TWI770930B - Positioning device and method, resin molding system, and manufacturing method of resin molded product - Google Patents
Positioning device and method, resin molding system, and manufacturing method of resin molded product Download PDFInfo
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- 239000011347 resin Substances 0.000 title claims abstract description 60
- 229920005989 resin Polymers 0.000 title claims abstract description 60
- 238000000465 moulding Methods 0.000 title claims abstract description 54
- 238000000034 method Methods 0.000 title claims abstract description 22
- 238000004519 manufacturing process Methods 0.000 title claims description 9
- 238000005259 measurement Methods 0.000 claims abstract description 69
- 238000006073 displacement reaction Methods 0.000 claims abstract description 44
- 230000002093 peripheral effect Effects 0.000 claims abstract description 11
- 230000007423 decrease Effects 0.000 claims abstract description 6
- 230000003247 decreasing effect Effects 0.000 claims description 6
- 230000000052 comparative effect Effects 0.000 description 12
- 238000001514 detection method Methods 0.000 description 7
- 238000010586 diagram Methods 0.000 description 6
- 239000000758 substrate Substances 0.000 description 6
- 238000004806 packaging method and process Methods 0.000 description 4
- 239000004065 semiconductor Substances 0.000 description 4
- 235000012431 wafers Nutrition 0.000 description 4
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 238000000748 compression moulding Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000000284 extract Substances 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 230000010365 information processing Effects 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
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-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C45/00—Injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould; Apparatus therefor
- B29C45/14—Injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould; Apparatus therefor incorporating preformed parts or layers, e.g. injection moulding around inserts or for coating articles
- B29C45/14008—Inserting articles into the mould
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C43/00—Compression moulding, i.e. applying external pressure to flow the moulding material; Apparatus therefor
- B29C43/32—Component parts, details or accessories; Auxiliary operations
- B29C43/58—Measuring, controlling or regulating
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C31/00—Handling, e.g. feeding of the material to be shaped, storage of plastics material before moulding; Automation, i.e. automated handling lines in plastics processing plants, e.g. using manipulators or robots
- B29C31/008—Handling preformed parts, e.g. inserts
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C31/00—Handling, e.g. feeding of the material to be shaped, storage of plastics material before moulding; Automation, i.e. automated handling lines in plastics processing plants, e.g. using manipulators or robots
- B29C31/04—Feeding of the material to be moulded, e.g. into a mould cavity
- B29C31/08—Feeding of the material to be moulded, e.g. into a mould cavity of preforms to be moulded, e.g. tablets, fibre reinforced preforms, extruded ribbons, tubes or profiles; Manipulating means specially adapted for feeding preforms, e.g. supports conveyors
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C33/00—Moulds or cores; Details thereof or accessories therefor
- B29C33/12—Moulds or cores; Details thereof or accessories therefor with incorporated means for positioning inserts, e.g. labels
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C43/00—Compression moulding, i.e. applying external pressure to flow the moulding material; Apparatus therefor
- B29C43/02—Compression moulding, i.e. applying external pressure to flow the moulding material; Apparatus therefor of articles of definite length, i.e. discrete articles
- B29C43/18—Compression moulding, i.e. applying external pressure to flow the moulding material; Apparatus therefor of articles of definite length, i.e. discrete articles incorporating preformed parts or layers, e.g. compression moulding around inserts or for coating articles
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C43/00—Compression moulding, i.e. applying external pressure to flow the moulding material; Apparatus therefor
- B29C43/32—Component parts, details or accessories; Auxiliary operations
- B29C43/36—Moulds for making articles of definite length, i.e. discrete articles
