TWI720769B - Test equipment and movably connected mechanism thereof - Google Patents
Test equipment and movably connected mechanism thereof Download PDFInfo
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- TWI720769B TWI720769B TW108148642A TW108148642A TWI720769B TW I720769 B TWI720769 B TW I720769B TW 108148642 A TW108148642 A TW 108148642A TW 108148642 A TW108148642 A TW 108148642A TW I720769 B TWI720769 B TW I720769B
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Abstract
Description
本發明係關於一種測試設備及其活動式連結機構,尤其是指一種利用固定連結組件與活動式連結組件來使兩個連接埠精準對接之測試設備及其活動式連結機構。 The present invention relates to a test equipment and a movable connection mechanism thereof, in particular to a test equipment and a movable connection mechanism thereof that use a fixed connection component and a movable connection component to accurately connect two connection ports.
在電子產品的製程中,通常會將製造出的電子產品進行一連串的檢測,以確保電子產品的功能與品質良好。其中,為了加強電性檢測的效率,通常會將電性檢測的功能性測試模組整合在一測試機台內,以使電子產品在透過測試機台檢測時,可以進行多種電性測試項目。 In the manufacturing process of electronic products, a series of tests are usually performed on the manufactured electronic products to ensure that the electronic products have good functions and quality. Among them, in order to enhance the efficiency of electrical testing, functional test modules for electrical testing are usually integrated in a testing machine, so that when electronic products are tested by the testing machine, various electrical test items can be performed.
承上所述,雖然現有的測試機台可以針對不同檢測項目來增減功能性測試模組,進而對電子產品進行多樣化的檢測,但功能性測試模組往往需要符合測試機台本身的電性連接裝置,當新增的功能性測試模組所使用的電性連接方式無法與測試機台預設的電性連結方式共通時,往往需要另外裝設其他電性連接介面來連 接欲進行測試的電子產品。舉例而言,現有的測試機台是透過預設的探針模組來電性連接測試載板的電性接點,但當新增的功能性測試模組僅能透過RF cable傳輸電子訊號,就無法透過測試機台預設的探針模組進行電性連接,需要外接RF cable來電性連接於電子產品,非常的不便利。 Continuing from the above, although existing test machines can add or remove functional test modules for different test items, and then perform diversified tests on electronic products, functional test modules often need to meet the electrical requirements of the test machine itself. The electrical connection device, when the electrical connection method used by the newly added functional test module cannot be shared with the electrical connection method preset by the test machine, it is often necessary to install other electrical connection interfaces to connect Connect the electronic products to be tested. For example, the existing test machine is electrically connected to the electrical contacts of the test carrier through the default probe module, but when the new functional test module can only transmit electronic signals through the RF cable, It cannot be electrically connected through the probe module preset in the test machine, and an external RF cable is needed to electrically connect to the electronic product, which is very inconvenient.
此外,雖然現有的測試機台也可以直接依據新增的功能性測試模組的傳輸規格來裝設新的連接器,但並非所有的電子產品都有上述新增的功能性測試模組的檢測需求,導致使用上仍需依據實際檢測項目常常拆裝特殊規格的連接器,也因此特殊規格的連接器很容易因為常常拆裝而增加調校對準的繁瑣步驟。 In addition, although existing test machines can also directly install new connectors according to the transmission specifications of the newly added functional test modules, not all electronic products have the above-mentioned new functional test modules to detect Due to the demand, it is still necessary to frequently disassemble and assemble the connectors of special specifications according to the actual test items. Therefore, the connectors of special specifications are easy to increase the cumbersome steps of adjustment and alignment due to the frequent disassembly and assembly.
有鑒於在先前技術中,由於現有的測試機台與測試載板是以固定的連接介面進行電性連接,因此當新增的功能性測試模組無法透過原有的連接介面進行連接時,往往需要另外接線,進而造成產品檢測時的不便;緣此,本發明的主要目的在於提供一種測試設備及其活動式連結機構,藉以配合現有的測試機台與測試載板之連接介面來增加新的電性連接介面。 In view of the fact that in the prior art, the existing test machine and the test carrier are electrically connected through a fixed connection interface. Therefore, when the newly added functional test module cannot be connected through the original connection interface, it is often Additional wiring is required, which will cause inconvenience during product testing. For this reason, the main purpose of the present invention is to provide a test equipment and a movable connection mechanism, so as to match the existing test machine and test carrier board connection interface to add new Electrical connection interface.
