TWI722887B - Ingot workpiece board, ingot slicing device and ingot slicing method - Google Patents

Ingot workpiece board, ingot slicing device and ingot slicing method Download PDF

Info

Publication number
TWI722887B
TWI722887B TW109114750A TW109114750A TWI722887B TW I722887 B TWI722887 B TW I722887B TW 109114750 A TW109114750 A TW 109114750A TW 109114750 A TW109114750 A TW 109114750A TW I722887 B TWI722887 B TW I722887B
Authority
TW
Taiwan
Prior art keywords
ingot
plate
waist
shaped
holes
Prior art date
Application number
TW109114750A
Other languages
Chinese (zh)
Other versions
TW202116513A (en
Inventor
趙旭良
Original Assignee
大陸商上海新昇半導體科技有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 大陸商上海新昇半導體科技有限公司 filed Critical 大陸商上海新昇半導體科技有限公司
Application granted granted Critical
Publication of TWI722887B publication Critical patent/TWI722887B/en
Publication of TW202116513A publication Critical patent/TW202116513A/en

Links

Images

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B28WORKING CEMENT, CLAY, OR STONE
    • B28DWORKING STONE OR STONE-LIKE MATERIALS
    • B28D5/00Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B28WORKING CEMENT, CLAY, OR STONE
    • B28DWORKING STONE OR STONE-LIKE MATERIALS
    • B28D5/00Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
    • B28D5/0058Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material
    • B28D5/0082Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material for supporting, holding, feeding, conveying or discharging work

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Processing Of Stones Or Stones Resemblance Materials (AREA)

Abstract

The present invention provides an ingot workpiece board, an ingot slicing device and an ingot slicing method. The ingot workpiece board comprises a fixed plate and an adjustment plate. The fixed plate is configured to place an ingot, and the adjustment plate is located on the surface of the fixed plate away from the ingot. The adjustment plate is provided with a center hole and a plurality of waist-shaped through holes, the center hole is located in the middle of the adjustment plate, and the pluralities of waist-shaped through holes are located on the periphery of the center hole. The fixed plate and the adjustment plate are connected by bolts located in the center hole and the pluralities of waist-shaped through holes, and the bolts in the waist-shaped through holes can be moved in the waist-shaped through holes to adjust the relative positions of the fixed plate and the adjustment plate, so as to achieve the adjustment of the crystal orientation angle of the ingot.

Description

晶棒工件板、晶棒切割裝置及切割方法Crystal rod workpiece plate, crystal rod cutting device and cutting method

本發明涉及矽晶圓製造領域,特別是涉及一種晶棒工件板、晶棒切割裝置及切割方法。The invention relates to the field of silicon wafer manufacturing, in particular to an ingot workpiece plate, an ingot cutting device and a cutting method.

晶圓是半導體晶片製造過程中最基礎也是重要的原材料之一,其製造過程通常包括將多晶矽料利用CZ(Czochralski,直拉單晶法)法拉製成高品質的單晶矽棒的拉晶步驟、將單晶矽棒分割成多個單晶矽棒,同時進行單晶矽棒外徑的研磨和加工north槽的滾磨分段步驟、將單晶矽棒進行分割成矽片的切割步驟,以及利用研磨提高矽片表面質量的步驟等。這其中,在切割前有一道非常重要的沾棒步驟,具體過程是將滾磨分段步驟加工完成的晶棒利用X-Ray(繞射儀)尋找off-orientation(偏角)進行偏角修正後,粘接在工件板上。現有技術中的沾棒製程為:人工進行塗膠,利用按壓裝置將晶棒壓持,讓晶棒與樹脂條和工件板三者利用膠水粘接在一起,最後進行一定時間的膠水固化後再進行X-ray的晶向複檢。但現有的設備和製程在將晶棒與樹脂條和工件板三者粘接後無法立即進行複檢,如果複檢失敗,需要脫膠後重新塗膠,會花費大量的時間,脫膠過程也會帶來晶棒的損壞風險。Wafer is one of the most basic and important raw materials in the semiconductor wafer manufacturing process. The manufacturing process usually includes the crystal pulling step of using CZ (Czochralski, Czochralski, Czochralski) method to draw high-quality single crystal silicon rods. , Divide the single crystal silicon rod into multiple single crystal silicon rods, simultaneously carry out the grinding of the outer diameter of the single crystal silicon rod and the barrel grinding segmentation step of processing the north groove, and the cutting step of dividing the single crystal silicon rod into silicon wafers. And the steps to improve the surface quality of silicon wafers by grinding. Among them, there is a very important step of dipping the rod before cutting. The specific process is to use X-Ray (diffractometer) to find the off-orientation (deflection angle) to correct the deflection angle. After that, it is glued to the workpiece board. The sticking process in the prior art is as follows: manually apply glue, use a pressing device to hold the crystal stick, let the crystal stick, the resin strip and the workpiece plate be glued together, and finally cure the glue for a certain period of time. Perform X-ray reexamination of crystal orientation. However, the existing equipment and manufacturing process cannot be re-inspected immediately after bonding the ingot, the resin strip and the workpiece plate. If the re-inspection fails, it will take a lot of time and the degumming process will also take a lot of time. Risk of damage to the crystal bar.

鑒於以上所述現有技術的缺點,本發明的目的在於提供一種晶棒工件板、晶棒切割裝置及切割方法,用於解決現有技術中在對晶棒的晶向複檢失敗時,需要脫膠後再重新塗膠,而脫膠過程不僅費時費力,而且容易導致晶棒損傷等問題。In view of the above-mentioned shortcomings of the prior art, the purpose of the present invention is to provide an ingot workpiece plate, an ingot cutting device, and a cutting method, which are used to solve the problem of the need for degumming when the crystal orientation of the ingot in the prior art fails to be rechecked. Then re-gluing, and the degumming process is not only time-consuming and laborious, but also easy to cause problems such as damage to the ingot.

