CN212301614U

CN212301614U - Test fixture for manufacturing photoelectronic device

Info

Publication number: CN212301614U
Application number: CN202020210500.9U
Authority: CN
Inventors: 李博; 白庆雄
Original assignee: Shenzhen Jincaihong Photoelectric Technology Co ltd
Current assignee: Shenzhen Jincaihong Photoelectric Technology Co ltd
Priority date: 2020-02-25
Filing date: 2020-02-25
Publication date: 2021-01-05
Anticipated expiration: 2030-02-25

Abstract

The utility model discloses a test fixture for optoelectronic device makes, including the test fixture platform, side splint A, side splint B, objective table mechanism, be equipped with the test fixture platform on the test fixture that optoelectronic device made, the mesa top both sides edge symmetry of test fixture platform is equipped with side splint A and side splint B, bottom between side splint A and the side splint B is connected through adjusting threaded rod A, top central authorities at the mesa are equipped with objective table mechanism, objective table mechanism regulates and control the height of objective table through the adjusting threaded rod A of bottom, this test fixture platform reasonable in design, moreover, the steam generator is simple in structure, and convenient operation can carry out the centre gripping to optoelectronic device of equidimension not fixed, improve test fixture's application scope.

Description

Test fixture for manufacturing photoelectronic device

Technical Field

The utility model relates to a test fixture technical field that optoelectronic device made specifically is a test fixture for optoelectronic device makes.

Background

Various functional devices are made by using the electro-photon conversion effect. The design principle of the photoelectronic device is based on the change of the external field to the propagation mode of guided wave light, and the photoelectronic device is also different from the early-stage photoelectric devices.

The manufacturing industry of the optoelectronic devices in China realizes rapid development. Under the stimulation of continuously expanding the requirements of application fields such as optical communication, optical display and the like, the product yield is broken through, and the yield of the Chinese optoelectronic device in 2010 is broken through by 1100 hundred million.

Optoelectronic devices are key and core components of optoelectronic technology, are leading-edge research fields of modern optoelectronic technology and microelectronic technology, and are important components of information technology. The development of optoelectronic devices is very rapid, new technologies, new materials, new principles and new products are continuously adopted, various new devices are continuously developed, and the device performance is continuously improved. The device for detecting from visible light to dim light, infrared, ultraviolet and X-ray has wide spectrum area ranging from gamma ray to far infrared and even to submillimeter wave band, the detecting element detects from point to multi-point to two-dimensional imaging device, the number of pixels is more and more, and the resolving power is more and more. Through the integration process of micro-optical mechanical electronic technology, the size of the photoelectronic device is smaller and smaller, the integration level is higher and higher, various novel solid imaging devices are developed successfully continuously, and the traditional vacuum photoelectronic device is replaced in many aspects. With the demand of optical information technology, the frequency response of the detector is continuously improved.

At present, a plurality of photoelectronic device test clamps are basically special clamps, are not convenient enough to fix and have small application range.

SUMMERY OF THE UTILITY MODEL

An object of the utility model is to provide a can carry out the centre gripping to the photoelectronic device of equidimension not fixed, improve the test fixture's application scope for photoelectronic device makes to solve the problem of proposing among the above-mentioned background art.

In order to achieve the above object, the utility model provides a following technical scheme: a test fixture for manufacturing optoelectronic devices comprises a test fixture table, a side clamping plate A, a side clamping plate B and an object stage mechanism, wherein the test fixture table is provided with a plurality of side clamping plates A and B

The test fixture comprises a test fixture table, wherein a square frame-shaped support is arranged at the bottom of the test fixture table, a table top is arranged above the test fixture table, and the table top and the square frame-shaped support at the bottom of the test fixture table are of an integrated structure;

the side clamping plate A is provided with a clamping plate, side clamping plate roller mechanisms are symmetrically arranged at the bottom of the clamping plate close to two ends, a threaded rod A connecting groove is formed in the center of the bottom of the side clamping plate A, the side clamping plate A and the side clamping plate roller mechanisms at the bottom are of an integrated structure, and balls are arranged at two ends of the bottom of the side clamping plate A;

the side clamping plate B is provided with a clamping plate, side clamping plate roller mechanisms are symmetrically arranged at the bottom of the clamping plate close to two ends of the clamping plate, a threaded rod B connecting groove is formed in the center of the bottom of the side clamping plate B, the side clamping plate B and the side clamping plate roller mechanisms at the bottom are of an integrated structure, and balls are arranged at two ends of the bottom of the side clamping plate B;

the objective table mechanism is equipped with the objective table in the objective table mechanism, and the bottom of objective table is equipped with adjusting threaded rod B, adjusting threaded rod B and objective table mutually perpendicular, adopt swing joint between adjusting threaded rod B's the top and the objective table, adjusting threaded rod B's the other end is equipped with adjustment handle.