本發明為解決先前技術之問題,所採用的必要技術手段是提供一種測試設備,包含一測試機台、一測試載板以及一活動式連結機構。測試載板係可拆卸地組接於測試機台,並用以承置至少一電性待測物。 In order to solve the problems of the prior art, the necessary technical means adopted by the present invention is to provide a test equipment, which includes a test machine, a test carrier and a movable connection mechanism. The test carrier is detachably assembled to the test machine and used to hold at least one electrical object under test.
活動式連結機構包含一固定連結組件以及一活動式連結組件。固定連結組件係固設於測試機台,用以裝設至少一第一連接埠,且固定連結組件具有複數個定位柱,定位柱係設置於至少一第一連接埠之周圍,並分別沿一第一方向延伸。 The movable connecting mechanism includes a fixed connecting component and a movable connecting component. The fixed connection component is fixed on the testing machine to install at least one first connection port, and the fixed connection component has a plurality of positioning posts. The positioning posts are arranged around the at least one first connection port and are respectively arranged along a Extend in the first direction.
活動式連結組件包含一容置殼體以及一移動式限位塊。容置殼體係連結於測試載板,並具有一設置空間。 The movable connection assembly includes a housing shell and a movable limit block. The accommodating shell system is connected to the test carrier and has an installation space.
移動式限位塊係可滑移地被限位於設置空間內,用以固接至少一第二連接埠,且移動式限位塊開設有複數個對應於定位柱之導引通孔,導引通孔係位於至少一第二連接埠之周圍。 The movable limit block is slidably confined in the installation space for fixing at least one second connection port, and the movable limit block is provided with a plurality of guiding through holes corresponding to the positioning pillars to guide The through hole is located around the at least one second connection port.
其中,當測試載板沿一與第一方向相反之第二方向接近並組接於測試機台時,係藉由定位柱引導移動式限位塊帶動第二連接埠對準第一連接埠,進而使第二連接埠準確地與第一連接埠結合。 Wherein, when the test carrier board approaches and is assembled to the test machine in a second direction opposite to the first direction, the positioning column guides the movable limit block to drive the second connection port to align with the first connection port. In turn, the second connection port is accurately combined with the first connection port.
在上述必要技術手段所衍生之一附屬技術手段中,活動式連結組件更包含複數個彈性連接件,彈性連接件係固接於測試載板,並彈性連結於容置殼體。較佳者,每一彈性連接件包含一限位件以及一彈簧,限位件係穿設容置殼體而固接於測試載板。彈簧係穿設於限位件,並設置於容置殼體與測試載板之間,藉以使容置殼體沿第一方向可彈性復歸地連結於測試載板。 In one of the auxiliary technical means derived from the above-mentioned necessary technical means, the movable connecting assembly further includes a plurality of elastic connecting members, and the elastic connecting members are fixed to the test carrier and elastically connected to the accommodating shell. Preferably, each elastic connecting member includes a limiting member and a spring, and the limiting member is fixed to the test carrier through the accommodating shell. The spring passes through the limiting member and is arranged between the accommodating shell and the test carrier board, so that the accommodating shell can be flexibly connected to the test carrier board along the first direction.
在上述必要技術手段所衍生之一附屬技術手段中,測試機台包含一機台本體以及一待測物介面 (Device Under Test interface;DUT interface)。機台本體係具有一測試模組設置空間,係用以容置至少一測試模組。待測物介面係設置於機台本體之頂端,用以組接測試載板,且固定連結組件係設置於待測物介面。 In one of the auxiliary technical means derived from the above-mentioned necessary technical means, the test machine includes a machine body and an interface of the object to be tested (Device Under Test interface; DUT interface). The machine system has a test module setting space for accommodating at least one test module. The test object interface is arranged on the top of the machine body for assembling the test carrier board, and the fixed connection component is arranged on the test object interface.
在上述必要技術手段所衍生之一附屬技術手段中,活動式連結組件更包含一承接組件,係設置於容置殼體,並具有複數個滾子,滾子係局部伸入於設置空間,且移動式限位塊之一底部平面係抵接於滾子而實質垂直於第一方向,藉以使移動式限位塊可滑移地設置於設置空間內。 In one of the auxiliary technical means derived from the above-mentioned necessary technical means, the movable connecting component further includes a receiving component, which is arranged in the accommodating shell and has a plurality of rollers, and the rollers partially extend into the installation space, and A bottom plane of the movable limit block abuts against the roller and is substantially perpendicular to the first direction, so that the movable limit block can be slidably arranged in the installation space.
