JP2013148554A - Electrode substrate inspection method - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide an electrode substrate inspection method that enables a cut surface of an electrode substrate to be inspected with high accuracy.SOLUTION: Illumination 21U of a color with low reflectance on a core material W1 is applied to, by coaxial epi-illumination, a cut surface W3 of an electrode substrate W for imaging the cut surface W3 of the electrode substrate W, illumination 22 of a color with higher reflectance on the core material W1 than the illumination 21U is applied to, by coaxial epi-illumination, the cut surface W3 of the electrode substrate W for imaging the cut surface W3 of the electrode substrate W. On the basis of a difference in brightness between each of obtained image data 11, burrs W11 generated in the core material W1 and the cut surface W3 of the electrode substrate W are detected.

Description

  The present invention relates to an electrode substrate inspection method for inspecting a cut surface of an electrode substrate on which a coating part is formed on the surface of a core material.

  Conventionally, in a battery manufacturing process, an electrode substrate on which a coating portion is formed on the surface of a core material such as a copper foil is cut with a slitter device or the like. As shown in FIG. 15, a burr | flash generate | occur | produces in the cut surface of the cut | disconnected electrode base material. If the burrs are large enough to be exposed to the outside of the coated part, a short circuit failure of the battery will occur.

For this reason, in the manufacturing process of a battery, the cut surface of an electrode base material is inspected. As such an inspection, for example, the cut surface of the electrode substrate is enlarged with a microscope, and it is confirmed whether or not burrs are exposed to the outside from the coating part.
In this case, it takes time to focus the microscope and measure the size of the burr. That is, it takes time to inspect the cut surface of the electrode base material.

  In the technique disclosed in Patent Document 1, the surface of the porous electrode base material is irradiated with inspection light, for example, white illumination, and predetermined image processing is performed on the result of imaging the transmitted light and the like by the imaging device. The appearance defect of the porous electrode substrate is determined.

JP 2010-272250 A

When the cut surface of the electrode base material is inspected using the technology disclosed in Patent Document 1, specifically, the inspection surface (for example, white illumination) is irradiated on the cut surface of the electrode base material. When the cut surface of the electrode base material is photographed, the cutting powder adhering to the cut surface shines in the same manner as the core material and appears glossy in the photographing result (see FIG. 16). Therefore, if the luster is falsely detected as a burr and the electrode base material where the burr is not exposed to the outside from the coating part is judged to be the electrode base material where the burr is exposed to the outside from the coating part. There is a possibility.
That is, when the cut surface of the electrode base material is inspected using the technique disclosed in Patent Document 1, the cut surface of the electrode base material cannot be inspected with high accuracy.

  The present invention has been made in view of the above circumstances, and provides an inspection method for an electrode base material that can inspect a cut surface of the electrode base material with high accuracy.

  In Claim 1, It is the inspection method of the electrode base material which test | inspects the cut surface of the electrode base material in which the coating part is formed in the surface of a core material, Comprising: The 1st illumination of the color with low reflectance of the said core material Illuminating the cut surface of the electrode base material by coaxial epi-illumination to photograph the cut surface of the electrode base material, and the second illumination of a color whose reflectance of the core material is higher than that of the first illumination, Photographing the cut surface of the electrode base material by irradiating the cut surface of the electrode base material with coaxial epi-illumination, and cutting the core material and the electrode base material on the basis of the difference in luminance of the captured image data It detects burrs generated on the surface.

  In Claim 2, It is the inspection method of the electrode base material which test | inspects the cut surface of the electrode base material in which the coating part is formed in the surface of a core material, Comprising: The 1st illumination of the color with the high reflectance of the said core material Is irradiated to the cut surface of the electrode base material by coaxial epi-illumination, and the second illumination having a color whose reflectance of the core material is lower than that of the first illumination is inclined with respect to the irradiation direction of the first illumination. Irradiating the cut surface of the electrode base material from the direction, photographing the cut surface of the electrode base material using the second illumination as a back light, and corresponding to the first illumination and the second illumination of the photographed image data The cut surface of the electrode base material is inspected after relatively changing the emphasis degree of the color to be performed.

  According to a third aspect of the present invention, the color corresponding to the first illumination of the image data is emphasized, and burrs generated on the cut surface of the electrode base material are detected.

  According to a fourth aspect of the present invention, only the color element corresponding to the first illumination of the image data is selectively emphasized to detect the core material line.

  In Claim 5, It is an inspection method of the electrode base material which test | inspects the cut surface of the electrode base material in which the coating part is formed in the surface of a core material, Comprising: The 1st illumination of the color with the high reflectance of the said core material Is irradiated to the cut surface of the electrode substrate by coaxial epi-illumination, and the second illumination having a color different from that of the first illumination is irradiated from the side facing the first illumination, and the second illumination Is taken as a back light, and the electrode base material is changed after relatively changing the enhancement degree of the color corresponding to the first illumination and the second illumination in the photographed image data. This is to inspect the cut surface.

  According to a sixth aspect of the present invention, the second illumination is reflected light reflected by a reflecting mirror.

  In Claim 7, the light of said 1st illumination which passes the thickness direction both ends of the cut surface of the said electrode base material is diverged by the said reflective mirror.

  According to an eighth aspect of the present invention, the color corresponding to the first illumination of the image data is emphasized, and burrs generated on the cut surface of the electrode base material are detected.

  According to a ninth aspect of the present invention, the color corresponding to the first illumination of the image data is emphasized, and the line of the core material is detected.

  In Claim 10, the color corresponding to said 1st illumination or said 2nd illumination of the said image data is emphasized, and the boundary line of the said electrode base material and a background is detected.

  The present invention has an effect that a cut surface of an electrode substrate can be inspected with high accuracy.

