TWI785195B - Semiconductor device - Google Patents

Semiconductor device Download PDF

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TWI785195B
TWI785195B TW108103065A TW108103065A TWI785195B TW I785195 B TWI785195 B TW I785195B TW 108103065 A TW108103065 A TW 108103065A TW 108103065 A TW108103065 A TW 108103065A TW I785195 B TWI785195 B TW I785195B
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light
receiving
receiving element
mentioned
emitting element
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TW108103065A
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TW201941447A (en
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黒羽淳史
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日商青井電子股份有限公司
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/12Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof structurally associated with, e.g. formed in or on a common substrate with, one or more electric light sources, e.g. electroluminescent light sources, and electrically or optically coupled thereto

Abstract

本發明之半導體裝置具有:受光元件,其於既定之區域形成有孔;發光元件,其設置於受光元件之孔內;以及第1樹脂,其覆蓋受光元件之周緣部;受光元件之表面與發光元件之表面位於實質上同一平面上。The semiconductor device of the present invention has: a light receiving element having a hole formed in a predetermined area; a light emitting element disposed in the hole of the light receiving element; and a first resin covering the peripheral portion of the light receiving element; the surface of the light receiving element and the light emitting element The surfaces of the elements lie on substantially the same plane.

Description

半導體裝置Semiconductor device

本發明係關於一種半導體裝置。 The present invention relates to a semiconductor device.

習知,光學式編碼器等中所使用之受光發光單元係採用於設置有受光元件之晶片上搭載有發光元件之構造。受光發光單元係藉由使來自發光元件之光於配置於受光發光單元之外部之被測定體發生反射,由受光元件接收該反射光而傳遞訊號。該構造係於受光元件上積層發光元件之構造,因此受光發光元件之厚度變厚。於在受光發光元件之內部具有反射面之類型之光電耦合器中,已知有設為於受光元件之大致中央部設置發光元件收容孔,於該發光元件收容孔內配置發光元件之構造。該構造中,於發光元件收容孔之周側面設置反射層,使來自發光元件之光於反射層發生反射。根據該構造,由於將發光元件配置於設置於受光元件之發光元件收容孔內,故而可使受光發光單元之厚度變薄(例如參照專利文獻1)。 Conventionally, a light-receiving and light-emitting unit used in an optical encoder and the like adopts a structure in which a light-emitting element is mounted on a chip provided with a light-receiving element. The light-receiving and light-emitting unit reflects light from the light-emitting element on an object to be measured arranged outside the light-receiving and light-emitting unit, and receives the reflected light by the light-receiving element to transmit a signal. This structure is a structure in which light-emitting elements are laminated on light-receiving elements, so the thickness of the light-receiving and light-emitting elements becomes thicker. In a photocoupler of the type having a reflective surface inside a light-receiving and light-emitting element, there is known a structure in which a light-emitting element receiving hole is provided approximately in the center of the light-receiving element, and a light-emitting element is arranged in the light-emitting element receiving hole. In this structure, a reflective layer is provided on the peripheral side of the light-emitting element receiving hole, and the light from the light-emitting element is reflected on the reflective layer. According to this structure, since the light-emitting element is arranged in the light-emitting element housing hole provided in the light-receiving element, the thickness of the light-receiving and light-emitting unit can be reduced (for example, refer to Patent Document 1).

[先前技術文獻] [Prior Art Literature] [專利文獻] [Patent Document]

專利文獻1:日本專利實開昭58-148954號公報 Patent Document 1: Japanese Patent Laid-Open No. 58-148954

於上述專利文獻1中所記載之受光發光單元中,使發光元件之光於設置於發光元件收容孔之周側面之反射層發生反射,因此必須使受光元件之厚度厚於發光元件之厚度,換言之將發光元件之發光面配置於較受光元件之受光面高之位置,而提高反射率。即,受光元件之受光面與發光元件之發光面之高度方向之位置不同。因此,有受光元件之受光面至被測定體之距離與發光元件之發光面至被測定體之距離不同,無法獲得較高之檢測感度之問題。 In the light-receiving and emitting unit described in the above-mentioned Patent Document 1, the light of the light-emitting element is reflected on the reflective layer provided on the peripheral side of the light-emitting element receiving hole, so the thickness of the light-receiving element must be thicker than the thickness of the light-emitting element, in other words The light-emitting surface of the light-emitting element is arranged at a higher position than the light-receiving surface of the light-receiving element to increase the reflectivity. That is, the positions in the height direction of the light receiving surface of the light receiving element and the light emitting surface of the light emitting element are different. Therefore, the distance from the light-receiving surface of the light-receiving element to the object to be measured is different from the distance from the light-emitting surface of the light-emitting element to the object to be measured, and a high detection sensitivity cannot be obtained.

根據第1態樣,半導體裝置具有:受光元件,其於既定之區域形成有孔;引線框架,其具有形成有凹部的發光元件收容部,上述發光元件收容部收容於上述受光元件的上述孔中;發光元件,其設置於上述引線框架之上述發光元件收容部的底部內面;引線端子,其沿著上述受光元件的外周設置,且自上述引線框架分離而形成;以及第1樹脂,其覆蓋上述受光元件之周緣部;上述發光元件藉由導電性接合劑接合於上述引線框架之上述發光元件收容部的上述底部內面;且上述受光元件之受光面與上述發光元件之發光面位於實質上同一平面上。 According to the first aspect, the semiconductor device includes: a light-receiving element having a hole formed in a predetermined region; and a lead frame having a light-emitting element accommodating portion formed with a concave portion, the light-emitting element accommodating portion being accommodated in the hole of the light-receiving element a light-emitting element provided on the bottom inner surface of the light-emitting element housing portion of the lead frame; a lead terminal provided along the outer periphery of the light-receiving element and separated from the lead frame; and a first resin covering The peripheral portion of the above-mentioned light-receiving element; the above-mentioned light-emitting element is bonded to the bottom inner surface of the above-mentioned light-emitting element housing part of the above-mentioned lead frame by a conductive adhesive; and the light-receiving surface of the above-mentioned light-receiving element and the light-emitting surface of the above-mentioned light-emitting element are located substantially on the same plane.

根據第2態樣,半導體裝置具有:受光元件,其於既定之區域形成有孔;發光元件,其設置於上述受光元件之上述孔內;以及第1樹脂,其覆蓋上述受光元件之周緣部;上述受光元件之受光面與上述發光元件之發光面位於實質上同一平面上,其中,上述受光元件具有第1受光部、第2受光部、及連接部,上述連接部將上述第1受光部與上述第2受光部連接,且厚度薄於上述第1受光部及上述第2受光部,且上述受光元件之上述孔形成於上述連接部。 According to the second aspect, the semiconductor device includes: a light receiving element having a hole formed in a predetermined region; a light emitting element disposed in the hole of the light receiving element; and a first resin covering the peripheral portion of the light receiving element; The light-receiving surface of the above-mentioned light-receiving element and the light-emitting surface of the above-mentioned light-emitting element are located on substantially the same plane, wherein the above-mentioned light-receiving element has a first light-receiving part, a second light-receiving part, and a connecting part, and the connecting part connects the first light-receiving part and the light-emitting part. The second light receiving part is connected and thinner than the first light receiving part and the second light receiving part, and the hole of the light receiving element is formed in the connecting part.