為實現上述目的,本發明提供一種晶棒工件板,包括:固定板及調整板,所述固定板用於放置晶棒;所述調整板位於所述固定板遠離所述晶棒的表面,所述調整板上設置有圓心孔和若干個腰形通孔,所述圓心孔位於所述調整板的中間,所述若干個腰形通孔位於所述圓心孔的外圍;所述固定板和所述調整板利用位於所述圓心孔和所述若干個腰形通孔內的螺栓相連接,位於所述腰形通孔內的螺栓可在所述腰形通孔內移動以調整所述固定板和所述調整板的相對位置,從而實現對所述晶棒的晶向偏角的調整。In order to achieve the above object, the present invention provides an ingot workpiece plate, including: a fixed plate and an adjustment plate, the fixed plate is used to place the ingot; the adjustment plate is located on the surface of the fixed plate away from the ingot, so The adjustment plate is provided with a center hole and a plurality of waist-shaped through holes, the center hole is located in the middle of the adjustment plate, and the plurality of waist-shaped through holes are located on the periphery of the center hole; The adjusting plate is connected by bolts located in the center hole and the plurality of waist-shaped through holes, and the bolts located in the waist-shaped through holes can move in the waist-shaped through holes to adjust the fixing plate And the relative position of the adjustment plate, so as to realize the adjustment of the deflection angle of the crystal orientation of the crystal rod.

可選地,所述腰形通孔為4個,4個所述腰形通孔在沿以所述圓心孔為圓心的周向上均勻間隔分佈。Optionally, there are four waist-shaped through holes, and the four waist-shaped through holes are evenly spaced along a circumferential direction centered on the center hole.

可選地,所述腰形通孔為弧形腰形通孔。Optionally, the waist-shaped through hole is an arc-shaped waist-shaped through hole.

可選地,所述腰形通孔的弧長對應的圓心角為15~60°。Optionally, the central angle corresponding to the arc length of the waist-shaped through hole is 15-60°.

可選地,所述晶棒工件板還包括樹脂框架,位於所述固定板的表面,晶棒位於所述樹脂框架內。Optionally, the crystal rod workpiece plate further includes a resin frame located on the surface of the fixing plate, and the crystal rod is located in the resin frame.

可選地,所述調整板包括平面部和凸台部,所述平面部與所述固定板相接觸,所述凸台部位於所述平面部遠離所述固定板的表面,其中,所述圓心孔位於所述凸台部上,所述腰形通孔位於所述平面部上。Optionally, the adjustment plate includes a plane portion and a boss portion, the plane portion is in contact with the fixing plate, and the boss portion is located on a surface of the plane portion away from the fixing plate, wherein the The center hole is located on the boss portion, and the waist-shaped through hole is located on the plane portion.

可選地,所述平面部和所述凸台部為一體成型結構。Optionally, the plane portion and the boss portion are an integrally formed structure.

可選地,所述凸台部為矩柱形,且所述凸台部的長度和所述平面部的長度相同。Optionally, the boss portion has a rectangular column shape, and the length of the boss portion is the same as the length of the plane portion.

本發明還提供一種晶棒切割裝置,包括: 如前述任一方案中所述的晶棒工件板; 承載台,待切割晶棒利用所述晶棒工件板放置於所述承載臺上; 切割單元,非切割作業時,所述切割單元位於所述晶棒的上方; 檢測單元,位於所述晶棒的上方,用於檢測所述晶棒的晶向偏角。 The present invention also provides a crystal rod cutting device, which includes: The ingot workpiece plate as described in any of the foregoing solutions; A carrying table, the ingot to be cut is placed on the carrying table by using the ingot workpiece plate; A cutting unit, the cutting unit is located above the crystal rod during non-cutting operation; The detection unit is located above the crystal rod and is used for detecting the crystal orientation deflection angle of the crystal rod.

本發明還提供一種晶棒切割方法,所述晶棒切割方法採用如前述方案中所述的晶棒切割裝置進行,所述晶棒切割方法包括在切割之前,採用所述檢測單元檢測所述晶棒的晶向偏角,在檢測到所述晶棒的晶向偏角超出預期範圍時,利用調整所述調整板以將所述晶棒的晶向偏角調整到預期範圍的步驟。The present invention also provides an ingot cutting method. The ingot cutting method is performed by the ingot cutting device as described in the foregoing solution, and the ingot cutting method includes detecting the ingot before cutting by using the detection unit. When it is detected that the deflection angle of the crystal orientation of the crystal rod exceeds the expected range, the step of adjusting the adjustment plate to adjust the deflection angle of the crystal orientation of the crystal rod to the expected range is used.

如上所述,本發明的晶棒工件板、晶棒切割裝置及切割方法,具有以下有益效果:本發明利用固定板和調整板相配合的結構設計,利用調整調整板相對固定板的位置以實現對晶棒的位置調節,以將晶棒的晶向偏角調整至預期範圍,確保最終切割出的晶圓符合要求。本裝置結構簡單,使用方便,不僅可以有效降低人力成本,同時調節偏角的過程中毋須經歷脫膠步驟,可有效避免對晶棒的損傷。採用本發明的晶棒切割裝置及切割方法,在切割前對晶棒的晶向偏角進行調節,可提高切割晶圓的品質,且可有效提高生產效率。As mentioned above, the ingot workpiece plate, the ingot cutting device and the cutting method of the present invention have the following beneficial effects: the present invention uses the structural design of the fixed plate and the adjusting plate to cooperate, and adjusts the position of the adjusting plate relative to the fixed plate to achieve Adjust the position of the ingot to adjust the crystal orientation deflection angle of the ingot to the expected range to ensure that the final cut wafer meets the requirements. The device is simple in structure and convenient to use, not only can effectively reduce labor costs, but also does not need to undergo a degumming step in the process of adjusting the deflection angle, and can effectively avoid damage to the ingot. By adopting the crystal rod cutting device and the cutting method of the present invention, the crystal orientation deflection angle of the crystal rod is adjusted before cutting, which can improve the quality of the cut wafer and can effectively improve the production efficiency.

以下由特定的具體實施例說明本發明的實施方式,熟悉此技術的人士可由本說明書所揭露的內容輕易地瞭解本發明的其他優點及功效。The following specific examples illustrate the implementation of the present invention. Those familiar with this technology can easily understand other advantages and effects of the present invention from the content disclosed in this specification.