在上述必要技術手段所衍生之一附屬技術手段中,測試載板包含一載板本體以及一固定架。載板本體係具有相對設置之一組接面與一承置面,組接面係用以可拆卸地組接於測試機台,承置面係用以承置至少一電性待測物。固定架係固定於組接面,並固接活動式連結組件。 In one of the auxiliary technical means derived from the above necessary technical means, the test carrier includes a carrier body and a fixing frame. The carrier board has a set of connecting surfaces and a bearing surface arranged oppositely. The connecting surface is used to detachably connect to the testing machine, and the bearing surface is used to hold at least one electrical object under test. The fixing frame is fixed on the assembly surface and fixedly connected with the movable connecting component.
在上述必要技術手段所衍生之一附屬技術手段中,每一定位柱具有一導引結構,當測試載板沿第二方向接近並組接於測試機台時,係藉由導引結構接觸導引通孔而引導移動式限位塊帶動第二連接埠對準第一連接埠。 In one of the auxiliary technical means derived from the above-mentioned necessary technical means, each positioning column has a guiding structure. When the test carrier is approached in the second direction and assembled to the testing machine, the guiding structure is contacted and guided. The through hole is guided to guide the movable limit block to drive the second connection port to align with the first connection port.
如上所述,由於本發明之測試設備及其活動式連結機構是將固定連結組件與活動式連結組件分別設置於測試機台與測試載板上,因此當測試載板組接於測試機台時,固定連結組件與活動式連結組件會一同連 接,進而使現有的測試機台與測試載板可以同時進行其他連接介面不同的功能性測試。 As mentioned above, since the test equipment and the movable connection mechanism of the present invention are to install the fixed connection component and the movable connection component on the test machine and the test carrier respectively, when the test carrier is assembled on the test machine , Fixed link components and movable link components will be connected together Connect, so that the existing test machine and test carrier board can perform other functional tests with different connection interfaces at the same time.
本發明所採用的具體實施例,將藉由以下之實施例及圖式作進一步之說明。 The specific embodiments adopted in the present invention will be further explained by the following embodiments and drawings.
100‧‧‧測試設備 100‧‧‧Test equipment
1‧‧‧測試機台 1‧‧‧Testing machine
11‧‧‧機台本體 11‧‧‧Machine body
12‧‧‧待測物介面 12‧‧‧Object under test interface
121、122‧‧‧電性連接區 121, 122‧‧‧Electrical connection area
123‧‧‧擴充測試區 123‧‧‧Expand the test area
124‧‧‧固定框架 124‧‧‧Fixed frame
2‧‧‧測試載板 2‧‧‧Test Carrier Board
21‧‧‧載板本體 21‧‧‧Carrier board body
211‧‧‧組接面 211‧‧‧Group junction
212‧‧‧承置面 212‧‧‧Supporting surface
22、23‧‧‧手把 22、23‧‧‧Handle
24‧‧‧固定架 24‧‧‧Fixed frame
3‧‧‧活動式連結機構 3‧‧‧Mobile link mechanism
31‧‧‧固定連結組件 31‧‧‧Fixed connection components
311‧‧‧固定基座 311‧‧‧Fixed base
3111‧‧‧連結底座 3111‧‧‧Connect the base
3112、3113‧‧‧固定板 3112、3113‧‧‧Fixed plate
312、313‧‧‧定位柱 312、313‧‧‧Positioning column
3121‧‧‧導引結構 3121‧‧‧Guiding structure
32‧‧‧活動式連結組件 32‧‧‧ Movable link assembly
321‧‧‧容置殼體 321‧‧‧Containing shell
3211‧‧‧底殼 3211‧‧‧Bottom shell
32111‧‧‧組接穿孔 32111‧‧‧Assembly perforation
32112、32113、32123、32124‧‧‧定位柱穿設孔 32112, 32113, 32123, 32124‧‧‧Positioning post hole
32114‧‧‧承接件設置孔 32114‧‧‧Socket setting hole
32115、32121‧‧‧限位孔 32115、32121‧‧‧Limiting hole
3212‧‧‧上蓋 3212‧‧‧Upper cover
32121‧‧‧限位孔 32121‧‧‧Limiting hole
32122‧‧‧連接埠穿設孔 32122‧‧‧Port through hole
322‧‧‧彈性連接件 322‧‧‧flexible connector
3221‧‧‧限位件 3221‧‧‧Limiting piece
3222‧‧‧彈簧 3222‧‧‧Spring
323‧‧‧承接組件 323‧‧‧Undertake components
3231‧‧‧滾子 3231‧‧‧roller
32311‧‧‧滾子本體 32311‧‧‧Roller body
