TWI785195B - Semiconductor device - Google Patents
Semiconductor device Download PDFInfo
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- TWI785195B TWI785195B TW108103065A TW108103065A TWI785195B TW I785195 B TWI785195 B TW I785195B TW 108103065 A TW108103065 A TW 108103065A TW 108103065 A TW108103065 A TW 108103065A TW I785195 B TWI785195 B TW I785195B
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- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 claims 1
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- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/12—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof structurally associated with, e.g. formed in or on a common substrate with, one or more electric light sources, e.g. electroluminescent light sources, and electrically or optically coupled thereto
Abstract
本發明之半導體裝置具有:受光元件,其於既定之區域形成有孔;發光元件,其設置於受光元件之孔內;以及第1樹脂,其覆蓋受光元件之周緣部;受光元件之表面與發光元件之表面位於實質上同一平面上。The semiconductor device of the present invention has: a light receiving element having a hole formed in a predetermined area; a light emitting element disposed in the hole of the light receiving element; and a first resin covering the peripheral portion of the light receiving element; the surface of the light receiving element and the light emitting element The surfaces of the elements lie on substantially the same plane.
Description
本發明係關於一種半導體裝置。 The present invention relates to a semiconductor device.
習知,光學式編碼器等中所使用之受光發光單元係採用於設置有受光元件之晶片上搭載有發光元件之構造。受光發光單元係藉由使來自發光元件之光於配置於受光發光單元之外部之被測定體發生反射,由受光元件接收該反射光而傳遞訊號。該構造係於受光元件上積層發光元件之構造,因此受光發光元件之厚度變厚。於在受光發光元件之內部具有反射面之類型之光電耦合器中,已知有設為於受光元件之大致中央部設置發光元件收容孔,於該發光元件收容孔內配置發光元件之構造。該構造中,於發光元件收容孔之周側面設置反射層,使來自發光元件之光於反射層發生反射。根據該構造,由於將發光元件配置於設置於受光元件之發光元件收容孔內,故而可使受光發光單元之厚度變薄(例如參照專利文獻1)。 Conventionally, a light-receiving and light-emitting unit used in an optical encoder and the like adopts a structure in which a light-emitting element is mounted on a chip provided with a light-receiving element. The light-receiving and light-emitting unit reflects light from the light-emitting element on an object to be measured arranged outside the light-receiving and light-emitting unit, and receives the reflected light by the light-receiving element to transmit a signal. This structure is a structure in which light-emitting elements are laminated on light-receiving elements, so the thickness of the light-receiving and light-emitting elements becomes thicker. In a photocoupler of the type having a reflective surface inside a light-receiving and light-emitting element, there is known a structure in which a light-emitting element receiving hole is provided approximately in the center of the light-receiving element, and a light-emitting element is arranged in the light-emitting element receiving hole. In this structure, a reflective layer is provided on the peripheral side of the light-emitting element receiving hole, and the light from the light-emitting element is reflected on the reflective layer. According to this structure, since the light-emitting element is arranged in the light-emitting element housing hole provided in the light-receiving element, the thickness of the light-receiving and light-emitting unit can be reduced (for example, refer to Patent Document 1).
專利文獻1:日本專利實開昭58-148954號公報 Patent Document 1: Japanese Patent Laid-Open No. 58-148954
於上述專利文獻1中所記載之受光發光單元中,使發光元件之光於設置於發光元件收容孔之周側面之反射層發生反射,因此必須使受光元件之厚度厚於發光元件之厚度,換言之將發光元件之發光面配置於較受光元件之受光面高之位置,而提高反射率。即,受光元件之受光面與發光元件之發光面之高度方向之位置不同。因此,有受光元件之受光面至被測定體之距離與發光元件之發光面至被測定體之距離不同,無法獲得較高之檢測感度之問題。
In the light-receiving and emitting unit described in the above-mentioned
根據第1態樣,半導體裝置具有:受光元件,其於既定之區域形成有孔;引線框架,其具有形成有凹部的發光元件收容部,上述發光元件收容部收容於上述受光元件的上述孔中;發光元件,其設置於上述引線框架之上述發光元件收容部的底部內面;引線端子,其沿著上述受光元件的外周設置,且自上述引線框架分離而形成;以及第1樹脂,其覆蓋上述受光元件之周緣部;上述發光元件藉由導電性接合劑接合於上述引線框架之上述發光元件收容部的上述底部內面;且上述受光元件之受光面與上述發光元件之發光面位於實質上同一平面上。 According to the first aspect, the semiconductor device includes: a light-receiving element having a hole formed in a predetermined region; and a lead frame having a light-emitting element accommodating portion formed with a concave portion, the light-emitting element accommodating portion being accommodated in the hole of the light-receiving element a light-emitting element provided on the bottom inner surface of the light-emitting element housing portion of the lead frame; a lead terminal provided along the outer periphery of the light-receiving element and separated from the lead frame; and a first resin covering The peripheral portion of the above-mentioned light-receiving element; the above-mentioned light-emitting element is bonded to the bottom inner surface of the above-mentioned light-emitting element housing part of the above-mentioned lead frame by a conductive adhesive; and the light-receiving surface of the above-mentioned light-receiving element and the light-emitting surface of the above-mentioned light-emitting element are located substantially on the same plane.