須知,本說明書所附圖式所繪示的結構、比例、大小等,均僅用以配合說明書所揭示的內容,以供熟悉此技術的人士瞭解與閱讀,並非用以限定本發明可實施的限定條件,故不具技術上的實質意義,任何結構的修飾、比例關係的改變或大小的調整,在不影響本發明所能產生的功效及所能達成的目的下,均應仍落在本發明所揭示的技術內容得能涵蓋的範圍內。同時,本說明書中所引用的如“上”、“下”、“左”、“右”、“中間”等的用語,亦僅為便於敘述的明瞭,而非用以限定本發明可實施的範圍,其相對關係的改變或調整,在無實質變更技術內容下,當亦視為本發明可實施的範疇。It should be noted that the structures, proportions, sizes, etc. shown in the accompanying drawings in this specification are only used to match the content disclosed in the specification for people familiar with this technology to understand and read, and are not intended to limit the implementation of the present invention. Limited conditions, so it has no technical significance. Any structural modification, proportional relationship change or size adjustment should still fall under the present invention without affecting the effects and objectives that can be achieved by the present invention. The disclosed technical content must be within the scope of coverage. At the same time, the terms such as "upper", "lower", "left", "right", "middle", etc., cited in this specification are only for ease of description and clarity, and are not used to limit the implementation of the present invention. The scope, the change or adjustment of the relative relationship, without any substantial change to the technical content, shall also be regarded as the scope within which the present invention can be implemented.

實施例一Example one

如圖1至圖4所示,本發明提供一種晶棒工件板,包括:固定板11及調整板12,所述固定板11用於放置晶棒;所述調整板12位於所述固定板11遠離所述晶棒的表面,所述調整板12上設置有圓心孔121和若干個腰形通孔122,所述圓心孔121位於所述調整板12的中間,所述若干個腰形通孔122位於所述圓心孔121的外圍;所述固定板11和所述調整板12利用位於所述圓心孔121和所述若干個腰形通孔122內的螺栓相連接,位於所述腰形通孔122內的螺栓可在所述腰形通孔122內移動以調整所述固定板11和所述調整板12的相對位置,從而實現對所述晶棒的晶向偏角的調整。本發明利用固定板11和調整板12相配合的結構設計,利用調整調整板12相對固定板11的位置以實現對晶棒的位置調節,以將晶棒的晶向偏角調整至預期範圍,確保最終切割出的晶圓符合要求。本裝置結構簡單,使用方便,不僅可以有效降低人力成本,同時調節偏角的過程中毋須經歷脫膠步驟,可有效避免對晶棒的損傷。圖1是本實施例的晶棒工件板的總體結構示意圖,圖2為固定板11的結構示意圖,圖3為調整板12的結構示意圖。As shown in Figures 1 to 4, the present invention provides an ingot workpiece plate, including: a fixed plate 11 and an adjustment plate 12, the fixed plate 11 is used to place the ingot; the adjustment plate 12 is located on the fixed plate 11 Away from the surface of the crystal rod, the adjustment plate 12 is provided with a center hole 121 and a plurality of waist-shaped through holes 122, the center hole 121 is located in the middle of the adjustment plate 12, and the plurality of waist-shaped through holes 122 is located on the periphery of the center hole 121; the fixing plate 11 and the adjustment plate 12 are connected by bolts located in the center hole 121 and the plurality of waist-shaped through holes 122, and are located in the waist-shaped through hole. The bolt in the hole 122 can move in the waist-shaped through hole 122 to adjust the relative position of the fixing plate 11 and the adjusting plate 12, so as to realize the adjustment of the crystal orientation deflection angle of the crystal rod. The present invention utilizes the structural design of the matching of the fixed plate 11 and the adjusting plate 12, and adjusts the position of the adjusting plate 12 relative to the fixed plate 11 to adjust the position of the crystal rod, so as to adjust the crystal orientation deflection angle of the crystal rod to the expected range. Ensure that the final cut wafer meets the requirements. The device is simple in structure and convenient to use, not only can effectively reduce labor costs, but also does not need to undergo a degumming step in the process of adjusting the deflection angle, and can effectively avoid damage to the ingot. FIG. 1 is a schematic diagram of the overall structure of the ingot workpiece plate of this embodiment, FIG. 2 is a schematic diagram of the structure of the fixing plate 11, and FIG. 3 is a schematic diagram of the structure of the adjusting plate 12.

矽片的晶向是控制半導體性能的重要指標,一般要求矽片的物理晶向和矽片幾何中心軸的夾角(即晶向偏角)控制在±0.5°以內,而在本發明人的工廠內,這個控制標準更高,通常控制在±0.1°以內。越小的晶向偏角控制偏差意味著調節難度越大,並且通常難以利用一次調整實現而是要經過多次調整才能達到預期效果。在現有的裝置和方法下,每次調整後都要再次檢測(即複檢),如果複檢結果仍達不到要求,則需要再重複人工進行塗膠,按壓裝置將晶棒壓持,讓晶棒與樹脂條和工件板三者利用膠水粘接在一起,最後進行一定時間的膠水固化後再進行X-ray的晶向複檢這樣一個複雜的流程,不僅耗時耗力,使得生產效率下降,生產成本上升,而且在反復的脫膠粘膠過程中容易造成晶棒的損傷。本申請的發明人正是針對現有裝置和方法的不足,經大量實驗後最終設計出了本申請的晶棒工件板結構,採用本發明的晶棒工件板,可以很容易地實現對晶棒的晶向偏角的調整。The crystal orientation of a silicon wafer is an important indicator for controlling semiconductor performance. Generally, it is required that the angle between the physical crystal orientation of the silicon wafer and the geometric center axis of the silicon wafer (ie, the deflection angle of the crystal orientation) be controlled within ±0.5°. This control standard is higher, usually within ±0.1°. The smaller the deviation of the crystal orientation deflection angle control means the greater the difficulty of adjustment, and it is usually difficult to achieve the desired effect with one adjustment but multiple adjustments. Under the existing device and method, after each adjustment, the inspection (ie re-inspection) is required. If the re-inspection result still does not meet the requirements, it is necessary to repeat the manual gluing process. The device is pressed to hold the crystal rod and let The crystal rod, the resin strip and the workpiece board are glued together, and finally the glue is cured for a certain period of time, and then the X-ray crystal orientation re-inspection is a complicated process, which not only consumes time and labor, but also makes production efficiency. Decrease, the production cost rises, and it is easy to cause damage to the crystal rods during repeated degumming and viscose processes. The inventor of the present application has designed the ingot workpiece plate structure of the present application after a large number of experiments in response to the deficiencies of the existing devices and methods. By using the ingot workpiece plate of the present invention, the ingot can be easily achieved. Adjustment of crystal orientation deflection angle.