323111‧‧‧卡緣 323111‧‧‧Card edge
32312‧‧‧滾動元件 32312‧‧‧Rolling elements
324‧‧‧移動式限位塊 324‧‧‧Mobile limit block
3241‧‧‧底部平面 3241‧‧‧Bottom plane
3242‧‧‧連接埠穿孔 3242‧‧‧Port perforation
3243、3244‧‧‧導引通孔 3243、3244‧‧‧Guide through hole
SS‧‧‧設置空間 SS‧‧‧Setup space
200‧‧‧電性待測物 200‧‧‧Electrical DUT
300‧‧‧第一連接埠 300‧‧‧First port
400‧‧‧第二連接埠 400‧‧‧Second port
D1‧‧‧第一方向 D1‧‧‧First direction
D2‧‧‧第二方向 D2‧‧‧Second direction
C1、C2‧‧‧軸心 C1, C2‧‧‧Axis
d1、d2‧‧‧中心間距 d1, d2‧‧‧center distance
d3‧‧‧內外徑差 d3‧‧‧Difference between inner and outer diameter
第一圖係顯示本發明較佳實施例所提供之測試設備之立體分解示意圖; The first figure is a three-dimensional exploded schematic diagram showing the testing equipment provided by the preferred embodiment of the present invention;
第二圖係顯示本發明較佳實施例所提供之測試機台與固定連結組件之平面示意圖; The second figure is a schematic plan view showing the testing machine and the fixed connection components provided by the preferred embodiment of the present invention;
第三圖係顯示本發明較佳實施例所提供之測試設備另一視角之立體分解示意圖; The third figure is a three-dimensional exploded schematic diagram showing the testing equipment provided by the preferred embodiment of the present invention from another perspective;
第四圖係顯示本發明較佳實施例所提供之固定連結組件之立體示意圖; The fourth figure is a three-dimensional schematic diagram showing the fixed connection component provided by the preferred embodiment of the present invention;
第五圖係顯示本發明較佳實施例所提供之活動式連結組件之立體示意圖; Figure 5 is a three-dimensional schematic diagram showing the movable connection assembly provided by the preferred embodiment of the present invention;
第六圖係顯示本發明較佳實施例所提供之活動式連結組件之立體分解示意圖; The sixth figure is a three-dimensional exploded schematic diagram showing the movable connection assembly provided by the preferred embodiment of the present invention;
第七圖係顯示本發明較佳實施例所提供之活動式連結組件另一視角之立體分解示意圖; The seventh figure is a three-dimensional exploded schematic diagram showing the movable connection assembly provided by the preferred embodiment of the present invention from another perspective;
第八圖係顯示本發明較佳實施例所提供之測試載板與活動式連結組件之立體分解示意圖; The eighth figure is a three-dimensional exploded schematic diagram showing the test carrier board and the movable connection assembly provided by the preferred embodiment of the present invention;
第九圖係為第八圖之A-A剖面示意圖; The ninth figure is a schematic diagram of the A-A section of the eighth figure;
第十圖係顯示本發明較佳實施例所提供之測試載板帶動 活動式連結組件組接於固定連結組件部分放大剖面示意圖; The tenth figure shows the test carrier provided by the preferred embodiment of the present invention. An enlarged cross-sectional schematic diagram of a part of the movable connection assembly connected to the fixed connection assembly;
第十一圖係顯示本發明較佳實施例所提供之定位柱之導引結構接觸到導引通孔來帶動移動式限位塊移動之部分放大剖面示意圖;以及 The eleventh figure is a partial enlarged cross-sectional schematic diagram showing that the guiding structure of the positioning post provided by the preferred embodiment of the present invention contacts the guiding through hole to drive the movable limit block to move; and
第十二圖係顯示在本發明較佳實施例中,透過定位柱與移動式限位塊之配合而使第二連接埠結合於第一連接埠之部分放大剖面示意圖。 Figure 12 is a schematic diagram showing a partial enlarged cross-sectional view of the second connection port being combined with the first connection port through the cooperation of the positioning post and the movable limit block in the preferred embodiment of the present invention.
