TW202007954A - Detecting apparatus for identifying defect of hole wall - Google Patents

Abstract

The present invention provides a detecting apparatus for identifying defect of a hole wall, comprising a detecting platform, a wide-angle image capturing device, and a processor. The detection platform is for placing an object. The wide-angle image capturing device sets beside the detection platform and captures at least one hole structure of the object. The processor includes an image capturing instruction module and an image processing module. The image capturing instruction module sends a capturing command to the wide-angle image capturing device for capturing an image of the hole structure, and the image processing module generates an image identification result according to the image of the hole structure.

Description

Inspection equipment for identifying hole wall defects

The invention relates to a detection device, in particular to a detection device for identifying hole wall defects.

Many kinds of holes, grooves and other deep structural designs are often seen on various objects. In addition to being used as a shape and a circulation port, these structural designs usually have the purpose of positioning, locking, or installing other components, etc., and Depending on the purpose of use, there are also different accuracy requirements for these structural designs.

Holes can generally be made by punching by punching, laser cutting, or drilling by hand tools. According to different manufacturing methods, the accuracy of the holes is also very different, so it is necessary to detect the hole on the object , To ensure that the holes meet the required accuracy requirements.

The main purpose of the present invention is to provide a detection device that simplifies the detection process of the hole wall and improves the overall detection efficiency.

To achieve the above object, the present invention provides a detection device for identifying hole wall defects, which includes a detection platform, a wide-angle camera device, and a processor. The detection platform is provided with an object to be measured, the wide-angle camera device is provided on the side of the detection platform, and the at least one hole structure of the object to be measured is imaged. The processor includes an image acquisition instruction module, and a An image processing module, the image capturing instruction module is electrically connected to the wide-angle camera device to transmit an image capturing command to the wide-angle camera device to obtain an image of the hole structure, and the image processing module receives the image and based on The obtained image obtains an image recognition result.

To achieve the above object, the present invention also provides a detection device for identifying hole wall defects, which includes a detection platform, a camera device, and a processor. The detection platform is provided for an object to be measured, the camera device is disposed on one side of the detection platform and forms an inclination angle with the surface of the detection platform to take an image of at least one hole structure on the object to be measured, and the processor It includes an imaging instruction module and an image processing module. The imaging instruction module is electrically connected to the camera device to transmit an imaging command to the camera device to obtain an image of the hole structure and the image The processing module receives the image and obtains an image recognition result based on the obtained image.

The invention can obtain all the images of the inner wall surface of the hole structure in a single imaging, so as to identify the position and type of the defect, simplify the previous complicated inspection process, reduce the inspection time, improve the efficiency of the inspection production line, and is suitable for inspection Various types of hole walls or side walls of the circuit board.

100‧‧‧ Testing equipment

P‧‧‧ test object

P1‧‧‧hole structure

P11‧‧‧Inner wall surface

10‧‧‧ Testing platform

20‧‧‧Wide angle camera

21‧‧‧Camera main body

22‧‧‧wide-angle lens

30‧‧‧ processor

31‧‧‧ Acquisition instruction module

32‧‧‧Image processing module

33‧‧‧Position indication module

40‧‧‧Lighting

41‧‧‧Side light source

411‧‧‧Light source

412‧‧‧Lens

413‧‧‧ Diffuser

42‧‧‧Back light

50‧‧‧Transfer device

θ‧‧‧angle of view

H‧‧‧Acquisition focal length

I‧‧‧Stretch the image

200‧‧‧ Testing equipment

A‧‧‧Tilt angle

T‧‧‧Image acquisition area

M‧‧‧Reflecting mirror

L‧‧‧Light

R‧‧‧ Path

D‧‧‧Blemish

FIG. 1 is a schematic side view of the detection device of the present invention.

FIG. 2 is a block diagram of the detection device of the present invention.

Figure 3 is a schematic diagram of the imaging of the detection device of the present invention.

FIG. 4 is a schematic diagram of an image of a hole structure obtained by a detection device of the present invention.

FIG. 5 is a schematic side view of another embodiment of the detection device of the present invention.

6 is a schematic diagram of movement of an image capturing area of another embodiment of the detection device of the present invention.