根據第3態樣,半導體裝置具有:受光元件,其於大致中央形成有孔;發光元件,其配置於上述受光元件之上述孔內;引線端子,其配置於上述受光元件之外周;第1導線,其將設置於上述發光元件之發光面的第1電極與上述受光 元件連接;第2導線,其將上述發光元件的第2電極與上述引線端子連接;以及樹脂,其使上述受光元件之受光面及上述發光元件之上述第1電極露出,並將上述發光元件、上述受光元件、上述引線端子及上述第2導線密封;上述受光元件、上述發光元件及上述引線端子由上述樹脂保持;且上述受光元件之上述受光面與上述發光元件之上述發光面位於實質上同一平面上。 According to a third aspect, the semiconductor device includes: a light receiving element having a hole formed substantially in the center; a light emitting element disposed in the hole of the light receiving element; a lead terminal disposed on the outer periphery of the light receiving element; and a first wire , it connects the first electrode provided on the light emitting surface of the above light emitting element with the above light receiving element connection; a second lead for connecting the second electrode of the light-emitting element to the lead terminal; and a resin for exposing the light-receiving surface of the light-receiving element and the first electrode of the light-emitting element, and connecting the light-emitting element, The light-receiving element, the lead terminal, and the second wire are sealed; the light-receiving element, the light-emitting element, and the lead terminal are held by the resin; on flat surface.

根據第4態樣,半導體裝置具有:受光元件,其於大致中央形成有孔;發光元件,其配置於上述受光元件之上述孔內;引線框架,其具有分別安裝上述受光元件及上述發光元件的平坦的安裝部,且上述受光元件及上述發光元件分別藉由導電性接合劑接合於上述平坦的安裝部;引線端子,其沿著上述受光元件的外周設置,且自上述引線框架分離而形成;第1導線,其將設置於上述發光元件之發光面的電極與上述受光元件的第1電極連接;第2導線,其將上述受光元件的第2電極與上述引線端子連接;以及樹脂,其使上述受光元件之受光面及上述發光元件之上述發光面露出,並將上述受光元件之周緣部、上述第2導線、上述引線端子及上述引線框架之周緣部密封;且藉由上述導電性接合劑安裝於上述平坦的安裝部的上述受光元件之上述受光面與上述發光元件之上述發光面位於實質上同一平面上。 According to a fourth aspect, the semiconductor device includes: a light receiving element having a hole formed substantially in the center; a light emitting element disposed in the hole of the light receiving element; a flat mounting portion, and the light receiving element and the light emitting element are respectively bonded to the flat mounting portion with a conductive adhesive; lead terminals are provided along the outer periphery of the light receiving element and are formed by being separated from the lead frame; a first lead for connecting the electrode provided on the light emitting surface of the light emitting element to the first electrode of the light receiving element; a second lead for connecting the second electrode of the light receiving element to the lead terminal; and a resin for making The light-receiving surface of the light-receiving element and the light-emitting surface of the light-emitting element are exposed, and the periphery of the light-receiving element, the second lead, the lead terminal, and the lead frame are sealed; and the conductive adhesive The light receiving surface of the light receiving element mounted on the flat mounting portion and the light emitting surface of the light emitting element are located on substantially the same plane.

根據本發明,藉由使受光元件之表面、與設置於形成於受光元件之孔的發光元件之表面位於實質上同一平面上,可使物體及受光元件之距離與物體及發光元件之距離一致,而獲得較高之檢測感度。 According to the present invention, by making the surface of the light-receiving element and the surface of the light-emitting element disposed in the hole formed in the light-receiving element substantially on the same plane, the distance between the object and the light-receiving element can be made equal to the distance between the object and the light-emitting element, And get a higher detection sensitivity.

1:光電耦合器 1: Optocoupler

10:基板 10: Substrate

20:受光晶片 20: Light-receiving chip

21、31、32:接合線 21, 31, 32: bonding wire

30:發光晶片 30: Luminous chip

31:接合線 31: Bonding wire

41、51:樹脂 41, 51: Resin

101:引線端子 101: Lead terminal

102:中央部 102: central part

103:中央凹部 103: Central recess

105:安裝部 105: Installation Department

201:孔 201: hole

202:凹部 202: concave part

203:第1受光部 203: The first light receiving part

204:第2受光部 204: The second light receiving part

圖1係示意性地表示本發明之第1實施形態之半導體裝置之形狀之圖。 FIG. 1 is a diagram schematically showing the shape of a semiconductor device according to a first embodiment of the present invention.

圖2係示意性地表示第1實施形態之半導體裝置之形狀之圖。 FIG. 2 is a diagram schematically showing the shape of the semiconductor device according to the first embodiment.

圖3係示意性地表示第1實施形態之受光晶片之形狀之圖。 Fig. 3 is a diagram schematically showing the shape of a light-receiving chip according to the first embodiment.

圖4係說明第1實施形態之半導體裝置之製造方法之圖。 FIG. 4 is a diagram illustrating a method of manufacturing the semiconductor device according to the first embodiment.

圖5係說明第1實施形態之半導體裝置之製造方法之圖。 FIG. 5 is a diagram illustrating a method of manufacturing the semiconductor device according to the first embodiment.

圖6係示意性地表示本發明之第2實施形態之半導體裝置之形狀之圖。 FIG. 6 is a diagram schematically showing the shape of a semiconductor device according to a second embodiment of the present invention.

圖7係說明第2實施形態之半導體裝置之製造方法之圖。 FIG. 7 is a diagram illustrating a method of manufacturing a semiconductor device according to the second embodiment.

圖8係說明第2實施形態之半導體裝置之製造方法之圖。 FIG. 8 is a diagram illustrating a method of manufacturing a semiconductor device according to the second embodiment.

圖9係示意性地表示本發明之第3實施形態之半導體裝置之形狀之圖。 Fig. 9 is a diagram schematically showing the shape of a semiconductor device according to a third embodiment of the present invention.

圖10係說明第3實施形態之半導體裝置之製造方法之圖。 Fig. 10 is a diagram illustrating a method of manufacturing a semiconductor device according to the third embodiment.

圖11係說明第3實施形態之半導體裝置之製造方法之圖。 Fig. 11 is a diagram illustrating a method of manufacturing a semiconductor device according to the third embodiment.

以下,參照圖式而對用以實施本發明之形態進行說明。 Hereinafter, an embodiment for implementing the present invention will be described with reference to the drawings.

-第1實施形態- -First Embodiment-

圖1~圖3係示意性地表示作為本發明之第1實施形態之半導體裝置的光電耦合器1之一例之圖。圖1(a)係俯視立體圖,圖1(b)係自圖1(a)移除樹脂之情形之俯視立體圖,圖2(a)係圖1(a)中之A-A'及B-B'剖面圖,圖2(b)係正面俯視圖,圖2(c)係背面俯視圖。但是,於圖2(a)中,A'-B剖面之區域省略圖示。圖3係後述之受光晶片之立體圖。此外,為了便於說明,使用如圖所示般設定之由X軸、Y軸、Z軸構成之座標系。 1 to 3 are diagrams schematically showing an example of a photocoupler 1 as a semiconductor device according to a first embodiment of the present invention. Figure 1(a) is a top perspective view, Figure 1(b) is a top perspective view of the situation where the resin is removed from Figure 1(a), Figure 2(a) is A-A' and B- in Figure 1(a) B' section view, Fig. 2(b) is a front top view, and Fig. 2(c) is a back top view. However, in FIG. 2( a ), the region of the A'-B cross section is omitted from illustration. Fig. 3 is a perspective view of a light-receiving chip described later. In addition, for convenience of explanation, a coordinate system composed of an X axis, a Y axis, and a Z axis set as shown in the figure is used.

又,作為半導體裝置,列舉光電耦合器1為例進行以下之說明,但作為半導體裝置,並不限定於光電耦合器1,亦可為光電微型感測器或標記感測器等。 In addition, as the semiconductor device, the photocoupler 1 is taken as an example for the following description, but the semiconductor device is not limited to the photocoupler 1, and may be a photoelectric microsensor or a mark sensor.

