectrophotometer 100 of the second embodiment includes a mirror 14 and an imaging unit 12 as a structure for detecting the relative position of the nozzle 40 with respect to the hole 22. The reflecting mirror 14 is provided at a position where the image including the tip of the nozzle 40 can be reflected. As shown in FIG. 5, in the state where the nozzle 40 is located directly above the hole part 22, the mirror 14 is arrange|positioned so that the tip of the nozzle 40 and the hole part 22 may be included in a reflected image.

The reflecting mirror 14 is arranged close to a position directly above the tip of the nozzle 40. In the example of FIG. 5, the mirror 14 is mounted on a portion of the arm 42 that is close to the position immediately above the tip of the nozzle 40. With this, in a state where the tip of the nozzle 40 is located directly above the hole 22, the mirror 14 can be arranged close to the position directly above the hole 22.

The imaging unit 12 is provided at a position where the reflected image of the tip of the nozzle 40 by the mirror 14 can be obtained. As shown in FIG. 5, when the nozzle 40 is moved to a position directly above the hole 22, a reflection image including the tip of the nozzle 40 and the hole 22 is formed in the reflecting mirror 14. The imaging unit 12 can detect the relative position of the nozzle 40 with respect to the hole 22 by acquiring the reflected image of the mirror 14.

The imaging unit 12 generates image data of the tip of the nozzle 40 based on the reflected image, and sends the generated image data to the controller 15. The controller 15 displays the captured image obtained by the imaging unit 12 on the display 16. Thereby, the user can confirm the position of the tip of the nozzle 40 by referring to the captured image displayed on the display 16. Therefore, as in the first embodiment, the user can confirm the relative position of the tip of the nozzle 40 with respect to the hole 22 while operating the position adjustment mechanism 10 so that the tip of the nozzle 40 is positioned directly above the hole 22. , The nozzle moving mechanism 41 is moved.

Alternatively, the controller 15 can obtain the relative position of the tip of the nozzle 40 and the hole 22 by performing known image processing on the image data obtained by the imaging unit 12. Therefore, the controller 15 can automatically adjust the position of the tip of the nozzle 40 with respect to the hole 22 based on the acquired relative position.

As described above, according to the atomic absorption spectrophotometer 100 of the second embodiment, the imaging unit 12 can use the mirror 14 to image the tip of the nozzle 40, so the user can detect from the captured image obtained by the imaging unit 12 The relative position of the tip of the nozzle 40 with respect to the hole 22 of the graphite tube 21. Therefore, the same effect as the atomic absorption spectrophotometer 100 of Embodiment 1 can be obtained.

Furthermore, according to the atomic absorption spectrophotometer 100 of the second embodiment, by setting the imaging unit 12 to obtain a reflection image of the tip of the nozzle 40 by the reflecting mirror 14, the imaging unit 12 can be installed away from the graphite tube 21. Therefore, it is possible to increase the distance from the graphite tube 21 that becomes a high temperature during sample analysis to install the imaging section 12, and therefore it is possible to protect the imaging section 12 from overheating.

[Embodiment 3] In the above-mentioned first embodiment, the configuration in which one imaging unit 12 is used to image the tip of the nozzle 40 has been described, but a plurality of imaging units 12 may be used to perform imaging of the tip of the nozzle 40 from multiple directions. The structure of the camera.

FIG. 6 is a diagram showing a schematic configuration of the atomic absorption spectrophotometer 100 of the third embodiment. FIG. 6 schematically shows a configuration example of the atomization unit 2 and the auto sampler 4.

Compared with the atomic absorption spectrophotometer 100 of Embodiment 1, the atomic absorption spectrophotometer 100 of Embodiment 3 is different in that it includes a plurality of imaging units 12A and 12B. The other structure is the same as that of the first embodiment, so the description will not be repeated. In addition, since the configuration of the imaging unit 12A and the imaging unit 12B is the same as that of the imaging unit 12, the description will not be repeated.

