TWI683384B - Wafer drying apparatus - Google Patents

Wafer drying apparatus Download PDF

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Publication number
TWI683384B
TWI683384B TW108102971A TW108102971A TWI683384B TW I683384 B TWI683384 B TW I683384B TW 108102971 A TW108102971 A TW 108102971A TW 108102971 A TW108102971 A TW 108102971A TW I683384 B TWI683384 B TW I683384B
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Taiwan
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carrier
wafer
blowing
blowing unit
clamping block
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TW108102971A
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Chinese (zh)
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TW202029374A (en
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張瑞堂
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奇景光電股份有限公司
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Publication of TWI683384B publication Critical patent/TWI683384B/en
Publication of TW202029374A publication Critical patent/TW202029374A/en

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  • Cleaning Or Drying Semiconductors (AREA)

Abstract

A wafer drying apparatus includes a platform, a holder and an air-blowing device. The holder is movably disposed on the platform. The holder is configured to carry a wafer. The holder includes a first carrying portion and a second carrying portion. There are plural first clamping blocks disposed on the first carrying portion. The second carrying portion is connected with the first carrying portion. There are plural second clamping blocks disposed on the second carrying portion. The first clamping blocks and the second clamping blocks are disposed between the first carrying portion and the second carrying portion, so as to form a distance between the first carrying portion and the second carrying portion. The air-blowing device is disposed on the platform and is configured to blow air to the holder.

Description

晶圓吹乾設備 Wafer drying equipment

本發明是有關於一種吹乾設備,且特別是有關於一種晶圓吹乾設備。 The present invention relates to a blow-drying device, and particularly to a wafer blow-drying device.

一般常見的晶圓乾燥的方式主要是將多個晶圓放置於晶圓脫水機中,再操作晶圓脫水機以旋轉晶圓進行脫水乾燥。然而,晶圓脫水機較適用於對數量較多的晶圓進行脫水,且所需的脫水時間較長。當需要對少量晶圓進行脫水時,使用晶圓脫水機較不符合經濟效益,且較費時。 A common way of drying wafers is to place multiple wafers in a wafer dehydrator, and then operate the wafer dehydrator to rotate the wafers for dehydration and drying. However, the wafer dehydration machine is more suitable for dehydration of a larger number of wafers, and the dehydration time is longer. When it is necessary to dehydrate a small number of wafers, it is less economical and time-consuming to use a wafer dehydrator.

另一種晶圓乾燥方式是製程人員使用氣槍來手動吹乾晶圓,但透過人工吹乾晶圓的方式不但無法確保晶圓有確實吹乾外,亦無法掌握晶圓整體吹乾時間、亦容易發生氣槍噴嘴碰觸到晶圓表面而造成產品異常或破片的問題。 Another method of wafer drying is that the process personnel use an air gun to manually dry the wafers, but manually drying the wafers can not only ensure that the wafers are indeed dried, but also can not grasp the overall wafer drying time, and it is also easy There was a problem that the air gun nozzle touched the surface of the wafer and caused the product to be abnormal or broken.

因此,本發明之一目的是在提供一種晶圓吹乾設備,其具有簡化晶圓的吹乾步驟及增加晶圓吹乾效率之優點。 Therefore, an object of the present invention is to provide a wafer blow-drying device, which has the advantages of simplifying the wafer blow-drying step and increasing the wafer blow-drying efficiency.

根據本發明之上述目的,提出一種晶圓吹乾設 備。此晶圓吹乾設備包含載座、承載架以及吹氣裝置。承載架可移動地設置在載座上。承載架配置以承載晶圓。承載架包含第一承載部以及第二承載部。第一承載部上設有複數個第一夾塊。第二承載部與第一承載部互相併合。第二承載部上設有複數個第二夾塊分別對應第一夾塊。第一夾塊與第二夾塊位於第一承載部與第二承載部之間,以使第一承載部與第二承載部間形成距離。吹氣裝置設置在載座上,配置以朝向承載架吹氣。 According to the above object of the present invention, a wafer blow drying device is proposed Prepare. The wafer drying equipment includes a carrier, a carrier and an air blowing device. The carrier is movably arranged on the carrier. The carrier is configured to carry wafers. The carrying frame includes a first carrying portion and a second carrying portion. A plurality of first clamping blocks are provided on the first bearing part. The second bearing part and the first bearing part merge with each other. The second bearing part is provided with a plurality of second clamping blocks respectively corresponding to the first clamping blocks. The first clamping block and the second clamping block are located between the first bearing portion and the second bearing portion, so that a distance is formed between the first bearing portion and the second bearing portion. The air blowing device is provided on the carrier and is configured to blow air toward the carrier.

依據本發明之一實施例,上述之每一個第一夾塊朝向其對應之第二夾塊之第一表面上設有第一凸出部。每一第二夾塊朝向其對應之第一夾塊之第二表面上設有第二凸出部。其中,第一凸出部與第二凸出部接觸晶圓,第一表面與第二表面不接觸晶圓。 According to an embodiment of the present invention, each of the first clamping blocks mentioned above is provided with a first protrusion on the first surface facing the corresponding second clamping block. Each second clamping block is provided with a second protrusion on the second surface facing the corresponding first clamping block. The first protrusion and the second protrusion contact the wafer, and the first surface and the second surface do not contact the wafer.

依據本發明之一實施例,上述之每一個第一凸出部與第二凸出部包含圓柱結構、圓弧結構、角錐結構、錐台結構、或複數個細柱結構。 According to an embodiment of the invention, each of the first protruding portion and the second protruding portion includes a cylindrical structure, a circular arc structure, a pyramid structure, a truncated cone structure, or a plurality of thin column structures.

