TWI747647B - Display device and pixel driving circuit - Google Patents
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
- G09G3/22—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources
- G09G3/30—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
- G09G3/22—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources
- G09G3/30—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels
- G09G3/32—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED]
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G2320/00—Control of display operating conditions
- G09G2320/02—Improving the quality of display appearance
- G09G2320/0233—Improving the luminance or brightness uniformity across the screen
Abstract
Description
本發明是有關於一種顯示技術,特別是關於一種畫素驅動電路。The present invention relates to a display technology, particularly to a pixel driving circuit.
顯示器的基板上的畫素驅動電路在製造過程中可能因為金屬殘留與蝕刻過多等等因素導致基板異常。發光元件諸如微發光二極體的製造過程複雜導致成本較高。此外,現行畫素驅動電路中的電流可能受開關特性及/或電流路徑上之電阻值的影響而使顯示器之亮度不均勻。因此,要如何發展能夠克服上述問題之相關技術為本領域重要之課題。The pixel driving circuit on the substrate of the display may be abnormal due to metal residue and excessive etching during the manufacturing process. The manufacturing process of light-emitting elements such as micro-light-emitting diodes is complicated, leading to higher costs. In addition, the current in the current pixel driving circuit may be affected by the switching characteristics and/or the resistance value in the current path, which may cause the brightness of the display to be uneven. Therefore, how to develop related technologies that can overcome the above-mentioned problems is an important issue in this field.
本發明實施例包含一種顯示裝置,包括串聯耦接的多個畫素驅動電路,其中多個畫素驅動電路中的一畫素驅動電路包括資料寫入單元與發光單元。資料寫入單元包括第一開關及電容,並用以將一資料信號寫入一第一節點。第一開關的一第一端耦接第一開關的一控制端於第一節點。電容的一第一端耦接第一節點。發光單元包括第二開關及發光元件,並用以依據資料信號產生一電流。第二開關用以接收電流。第二開關的一控制端耦接第一節點,第二開關的一第一端耦接電容的一第二端。發光元件依據電流發光。The embodiment of the present invention includes a display device including a plurality of pixel driving circuits coupled in series, wherein one pixel driving circuit of the plurality of pixel driving circuits includes a data writing unit and a light emitting unit. The data writing unit includes a first switch and a capacitor, and is used for writing a data signal into a first node. A first terminal of the first switch is coupled to a control terminal of the first switch at the first node. A first terminal of the capacitor is coupled to the first node. The light-emitting unit includes a second switch and a light-emitting element, and is used for generating a current according to the data signal. The second switch is used for receiving current. A control terminal of the second switch is coupled to the first node, and a first terminal of the second switch is coupled to a second terminal of the capacitor. The light-emitting element emits light according to current.
本發明實施例更包含一種畫素驅動電路包括資料寫入單元與發光單元。資料寫入單元包括第一開關、第二開關及電容,並用以將一資料信號寫入一第一節點。第一開關的一第一端耦接第一開關的一控制端於一第一節點。電容的一第一端耦接第一節點。第二開關的一第一端耦接電容的一第二端,第二開關的一第二端耦接第一開關的一第二端。發光單元包括第三開關及發光元件,並用以依據資料信號產生一電流。第三開關的一控制端耦接第一節點。發光元件用以依據電流發光。The embodiment of the present invention further includes a pixel driving circuit including a data writing unit and a light emitting unit. The data writing unit includes a first switch, a second switch and a capacitor, and is used for writing a data signal into a first node. A first terminal of the first switch is coupled to a control terminal of the first switch at a first node. A first terminal of the capacitor is coupled to the first node. A first terminal of the second switch is coupled to a second terminal of the capacitor, and a second terminal of the second switch is coupled to a second terminal of the first switch. The light-emitting unit includes a third switch and a light-emitting element, and is used for generating a current according to the data signal. A control terminal of the third switch is coupled to the first node. The light emitting element is used for emitting light according to the current.
於本文中,當一元件被稱為「連接」或「耦接」時,可指「電性連接」或「電性耦接」。「連接」或「耦接」亦可用以表示二或多個元件間相互搭配操作或互動。此外,雖然本文中使用「第一」、「第二」、…等用語描述不同元件,該用語僅是用以區別以相同技術用語描述的元件或操作。除非上下文清楚指明,否則該用語並非特別指稱或暗示次序或順位,亦非用以限定本發明。In this text, when an element is referred to as “connected” or “coupled”, it can be referred to as “electrically connected” or “electrically coupled”. "Connected" or "coupled" can also be used to mean that two or more components cooperate or interact with each other. In addition, although terms such as “first”, “second”, etc. are used herein to describe different elements, the terms are only used to distinguish elements or operations described in the same technical terms. Unless the context clearly indicates, the terms do not specifically refer to or imply order or sequence, nor are they used to limit the present invention.
除非另有定義,本文使用的所有術語(包括技術和科學術語)具有與本發明所屬領域的普通技術人員通常理解的相同的含義。將進一步理解的是,諸如在通常使用的字典中定義的那些術語應當被解釋為具有與它們在相關技術和本發明的上下文中的含義一致的含義,並且將不被解釋為理想化的或過度正式的意義,除非本文中明確地這樣定義。Unless otherwise defined, all terms (including technical and scientific terms) used herein have the same meaning as commonly understood by those of ordinary skill in the art to which the present invention belongs. It will be further understood that terms such as those defined in commonly used dictionaries should be interpreted as having meanings consistent with their meaning in the context of related technologies and the present invention, and will not be interpreted as idealized or excessive The formal meaning, unless explicitly defined as such in this article.
這裡使用的術語僅僅是為了描述特定實施例的目的,而不是限制性的。如本文所使用的,除非內容清楚地指示,否則單數形式「一」、「一個」和「該」旨在包括複數形式,包括「至少一個」。「或」表示「及/或」。如本文所使用的,術語「及/或」包括一個或多個相關所列項目的任何和所有組合。還應當理解,當在本說明書中使用時,術語「包括」及/或「包含」指定所述特徵、區域、整體、步驟、操作、元件的存在及/或部件,但不排除一個或多個其它特徵、區域整體、步驟、操作、元件、部件及/或其組合的存在或添加。The terminology used here is only for the purpose of describing specific embodiments and is not restrictive. As used herein, unless the content clearly indicates otherwise, the singular forms "a", "an" and "the" are intended to include plural forms, including "at least one." "Or" means "and/or". As used herein, the term "and/or" includes any and all combinations of one or more of the related listed items. It should also be understood that when used in this specification, the terms "including" and/or "including" designate the presence of the features, regions, wholes, steps, operations, elements, and/or components, but do not exclude one or more The existence or addition of other features, regions as a whole, steps, operations, elements, components, and/or combinations thereof.
以下將以圖式揭露本案之複數個實施方式,為明確說明起見,許多實務上的細節將在以下敘述中一併說明。然而,應瞭解到,這些實務上的細節不應用以限制本案。也就是說,在本揭示內容部分實施方式中,這些實務上的細節是非必要的。此外,為簡化圖式起見,一些習知慣用的結構與元件在圖式中將以簡單示意的方式繪示之。Hereinafter, multiple implementations of this case will be disclosed in schematic form. For the sake of clarity, many practical details will be described in the following description. However, it should be understood that these practical details should not be used to limit the case. In other words, in some implementations of the present disclosure, these practical details are unnecessary. In addition, in order to simplify the drawings, some conventionally used structures and elements are shown in the drawings in a simple and schematic manner.