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C45/00—Injection moulding, i.e. forcing the required volume of moulding material through a nozzle into a closed mould; Apparatus therefor
- B29C45/17—Component parts, details or accessories; Auxiliary operations
- B29C45/76—Measuring, controlling or regulating
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
- H01L21/56—Encapsulations, e.g. encapsulation layers, coatings
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C43/00—Compression moulding, i.e. applying external pressure to flow the moulding material; Apparatus therefor
- B29C43/02—Compression moulding, i.e. applying external pressure to flow the moulding material; Apparatus therefor of articles of definite length, i.e. discrete articles
- B29C43/18—Compression moulding, i.e. applying external pressure to flow the moulding material; Apparatus therefor of articles of definite length, i.e. discrete articles incorporating preformed parts or layers, e.g. compression moulding around inserts or for coating articles
- B29C2043/181—Compression moulding, i.e. applying external pressure to flow the moulding material; Apparatus therefor of articles of definite length, i.e. discrete articles incorporating preformed parts or layers, e.g. compression moulding around inserts or for coating articles encapsulated
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C43/00—Compression moulding, i.e. applying external pressure to flow the moulding material; Apparatus therefor
- B29C43/32—Component parts, details or accessories; Auxiliary operations
- B29C43/58—Measuring, controlling or regulating
- B29C2043/5875—Measuring, controlling or regulating the material feed to the moulds or mould parts, e.g. controlling feed flow, velocity, weight, doses
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- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Robotics (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Moulds For Moulding Plastics Or The Like (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Apparatuses And Processes For Manufacturing Resistors (AREA)
- Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
Abstract
期望一種能夠檢測工件的直線部分及槽口的定位裝置及方法、樹脂成形系統及樹脂成形品的製造方法。本發明的定位裝置包括:測定器,對旋轉的工件每隔固定的旋轉角度測定工件的周緣部的位移量;以及控制部,控制測定器以檢測工件的缺口部的中心位置,且控制部以基於測定結果的單調遞減的第一範圍及單調遞增的第二範圍的至少一部分的測定點的數量,來檢測工件的缺口部的中心位置的方式進行控制。 A positioning device and method, a resin molding system, and a resin molding method capable of detecting a straight portion and a notch of a workpiece are desired. The positioning device of the present invention includes: a measuring device for measuring the displacement amount of the peripheral edge portion of the workpiece for every fixed rotation angle of the rotating workpiece; and a control portion for controlling the measuring device to detect the center position of the notch portion of the workpiece, and the control portion The manner of detecting the center position of the notch portion of the workpiece is controlled based on the number of measurement points in at least a part of the first range that monotonically decreases and the second range that monotonically increases in the measurement result.
Description
本發明涉及一種定位裝置、定位方法、樹脂成形系統及樹脂成形品的製造方法。 The present invention relates to a positioning device, a positioning method, a resin molding system, and a method for manufacturing a resin molded product.
專利文獻1公開了一種俯視下包括直線部分的半導體晶圓的定向平面(orientation flat)(以下,記載為“定向平面”)的位置的檢測方法。參照此文獻的圖8而說明的檢測方法中,在圖8(a)所示的定向平面部分的軌跡中,從兩端部的數據中檢測與外緣位置數據對應的相反側外緣位置數據,並求出各平均值。自所述平均值中檢測眾數,以定向平面部分的中心位置為基準來進行半導體晶圓的對位。 Patent Document 1 discloses a method for detecting the position of an orientation flat (hereinafter, referred to as "orientation flat") of a semiconductor wafer including a straight portion in plan view. In the detection method described with reference to FIG. 8 of this document, in the trajectory of the orientation plane portion shown in FIG. 8( a ), the opposite-side outer edge position data corresponding to the outer edge position data is detected from the data of both end parts. , and find the average value of each. The mode is detected from the average value, and the alignment of the semiconductor wafer is performed based on the center position of the orientation flat portion.
[現有技術文獻] [Prior Art Literature]
[專利文獻] [Patent Literature]
[專利文獻1]日本專利特開平4-268746號公報 [Patent Document 1] Japanese Patent Laid-Open No. 4-268746
所述專利文獻1中,對半導體晶圓的定向平面部分的檢測進行了記載,但並未對槽口(notch)的檢測進行記載。另一方面, 期望一種能夠檢測工件的直線部分及槽口的技術。 The aforementioned Patent Document 1 describes the detection of the orientation flat portion of the semiconductor wafer, but does not describe the detection of the notch. on the other hand, A technique that can detect straight portions and notches of workpieces is desired.
