TWI744205B - Universal match plate for test handler - Google Patents
Universal match plate for test handler Download PDFInfo
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- TWI744205B TWI744205B TW110109428A TW110109428A TWI744205B TW I744205 B TWI744205 B TW I744205B TW 110109428 A TW110109428 A TW 110109428A TW 110109428 A TW110109428 A TW 110109428A TW I744205 B TWI744205 B TW I744205B
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- plate
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/34—Sorting according to other particular properties
- B07C5/344—Sorting according to other particular properties according to electric or electromagnetic properties
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C2301/00—Sorting according to destination
- B07C2301/0008—Electronic Devices, e.g. keyboard, displays
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- Tests Of Electronic Circuits (AREA)
- Measuring Leads Or Probes (AREA)
Abstract
Description
本發明係關於一種測試分選機的匹配板,尤指一種測試分選機的共用型匹配板。The invention relates to a matching board of a test sorting machine, in particular to a common matching board of a test sorting machine.
半導體封裝廠設置一種測試分選機,係於半導體元件製作完成後,來測試半導體元件製作,以確保其功能正常才能出貨。該測試分選機的測試區上設置有多個測試用電路板,各電路板上具有多個測試插座,一次供多個半導體元件分別接觸該些測試插座後完成電氣測試,該測試分選機設置有多個匹配板,各該匹配板會依據客戶提供測試用的電路板進行更換,以對應該電路板上的測試插座;如圖8及圖10所示,該測試分選機的匹配板80係包含四個推動件85,用以將對應的半導體元件按壓於該電路板的測試插座上進行測試,然而當客戶更換不同數量及位置之測試插座的電路板時,則必須更換不同類型的匹配板,例如具有二個推動件85的匹配板,才能順利地將半導體元件按壓以接觸到對應的測試插座完成測試。The semiconductor packaging factory sets up a test sorting machine to test the production of semiconductor components after the semiconductor components are completed to ensure that they function properly before they can be shipped. The test area of the test sorting machine is provided with a plurality of test circuit boards, each circuit board has a plurality of test sockets, and a plurality of semiconductor components are contacted with the test sockets at a time to complete the electrical test. The test sorting machine There are multiple matching boards, and each matching board will be replaced according to the circuit board provided by the customer for testing to correspond to the test socket on the circuit board; as shown in Figure 8 and Figure 10, the matching board of the test sorting machine The 80 series contains four
如圖7所示,該匹配板80係由四支固定件81、四個導塊82、一設置板83、一基座84以及2*2個推動件85組成,其中該設置板83係設置於該基座84的頂面,該基座84包含2*2個開口841,各該導塊82形成一第一貫穿孔821,各該推動件85形成一第二貫穿孔851;組裝時,如圖9所示,係將該些導塊82分別自該基座84上方滑設於對應的該開口841中,將各該推動件85的該第二貫穿孔851對準對應的導塊82的該第一貫穿孔821後,以該些固定件81分別從該些導塊82的頂面插經對應的該第一貫穿孔821,並固定於對應的該推動件85的該第二貫穿孔851之中;因此當該匹配板須更換不同類型匹配板時,例如具有二推動件85的匹配板,只能夠將該匹配板80整組拆下後,再安裝不同類型的匹配板,增加測試成本;再者,由於該些推動件85是透過該固定件81固定於該導塊82之中,需要將該些固定件81鬆開後才能夠更換對應的推動件85,非常耗時;因此,有必要進一步改良。As shown in Figure 7, the
有鑑於現有技術之測試分選機的匹配板於匹配不同電路板時需要額外購買額外匹配板,本發明的主要目的係提供一種改良的測試分選機的共用型匹配板,以與不同類型的匹配板共用。In view of the fact that the matching board of the test sorting machine in the prior art needs to purchase additional matching boards when matching different circuit boards, the main purpose of the present invention is to provide an improved common matching board for the test sorting machine to be compatible with different types of circuit boards. The matching board is shared.