第1圖為根據本案之一實施例所繪示之顯示器的示意圖。請參照第1圖,顯示器100包括顯示裝置110、掃描裝置120、資料輸入裝置130與發光控制裝置140。掃描裝置120藉由掃描線SL(0)~SL(n)提供多個掃描信號,例如第2圖所示之的掃描信號S(n-1)與掃描信號S(n),至顯示裝置110。資料輸入裝置130藉由資料線DL(1)~DL(m) 提供多個資料信號,例如第2圖所示之的資料信號DT,至顯示裝置110。發光控制裝置140藉由發光線EL(1)~EL(n) 提供多個發光信號,例如第2圖所示之的發光信號EM,至顯示裝置110。其中n與m皆為正整數。在一些實施例中,顯示器100可以由玻璃基板或塑膠基板所製成,但不限於此。Figure 1 is a schematic diagram of a display according to an embodiment of the present invention. Please refer to FIG. 1, the
如第1圖所示,顯示裝置110包含多級彼此串接的畫素驅動電路DV(1)~DV(n),其中包含畫素驅動電路112。在一些實施例中,顯示裝置110中的畫素驅動電路112依據掃描裝置120、資料輸入裝置130與發光控制裝置140提供的信號進行發光操作。As shown in FIG. 1, the
舉例來說,第2圖所示之的畫素驅動電路200為畫素驅動電路112的一實施例。如第2圖所示,畫素驅動電路200藉由掃描裝置120提供的掃描信號S(n-1)及S(n)重置畫素驅動電路200,並且寫入由資料輸入裝置130提供的資料信號DT,其中資料信號DT的電壓準位決定了發光元件L2的發光強度,最後藉由發光控制裝置140提供的發光信號EM控制發光元件L2的發光時間長度。For example, the
在一些實施例中,掃描信號S(n-1)與掃描信號S(n)分別通過掃描線SL(n-1)與掃描線SL(n)傳輸至畫素驅動電路112,資料信號DT通過資料線DL(m)傳輸至畫素驅動電路112,發光信號EM通過發光線EL(n)傳輸至畫素驅動電路112,但本發明實施例不限於此,通過其他各種導線傳輸掃描信號S(n-1)、掃描信號S(n)、資料信號DT與發光信號EM至畫素驅動電路112的方式亦在本發明思及範圍內。In some embodiments, the scan signal S(n-1) and the scan signal S(n) are respectively transmitted to the
第2圖為根據本案之一實施例所繪示之顯示裝置中的畫素驅動電路的電路圖。請參照第2圖,第2圖為畫素驅動電路200的電路圖。畫素驅動電路200為顯示裝置110中的畫素驅動電路112的一種實施例。在一些實施例中,畫素驅動電路200包括資料寫入單元220、發光單元240及檢測單元260。FIG. 2 is a circuit diagram of a pixel driving circuit in a display device according to an embodiment of the present invention. Please refer to FIG. 2, which is a circuit diagram of the
在一些實施例中,資料寫入單元220用以依據掃描信號S(n-1)及S(n)進行重置操作,以重置節點N21的節點電壓V21與節點N22的節點電壓V22。資料寫入單元220更用以依據掃描信號S(n)及控制信號VC進行資料寫入操作,以將資料信號DT寫入至節點N21,同時開關T22的臨界電壓準位V
TH也寫入至節點N21以進行補償操作。發光單元240依據發光信號EM進行發光操作,並依據節點N21的節點電壓V21產生電流I2,且依據電流I2的電流準位發光。檢測單元260用以依據檢測信號TS進行檢測操作,以檢測畫素驅動電路200中的開關T21~T28及發光元件L2的至少一者是否能夠正常運作,例如正常導通或正常關閉。
In some embodiments, the
在一些實施例中,畫素驅動電路200為顯示器100中的多個畫素驅動電路的第n級畫素驅動電路DV(n)。對應地,掃描信號S(n)為第n級掃描信號,且掃描信號S(n-1)為第n-1級掃描信號。顯示器100中的多個畫素驅動電路的第(n-1)級畫素驅動電路DV(n-1)也用以依據掃描信號S(n-1)進行操作。In some embodiments, the
在一些實施例中,資料寫入單元220包括開關T21~T24及電容C2。開關T21的控制端用以接收控制信號VC,開關T21的一端用以接收資料信號DT,開關T21的另一端耦接開關T22的一端。開關T22的一端耦接開關T21,開關T22的另一端及開關T22的控制端耦接節點N21。在一些實施例中,開關T22具有二極體的功能。電容C2的一端耦接節點N21,電容C2的另一端耦接節點N22。開關T23的控制端用以接收掃描信號S(n),開關T23的一端用以接收電壓信號VINI,開關T23的另一端耦接節點N22。開關T24的控制端用以接收掃描信號S(n-1),開關T24的一端用以接收電壓信號VDD於節點N26,開關T24的另一端耦接節點N21。In some embodiments, the
在一些實施例中,發光單元240包括發光元件L2及開關T25~T27。開關T25的控制端耦接節點N21,開關T25的一端耦接開關T26於節點N23,且開關T25的另一端耦接開關T27於節點N22。開關T26的控制端用以接收發光信號EM,開關T26的一端耦接發光元件L2於節點N24,且開關T26的另一端耦接節點N23。開關T27的控制端用以接收發光信號EM,開關T27的一端用以接收電壓信號VSS,且開關T27的另一端耦接節點N22。發光元件L2的一端耦接節點N24,發光元件L2的另一端耦接節點N25,並且在節點N25用以接收電壓信號VDD。在一些實施例中,發光元件L2用以接收流經開關T25的電流I2,並用以依據電流I2發光。In some embodiments, the light-emitting
在一些實施例中,檢測單元260包括開關T28。開關T28的控制端用以接收檢測信號TS,開關T28的一端耦接開關T24於節點N26,且開關T28的另一端耦接開關T26及發光元件L2於節點N24。在一些實施例中,檢測單元260 用以接收電壓信號VDD於節點N26以檢測發光元件L2及開關T21~T28的至少一者是否正常導通。In some embodiments, the
在不同的實施例中,發光元件L2可以是微發光二極體(mLED)或其他不同類型的發光元件。在不同的實施例中,開關T21~ T28可以是P型金屬氧化物半導體場效電晶體(PMOS)、N型金屬氧化物半導體場效電晶體(NMOS)、薄膜電晶體(TFT)或其他不同類型的開關元件。In different embodiments, the light emitting element L2 may be a micro light emitting diode (mLED) or other different types of light emitting elements. In different embodiments, the switches T21~T28 can be P-type metal oxide semiconductor field effect transistors (PMOS), N-type metal oxide semiconductor field effect transistors (NMOS), thin film transistors (TFT) or other different types. Type of switching element.
第3圖為根據本發明之一實施例中的畫素驅動電路進行驅動操作所繪示之時序圖。第3圖所繪示之時序圖依序包括階段P31、階段P32與階段P33。在一些實施例中,第3圖所繪示之時序圖對應第2圖所示之不同信號,例如掃描信號S(n)及S(n-1)、發光信號EM、資料信號DT、控制信號VC及檢測信號TS的操作。FIG. 3 is a timing diagram of the driving operation of the pixel driving circuit according to an embodiment of the present invention. The timing diagram shown in FIG. 3 includes phase P31, phase P32, and phase P33 in sequence. In some embodiments, the timing diagram shown in Figure 3 corresponds to the different signals shown in Figure 2, such as scan signals S(n) and S(n-1), light-emitting signal EM, data signal DT, control signal Operation of VC and detection signal TS.