為了解決所述課題,本發明的定位裝置包括:測定器,對旋轉的工件每隔固定的旋轉角度測定所述工件的周緣部的位移量;以及控制部,控制所述測定器以檢測所述工件的缺口部的中心位置。所述控制部構成為:以基於所述測定結果的單調遞減(monotonically decreasing)的第一範圍及單調遞增(monotonically increasing)的第二範圍的至少一部分的測定點的數量,來檢測工件的缺口部的中心位置的方式進行控制。 In order to solve the above-mentioned problems, the positioning device of the present invention includes: a measuring device for measuring the displacement amount of the peripheral edge portion of the workpiece for every fixed rotation angle of the rotating workpiece; and a control unit for controlling the measuring device to detect the The center position of the notch of the workpiece. The control unit is configured to detect the notch of the workpiece as the number of measurement points in at least a part of a first range that is monotonically decreasing and a second range that is monotonically increasing based on the measurement result the center position of the control.
本發明的定位方法包括:測定步驟,使工件旋轉,每隔固定的旋轉角度測定所述工件的周緣部的位移量;以及檢測步驟,基於所述測定步驟中測定的測定結果的單調遞減的第一範圍及單調遞增的第二範圍的至少一部分的測定點的數量,來檢測工件的缺口部的中心位置。 The positioning method of the present invention includes: a measuring step of rotating a workpiece, and measuring the displacement amount of the peripheral edge portion of the workpiece every fixed rotation angle; The number of measurement points in at least a part of a range and a monotonically increasing second range is used to detect the center position of the notch portion of the workpiece.
本發明的樹脂成形系統包括樹脂成形裝置,所述樹脂成形裝置配置由所述定位裝置定位的所述工件來進行樹脂成形。 The resin molding system of the present invention includes a resin molding device that performs resin molding by arranging the workpiece positioned by the positioning device.
本發明的樹脂成形品的製造方法是使用所述樹脂成形系統對所述工件進行樹脂成形。 The manufacturing method of the resin molded product of this invention performs resin molding on the said workpiece|work using the said resin molding system.
根據本發明,可提供一種能夠檢測俯視下包括直線部分及槽口的工件的缺口部的中心位置的定位裝置、定位方法、樹脂成形系統及樹脂成形品的製造方法。 According to the present invention, there can be provided a positioning device, a positioning method, a resin molding system, and a manufacturing method of a resin molded product capable of detecting the center position of a notch portion of a workpiece including a straight portion and a notch in plan view.
10:樹脂成形系統 10: Resin molding system
20:定位裝置 20: Positioning device
30:樹脂成形裝置 30: Resin molding device
40:控制部 40: Control Department
21:旋轉台 21: Rotary table
22:測定器 22: Measuring device
A:位移量的平均值 A: Average value of displacement
C:中央測定點 C: Central measuring point
E:測定範圍 E: Measuring range
P:旋轉軸 P: Rotary axis
R:第三範圍 R: third range
S1~S8、C1~C6:步驟 S1~S8, C1~C6: Steps
W:工件 W: workpiece
s、t、u、v:測定點 s, t, u, v: measuring points
圖1是示意性表示本實施方式的樹脂成形系統的結構的圖。 FIG. 1 is a diagram schematically showing the configuration of a resin molding system according to the present embodiment.
圖2的(a)及圖2的(b)是示意性表示本實施方式的定位裝置的平面圖及側面圖。 FIGS. 2( a ) and 2 ( b ) are a plan view and a side view schematically showing the positioning device of the present embodiment.
圖3是表示本實施方式的工件的定位方法的流程圖。 FIG. 3 is a flowchart showing a workpiece positioning method according to the present embodiment.
圖4的(a)及圖4的(b)是表示基於本實施方式及比較例的工件的定位方法的測定數據的圖。 FIGS. 4( a ) and 4 ( b ) are diagrams showing measurement data based on the workpiece positioning method of the present embodiment and the comparative example.
圖5是表示比較例的工件的定位方法的流程圖。 FIG. 5 is a flowchart showing a positioning method of a workpiece according to a comparative example.
圖6的(a)及圖6的(b)是表示基於本實施方式及比較例的工件的定位方法的測定數據的圖。 FIGS. 6( a ) and 6 ( b ) are diagrams showing measurement data based on the workpiece positioning method of the present embodiment and the comparative example.