請參閱第一圖至第四圖,第一圖係顯示本發明較佳實施例所提供之測試設備之立體分解示意圖;第二圖係顯示本發明較佳實施例所提供之測試機台與固定連結組件之平面示意圖;第三圖係顯示本發明較佳實施例所提供之測試設備另一視角之立體分解示意圖;第四圖係顯示本發明較佳實施例所提供之固定連結組件之立體示意圖。 Please refer to the first to fourth figures. The first figure shows a three-dimensional exploded schematic diagram of the test equipment provided by the preferred embodiment of the present invention; the second figure shows the test machine and fixing provided by the preferred embodiment of the present invention A schematic plan view of the connecting assembly; the third figure is a perspective exploded schematic view showing another view of the testing equipment provided by the preferred embodiment of the present invention; the fourth figure is a perspective schematic view showing the fixed connecting assembly provided by the preferred embodiment of the present invention .
如第一圖至第四圖所示,一種測試設備100包含一測試機台1、一測試載板2以及一活動式連結機構3。
As shown in the first to fourth figures, a
測試機台1包含一機台本體11以及一待測物介面(Device Under Test interface;DUT interface)12。機台本體11實際上具有一測試模組設置空間(圖未示),以利用測試模組設置空間來容置測試模組。待測物介面12係設置於機台本體11之頂端,用以組接測試載板
2,且待測物介面12還包含了二電性連接區121與122、一擴充測試區123以及一固定框架124;在本實施例中,二電性連接區121與122內設有多個探針連接器,且二電性連接區121與122是透過真空吸附的方式來使待測物之電性接點抵接於探針連接器,而擴充測試區123是位於二電性連接區121與122之間,且擴充測試區123為凹槽結構,用以供使用者選擇性加裝其他測試連接器。固定框架124是固定於擴充測試區123內,用以固定加裝的測試連接器。
The
測試載板2包含一載板本體21、二手把22與23以及一固定架24。載板本體21係具有相對設置之一組接面211與一承置面212,組接面211是用來可拆卸地組接於測試機台1之待測物介面12,而承置面212是用來承置一電性待測物200。二手把22與23是分別固接於承置面212,藉以供使用者透過二手把22與23來將整個測試載板2搬移至待測物介面12上。固定架24是固定於組接面211。需補充說明的是,雖然在本實施例中,電性待測物200是設置於承置面212,但在實際使用上,組接面211亦裝設有用來電性連接電性連接區121與122的電路板等電性連接件,而電性待測物200是電性連結於這些電性連接件;換句話說,載板本體21之組接面211設置有常態連接電性連接區121與122的電性連接件,而承置面212則是用來承置替換性的電性待測物200,藉以使電性待測物200可以透過設置於組接面211之電性連接件電性連結於電性連接區121與122之探針連接器。
The
如第一圖、第二圖、第三圖以及第四圖所示,活動式連結機構3包含一固定連結組件31以及一活動式連結組件32。固定連結組件31包含一固定基座311以及八個定位柱312與313(圖中僅標示兩個)。固定基座311包含一連結底座3111以及二固定板3112與3113。連結底座3111是固定於測試機台1之待測物介面12,而固定板3112與3113是鎖固於連結底座3111,並自固定框架124中露出;其中,每一固定板3112與3113皆裝設有二個第一連接埠300。
As shown in the first, second, third, and fourth figures, the movable connecting
定位柱312與313是固定於固定板3112,並位於第一連接埠300之兩側,且定位柱312與313皆分別自固定板3112沿一第一方向D1沿伸;在本實施例中,每個第一連接埠300之兩側皆分別設有定位柱312與313,然而在其他實施例中則不限於兩側,只要每個第一連接埠300之周圍設有兩個以上的定位柱312與313即可。此外,以定位柱312為例,定位柱312還具有一導引結構3121;在本實施例中,導引結構3121為一朝第一方向D1漸縮之錐狀結構。
The positioning posts 312 and 313 are fixed to the
請參閱第三圖至第七圖,第五圖係顯示本發明較佳實施例所提供之活動式連結組件之立體示意圖;第六圖係顯示本發明較佳實施例所提供之活動式連結組件之立體分解示意圖;第七圖係顯示本發明較佳實施例所提供之活動式連結組件另一視角之立體分解示意圖。如第三圖、第五圖至第七圖所示,活動式連結組件32包含一容置殼體321、四個彈性連接件322(圖中僅標
示一個)、一承接組件323以及四個移動式限位塊324(圖中僅標示一個)。