如第3圖所示,在階段P31,掃描信號S(n-1)及S(n)具有致能電壓準位VGH,使得開關T24與開關T23導通。此時開關T24提供具有電壓準位DD的電壓信號VDD至節點N21,使得節點N21的節點電壓V21具有電壓準位DD。As shown in FIG. 3, in phase P31, the scan signals S(n-1) and S(n) have the enable voltage level VGH, so that the switch T24 and the switch T23 are turned on. At this time, the switch T24 provides the voltage signal VDD with the voltage level DD to the node N21, so that the node voltage V21 of the node N21 has the voltage level DD.
在一些實施例中,電壓準位DD為致能電壓準位,使得開關T22依據具有電壓準位DD的節點電壓V21導通。在一些實施例中,電容C2 用以儲存節點N21的電荷以在開關T24關閉後維持節點電壓V21,使得開關T22在開關T24關閉後(例如在階段P32)持續導通。In some embodiments, the voltage level DD is the enable voltage level, so that the switch T22 is turned on according to the node voltage V21 having the voltage level DD. In some embodiments, the capacitor C2 is used to store the charge of the node N21 to maintain the node voltage V21 after the switch T24 is turned off, so that the switch T22 is continuously turned on after the switch T24 is turned off (for example, in the phase P32).
在階段P31,開關T23導通以提供電壓信號VINI至節點N22,電壓信號VINI具有電壓準位INI,使得節點N22的節點電壓V22具有電壓準位INI。此時電容C2兩端的電壓準位差為(DD-INI)。In phase P31, the switch T23 is turned on to provide the voltage signal VINI to the node N22, and the voltage signal VINI has the voltage level INI, so that the node voltage V22 of the node N22 has the voltage level INI. At this time, the voltage level difference across the capacitor C2 is (DD-INI).
在一些實施例中,在期間P31,畫素驅動電路200的節點電壓V21與節點電壓V22分別被電壓信號VDD與電壓信號VINI重置,使得畫素驅動電路200可以準備接收資料信號DT,因此階段P31被稱為重置階段。In some embodiments, during the period P31, the node voltage V21 and the node voltage V22 of the
在階段P32,掃描信號S(n)與控制信號VC具有致能電壓準位VGH,使得開關T26及開關T21導通。掃描信號S(n-1)具有禁能電壓準位VGL,使得開關T24關閉。電容C2在階段P31儲存之電荷使得節點電壓V21在階段P32時仍然具有致能電壓準位,因此開關T22在階段P32時導通。此時具有電壓準位VDT的資料信號DT通過開關T21及開關T22寫入節點N21,使得節點電壓V21被拉至 (VDT+V TH),其中臨界電壓準位V TH為開關T22的臨界電壓準位。此時節點電壓V22依然具有電壓準位INI。此時電容C2兩端的電壓準位差為(VDT+V TH-INI)。 In phase P32, the scan signal S(n) and the control signal VC have the enable voltage level VGH, so that the switch T26 and the switch T21 are turned on. The scan signal S(n-1) has the disable voltage level VGL, so that the switch T24 is closed. The charge stored in the capacitor C2 in the phase P31 makes the node voltage V21 still have the enable voltage level in the phase P32, so the switch T22 is turned on during the phase P32. At this time, the data signal DT with the voltage level VDT is written into the node N21 through the switch T21 and the switch T22, so that the node voltage V21 is pulled to (VDT+V TH ), where the threshold voltage level V TH is the threshold voltage level of the switch T22 Bit. At this time, the node voltage V22 still has the voltage level INI. At this time, the voltage level difference between the two ends of the capacitor C2 is (VDT+V TH -INI).
在一些實施例中,在階段P32,資料信號DT被寫入畫素驅動電路200,並且藉由開關T22的臨界電壓準位V
TH,節點電壓V22的電壓準位被調整至(VDT +V
TH)以準備補償發光階段(例如階段P33)時開關T25的臨界電壓準位V
TH。因此階段P32被稱為資料寫入與補償階段。
In some embodiments, in stage P32, the data signal DT is written into the
在階段P33,發光信號EM具有致能電壓準位VGH,使得開關T26與開關T27導通。掃描信號S(n)、掃描信號S(n-1)與控制信號VC具有禁能電壓準位VGL,使得開關T21、T23及T24關閉。此時電流I2依序流經發光元件L2、開關T26、T25及T27,使得發光元件L2依據電流I2的電流準位發光。在一些實施例中,電流I2的電流準位決定發光元件L2的發光強度。In phase P33, the light-emitting signal EM has the enable voltage level VGH, so that the switch T26 and the switch T27 are turned on. The scan signal S(n), the scan signal S(n-1), and the control signal VC have the disable voltage level VGL, so that the switches T21, T23, and T24 are closed. At this time, the current I2 sequentially flows through the light-emitting element L2, the switches T26, T25, and T27, so that the light-emitting element L2 emits light according to the current level of the current I2. In some embodiments, the current level of the current I2 determines the luminous intensity of the light-emitting element L2.
在階段P33,電容C2維持了在階段P32時,電容C2兩端的電壓準位差,使得在階段P33時節點N21的電壓準位與節點N22的電壓準位差仍然為(VDT+V TH-INI)。 In the phase P33, the capacitor C2 maintains the voltage level difference between the two ends of the capacitor C2 in the phase P32, so that the voltage level difference between the voltage level of the node N21 and the voltage level of the node N22 in the phase P33 is still (VDT+V TH -INI ).
在一些實施例中,將開關T25的閘極與源極之電壓準位差,也就是節點N21的電壓準位與節點N22的電壓準位差設為VGS。此外,在一些實施例中,開關T22與T25的臨界電壓準位實質上等同,因此以相同的臨界電壓準位V TH表示開關T22與T25之任一者的臨界電壓準位。透過電子學中的公式可得知通過開關T25的電流I2的電流準位為K×(VGS-V TH)^2。在階段P33,將VDT+V TH-INI)帶入電壓準位差VGS,即可得出電流I2的的電流準位為K×(VDT-INI)^2,其中K為一常數。因此電流I2的電流準位與臨界電壓準位V TH無關,而與資料信號DT的電壓準位VDT與電壓信號VINI的電壓準位INI有關。 In some embodiments, the voltage level difference between the gate and the source of the switch T25, that is, the voltage level difference between the voltage level of the node N21 and the voltage level of the node N22 is set to VGS. In addition, in some embodiments, the threshold voltage levels of the switches T22 and T25 are substantially the same, so the same threshold voltage level V TH represents the threshold voltage level of any one of the switches T22 and T25. According to the formula in electronics, it can be known that the current level of the current I2 passing through the switch T25 is K×(VGS-V TH )^2. In phase P33, VDT+V TH -INI) is brought into the voltage level difference VGS, and the current level of the current I2 can be obtained as K×(VDT-INI)^2, where K is a constant. Therefore, the current level of the current I2 has nothing to do with the threshold voltage level V TH , but is related to the voltage level VDT of the data signal DT and the voltage level INI of the voltage signal VINI.