依據本發明之一實施例,上述之每一個第一凸出部與第二凸出部具有第一斜面以及第二斜面。其中,第一斜面與第二斜面共同形成稜線,且稜線接觸晶圓。 According to an embodiment of the present invention, each of the first protruding portion and the second protruding portion has a first inclined surface and a second inclined surface. Wherein, the first inclined surface and the second inclined surface jointly form an ridge line, and the ridge line contacts the wafer.

依據本發明之一實施例,上述之第一承載部與第二承載部為環形,且第一夾塊與第二夾塊共同夾持晶圓之周緣。 According to an embodiment of the present invention, the first supporting portion and the second supporting portion are ring-shaped, and the first clamping block and the second clamping block jointly clamp the peripheral edge of the wafer.

依據本發明之一實施例,上述之吹氣裝置包含第一吹氣單元及第二吹氣單元。第一吹氣單元與第二吹氣單 元沿著垂直於承載架之移動方向相對設置並形成吹氣通道。承載架可沿著載座移動並通過吹氣通道,且第一吹氣單元與第二吹氣單元配置以分別對承載架之相對二側吹氣。 According to an embodiment of the invention, the above-mentioned blowing device includes a first blowing unit and a second blowing unit. First blowing unit and second blowing unit The elements are arranged oppositely along the moving direction perpendicular to the carrier and form a blowing channel. The carrier can move along the carrier and pass through the blowing channel, and the first blowing unit and the second blowing unit are configured to blow the opposite sides of the carrier respectively.

依據本發明之一實施例,上述之每一個第一吹氣單元與第二吹氣單元的吹氣方向是相對載座傾斜45度到60度。 According to an embodiment of the present invention, the blowing direction of each of the first blowing unit and the second blowing unit described above is inclined by 45 degrees to 60 degrees relative to the carrier.

依據本發明之一實施例,上述之吹氣裝置更包含固定架、第一調整裝置以及第二調整裝置。固定架設置在載座之一側。第一調整裝置設置在固定架上,且配置以連接第一吹氣單元,以調整第一吹氣單元之吹氣方向。第二調整裝置設置在固定架上,且配置以連接第二吹氣單元,以調整第二吹氣單元之吹氣方向。 According to an embodiment of the present invention, the above-mentioned blowing device further includes a fixing frame, a first adjusting device and a second adjusting device. The fixing frame is arranged on one side of the carrier. The first adjusting device is disposed on the fixing frame and is configured to be connected to the first blowing unit to adjust the blowing direction of the first blowing unit. The second adjusting device is disposed on the fixing frame and is configured to be connected to the second blowing unit to adjust the blowing direction of the second blowing unit.

依據本發明之一實施例,上述之吹氣裝置更包含第一擋板以及第二擋板。第一擋板與第二擋板分別設置在第一吹氣單元與第二吹氣單元的前方。 According to an embodiment of the invention, the above-mentioned air blowing device further includes a first baffle and a second baffle. The first baffle and the second baffle are respectively disposed in front of the first blowing unit and the second blowing unit.

依據本發明之一實施例,上述之第一承載部與第二承載部之一側互相樞接,且樞接處連接旋轉氣壓缸。 According to an embodiment of the invention, one side of the first bearing portion and the second bearing portion are pivotally connected to each other, and the pivotal connection is connected to the rotary pneumatic cylinder.

由上述本發明實施方式可知,本發明之晶圓吹乾設備利用承載架夾持晶圓,並將晶圓運輸至吹氣裝置吹乾,故簡化了整體晶圓的吹乾步驟與時間。此外,晶圓的傳輸速度亦可搭配吹氣裝置之出風量及出風溫度來控制整體晶圓吹乾設備的製程時間。 It can be known from the above embodiments of the present invention that the wafer drying equipment of the present invention uses the carrier to hold the wafers and transport the wafers to the blowing device for drying, thus simplifying the drying process and time of the entire wafer. In addition, the wafer transfer speed can also be combined with the air volume and temperature of the air blowing device to control the process time of the overall wafer drying equipment.

另一方面,本發明之承載架具有第一夾塊與第二夾塊的設計,除了可共同夾持晶圓外,亦可在第一承載部 與第二承載部之間製造間隙,以利吹氣裝置將晶圓表面的液體排出。此外,本發明之第一夾塊與第二夾塊亦可進一步設計凸出部,以減少第一夾塊與第二夾塊夾持晶圓時的接觸面積,避免液體殘留於晶圓與夾塊之間。 On the other hand, the carrier of the present invention has the design of the first clamping block and the second clamping block. A gap is created between the second carrier and the air blowing device to expel the liquid on the surface of the wafer. In addition, the first clamping block and the second clamping block of the present invention can be further designed with protruding portions to reduce the contact area when the first clamping block and the second clamping block clamp the wafer, and to prevent liquid from remaining on the wafer and the clamping Between blocks.