光電耦合器1係具有發光元件之發光晶片30及具有受光元件之受 光晶片20構成為一體之平置型光電耦合器。於圖1中,發光元件之發光面及受光元件之受光面均為上表面(Z軸方向+側)。本實施形態之光電耦合器1適於光學式編碼器用,自發光元件發出之光係向反射面之垂直方向、即與Z軸方向大致平行地發射。被測定體(未圖示)係配置於Z軸方向上之光電耦合器1之外部,光電耦合器1係構成為由受光元件接收自被測定體反射之光。 The photocoupler 1 is a light-emitting chip 30 with a light-emitting element and a receiving element with a light-receiving element. The optical chip 20 constitutes an integrated planar photocoupler. In FIG. 1 , both the light emitting surface of the light emitting element and the light receiving surface of the light receiving element are the upper surface (+ side in the Z-axis direction). The photocoupler 1 of this embodiment is suitable for an optical encoder, and the light emitted from the light-emitting element is emitted in a direction perpendicular to the reflection surface, that is, substantially parallel to the Z-axis direction. An object to be measured (not shown) is arranged outside the photocoupler 1 in the Z-axis direction, and the photocoupler 1 is configured to receive light reflected from the object to be measured by a light receiving element.

光電耦合器1具備:基板10、發光晶片30、受光晶片20、引線端子101、及樹脂51。 The photocoupler 1 includes a substrate 10 , a light emitting chip 30 , a light receiving chip 20 , lead terminals 101 , and a resin 51 .

受光晶片20於內部具有多個受光元件(光電二極體:PD),於俯視下具有矩形形狀。此外,受光晶片20可構成為組合PD及電晶體而成之光電晶體,亦可構成為包括PD及構成該PD驅動用電路之積體電路的PDIC。如圖3所示,於受光晶片20之上表面之包含中央之既定之區域,形成有孔201。於該孔201內,收容後述之基板10之中央凹部103(參照圖2)。又,受光晶片20包含孔201,於沿著圖之X軸方向之區域形成有厚度較薄之連接部202(參照圖3)。受光晶片20係夾著連接部202而具備第1受光部203(圖之Y軸方向+側)、及第2受光部204(圖之Y軸方向-側)。連接部202之上表面(Z軸方向+側之面)係自第1受光部203之上表面及第2受光部204之上表面凹陷而形成。即,連接部202之上表面係配置於較第1受光部203之上表面及第2受光部204之上表面於Z軸方向+側低之位置。 The light-receiving chip 20 has a plurality of light-receiving elements (photodiodes: PD) inside, and has a rectangular shape in plan view. In addition, the light-receiving chip 20 may be configured as a phototransistor combining a PD and a transistor, or may be configured as a PDIC including a PD and an integrated circuit constituting a circuit for driving the PD. As shown in FIG. 3 , a hole 201 is formed in a predetermined region including the center on the upper surface of the light receiving chip 20 . In this hole 201, the central recessed part 103 (refer FIG. 2) of the board|substrate 10 mentioned later is accommodated. In addition, the light-receiving chip 20 includes a hole 201, and a thin connection portion 202 is formed in a region along the X-axis direction of the figure (see FIG. 3 ). The light-receiving chip 20 includes a first light-receiving portion 203 (+ side in the Y-axis direction in the figure) and a second light-receiving portion 204 (- side in the Y-axis direction in the figure) with the connection portion 202 interposed therebetween. The upper surface (the surface on the + side in the Z-axis direction) of the connecting portion 202 is formed by being recessed from the upper surface of the first light receiving portion 203 and the upper surface of the second light receiving portion 204 . That is, the upper surface of the connecting portion 202 is disposed at a position lower on the + side in the Z-axis direction than the upper surfaces of the first light receiving portion 203 and the second light receiving portion 204 .

如圖2所示,基板10例如由引線框架等構成,且具有設置於上述之受光晶片20之連接部202之上部的中央部102。於基板10之中央部102,與受光晶片20之形成孔201之區域對應地形成有中央凹部(發光元件收容部)103。如上所述,中央凹部103係收容於受光晶片20之孔201內。引線端子101係沿著受光晶片20之第1受光部203及第2受光部204之外周而排列。如後所述,引線端子101最初係與基板10一起一體地形成為引線框架,係藉由將作為與引線框架 之連結部之引線部裁斷,自基板10分離而形成。中央部102之上表面(Z軸方向+側之面)與第1受光部203之上表面及第2受光部204之上表面成為大致同一面。受光晶片20之第1受光部203與第2受光部204藉由接合線21與引線端子101連接。基板10之中央凹部103之凹部之底面103a係以成為較中央部102之上表面低之位置(圖之Z軸方向-側)之方式形成中央凹部103。於中央凹部103之底面103a,設置發光晶片30。 As shown in FIG. 2 , the substrate 10 is formed of, for example, a lead frame, and has a central portion 102 provided above the connection portion 202 of the above-mentioned light receiving chip 20 . In the central portion 102 of the substrate 10 , a central concave portion (light-emitting element accommodating portion) 103 is formed corresponding to the area where the hole 201 of the light-receiving chip 20 is formed. As mentioned above, the central concave portion 103 is accommodated in the hole 201 of the light receiving chip 20 . The lead terminals 101 are arranged along the outer circumference of the first light receiving portion 203 and the second light receiving portion 204 of the light receiving chip 20 . As will be described later, the lead terminal 101 is initially formed integrally with the substrate 10 to form a lead frame. The lead part of the connection part is cut and separated from the substrate 10 to form. The upper surface (the Z-axis direction + side surface) of the central portion 102 is substantially flush with the upper surface of the first light receiving unit 203 and the upper surface of the second light receiving unit 204 . The first light receiving part 203 and the second light receiving part 204 of the light receiving chip 20 are connected to the lead terminal 101 by the bonding wire 21 . The bottom surface 103a of the concave portion of the central concave portion 103 of the substrate 10 is formed so that the bottom surface 103a of the concave portion is lower than the upper surface of the central portion 102 (Z-axis direction - side in the figure). On the bottom surface 103a of the central concave portion 103, the light emitting chip 30 is disposed.

發光晶片30具有發光元件,且設置於形成於上述之基板10之中央部102的中央凹部103之底面103a上。發光晶片30例如藉由銀膠或焊料等導電性接合劑電性接合於基板10。藉此,發光晶片30之一電極、例如陰極電極連接於基板10。發光晶片30之上表面即發光面、與受光晶片20之上表面即受光面對齊於實質上同一高度、即於Z軸方向上對齊於實質上同一位置。具體而言,發光晶片30之發光面與受光晶片20之受光面之高度之差設為較佳為30μm以下之範圍、更佳為10μm以下之範圍。於本說明書中,將發光晶片30之上表面與受光晶片20之上表面之Z軸方向之位置之差為30μm以下之範圍設為實質上相同者。換言之,以基板10之中央凹部103之底面103a成為較中央部102之上表面低發光晶片30之Z軸方向之大小之位置之方式,形成中央凹部103。 The light-emitting chip 30 has a light-emitting element, and is disposed on the bottom surface 103a of the central concave portion 103 formed in the central portion 102 of the above-mentioned substrate 10 . The light-emitting chip 30 is electrically bonded to the substrate 10 by, for example, silver glue or a conductive adhesive such as solder. Thereby, one electrode of the light emitting chip 30 , for example, the cathode electrode, is connected to the substrate 10 . The upper surface of the light-emitting chip 30 , namely the light-emitting surface, and the upper surface of the light-receiving chip 20 , namely the light-receiving surface, are aligned at substantially the same height, that is, aligned at substantially the same position in the Z-axis direction. Specifically, the height difference between the light-emitting surface of the light-emitting chip 30 and the light-receiving surface of the light-receiving chip 20 is set to a range of preferably 30 μm or less, more preferably 10 μm or less. In this specification, the range in which the difference in Z-axis direction between the upper surface of the light emitting chip 30 and the upper surface of the light receiving chip 20 is 30 μm or less is defined as being substantially the same. In other words, the central concave portion 103 is formed such that the bottom surface 103 a of the central concave portion 103 of the substrate 10 is at a position lower than the upper surface of the central portion 102 in the Z-axis direction of the light-emitting chip 30 .