欲達上述發明之目的所使用的主要技術手段係令該測試分選機的共用型匹配板包含: 一基座,係包含: 一板體,係形成四個第一開口,且以2*2間隔排列於該板體;以及 一固定塊,係裝設於該板體的底面中間,並於頂面形成二開槽,於底面形成二穿槽,其中各該穿槽係與對應的開槽連通,該開槽具有一深度; 二導板,係分別包含一固定部及二相對外翼部,該固定部係跨設於該固定塊對應的開槽內,該些外翼部係分別凸出對應的該開槽的外側,並形成對應該板體的該第一開口的一第一固定孔,其中各該導板的厚度小於該開槽的深度; 四個導塊,係分別滑設於對應的第一開口中,並分別形成一第一貫穿孔,其中各該第一貫穿孔係對應該導板的該第一固定孔; 四支固定件,係分別對應並插入該導塊的第一貫穿孔與該導板的該第一固定孔中,將對應的導塊固定於對應的導板;以及 二推動件,係分別插設於該固定塊對應的穿槽,並固定於對應的導板。 The main technical means used to achieve the purpose of the above invention is to make the common matching board of the test sorting machine include: A base, which contains: A plate body is formed with four first openings and arranged on the plate body at 2*2 intervals; and A fixing block is installed in the middle of the bottom surface of the board, and two slots are formed on the top surface and two through slots are formed on the bottom surface, wherein each of the through slots is communicated with a corresponding slot, and the slot has a depth ; The two guide plates respectively include a fixed part and two opposite outer wing parts. The fixed part straddles the corresponding slot of the fixed block, and the outer wings respectively protrude from the outer side of the corresponding slot, And forming a first fixing hole corresponding to the first opening of the plate body, wherein the thickness of each guide plate is smaller than the depth of the slot; The four guide blocks are respectively slidably disposed in the corresponding first openings and respectively form a first through hole, wherein each of the first through holes corresponds to the first fixing hole of the guide plate; The four fixing pieces are respectively corresponding to and inserted into the first through hole of the guide block and the first fixing hole of the guide plate to fix the corresponding guide block to the corresponding guide plate; and The two pushing parts are respectively inserted into the corresponding through slots of the fixing block and fixed to the corresponding guide plates.
本發明的優點在於,透過該些導板及該固定塊,使該些推動件係分別固定於對應的導板,所以當該推動件的數量與位置需要根據不同數量及位置之測試插座的電路板進行變更時,只需更換對應的導板即可變更該推動件的數量,不須購買整組不同類型的匹配板,也不必將該匹配板整組拆下更換,節省測試成本以及拆裝時間。The advantage of the present invention is that through the guide plates and the fixing block, the pushing parts are respectively fixed to the corresponding guide plates, so when the number and position of the pushing parts need to be based on the circuit of the test socket of different numbers and positions When the board is changed, you only need to replace the corresponding guide plate to change the number of the pushing parts. There is no need to purchase a whole set of different types of matching boards, and there is no need to remove the entire set of matching boards for replacement, saving test costs and disassembly. time.