The figure which shows the structure of the inspection apparatus of the electrode base material of 1st embodiment. The figure which shows the 1st image data of 1st embodiment. The figure which shows the 2nd image data of 1st embodiment. The figure which shows the comparison result of the brightness | luminance of each image data of 1st embodiment. The figure which shows the structure of the inspection apparatus of the electrode base material of 2nd embodiment. The figure which shows the image data of 2nd embodiment. The figure which shows the line of a core material. The figure which shows the state which detects the line of a core material from the image data of 2nd embodiment. The figure which shows the state which detects a burr | flash from the image data of 2nd embodiment. The figure which shows the structure of the inspection apparatus of the electrode base material of 3rd embodiment. The figure which shows the image data of 3rd embodiment. The figure which shows the state which detects the line of a core material from the image data of 3rd embodiment. The figure which shows the state which detects a burr | flash from the image data of 3rd embodiment. The figure which shows the modification of the inspection apparatus of the electrode base material of 3rd embodiment. The figure which shows the cut surface of an electrode base material. The figure which shows the imaging | photography result of the cut surface of the electrode base material in a prior art.

  Below, the inspection method of the electrode base material W of 1st embodiment is demonstrated.

First, the electrode substrate W will be described.
In addition, the electrode base material W of 1st embodiment shall be the electrode base material W for negative electrodes.

  As shown in FIG. 1, the electrode base material W has a core material W1 and a coating part W2. Core material W1 of a first embodiment is a sheet-like member, and is constituted by copper foil. A coating portion W2 is formed on the surface of the core material W1. The coating part W2 of the first embodiment is a graphite layer.

The electrode base material W is cut into a predetermined width by a slitter device or the like.
As shown in FIG. 2, when the electrode substrate W is cut by a slitter device, burrs W11 are generated on the cut surface W3. When such a protrusion dimension of the burr W11 with respect to the core material W1 is larger than the thickness of the coating part W2, that is, when the burr W11 is exposed to the outside from the coating part W2, a short circuit failure of the battery occurs.

The slitter device cuts the electrode substrate W in a state where a predetermined clearance is set in the pair of cutting tools. When the clearance fluctuates due to wear of the blade or the like, chips of the electrode substrate W adhere to the cut surface W3 of the electrode substrate W. Examples of such chips include a copper piece W12 generated when the electrode substrate W is cut.
When such a copper piece W12 is exposed to the outside from the coating part W2, a short circuit failure of the battery occurs.

Therefore, in the inspection method for the electrode substrate W of the first embodiment (hereinafter simply referred to as “inspection method”), the cut surface W3 of the electrode substrate W is inspected and exposed to the outside from the coating part W2. It is confirmed whether there are such large burrs W11 and copper pieces W12.
As shown in FIG. 1, in the inspection method, the cut surface W <b> 3 of the electrode base material W is inspected using an inspection device 1 for the electrode base material W (hereinafter simply referred to as “inspection device 1”).

Next, the inspection apparatus 1 according to the first embodiment will be described.
The inspection apparatus 1 according to the first embodiment includes a camera 10, a first light projecting unit 21, a second light projecting unit 22, and an image processing unit 30.

  The camera 10 photographs the cut surface W3 of the electrode substrate W from the left side of the electrode substrate W. As the camera 10 of the first embodiment, a commercially available camera that captures the cut surface W3 of the electrode substrate W as monochrome image data is used.

  The first light projecting unit 21 applies ultraviolet illumination 21U to the cut surface W3 of the electrode substrate W by coaxial epi-illumination that irradiates the optical axis of the camera 10 with the optical axis of the illumination 21U (see FIG. 2). Irradiate (light with a wavelength in the ultraviolet region).

  Similar to the first light projecting unit 21, the second light projecting unit 22 uses the coaxial epi-illumination that irradiates the optical axis of the camera 10 with the optical axis of the illumination 22R (refer to FIG. 3). A red illumination 22R (light having a wavelength in the red region) is applied to the cut surface W3.

  Each of the light projecting units 21 and 22 irradiates the illuminations 21U and 22R with a light amount that does not cause halation in the core material W1 because the amount of light reflected by the core material W1 is excessive.

  The image processing unit 30 is configured to store a result of photographing by the camera 10 using a commercially available personal computer or the like, and to execute processing relating to the inspection method of the first embodiment on the stored result of photographing by the camera 10.

  Next, the procedure of the inspection method of the first embodiment will be described.

First, as shown in FIG. 2, in the inspection method of the first embodiment, the first base 21 irradiates the cut surface W <b> 3 of the electrode base material W with the illumination 21 </ b> U from the first light projecting unit 21. The cut surface W3 is photographed. Thereby, in the inspection method of the first embodiment, the first image data 11 is acquired as a result of photographing by illuminating the cut surface W3 of the electrode substrate W with the ultraviolet color.
At this time, the electrode substrate W is stationary.

Here, when the electrode base material W is cut by a slitter device, cutting powder generated at the time of cutting may adhere to the cut surface W3 of the electrode base material W.
Such cutting powder reflects the ultraviolet illumination 21 </ b> U and appears as gloss W <b> 13 in the first image data 11.

  Moreover, the copper piece W12 adhering to the cut surface W3 of the electrode base material W appears in the first image data 11 in a form overlapping the core material W1 and the coating part W2.

  That is, in the first image data 11, there is a possibility that the gloss W13 appears in addition to the core material W1, the coating portion W2, the burr W11, and the copper piece W12.

If the gloss W13 is erroneously detected as the burr W11, the electrode base W in which the burr W11 is not exposed to the outside from the coating part W2 is the electrode where the burr W11 is exposed to the outside from the coating part W2. There is a possibility that the substrate W is determined. That is, the gloss W13 affects the inspection of the cut surface W3 of the electrode substrate W.
That is, in the inspection method of the first embodiment, it is necessary to distinguish the burr W11 and the copper piece W12 from the coating part W2 and the gloss W13.

  In the first embodiment, it is assumed that the core material W1, the coating portion W2, the burr W11, the copper piece W12, and the gloss W13 appear in the first image data 11.

  Here, like the core material W1, the burr | flash W11, and the copper piece W12, the part comprised with copper has a low reflectance with respect to an ultraviolet color. Accordingly, the core material W1, the burr W11, and the copper piece W12 appear as relatively dark portions (with low luminance) in the first image data 11.

