TWI734463B - Pixel driving device having test function - Google Patents
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
- G09G3/22—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources
- G09G3/30—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels
- G09G3/32—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED]
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
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Abstract
Description
本發明是有關於一種顯示技術,特別是關於一種顯示面板的驅動裝置。 The present invention relates to a display technology, in particular to a driving device for a display panel.
顯示面板的基板上的畫素驅動電路在製造過程中可能因為金屬殘留與蝕刻過多等等因素導致基板異常。發光元件諸如微發光二極體的製造過程複雜導致成本較高。此外,現行畫素驅動電路中的電流可能受開關特性影響而產生亮度差異。因此,要如何發展能夠克服上述問題之相關技術為本領域重要之課題。 The pixel driving circuit on the substrate of the display panel may be abnormal due to metal residue and excessive etching during the manufacturing process. The manufacturing process of light-emitting elements such as micro-light-emitting diodes is complicated, resulting in higher costs. In addition, the current in the current pixel driving circuit may be affected by the switching characteristics and cause brightness differences. Therefore, how to develop related technologies that can overcome the above-mentioned problems is an important issue in this field.
本發明實施例包含一種具檢測功能的畫素驅動裝置,包括多個畫素驅動電路。多個畫素驅動電路用以依序接收一第一掃描信號、一第二掃描信號與一發光信號以執行一第一檢測,多個畫素驅動電路包括一畫素驅動電路,該畫素驅動電路包括多個開關與一容置空間。多個開關用以在執行該第一檢測時接收至少一檢測信號以確認該多個 開關是否依據該第一掃描信號、該第二掃描信號與該發光信號正常導通或正常關閉。容置空間用以在該第一檢測完畢後容納一發光元件,使得該發光元件耦接該畫素驅動電路。 The embodiment of the present invention includes a pixel driving device with detection function, which includes a plurality of pixel driving circuits. The plurality of pixel driving circuits are used to sequentially receive a first scan signal, a second scan signal, and a light emitting signal to perform a first detection. The plurality of pixel driving circuits include a pixel driving circuit, and the pixel driving The circuit includes a plurality of switches and an accommodating space. A plurality of switches are used for receiving at least one detection signal to confirm the plurality of Whether the switch is normally turned on or normally closed according to the first scan signal, the second scan signal, and the light-emitting signal. The accommodating space is used for accommodating a light-emitting element after the first detection is completed, so that the light-emitting element is coupled to the pixel driving circuit.
100:顯示面板 100: display panel
110:顯示裝置 110: display device
120:掃描裝置 120: Scanning device
130:資料輸入裝置 130: data input device
140:發光裝置 140: Light-emitting device
SL(1)~SL(n+1):掃描線 SL(1)~SL(n+1): scan line
S1、S2:掃描信號 S1, S2: scan signal
DL(1)~DL(m):資料線 DL(1)~DL(m): data line
D1:資料信號 D1: Data signal
EL(1)~EL(n):發光線 EL(1)~EL(n): luminous line
EM:發光信號 EM: Luminous signal
112、112'、112":畫素驅動電路 112, 112', 112": pixel drive circuit
L1:發光元件 L1: Light-emitting element
210:重置單元 210: reset unit
220:資料寫入單元 220: data write unit
230:補償單元 230: compensation unit
240:發光單元 240: light-emitting unit
SS、DD:電壓信號 SS, DD: voltage signal
VA、VB:節點電壓 VA, VB: node voltage
RF1、RF2:參考信號 RF1, RF2: Reference signal
201、211、213、221、223、231、233、241、243、245:節點 201, 211, 213, 221, 223, 231, 233, 241, 243, 245: nodes
VTH:臨界電壓準位 V TH : Threshold voltage level
VSS、VDD、VR1、VR2、VD1:電壓準位 VSS, VDD, VR1, VR2, VD1: voltage level
ΔV:電壓準位變化 ΔV: voltage level change
I:電流 I: current
T1~T7:開關 T1~T7: switch
C1:電容 C1: Capacitance
P31~P33、P51、P71、P91:階段 P31~P33, P51, P71, P91: stage
VGH:致能電壓準位 VGH: enable voltage level
VGL:禁能電壓準位 VGL: disable voltage level
401:容置空間 401: accommodating space
410、420、610、810、820、1010:導通路徑 410, 420, 610, 810, 820, 1010: conduction path
第1圖為根據本案之一實施例所繪示之顯示面板的示意圖。 Figure 1 is a schematic diagram of a display panel according to an embodiment of the present invention.
第2圖為根據本案之一實施例所繪示之顯示裝置中的畫素驅動電路的電路圖。 FIG. 2 is a circuit diagram of a pixel driving circuit in a display device according to an embodiment of the present invention.