<本發明的一實施方式> <One Embodiment of the Present Invention>
以下,參照圖式對本發明的實施方式詳細地進行說明。再者,對圖中相同或相當部分標注相同符號而不重複其說明。 Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings. In addition, the same code|symbol is attached|subjected to the same or corresponding part in a figure, and the description is not repeated.
<樹脂成形系統10的結構>
<Configuration of
以下,對本實施方式的樹脂成形系統10的樹脂成形的基本結構進行說明。
Hereinafter, the basic structure of resin molding of the
圖1是示意性表示按照本實施方式的樹脂成形系統10的結構的圖。此樹脂成形系統10構成為通過使用所謂的壓縮成型法(compression mold)來製造樹脂成形品。如圖1所示,樹脂成形系統10包括定位裝置20、樹脂成形裝置30、控制部40。
FIG. 1 is a diagram schematically showing the configuration of a
定位裝置20包括旋轉台21及測定器22。在定位裝置20中,例如,如後述那樣對工件W進行定位。作為工件W的一例,可列舉矽晶圓等半導體基板、引線框、印刷配線基板、金屬制基板、樹脂制基板、玻璃制基板、陶瓷制基板等。另外,基板W也可以是用於扇出型晶圓級封裝(Fan Out Wafer Level Packaging,FOWLP)、扇出型面板級封裝(Fan Out Panel Level Packaging,FOPLP)的載體。進而,既可以是已經實施了配線的工件,也可以是未配線的工件。
The
樹脂成形裝置30包括成形模(未圖示)及將此成形模合模的合模機構(未圖示)。在樹脂成形裝置30中,例如對由定位裝置20定位的工件W進行樹脂成形。
The
控制部40包括中央處理器(Central Processing Unit,CPU)、隨機存取記憶體(Random Access Memory,RAM)以及只讀記憶體(Read Only Memory,ROM)等,且構成為根據信息處理進行各結構要素的控制。控制部40構成為至少控制定位裝置20,在本實施方式中構成為也控制樹脂成形裝置30。
The
<樹脂成形系統10的動作>
<Operation of the
以下,說明本實施方式的樹脂成形系統10的樹脂成形的基本動作。
Hereinafter, the basic operation of resin molding by the
利用機械手(robot hand)等(未圖示)將搬入到樹脂成形系統內的工件W配置在定位裝置的旋轉台21上。將由定位裝置定位的工件W利用機械手等轉移到輸送機構(未圖示),利用
輸送機構將工件W輸送到樹脂成形裝置的成形模,使用合模機構將成形模合模而進行樹脂成形,製造樹脂成形品。
The workpiece W carried into the resin molding system is placed on the
<工件W的定位部20的結構>
<Configuration of the
圖2的(a)及圖2的(b)是示意性表示定位裝置20的圖,圖2的(a)是平面圖,圖2的(b)是側面圖。如圖2的(a)及圖2的(b)所示,定位裝置20包括旋轉台21及測定器22。
FIGS. 2( a ) and 2 ( b ) are diagrams schematically showing the
旋轉台21構成為以旋轉軸P為中心旋轉。在旋轉部21的上部配置工件W。旋轉台21例如能夠利用馬達進行旋轉。旋轉台21例如能夠吸附並固定工件W。
The
測定器22構成為測定配置在旋轉台21上的工件W的周緣部的位移量。作為測定器22的一例,可列舉光學式感測器,更具體地可列舉雷射位移計。
The
<工件W的定位裝置20的動作>
<Operation of the
以下,說明本實施方式的定位裝置20的基本動作。
Hereinafter, the basic operation of the
圖3是由定位裝置20進行的工件W的定位動作的流程圖。此流程圖所示的處理例如由樹脂成形系統10所包含的控制部40執行。再者,也可構成為在定位裝置20中包括控制部40。
FIG. 3 is a flowchart of the positioning operation of the workpiece W by the
參照圖2的(a)及圖2的(b),控制部40利用機械手等使工件W配置在旋轉台21上,求出工件W的旋轉中心位置,使其與旋轉台21的旋轉軸P一致來進行中心對準(步驟S1)。針對此,可使用公知的方法。例如,在旋轉台21上配置工件W,在偏心的狀態下使其以固定的旋轉速度旋轉,根據測定器22的位移
