TWI762913B - Detection method - Google Patents
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- TWI762913B TWI762913B TW109113884A TW109113884A TWI762913B TW I762913 B TWI762913 B TW I762913B TW 109113884 A TW109113884 A TW 109113884A TW 109113884 A TW109113884 A TW 109113884A TW I762913 B TWI762913 B TW I762913B
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Abstract
一種檢測方法,適用於檢測一電路板的一盲孔內的一填膠,該檢測方法包含一準備步驟、一檢測步驟,及一處理步驟。該準備步驟準備一檢測裝置,該檢測裝置包括一具有一第一波長範圍的激發光源、一光接收器,及一與該光接收器連接的處理單元。該檢測步驟以該激發光源照射該填膠,使該填膠被該激發光源激發產生一具有與該第一波長範圍不同的第二波長範圍的光致螢光,該光接收器可接收該光致螢光並產生對應的光致螢光訊號。該處理步驟以該處理單元接收該光致螢光訊號並進行灰階轉換,以得到一填膠灰階影像。A detection method is suitable for detecting a glue filling in a blind hole of a circuit board. The detection method includes a preparation step, a detection step, and a processing step. The preparation step prepares a detection device, the detection device includes an excitation light source having a first wavelength range, a light receiver, and a processing unit connected to the light receiver. In the detecting step, the filler is irradiated with the excitation light source, so that the filler is excited by the excitation light source to generate a photofluorescence light having a second wavelength range different from the first wavelength range, and the light receiver can receive the light fluoresce and generate a corresponding photoluminescence signal. In the processing step, the processing unit receives the photoluminescence signal and performs grayscale conversion to obtain a glue-filled grayscale image.
Description
本發明是有關於一種檢測方法,特別是指一種用於檢測電路板的盲孔中的填膠是否凹陷的檢測方法。The present invention relates to a detection method, in particular to a detection method for detecting whether the glue filling in the blind hole of a circuit board is concave.
現有電子產品已朝向輕薄短小且具多功能的趨勢發展,因此,內部電路板往往堆疊了多層的線路結構,一般常透過開設一盲孔(via)並進行電鍍來連通不同層間的線路結構,隨後對盲孔進行填膠及刮除溢出的填膠,使在盲孔中的填膠的頂面能與電路板的表面齊平,而在刮除溢出填膠的同時,會填膠的頂面佈有銅屑層,以利後續在電路板的表面形成 外層電路。Existing electronic products have been developing towards the trend of being light, thin, short, and multi-functional. Therefore, the internal circuit boards are often stacked with multi-layer circuit structures. Generally, a blind hole (via) is opened and electroplated to connect the circuit structures between different layers. Fill the blind holes and scrape the overflowing glue, so that the top surface of the glue filling in the blind holes can be flush with the surface of the circuit board, and while scraping the overflowing glue, the top surface of the glue filling will be A layer of copper chips is arranged to facilitate the subsequent formation of an outer layer circuit on the surface of the circuit board.
因此,當盲孔中所填的填膠的頂面沒有與電路板的表面齊平時(即填膠的頂面凹陷在盲孔中),則該填膠凹陷處的頂面不會有該銅屑層,使得後續在電路板上形成的外層電路容易造成短路或斷路。Therefore, when the top surface of the filler in the blind hole is not flush with the surface of the circuit board (that is, the top surface of the filler is recessed in the blind hole), the top surface of the recess of the filler will not have the copper The chip layer makes the outer circuit formed on the circuit board easy to cause short circuit or open circuit.