根據第2態樣,半導體裝置具有:受光元件,其於既定之區域形成有孔;發光元件,其設置於上述受光元件之上述孔內;以及第1樹脂,其覆蓋上述受光元件之周緣部;上述受光元件之受光面與上述發光元件之發光面位於實質上同一平面上,其中,上述受光元件具有第1受光部、第2受光部、及連接部,上述連接部將上述第1受光部與上述第2受光部連接,且厚度薄於上述第1受光部及上述第2受光部,且上述受光元件之上述孔形成於上述連接部。 According to the second aspect, the semiconductor device includes: a light receiving element having a hole formed in a predetermined region; a light emitting element disposed in the hole of the light receiving element; and a first resin covering the peripheral portion of the light receiving element; The light-receiving surface of the above-mentioned light-receiving element and the light-emitting surface of the above-mentioned light-emitting element are located on substantially the same plane, wherein the above-mentioned light-receiving element has a first light-receiving part, a second light-receiving part, and a connecting part, and the connecting part connects the first light-receiving part and the light-emitting part. The second light receiving part is connected and thinner than the first light receiving part and the second light receiving part, and the hole of the light receiving element is formed in the connecting part.
根據第3態樣,半導體裝置具有:受光元件,其於大致中央形成有孔;發光元件,其配置於上述受光元件之上述孔內;引線端子,其配置於上述受光元件之外周;第1導線,其將設置於上述發光元件之發光面的第1電極與上述受光 元件連接;第2導線,其將上述發光元件的第2電極與上述引線端子連接;以及樹脂,其使上述受光元件之受光面及上述發光元件之上述第1電極露出,並將上述發光元件、上述受光元件、上述引線端子及上述第2導線密封;上述受光元件、上述發光元件及上述引線端子由上述樹脂保持;且上述受光元件之上述受光面與上述發光元件之上述發光面位於實質上同一平面上。 According to a third aspect, the semiconductor device includes: a light receiving element having a hole formed substantially in the center; a light emitting element disposed in the hole of the light receiving element; a lead terminal disposed on the outer periphery of the light receiving element; and a first wire , it connects the first electrode provided on the light emitting surface of the above light emitting element with the above light receiving element connection; a second lead for connecting the second electrode of the light-emitting element to the lead terminal; and a resin for exposing the light-receiving surface of the light-receiving element and the first electrode of the light-emitting element, and connecting the light-emitting element, The light-receiving element, the lead terminal, and the second wire are sealed; the light-receiving element, the light-emitting element, and the lead terminal are held by the resin; on flat surface.
根據第4態樣,半導體裝置具有:受光元件,其於大致中央形成有孔;發光元件,其配置於上述受光元件之上述孔內;引線框架,其具有分別安裝上述受光元件及上述發光元件的平坦的安裝部,且上述受光元件及上述發光元件分別藉由導電性接合劑接合於上述平坦的安裝部;引線端子,其沿著上述受光元件的外周設置,且自上述引線框架分離而形成;第1導線,其將設置於上述發光元件之發光面的電極與上述受光元件的第1電極連接;第2導線,其將上述受光元件的第2電極與上述引線端子連接;以及樹脂,其使上述受光元件之受光面及上述發光元件之上述發光面露出,並將上述受光元件之周緣部、上述第2導線、上述引線端子及上述引線框架之周緣部密封;且藉由上述導電性接合劑安裝於上述平坦的安裝部的上述受光元件之上述受光面與上述發光元件之上述發光面位於實質上同一平面上。 According to a fourth aspect, the semiconductor device includes: a light receiving element having a hole formed substantially in the center; a light emitting element disposed in the hole of the light receiving element; a flat mounting portion, and the light receiving element and the light emitting element are respectively bonded to the flat mounting portion with a conductive adhesive; lead terminals are provided along the outer periphery of the light receiving element and are formed by being separated from the lead frame; a first lead for connecting the electrode provided on the light emitting surface of the light emitting element to the first electrode of the light receiving element; a second lead for connecting the second electrode of the light receiving element to the lead terminal; and a resin for making The light-receiving surface of the light-receiving element and the light-emitting surface of the light-emitting element are exposed, and the periphery of the light-receiving element, the second lead, the lead terminal, and the lead frame are sealed; and the conductive adhesive The light receiving surface of the light receiving element mounted on the flat mounting portion and the light emitting surface of the light emitting element are located on substantially the same plane.