The detailed description and technical content of the present invention will now be described in conjunction with the drawings. Furthermore, the drawings in the present invention are not necessarily drawn according to actual proportions for the convenience of explanation. The drawings and their proportions are not intended to limit the scope of the present invention, and will be described here first.

Please refer to "FIG. 1" and "FIG. 2", which are side schematic diagrams and block schematic diagrams of the inspection device of the present invention. As shown in the figure: the present invention provides a testing device 100 for identifying hole wall defects, which is mainly used in Detect the inner wall surface of the hole, groove and other structures, and obtain all the images of the inner wall surface in a single shot through the optical detection lens to identify whether the wall surface has defects such as foreign objects, ink, or uneven surface. The detection device 100 includes a detection The platform 10, a wide-angle camera device 20, and a processor 30.

The detection platform 10 is provided with an object P to be tested, and the object P to be tested may be an object such as a circuit board, a panel, or a product casing, which is not limited by the present invention. In one embodiment, the detection platform 10 may be provided with a positioning bracket (not shown) for positioning the object P. The positioning bracket includes two positions that can be adjusted in the X direction and the Y direction respectively The rod is used to fix the object P on the plane of the detection platform 10 via the two positioning rods. In another embodiment, the detection platform 10 may be provided with a vacuum adsorption device (not shown), and the object P is adsorbed via the vacuum adsorption device to fix the object P to the detection On the plane of the platform 10. The detection platform 10 may also be provided with a transmission belt (not shown) for carrying the object P to be imaged when the object P passes through the wide-angle camera device 20. However, the above-mentioned examples are only for the description of several preferred embodiments of the detection platform 10 of the present invention. The specific embodiments of the present invention are not limited to the above-mentioned embodiments, and will be described here first.

The wide-angle camera device 20 is disposed on the side of the detection platform 10 to take an image of at least one hole structure P1 of the object P to be measured. The hole structure P1 may be a through hole, a slot, or any other object Form a structure with a depth. In this embodiment, as shown in FIG. 1, the wide-angle camera device 20 is disposed above the detection platform 10 to capture the object P to obtain an image of the inner wall surface P11 of the hole structure P1. The wide-angle camera device 20 includes a camera body 21 and a wide-angle lens 22 disposed on the side of the camera body 21, wherein the wide-angle lens 22 and the camera body 21 can be integrated into one body or independently provided, the present invention addresses this No restrictions. The camera body 21 may be a CMOS line scan camera (CMOS line scan camera), a CMOS area scan camera (CMOS area scan camera) or a CCD (Charge Coupled Device) line scan camera. P1 takes an image to obtain an image of the inner wall surface P11 of the hole structure P1. When the wide-angle lens 22 captures an object, the obtained image will have a spherical or swollen feeling, resulting in barrel distortion (Barrel Distortion), also known as negative distortion (Negative Distortion). For example, the wide-angle lens 22 takes a picture In the case of a square object, the four corners of the obtained image will be tightened inward, and the middle of the edge of the image will be stretched out and convex, and the shape is similar to a wooden barrel, so it is also called barrel deformation.

In this embodiment, as shown in FIG. 2, the processor 30 includes an imaging instruction module 31, an image processing module 32, and a positioning instruction module 33. In one embodiment, the processor works with the storage unit to access the data of the storage unit, and then executes a pre-stored program in the storage unit. The pre-stored program may be the image capturing instruction module 31 and the image processing module Group 32, and positioning instruction module 33. It must be explained here that the processor and the storage unit described in the present invention are not limited to a single one. When necessary, the program and the work can also be executed in cooperation through a plurality of processors and a plurality of storage units. In one embodiment, the processor is, for example, a central processing unit (CPU), or other programmable general-purpose or special-purpose microprocessor (Microprocessor), digital signal processor ( Digital Signal Processor (DSP), programmable controller, application specific integrated circuits (ASIC), programmable logic device (Programmable Logic Device, PLD) or other similar devices or a combination of these devices.