因此,以填膠對該盲孔進行塞孔並刮除溢出的填膠後,會先透過自動光學檢測系統對盲孔中的填膠進行外觀檢測,以確保填在該盲孔中的填膠的頂面與電路板的表面齊平而具有銅屑層,然而,電路板的其他處也常會因碰撞產生凹陷,或板材金屬因化學氧化產生的異物導致不同型態的突起與凹陷,現有的光學檢測以反射光進行其外觀檢測時,並無法有效辨別填膠的頂面的凹陷與電路板因外在因素產生的凹陷兩者的差異,因而容易將此兩種凹陷一併進行判斷而造成誤差。Therefore, after plugging the blind hole with glue and scraping off the overflowing glue, the appearance inspection of the glue in the blind hole will be carried out through the automatic optical inspection system first to ensure that the glue filled in the blind hole is The top surface of the circuit board is flush with the surface of the circuit board and has a copper chip layer. However, other parts of the circuit board often have depressions due to collisions, or different types of protrusions and depressions caused by foreign matter generated by chemical oxidation of the sheet metal. The existing When optical inspection uses reflected light for its appearance inspection, it cannot effectively distinguish the difference between the depression on the top surface of the glue filling and the depression caused by external factors on the circuit board, so it is easy to judge the two depressions together. error.
因此,本發明的目的,即在提供一種檢測方法。Therefore, the purpose of the present invention is to provide a detection method.
於是,本發明該檢測方法適用於檢測一電路板的一盲孔內的一填膠,該檢測方法包含一準備步驟、一檢測步驟,及一處理步驟。Therefore, the detection method of the present invention is suitable for detecting a glue filling in a blind hole of a circuit board, and the detection method includes a preparation step, a detection step, and a processing step.
該準備步驟準備一檢測裝置,該檢測裝置包括一具有一第一波長範圍的激發光源、一光接收器,及一與該光接收器連接的處理單元。The preparation step prepares a detection device, the detection device includes an excitation light source having a first wavelength range, a light receiver, and a processing unit connected to the light receiver.
該檢測步驟以該激發光源照射該填膠,使該填膠被該激發光源激發產生一具有與該第一波長範圍不同的第二波長範圍的光致螢光,該光接收器可接收該光致螢光並產生對應的光致螢光訊號。In the detecting step, the filler is irradiated with the excitation light source, so that the filler is excited by the excitation light source to generate a photofluorescence light having a second wavelength range different from the first wavelength range, and the light receiver can receive the light fluoresce and generate a corresponding photoluminescence signal.
該處理步驟以該處理單元接收該光致螢光訊號並進行灰階轉換,以得到一填膠灰階影像。In the processing step, the processing unit receives the photoluminescence signal and performs grayscale conversion to obtain a glue-filled grayscale image.
本發明的功效在於,透過激發光源照射該填膠,使該填膠產生光致螢光,該光接收器接收該光致螢光產生螢光影像後,再透過處理步驟進行灰階轉換,透過只讓該填膠的凹陷處產生的光致螢光並配合填膠灰階影像,除了能判斷該填膠的頂面是否凹陷在該盲孔,更能排除電路板自身的凹陷。The effect of the present invention lies in that the filler is irradiated by an excitation light source, so that the filler generates photofluorescence, and after the light receiver receives the photofluorescence to generate a fluorescent image, the grayscale conversion is performed through the processing step, and the through Only the photoluminescence generated in the recess of the glue filling and the gray-scale image of the glue filling can be used to determine whether the top surface of the glue filling is recessed in the blind hole, and can also eliminate the depression of the circuit board itself.
在本發明被詳細描述之前,應當注意在以下的說明內容中,類似的元件是以相同的編號來表示。Before the present invention is described in detail, it should be noted that in the following description, similar elements are designated by the same reference numerals.