根據本發明,藉由使受光元件之表面、與設置於形成於受光元件之孔的發光元件之表面位於實質上同一平面上,可使物體及受光元件之距離與物體及發光元件之距離一致,而獲得較高之檢測感度。 According to the present invention, by making the surface of the light-receiving element and the surface of the light-emitting element disposed in the hole formed in the light-receiving element substantially on the same plane, the distance between the object and the light-receiving element can be made equal to the distance between the object and the light-emitting element, And get a higher detection sensitivity.
1:光電耦合器 1: Optocoupler
10:基板 10: Substrate
20:受光晶片 20: Light-receiving chip
21、31、32:接合線 21, 31, 32: bonding wire
30:發光晶片 30: Luminous chip
31:接合線 31: Bonding wire
41、51:樹脂 41, 51: Resin
101:引線端子 101: Lead terminal
102:中央部 102: central part
103:中央凹部 103: Central recess
105:安裝部 105: Installation Department
201:孔 201: hole
202:凹部 202: concave part
203:第1受光部 203: The first light receiving part
204:第2受光部 204: The second light receiving part
圖1係示意性地表示本發明之第1實施形態之半導體裝置之形狀之圖。 FIG. 1 is a diagram schematically showing the shape of a semiconductor device according to a first embodiment of the present invention.
圖2係示意性地表示第1實施形態之半導體裝置之形狀之圖。 FIG. 2 is a diagram schematically showing the shape of the semiconductor device according to the first embodiment.
圖3係示意性地表示第1實施形態之受光晶片之形狀之圖。 Fig. 3 is a diagram schematically showing the shape of a light-receiving chip according to the first embodiment.
圖4係說明第1實施形態之半導體裝置之製造方法之圖。 FIG. 4 is a diagram illustrating a method of manufacturing the semiconductor device according to the first embodiment.
圖5係說明第1實施形態之半導體裝置之製造方法之圖。 FIG. 5 is a diagram illustrating a method of manufacturing the semiconductor device according to the first embodiment.
圖6係示意性地表示本發明之第2實施形態之半導體裝置之形狀之圖。 FIG. 6 is a diagram schematically showing the shape of a semiconductor device according to a second embodiment of the present invention.
圖7係說明第2實施形態之半導體裝置之製造方法之圖。 FIG. 7 is a diagram illustrating a method of manufacturing a semiconductor device according to the second embodiment.
圖8係說明第2實施形態之半導體裝置之製造方法之圖。 FIG. 8 is a diagram illustrating a method of manufacturing a semiconductor device according to the second embodiment.
圖9係示意性地表示本發明之第3實施形態之半導體裝置之形狀之圖。 Fig. 9 is a diagram schematically showing the shape of a semiconductor device according to a third embodiment of the present invention.
圖10係說明第3實施形態之半導體裝置之製造方法之圖。 Fig. 10 is a diagram illustrating a method of manufacturing a semiconductor device according to the third embodiment.
圖11係說明第3實施形態之半導體裝置之製造方法之圖。 Fig. 11 is a diagram illustrating a method of manufacturing a semiconductor device according to the third embodiment.
以下,參照圖式而對用以實施本發明之形態進行說明。 Hereinafter, an embodiment for implementing the present invention will be described with reference to the drawings.
