TWI722887B - Ingot workpiece board, ingot slicing device and ingot slicing method - Google Patents
Ingot workpiece board, ingot slicing device and ingot slicing method Download PDFInfo
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
- B28D5/0058—Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material
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本發明涉及矽晶圓製造領域,特別是涉及一種晶棒工件板、晶棒切割裝置及切割方法。The invention relates to the field of silicon wafer manufacturing, in particular to an ingot workpiece plate, an ingot cutting device and a cutting method.
晶圓是半導體晶片製造過程中最基礎也是重要的原材料之一,其製造過程通常包括將多晶矽料利用CZ(Czochralski,直拉單晶法)法拉製成高品質的單晶矽棒的拉晶步驟、將單晶矽棒分割成多個單晶矽棒,同時進行單晶矽棒外徑的研磨和加工north槽的滾磨分段步驟、將單晶矽棒進行分割成矽片的切割步驟,以及利用研磨提高矽片表面質量的步驟等。這其中,在切割前有一道非常重要的沾棒步驟,具體過程是將滾磨分段步驟加工完成的晶棒利用X-Ray(繞射儀)尋找off-orientation(偏角)進行偏角修正後,粘接在工件板上。現有技術中的沾棒製程為:人工進行塗膠,利用按壓裝置將晶棒壓持,讓晶棒與樹脂條和工件板三者利用膠水粘接在一起,最後進行一定時間的膠水固化後再進行X-ray的晶向複檢。但現有的設備和製程在將晶棒與樹脂條和工件板三者粘接後無法立即進行複檢,如果複檢失敗,需要脫膠後重新塗膠,會花費大量的時間,脫膠過程也會帶來晶棒的損壞風險。Wafer is one of the most basic and important raw materials in the semiconductor wafer manufacturing process. The manufacturing process usually includes the crystal pulling step of using CZ (Czochralski, Czochralski, Czochralski) method to draw high-quality single crystal silicon rods. , Divide the single crystal silicon rod into multiple single crystal silicon rods, simultaneously carry out the grinding of the outer diameter of the single crystal silicon rod and the barrel grinding segmentation step of processing the north groove, and the cutting step of dividing the single crystal silicon rod into silicon wafers. And the steps to improve the surface quality of silicon wafers by grinding. Among them, there is a very important step of dipping the rod before cutting. The specific process is to use X-Ray (diffractometer) to find the off-orientation (deflection angle) to correct the deflection angle. After that, it is glued to the workpiece board. The sticking process in the prior art is as follows: manually apply glue, use a pressing device to hold the crystal stick, let the crystal stick, the resin strip and the workpiece plate be glued together, and finally cure the glue for a certain period of time. Perform X-ray reexamination of crystal orientation. However, the existing equipment and manufacturing process cannot be re-inspected immediately after bonding the ingot, the resin strip and the workpiece plate. If the re-inspection fails, it will take a lot of time and the degumming process will also take a lot of time. Risk of damage to the crystal bar.
鑒於以上所述現有技術的缺點,本發明的目的在於提供一種晶棒工件板、晶棒切割裝置及切割方法,用於解決現有技術中在對晶棒的晶向複檢失敗時,需要脫膠後再重新塗膠,而脫膠過程不僅費時費力,而且容易導致晶棒損傷等問題。In view of the above-mentioned shortcomings of the prior art, the purpose of the present invention is to provide an ingot workpiece plate, an ingot cutting device, and a cutting method, which are used to solve the problem of the need for degumming when the crystal orientation of the ingot in the prior art fails to be rechecked. Then re-gluing, and the degumming process is not only time-consuming and laborious, but also easy to cause problems such as damage to the ingot.