  As described above, in the inspection method according to the first embodiment, the ultraviolet illumination 21U (the first illumination having a color with a low reflectance of the core material W1) is applied to the cut surface W3 of the electrode substrate W by the coaxial incident illumination. The cut surface W3 of the electrode substrate W is photographed.

  On the other hand, the coating part W2 and the gloss W13 have a high reflectance regardless of the difference in illumination color. That is, the coating part W2 and the gloss W13 have a high reflectance with respect to the ultraviolet color. Accordingly, the coating portion W2 and the gloss W13 appear as relatively bright portions (with high luminance) in the first image data 11.

After acquiring the first image data 11, as shown in FIG. 3, in the inspection method of the first embodiment, the second light projecting unit 22 irradiates the cut surface W <b> 3 of the electrode substrate W with the illumination 22 </ b> R. Then, the camera 10 photographs the cut surface W3 of the electrode substrate W. Thereby, in the inspection method of the first embodiment, the second image data 12 is acquired as a result of photographing by illuminating the cut surface W3 of the electrode substrate W with the red illumination 22R.
At this time, the electrode substrate W is stationary.

  In the second image data 12 like the first image data 11, the core material W1, the coating part W2, the burr W11, the copper piece W12, and the gloss W13 appear.

Here, portions made of copper, such as the core material W1, the burr W11, and the copper piece W12, have a high reflectance with respect to the red illumination 22R.
Further, the coating part W2 and the gloss W13 have a high reflectance with respect to the red illumination 22R.

  As described above, in the inspection method of the first embodiment, the red illumination 22R (second illumination having a color higher than the first illumination in the reflectance of the core material W1) is applied to the cut surface of the electrode substrate W by the coaxial incident illumination. The cut surface W3 of the electrode substrate W is photographed by irradiating W3.

  Here, the core material W1, the burr W11, and the copper piece W12, and the coating part W2 and the gloss W13 appear in a state in which it is difficult to distinguish from each other in the image data 11 and 12. Therefore, for example, when an operator or the like visually recognizes the image data 11 and 12, it is difficult to accurately determine the core material W1, the burr W11, the copper piece W12, the coating portion W2, and the gloss W13. It is.

  Therefore, in the inspection method of the first embodiment, after obtaining the second image data 12, the image processing unit 30 calculates the luminance difference between the image data 11 and 12, and only the portion with the large luminance difference is luminance. As a comparison result 13 (see FIG. 4).

As shown in FIGS. 2 and 3, the core material W <b> 1, the burr W <b> 11, and the copper piece W <b> 12 appear with low luminance in the first image data 11 and appear with high luminance in the second image data 12.
On the other hand, the coating portion W2 and the gloss W13 appear at high luminance in each of the image data 11 and 12.

That is, as shown in FIG. 4, the core material W <b> 1, the burr W <b> 11, and the copper piece W <b> 12 are extracted as the luminance comparison result 13 because the luminance difference between the image data 11 and 12 is large.
On the other hand, the coated portion W2 and the gloss W13 are not extracted in the luminance comparison result 13 because the difference in luminance between the image data 11 and 12 is small.

  In other words, in the inspection method of the first embodiment, the core material W1, the burr W11, and the copper piece W12, and the difference in the reflection characteristics between the coating portion W2 and the gloss W13 are used, and the core material W1, the burr W11, and Only the copper piece W12 is extracted from the image data 11 and 12.

After the luminance comparison result 13 is acquired, the burr W11 and the copper piece W12 are detected based on the luminance comparison result 13 in the inspection method of the first embodiment. That is, the cut surface W3 of the electrode substrate W is inspected.
At this time, for example, the operator or the like detects the burr W11 and the copper piece W12 by visually checking the luminance comparison result 13. And the magnitude | size of the detected burr | flash W11 and the copper piece W12 is measured.

According to this, since the inspection method of the first embodiment can detect the burr W11 and the copper piece W12 after removing the gloss W13, it can be prevented that the gloss W13 is erroneously detected as the burr W11.
That is, the inspection method of the first embodiment can inspect the cut surface W3 of the electrode substrate W with high accuracy.

  As described above, in the inspection method of the first embodiment, the burr W11 generated on the cut surface W3 of the core material W1 and the electrode base material W is detected based on the difference in luminance between the captured image data 11 and 12.

Although each light projection part 21 * 22 of 1st embodiment irradiated ultraviolet-ray and red illumination 21U * 22R, it is not limited to this. That is, if each light projection part is the structure which irradiates the illumination of the color from which the reflectance of a core material differs so that only a core material, a burr | flash, and a copper piece can be extracted when the brightness | luminance of each image data is compared. Good.
If the cutting powder that becomes glossy has a different reflectance depending on the color of the illumination, the reflectance of the core material differs from each light projecting unit, and the reflectance of the cutting powder that becomes glossy is about the same. What is necessary is just to irradiate color illumination.

  Below, the inspection method of a second embodiment is explained.

In addition, the electrode base material W of 2nd embodiment shall be the electrode base material W for negative electrodes, and shall comprise the core material W1 with copper foil and the coating part W2 with graphite.
Moreover, in the inspection method of 2nd embodiment, the cut surface W3 of the electrode base material W conveyed is test | inspected. Specifically, the electrode base W is wound around the rolls at both ends in the longitudinal direction, and each roll is rotated and conveyed.

  As shown in FIG. 5, in the inspection method of the second embodiment, the cut surface W3 of the electrode substrate W is inspected using the inspection apparatus 101 of the second embodiment. The inspection apparatus 101 according to the second embodiment includes a camera 110, a first light projecting unit 121, a second light projecting unit 122, a third light projecting unit 123, and an image processing unit 130.

  The camera 110 is disposed between the rolls. As the camera 110 of the second embodiment, a commercially available camera that photographs the cut surface W3 of the electrode substrate W as color image data is used. A telecentric lens is used as the lens of the camera 110.

  It is not always necessary to use a telecentric lens as the camera lens. However, it is preferable to use a telecentric lens for the camera lens from the viewpoint of easy focusing when photographing the conveyed electrode substrate.