The imaging instruction module 31 is electrically connected to the wide-angle camera device 20. The imaging instruction module 31 transmits an imaging command to the wide-angle camera device 20, so that the wide-angle camera device 20 obtains the hole structure P1. One image. The image processing module 32 receives the image of the hole structure P1 from the wide-angle camera device 20, and obtains an image recognition result according to the obtained image, and determines whether the inner wall surface P11 of the hole structure P1 has Defect D and its type and location (as shown in Figure 4). In one embodiment, the image processing module 32 performs, for example, binarization processing, sharpening processing, contrast enhancement processing, back contrast processing, and image segmentation processing based on the acquired image of the hole structure P1 Or other similar image processing procedures, to identify whether the inner wall surface P11 of the hole structure P1 has the defect D through the image after the image processing, and to identify the defect D such as the inner wall surface P11 has bubbles, pores, depressions, bumps, cracks, Foreign matter, burrs, ink, or any other type of defects that cause unevenness of the inner wall surface P11. In another embodiment, the image processing module 32 compares the image of the hole structure P1 with a preset image through an image processing procedure to identify the inner wall surface P11 of the hole structure P1 The type and location of defect D. In another implementation form, the image defects can also be identified through neural networks such as machine learning or deep learning. However, the above examples are only for the description of the three preferred embodiments of the image processing recognition of the present invention. The specific embodiments of the present invention are not limited to the above-mentioned embodiments, and will be described here first.

In order to enable the wide-angle camera device 20 to acquire the image of the hole structure P1, in one embodiment, the positioning instruction module 33 obtains the initial coordinates of the hole structure P1 and the wide-angle camera device 20 respectively, and outputs coordinate signals according to the two initial coordinates To obtain the relative positional relationship between the wide-angle camera device 20 and the hole structure P1 to facilitate adjustment. In an implementation form, the positioning indicator module 33 calculates and obtains the vector difference between the two initial coordinates in the X, Y, Z and other axes according to the initial coordinates of the hole structure P1 and the wide-angle camera device 20, based on The vector difference is used to adjust the relative positional relationship between the wide-angle camera device 20 and the hole structure P1.

The detection device 100 further includes a lighting device 40 disposed on the side of the detection platform 10 to provide a light source for illumination. The lighting device 40 includes one or more lateral light sources 41, which are disposed on one side or the peripheral side above the detection platform 10. In this embodiment, as shown in FIG. 1, The lateral light source 41 is disposed on the upper two sides of the detection platform 10, and the two sides of the front surface of the object P provide illumination light source to the hole structure P1. In one embodiment, the lateral light source 41 may be a ring-shaped lamp, and the hole structure P1 is provided with uniform illumination light sources around the object P to reduce the generation of dark bands. The side light source 41 may be an illumination light source such as a tunnel light, a side light, and the like in addition to a ring light. The illumination device 40 includes one or more back light sources 42. The back light sources 42 are disposed on the other side of the detection platform 10 relative to the wide-angle camera device 20. In this embodiment, as shown in FIG. 1 The back light source 42 is disposed below the detection platform 10, and the detection platform 10 may be a light-transmitting homogenizing plate. The light source of the back light source 42 is vertically irradiated to the homogenizing plate to illuminate the light source evenly to the test Object P back.

The detection device 100 further includes a transfer device 50 carrying the wide-angle camera device 20. The transfer device 50 moves the wide-angle camera device 20 to the vicinity of the hole structure P1 according to the coordinate signal output by the positioning instruction module 33 to take an image of the hole structure P1. The transfer device 50 can be a multi-axis mechanical arm (not shown), including a bearing base disposed on the side of the detection platform 10, and a bearing base disposed on the bearing base for carrying the wide-angle camera The transfer arm of the device 20, wherein the bearing base can be provided integrally with the detection platform 10, and the wide-angle camera device 20 is moved to the hole structure P1 through the transfer arm, and the wide-angle camera device 20 and the standby are adjusted The distance between the measured objects P. In another preferred embodiment, the transfer device 50 may be a multi-dimensional linear stage (not shown) disposed on the detection platform 10, including an X-axis slide with a Z-axis slide rail Rail and a Y-axis slide rail connected to the X-axis slide rail, the Z-axis slide rail carries the wide-angle camera device 20 to move it in the Z direction, and passes through the X-axis slide rail and the Y-axis The slide rails respectively move in the XY direction to adjust the position of the wide-angle camera device 20 relative to the hole structure P1. However, the above examples are only for the description of the two preferred embodiments of the transfer device 50 of the present invention. The specific embodiments of the present invention are not limited to the above-mentioned embodiments, and will be described here first.