在一些先前的作法中,電流通過顯示器中的不同路徑時,不同路徑上不同的電阻值會造成不同的電壓降,此外,開關的臨界電壓準位也會造成電壓降,使得流經發光元件的電流難以控制,造成顯示器的亮度不均勻的結果。In some previous practices, when current flows through different paths in the display, different resistance values on different paths will cause different voltage drops. In addition, the threshold voltage level of the switch will also cause a voltage drop, which makes the The current is difficult to control, resulting in uneven brightness of the display.
相較於上述的作法,在本發明實施例中,電壓準位VDT與電壓準位INI系取決於使用者。如此一來,流經發光元件L2的電流可以被使用者調整,而不被電流路徑或是畫素驅動電路200的元件特性,例如開關T25的臨界電壓準位V TH所影響。 Compared with the above-mentioned method, in the embodiment of the present invention, the voltage level VDT and the voltage level INI depend on the user. In this way, the current flowing through the light-emitting element L2 can be adjusted by the user, and is not affected by the current path or the element characteristics of the pixel driving circuit 200, such as the threshold voltage level V TH of the switch T25.
在一些實施例中,在階段P33,畫素驅動電路200中的發光元件L2發光,因此階段P33被稱為發光階段。In some embodiments, in the phase P33, the light-emitting element L2 in the
在一些先前的作法中,檢測訊號被提供至顯示器100以測試顯示裝置110是否有異常時,發光元件L2已經耦接顯示裝置110。此時顯示器100之製造成本包含發光元件L2之製造成本。In some previous practices, when the detection signal is provided to the
相較於上述的作法,本發明實施例提供一種可以在發光元件L2耦接顯示裝置110之前進行檢測的畫素驅動電路400,如第4圖所示。畫素驅動電路400為還沒耦接發光元件的畫素驅動電路,因此畫素驅動電路400的製造成本比畫素驅動電路200的製造成本低。Compared with the above-mentioned method, the embodiment of the present invention provides a
第4圖為根據本案之一實施例所繪示之顯示裝置中的畫素驅動電路的電路操作圖。第4圖所示之畫素驅動電路400類似於第2圖所示之畫素驅動電路200,因此畫素驅動電路400沿用畫素驅動電路200的相關標號,並且元件間連接關係於此不再贅述。畫素驅動電路400與畫素驅動電路200之區別在於,畫素驅動電路400不包含發光元件L2,且畫素驅動電路400具有位於節點N24與節點N25之間的容置空間401。容置空間401可以用於在檢測(例如第5圖及第6圖所述之檢測操作)後容納發光元件L4,使得發光元件L4耦接畫素驅動電路400。FIG. 4 is a circuit operation diagram of the pixel driving circuit in the display device according to an embodiment of the present invention. The
第5圖為根據本發明之一實施例中的畫素驅動電路進行檢測操作所繪示之時序圖。第5圖所繪示之時序圖包括階段P51及P52。階段P51及P52之信號操作類似於第3圖所繪示之階段P31及P32之信號操作,所以部分操作於此不再贅述。FIG. 5 is a timing diagram of the detection operation performed by the pixel driving circuit according to an embodiment of the present invention. The timing diagram shown in Figure 5 includes phases P51 and P52. The signal operations of phases P51 and P52 are similar to the signal operations of phases P31 and P32 shown in FIG. 3, so part of the operations will not be repeated here.
請參照第4圖與第5圖,在階段P51及P52,電壓信號VDD2被提供至節點N26以執行對畫素驅動電路400的檢測。在階段P51及P52,檢測信號TS具有禁能電壓準位VGL,使得開關T28關閉。Please refer to FIGS. 4 and 5, in phases P51 and P52, the voltage signal VDD2 is provided to the node N26 to perform the detection of the
在階段P51,掃描信號S(n-1)具有致能電壓準位VGH,使得開關T24導通。此時具有電壓準位DD2的電壓信號VDD2通過開關T24寫入節點N21,使得節點N21的節點電壓V21具有電壓準位DD2。In phase P51, the scan signal S(n-1) has the enable voltage level VGH, so that the switch T24 is turned on. At this time, the voltage signal VDD2 having the voltage level DD2 is written into the node N21 through the switch T24, so that the node voltage V21 of the node N21 has the voltage level DD2.
在一些實施例中,電壓準位DD2為致能電壓準位,使得開關T22依據具有電壓準位DD2的節點電壓V21導通。在一些實施例中,電容C2 用以儲存節點N21的電荷以在開關T24關閉後維持節點電壓V21,使得開關T22在開關T24關閉後(例如在階段P52)持續導通。In some embodiments, the voltage level DD2 is the enable voltage level, so that the switch T22 is turned on according to the node voltage V21 having the voltage level DD2. In some embodiments, the capacitor C2 is used to store the charge of the node N21 to maintain the node voltage V21 after the switch T24 is turned off, so that the switch T22 is continuously turned on after the switch T24 is turned off (for example, in the phase P52).
在階段P52,控制信號VC具有致能電壓準位VGH,使得開關T21導通。電容C2在階段P51儲存之電荷使得節點電壓V21在階段P52時仍然具有致能電壓準位,因此開關T22在階段P52時導通。此時被電容C2儲存在節點N21的電壓信號VDD2依序通過開關T22及T21傳輸至節點N41。In phase P52, the control signal VC has the enable voltage level VGH, so that the switch T21 is turned on. The charge stored in the capacitor C2 in the phase P51 makes the node voltage V21 still have the enable voltage level in the phase P52, so the switch T22 is turned on during the phase P52. At this time, the voltage signal VDD2 stored at the node N21 by the capacitor C2 is sequentially transmitted to the node N41 through the switches T22 and T21.
如第4圖所示,開關T24、開關T22與開關T21形成導通路徑P41。在經過階段P51及P52之操作後,如果電壓信號VDD2可以從節點N26通過導通路徑P41傳輸至節點N41,則表示導通路徑P41上的開關T24、開關T22與開關T21可以正常導通。反之,如果在經過階段P51及P52之操作後,無法在節點N41檢測到對應電壓信號VDD2的電壓信號,則表示導通路徑P41上的開關T24、開關T22與開關T21的至少一者無法正常導通。As shown in FIG. 4, the switch T24, the switch T22, and the switch T21 form a conduction path P41. After the operations of the phases P51 and P52, if the voltage signal VDD2 can be transmitted from the node N26 to the node N41 through the conduction path P41, it means that the switches T24, T22, and T21 on the conduction path P41 can be normally turned on. Conversely, if the voltage signal corresponding to the voltage signal VDD2 cannot be detected at the node N41 after the operations of the phases P51 and P52, it means that at least one of the switch T24, the switch T22, and the switch T21 on the conduction path P41 cannot be normally turned on.
第6圖為根據本發明之一實施例中的畫素驅動電路進行檢測操作所繪示之時序圖。第6圖所繪示之時序圖包括階段P61~P63。階段P61~P63之信號操作類似於第3圖所繪示之階段P31~P33之信號操作,所以部分操作於此不再贅述。FIG. 6 is a timing diagram of the detection operation performed by the pixel driving circuit according to an embodiment of the present invention. The timing diagram shown in Figure 6 includes stages P61~P63. The signal operation of stages P61~P63 is similar to the signal operation of stages P31~P33 shown in Figure 3, so part of the operation will not be repeated here.