第3圖為根據本發明之一實施例中的畫素驅動電路進行驅動操作所繪示之時序圖。 FIG. 3 is a timing diagram of the driving operation of the pixel driving circuit according to an embodiment of the present invention.
第4圖為根據本案之一實施例所繪示之顯示裝置中的畫素驅動電路的電路操作圖。 FIG. 4 is a circuit operation diagram of the pixel driving circuit in the display device according to an embodiment of the present invention.
第5圖為根據本發明之一實施例中的畫素驅動電路進行檢測操作所繪示之時序圖。 FIG. 5 is a timing diagram of the detection operation performed by the pixel driving circuit according to an embodiment of the present invention.
第6圖為根據本案之一實施例所繪示之顯示裝置中的畫素驅動電路的電路操作圖。 FIG. 6 is a circuit operation diagram of the pixel driving circuit in the display device according to an embodiment of the present invention.
第7圖為根據本發明之一實施例中的畫素驅動電路進行檢測操作所繪示之時序圖。 FIG. 7 is a timing diagram of the detection operation performed by the pixel driving circuit according to an embodiment of the present invention.
第8圖為根據本案之一實施例所繪示之顯示裝置中的畫素驅動電路的電路操作圖。 FIG. 8 is a circuit operation diagram of the pixel driving circuit in the display device according to an embodiment of the present invention.
第9圖為根據本發明之一實施例中的畫素驅動電路進 行檢測操作所繪示之時序圖。 Figure 9 shows the pixel driving circuit according to an embodiment of the present invention. The timing chart of the line detection operation.
第10圖為根據本案之一實施例所繪示之顯示裝置中的畫素驅動電路的電路操作圖。 FIG. 10 is a circuit operation diagram of the pixel driving circuit in the display device according to an embodiment of the present invention.
於本文中,當一元件被稱為「連接」或「耦接」時,可指「電性連接」或「電性耦接」。「連接」或「耦接」亦可用以表示二或多個元件間相互搭配操作或互動。此外,雖然本文中使用「第一」、「第二」、…等用語描述不同元件,該用語僅是用以區別以相同技術用語描述的元件或操作。除非上下文清楚指明,否則該用語並非特別指稱或暗示次序或順位,亦非用以限定本發明。 In this text, when a component is referred to as “connected” or “coupled”, it can be referred to as “electrically connected” or “electrically coupled”. "Connected" or "coupled" can also be used to mean that two or more components cooperate or interact with each other. In addition, although terms such as “first”, “second”, etc. are used herein to describe different elements, the terms are only used to distinguish elements or operations described in the same technical terms. Unless the context clearly indicates, the terms do not specifically refer to or imply order or sequence, nor are they used to limit the present invention.
除非另有定義,本文使用的所有術語(包括技術和科學術語)具有與本發明所屬領域的普通技術人員通常理解的相同的含義。將進一步理解的是,諸如在通常使用的字典中定義的那些術語應當被解釋為具有與它們在相關技術和本發明的上下文中的含義一致的含義,並且將不被解釋為理想化的或過度正式的意義,除非本文中明確地這樣定義。 Unless otherwise defined, all terms (including technical and scientific terms) used herein have the same meaning as commonly understood by those of ordinary skill in the art to which the present invention belongs. It will be further understood that terms such as those defined in commonly used dictionaries should be interpreted as having meanings consistent with their meanings in the context of related technologies and the present invention, and will not be interpreted as idealized or excessive The formal meaning, unless explicitly defined as such in this article.
這裡使用的術語僅僅是為了描述特定實施例的目的,而不是限制性的。如本文所使用的,除非內容清楚地指示,否則單數形式「一」、「一個」和「該」旨在包括複數形式,包括「至少一個」。「或」表示「及/或」。如本文所使用的,術語「及/或」包括一個或多個相關所列項 目的任何和所有組合。還應當理解,當在本說明書中使用時,術語「包括」及/或「包含」指定所述特徵、區域、整體、步驟、操作、元件的存在及/或部件,但不排除一個或多個其它特徵、區域整體、步驟、操作、元件、部件及/或其組合的存在或添加。 The terminology used here is only for the purpose of describing specific embodiments and is not restrictive. As used herein, unless the content clearly indicates otherwise, the singular forms "a", "an" and "the" are intended to include plural forms, including "at least one." "Or" means "and/or". As used herein, the term "and/or" includes one or more related listed items Any and all combinations of purpose. It should also be understood that when used in this specification, the terms "including" and/or "including" designate the presence of the features, regions, wholes, steps, operations, elements, and/or components, but do not exclude one or more The existence or addition of other features, regions as a whole, steps, operations, elements, components, and/or combinations thereof.