作為示例,所述腰形通孔122為4個,4個所述腰形通孔122在沿以所述圓心孔121為圓心的周向上均勻間隔分佈,所述腰形通孔122為4個,既有利於所述固定板11和所述調整板12的緊固,同時在需要調整作業時調整過程也不會太複雜。設計腰形通孔122結構,且在進一步較佳的示例中,所述腰形通孔122為弧形腰形通孔,可以使得螺栓有較大的調整範圍,而且調整時更加容易。當然,所述固定板11上設置有對應的螺絲孔(未標示),以利用螺栓實現與所述調整板12的固定。As an example, there are 4 waist-shaped through holes 122, 4 waist-shaped through holes 122 are evenly spaced along the circumferential direction centered on the center hole 121, and there are 4 waist-shaped through holes 122. , Which is beneficial to the fastening of the fixing plate 11 and the adjusting plate 12, and at the same time, the adjustment process is not too complicated when the adjustment operation is required. The structure of the waist-shaped through hole 122 is designed, and in a further preferred example, the waist-shaped through hole 122 is an arc-shaped waist-shaped through hole, which can make the bolt have a larger adjustment range and make adjustment easier. Of course, the fixing plate 11 is provided with corresponding screw holes (not labeled), so as to realize the fixing with the adjusting plate 12 by bolts.

當所述腰形通孔122為弧形腰形通孔時,作為示例,所述腰形通孔122的弧長對應的圓心角為15~60°,角度過小則調整難度較大,角度過大不僅沒有必要(一般而言,晶棒偏角不會特別大),而且容易造成螺栓的鬆動。發明人經反復實驗發現,當該角度在15~60°之間時調整效果較好。When the waist-shaped through hole 122 is an arc-shaped waist-shaped through hole, as an example, the arc length of the waist-shaped through hole 122 corresponds to a center angle of 15-60°. If the angle is too small, the adjustment will be more difficult, and the angle is too large. Not only is it unnecessary (generally speaking, the deflection angle of the crystal rod is not particularly large), but it is also easy to cause the bolt to loosen. The inventor found through repeated experiments that the adjustment effect is better when the angle is between 15 and 60°.

所述固定板11的材質可以根據需要設置,比如為石墨、碳化矽或不銹鋼等,其表面形狀較佳為矩形。理論上晶棒可以直接固定在所述固定板11上,比如在所述固定板11上可以設置凹槽而將晶棒放置於所述凹槽內,但為避免晶棒和所述固定板11之間的摩擦造成晶棒的損傷,所述晶棒工件板還包括樹脂框架13,位於所述固定板11上,晶棒位於所述樹脂框架13內。當晶棒被放置到所述樹脂框架13內時,通常還需要利用塗膠以使所述晶棒、樹脂框架13和所述固定板11及調整板12牢固結合,膠水固化後再利用傳送裝置傳送到切割平臺上進行偏角檢測、偏角校正和切割等步驟。The material of the fixing plate 11 can be set as required, such as graphite, silicon carbide, stainless steel, etc., and its surface shape is preferably rectangular. Theoretically, the ingot can be directly fixed on the fixing plate 11. For example, a groove can be provided on the fixing plate 11 and the ingot can be placed in the groove, but in order to avoid the ingot and the fixing plate 11 The friction between the ingots causes damage to the ingot. The ingot workpiece plate further includes a resin frame 13 on the fixed plate 11, and the ingot is located in the resin frame 13. When the crystal rod is placed in the resin frame 13, it is usually necessary to use glue to make the crystal rod, the resin frame 13 and the fixed plate 11 and the adjustment plate 12 firmly combined, and the glue is cured before using the conveying device Transfer to the cutting platform for deflection detection, deflection correction and cutting steps.

作為示例,所述調整板12包括平面部12a和凸台部12b,所述平面部12a與所述固定板11相接觸,所述凸台部12b位於所述平面部12a遠離所述固定板11的表面,其中,所述圓心孔121位於所述凸台部12b上,所述腰形通孔122位於所述平面部12a上,設置所述凸台部12b可使調整過程更加容易,比如在進行晶向偏角的調整作業時,先擰鬆所有的螺栓,然後利用施力於所述凸台部12b上以使所述調整板12圍繞所述圓心孔121旋轉,此時螺栓在對應的腰形通孔122內移動,當晶向偏角調整到預期範圍時,再將所有螺栓緊固。As an example, the adjusting plate 12 includes a flat portion 12a and a boss portion 12b, the flat portion 12a is in contact with the fixing plate 11, and the boss portion 12b is located on the flat portion 12a away from the fixing plate 11. Wherein, the center hole 121 is located on the boss portion 12b, and the waist-shaped through hole 122 is located on the flat portion 12a. The provision of the boss portion 12b can make the adjustment process easier, such as When adjusting the deflection angle of the crystal orientation, first loosen all the bolts, and then apply force on the boss portion 12b to make the adjustment plate 12 rotate around the center hole 121. At this time, the bolts are in the corresponding position. Move inside the waist-shaped through hole 122, and when the crystal orientation deflection angle is adjusted to the expected range, all bolts are tightened.

作為示例,所述平面部12a和所述凸台部12b為一體成型結構。As an example, the flat portion 12a and the boss portion 12b are integrally formed.

作為示例,所述凸台部12b為矩柱形,且所述凸台部12b的長度和所述平面部12a的長度相同,以在移動過程中保持晶棒的平衡。當然,在其他示例中,根據放置晶棒工件板的載台的結構不同,所述凸台部12b還可以為其他結構或其他尺寸。As an example, the boss portion 12b has a rectangular column shape, and the length of the boss portion 12b is the same as the length of the plane portion 12a, so as to maintain the balance of the crystal rod during the movement. Of course, in other examples, depending on the structure of the carrier on which the ingot workpiece plate is placed, the boss portion 12b may also have other structures or other sizes.