圖1~圖3係示意性地表示作為本發明之第1實施形態之半導體裝置的光電耦合器1之一例之圖。圖1(a)係俯視立體圖,圖1(b)係自圖1(a)移除樹脂之情形之俯視立體圖,圖2(a)係圖1(a)中之A-A'及B-B'剖面圖,圖2(b)係正面俯視圖,圖2(c)係背面俯視圖。但是,於圖2(a)中,A'-B剖面之區域省略圖示。圖3係後述之受光晶片之立體圖。此外,為了便於說明,使用如圖所示般設定之由X軸、Y軸、Z軸構成之座標系。
1 to 3 are diagrams schematically showing an example of a
又,作為半導體裝置,列舉光電耦合器1為例進行以下之說明,但作為半導體裝置,並不限定於光電耦合器1,亦可為光電微型感測器或標記感測器等。
In addition, as the semiconductor device, the
光電耦合器1係具有發光元件之發光晶片30及具有受光元件之受
光晶片20構成為一體之平置型光電耦合器。於圖1中,發光元件之發光面及受光元件之受光面均為上表面(Z軸方向+側)。本實施形態之光電耦合器1適於光學式編碼器用,自發光元件發出之光係向反射面之垂直方向、即與Z軸方向大致平行地發射。被測定體(未圖示)係配置於Z軸方向上之光電耦合器1之外部,光電耦合器1係構成為由受光元件接收自被測定體反射之光。
The
光電耦合器1具備:基板10、發光晶片30、受光晶片20、引線端子101、及樹脂51。
The
受光晶片20於內部具有多個受光元件(光電二極體:PD),於俯視下具有矩形形狀。此外,受光晶片20可構成為組合PD及電晶體而成之光電晶體,亦可構成為包括PD及構成該PD驅動用電路之積體電路的PDIC。如圖3所示,於受光晶片20之上表面之包含中央之既定之區域,形成有孔201。於該孔201內,收容後述之基板10之中央凹部103(參照圖2)。又,受光晶片20包含孔201,於沿著圖之X軸方向之區域形成有厚度較薄之連接部202(參照圖3)。受光晶片20係夾著連接部202而具備第1受光部203(圖之Y軸方向+側)、及第2受光部204(圖之Y軸方向-側)。連接部202之上表面(Z軸方向+側之面)係自第1受光部203之上表面及第2受光部204之上表面凹陷而形成。即,連接部202之上表面係配置於較第1受光部203之上表面及第2受光部204之上表面於Z軸方向+側低之位置。
The light-receiving
如圖2所示,基板10例如由引線框架等構成,且具有設置於上述之受光晶片20之連接部202之上部的中央部102。於基板10之中央部102,與受光晶片20之形成孔201之區域對應地形成有中央凹部(發光元件收容部)103。如上所述,中央凹部103係收容於受光晶片20之孔201內。引線端子101係沿著受光晶片20之第1受光部203及第2受光部204之外周而排列。如後所述,引線端子101最初係與基板10一起一體地形成為引線框架,係藉由將作為與引線框架
之連結部之引線部裁斷,自基板10分離而形成。中央部102之上表面(Z軸方向+側之面)與第1受光部203之上表面及第2受光部204之上表面成為大致同一面。受光晶片20之第1受光部203與第2受光部204藉由接合線21與引線端子101連接。基板10之中央凹部103之凹部之底面103a係以成為較中央部102之上表面低之位置(圖之Z軸方向-側)之方式形成中央凹部103。於中央凹部103之底面103a,設置發光晶片30。
As shown in FIG. 2 , the
發光晶片30具有發光元件,且設置於形成於上述之基板10之中央部102的中央凹部103之底面103a上。發光晶片30例如藉由銀膠或焊料等導電性接合劑電性接合於基板10。藉此,發光晶片30之一電極、例如陰極電極連接於基板10。發光晶片30之上表面即發光面、與受光晶片20之上表面即受光面對齊於實質上同一高度、即於Z軸方向上對齊於實質上同一位置。具體而言,發光晶片30之發光面與受光晶片20之受光面之高度之差設為較佳為30μm以下之範圍、更佳為10μm以下之範圍。於本說明書中,將發光晶片30之上表面與受光晶片20之上表面之Z軸方向之位置之差為30μm以下之範圍設為實質上相同者。換言之,以基板10之中央凹部103之底面103a成為較中央部102之上表面低發光晶片30之Z軸方向之大小之位置之方式,形成中央凹部103。