發光晶片30之其他電極、例如陽極電極藉由接合線31與受光晶片20(圖中所示之例中為第1受光部203)連接。 Other electrodes of the light-emitting chip 30 , such as an anode electrode, are connected to the light-receiving chip 20 (in the example shown in the figure, the first light-receiving portion 203 ) by bonding wires 31 .

如圖2(a)所示,基板10之中央部102於下表面側、即Z軸方向-側具有凹部102a。於基板10之中央部102之凹部102a內,收容受光晶片20之連接部202。受光晶片20之連接部202於收容於基板10之中央部102之凹部120a內之狀態下藉由樹脂41而密封。於光電耦合器1之上部(Z軸方向+側),將受光晶片20之周緣部、基板10之周緣部之引線端子101之一部分(即除背面(Z軸-側之面)以外之部分)、及接合線21藉由樹脂51而密封。此外,樹脂41及樹脂51 例如為如環氧樹脂般具有遮光性之不透明之樹脂。 As shown in FIG. 2( a ), the central portion 102 of the substrate 10 has a concave portion 102 a on the lower surface side, that is, on the side in the Z-axis direction. In the concave portion 102a of the central portion 102 of the substrate 10, the connection portion 202 of the light-receiving chip 20 is housed. The connection portion 202 of the light-receiving chip 20 is sealed with the resin 41 in a state of being housed in the concave portion 120 a of the central portion 102 of the substrate 10 . On the upper part of the photocoupler 1 (Z-axis direction + side), the peripheral part of the light-receiving chip 20 and the part of the lead terminal 101 of the peripheral part of the substrate 10 (that is, the part other than the back surface (Z-axis-side surface)) , and bonding wire 21 are sealed by resin 51 . In addition, resin 41 and resin 51 For example, it is an opaque resin having light-shielding properties such as epoxy resin.

參照圖4、圖5,對上述之光電耦合器1之製造方法進行說明。圖4、圖5與圖2(a)同樣地,為圖1(a)中之A-A'及B-B'剖面圖,該情形時,A'-B剖面之區域亦省略圖示。 Referring to FIG. 4 and FIG. 5 , a method of manufacturing the above-mentioned photocoupler 1 will be described. Fig. 4 and Fig. 5 are the same as Fig. 2(a) and are AA' and BB' cross-sectional views in Fig. 1(a). In this case, the area of the A'-B cross-section is also omitted from the illustration.

如圖4(a)所示,於金屬或背面膠帶等較薄之支持基材60上,安裝形成有多個引線端子101、中央部102、中央凹部103之基板10、及受光晶片20。此外,形成基板10之母材係具有如可獲得多個光電耦合器1之大小者,但圖式中僅表示成為1個光電耦合器1之區域及其周圍。受光晶片20係以將連接部202配置於基板10之中央部102之凹部102a內之方式安裝。此時,基板10之中央部102之凹部102a的Z軸方向-側之面之高度係以於與受光晶片20之連接部的Z軸方向+側之面之間形成間隙g之方式預先設定。此外,基板10係預先準備可形成中央凹部103之厚度較厚之板狀之母材,藉由蝕刻等去除母材之一部分,形成凹部102a及中央凹部103。又,於該狀態下,基板10之中央部102及多個引線端子101一體地形成為於基板10之外周具有框架部之引線框架(未圖示),中央部102及各引線端子101藉由形成於引線框架之引線部102b連結於該引線框架。 As shown in FIG. 4( a ), on a thin support substrate 60 such as metal or back tape, the substrate 10 formed with a plurality of lead terminals 101 , the central portion 102 , and the central concave portion 103 , and the light-receiving chip 20 are mounted. In addition, the base material forming the substrate 10 has a size such that a plurality of photocouplers 1 can be obtained, but only a region of one photocoupler 1 and its surroundings are shown in the drawings. The light-receiving chip 20 is mounted in such a manner that the connecting portion 202 is disposed in the concave portion 102 a of the central portion 102 of the substrate 10 . At this time, the height of the Z-axis direction-side surface of the concave portion 102 a of the central portion 102 of the substrate 10 is set in advance so as to form a gap g between the Z-axis direction +-side surface of the connecting portion with the light-receiving chip 20 . In addition, the substrate 10 is prepared in advance with a thick plate-shaped base material capable of forming the central concave portion 103 , and a part of the base material is removed by etching to form the concave portion 102 a and the central concave portion 103 . Also, in this state, the central portion 102 and the plurality of lead terminals 101 of the substrate 10 are integrally formed as a lead frame (not shown) having a frame portion on the outer periphery of the substrate 10, and the central portion 102 and each lead terminal 101 are formed by forming The lead part 102b of the lead frame is connected to the lead frame.

以覆蓋受光晶片20及基板10之方式利用樹脂41進行密封。此時,受光晶片20之連接部202係藉由填充於設置於基板10之中央部102之凹部102a內之樹脂,亦包括與基板10之中央部102之間之間隙部分在內,將整個周側面密封。使樹脂41硬化後,將支持基材60剝離去除而製成中間製品1A(圖4(b))。此外,根據支持基材60中所使用之金屬,亦可進行溶解去除。將中間製品1A之上下方向反轉,利用接合線21將受光晶片20與引線端子101進行接合連接(圖4(c))。以覆蓋受光晶片20之周緣部、基板10之周緣部之引線端子101之一部分(即除背面(Z軸-側之面)以外之部分)、及接合線21之方式利用樹脂51進行密封(圖4(d))。 It seals with resin 41 so that the light receiving chip 20 and the board|substrate 10 may be covered. At this time, the connection portion 202 of the light-receiving chip 20 is filled with the resin in the concave portion 102a provided in the central portion 102 of the substrate 10, including the gap portion with the central portion 102 of the substrate 10, and the entire circumference is covered. Side seals. After hardening the resin 41, the support base material 60 is peeled off and removed, and the intermediate product 1A is produced (FIG.4(b)). In addition, depending on the metal used in the support substrate 60, it may also be removed by dissolution. The up-down direction of intermediate product 1A is reversed, and light-receiving chip 20 and lead terminal 101 are bonded and connected by bonding wire 21 ( FIG. 4( c )). Seal with resin 51 in such a way as to cover the peripheral portion of the light-receiving chip 20, a portion of the lead terminal 101 of the peripheral portion of the substrate 10 (that is, the portion other than the back surface (Z-axis-side surface)), and the bonding wire 21 (Fig. 4(d)).

於形成於基板10之中央部102之中央凹部103之底面103a上,例如藉由使用銀膠等接著劑之粒接法(Die Bonding)連接發光晶片30(圖5(a))。利用接合線31將發光晶片30之電極與受光晶片20之電極進行接合連接(圖5(b))。其後,於圖5(c)之一點鏈線所示之位置,將連接基板10之中央部102及各引線端子101之引線部102b與樹脂51一起裁斷而單片化。藉此,獲得圖1所示之光電耦合器1。 On the bottom surface 103a of the central concave portion 103 formed in the central portion 102 of the substrate 10, the light-emitting chip 30 is connected, for example, by die bonding using an adhesive such as silver glue ( FIG. 5( a )). The electrodes of the light-emitting chip 30 and the electrodes of the light-receiving chip 20 are bonded and connected by bonding wires 31 ( FIG. 5( b )). Thereafter, the central portion 102 of the connection board 10 and the lead portion 102b of each lead terminal 101 are cut together with the resin 51 at the positions indicated by chain lines in FIG. Thereby, the photocoupler 1 shown in FIG. 1 is obtained.

根據上述之第1實施形態,可獲得以下之作用效果。 According to the first embodiment described above, the following effects can be obtained.