6, the imaging unit 12A and the imaging unit 12B are arranged so as to include the tip of the nozzle 40 in the imaging field of view. The imaging unit 12A and the imaging unit 12B are arranged such that the tip of the nozzle 40 and the hole 22 are included in the imaging field of view in a state where the tip of the nozzle 40 is located directly above the hole 22.

However, the imaging unit 12A and the imaging unit 12B are arranged to image the tip of the nozzle 40 at different angles. In the example of FIG. 6, the imaging unit 12A and the imaging unit 12B are arranged at positions that are targeted with the nozzle 40 as the center. Both the imaging unit 12A and the imaging unit 12B are mounted on the arm 42.

The imaging unit 12A and the imaging unit 12B respectively image the tip of the nozzle 40 to generate image data, and send the generated image data to the controller 15. When the controller 15 receives image data from the imaging unit 12A and the imaging unit 12B, it displays two captured images on the display 16.

The user can confirm the position of the tip of the nozzle 40 by referring to the two captured images displayed on the display 16. Since the two captured images capture the tip of the nozzle 40 from different angles, the relative position of the tip of the nozzle 40 with respect to the hole 22 is different. The user can confirm the position of the tip of the nozzle 40 based on the two relative positions respectively obtained from the two captured images.

As described in the first embodiment, in order to accurately detect the relative position of the tip of the nozzle 40 with respect to the hole 22, it is ideal to arrange the imaging unit 12 close to the position directly above the hole 22. However, there are restrictions on the arrangement of the imaging unit 12. , And it is difficult to bring the imaging unit 12 close to the position directly above the hole 22. In this case, as shown in FIG. 6, by providing a plurality of imaging units 12A, 12B to capture images of the tip of the nozzle 40 from different angles, the nozzle 40 can be detected from multiple directions. The relative position of the tip with respect to the hole 22 is obtained based on values derived from a plurality of detection results. For example, the controller 15 can use a well-known image processing technique to synthesize a plurality of captured images obtained by the plurality of imaging units 12A and 12B, thereby generating a picture of the tip of the nozzle 40 taken from a position directly above the hole 22. picture. Thereby, the user can detect the relative position of the tip of the nozzle 40 with respect to the hole 22 based on the composite image displayed on the display 16. Therefore, in the third embodiment, similarly to the first embodiment, the user can confirm the relative position of the tip of the nozzle 40 with respect to the hole 22 while operating the position adjustment mechanism 10, so that the tip of the nozzle 40 is positioned at The nozzle moving mechanism 41 is moved in the manner of the position directly above the hole 22.

In addition, the controller 15 can be configured to automatically adjust the position of the nozzle 40 by using a known image processing technique. Specifically, if the controller 15 obtains image data from the imaging unit 12A and the imaging unit 12A, respectively, the two types of image data are synthesized to generate the nozzle 40 viewed from the position directly above the hole 22. The image of the tip and the hole 22. The controller 15 obtains the relative position of the tip of the nozzle 40 and the hole 22 based on the generated image, and operates the position adjustment mechanism 10 so that the tip of the nozzle 40 is at a preset reference position.

As described above, according to the atomic absorption spectrophotometer 100 of the third embodiment, it is possible to detect the tip of the nozzle 40 relative to the graphite based on the captured images obtained by the plurality of imaging units 12A and 12B that respectively capture the tip of the nozzle 40. The relative position of the hole 22 of the tube 21. Therefore, the same effect as the atomic absorption spectrophotometer 100 of Embodiment 1 is exhibited.

In addition, according to the atomic absorption spectrophotometer 100 of the third embodiment, since the movement mechanism of the plurality of imaging units 12A and 12B is shared with the nozzle movement mechanism 41, if the nozzle 40 is separated from the graphite tube 21, the imaging unit 12A and the imaging unit can be increased. The distance between the part 12B and the graphite tube 21. Thereby, the imaging unit 12A and the imaging unit 12B can be retreated from the graphite tube 21 which becomes high temperature during the analysis of the sample with a simple structure, and the imaging unit 12A and the imaging unit 12B can be protected from overheating.