如圖4所示,在使用本實施例的晶棒工件板時,將晶棒利用樹脂框架13並經粘膠以及固化製程與晶棒工件板固定,初始狀態下晶棒與所述固定板11及所述調整板12三者位置完全對應,晶棒的軸心線(沿晶棒長度方向的軸線)和所述固定板11及所述調整板12沿長度方向的中心線三者在縱向上對應(位於同一截面上),之後將所述晶棒和所述晶棒工件板利用傳送機構傳送至切割平臺的載臺上,且此時晶棒的軸心線與切割裝置的切割方向相互垂直,然後對晶棒進行晶向偏角檢測,如果晶向偏角在預期範圍則直接進行切割,如果晶向偏角超出預期範圍,則擰鬆所有的螺栓,然後使所述調整板12圍繞所述圓心孔121旋轉,旋轉的角度即需要校正的角度,由於載台和切割裝置的位置是固定不變的,所述固定板11和所述調整板12的相對位置調整後,所述調整板12仍是按原來的位置放置於載臺上,故所述晶棒相對於切割裝置的位置有所調整,由此實現了晶棒的晶向偏角的調整,當晶向偏角調整到預期範圍(比如為±0.1°)時,再將所有螺栓緊固。整個過程非常簡單,可以極大降低人力成本,而且可以有效避免晶棒的損傷,確保切割晶圓的品質。As shown in FIG. 4, when the ingot workpiece plate of this embodiment is used, the ingot is fixed to the ingot workpiece plate by the resin frame 13 and through the glue and curing process. In the initial state, the ingot and the fixed plate 11 The positions of the three positions corresponding to the adjustment plate 12 are completely corresponding. The axis of the crystal rod (the axis along the length direction of the crystal rod) and the center line of the fixed plate 11 and the adjustment plate 12 in the longitudinal direction are in the longitudinal direction. Corresponding (located on the same cross-section), then the ingot and the ingot workpiece plate are transferred to the stage of the cutting platform by a conveying mechanism, and at this time the axis of the ingot and the cutting direction of the cutting device are perpendicular to each other , And then check the crystal orientation deflection angle of the crystal rod. If the crystal orientation deflection angle is within the expected range, then cut directly. If the crystal orientation deflection angle exceeds the expected range, loosen all the bolts, and then make the adjustment plate 12 surround the The center hole 121 rotates, and the angle of rotation is the angle that needs to be corrected. Since the positions of the carrier and the cutting device are fixed, after the relative positions of the fixed plate 11 and the adjustment plate 12 are adjusted, the adjustment plate 12 is still placed on the stage in its original position, so the position of the crystal rod relative to the cutting device has been adjusted, thereby realizing the adjustment of the crystal orientation deflection angle of the crystal rod. When the crystal orientation deflection angle is adjusted to the expected When it is within the range (for example, ±0.1°), then tighten all bolts. The whole process is very simple, can greatly reduce labor costs, and can effectively avoid damage to the ingot, and ensure the quality of the cut wafer.

實施例二Example two

如圖5所示,本發明還提供一種晶棒切割裝置,包括: 如實施例一中所述的晶棒工件板; 承載台3,待切割晶棒2利用所述晶棒工件板放置於所述承載台3上; 切割單元4,非切割作業時,所述切割單元4位於所述晶棒2的上方; 檢測單元5,位於所述晶棒2的上方,用於檢測所述晶棒2的晶向偏角。 As shown in Figure 5, the present invention also provides an ingot cutting device, including: The ingot workpiece plate as described in the first embodiment; The carrying table 3, the ingot 2 to be cut is placed on the carrying table 3 by using the ingot workpiece plate; The cutting unit 4, during non-cutting operation, the cutting unit 4 is located above the crystal rod 2; The detection unit 5 is located above the crystal rod 2 and is used to detect the crystal orientation deflection angle of the crystal rod 2.

對所述晶棒工件板的介紹請參考實施例一,出於簡潔的目的不贅述。Please refer to the first embodiment for the introduction of the ingot workpiece plate, and it will not be repeated for the sake of brevity.

所述承載台3的具體結構可以依據所述調整板12的具體結構不同而調整,比如本實施例中,所述承載台3上可設置有對應所述調整板12的凸台部12b的凹槽(未圖示)而將所述凸台部12b嵌入所述凹槽內,這樣可以使所述晶棒工件板能更好地固定於所述承載臺上。The specific structure of the carrying platform 3 can be adjusted according to the specific structure of the adjusting plate 12. For example, in this embodiment, the carrying platform 3 may be provided with a concave portion corresponding to the boss portion 12b of the adjusting plate 12. A groove (not shown) is used to embed the boss portion 12b in the groove, so that the ingot workpiece plate can be better fixed on the carrying platform.

所述切割單元4較佳為線切割單元,通常包括若干個滾輪和纏繞於滾輪上的鋼絲,以及驅動單元和升降單元等,在切割作業開始時,滾輪下降至晶棒表面,並在驅動單元的驅動下旋轉,由此帶動鋼絲線旋轉以沿晶棒的徑向對晶棒進行切割,並隨著切割進行逐步下降直至切割出完整的晶圓。需要特別說明的是,圖4中只是示意出各結構的相對位置而並非實際切割作業時的狀態展示。The cutting unit 4 is preferably a wire cutting unit, which usually includes a number of rollers and steel wires wound on the rollers, as well as a drive unit and a lifting unit. When the cutting operation starts, the rollers drop to the surface of the crystal rod, and the drive unit Driven by the drive to rotate, the steel wire is driven to rotate to cut the ingot along the radial direction of the ingot, and gradually descend as the cutting progresses until a complete wafer is cut. It should be particularly noted that FIG. 4 only illustrates the relative positions of the various structures and is not a state display during the actual cutting operation.