請參照第4圖與第6圖,在階段P61~P63,電壓信號VDD2被提供至節點N26以執行對畫素驅動電路400的檢測。在階段P61~P63,檢測信號TS具有致能電壓準位VGH,使得開關T28導通。Please refer to FIGS. 4 and 6, in stages P61 to P63, the voltage signal VDD2 is provided to the node N26 to perform the detection of the
在階段P61,掃描信號S(n-1)具有致能電壓準位VGH,使得開關T24導通。此時具有電壓準位DD2的電壓信號VDD2通過開關T24寫入節點N21,使得節點N21的節點電壓V21具有電壓準位DD2。In phase P61, the scan signal S(n-1) has the enable voltage level VGH, so that the switch T24 is turned on. At this time, the voltage signal VDD2 having the voltage level DD2 is written into the node N21 through the switch T24, so that the node voltage V21 of the node N21 has the voltage level DD2.
在一些實施例中,電壓準位DD2為致能電壓準位,使得開關T22依據具有電壓準位DD2的節點電壓V21導通。在一些實施例中,電容C2 用以儲存節點N21的電荷以在開關T24關閉後維持節點電壓V21,使得開關T22在開關T24關閉後(例如在階段P62)持續導通。In some embodiments, the voltage level DD2 is the enable voltage level, so that the switch T22 is turned on according to the node voltage V21 having the voltage level DD2. In some embodiments, the capacitor C2 is used to store the charge of the node N21 to maintain the node voltage V21 after the switch T24 is turned off, so that the switch T22 is continuously turned on after the switch T24 is turned off (for example, in the phase P62).
在階段P62,控制信號VC具有致能電壓準位VGH,使得開關T21導通。電容C2在階段P61儲存之電荷使得節點電壓V21在階段P62時仍然具有致能電壓準位,因此開關T22在階段P62時導通。此時具有電壓準位VDT的資料信號DT依序通過開關T21及T22寫入節點N21。在一些實施例中,電壓準位VDT為致能電壓準位,使得開關T25導通。電容C2 用以在開關T21關閉後維持節點電壓V21,使得開關T25在開關T21關閉後(例如在階段P63)持續導通。In phase P62, the control signal VC has the enable voltage level VGH, so that the switch T21 is turned on. The charge stored in the capacitor C2 in the phase P61 makes the node voltage V21 still have the enable voltage level in the phase P62, so the switch T22 is turned on during the phase P62. At this time, the data signal DT with the voltage level VDT is sequentially written into the node N21 through the switches T21 and T22. In some embodiments, the voltage level VDT is the enable voltage level, so that the switch T25 is turned on. The capacitor C2 is used to maintain the node voltage V21 after the switch T21 is closed, so that the switch T25 is continuously turned on after the switch T21 is closed (for example, in the phase P63).
在階段P63,發光信號EM具有致能電壓準位VGH,使得開關T26與開關T27導通。電容C2維持節點電壓V21,使得開關T25導通。In phase P63, the light-emitting signal EM has the enable voltage level VGH, so that the switch T26 and the switch T27 are turned on. The capacitor C2 maintains the node voltage V21, so that the switch T25 is turned on.
如第4圖所示,開關T28、開關T26、開關T25與開關T27形成導通路徑P42。在階段P63,如果電壓信號VDD2可以從節點N26通過導通路徑P42傳輸至節點N42,則表示導通路徑P42上的開關T28、開關T26、開關T25與開關T27可以正常導通。反之,如果在階段P63,無法在節點N42檢測到電壓信號VDD2,則表示導通路徑P42上的開關T28、開關T26、開關T25與開關T27的至少一者無法正常導通。As shown in Fig. 4, the switch T28, the switch T26, the switch T25, and the switch T27 form a conduction path P42. In phase P63, if the voltage signal VDD2 can be transmitted from the node N26 to the node N42 through the conduction path P42, it means that the switches T28, T26, T25, and T27 on the conduction path P42 can be normally turned on. Conversely, if the voltage signal VDD2 cannot be detected at the node N42 at the stage P63, it means that at least one of the switch T28, the switch T26, the switch T25, and the switch T27 on the conduction path P42 cannot be normally turned on.
請參照第5圖及第6圖,除了檢測信號TS以外,第5圖及第6圖所繪示之信號操作相同。因此,在一些實施例中,只需要透過調整檢測信號TS,便可以檢測畫素驅動電路400中的不同開關是否正常導通。Please refer to FIGS. 5 and 6, except for the detection signal TS, the signal operations shown in FIGS. 5 and 6 are the same. Therefore, in some embodiments, it is only necessary to adjust the detection signal TS to detect whether the different switches in the
在一些實施例中,在執行第5圖及/或第6圖所述之檢測操作後,可以將發光元件L4耦接至容置空間401,亦即將發光元件L4耦接於節點N25與節點N24之間,使得發光元件L4耦接畫素驅動電路400。In some embodiments, after the detection operation described in FIG. 5 and/or FIG. 6 is performed, the light-emitting element L4 can be coupled to the
在一些實施例中,在發光元件L4耦接畫素驅動電路400後,可以進一步檢測由發光元件L4是否能夠正常運作。In some embodiments, after the light-emitting element L4 is coupled to the
如第4圖所示,發光元件L4與開關T28形成導通路徑P43。在一些實施例中,電壓信號VDD1與VDD2的電壓準位不同,且檢測信號TS具有致能電壓準位VGH使得開關T28導通。此時,如果電壓信號VDD1可以從節點N25通過導通路徑P43以傳輸至節點N26則表示導通路徑P43上的開關T28與發光元件L4可以正常導通。反之,如果無法在節點N26檢測到對應電壓信號VDD1之信號,則表示導通路徑P43上的開關T28與發光元件L4的至少一者無法正常導通。此外,如果發光元件L4的發光強度無法對應電壓信號VDD1與VDD2之間的電壓準位差,則表示發光元件L4有異常。As shown in FIG. 4, the light-emitting element L4 and the switch T28 form a conduction path P43. In some embodiments, the voltage levels of the voltage signals VDD1 and VDD2 are different, and the detection signal TS has the enable voltage level VGH so that the switch T28 is turned on. At this time, if the voltage signal VDD1 can be transmitted from the node N25 through the conduction path P43 to the node N26, it means that the switch T28 and the light emitting element L4 on the conduction path P43 can be normally turned on. Conversely, if the signal corresponding to the voltage signal VDD1 cannot be detected at the node N26, it means that at least one of the switch T28 and the light-emitting element L4 on the conduction path P43 cannot be normally turned on. In addition, if the luminous intensity of the light-emitting element L4 cannot correspond to the voltage level difference between the voltage signals VDD1 and VDD2, it indicates that the light-emitting element L4 is abnormal.