量的輸出求出工件W的中心與旋轉台21的旋轉軸P的偏心量。基於此偏心量,將工件W重新配置在旋轉台21上。
Referring to FIGS. 2( a ) and 2 ( b ), the
控制部40使旋轉台21以固定的旋轉速度開始旋轉(步驟S2)。再者,此處的旋轉速度比上述中心對準的步驟S1的旋轉速度慢。
The
控制部40每隔固定時間從測定器22取得配置在旋轉台21上的工件W的周緣部的位移量(步驟S3)。控制部40在取得位移量結束後,使旋轉台21停止(步驟S4)。再者,步驟S3的從測定器22取得位移量的測定範圍E可基於上述中心對準的步驟S1中的結果來設定。
The
圖4的(a)、圖4的(b)是將步驟S3中的來自測定器22的輸出圖表化的圖,步驟S3取得定位裝置20對工件W進行的定位動作的位移量。在此圖表中,縱軸表示從測定器22取得的位移量,橫軸表示根據旋轉台21的旋轉速度算出的旋轉角度,縱軸及橫軸的單位均任意。此處,作為工件W,使用俯視下包含直線部分的工件W,作為測定範圍E,以包含直線部分的中心位置的方式預先設定。圖4的(b)是將圖4的(a)的工件W直線部分的中心位置附近放大的圖。圖4的(a)、圖4的(b)的縱軸的位移量成為對應於從工件W的旋轉中心到周緣部的距離的值。
FIGS. 4( a ) and 4 ( b ) are diagrams graphing the output from the measuring
在圖4的(a)及圖4的(b)所示的圖表中,A表示從測定器22取得的位移量的平均值,N表示測定點的個數,C表示位移量的平均值A以下的測定點中位於中央的測定點。再者,中
央測定點C是N1與N2的數量相同的點。
In the graphs shown in FIG. 4( a ) and FIG. 4( b ), A represents the average value of the displacement amount obtained from the measuring
參照圖4的(a)及圖4的(b),控制部40通過取得位移量的步驟S3的處理,算出從測定器22取得的位移量的全部數據的平均值A(步驟S5)。控制部40提取成為所算出的平均值A以下的位移量的測定點(步驟S6)。控制部40根據所提取的測定點,算出對於旋轉角度成為中央的中央測定點C(步驟S7),並將此中央測定點C作為工件W的缺口部的中心位置進行檢測(步驟S8)。在平均值A以下的測定點為奇數的情況下,中央測定點C為1點,而在平均值A以下的測定點為偶數的情況下,中央測定點C為2點,因此可將任意1點檢測為中心位置,也可將所述2點之間檢測為中心位置。
4( a ) and 4 ( b ), the
在圖4的(a)及圖4的(b)中,示出了檢測俯視下包括直線部分的工件W的直線部分的中心位置時的數據,但也可通過相同的步驟S1~步驟S8的處理來檢測工件W的槽口的中心位置。再者,在圖4的(a)及圖4的(b)的例子中,根據平均值A以下的測定點求出中央,但在圖4的(a)中,也可在橫切輸出值(測定值)單調遞減的曲線與單調遞增的曲線兩者的水平方向的直線之下的範圍,求出成為中央的中央測定點C。 4( a ) and 4 ( b ) show data obtained when the center position of the linear portion of the workpiece W including the linear portion is detected in plan view, but the same steps S1 to S8 may be used. Processed to detect the center position of the notch of the workpiece W. In addition, in the example of FIG. 4(a) and FIG. 4(b), the center is obtained from the measurement points below the average value A, but in FIG. 4(a), the output value may be cross-cut. (Measured value) The range below the straight line in the horizontal direction of both the monotonically decreasing curve and the monotonically increasing curve is obtained, and the central measurement point C serving as the center is obtained.
