TWI720737B - Microcontroller circuit and control method thereof - Google Patents

Microcontroller circuit and control method thereof Download PDF

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TWI720737B
TWI720737B TW108145917A TW108145917A TWI720737B TW I720737 B TWI720737 B TW I720737B TW 108145917 A TW108145917 A TW 108145917A TW 108145917 A TW108145917 A TW 108145917A TW I720737 B TWI720737 B TW I720737B
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charging
signal
value
capacitor
microcontroller circuit
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TW108145917A
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TW202125468A (en
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張圖尹
李文益
蔡德宗
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新唐科技股份有限公司
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    • GPHYSICS
    • G09EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09GARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/34Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
    • G09G3/36Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using liquid crystals
    • GPHYSICS
    • G09EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09GARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/34Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
    • G09G3/36Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using liquid crystals
    • G09G3/3611Control of matrices with row and column drivers
    • G09G3/3622Control of matrices with row and column drivers using a passive matrix

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  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Control Of Indicators Other Than Cathode Ray Tubes (AREA)
  • Liquid Crystal Display Device Control (AREA)

Abstract

A microcontroller circuit controlling a display panel and including a memory, a CPU, an image driver, a charge pump and a control circuit is provided. The memory is configured to store a program code. The CPU executes the program code to generate an image driving signal. The image driver receives an operation voltage and drives the display panel according to the image driving signal. The charge pump charges a capacitor according to a charging signal. The voltage of the capacitor serves as the operation voltage. The control circuit generates the charging signal according to the operation voltage. In a normal mode, the control circuit determines whether the charge time of the capacitor exceeds a charging standard value. When the charge time of the capacitor exceeds the charging standard value, the CPU executes a detection procedure of the program code.

Description

微控制器電路及控制方法Microcontroller circuit and control method

本發明係有關於一種微控制器電路,特別是有關於一種用以驅動一顯示面板的微控制器電路。The present invention relates to a microcontroller circuit, in particular to a microcontroller circuit for driving a display panel.

在一般的顯示裝置中,通常具有一顯示面板以及一微控制器電路。微控制器電路用以產生一影像信號。顯示面板根據影像信號而呈現畫面。在組裝顯示面板與微控制器電路時,顯示面板的兩相鄰接腳可能發生短路,因而無法正常地呈現畫面。另外,當顯示面板的尺寸過大時,微控制器電路所產生的影像信號可能不足以驅動顯示面板,因而使得顯示面板無法正常地呈現畫面。然而,在顯示面板無法正常地呈現畫面時,測試人員無法立即得知異常出現的原因,而需要花費許多時間進行檢測。In a general display device, there is usually a display panel and a microcontroller circuit. The microcontroller circuit is used to generate an image signal. The display panel presents a picture according to the image signal. When assembling the display panel and the microcontroller circuit, two adjacent pins of the display panel may be short-circuited, so that the picture cannot be displayed normally. In addition, when the size of the display panel is too large, the image signal generated by the microcontroller circuit may not be sufficient to drive the display panel, so that the display panel cannot display images normally. However, when the display panel cannot display the picture normally, the tester cannot immediately know the cause of the abnormality, and it takes a lot of time to detect.

本發明提供一種微控制器電路,用以控制一顯示面板,並包括一記憶體、一中央處理器、一影像驅動器、一電荷幫浦以及一控制電路。記憶體用以儲存一程式碼。中央處理器執行程式碼,用以產生一影像驅動信號。影像驅動器接收一操作電壓,並根據影像驅動信號驅動顯示面板。電荷幫浦根據一充電信號,對一電容充電。電容的電壓作為操作電壓。控制電路根據操作電壓,產生充電信號。在一正常模式下,控制電路判斷電容的充電時間是否大於一充電標準值。當電容的充電時間大於充電標準值時,中央處理器執行該程式碼的一檢測程序。The present invention provides a microcontroller circuit for controlling a display panel, and includes a memory, a central processing unit, an image driver, a charge pump, and a control circuit. The memory is used to store a program code. The central processing unit executes the program code to generate an image driving signal. The image driver receives an operating voltage and drives the display panel according to the image driving signal. The charge pump charges a capacitor according to a charging signal. The voltage of the capacitor is used as the operating voltage. The control circuit generates a charging signal according to the operating voltage. In a normal mode, the control circuit determines whether the charging time of the capacitor is greater than a charging standard value. When the charging time of the capacitor is greater than the charging standard value, the central processing unit executes a detection procedure of the program code.

本發明更提供一種控制方法,適用於一微控制器電路中。微控制器電路耦接一顯示面板。本發明之控制方法包括,執行一程式碼,用以產生一影像驅動信號;對一電容充電,其中電容的電壓作為一操作電壓;提供操作電壓予一影像驅動器,其中影像驅動器根據影像驅動信號驅動顯示面板;以及判斷電容的充電時間是否大於一充電標準值。當電容的充電時間大於充電標準值時,執行程式碼的一檢測程序。The present invention further provides a control method, which is suitable for a microcontroller circuit. The microcontroller circuit is coupled to a display panel. The control method of the present invention includes: executing a program code to generate an image driving signal; charging a capacitor, where the voltage of the capacitor is used as an operating voltage; providing an operating voltage to an image driver, where the image driver is driven according to the image driving signal Display panel; and judging whether the charging time of the capacitor is greater than a charging standard value. When the charging time of the capacitor is greater than the charging standard value, a detection procedure of the program code is executed.

本發明之控制方法可經由本發明之微控制器電路來實作,其為可執行特定功能之硬體或韌體,亦可以透過程式碼方式收錄於一紀錄媒體中,並結合特定硬體來實作。當程式碼被電子裝置、處理器、電腦或機器載入且執行時,電子裝置、處理器、電腦或機器變成用以實行本發明之微控制器電路。The control method of the present invention can be implemented by the microcontroller circuit of the present invention, which is a hardware or firmware that can perform specific functions, or it can be recorded in a recording medium by means of program codes and combined with specific hardware. Implementation. When the program code is loaded and executed by an electronic device, processor, computer, or machine, the electronic device, processor, computer, or machine becomes a microcontroller circuit for implementing the present invention.

為讓本發明之目的、特徵和優點能更明顯易懂,下文特舉出實施例,並配合所附圖式,做詳細之說明。本發明說明書提供不同的實施例來說明本發明不同實施方式的技術特徵。其中,實施例中的各元件之配置係為說明之用,並非用以限制本發明。另外,實施例中圖式標號之部分重覆,係為了簡化說明,並非意指不同實施例之間的關聯性。In order to make the purpose, features and advantages of the present invention more comprehensible, embodiments are specifically cited below, and detailed descriptions are made in conjunction with the accompanying drawings. The specification of the present invention provides different examples to illustrate the technical features of different embodiments of the present invention. Among them, the configuration of each element in the embodiment is for illustrative purposes, and is not intended to limit the present invention. In addition, part of the repetition of the drawing symbols in the embodiments is for simplifying the description, and does not mean the relevance between different embodiments.

第1圖為本發明之顯示裝置的示意圖。如圖所示,顯示裝置100包括一顯示面板110以及一微控制器電路120。本發明並不限定顯裝置100的種類。在一可能實施例中,顯示裝置100係為具有顯示功能的電子裝置,如電子錶。Figure 1 is a schematic diagram of the display device of the present invention. As shown in the figure, the display device 100 includes a display panel 110 and a microcontroller circuit 120. The present invention does not limit the type of the display device 100. In a possible embodiment, the display device 100 is an electronic device with a display function, such as an electronic watch.