第7圖為根據本案之一實施例所繪示之顯示裝置中的畫素驅動電路的電路圖。請參照第7圖,第7圖為畫素驅動電路700的電路圖。畫素驅動電路700為第1圖所示的顯示裝置110中的畫素驅動電路112的一種實施例。在一些實施例中,畫素驅動電路700包括資料寫入單元720、發光單元740及檢測單元760。FIG. 7 is a circuit diagram of a pixel driving circuit in a display device according to an embodiment of the present invention. Please refer to FIG. 7, which is a circuit diagram of the
在一些實施例中,資料寫入單元720用以依據控制信號VC1及VC2進行重置操作,以重置節點N71的節點電壓V71與節點N72的節點電壓V72。資料寫入單元720更用以依據控制信號VC2將臨界電壓準位V
TH也寫入至節點N71以進行補償操作。資料寫入單元720更用以依據掃描信號S(n)進行資料寫入操作,以將資料信號DT透過電容C7寫入至節點N71。發光單元740依據發光信號EM進行發光操作,並依據節點N71的節點電壓V71產生電流I7,且依據電流I7的電流準位發光。檢測單元760用以依據檢測信號TS進行檢測操作,以檢測畫素驅動電路700中的開關T71~T76、T78及發光元件L7的至少一者是否能夠正常運作,例如正常導通或正常關閉。
In some embodiments, the
在一些實施例中,畫素驅動電路700為顯示器100中的多個畫素驅動電路的第n級畫素驅動電路DV(n)。對應地,掃描信號S(n)為第n級掃描信號,且掃描信號S(n-1)為第n-1級掃描信號。In some embodiments, the
在一些實施例中,資料寫入單元720包括開關T71~T74及電容C7。開關T71的控制端用以接收控制信號VC2,開關T71的一端耦接開關T72並用以接收電壓信號VINI於節點N77,開關T71的另一端耦接開關T73於節點N72。開關T72的一端耦接開關T71並用以接收電壓信號VINI,開關T72的另一端及開關T72的控制端耦接節點N71。在一些實施例中,開關T72具有二極體的功能。電容C7的一端耦接節點N71,電容C7的另一端耦接節點N72。開關T73的控制端用以接收掃描信號S(n),開關T73的一端用以接收資料信號DT,開關T73的另一端耦接節點N72。開關T74的控制端用以接收掃描信號S(n-1),開關T74的一端用以接收電壓信號VDD於節點N76,開關T74的另一端耦接節點N71。In some embodiments, the
在一些實施例中,發光單元740包括發光元件L7、開關T75及T76。開關T75的控制端耦接節點N71,開關T75的一端用以接收電壓信號VSS,且開關T75的另一端耦接開關T76於節點N73。開關T76的控制端用以接收發光信號EM,開關T76的一端耦接發光元件L7於節點N74,且開關T76的另一端耦接節點N73。發光元件L7的一端耦接節點N74,發光元件L7的另一端耦接節點N75,並且在節點N75用以接收電壓信號VDD1。在一些實施例中,發光元件L7用以接收流經開關T75的電流I7,並用以依據電流I7發光。In some embodiments, the light-emitting
在一些實施例中,檢測單元760包括開關T78。開關T78的控制端用以接收檢測信號TS,開關T78的一端耦接開關T74於節點N76,且開關T78的另一端耦接開關T76及發光元件L7於節點N74。在一些實施例中,檢測單元760 用以接收電壓信號VDD2於節點N76以檢測發光元件L7及開關T71~T76及T78的至少一者是否正常導通。In some embodiments, the
在不同的實施例中,發光元件L7可以是微發光二極體(mLED)或其他不同類型的發光元件。在不同的實施例中,開關T71~T76及T78可以是P型金屬氧化物半導體場效電晶體(PMOS)、N型金屬氧化物半導體場效電晶體(NMOS)、薄膜電晶體(TFT)或其他不同類型的開關元件。In different embodiments, the light emitting element L7 may be a micro light emitting diode (mLED) or other different types of light emitting elements. In different embodiments, the switches T71 to T76 and T78 can be P-type metal oxide semiconductor field effect transistors (PMOS), N-type metal oxide semiconductor field effect transistors (NMOS), thin film transistors (TFT) or Other different types of switching elements.
第8圖為根據本發明之一實施例中的畫素驅動電路進行驅動操作所繪示之時序圖。第8圖所繪示之時序圖依序包括階段P81、階段P82、階段P83以及階段P84。在一些實施例中,階段P81~P84的時間長度總和對應畫素驅動電路700的框時間(frame time)。在一些實施例中,第8圖所繪示之時序圖對應第7圖所示之不同信號,例如掃描信號S(n)、發光信號EM、資料信號DT、控制信號VC1、控制信號VC2、電壓信號VINI及檢測信號TS的操作。FIG. 8 is a timing diagram of the driving operation of the pixel driving circuit according to an embodiment of the present invention. The sequence diagram shown in FIG. 8 includes phase P81, phase P82, phase P83, and phase P84 in sequence. In some embodiments, the sum of the time lengths of the stages P81 to P84 corresponds to the frame time of the
如第8圖所示,在階段P81,控制信號VC1及VC2具有致能電壓準位VGH,使得開關T74與開關T71導通。此時開關T74提供具有電壓準位DD2的電壓信號VDD2至節點N71,使得節點N71的節點電壓V71具有電壓準位DD2。As shown in Fig. 8, in phase P81, the control signals VC1 and VC2 have the enable voltage level VGH, so that the switch T74 and the switch T71 are turned on. At this time, the switch T74 provides the voltage signal VDD2 with the voltage level DD2 to the node N71, so that the node voltage V71 of the node N71 has the voltage level DD2.
在一些實施例中,電壓準位DD2為致能電壓準位,使得開關T72依據具有電壓準位DD2的節點電壓V71導通。在一些實施例中,電容C7 用以儲存節點N71的電荷以在開關T74關閉後維持節點電壓V71,使得開關T72在開關T74關閉後(例如在階段P82)持續導通。In some embodiments, the voltage level DD2 is the enable voltage level, so that the switch T72 is turned on according to the node voltage V71 having the voltage level DD2. In some embodiments, the capacitor C7 is used to store the charge of the node N71 to maintain the node voltage V71 after the switch T74 is turned off, so that the switch T72 is continuously turned on after the switch T74 is turned off (for example, in the phase P82).
在階段P81,開關T78導通以提供電壓信號VINI至節點N72。此時電壓信號VINI具有電壓準位INI1,使得節點N72的節點電壓V72具有電壓準位INI1。In phase P81, the switch T78 is turned on to provide the voltage signal VINI to the node N72. At this time, the voltage signal VINI has the voltage level INI1, so that the node voltage V72 of the node N72 has the voltage level INI1.
在一些實施例中,在期間P81,畫素驅動電路700的節點電壓V71與節點電壓V72分別被電壓信號VDD2與電壓信號VINI重置,使得畫素驅動電路700可以準備接收資料信號DT,因此階段P81被稱為重置階段。In some embodiments, during the period P81, the node voltage V71 and the node voltage V72 of the
在階段P82,控制信號VC2具有致能電壓準位VGH,使得開關T71導通。控制信號VC1具有禁能電壓準位VGL,使得開關T74關閉。電容C7在階段P81儲存之電荷使得節點電壓V71在階段P82時仍然具有致能電壓準位,因此開關T72在階段P82時導通。此時節點N77的電壓準位INI1小於節點N71的電壓準位VDD2,使得電荷從節點N71往節點N77流出,直到節點N71的電壓準位被拉至 (INI1+V TH),其中臨界電壓準位V TH為開關T72的臨界電壓準位。此時電容C7兩端的電壓準位差為V TH。 In phase P82, the control signal VC2 has the enable voltage level VGH, so that the switch T71 is turned on. The control signal VC1 has the disable voltage level VGL, so that the switch T74 is turned off. The charge stored in the capacitor C7 in the phase P81 makes the node voltage V71 still have the enable voltage level in the phase P82, so the switch T72 is turned on during the phase P82. At this time, the voltage level INI1 of the node N77 is less than the voltage level VDD2 of the node N71, so that the charge flows from the node N71 to the node N77 until the voltage level of the node N71 is pulled to (INI1+V TH ), where the threshold voltage level V TH is the threshold voltage level of the switch T72. At this time, the voltage level difference across the capacitor C7 is V TH .