The light-emitting
發光晶片30之其他電極、例如陽極電極藉由接合線31與受光晶片20(圖中所示之例中為第1受光部203)連接。
Other electrodes of the light-emitting
如圖2(a)所示,基板10之中央部102於下表面側、即Z軸方向-側具有凹部102a。於基板10之中央部102之凹部102a內,收容受光晶片20之連接部202。受光晶片20之連接部202於收容於基板10之中央部102之凹部120a內之狀態下藉由樹脂41而密封。於光電耦合器1之上部(Z軸方向+側),將受光晶片20之周緣部、基板10之周緣部之引線端子101之一部分(即除背面(Z軸-側之面)以外之部分)、及接合線21藉由樹脂51而密封。此外,樹脂41及樹脂51
例如為如環氧樹脂般具有遮光性之不透明之樹脂。
As shown in FIG. 2( a ), the
參照圖4、圖5,對上述之光電耦合器1之製造方法進行說明。圖4、圖5與圖2(a)同樣地,為圖1(a)中之A-A'及B-B'剖面圖,該情形時,A'-B剖面之區域亦省略圖示。
Referring to FIG. 4 and FIG. 5 , a method of manufacturing the above-mentioned
如圖4(a)所示,於金屬或背面膠帶等較薄之支持基材60上,安裝形成有多個引線端子101、中央部102、中央凹部103之基板10、及受光晶片20。此外,形成基板10之母材係具有如可獲得多個光電耦合器1之大小者,但圖式中僅表示成為1個光電耦合器1之區域及其周圍。受光晶片20係以將連接部202配置於基板10之中央部102之凹部102a內之方式安裝。此時,基板10之中央部102之凹部102a的Z軸方向-側之面之高度係以於與受光晶片20之連接部的Z軸方向+側之面之間形成間隙g之方式預先設定。此外,基板10係預先準備可形成中央凹部103之厚度較厚之板狀之母材,藉由蝕刻等去除母材之一部分,形成凹部102a及中央凹部103。又,於該狀態下,基板10之中央部102及多個引線端子101一體地形成為於基板10之外周具有框架部之引線框架(未圖示),中央部102及各引線端子101藉由形成於引線框架之引線部102b連結於該引線框架。
As shown in FIG. 4( a ), on a
以覆蓋受光晶片20及基板10之方式利用樹脂41進行密封。此時,受光晶片20之連接部202係藉由填充於設置於基板10之中央部102之凹部102a內之樹脂,亦包括與基板10之中央部102之間之間隙部分在內,將整個周側面密封。使樹脂41硬化後,將支持基材60剝離去除而製成中間製品1A(圖4(b))。此外,根據支持基材60中所使用之金屬,亦可進行溶解去除。將中間製品1A之上下方向反轉,利用接合線21將受光晶片20與引線端子101進行接合連接(圖4(c))。以覆蓋受光晶片20之周緣部、基板10之周緣部之引線端子101之一部分(即除背面(Z軸-側之面)以外之部分)、及接合線21之方式利用樹脂51進行密封(圖4(d))。
It seals with
於形成於基板10之中央部102之中央凹部103之底面103a上,例如藉由使用銀膠等接著劑之粒接法(Die Bonding)連接發光晶片30(圖5(a))。利用接合線31將發光晶片30之電極與受光晶片20之電極進行接合連接(圖5(b))。其後,於圖5(c)之一點鏈線所示之位置,將連接基板10之中央部102及各引線端子101之引線部102b與樹脂51一起裁斷而單片化。藉此,獲得圖1所示之光電耦合器1。
On the
根據上述之第1實施形態,可獲得以下之作用效果。 According to the first embodiment described above, the following effects can be obtained.
