TWI676797B - Optical film detecting device and optical film detecting method - Google Patents

Optical film detecting device and optical film detecting method Download PDF

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TWI676797B
TWI676797B TW108108120A TW108108120A TWI676797B TW I676797 B TWI676797 B TW I676797B TW 108108120 A TW108108120 A TW 108108120A TW 108108120 A TW108108120 A TW 108108120A TW I676797 B TWI676797 B TW I676797B
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optical film
light
component
item
application
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TW108108120A
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Chinese (zh)
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TW202033952A (en
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陳奕齊
I-Chi Chen
洪嘉嬬
Chia-Ju Hung
阮祺婷
Ci-ting RUAN
黃馨卉
Hsin-Hui Huang
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住華科技股份有限公司
Sumika Technology Co., Ltd.
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8806Specially adapted optical and illumination features
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8854Grading and classifying of flaws
    • G01N2021/8874Taking dimensions of defect into account

Abstract

本揭露提供一種光學膜檢測裝置,其係用於檢測光學膜之缺陷。所述裝置包括:一輸送系統、第一光源組件以及第一拍攝組件。輸送系統用以承載及輸送光學膜。第一光源組件設置於光學膜的一側,且提供第一光源,第一光源具有第一光軸。第一拍攝組件設置於光學膜的一側,且對光學膜的第一表面進行拍攝。此外,第一光源的第一光軸平行或偏離光學膜的第一表面。本揭露亦提供一種光學膜的檢測方法。The disclosure provides an optical film inspection device, which is used to detect defects of the optical film. The device includes a conveying system, a first light source component, and a first photographing component. The conveying system is used for carrying and conveying the optical film. The first light source component is disposed on one side of the optical film and provides a first light source. The first light source has a first optical axis. The first photographing component is disposed on one side of the optical film, and photographs a first surface of the optical film. In addition, the first optical axis of the first light source is parallel or offset from the first surface of the optical film. The disclosure also provides a method for detecting an optical film.

Description

光學膜檢測裝置及光學膜的檢測方法Optical film detection device and method

本揭露係關於一種光學膜檢測裝置,且特別是關於檢查光學膜之缺陷的光學膜檢測裝置以及包含所述裝置的檢測系統。This disclosure relates to an optical film inspection device, and more particularly, to an optical film inspection device for inspecting defects of an optical film and a detection system including the same.

光學膜廣泛應用於生活中的各種物件,例如,燈具的防眩光材料、車窗隔熱材料、數位相機的濾波材料、平面顯示器等。平面顯示器為近年來的重點發展產業之一,其中,液晶顯示器的產值又佔了平面顯示器產業的絕大部分。Optical films are widely used in various objects in life, such as anti-glare materials for lamps, window insulation materials, filter materials for digital cameras, and flat-panel displays. The flat panel display is one of the key development industries in recent years. Among them, the output value of liquid crystal displays accounts for most of the flat panel display industry.

應用於液晶顯示器的光學膜種類繁多,隨著液晶顯示器頻繁地應用於各種精密電子產品,例如,手機、穿戴式裝置、電腦等,產業界對於光學膜品質的要求也日益提高。而光學膜的生產製程為影響光學膜品質的根本,因此,提升光學膜生產製程的效率為重要課題之一。There are many types of optical films used in liquid crystal displays. With the frequent use of liquid crystal displays in various precision electronic products, such as mobile phones, wearable devices, computers, etc., the industry's requirements for the quality of optical films are also increasing. The production process of the optical film is the fundamental factor affecting the quality of the optical film. Therefore, improving the efficiency of the production process of the optical film is one of the important topics.

自動光學檢查(automated optical inspection,AOI)已廣泛地應用於生產光學膜製程的檢測系統,其可利用光學儀器取得光學膜半成品或成品的表面狀態,再以電腦影像處理技術檢測凹陷、刮傷或異物等瑕疵。一般而言,在自動光學檢查之後,會再利用人力進行分類或篩選等,因此,若自動光學檢查無法根據特定製程需求進行符合期望的檢測,將導致後續人員處理時間增加,進而增加人力成本。Automated optical inspection (AOI) has been widely used in inspection systems for the production of optical films. It can use optical instruments to obtain the surface state of semi-finished or finished optical films, and then use computer image processing technology to detect depressions, scratches or Defects such as foreign objects. Generally speaking, after the automatic optical inspection, human labor is used for classification or screening. Therefore, if the automatic optical inspection fails to perform the desired detection according to the specific process requirements, it will lead to an increase in the processing time of subsequent personnel and increase the labor cost.

雖然現存之光學膜檢測裝置可大致滿足它們原先預定的用途,但其仍未在各個方面皆徹底地符合需求。Although existing optical film inspection devices can roughly meet their originally intended uses, they have not completely met the requirements in every aspect.

根據本揭露一些實施例,提供一種光學膜檢測裝置,其係用於檢測光學膜之缺陷。所述光學膜檢測裝置包括:一輸送系統、第一光源組件以及第一拍攝組件。輸送系統用以承載及輸送光學膜。第一光源組件設置於光學膜的一側,且提供第一光源,第一光源具有第一光軸。第一拍攝組件設置於光學膜的一側,且對光學膜的第一表面進行拍攝。此外,第一光源的第一光軸平行或偏離光學膜的第一表面。According to some embodiments of the present disclosure, an optical film inspection device is provided, which is used to detect defects of the optical film. The optical film detection device includes a transport system, a first light source component, and a first photographing component. The conveying system is used for carrying and conveying the optical film. The first light source component is disposed on one side of the optical film and provides a first light source. The first light source has a first optical axis. The first photographing component is disposed on one side of the optical film, and photographs a first surface of the optical film. In addition, the first optical axis of the first light source is parallel or offset from the first surface of the optical film.

根據本揭露一些實施例,提供一種光學膜的檢測方法,其係用於檢測待測光學膜之缺陷。所述光學膜的檢測方法包括:以輸送系統承載及輸送待測光學膜、以第一光源組件提供第一光源以及以第一拍攝組件對待測光學膜的第一表面進行拍攝。此外,第一光源組件設置於待測光學膜的一側,且第一光源具有第一光軸。第一光源組件係偏移待測光學膜設置,使得第一光軸平行或偏離待測光學膜的第一表面。According to some embodiments of the present disclosure, a method for detecting an optical film is provided, which is used to detect defects of the optical film to be tested. The detection method of the optical film includes: carrying and conveying the optical film to be tested with a transport system, providing a first light source with a first light source component, and photographing a first surface of the optical film to be tested with a first photographing component. In addition, the first light source component is disposed on one side of the optical film to be measured, and the first light source has a first optical axis. The first light source component is disposed offset from the optical film to be measured, so that the first optical axis is parallel or offset from the first surface of the optical film to be measured.

為讓本揭露之特徵、或優點能更明顯易懂,下文特舉出較佳實施例,並配合所附圖式,作詳細說明如下。In order to make the features or advantages of this disclosure more obvious and easy to understand, the preferred embodiments are exemplified below, and will be described in detail with the accompanying drawings.

以下針對本揭露實施例的光學膜檢測裝置以及使用所述裝置進行的光學膜檢測方法作詳細說明。應了解的是,以下之敘述提供許多不同的實施例或例子,用以實施本揭露一些實施例之不同樣態。以下所述特定的元件及排列方式僅為簡單清楚描述本揭露一些實施例。當然,這些僅用以舉例而非本揭露之限定。此外,在不同實施例中可能使用類似及/或對應的標號標示類似及/或對應的元件,以清楚描述本揭露。然而,這些類似及/或對應的標號的使用僅為了簡單清楚地敘述本揭露一些實施例,不代表所討論之不同實施例及/或結構之間具有任何關連性。The optical film detection device and the optical film detection method using the device according to the embodiments of the disclosure are described in detail below. It should be understood that the following description provides many different embodiments or examples for implementing different aspects of some embodiments of the present disclosure. The specific components and arrangements described below are only a simple and clear description of some embodiments of the disclosure. Of course, these are only examples and not the limitations of this disclosure. In addition, similar and / or corresponding reference numerals may be used to indicate similar and / or corresponding elements in different embodiments to clearly describe the present disclosure. However, the use of these similar and / or corresponding reference numerals is only for simply and clearly describing some embodiments of the present disclosure, and does not represent any correlation between the different embodiments and / or structures discussed.

應理解的是,圖式之元件或裝置可以發明所屬技術領域具有通常知識者所熟知的各種形式存在。此外實施例中可能使用相對性用語,例如「較低」或「底部」或「較高」或「頂部」,以描述圖式的一個元件對於另一元件的相對關係。可理解的是,如果將圖式的裝置翻轉使其上下顛倒,則所敘述在「較低」側的元件將會成為在「較高」側的元件。本揭露實施例可配合圖式一併理解,本揭露之圖式亦被視為揭露說明之一部分。應理解的是,本揭露之圖式並未按照比例繪製,事實上,可能任意的放大或縮小元件的尺寸以便清楚表現出本揭露的特徵。It should be understood that, the elements or devices of the drawings may exist in various forms well known to those having ordinary knowledge in the technical field to which the invention belongs. In addition, relative terms such as "lower" or "bottom" or "higher" or "top" may be used in the embodiments to describe the relative relationship between one element and another element in the figure. It can be understood that if the illustrated device is turned upside down and turned upside down, the element described on the "lower" side will become the element on the "higher" side. The embodiments of the disclosure can be understood together with the drawings, and the drawings of the disclosure are also considered as a part of the disclosure description. It should be understood that the drawings of this disclosure are not drawn to scale. In fact, the dimensions of the components may be arbitrarily enlarged or reduced in order to clearly show the characteristics of this disclosure.

此外,圖式之元件或裝置可以發明所屬技術領域具有通常知識者所熟知的各種形式存在。此外,應理解的是,雖然在此可使用用語「第一」、「第二」、「第三」等來敘述各種元件、組件、或部分,這些元件、組件或部分不應被這些用語限定。這些用語僅是用來區別不同的元件、組件、區域、層或部分。因此,以下討論的一第一元件、組件、區域、層或部分可在不偏離本揭露之教示的情況下被稱為一第二元件、組件、區域、層或部分。In addition, the elements or devices of the drawings may exist in various forms known to those skilled in the art to which the invention belongs. In addition, it should be understood that although the terms "first", "second", "third", etc. may be used herein to describe various elements, components, or parts, these elements, components, or parts should not be limited by these terms . These terms are only used to distinguish different elements, components, regions, layers or sections. Thus, a first element, component, region, layer or section discussed below can be termed a second element, component, region, layer or section without departing from the teachings of this disclosure.

於文中,「約」、「大約」、「實質上」、「大致上」之用語通常表示在一給定值或範圍的20%內,較佳是10%內,更佳是5%內,或3%之內,或2%之內,或1%之內,或0.5%之內。在此給定的數量為大約的數量,亦即在沒有特定說明「約」、「大約」、「實質上」、「大致上」的情況下,仍可隱含「約」、「大約」、「實質上」、「大致上」之含義。此外,用語「在第一數值至第二數值的範圍中」、「範圍為第一數值至第二數值」表示所述範圍包含第一數值、第二數值以及它們之間的其它數值。In the text, the terms "about", "approximately", "substantially", and "approximately" are usually expressed within 20% of a given value or range, preferably within 10%, more preferably within 5%, Or within 3%, or within 2%, or within 1%, or within 0.5%. The number given here is an approximate number, that is, without approximation "about", "about", "substantially", "approximately", "about", "about", The meaning of "substantially" and "substantially". In addition, the terms "in the range of the first value to the second value" and "the range is the first value to the second value" indicate that the range includes the first value, the second value, and other values therebetween.

在本揭露一些實施例中,關於接合、連接之用語例如「連接」、「互連」等,除非特別定義,否則可指兩個結構係直接接觸,或者亦可指兩個結構並非直接接觸,其中有其它結構設於此兩個結構之間。且此關於接合、連接之用語亦可包括兩個結構都可移動,或者兩個結構都固定之情況。In some embodiments of the present disclosure, terms such as “connection” and “interconnection”, such as “joining” and “interconnecting”, may mean that two structures are in direct contact, or they may not be in direct contact, unless specifically defined. There are other structures between these two structures. Moreover, the term about joining and connecting may also include a case where both structures are movable or both structures are fixed.

在本揭露一些實施例中,用詞「光軸」可定義為與發光元件之發光面垂直之中心軸,一般而言,光軸會與發光元件的機械中心重合。In some embodiments of the present disclosure, the term “optical axis” may be defined as a central axis that is perpendicular to the light emitting surface of the light emitting element. Generally, the optical axis coincides with the mechanical center of the light emitting element.