本發明係針對測試分選機的匹配板進行改良,並以實施例配合圖式詳細說明本發明內容。The present invention is to improve the matching plate of the test sorting machine, and the content of the present invention is described in detail with embodiments and drawings.
首先請參閱圖1及圖2A所示,係本發明測試分選機的共用型匹配板10的第一實施例,其包含一基座20、二導板30、四個導塊40、四支固定件50及二推動件60,其中該些導塊40與該些固定件50與先前技術圖7所示的另一種類型的匹配板80的四個導塊82與四支固定件81相同,故與之共用。First, please refer to Figures 1 and 2A, which is the first embodiment of the
上述基座20係包含一板體21及一固定塊22,其中該板體21係包含四個第一開口211、一底面212及一頂面213,該固定塊22包含一頂面221、一底面222、二開槽223及二穿槽224;於本實施例,如圖1及圖2A所示,該些第一開口211係呈2*2間隔排列,並貫穿該板體21,該固定塊22係裝設於該板體21的底面212中間,該固定塊22的頂面221形成該些開槽223,並具有一深度,而該固定塊22的底面222則形成該些穿槽224,其中各該穿槽224係與對應的開槽223連通。於一實施例中,如圖1所示,係進一步於該板體21的該些第一開口211的相對二側邊214形成二凸條215,於該板體21的頂面213形成二固定柱216,於該板體21形成二貫穿孔217;於該固定塊22的各該開槽223的內底面225形成二第二凹槽226,於該固定塊22形成二貫穿孔227,其中該固定塊22的厚度大於該板體21的厚度(如圖4所示),並將該板體21的各該貫穿孔217與該固定塊22的各該貫穿孔227對準後,分別以螺絲23鎖固,以組成該基座20。The
上述導板30係分別包含一固定部31及二外翼部32;於本實施例,如圖1及2B所示,該固定部31係跨設於該固定塊22對應的該開槽223內,該些外翼部32係分別凸出對應的該開槽223的外側,並形成對應該板體21的該第一開口211的一第一固定孔321,其中各該導板30的厚度小於該開槽223的深度,使該導板30可於該基座20中上、下活動。於一實施例中,係進一步於各該導板30的該固定部31形成一貫穿的第二固定孔311(如圖1所示),於底面312形成二第一凸柱313(如圖3所示);於各該外翼部32的底面322形成一第二凸柱324(如圖4所示),於該頂面323形成二第三凸柱325(如圖5所示),其中該固定部31的寬度小於該外翼部32的寬度;該些第二凸柱324與對應的該固定塊22的該些第二凹槽226對應並卡合(如圖4所示),加強結構穩定性。The
上述導塊40係分別形成一第一貫穿孔41;於本實施例,如圖2A所示,各該導塊40係滑設於對應的該第一開口211中,各該第一貫穿孔41係對應該導板30的該第一固定孔321。於一實施例中,如圖5所示,係進一步於各該導塊40的底面42形成二第三凹槽421,其中該些第三凹槽421係分別與對應的該導板30的該第三凸柱325卡合,加強結構穩定性,再如圖4所示,於相對二側邊43分別形成一延伸片431,其中各該延伸片431係與該板體21對應的該凸條215接觸。The above-mentioned
上述固定件50,如圖3所示,係分別對應並插入該導塊40的該第一貫穿孔41與該導板30的該第一固定孔321中,將對應的導塊40固定於對應的導板30。於本實施例,該固定件50係為一螺絲,其螺栓前段形成螺紋,該螺栓插經該第一貫穿孔41,接著螺合至該第一固定孔321,故該第一固定孔321為一螺孔。The above-mentioned
上述推動件60係分別插設於該固定塊22對應的該穿槽224,並固定於對應的該導板30;於本實施例,如圖2B所示,各該推動件60係進一步形成一第二貫穿孔61,再如圖3所示,於頂面62形成二第一凹槽621,其中該第二貫穿孔61與對應的該導板30的該第二固定孔311對準,並以一螺絲63從該推動件60的底面穿經其第二貫穿孔61,最後螺合於該導板30的該第二固定孔311,將該推動件60鎖固於對應的該導板30(如圖6所示);如圖3所示,該些第一凹槽621與對應的該導板30的該些第一凸柱313對應並卡合,加強結構穩定性。The above-mentioned pushing
於一實施例中,如圖1所示,該共用型匹配板10係進一步包含一設置板70,其設置於該板體21的頂面213,並形成對應該些第一開口211的四個第二開口71;於本實施例,如圖2A所示,該設置板70係進一步形成二設置孔72,其中各該設置孔72係卡合於該板體21對應的該固定柱216,將該設置板70固定於該板體21的頂面213。In one embodiment, as shown in FIG. 1, the
於組裝時,如圖1所示,將該些導塊40分別自該板體21上方滑設於該板體21對應的該第一開口211中,接著將各該導塊40的第一貫穿孔41對準位在該板體21下方的該些導板30對應的該第一固定孔321後,用該些固定件50分別從該些導塊40的頂面插經對應的該第一貫穿孔41,並固定於該第一固定孔321,使該些導塊40結合於對應的該導板30;接著將位在該些導板30下方的該固定塊22的該些開槽223分別與對應的該導板30的固定部31對準,此時該固定塊22的各該貫穿孔227與該板體21的各該貫穿孔217也一併對準後,再分別以該些螺絲23從該固定塊22螺合於該板體21,組成該基座20,且該些導板30的固定部31即設置在該基座20內,又由於各該導板30的厚度小於該開槽223的深度,當該些導塊40上、下滑動時,即可使該導板30於該基座20內上、下活動;又由於該固定塊22的穿槽224使得各該導板30的固定部31外露,故該固定部31的該第二固定孔311可對準位在該固定塊22下方的對應推動件60的該第二貫穿孔61,再分別以該螺絲63從各該推動件60的底面穿經該第二貫穿孔61,螺合於該第二固定孔311中,將該推動件60鎖固於對應的該導板30;如此,當該些導塊40上、下滑動時,即可透過該些導板30一併帶動該些推動件60上、下移動。When assembling, as shown in FIG. 1, the
