KR20000024669A - The equipment combine system and jig of electrical inspection pcb board - Google Patents

The equipment combine system and jig of electrical inspection pcb board Download PDF

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KR20000024669A
KR20000024669A KR1020000009892A KR20000009892A KR20000024669A KR 20000024669 A KR20000024669 A KR 20000024669A KR 1020000009892 A KR1020000009892 A KR 1020000009892A KR 20000009892 A KR20000009892 A KR 20000009892A KR 20000024669 A KR20000024669 A KR 20000024669A
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South Korea
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jig
pitch
dedicated
universal
plate
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KR1020000009892A
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Korean (ko)
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KR100353978B1 (en
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김영훈
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김영훈
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Priority to KR2020000005511U priority Critical patent/KR200189594Y1/en
Priority to KR1020000009892A priority patent/KR100353978B1/en
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    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/0061Tools for holding the circuit boards during processing; handling transport of printed circuit boards
    • H05K13/0069Holders for printed circuit boards
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/0266Marks, test patterns or identification means
    • H05K1/0268Marks, test patterns or identification means for electrical inspection or testing

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  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Manufacturing & Machinery (AREA)
  • Measuring Leads Or Probes (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

PURPOSE: A method and a device are provided, so that a compatible jig can be used in a tester with a universal type and a dedicated type, by equipping a fin installed on a jig for connection use to have a narrow interval on an upper part and to have a wide interval on a lower part. CONSTITUTION: A connection jig(1) for adjusting intervals of fins is composed of an upper plate(2), many middle plates(3), and a lower plate(4) which are separable, respectively. The connection jig inserts fixed sticks(5) into edges of each plates(2,3,4), inserts a screw axis(6) in an upper part of the fixed sticks(5), and perforates the fixed sticks(5) into the each plates(2,3,4). The connection jig fixes the perforated fixed sticks(5) with a nut(7) which is composed of polypropylene, and forms insertion spaces(9) which the fins are inserted on the upper plate(2), and between the middle plates(3) and the lower plate(4). The connection jig adjusts a pitch of a fin projected on the upper plate(2) with a pitch of a dedicated type jig, and adjusts a pitch of a fin projected on the lower plate(4) with a pitch of a universal type jig, by forming the insertion spaces of the upper, middle, lower plates(2,3,4) as one side.

Description

피시비 기판의 전기적 검사용 지그에 대한 호환방법및 그 장치{THE EQUIPMENT COMBINE SYSTEM AND JIG OF ELECTRICAL INSPECTION PCB BOARD}The compatibility method for the electrical inspection jig of the PCB and its device {THE EQUIPMENT COMBINE SYSTEM AND JIG OF ELECTRICAL INSPECTION PCB BOARD}

본 발명은 PCB기판에 대한 전기적 검사를 할 때 사용하는 지그에 관한 것으로, 장비가격이 저렴한 데디케이트형 지그에 유니버샬형 지그를 변경그리드(GRID)를 이용하여 호환되게 함으로서 지그의 제작 가격을 최소로 절감할 수 있도록 하는한편 지그를 호혼되게 함으로서 측정기기에 상관없이 제품을 측정할수 있도록 하는데 그 목적이 있는 것이다.The present invention relates to a jig to be used for electrical inspection of the PCB substrate, by making the universal jig compatible with the use of a change grid (GRID) to a cheap jig low price jig to minimize the production price of the jig The purpose is to allow the product to be measured regardless of the measuring device by allowing the jig to be mixed together.

일반적으로 PCB기판을 전기적 검사를 할 때 사용되는 기기가 데디게이트형 (DEDICATE TYPE)과 유니버샬형(UNIVERSAL TYPE)의 기기가 주로 사용되고 있는 바, 상기 전자의 데디게이트형 검사기는 핀의 보유수가 2048-16384내외이고, 사용지그는 레캡터(RECEPTER)와 스프링프로브(SPRING PROBE)를 사용하나, 사용되는 모델당 지그의 제작비가 고가인 단점이 있으며, 또한 프로브의 재사용이 불가능함으로서 불필요한 원자재의 낭비가 심한 문제점이 있었다.In general, a device used for electrical inspection of a PCB substrate is mainly a device of a dead type and a universal type. The electronic dead gate type tester has a number of pins of 2048-. It is around 16384, and the jig used uses the RECEPTER and SPRING PROBE, but there is a disadvantage that the manufacturing cost of the jig per model used is expensive, and since the reuse of the probe is impossible, unnecessary waste of raw materials is severe. There was a problem.