除非另外定義,在此使用的全部用語(包含技術及科學用語)具有與本揭露所屬技術領域的技術人員通常理解的相同涵義。能理解的是,這些用語例如在通常使用的字典中定義用語,應被解讀成具有與相關技術及本揭露的背景或上下文一致的意思,而不應以一理想化或過度正式的方式解讀,除非在本揭露實施例有特別定義。Unless otherwise defined, all terms (including technical and scientific terms) used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this disclosure belongs. It can be understood that these terms, such as those defined in commonly used dictionaries, should be interpreted to have a meaning consistent with the relevant technology and the background or context of this disclosure, and should not be interpreted in an idealized or overly formal manner. Unless specifically defined in the disclosed embodiments.

本揭露實施例提供一種光學膜檢測裝置,其光源組件可提供光軸平行或偏離光學膜表面的光源,亦即,藉由平行光源或側光光源照射光學膜表面,以檢測光學膜上的缺陷如凹陷、水痕、刮痕或微小氣泡等。藉由此種配置,可更有效地檢測出現有自動光學檢查設備無法檢出的缺陷種類。根據本揭露一些實施例,可進一步針對檢出的缺陷進行影像後處理,藉此可濾除輕微缺陷,提升檢測效率及減少人力作業時間。The embodiment of the present disclosure provides an optical film inspection device, and a light source component thereof can provide a light source whose optical axis is parallel or deviated from the surface of the optical film, that is, the surface of the optical film is illuminated by a parallel light source or a side light source to detect defects on the optical film. Such as dents, water marks, scratches, or tiny bubbles. With this configuration, it is possible to more effectively detect the presence of types of defects that cannot be detected by automatic optical inspection equipment. According to some embodiments of the present disclosure, image post-processing may be further performed on the detected defects, thereby filtering out minor defects, improving detection efficiency, and reducing manual work time.

第1圖顯示根據本揭露一些實施例中,光學膜檢測裝置10的側視結構示意圖。應理解的是,根據一些實施例,可添加額外特徵於以下所述之光學膜檢測裝置10。在一些實施例中,光學膜檢測裝置10可用於檢測光學膜100的成品或半成品上的缺陷。所述光學膜100可為單層的光學膜或光學膜層疊體。在一些實施例中,光學膜檢測裝置10所處理的光學膜100以捲材形式存在。FIG. 1 is a schematic diagram of a side view structure of an optical film detection device 10 according to some embodiments of the present disclosure. It should be understood that according to some embodiments, additional features may be added to the optical film detection device 10 described below. In some embodiments, the optical film inspection device 10 may be used to detect defects on a finished product or a semi-finished product of the optical film 100. The optical film 100 may be a single-layer optical film or an optical film laminate. In some embodiments, the optical film 100 processed by the optical film detection device 10 exists in the form of a roll.

在一些實施例中,光學膜檢測裝置10可設置於用以貼合複數層光學膜的貼合滾輪(未繪示)的下游。在一些實施例中,光學膜檢測裝置10可設置於裁切機構(未繪示)的下游。應理解的是,可根據實際需求,將光學膜檢測裝置10設置於需要進行缺陷檢查的任意製程階段。In some embodiments, the optical film detection device 10 may be disposed downstream of a bonding roller (not shown) for bonding a plurality of layers of optical films. In some embodiments, the optical film detection device 10 may be disposed downstream of a cutting mechanism (not shown). It should be understood that, according to actual requirements, the optical film inspection device 10 may be set at any process stage where defect inspection is required.

請參照第1A圖,光學膜檢測裝置10可包含輸送系統200、第一光源組件300A以及第一拍攝組件400A。輸送系統200可用以承載及輸送光學膜100。在一些實施例中,輸送系統200可包含導輥,而光學膜100可以捲材形式經由導輥進行輸送。在一些實施例中,輸送系統200可包含輸送帶,而光學膜100可以片狀形式經由輸送帶進行輸送。如第1A圖所示,輸送系統200可將光學膜100沿著第一方向A1進行輸送。Referring to FIG. 1A, the optical film detection device 10 may include a transportation system 200, a first light source module 300A, and a first photographing module 400A. The transport system 200 can be used to carry and transport the optical film 100. In some embodiments, the conveying system 200 may include a guide roller, and the optical film 100 may be conveyed via the guide roller in the form of a roll. In some embodiments, the conveyor system 200 may include a conveyor belt, and the optical film 100 may be conveyed via the conveyor belt in sheet form. As shown in FIG. 1A, the transport system 200 can transport the optical film 100 along the first direction A1.

此外,光學膜100可具有第一表面100a以及與第一表面100a相對的第二表面100b。在一些實施例中,所述光學膜100可為一單層或多層膜材,包含對光學之增益、配向、補償、轉向、直交、擴散、保護、防黏、耐刮、抗眩、反射抑制、高折射率等有所助益的膜,例如,可為偏光膜、離型膜、廣視角膜、增亮膜、反射膜、保護膜、具有控制視角補償或雙折射(birefraction)等特性的配向液晶膜、硬塗膜、抗反射膜、防黏膜、擴散膜、防眩膜等各種表面經處理的膜或上述之組合,但不限於此。In addition, the optical film 100 may have a first surface 100a and a second surface 100b opposite to the first surface 100a. In some embodiments, the optical film 100 may be a single-layer or multi-layer film, including gain, alignment, compensation, steering, orthogonality, diffusion, protection, anti-sticking, scratch resistance, anti-glare, and reflection suppression for optics. And high-refractive films, such as polarizing films, release films, wide viewing angle films, brightness enhancement films, reflective films, protective films, and other characteristics that control viewing angle compensation or birefraction. Various surface-treated films such as an alignment liquid crystal film, a hard coat film, an anti-reflection film, an anti-adhesive film, a diffusion film, an anti-glare film, or a combination thereof, but are not limited thereto.

在一些實施例中,光學膜100可包含兩層保護層以及夾設於保護層之間的偏光膜。In some embodiments, the optical film 100 may include two protective layers and a polarizing film sandwiched between the protective layers.

在一些實施例中,所述保護膜可為單層或多層之結構,為透明性、機械強度、熱穩定性、水分阻隔性等優良之熱可塑性樹脂。熱可塑性樹脂可包括纖維素樹脂(例如,三醋酸纖維素(triacetate cellulose,TAC)或二醋酸纖維素(diacetate cellulose,DAC))、丙烯酸樹脂(例如,聚甲基丙烯酸甲酯(poly(methyl methacrylate),PMMA)、聚酯樹脂(例如,聚對苯二甲酸乙二酯(polyethylene terephthalate,PET)或聚萘二甲酸乙二酯)、烯烴樹脂、聚碳酸酯樹脂、環烯烴樹脂、定向拉伸性聚丙烯(oriented-polypropylene,OPP)、聚乙烯(polyethylene,PE)、聚丙烯(polypropylene,PP)、環烯烴聚合物(cyclic olefin polymer,COP)、環烯烴共聚合物(cyclic olefin copolymer,COC)或前述之組合。在一些實施例中,所述保護膜的材料可包含(甲基)丙烯酸系、胺基甲酸酯系、丙烯酸胺基甲酸酯系、環氧系、聚矽氧系等熱硬化性樹脂或紫外線硬化型樹脂。此外,亦可進一步對上述保護膜實行表面處理,例如,抗眩光處理、抗反射處理、硬塗處理、帶電防止處理或抗污處理等。In some embodiments, the protective film may have a single-layer or multi-layer structure, and is a thermoplastic resin with excellent transparency, mechanical strength, thermal stability, and moisture barrier properties. The thermoplastic resin may include a cellulose resin (for example, triacetate cellulose (TAC) or diacetate cellulose (DAC)), an acrylic resin (for example, poly (methyl methacrylate) ), PMMA), polyester resin (for example, polyethylene terephthalate (PET) or polyethylene naphthalate), olefin resin, polycarbonate resin, cycloolefin resin, oriented stretching Oriented polypropylene (OPP), polyethylene (PE), polypropylene (PP), cyclic olefin polymer (COP), cyclic olefin copolymer (COC) ) Or a combination thereof. In some embodiments, the material of the protective film may include (meth) acrylic, urethane, acrylic urethane, epoxy, polysiloxane Isothermally curable resin or UV-curable resin. In addition, the protective film may be further subjected to a surface treatment such as an anti-glare treatment, an anti-reflection treatment, a hard coating treatment, a charge prevention treatment, or Dirt treatment, etc.

在一些實施例中,所述偏光膜可由吸附配向之二色性色素之聚乙烯醇(polyvinyl alcohol,PVA)薄膜或由液晶材料摻附具吸收染料分子所形成。聚乙烯醇可藉由皂化聚乙酸乙烯酯而形成。在一些實施例中,聚乙酸乙烯酯可為乙酸乙烯酯之單聚物或乙酸乙烯酯及其它單體之共聚物等。上述其它單體可為不飽和羧酸類、烯烴類、不飽和磺酸類或乙烯基醚類等。在另一些實施例中,聚乙烯醇可為經改質的聚乙烯醇,例如,經醛類改質的聚乙烯甲醛、聚乙烯乙醛或聚乙烯丁醛等。In some embodiments, the polarizing film may be formed of a polyvinyl alcohol (PVA) film that adsorbs and aligns a dichroic pigment or a liquid crystal material doped with absorbing dye molecules. Polyvinyl alcohol can be formed by saponifying polyvinyl acetate. In some embodiments, the polyvinyl acetate may be a single polymer of vinyl acetate or a copolymer of vinyl acetate and other monomers. The other monomers may be unsaturated carboxylic acids, olefins, unsaturated sulfonic acids, vinyl ethers, and the like. In other embodiments, the polyvinyl alcohol can be modified polyvinyl alcohol, for example, aldehyde-modified polyvinyl formaldehyde, polyvinyl acetaldehyde, or polyvinyl butyral, and the like.

再者,請參照第1A圖,第一光源組件300A可設置於光學膜100的一側,且提供第一光源302a,第一光源302a具有第一光軸LX 1。根據一些實施例,第一光源302a的第一光軸LX 1平行或偏離光學膜100的第一表面100a。在一些實施例中,可將第一光源組件300A以實質上平行於光學膜100的第一表面100a的方向進行設置。在一些實施例中,第一光軸LX 1未與光學膜100或是光學膜100的第一表面100a相交。換言之,第一光源302a並未直接照射光學膜100,藉此可避免膜面過亮導致缺陷難以辨識。在一些實施例中,第一光源302a可以散射光的形式照射第一表面100a。 Further, referring to FIG. 1A, the first light source assembly 300A may be disposed on one side of the optical film 100 and provides a first light source 302 a having a first optical axis LX 1 . According to some embodiments, the first optical axis LX 1 of the first light source 302 a is parallel or offset from the first surface 100 a of the optical film 100. In some embodiments, the first light source assembly 300A may be disposed in a direction substantially parallel to the first surface 100 a of the optical film 100. In some embodiments, the first optical axis LX 1 does not intersect the optical film 100 or the first surface 100 a of the optical film 100. In other words, the first light source 302a does not directly irradiate the optical film 100, thereby avoiding that the film surface is too bright, which makes it difficult to identify defects. In some embodiments, the first light source 302a may illuminate the first surface 100a in the form of scattered light.

承前述,光學膜100沿第一方向A1傳送,在一些實施例中,第一方向A1與第一光軸LX 1的延伸線形成第一夾角θ 1(未繪示)。在一些實施例中,第一夾角θ 1的範圍可為約0度至約90度、約0度至約60度、約0度至約45度、或約0度至約35度。在一些實施例中,第一夾角θ 1為0度,如第1A圖所示。 According to the foregoing, the optical film 100 is transmitted along the first direction A1. In some embodiments, the first direction A1 and the extension line of the first optical axis LX 1 form a first included angle θ 1 (not shown). In some embodiments, the first included angle θ 1 may range from about 0 degrees to about 90 degrees, from about 0 degrees to about 60 degrees, from about 0 degrees to about 45 degrees, or from about 0 degrees to about 35 degrees. In some embodiments, the first included angle θ 1 is 0 degrees, as shown in FIG. 1A.