顯示面板110根據一影像信號S I呈現一畫面。本發明並不限定顯示裝置110的種類。在一可能實施例中,顯示面板110係為一液晶顯示面板(LCD panel),如一扭曲向列式(twisted nematic;TN)液晶顯示面板或是一超級扭曲向列式(supper-twisted nematic;STN)液晶顯示面板。在其它實施例中,顯示面板110係為一被動矩陣式液晶顯示面板。 The display panel 110 presents a frame according to an image signal S I. The invention does not limit the type of the display device 110. In a possible embodiment, the display panel 110 is a liquid crystal display panel (LCD panel), such as a twisted nematic (TN) liquid crystal display panel or a super-twisted nematic (STN) liquid crystal display panel. ) Liquid crystal display panel. In other embodiments, the display panel 110 is a passive matrix liquid crystal display panel.

微控制器電路120提供影像信號S I予顯示面板110,並包括一記憶體121、一中央處理器(CPU)122、一影像驅動器123、一電荷幫浦(charge pump)124以及一控制電路125。在一可能實施例中,微控制器電路120係為一微控制單元(MCU)。 The microcontroller circuit 120 provides the image signal S I to the display panel 110, and includes a memory 121, a central processing unit (CPU) 122, an image driver 123, a charge pump 124, and a control circuit 125 . In one possible embodiment, the microcontroller circuit 120 is a micro control unit (MCU).

在本實施例中,記憶體121用以儲存一程式碼PRC。本發明並不限定記憶體121的種類。在一可能實施例中,記憶體121係為一非揮發性記憶體,如一快閃記憶體(flash memory)。In this embodiment, the memory 121 is used to store a program code PRC. The invention does not limit the type of the memory 121. In a possible embodiment, the memory 121 is a non-volatile memory, such as a flash memory.

中央處理器122讀取並執行程式碼PRC,用以產生一影像驅動信號S D。在一可能實施例中,中央處理器122具有輸入輸出接腳D 0~D 7。輸入輸出接腳D 0~D 7係用以接收資料S DT。在此例中,資料S DT係為一並列資料。在其它實施例中,資料S DT係為一串列資料。中央處理器122利用單一輸入輸出接腳(如D 0)接收串列資料。 The central processor 122 reads and executes the code PRC, to generate a video drive signal S D. In a possible embodiment, the central processing unit 122 has input and output pins D 0 to D 7 . The input and output pins D 0 ~ D 7 are used to receive data S DT . In this example, the data S DT is a parallel data. In other embodiments, the data S DT is a series of data. The central processing unit 122 uses a single input/output pin (such as D 0 ) to receive serial data.

在其它實施例中,中央處理器122更具有一輸入輸出接腳INT 0,用以接收中斷信號LCDPO_INT。當中斷信號LCDPO_INT被致能時,中央處理器122執行程式碼PRC的一中斷程序。在一可能實施例中,當微控制器電路120操作於一測試模式(test mode)時,如果中斷信號LCDPO_INT被致能,中央處理器122便透過輸入輸出接腳D 0~D 7接收資料S DT,並根據資料S DT產生一充電標準值。在此例中,中央處理器122可能透過輸入輸出接腳D 0~D 7輸出充電標準值。然而,當微控制器電路120操作於一正常模式(normal mode)時,如果中斷信號LCDPO_INT被致能,表示顯示面板110工作異常。因此,中央處理器122根據程式碼PRC的中斷程序,進入一檢測模式。在檢測模式下,中央處理器122進行一檢測程序。該檢測程序可能是一障礙排除程序,用以找出異常發生之處,或是一警示程序,用以通知使用者。 In other embodiments, the central processing unit 122 further has an input and output pin INT 0 for receiving the interrupt signal LCDPO_INT. When the interrupt signal LCDPO_INT is enabled, the central processing unit 122 executes an interrupt procedure of the program code PRC. In a possible embodiment, when the microcontroller circuit 120 is operating in a test mode, if the interrupt signal LCDPO_INT is enabled, the CPU 122 receives data S through the input and output pins D 0 ~ D 7 DT , and generate a charging standard value based on the data S DT. In this example, the central processing unit 122 may output the charging standard value through the input and output pins D 0 to D 7. However, when the microcontroller circuit 120 is operating in a normal mode, if the interrupt signal LCDPO_INT is enabled, it means that the display panel 110 is working abnormally. Therefore, the central processing unit 122 enters a detection mode according to the interrupt procedure of the program code PRC. In the detection mode, the central processing unit 122 performs a detection procedure. The detection procedure may be an obstacle removal procedure to find out where the abnormality occurs, or a warning procedure to notify the user.

影像驅動器123接收一操作電壓VLCD,並根據影像驅動信號S D產生影像信號S I。本發明並不限定影像驅動器123的電路架構。在一可能實施例中,影像驅動器123包括一電壓產生電路,其根據操作電壓VLCD產生複數輸出電壓,並根據影像驅動信號S D,從該等輸出電壓中選擇一者作為影像信號S I。在一可能實施例中,影像驅動器123係為一共通/區段(COM/SEG)驅動器。 Video driver 123 receives an operating voltage VLCD, and generate an image based on the video signal S I drive signal S D. The present invention does not limit the circuit structure of the image driver 123. In one possible embodiment, the image 123 comprising a drive voltage generating circuit which generates a plurality of output voltage VLCD according to the operating voltage, and the driving based on the video signal S D, to select one of a video signal S I from such output voltage. In one possible embodiment, the image driver 123 is a common/segment (COM/SEG) driver.

電荷幫浦124根據一充電信號CMP_OUT,對一電容C充電,用以提供操作電壓VLCD。在一可能實施例中,電容C的電壓作為操作電壓VLCD。本發明並不限定電荷幫浦124的電路架構。任何可根據充電信號CMP_OUT對電容C充電的架構,均可作為電荷幫浦124。在一可能實施例中,當充電信號CMP_OUT為一第一位準時,電荷幫浦124對電容C充電。當充電信號CMP_OUT為一第二位準時,電荷幫浦124停止對電容C充電。在其它實施例中,電荷幫浦124更接收來自中央處理器122的一時脈信號LCDCLK。The charge pump 124 charges a capacitor C according to a charging signal CMP_OUT to provide an operating voltage VLCD. In a possible embodiment, the voltage of the capacitor C is used as the operating voltage VLCD. The present invention does not limit the circuit structure of the charge pump 124. Any structure that can charge the capacitor C according to the charging signal CMP_OUT can be used as the charge pump 124. In a possible embodiment, when the charging signal CMP_OUT is at a first level, the charge pump 124 charges the capacitor C. When the charging signal CMP_OUT is at a second level, the charge pump 124 stops charging the capacitor C. In other embodiments, the charge pump 124 further receives a clock signal LCDCLK from the central processing unit 122.

控制電路125根據操作電壓VLCD,產生充電信號CMP_OUT。舉例而言,當操作電壓VLCD低於一目標值(如5V)時,控制電路125致能充電信號CMP_OUT,如令充電信號CMP_OUT為第一位準。此時,電荷幫浦124根據充電信號CMP_OUT,對電容C充電,用以提高操作電壓VLCD。然而,當操作電壓VLCD達目標值時,控制電路125禁能充電信號CMP_OUT,如令充電信號CMP_OUT為第二位準。此時,電荷幫浦124根據充電信號CMP_OUT,停止對電容C充電。第一位準相對於第二位準。舉例而言,當第一位準係為一高位準時,第二位準係為一低位準。當第一位準係為一低位準時,第二位準係為一高位準。The control circuit 125 generates a charging signal CMP_OUT according to the operating voltage VLCD. For example, when the operating voltage VLCD is lower than a target value (such as 5V), the control circuit 125 enables the charging signal CMP_OUT, such as setting the charging signal CMP_OUT to the first level. At this time, the charge pump 124 charges the capacitor C according to the charging signal CMP_OUT to increase the operating voltage VLCD. However, when the operating voltage VLCD reaches the target value, the control circuit 125 disables the charging signal CMP_OUT, such as setting the charging signal CMP_OUT to the second level. At this time, the charge pump 124 stops charging the capacitor C according to the charging signal CMP_OUT. The first level is relative to the second level. For example, when the first level is a high level, the second level is a low level. When the first level is a low level, the second level is a high level.