In addition, in Embodiment 3, by mounting the imaging unit 12A and the imaging unit 12B on the arm 42, the rotation of the arm 42 is used to move the imaging unit 12A and the imaging unit 12B. However, it may also be configured to be atomic absorption. The spectrophotometer 100 additionally includes a structure of a movement mechanism of the imaging unit 12A and the imaging unit 12B. In this case, the moving mechanism of the imaging unit 12A and the imaging unit 12B is configured to be able to approach the hole 22 and include the tip of the nozzle 40 in the imaging field of view at a first position farther away from the graphite than the first position. Between the second positions of the tube 21, the imaging unit 12A and the imaging unit 12B are moved.

Furthermore, according to the atomic absorption spectrophotometer 100 of the third embodiment, by synthesizing a plurality of captured images, an image of the tip of the nozzle 40 and the hole 22 viewed from a position directly above the hole 22 is generated. Even when the arrangement of the imaging unit is restricted, the relative position of the tip of the nozzle 40 with respect to the hole 22 can be detected.

In addition, in the example of FIG. 6, the configuration in which two imaging units 12A and 12B are provided has been described, but the number of imaging units is not limited to this, and it may be a configuration in which three or more imaging units are installed.

[Embodiment 4] FIG. 7 is a diagram showing a schematic configuration of an atomic absorption spectrophotometer 100 according to the fourth embodiment. In FIG. 7, a configuration example of the atomization unit 2 and the auto sampler 4 is schematically shown.

Compared with the atomic absorption spectrophotometer 100 of Embodiment 1, the atomic absorption spectrophotometer 100 of Embodiment 4 is different in that it includes a plurality of imaging units 12A, 12B and a plurality of mirrors 14A, 14B. The other structure is the same as that of the first embodiment, so the description will not be repeated. In addition, since the configuration of the imaging unit 12A and the imaging unit 12B is the same as that of the imaging unit 12, the description will not be repeated.

7, the atomic absorption spectrophotometer 100 of the fourth embodiment includes a mirror 14A, a mirror 14B, and an imaging unit 12A, and an imaging unit 12B as a structure for detecting the positional relationship of the nozzle 40 with respect to the hole 22. The reflecting mirror 14A and the reflecting mirror 14B are provided at positions where the image including the tip of the nozzle 40 can be reflected. As shown in FIG. 7, the reflecting mirror 14A and the reflecting mirror 14B are respectively arranged so that the tip of the nozzle 40 and the hole 22 are included in the image in a state where the nozzle 40 is located directly above the hole 22. However, the reflecting mirror 14A and the reflecting mirror 14B are arranged to reflect the image including the tip of the nozzle 40 at different angles from each other. In the example of FIG. 7, both the mirror 14A and the mirror 14B are mounted on the arm 42.

The imaging unit 12A is provided at a position where the image reflected by the mirror 14A can be obtained. The imaging unit 12B is provided at a position where the image reflected by the mirror 14B can be obtained. As shown in FIG. 7, when the nozzle 40 is moved to a position directly above the hole 22, the mirror 14A and the mirror 14B form an image including the tip of the nozzle 40 and the hole 22, respectively. The imaging unit 12A can detect the positional relationship of the nozzle 40 with respect to the hole 22 by acquiring the image reflected by the mirror 14A. The imaging unit 12B can detect the positional relationship of the nozzle 40 with respect to the hole 22 by acquiring the image reflected by the mirror 14B.

The imaging unit 12A and the imaging unit 12B capture images of the tip of the nozzle 40 to generate image data, and send the generated image data to the controller 15. When the controller 15 receives image data from the imaging unit 12A and the imaging unit 12B, it displays two captured images on the display 16.

The user can confirm the position of the tip of the nozzle 40 by referring to the two captured images displayed on the display 16. Since the two captured images capture the tip of the nozzle 40 from different angles, the positional relationship of the tip of the nozzle 40 with respect to the hole 22 is different. The user can confirm the position of the tip of the nozzle 40 based on the two positional relationships obtained from the two captured images.