(1)光電耦合器1具有:受光晶片20,其於既定之區域形成有孔201;發光晶片30,其設置於引線框架之中央凹部103;及樹脂51,其覆蓋受光晶片20之周緣部;且受光晶片20之表面與發光晶片30之表面位於實質上同一平面上。藉此,可使自發光晶片30出射之光於物體發生反射為止之移動距離、與由物體反射之光入射至受光晶片20為止之移動距離實質上相等。藉此,可提高檢測精度,而實現感測器之高感度化。
(1) The
又,與於受光晶片上載置發光晶片並利用接合線進行連接之情形相比,可減小Z軸方向之大小,因此可達成光電耦合器1之小型化、薄型化。
In addition, compared with the case where a light emitting chip is mounted on a light receiving chip and connected with a bonding wire, the size in the Z-axis direction can be reduced, so that miniaturization and thinning of the
又,於日本專利實開昭58-148954號公報中所揭示之先前技術中,將形成於電晶體之主面之孔部之側面與底面所成之角度設定為既定之值,由側面反射之光亦由受光元件接收。但是,藉由矽形成受光元件,藉由矽之各向異性蝕刻形成受光元件之發光元件收容孔。因此,由於將成為反射面之周側面相對於底面所成之傾斜角設定為53.7°之既定之角度,故而於特定之用途以外難以應用而通用性較低。相對於此,本實施形態並非為由受光晶片20接收由構造體之側面反射之光,因此亦可用於特定之用途以外,且可提供通用性高之半導體裝置。
Also, in the prior art disclosed in Japanese Patent Application Laid-Open No. 58-148954, the angle formed between the side surface and the bottom surface of the hole formed on the main surface of the transistor is set to a predetermined value, and the angle reflected by the side surface Light is also received by the light receiving element. However, the light-receiving element is formed by silicon, and the light-emitting element accommodation hole of the light-receiving element is formed by anisotropic etching of silicon. Therefore, since the inclination angle formed by the peripheral side surface to be the reflective surface with respect to the bottom surface is set at a predetermined angle of 53.7°, it is difficult to apply it outside of specific applications and the versatility is low. On the other hand, this embodiment does not receive the light reflected from the side surface of the structure by the light-receiving
(2)基板10具有作為設置發光晶片30之發光元件收容部之中央凹部103,於受光晶片20之孔201配置中央凹部103。藉此,可將發光晶片30設
置於基板10之中央凹部103上,因此可提高散熱性。
(2) The
(3)受光晶片20具有第1受光部203、第2受光部204、及連接部202,該連接部202將第1受光部203與第2受光部204連接,且厚度薄於第1受光部203及第2受光部204,且孔201設置於連接部202。藉此,可於使受光晶片20之表面與發光晶片30之表面位於實質上同一平面上之狀態下,將發光晶片30設置於基板10上,因此可實現檢測精度之提高及散熱性之提高。
(3) The light-receiving
(4)基板10具有收容受光晶片20之連接部202之凹部102a,且於收容有連接部202之凹部102a內填充樹脂41。樹脂41亦填充於基板10與受光晶片20之間之間隙g。藉此,可獲得較高之衝擊性。
(4) The
對本發明之第2實施形態之光電耦合器進行說明。於以下之說明中,對與第1實施形態相同之構成部分標註相同之符號而主要說明不同點。對於未特別說明之點則與第1實施形態相同。 A photocoupler according to a second embodiment of the present invention will be described. In the following description, the same code|symbol is attached|subjected to the same component as 1st Embodiment, and a different point is mainly demonstrated. Points not particularly described are the same as those of the first embodiment.