為實現上述目的,本發明提供一種晶棒工件板,包括:固定板及調整板,所述固定板用於放置晶棒;所述調整板位於所述固定板遠離所述晶棒的表面,所述調整板上設置有圓心孔和若干個腰形通孔,所述圓心孔位於所述調整板的中間,所述若干個腰形通孔位於所述圓心孔的外圍;所述固定板和所述調整板利用位於所述圓心孔和所述若干個腰形通孔內的螺栓相連接,位於所述腰形通孔內的螺栓可在所述腰形通孔內移動以調整所述固定板和所述調整板的相對位置,從而實現對所述晶棒的晶向偏角的調整。In order to achieve the above object, the present invention provides an ingot workpiece plate, including: a fixed plate and an adjustment plate, the fixed plate is used to place the ingot; the adjustment plate is located on the surface of the fixed plate away from the ingot, so The adjustment plate is provided with a center hole and a plurality of waist-shaped through holes, the center hole is located in the middle of the adjustment plate, and the plurality of waist-shaped through holes are located on the periphery of the center hole; The adjusting plate is connected by bolts located in the center hole and the plurality of waist-shaped through holes, and the bolts located in the waist-shaped through holes can move in the waist-shaped through holes to adjust the fixing plate And the relative position of the adjustment plate, so as to realize the adjustment of the deflection angle of the crystal orientation of the crystal rod.
可選地,所述腰形通孔為4個,4個所述腰形通孔在沿以所述圓心孔為圓心的周向上均勻間隔分佈。Optionally, there are four waist-shaped through holes, and the four waist-shaped through holes are evenly spaced along a circumferential direction centered on the center hole.
可選地,所述腰形通孔為弧形腰形通孔。Optionally, the waist-shaped through hole is an arc-shaped waist-shaped through hole.
可選地,所述腰形通孔的弧長對應的圓心角為15~60°。Optionally, the central angle corresponding to the arc length of the waist-shaped through hole is 15-60°.
可選地,所述晶棒工件板還包括樹脂框架,位於所述固定板的表面,晶棒位於所述樹脂框架內。Optionally, the crystal rod workpiece plate further includes a resin frame located on the surface of the fixing plate, and the crystal rod is located in the resin frame.
可選地,所述調整板包括平面部和凸台部,所述平面部與所述固定板相接觸,所述凸台部位於所述平面部遠離所述固定板的表面,其中,所述圓心孔位於所述凸台部上,所述腰形通孔位於所述平面部上。Optionally, the adjustment plate includes a plane portion and a boss portion, the plane portion is in contact with the fixing plate, and the boss portion is located on a surface of the plane portion away from the fixing plate, wherein the The center hole is located on the boss portion, and the waist-shaped through hole is located on the plane portion.
可選地,所述平面部和所述凸台部為一體成型結構。Optionally, the plane portion and the boss portion are an integrally formed structure.
可選地,所述凸台部為矩柱形,且所述凸台部的長度和所述平面部的長度相同。Optionally, the boss portion has a rectangular column shape, and the length of the boss portion is the same as the length of the plane portion.
本發明還提供一種晶棒切割裝置,包括: 如前述任一方案中所述的晶棒工件板; 承載台,待切割晶棒利用所述晶棒工件板放置於所述承載臺上; 切割單元,非切割作業時,所述切割單元位於所述晶棒的上方; 檢測單元,位於所述晶棒的上方,用於檢測所述晶棒的晶向偏角。 The present invention also provides a crystal rod cutting device, which includes: The ingot workpiece plate as described in any of the foregoing solutions; A carrying table, the ingot to be cut is placed on the carrying table by using the ingot workpiece plate; A cutting unit, the cutting unit is located above the crystal rod during non-cutting operation; The detection unit is located above the crystal rod and is used for detecting the crystal orientation deflection angle of the crystal rod.
本發明還提供一種晶棒切割方法,所述晶棒切割方法採用如前述方案中所述的晶棒切割裝置進行,所述晶棒切割方法包括在切割之前,採用所述檢測單元檢測所述晶棒的晶向偏角,在檢測到所述晶棒的晶向偏角超出預期範圍時,利用調整所述調整板以將所述晶棒的晶向偏角調整到預期範圍的步驟。The present invention also provides an ingot cutting method. The ingot cutting method is performed by the ingot cutting device as described in the foregoing solution, and the ingot cutting method includes detecting the ingot before cutting by using the detection unit. When it is detected that the deflection angle of the crystal orientation of the crystal rod exceeds the expected range, the step of adjusting the adjustment plate to adjust the deflection angle of the crystal orientation of the crystal rod to the expected range is used.