在本實施例中,控制電路125根據電容C的充電時間,判斷顯示面板110是否發生異常。舉例而言,當組裝人員將顯示面板110與微控制器電路120連接在一起時,可能因積體電路(IC)的腳位間發生短路或是顯示裝置110的尺寸過大造成過載,都會造成電容C的充電時間過長。當電容C的充電時間大於一充電標準值時,顯示面板110無法正常工作,或是呈現模糊的影像。因此,控制電路125致能中斷信號LCDPO_INT,通知中央處理器122。In this embodiment, the control circuit 125 determines whether the display panel 110 is abnormal according to the charging time of the capacitor C. For example, when the assembler connects the display panel 110 with the microcontroller circuit 120, it may be caused by a short circuit between the pins of the integrated circuit (IC) or an overload caused by the oversize of the display device 110, which will cause the capacitor C's charging time is too long. When the charging time of the capacitor C is greater than a charging standard value, the display panel 110 cannot work normally or presents a blurred image. Therefore, the control circuit 125 enables the interrupt signal LCDPO_INT to notify the central processing unit 122.

此時,中央處理器122根據中斷信號LCDPO_INT執行程式碼PRC的一特定程序。在一可能實施例中,特定程序係用以發出一警告訊息,用以通知組裝人員異常發生。在另一可能實施例中,特定程序係用以發出一測試信號,命令影像驅動器123進入一檢測模式。在檢測模式下,影像驅動器123依序檢測顯示面板110的每一接腳與另一接腳間是否發生短路。At this time, the central processing unit 122 executes a specific program of the program code PRC according to the interrupt signal LCDPO_INT. In a possible embodiment, the specific program is used to issue a warning message to notify the assembly personnel of the abnormal occurrence. In another possible embodiment, the specific program is used to issue a test signal to command the image driver 123 to enter a test mode. In the detection mode, the image driver 123 sequentially detects whether a short circuit occurs between each pin of the display panel 110 and another pin.

在其它實施例中,當一觸發事件發生時,微控制器電路120進入一測試模式。在測試模式下,控制電路125偵測電容C的充電時間,用以產生資料S DT。中央處理器122根據資料S DT,得知電容C的充電時間,再根據電容C的充電時間,定義出一充電標準值。在一可能實施例中,觸發事件係由測試人員所引起。在此例中,測試人員可能按下一按鈕(未顯示),用以使微控制器電路120進入一測試模式。在另一可能實施例中,當中央處理器122執行程式碼PRC的一測試程序時,微控制器電路120也會進入一測試模式。 In other embodiments, when a trigger event occurs, the microcontroller circuit 120 enters a test mode. In the test mode, the control circuit 125 detects the charging time of the capacitor C to generate data S DT . The central processing unit 122 learns the charging time of the capacitor C according to the data S DT , and then defines a charging standard value according to the charging time of the capacitor C. In a possible embodiment, the trigger event is caused by the tester. In this example, the tester may press a button (not shown) to make the microcontroller circuit 120 enter a test mode. In another possible embodiment, when the central processing unit 122 executes a test procedure of the program code PRC, the microcontroller circuit 120 also enters a test mode.

第2圖為本發明之控制電路的一可能實施例。如圖所示,控制電路200包括比較器210及260、一計數器220、一邊緣偵測器230、一儲存電路240以及一開關250。比較器210比較操作電壓VLCD與一參考電壓Vref 1,用以產生充電信號CMP_OUT。在本實施例中,當操作電壓VLCD小於參考電壓Vref 1時,表示操作電壓VLCD未達一目標值,故比較器210輸出高位準的充電信號CMP_OUT,用以命令電荷幫浦124對電容C充電。然而,當操作電壓VLCD大於參考電壓Vref 1時,表示操作電壓VLCD已達目標值,故比較器210輸出低位準的充電信號CMP_OUT,用以命令電荷幫浦124停止對電容C充電。在一可能實施例中,比較器210整合於電荷幫浦124之中。 Figure 2 is a possible embodiment of the control circuit of the present invention. As shown in the figure, the control circuit 200 includes comparators 210 and 260, a counter 220, an edge detector 230, a storage circuit 240, and a switch 250. The comparator 210 compares the operating voltage VLCD with a reference voltage Vref 1 to generate the charging signal CMP_OUT. In this embodiment, when the operating voltage VLCD is less than the reference voltage Vref 1 , it indicates that the operating voltage VLCD has not reached a target value, so the comparator 210 outputs a high-level charging signal CMP_OUT to command the charge pump 124 to charge the capacitor C . However, when the operating voltage VLCD is greater than the reference voltage Vref 1 , it indicates that the operating voltage VLCD has reached the target value, so the comparator 210 outputs a low-level charging signal CMP_OUT to command the charge pump 124 to stop charging the capacitor C. In one possible embodiment, the comparator 210 is integrated in the charge pump 124.

計數器220用以計數電容C的充電時間。在本實施例中,計數器220係計算充電信號CMP_OUT為高位準的持續時間。本發明並不限定計數器220的計數方式。在一可能實施例中,計數器220係由充電信號CMP_OUT的上升邊緣所觸發,用以從一預設值開始計數時脈信號LCDCLK的脈衝數量。在此例中,計數器220根據充電信號CMP_OUT的下降邊緣停止計數。本發明並不限定計數器220的種類。在一可能實施例中,計數器220係為一上數計數器或是一下數計數器。The counter 220 is used to count the charging time of the capacitor C. In this embodiment, the counter 220 calculates the duration of the charging signal CMP_OUT at a high level. The present invention does not limit the counting method of the counter 220. In a possible embodiment, the counter 220 is triggered by the rising edge of the charging signal CMP_OUT to count the number of pulses of the clock signal LCDCLK from a preset value. In this example, the counter 220 stops counting according to the falling edge of the charging signal CMP_OUT. The invention does not limit the type of the counter 220. In one possible embodiment, the counter 220 is an up counter or a down counter.

邊緣偵測器230用以偵測充電信號CMP_OUT的下降邊緣。當邊緣偵測器230偵測到充電信號CMP_OUT的下降邊緣時,表示電荷幫浦124停止對電容C充電。因此,邊緣偵測器230讀取計數器220的計數值。本發明並不限定邊緣偵測器230的電路架構。在一可能實施例中,邊緣偵測器230具有一閂鎖器(latch),用以閂鎖計數器220的計數值。在另一可能實施例中,邊緣偵測器230將計數器220的計數值儲存於儲存電路240中。為方便說明,當微控制器電路120操作於一測試模式時,計數器220的計數值以符號CNT T表示。在微控制器電路120操作於一正常模式時,計數器220的計數值以符號CNT N表示。 The edge detector 230 is used to detect the falling edge of the charging signal CMP_OUT. When the edge detector 230 detects the falling edge of the charging signal CMP_OUT, it means that the charge pump 124 stops charging the capacitor C. Therefore, the edge detector 230 reads the count value of the counter 220. The invention does not limit the circuit structure of the edge detector 230. In one possible embodiment, the edge detector 230 has a latch for latching the count value of the counter 220. In another possible embodiment, the edge detector 230 stores the count value of the counter 220 in the storage circuit 240. For convenience of illustration, the micro-controller circuit 120 when operating in a test mode, the count value of the counter 220 is represented by the symbol CNT T. When microcontroller circuit 120 operates in a normal mode, the count value of the counter 220 is represented by the symbol CNT N.