100‧‧‧晶圓吹乾設備 100‧‧‧ Wafer Drying Equipment

200‧‧‧載座 200‧‧‧Carrier

300‧‧‧承載架 300‧‧‧Carrier

310‧‧‧第一承載部 310‧‧‧ First Carrying Department

311‧‧‧第一夾塊 311‧‧‧The first clamping block

311a‧‧‧第一表面 311a‧‧‧First surface

311b‧‧‧第一凸出部 311b‧‧‧First protrusion

311c‧‧‧第一斜面 311c‧‧‧First slope

311d‧‧‧第二斜面 311d‧‧‧Second slope

311e‧‧‧稜線 311e‧‧‧Edge

320‧‧‧第二承載部 320‧‧‧Second Carrying Department

321‧‧‧第二夾塊 321‧‧‧Second clamping block

321a‧‧‧第二表面 321a‧‧‧Second surface

321b‧‧‧第二凸出部 321b‧‧‧Second protrusion

321c‧‧‧第一斜面 321c‧‧‧First slope

321d‧‧‧第二斜面 321d‧‧‧Second slope

321e‧‧‧稜線 321e‧‧‧Edge

400‧‧‧吹氣裝置 400‧‧‧Blowing device

410‧‧‧第一吹氣單元 410‧‧‧First blow unit

420‧‧‧第二吹氣單元 420‧‧‧ Second blowing unit

430‧‧‧固定架 430‧‧‧Fixing frame

440‧‧‧第一調整裝置 440‧‧‧ First adjustment device

450‧‧‧第二調整裝置 450‧‧‧Second adjustment device

460‧‧‧第一擋板 460‧‧‧First baffle

470‧‧‧第二擋板 470‧‧‧Second baffle

500‧‧‧傳動裝置 500‧‧‧ Transmission

510‧‧‧滑軌 510‧‧‧slide

520‧‧‧滑塊 520‧‧‧slider

530‧‧‧伺服馬達 530‧‧‧Servo motor

540‧‧‧旋轉氣壓缸 540‧‧‧rotary pneumatic cylinder

610‧‧‧第一夾塊 610‧‧‧The first clamping block

610a‧‧‧第一表面 610a‧‧‧First surface

611‧‧‧第一凸出部 611‧‧‧The first protrusion

620‧‧‧第二夾塊 620‧‧‧Second clamping block

620a‧‧‧第二表面 620a‧‧‧Second surface

621‧‧‧第二凸出部 621‧‧‧Second protruding part

710‧‧‧第一夾塊 710‧‧‧First clamping block

711‧‧‧第一凸出部 711‧‧‧First protrusion

720‧‧‧第二夾塊 720‧‧‧Second clamping block

721‧‧‧第二凸出部 721‧‧‧Second protrusion

810‧‧‧第一夾塊 810‧‧‧The first clamping block

811‧‧‧第一凸出部 811‧‧‧First protrusion

820‧‧‧第二夾塊 820‧‧‧Second clamping block

821‧‧‧第二凸出部 821‧‧‧Second protrusion

910‧‧‧第一夾塊 910‧‧‧The first clamping block

911‧‧‧第一凸出部 911‧‧‧First protrusion

920‧‧‧第二夾塊 920‧‧‧Second clamping block

921‧‧‧第二凸出部 921‧‧‧Second protruding part

G1‧‧‧間距 G1‧‧‧spacing

S1‧‧‧上載側 S1‧‧‧Upload side

S2‧‧‧卸載側 S2‧‧‧Unloading side

W‧‧‧晶圓 W‧‧‧ Wafer

為了更完整了解實施例及其優點,現參照結合所附圖式所做之下列描述,其中:〔圖1〕係繪示依照本發明之一實施方式之一種晶圓吹乾設備之裝置示意圖;〔圖2〕係繪示依照本發明之一實施方式之一種晶圓吹乾設備之側面示意圖;〔圖3〕係繪示依照本發明之一實施方式之一種承載架之開啟狀態示意圖;〔圖4〕係繪示依照本發明之一實施方式之一種承載架之併合狀態示意圖;以及〔圖5A〕至〔圖5D〕係分別繪示依照本發明之一實施方式之具有不同結構設計之夾塊示意圖。 For a more complete understanding of the embodiment and its advantages, reference is now made to the following description made in conjunction with the accompanying drawings, wherein: [FIG. 1] is a schematic diagram of a device for drying a wafer according to an embodiment of the present invention; [FIG. 2] is a schematic side view of a wafer drying apparatus according to an embodiment of the present invention; [FIG. 3] is a schematic view of an open state of a carrier according to an embodiment of the present invention; [FIG. 4] It is a schematic diagram showing the merged state of a carrier according to an embodiment of the present invention; and [FIG. 5A] to [FIG. 5D] are diagrams showing clips with different structural designs according to an embodiment of the present invention. Schematic.

以下實施例中所提到的方向用語,例如「X方向」、「Y方向」、「Z方向」、「上面」或「下面」等,僅是參考附加圖式的方向。因此,使用的方向用語是用來說 明,而非用來限制本發明。 Directional terms mentioned in the following embodiments, such as "X direction", "Y direction", "Z direction", "upper surface" or "lower surface", etc., refer only to the directions of the attached drawings. Therefore, the directional terms used are Rather than limiting the invention.

請同時參照圖1及圖2,其係分別繪示依照本發明之一實施方式之一種晶圓吹乾設備之裝置示意圖及側面示意圖。本實施方式之晶圓吹乾設備100主要包含載座200、承載架300以及吹氣裝置400。如圖1及圖2所示,載座200沿著Y方向的相對兩側分別定義為上載側S1以及卸載側S2。在本實施例中,承載架300的初始位置位於載座200靠近上載側S1的位置,吹氣裝置400設置在載座200的上載側S1與卸載側S2之間。其中,承載架300主要是配置以承載晶圓W,且可滑動地設置在載座200上,藉此可將晶圓W從載座200的上載側S1輸送至吹氣裝置400吹乾後,再輸送至卸載側S2。在一實施例中,承載架300是透過傳動裝置500在載座200上滑移。如圖1及圖2所示,傳動裝置500包含滑軌510、滑塊520及伺服馬達530,有關滑軌510、滑塊520及伺服馬達530之設置位置將於後述。 Please refer to FIG. 1 and FIG. 2 at the same time, which are respectively a schematic diagram and a side schematic diagram of a wafer drying apparatus according to an embodiment of the present invention. The wafer drying apparatus 100 of this embodiment mainly includes a carrier 200, a carrier 300 and an air blowing device 400. As shown in FIGS. 1 and 2, opposite sides of the carrier 200 along the Y direction are respectively defined as an uploading side S1 and an unloading side S2. In this embodiment, the initial position of the carrier 300 is located on the carrier 200 near the upload side S1, and the air blowing device 400 is disposed between the upload side S1 and the unload side S2 of the carrier 200. Wherein, the carrier 300 is mainly configured to carry the wafer W, and is slidably disposed on the carrier 200, whereby the wafer W can be transported from the upload side S1 of the carrier 200 to the blowing device 400 to be dried, Then transport to the unloading side S2. In one embodiment, the carrier 300 slides on the carrier 200 through the transmission device 500. As shown in FIGS. 1 and 2, the transmission device 500 includes a slide rail 510, a slider 520, and a servo motor 530. The installation positions of the slide rail 510, the slider 520, and the servo motor 530 will be described later.