한편 후자의 유니버샬형은 핀 수가 30,000- 100,000내외로서 지그는 플레이트와 프로브를 사용하고 모델당 지그의 제작비용이 약 40만원내외로서 지그의 제작비용을 저렴하나 핀의 피치가 0.5mm이하로는 불가능하여 고밀도의 회로는 검사를 할 수가 없는 문제점이 있었다.On the other hand, the latter universal type has a pin number of about 30,000 to 100,000, and the jig uses plates and probes, and the production cost of the jig per model is about 400,000 won, which makes the jig manufacturing cost cheaper but the pitch of the pin is less than 0.5mm. Therefore, there was a problem that the high-density circuit cannot be inspected.

즉 상기 두가지의 검사 기기를 비교하면 다음과 같다.That is, when comparing the two inspection devices as follows.

장비의 종류비교항목Type of Equipment Comparison 유니버샬(universal type)Universal type 데디케이트(dedicate type)Dedicated type 장비의 보유 핀수Retention Pin Count of Equipment 30,000-100,000내외Around 30,000-100,000 2048-16384이내Within 2048-16384 사용지그(FIXTURE)Jig (FIXTURE) 플레이트와 프로브(PLATE & PROBE)Plate & Probe 래캡터와 스프링 프로브(RECEPTER & SPRING PROBE)Ractorter & Spring Probe 프로브(PROBE)의 재활용여부Whether the probe is recycled 재활용 가능Recyclable 재활용 불가Non-recyclable 사용모델당 지그제작비용(평균 4000핀 기준)Jig production cost per model used (on average 4000 pins) 40만원 내외 (소모되는 프로브가격 제외)Around 400,000 won (excluding the probe price consumed) 200만원-6500만원(프로브의 종류에 따라 다름)$ 200- $ 50 million (depending on the type of probe) 핀의 제작 가능한 피치Manufactureable pitch of the pin 통상 0.5mm이하불가Normally less than 0.5mm 프로브에 따라 0.3mm도 가능0.3 mm depending on probe

상기와 같이 기존 종래의 검사기에 사용되는 지그는 각각 전용의 지그를 제작하여 사용함으로서 호환성이 없는 단점이 있으며, 이로 인하여 각각의 지그를 제작한 다음 전용으로 사용하기 때문에 각각의 지그를 보관함으로서 불필요한 지그 보관용 공간을 요하였으며, 또한 각각의 지그를 제작함으로서 불필요한 제작비를 지출하게 되는 문제점이 있었다.As described above, the jig used in the conventional conventional inspection machine has a disadvantage of incompatibility by making and using a dedicated jig, and thus, since each jig is manufactured and used exclusively, unnecessary jig is kept by storing each jig. It required a storage space, there was also a problem that spend unnecessary manufacturing costs by making each jig.

즉 종래에 사용되어온 지그중 데디케이트형 지그는 지그의 판넬에 핀을 설치할 때 판넬에 핀을 체결한 다음 핀의 하단부를 납땜을 하거나 랩핑을 하여 고정함으로서 핀을 재활용할 수가 없는 단점이 있으며, 이로 인하여 고가인 핀의 낭비가 심하여 불필요한 지출을 초래하게 되는 요인이 되었다.That is, among the jig used in the prior art, the dedicated jig has the disadvantage that the pin cannot be recycled by fastening the pin to the panel and then soldering or wrapping the lower end of the pin when installing the pin on the panel of the jig. As a result, waste of expensive pins was severe and caused unnecessary expenses.