所述檢測單元5可以為X射線繞射儀,具體可以包括用於發射X射線的X射線發生器、X射線衍射接受裝置和測角儀圓,X射線投射在晶棒上後利用X射線衍射接受裝置進行接收衍射以獲取晶棒的晶向,然後再利用測角儀圓來獲取晶棒的晶向偏角,可以將晶向偏角的數據信息顯示或傳輸給其他設備。The detection unit 5 may be an X-ray diffractometer, which may specifically include an X-ray generator for emitting X-rays, an X-ray diffraction receiving device, and a goniometer circle. The X-rays are projected on the crystal rod and used for X-ray diffraction. The receiving device performs receiving diffraction to obtain the crystal orientation of the crystal rod, and then uses the goniometer circle to obtain the crystal orientation deflection angle of the crystal rod. The data information of the crystal orientation deflection angle can be displayed or transmitted to other equipment.

所述晶棒切割裝置的其他結構和現有技術中的切割裝置相同,由於這部分內容為本領域技術人員所熟知,出於簡潔的目的不展開。The other structure of the crystal rod cutting device is the same as that of the cutting device in the prior art. Since this part of the content is well known to those skilled in the art, it will not be expanded for the purpose of brevity.

本實施例的晶棒切割裝置可以很方便地將晶棒的晶向偏角調整到預期範圍,可提高切割晶圓的品質,且可有效提高生產效率。The crystal rod cutting device of this embodiment can conveniently adjust the crystal orientation deflection angle of the crystal rod to the expected range, can improve the quality of the cut wafer, and can effectively improve the production efficiency.

本發明還提供一種晶棒切割方法,所述晶棒切割方法採用如實施例二中所述的晶棒切割裝置進行,所述晶棒切割方法重點是在切割之前,採用所述檢測單元檢測所述晶棒的晶向偏角,在檢測到所述晶棒的晶向偏角超出預期範圍時,利用調整所述調整板以將所述晶棒的晶向偏角調整到預期範圍。除此之外,本發明的晶棒切割方法和現有技術中的切割方法相同,由於這部分內容為本領域技術人員所熟知,出於簡潔的目的不展開。The present invention also provides an ingot cutting method. The ingot cutting method is performed by the ingot cutting device as described in the second embodiment. The focus of the ingot cutting method is to use the detection unit to detect the ingot before cutting. For the deflection angle of the crystal orientation of the crystal rod, when it is detected that the deflection angle of the crystal orientation of the crystal rod exceeds the expected range, the adjustment plate is used to adjust the deflection angle of the crystal orientation of the crystal rod to the expected range. In addition, the crystal rod cutting method of the present invention is the same as the cutting method in the prior art. Since this part of the content is well known to those skilled in the art, it will not be expanded for the sake of brevity.

如上所述,本發明提供一種晶棒工件板、晶棒切割裝置及切割方法。晶棒工件板包括:固定板及調整板,所述固定板用於放置晶棒;所述調整板位於所述固定板遠離所述晶棒的表面,所述調整板上設置有圓心孔和若干個腰形通孔,所述圓心孔位於所述調整板的中間,所述若干個腰形通孔位於所述圓心孔的外圍;所述固定板和所述調整板利用位於所述圓心孔和所述若干個腰形通孔內的螺栓相連接,位於所述腰形通孔內的螺栓可在所述腰形通孔內移動以調整所述固定板和所述調整板的相對位置,從而實現對所述晶棒的晶向偏角的調整。本發明利用固定板和調整板相配合的結構設計,利用調整調整板相對固定板的位置以實現對晶棒的位置調節,以將晶棒的晶向偏角調整至預期範圍,確保最終切割出的晶圓符合要求。本裝置結構簡單,使用方便,不僅可以有效降低人力成本,同時調節偏角的過程中毋須經歷脫膠步驟,可有效避免對晶棒的損傷。採用本發明的晶棒切割裝置及切割方法,在切割前對晶棒的晶向偏角進行調節,可提高切割晶圓的品質,且可有效提高生產效率。所以,本發明有效克服了現有技術中的種種缺點而具高度產業利用價值。As described above, the present invention provides an ingot workpiece plate, an ingot cutting device and a cutting method. The ingot workpiece plate includes: a fixed plate and an adjustment plate, the fixed plate is used to place the ingot; the adjustment plate is located on the surface of the fixed plate away from the ingot, and the adjustment plate is provided with a center hole and several A waist-shaped through hole, the center hole is located in the middle of the adjustment plate, the plurality of waist-shaped through holes are located at the periphery of the center hole; the fixing plate and the adjustment plate use the center hole and The bolts in the several waist-shaped through holes are connected, and the bolts located in the waist-shaped through holes can move in the waist-shaped through holes to adjust the relative positions of the fixing plate and the adjusting plate, thereby The adjustment of the deflection angle of the crystal orientation of the crystal rod is realized. The invention utilizes the structural design of the matching of the fixed plate and the adjusting plate, and the position of the adjusting plate relative to the fixed plate is used to adjust the position of the crystal rod, so as to adjust the crystal orientation deflection angle of the crystal rod to the expected range, and ensure that the final cut is The wafers meet the requirements. The device is simple in structure and convenient to use, not only can effectively reduce labor costs, but also does not need to undergo a degumming step in the process of adjusting the deflection angle, and can effectively avoid damage to the ingot. By adopting the crystal rod cutting device and the cutting method of the present invention, the crystal orientation deflection angle of the crystal rod is adjusted before cutting, which can improve the quality of the cut wafer and can effectively improve the production efficiency. Therefore, the present invention effectively overcomes various shortcomings in the prior art and has a high industrial value.

上述實施例僅例示性說明本發明的原理及其功效,而非用於限制本發明。任何熟悉此技術的人士皆可在不違背本發明的精神及範疇下,對上述實施例進行修飾或改變。因此,舉凡所屬技術領域中具有通常知識者在未脫離本發明所揭示的精神與技術思想下所完成的一切等效修飾或改變,仍應由本發明的發明申請專利範圍所涵蓋。The above-mentioned embodiments only exemplarily illustrate the principles and effects of the present invention, but are not used to limit the present invention. Anyone familiar with this technology can modify or change the above-mentioned embodiments without departing from the spirit and scope of the present invention. Therefore, all equivalent modifications or changes made by persons with ordinary knowledge in the technical field without departing from the spirit and technical ideas disclosed in the present invention should still be covered by the scope of the invention patent application of the present invention.