請繼續參照圖1及圖2,在一特定實施例中,載座200為長槽體設計或一般架體設計。如圖1所示,載座200的上方為開放式設計,內部具有裝配空間。在本實施例中,傳動裝置500的滑軌510是分別設置在載座200沿著X方向的相對二側,且滑軌510沿著Y方向延伸。在本實施例中,承載架300的相對二側分別連接滑塊520,且滑塊520設置在載座200的滑軌510上。伺服馬達530設置在載座200的一側,且可驅動滑塊520與承載架300在滑軌510滑移。 Please continue to refer to FIGS. 1 and 2. In a specific embodiment, the carrier 200 is a long slot body design or a general frame design. As shown in FIG. 1, the upper side of the carrier 200 is an open design and has an assembly space inside. In this embodiment, the slide rails 510 of the transmission device 500 are respectively disposed on two opposite sides of the carrier 200 along the X direction, and the slide rails 510 extend along the Y direction. In this embodiment, two opposite sides of the carrier 300 are connected to the slider 520 respectively, and the slider 520 is disposed on the slide rail 510 of the carrier 200. The servo motor 530 is disposed on one side of the carrier 200, and can drive the slider 520 and the carrier 300 to slide on the slide rail 510.

另請同時參照圖1及圖3,其中圖3係繪示依照 本發明之一實施方式之一種承載架之開啟狀態示意圖。在本實施例中,承載架300包含第一承載部310及第二承載部320,其中第一承載部310與第二承載部320可互相併合。在一實施例中,第一承載部310及第二承載部320的一側互相樞接,且樞接處連接一旋轉氣壓缸540,其可控制第一承載部310相對第二承載部320開啟。如圖3所示,第一承載部310上設有數個第一夾塊311,且第二承載部320上設有數個第二夾塊321。 Please also refer to Figure 1 and Figure 3, where Figure 3 shows the A schematic view of an open state of a carrier according to an embodiment of the present invention. In this embodiment, the carrier 300 includes a first carrier 310 and a second carrier 320, wherein the first carrier 310 and the second carrier 320 can be combined with each other. In one embodiment, one side of the first bearing portion 310 and the second bearing portion 320 are pivotally connected to each other, and a rotary pneumatic cylinder 540 is connected to the pivotal connection, which can control the first bearing portion 310 to open relative to the second bearing portion 320 . As shown in FIG. 3, the first carrying portion 310 is provided with a plurality of first clamping blocks 311, and the second carrying portion 320 is provided with a plurality of second clamping blocks 321.

請一併參照圖4,其係繪示依照本發明之一實施方式之一種承載架之併合狀態示意圖。在本實施例子中,第一夾塊311與第二夾塊321位於第一承載部310及第二承載部320之間,且第二夾塊321的位置與數量均與第一夾塊311的位置與數量互相對應。藉此,當第一承載部310及第二承載部320互相併合時,第一夾塊311與其對應的第二夾塊321可互相接合,而第一承載部未設置第一夾塊311的部分與第二承載部未設置第二夾塊321的部分之間具有一間距G1。具體而言,當晶圓W放置在承載架300時,承載架300的第一夾塊311與第二夾塊321可共同夾持晶圓W,且間距G1則可供晶圓W表面上的液體通過而排出。在一特定實施例中,第一承載部310及第二承載部320的形狀為圓環狀,其尺寸是設計成對應待吹乾之晶圓W的尺寸,且第一承載部310及第二承載部320共同夾持晶圓W的外周緣。 Please refer to FIG. 4 together, which shows a schematic diagram of a combined state of a carrier according to an embodiment of the present invention. In this embodiment, the first clamping block 311 and the second clamping block 321 are located between the first bearing portion 310 and the second bearing portion 320, and the position and number of the second clamping block 321 are the same as those of the first clamping block 311. Position and quantity correspond to each other. Thereby, when the first bearing portion 310 and the second bearing portion 320 merge with each other, the first clamping block 311 and its corresponding second clamping block 321 can be engaged with each other, and the first bearing portion does not have a portion of the first clamping block 311 There is a gap G1 between the portion of the second bearing portion where the second clamping block 321 is not provided. Specifically, when the wafer W is placed on the carrier 300, the first clamping block 311 and the second clamping block 321 of the carrier 300 can clamp the wafer W together, and the gap G1 is provided on the surface of the wafer W The liquid drains through. In a specific embodiment, the shapes of the first bearing portion 310 and the second bearing portion 320 are circular, and the size is designed to correspond to the size of the wafer W to be dried, and the first bearing portion 310 and the second The carrier 320 collectively clamps the outer periphery of the wafer W.