(1)光電耦合器1具有:受光晶片20,其於既定之區域形成有孔201;發光晶片30,其設置於引線框架之中央凹部103;及樹脂51,其覆蓋受光晶片20之周緣部;且受光晶片20之表面與發光晶片30之表面位於實質上同一平面上。藉此,可使自發光晶片30出射之光於物體發生反射為止之移動距離、與由物體反射之光入射至受光晶片20為止之移動距離實質上相等。藉此,可提高檢測精度,而實現感測器之高感度化。 (1) The photocoupler 1 has: a light-receiving chip 20, which has a hole 201 formed in a predetermined area; a light-emitting chip 30, which is arranged in the central recess 103 of the lead frame; and a resin 51, which covers the peripheral portion of the light-receiving chip 20; And the surface of the light-receiving chip 20 and the surface of the light-emitting chip 30 are located on substantially the same plane. Thereby, the moving distance until the light emitted from the light-emitting chip 30 is reflected by the object and the moving distance until the light reflected by the object enters the light-receiving chip 20 can be substantially equal. Thereby, the detection accuracy can be improved, and the high sensitivity of the sensor can be realized.

又,與於受光晶片上載置發光晶片並利用接合線進行連接之情形相比,可減小Z軸方向之大小,因此可達成光電耦合器1之小型化、薄型化。 In addition, compared with the case where a light emitting chip is mounted on a light receiving chip and connected with a bonding wire, the size in the Z-axis direction can be reduced, so that miniaturization and thinning of the photocoupler 1 can be achieved.

又,於日本專利實開昭58-148954號公報中所揭示之先前技術中,將形成於電晶體之主面之孔部之側面與底面所成之角度設定為既定之值,由側面反射之光亦由受光元件接收。但是,藉由矽形成受光元件,藉由矽之各向異性蝕刻形成受光元件之發光元件收容孔。因此,由於將成為反射面之周側面相對於底面所成之傾斜角設定為53.7°之既定之角度,故而於特定之用途以外難以應用而通用性較低。相對於此,本實施形態並非為由受光晶片20接收由構造體之側面反射之光,因此亦可用於特定之用途以外,且可提供通用性高之半導體裝置。 Also, in the prior art disclosed in Japanese Patent Application Laid-Open No. 58-148954, the angle formed between the side surface and the bottom surface of the hole formed on the main surface of the transistor is set to a predetermined value, and the angle reflected by the side surface Light is also received by the light receiving element. However, the light-receiving element is formed by silicon, and the light-emitting element accommodation hole of the light-receiving element is formed by anisotropic etching of silicon. Therefore, since the inclination angle formed by the peripheral side surface to be the reflective surface with respect to the bottom surface is set at a predetermined angle of 53.7°, it is difficult to apply it outside of specific applications and the versatility is low. On the other hand, this embodiment does not receive the light reflected from the side surface of the structure by the light-receiving chip 20, so it can be used for other than specific purposes, and can provide a highly versatile semiconductor device.

(2)基板10具有作為設置發光晶片30之發光元件收容部之中央凹部103,於受光晶片20之孔201配置中央凹部103。藉此,可將發光晶片30設 置於基板10之中央凹部103上,因此可提高散熱性。 (2) The substrate 10 has a central concave portion 103 as a light-emitting element housing portion where the light-emitting chip 30 is placed, and the central concave portion 103 is arranged in the hole 201 of the light-receiving chip 20 . In this way, the light-emitting chip 30 can be set Placed on the central concave portion 103 of the substrate 10, the heat dissipation can be improved.

(3)受光晶片20具有第1受光部203、第2受光部204、及連接部202,該連接部202將第1受光部203與第2受光部204連接,且厚度薄於第1受光部203及第2受光部204,且孔201設置於連接部202。藉此,可於使受光晶片20之表面與發光晶片30之表面位於實質上同一平面上之狀態下,將發光晶片30設置於基板10上,因此可實現檢測精度之提高及散熱性之提高。 (3) The light-receiving chip 20 has a first light-receiving part 203, a second light-receiving part 204, and a connection part 202. The connection part 202 connects the first light-receiving part 203 and the second light-receiving part 204, and is thinner than the first light-receiving part. 203 and the second light receiving part 204, and the hole 201 is provided in the connecting part 202. Thereby, the light-emitting chip 30 can be placed on the substrate 10 with the surface of the light-receiving chip 20 and the surface of the light-emitting chip 30 being substantially on the same plane, thereby improving detection accuracy and heat dissipation.

(4)基板10具有收容受光晶片20之連接部202之凹部102a,且於收容有連接部202之凹部102a內填充樹脂41。樹脂41亦填充於基板10與受光晶片20之間之間隙g。藉此,可獲得較高之衝擊性。 (4) The substrate 10 has a concave portion 102 a for accommodating the connecting portion 202 of the light-receiving chip 20 , and the resin 41 is filled in the concave portion 102 a for accommodating the connecting portion 202 . The resin 41 is also filled in the gap g between the substrate 10 and the light-receiving chip 20 . Thereby, higher impact can be obtained.

-第2實施形態- -Second Embodiment-

對本發明之第2實施形態之光電耦合器進行說明。於以下之說明中,對與第1實施形態相同之構成部分標註相同之符號而主要說明不同點。對於未特別說明之點則與第1實施形態相同。 A photocoupler according to a second embodiment of the present invention will be described. In the following description, the same code|symbol is attached|subjected to the same component as 1st Embodiment, and a different point is mainly demonstrated. Points not particularly described are the same as those of the first embodiment.

圖6係例示本發明之第2實施形態之光電耦合器1之圖,圖6(a)係剖面圖,圖6(b)係正面俯視圖,圖6(c)係背面俯視圖。此外,圖6(a)係圖6(b)中之C-C'剖面圖。 Fig. 6 is a diagram illustrating a photocoupler 1 according to a second embodiment of the present invention, Fig. 6(a) is a sectional view, Fig. 6(b) is a front top view, and Fig. 6(c) is a back top view. In addition, Fig. 6(a) is a CC' sectional view in Fig. 6(b).

受光晶片20於俯視下具有矩形形狀,於包含中央之既定之區域形成孔201。受光晶片20於光電耦合器1之周緣部藉由接合線21與由引線框架等構成之多個引線端子101連接。於孔201設置發光晶片30。藉此,使發光晶片30之上表面即發光面、與受光晶片20之上表面即受光面對齊於實質上同一高度、即於Z軸方向上對齊於實質上同一位置。於第2實施形態中,亦與第1實施形態之情形同樣地,發光晶片30之發光面與受光晶片20之受光面之高度之差設為較佳為30μm以下之範圍、更佳為10μm以下之範圍。此外,於本實施形態中,尤其亦可將發光晶片30之發光面與受光晶片20之受光面之高度之差設為數μm以下 之範圍。 The light-receiving chip 20 has a rectangular shape in plan view, and a hole 201 is formed in a predetermined area including the center. The light-receiving chip 20 is connected to a plurality of lead terminals 101 composed of a lead frame or the like by bonding wires 21 at the peripheral portion of the photocoupler 1 . The light emitting chip 30 is disposed in the hole 201 . Thereby, the upper surface of the light-emitting chip 30 , which is the light-emitting surface, and the upper surface of the light-receiving chip 20 , which is the light-receiving surface, are aligned at substantially the same height, that is, aligned at substantially the same position in the Z-axis direction. In the second embodiment, as in the case of the first embodiment, the height difference between the light-emitting surface of the light-emitting chip 30 and the light-receiving surface of the light-receiving chip 20 is set to a range of preferably 30 μm or less, more preferably 10 μm or less. range. In addition, in this embodiment, the difference in height between the light emitting surface of the light emitting chip 30 and the light receiving surface of the light receiving chip 20 can be set to be several μm or less. range.

發光晶片30藉由接合線31與受光晶片20連接,藉由接合線32與引線端子101連接。藉此,發光晶片30之一電極、例如陰極電極電性連接於引線端子101,另一電極、例如陽極電極電性連接於受光晶片20。 The light-emitting chip 30 is connected to the light-receiving chip 20 through the bonding wire 31 , and connected to the lead terminal 101 through the bonding wire 32 . Thereby, one electrode of the light-emitting chip 30 , such as the cathode electrode, is electrically connected to the lead terminal 101 , and the other electrode, such as the anode electrode, is electrically connected to the light-receiving chip 20 .