한편 유니버샬형 지그는 지그를 이루고 있는 판넬에 핀을 조립할 경우 재활용 가능하게 설치함으로서 핀으로 인한 비용을 절감할 수 있도록 하였으나, 장비가 고가인 단점이 있으며 또한 지그에 설치되는 핀과 핀 사이의 간격이 넓어 회로의 간격이 조밀한 기판은 측정할 수가 없는 문제점이 이었다.On the other hand, the universal jig can reduce the cost of the pin by reusing it when assembling the pin on the panel forming the jig. However, the equipment is expensive and the gap between the pin and the pin installed in the jig It was a problem that the board | substrate which was wide and the space | interval is dense was not able to measure.

본 발명은 상기와 같은 문제점을 해결하기 위하여 발명한 것으로서, 여결용 지그를 제작하되 연결용 지그에 설치되는 핀을 상단부는 간격이 좁고 하단부는 간격이 넓게 설치하여 기존에 사용되고 있는 유니버샬형과 데디케이트형의 지그 사이에 호환용 지그를 설치하여 유니버샬형과 데디케이트형의 검사기에 호환용으로 사용할 수 있도록 한 것으로서, 이하 본 발명을 첨부된 도면에 의하여 상세히 설명하면 다음과 같다.The present invention has been invented to solve the above problems, the manufacturing jig for filtration, but the upper end of the pin is installed in the connecting jig and the lower end of the wide gap is installed universal type and dedicated Interchangeable jig is installed between the jig of the type to be used for compatibility with the universal type and the dedicated type checker, the present invention will be described in detail with reference to the accompanying drawings as follows.

도 1 은 본 발명의 분리사시도1 is an exploded perspective view of the present invention

도 2 는 본 발명의 사용상태개략정면도2 is a schematic front view of a use state of the present invention;

도 3 은 본 발명의 요부확대도3 is an enlarged view of main parts of the present invention;

** 도면의 주요 부분에 대한 부호의 설명 **** Description of symbols for the main parts of the drawing **

1. 연결지그 2. 상판 3. 중간판1. Connecting jig 2. Top plate 3. Intermediate plate

4. 하판 5. 고정봉 6. 나사축4. Bottom plate 5. Fixed rod 6. Screw shaft

7. 너트 8. 핀 9. 삽입공7. Nut 8. Pin 9. Insertion Hole

10. 지그 11. 돌출부 12. 요홈부10. Jig 11. Projection 12. Groove

데디케이트형 검사기에 사용되는 지그와 유니버샬형 검사기에 사용되는 지그 사이에 데디케이트형 지그의 핀과 유니버샬형 지그에 설치되어 있는 핀의 간격을 조절하는 연결지그를 설치하여 유니버샬형 검사기와 데디케이트형 검사기가 호환되도록 하여서 된 것이다.Universal Jig and Dedicated Jig are installed between the jig used for the dedicated type checker and the jig used for the universal type checker by installing a connecting jig that adjusts the gap between the pin of the dedicated jig and the pin installed on the universal jig. This is because the tester is compatible.

상기 연결지그(1)는 상판(2)과 수개의 중간판(3)및 하판(4)으로 분리되게 구성하되 각 판체(2)(3)(4)의 상부 모서리측에 고정봉(5)을 삽입한 다음 고정봉(5)의 상부에서 나사축(6)을 삽입하여 고정봉(5)과 각 판체(2)(3)(4)를 관통되게 한 다음 하단에서 폴리프로필렌으로 된 너트(7)로 고정하며, 상판(2)과 수개의 중간판(3)및 하판(4)의 중간부에 핀(8)이 삽입되는 삽입공(9)을 형성하되 상, 중, 하판(2)(3)(4)의 삽입공을 다단식으로 일측으로 단차지게 형성하여 상판(2)에 돌출되는 핀의 피치는 데디케이트형 지그의 피치에 맞게 하고 하판(4)에 돌출 되는 핀의 피치는 유니버샬형 지그의 피치에 맞도록 하여서 된 것이다.The connecting jig 1 is configured to be separated into an upper plate 2, several intermediate plates 3 and a lower plate 4, but a fixing rod 5 at an upper edge side of each plate body 2, 3 and 4, respectively. Insert the screw shaft (6) at the top of the fixing rod (5) to allow the fixing rod (5) and each plate (2) (3) (4) to pass through, and then 7) and the insertion hole 9 into which the pin 8 is inserted in the middle of the upper plate 2, several intermediate plates 3, and the lower plate 4 is formed. (3) The pitch of the pins protruding from the upper plate 2 is formed by stepping the insertion hole of the multi-stage side to one side in accordance with the pitch of the dedicated jig, and the pitch of the pins protruding from the lower plate 4 is universal. It was made to fit the pitch of the mold jig.