在其它實施例中,每當邊緣偵測器230偵測到充電信號CMP_OUT的下降邊緣時,邊緣偵測器230產生一致能信號S EN。在一可能實施例中,當微控制器電路120操作於測試模式時,中央處理器122導通開關250。因此,致能信號S EN作為中斷信號LCDPO_INT,用以中斷中央處理器122。此時,中央處理器122讀取儲存電路240所儲存的計數值CNT T,並根據計數值CNT T產生一充電標準值ST C。在一可能實施例中,中央處理器122將計數值CNT T加上一預設值,並將相加後的結果作為充電標準值ST C。中央處理器122可能將充電標準值ST C儲存於儲存電路240中。在其它實施例中,中央處理器122可能充電標準值ST C儲存於記憶體121中。在一些實施例中,中央處理器122耦接計數器220,用以直接讀取計數器220的計數值CNT T。然而,當微控制器電路120操作於正常模式時,中央處理器122不導通開關250。在此例中,致能信號S EN用以觸發比較器260。 In other embodiments, each time the edge detector 230 detects the falling edge of the charging signal CMP_OUT, the edge detector 230 generates the enabling signal S EN . In a possible embodiment, when the microcontroller circuit 120 is operating in the test mode, the central processing unit 122 turns on the switch 250. Therefore, the enable signal S EN is used as the interrupt signal LCDPO_INT to interrupt the central processing unit 122. At this time, the central processing unit 122 reads the count value CNT T stored in the storage circuit 240, and generates a charging standard value ST C according to the count value CNT T. In a possible embodiment, the central processing unit 122 adds a preset value to the count value CNT T , and uses the added result as the charging standard value ST C. The central processing unit 122 may store the charging standard value ST C in the storage circuit 240. In other embodiments, the central processing unit 122 may store the charging standard value ST C in the memory 121. In some embodiments, the central processing unit 122 is coupled to the counter 220 to directly read the count value CN T of the counter 220. However, when the microcontroller circuit 120 is operating in the normal mode, the central processing unit 122 does not turn on the switch 250. In this example, the enable signal S EN is used to trigger the comparator 260.

在正常模式下,當比較器260被致能信號S EN觸發時,比較器260比較計數器220的計數值CNT N與充電標準值ST C。當計數器220的計數值CNT N大於充電標準值ST C時,表示電容C的充電時間過久。因此,比較器260致能中斷信號LCDPO_INT,用以通知中央處理器122。在一可能實施例中,中央處理器122根據中斷信號LCDPO_INT執行程式碼PRC的一特定程序,如一通知程序,用以通知使用者,或是執行一檢測程式,用以檢測異常,或是執行一故障排除程序。然而,當計數器220的計數值CNT N未大於充電標準值ST C時,表示電容C的充電時間正常。因此,比較器260不致能中斷信號LCDPO_INT。此時,中央處理器122繼續產生影像驅動信號S D予影像驅動器123。 In the normal mode, when the comparator 260 is enabled trigger signal S EN, the comparator 260 comparing the count value of the counter 220 and the charging standard value CNT N ST C. When the count value of the counter 220 is larger than the charging standard value CNT N ST C, C represents the capacitance of the charging time is too long. Therefore, the comparator 260 enables the interrupt signal LCDPO_INT to notify the central processing unit 122. In a possible embodiment, the central processing unit 122 executes a specific program of the program code PRC according to the interrupt signal LCDPO_INT, such as a notification program to notify the user, or executes a detection program to detect abnormalities, or executes a Troubleshooting procedures. However, when the count value of the counter CNT N 220 does not exceed the value of the charging standard ST C, C represents the capacitance of the normal charging time. Therefore, the comparator 260 does not enable the interrupt signal LCDPO_INT. At this time, the central processor 122 continues to generate the drive signal S D to the video driver 123 images.

在本實施例中,比較器260耦接儲存電路240,用以讀取計數值CNT N與充電標準值ST C,但並非用以限制本發明。在一可能實施例中,當邊緣偵測器230偵測到充電信號CMP_OUT的下降邊緣時,邊緣偵測器230讀取計數器220的計數值CNT N,並直接提供計數值CNT N予比較器260。在另一可能實施例中,比較器260直接耦接計數器220,用以讀取計數值CNT N。在一些實施例中,比較器260耦接記憶體121,用以讀取充電標準值ST C。在其它實施例中,比較器260耦接中央處理器122,用以接收充電標準值ST CIn the present embodiment, comparator 260 is coupled to the storage circuit 240 for reading the count value of the charging standard value CNT N ST C, but not to limit the present invention. In one possible embodiment, when the edge detector 230 detects the falling edge of the charging signal CMP_OUT, edge detector 230 reads the count value of the counter CNT N 220, and the count value CNT N directly to the comparator 260 . In another possible embodiment, the comparator 260 is directly coupled to counter 220 to read the count value CNT N. In some embodiments, the comparator 260 is coupled to the memory 121 for reading the charging standard value ST C. In other embodiments, the comparator 260 is coupled to the central processing unit 122 to receive the charging standard value ST C.

在一可能實施例中,當計數器220的計數值CNT N大於充電標準值ST C時,比較器260設定一旗標(未顯示)的數值為一第一特定數值,如1。在此例中,當中央處理器122接收到被致能的中斷信號LCDPO_INT時,中央處理器122讀取該旗標的數值。當旗標的數值等於一設定值(如1)時,中央處理器122執行一檢測程序。在另一可能實施例中,當計數器220的計數值CNT N大於充電標準值ST C時,比較器260設定旗標的數值一第二特定數值,如0。在此例中,由於旗標的數值不等於設定值,故即使中斷信號LCDPO_INT被致能,中央處理器122不執行檢測程序。 In one possible embodiment, when the count value of the counter 220 is larger than the charging standard value CNT N ST C, the magnitude comparator 260 to set a flag (not shown) is a first specific value, such as 1. In this example, when the central processing unit 122 receives the enabled interrupt signal LCDPO_INT, the central processing unit 122 reads the value of the flag. When the value of the flag is equal to a set value (such as 1), the central processing unit 122 executes a detection procedure. In another possible embodiment, when the count value of the counter 220 is larger than the charging standard value CNT N ST C, the target value of the flag comparator 260 is set to a second specific value such as 0. In this example, since the value of the flag is not equal to the set value, even if the interrupt signal LCDPO_INT is enabled, the CPU 122 does not execute the detection procedure.

在其它實施例中,儲存電路240更具有一模式暫存器(未顯示)。在此例中,當模式暫存器儲存數值1時,表示微控制器電路120操作於測試模式。因此,微控制器電路120導通開關250。然而,當模式暫存器儲存數值0時,表示微控制器電路120操作於正常模式。因此,微控制器電路120不導通開關250。In other embodiments, the storage circuit 240 further has a mode register (not shown). In this example, when the mode register stores a value of 1, it means that the microcontroller circuit 120 is operating in the test mode. Therefore, the microcontroller circuit 120 turns on the switch 250. However, when the mode register stores a value of 0, it means that the microcontroller circuit 120 is operating in the normal mode. Therefore, the microcontroller circuit 120 does not turn on the switch 250.

在一可能實施例中,微控制器電路120更包括一按鈕(未顯示)。當使用者將按鈕往右撥動時,中央處理器122儲存數值1於模式暫存器中。當使用者將按鈕往左撥動時,中央處理器122儲存數值0於模式暫存器中。在一些實施例中,模式暫存器可能設置於記憶體121中。In a possible embodiment, the microcontroller circuit 120 further includes a button (not shown). When the user toggles the button to the right, the central processing unit 122 stores the value 1 in the mode register. When the user toggles the button to the left, the central processing unit 122 stores the value 0 in the mode register. In some embodiments, the mode register may be provided in the memory 121.