於在受光晶片20之孔201中設置有發光晶片30之狀態下,受光晶片20、引線端子101之一部分(即除背面(Z軸-側之面)以外之部分)、發光晶片30、及接合線32於光電耦合器1之下部(Z軸方向-側)藉由樹脂41而密封。於光電耦合器1之上部(Z軸方向+側),將受光晶片20之周緣部、引線端子101、及接合線21藉由樹脂51而密封。此外,樹脂41及樹脂51例如為如環氧樹脂般具有遮光性之不透明之樹脂。 In the state where the light-emitting chip 30 is set in the hole 201 of the light-receiving chip 20, the light-receiving chip 20, a part of the lead terminal 101 (that is, the part other than the back surface (Z-axis-side surface)), the light-emitting chip 30, and the joint The wire 32 is sealed with a resin 41 at the lower part (Z-axis direction-side) of the photocoupler 1 . On the upper portion of the photocoupler 1 (Z-axis direction + side), the peripheral portion of the light receiving chip 20 , the lead terminals 101 , and the bonding wires 21 are sealed with a resin 51 . In addition, the resin 41 and the resin 51 are, for example, opaque resins having light-shielding properties such as epoxy resins.

參照圖7、圖8,對上述之第2實施形態之光電耦合器1之製造方法進行說明。圖7、圖8與圖6(a)同樣地,為圖6(b)中之C-C'剖面圖。 Referring to FIG. 7 and FIG. 8, a method of manufacturing the photocoupler 1 according to the second embodiment described above will be described. Fig. 7 and Fig. 8 are the same as Fig. 6(a), and are CC' sectional views in Fig. 6(b).

如圖7(a)所示,於支持基材60上,安裝多個引線端子101、受光晶片20、及發光晶片30。此外,形成引線端子101之母材係具有如可獲得多個光電耦合器1之大小者,但於圖式中僅表示成為1個光電耦合器1之區域及其周邊。發光晶片30通過形成於受光晶片20之孔201而安裝於支持基材60上。又,於該狀態下,多個引線端子101一體地形成為於外周具有框架部之引線框架(未圖示),各引線端子101藉由形成於引線框架之引線部102b連結於該引線框架。 As shown in FIG. 7( a ), on a support substrate 60 , a plurality of lead terminals 101 , a light receiving chip 20 , and a light emitting chip 30 are mounted. In addition, the base material forming the lead terminal 101 has a size such that a plurality of photocouplers 1 can be obtained, but in the drawings, only the region to be one photocoupler 1 and its surroundings are shown. The light emitting chip 30 is mounted on the support base 60 through the hole 201 formed in the light receiving chip 20 . In this state, the plurality of lead terminals 101 are integrally formed as a lead frame (not shown) having a frame portion on the outer periphery, and each lead terminal 101 is connected to the lead frame by a lead portion 102b formed on the lead frame.

利用接合線32將發光晶片30與引線端子101進行接合連接(圖7(b))。以覆蓋受光晶片20、引線端子101之一部分(即除背面(Z軸方向-側之面)以外之部分)、發光晶片30、及接合線32之方式利用樹脂41進行密封,使樹脂41硬化後,將支持基材60剝離去除而製成中間製品1A(圖7(c))。將中間製品1A之上下方向反轉,利用接合線21將受光晶片20與引線端子101進行接合連接(圖8(a))。以覆蓋受光晶片20之周緣部、引線端子101、及接合 線21之方式利用樹脂51進行密封(圖8(b))。利用接合線31將發光晶片30之電極與受光晶片20之電極進行接合連接(圖8(b))。 The light-emitting chip 30 and the lead terminal 101 are bonded and connected by bonding wires 32 ( FIG. 7( b )). Seal with resin 41 in such a way as to cover light-receiving chip 20 , a part of lead terminal 101 (that is, the part other than the back surface (the Z-axis direction-side surface)), light-emitting chip 30 , and bonding wire 32 , and harden resin 41 , the supporting base material 60 is peeled off to produce an intermediate product 1A ( FIG. 7( c )). The up-down direction of intermediate product 1A is reversed, and light-receiving chip 20 and lead terminal 101 are bonded and connected by bonding wire 21 ( FIG. 8( a )). To cover the peripheral portion of the light-receiving chip 20, the lead terminals 101, and the bonding The form of the wire 21 is sealed with a resin 51 (FIG. 8(b)). The electrodes of the light-emitting chip 30 and the electrodes of the light-receiving chip 20 are bonded and connected by bonding wires 31 ( FIG. 8( b )).

其後,於圖8(c)之一點鏈線所示之位置,將連接各引線端子101之引線部102b與樹脂51一起裁斷而單片化。藉此,獲得圖6所示之光電耦合器1。 Thereafter, the lead portion 102b connecting each lead terminal 101 is cut together with the resin 51 at the position shown by the dot chain line in FIG. 8(c) to be separated into individual pieces. Thereby, the photocoupler 1 shown in FIG. 6 is obtained.

根據上述之第2實施形態,除藉由第1實施形態所獲得之(1)之作用效果以外,亦可獲得以下之作用效果。 According to the above-mentioned second embodiment, in addition to the effect of (1) obtained by the first embodiment, the following effects can also be obtained.

(1)將受光晶片20、發光晶片30、引線端子101之一部分、及接合線32自背面藉由樹脂41而密封。藉此,受光晶片20及發光晶片30之上表面以外係藉由樹脂41、51而覆蓋,因此可獲得較高之耐衝擊性。又,引線端子101呈L字狀地藉由樹脂41、51而密封,因此可製成可耐樹脂脫落之形狀。 (1) The light-receiving chip 20 , the light-emitting chip 30 , a part of the lead terminal 101 , and the bonding wire 32 are sealed with the resin 41 from the back surface. In this way, the upper surfaces of the light-receiving chip 20 and the light-emitting chip 30 are covered by the resins 41 and 51 , so higher impact resistance can be obtained. In addition, since the lead terminal 101 is sealed with the resin 41, 51 in an L-shape, it can be made into a shape that is resistant to resin shedding.

(2)如圖7、圖8所示,於製造時,於支持基材60上安裝受光晶片20之上表面及發光晶片30之上表面,因此可使光電耦合器1之受光晶片20之上表面與發光晶片30之上表面以高精度位於同一平面上。 (2) As shown in Figures 7 and 8, during manufacture, the upper surface of the light-receiving chip 20 and the upper surface of the light-emitting chip 30 are installed on the support substrate 60, so that the light-receiving chip 20 of the photocoupler 1 can The surface is located on the same plane as the upper surface of the light-emitting wafer 30 with high precision.

-第3實施形態- -Third Embodiment-

對本發明之第3實施形態之光電耦合器進行說明。於以下之說明中,對與第1實施形態相同之構成要素標附相同之符號而主要說明不同點。關於未特別說明之點,與第1實施形態相同。 A photocoupler according to a third embodiment of the present invention will be described. In the following description, the same code|symbol is attached|subjected to the same component as 1st Embodiment, and a different point is mainly demonstrated. About the point which is not demonstrated especially, it is the same as 1st Embodiment.

圖9係例示本發明之第3實施形態之光電耦合器1之圖,圖9(a)係剖面圖,圖9(b)係正面俯視圖,圖9(c)係背面俯視圖。此外,圖9(a)係圖9(b)中之D-D'剖面圖。 Fig. 9 is a diagram illustrating a photocoupler 1 according to a third embodiment of the present invention, Fig. 9(a) is a sectional view, Fig. 9(b) is a front plan view, and Fig. 9(c) is a back plan view. In addition, Fig. 9(a) is a sectional view of DD' in Fig. 9(b).