以下將以圖式揭露本案之複數個實施方式,為明確說明起見,許多實務上的細節將在以下敘述中一併說明。然而,應瞭解到,這些實務上的細節不應用以限制本案。也就是說,在本揭示內容部分實施方式中,這些實務上的細節是非必要的。此外,為簡化圖式起見,一些習知慣用的結構與元件在圖式中將以簡單示意的方式繪示之。 Hereinafter, multiple implementation modes of this case will be disclosed in schematic form. For the sake of clarity, many practical details will be described in the following description. However, it should be understood that these practical details should not be used to limit the case. That is to say, in some implementations of the present disclosure, these practical details are unnecessary. In addition, in order to simplify the drawings, some conventionally used structures and elements are shown in the drawings in a simple and schematic manner.
第1圖為根據本案之一實施例所繪示之顯示面板的示意圖。請參照第1圖,顯示面板100包括顯示裝置110、掃描裝置120、資料輸入裝置130與發光裝置140。掃描裝置120藉由掃描線SL(1)~SL(n+1)提供多個掃描信號,例如第2圖中的掃描信號S1與掃描信號S2,至顯示裝置110。資料輸入裝置130藉由資料線DL(1)~DL(m)提供多個資料信號,例如第2圖中的資料信號D1,至顯示裝置110。發光裝置140藉由發光線EL(1)~EL(n)提供多個發光信號,例如第2圖中的發光信號EM,至顯示裝置110。其中n與m皆為正整數。在一些實施例中,顯示面板100可以由玻璃基板或塑膠基板所製成,但不限於此。
Figure 1 is a schematic diagram of a display panel according to an embodiment of the present invention. Please refer to FIG. 1, the
如第1圖所示,顯示裝置110包含多級彼此串接
的畫素驅動電路DV(1)~DV(n),其中包含畫素驅動電路112。在一些實施例中,顯示裝置110中的畫素驅動電路112依據掃描裝置120、資料輸入裝置130與發光裝置140提供的信號進行發光操作。
As shown in Figure 1, the
舉例來說,如第2圖所示,畫素驅動電路112藉由掃描裝置120提供的掃描信號S1重置畫素驅動電路112,並且藉由掃描裝置120提供的掃描信號S2寫入由資料輸入裝置130提供的資料信號D1,其中資料信號D1的電壓準位決定了發光元件L1的發光強度,最後藉由發光裝置140提供的發光信號EM控制發光元件L1的發光時間長度。
For example, as shown in FIG. 2, the
在一些實施例中,掃描信號S1與掃描信號S2分別通過掃描線SL(n)與掃描線SL(n+1)傳輸至畫素驅動電路112,資料信號D1通過資料線DL(m)傳輸至畫素驅動電路112,發光信號EM通過發光線EL(n)傳輸至畫素驅動電路112,但本發明實施例不限於此,通過其他各種導線傳輸掃描信號S1、掃描信號S2、資料信號D1與發光信號EM至畫素驅動電路112的方式亦在本發明思及範圍內。
In some embodiments, the scan signal S1 and the scan signal S2 are respectively transmitted to the
第2圖為根據本案之一實施例所繪示之顯示裝置中的畫素驅動電路的電路圖。請參照第2圖,第2圖為顯示裝置110中的畫素驅動電路112的電路圖。在一些實施例中,畫素驅動電路112包括重置單元210、資料寫入單元220、補償單元230與發光單元240。
FIG. 2 is a circuit diagram of a pixel driving circuit in a display device according to an embodiment of the present invention. Please refer to FIG. 2, which is a circuit diagram of the
在一些實施例中,重置單元210用以依據掃描信號S1導通,並且在導通時依據電壓信號SS下拉節點221的節點電壓VA以及依據參考信號RF1拉升節點201的節點電壓VB,以重置節點電壓VA與節點電壓VB。資料寫入單元220用以依據掃描信號S2導通,並且在導通時將資料信號D1寫入至節點221。補償單元230用以依據掃描信號S2導通,並且在導通時依據電壓信號SS的電壓準位VSS與開關T6的臨界電壓準位VTH下拉節點201的節點電壓VB。發光單元240依據發光信號EM導通,並且在導通時依據參考信號RF2拉升節點221的節點電壓VA以及接收來自補償單元的電流I,並依據電流I的電流準位發光。
In some embodiments, the
在一些實施例中,重置單元210包括開關T3與開關T5,開關T3的控制端與開關T5的控制端皆用以接收掃描信號S1。開關T3的一端用以接收電壓信號SS於節點211,開關T3的另一端耦接節點221。開關T5的一端用以接收參考信號RF1於節點213,開關T5的另一端耦接節點201。
In some embodiments, the
在一些實施例中,資料寫入單元220包括開關T1與電容C1。開關T1的控制端用以接收掃描信號S2,開關T1的一端用以接收資料信號D1於節點223,開關T1的另一端耦接節點221。電容C1的一端耦接節點221,電容C1的另一端耦接節點201。電容C1用以將資料信號D1從資料寫入單元220傳輸至補償單元230。
In some embodiments, the
在一些實施例中,補償單元230包括開關T4與開關T6。開關T4的控制端用以接收掃描信號S2,開關T4的一端耦接節點201,開關T4的另一端耦接節點231。開關T6的控制端耦接節點201,開關T6的一端用以接收電壓信號SS於節點233,開關T6的另一端耦接節點231。