In the case where it is difficult to bring the imaging unit 12 close to the position directly above the hole 22, the multiple mirrors 14A, 14B and the multiple imaging units 12A, 12B can be used in combination to set the nozzle 40 at different angles from each other. The tip of the nozzle is imaged, and the positional relationship of the tip of the nozzle 40 with respect to the hole 22 is detected from multiple directions, and based on a value (for example, an average value) calculated from a plurality of detection results, the tip of the nozzle 40 with respect to The positional relationship of the hole 22. Therefore, in the fourth embodiment, similarly to the first embodiment, the user can confirm the positional relationship of the tip of the nozzle 40 with respect to the hole 22 while operating the position adjustment mechanism 10, so that the nozzle 40 is located in the hole. The nozzle moving mechanism 41 is moved in the manner of the position directly above 22.

In addition, the controller 15 can be configured to automatically adjust the position of the nozzle 40 by using a well-known image processing technique. Specifically, if the controller 15 obtains image data from the imaging unit 12A and the imaging unit 12A, respectively, it uses image processing technology to select the tip of the nozzle 40 and the hole 22 for each image data. The controller 15 obtains the positional relationship between the tip of the nozzle 40 and the hole 22 based on a plurality of selection results, and operates the position adjustment mechanism 10 so that the tip of the nozzle 40 is at a preset reference position.

As described above, according to the atomic absorption spectrophotometer 100 of the fourth embodiment, it is possible to detect that the tip of the nozzle 40 is relative to the graphite tube 21 based on the captured images obtained by the plurality of imaging units that respectively capture the tip of the nozzle 40. The relative position of the hole 22. Therefore, the same effect as the atomic absorption spectrophotometer 100 of Embodiment 1 is exhibited.

Furthermore, according to the atomic absorption spectrophotometer 100 of the fourth embodiment, the reflection image of the tip of the nozzle 40 obtained by the plurality of reflecting mirrors 14A and 14B can be obtained by setting the plurality of imaging units 12A, 12B to obtain the reflection image of the tip of the nozzle 40, respectively. The plurality of imaging units 12A and 12B are provided away from the graphite tube 21. Therefore, the imaging unit 12A and the imaging unit 12B can be installed at a distance from the graphite tube 21 that becomes a high temperature during sample analysis. Therefore, the imaging unit 12A and the imaging unit 12B can be protected from overheating.

In addition, in the example of FIG. 7, the configuration in which two mirrors 14A, 14B and two imaging units 12A, 12B are provided has been described, but the number of mirrors and imaging units is not limited to this, and can also be set as A structure with three or more mirrors and three or more imaging units.

[form] As understood by those having ordinary knowledge in the technical field, the plurality of illustrative embodiments are specific examples of the following forms.

(Item 1) One aspect of the atomic absorption spectrophotometer includes an atomization section, a nozzle, a nozzle moving mechanism, a position adjustment mechanism, at least one imaging section, and a display. The atomization part includes a furnace in which a hole for sample injection is formed, and the sample injected into the furnace is atomized by heating. The nozzle sucks and ejects the sample. The nozzle moving mechanism moves the nozzle to a position directly above the hole. The position adjustment mechanism is configured to be able to adjust the relative position of the tip of the nozzle with respect to the hole by moving the nozzle moving mechanism. At least one imaging unit is arranged so that the tip of the nozzle and the hole are included in the imaging field of view in a state where the tip of the nozzle is located directly above the hole. The display displays the captured image obtained by at least one imaging unit.

According to the atomic absorption spectrophotometer described in item 1, it is possible to detect the relative position of the tip of the nozzle with respect to the hole of the furnace by using at least one imaging unit that takes an image of the tip of the nozzle. The adjustment of the relative position becomes easy. Thereby, the efficiency of the analysis work can be improved, and the accuracy of the position adjustment of the nozzle can be improved.

(Item 2) The atomic absorption spectrophotometer according to item 1 further includes: a moving mechanism for moving at least one imaging unit to a first position close to the position directly above the hole, compared with the first position And move between the second position away from the furnace.

According to the atomic absorption spectrophotometer described in Item 2, after the nozzle position adjustment is completed, the distance between the furnace and each imaging unit can be increased by the moving mechanism. Thereby, the at least one imaging unit can be retreated from the furnace that becomes high temperature during the analysis of the sample, and the at least one imaging unit can be protected from overheating.