Please also refer to "Figure 3", which is an imaging schematic diagram of the detection device of the present invention. As shown in the figure: in this embodiment, the lateral light source 41 includes a light source 411, and a light source 411 Side lens 412, and a diffuser 413 disposed between the light source 411 and the lens 412. The light source 411 outputs a plurality of directional light rays L through the lens 412 and the diffuser 413. The light L is irradiated toward the axis of the wide-angle camera 20, and the light L is reflected by the mirror M onto the hole structure P1. The wide-angle camera device 20 moves in the Z direction to adjust the image capturing position of the hole structure P1. The wide-angle camera device 20 uses its wide-angle characteristic to receive the light L irradiated on the inner wall surface P11 from the imaging path R to Obtain an image of the inner wall surface P11 of the hole structure P1.

Please also refer to "Figure 4", which is an image schematic diagram of the hole structure obtained by the inspection device of the present invention, and refer to "Figure 1", as shown in the figure: as shown in "Figure 1", the wide-angle camera The angle of view θ of the device 20 is between 70 degrees and 90 degrees, that is, the range where the wide-angle lens 22 can take an image of the object P to be measured. The imaging focal length H between the wide-angle camera device 20 and the object to be measured P is between 5 mm and 60 mm, which helps the hole structure P1 enter the angle of view θ of the wide-angle camera device 20 to obtain the hole structure Clear image of P1.

In order to enable the image acquired by the wide-angle camera device 20 to present all the inner wall surfaces P11 of the hole structure P1, during the detection, the wide-angle camera device 20 is moved to the hole structure P1 through the transfer device 50 and the two Coaxially arranged, so that the wide-angle camera device 20 images the inner side wall surface P11 of the hole structure P1 in the stretched image I. The wide-angle end of the wide-angle camera device 20 can cause barrel deformation of the image. The stretched inner wall surface P11 is shown in the image I. As shown in FIG. 4, the present invention can obtain all the inner wall surfaces P11 of the hole structure P1 in a single shot through the characteristics of the wide-angle camera device 20 to facilitate the identification of its defects D The location and type of it can effectively simplify the inspection process and shorten the inspection time.

Please refer to "Figure 5" and "Figure 6" together, which is a schematic side view of another embodiment of the detection device of the present invention and a schematic diagram of the movement of the image capturing area, and also refer to "Figure 2", as shown in the figure: In the present embodiment, when the detection device 200 performs detection, the wide-angle camera device 20 is moved to above (or below) the inner circumference of the hole structure P1 through the transfer device 50, wherein the wide-angle camera device 20 and the detection A tilt angle A is included between the surfaces of the platform 10, and the tilt angle A is between 0 degrees and 90 degrees. The transfer device 50 causes the tilted wide-angle camera device 20 to bypass the periphery of the hole structure P1, that is, the wide-angle camera The image capturing area T of the device 20 wraps around the hole structure P1 to obtain an image of the stretched inner side wall surface P11. The present invention helps to detect the wall surface with a small aperture by taking a circle at the same time along the edge of the hole The location and type of defect D (as shown in Figure 6). Since the difference between this embodiment and the previous embodiment mainly lies in the positional relationship between the wide-angle camera device 20 and the hole structure P1, the details of the same structure will not be repeated in this paragraph, and will be described here first.

In another embodiment, the present invention can also use a camera device without a wide-angle imaging effect to capture the hole structure P1. Since the difference between this embodiment and the previous embodiment is mainly the imaging effect of the camera device, Therefore, this paragraph will not repeat the parts of the same structure, which will be described first. When the detection device 100 performs the detection, the camera device is moved to the upper (or lower) inner side of the perimeter of the hole structure P1 through the transfer device 50, and a gap between the camera device and the surface of the inspection platform 10 is adjusted between 0 degrees and 90 degrees. The inclination angle A between them is used to capture the image of the inner wall surface of the hole structure P1, so as to detect the wall surface defects of the aperture. In addition, the transfer device 50 can also make the imaging device go around the periphery of the hole structure P1, that is, the image capturing area of the imaging device makes a circle around the hole structure P1 to obtain the image of the inner wall surface P11 of the hole structure P1 to detect the aperture The position and type of the inner wall surface defects.