  The first light projecting unit 121 applies red illumination 121R (on the cut surface W3 of the electrode base W to the cut surface W3 by coaxial incident illumination that irradiates the optical axis of the camera 110 with the optical axis of the illumination 121R (see FIG. 6). Irradiation with light having a wavelength in the red region.

The second light projecting units 122 are arranged at two locations on the upper and lower sides of the right end portion of the camera 110. The second light projecting unit 122 applies blue illumination 122B (light having a wavelength in the blue region, see FIG. 6) to the cut surface W3 of the electrode substrate W from above and below the optical axis of the illumination 121R of the first light projecting unit 121. ).
That is, the second light projecting unit 122 irradiates the cut surface W3 of the electrode substrate W with the blue illumination 122B from the direction inclined with respect to the irradiation direction of the illumination 121R of the first light projecting unit 121. Thereby, in the inspection method of the second embodiment, the illumination 122B of the second light projecting unit 122 is used as the back light of the cut surface W3 of the electrode substrate W.

  In the inspection apparatus 101 of the second embodiment, the first light projecting unit 121 and the second light projecting light are so light that the amount of light reflected by the core material W1 is too large to cause halation in the core material W1. Illumination 121R / 122B is emitted from the section 122.

The third light projecting unit 123 is disposed on the right side of the electrode substrate W. The 3rd light emission part 123 is arrange | positioned at two places of the upper side and lower side of the electrode base material W in an up-down direction, and irradiates the blue illumination 123B toward the left direction.
That is, the third light projecting unit 123 irradiates the blue illumination 122 </ b> B from the direction opposite to the illumination 121 </ b> R of the first light projecting unit 121. Thereby, in the inspection method of the second embodiment, the illumination 123B of the third light projecting unit 123 is used as the back light of the cut surface W3 of the electrode substrate W.

  In addition, the inspection apparatus of 2nd embodiment does not necessarily need to comprise a 3rd light projection part.

  The image processing unit 130 is configured to store a result of photographing by the camera 110 using a commercially available personal computer or the like, and to perform processing relating to the inspection method of the second embodiment on the stored result of photographing by the camera 110.

  Next, the procedure of the inspection method of the second embodiment will be described.

  First, as shown in FIG. 6, in the inspection method of the second embodiment, the cut surface W <b> 3 of the electrode substrate W is formed by the camera 110 in a state where the illuminations 121 </ b> R, 122 </ b> B, and 123 </ b> B are irradiated from the light projecting units 121 to 123. A picture is taken and image data 111 is acquired.

  In the second embodiment, it is assumed that the core material W1, the coating portion W2, the burr W11, the copper piece W12, and the gloss W13 appear in the image data 111.

Here, like the core material W1, the burr | flash W11, and the copper piece W12, the part comprised with copper has the high reflectance with respect to the red illumination 121R, and the reflectance with respect to the blue illumination 122B is low.
Further, the coated portion W2 and the gloss W13 have high reflectance regardless of the illumination color. That is, the coating part W2 and the gloss W13 have a high reflectance with respect to the red illumination 121R and the blue illumination 122B.

As described above, the illumination 121R of the first light projecting unit 121 functions as the first illumination having a color with high reflectivity of the core material W1 that is irradiated onto the cut surface W3 of the electrode base material W by the coaxial incident illumination.
In addition, the illumination 122B of the second light projecting unit 122 is reflected from the core material W1 that is applied to the cut surface W3 of the electrode base material W from a direction inclined with respect to the irradiation direction of the illumination 121R of the first light projecting unit 121. The rate functions as second illumination of a color lower than the illumination 121R of the first light projecting unit 121.
In the inspection method of the second embodiment, the cut surface W3 of the electrode base material W is photographed using the illumination 122B of the second light projecting unit 122 as the back light.

  After acquiring the image data 111, the inspection method of the second embodiment detects the boundary line L1 between the electrode base material W and the background B based on the image data 111.

In the inspection method of the second embodiment, in addition to the illumination 121R of the first light projecting unit 121, the illumination 122B and 123B are irradiated from the second light projecting unit 122 and the third light projecting unit 123, and the coating unit W2 and The amount of light that can be distinguished from the background B is secured.
For this reason, in the inspection method of the second embodiment, the boundary line L1 between the electrode substrate W and the background B can be accurately detected.

  After detecting the boundary line L1 between the electrode substrate W and the background B, the line L2 (see FIG. 8) of the core material W1 is detected in the inspection method of the second embodiment.

  Here, the “core material line” is an imaginary line passing through the center of the core material in the vertical direction (thickness direction of the electrode base material) along the cutting direction of the electrode base material.

In the inspection method of the second embodiment, the size of the burr W11 is measured by checking how much the burr W11 protrudes from the line L2 of the core material W1 toward the coating part W2.
If the detected line L2 of the core material W1 is displaced in the vertical direction with respect to the actual core material line, a deviation occurs in the size of the burr W11 measured according to the degree of the deviation.
Therefore, in the inspection method of the second embodiment, it is necessary to accurately detect the line L2 of the core material W1.

As shown in FIG. 7A, in the second embodiment, for the purpose of inspecting the cut surface W3 of the electrode substrate W to be conveyed, the electrode substrate W moves up and down during the conveyance, or FIG. ), The electrode substrate W may be bent with respect to the left-right direction (conveying direction).
That is, the line L2 of the core material W1 does not pass through a certain position in the image data 111 in a straight line, and therefore cannot be set at a certain position by the image processing unit 130.

  Further, when the core material W1 and the coating portion W2 are discriminated and the line L2 of the core material W1 is detected, if the gloss W13 is erroneously detected as the core material W1, the detected line L2 of the core material W1 is It shifts in the vertical direction with respect to the actual core line.

  For this reason, it is necessary to detect the line L2 of the core material W1 after accurately determining the core material W1, the coating portion W2, and the gloss W13.

Since the core material W1, the burr W11, and the copper piece W12 have a high reflectance with respect to the red illumination 121R and a low reflectance with respect to the blue illumination 122B, they appear in the image data 111 as elements containing a large amount of red.
On the other hand, the coating portion W2 and the gloss W13 have high reflectivity with respect to the red illumination 121R and the blue illumination 122B, and thus appear as elements including red and blue in the image data 111.