請再次參照圖3及圖4,在一實施例中,在每一個第一夾塊311中,第一夾塊311朝向其對應的第二夾塊 321具有第一表面311a,且第一表面311a上設有第一凸出部311b。同樣地,在每一個第二夾塊321中,第二夾塊321朝向其對應的第一夾塊311具有第二表面321a,且第二表面321a上設有第二凸出部321b。在本實施例中,第一凸出部311b與第二凸出部321b概成角錐形。如圖3所示,第一夾塊311的第一凸出部311b包含第一斜面311c及第二斜面311d,其中第一斜面311c及第二斜面311d互相連接而形成稜線311e。同樣地,第二夾塊321的第二凸出部321b包含第一斜面321c及第二斜面321d,其中第一斜面321c及第二斜面321d互相連接而形成稜線321e。藉此,當第一夾塊311與第二夾塊321共同夾持如圖1所示之晶圓W時,僅有第一夾塊311的稜線311e與第二夾塊321的稜線321e接觸晶圓W,且第一夾塊311的第一斜面311c及第二斜面311d與第二夾塊321的第一斜面321c及第二斜面321d均不接觸晶圓W而與晶圓W之間產生間隙,以加速液體排出。由此可知,透過第一夾塊311的第一凸出部311b與第二夾塊321的第二凸出部321b設計,可減小與晶圓W的接觸面積,進而避免液體殘留於晶圓W的夾持處。 Please refer to FIGS. 3 and 4 again. In an embodiment, in each first clamping block 311, the first clamping block 311 faces its corresponding second clamping block 321 has a first surface 311a, and a first protrusion 311b is provided on the first surface 311a. Similarly, in each second clamping block 321, the second clamping block 321 has a second surface 321a toward its corresponding first clamping block 311, and a second protrusion 321b is provided on the second surface 321a. In this embodiment, the first protrusion 311b and the second protrusion 321b are substantially pyramid-shaped. As shown in FIG. 3, the first protrusion 311b of the first clamping block 311 includes a first inclined surface 311c and a second inclined surface 311d, wherein the first inclined surface 311c and the second inclined surface 311d are connected to each other to form an ridge line 311e. Similarly, the second protrusion 321b of the second clamping block 321 includes a first inclined surface 321c and a second inclined surface 321d, wherein the first inclined surface 321c and the second inclined surface 321d are connected to each other to form an ridge line 321e. Thus, when the first clamping block 311 and the second clamping block 321 jointly clamp the wafer W as shown in FIG. 1, only the ridge line 311e of the first clamping block 311 and the ridge line 321e of the second clamping block 321 contact the crystal A circle W, and the first inclined surface 311c and the second inclined surface 311d of the first clamping block 311 and the first inclined surface 321c and the second inclined surface 321d of the second clamping block 321 do not contact the wafer W and a gap is formed between the wafer W To accelerate the discharge of liquid. It can be seen that the design of the first protruding portion 311b of the first clamping block 311 and the second protruding portion 321b of the second clamping block 321 can reduce the contact area with the wafer W, thereby preventing liquid from remaining on the wafer W's grip.

欲陳明者,本發明之第一夾塊與第二夾塊亦有不同的結構設計。請參照圖5A,圖5A係繪示依照本發明之一實施方式之具有不同結構設計之夾塊示意圖。在本實施例中,第一夾塊610與第二夾塊620的結構分別與前述之第一夾塊311與第二夾塊321的結構大致上相同,差異僅在於第一夾塊610之第一凸出部611與第二夾塊620上之第二凸出 部621具有不同的形狀。在本實施例中,第一凸出部611與第二凸出部621的為圓柱結構。如圖5A所示,第一凸出部611設置在第一夾塊610朝向第二夾塊620的第一表面610a上,第二凸出部621設置在第二夾塊620朝向第一夾塊610的第二表面620a上。藉此,當第一夾塊610與第二夾塊620共同夾持晶圓時,僅有第一凸出部611與第二凸出部621分別接觸晶圓的表面,而第一表面610a與第二表面620a均不接觸晶圓,藉此可降低夾塊與晶圓之接觸面積,避免液體殘留於夾塊與晶圓之間。 For clarity, the first clamping block and the second clamping block of the present invention also have different structural designs. Please refer to FIG. 5A, which is a schematic diagram of a clamping block with different structural designs according to an embodiment of the present invention. In this embodiment, the structures of the first clamping block 610 and the second clamping block 620 are substantially the same as the structures of the first clamping block 311 and the second clamping block 321 described above, the difference is only that the first clamping block 610 A protrusion 611 and the second protrusion on the second clamping block 620 The portion 621 has different shapes. In this embodiment, the first protrusion 611 and the second protrusion 621 have a cylindrical structure. As shown in FIG. 5A, the first protrusion 611 is disposed on the first surface 610a of the first clamping block 610 toward the second clamping block 620, and the second protrusion 621 is disposed on the second clamping block 620 toward the first clamping block 610 on the second surface 620a. Thereby, when the first clamping block 610 and the second clamping block 620 jointly clamp the wafer, only the first protruding portion 611 and the second protruding portion 621 respectively contact the surface of the wafer, and the first surface 610a and The second surface 620a does not contact the wafer, thereby reducing the contact area between the clamping block and the wafer, and preventing liquid from remaining between the clamping block and the wafer.

另請參照圖5B,圖5B係繪示依照本發明之一實施方式之具有不同結構設計之夾塊示意圖。在本實施例中,第一夾塊710與第二夾塊720的結構分別與圖5A之第一夾塊610與第二夾塊620的結構大致上相同,差異僅在於第一夾塊710之第一凸出部711與第二夾塊720上之第二凸出部721具有不同的形狀。在本實施例中,第一凸出部711與第二凸出部721分別為圓弧結構,同樣可達到如前述減少夾塊與晶圓之接觸面積的目的。 Please also refer to FIG. 5B. FIG. 5B is a schematic diagram of clips having different structural designs according to an embodiment of the present invention. In this embodiment, the structures of the first clamping block 710 and the second clamping block 720 are substantially the same as the structures of the first clamping block 610 and the second clamping block 620 of FIG. 5A, the difference is only in the structure of the first clamping block 710 The first protrusion 711 and the second protrusion 721 on the second clamping block 720 have different shapes. In this embodiment, the first protruding portion 711 and the second protruding portion 721 respectively have a circular arc structure, which can also achieve the purpose of reducing the contact area between the clamping block and the wafer as described above.