圖6係例示本發明之第2實施形態之光電耦合器1之圖,圖6(a)係剖面圖,圖6(b)係正面俯視圖,圖6(c)係背面俯視圖。此外,圖6(a)係圖6(b)中之C-C'剖面圖。
Fig. 6 is a diagram illustrating a
受光晶片20於俯視下具有矩形形狀,於包含中央之既定之區域形成孔201。受光晶片20於光電耦合器1之周緣部藉由接合線21與由引線框架等構成之多個引線端子101連接。於孔201設置發光晶片30。藉此,使發光晶片30之上表面即發光面、與受光晶片20之上表面即受光面對齊於實質上同一高度、即於Z軸方向上對齊於實質上同一位置。於第2實施形態中,亦與第1實施形態之情形同樣地,發光晶片30之發光面與受光晶片20之受光面之高度之差設為較佳為30μm以下之範圍、更佳為10μm以下之範圍。此外,於本實施形態中,尤其亦可將發光晶片30之發光面與受光晶片20之受光面之高度之差設為數μm以下
之範圍。
The light-receiving
發光晶片30藉由接合線31與受光晶片20連接,藉由接合線32與引線端子101連接。藉此,發光晶片30之一電極、例如陰極電極電性連接於引線端子101,另一電極、例如陽極電極電性連接於受光晶片20。
The light-emitting
於在受光晶片20之孔201中設置有發光晶片30之狀態下,受光晶片20、引線端子101之一部分(即除背面(Z軸-側之面)以外之部分)、發光晶片30、及接合線32於光電耦合器1之下部(Z軸方向-側)藉由樹脂41而密封。於光電耦合器1之上部(Z軸方向+側),將受光晶片20之周緣部、引線端子101、及接合線21藉由樹脂51而密封。此外,樹脂41及樹脂51例如為如環氧樹脂般具有遮光性之不透明之樹脂。
In the state where the light-emitting
參照圖7、圖8,對上述之第2實施形態之光電耦合器1之製造方法進行說明。圖7、圖8與圖6(a)同樣地,為圖6(b)中之C-C'剖面圖。
Referring to FIG. 7 and FIG. 8, a method of manufacturing the
如圖7(a)所示,於支持基材60上,安裝多個引線端子101、受光晶片20、及發光晶片30。此外,形成引線端子101之母材係具有如可獲得多個光電耦合器1之大小者,但於圖式中僅表示成為1個光電耦合器1之區域及其周邊。發光晶片30通過形成於受光晶片20之孔201而安裝於支持基材60上。又,於該狀態下,多個引線端子101一體地形成為於外周具有框架部之引線框架(未圖示),各引線端子101藉由形成於引線框架之引線部102b連結於該引線框架。
As shown in FIG. 7( a ), on a
利用接合線32將發光晶片30與引線端子101進行接合連接(圖7(b))。以覆蓋受光晶片20、引線端子101之一部分(即除背面(Z軸方向-側之面)以外之部分)、發光晶片30、及接合線32之方式利用樹脂41進行密封,使樹脂41硬化後,將支持基材60剝離去除而製成中間製品1A(圖7(c))。將中間製品1A之上下方向反轉,利用接合線21將受光晶片20與引線端子101進行接合連接(圖8(a))。以覆蓋受光晶片20之周緣部、引線端子101、及接合
線21之方式利用樹脂51進行密封(圖8(b))。利用接合線31將發光晶片30之電極與受光晶片20之電極進行接合連接(圖8(b))。
The light-emitting
其後,於圖8(c)之一點鏈線所示之位置,將連接各引線端子101之引線部102b與樹脂51一起裁斷而單片化。藉此,獲得圖6所示之光電耦合器1。
Thereafter, the
根據上述之第2實施形態,除藉由第1實施形態所獲得之(1)之作用效果以外,亦可獲得以下之作用效果。 According to the above-mentioned second embodiment, in addition to the effect of (1) obtained by the first embodiment, the following effects can also be obtained.
(1)將受光晶片20、發光晶片30、引線端子101之一部分、及接合線32自背面藉由樹脂41而密封。藉此,受光晶片20及發光晶片30之上表面以外係藉由樹脂41、51而覆蓋,因此可獲得較高之耐衝擊性。又,引線端子101呈L字狀地藉由樹脂41、51而密封,因此可製成可耐樹脂脫落之形狀。
(1) The light-receiving
(2)如圖7、圖8所示,於製造時,於支持基材60上安裝受光晶片20之上表面及發光晶片30之上表面,因此可使光電耦合器1之受光晶片20之上表面與發光晶片30之上表面以高精度位於同一平面上。
(2) As shown in Figures 7 and 8, during manufacture, the upper surface of the light-receiving
對本發明之第3實施形態之光電耦合器進行說明。於以下之說明中,對與第1實施形態相同之構成要素標附相同之符號而主要說明不同點。關於未特別說明之點,與第1實施形態相同。 A photocoupler according to a third embodiment of the present invention will be described. In the following description, the same code|symbol is attached|subjected to the same component as 1st Embodiment, and a different point is mainly demonstrated. About the point which is not demonstrated especially, it is the same as 1st Embodiment.