在一些實施例中,在階段P82,藉由開關T72的臨界電壓準位V TH,節點電壓V72的電壓準位被調整至(INI1+V TH)以準備補償發光階段(例如階段P84)時開關T75的臨界電壓準位V TH。因此階段P82被稱為補償階段。 In some embodiments, in the phase P82, by the threshold voltage level V TH of the switch T72, the voltage level of the node voltage V72 is adjusted to (INI1+V TH ) to prepare to compensate for the light-emitting phase (for example, phase P84). The threshold voltage level of T75 is V TH . Therefore phase P82 is called the compensation phase.
在階段P83,掃描信號S(n)具有致能電壓準位VGH,使得開關T71導通。控制信號VC1具有禁能電壓準位VGL,使得開關T74關閉。此時具有電壓準位VDT的資料信號DT通過開關T73寫入節點N72,使得節點N72具有電壓準位VDT。此時電壓信號VINI電壓準位INI2具有電壓準位INI2,使得節點N77的電壓準位被拉升至電壓準位INI2。電壓準位INI2大於節點N71的電壓準位,使得電荷在階段P83不會從節點N71往節點N77流出。In phase P83, the scan signal S(n) has the enable voltage level VGH, so that the switch T71 is turned on. The control signal VC1 has the disable voltage level VGL, so that the switch T74 is turned off. At this time, the data signal DT with the voltage level VDT is written into the node N72 through the switch T73, so that the node N72 has the voltage level VDT. At this time, the voltage level INI2 of the voltage signal VINI has the voltage level INI2, so that the voltage level of the node N77 is pulled up to the voltage level INI2. The voltage level INI2 is greater than the voltage level of the node N71, so that the charge will not flow out from the node N71 to the node N77 in the stage P83.
從階段P82到階段P83,節點N72的電壓準位從電壓準位INI1被拉至電壓準位VDT,其中的電壓準位差為(VDT-INI1)。藉由電容C7的電容耦合,從階段P82到階段P83,節點N71的電壓準位從(INI1+V TH)被拉至(INI1+V TH)+(VDT-INI1),亦即(VDT+V TH)。 From the stage P82 to the stage P83, the voltage level of the node N72 is pulled from the voltage level INI1 to the voltage level VDT, where the voltage level difference is (VDT-INI1). With the capacitive coupling of capacitor C7, from stage P82 to stage P83, the voltage level of node N71 is pulled from (INI1+V TH ) to (INI1+V TH )+(VDT-INI1), that is, (VDT+V TH ).
在一些實施例中,在階段P83,資料信號DT通過開關T73寫入節點N72,並且透過電容C7的電容耦合寫入節點N71。因此階段P83被稱為資料寫入階段。In some embodiments, in the stage P83, the data signal DT is written into the node N72 through the switch T73, and is written into the node N71 through the capacitive coupling of the capacitor C7. Therefore, stage P83 is called the data writing stage.
在階段P84,發光信號EM具有致能電壓準位VGH,使得開關T76導通。掃描信號S(n)具有禁能電壓準位VGL,使得開關T73關閉。此時電流I7依序流經發光元件L7、開關T76及T75,使得發光元件L7依據電流I7的電流準位發光。在一些實施例中,電流I7的電流準位決定發光元件L7的發光強度。In phase P84, the light-emitting signal EM has the enable voltage level VGH, so that the switch T76 is turned on. The scan signal S(n) has the disable voltage level VGL, so that the switch T73 is closed. At this time, the current I7 flows through the light-emitting element L7, the switches T76 and T75 in sequence, so that the light-emitting element L7 emits light according to the current level of the current I7. In some embodiments, the current level of the current I7 determines the luminous intensity of the light-emitting element L7.
在階段P84,電容C7維持了在階段P83時,節點N71的電壓準位,使得在階段P84時節點N71的電壓準位的電壓準位仍然為(VDT+V TH)。此時開關T75的源極用以接收具有電壓準位SS的電壓信號VSS。 In the phase P84, the capacitor C7 maintains the voltage level of the node N71 in the phase P83, so that the voltage level of the voltage level of the node N71 in the phase P84 is still (VDT+V TH ). At this time, the source of the switch T75 is used to receive the voltage signal VSS having the voltage level SS.
如此一來,將開關T75在節點N71的閘極的電壓準位(VDT+V TH)以及開關T75在節點N78的源極的電壓準位SS。帶入前述關於第3圖之操作的電子學公式,即可得出電流I7的的電流準位為K×(VDT-SS)^2。因此電流I7的電流準位與臨界電壓準位V TH無關,而與資料信號DT的電壓準位VDT與電壓信號VSS的電壓準位SS有關。 In this way, the voltage level (VDT+V TH ) of the gate of the switch T75 at the node N71 and the voltage level SS of the source of the switch T75 at the node N78 are set. Incorporating the aforementioned electronic formula for the operation in Figure 3, the current level of the current I7 can be obtained as K×(VDT-SS)^2. Therefore, the current level of the current I7 has nothing to do with the threshold voltage level V TH , but is related to the voltage level VDT of the data signal DT and the voltage level SS of the voltage signal VSS.
在一些實施例中,電壓準位VDT與電壓準位SS系取決於使用者。如此一來,發光元件L7的發光強度可以被使用者調整,而不被畫素驅動電路700的元件特性,例如開關T75的臨界電壓準位V TH所影響。 In some embodiments, the voltage level VDT and the voltage level SS depend on the user. In this way, the luminous intensity of the light-emitting element L7 can be adjusted by the user without being affected by the element characteristics of the pixel driving circuit 700, such as the threshold voltage level V TH of the switch T75.
在一些實施例中,在階段P84,畫素驅動電路700中的發光元件L7發光,因此階段P84被稱為發光階段。In some embodiments, in the phase P84, the light-emitting element L7 in the
在不同的實施例中,第5圖及第6圖所示之檢測操作亦可以應用於畫素驅動電路700。舉例來說,在發光元件L7耦接畫素驅動電路700之前,將控制信號VC1拉至致能電壓準位VGH,並提供電壓信號VDD2於節點N76,且在節點N77測量是否有對應電壓信號VDD2的信號,以確認開關T72及T74是否正常導通。In different embodiments, the detection operations shown in FIG. 5 and FIG. 6 can also be applied to the
舉另一例來說,在發光元件L7耦接畫素驅動電路700之前,將檢測信號TS、控制信號VC1及發光信號EM拉至致能電壓準位VGH,並提供電壓信號VDD2於節點N76,且在節點N78測量是否有對應電壓信號VDD2的信號,以確認開關T78、T74、T76及T75是否正常導通。For another example, before the light-emitting element L7 is coupled to the
又舉另一例來說,在發光元件L7耦接畫素驅動電路700之後,將檢測信號TS拉至致能電壓準位VGH,並提供不同於電壓信號VDD2的電壓信號VDD1於節點N75,且在節點N76測量是否有對應電壓信號VDD1的信號,以確認發光元件L7是否能夠正常運作。For another example, after the light-emitting element L7 is coupled to the
本文前述各種檢測方式係用於說明,其他各種檢測方式以及信號操作方式都在本案思及的範圍中。The various detection methods mentioned in this article are used for illustration, and other various detection methods and signal operation methods are within the scope of this case.