상기와 같이 수개의 핀이 일정한 간격으로 체결되어 있는 데디케이트형과 유니버샬형 지그(10)의 하단 전후 양측에 돌출부(11)를 형성하고 연결지그(1)의 전후 양측에는 요홈부(12)를 형성하여 연결지그(1)가 데디케이트형과 유니버샬형 지그(10)사이에 체결되도록 하여서 된 것이다.As described above, protrusions 11 are formed at both front and rear sides of the lower end of the dedicated and universal jig 10 in which several pins are fastened at regular intervals, and grooves 12 are formed at both front and rear sides of the connecting jig 1. It is formed so that the connecting jig 1 is fastened between the dedicated type and the universal type jig 10.

상기와 같이 된 본 발명의 작용을 설명하면 다음과 같다.Referring to the operation of the present invention as described above is as follows.

초소형의 기판에 대하여 전기적 검사를 하고자 할 때 유니버샬형 검사기나 데디케이트형 검사기를 이용하여 기판의 전기적 검사를 하고자 할 때 먼저 기판에 맞는 연결지그(1)를 제작한다. 이때 연결지그(1)의 상판(2)에서 삽입되는 핀(8)은 피치의 간격을 넓으나 중간판(3)과 하단(4)에 형성되어 있는 삽입공(9)이 일측으로 단차지게 이동되어 있는 상태로 형성되어 있기 때문에 핀이 삽입되면서 일측으로 기울어지게 되고, 이로 인하여 하판(4)의 저면으로 돌출 되는 핀의 피치가 좁게 구성되는 것이다.When you want to perform the electrical inspection of the micro-substrate when the electrical inspection of the substrate using a universal inspection machine or a dedicated inspection machine first to manufacture a connecting jig (1) suitable for the substrate. At this time, the pin 8 inserted from the upper plate 2 of the connecting jig 1 has a wide pitch, but the insertion hole 9 formed in the intermediate plate 3 and the lower end 4 moves stepwise to one side. Since it is formed in a state that is inclined to one side while the pin is inserted, thereby the pitch of the pin protruding to the bottom of the lower plate 4 is configured to be narrow.

상기와 같이 연결지그(1)를 제작한 다음 이 열결지그를 데디케이트형 지그와 유니버샬형 지그의 사이에 설치하면 기판의 간격과 같은 지그의 핀이 연결지그의 상부에 위치하게 되고, 이 상태에서 연결지그의 하단부는 간격이 좁거나 넓게 구성되기 때문에 기판의 피치에 상관없이 검사를 할 수가 있는 것이다.After the connecting jig 1 is manufactured as described above, and the thermal jig is installed between the dedicated jig and the universal jig, the pins of the jig, such as the spacing of the substrate, are positioned on the upper part of the jig. Since the lower end of the connecting jig is narrow or wide, the inspection can be performed regardless of the pitch of the substrate.

이상과 같이 본 발명은 상단부는 간격이 좁고 하단부는 간격이 넓게 핀을 설치하여 기존에 사용되고 있는 유니버샬형과 데디케이트형의 지그 사이에 연결용 지그를 설치하여 유니버샬형과 데디케이트형의 검사기에 호환용으로 사용할 수 있도록 한 것으로서, 구조가 간단하여 제작이 용이하고 지그에 사용되는 핀을 분리하여 제활용할수가 있기 때문에 지그 제작비용이 저렴하며, 또한 기판에 인쇄된 회로의 피치에 관계없이 전기적 검사를 할 수가 있는 유용한 발명인 것이다.As described above, in the present invention, the upper part has a narrow gap and the lower part has a wide spacing, so that a connection jig is installed between the universal type and the dedicated type jig, which is used to be compatible with the universal type and the dedicated type inspector. It is designed to be used for the purpose. The structure is simple, so it is easy to manufacture, and the pin used for the jig can be separated and recycled, and the jig manufacturing cost is low. It is a useful invention that can be done.