Therefore, as shown in FIG. 8, in the inspection method of the second embodiment, the image processing unit 130 adjusts the color balance of the image data 111. Specifically, only the red element of the image data 111 is selectively enhanced and brightened (see the enhanced image data 112 shown in FIG. 8).
Then, binarization processing is performed on the enhanced image data 112 to detect the line L2 of the core material W1 (see image data 113 after binarization processing shown in FIG. 8).

As a result, the core material W1, the burr W11, and the copper piece W12 become brighter when emphasized, and appear as white elements in the image data 113 after binarization processing.
On the other hand, the coating part W2 and the gloss W13 do not become bright when emphasized, and appear as black elements in the binarized image data 111.

According to this, in the inspection method of the second embodiment, even when the electrode base material W moves up and down or the upper and lower surfaces of the electrode base material W are bent during conveyance, the core material W1 and the coating part W2 are used. And the gloss W13 can be accurately discriminated, so that the line L2 of the core material W1 can be accurately detected.
Further, since it is possible to prevent the gloss W13 from being erroneously detected as the core material W1, the line L2 of the core material W1 can be accurately detected.
Therefore, the inspection method of the second embodiment can accurately measure the size of the burr W11.

  As described above, in the inspection method of the second embodiment, only the red element (the color corresponding to the illumination 121R of the first light projecting unit 121) of the image data 111 is selectively emphasized, and the line L2 of the core material W1 is selected. To detect.

  After detecting the line L2 of the core material W1, in the inspection method of the second embodiment, as shown in FIG. 9, the image processing unit 130 emphasizes the red color of the image data 111 to brighten it, and the burr W11 and the copper piece. W12 is detected (see image data 114 after enhancement). That is, the cut surface W3 of the electrode substrate W is inspected.

  Since the core material W1, the burr W11, and the copper piece W12 appear as elements containing a large amount of red, by highlighting the red color of the image data 111, it becomes brighter than the coated portion W2 and the gloss W13.

  Since the coating part W2 and the gloss W13 appear as elements including red and blue, the red color of the image data 111 is emphasized, so that it becomes brighter than the background B.

  That is, in the inspection method of the second embodiment, the brightness of the core material W1, the burr W11, the copper piece W12, the coating portion W2, the gloss W13, and the background B is emphasized by emphasizing the red color of the image data 111. The difference is relatively large.

  Thereby, the inspection method of the second embodiment is such that the core material W1, the burr W11, and the copper piece W12, the coating part W2, the gloss W13, and the background B can be accurately discriminated, and the burr W11 and the copper The piece W12 can be detected.

According to this, the inspection method of the second embodiment can easily detect the burr W11 and the copper piece W12. Further, it can be prevented that the gloss W13 is erroneously detected as the burr W11.
That is, the inspection method of the second embodiment can inspect the cut surface W3 of the electrode substrate W with high accuracy.

  Here, the amount of light that is set in the first light projecting unit 121 and the second light projecting unit 122 so that halation does not occur in the core material W1 is greater than the amount of light that can distinguish the coating unit W2 and the background B. small.

Therefore, if you take a picture of the cut surface of the electrode base material with a single-color illumination that sets the amount of light so that halation does not occur in the core material, both the coating part and the background will become dark, The coating part and the background cannot be distinguished.
On the other hand, when shooting with a single color illumination that sets the amount of light that can distinguish between the coated part and the background and illuminating the cut surface of the electrode base material, the amount of light reflected by the core becomes too large, and the core Halation occurs in the material. That is, it becomes impossible to distinguish between the core material and the coating part.

Therefore, in the inspection method according to the second embodiment, as shown in FIG. 6, the illumination part 122 </ b> B having a color with a low reflectance of the core material W <b> 1 is irradiated from the second light projecting part 122, thereby The amount of light that can be discriminated from B is secured, and the amount of light reflected by the core material W1 is reduced to prevent halation from occurring in the core material W1.
Moreover, by using the illumination of the color with a high reflectance of the core material W1 for the illumination 121R of the first light projecting unit 121, the core material W1, the burr W11, the copper piece W12, and the coating part W2 are more clearly defined. Can be determined.

In the inspection method of the second embodiment, the size of the burr W11 is measured based on the line L2 of the core material W1. Then, based on the measurement result, the boundary line L1 between the electrode substrate W and the background B, and the line L2 of the core material W1, it is confirmed whether the burr W11 is exposed to the outside from the coating part W2.
Thereby, the inspection method of the second embodiment can automatically detect the burr W11 by the image processing unit 130, and automatically check whether the detected burr W11 is exposed to the outside from the coating unit W2. it can.

  In addition, even when the burr W11 and the copper piece W12 are detected by visually confirming the emphasized image data 114 by an operator or the like, the coating part W2 and the background B can be clearly distinguished. It can be easily confirmed whether the copper piece W12 is exposed to the outside from the coating portion W2.

As described above, in the inspection method of the second embodiment, after the relative enhancement degree of red and blue (color corresponding to the first illumination and the second illumination) of the captured image data 111 is changed, The cut surface W3 of the material W is inspected.
In the inspection method of the second embodiment, the red color (color corresponding to the first illumination) of the image data 111 is emphasized, and the burr W11 generated on the cut surface W3 of the electrode substrate W is detected.

In the image data, if the boundary between the electrode substrate and the background is not clear due to the effect of gloss, etc., the green light is emitted from the third light projecting unit, and the boundary between the electrode substrate and the background What is necessary is just to emphasize the green of image data, when detecting a line.
Thereby, the boundary line of an electrode base material and a background can be detected more reliably.

  Although the 1st light projection part 121 and the 2nd light projection part 122 of 2nd embodiment irradiated red and blue illumination 121R * 122B, it is not limited to this. That is, the first light projecting unit may irradiate illumination with a color with a high reflectance of the core material, and the second light projecting unit may irradiate illumination with a color with a low reflectance of the core material.