(Item 3) In the atomic absorption spectrophotometer described in Item 2, the nozzle moving mechanism is configured to be able to move the nozzle between a position directly above the hole and a position directly above the container containing the sample. The moving mechanism of the imaging unit is shared with the nozzle moving mechanism.

According to the atomic absorption spectrophotometer described in Item 3, since the nozzle moving mechanism is shared with the moving mechanism of at least one imaging section, the distance between each imaging section and the furnace can be increased by separating the nozzle from the furnace. Therefore, the moving mechanism of the imaging unit is not required. Thereby, with a simple structure, at least one imaging part can be evacuated from the furnace which becomes a high temperature at the time of sample analysis.

(Item 4) In the atomic absorption spectrophotometer described in Item 3, the nozzle moving mechanism includes an arm that supports the nozzle. The nozzle moving mechanism is configured to be able to move the nozzle between a position directly above the hole and a position directly above the container containing the sample by moving the arm. At least one imaging unit is mounted on the arm.

According to the atomic absorption spectrophotometer described in Item 4, the distance between each imaging unit and the furnace can be increased by moving the nozzle from the position directly above the hole by the movement of the arm. Therefore, with a simple structure, at least one imaging unit can be evacuated from a furnace that becomes a high temperature during sample analysis.

(Item 5) The atomic absorption spectrophotometer described in Item 1 further includes: at least one reflector. At least one mirror forms a reflection image of the tip of the nozzle. At least one imaging unit is provided in correspondence with the at least one reflecting mirror, and obtains a reflection image of the corresponding reflecting mirror.

According to the atomic absorption spectrophotometer described in item 5, since at least one imaging unit can use at least one mirror to image the tip of the nozzle, it is possible to detect the tip of the nozzle based on the captured image obtained by the at least one imaging unit The relative position of the hole with respect to the furnace. Therefore, the adjustment of the relative position of the nozzle with respect to the hole can be made easy. In addition, it is possible to install the at least one imaging unit away from the furnace by providing a structure in which at least one imaging unit respectively obtains the reflected image of the tip of the nozzle by at least one reflecting mirror. Therefore, it is possible to increase the distance from the furnace that becomes a high temperature during sample analysis and to install at least one imaging unit, so that each imaging unit can be protected from overheating.

(Item 6) In the atomic absorption spectrophotometer described in Item 5, the nozzle moving mechanism includes an arm that supports the nozzle. The nozzle moving mechanism is configured to be able to move the nozzle between a position directly above the hole and a position directly above the container containing the sample by moving the arm. At least one mirror is mounted on the arm.

According to the atomic absorption spectrophotometer described in Item 6, the nozzle can be moved from the position directly above the hole by the movement of the arm, thereby increasing the distance between each reflector and the furnace. Therefore, with a simple structure, at least one reflector can be evacuated from a furnace that becomes a high temperature during sample analysis.

(Item 7) The atomic absorption spectrophotometer described in items 1 to 6 further includes a controller. The controller detects the relative position of the tip of the nozzle with respect to the hole based on the captured image obtained by the at least one imaging section. The controller operates the position adjustment mechanism according to the detected deviation of the relative position from the reference position.

According to the atomic absorption spectrophotometer described in Item 7, the position adjustment operation of the nozzle by the user is not required, and therefore the analysis efficiency can be further improved.

In addition, with regard to the above-mentioned Embodiments 1 to 4 and the modified examples, it has been stipulated in advance since the beginning of the application, including combinations not mentioned in the specification, and within the scope that no inconsistencies or contradictions occur, the The illustrated structure is properly combined.

It should be considered that the embodiment disclosed this time is an illustration in all aspects and is not limited. The scope of the present invention is shown not by the above description but by the scope of the patent application, and intends to include the meaning equivalent to the scope of the patent application and all changes within the scope.