11:固定板11: fixed plate

12:調整板12: adjustment board

12a:平面部12a: Plane

12b:凸台部12b: Boss

121:圓心孔121: Center Hole

122:腰形通孔122: Waist-shaped through hole

13:樹脂框架13: Resin frame

2:晶棒2: crystal rod

3:承載台3: Bearing platform

4:切割單元4: Cutting unit

5:檢測單元5: Detection unit

本發明的下列附圖在此作為本發明的一部分用於理解本發明。附圖中示出了本發明的實施例及其描述,用來解釋本發明的原理。The following drawings of the present invention are used here as a part of the present invention for understanding the present invention. The drawings show the embodiments of the present invention and the description thereof to explain the principle of the present invention.

附圖中: [圖1]顯示為本發明實施例一的晶棒工件板的結構示意圖。 [圖2]顯示為圖1中的固定板的結構示意圖。 [圖3]顯示為圖1中的調整板的結構示意圖。 [圖4]顯示為晶棒放置於本實施例一的晶棒工件板上的結構示意圖。 [圖5]顯示為本發明實施例二的晶棒切割裝置的結構示意圖。 In the attached picture: [Fig. 1] is a schematic diagram showing the structure of the ingot workpiece plate in the first embodiment of the present invention. [Fig. 2] Shows as a schematic diagram of the structure of the fixing plate in Fig. 1. [Fig. 3] Shows as a schematic diagram of the structure of the adjustment plate in Fig. 1. [Figure 4] shows a schematic diagram of the structure of the ingot ingot placed on the ingot workpiece plate of the first embodiment. [Figure 5] shows a schematic diagram of the structure of the ingot cutting device according to the second embodiment of the present invention.

no

11:固定板 11: fixed plate

12:調整板 12: adjustment board

Claims (9)

一種晶棒工件板,包括:固定板,所述固定板用於放置晶棒;調整板,位於所述固定板遠離所述晶棒的表面,所述調整板上設置有圓心孔和若干個腰形通孔,所述圓心孔位於所述調整板的中間,所述若干個腰形通孔位於所述圓心孔的外圍;所述固定板和所述調整板利用位於所述圓心孔和所述若干個腰形通孔內的螺栓相連接,位於所述腰形通孔內的螺栓可在所述腰形通孔內移動以調整所述固定板和所述調整板的相對位置,從而實現對所述晶棒的晶向偏角的調整,其中所述腰形通孔為弧形腰形通孔。 An ingot workpiece plate, comprising: a fixed plate for placing the ingot; an adjustment plate located on the surface of the fixed plate away from the ingot; the adjustment plate is provided with a center hole and a plurality of waists The central hole is located in the middle of the adjusting plate, and the several waist-shaped through holes are located at the periphery of the central hole; the fixing plate and the adjusting plate use the central hole and the The bolts in a plurality of waist-shaped through holes are connected, and the bolts located in the waist-shaped through holes can move in the waist-shaped through holes to adjust the relative positions of the fixing plate and the adjusting plate, thereby realizing alignment. In the adjustment of the deflection angle of the crystal orientation of the crystal rod, the waist-shaped through hole is an arc waist-shaped through hole. 如請求項1所述的晶棒工件板,其中所述腰形通孔為4個,4個所述腰形通孔在沿以所述圓心孔為圓心的周向上均勻間隔分佈。 The ingot workpiece plate according to claim 1, wherein the number of the waist-shaped through holes is four, and the four waist-shaped through holes are evenly spaced along the circumferential direction with the center hole as the center. 如請求項1所述的晶棒工件板,其中所述腰形通孔的弧長對應的圓心角為15~60°。 The ingot workpiece plate according to claim 1, wherein the central angle corresponding to the arc length of the waist-shaped through hole is 15-60°. 如請求項1所述的晶棒工件板,其中所述晶棒工件板還包括樹脂框架,位於所述固定板上,晶棒位於所述樹脂框架內。 The ingot workpiece plate according to claim 1, wherein the ingot workpiece plate further includes a resin frame located on the fixed plate, and the ingot is located in the resin frame. 如請求項1-4任一項所述的晶棒工件板,其中所述調整板包括平面部和凸台部,所述平面部與所述固定板相接觸,所述凸台部位於所述平面部遠離所述固定板的表面,其中,所述圓心孔位於所述凸台部上,所述腰形通孔位於所述平面部上。 The ingot workpiece plate according to any one of claims 1 to 4, wherein the adjustment plate includes a plane portion and a boss portion, the plane portion is in contact with the fixed plate, and the boss portion is located at the The flat portion is away from the surface of the fixing plate, wherein the center hole is located on the boss portion, and the waist-shaped through hole is located on the flat portion. 如請求項5所述的晶棒工件板,其中所述平面部和所述凸台部為一體成型結構。 The ingot workpiece plate according to claim 5, wherein the plane portion and the boss portion are an integrally formed structure. 如請求項5所述的晶棒工件板,其中所述凸台部為矩柱形,且所述凸台部的長度和所述平面部的長度相同。 The ingot workpiece plate according to claim 5, wherein the boss portion is in a rectangular column shape, and the length of the boss portion is the same as the length of the plane portion. 一種晶棒切割裝置,包括:如請求項1所述的晶棒工件板;承載台,待切割晶棒利用所述晶棒工件板放置於所述承載臺上;切割單元,非切割作業時,所述切割單元位於所述晶棒的上方;檢測單元,位於所述晶棒的上方,用於檢測所述晶棒的晶向偏角。 An ingot cutting device, comprising: the ingot workpiece plate according to claim 1; a bearing table, where the ingot to be cut is placed on the bearing table by using the ingot workpiece plate; a cutting unit, during non-cutting operation, The cutting unit is located above the crystal rod; the detection unit is located above the crystal rod and is used to detect the crystal orientation deflection angle of the crystal rod. 一種晶棒切割方法,採用如請求項8所述的晶棒切割裝置進行,所述晶棒切割方法包括在切割之前,採用所述檢測單元檢測所述晶棒的晶向偏角,在檢測到所述晶棒的晶向偏角超出預期範圍時,利用調整所述調整板以將所述晶棒的晶向偏角調整到預期範圍的步驟。An ingot cutting method, which is carried out by using the ingot cutting device as described in claim 8. The ingot cutting method includes before cutting, the detection unit is used to detect the crystal orientation deflection angle of the ingot, and after detecting When the crystal orientation deflection angle of the crystal rod exceeds the expected range, the step of adjusting the adjustment plate to adjust the crystal orientation deflection angle of the crystal rod to the expected range is used.
TW109114750A 2019-10-18 2020-05-04 Ingot workpiece board, ingot slicing device and ingot slicing method TWI722887B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN201910994483.4 2019-10-18
CN201910994483.4A CN110625836A (en) 2019-10-18 2019-10-18 Crystal bar workpiece plate, crystal bar cutting device and crystal bar cutting method