  Below, the inspection method of a third embodiment is explained.

In addition, the electrode base material W of 3rd embodiment shall be the electrode base material W for positive electrodes, and while comprising core material W1 with aluminum foil and coating part W2 with lithium cobaltate etc. To do.
Moreover, in the inspection method of 3rd embodiment, the cut surface W3 of the electrode base material W conveyed is test | inspected. Specifically, the electrode base W is wound around the rolls at both ends in the longitudinal direction, and each roll is rotated and conveyed.

  As shown in FIG. 10, in the inspection method of the third embodiment, the cut surface W3 of the electrode substrate W is inspected using the inspection apparatus 201 of the third embodiment. The inspection apparatus 201 according to the third embodiment includes a camera 210, a first light projecting unit 221, a second light projecting unit 222, a reflecting mirror 224, and an image processing unit 230.

  The camera 210 is disposed between the rolls. The camera 210 has the same configuration as the camera 110 of the second embodiment.

  The first light projecting unit 221 applies white illumination 221W (on the cut surface W3 of the electrode substrate W to the white illumination 221W by coaxial incident illumination that irradiates the optical axis of the camera 210 with the optical axis of the illumination 221W (see FIG. 11). (Illumination including wavelengths of a plurality of colors).

  The first light projecting unit 221 irradiates the illumination 221W with a light amount that does not cause halation in the core material W1 because the amount of light reflected by the core material W1 is excessive.

  The second light projecting unit 222 irradiates the reflecting mirror 224 with red illumination 222R (light having a wavelength in the red region, see FIG. 11) from above and below the electrode substrate W.

  The peak of the wavelength is adjusted so that the illumination 221W of the first light projecting unit 221 falls within the range of a color region different from the wavelength of the illumination 222R of the second light projecting unit 222. That is, the peak of the wavelength of the illumination 221W of the first light projecting unit 221 is adjusted within the wavelength range of the blue region, for example.

  The reflecting mirror 224 is disposed on the right side of the electrode substrate W. The reflecting mirror 224 is formed in a tapered shape in which the upper and lower halfway portions on the left side surface protrude toward the central portion in the thickness direction of the electrode substrate W, diverges the illumination 221W of the first light projecting unit 221, and the second light projecting unit The illumination 222R of 222 is reflected toward the camera 210.

  The image processing unit 230 is configured to store a result of photographing by the camera 210 using a commercially available personal computer or the like, and to perform processing relating to the inspection method of the third embodiment on the stored result of photographing by the camera 210.

  Next, the procedure of the inspection method according to the third embodiment will be described.

  First, as shown in FIG. 11, in the inspection method of the third embodiment, the cut surface W <b> 3 of the electrode base material W is photographed by the camera 210 in a state where the illumination units 221 </ b> W and 222 </ b> R are irradiated from the light projecting units 221 and 222. .

At this time, a part of the illumination 221W of the first light projecting unit 221 hits and reflects the cut surface W3 of the electrode base material W (see the illumination 221W of the first light projecting unit 221 indicated by a black arrow in FIG. 11).
Further, the other part of the illumination 221W of the first light projecting unit 221 passes above and below the cut surface W3 of the electrode base material W, and strikes the reflecting mirror 224 to diverge (the first projection shown by a dotted line in FIG. 11). (Refer to illumination 221W of the light part 221).
That is, the reflecting mirror 224 diverges the illumination 221W of the first light projecting unit 221 that did not hit the cut surface W3 of the electrode base material W.

  Further, the illumination 222R of the second light projecting unit 222 is reflected by the reflecting mirror 224 so that the reflected light is directed to the camera 210 (see the illumination 222R of the second light projecting unit 222 shown in FIG. 11). That is, the reflected light of the second light projecting unit 222 is irradiated from the right side of the electrode base material W and becomes the back light of the cut surface W3 of the electrode base material W.

  In the inspection method of the third embodiment, the cut surface W3 of the electrode base material W is photographed by the camera 210 in such a state, and the image data 211 is acquired.

In the third embodiment, it is assumed that the core material W1, the coating portion W2, the burr W11, the gloss W13, and the aluminum piece W14 generated when the electrode base material W is cut appear in the image data 211.
If the aluminum piece W14 is exposed to the outside from the coating portion W2, a short circuit failure of the battery occurs.
Therefore, in the inspection method of the third embodiment, the burr W11 and the aluminum piece W14 are detected.

  The portions made of aluminum, such as the core material W1, the burr W11, and the aluminum piece W14, have a high reflectance regardless of the color of the illumination. That is, the core material W1, the burr W11, and the aluminum piece W14 have a high reflectance with respect to white.

As described above, the illumination 221W of the first light projecting unit 221 according to the third embodiment is applied to the cut surface W3 of the electrode base material W by the coaxial incident illumination, and the first illumination having a color with high reflectance of the core material W1. Function as.
In addition, the reflected light of the illumination 222R of the second light projecting unit 222 of the third embodiment is irradiated from the right side of the electrode base material W (the side facing the illumination 221W of the first light projecting unit 221). It functions as a second illumination of a color different from the color corresponding to the illumination 221W of the light projecting unit 221.
In the inspection method of the third embodiment, the cut surface W3 of the electrode substrate W is imaged using the reflected light of the illumination 222R of the second light projecting unit 222 as the back light.

After obtaining the image data 211, as shown in FIG. 12, in the inspection method of the third embodiment, the image processing unit 230 adjusts the color balance of the image data 211. Specifically, the red color of the image data 211 is enhanced and brightened (see the image data 212 after enhancement shown in FIG. 12).
Then, the boundary line L1 between the electrode base material W and the background B is detected by performing binarization processing on the enhanced image data 212 (see the image data 213 after binarization processing shown in FIG. 12). ).

As shown in FIG. 11, in the inspection method of the third embodiment, only the illumination 221 </ b> W of the first light projecting unit 221 is irradiated on the cut surface W <b> 3 of the electrode base material W. The illumination 221W of the first light projecting unit 221 has a peak set at a wavelength of a color different from that of the red region.
In the inspection method of the third embodiment, in addition to the illumination 221 </ b> W of the first light projecting unit 221, the illumination 222 </ b> R of the second light projecting unit 222 is used as the back light of the cut surface W <b> 3 of the electrode substrate W. The amount of light that can clearly define the boundary line L1 between the material W and the background B is ensured.