如上所述,本發明的晶棒工件板、晶棒切割裝置及切割方法,具有以下有益效果:本發明利用固定板和調整板相配合的結構設計,利用調整調整板相對固定板的位置以實現對晶棒的位置調節,以將晶棒的晶向偏角調整至預期範圍,確保最終切割出的晶圓符合要求。本裝置結構簡單,使用方便,不僅可以有效降低人力成本,同時調節偏角的過程中毋須經歷脫膠步驟,可有效避免對晶棒的損傷。採用本發明的晶棒切割裝置及切割方法,在切割前對晶棒的晶向偏角進行調節,可提高切割晶圓的品質,且可有效提高生產效率。As mentioned above, the ingot workpiece plate, the ingot cutting device and the cutting method of the present invention have the following beneficial effects: the present invention uses the structural design of the fixed plate and the adjusting plate to cooperate, and adjusts the position of the adjusting plate relative to the fixed plate to achieve Adjust the position of the ingot to adjust the crystal orientation deflection angle of the ingot to the expected range to ensure that the final cut wafer meets the requirements. The device is simple in structure and convenient to use, not only can effectively reduce labor costs, but also does not need to undergo a degumming step in the process of adjusting the deflection angle, and can effectively avoid damage to the ingot. By adopting the crystal rod cutting device and the cutting method of the present invention, the crystal orientation deflection angle of the crystal rod is adjusted before cutting, which can improve the quality of the cut wafer and can effectively improve the production efficiency.
以下由特定的具體實施例說明本發明的實施方式,熟悉此技術的人士可由本說明書所揭露的內容輕易地瞭解本發明的其他優點及功效。The following specific examples illustrate the implementation of the present invention. Those familiar with this technology can easily understand other advantages and effects of the present invention from the content disclosed in this specification.
須知,本說明書所附圖式所繪示的結構、比例、大小等,均僅用以配合說明書所揭示的內容,以供熟悉此技術的人士瞭解與閱讀,並非用以限定本發明可實施的限定條件,故不具技術上的實質意義,任何結構的修飾、比例關係的改變或大小的調整,在不影響本發明所能產生的功效及所能達成的目的下,均應仍落在本發明所揭示的技術內容得能涵蓋的範圍內。同時,本說明書中所引用的如“上”、“下”、“左”、“右”、“中間”等的用語,亦僅為便於敘述的明瞭,而非用以限定本發明可實施的範圍,其相對關係的改變或調整,在無實質變更技術內容下,當亦視為本發明可實施的範疇。It should be noted that the structures, proportions, sizes, etc. shown in the accompanying drawings in this specification are only used to match the content disclosed in the specification for people familiar with this technology to understand and read, and are not intended to limit the implementation of the present invention. Limited conditions, so it has no technical significance. Any structural modification, proportional relationship change or size adjustment should still fall under the present invention without affecting the effects and objectives that can be achieved by the present invention. The disclosed technical content must be within the scope of coverage. At the same time, the terms such as "upper", "lower", "left", "right", "middle", etc., cited in this specification are only for ease of description and clarity, and are not used to limit the implementation of the present invention. The scope, the change or adjustment of the relative relationship, without any substantial change to the technical content, shall also be regarded as the scope within which the present invention can be implemented.