另請參照圖5C,圖5C係繪示依照本發明之一實施方式之具有不同結構設計之夾塊示意圖。在本實施例中,第一夾塊810與第二夾塊820的結構分別與圖5A之第一夾塊610與第二夾塊620的結構大致上相同,差異僅在於第一夾塊810之第一凸出部811與第二夾塊820上之第二凸出部821具有不同的形狀。在本實施例中,第一凸出部811與第二凸出部821分別為錐台結構,同樣可達到如前述減少夾塊 與晶圓之接觸面積的目的。 Please also refer to FIG. 5C, which is a schematic diagram of a clamping block with different structural designs according to an embodiment of the present invention. In this embodiment, the structures of the first clamping block 810 and the second clamping block 820 are respectively substantially the same as the structures of the first clamping block 610 and the second clamping block 620 of FIG. 5A, the only difference is that the first clamping block 810 The first protrusion 811 and the second protrusion 821 on the second clamping block 820 have different shapes. In this embodiment, the first protruding portion 811 and the second protruding portion 821 respectively have a truncated cone structure, which can also achieve the reduction of the clamping block as described above The purpose of the contact area with the wafer.

另請參照圖5D,圖5D係繪示依照本發明之一實施方式之具有不同結構設計之夾塊示意圖。在本實施例中,第一夾塊910與第二夾塊920的結構分別與圖5A之第一夾塊610與第二夾塊620的結構大致上相同,差異僅在於第一夾塊910之第一凸出部911與第二夾塊920上之第二凸出部921具有不同的形狀。在本實施例中,第一凸出部911與第二凸出部921分別為複數個細柱結構,同樣可達到如前述減少夾塊與晶圓之接觸面積的目的。 Please also refer to FIG. 5D, which is a schematic diagram of a clamping block having different structural designs according to an embodiment of the present invention. In this embodiment, the structures of the first clamping block 910 and the second clamping block 920 are substantially the same as the structures of the first clamping block 610 and the second clamping block 620 of FIG. 5A, the difference is only in the first clamping block 910 The first protrusion 911 and the second protrusion 921 on the second clamping block 920 have different shapes. In this embodiment, the first protruding portion 911 and the second protruding portion 921 are respectively a plurality of thin pillar structures, which can also achieve the purpose of reducing the contact area between the clamping block and the wafer as described above.

另請再次參照圖1及圖2,吹氣裝置400設置在載座200之上載側S1與卸載側S2之間,當承載架300承載晶圓W移動至吹氣裝置400的前方時,吹氣裝置400可朝向承載架300吹氣,以將晶圓W吹乾。在一些實施例中,吹氣裝置400包含第一吹氣單元410及第二吹氣單元420,且第一吹氣單元410及第二吹氣單元420是沿著垂直於承載架300之移動方向相對設置。具體而言,第一吹氣單元410及第二吹氣單元420可沿著Z軸方向相對設置。在一實施例中,第一吹氣單元410位於載座200的上方,第二吹氣單元420則是位於載座200的裝配空間中,且兩者間保持特定距離以形成吹氣通道。藉此,承載架300可沿著載座200移動並通過吹氣通道,以使第一吹氣單元410及第二吹氣單元420分別對位於承載架300上的晶圓W的相對二面(例如晶圓W的上表面與下表面)吹氣。 1 and FIG. 2 again, the blowing device 400 is disposed between the loading side S1 and the unloading side S2 on the carrier 200, and when the carrier 300 carries the wafer W to the front of the blowing device 400, blowing The device 400 may blow air toward the carrier 300 to dry the wafer W. In some embodiments, the blowing device 400 includes a first blowing unit 410 and a second blowing unit 420, and the first blowing unit 410 and the second blowing unit 420 are along a movement direction perpendicular to the carrier 300 Relative settings. Specifically, the first blowing unit 410 and the second blowing unit 420 may be oppositely arranged along the Z-axis direction. In one embodiment, the first blowing unit 410 is located above the carrier 200, and the second blowing unit 420 is located in the mounting space of the carrier 200, and a certain distance is maintained between the two to form a blowing channel. Thereby, the carrier 300 can move along the carrier 200 and pass through the blowing channel, so that the first blowing unit 410 and the second blowing unit 420 respectively face the opposite sides of the wafer W on the carrier 300 ( For example, the upper and lower surfaces of the wafer W) are blown.

請再次參照圖1及圖2,第一吹氣單元410及第 二吹氣單元420的吹氣方向是相對載座200傾斜40度到60度。具體而言,吹氣裝置400更包含固定架430、第一調整裝置440及第二調整裝置450。固定架430設置在載座200的至少一側。第一調整裝置440設置在固定架430上且連接第一吹氣單元410,配置以供操作者調整第一吹氣單元410的吹氣方向。第二調整裝置450設置在固定架430上且連接第二吹氣單元420,配置以供操作者調整第二吹氣單元420的吹氣方向。在一些實施例中,第一吹氣單元410與第二吹氣單元420為風刀裝置。如圖2所示,在一些實施例中,第一吹氣單元410與第二吹氣單元420的前方可分別設置第一擋板460及第二擋板470。同樣地,第一擋板460及第二擋板470之間保持特定距離以供承載架300通過。藉此,當承載架300沿著載座200移動並從第一擋板460及第二擋板470之間通過的同時,第一吹氣單元410及第二吹氣單元420分別朝向承載架300上的晶圓W上、下兩面吹氣所吹起的液體可被第一擋板460及第二擋板470阻隔,避免晶圓W上的液體進入第一吹氣單元410與第二吹氣單元420的後方。 1 and 2 again, the first blowing unit 410 and the first The blowing direction of the second blowing unit 420 is inclined by 40 degrees to 60 degrees relative to the carrier 200. Specifically, the air blowing device 400 further includes a fixing frame 430, a first adjusting device 440 and a second adjusting device 450. The fixing frame 430 is disposed on at least one side of the carrier 200. The first adjusting device 440 is disposed on the fixing frame 430 and connected to the first blowing unit 410, and is configured for an operator to adjust the blowing direction of the first blowing unit 410. The second adjusting device 450 is disposed on the fixing frame 430 and connected to the second blowing unit 420, and is configured for the operator to adjust the blowing direction of the second blowing unit 420. In some embodiments, the first blowing unit 410 and the second blowing unit 420 are air knife devices. As shown in FIG. 2, in some embodiments, a first baffle 460 and a second baffle 470 may be respectively disposed in front of the first blowing unit 410 and the second blowing unit 420. Similarly, a specific distance is maintained between the first baffle 460 and the second baffle 470 for the carrier 300 to pass through. Thereby, when the carrier 300 moves along the carrier 200 and passes between the first baffle 460 and the second baffle 470, the first blowing unit 410 and the second blowing unit 420 face the carrier 300, respectively The liquid blown by the upper and lower sides of the upper wafer W can be blocked by the first baffle 460 and the second baffle 470 to prevent the liquid on the wafer W from entering the first blowing unit 410 and the second blowing The rear of the unit 420.