此外,在一些實施例中,第一光源組件300A可包含至少一組相對設置的發光元件304,發光元件304可各自提供第一光源302a。如第1A圖所示,發光元件304的發光面可彼此相對。在一些實施例中,相對設置的一組發光元件304所產生的第一光軸LX 1可實質上彼此重疊。在一些實施例中,所述第一光源組件300A可包含3組至15組之相對設置的發光元件304,較佳為5組至10組之相對設置的發光元件304,但本揭露不限於此。根據一些實施例,可根據製程或產品需求(例如,欲檢出的缺陷),調整合適的發光元件304的數量。 In addition, in some embodiments, the first light source assembly 300A may include at least one set of light emitting elements 304 opposite to each other, and the light emitting elements 304 may each provide a first light source 302a. As shown in FIG. 1A, the light emitting surfaces of the light emitting elements 304 may face each other. In some embodiments, the first optical axes LX 1 generated by a set of light emitting elements 304 disposed oppositely may substantially overlap each other. In some embodiments, the first light source assembly 300A may include 3 to 15 groups of light-emitting elements 304 arranged oppositely, preferably 5 to 10 groups of light-emitting elements 304 arranged oppositely, but the disclosure is not limited thereto . According to some embodiments, the number of suitable light-emitting elements 304 can be adjusted according to process or product requirements (for example, defects to be detected).

應理解的是,為了清楚說明,圖式中僅繪示部分的第一光源302a及第一光軸LX 1,實際上發光元件304均對應地具有第一光源302a及第一光軸LX 1It should be understood that, for the sake of clarity, only a part of the first light source 302 a and the first optical axis LX 1 are shown in the drawing. In fact, the light emitting elements 304 each have the first light source 302 a and the first optical axis LX 1 .

如第1A圖所示,根據一些實施例,複數組相對設置的發光元件304可以塔型方式進行堆疊,亦即,從靠近光學膜100的位置朝向遠離光學膜100的位置(例如,沿圖中所示的Z方向),發光元件304之間的間距逐漸縮小。具體而言,第一光源組件300A包含一組相對設置的第一發光元件304(標示為304a,以方便說明),以及設置此組第一發光元件304a上的另一組相對設置的第二發光元件304(標示為304b,以方便說明)。第一發光元件304a之間相隔第一距離D 1,第二發光元件304b之間相隔第二距離D 2。在一些實施例中,第二發光元件304b之間的第二距離D 2可小於第一發光元件304a之間的第一距離D 1As shown in FIG. 1A, according to some embodiments, the light-emitting elements 304 opposite to each other in a complex array may be stacked in a tower manner, that is, from a position near the optical film 100 to a position far from the optical film 100 (for example, along the figure Z direction shown), the distance between the light-emitting elements 304 gradually decreases. Specifically, the first light source assembly 300A includes a set of first light emitting elements 304 (labeled 304a for convenience) and a second set of second light emitting elements on the first light emitting element 304a. Element 304 (labeled 304b for convenience). The first light emitting elements 304a are separated by a first distance D 1 , and the second light emitting elements 304 b are separated by a second distance D 2 . In some embodiments, the second distance D 2 between the second light emitting elements 304 b may be smaller than the first distance D 1 between the first light emitting elements 304 a.

應理解的是,於此僅以第一發光元件304a及第二發光元件304b舉例說明,設置於它們之上的其它組發光元件304亦可以相同方式進行對應的配置。It should be understood that, only the first light-emitting element 304a and the second light-emitting element 304b are described as examples, and other groups of light-emitting elements 304 disposed on them can be correspondingly configured in the same manner.

承前述,第一光源組件300A可具有合適組數之相對設置的發光元件304。在一些實施例中,第一光源組件300A中最靠近第一拍攝組件400A的發光元件304的底部304p於光學膜100上形成投影P。根據一些實施例,所述發光元件304的底部304p可為發光元件304最靠近光學膜100的部分(點或邊緣)。在一些實施例中,最靠近第一拍攝組件400A的發光元件304的底部304p與投影P之間的連線與光學膜100的第一表面100a形成一夾角(未繪示),且所述夾角可為約90度。在一些實施例中,其它組發光元件304的底部304p與投影P之間的連線與光學膜100的第一表面100a所形成的夾角(未繪示)實質上可具有等差數列的關係。In accordance with the foregoing, the first light source assembly 300A may have a corresponding number of light emitting elements 304 arranged in opposite groups. In some embodiments, the bottom 304 p of the light emitting element 304 closest to the first photographing component 400A of the first light source component 300A forms a projection P on the optical film 100. According to some embodiments, the bottom 304 p of the light emitting element 304 may be a portion (point or edge) of the light emitting element 304 closest to the optical film 100. In some embodiments, the connecting line between the bottom 304p and the projection P of the light emitting element 304 closest to the first photographing component 400A forms an included angle (not shown) with the first surface 100a of the optical film 100, and the included angle It can be about 90 degrees. In some embodiments, the included angle (not shown) formed by the connection line between the bottom 304p and the projection P of the other group of light-emitting elements 304 and the first surface 100a of the optical film 100 may have an equal number sequence relationship.

具體而言,如第1A圖所示,各發光元件304的底部304p與投影P之間的連線與第一表面100a所形成的夾角之間可具有公差角度θ d。舉例而言,於第一光源組件300A具有5組發光元件304且最靠近第一拍攝組件400A的發光元件304的底部304p與投影P之間的連線與第一表面100a之間的夾角為90度的實施例中,公差角度θ d可為90/5度,即,18度。換言之,於前述實施例中,發光元件304的底部304p與投影P之間的連線與第一表面100a之間的夾角分別可為18度、36度、54度、72度及90度。 Specifically, as shown in FIG. 1A, a tolerance angle θ d may be included between a connection line between the bottom 304 p and the projection P of each light-emitting element 304 and the first surface 100 a. For example, the first light source assembly 300A has five groups of light emitting elements 304 and the angle between the line 304p of the light emitting element 304 closest to the first photographing element 400A and the projection P and the first surface 100a is 90. In an embodiment of degrees, the tolerance angle θ d may be 90/5 degrees, that is, 18 degrees. In other words, in the foregoing embodiment, the included angles between the line between the bottom 304p and the projection P of the light-emitting element 304 and the first surface 100a may be 18 degrees, 36 degrees, 54 degrees, 72 degrees, and 90 degrees, respectively.

舉例而言,於第一光源組件300A具有n組發光元件304且最靠近第一拍攝組件400A的發光元件304的底部304p與投影P之間的連線與第一表面100a之間的夾角為90度的其它實施例中,公差角度θ d可為90/n度。依據先前第一光源組件300A可包含3組至15組敘述可以理解,n=3~15,較佳為n=5~10。 For example, the first light source component 300A has n groups of light emitting elements 304 and the angle between the line 304p of the light emitting element 304 closest to the first photographing component 400A and the projection P and the first surface 100a is 90. In other embodiments, the tolerance angle θ d may be 90 / n degrees. It can be understood from the previous description that the first light source assembly 300A may include 3 groups to 15 groups, n = 3 ~ 15, preferably n = 5 ~ 10.

此外,在一些實施例中,最靠近光學膜100的發光元件304(304a)的底部304p與光學膜100的第一表面100a之間相隔第三距離D 3。根據一些實施例,所述第三距離D 3可為沿著光學膜100的法線方向(例如,圖中所示的Z方向)上之底部304p與光學膜100之間的距離。在一些實施例中,第三距離D 3的範圍為約10mm至約100mm、或約10mm至約40mm。 A third distance D 3 between the first surface 100a Additionally, in some embodiments, it is closest to the light emitting element 100 of the optical film 304 (304a) and the bottom of the optical film 100 304p. According to some embodiments, the third distance D 3 may be a distance between the bottom 304 p and the optical film 100 along a normal direction of the optical film 100 (eg, a Z direction shown in the figure). In some embodiments, the third distance D 3 ranges from about 10 mm to about 100 mm, or from about 10 mm to about 40 mm.

應注意的是,若發光元件304(304a)的底部304p與光學膜100之間的第三距離D 3過大(例如,大於100mm),則發光元件304提供的第一光源302a可能無法有效照射至光學膜100;反之,若第三距離D 3過小(例如,小於10mm),則光學膜100的膜面可能會過亮而造成缺陷不易辨識。 It should be noted that if the third distance D 3 between the bottom 304p of the light-emitting element 304 (304a) and the optical film 100 is too large (for example, greater than 100 mm), the first light source 302a provided by the light-emitting element 304 may not be effectively illuminated Optical film 100; On the other hand, if the third distance D 3 is too small (for example, less than 10 mm), the film surface of the optical film 100 may be too bright, making it difficult to identify defects.

在一些實施例中,最靠近第一拍攝組件400A的發光元件304的底部304p與光學膜100的第一表面100a之間相隔第四距離D 4。根據一些實施例,所述第四距離D 4可為沿著光學膜100的法線方向(例如,圖中所示的Z方向)上之底部304p與光學膜100之間的距離。在一些實施例中,第四距離D 4的範圍可為約200mm至約1000mm、約300mm至約900mm、或約400mm至約800mm,例如,約500mm。 In some embodiments, the first surface 100a between the light emitting element 400A closest to the first imaging component 304p and the bottom 100 of the optical film 304 are separated by a fourth distance D 4. According to some embodiments, the fourth distance D 4 may be a distance between the bottom 304 p and the optical film 100 along a normal direction of the optical film 100 (eg, a Z direction shown in the figure). In some embodiments, the fourth distance D 4 may range from about 200 mm to about 1000 mm, from about 300 mm to about 900 mm, or from about 400 mm to about 800 mm, for example, about 500 mm.

相似地,若最靠近第一拍攝組件400A的發光元件304的底部304p與光學膜100之間的第四距離D 4過大(例如,大於1000mm),則發光元件304提供的第一光源302a可能無法有效照射至光學膜100;反之,若第四距離D 4過小(例如,小於200mm),則光學膜100的膜面可能會過亮而造成缺陷不易辨識。 Similarly, if the fourth distance D 4 between the bottom 304 p of the light emitting element 304 closest to the first photographing component 400A and the optical film 100 is too large (for example, greater than 1000 mm), the first light source 302 a provided by the light emitting element 304 may fail. Effectively irradiate the optical film 100; conversely, if the fourth distance D 4 is too small (for example, less than 200 mm), the film surface of the optical film 100 may be too bright, making it difficult to identify defects.

特別地,於所述塔型堆疊的第一光源組件300A中,每一組發光元件304相對於的光學膜100的第一表面100a之距離及角度均不同,因此,可產生多種角度及強度的光線反射,可藉此濾除較輕微之變形缺陷。在一些實施例中,所述輕微之變形缺陷可能為光學膜100產品可容忍的缺陷,亦即,符合規格的缺陷。In particular, in the tower-type stacked first light source module 300A, the distance and angle of each group of light-emitting elements 304 relative to the first surface 100a of the optical film 100 are different, so that a variety of angles and intensities can be generated. Light reflections can be used to filter out minor deformation defects. In some embodiments, the slight deformation defect may be a defect that can be tolerated by the optical film 100 product, that is, a defect that meets specifications.

此外,在一些實施例中,發光元件304可包含發光二極體(LED)、微型發光二極體(micro LED、mini LED)、有機發光二極體(OLED)、量子點有機發光二極體(QLED)、其它合適之發光元件或前述之組合,但不限於此。In addition, in some embodiments, the light emitting element 304 may include a light emitting diode (LED), a micro light emitting diode (micro LED, mini LED), an organic light emitting diode (OLED), or a quantum dot organic light emitting diode. (QLED), other suitable light-emitting elements, or a combination of the foregoing, but is not limited thereto.

在一些實施例中,第一光源組件300A的發光元件304所提供的第一光源302a可包含可見光,例如,波長範圍可為約390nm至約780nm。在一些實施例中,發光元件304所提供的第一光源302a的色溫範圍可為約3000K至約6500K、約4000K至約6500K、或約5000K至約6000K。此外,根據一些實施例,可根據製程或產品需求(例如,欲檢出的缺陷種類),調整合適的第一光源302a的強度。In some embodiments, the first light source 302a provided by the light emitting element 304 of the first light source assembly 300A may include visible light, for example, the wavelength range may be about 390 nm to about 780 nm. In some embodiments, the color temperature range of the first light source 302a provided by the light emitting element 304 may be about 3000K to about 6500K, about 4000K to about 6500K, or about 5000K to about 6000K. In addition, according to some embodiments, the intensity of the appropriate first light source 302a may be adjusted according to the process or product requirements (for example, the type of defect to be detected).