實施例一Example one
如圖1至圖4所示,本發明提供一種晶棒工件板,包括:固定板11及調整板12,所述固定板11用於放置晶棒;所述調整板12位於所述固定板11遠離所述晶棒的表面,所述調整板12上設置有圓心孔121和若干個腰形通孔122,所述圓心孔121位於所述調整板12的中間,所述若干個腰形通孔122位於所述圓心孔121的外圍;所述固定板11和所述調整板12利用位於所述圓心孔121和所述若干個腰形通孔122內的螺栓相連接,位於所述腰形通孔122內的螺栓可在所述腰形通孔122內移動以調整所述固定板11和所述調整板12的相對位置,從而實現對所述晶棒的晶向偏角的調整。本發明利用固定板11和調整板12相配合的結構設計,利用調整調整板12相對固定板11的位置以實現對晶棒的位置調節,以將晶棒的晶向偏角調整至預期範圍,確保最終切割出的晶圓符合要求。本裝置結構簡單,使用方便,不僅可以有效降低人力成本,同時調節偏角的過程中毋須經歷脫膠步驟,可有效避免對晶棒的損傷。圖1是本實施例的晶棒工件板的總體結構示意圖,圖2為固定板11的結構示意圖,圖3為調整板12的結構示意圖。As shown in Figures 1 to 4, the present invention provides an ingot workpiece plate, including: a
矽片的晶向是控制半導體性能的重要指標,一般要求矽片的物理晶向和矽片幾何中心軸的夾角(即晶向偏角)控制在±0.5°以內,而在本發明人的工廠內,這個控制標準更高,通常控制在±0.1°以內。越小的晶向偏角控制偏差意味著調節難度越大,並且通常難以利用一次調整實現而是要經過多次調整才能達到預期效果。在現有的裝置和方法下,每次調整後都要再次檢測(即複檢),如果複檢結果仍達不到要求,則需要再重複人工進行塗膠,按壓裝置將晶棒壓持,讓晶棒與樹脂條和工件板三者利用膠水粘接在一起,最後進行一定時間的膠水固化後再進行X-ray的晶向複檢這樣一個複雜的流程,不僅耗時耗力,使得生產效率下降,生產成本上升,而且在反復的脫膠粘膠過程中容易造成晶棒的損傷。本申請的發明人正是針對現有裝置和方法的不足,經大量實驗後最終設計出了本申請的晶棒工件板結構,採用本發明的晶棒工件板,可以很容易地實現對晶棒的晶向偏角的調整。The crystal orientation of a silicon wafer is an important indicator for controlling semiconductor performance. Generally, it is required that the angle between the physical crystal orientation of the silicon wafer and the geometric center axis of the silicon wafer (ie, the deflection angle of the crystal orientation) be controlled within ±0.5°. This control standard is higher, usually within ±0.1°. The smaller the deviation of the crystal orientation deflection angle control means the greater the difficulty of adjustment, and it is usually difficult to achieve the desired effect with one adjustment but multiple adjustments. Under the existing device and method, after each adjustment, the inspection (ie re-inspection) is required. If the re-inspection result still does not meet the requirements, it is necessary to repeat the manual gluing process. The device is pressed to hold the crystal rod and let The crystal rod, the resin strip and the workpiece board are glued together, and finally the glue is cured for a certain period of time, and then the X-ray crystal orientation re-inspection is a complicated process, which not only consumes time and labor, but also makes production efficiency. Decrease, the production cost rises, and it is easy to cause damage to the crystal rods during repeated degumming and viscose processes. The inventor of the present application has designed the ingot workpiece plate structure of the present application after a large number of experiments in response to the deficiencies of the existing devices and methods. By using the ingot workpiece plate of the present invention, the ingot can be easily achieved. Adjustment of crystal orientation deflection angle.