In some embodiments, the
在一些實施例中,發光單元240包括發光元件L1、開關T2與開關T7。開關T2的控制端用以接收發光信號EM,開關T2的一端耦接節點221,開關T2的另一端用以接收參考信號RF2於節點241。開關T7的控制端用以接收發光信號EM,開關T7的一端耦接節點231,開關T7的另一端耦接節點243。發光元件L1的一端耦接節點243,發光元件L1的另一端耦接節點241,並且在節點241用以接收電壓信號DD。
In some embodiments, the light-emitting
在不同的實施例中,發光元件L1可以是微發光二極體(mLED)或其他不同類型的發光元件。在不同的實施例中,開關T1~開關T7可以是P型金屬氧化物半導體場效電晶體(PMOS)、N型金屬氧化物半導體場效電晶體(NMOS)、薄膜電晶體(TFT)或其他不同類型的開關元件。 In different embodiments, the light emitting element L1 may be a micro light emitting diode (mLED) or other different types of light emitting elements. In different embodiments, the switches T1 to T7 can be P-type metal oxide semiconductor field effect transistors (PMOS), N-type metal oxide semiconductor field effect transistors (NMOS), thin film transistors (TFT), or other types. Different types of switching elements.
第3圖為根據本發明之一實施例中的畫素驅動電路進行驅動操作所繪示之時序圖。第3圖所繪示之時序圖依序包括階段P31、階段P32與階段P33。 FIG. 3 is a timing diagram of the driving operation of the pixel driving circuit according to an embodiment of the present invention. The timing diagram shown in FIG. 3 includes phase P31, phase P32, and phase P33 in sequence.
在階段P31,掃描信號S1具有致能電壓準位
VGH,使得開關T3與開關T5導通。此時開關T3提供電壓信號SS至節點221,電壓信號SS具有電壓準位VSS,使得節點221的節點電壓VA具有電壓準位VSS。此時開關T5提供參考信號RF1至節點201,參考信號RF1具有電壓準位VR1,使得節點201的節點電壓VB具有電壓準位VR1。此時電容C1儲存來自參考信號RF1的電荷,使得在開關T5關閉後節點電壓VB的電壓準位還可以維持在足以導通開關T6的致能電壓準位。
In phase P31, the scan signal S1 has the enable voltage level
VGH turns on the switch T3 and the switch T5. At this time, the switch T3 provides the voltage signal SS to the
在一些實施例中,在期間P31,畫素驅動電路112的節點電壓VA與節點電壓VB被重置,使得畫素驅動電路112可以準備接收資料信號D1,因此階段P31被稱為重置階段。
In some embodiments, during the period P31, the node voltage VA and the node voltage VB of the
在階段P32,掃描信號S2具有致能電壓準位VGH,使得開關T1與開關T4導通。此時開關T1將資料信號D1寫入節點221,使得節點221的節點電壓VA具有資料信號D1的電壓準位VD1。電容C1在階段P31儲存之電荷使得節點電壓VB在階段P32時仍然具有致能電壓準位,因此開關T6在階段P32時導通。開關T4與開關T6皆導通,使得節點電壓VB的電壓準位被電壓信號SS下拉至(VSS+VTH),其中電壓準位VSS為電壓信號SS的電壓準位,臨界電壓準位VTH為開關T6的臨界電壓準位。
In phase P32, the scan signal S2 has the enable voltage level VGH, so that the switch T1 and the switch T4 are turned on. At this time, the switch T1 writes the data signal D1 into the
在一些實施例中,在階段P32,資料信號D1被寫入畫素驅動電路112,並且節點電壓VB的電壓準位被
調整至(VSS+VTH)以準備補償發光階段(例如階段P33)時開關T6的臨界電壓準位VTH。因此階段P32被稱為資料寫入與補償階段。
In some embodiments, in stage P32, the data signal D1 is written into the
在一些實施例中,在階段P31,開關T3將節點221的節點電壓VA下拉至電壓準位VSS,其中電壓準位VSS低於資料信號D1的電壓準位VD1,使得在階段P32資料信號D1寫入時,節點電壓VB的電壓準位會被正確地調整至(VSS+VTH)。
In some embodiments, in the stage P31, the switch T3 pulls the node voltage VA of the
在階段P33,發光信號EM具有致能電壓準位VGH,使得開關T2與開關T7導通。此時開關T2提供參考信號RF2至節點221,參考信號RF2具有電壓準位VR2,使得節點221的節點電壓VA的電壓準位從階段P32的電壓準位VD1被拉至電壓準位VR2。節點電壓VA從階段P32到階段P33的電壓準位變化ΔV為(VR2-VD1)。此時電容C1藉由節點電壓VA將節點電壓VB的電壓準位從階段P32時的(VSS+VTH)拉至電壓準位((VSS+VTH)+ΔV),也就是(VSS+VTH-VD1+VR2)。