受光晶片20於俯視下具有矩形形狀,於包含中央之既定之區域形成孔201。受光晶片20及發光晶片30安裝於基板10。發光晶片30係通過形成於受光晶片20之孔201而安裝於基板10。藉此,發光晶片30例如藉由銀膠或焊 料等導電性接合劑接合於基板10,藉此一電極(例如陰極電極)電性連接於基板10。使發光晶片30之上表面即發光面、與受光晶片20之上表面即受光面對齊於實質上同一高度、即於Z軸方向上對齊於實質上同一位置。於第3實施形態中,亦與第1實施形態之情形同樣地,發光晶片30之發光面與受光晶片20之受光面之高度之差設為較佳為30μm以下之範圍、更佳為10μm以下之範圍。 The light-receiving chip 20 has a rectangular shape in plan view, and a hole 201 is formed in a predetermined area including the center. The light receiving chip 20 and the light emitting chip 30 are mounted on the substrate 10 . The light emitting chip 30 is mounted on the substrate 10 through the hole 201 formed in the light receiving chip 20 . In this way, the light-emitting chip 30, for example, by silver paste or solder A conductive adhesive such as material is bonded to the substrate 10 , whereby an electrode (eg, a cathode electrode) is electrically connected to the substrate 10 . The upper surface of the light-emitting chip 30 , the light-emitting surface, and the upper surface of the light-receiving chip 20 , the light-receiving surface, are aligned at substantially the same height, that is, aligned at substantially the same position in the Z-axis direction. In the third embodiment, as in the case of the first embodiment, the height difference between the light-emitting surface of the light-emitting chip 30 and the light-receiving surface of the light-receiving chip 20 is set to a range of preferably 30 μm or less, more preferably 10 μm or less. range.

發光晶片30之另一電極、例如陽極電極藉由接合線31與受光晶片20連接。 Another electrode of the light-emitting chip 30 , such as an anode electrode, is connected to the light-receiving chip 20 through a bonding wire 31 .

基板10例如由引線框架等構成,如上所述具有安裝受光晶片20及發光晶片30之安裝部105、及設置於周緣部之多個引線端子101。引線端子101與受光晶片20係藉由接合線21而連接。 The board|substrate 10 is comprised, for example by a lead frame etc., and has the mounting part 105 which mounts the light receiving chip 20 and the light emitting chip 30 as mentioned above, and the several lead terminal 101 provided in the peripheral part. The lead terminals 101 and the light receiving chip 20 are connected by bonding wires 21 .

受光晶片20、基板10之周緣部(即安裝部105之一部分、引線端子101之一部分(即除背面(Z軸-側之面)以外之部分))、及接合線21係於光電耦合器1之上部(Z軸方向+側)藉由樹脂51而密封。此外,樹脂51例如為如環氧樹脂般具有遮光性之不透明之樹脂。 The light-receiving chip 20, the peripheral portion of the substrate 10 (that is, a part of the mounting part 105, and a part of the lead terminal 101 (that is, the part except the back surface (Z-axis-side surface))), and the bonding wire 21 are connected to the photocoupler 1 The upper part (Z-axis direction + side) is sealed with resin 51 . In addition, the resin 51 is, for example, an opaque resin having light-shielding properties such as epoxy resin.

參照圖10、圖11,對上述之第3實施形態之光電耦合器1之製造方法進行說明。圖10、圖11與圖9(a)同樣地,為圖9(b)中之D-D'剖面圖。 Referring to FIG. 10 and FIG. 11, a method of manufacturing the photocoupler 1 according to the third embodiment described above will be described. Fig. 10 and Fig. 11 are the same as Fig. 9(a), and are sectional views of DD' in Fig. 9(b).

如圖10(a)所示,於支持基材60上,安裝形成有多個引線端子101、及安裝部105之基板10。此外,形成基板10之母材係具有如可獲得多個光電耦合器1之大小者,但於圖式中僅表示成為1個光電耦合器1之區域及其周圍。於基板10之安裝部105上,例如藉由使用銀膠等接著劑之粒接法連接受光晶片20。 As shown in FIG. 10( a ), the substrate 10 in which a plurality of lead terminals 101 and mounting portions 105 are formed is mounted on a supporting base material 60 . In addition, the base material forming the substrate 10 has a size such that a plurality of photocouplers 1 can be obtained, but only the region where one photocoupler 1 becomes and its surroundings are shown in the drawings. On the mounting portion 105 of the substrate 10, the light-receiving chip 20 is connected, for example, by a grain bonding method using an adhesive such as silver glue.

利用接合線21將受光晶片20與引線端子101進行接合連接(圖10(b))。以覆蓋受光晶片20、基板10之周緣部、及接合線21之方式利用樹脂51進行密封,使樹脂51硬化後,將支持基材60剝離去除(圖10(c))。將發光晶片30通過形成於受光晶片20之孔201,例如藉由使用銀膠等接著劑之粒接法連接於基板10之安裝部105(圖11(a))。利用接合線31將發光晶片30之電 極與受光晶片20之電極進行接合連接(圖11(a))。其後,於圖11(b)之一點鏈線所示之位置,將樹脂51裁斷而單片化。藉此,獲得圖9所示之光電耦合器1。 The light-receiving chip 20 and the lead terminal 101 are bonded and connected by bonding wires 21 ( FIG. 10( b )). The light-receiving chip 20, the peripheral portion of the substrate 10, and the bonding wire 21 are sealed with a resin 51, and after the resin 51 is cured, the support base 60 is peeled off and removed (FIG. 10(c)). Pass the light-emitting chip 30 through the hole 201 formed in the light-receiving chip 20, and connect to the mounting portion 105 of the substrate 10 by, for example, bonding with an adhesive such as silver glue ( FIG. 11( a )). Use the bonding wire 31 to connect the electricity of the light-emitting chip 30 The electrodes are bonded and connected to the electrodes of the light-receiving chip 20 ( FIG. 11( a )). Thereafter, the resin 51 is cut and separated into individual pieces at the positions indicated by chain lines in FIG. 11( b ). Thereby, the photocoupler 1 shown in FIG. 9 is obtained.

根據上述之第3實施形態,除藉由第1實施形態所獲得之(1)之作用效果以外,亦可獲得以下之作用效果。 According to the above-mentioned third embodiment, in addition to the effect of (1) obtained by the first embodiment, the following effects can also be obtained.

基板10具有保持受光晶片20及發光晶片30之安裝部105。藉此,可將發光晶片30設置於基板10上,因此可提高散熱性。 The substrate 10 has a mounting portion 105 for holding the light-receiving chip 20 and the light-emitting chip 30 . Thereby, the light-emitting chip 30 can be disposed on the substrate 10, so the heat dissipation can be improved.

只要無損本發明之特徵,則本發明並不限定於上述實施形態,本發明之技術思想之範圍內所考慮到之其他形態亦包含於本發明之範圍內。 As long as the characteristics of the present invention are not impaired, the present invention is not limited to the above embodiments, and other forms considered within the scope of the technical idea of the present invention are also included in the scope of the present invention.

下述之優先權基礎申請案之揭示內容作為引用文套用至本文中。 The disclosure content of the following priority basic application is incorporated herein as a reference.