作為示例,所述腰形通孔122為4個,4個所述腰形通孔122在沿以所述圓心孔121為圓心的周向上均勻間隔分佈,所述腰形通孔122為4個,既有利於所述固定板11和所述調整板12的緊固,同時在需要調整作業時調整過程也不會太複雜。設計腰形通孔122結構,且在進一步較佳的示例中,所述腰形通孔122為弧形腰形通孔,可以使得螺栓有較大的調整範圍,而且調整時更加容易。當然,所述固定板11上設置有對應的螺絲孔(未標示),以利用螺栓實現與所述調整板12的固定。As an example, there are 4 waist-shaped through
當所述腰形通孔122為弧形腰形通孔時,作為示例,所述腰形通孔122的弧長對應的圓心角為15~60°,角度過小則調整難度較大,角度過大不僅沒有必要(一般而言,晶棒偏角不會特別大),而且容易造成螺栓的鬆動。發明人經反復實驗發現,當該角度在15~60°之間時調整效果較好。When the waist-shaped through
所述固定板11的材質可以根據需要設置,比如為石墨、碳化矽或不銹鋼等,其表面形狀較佳為矩形。理論上晶棒可以直接固定在所述固定板11上,比如在所述固定板11上可以設置凹槽而將晶棒放置於所述凹槽內,但為避免晶棒和所述固定板11之間的摩擦造成晶棒的損傷,所述晶棒工件板還包括樹脂框架13,位於所述固定板11上,晶棒位於所述樹脂框架13內。當晶棒被放置到所述樹脂框架13內時,通常還需要利用塗膠以使所述晶棒、樹脂框架13和所述固定板11及調整板12牢固結合,膠水固化後再利用傳送裝置傳送到切割平臺上進行偏角檢測、偏角校正和切割等步驟。The material of the fixing
作為示例,所述調整板12包括平面部12a和凸台部12b,所述平面部12a與所述固定板11相接觸,所述凸台部12b位於所述平面部12a遠離所述固定板11的表面,其中,所述圓心孔121位於所述凸台部12b上,所述腰形通孔122位於所述平面部12a上,設置所述凸台部12b可使調整過程更加容易,比如在進行晶向偏角的調整作業時,先擰鬆所有的螺栓,然後利用施力於所述凸台部12b上以使所述調整板12圍繞所述圓心孔121旋轉,此時螺栓在對應的腰形通孔122內移動,當晶向偏角調整到預期範圍時,再將所有螺栓緊固。As an example, the adjusting
作為示例,所述平面部12a和所述凸台部12b為一體成型結構。As an example, the
作為示例,所述凸台部12b為矩柱形,且所述凸台部12b的長度和所述平面部12a的長度相同,以在移動過程中保持晶棒的平衡。當然,在其他示例中,根據放置晶棒工件板的載台的結構不同,所述凸台部12b還可以為其他結構或其他尺寸。As an example, the
如圖4所示,在使用本實施例的晶棒工件板時,將晶棒利用樹脂框架13並經粘膠以及固化製程與晶棒工件板固定,初始狀態下晶棒與所述固定板11及所述調整板12三者位置完全對應,晶棒的軸心線(沿晶棒長度方向的軸線)和所述固定板11及所述調整板12沿長度方向的中心線三者在縱向上對應(位於同一截面上),之後將所述晶棒和所述晶棒工件板利用傳送機構傳送至切割平臺的載臺上,且此時晶棒的軸心線與切割裝置的切割方向相互垂直,然後對晶棒進行晶向偏角檢測,如果晶向偏角在預期範圍則直接進行切割,如果晶向偏角超出預期範圍,則擰鬆所有的螺栓,然後使所述調整板12圍繞所述圓心孔121旋轉,旋轉的角度即需要校正的角度,由於載台和切割裝置的位置是固定不變的,所述固定板11和所述調整板12的相對位置調整後,所述調整板12仍是按原來的位置放置於載臺上,故所述晶棒相對於切割裝置的位置有所調整,由此實現了晶棒的晶向偏角的調整,當晶向偏角調整到預期範圍(比如為±0.1°)時,再將所有螺栓緊固。整個過程非常簡單,可以極大降低人力成本,而且可以有效避免晶棒的損傷,確保切割晶圓的品質。As shown in FIG. 4, when the ingot workpiece plate of this embodiment is used, the ingot is fixed to the ingot workpiece plate by the
實施例二Example two
如圖5所示,本發明還提供一種晶棒切割裝置,包括:
如實施例一中所述的晶棒工件板;
承載台3,待切割晶棒2利用所述晶棒工件板放置於所述承載台3上;
切割單元4,非切割作業時,所述切割單元4位於所述晶棒2的上方;
檢測單元5,位於所述晶棒2的上方,用於檢測所述晶棒2的晶向偏角。
As shown in Figure 5, the present invention also provides an ingot cutting device, including:
The ingot workpiece plate as described in the first embodiment;
The carrying table 3, the
對所述晶棒工件板的介紹請參考實施例一,出於簡潔的目的不贅述。Please refer to the first embodiment for the introduction of the ingot workpiece plate, and it will not be repeated for the sake of brevity.