In phase P33, the light-emitting signal EM has the enable voltage level VGH, so that the switch T2 and the switch T7 are turned on. At this time, the switch T2 provides the reference signal RF2 to the
在一些實施例中,電壓準位VR1大於或等於電壓準位VR2,但本發明實施例不限於此。 In some embodiments, the voltage level VR1 is greater than or equal to the voltage level VR2, but the embodiment of the present invention is not limited thereto.
在一些實施例中,在階段P33,開關T7導通使得電流I可以從節點245經過節點243與節點231流至節點233。節點245接收具有電壓準位VDD的電壓信號DD,其中電壓準位VDD高於節點233的電壓準位VSS,
使得電流I的電流準位的絕對值可以大於零。在一些實施例中,電流I的電流準位可以決定發光元件L1的發光強度。
In some embodiments, in the phase P33, the switch T7 is turned on so that the current I can flow from the
在一些實施例中,將開關T6的閘極電壓準位與源極電壓準位之差,也就是節點201的電壓準位與節點233的電壓準位之差設為VGS,透過電子學中的公式可得知通過開關T6的電流I的電流準位為K×(VGS-VTH)。在階段P33,將(VSS+VTH-VD1+VR2)帶入節點201的電壓準位,並且將VSS帶入節點201的電壓準位,即可得出電流I的的電流準位為K×(VR2-VD1),其中K為一常數。因此電流I的電流準位與臨界電壓準位VTH無關,而與資料信號D1的電壓準位VD1有關。
In some embodiments, the difference between the gate voltage level and the source voltage level of the switch T6, that is, the difference between the voltage level of the
在一些實施例中,在階段P33,發光元件L1的發光強度由電流I的電流準位決定。通過階段P31、階段P32與階段P33所述之操作可以使臨界電壓準位VTH的數值大小不影響發光元件L1的發光強度。發光元件L1的發光強度取決於資料信號D1的電壓準位VD1。 In some embodiments, in the stage P33, the luminous intensity of the light-emitting element L1 is determined by the current level of the current I. Through the operations described in the stage P31, the stage P32, and the stage P33, the value of the threshold voltage level V TH does not affect the luminous intensity of the light-emitting element L1. The luminous intensity of the light-emitting element L1 depends on the voltage level VD1 of the data signal D1.
在一些實施例中,在階段P33,畫素驅動電路112中的發光元件L1發光,因此階段P33被稱為發光階段。
In some embodiments, in the phase P33, the light-emitting element L1 in the
在先前的作法中,檢測訊號被提供至顯示面板100以測試顯示裝置110是否有異常時,發光元件L1已經耦接顯示裝置110。此時顯示面板100之製造成本包含發光元件L1之製造成本。
In the previous practice, when the detection signal is provided to the
相較於上述的作法,本發明實施例提供一種可以在
發光元件L1耦接顯示裝置110之前進行檢測的畫素驅動電路112',如第4圖所示。畫素驅動電路112'為還沒耦接發光元件L1的畫素驅動電路112,因此畫素驅動電路112'的成本比畫素驅動電路112的製造成本低。
Compared with the above-mentioned method, the embodiment of the present invention provides a method that can be used in
The light-emitting element L1 is coupled to the
第4圖為根據本案之一實施例所繪示之顯示裝置中的畫素驅動電路的電路操作圖。第4圖所示之畫素驅動電路112'與第2圖所示之畫素驅動電路112之區別在於,畫素驅動電路112'具有容置空間401耦接於節點245與節點243之間。容置空間401可以用於容納發光元件L1,使得發光元件L1耦接畫素驅動電路112'。
FIG. 4 is a circuit operation diagram of the pixel driving circuit in the display device according to an embodiment of the present invention. The difference between the
第5圖為根據本發明之一實施例中的畫素驅動電路進行檢測操作所繪示之時序圖。第5圖所繪示之時序圖包括階段P51。在階段P51,一種對畫素驅動電路112'的檢測被執行。 FIG. 5 is a timing diagram of the detection operation performed by the pixel driving circuit according to an embodiment of the present invention. The timing diagram shown in Figure 5 includes phase P51. In stage P51, a detection of the pixel driving circuit 112' is performed.