另外,在圖4的(a)及圖4的(b)的例子中,在輸出值(測定值)單調遞減的第一範圍與單調遞增的第二範圍之間存在第三範圍R。在此種情況下,根據第一範圍及第二範圍的平均值A等固定值以下的測定點、及第三範圍R的測定點求出中央測 定點C即可。再者,圖4的(b)所示的範圍為第三範圍R。 In addition, in the example of FIG.4(a) and FIG.4(b), the 3rd range R exists between the 1st range which monotonically decreases the output value (measurement value), and the 2nd range which monotonically increases. In this case, the central measurement point is obtained from the measurement points at or below a fixed value such as the average value A of the first range and the second range, and the measurement points in the third range R. Just point C. In addition, the range shown in FIG.4(b) is a 3rd range R. As shown in FIG.
在以上說明的定位裝置20對工件W實施的動作之後,如上所述,利用機械手等將定位後的工件W轉移到輸送機構,利用輸送機構將工件W輸送到樹脂成形裝置的成形模。然後,使用合模機構對成形模進行合模並進行樹脂成形,而可製造樹脂成形品。
After the above-described operation of the
<比較例> <Comparative example>
圖5是比較例的工件W的定位動作的流程圖,與圖3對應。再者,定位裝置的基本結構與本發明相同。 FIG. 5 is a flowchart of the positioning operation of the workpiece W according to the comparative example, and corresponds to FIG. 3 . Furthermore, the basic structure of the positioning device is the same as that of the present invention.
在圖5中,步驟C1~步驟C3與圖3的步驟S1~步驟S3相同,因此省略說明。在比較例中,依次取得來自測定器22的位移量的輸出,並將第二次以後取得的測定點與緊接在其之前取得的測定點進行位移量的比較處理。在以下的說明中,對於剛剛取得的測定點或位移量使用“本次”的表述,對於在緊接其之前取得的測定點或位移量使用“上次”的表述。
In FIG. 5 , the steps C1 to C3 are the same as the steps S1 to S3 of FIG. 3 , and thus the description is omitted. In the comparative example, the output of the displacement amount from the measuring
控制部40針對在第二次以後取得的測定點,將從測定器22取得的工件W的周緣部的位移量與上次的位移量進行比較,如果本次取得的位移量比上次的位移量小,則返回步驟C3。(步驟C4)
The
在步驟C4中,如果本次取得的位移量大於或等於上次的位移量,則控制部40將上次的位移量視為最小位移量,使旋轉台21停止(步驟C5)。控制部40將最小位移量的測定點檢測為工件
W的缺口部的中心位置(步驟C6)。再者,在步驟C2及步驟C5中,也可在旋轉了預先設定的角度後停止旋轉。另外,步驟C6也可不等待步驟C5的旋轉停止而進行檢測。
In step C4, if the displacement amount acquired this time is greater than or equal to the previous displacement amount, the
圖6的(a)、圖6的(b)與圖4的(a)、圖4的(b)對應,是將比較例的對工件W的定位動作的步驟C3中的來自測定器22的輸出圖表化的圖。圖6的(b)是將圖6的(a)的工件W的槽口的中心位置附近放大的圖。
FIGS. 6( a ) and 6 ( b ) correspond to FIGS. 4 ( a ) and 4 ( b ), and are signals from the measuring
在比較例的工件W的定位動作的步驟C3~步驟C4中,在檢測出槽口的中心位置的情況下,如以下般進行處理。參照圖6的(b),控制部40從測定器22取得測定點t。當比較上次的測定點s與本次取得的測定點t時,本次取得的測定點t與上次的測定點s相等,所以將上次的測定點s視為最小位移量,將測定點s作為工件W的缺口部的中心位置進行檢測。
In steps C3 to C4 of the positioning operation of the workpiece W of the comparative example, when the center position of the notch is detected, the following processing is performed. Referring to FIG. 6( b ), the
在比較例的工件W的定位動作中,例如,如圖6的(b)所示,在最小位移量排列3個點的情況下,會將最初測定的測定點s檢測為工件W的缺口部的中心位置。因此,會將略微偏離本來的工件W的缺口部的中心位置即測定點t的位置視為工件W的缺口部的中心位置。 In the positioning operation of the workpiece W of the comparative example, for example, as shown in FIG. 6( b ), when three points are arranged with the minimum displacement amount, the measurement point s measured first is detected as the notch portion of the workpiece W the center position. Therefore, the position of the measurement point t, which is slightly deviated from the center position of the notch portion of the original workpiece W, is regarded as the center position of the notch portion of the workpiece W. FIG.