參閱圖1與圖2,本發明的檢測方法的一實施例適用於檢測一電路板1的一盲孔10內的一填膠11。Referring to FIG. 1 and FIG. 2 , an embodiment of the detection method of the present invention is suitable for detecting a
具體地說,一般對該電路板1的該盲孔10進行填膠11後,會透過刮除動作來刮除溢出該盲孔10多餘的該填膠11,使位在該盲孔10中的該填膠11的一頂面110能與該電路板1的一表面12齊平,而在刮除的過程中,會讓與該電路板1齊平的該填膠11的該頂面110上留存有銅屑層,以利後續在該電路板1的該表面12上形成一外層電路,但當該填膠11的該頂面11沒有與該電路板1的該表面12齊平而有部分凹陷時,其在進行刮除過程中,部分凹陷處因位在該盲孔10中而不具有銅屑層,會導致後續形成的外層電路容易造成短路或斷路,因此,本發明的檢測方法即是在檢測該填膠11的該頂面110是否與該電路板1的該表面12齊平而沒有凹陷在該盲孔10中。此處要說明的是,一般該電路板1會具有多個盲孔10,本實施例與對應的圖式僅是示意檢測單一個該盲孔10內的該填膠11的狀態為例作說明,但不限於此。Specifically, after the
本實施例的該檢測方法包含一準備步驟201、一檢測步驟202、一處理步驟203,及一判斷步驟204。The detection method of this embodiment includes a
首先,進行該準備步驟201,準備一檢測裝置2,該檢測裝置2包括一能發出一激發光E的激發光源21、一光接收器22、一與該光接收器22連接的處理單元23、一位在該光接收器22下游的發射濾光片(emission filter)24、一位在該發射濾光片24下游的分光鏡(dichroic mirror)25,及一設置在該激發光源21下游並位在該激發光源21與該分光鏡25之間的凸透鏡26。First, perform the
在準備好該檢測裝置2後,即可將待檢測的該電路板1置於該檢測裝置2的該光接收器22下方,並使該電路板1與該光接收器22彼此間隔設置,以完成該準備步驟201。After the
接著,進行該檢測步驟202,該激發光源21發出的該激發光E具有一第一波長範圍,且可通過該分光鏡25照射至該電路板1,以該激發光源21發出的該激發光E照射該電路板1的該盲孔10中的該填膠11時,該填膠11能被該激發光E激發而產生一具有與該第一波長範圍不同的第二波長範圍的光致螢光F,並透過該光接收器22接收該光致螢光F,及產生對應的光致螢光訊號。Next, the
詳細地說,在本實施例中,該激發光源21發出的該激發光E所具有的該第一波長範圍並沒有特別限制,主要是依據該填膠11的材質來選擇,換句話說,只要該第一波長範圍能在照射該填膠11時,使該填膠11激發產生光致螢光F即可。In detail, in this embodiment, the first wavelength range of the excitation light E emitted by the excitation light source 21 is not particularly limited, and is mainly selected according to the material of the
適用於本實施例中的該激發光源21可選自發光二極體(LED)或雷射光源,且在本實施例中,該激發光E具有的該第一波長範圍介於460nm~490nm,而該填膠11受具有該第一波長範圍(460nm~490nm)的該激發光E照射後,能產生第二波長範圍介於510nm~530nm的光致螢光F;其中,本實施例僅是以單一個該激發光源21為例做說明,但不以此為限,可視需求增加其他數量的激發光源來進行檢測;此外,該光接收器22可選自一相機,用以接收該光致螢光F。The excitation light source 21 suitable for this embodiment can be selected from a light emitting diode (LED) or a laser light source, and in this embodiment, the excitation light E has the first wavelength range of 460nm˜490nm, After being irradiated by the excitation light E with the first wavelength range (460nm~490nm), the
由於該第一波長範圍的選定沒有特別限制,主要是與該填膠11的材料做搭配,也就是當該填膠11使用的材料不同時,該第一波長範圍也會有所不同,而該填膠11受激發光E產生的光致螢光F的該第二波長範圍也會隨之改變。較佳地,該第一波長範圍具有一能量第一峰值,該第二波長範圍具有一能量第二峰值,當該第一波長範圍改變導致該第二波長範圍變動時,其兩者的關係為該第一波長範圍的該能量第一峰值與第二波長範圍的該能量第二峰值的差異(即轉移程度)介於0.01%~30%。Since the selection of the first wavelength range is not particularly limited, it is mainly matched with the material of the