Please refer to the third to seventh figures. The fifth figure is a three-dimensional schematic diagram showing the movable connecting assembly provided by the preferred embodiment of the present invention; the sixth figure shows the movable connecting assembly provided by the preferred embodiment of the present invention A three-dimensional exploded schematic view; Figure 7 is a three-dimensional exploded schematic view showing the movable connection assembly provided by the preferred embodiment of the present invention from another perspective. As shown in the third and fifth to seventh figures, the movable connecting
容置殼體321包含一底殼3211與一上蓋3212。底殼3211具有一設置空間SS,且底殼3211開設有四個組接穿孔32111(圖中僅標示一個)、八個定位柱穿設孔32112與32113(圖中僅標示兩個)、十六個承接件設置孔32114(圖中僅標示一個)以及四個限位孔32115(圖中僅標示一個)。
The
四個組接穿孔32111是分別對應於四個第一連接埠300,而八個定位柱穿設孔32112與32113是位於每一組接穿孔32111之兩側,且八個定位柱穿設孔32112與32113是分別對應於八個定位柱312與313。十六個承接件設置孔32114是分別設置於四個組接穿孔32111之周圍,在本實施例中,每一個組接穿孔32111之四周各有一個承接件設置孔32114。四個限位孔32115是分散設置於底殼3211之四個角落。其中,上述之組接穿孔32111、定位柱穿設孔32112與32113、承接件設置孔32114以及限位孔32115皆沿第一方向D1貫通至設置空間SS。此外,限位孔32115之底側為四邊形穿孔,而頂側為圓形穿孔。
The four connecting
上蓋3212是固接於底殼3211,且上蓋3212開設有四個限位孔32121(圖中僅標示一個)、四個連接埠穿設孔32122(圖中僅標示一個)以及八個定位柱穿設孔32123與32124。在上蓋3212固接於底殼3211時,四個限位孔32121是分別對應地連通於四個限位孔32115之頂側,四個連接埠穿設孔32122是分別對應於四個組接穿孔
32111,八個定位柱穿設孔32123與32124是分別對應於八個定位柱穿設孔32112與32113。
The
彈性連接件322包含一限位件3221以及一彈簧3222,限位件3221係穿設於限位孔32115與限位孔32121,並固接於測試載板2之固定架24與載板本體21。彈簧3222是穿設於限位件3221,並設置於上蓋3212與固定架24之間,藉以使容置殼體321沿第一方向D1可彈性復歸地連結於測試載板2。其中,限位件3221實際上例如為一螺件,當限位件3221穿入限位孔32115,並自限位孔32121穿出而抵接於固定架24時,使用者可以自承置面212鎖接住限位件3221,而限位件3221位於限位孔32115之底側處的螺帽端則可因為限位孔32115之底側為四邊形穿孔而防止在鎖接於測試載板2時轉動。
The elastic connecting
承接組件323包含十六個滾子3231(圖中僅標示一個),滾子3231包含一滾子本體32311與一滾動元件32312,滾子本體32311是分別設置於底殼3211之承接件設置孔32114,且滾子本體32311具有一卡緣323111,藉以使滾子本體32311在設置空間SS內被塞設卡底於承接件設置孔32114。滾動元件32312是可滾動地嵌設於滾子本體32311內,並局部伸入設置空間SS。其中,滾動元件32312例如為滾珠,但不限於此。
The receiving
移動式限位塊324是用以固接一第二連接埠400,且移動式限位塊324具有一底部平面3241,並開設有一連接埠穿孔3242以及二導引通孔3243與3244。底部平面3241是抵接於滾子3231之滾動元件32312,且底部
平面3241是實質垂直於第一方向D1,藉以使移動式限位塊324可滑移地被限位於設置空間SS內。連接埠穿孔3242是對應於組接穿孔32111,而導引通孔3243與3244是分別沿第一方向D1延伸而貫通至底部平面3241,且第二連接埠400是自連接埠穿孔3242沿第二方向D2沿伸而露出移動式限位塊324。導引通孔3243與3244是設置於連接埠穿孔3242之兩側,並對應於定位柱312與313。
The
請繼續參閱第八圖至第十二圖,第八圖係顯示本發明較佳實施例所提供之測試載板與活動式連結組件之立體分解示意圖;第九圖係為第八圖之A-A剖面示意圖;第十圖係顯示本發明較佳實施例所提供之測試載板帶動活動式連結組件組接於固定連結組件部分放大剖面示意圖;第十一圖係顯示本發明較佳實施例所提供之定位柱之導引結構接觸到導引通孔來帶動移動式限位塊移動之部分放大剖面示意圖;第十二圖係顯示在本發明較佳實施例中,透過定位柱與移動式限位塊之配合而使第二連接埠結合於第一連接埠之部分放大剖面示意圖。 