另外,在通過比較例的工件W的定位動作來檢測定向平面部分的中心位置的情況下,如以下般進行處理。參照圖4的(b),控制部40從測定器22取得測定點v。當控制部40比較上次的測定點u與本次取得的測定點v時,本次取得的測定點v比上次的
測定點u大,所以將上次的測定點u視為最小位移量,將測定點u檢測為工件W的缺口部的中心位置。因此,會在檢測出真正的缺口部的中心位置即中央測定點C之前,結束位移量以及旋轉角度信息的測定以及取得。
In addition, in the case where the center position of the orientation flat portion is detected by the positioning operation of the workpiece W of the comparative example, the following processing is performed. Referring to FIG. 4( b ), the
因此,比較例的工件W的定位動作雖然與所述的本實施方式相比精度差,但能夠進行槽口的中心位置的檢測,但難以進行直線部分的中心位置的檢測。 Therefore, although the accuracy of the positioning operation of the workpiece W of the comparative example is lower than that of the present embodiment described above, the detection of the center position of the notch can be performed, but the detection of the center position of the linear portion is difficult.
另一方面,當通過本發明的工件W的定位動作進行處理時,如上所述,能夠檢測出俯視下包括直線部分及槽口的工件W的缺口部的中心位置。如果是圖6所示的例子,在應用了本發明的情況下,能夠將測定點t檢測為槽口的中心位置,與比較例相比能夠進行更高精度的檢測。 On the other hand, when processing is performed by the positioning operation of the workpiece W of the present invention, as described above, the center position of the notch portion of the workpiece W including the straight portion and the notch in plan view can be detected. In the example shown in FIG. 6 , when the present invention is applied, the measurement point t can be detected as the center position of the notch, and detection can be performed with higher accuracy than the comparative example.
<其他實施方式> <Other Embodiments>
上述實施方式的思想並不限定於以上說明的實施方式。以下,對可應用上述實施方式的思想的其他實施方式的一例進行說明。 The idea of the above-described embodiment is not limited to the above-described embodiment. Hereinafter, an example of another embodiment to which the idea of the above-described embodiment can be applied will be described.
在按照上述實施方式的樹脂成形系統10中,由控制部40進行定位裝置10及樹脂成形裝置20的控制。但是,定位裝置10及樹脂成形裝置20的控制未必需要由共同的控制部40進行。例如,定位裝置10及樹脂成形裝置20也可以分別具有專用的控制部。
In the
另外,在按照上述實施方式的控制部40中,進行步驟S6
~步驟S8的處理,檢測工件W的缺口部的中心位置。但是,也可不必算出平均值,算出工件W的旋轉角度信息的中位數C來檢測工件W的缺口部的中心位置。例如,也可以如下方式進行控制:基於從測定器22取得的測定結果的單調遞減的範圍與單調遞增的範圍的測定點的數量,檢測工件W的缺口部的中心位置。
In addition, in the
<本實施方式的效果> <Effects of the present embodiment>
本實施方式的定位裝置包括:測定器,對旋轉工件W每隔固定的旋轉角度測定工件的周緣部的位移量;以及控制部,對測定器進行控制,以檢測工件W的缺口部的中心位置,控制部以如下方式進行控制:基於測定結果的單調遞減的第一範圍及單調遞增的第二範圍的至少一部分的測定點的數量,檢測工件W的缺口部的中心位置。如果是此定位裝置,則能夠檢測出在俯視下包括直線部分及槽口的工件W的缺口部的中心位置。 The positioning device according to the present embodiment includes: a measuring device for measuring the displacement amount of the peripheral portion of the workpiece W for every fixed rotation angle of the rotating workpiece; , the control unit controls to detect the center position of the notch portion of the workpiece W based on the number of measurement points in at least a part of the first range that monotonically decreases and the second range that monotonically increases of the measurement result. According to this positioning device, the center position of the notch portion of the workpiece W including the straight portion and the notch in plan view can be detected.