第3圖為本發明之控制電路的另一可能實施例。第3圖相似第2圖,不同之處在於,第3圖的控制電路300更包括一分壓電路305。分壓電路305處理操作電壓VLCD,用以產生一處理電壓V P。在此例中,比較器310比較處理電壓V P以及參考電壓Vref 2,用以產生充電信號CMP_OUT。由於計數器320、邊緣偵測器330、儲存電路340及比較器360的特性與第2圖的計數器220、邊緣偵測器230、儲存電路240及比較器260的特性相似,故不再贅述。 Figure 3 is another possible embodiment of the control circuit of the present invention. FIG. 3 is similar to FIG. 2 except that the control circuit 300 in FIG. 3 further includes a voltage divider circuit 305. The voltage divider circuit 305 processes the operating voltage VLCD to generate a process voltage V P. In this example, the comparator 310 compares the processing voltage V P and the reference voltage Vref 2 to generate the charging signal CMP_OUT. Since the characteristics of the counter 320, the edge detector 330, the storage circuit 340, and the comparator 360 are similar to those of the counter 220, the edge detector 230, the storage circuit 240, and the comparator 260 in FIG. 2, they will not be described again.

第4A圖為本發明之充電信號CMP_OUT與中斷信號LCDPO_INT在正常模式下的示意圖。以第2圖的控制電路200為例,充電信號CMP_OUT的上升邊緣413觸發計數器220。因此,計數器220根據時脈信號LCDCLK的上升邊緣,開始調整一計數值CNT T。此時,由於充電信號CMP_OUT為高位準,故電荷幫浦124對電容C充電。 FIG. 4A is a schematic diagram of the charging signal CMP_OUT and the interrupt signal LCDPO_INT in the normal mode of the present invention. Taking the control circuit 200 in FIG. 2 as an example, the rising edge 413 of the charging signal CMP_OUT triggers the counter 220. Therefore, the counter 220 starts to adjust a count value CNT T according to the rising edge of the clock signal LCDCLK. At this time, since the charging signal CMP_OUT is at a high level, the charge pump 124 charges the capacitor C.

當充電信號CMP_OUT由高位準變化至低位準時,電荷幫浦124停止對電容C充電。此時,計數器220根據充電信號CMP_OUT的下降邊緣414停止計數。假設,計數器220的計數值為56。由於計數器220的計數值(56)大於充電標準值(50),故比較器260致能中斷信號LCDPO_INT。因此,中央處理器122執行一中斷程序,如一異常檢測程序或是一通知程序。When the charging signal CMP_OUT changes from a high level to a low level, the charge pump 124 stops charging the capacitor C. At this time, the counter 220 stops counting according to the falling edge 414 of the charging signal CMP_OUT. Assume that the count value of the counter 220 is 56. Since the count value (56) of the counter 220 is greater than the charging standard value (50), the comparator 260 enables the interrupt signal LCDPO_INT. Therefore, the central processing unit 122 executes an interrupt procedure, such as an abnormality detection procedure or a notification procedure.

第4B圖為本發明之充電信號CMP_OUT與中斷信號LCDPO_INT在測試模式下的示意圖。以第2圖的控制電路200為例,充電信號CMP_OUT的上升邊緣411觸發計數器220。因此,計數器220根據時脈信號LCDCLK的上升邊緣,開始調整一計數值CNTN。此時,由於充電信號CMP_OUT為高位準,故電荷幫浦124對電容C充電。 FIG. 4B is a schematic diagram of the charging signal CMP_OUT and the interrupt signal LCDPO_INT of the present invention in the test mode. Taking the control circuit 200 in FIG. 2 as an example, the counter 220 is triggered by the rising edge 411 of the charging signal CMP_OUT. Thus, counter 220 according to the clock signal rising edge LCDCLK, adjusting a start count value CNT N. At this time, since the charging signal CMP_OUT is at a high level, the charge pump 124 charges the capacitor C.

當充電信號CMP_OUT由高位準變化至低位準時,電荷幫浦124停止對電容C充電。此時,計數器220根據充電信號CMP_OUT的下降邊緣412停止計數。假設,計數器220的計數值為50。邊緣偵測器230根據下降邊緣412,致能中斷信號LCDPO_INT。因此,中央處理器122讀取計數器220的計數值(如為50)。在一可能實施例中,央處理器122直接將計數器220的計數值(如為50)作為一充電標準值。 When the charging signal CMP_OUT changes from a high level to a low level, the charge pump 124 stops charging the capacitor C. At this time, the counter 220 stops counting according to the falling edge 412 of the charging signal CMP_OUT. Assume that the count value of the counter 220 is 50. The edge detector 230 enables the interrupt signal LCDPO_INT according to the falling edge 412. Therefore, the central processing unit 122 reads the count value of the counter 220 (for example, 50). In a possible embodiment, the central processing unit 122 directly uses the count value of the counter 220 (for example, 50) as a charging standard value.

第5圖為本發明之影像驅動器的一可能示意圖。在本實施例中,影像驅動器500係為一COM/SEG驅動器,並包括一COM/SEG數位信號產生器510、一電壓產生電路520以及一驅動器530。COM/SEG數位信號產生器510根據影像驅動信號SD,產生數位信號SDG。電壓產生電路520根據操作電壓VLCD,產生處理電壓V1~V3。本發明並不限定電壓產生電路520的架構。在一可能實施例中,電壓產生電路520係為一分壓電路,其包括電阻R1~R4。電阻R1~R4串聯於操作電壓VLCD與接地電壓VSS之間,用以產生處理電壓V1~V3。本發明並不限定電阻的數量。在其它實施例中,當電壓產生電路520具有更多的電阻時,便可產生更多的處理電壓。 Figure 5 is a possible schematic diagram of the image driver of the present invention. In this embodiment, the image driver 500 is a COM/SEG driver, and includes a COM/SEG digital signal generator 510, a voltage generating circuit 520, and a driver 530. The COM/SEG digital signal generator 510 generates a digital signal S DG according to the image driving signal S D. The voltage generating circuit 520 generates processing voltages V1 to V3 according to the operating voltage VLCD. The invention does not limit the structure of the voltage generating circuit 520. In a possible embodiment, the voltage generating circuit 520 is a voltage divider circuit, which includes resistors R 1 ˜R 4 . The resistors R 1 to R 4 are connected in series between the operating voltage VLCD and the ground voltage VSS to generate the processing voltages V1 to V3. The invention does not limit the number of resistors. In other embodiments, when the voltage generating circuit 520 has more resistances, more processing voltages can be generated.

驅動器530根據數位信號SDG,產生共通信號COM0~COMM及區段信號SEG0~SEGN。在一可能實施例中,驅動器530根據數位信號SDG,選擇性地將處理電壓V1~V3作為共通信號COM0~COMM及區段信號SEG0~SEGN。換句話說,共通信號COM 0~COM M及區段信號SEG 0~SEG N之任一者的電壓等於處理電壓V1~V3之一者。在本實施例中,共通信號COM 0~COM M及區段信號SEG 0~SEG N構成影像信號S IThe driver 530 generates common signals COM 0 ~COM M and segment signals SEG 0 ~SEG N according to the digital signal S DG . In a possible embodiment, the driver 530 selectively uses the processing voltages V1 to V3 as the common signals COM 0 to COM M and the segment signals SEG 0 to SEG N according to the digital signal S DG . In other words, the voltage of any one of the common signals COM 0 to COM M and the segment signals SEG 0 to SEG N is equal to one of the processing voltages V1 to V3. In this embodiment, the common signals COM 0 to COM M and the segment signals SEG 0 to SEG N constitute the image signal S I.