請參照第4圖與第5圖,在階段P51,掃描信號S1與掃描信號S2具有致能電壓準位VGH,使得開關T1、開關T3、開關T4與開關T5導通。發光信號EM具有禁能電壓準位VGL,使得開關T2與開關T7關閉。此時從節點213開始,經過節點201與節點231至節點233形成導通路徑410,並且從節點211開始,經過節點221至節點223形成導通路徑420。
Referring to FIGS. 4 and 5, in stage P51, the scan signal S1 and the scan signal S2 have the enable voltage level VGH, so that the switch T1, the switch T3, the switch T4, and the switch T5 are turned on. The light-emitting signal EM has the disable voltage level VGL, so that the switch T2 and the switch T7 are closed. At this time, starting from
在一些實施例中,在階段P51,參考信號RF1被提供至節點213以進行檢測。如果參考信號RF1可以從節點213傳輸至節點233,則表示導通路徑410上的開關
T5、開關T4與開關T6可以正常導通。類似的,電壓信號SS被提供至節點211以進行檢測。如果電壓信號SS可以從節點211傳輸至節點223,則表示導通路徑420上的開關T3與開關T1可以正常導通。此時由於開關T2關閉,節點241之電壓準位應為浮動電壓準位而不會被電壓信號SS影響。若節點241之電壓準位為浮動電壓準位,則表示開關T2可以正常關閉。
In some embodiments, in phase P51, the reference signal RF1 is provided to the
第6圖為根據本案之一實施例所繪示之顯示裝置中的畫素驅動電路的電路操作圖。第6圖所示之畫素驅動電路112'與第4圖所示之畫素驅動電路112'相同。第6圖與第4圖之區別在於導通的開關不同,如下所述。 FIG. 6 is a circuit operation diagram of the pixel driving circuit in the display device according to an embodiment of the present invention. The pixel driving circuit 112' shown in FIG. 6 is the same as the pixel driving circuit 112' shown in FIG. The difference between Fig. 6 and Fig. 4 is the switch that is turned on, as described below.
第7圖為根據本發明之一實施例中的畫素驅動電路進行檢測操作所繪示之時序圖。第7圖所繪示之時序圖包括階段P71。在階段P71,一種對畫素驅動電路112'的檢測被執行。 FIG. 7 is a timing diagram of the detection operation performed by the pixel driving circuit according to an embodiment of the present invention. The timing diagram shown in Figure 7 includes phase P71. In stage P71, a detection of the pixel driving circuit 112' is performed.
請參照第6圖與第7圖,在階段P71,發光信號EM與掃描信號S2具有致能電壓準位VGH,使得開關T1、開關T2、開關T4與開關T6導通。掃描信號S1具有禁能電壓準位VGL,使得開關T3與開關T5關閉。此時從節點241開始,經過節點221至節點223形成導通路徑610。
Referring to FIGS. 6 and 7, in stage P71, the light-emitting signal EM and the scan signal S2 have the enable voltage level VGH, so that the switch T1, the switch T2, the switch T4, and the switch T6 are turned on. The scan signal S1 has the disable voltage level VGL, so that the switch T3 and the switch T5 are closed. At this time, starting from the
在一些實施例中,在階段P71,參考信號RF2被提供至節點241以進行檢測。如果參考信號RF2可以從節點241傳輸至節點223,則表示導通路徑610上的開關
T1與開關T2可以正常導通。另外,電壓信號SS被提供至節點233以進行檢測。此時由於開關T5關閉,參考信號RF1無法通過開關T5,因此節點213之電壓準位應為浮動電壓準位而不會被電壓信號SS影響。若節點213的電壓準位為浮動電壓準位,則表示開關T5可以正常關閉。
In some embodiments, in stage P71, the reference signal RF2 is provided to the
第8圖為根據本案之一實施例所繪示之顯示裝置中的畫素驅動電路的電路操作圖。第8圖所示之畫素驅動電路112'與第4圖所示之畫素驅動電路112'相同。第8圖與第4圖之區別在於導通的開關不同,如下所述。 FIG. 8 is a circuit operation diagram of the pixel driving circuit in the display device according to an embodiment of the present invention. The pixel driving circuit 112' shown in FIG. 8 is the same as the pixel driving circuit 112' shown in FIG. The difference between Fig. 8 and Fig. 4 is the switch that is turned on, as described below.