作為具體的定位裝置的結構,理想的是包括控制部,此控制部在上述第一範圍與上述第二範圍之間存在第三範圍的情況下,以基於第一範圍及第二範圍的至少一部分與第三範圍的測定點的數量,檢測工件W的缺口部的中心位置的方式進行控制。 As a specific configuration of the positioning device, it is desirable to include a control unit that, when a third range exists between the first range and the second range, is based on at least a part of the first range and the second range. The number of measurement points in the third range is controlled so that the center position of the notch portion of the workpiece W is detected.
作為具體的定位裝置的結構,理想的是包括算出測定結果的平均值、並將此平均值以下的全部測定結果的中位數檢測為中心位置的控制部。通過設為平均值以下,能夠與工件的尺寸無關地高精度地檢測。 As a specific configuration of the positioning device, it is desirable to include a control unit that calculates the average value of the measurement results and detects the median of all the measurement results below the average value as the center position. By making it equal to or less than the average value, it is possible to detect with high accuracy regardless of the size of the workpiece.
另外,本實施方式的樹脂成形系統包括配置由上述定位 裝置定位的工件而進行樹脂成形的樹脂成形裝置。如果為此種樹脂成形系統,則能夠檢測出在俯視下包含直線部分及槽口的工件的缺口部的中心位置,能夠進行高精度定位的工件的樹脂成形。 In addition, the resin molding system of the present embodiment includes the arrangement by the above-mentioned positioning A resin molding device that performs resin molding by positioning the workpiece. According to such a resin molding system, the center position of the notch portion of the workpiece including the straight portion and the notch in plan view can be detected, and the resin molding of the workpiece with high precision positioning can be performed.
進而,如果是本實施方式的樹脂成形品的製造方法,則使用上述的樹脂成形系統對工件進行樹脂成形。如果是此種樹脂成形品的製造方法,則能夠進行高精度定位的工件的樹脂成形,因此能夠製造高品質的樹脂成形品。 Furthermore, in the manufacturing method of the resin molded article of the present embodiment, the workpiece is resin-molded using the above-described resin molding system. According to the manufacturing method of such a resin molded product, since resin molding of a workpiece with high precision positioning can be performed, a high-quality resin molded product can be manufactured.
此外,本實施方式的定位方法包括:測定步驟,使工件旋轉,每隔固定的旋轉角度測定工件的周緣部的位移量;以及檢測步驟,基於在所述測定步驟中測定的測定結果的單調遞減的第一範圍及單調遞增的第二範圍的至少一部分的測定點的數量,檢測工件的缺口部的中心位置。如果為此種定位方法,則能夠檢測出在俯視下包括直線部分及槽口的工件的缺口部的中心位置。 Further, the positioning method of the present embodiment includes: a measuring step of rotating the workpiece, and measuring the displacement amount of the peripheral portion of the workpiece every fixed rotation angle; and a detection step of monotonically decreasing based on the measurement result measured in the measuring step The number of measurement points in at least a part of the first range and the monotonically increasing second range detects the center position of the notch portion of the workpiece. With such a positioning method, the center position of the notch portion of the workpiece including the straight portion and the notch in plan view can be detected.
以上對本發明的實施方式進行了例示說明。即,由於例示性的說明,公開了詳細的說明以及附圖。因此,在詳細的說明及附圖所記載的結構要素中,為了解決課題有時包含並非必須的結構要素。因此,不能因為在詳細的說明及附圖中記載了這些並非必須的結構要素,而直接認定為這些並非必須的結構要素是必須的。 The embodiments of the present invention have been described above as examples. That is, the detailed description and the drawings are disclosed for the illustrative description. Therefore, among the components described in the detailed description and the drawings, components that are not necessary in order to solve the problem may be included. Therefore, since these unnecessary structural elements are described in the detailed description and drawings, it cannot be directly recognized that these unnecessary structural elements are essential.
另外,上述實施方式在所有方面只不過是本發明的例示。上述實施方式能夠在本發明的範圍內進行各種改良或變更。即,在實施本發明時,可根據實施方式適當採用具體的結構。 In addition, the above-mentioned embodiment is only an illustration of this invention in every respect. The above-described embodiments can be variously improved or changed within the scope of the present invention. That is, in carrying out the present invention, a specific structure can be appropriately adopted according to the embodiment.
S1~S8:步驟 S1~S8: Steps
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