另外要說明的是,該檢測裝置2所使用的該發射濾光片(emission filter)24設置在該光接收器22下游,主要是該填膠11受激發而產生的該光致螢光F被該光接收器22接收之前,可透過該發射濾光片24來篩選真正需要的光致螢光F,而在圖2中是讓該激發光源21設置在該分光鏡25一側,以讓其產生的該激發光E先經過該分光鏡25後,再照射至該填膠11上,透過該分光鏡25來改變該激發光E的光路徑,使該激發光E以垂直入射(入射角等於零)方式照射該填膠11,但並不限於此。In addition, it should be noted that the
此外,在該激發光源21照射該填膠11時,為了能增強照射的光強度, 透過設置該凸透鏡26將該激發光源21的光進行聚焦來增強光強度,從而讓該光接收器22收到的影像更清楚。In addition, when the excitation light source 21 irradiates the
在本實施例中,該激發光源21是照射經刮除的該填膠11,因此,該填膠與該電路板1的該表面12齊平處因具有銅屑層,而不會產生該光致螢光,也就是說,該填膠11產生的該光致螢光訊號即是該填膠11凹陷(沒有銅屑層)處所產生,在得到該填膠11凹陷處的該光致螢光訊號後,會進行該處理步驟203,透過該處理單元23接收該光致螢光訊號產生的螢光影像,將該螢光影像進行灰階轉換,以得到一填膠灰階影像(圖未示),此處要說明的是,當該填膠11是與該電路板1的該表面12完全齊平時,不具有凹陷處的該填膠11及該電路板1均不會產生光致螢光訊號,其得到的灰階影像為全黑狀態,所以該填膠11凹陷處產生的光致螢光訊號經灰階轉換後,即可與全黑處進行判斷。In this embodiment, the excitation light source 21 illuminates the scraped
詳細地說,在本實施例中,該判斷步驟204是將該填膠灰階影像與該電路板1的該表面12的一表面灰階影像(圖未示)兩者相比較,當該填膠灰階影像與該表面灰階影像的灰階差異大於10%時,則判斷該填膠11向該盲孔10內凹陷,但不限於此,也可以是該填膠11之凹陷處(有產生光致螢光)與該填膠11之齊平於該表面11處(沒產生光致螢光)兩者的灰階影像相互比較。Specifically, in the present embodiment, the determining
參閱圖3與圖4,圖3與圖4是本實施例檢測方法的該光接收器22接收得到的螢光影像,由此螢光影像可看出,該填膠11凹陷處的螢光影像與沒有產生螢光處相較具有超高對比度而具有明顯識別,能更輕易辨識出該填膠11的凹陷,及與該電路板1之間的差異。Referring to FIG. 3 and FIG. 4 , FIG. 3 and FIG. 4 are the fluorescent images received by the
舉例而言,當要比較該填膠11的齊平部分及該填膠11具有凹陷部分兩者差異時,其螢光影像進行灰階轉換時,兩者即具有明顯的深淺灰階差異;此外,當該填膠11與該電路板1的該表面12齊平時,其頂面11具有銅屑層時,其銅屑層經該激發光源21照射時,不會產生光致螢光,也因此遮蔽了該填膠11的部分螢光特性;再者,該電路板1若碰撞產生的凹陷也不會因該激發光源21產生光致螢光,使得該電路板1在經檢測產生的影像為全黑狀態,換句話說,以本發明的檢測方法的激發光源21照射該電路板1整體時,非該填膠11之其他處的凹陷不會有螢光特性產生而呈相對暗的狀態,以使該填膠11的凹陷處的螢光影像具有高對比度而能更明顯識別。For example, when comparing the difference between the flush portion of the
由此可知,當使用現有光學檢測的反射光對該電路板1進行檢測時,容易將該電路板1因碰撞產或其他因素產生的凹陷一併檢測,也就是在不使用如本發明的螢光時,會讓該填膠11的凹陷與該電路板1的凹陷非常相似,因而抓取了全部的凹陷,容易造成後續檢測誤差。It can be seen from this that when the
綜上所述,本發明檢測方法,透過激發光源21產生的激發光E照射該填膠11,讓其產生光致螢光F,再由該光接收器22接收該光致螢光F並產生螢光影像及透過處理單元23進行灰階轉換,從而判斷該填膠11的該頂面110是否凹陷在該盲孔10之外,還能排除電路板自身的凹陷,故確實能達成本發明的目的。To sum up, in the detection method of the present invention, the
惟以上所述者,僅為本發明的實施例而已,當不能以此限定本發明實施的範圍,凡是依本發明申請專利範圍及專利說明書內容所作的簡單的等效變化與修飾,皆仍屬本發明專利涵蓋的範圍內。However, the above are only examples of the present invention, and should not limit the scope of implementation of the present invention. Any simple equivalent changes and modifications made according to the scope of the patent application of the present invention and the contents of the patent specification are still included in the scope of the present invention. within the scope of the invention patent.