此外,請參照第1A圖,第一拍攝組件400A可設置於光學膜100的一側,且對光學膜100的第一表面100a進行拍攝。詳細而言,第一拍攝組件400A可拍攝第一表面100a產生的反射光像。如第1A圖所示,在一些實施例中,第一光源組件300A與第一拍攝組件400A可設置於光學膜100的同一側,且第一光源組件300A可設置於第一拍攝組件400A與光學膜100之間。In addition, referring to FIG. 1A, the first photographing component 400A may be disposed on one side of the optical film 100 and photograph the first surface 100 a of the optical film 100. In detail, the first photographing component 400A can photograph a reflected light image generated by the first surface 100a. As shown in FIG. 1A, in some embodiments, the first light source component 300A and the first photographing component 400A may be disposed on the same side of the optical film 100, and the first light source component 300A may be disposed on the first photographing component 400A and optical Between the films 100.

在一些實施例中,第一拍攝組件400A可包含感光耦合裝置(charge coupled device,CCD)照像機或攝影機,可將影像轉變為電子訊號,亦即,將影像數位數據化。在一些實施例中,第一拍攝組件400A可包含鏡頭單元402,鏡頭單元402可具有中心軸402X。根據一些實施例,所述中心軸402X為鏡頭單元402於光學膜100的第一表面100a的法線方向(例如,圖中所示的Z方向)上的中心軸。在一些實施例中,第一光源302a的第一光軸LX 1與鏡頭單元402的中心軸402X之間具有第二夾角θ 2。在一些實施例中,第二夾角θ 2的範圍為約30度至約90度、約45度至約90度、或約60度至約90度。在一些實施例中,第二夾角θ 2為約90度。 In some embodiments, the first photographing component 400A may include a charge coupled device (CCD) camera or a video camera, which may convert an image into an electronic signal, that is, digitize the image digitally. In some embodiments, the first photographing assembly 400A may include a lens unit 402, and the lens unit 402 may have a central axis 402X. According to some embodiments, the central axis 402X is a central axis of the lens unit 402 in a normal direction (for example, the Z direction shown in the figure) of the first surface 100 a of the optical film 100. In some embodiments, there is a second included angle θ 2 between the first optical axis LX 1 of the first light source 302 a and the central axis 402X of the lens unit 402. In some embodiments, the second included angle θ 2 ranges from about 30 degrees to about 90 degrees, from about 45 degrees to about 90 degrees, or from about 60 degrees to about 90 degrees. In some embodiments, the second included angle θ 2 is about 90 degrees.

再者,在一些實施例中,鏡頭單元402與最靠近第一拍攝組件400A的發光元件304之間相隔第五距離D 5。根據一些實施例,所述第五距離D 5可為沿著光學膜100的法線方向(例如,圖中所示的Z方向)上之鏡頭單元402與發光元件304之間的距離。在一些實施例中,第五距離D 5的範圍為約50mm至約400mm、或約100mm至約300mm,例如,約200mm。 Furthermore, in some embodiments, the lens unit 402 is separated from the light emitting element 304 closest to the first photographing component 400A by a fifth distance D 5 . According to some embodiments, the fifth distance D 5 may be a distance between the lens unit 402 and the light emitting element 304 in a normal direction of the optical film 100 (for example, a Z direction shown in the figure). In some embodiments, the fifth distance D 5 ranges from about 50 mm to about 400 mm, or from about 100 mm to about 300 mm, for example, about 200 mm.

應注意的是,若鏡頭單元402與最靠近第一拍攝組件400A的發光元件304之間的第五距離D 5過大(例如,大於400mm)或過小(例如,小於50mm),則第一拍攝組件400A可能無法有效進行取像。 It should be noted that if the fifth distance D 5 between the lens unit 402 and the light emitting element 304 closest to the first photographing component 400A is too large (for example, greater than 400 mm) or too small (for example, less than 50 mm), the first photographing component 400A may not be effective for image acquisition.

此外,根據一些實施例,光學膜檢測裝置10更包含影像判斷系統500,影像判斷系統500可與第一拍攝組件400A耦接。影像判斷系統500可進一步對第一拍攝組件400A拍攝到的影像所產生之電子訊號進行處理。在一些實施例中,影像判斷系統500可根據從光學膜100的第一表面100a反射的光線的亮度差異,判斷光學膜100的第一表面100a上是否存在缺陷。具體而言,缺陷處會產生與正常區域不同方向之反射,使得第一拍攝組件400A的一部分像素接收到不同的亮度,因此,缺陷處在形成的影像上會與其它區域明顯不同。舉例而言,缺陷處的亮度可能較低,而不具有缺陷的平坦部分的亮度可能較高。In addition, according to some embodiments, the optical film detection device 10 further includes an image determination system 500, and the image determination system 500 may be coupled to the first photographing component 400A. The image determination system 500 may further process the electronic signals generated by the images captured by the first shooting component 400A. In some embodiments, the image determination system 500 may determine whether there is a defect on the first surface 100 a of the optical film 100 according to the brightness difference of the light reflected from the first surface 100 a of the optical film 100. Specifically, the defect will generate reflections in different directions from the normal area, so that some pixels of the first shooting component 400A receive different brightness. Therefore, the defect formed in the image will be significantly different from other areas. For example, the brightness at a defect may be low, and the brightness of a flat portion without a defect may be high.

在一些實施例中,影像判斷系統500可包含軟體及硬體(中央處理器(central process unit,CPU)、記憶體等),亦可包含特殊應用積體電路(application-specific integrated circuit,ASIC)、專用電路、韌體等。影像判斷系統500的影像處理可藉由前述元件之協同作用來實現。In some embodiments, the image determination system 500 may include software and hardware (central processing unit (CPU), memory, etc.), and may also include application-specific integrated circuits (ASICs). , Dedicated circuits, firmware, etc. The image processing of the image determination system 500 can be realized by the synergy of the aforementioned components.

接著,請參照第1B圖,第1B圖顯示根據本揭露一些實施例中,光學膜檢測裝置10的上視結構示意圖。如第1B圖所示,第一拍攝組件400A可設置於第一光源組件300A之間。在一些實施例中,第一拍攝組件400A實質上設置於第一光源組件300A的正中間,換言之,第一拍攝組件400A與兩側之第一光源組件300A之間的距離大致相同。Next, please refer to FIG. 1B. FIG. 1B shows a schematic diagram of a top view structure of the optical film detection device 10 according to some embodiments of the present disclosure. As shown in FIG. 1B, the first photographing component 400A may be disposed between the first light source components 300A. In some embodiments, the first photographing component 400A is disposed substantially in the middle of the first light source component 300A. In other words, the distance between the first photographing component 400A and the first light source components 300A on both sides is substantially the same.

再者,第一光源組件300A的發光元件304具有寬度W 1,光學膜100具有幅寬W 2。根據一些實施例,所述寬度W 1為發光元件304於實質上垂直於光學膜100傳送的第一方向A1之方向(例如,圖中所示的Y方向)上的寬度。在一些實施例中,發光元件304的寬度W 1大於光學膜100的幅寬W 2。第一光源組件300A提供的第一光源302a可完整地照射光學膜100的第一表面100a。 Furthermore, the light emitting element 304 of the first light source module 300A has a width W 1 , and the optical film 100 has a width W 2 . According to some embodiments, the width W 1 is a width of the light emitting element 304 in a direction (eg, a Y direction shown in the figure) that is substantially perpendicular to the first direction A1 transmitted by the optical film 100. In some embodiments, the width W 1 of the light emitting element 304 is larger than the width W 2 of the optical film 100. The first light source 302 a provided by the first light source assembly 300A may completely illuminate the first surface 100 a of the optical film 100.

此外,如第1B圖所示,在一些實施例中,光學膜檢測裝置10可具有複數個第一拍攝組件400A。在一些實施例中,可根據光學膜100的最大幅寬決定適合數量的第一拍攝組件400A,詳細而言,第一拍攝組件400A的全視野幅寬需大於光學膜100的最大幅寬。In addition, as shown in FIG. 1B, in some embodiments, the optical film detection device 10 may have a plurality of first photographing components 400A. In some embodiments, a suitable number of first photographing components 400A may be determined according to the maximum width of the optical film 100. In detail, the full-field width of the first photographing component 400A needs to be greater than the maximum width of the optical film 100.

一般而言,單一角度照射的光源組件,其較難直接辨識缺陷形態且因無法利用其它角度的光源進行補光,因此無法有效過濾程度不同之缺陷。相較於採用單一角度照射的光源組件的光學膜檢測裝置,前述光學膜檢測裝置10可利用不同角度及距離的光源照射光學膜100,可多角度地對缺陷進行補光進而辨識程度不同之缺陷,藉此可濾除不欲檢出之輕微的缺陷。在一些實施例中,光學膜檢測裝置10可檢出之缺陷最小尺寸可為約1個像素(例如,約30μm或33μm)。此外,在一些實施例中,光學膜檢測裝置10可主要針對光學膜100上的凹陷缺陷進行檢測。Generally speaking, it is difficult for a light source component illuminated by a single angle to directly identify the defect form, and it is not possible to effectively filter defects of different degrees because it cannot use light sources of other angles to supplement the light. Compared to the optical film detection device using a single-angle light source assembly, the aforementioned optical film detection device 10 can irradiate the optical film 100 with light sources of different angles and distances, and can supplement defects at multiple angles to identify defects of different degrees. This can filter out minor defects that are not intended to be detected. In some embodiments, the minimum size of the defect detectable by the optical film inspection device 10 may be about 1 pixel (for example, about 30 μm or 33 μm). In addition, in some embodiments, the optical film detection device 10 may mainly detect pit defects on the optical film 100.

接著,請參照第2圖,第2圖顯示根據本揭露另一些實施例中,光學膜檢測裝置20的側視結構示意圖。應理解的是,後文中與前文相同或相似的組件或元件將以相同或相似之標號表示,其材料與功能皆與前文所述相同或相似,故此部分在後文中將不再贅述。Next, please refer to FIG. 2. FIG. 2 is a schematic diagram illustrating a side view of the optical film detection device 20 according to other embodiments of the present disclosure. It should be understood that the same or similar components or elements in the following will be denoted by the same or similar reference numerals, and their materials and functions are the same as or similar to those described in the foregoing, so this part will not be repeated in the following.

第2圖所示的光學膜檢測裝置20與第1A圖所示的光學膜檢測裝置10大致相似,其差異在於,於此實施例中,光學膜檢測裝置20進一步包含第二光源組件300B以及第二拍攝組件400B。於此實施例中,光學膜檢測裝置20可同時對光學膜100的第一表面100a及第二表面100b進行檢測。The optical film detection device 20 shown in FIG. 2 is substantially similar to the optical film detection device 10 shown in FIG. 1A, and the difference is that in this embodiment, the optical film detection device 20 further includes a second light source module 300B and a first light source module 300B. Two shooting components 400B. In this embodiment, the optical film detection device 20 can simultaneously detect the first surface 100 a and the second surface 100 b of the optical film 100.

詳細而言,第二光源組件300B與第一光源組件300B可分別設置於光學膜100的相對兩側,第二拍攝組件400B與第一拍攝組件400A亦設置於光學膜100的相對兩側。在一些實施例中,第二光源組件300B與第二拍攝組件400B可設置於光學膜100的同一側,且第二光源組件300B可設置於第二拍攝組件400B與光學膜100之間。In detail, the second light source module 300B and the first light source module 300B may be respectively disposed on opposite sides of the optical film 100, and the second photographing module 400B and the first photographing module 400A are also disposed on opposite sides of the optical film 100. In some embodiments, the second light source component 300B and the second photographing component 400B may be disposed on the same side of the optical film 100, and the second light source component 300B may be disposed between the second photographing component 400B and the optical film 100.

再者,第二拍攝組件400B可對光學膜100的第二表面100b進行拍攝,第二光源組件300B可提供第二光源302b,第二光源302b具有第二光軸LX 2。根據一些實施例,第二光軸LX 2平行或偏離光學膜100的第二表面100b。在一些實施例中,可將第二光源組件300B以實質上平行於光學膜100的第二表面100b的方向進行設置。在一些實施例中,第二光軸LX 2未與光學膜100或是光學膜100的第二表面100b相交。此外,在一些實施例中,第二光源組件300B與第一光源組件300A實質上以光學膜100為基準,對稱地進行設置。第二光源組件300B的配置方式大致上與第一光源組件300A的配置方式相同。 Furthermore, the second photographing component 400B can photograph the second surface 100b of the optical film 100, and the second light source component 300B can provide a second light source 302b, and the second light source 302b has a second optical axis LX 2 . According to some embodiments, the second optical axis LX 2 is parallel or offset from the second surface 100 b of the optical film 100. In some embodiments, the second light source assembly 300B may be disposed in a direction substantially parallel to the second surface 100 b of the optical film 100. In some embodiments, the second optical axis LX 2 does not intersect the optical film 100 or the second surface 100 b of the optical film 100. In addition, in some embodiments, the second light source module 300B and the first light source module 300A are substantially symmetrically disposed with reference to the optical film 100. The arrangement of the second light source assembly 300B is substantially the same as the arrangement of the first light source assembly 300A.