第9圖為根據本發明之一實施例中的畫素驅動電路進行檢測操作所繪示之時序圖。第9圖所繪示之時序圖包括階段P91。在階段P91,一種對畫素驅動電路112'的檢測被執行。 FIG. 9 is a timing diagram of a detection operation performed by the pixel driving circuit according to an embodiment of the present invention. The timing diagram shown in Figure 9 includes phase P91. In stage P91, a detection of the pixel driving circuit 112' is performed.
請參照第8圖與第9圖,在階段P91,發光信號EM、掃描信號S1與掃描信號S2具有致能電壓準位VGH,使得開關T1~開關T7全部導通。此時從節點213開始,經過節點201與節點231至節點233形成導通路徑810,並且從節點211開始,經過節點221至節點223與節點241形成導通路徑820。
Referring to FIG. 8 and FIG. 9, in stage P91, the light-emitting signal EM, the scan signal S1, and the scan signal S2 have the enable voltage level VGH, so that the switches T1 to T7 are all turned on. At this time, starting from the
在一些實施例中,在階段P91,參考信號RF1被提供至節點213以進行檢測。如果參考信號RF1可以從節點213傳輸至節點233,則表示導通路徑810上的開關T5、開關T4與開關T6可以正常導通。另外,電壓信號SS被提供至節點211以進行檢測。如果電壓信號SS可以
從節點211傳輸至節點223與241,則表示導通路徑810上的開關T3、開關T1與開關T2可以正常導通。
In some embodiments, in phase P91, the reference signal RF1 is provided to the
在一些實施例中,在第4圖~第9圖所述的階段P51、階段P71或階段P91中,也可以將信號提供至導通路徑的不同於上述實施例的節點以進行檢測。舉例來說,請參照第4圖與第5圖,在階段P51,也可以提供電壓信號SS至節點233,並且量測節點213的電壓準位是否為電壓信號SS的電壓準位VSS,以確認開關T5、開關T4與開關T6是否正常導通。
In some embodiments, in phase P51, phase P71, or phase P91 described in FIGS. 4-9, a signal may also be provided to a node of the conduction path that is different from the above-mentioned embodiment for detection. For example, referring to Figures 4 and 5, at stage P51, the voltage signal SS can also be provided to the
在一些實施例中,在各個階段中,各個節點的電壓準位被示波器量測以進行檢測。舉例來說,在階段P51,藉由示波器量測節點241的電壓準位,以確認節點241的電壓準位是否為浮動電壓準位。舉另一例來說,在階段P51,藉由示波器量測節點233的電壓準位,以確認節點233的電壓準位是否為參考信號RF1的電壓準位VR1。
In some embodiments, in each stage, the voltage level of each node is measured by an oscilloscope for detection. For example, in stage P51, the voltage level of the
在一些實施例中,第4圖~第9圖所述之檢測被稱為陣列檢測(array test),並且只對顯示面板100的基板進行檢測。
In some embodiments, the inspection described in FIGS. 4-9 is called an array test, and only the substrate of the
第10圖為根據本案之一實施例所繪示之顯示裝置中的畫素驅動電路的電路操作圖。第10圖所示之畫素驅動電路112"與第4圖所示之畫素驅動電路112'之區別在於,在畫素驅動電路112"中,發光元件L1耦接於容置空間401中,也就是耦接於節點245與節點243之間。
FIG. 10 is a circuit operation diagram of the pixel driving circuit in the display device according to an embodiment of the present invention. The difference between the
第10圖所示之實施例的操作類似於第9圖所示之
階段P91的操作,即發光信號EM、掃描信號S1與掃描信號S2具有致能電壓準位VGH,使得開關T1~開關T7全部導通。此時從節點245開始,經過節點243與節點231至節點201與節點233形成導通路徑1010。
The operation of the embodiment shown in Fig. 10 is similar to that shown in Fig. 9
The operation of the stage P91, that is, the light-emitting signal EM, the scan signal S1, and the scan signal S2 have the enable voltage level VGH, so that the switches T1 to T7 are all turned on. At this time, starting from
在一些實施例中,在第10圖所示之實施例的操作中,電壓信號SS與電壓信號DD分別被提供至節點233與節點245。此時電流I通過發光元件L1使得發光元件L1發光。如果發光元件L1正確地發光,則代表開關T7正常導通且發光元件L1沒有異常。在一些實施例中,發光元件L1的異常可能由焊接狀況導致。
In some embodiments, in the operation of the embodiment shown in FIG. 10, the voltage signal SS and the voltage signal DD are provided to the
在一些實施例中,第10圖所述之檢測被稱為畫素檢測(cell test)。畫素檢測不同於陣列檢測,不只對顯示面板100的基板進行檢測,也對焊接在顯示面板100上的發光元件,例如發光元件L1,進行檢測。