  Therefore, by emphasizing the red color of the image data 211 to make it brighter, only the background B of the image data 211 becomes brighter.

  Thereby, since the inspection method of the third embodiment can accurately determine the coating part W2 and the background B, the boundary line L1 between the electrode base material W and the background B can be detected accurately.

  Note that the boundary line L1 between the electrode substrate W and the background B may be detected by emphasizing blue and green in the image data 211. In this case, the background B is not brightened, and the electrode substrate W is brightened.

  As described above, in the inspection method of the third embodiment, blue and green (color corresponding to the first illumination) or red (color corresponding to the second illumination) of the image data 211 is emphasized, and the electrode substrate W and the background are highlighted. A boundary line L1 with B is detected.

  Here, in the inspection method of the third embodiment, the first projection is applied to the background B by diverging the illumination 221W of the first projection unit 221 that did not hit the cut surface W3 of the electrode substrate W by the reflecting mirror 224. The illumination 221W of the part 221 is prevented from being reflected (see the illumination 221W of the first light projecting part 221 indicated by a dotted line in FIG. 11).

  Thereby, since the inspection method of the third embodiment can prevent the occurrence of image unevenness in the background B of the image data 211, the boundary line L1 between the electrode base material W and the background B can be detected more accurately.

  As described above, in the inspection method according to the third embodiment, the reflecting mirror 224 causes the illumination 221W of the first light projecting unit 221 to pass through both the upper and lower sides (both ends in the thickness direction) of the cut surface W3 of the electrode base material W to diverge. .

  In addition, as shown in FIG. 11, in the inspection method of the third embodiment, the second light projecting unit is disposed on the right side of the electrode substrate W by reflecting the illumination 222 </ b> R of the second light projecting unit 222 with the reflecting mirror 224. Compared with the case where 222 is arranged, the left and right halfway portions of the electrode base material W are made brighter.

  As a result, the inspection method of the third embodiment can reliably secure the amount of light necessary to detect the boundary line between the electrode substrate and the background, even with an electrode substrate having a large lateral dimension (width dimension). For this reason, even if the electrode base material has a large width dimension, the boundary line between the electrode base material and the background can be reliably detected.

  Thus, in 3rd embodiment, the 2nd illumination used as the back light of the cut surface W3 of the electrode base material W is the reflected light which reflected the illumination 222R of the 2nd light projection part 222 with the reflective mirror 224. FIG.

  After detecting the boundary line L1 between the electrode substrate W and the background B, as shown in FIG. 13, in the inspection method of the third embodiment, the image processing unit 230 emphasizes the blue and green of the image data 211. The line L2 of the core material W1 is detected by increasing the brightness.

In 3rd embodiment, only the illumination 221W of the 1st light projection part 221 is irradiated to the cut surface W3 of the electrode base material W. FIG.
That is, in the inspection method of the third embodiment, it is possible to prevent halation from occurring in the core material W1 only by adjusting the light quantity of the illumination 221W of the first light projecting unit 221.

Therefore, in the inspection method of the third embodiment, when the blue and green colors of the image data 211 are emphasized, the core material W1, the burr W11, and the aluminum piece W14, and the coating portion W2 and the gloss W13 can be more easily distinguished. The light quantity of the illumination 221W of the first light projecting unit 221 can be set as the light quantity.
That is, the inspection method of the third embodiment is for determining the light quantity of the illumination 221W of the first light projecting unit 221 from the core material W1, the burr W11, and the aluminum piece W14, and the coating unit W2 and the gloss W13. The optimal light intensity can be set.
Moreover, since the illumination of the color with the high reflectance of the core material W1 is used for the illumination 221W of the first light projecting unit 221, the core material W1, the burr W11, the aluminum piece W14, and the coating unit W2 are more It can be determined accurately.

  Thereby, the inspection method of the third embodiment can accurately discriminate the core material W1, the burr W11, the aluminum piece W14, the coating part W2, the gloss W13, and the background B in the image data 214 after enhancement. .

  According to this, in the inspection method of the third embodiment, even when the electrode base material W moves up and down during conveyance or the upper and lower surfaces of the electrode base material W are bent, the line L2 of the core material W1 is accurately set. It can be detected. Therefore, the inspection method of the third embodiment can accurately measure the size of the burr W11.

  As described above, in the inspection method of the third embodiment, the blue and green colors (colors corresponding to the first illumination) of the image data 211 are emphasized, and the line L2 of the core material W1 is detected.

  After detecting the line L2 of the core material W1, in the inspection method of the third embodiment, the image data 214 after the enhancement is analyzed by the image processing unit 230, and the burr W11 and the aluminum piece W14 are detected. That is, the cut surface W3 of the electrode substrate W is inspected.

As described above, the emphasized image data 214 can accurately determine the core material W1, the burr W11, the aluminum piece W14, the coating portion W2, the gloss W13, and the background B.
Therefore, the inspection method of the third embodiment can easily detect the burr W11 and the aluminum piece W14. Further, it can be prevented that the gloss W13 is erroneously detected as the burr W11.
That is, the inspection method of the third embodiment can inspect the cut surface W3 of the electrode substrate W with high accuracy.

  Further, even when the burrs W11 and the aluminum piece W14 are detected by visually confirming the emphasized image data 214 by an operator or the like, the coating portion W2 and the background B can be clearly distinguished. It can be easily confirmed whether the aluminum piece W14 is exposed to the outside from the coating portion W2.

In the inspection method of the third embodiment, the size of the burr W11 is measured based on the line L2 of the core material W1. Then, based on the measurement result, the boundary line L1 between the electrode substrate W and the background B, and the line L2 of the core material W1, it is confirmed whether the burr W11 is exposed to the outside from the coating part W2.
Thereby, the inspection method of the third embodiment can automatically detect the burr W11 by the image processing unit 230, and automatically check whether the detected burr W11 is exposed to the outside from the coating unit W2. it can.