由上述的說明可知,本發明的共用型匹配板係主要讓數量較少的推動件透過導板及固定塊的設計,與數量較多的推動件的匹配板共用板體、設置板、導塊及固定件;因此,當該推動件的數量跟位置需要根據不同數量及位置之測試插座的電路板進行變更時,只需更換對應的導板即可變更該推動件的數量,不須購買整組不同類型的匹配板,也不必將該匹配板整組拆下更換,節省測試成本以及拆裝時間;再者,本發明將該推動件透過對應的該導板而設置在該基座底面的中間位置,故當基座頂面之該些固定件下壓之後,可以將力均勻集中於對應的推動件上;此外,該些推動件係以螺絲從該推動件的底面鎖固於對應的導板,只需從下方將該螺絲鬆開即可更換對應數量的推動件,而不需要整組拆換,節省更換時間。From the above description, it can be seen that the shared matching plate of the present invention mainly allows a smaller number of pushers to pass through the design of the guide plate and fixing block, and shares the plate body, setting plate, and guide block with the matching plate of a larger number of pushers. And fixed parts; therefore, when the number and position of the push parts need to be changed according to the circuit boards of the test sockets of different numbers and positions, the number of push parts can be changed only by replacing the corresponding guide plate, and there is no need to purchase the whole There is no need to disassemble and replace the entire group of matching plates for different types of matching plates, which saves test costs and disassembly time; furthermore, the present invention sets the pushing member on the bottom surface of the base through the corresponding guide plate. In the middle position, when the fixing parts on the top surface of the base are pressed down, the force can be evenly concentrated on the corresponding pushing parts; in addition, the pushing parts are fixed to the corresponding pushing parts with screws from the bottom surface of the pushing parts. For the guide plate, the corresponding number of pushers can be replaced by loosening the screw from below, instead of the entire set of disassembly and replacement, saving replacement time.
以上所述僅是本發明的實施例而已,並非對本發明做任何形式上的限制,雖然本發明已以實施例揭露如上,然而並非用以限定本發明,任何所屬技術領域中具有通常知識者,在不脫離本發明技術方案的範圍內,當可利用上述揭示的技術內容作出些許更動或修飾為等同變化的等效實施例,但凡是未脫離本發明技術方案的內容,依據本發明的技術實質對以上實施例所作的任何簡單修改、等同變化與修飾,均仍屬於本發明技術方案的範圍內。The above are only the embodiments of the present invention and do not limit the present invention in any form. Although the present invention has been disclosed in the above embodiments, it is not intended to limit the present invention. Anyone with ordinary knowledge in the relevant technical field, Without departing from the scope of the technical solution of the present invention, when the technical content disclosed above can be used to make slight changes or modification into equivalent embodiments with equivalent changes, but any content that does not depart from the technical solution of the present invention is based on the technical essence of the present invention Any simple modifications, equivalent changes and modifications made to the above embodiments still fall within the scope of the technical solution of the present invention.