1: light source 2: Atomization Department 3: splitter 4: automatic sampler 5: Detector 6: heater 8: drive 9: turntable 10: Position adjustment mechanism 12, 12A, 12B: camera department 14, 14A, 14B, 33, 34: mirror 15: Controller 16: display 18: Operation Department 21: Graphite tube 22, 25: Hole 23, 24: Electrode 26: window panel 31: entrance slit 32: Exit slit 35: Diffraction grating 40: Nozzle 41: Nozzle moving mechanism 42: arm 43: Rotation axis 44, 90: Motor 92: platform 94a, 94b, 94c: container 100: Atomic Absorption Spectrophotometer 150: processor 152: Memory 154: Input and output interface (I/F) 156: Communication interface (I/F) P: Working position S01～S06: Step X, Y, Z: axis

FIG. 1 is a diagram showing a schematic configuration of the atomic absorption spectrophotometer of the first embodiment. Fig. 2 is a schematic diagram showing a configuration example of an atomization section and an auto sampler shown in Fig. 1. Fig. 3 is a schematic diagram showing a configuration example of the atomization section and the autosampler shown in Fig. 1. FIG. 4 is a flowchart for explaining the processing procedure of nozzle position adjustment by the controller. FIG. 5 is a diagram showing a schematic configuration of an atomic absorption spectrophotometer according to Embodiment 2. FIG. FIG. 6 is a diagram showing a schematic configuration of an atomic absorption spectrophotometer according to Embodiment 3. FIG. FIG. 7 is a diagram showing a schematic configuration of an atomic absorption spectrophotometer according to Embodiment 4. FIG.

2: Atomization Department

10: Position adjustment mechanism

12: Camera Department

15: Controller

16: display

18: Operation Department

21: Graphite tube

22, 25: Hole

23, 24: Electrode

26: window panel

40: Nozzle

41: Nozzle moving mechanism

42: arm

43: Rotation axis

44: Motor

X, Y, Z: axis

Claims (7)

An atomic absorption spectrophotometer, which is characterized in that it comprises: The atomization part includes a furnace in which a hole for sample injection is formed, and the sample injected into the furnace is atomized by heating; Nozzle, suck and eject the sample; Nozzle moving mechanism to move the nozzle to a position directly above the hole; The position adjustment mechanism is configured to be able to adjust the relative position of the tip of the nozzle with respect to the hole by moving the nozzle moving mechanism; At least one imaging unit is arranged such that the tip of the nozzle and the hole are included in the imaging field of view in a state where the tip of the nozzle is located directly above the hole; and The display displays the captured image obtained by the at least one imaging unit. The atomic absorption spectrophotometer as described in claim 1, further including: A moving mechanism for moving the imaging unit between a first position close to a position directly above the hole and a second position farther from the furnace than the first position. The atomic absorption spectrophotometer according to claim 2, wherein: The nozzle moving mechanism is configured to be able to move the nozzle between a position directly above the hole and a position directly above the container containing the sample, and The moving mechanism of the imaging unit is shared with the nozzle moving mechanism. The atomic absorption spectrophotometer according to claim 3, wherein: The nozzle moving mechanism includes: an arm supporting the nozzle, The nozzle moving mechanism is configured to be able to move the nozzle between a position directly above the hole and a position directly above the container containing the sample by moving the arm; and The at least one imaging unit is mounted on the arm. The atomic absorption spectrophotometer as described in claim 1, further including: At least one mirror, forming a reflection image of the tip of the nozzle; and The at least one imaging unit is provided in correspondence with the at least one reflecting mirror, and obtains a reflection image of the corresponding reflecting mirror. The atomic absorption spectrophotometer according to claim 5, wherein: The nozzle moving mechanism includes: an arm supporting the nozzle, The nozzle moving mechanism is configured to be able to move the nozzle between a position directly above the hole and a position directly above the container containing the sample by rotating the arm, and The at least one mirror is mounted on the arm. The atomic absorption spectrophotometer according to any one of claim 1 to claim 6, further comprising: a controller, The controller detects the relative position of the tip of the nozzle with respect to the hole based on the captured image obtained by the at least one imaging section, and The position adjustment mechanism is operated according to the detected deviation of the relative position from the reference position.

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