Please continue to refer to the eighth to the twelfth figure. The eighth figure shows the three-dimensional exploded schematic diagram of the test carrier and the movable connection assembly provided by the preferred embodiment of the present invention; the ninth figure is the AA cross-section of the eighth figure Schematic diagram; the tenth figure is a partial enlarged cross-sectional schematic diagram showing the test carrier board provided by the preferred embodiment of the present invention to drive the movable link assembly to the fixed link assembly; the eleventh figure is the partial enlarged cross-sectional view showing the test carrier provided by the preferred embodiment of the present invention A partial enlarged cross-sectional schematic diagram of the guide structure of the positioning post contacting the guide through hole to drive the movable limit block to move; the twelfth figure shows the preferred embodiment of the present invention through the positioning post and the movable limit block The partial enlarged cross-sectional schematic diagram of the second connection port being combined with the first connection port by the cooperation.
如第一圖、第四圖、第六圖、第七圖至第十二圖所示,當測試載板2沿第二方向D2接近並組接於測試機台1時,即使定位柱312之軸心C1與導引通孔3243之軸心C2原先並未對準,透過測試載板2持續沿第二方向D2移動,定位柱312之導引結構3121會在接觸到導引通孔3243時推動移動式限位塊324而使導引通孔3243對準定位柱312,此時由於第一連接埠300與定位柱312及
313之中心間距d1等於第二連接埠400與導引通孔3243及3244之中心間距d2,因此被定位柱312帶動的移動式限位塊324會一同帶動第二連接埠400對準第一連接埠300,進而使第二連接埠400準確地與第一連接埠300結合。需特別說明的是,在本實施例中,本發明是利用四個移動式限位塊324被限位於設置空間SS內,進而使中心間距d1與中心間距d2之差距小於導引結構3121之導引斜面範圍,意即中心間距d1與中心間距d2之差距需小於導引結構3121之內外徑差d3(標示於定位柱313之導引結構),藉此,才能有效地透過導引結構3121之導引斜面來帶動移動式限位塊324移動。
As shown in the first, fourth, sixth, seventh to twelfth figures, when the
此外,由於容置殼體321是透過彈性連接件322彈性連結於測試載板2,因此活動式連結組件32與固定連結組件31結合時,容置殼體321可以藉由彈性連接件322彈性的往第一方向D1壓縮而吸收第一連接埠300與第二連接埠400組接時的力道。
In addition, since the
綜上所述,相較於現有的測試機台與測試載板是以固定的連接介面進行電性連接,無法供其他連接規格的測試模組共用連接介面,導致產品檢測時的不便;本發明所提供之測試設備及其活動式連結機構,主要是將固定連結組件固接於測試機台上,並將活動式連結組件設置測試載板上,因此可以透過固定連結組件之定位柱與活動式連結組件之移動式限位塊之間的配合,使設置於活動式連結組件之第二連接埠可以受到定位柱之導引而對準第一連接埠,有效的增進檢測上的效率。 In summary, compared with the existing test machine and the test carrier board that are electrically connected with a fixed connection interface, the connection interface cannot be shared by test modules of other connection specifications, which results in inconvenience during product testing; the present invention The provided test equipment and its movable connection mechanism are mainly to fix the fixed connection component on the test machine, and set the movable connection component on the test carrier board, so the positioning post and movable type of the fixed connection component can be used. The cooperation between the movable limit blocks of the connecting component enables the second connection port provided on the movable connecting component to be guided by the positioning column to align with the first connection port, which effectively improves the efficiency of detection.