請參照第1圖,在一些實施例中,可以依序對顯示器100中的畫素驅動電路進行檢測。例如先通過掃描線SL(1)、資料線DL(m)與發光線EL(1)傳輸信號至畫素驅動電路DV(1)進行檢測,再通過掃描線SL(2)、資料線DL(m)與發光線EL(2)傳輸信號至畫素驅動電路DV(2)以進行檢測。在一些其他的實施例中,也可以同時對顯示器100中的多個畫素驅動電路進行檢測。例如同時通過掃描線SL(1)~SL(n)、資料線DL(m)與發光線EL(1) ~EL(n)傳輸信號至畫素驅動電路DV(1)~DV(n)以進行檢測。對顯示器100中的畫素驅動電路的各種檢測順序都在本案思及的範圍中。Referring to FIG. 1, in some embodiments, the pixel driving circuits in the
綜上所述,在本發明實施例中,在發光元件L2或L7發光時,開關T25或開關T75的臨界電壓準位V
TH被補償,使得臨界電壓準位V
TH的數值大小不影響發光元件L2或L7的發光強度。另外,由使用者決定的資料信號DT、電壓信號VINI及VSS使得發光元件L2及L7的發光強度不會受到電流路徑的電阻值的影響。此外,畫素驅動電路400可以在耦接發光元件L4之前進行檢測,從而降低製造成本。
In summary, in the embodiment of the present invention, when the light-emitting element L2 or L7 emits light, the threshold voltage level V TH of the switch T25 or the switch T75 is compensated, so that the value of the threshold voltage level V TH does not affect the light-emitting element The luminous intensity of L2 or L7. In addition, the data signal DT, voltage signals VINI, and VSS determined by the user make the luminous intensity of the light-emitting elements L2 and L7 not affected by the resistance value of the current path. In addition, the
雖然本發明已以實施例揭露如上,然其並非用以限定本發明,任何所屬技術領域中具有通常知識者,在不脫離本發明的精神和範圍內,當可作些許的更動與潤飾,故本發明的保護範圍當視後附的申請專利範圍所界定者為準。Although the present invention has been disclosed in the above embodiments, it is not intended to limit the present invention. Anyone with ordinary knowledge in the technical field can make some changes and modifications without departing from the spirit and scope of the present invention. The scope of protection of the present invention shall be subject to those defined by the attached patent scope.
100:顯示器100: display
110:顯示裝置110: display device
120:掃描裝置120: Scanning device
130:資料輸入裝置130: data input device
140:發光控制裝置140: Light-emitting control device
SL(0)~SL(n):掃描線SL(0)~SL(n): scan line
S(n-1)、S(n):掃描信號S(n-1), S(n): scan signal
DL(1)~DL(m):資料線DL(1)~DL(m): data line
DT:資料信號DT: Data signal
EL(1)~EL(n):發光線EL(1)~EL(n): luminous line
EM:發光信號EM: Luminous signal
112、200、400、700:畫素驅動電路112, 200, 400, 700: pixel drive circuit
L2、L4、L7:發光元件L2, L4, L7: light-emitting element
220、720:資料寫入單元220, 720: data writing unit
240、740:發光單元240, 740: light-emitting unit
260、760:檢測單元260, 760: detection unit
VSS、VDD、VDD1、VDD2、VINI:電壓信號VSS, VDD, VDD1, VDD2, VINI: voltage signal
VC、VC1、VC2:控制信號VC, VC1, VC2: control signal
TS:檢測信號TS: Heartbeat
N21~N26、N41、N42、N71~N77:節點N21~N26, N41, N42, N71~N77: Node
V TH:臨界電壓準位V TH : Threshold voltage level
P31~P33、P51、P52、P61~P63、P81~P84:階段P31~P33, P51, P52, P61~P63, P81~P84: stage
VGH:致能電壓準位VGH: Enable voltage level
VGL:禁能電壓準位VGL: disable voltage level
DD、DD1、DD2、SS、INI、INI1、INI2、VDT:電壓準位DD, DD1, DD2, SS, INI, INI1, INI2, VDT: voltage level
V21、V22:節點電壓V21, V22: node voltage
VGS:電壓準位差VGS: Voltage level difference
I2、I7:電流I2, I7: current
T21~T28、T71~T76、T78:開關T21~T28, T71~T76, T78: switch
401:容置空間401: accommodating space
C2、C7:電容C2, C7: Capacitance
401:容置空間401: accommodating space
P41、P42、P43:導通路徑P41, P42, P43: conduction path
K:常數K: constant
第1圖為根據本案之一實施例所繪示之顯示器的示意圖。 第2圖為根據本案之一實施例所繪示之顯示裝置中的畫素驅動電路的電路圖。 第3圖為根據本發明之一實施例中的畫素驅動電路進行驅動操作所繪示之時序圖。 第4圖為根據本案之一實施例所繪示之顯示裝置中的畫素驅動電路的電路操作圖。 第5圖為根據本發明之一實施例中的畫素驅動電路進行檢測操作所繪示之時序圖。 第6圖為根據本發明之一實施例中的畫素驅動電路進行檢測操作所繪示之時序圖。 第7圖為根據本案之一實施例所繪示之顯示裝置中的畫素驅動電路的電路圖。 第8圖為根據本發明之一實施例中的畫素驅動電路進行驅動操作所繪示之時序圖。 Figure 1 is a schematic diagram of a display according to an embodiment of the present invention. FIG. 2 is a circuit diagram of a pixel driving circuit in a display device according to an embodiment of the present invention. FIG. 3 is a timing diagram of the driving operation of the pixel driving circuit according to an embodiment of the present invention. FIG. 4 is a circuit operation diagram of the pixel driving circuit in the display device according to an embodiment of the present invention. FIG. 5 is a timing diagram of the detection operation performed by the pixel driving circuit according to an embodiment of the present invention. FIG. 6 is a timing diagram of the detection operation performed by the pixel driving circuit according to an embodiment of the present invention. FIG. 7 is a circuit diagram of a pixel driving circuit in a display device according to an embodiment of the present invention. FIG. 8 is a timing diagram of the driving operation of the pixel driving circuit according to an embodiment of the present invention.
國內寄存資訊(請依寄存機構、日期、號碼順序註記) 無 國外寄存資訊(請依寄存國家、機構、日期、號碼順序註記) 無 Domestic deposit information (please note in the order of deposit institution, date and number) none Foreign hosting information (please note in the order of hosting country, institution, date, and number) none
S(n-1)、S(n):掃描信號 S(n-1), S(n): scan signal
DT:資料信號 DT: Data signal
EM:發光信號 EM: Luminous signal
200:畫素驅動電路 200: pixel drive circuit
L2:發光元件 L2: Light-emitting element
220:資料寫入單元 220: data write unit
240:發光單元 240: light-emitting unit
260:檢測單元 260: detection unit
VSS、VDD、VINI:電壓信號 VSS, VDD, VINI: voltage signal
VC:控制信號 VC: Control signal
TS:檢測信號 TS: Heartbeat
N21~N26:節點 N21~N26: Node
I2:電流 I2: current
T21~T28:開關 T21~T28: switch
C2:電容 C2: Capacitance
Claims (10)
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