Claims (3)

데디케이트형 검사기에 사용되는 지그와 유니버샬형 검사기에 사용되는 지그 사이에 데디케이트형 지그의 핀과 유니버샬형 지그에 설치되어 있는 핀의 간격을 조절하는 연결지그를 설치하여 유니버샬형 검사기와 데디케이트형 검사기를 호환되도록 하여서 된 것을 특징으로 하는 피시비 기판의 전기적 검사용 지그에 대한 호환방법.Universal Jig and Dedicated Jig are installed between the jig used for the dedicated type checker and the jig used for the universal type checker by installing a connecting jig that adjusts the gap between the pin of the dedicated jig and the pin installed on the universal jig. Compatible method for the jig for electrical inspection of the PCB substrate, characterized in that the tester is made to be compatible. 연결지그(1)는 상판(2)과 수개의 중간판(3)및 하판(4)으로 분리되게 구성하되 각 판체(2)(3)(4)의 상부 모서리측에 고정봉(5)을 삽입한 다음 고정봉(5)의 상부에서 나사축(6)을 삽입하여 고정봉(5)과 각 판체(2)(3)(4)를 관통되게 한 다음 하단에서 폴리프로필렌으로 된 너트(7)로 고정하며, 상판(2)과 수개의 중간판(3)및 하판(4)의 중간부에 핀(8)이 삽입되는 삽입공(9)을 형성하되 상, 중, 하판(2)(3)(4)의 삽입공을 다단식으로 일측으로 단차지게 형성하여 상판(2)에 돌출 되는 핀의 피치는 데디케이트형 지그의 피치에 맞게 하고, 하판(4)에 돌출 되는 핀의 피치는 유니버샬형 지그의 피치에 맞도록 하여서 된 것을 특징으로 하는 피시비 기판의 전기적 검사용 지그에 대한 호환장치.The connecting jig 1 is configured to be separated into an upper plate 2, several intermediate plates 3 and a lower plate 4, and a fixing rod 5 is disposed at the upper edge side of each plate body 2, 3, and 4. Insert and then insert the screw shaft (6) at the top of the fixing rod (5) so that the fixing rod (5) and each plate (2) (3) (4) pass through, and then at the bottom a nut of polypropylene (7). And inserting holes 9 into which the pins 8 are inserted in the middle of the upper plate 2, several intermediate plates 3, and the lower plate 4, and the upper, middle, and lower plates 2 ( 3) The insertion hole of (4) is formed in a multi-step step to one side, the pitch of the pin protruding from the upper plate (2) to match the pitch of the dedicated jig, the pitch of the pin protruding from the lower plate (4) is universal Compatible device for the jig for electrical inspection of the PCB substrate, characterized in that it is adapted to the pitch of the type jig. 데디케이트형과 유니버샬형 지그(10)의 하단 전후 양측에 돌출부(11)를 형성하고 연결지그(1)의 전후 양측에는 요홈부(12)를 형성하여 연결지그(1)가 데디케이트형과 유니버샬형 지그(10)사이에 체결되도록 하여서 된 것을 특징으로 하는 피시비 기판의 전기적 검사용 지그에 대한 호환장치.Protruding portions 11 are formed on both sides of the lower and front sides of the dedicated and universal jig 10, and grooves 12 are formed on both front and rear sides of the connecting jig 1 so that the connecting jig 1 is formed of the dedicated and universal jig 10. Compatible device for the jig for electrical inspection of the PCB substrate, characterized in that it is fastened between the type jig (10).
KR1020000009892A 2000-02-28 2000-02-28 The equipment combine system and jig of electrical inspection pcb board KR100353978B1 (en)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100730390B1 (en) * 2006-06-15 2007-06-19 (주) 현대테크 Examination apparatus for Printed Circuit Board

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KR101689478B1 (en) * 2015-08-24 2016-12-23 김재수 Printed circuit board testing jig

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100730390B1 (en) * 2006-06-15 2007-06-19 (주) 현대테크 Examination apparatus for Printed Circuit Board

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