所述承載台3的具體結構可以依據所述調整板12的具體結構不同而調整,比如本實施例中,所述承載台3上可設置有對應所述調整板12的凸台部12b的凹槽(未圖示)而將所述凸台部12b嵌入所述凹槽內,這樣可以使所述晶棒工件板能更好地固定於所述承載臺上。The specific structure of the carrying
所述切割單元4較佳為線切割單元,通常包括若干個滾輪和纏繞於滾輪上的鋼絲,以及驅動單元和升降單元等,在切割作業開始時,滾輪下降至晶棒表面,並在驅動單元的驅動下旋轉,由此帶動鋼絲線旋轉以沿晶棒的徑向對晶棒進行切割,並隨著切割進行逐步下降直至切割出完整的晶圓。需要特別說明的是,圖4中只是示意出各結構的相對位置而並非實際切割作業時的狀態展示。The
所述檢測單元5可以為X射線繞射儀,具體可以包括用於發射X射線的X射線發生器、X射線衍射接受裝置和測角儀圓,X射線投射在晶棒上後利用X射線衍射接受裝置進行接收衍射以獲取晶棒的晶向,然後再利用測角儀圓來獲取晶棒的晶向偏角,可以將晶向偏角的數據信息顯示或傳輸給其他設備。The
所述晶棒切割裝置的其他結構和現有技術中的切割裝置相同,由於這部分內容為本領域技術人員所熟知,出於簡潔的目的不展開。The other structure of the crystal rod cutting device is the same as that of the cutting device in the prior art. Since this part of the content is well known to those skilled in the art, it will not be expanded for the purpose of brevity.
本實施例的晶棒切割裝置可以很方便地將晶棒的晶向偏角調整到預期範圍,可提高切割晶圓的品質,且可有效提高生產效率。The crystal rod cutting device of this embodiment can conveniently adjust the crystal orientation deflection angle of the crystal rod to the expected range, can improve the quality of the cut wafer, and can effectively improve the production efficiency.
本發明還提供一種晶棒切割方法,所述晶棒切割方法採用如實施例二中所述的晶棒切割裝置進行,所述晶棒切割方法重點是在切割之前,採用所述檢測單元檢測所述晶棒的晶向偏角,在檢測到所述晶棒的晶向偏角超出預期範圍時,利用調整所述調整板以將所述晶棒的晶向偏角調整到預期範圍。除此之外,本發明的晶棒切割方法和現有技術中的切割方法相同,由於這部分內容為本領域技術人員所熟知,出於簡潔的目的不展開。The present invention also provides an ingot cutting method. The ingot cutting method is performed by the ingot cutting device as described in the second embodiment. The focus of the ingot cutting method is to use the detection unit to detect the ingot before cutting. For the deflection angle of the crystal orientation of the crystal rod, when it is detected that the deflection angle of the crystal orientation of the crystal rod exceeds the expected range, the adjustment plate is used to adjust the deflection angle of the crystal orientation of the crystal rod to the expected range. In addition, the crystal rod cutting method of the present invention is the same as the cutting method in the prior art. Since this part of the content is well known to those skilled in the art, it will not be expanded for the sake of brevity.
如上所述,本發明提供一種晶棒工件板、晶棒切割裝置及切割方法。晶棒工件板包括:固定板及調整板,所述固定板用於放置晶棒;所述調整板位於所述固定板遠離所述晶棒的表面,所述調整板上設置有圓心孔和若干個腰形通孔,所述圓心孔位於所述調整板的中間,所述若干個腰形通孔位於所述圓心孔的外圍;所述固定板和所述調整板利用位於所述圓心孔和所述若干個腰形通孔內的螺栓相連接,位於所述腰形通孔內的螺栓可在所述腰形通孔內移動以調整所述固定板和所述調整板的相對位置,從而實現對所述晶棒的晶向偏角的調整。本發明利用固定板和調整板相配合的結構設計,利用調整調整板相對固定板的位置以實現對晶棒的位置調節,以將晶棒的晶向偏角調整至預期範圍,確保最終切割出的晶圓符合要求。本裝置結構簡單,使用方便,不僅可以有效降低人力成本,同時調節偏角的過程中毋須經歷脫膠步驟,可有效避免對晶棒的損傷。採用本發明的晶棒切割裝置及切割方法,在切割前對晶棒的晶向偏角進行調節,可提高切割晶圓的品質,且可有效提高生產效率。所以,本發明有效克服了現有技術中的種種缺點而具高度產業利用價值。As described above, the present invention provides an ingot workpiece plate, an ingot cutting device and a cutting method. The ingot workpiece plate includes: a fixed plate and an adjustment plate, the fixed plate is used to place the ingot; the adjustment plate is located on the surface of the fixed plate away from the ingot, and the adjustment plate is provided with a center hole and several A waist-shaped through hole, the center hole is located in the middle of the adjustment plate, the plurality of waist-shaped through holes are located at the periphery of the center hole; the fixing plate and the adjustment plate use the center hole and The bolts in the several waist-shaped through holes are connected, and the bolts located in the waist-shaped through holes can move in the waist-shaped through holes to adjust the relative positions of the fixing plate and the adjusting plate, thereby The adjustment of the deflection angle of the crystal orientation