As described above, in the inspection method according to the third embodiment, the degree of emphasis between blue and green (color corresponding to the first illumination) and red (color corresponding to the second illumination) of the captured image data 211 is relatively set. After the change, the cut surface W3 of the electrode substrate W is inspected.
In the inspection method of the third embodiment, the blue and green colors of the image data 211 are emphasized, and the burr W11 generated on the cut surface W3 of the electrode substrate W is detected.

  In the inspection method of the third embodiment, since only the illumination 221W of the first light projecting unit 221 is irradiated onto the cut surface W3 of the electrode base material W, the core material W1 is reflected as compared with the inspection method of the second embodiment. The amount of light to be reduced can be further reduced.

Therefore, the inspection method of the third embodiment can distinguish between the coating portion W2 and the background B even when the core is made of a material having high reflectivity, for example, aluminum foil, regardless of the color of the illumination. A sufficient amount of light can be secured, and halation can be prevented from occurring in the core material.
In other words, the cut surface of the electrode substrate can be inspected with high accuracy even when the core is made of a material having a high reflectance regardless of the color of the illumination.

  Although each light projection part 221 * 222 of 3rd embodiment irradiated white and red illumination 221W * 222R, it is not limited to this. That is, each light projection part should just be the structure which irradiates illumination of a mutually different color.

In the inspection method of the third embodiment, by using the reflecting mirror 224, the second light projecting unit 222 is disposed above and below the electrode base material W, and the second light projection is performed without straddling the electrode base material W. The illumination 222R of the unit 222 is replaceable.
Therefore, the illumination 222R of the second light projecting unit 222 can be easily replaced.

In the third embodiment, the reflected light of the illumination 222R of the second light projecting unit 222 is the back light of the cut surface W3 of the electrode substrate W, but is not limited to this.
For example, the illumination of the second projection unit that illuminates the illumination in the direction opposite to the illumination direction of the first projection unit is arranged on the right side of the electrode substrate, and the illumination of the second projection unit is the electrode substrate It may be the back light of the cut surface.

In the third embodiment, the camera 210 and the like are arranged between the rolls wound around both ends in the longitudinal direction of the electrode substrate W. However, the present invention is not limited to this. For example, a camera or the like is installed on the side of the roll. It doesn't matter.
In this case, as shown in FIG. 14, a reflecting mirror 224 is provided on the right side of the electrode substrate W, and a reflecting mirror 225 that does not rotate with the roll 240 is attached to the left side surface of the roll 240. Further, the cut surface W3 of the electrode base material W is protruded from the roll 240 to the left by a predetermined interval. Then, the second light projecting unit 222 irradiates the illumination 222R toward the reflecting mirrors 224 and 225.

DESCRIPTION OF SYMBOLS 1 Inspection apparatus 11 1st image data 12 2nd image data 21U Illumination (1st illumination)
22R lighting (second lighting)
W Electrode base material W1 Core material W2 Coated part W3 Cut surface W11 Burr

Claims (10)

An inspection method of an electrode base material for inspecting a cut surface of an electrode base material on which a coating part is formed on the surface of a core material,
The core material is irradiated with the first illumination of a color having a low reflectance of the core material by the coaxial epi-illumination to photograph the cut surface of the electrode substrate, and the reflectance of the core material is The second illumination of a color higher than the first illumination is irradiated on the cut surface of the electrode base material by coaxial epi-illumination to photograph the cut surface of the electrode base material,
Based on the difference in brightness of each captured image data, detect burrs that occur on the cut surface of the core material and the electrode base material,
Inspection method of electrode substrate. An inspection method of an electrode base material for inspecting a cut surface of an electrode base material on which a coating part is formed on the surface of a core material,
A first illumination having a color with a high reflectance of the core material is applied to a cut surface of the electrode base material by coaxial epi-illumination, and a second illumination having a color with a reflectance of the core material lower than that of the first illumination is applied. Irradiating the cut surface of the electrode base material from a direction inclined with respect to the irradiation direction of the first illumination, photographing the cut surface of the electrode base material with the second illumination as a back light,
After relatively changing the enhancement degree of the color corresponding to the first illumination and the second illumination of the photographed image data, the cut surface of the electrode base material is inspected.
Inspection method of electrode substrate. Emphasize the color corresponding to the first illumination of the image data, and detect burrs generated on the cut surface of the electrode substrate,
The method for inspecting an electrode substrate according to claim 2. Selectively highlight only the color elements corresponding to the first illumination of the image data, and detect the core line;
The inspection method of the electrode base material of Claim 2 or Claim 3. An inspection method of an electrode base material for inspecting a cut surface of an electrode base material on which a coating part is formed on the surface of a core material,
A first illumination of a color having a high reflectance of the core material is irradiated to a cut surface of the electrode base material by coaxial epi-illumination, and a second illumination of a color different from the first illumination is applied to the first illumination. Irradiating from the opposite side, photographing the cut surface of the electrode substrate with the second illumination as the back light,
After relatively changing the enhancement degree of the color corresponding to the first illumination and the second illumination of the photographed image data, the cut surface of the electrode base material is inspected.
Inspection method of electrode substrate. The second illumination is
It is the reflected light reflected by the reflector.
The method for inspecting an electrode substrate according to claim 5. By the reflecting mirror, the light of the first illumination that passes through both ends in the thickness direction of the cut surface of the electrode base material is diverged.
The method for inspecting an electrode substrate according to claim 6. Emphasize the color corresponding to the first illumination of the image data, and detect burrs generated on the cut surface of the electrode substrate,
The method for inspecting an electrode substrate according to any one of claims 5 to 7. Emphasize the color corresponding to the first illumination of the image data, and detect the line of the core material,
The method for inspecting an electrode substrate according to any one of claims 5 to 8. Emphasizing the color corresponding to the first illumination or the second illumination of the image data, and detecting a boundary line between the electrode substrate and the background,
The method for inspecting an electrode substrate according to any one of claims 5 to 9.

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