日本專利申請案2018年第012842號(2018年1月29日提出申請) Japanese Patent Application 2018 No. 012842 (filed on January 29, 2018)

1‧‧‧光電耦合器 1‧‧‧Optocoupler

10‧‧‧基板 10‧‧‧substrate

20‧‧‧受光晶片 20‧‧‧light receiving chip

30‧‧‧發光晶片 30‧‧‧Light-emitting chips

31‧‧‧接合線 31‧‧‧Joint wire

51‧‧‧樹脂 51‧‧‧Resin

101‧‧‧引線端子 101‧‧‧Lead terminal

102‧‧‧中央部 102‧‧‧Central Department

203‧‧‧第1受光部 203‧‧‧The first light receiving part

204‧‧‧第2受光部 204‧‧‧The second light receiving part

Claims (9)

一種半導體裝置,其具有:受光元件,其於既定之區域形成有孔;引線框架,其具有形成有凹部的發光元件收容部,上述發光元件收容部收容於上述受光元件的上述孔中;發光元件,其設置於上述引線框架之上述發光元件收容部的底部內面;引線端子,其沿著上述受光元件的外周設置,且自上述引線框架分離而形成;以及第1樹脂,其覆蓋上述受光元件之周緣部;上述發光元件藉由導電性接合劑接合於上述引線框架之上述發光元件收容部的上述底部內面;且上述受光元件之受光面與上述發光元件之發光面位於實質上同一平面上。 A semiconductor device comprising: a light receiving element having a hole formed in a predetermined area; a lead frame having a light emitting element housing portion formed with a concave portion, the light emitting element housing portion being accommodated in the hole of the light receiving element; a light emitting element , which is provided on the bottom inner surface of the above-mentioned light-emitting element housing part of the above-mentioned lead frame; a lead terminal, which is provided along the outer periphery of the above-mentioned light-receiving element, and is formed by being separated from the above-mentioned lead frame; and a first resin that covers the above-mentioned light-receiving element The peripheral portion of the light-emitting element; the light-emitting element is bonded to the bottom inner surface of the light-emitting element housing portion of the lead frame with a conductive adhesive; and the light-receiving surface of the light-receiving element and the light-emitting surface of the light-emitting element are located on substantially the same plane . 如請求項1所述之半導體裝置,其中,上述受光元件分別具有第1受光部、第2受光部、及連接部,上述連接部將上述第1受光部與上述第2受光部連接;上述引線框架使上述第1受光部及上述第2受光部之受光面即上表面露出,並設置為覆蓋上述連接部的上表面。 The semiconductor device according to claim 1, wherein each of the light receiving elements has a first light receiving part, a second light receiving part, and a connecting part, and the connecting part connects the first light receiving part and the second light receiving part; the lead wire The frame exposes the upper surface which is the light receiving surface of the first light receiving part and the second light receiving part, and is provided so as to cover the upper surface of the connecting part. 如請求項2所述之半導體裝置,其中,上述引線框架具有收容上述受光元件之上述連接部的凹部。 The semiconductor device according to claim 2, wherein the lead frame has a concave portion for accommodating the connecting portion of the light receiving element. 一種半導體裝置,其具有:受光元件,其於既定之區域形成有孔;發光元件,其設置於上述受光元件之上述孔內;以及第1樹脂,其覆蓋上述受光元件之周緣部;上述受光元件之受光面與上述發光元件之發光面位於實質上同一平面上, 其中,上述受光元件具有第1受光部、第2受光部、及連接部,上述連接部將上述第1受光部與上述第2受光部連接,且厚度薄於上述第1受光部及上述第2受光部,且上述受光元件之上述孔形成於上述連接部。 A semiconductor device comprising: a light-receiving element having a hole formed in a predetermined region; a light-emitting element disposed in the hole of the light-receiving element; and a first resin covering the peripheral portion of the light-receiving element; the light-receiving element The light-receiving surface and the light-emitting surface of the above-mentioned light-emitting element are located on substantially the same plane, Wherein, the light receiving element has a first light receiving part, a second light receiving part, and a connecting part, and the connecting part connects the first light receiving part and the second light receiving part, and is thinner than the first light receiving part and the second light receiving part. A light receiving part, wherein the hole of the light receiving element is formed in the connecting part. 如請求項4所述之半導體裝置,其進一步具備:基板,其具有收容上述受光元件之上述連接部的凹部,且於收容有上述受光元件之上述凹部內填充有第2樹脂。 The semiconductor device according to claim 4, further comprising: a substrate having a recess for accommodating the connecting portion of the light receiving element, and filling the recess for accommodating the light receiving element with a second resin. 如請求項5所述之半導體裝置,其中,上述第2樹脂亦填充於上述基板與上述受光元件之間之間隙內。 The semiconductor device according to claim 5, wherein the second resin is also filled in a gap between the substrate and the light receiving element. 一種半導體裝置,其具有:受光元件,其於大致中央形成有孔;發光元件,其配置於上述受光元件之上述孔內;引線端子,其配置於上述受光元件之外周;第1導線,其將設置於上述發光元件之發光面的第1電極與上述受光元件連接;第2導線,其將上述發光元件的第2電極與上述引線端子連接;以及樹脂,其使上述受光元件之受光面及上述發光元件之上述第1電極露出,並將上述發光元件、上述受光元件、上述引線端子及上述第2導線密封;上述受光元件、上述發光元件及上述引線端子由上述樹脂保持;且上述受光元件之上述受光面與上述發光元件之上述發光面位於實質上同一平面上。 A semiconductor device comprising: a light-receiving element having a hole formed substantially in the center; a light-emitting element disposed in the hole of the light-receiving element; lead terminals disposed on the outer periphery of the light-receiving element; and a first wire connecting The first electrode provided on the light emitting surface of the light emitting element is connected to the light receiving element; the second lead is used to connect the second electrode of the light emitting element to the lead terminal; and the resin is used to connect the light receiving surface of the light receiving element to the above The above-mentioned first electrode of the light-emitting element is exposed, and the above-mentioned light-emitting element, the above-mentioned light-receiving element, the above-mentioned lead terminal, and the above-mentioned second wire are sealed; the above-mentioned light-receiving element, the above-mentioned light-emitting element, and the above-mentioned lead terminal are held by the above-mentioned resin; and the above-mentioned light-receiving element The light receiving surface and the light emitting surface of the light emitting element are located on substantially the same plane. 一種半導體裝置,其具有:受光元件,其於大致中央形成有孔;發光元件,其配置於上述受光元件之上述孔內; 引線框架,其具有分別安裝上述受光元件及上述發光元件的平坦的安裝部,且上述受光元件及上述發光元件分別藉由導電性接合劑接合於上述平坦的安裝部;引線端子,其沿著上述受光元件的外周設置,且自上述引線框架分離而形成;第1導線,其將設置於上述發光元件之發光面的電極與上述受光元件的第1電極連接;第2導線,其將上述受光元件的第2電極與上述引線端子連接;以及樹脂,其使上述受光元件之受光面及上述發光元件之上述發光面露出,並將上述受光元件之周緣部、上述第2導線、上述引線端子及上述引線框架之周緣部密封;且藉由上述導電性接合劑安裝於上述平坦的安裝部的上述受光元件之上述受光面與上述發光元件之上述發光面位於實質上同一平面上。 A semiconductor device comprising: a light-receiving element having a hole formed substantially in the center; a light-emitting element disposed in the hole of the light-receiving element; A lead frame having a flat mounting portion on which the light-receiving element and the light-emitting element are respectively mounted, and the light-receiving element and the light-emitting element are respectively bonded to the flat mounting portion with a conductive adhesive; a lead terminal along the above-mentioned The outer periphery of the light-receiving element is provided and separated from the above-mentioned lead frame; the first wire connects the electrode provided on the light-emitting surface of the above-mentioned light-emitting element to the first electrode of the above-mentioned light-receiving element; the second wire connects the above-mentioned light-receiving element the second electrode of the above-mentioned lead terminal; The peripheral portion of the lead frame is sealed; and the light receiving surface of the light receiving element mounted on the flat mounting portion with the conductive adhesive is substantially on the same plane as the light emitting surface of the light emitting element. 如請求項1至8中任一項所述之半導體裝置,其中,上述受光元件之上述受光面與上述發光元件之上述發光面之高度之差為10μm以內。The semiconductor device according to any one of claims 1 to 8, wherein a difference in height between the light receiving surface of the light receiving element and the light emitting surface of the light emitting element is within 10 μm.
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