第6圖為本發明之控制方法的一可能流程示意圖。本發明的控制方法適用於一微控制器電路中。微控制器電路耦接一顯示面板,用以控制顯示面板所呈現的畫面。首先,判斷一觸發事件是否發生(步驟S611)。本發明並不限定觸發事件的種類。在一可能實施例中,微控制器電路判斷一按鈕的狀態。當測試人員按下該按鈕時,表示觸發事件發生。因此,微控制器電路進入一測試模式(步驟S612)。當觸發事件未發生時,微控制器電路進入一正常模式(步驟S613) 。在一可能實施例中,在測試模式下,微控制器電路定義出一充電標準值。在正常模式下,微控制器電路將一電容的充電時間與該充電標準值作比較。當電容的充電時間大於充電標準值時,表示顯示面板發生異常。因此,微控制器電路執行一特定程序,如一異常檢測程序。Figure 6 is a schematic diagram of a possible flow of the control method of the present invention. The control method of the present invention is applicable to a microcontroller circuit. The microcontroller circuit is coupled to a display panel for controlling the picture presented by the display panel. First, it is determined whether a trigger event has occurred (step S611). The invention does not limit the types of trigger events. In one possible embodiment, the microcontroller circuit determines the state of a button. When the tester presses the button, it means that a trigger event has occurred. Therefore, the microcontroller circuit enters a test mode (step S612). When the trigger event does not occur, the microcontroller circuit enters a normal mode (step S613). In a possible embodiment, in the test mode, the microcontroller circuit defines a charging standard value. In the normal mode, the microcontroller circuit compares the charging time of a capacitor with the charging standard value. When the charging time of the capacitor is longer than the charging standard value, it means that the display panel is abnormal. Therefore, the microcontroller circuit executes a specific program, such as an abnormality detection program.

第7圖為本發明之微控制器電路操作於測試模式下的一可能流程示意圖。首先,重置一計數值(步驟S711)。在一可能實施例中,微控制器電路係根據一充電信號的位準變化,重置該計數值,其中該充電信號係用以對一特定電容充電。在此例中,當一充電信號由一第一位準(如低位準)變化至一第二位準(高位準)時,微控制器電路重置一計數器,使其從一初始值開始計數。FIG. 7 is a schematic diagram of a possible flow of the microcontroller circuit of the present invention operating in the test mode. First, reset a count value (step S711). In a possible embodiment, the microcontroller circuit resets the count value according to the level change of a charging signal, wherein the charging signal is used to charge a specific capacitor. In this example, when a charging signal changes from a first level (such as a low level) to a second level (a high level), the microcontroller circuit resets a counter to start counting from an initial value .

接著,判斷一充電信號是否處於第二位準(步驟S712)。當充電信號處於第二位準時,表示電容C持續在充電。因此,增加計數值(步驟S713),並回到步驟S712。當充電信號並未處於第二位準時,電容C不再充電。因此,閂鎖計數值並產生一中斷要求(步驟S714)。在一可能實施例中,微控制器電路根據步驟S714所閂鎖的計數值,產生一充電標準值。本發明並不限定微控制器電路如何產生充電標準值。在一可能實施例中,微控制器電路將計數值與一預設值相加,再將相加後的結果作為充電標準值。Next, it is determined whether a charging signal is at the second level (step S712). When the charging signal is at the second level, it means that the capacitor C is continuously charging. Therefore, the count value is increased (step S713), and the process returns to step S712. When the charging signal is not at the second level, the capacitor C is no longer charged. Therefore, the count value is latched and an interrupt request is generated (step S714). In a possible embodiment, the microcontroller circuit generates a charging standard value according to the count value latched in step S714. The invention does not limit how the microcontroller circuit generates the charging standard value. In a possible embodiment, the microcontroller circuit adds the count value to a preset value, and then uses the added result as the charging standard value.

在其它實施例中,步驟S712更判斷計數值是否小於一最大值。在此例中,只要充電信號未處於第二位準或是計數值未小於最大值,便執行步驟S714。然而,如果充電信號處於第二位準並且計數值小於最大值時,則執行步驟S713。In other embodiments, step S712 further determines whether the count value is less than a maximum value. In this example, as long as the charging signal is not at the second level or the count value is not less than the maximum value, step S714 is executed. However, if the charging signal is at the second level and the count value is less than the maximum value, step S713 is executed.

第8圖為本發明之微控制器電路操作於正常模式下的一可能流程示意圖。首先,重置一計數值(步驟S811)。在一可能實施例中,當一充電信號由一第一位準(如低位準)變化至一第二位準(高位準)時,一計數器被重置。因此,該計數器從一初始值(如0)開始計數。FIG. 8 is a schematic diagram of a possible flow of the microcontroller circuit of the present invention operating in the normal mode. First, a count value is reset (step S811). In one possible embodiment, when a charging signal changes from a first level (such as a low level) to a second level (a high level), a counter is reset. Therefore, the counter starts counting from an initial value (such as 0).

判斷充電信號是否處於第二位準(步驟S812)。在本實施例中,充電信號係提供予一電荷幫浦。當該充電信號處於第二位準時,電荷幫浦對一電容C充電。當該充電信號處於第一位準時,電荷幫浦停止對電容C充電。It is determined whether the charging signal is at the second level (step S812). In this embodiment, the charging signal is provided to a charge pump. When the charging signal is at the second level, the charge pump charges a capacitor C. When the charging signal is at the first level, the charge pump stops charging the capacitor C.

當充電信號處於第二位準時,增加計數值(步驟S813),並回到步驟S812。當充電信號並未處於第二位準時,閂鎖計數值(步驟S814)。判斷步驟S814所閂鎖的計數值是否大於一充電標準值(步驟S815)。當計數值小於充電標準值時,回到步驟S811,重置計數值,使計數值回到一初始值。然而,當計數值大於充電標準值時,表示顯示面板可能發生異常。因此,產生一中斷要求(步驟S816)。在一可能實施例中,當微控制器電路接收到中斷要求時,微控制器電路執行一檢測程序,用以找出異常現象。When the charging signal is at the second level, the count value is increased (step S813), and step S812 is returned. When the charging signal is not at the second level, the count value is latched (step S814). It is determined whether the latched count value in step S814 is greater than a charging standard value (step S815). When the count value is less than the charging standard value, return to step S811 to reset the count value to return the count value to an initial value. However, when the count value is greater than the charging standard value, it means that the display panel may be abnormal. Therefore, an interrupt request is generated (step S816). In a possible embodiment, when the microcontroller circuit receives an interrupt request, the microcontroller circuit executes a detection procedure to find out the abnormal phenomenon.

在其它實施例中,在步驟S811之前,微控制器電路裡的一中央處理器執行一程式碼,用以產生一影像驅動信號。在此例中,微控制器電路裡的電荷幫浦根據一充電信號對一電容充電。電容的電壓作為一操作電壓。接著,微控制器電路裡的一影像驅動器根據影像驅動信號驅動顯示面板。在電容充電時,記錄電容的充電時間(即步驟S811~S813)。當電容的充電時間大於充電標準值時,執行程式碼的一檢測程序。In other embodiments, before step S811, a central processing unit in the microcontroller circuit executes a program code to generate an image driving signal. In this example, the charge pump in the microcontroller circuit charges a capacitor according to a charging signal. The voltage of the capacitor serves as an operating voltage. Then, an image driver in the microcontroller circuit drives the display panel according to the image driving signal. When the capacitor is charged, the charging time of the capacitor is recorded (that is, steps S811 to S813). When the charging time of the capacitor is greater than the charging standard value, a detection procedure of the program code is executed.

在一些實施例中,步驟S812更判斷計數值是否小於一最大值。在此例中,只要充電信號未處於第二位準或是計數值未小於最大值,便執行步驟S814。然而,如果充電信號處於第二位準並且計數值小於最大值時,則執行步驟S813。In some embodiments, step S812 further determines whether the count value is less than a maximum value. In this example, as long as the charging signal is not at the second level or the count value is not less than the maximum value, step S814 is executed. However, if the charging signal is at the second level and the count value is less than the maximum value, step S813 is executed.