1:電路板 10:盲孔 11:填膠 110:頂面 12:表面 2:檢測裝置 201:準備步驟 202:檢測步驟 203:處理步驟 204:判斷步驟 21:激發光源 22:光接收器 23:處理單元 24:發射濾光片 25:分光鏡 26:凸透鏡 E:激發光 F:光致螢光1: circuit board 10: Blind hole 11: Filling 110: top surface 12: Surface 2: Detection device 201: Preparation steps 202: Detection step 203: Processing steps 204: Judgment step 21: Excitation light source 22: Optical receiver 23: Processing unit 24: Emission filter 25: Beamsplitter 26: Convex Lens E: Excitation light F: Photofluorescence
本發明的其他的特徵及功效,將於參照圖式的實施方式中清楚地呈現,其中: 圖1是一流程示意圖,說明本發明檢測方法一實施流程; 圖2是一示意圖,說明本發明檢測方法使用的一檢測裝置; 圖3是一影像圖,說明本發明檢測方法檢測一盲孔內的一填膠狀態;及 圖4是一影像圖,說明本發明檢測方法檢測該盲孔內的該填膠的另一狀態。Other features and effects of the present invention will be clearly presented in the embodiments with reference to the drawings, wherein: 1 is a schematic flow diagram illustrating an implementation flow of the detection method of the present invention; 2 is a schematic diagram illustrating a detection device used in the detection method of the present invention; 3 is an image diagram illustrating the detection method of the present invention to detect a glue filling state in a blind hole; and FIG. 4 is an image diagram illustrating another state in which the glue filling in the blind hole is detected by the detection method of the present invention.
201:準備步驟201: Preparation steps
202:檢測步驟202: Detection step
203:處理步驟203: Processing steps
204:判斷步驟204: Judgment step
Claims (7)
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US20020053589A1 (en) * | 1999-04-07 | 2002-05-09 | Owen Mark D. | Material inspection |
TWM426246U (en) * | 2011-08-03 | 2012-04-01 | xian-ming Liao | System for detecting remaining glue foots after PCB laser drilling and remaining agent after PCB rinsing |
TW202007954A (en) * | 2018-08-02 | 2020-02-16 | 由田新技股份有限公司 | Detecting apparatus for identifying defect of hole wall |
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US20020053589A1 (en) * | 1999-04-07 | 2002-05-09 | Owen Mark D. | Material inspection |
US6252664B1 (en) * | 1999-10-15 | 2001-06-26 | Biocrystal Ltd. | Fluorescence filter cube for fluorescence detection and imaging |
TWM426246U (en) * | 2011-08-03 | 2012-04-01 | xian-ming Liao | System for detecting remaining glue foots after PCB laser drilling and remaining agent after PCB rinsing |
TW202007954A (en) * | 2018-08-02 | 2020-02-16 | 由田新技股份有限公司 | Detecting apparatus for identifying defect of hole wall |
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