由上述本發明實施方式可知,本發明之晶圓吹乾設備利用承載架夾持晶圓,並將晶圓運輸至吹氣裝置吹乾,故簡化了整體晶圓的吹乾步驟與時間。此外,晶圓的傳輸速度亦可搭配吹氣裝置之出風量及出風溫度來控制整體晶圓吹乾設備的製程時間。 It can be known from the above embodiments of the present invention that the wafer drying equipment of the present invention uses the carrier to hold the wafers and transport the wafers to the blowing device for drying, thus simplifying the drying process and time of the entire wafer. In addition, the wafer transfer speed can also be combined with the air volume and temperature of the air blowing device to control the process time of the overall wafer drying equipment.

另一方面,本發明之承載架具有第一夾塊與第 二夾塊的設計,除了可共同夾持晶圓外,亦可在第一承載部與第二承載部之間製造間隙,以利吹氣裝置將晶圓表面的液體排出。此外,本發明之第一夾塊與第二夾塊亦可進一步設計凸出部,以減少第一夾塊與第二夾塊夾持晶圓時的接觸面積,避免液體殘留於晶圓與夾塊之間。 On the other hand, the carrier of the present invention has a first clamping block and a first The design of the two clamping blocks not only can clamp the wafer together, but also can create a gap between the first carrying portion and the second carrying portion to facilitate the air blowing device to discharge the liquid on the surface of the wafer. In addition, the first clamping block and the second clamping block of the present invention can be further designed with protruding portions to reduce the contact area when the first clamping block and the second clamping block clamp the wafer, and to prevent liquid from remaining on the wafer and the clamping Between blocks.

雖然本發明已以實施例揭露如上,然其並非用以限定本發明,任何所屬技術領域中具有通常知識者,在不脫離本發明的精神和範圍內,當可作些許的更動與潤飾,故本發明的保護範圍當視後附的申請專利範圍所界定者為準。 Although the present invention has been disclosed as above with examples, it is not intended to limit the present invention. Any person with ordinary knowledge in the technical field can make some changes and modifications without departing from the spirit and scope of the present invention. The scope of protection of the present invention shall be subject to the scope defined in the appended patent application.

100‧‧‧晶圓吹乾設備 100‧‧‧ Wafer Drying Equipment

200‧‧‧載座 200‧‧‧Carrier

300‧‧‧承載架 300‧‧‧Carrier

310‧‧‧第一承載部 310‧‧‧ First Carrying Department

320‧‧‧第二承載部 320‧‧‧Second Carrying Department

400‧‧‧吹氣裝置 400‧‧‧Blowing device

410‧‧‧第一吹氣單元 410‧‧‧First blow unit

420‧‧‧第二吹氣單元 420‧‧‧ Second blowing unit

430‧‧‧固定架 430‧‧‧Fixing frame

440‧‧‧第一調整裝置 440‧‧‧ First adjustment device

450‧‧‧第二調整裝置 450‧‧‧Second adjustment device

500‧‧‧傳動裝置 500‧‧‧ Transmission

510‧‧‧滑軌 510‧‧‧slide

520‧‧‧滑塊 520‧‧‧slider

530‧‧‧伺服馬達 530‧‧‧Servo motor

540‧‧‧旋轉氣壓缸 540‧‧‧rotary pneumatic cylinder

W‧‧‧晶圓 W‧‧‧ Wafer

Claims (9)