In some embodiments, the test described in Figure 10 is called a cell test. Pixel detection is different from array detection. It not only detects the substrate of the
在一些實施例中,第4圖~第9圖所述之陣列檢測發生在將發光元件L1焊接於顯示面板100之前。第10圖所述之畫素檢測發生在將發光元件L1焊接於顯示面板100之後。由於畫素驅動電路112'比畫素驅動電路112"少了發光元件L1,因此畫素驅動電路112'的製作成本較畫素驅動電路112"低。先透過陣列檢測確認顯示面板100沒有異常,再將發光元件L1焊接於顯示面板100可以節省製造成本。
In some embodiments, the array detection described in FIGS. 4-9 occurs before the light-emitting element L1 is soldered to the
請參照第1圖,在一些實施例中,可以依序對顯示面板100中的畫素驅動電路進行檢測。例如先通過掃描
線SL(1)、資料線DL(m)與發光線EL(1)傳輸信號至畫素驅動電路DV(1)進行檢測,再通過掃描線SL(2)、資料線DL(m)與發光線EL(2)傳輸信號至畫素驅動電路DV(2)以進行檢測。在一些實施例中,也可以同時對顯示面板100中的多個畫素驅動電路進行檢測。例如同時通過掃描線SL(1)~SL(n)、資料線DL(m)與發光線EL(1)~EL(n)傳輸信號至畫素驅動電路DV(1)~DV(n)以進行檢測。對顯示面板100中的畫素驅動電路的各種檢測順序都在本案思及的範圍中。
Please refer to FIG. 1. In some embodiments, the pixel driving circuits in the
綜上所述,在本發明實施例中,在發光元件L1發光時,開關T6的臨界電壓準位VTH被補償,使得臨界電壓準位VTH的數值大小不影響發光元件L1的發光強度。另外,畫素驅動電路112'具有多條用於檢測的導通路徑。在電容C1的兩側具有獨立的導通路徑,例如導通路徑410與導通路徑420。此外,畫素驅動電路112'可以在耦接發光元件L1之前進行檢測,從而降低製造成本。
To sum up, in the embodiment of the present invention, when the light-emitting element L1 emits light, the threshold voltage level V TH of the switch T6 is compensated, so that the value of the threshold voltage level V TH does not affect the luminous intensity of the light-emitting element L1. In addition, the pixel driving circuit 112' has a plurality of conduction paths for detection. There are independent conduction paths on both sides of the capacitor C1, such as the
雖然本發明已以實施例揭露如上,然其並非用以限定本發明,任何所屬技術領域中具有通常知識者,在不脫離本發明的精神和範圍內,當可作些許的更動與潤飾,故本發明的保護範圍當視後附的申請專利範圍所界定者為準。 Although the present invention has been disclosed in the above embodiments, it is not intended to limit the present invention. Anyone with ordinary knowledge in the relevant technical field can make some changes and modifications without departing from the spirit and scope of the present invention. The protection scope of the present invention shall be subject to those defined by the attached patent application scope.
S1、S2:掃描信號 S1, S2: scan signal
D1:資料信號 D1: Data signal
EM:發光信號 EM: Luminous signal
112:畫素驅動電路 112: Pixel drive circuit
L1:發光元件 L1: Light-emitting element
210:重置單元 210: reset unit
220:資料寫入單元 220: data write unit
230:補償單元 230: compensation unit
240:發光單元 240: light-emitting unit
SS、DD:電壓信號 SS, DD: voltage signal
VA、VB:節點電壓 VA, VB: node voltage
RF1、RF2:參考信號 RF1, RF2: Reference signal
201、211、213、221、223、231、233、241、243、245:節點 201, 211, 213, 221, 223, 231, 233, 241, 243, 245: nodes
I:電流 I: current
T1~T7:開關 T1~T7: switch
C1:電容 C1: Capacitance
Claims (7)
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TW109114937A TWI734463B (en) | 2020-05-05 | 2020-05-05 | Pixel driving device having test function |
CN202011209741.2A CN112259045B (en) | 2020-05-05 | 2020-11-03 | Pixel driving device and pixel driving circuit with detection function |
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CN112259045B (en) | 2023-03-14 |
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