由於微控制器電路具有充電檢測功能,故在電容C的充電時間過長時,微控制器電路執行一特定程序,用以找出異常原因,如負載過大,或是顯示面板的接腳發生短路。因此,測試人員根據微控制器電路的回報結果,便可快速地得知異常之處。Because the microcontroller circuit has a charge detection function, when the charging time of the capacitor C is too long, the microcontroller circuit executes a specific program to find out the cause of the abnormality, such as excessive load or short circuit on the pins of the display panel . Therefore, the tester can quickly learn the abnormality according to the report result of the microcontroller circuit.

本發明之方法,或特定型態或其部份,可以以程式碼的型態存在。程式碼可儲存於實體媒體,如軟碟、光碟片、硬碟、或是任何其他機器可讀取(如電腦可讀取)儲存媒體,亦或不限於外在形式之電腦程式產品,其中,當程式碼被機器,如電腦載入且執行時,此機器變成用以參與本發明之微控制器電路。程式碼也可透過一些傳送媒體,如電線或電纜、光纖、或是任何傳輸型態進行傳送,其中,當程式碼被機器,如電腦接收、載入且執行時,此機器變成用以參與本發明之微控制器電路。當在一般用途處理單元實作時,程式碼結合處理單元提供一操作類似於應用特定邏輯電路之獨特裝置。The method of the present invention, or a specific type or part thereof, can exist in the form of code. The code can be stored in physical media, such as floppy disks, CDs, hard disks, or any other machine-readable (such as computer-readable) storage media, or not limited to external forms of computer program products. Among them, When the program code is loaded and executed by a machine, such as a computer, the machine becomes the microcontroller circuit used to participate in the present invention. The code can also be transmitted through some transmission media, such as wire or cable, optical fiber, or any transmission type. When the code is received, loaded and executed by a machine, such as a computer, the machine becomes used to participate in this Invention of the microcontroller circuit. When implemented in a general-purpose processing unit, the program code combined with the processing unit provides a unique device that operates similar to the application of a specific logic circuit.

除非另作定義,在此所有詞彙(包含技術與科學詞彙)均屬本發明所屬技術領域中具有通常知識者之一般理解。此外,除非明白表示,詞彙於一般字典中之定義應解釋為與其相關技術領域之文章中意義一致,而不應解釋為理想狀態或過分正式之語態。 Unless otherwise defined, all vocabulary (including technical and scientific vocabulary) herein belong to the general understanding of persons with ordinary knowledge in the technical field of the present invention. In addition, unless clearly stated, the definition of a word in a general dictionary should be interpreted as consistent with the meaning in the article in the relevant technical field, and should not be interpreted as an ideal state or an overly formal voice.

雖然本發明已以較佳實施例揭露如上,然其並非用以限定本發明,任何所屬技術領域中具有通常知識者,在不脫離本發明之精神和範圍內,當可作些許之更動與潤飾。舉例來,本發明實施例所系統、裝置或是方法可以硬體、軟體或硬體以及軟體的組合的實體實施例加以實現。因此本發明之保護範圍當視後附之申請專利範圍所界定者為準。 Although the present invention has been disclosed as above in the preferred embodiment, it is not intended to limit the present invention. Anyone with ordinary knowledge in the relevant technical field can make some changes and modifications without departing from the spirit and scope of the present invention. . For example, the system, device, or method of the embodiment of the present invention can be implemented in a physical embodiment of hardware, software, or a combination of hardware and software. Therefore, the scope of protection of the present invention shall be subject to those defined by the attached patent scope.

100:顯示裝置 100: display device

110:顯示面板 110: display panel

120:微控制器電路 120: Microcontroller circuit

121:記憶體 121: memory

122:中央處理器 122: Central Processing Unit

123、500:影像驅動器 123, 500: image drive

124:電荷幫浦 124: Charge Pump

125、200、300:控制電路 125, 200, 300: control circuit

210、260、310、360:比較器 210, 260, 310, 360: comparator

220、320:計數器 220, 320: counter

230、330:邊緣偵測器 230, 330: edge detector

240、340:儲存電路 240, 340: storage circuit

250、350:開關 250, 350: switch

305:分壓電路 305: Voltage divider circuit

411、413:上升邊緣 411, 413: rising edge

412、414:下降邊緣 412, 414: Falling Edge

50、56:數值 50, 56: Numerical value

520:電壓產生電路 520: voltage generating circuit

510:COM/SEG數位信號產生器 510: COM/SEG digital signal generator

530:驅動器 530: drive

SI:影像信號 S I : image signal

PRC:程式碼 PRC: Code

SD:影像驅動信號 S D : image drive signal

D0~D7、INT0:輸入輸出接腳 D 0 ~D 7 , INT 0 : input and output pins

SDT:資料 S DT : Information

LCDPO_INT:中斷信號 LCDPO_INT: interrupt signal

VLCD:操作電壓 VLCD: Operating voltage

CMP_OUT:充電信號 CMP_OUT: Charging signal

LCDCLK:時脈信號 LCDCLK: clock signal

Vref1、Vref2:參考電壓 Vref 1 , Vref 2 : Reference voltage

CNTT、CNTN:計數值 CNT T , CNT N : count value

SEN:致能信號 S EN : enable signal

STC:充電標準值 ST C : Charging standard value

VP、V1~V3:處理電壓 V P , V1~V3: processing voltage

R1~R4:電阻 R 1 ~R 4 : resistance

COM0~COMM:共通信號 COM 0 ~ COM M : Common signal

SEG0~SEGN:區段信號 SEG 0 ~SEG N : Segment signal

S611~S613、S711~S714、S811~S813:步驟 S611~S613, S711~S714, S811~S813: steps

VSS:接地電壓 VSS: Ground voltage

第1圖為本發明之顯示裝置的示意圖。 第2圖為本發明之控制電路的一可能實施例。 第3圖為本發明之控制電路的另一可能實施例。 第4A圖為本發明之充電信號與中斷信號在正常模式下的示意圖。 第4B圖為本發明之充電信號與中斷信號在測試模式下的示意圖。 第5圖為本發明之影像驅動器的一可能示意圖。 第6圖為本發明之控制方法的一可能流程示意圖。 第7圖為本發明之微控制器電路操作於測試模式下的一可能流程示意圖。 第8圖為本發明之微控制器電路操作於正常模式下的一可能流程示意圖。 Figure 1 is a schematic diagram of the display device of the present invention. Figure 2 is a possible embodiment of the control circuit of the present invention. Figure 3 is another possible embodiment of the control circuit of the present invention. Figure 4A is a schematic diagram of the charging signal and the interrupt signal of the present invention in the normal mode. Figure 4B is a schematic diagram of the charging signal and the interrupt signal of the present invention in the test mode. Figure 5 is a possible schematic diagram of the image driver of the present invention. Figure 6 is a schematic diagram of a possible flow of the control method of the present invention. FIG. 7 is a schematic diagram of a possible flow of the microcontroller circuit of the present invention operating in the test mode. FIG. 8 is a schematic diagram of a possible flow of the microcontroller circuit of the present invention operating in the normal mode.