Preferably, the inside of mesa is close to both ends symmetry and is equipped with the spout, and the central authorities inside of mesa is equipped with adjusting threaded rod A mounting groove, the mesa is all run through to spout, adjusting threaded rod A mounting groove, side splint gyro wheel mechanism sets up the inside at the spout.

Preferably, the side splint roller mechanism forms an inverted T shape, and balls are arranged inside two ends of the bottom plate of the side splint roller mechanism.

Preferably, the screw thread of side splint A and the inside spread groove of side splint B bottom central threaded rod A is opposite, be equipped with adjusting threaded rod A in side splint A and the spread groove of side splint B bottom central threaded rod A, adjusting threaded rod A's one end is passed through annular bearing and is fixed at a side edge of mesa, and adjusting threaded rod A's the other end is equipped with the adjusting disk, side splint A is the non-slip surface with a side surface of side splint B.

Compared with the prior art, the beneficial effects of the utility model are that:

(1) the center above the table top is provided with an objective table mechanism, and the objective table mechanism is convenient for regulating and controlling the height of the objective table through a regulating threaded rod A at the bottom;

(2) the surface of one side of each of the side clamping plate A and the side clamping plate B is an anti-slip surface, so that the photoelectronic device is effectively prevented from sliding when being clamped, and a good clamping and fixing effect is achieved;

(3) the test fixture table is reasonable in design, simple in structure and convenient to operate, and can clamp and fix optoelectronic devices of different sizes, so that the application range of the test fixture is widened.

Drawings

FIG. 1 is a front view of the test fixture of the present invention;

FIG. 2 is a top view of the test fixture of the present invention;

FIG. 3 is a schematic view of the side clamping plate of the present invention;

fig. 4 is a schematic structural view of the objective table of the present invention.

In the figure: 1. a test fixture table; 2. a table top; 3. an object stage; 4. a side splint A; 5. an adjusting disk; 6. adjusting the threaded rod B; 7. an adjusting handle; 8. a side clamping plate roller mechanism; 9. a ball bearing; 10. a threaded rod A is connected with a groove; 11. a chute; 12. adjusting the threaded rod A; 13. an installation groove of the adjusting threaded rod A; 14. a side clamping plate B; 15. an objective table mechanism.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.

Referring to fig. 1-4, the present invention provides a technical solution: the utility model provides a test fixture for optoelectronic device makes, including test fixture platform 1, side splint A4, side splint B14, objective table mechanism 15, be equipped with test fixture platform 1 on the test fixture that optoelectronic device made, test fixture platform 1's bottom is equipped with square frame form support, test fixture platform 1's top is equipped with mesa 2, the inside of mesa 2 is close to both ends symmetry and is equipped with spout 11, the inside adjusting threaded rod A mounting groove 13 that is equipped with of mesa 2's central authorities, spout 11, adjusting threaded rod A mounting groove 13 all runs through the mesa, side splint gyro wheel mechanism 8 sets up the inside at spout 11, mesa 2 and the square frame form support of test fixture platform 1 bottom structure as an organic whole.

A side splint A4 and a side splint B14 are symmetrically arranged on the table-board 2, a splint is arranged on the side splint A4, side splint roller mechanisms 8 are symmetrically arranged at the bottom of the splint near both ends, a threaded rod A connecting groove 10 is arranged at the center of the bottom of the side splint A4, a side splint A4 and the bottom side splint roller mechanism 8 are symmetrically arranged, the threaded rod A connecting groove 10 is an integrated structure, balls 9 are arranged at both ends of the bottom of the side splint A4, a splint is arranged on the side splint B14, the side splint roller mechanisms 8 are symmetrically arranged at the bottom of the splint near both ends, a threaded rod B connecting groove is arranged at the center of the bottom of the side splint B14, the side splint B14 and the bottom side splint roller mechanism 8 are arranged in an inverted T shape, balls 9 are arranged inside both ends of the bottom plate of the side splint roller mechanism 8, the threaded rod B connecting groove is an integrated structure, balls 9 are, the ball 9 is used for reducing the friction between the side clamping plate roller mechanism 8 and the chute 11 in the table board 2.