一種晶圓吹乾設備,包含:一載座;一承載架,可移動地設置在該載座上,其中該承載架配置以承載一晶圓,且該承載架包含:一第一承載部,其中該第一承載部上設有複數個第一夾塊;以及一第二承載部,與該第一承載部互相併合,其中該第二承載部上設有複數個第二夾塊分別對應該些第一夾塊,其中該些第一夾塊與該些第二夾塊位於該第一承載部與該第二承載部之間,以使該第一承載部與該第二承載部間形成一距離;其中,每一該些第一夾塊朝向其對應之該第二夾塊之一第一表面上設有一第一凸出部,且每一該些第二夾塊朝向其對應之該第一夾塊之一第二表面上設有一第二凸出部,其中該些第一凸出部與該第二凸出部接觸該晶圓,該第一表面與該第二表面不接觸該晶圓;以及一吹氣裝置,設置在該載座上,配置以朝向該承載架吹氣。 A wafer drying equipment includes: a carrier; a carrier, which is movably disposed on the carrier, wherein the carrier is configured to carry a wafer, and the carrier includes: a first carrier, A plurality of first clamping blocks are provided on the first bearing portion; and a second bearing portion is merged with the first bearing portion, wherein a plurality of second clamping blocks are provided on the second bearing portion respectively corresponding to First clamping blocks, wherein the first clamping blocks and the second clamping blocks are located between the first bearing portion and the second bearing portion, so that the first bearing portion and the second bearing portion are formed A distance; wherein, each of the first clamping blocks is oriented toward its corresponding second clamping block on a first surface with a first protrusion, and each of the second clamping blocks is oriented toward its corresponding A second protrusion is provided on a second surface of the first clamping block, wherein the first protrusions and the second protrusion contact the wafer, and the first surface and the second surface do not contact the Wafer; and an air blowing device, disposed on the carrier, configured to blow air toward the carrier. 如申請專利範圍第1項所述之晶圓吹乾設備,其中每一該些第一凸出部與該些第二凸出部包含一圓柱結構、一圓弧結構、一角錐結構、一錐台結構、或複數 個細柱結構。 The wafer drying equipment as described in item 1 of the patent application, wherein each of the first protrusions and the second protrusions includes a cylindrical structure, a circular arc structure, a pyramid structure, and a cone Table structure, or plural A thin column structure. 如申請專利範圍第1項所述之晶圓吹乾設備,其中每一該些第一凸出部與該些第二凸出部具有一第一斜面以及一第二斜面,其中該第一斜面與該第二斜面共同形成一稜線,且該稜線接觸該晶圓。 The wafer blow-drying device as described in item 1 of the patent application scope, wherein each of the first protrusions and the second protrusions has a first inclined surface and a second inclined surface, wherein the first inclined surface A ridge line is formed together with the second inclined surface, and the ridge line contacts the wafer. 如申請專利範圍第1項所述之晶圓吹乾設備,其中該第一承載部與該第二承載部為環形,且該些第一夾塊與該些第二夾塊共同夾持該晶圓之周緣。 The wafer drying equipment as described in item 1 of the patent application scope, wherein the first bearing portion and the second bearing portion are ring-shaped, and the first clamping blocks and the second clamping blocks jointly hold the crystal The circumference of the circle. 如申請專利範圍第1項所述之晶圓吹乾設備,其中該吹氣裝置包含一第一吹氣單元及一第二吹氣單元,該第一吹氣單元及該第二吹氣單元沿著垂直於該承載架之移動方向相對設置並形成一吹氣通道;以及該承載架可沿著該載座移動並通過該吹氣通道,且該第一吹氣單元與該第二吹氣單元配置以分別對該承載架之相對二側吹氣。 The wafer drying equipment as described in item 1 of the patent application scope, wherein the blowing device includes a first blowing unit and a second blowing unit, the first blowing unit and the second blowing unit Opposite to the moving direction of the carrier and forming a blowing channel; and the carrier can move along the carrier and pass through the blowing channel, and the first blowing unit and the second blowing unit It is configured to blow the opposite sides of the carrier respectively. 如申請專利範圍第5項所述之晶圓吹乾設備,其中每一該第一吹氣單元與該第二吹氣單元的吹氣方向是相對該載座傾斜45度到60度。 The wafer drying equipment as described in item 5 of the patent application scope, wherein the blowing direction of each of the first blowing unit and the second blowing unit is inclined 45 degrees to 60 degrees relative to the carrier. 如申請專利範圍第5項所述之晶圓吹乾設備,其中該吹氣裝置更包含:一固定架,設置在該載座之一側;一第一調整裝置,設置在該固定架上且連接該第一吹氣單元,配置以調整該第一吹氣單元之吹氣方向;以及一第二調整裝置,設置在該固定架上且連接該第二吹氣單元,配置以調整該第二吹氣單元之吹氣方向。 The wafer drying equipment as described in item 5 of the patent application scope, wherein the blowing device further comprises: a fixing frame, which is arranged on one side of the carrier; and a first adjusting device, which is arranged on the fixing frame and Connected to the first blowing unit, configured to adjust the blowing direction of the first blowing unit; and a second adjusting device, disposed on the fixing frame and connected to the second blowing unit, configured to adjust the second The blowing direction of the blowing unit. 如申請專利範圍第5項所述之晶圓吹乾設備,其中該吹氣裝置更包含一第一擋板以及一第二擋板,該第一擋板以及該第二擋板分別設置在該第一吹氣單元與該第二吹氣單元的前方。 The wafer drying equipment as described in item 5 of the patent application scope, wherein the blowing device further includes a first baffle and a second baffle, the first baffle and the second baffle are respectively disposed on the In front of the first blowing unit and the second blowing unit. 如申請專利範圍第1項所述之晶圓吹乾設備,其中該第一承載部與該第二承載部之一側互相樞接,且樞接處連接一旋轉氣壓缸。 According to the wafer drying equipment described in item 1 of the patent application scope, one side of the first bearing portion and the second bearing portion are pivotally connected to each other, and a rotary pneumatic cylinder is connected to the pivotal connection.
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Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW487221U (en) * 2001-01-19 2002-05-11 Touchtek Corp Drying apparatus for wafer
US6732750B2 (en) * 2000-04-11 2004-05-11 Samsung Electronics Co., Ltd. Semiconductor wafer cleaning apparatus and method of using the same
US20150122635A1 (en) * 1999-05-18 2015-05-07 Ebara Corporation Semiconductor wafer holder and electroplating system for plating a semiconductor wafer

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20150122635A1 (en) * 1999-05-18 2015-05-07 Ebara Corporation Semiconductor wafer holder and electroplating system for plating a semiconductor wafer
US6732750B2 (en) * 2000-04-11 2004-05-11 Samsung Electronics Co., Ltd. Semiconductor wafer cleaning apparatus and method of using the same
TW487221U (en) * 2001-01-19 2002-05-11 Touchtek Corp Drying apparatus for wafer

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