10:測試分選機的共用型匹配板 20:基座 21:板體 211:第一開口 212:底面 213:頂面 214:側邊 215:凸條 216:固定柱 217:貫穿孔 22:固定塊 221:頂面 222:底面 223:開槽 224:穿槽 225:內底面 226:第二凹槽 227:貫穿孔 23:螺絲 30:導板 31:固定部 311:第二固定孔 312:底面 313:第一凸柱 32:外翼部 321:第一固定孔 322:底面 323:頂面 324:第二凸柱 325:第三凸柱 40:導塊 41:第一貫穿孔 42:底面 421:第三凹槽 43:側邊 431:延伸片 50:固定件 60:推動件 61:第二貫穿孔 62:頂面 621:第一凹槽 63:螺絲 70:設置板 71:第二開口 72:設置孔 80:測試分選機的匹配板 81:固定件 82:導塊 821:第一貫穿孔 83:設置板 84:基座 841:開口 85:推動件 851:第二貫穿孔10: Common matching board for test sorting machine 20: Pedestal 21: Board body 211: first opening 212: Bottom 213: top surface 214: side 215: Rib 216: fixed column 217: Through hole 22: fixed block 221: top surface 222: Bottom 223: Grooving 224: piercing 225: inner bottom surface 226: second groove 227: Through Hole 23: Screw 30: guide plate 31: Fixed part 311: second fixing hole 312: Bottom 313: first protruding column 32: Outer Wing 321: The first fixing hole 322: Bottom 323: top surface 324: second boss 325: Third Protruding Post 40: guide block 41: The first through hole 42: Bottom 421: Third Groove 43: side 431: Extension piece 50: fixed parts 60: Push pieces 61: second through hole 62: top surface 621: first groove 63: Screw 70: setting board 71: second opening 72: Setting hole 80: Test the matching board of the sorting machine 81: fixed parts 82: guide block 821: first through hole 83: setting board 84: Pedestal 841: open 85: push pieces 851: second through hole
圖1:本發明測試分選機的共用型匹配板之立體分解圖。 圖2A:本發明測試分選機的共用型匹配板之俯視立體圖。 圖2B:本發明測試分選機的共用型匹配板之仰視立體圖。 圖3:本發明測試分選機的共用型匹配板之側視剖面圖。 圖4:本發明測試分選機的共用型匹配板之另一視角的剖面圖。 圖5:本發明測試分選機的共用型匹配板之局部剖面圖。 圖6:本發明測試分選機的共用型匹配板之仰視平面圖。 圖7:現有技術之測試分選機的共用型匹配板的立體分解圖。 圖8:現有技術之測試分選機的共用型匹配板的立體圖。 圖9:現有技術之測試分選機的共用型匹配板的側視剖面圖。 圖10:現有技術之測試分選機的共用型匹配板的仰視平面圖。 Figure 1: A three-dimensional exploded view of the common matching plate of the test sorting machine of the present invention. Fig. 2A: A top perspective view of the common matching plate of the test sorting machine of the present invention. Fig. 2B: A bottom perspective view of the common matching plate of the test sorting machine of the present invention. Figure 3: A side cross-sectional view of the shared matching plate of the test sorting machine of the present invention. Figure 4: Another view of the cross-sectional view of the shared matching plate of the test sorting machine of the present invention. Figure 5: A partial cross-sectional view of the shared matching plate of the test sorting machine of the present invention. Figure 6: The bottom plan view of the shared matching plate of the test sorting machine of the present invention. Fig. 7: A three-dimensional exploded view of a common matching plate of a test sorting machine in the prior art. Figure 8: A three-dimensional view of a common matching plate of a test sorting machine in the prior art. Fig. 9: A side sectional view of a common matching plate of a test sorting machine in the prior art. Figure 10: The bottom plan view of the common matching plate of the test sorting machine in the prior art.
20:基座 20: Pedestal
21:板體 21: Board body
22:固定塊 22: fixed block
30:導板 30: guide plate
31:固定部 31: Fixed part
311:第二固定孔 311: second fixing hole
312:底面 312: Bottom
313:第一凸柱 313: first protruding column
321:第一固定孔 321: The first fixing hole
40:導塊 40: guide block
41:第一貫穿孔 41: The first through hole
50:固定件 50: fixed parts
60:推動件 60: Push pieces
61:第二貫穿孔 61: second through hole
621:第一凹槽 621: first groove
63:螺絲 63: Screw
70:設置板 70: setting board
Claims (10)
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TW110109428A TWI744205B (en) | 2021-03-16 | 2021-03-16 | Universal match plate for test handler |
CN202110491618.2A CN115069606A (en) | 2021-03-16 | 2021-05-06 | Shared matching board of test classifier |
JP2021084272A JP2022142694A (en) | 2021-03-16 | 2021-05-19 | Shared match plate for test handler |
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TW202238136A TW202238136A (en) | 2022-10-01 |
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- 2021-03-16 TW TW110109428A patent/TWI744205B/en active
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CN115069606A (en) | 2022-09-20 |
JP2022142694A (en) | 2022-09-30 |
TW202238136A (en) | 2022-10-01 |
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