The side splint A4 is opposite to the screw thread inside the central threaded rod connecting groove at the bottom of the side splint B14, an adjusting threaded rod A12 is arranged in the central threaded rod connecting groove at the bottom of the side splint A4 and the side splint B14, one end of the adjusting threaded rod A12 is fixed at one side edge of the table top 2 through a ring bearing, the other end of the adjusting threaded rod A12 is provided with an adjusting disc 5, one side surfaces of the side splint A4 and the side splint B14 are anti-skid surfaces, when the adjusting threaded rod A12 is manually adjusted clockwise, since the side clamp a4 is opposite the threads on the inside of the bottom central threaded rod attachment slot of the side clamp B14, the side clamp a4 is synchronously centered with the side clamp B14, when the adjustment threaded rod a12 is manually adjusted counterclockwise, since the side clamp plate a4 is opposite the threads on the inside of the bottom central threaded rod attachment slot of the side clamp plate B14, the side clamp plate a4 is moved away from both sides in unison with the side clamp plate B14.

Mesa 2's central authorities are equipped with objective table mechanism 15, be equipped with objective table 3 on the objective table mechanism 15, the bottom of objective table 3 is equipped with adjusting threaded rod B6, adjusting threaded rod B6 and objective table 3 mutually perpendicular, adopt swing joint between adjusting threaded rod B6's top and the objective table 3, adjusting threaded rod B6's the other end is equipped with adjustment handle 7, when adjusting threaded rod B6, the height that objective table mechanism 15 was regulated and control to manual rotatory adjustment handle 7.

The using method comprises the following steps: when the test fixture table 1 is used for clamping and fixing the optoelectronic device, the optoelectronic device is placed on the object stage 3, the height of the object stage 3 is adjusted and controlled by manually adjusting the adjusting threaded rod B6, and then the adjusting disc 5 is manually rotated clockwise to enable the side clamping plate A4 and the side clamping plate B14 to be close to each other, so that the optoelectronic device is clamped.

The test fixture table is reasonable in design, simple in structure and convenient to operate, and can clamp and fix optoelectronic devices of different sizes, so that the application range of the test fixture is widened.

Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.

Claims

1. A test fixture for optoelectronic device manufacturing, comprising a test fixture table (1), a side clamping plate A (4), a side clamping plate B (14), an object table mechanism (15), characterized in that: the above-mentioned

The test fixture comprises a test fixture table (1), wherein a square frame-shaped support is arranged at the bottom of the test fixture table (1), a table top (2) is arranged above the test fixture table (1), and the table top (2) and the square frame-shaped support at the bottom of the test fixture table (1) are of an integrated structure;

the side clamping plate A (4) is provided with a clamping plate, the bottom of the clamping plate is symmetrically provided with side clamping plate roller mechanisms (8) close to two ends, the center of the bottom of the side clamping plate A (4) is provided with a threaded rod A connecting groove (10), the side clamping plate A (4) and the bottom side clamping plate roller mechanisms (8) are of an integral structure, and two ends of the bottom of the side clamping plate A (4) are provided with rolling balls (9);

the side clamping plate B (14), clamping plates are arranged on the side clamping plate B (14), side clamping plate roller mechanisms (8) are symmetrically arranged at the bottom of each clamping plate close to two ends, a threaded rod B connecting groove is formed in the center of the bottom of each side clamping plate B (14), the side clamping plates B (14) and the side clamping plate roller mechanisms (8) at the bottom are integrated into a whole, and balls (9) are arranged at two ends of the bottom of each side clamping plate B (14);

objective table mechanism (15), be equipped with objective table (3) on objective table mechanism (15), the bottom of objective table (3) is equipped with adjusting threaded rod B (6), adjusting threaded rod B (6) and objective table (3) mutually perpendicular, adopt swing joint between the top of adjusting threaded rod B (6) and objective table (3), the other end of adjusting threaded rod B (6) is equipped with adjustment handle (7).

2. A test fixture for optoelectronic device fabrication as set forth in claim 1, wherein: the inside of mesa (2) is close to both ends symmetry and is equipped with spout (11), and the central authorities inside of mesa (2) is equipped with adjusting threaded rod A mounting groove (13), spout (11), adjusting threaded rod A mounting groove (13) all run through the mesa, side splint gyro wheel mechanism (8) set up the inside at spout (11).

3. A test fixture for optoelectronic device fabrication as set forth in claim 1, wherein: the side splint roller mechanism (8) is inverted T-shaped, and balls (9) are arranged inside two ends of a bottom plate of the side splint roller mechanism (8).

4. A test fixture for optoelectronic device fabrication as set forth in claim 1, wherein: the utility model discloses a table top, including side splint B (14), side splint A (4), regulation threaded rod A (12) are fixed at a side edge of mesa (2) through cyclic annular bearing, the other end of regulation threaded rod A (12) is equipped with adjusting disk (5), side splint A (4) are the non-slip surface with a side surface of side splint B (14).