In summary, the present invention can obtain all the images of the inner wall surface of the hole structure in a single acquisition, so as to identify the position and type of the defect, simplify the previous complicated inspection process, reduce the inspection time, and improve the efficiency of the inspection production line .

The present invention has been described in detail above, but the above is only one of the preferred embodiments of the present invention, and it should not be used to limit the scope of implementation of the present invention, that is, any equivalent made in accordance with the scope of the patent application of the present invention Changes and modifications should still fall within the scope of the patent of the present invention.

100‧‧‧ Testing equipment

P‧‧‧ test object

P1‧‧‧hole structure

P11‧‧‧Inner wall surface

10‧‧‧ Testing platform

20‧‧‧Wide angle camera

21‧‧‧Camera main body

22‧‧‧wide-angle lens

40‧‧‧Lighting

41‧‧‧Side light source

42‧‧‧Back light

θ‧‧‧angle of view

H‧‧‧Acquisition focal length

Claims (14)

A detection device for identifying defects in a hole wall includes: a detection platform for setting a test object; a wide-angle camera device, which is provided on one side of the test platform, to take an image of at least one hole structure on the test object And a processor including an image capturing instruction module and an image processing module, the image capturing instruction module is electrically connected to the wide-angle camera device to transmit an image capturing instruction to obtain an image of the hole structure, The image processing module receives the image and obtains an image recognition result based on the obtained image. The detection device as described in item 1 of the scope of the patent application further includes a lighting device provided on one side of the detection platform to provide an illumination light source. The detection device as described in item 1 of the patent application scope, wherein the angle of view of the wide-angle camera device is between 70 degrees and 90 degrees. The detection device as described in item 1 of the patent application scope, wherein the imaging focal length between the wide-angle camera device and the object to be measured is between 5 mm and 60 mm. The detection device as described in item 1 of the patent application scope, wherein the wide-angle camera device includes a camera body and a wide-angle lens provided on one side of the camera body. The detection device as described in item 1 of the patent application scope further includes a transfer device carrying the wide-angle camera device, and the processor includes a positioning indication module that outputs a coordinate signal, and the transfer device is based on the coordinate The signal moves the wide-angle camera device to the hole structure to capture the hole structure. The detection device as described in item 6 of the patent application range, wherein the transfer device is a multi-axis robot arm, or a multi-dimensional linear stage. The detection device as described in item 2 of the patent application scope, wherein the lighting device includes one or a plurality of lateral light sources disposed on one side, two sides, or around the detection platform. The detection device as described in item 2 of the patent application scope, wherein the illumination device includes one or more back light sources, which are disposed on the other side of the detection platform relative to the wide-angle camera device. An inspection device for identifying hole wall defects includes: an inspection platform for setting an object to be measured; a camera device, which is arranged on one side of the inspection platform and forms an inclined angle with the surface of the inspection platform At least one hole structure on the object for image capturing; and a processor including an image capturing instruction module and an image processing module, the image capturing instruction module is electrically connected to the camera device to transmit an image capturing instruction To obtain an image of the hole structure, the image processing module receives the image and obtains an image recognition result according to the obtained image. The detection device as described in item 10 of the patent application scope, wherein the camera device is a wide-angle camera device. The detection device as described in item 10 of the patent application scope, wherein the inclination angle between the camera device and the surface of the detection platform is between 0 degrees and 90 degrees. The detection device as described in item 10 of the patent application scope, wherein the camera device is moved by a transfer device to make a circle around the periphery of the hole structure to take an image of the hole structure. The inspection device as described in item 1 or 10 of the patent application range, wherein the defect of the hole structure is that the inner wall surface of the hole structure has bubbles, pores, depressions, bumps, cracks, ink, burrs, or foreign objects.

Images