此外,由於本發明之活動式連結組件是讓移動式限位塊可滑移的設置於設置空間內,因此即使設有第二連接埠之移動式限位塊因為檢測上的需求而進行多次的拆裝,也可透過定位柱帶動移動式限位塊滑移來使第二連接埠對準第一連接埠,藉以在多次拆裝時可以減少調校對準的繁瑣步驟。 In addition, because the movable connection assembly of the present invention allows the movable limit block to be slidably arranged in the installation space, even the movable limit block with the second connection port is required to perform multiple inspections. In the disassembly and assembly, the positioning post can also be used to drive the movable limit block to slide to align the second connection port with the first connection port, thereby reducing the cumbersome steps of adjustment and alignment during multiple disassembly and assembly.
藉由以上較佳具體實施例之詳述,係希望能更加清楚描述本發明之特徵與精神,而並非以上述所揭露的較佳具體實施例來對本發明之範疇加以限制。相反地,其目的是希望能涵蓋各種改變及具相等性的安排於本發明所欲申請之專利範圍的範疇內。 Through the detailed description of the above preferred embodiments, it is hoped that the characteristics and spirit of the present invention can be described more clearly, and the scope of the present invention is not limited by the preferred embodiments disclosed above. On the contrary, its purpose is to cover various changes and equivalent arrangements within the scope of the patent for which the present invention is intended.
100‧‧‧測試設備 100‧‧‧Test equipment
1‧‧‧測試機台 1‧‧‧Testing machine
11‧‧‧機台本體 11‧‧‧Machine body
12‧‧‧待測物介面 12‧‧‧Object under test interface
121、122‧‧‧電性連接區 121, 122‧‧‧Electrical connection area
123‧‧‧擴充測試區 123‧‧‧Expand the test area
124‧‧‧固定框架 124‧‧‧Fixed frame
2‧‧‧測試載板 2‧‧‧Test Carrier Board
21‧‧‧載板本體 21‧‧‧Carrier board body
212‧‧‧承置面 212‧‧‧Supporting surface
22、23‧‧‧手把 22、23‧‧‧Handle
3‧‧‧活動式連結機構 3‧‧‧Mobile link mechanism
31‧‧‧固定連結組件 31‧‧‧Fixed connection components
32‧‧‧活動式連結組件 32‧‧‧ Movable link assembly
200‧‧‧電性待測物 200‧‧‧Electrical DUT
D1‧‧‧第一方向 D1‧‧‧First direction
D2‧‧‧第二方向 D2‧‧‧Second direction
Claims (10)
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Citations (5)
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EP0699913B1 (en) * | 1994-09-01 | 2004-05-26 | Teradyne, Inc. | Interface apparatus for automatic test equipment |
TWM375883U (en) * | 2009-06-10 | 2010-03-11 | Chroma Ate Inc | Positioning apparatus used in testing equipment |
WO2013009817A1 (en) * | 2011-07-12 | 2013-01-17 | Intest Corporation | Method and apparatus for docking a test head with a peripheral |
TW201511172A (en) * | 2013-09-13 | 2015-03-16 | King Yuan Electronics Co Ltd | Floating buffer mechanism for electronic component testing socket |
TW201625957A (en) * | 2015-01-13 | 2016-07-16 | 京元電子股份有限公司 | Connecting mechanism for semiconductor testing device |
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2019
- 2019-12-31 TW TW108148642A patent/TWI720769B/en active
Patent Citations (5)
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EP0699913B1 (en) * | 1994-09-01 | 2004-05-26 | Teradyne, Inc. | Interface apparatus for automatic test equipment |
TWM375883U (en) * | 2009-06-10 | 2010-03-11 | Chroma Ate Inc | Positioning apparatus used in testing equipment |
WO2013009817A1 (en) * | 2011-07-12 | 2013-01-17 | Intest Corporation | Method and apparatus for docking a test head with a peripheral |
TW201511172A (en) * | 2013-09-13 | 2015-03-16 | King Yuan Electronics Co Ltd | Floating buffer mechanism for electronic component testing socket |
TW201625957A (en) * | 2015-01-13 | 2016-07-16 | 京元電子股份有限公司 | Connecting mechanism for semiconductor testing device |
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