圖9係例示本發明之第3實施形態之光電耦合器1之圖,圖9(a)係剖面圖,圖9(b)係正面俯視圖,圖9(c)係背面俯視圖。此外,圖9(a)係圖9(b)中之D-D'剖面圖。
Fig. 9 is a diagram illustrating a
受光晶片20於俯視下具有矩形形狀,於包含中央之既定之區域形成孔201。受光晶片20及發光晶片30安裝於基板10。發光晶片30係通過形成於受光晶片20之孔201而安裝於基板10。藉此,發光晶片30例如藉由銀膠或焊
料等導電性接合劑接合於基板10,藉此一電極(例如陰極電極)電性連接於基板10。使發光晶片30之上表面即發光面、與受光晶片20之上表面即受光面對齊於實質上同一高度、即於Z軸方向上對齊於實質上同一位置。於第3實施形態中,亦與第1實施形態之情形同樣地,發光晶片30之發光面與受光晶片20之受光面之高度之差設為較佳為30μm以下之範圍、更佳為10μm以下之範圍。
The light-receiving
發光晶片30之另一電極、例如陽極電極藉由接合線31與受光晶片20連接。
Another electrode of the light-emitting
基板10例如由引線框架等構成,如上所述具有安裝受光晶片20及發光晶片30之安裝部105、及設置於周緣部之多個引線端子101。引線端子101與受光晶片20係藉由接合線21而連接。
The board|
受光晶片20、基板10之周緣部(即安裝部105之一部分、引線端子101之一部分(即除背面(Z軸-側之面)以外之部分))、及接合線21係於光電耦合器1之上部(Z軸方向+側)藉由樹脂51而密封。此外,樹脂51例如為如環氧樹脂般具有遮光性之不透明之樹脂。
The light-receiving
參照圖10、圖11,對上述之第3實施形態之光電耦合器1之製造方法進行說明。圖10、圖11與圖9(a)同樣地,為圖9(b)中之D-D'剖面圖。
Referring to FIG. 10 and FIG. 11, a method of manufacturing the
如圖10(a)所示,於支持基材60上,安裝形成有多個引線端子101、及安裝部105之基板10。此外,形成基板10之母材係具有如可獲得多個光電耦合器1之大小者,但於圖式中僅表示成為1個光電耦合器1之區域及其周圍。於基板10之安裝部105上,例如藉由使用銀膠等接著劑之粒接法連接受光晶片20。
As shown in FIG. 10( a ), the
利用接合線21將受光晶片20與引線端子101進行接合連接(圖10(b))。以覆蓋受光晶片20、基板10之周緣部、及接合線21之方式利用樹脂51進行密封,使樹脂51硬化後,將支持基材60剝離去除(圖10(c))。將發光晶片30通過形成於受光晶片20之孔201,例如藉由使用銀膠等接著劑之粒接法連接於基板10之安裝部105(圖11(a))。利用接合線31將發光晶片30之電
極與受光晶片20之電極進行接合連接(圖11(a))。其後,於圖11(b)之一點鏈線所示之位置,將樹脂51裁斷而單片化。藉此,獲得圖9所示之光電耦合器1。
The light-receiving
根據上述之第3實施形態,除藉由第1實施形態所獲得之(1)之作用效果以外,亦可獲得以下之作用效果。 According to the above-mentioned third embodiment, in addition to the effect of (1) obtained by the first embodiment, the following effects can also be obtained.
基板10具有保持受光晶片20及發光晶片30之安裝部105。藉此,可將發光晶片30設置於基板10上,因此可提高散熱性。
The
只要無損本發明之特徵,則本發明並不限定於上述實施形態,本發明之技術思想之範圍內所考慮到之其他形態亦包含於本發明之範圍內。 As long as the characteristics of the present invention are not impaired, the present invention is not limited to the above embodiments, and other forms considered within the scope of the technical idea of the present invention are also included in the scope of the present invention.
下述之優先權基礎申請案之揭示內容作為引用文套用至本文中。 The disclosure content of the following priority basic application is incorporated herein as a reference.
日本專利申請案2018年第012842號(2018年1月29日提出申請) Japanese Patent Application 2018 No. 012842 (filed on January 29, 2018)
1‧‧‧光電耦合器 1‧‧‧Optocoupler
10‧‧‧基板 10‧‧‧substrate
20‧‧‧受光晶片 20‧‧‧light receiving chip
30‧‧‧發光晶片 30‧‧‧Light-emitting chips
31‧‧‧接合線 31‧‧‧Joint wire
51‧‧‧樹脂 51‧‧‧Resin
101‧‧‧引線端子 101‧‧‧Lead terminal
102‧‧‧中央部 102‧‧‧Central Department
203‧‧‧第1受光部 203‧‧‧The first light receiving part
204‧‧‧第2受光部 204‧‧‧The second light receiving part
Claims (9)
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JPJP2018-012842 | 2018-01-29 | ||
JP2018012842A JP6620176B2 (en) | 2018-01-29 | 2018-01-29 | Semiconductor device |
PCT/JP2018/047287 WO2019146339A1 (en) | 2018-01-29 | 2018-12-21 | Semiconductor device |
WOPCT/JP2018/047287 | 2018-12-21 | ||
??PCT/JP2018/047287 | 2018-12-21 |
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JP6620176B2 (en) | 2019-12-11 |
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CN111656540A (en) | 2020-09-11 |
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