此外,在一些實施例中,光學膜100傳送的第一方向A1與第二光軸LX 2的延伸線形成第一夾角θ 1’(未繪示),第一夾角θ 1’的範圍可為約0度至約45度、約0度至約40度、或約0度至約35度。在一些實施例中,第一夾角θ 1’為0度,如第2圖所示。 In addition, in some embodiments, the first direction A1 and the extension line of the second optical axis LX 2 transmitted by the optical film 100 form a first included angle θ 1 ′ (not shown), and the range of the first included angle θ 1 ′ may be About 0 degrees to about 45 degrees, about 0 degrees to about 40 degrees, or about 0 degrees to about 35 degrees. In some embodiments, the first included angle θ 1 ′ is 0 degrees, as shown in FIG. 2.

相似地,在一些實施例中,第二光源組件300B可包含至少一組相對設置的發光元件304,發光元件304可各自提供第二光源302b。如第2圖所示,發光元件304的發光面可彼此相對。在一些實施例中,相對設置的一組發光元件304所產生的第二光軸LX 2可實質上彼此重疊。在一些實施例中,所述第二光源組件300B可包含3組至15組之相對設置的發光元件304,較佳為5組至10組之相對設置的發光元件304,但本揭露不限於此。根據一些實施例,可根據製程或產品需求(例如,欲檢出的缺陷),調整合適的發光元件304的數量。 Similarly, in some embodiments, the second light source assembly 300B may include at least one set of light emitting elements 304 opposite to each other, and the light emitting elements 304 may each provide a second light source 302b. As shown in FIG. 2, the light emitting surfaces of the light emitting elements 304 may face each other. In some embodiments, the second optical axis LX 2 generated by a set of light emitting elements 304 disposed oppositely may substantially overlap each other. In some embodiments, the second light source assembly 300B may include 3 to 15 groups of light-emitting elements 304 disposed oppositely, preferably 5 to 10 groups of light-emitting elements 304 disposed oppositely, but the disclosure is not limited thereto . According to some embodiments, the number of suitable light-emitting elements 304 can be adjusted according to process or product requirements (for example, defects to be detected).

如第2圖所示,根據一些實施例,第二光源組件300B的複數組相對設置的發光元件304亦可以塔型方式進行堆疊,亦即,從靠近光學膜100的位置朝向遠離光學膜100的位置(例如,沿圖中所示的-Z方向),發光元件304之間的間距逐漸縮小。As shown in FIG. 2, according to some embodiments, the light emitting elements 304 opposite to each other in a plurality of arrays of the second light source module 300B may be stacked in a tower manner, that is, from a position close to the optical film 100 toward a distance from the optical film 100. At the position (for example, in the -Z direction shown in the figure), the interval between the light emitting elements 304 gradually decreases.

此外,在一些實施例中,於第二發光組件300B中,最靠近光學膜100的發光元件304的頂部304t與光學膜100的第二表面100b之間相隔第三距離D 3’。根據一些實施例,所述發光元件304的頂部304t可為發光元件304最靠近光學膜100的部分(點或邊緣)。根據一些實施例,所述第三距離D 3’可為沿著光學膜100的法線方向(例如,圖中所示的Z方向)上之頂部304t與光學膜100之間的距離。在一些實施例中,第三距離D 3’的範圍為約10mm至約100mm、或約10mm至約40mm。 In addition, in some embodiments, in the second light-emitting component 300B, the top 304t of the light-emitting element 304 closest to the optical film 100 and the second surface 100b of the optical film 100 are separated by a third distance D 3 ′. According to some embodiments, the top 304t of the light emitting element 304 may be a portion (point or edge) of the light emitting element 304 closest to the optical film 100. According to some embodiments, the third distance D 3 ′ may be a distance between the top 304 t and the optical film 100 along a normal direction of the optical film 100 (eg, a Z direction shown in the figure). In some embodiments, the third distance D 3 ′ ranges from about 10 mm to about 100 mm, or from about 10 mm to about 40 mm.

在一些實施例中,於第二發光組件300B中,最靠近第二拍攝組件400B的發光元件304的頂部304t與光學膜100的第二表面100b之間相隔第四距離D 4’。根據一些實施例,所述第四距離D 4’可為沿著光學膜100的法線方向(例如,圖中所示的Z方向)上之頂部304t與光學膜100之間的距離。在一些實施例中,第四距離D 4’的範圍可為約200mm至約1000mm、約300mm至約900mm、或約400mm至約800mm,例如,約500mm。 In some embodiments, in the second light emitting component 300B, the top 304t of the light emitting element 304 closest to the second photographing component 400B and the second surface 100b of the optical film 100 are separated by a fourth distance D 4 ′. According to some embodiments, the fourth distance D 4 ′ may be a distance between the top 304 t in the normal direction of the optical film 100 (for example, the Z direction shown in the figure) and the optical film 100. In some embodiments, the fourth distance D 4 ′ may range from about 200 mm to about 1000 mm, from about 300 mm to about 900 mm, or from about 400 mm to about 800 mm, for example, about 500 mm.

在一些實施例中,第二拍攝組件400B的發光元件304所提供的第二光源302b可包含可見光,例如,波長範圍可為約390nm至約780nm。在一些實施例中,發光元件304所提供的第二光源302b的色溫範圍可為約3000K至約6500K、約4000K至約6500K、或約5000K至約6000K。此外,根據一些實施例,可根據製程或產品需求(例如,欲檢出的缺陷種類),調整合適的第二光源302b的強度。在一些實施例中,第一光源302a與第二光源302b的波長及/或色溫可相同或不同。In some embodiments, the second light source 302b provided by the light emitting element 304 of the second photographing component 400B may include visible light, for example, the wavelength range may be about 390 nm to about 780 nm. In some embodiments, the color temperature range of the second light source 302b provided by the light emitting element 304 may be about 3000K to about 6500K, about 4000K to about 6500K, or about 5000K to about 6000K. In addition, according to some embodiments, the intensity of the appropriate second light source 302b can be adjusted according to the process or product requirements (for example, the type of defect to be detected). In some embodiments, the wavelength and / or color temperature of the first light source 302a and the second light source 302b may be the same or different.

此外,第二拍攝組件400B可包含感光耦合裝置(charge coupled device,CCD)照像機或攝影機,可將影像轉變為電子訊號,亦即,將影像數位數據化。在一些實施例中,第二拍攝組件400B可包含鏡頭單元402,鏡頭單元402可具有中心軸402X’。根據一些實施例,所述中心軸402X’為鏡頭單元402於光學膜100的第二表面100a的法線方向(例如,圖中所示的Z方向)上的中心軸。在一些實施例中,第二光源302b的第二光軸LX 2與鏡頭單元402的中心軸402X’之間具有第二夾角θ 2’。在一些實施例中,第二夾角θ 2’的範圍為約30度至約90度、約45度至約90度、或約60度至約90度。在一些實施例中,第二夾角θ 2’為約90度。 In addition, the second photographing module 400B may include a charge coupled device (CCD) camera or a video camera, which may convert an image into an electronic signal, that is, digitize the image digitally. In some embodiments, the second photographing assembly 400B may include a lens unit 402, and the lens unit 402 may have a central axis 402X ′. According to some embodiments, the central axis 402X ′ is a central axis of the lens unit 402 in a normal direction (for example, the Z direction shown in the figure) of the second surface 100 a of the optical film 100. In some embodiments, there is a second included angle θ 2 ′ between the second optical axis LX 2 of the second light source 302 b and the central axis 402X ′ of the lens unit 402. In some embodiments, the second included angle θ 2 ′ ranges from about 30 degrees to about 90 degrees, from about 45 degrees to about 90 degrees, or from about 60 degrees to about 90 degrees. In some embodiments, the second included angle θ 2 ′ is about 90 degrees.

再者,在一些實施例中,鏡頭單元402與最靠近第二拍攝組件400B的發光元件304之間相隔第五距離D 5’。根據一些實施例,所述第五距離D 5’可為沿著光學膜100的法線方向(例如,圖中所示的Z方向)上之鏡頭單元402與發光元件304之間的距離。在一些實施例中,第五距離D 5’的範圍為約50mm至約400mm、或約100mm至約300mm,例如,約200mm。 Furthermore, in some embodiments, the lens unit 402 is separated from the light emitting element 304 closest to the second photographing component 400B by a fifth distance D 5 ′. According to some embodiments, the fifth distance D 5 ′ may be a distance between the lens unit 402 and the light emitting element 304 in a normal direction of the optical film 100 (for example, a Z direction shown in the figure). In some embodiments, the fifth distance D 5 ′ ranges from about 50 mm to about 400 mm, or from about 100 mm to about 300 mm, for example, about 200 mm.

在一些實施例中,第二拍攝組件400B亦可進一步與影像判斷系統500耦接。在一些實施例中,第一拍攝組件400A及第二拍攝組件400B可耦接至同一個影像判斷系統500,亦即,影像判斷系統500可同時對第一拍攝組件400A及第二拍攝組件400B拍攝到的影像所產生之電子訊號進行處理。在一些實施例中,第一拍攝組件400A及第二拍攝組件400B可分開耦接至不同的影像判斷系統500。In some embodiments, the second shooting component 400B may be further coupled to the image determination system 500. In some embodiments, the first camera module 400A and the second camera module 400B may be coupled to the same image determination system 500, that is, the image camera system 500 may simultaneously shoot the first camera module 400A and the second camera module 400B. The electronic signals generated by the received images are processed. In some embodiments, the first shooting component 400A and the second shooting component 400B may be separately coupled to different image determination systems 500.

承前述,於光學膜檢測裝置20中,所述塔型堆疊的第一光源組件300A及第二光源組件300B,可同時對光學膜100的第一表面100a及第二表面100b進行多種角度及強度的光線照射,可藉此濾除較輕微之變形缺陷,減少後續人員篩檢所需的時間。According to the foregoing, in the optical film detection device 20, the tower-stacked first light source module 300A and the second light source module 300B can simultaneously perform multiple angles and intensities on the first surface 100a and the second surface 100b of the optical film 100. The light can be used to filter out minor deformation defects and reduce the time required for subsequent personnel screening.

接著,請參照第3A圖,第3A圖顯示根據本揭露另一些實施例中,光學膜檢測裝置30的側視結構示意圖。如第3A圖所示,光學膜檢測裝置30可包含輸送系統200、第一光源組件300A以及第一拍攝組件400A。於此實施例中,輸送系統200可包含導輥,而光學膜100可以捲材形式經由導輥進行輸送。於此實施例中,第一光源組件300A及第一拍攝組件400A可設置於具有上下位差的生產段。Next, please refer to FIG. 3A. FIG. 3A shows a schematic side view structure diagram of the optical film detection device 30 in other embodiments according to the present disclosure. As shown in FIG. 3A, the optical film detection device 30 may include a transport system 200, a first light source module 300A, and a first photographing module 400A. In this embodiment, the conveying system 200 may include a guide roller, and the optical film 100 may be conveyed through the guide roller in the form of a roll. In this embodiment, the first light source module 300A and the first photographing module 400A may be disposed in a production section with a vertical difference.

再者,輸送系統200可將光學膜100沿著第二方向A2進行輸送。在一些實施例中,待檢測的光學膜100的區段可以實質上垂直於地面的方向進行設置(亦即,使第二方向A2實質上垂直於地面),降低環境光源(例如,設置於天花板的光源)對檢測準確度的影響。在一些實施例中,待檢測的光學膜100的區段可以與地面的法線方向之夾角約0度至約60度內的方向進行設置,亦即,使第二方向A2與地面的法線方向之夾角為約0度至約60度、約0度至約45度、或約0度至約30度。Moreover, the transport system 200 can transport the optical film 100 along the second direction A2. In some embodiments, the section of the optical film 100 to be detected may be set in a direction substantially perpendicular to the ground (ie, the second direction A2 is substantially perpendicular to the ground), reducing the ambient light source (for example, provided in the ceiling Light source) on the accuracy of detection. In some embodiments, the section of the optical film 100 to be detected may be set in a direction within an angle of about 0 degrees to about 60 degrees with the normal direction of the ground, that is, the second direction A2 is normal to the ground. The included angle of the directions is about 0 degrees to about 60 degrees, about 0 degrees to about 45 degrees, or about 0 degrees to about 30 degrees.