100:顯示裝置 100: display device

110:顯示面板 110: display panel

120:微控制器電路 120: Microcontroller circuit

121:記憶體 121: memory

122:中央處理器 122: Central Processing Unit

123:影像驅動器 123: Image Drive

124:電荷幫浦 124: Charge Pump

125:控制電路 125: control circuit

SI:影像信號 S I : image signal

PRC:程式碼 PRC: Code

SD:影像驅動信號 S D : image drive signal

D0~D7、INT0:輸入輸出接腳 D 0 ~D 7 , INT 0 : input and output pins

SDT:資料 S DT : Information

LCDPO_INT:中斷信號 LCDPO_INT: interrupt signal

VLCD:操作電壓 VLCD: Operating voltage

CMP_OUT:充電信號 CMP_OUT: Charging signal

LCDCLK:時脈信號 LCDCLK: clock signal

Claims (10)

一種微控制器電路,用以控制一顯示面板,並包括: 一記憶體,用以儲存一程式碼; 一中央處理器,執行該程式碼,用以產生一影像驅動信號; 一影像驅動器,接收一操作電壓,並根據該影像驅動信號驅動該顯示面板; 一電荷幫浦,根據一充電信號,對一電容充電,其中該電容的電壓作為該操作電壓;以及 一控制電路,根據該操作電壓,產生該充電信號; 其中,在一正常模式下,該控制電路判斷該電容的充電時間是否大於一充電標準值,當該電容的充電時間大於該充電標準值時,該中央處理器執行該程式碼的一檢測程序。 A microcontroller circuit is used to control a display panel and includes: A memory for storing a program code; A central processing unit that executes the program code to generate an image driving signal; An image driver, receiving an operating voltage, and driving the display panel according to the image driving signal; A charge pump charges a capacitor according to a charging signal, wherein the voltage of the capacitor is used as the operating voltage; and A control circuit generates the charging signal according to the operating voltage; Wherein, in a normal mode, the control circuit determines whether the charging time of the capacitor is greater than a charging standard value, and when the charging time of the capacitor is greater than the charging standard value, the CPU executes a detection procedure of the program code. 如申請專利範圍第1項所述之微控制器電路,其中在一測試模式下,該控制電路根據該充電信號,記錄該電容的充電時間,用以產生該充電標準值。For the microcontroller circuit described in item 1 of the scope of patent application, in a test mode, the control circuit records the charging time of the capacitor according to the charging signal to generate the charging standard value. 如申請專利範圍第2項所述之微控制器電路,其中該控制電路包括: 一第一比較器,比較一處理電壓以及一參考電壓,用以產生該充電信號,其中該處理電壓與該操作電壓有關。 The microcontroller circuit described in item 2 of the scope of patent application, wherein the control circuit includes: A first comparator compares a processing voltage and a reference voltage to generate the charging signal, wherein the processing voltage is related to the operating voltage. 如申請專利範圍第3項所述之微控制器電路,其中該控制電路更包括: 一分壓電路,處理該操作電壓,用以產生該處理電壓。 The microcontroller circuit described in item 3 of the scope of patent application, wherein the control circuit further includes: A voltage divider circuit processes the operating voltage to generate the processed voltage. 如申請專利範圍第3項所述之微控制器電路,其中該控制電路包括: 一計數器,由該充電信號的一第一邊緣所觸發,用以開始調整一計數值,並根據該充電信號的一第二邊緣,停止調整該計數值;以及 一邊緣偵測器,根據該充電信號的該第二邊緣,產生一致能信號, 其中在該測試模式下,該中央處理器根據該致能信號讀取該計數值,並根據該計數值產生該充電標準值。 The microcontroller circuit described in item 3 of the scope of patent application, wherein the control circuit includes: A counter, triggered by a first edge of the charging signal, to start adjusting a count value, and stop adjusting the count value according to a second edge of the charging signal; and An edge detector generates a consistent energy signal according to the second edge of the charging signal, Wherein, in the test mode, the central processing unit reads the count value according to the enable signal, and generates the charging standard value according to the count value. 如申請專利範圍第5項所述之微控制器電路,其中該第一邊緣係為一上升邊緣,該第二邊緣係為一下降邊緣。In the microcontroller circuit described in claim 5, the first edge is a rising edge, and the second edge is a falling edge. 如申請專利範圍第5項所述之微控制器電路,其中該控制電路更包括: 一儲存電路,儲存該充電標準值; 一第二比較器,根據該致能信號,比較該計數值與該充電標準值,其中在該正常模式下,當該計數值大於該充電標準值時,該第二比較器發出一中斷信號予該中央處理器。 The microcontroller circuit described in item 5 of the scope of patent application, wherein the control circuit further includes: A storage circuit to store the charging standard value; A second comparator compares the count value with the charging standard value according to the enable signal, wherein in the normal mode, when the count value is greater than the charging standard value, the second comparator sends an interrupt signal to The central processing unit. 如申請專利範圍第7項所述之微控制器電路,其中該第二比較器更比較該計數值與一預設值,當該計數值大於該預設值時,該第二比較器發出該中斷信號,當該計數值大於該充電標準值或該預設值時,該第二比較器設定一旗標的數值為一特定數值。Such as the microcontroller circuit described in item 7 of the scope of patent application, wherein the second comparator compares the count value with a preset value, and when the count value is greater than the preset value, the second comparator sends out the The interrupt signal, when the count value is greater than the charging standard value or the preset value, the second comparator sets the value of a flag to a specific value. 如申請專利範圍第8項所述之微控制器電路,其中當該中央處理器接收到該中斷信號時,該中央處理器讀取該旗標的數值,當該旗標的數值等於一設定值時,該中央處理器執行該檢測程序。For example, the microcontroller circuit described in item 8 of the scope of patent application, wherein when the central processing unit receives the interrupt signal, the central processing unit reads the value of the flag, and when the value of the flag is equal to a set value, The central processing unit executes the detection program. 一種控制方法,適用於一微控制器電路中,該微控制器電路耦接一顯示面板,該控制方法包括: 執行一程式碼,用以產生一影像驅動信號; 對一電容充電,其中該電容的電壓作為一操作電壓; 提供該操作電壓予一影像驅動器,其中該影像驅動器根據該影像驅動信號驅動該顯示面板;以及 判斷該電容的充電時間是否大於一充電標準值; 其中當該電容的充電時間大於該充電標準值時,執行該程式碼的一檢測程序。 A control method is suitable for a microcontroller circuit, the microcontroller circuit is coupled to a display panel, and the control method includes: Execute a program code to generate an image drive signal; Charge a capacitor, where the voltage of the capacitor is used as an operating voltage; Providing the operating voltage to an image driver, wherein the image driver drives the display panel according to the image driving signal; and Determine whether the charging time of the capacitor is greater than a charging standard value; When the charging time of the capacitor is greater than the charging standard value, a detection procedure of the program code is executed.
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Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1998000725A1 (en) * 1996-06-28 1998-01-08 Microchip Technology Incorporated Methodology for testing a microcontroller chip adapted to control a liquid crystal display
TW200914857A (en) * 2007-09-27 2009-04-01 Chi Mei Optoelectronics Corp A testing system applied to test a flat panel display device
CN102654967A (en) * 2011-11-21 2012-09-05 京东方科技集团股份有限公司 Automatic power supply abnormality detection apparatus, drive circuit and display device
CN104616614A (en) * 2014-11-28 2015-05-13 合肥京东方光电科技有限公司 Power-on method and device and detection method and device of display module

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI547922B (en) * 2015-06-05 2016-09-01 矽創電子股份有限公司 Power supply system and display apparatus
CN105128688B (en) * 2015-09-06 2017-09-22 重庆长安汽车股份有限公司 A kind of electric automobile starts control method and control system
US10545193B2 (en) * 2016-07-13 2020-01-28 Stmicroelectronics (Research & Development) Limited Charge pump overload detection
CN107731190B (en) * 2017-11-14 2020-01-31 深圳市华星光电半导体显示技术有限公司 Driving system and driving method of liquid crystal display device
CN110308362A (en) * 2019-04-16 2019-10-08 惠科股份有限公司 Detection circuit and display panel

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1998000725A1 (en) * 1996-06-28 1998-01-08 Microchip Technology Incorporated Methodology for testing a microcontroller chip adapted to control a liquid crystal display
TW200914857A (en) * 2007-09-27 2009-04-01 Chi Mei Optoelectronics Corp A testing system applied to test a flat panel display device
CN102654967A (en) * 2011-11-21 2012-09-05 京东方科技集团股份有限公司 Automatic power supply abnormality detection apparatus, drive circuit and display device
CN104616614A (en) * 2014-11-28 2015-05-13 合肥京东方光电科技有限公司 Power-on method and device and detection method and device of display module

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