of the crystal rod is realized. The invention utilizes the structural design of the matching of the fixed plate and the adjusting plate, and the position of the adjusting plate relative to the fixed plate is used to adjust the position of the crystal rod, so as to adjust the crystal orientation deflection angle of the crystal rod to the expected range, and ensure that the final cut is The wafers meet the requirements. The device is simple in structure and convenient to use, not only can effectively reduce labor costs, but also does not need to undergo a degumming step in the process of adjusting the deflection angle, and can effectively avoid damage to the ingot. By adopting the crystal rod cutting device and the cutting method of the present invention, the crystal orientation deflection angle of the crystal rod is adjusted before cutting, which can improve the quality of the cut wafer and can effectively improve the production efficiency. Therefore, the present invention effectively overcomes various shortcomings in the prior art and has a high industrial value.
上述實施例僅例示性說明本發明的原理及其功效,而非用於限制本發明。任何熟悉此技術的人士皆可在不違背本發明的精神及範疇下,對上述實施例進行修飾或改變。因此,舉凡所屬技術領域中具有通常知識者在未脫離本發明所揭示的精神與技術思想下所完成的一切等效修飾或改變,仍應由本發明的發明申請專利範圍所涵蓋。The above-mentioned embodiments only exemplarily illustrate the principles and effects of the present invention, but are not used to limit the present invention. Anyone familiar with this technology can modify or change the above-mentioned embodiments without departing from the spirit and scope of the present invention. Therefore, all equivalent modifications or changes made by persons with ordinary knowledge in the technical field without departing from the spirit and technical ideas disclosed in the present invention should still be covered by the scope of the invention patent application of the present invention.
11:固定板11: fixed plate
12:調整板12: adjustment board
12a:平面部12a: Plane
12b:凸台部12b: Boss
121:圓心孔121: Center Hole
122:腰形通孔122: Waist-shaped through hole
13:樹脂框架13: Resin frame
2:晶棒2: crystal rod
3:承載台3: Bearing platform
4:切割單元4: Cutting unit
5:檢測單元5: Detection unit
本發明的下列附圖在此作為本發明的一部分用於理解本發明。附圖中示出了本發明的實施例及其描述,用來解釋本發明的原理。The following drawings of the present invention are used here as a part of the present invention for understanding the present invention. The drawings show the embodiments of the present invention and the description thereof to explain the principle of the present invention.
附圖中: [圖1]顯示為本發明實施例一的晶棒工件板的結構示意圖。 [圖2]顯示為圖1中的固定板的結構示意圖。 [圖3]顯示為圖1中的調整板的結構示意圖。 [圖4]顯示為晶棒放置於本實施例一的晶棒工件板上的結構示意圖。 [圖5]顯示為本發明實施例二的晶棒切割裝置的結構示意圖。 In the attached picture: [Fig. 1] is a schematic diagram showing the structure of the ingot workpiece plate in the first embodiment of the present invention. [Fig. 2] Shows as a schematic diagram of the structure of the fixing plate in Fig. 1. [Fig. 3] Shows as a schematic diagram of the structure of the adjustment plate in Fig. 1. [Figure 4] shows a schematic diagram of the structure of the ingot ingot placed on the ingot workpiece plate of the first embodiment. [Figure 5] shows a schematic diagram of the structure of the ingot cutting device according to the second embodiment of the present invention.
無no
11:固定板 11: fixed plate
12:調整板 12: adjustment board
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CN114714526A (en) * | 2022-04-01 | 2022-07-08 | 宁夏中欣晶圆半导体科技有限公司 | Bonding method for two-dimensionally adjusting crystal orientation of single crystal silicon rod |
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