如第3A圖所示,第一光源組件300A可設置於光學膜100的一側,且提供第一光源302a,第一光源302a具有第一光軸LX 1。在一些實施例中,第一光源組件300A可設置於光學膜100的下方,或是與環境光源相反的一側。根據一些實施例,第一光源302a的第一光軸LX 1平行或偏離光學膜100的第二表面100b。在一些實施例中,可將第一光源組件300A以實質上平行於光學膜100的第二表面100b的方向進行設置。在一些實施例中,第一光軸LX 1未與光學膜100或是光學膜100的第二表面100b相交。換言之,第一光源302a並未直接照射光學膜100,藉此可避免膜面過亮導致缺陷難以辨識。 As shown in FIG. 3A, the first light source assembly 300A may be disposed on one side of the optical film 100 and provides a first light source 302 a having a first optical axis LX 1 . In some embodiments, the first light source assembly 300A may be disposed below the optical film 100 or on the side opposite to the ambient light source. According to some embodiments, the first optical axis LX 1 of the first light source 302 a is parallel or offset from the second surface 100 b of the optical film 100. In some embodiments, the first light source assembly 300A may be disposed in a direction substantially parallel to the second surface 100 b of the optical film 100. In some embodiments, the first optical axis LX 1 does not intersect the optical film 100 or the second surface 100 b of the optical film 100. In other words, the first light source 302a does not directly irradiate the optical film 100, thereby avoiding that the film surface is too bright, which makes it difficult to identify defects.

承前述,光學膜100沿第二方向A2傳送,在一些實施例中,第二方向A2與第一光軸LX 1的延伸線LX 1’形成第三夾角θ 3,第三夾角θ 3的範圍可為約0度至約90度、約0度至約60度、約0度至約45度、或約0度至約35度。 According to the foregoing, the optical film 100 is transmitted along the second direction A2. In some embodiments, the second direction A2 and the extension line LX 1 ′ of the first optical axis LX 1 form a third included angle θ 3 and a third included angle θ 3 . It may be about 0 degrees to about 90 degrees, about 0 degrees to about 60 degrees, about 0 degrees to about 45 degrees, or about 0 degrees to about 35 degrees.

於此實施例中,第一光源組件300A可包含至少一發光元件304以及圍繞發光元件304的罩體306。罩體306可防止發光元件304提供的第一光源302a直接照射到光學膜100的第二表面100b。在一些實施例中,罩體306可以具有遮光特性的材料形成。舉例而言,在一些實施例中,罩體306的材料可包含高分子材料、金屬材料、其它合適的材料或前述之組合。所述高分子材料可包含聚碳酸酯(polycarbonate,PC)、聚甲基丙烯酸甲酯(polymethylmethacrylate,PMMA)、聚氯乙烯(polyvinyl chloride,PVC)、聚丙烯(polypropylene,PP)或丙烯腈-丁二烯-苯乙烯的共聚物(ABS樹脂)、聚酯纖維,但不限於此。在一些實施例中,亦可使用環氧材料或聚酯材料作為罩體306的塗料。在一些實施例中,罩體306的亦可包含添加劑,例如,磨砂粉或光擴散劑等,但不限於此。In this embodiment, the first light source assembly 300A may include at least one light emitting element 304 and a cover 306 surrounding the light emitting element 304. The cover 306 can prevent the first light source 302 a provided by the light emitting element 304 from directly irradiating the second surface 100 b of the optical film 100. In some embodiments, the cover 306 may be formed of a material having light shielding properties. For example, in some embodiments, the material of the cover 306 may include a polymer material, a metal material, other suitable materials, or a combination thereof. The polymer material may include polycarbonate (PC), polymethylmethacrylate (PMMA), polyvinyl chloride (PVC), polypropylene (PP), or acrylonitrile-butyl Diene-styrene copolymer (ABS resin), polyester fiber, but not limited thereto. In some embodiments, an epoxy material or a polyester material can also be used as the coating of the cover 306. In some embodiments, the cover 306 may also contain additives, such as frosting powder or light diffusing agent, but is not limited thereto.

如同前述,第一光源組件300A的發光元件304可包含發光二極體(LED)、微型發光二極體(micro LED、mini LED)、有機發光二極體(OLED)、量子點有機發光二極體(QLED)、其它合適之發光元件或前述之組合,但不限於此。As mentioned above, the light emitting element 304 of the first light source assembly 300A may include a light emitting diode (LED), a micro light emitting diode (micro LED, mini LED), an organic light emitting diode (OLED), and a quantum dot organic light emitting diode. Body (QLED), other suitable light-emitting elements, or a combination of the foregoing, but is not limited thereto.

在一些實施例中,第一光源組件300A的發光元件304所提供的第一光源302a可包含可見光,例如,波長範圍可為約390nm至約780nm、或約520nm至約640nm。在一些實施例中,第一光源302a可為黃光。在一些實施例中,發光元件304所提供的第一光源302a的色溫範圍可為約3000K至約6500K、約4000K至約6500K、或約5000K至約6000K。此外,根據一些實施例,可根據製程或產品需求(例如,欲檢出的缺陷種類),調整合適的第一光源302a的強度。舉例而言,在一些實施例中,第一光源302a的強度可為約1000 Lux以上。In some embodiments, the first light source 302a provided by the light emitting element 304 of the first light source assembly 300A may include visible light, for example, the wavelength range may be about 390 nm to about 780 nm, or about 520 nm to about 640 nm. In some embodiments, the first light source 302a may be yellow light. In some embodiments, the color temperature range of the first light source 302a provided by the light emitting element 304 may be about 3000K to about 6500K, about 4000K to about 6500K, or about 5000K to about 6000K. In addition, according to some embodiments, the intensity of the appropriate first light source 302a may be adjusted according to the process or product requirements (for example, the type of defect to be detected). For example, in some embodiments, the intensity of the first light source 302a may be above about 1000 Lux.

此外,於此實施例中,第一光源組件300A與第一拍攝組件400A可設置於光學膜100的相對兩側,第一拍攝組件400A可拍攝光學膜100產生的折射光像。詳細而言,於此實施例中,罩體306可將第一光源302a反射,當反射的光線照射到光學膜100上的缺陷時,缺陷的不平整將使光線能夠折射至第一拍攝組件400A,藉此可容易地辨識缺陷。相較之下,以背光式光源架設之一般光學膜檢測裝置,其光線直接照射膜面並透射膜面直達拍攝組件,光線較難因缺陷本身之不平整而產生折射,且光線之光量太充足較難辨識出折射至鏡頭的光量差異。In addition, in this embodiment, the first light source component 300A and the first photographing component 400A may be disposed on opposite sides of the optical film 100, and the first photographing component 400A may photograph a refracted light image generated by the optical film 100. In detail, in this embodiment, the cover 306 can reflect the first light source 302a. When the reflected light hits the defect on the optical film 100, the unevenness of the defect will allow the light to be refracted to the first photographing component 400A. , So that defects can be easily identified. In contrast, a general optical film inspection device set up with a backlight type light source, whose light directly illuminates the film surface and transmits the film surface directly to the shooting component. The light is difficult to be refracted due to the unevenness of the defect itself, and the amount of light is too sufficient It is difficult to discern the difference in the amount of light refracted to the lens.

如同前述,第一拍攝組件400A可包含感光耦合裝置(CCD)照像機或攝影機,可將影像轉變為電子訊號,亦即,將影像數位數據化。在一些實施例中,第一拍攝組件400A可包含鏡頭單元402,鏡頭單元402可具有中心軸402X。根據一些實施例,所述中心軸402X為鏡頭單元402於光學膜100的第一表面100a的法線方向上的中心軸。在一些實施例中,第一光源302a的第一光軸LX 1與鏡頭單元402的中心軸402X之間具有第四夾角θ 4。在一些實施例中,第四夾角θ 4的範圍為約0度至約90度、約30度至約80度、或約45度至約70度。 As mentioned above, the first photographing module 400A may include a photosensitive coupling device (CCD) camera or a video camera, which may convert an image into an electronic signal, that is, digitize the image digitally. In some embodiments, the first photographing assembly 400A may include a lens unit 402, and the lens unit 402 may have a central axis 402X. According to some embodiments, the central axis 402X is a central axis of the lens unit 402 in a normal direction of the first surface 100 a of the optical film 100. In some embodiments, there is a fourth included angle θ 4 between the first optical axis LX 1 of the first light source 302 a and the central axis 402X of the lens unit 402. In some embodiments, the fourth included angle θ 4 ranges from about 0 degrees to about 90 degrees, from about 30 degrees to about 80 degrees, or from about 45 degrees to about 70 degrees.

此外,在一些實施例中,鏡頭單元402的中心軸402X與光學膜100的第一表面100a或第二表面100b之間具有第五夾角θ 5。在一些實施例中,第五夾角θ 5的範圍為約0度至約90度、約30度至約90度、或約45度至約90度。應注意的是,若第五夾角θ 5的範圍過大(例如,大於90度),則第一拍攝組件400A可能會無法有效辨識出缺陷。 In addition, in some embodiments, a fifth included angle θ 5 exists between the central axis 402X of the lens unit 402 and the first surface 100 a or the second surface 100 b of the optical film 100. In some embodiments, the fifth included angle θ 5 ranges from about 0 degrees to about 90 degrees, from about 30 degrees to about 90 degrees, or from about 45 degrees to about 90 degrees. It should be noted that if the range of the fifth included angle θ 5 is too large (for example, greater than 90 degrees), the first imaging component 400A may not be able to effectively identify defects.

再者,第一光源組件300A提供的第一光源302a的第一光軸LX 1與光學膜100之間具有第一最小距離D 6。在一些實施例中,第一最小距離D 6的範圍為約5cm至約60cm、約10cm至約50cm、或約20cm至約40cm,例如,約30cm。應注意的是,第一光軸LX 1與光學膜100之間的距離不應過大,否則第一光源302a可能無法反射至光學膜100,可能造成光源不足。 Furthermore, there is a first minimum distance D 6 between the first optical axis LX 1 of the first light source 302 a provided by the first light source assembly 300A and the optical film 100. In some embodiments, the first minimum distance D 6 ranges from about 5 cm to about 60 cm, about 10 cm to about 50 cm, or about 20 cm to about 40 cm, for example, about 30 cm. It should be noted that the distance between the first optical axis LX 1 and the optical film 100 should not be too large, otherwise the first light source 302a may fail to reflect to the optical film 100, which may cause insufficient light sources.

此外,第一拍攝組件400A的鏡頭單元402與光學膜100之間具有第二最小距離D 7。在一些實施例中,第二最小距離D 7的範圍為約5cm至約100cm、約20cm至約80cm、或約40cm至約70cm,例如,約50cm。應注意的是,鏡頭單元402與光學膜100之間的距離不應過大或過小,否則鏡頭單元402可能無法有效進行取像。 In addition, the lens unit 402 of the first photographing module 400A and the optical film 100 have a second minimum distance D 7 . In some embodiments, the second minimum distance D 7 ranges from about 5 cm to about 100 cm, about 20 cm to about 80 cm, or about 40 cm to about 70 cm, for example, about 50 cm. It should be noted that the distance between the lens unit 402 and the optical film 100 should not be too large or too small, otherwise the lens unit 402 may not be able to take images effectively.

如同前述,根據一些實施例,光學膜檢測裝置30更包含影像判斷系統500,影像判斷系統500可與第一拍攝組件400A耦接。影像判斷系統500可進一步對第一拍攝組件400A拍攝到的影像所產生之電子訊號進行處理。As mentioned above, according to some embodiments, the optical film detection device 30 further includes an image determination system 500, and the image determination system 500 may be coupled to the first photographing component 400A. The image determination system 500 may further process the electronic signals generated by the images captured by the first shooting component 400A.

在一些實施例中,影像判斷系統500可根據從光學膜100折射的光線的亮度差異,判斷光學膜100的第一表面100a上是否存在缺陷。具體而言,當光學膜100上具有異物或氣泡等缺陷時,從第一光源組件300A所射出之光線會因異物或氣泡而產生散射,散射光線之一部分會進入第一拍攝組件400A。另一方面,在沒有異物或氣泡等缺陷的情況中,由於不會產生散射光線,故第一拍攝組件400A拍攝到的影像會變暗。因此,缺陷處在形成的影像上會與其它區域明顯不同。舉例而言,缺陷處的亮度可能較高,而不具有缺陷的平坦部分的亮度可能較低。In some embodiments, the image determination system 500 may determine whether there is a defect on the first surface 100 a of the optical film 100 according to the brightness difference of the light refracted from the optical film 100. Specifically, when there is a defect such as a foreign object or a bubble on the optical film 100, the light emitted from the first light source module 300A will be scattered by the foreign object or the bubble, and a part of the scattered light will enter the first photographing module 400A. On the other hand, in the case where there are no defects such as foreign objects or bubbles, since the scattered light does not occur, the image captured by the first imaging module 400A becomes dark. Therefore, the defects are significantly different from other areas in the formed image. For example, the brightness at a defect may be higher, and the brightness of a flat portion without a defect may be lower.