Publications (2)

Publication Number Publication Date
TWI722887B true TWI722887B (en) 2021-03-21
TW202116513A TW202116513A (en) 2021-05-01

Family

ID=68976723

Family Applications (1)

Application Number Title Priority Date Filing Date
TW109114750A TWI722887B (en) 2019-10-18 2020-05-04 Ingot workpiece board, ingot slicing device and ingot slicing method

Country Status (2)

Country Link
CN (1) CN110625836A (en)
TW (1) TWI722887B (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN217577167U (en) * 2022-03-22 2022-10-14 天津市环智新能源技术有限公司 Blanking buffer storage table
CN114714526A (en) * 2022-04-01 2022-07-08 宁夏中欣晶圆半导体科技有限公司 Bonding method for two-dimensionally adjusting crystal orientation of single crystal silicon rod
CN114905647A (en) * 2022-05-13 2022-08-16 西安奕斯伟材料科技有限公司 Positioning device for positioning crystal bar to be subjected to wire cutting and wire cutting machine

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2013052350A1 (en) * 2011-10-05 2013-04-11 Memc Electronic Materials, Inc. Systems and methods for connecting an ingot to a wire saw
CN204196015U (en) * 2014-06-06 2015-03-11 云南蓝晶科技股份有限公司 Crystal bar axis positioning device
TWM515002U (en) * 2015-10-08 2016-01-01 Globalwafers Co Ltd Jig for angular orientation of ingot
WO2016068526A1 (en) * 2014-10-30 2016-05-06 한국생산기술연구원 Apparatus for monitoring processing state of wire saw and wire saw having same installed therein
TWI663033B (en) * 2018-05-11 2019-06-21 環球晶圓股份有限公司 Ingot fixing jig and method for using the same

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6106365A (en) * 1998-11-06 2000-08-22 Seh America, Inc. Method and apparatus to control mounting pressure of semiconductor crystals
DE10132503A1 (en) * 2001-07-05 2002-02-14 Wacker Siltronic Halbleitermat Wire saw to separate discs from work piece, e.g. to cut semiconductor wafers has work piece holder to fix work piece plate and adjusting unit to align work piece plate flush with work piece holder
CN105128162A (en) * 2015-09-24 2015-12-09 常州亿晶光电科技有限公司 Sapphire A direction orientating fixture
CN207190021U (en) * 2017-07-21 2018-04-06 山东大海新能源发展有限公司 Polycrystalline shear angle adjusting device for baffle
CN208215712U (en) * 2018-05-08 2018-12-11 安徽科瑞思创晶体材料有限责任公司 A kind of multi-direction adjusting bracket of crystal-cut
CN110065171B (en) * 2019-04-25 2021-12-24 西安奕斯伟材料科技有限公司 Cutting device and crystal bar cutting method

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2013052350A1 (en) * 2011-10-05 2013-04-11 Memc Electronic Materials, Inc. Systems and methods for connecting an ingot to a wire saw
CN204196015U (en) * 2014-06-06 2015-03-11 云南蓝晶科技股份有限公司 Crystal bar axis positioning device
WO2016068526A1 (en) * 2014-10-30 2016-05-06 한국생산기술연구원 Apparatus for monitoring processing state of wire saw and wire saw having same installed therein
TWM515002U (en) * 2015-10-08 2016-01-01 Globalwafers Co Ltd Jig for angular orientation of ingot
TWI663033B (en) * 2018-05-11 2019-06-21 環球晶圓股份有限公司 Ingot fixing jig and method for using the same

Also Published As

Publication number Publication date
CN110625836A (en) 2019-12-31
TW202116513A (en) 2021-05-01

Similar Documents

Publication Publication Date Title
TWI722887B (en) Ingot workpiece board, ingot slicing device and ingot slicing method
CN1977371A (en) Sheet peeling device and method
CN204277691U (en) Glass edge polishing machine glass whirligig
CN107283986A (en) Dyestripping film sticking apparatus and dyestripping method for adhering film
WO2023280201A1 (en) Manual ingot bonding method for 12-inch semiconductor wafer
CN107848092A (en) The cutting-off method of work support and workpiece
CN103434036A (en) Crystal rod orientation device
CN105066913B (en) The clamping-rotating device of belt pulley plane degree detection
CN1994713B (en) Crystal grain separation device and separation method thereof
CN207930506U (en) A kind of 6 inches sapphire crystal bar end face flat grinding jigs
KR101814505B1 (en) Film sticking apparatus having bubbles removal function
CN209079275U (en) Carcass transmits loop device
JP2008300534A (en) Thin-film forming apparatus and thin-film forming method
JP2012028702A (en) Semiconductor crystal fixing jig
CN110497432A (en) A kind of industrial robot composite fixture
JP2011127735A (en) Centering device and centering method for motor pulley
CN104485222A (en) Wire winding clamp needing pre-tightening force
CN206747463U (en) A kind of simple type steel wire drawing device
CN205957918U (en) Structural type copper wire wave form detects anchor clamps
CN218874819U (en) Bearing ring fixing frame convenient to adjust
CN217717563U (en) XRD is with rotatory sample platform
KR101236065B1 (en) Jig for fixing hydroforming formation and information acquisition apparatus for analyzing deformation rate of hydroforming formation having the same
CN204204630U (en) A kind of winding clamp requiring pretightning force
CN212301614U (en) Test fixture for manufacturing photoelectronic device
CN220054886U (en) Liquid crystal display production protection conveyer