在一些實施例中,影像判斷系統500可包含軟體及硬體(中央處理器(CPU)、記憶體等),亦可包含特殊應用積體電路(ASIC)、專用電路、韌體等。影像判斷系統500的影像處理可藉由前述元件之協同作用來實現。In some embodiments, the image determination system 500 may include software and hardware (central processing unit (CPU), memory, etc.), and may also include special application integrated circuits (ASIC), dedicated circuits, firmware, and the like. The image processing of the image determination system 500 can be realized by the synergy of the aforementioned components.

接著,請參照第3B圖,第3B圖顯示根據本揭露一些實施例中,光學膜檢測裝置30的上視結構示意圖。如第3B圖所示,在一些實施例中,相較於第一光源組件300A,第一拍攝組件400A可設置於下游處。然而,在另一些實施例中,第一光源組件300A與第一拍攝組件400A於光學膜100的法線方向上可部份地重疊。Next, please refer to FIG. 3B. FIG. 3B shows a schematic diagram of a top view structure of the optical film detection device 30 according to some embodiments of the present disclosure. As shown in FIG. 3B, in some embodiments, compared to the first light source component 300A, the first photographing component 400A may be disposed downstream. However, in other embodiments, the first light source component 300A and the first photographing component 400A may partially overlap in the normal direction of the optical film 100.

再者,發光元件304可具有寬度W 1,光學膜100具有幅寬W 2。根據一些實施例,所述寬度W 1為發光元件304於實質上垂直於光學膜100傳送的第二方向A2之方向(例如,圖中所示的Y方向)上的寬度。在一些實施例中,發光元件304的寬度W 1大於光學膜100的幅寬W 2。第一光源組件300A提供的第一光源302a可完整地照射光學膜100的第一表面100a。 Moreover, the light emitting element 304 may have a width W 1 , and the optical film 100 may have a width W 2 . According to some embodiments, the width W 1 of the light emitting element 304 in the optical film are substantially in the direction (e.g., Y direction shown in the drawing) 100 transmits the second direction A2 perpendicular to the width. In some embodiments, the width W 1 of the light emitting element 304 is larger than the width W 2 of the optical film 100. The first light source 302 a provided by the first light source assembly 300A may completely illuminate the first surface 100 a of the optical film 100.

此外,應理解的是,雖然第3B圖所示的實施例中,僅繪示一個第一拍攝組件400A,但在另一些實施例中,光學膜檢測裝置30可具有複數個第一拍攝組件400A。在一些實施例中,可根據光學膜100的最大幅寬決定適合數量的第一拍攝組件400A,詳細而言,第一拍攝組件400A的全視野幅寬需大於光學膜100的最大幅寬。In addition, it should be understood that although in the embodiment shown in FIG. 3B, only one first photographing component 400A is shown, in other embodiments, the optical film detection device 30 may have a plurality of first photographing components 400A. . In some embodiments, a suitable number of first photographing components 400A may be determined according to the maximum width of the optical film 100. In detail, the full-field width of the first photographing component 400A needs to be greater than the maximum width of the optical film 100.

承前述,光學膜檢測裝置30可藉由以特定相對位置與光學膜100配置的第一光源組件300A及第一拍攝組件400A,主要針對光學膜100上的氣泡,特別是微小氣泡及刮痕,也可針對髒汙或水痕等缺陷進行檢測。光源可以散射光的形式照射光學膜100的表面,提高前述缺陷之檢測效率以及降低漏檢率。According to the foregoing, the optical film detection device 30 can mainly target the air bubbles on the optical film 100, especially the micro air bubbles and scratches, by using the first light source module 300A and the first photographing module 400A configured with the optical film 100 at a specific relative position. Defects such as dirt or water marks can also be detected. The light source can irradiate the surface of the optical film 100 in the form of scattered light, which improves the detection efficiency of the aforementioned defects and reduces the missed detection rate.

接著,請參照第4圖,第4圖顯示根據本揭露一些實施例中,光學膜的檢測方法10A的步驟流程圖。光學膜的檢測方法10A可藉由前述實施例之光學膜檢測裝置加以實行,其可用於檢測待測光學膜100之缺陷。於此,以使用光學膜檢測裝置10進行之光學膜的檢測方法10A為例,說明如下。Next, please refer to FIG. 4. FIG. 4 shows a flowchart of the steps of the optical film detection method 10A in some embodiments according to the present disclosure. The optical film detection method 10A can be implemented by the optical film detection device of the foregoing embodiment, which can be used to detect defects of the optical film 100 to be tested. Here, an example of the optical film detection method 10A using the optical film detection device 10 is described below.

應理解的是,根據一些實施例,可於光學膜的檢測方法10A進行前、進行中及/或進行後提供額外的操作步驟。根據另一些實施例,所述的一些階段(或步驟)可視情況被刪除或取代,或者視狀況互換步驟的順序。It should be understood that according to some embodiments, additional operation steps may be provided before, during, and / or after the detection method 10A of the optical film is performed. According to other embodiments, some of the stages (or steps) may be deleted or replaced as appropriate, or the order of the steps may be reversed depending on the situation.

如第4圖所示,光學膜的檢測方法10A可包含以下步驟:以輸送系統200承載及輸送待測光學膜100(步驟S12);以第一光源組件300A提供第一光源302a(步驟S14);以及以第一拍攝組件400A對待測光學膜100的第一表面100a進行拍攝(步驟S16)。As shown in FIG. 4, the optical film detection method 10A may include the following steps: carrying and transporting the optical film 100 to be tested with the transport system 200 (step S12); and providing the first light source 302 a with the first light source assembly 300A (step S14) ; And photographing the first surface 100a of the optical film 100 to be measured with the first photographing module 400A (step S16).

詳細而言,於步驟S12中,輸送系統200可將待測光學膜100沿第一方向A1傳送。承前述,在一些實施例中,光學膜100傳送的第一方向A1與第一光源302a的第一光軸LX 1的延伸線形成第一夾角θ 1(未繪示)。在一些實施例中,第一夾角θ 1為約0度。 In detail, in step S12, the conveyance system 200 may convey the optical film 100 to be tested along the first direction A1. According to the foregoing, in some embodiments, the first direction A1 transmitted by the optical film 100 and the extension line of the first optical axis LX 1 of the first light source 302 a form a first included angle θ 1 (not shown). In some embodiments, the first included angle θ 1 is about 0 degrees.

於步驟S14中,第一光源組件300A係偏移待測光學膜100設置,使得第一光源302a的第一光軸LX 1可平行或偏離待測光學膜100的第一表面100a。根據一些實施例,第一光源302a係以散射光的形式照射於待測光學膜100的第一表面100a。 In step S14, the first light source 100 disposed offset lines assembly 300A tested optical film, such that the first axis of the first light source 302a may be parallel or divergent LX 1 measured first surface 100a of the optical film 100. According to some embodiments, the first light source 302a irradiates the first surface 100a of the optical film 100 to be measured in the form of scattered light.

此外,於步驟S16中,可將第一拍攝組件400A設置為使得鏡頭單元402的中心軸402X與第一光軸LX 1之間具有第二夾角θ 2。在一些實施例中,第二夾角θ 2的範圍為約30度至約90度、約45度至約90度、或約60度至約90度。在一些實施例中,第二夾角θ 2為約90度。 In addition, in step S16, the first shooting component 400A may be set so that a second included angle θ 2 is formed between the central axis 402X of the lens unit 402 and the first optical axis LX 1 . In some embodiments, the second included angle θ 2 ranges from about 30 degrees to about 90 degrees, from about 45 degrees to about 90 degrees, or from about 60 degrees to about 90 degrees. In some embodiments, the second included angle θ 2 is about 90 degrees.

此外,如第4圖所示,根據一些實施例,光學膜的檢測方法10A更包含以影像判斷系統500判斷待測光學膜100是否具有缺陷(步驟S18)。所述影像判斷系統500可根據從待測光學膜100的第一表面100a反射的光線的亮度差異進行判別。In addition, as shown in FIG. 4, according to some embodiments, the optical film detection method 10A further includes determining whether the optical film 100 to be tested has a defect using the image determination system 500 (step S18). The image determination system 500 can make a determination based on the brightness difference of the light reflected from the first surface 100 a of the optical film 100 to be measured.

接著,請參照第5圖,第5圖顯示根據本揭露一些實施例中,光學膜的檢測方法10B的步驟流程圖。如第5圖所示,相較於光學膜的檢測方法10A,光學膜的檢測方法10B在以輸送系統200承載及輸送待測光學膜100的步驟S12之前可進一步包含以下步驟:對具有合格缺陷的光學膜標準樣品進行檢測,藉由影像判斷系統500紀錄合格缺陷的影像參數(步驟22);對具有不合格缺陷的光學膜標準樣品進行檢測,藉由影像判斷系統500紀錄不合格缺陷的影像參數(步驟24);以及藉由合格缺陷的影像參數與不合格缺陷的影像參數,調整用於檢測該待測光學膜100之缺陷的亮度閾值(步驟26)。Next, please refer to FIG. 5. FIG. 5 shows a flowchart of the steps of the optical film detection method 10B in some embodiments according to the present disclosure. As shown in FIG. 5, compared to the optical film detection method 10A, the optical film detection method 10B may further include the following steps before step S12 of carrying and transporting the optical film 100 to be tested by the transport system 200: The optical film standard samples are inspected, and the image parameters of qualified defects are recorded by the image determination system 500 (step 22); the optical film standard samples with unqualified defects are detected, and the images of the defective images are recorded by the image determination system 500 The parameters (step 24); and adjusting the brightness threshold for detecting the defects of the optical film 100 to be tested using the image parameters of the qualified defect and the image parameters of the unqualified defect (step 26).

可藉由前述步驟22至步驟26進一步使影像判斷系統500針對於第一拍攝組件400A所拍攝到的影像進行參數調整。具體而言,所述缺陷可分為合格缺陷及不合格缺陷,合格缺陷可定義為製程或產品中可容許的輕微缺陷,不合格缺陷則可定義為製程或產品中不容許的缺陷,例如,較嚴重的凹陷等。應理解的是,根據不同的實施例,合格缺陷及不合格缺陷的判斷標準可能根據光學膜產品的實際需求而有所不同。The foregoing steps 22 to 26 can be further used to make the image determination system 500 perform parameter adjustment on the image captured by the first shooting component 400A. Specifically, the defects can be divided into qualified defects and unqualified defects. Qualified defects can be defined as minor defects that can be tolerated in the process or product, and unqualified defects can be defined as defects that are not allowed in the process or product. For example, More serious depressions. It should be understood that according to different embodiments, the judgment criteria of qualified defects and unqualified defects may be different according to the actual needs of optical film products.

於步驟22及步驟24中,可根據光學膜產品的實際需求,適當地準備具有合格缺陷的光學膜標準樣品以及具有不合格缺陷的光學膜標準樣品。在一些實施例中,可藉由影像判斷系統500中的記憶體紀錄合格及不合格缺陷的影像參數,例如,亮度參數(灰階值)。In steps 22 and 24, according to the actual requirements of the optical film product, an optical film standard sample with qualified defects and an optical film standard sample with unqualified defects may be appropriately prepared. In some embodiments, the image parameters of the pass and fail defects can be recorded by the memory in the image determination system 500, for example, the brightness parameter (gray level value).

於步驟26中,可藉由於步驟22及步驟24中所得到的影像參數,調整用於檢測該待測光學膜100之缺陷的亮度閾值。具體而言,在一些實施例中,可將欲濾除之不合格缺陷的各像素的閾值調整至最大灰階數。例如,在一些實施例中,可將不合格缺陷的像素閾值調整至255位元(bit)。In step 26, the brightness threshold used to detect the defects of the optical film 100 to be tested can be adjusted based on the image parameters obtained in steps 22 and 24. Specifically, in some embodiments, the threshold of each pixel of the defective defects to be filtered out can be adjusted to the maximum number of gray levels. For example, in some embodiments, the pixel threshold of a non-conforming defect may be adjusted to 255 bits.

此外,根據一些實施例,光學膜的檢測方法10B在以影像判斷系統500判斷待測光學膜100是否具有缺陷的步驟S18之後,可進一步包含以影像後處理系統(未繪示)篩選經檢出之缺陷(步驟28)。In addition, according to some embodiments, after the optical film detection method 10B determines whether the optical film 100 to be tested has a defect in step S18 using the image determination system 500, the method may further include screening the detected images with an image post-processing system (not shown). Defects (step 28).

在一些實施例中,影像後處理系統係根據前述合格缺陷的影像參數與不合格缺陷的影像參數,調整用於篩選經前述步驟檢出之缺陷的尺寸閾值。具體而言,由於缺陷型態的不同,部分經補光後的合格缺陷之邊緣可能產生無法濾除的雜訊,進而被分類為不合格的缺陷,因此,可進一步藉由影像後處理系統篩選經檢出之缺陷,例如,可進一步設定缺陷的尺寸閾值,將此類雜訊濾除。In some embodiments, the image post-processing system adjusts a size threshold for screening defects detected by the foregoing steps according to the image parameters of the qualified defects and the image parameters of the unqualified defects. Specifically, due to the different defect types, the edges of some qualified defects that have been filled with light may produce unfilterable noise, and then be classified as unqualified defects. Therefore, it can be further filtered by the image post-processing system. For detected defects, for example, the size threshold of the defect can be further set to filter out such noise.

詳細而言,請參照第6圖,第6圖顯示根據本揭露一些實施例中,影像後處理系統的尺寸閾值的計算方式。根據一些實施例,可藉由以下列式(I)計算用於影像後處理系統的缺陷的尺寸閾值SV(圖式中以*標示): (A-B)/2+B 式(I)。In detail, please refer to FIG. 6, which illustrates a calculation method of the size threshold of the image post-processing system in some embodiments according to the disclosure. According to some embodiments, the size threshold SV (denoted by * in the figure) of a defect for an image post-processing system can be calculated by the following formula (I): (A-B) / 2 + B Formula (I).

於式(I)中,A為不合格缺陷的尺寸(閾值),B為合格缺陷的尺寸(閾值)。藉由影像後處理系統的缺陷尺寸閾值SV之設定,可進一步濾除經補光後誤被分類為不合格的缺陷的合格缺陷。In the formula (I), A is the size (threshold value) of a defective defect, and B is the size (threshold value) of a qualified defect. With the setting of the defect size threshold SV of the image post-processing system, it is possible to further filter the qualified defects that are mistakenly classified as unqualified defects after being filled with light.

綜上所述,根據本揭露一些實施例,光學膜檢測裝置的光源組件可提供光軸平行或偏離光學膜表面的光源,亦即,藉由平行光源或側光光源照射光學膜表面,以檢測光學膜上的缺陷如凹陷、刮痕、水痕或微小氣泡等。藉由此種配置,可更有效地檢測出現有自動光學檢查設備無法檢出的缺陷類型。根據本揭露一些實施例,可進一步針對程度較輕微之缺陷進行補光或對檢出的缺陷進行篩選,藉此可濾除欲排除的輕微缺陷,以提升檢測效率及減少人力作業時間。In summary, according to some embodiments of the present disclosure, the light source component of the optical film detection device may provide a light source with an optical axis parallel or off the surface of the optical film, that is, the surface of the optical film is illuminated by a parallel light source or a side light source to detect Defects on the optical film, such as dents, scratches, water marks, or tiny air bubbles. With this configuration, it is possible to more effectively detect the presence of defect types that cannot be detected by automatic optical inspection equipment. According to some embodiments of the present disclosure, it is possible to further supplement the light for the minor defects or to screen the detected defects, thereby filtering out the minor defects to be excluded, so as to improve the detection efficiency and reduce the labor time.

雖然本揭露的實施例及其優點已揭露如上,但應該瞭解的是,任何所屬技術領域中具有通常知識者,在不脫離本揭露之精神和範圍內,當可作更動、替代與潤飾。此外,本揭露之保護範圍並未侷限於說明書內所述特定實施例中的製程、機器、製造、物質組成、裝置、方法及步驟,任何所屬技術領域中具有通常知識者可從本揭露揭示內容中理解現行或未來所發展出的製程、機器、製造、物質組成、裝置、方法及步驟,只要可以在此處所述實施例中實施大抵相同功能或獲得大抵相同結果皆可根據本揭露使用。因此,本揭露之保護範圍包括前述製程、機器、製造、物質組成、裝置、方法及步驟。另外,每一申請專利範圍構成個別的實施例,且本揭露之保護範圍也包括各個申請專利範圍及實施例的組合。本揭露之保護範圍當視後附之申請專利範圍所界定者為準。Although the embodiments and advantages of this disclosure have been disclosed as above, it should be understood that anyone with ordinary knowledge in the technical field can make changes, substitutions, and decorations without departing from the spirit and scope of this disclosure. In addition, the scope of protection of this disclosure is not limited to the processes, machines, manufacturing, material composition, devices, methods and steps in the specific embodiments described in the description. Any person with ordinary knowledge in the technical field to which this disclosure pertains may disclose content from this disclosure To understand the current or future development of processes, machines, manufacturing, material composition, devices, methods and steps, as long as they can implement substantially the same functions or achieve approximately the same results in the embodiments described herein, they can be used according to this disclosure. Therefore, the scope of protection of this disclosure includes the aforementioned processes, machines, manufacturing, material composition, devices, methods and steps. In addition, each patent application scope constitutes a separate embodiment, and the protection scope of this disclosure also includes a combination of each patent application scope and embodiment. The scope of protection of this disclosure shall be determined by the scope of the appended patent application.

10、20、30‧‧‧光學膜檢測裝置10, 20, 30‧‧‧Optical film detection device

10A、10B‧‧‧光學膜的檢測方法 10A, 10B‧‧‧Optical film detection method

100‧‧‧光學膜 100‧‧‧ Optical Film

100a‧‧‧第一表面 100a‧‧‧first surface

100b‧‧‧第二表面 100b‧‧‧Second surface

200‧‧‧輸送系統 200‧‧‧ Conveying System

300A‧‧‧第一光源組件 300B‧‧‧第二光源組件 302a‧‧‧第一光源 300A‧‧‧First light source assembly 300B‧‧‧Second light source assembly 302a‧‧‧First light source

302b‧‧‧第二光源 302b‧‧‧Second light source

304、304a、304b‧‧‧發光元件 304, 304a, 304b‧‧‧light-emitting elements

304p‧‧‧底部 304p‧‧‧ bottom

304t‧‧‧頂部 304t‧‧‧Top

306‧‧‧罩體 306‧‧‧ cover

400A‧‧‧第一拍攝組件 400A‧‧‧First shooting kit

400B‧‧‧第二拍攝組件 400B‧‧‧Second shooting kit

402‧‧‧鏡頭單元 402‧‧‧lens unit

402X、402X’‧‧‧中心軸 402X, 402X’‧‧‧ center axis

500‧‧‧影像判斷系統 500‧‧‧image judgment system

A‧‧‧不合格缺陷的尺寸 A‧‧‧Unqualified defect size

A1‧‧‧第一方向 A1‧‧‧First direction

A2‧‧‧第二方向 A2‧‧‧Second direction

B‧‧‧合格缺陷的尺寸 B‧‧‧ size of qualified defect

D1‧‧‧第一距離D 1 ‧‧‧ the first distance

D2‧‧‧第二距離D 2 ‧‧‧Second Distance

D3、D3’‧‧‧第三距離D 3 , D 3 '‧‧‧ third distance

D4、D4’‧‧‧第四距離D 4 , D 4 '‧‧‧ fourth distance

D5、D5’‧‧‧第五距離D 5 , D 5 '‧‧‧ fifth distance

D6‧‧‧第六距離D 6 ‧‧‧ sixth distance

D7‧‧‧第七距離D 7 ‧‧‧seventh distance

LX1‧‧‧第一光軸LX 1 ‧‧‧First optical axis

LX1’‧‧‧延伸線LX 1 '‧‧‧ extension line

LX2‧‧‧第二光軸LX 2 ‧‧‧Second optical axis

S12~S18、S22~S28‧‧‧步驟 S12 ~ S18, S22 ~ S28‧‧‧step

SV‧‧‧閾值 SV‧‧‧Threshold

P‧‧‧投影 P‧‧‧ Projection

W1‧‧‧寬度W 1 ‧‧‧Width

W2‧‧‧幅寬W 2 ‧‧‧Width

θ1、θ1’‧‧‧第一夾角θ 1 , θ 1 '‧‧‧ the first included angle

θ2、θ2’‧‧‧第二夾角θ 2 , θ 2 '‧‧‧ the second angle

θ3‧‧‧第三夾角θ 3 ‧‧‧ third angle

θ4‧‧‧第四夾角θ 4 ‧‧‧ fourth angle

θ5‧‧‧第五夾角θ 5 ‧‧‧ fifth included angle

θd‧‧‧公差角度θ d ‧‧‧ tolerance angle

第1A圖顯示根據本揭露一些實施例中,光學膜檢測裝置的側視結構示意圖; 第1B圖顯示根據本揭露一些實施例中,光學膜檢測裝置的上視結構示意圖; 第2圖顯示根據本揭露一些實施例中,光學膜檢測裝置的側視結構示意圖; 第3A圖顯示根據本揭露一些實施例中,光學膜檢測裝置的側視結構示意圖; 第3B圖顯示根據本揭露一些實施例中,光學膜檢測裝置的上視結構示意圖; 第4圖顯示根據本揭露一些實施例中,光學膜的檢測方法的步驟流程圖; 第5圖顯示根據本揭露一些實施例中,光學膜的檢測方法的步驟流程圖; 第6圖顯示根據本揭露一些實施例中,影像後處理系統的尺寸閾值的計算方式。FIG. 1A is a schematic diagram of a side view of an optical film detection device according to some embodiments of the disclosure; FIG. 1B is a schematic diagram of a top-view structure of an optical film detection device according to some embodiments of the disclosure; FIG. FIG. 3A shows a schematic side view structure of an optical film detection device in some embodiments according to the disclosure; FIG. 3A shows a schematic side view structure of an optical film detection device in some embodiments according to the disclosure; FIG. 3B shows some embodiments according to the disclosure, Schematic diagram of the top view structure of an optical film detection device; FIG. 4 shows a flowchart of steps of a method for detecting an optical film according to some embodiments of the present disclosure; FIG. 5 shows a method of detecting an optical film according to some embodiments of the present disclosure; Step flowchart; FIG. 6 shows a calculation method of a size threshold of an image post-processing system in some embodiments of the present disclosure.

Claims (30)

一種光學膜檢測裝置,其係用於檢測一光學膜之缺陷,該光學膜檢測裝置包括: 一輸送系統,用以承載及輸送該光學膜; 一第一光源組件,設置於該光學膜的一側,且提供一第一光源,其中該第一光源具有一第一光軸;以及 一第一拍攝組件,設置於該光學膜的一側,且對該光學膜的一第一表面進行拍攝,其中該第一光源的該第一光軸平行或偏離該光學膜的該第一表面。An optical film detection device is used to detect a defect of an optical film. The optical film detection device includes: a conveying system for carrying and conveying the optical film; a first light source component disposed on an optical film; A first light source is provided, wherein the first light source has a first optical axis; and a first photographing component is disposed on one side of the optical film and photographs a first surface of the optical film, Wherein, the first optical axis of the first light source is parallel or offset from the first surface of the optical film. 如申請專利範圍第1項所述之光學膜檢測裝置,其中該光學膜沿一第一方向傳送,該第一方向與該第一光軸的延伸線形成一第一夾角,該第一夾角的範圍為0度至90度。The optical film detection device according to item 1 of the scope of patent application, wherein the optical film is transmitted in a first direction, and the first direction forms a first angle with the extension line of the first optical axis. The range is 0 degrees to 90 degrees. 如申請專利範圍第1項所述之光學膜檢測裝置,其中該第一光軸未與該光學膜的該第一表面相交。The optical film detection device according to item 1 of the application, wherein the first optical axis does not intersect the first surface of the optical film. 如申請專利範圍第1項所述之光學膜檢測裝置,其中該第一拍攝組件具有一鏡頭單元,該第一光軸與該鏡頭單元的一中心軸之間具有一第二夾角,該第二夾角的範圍為30度至90度。The optical film detection device according to item 1 of the scope of patent application, wherein the first photographing component has a lens unit, a second angle between the first optical axis and a central axis of the lens unit, and the second The included angle ranges from 30 degrees to 90 degrees. 如申請專利範圍第1項所述之光學膜檢測裝置,其中該第一光源組件與該第一拍攝組件設置於該光學膜的同一側,且該第一光源組件設置於該第一拍攝組件與該光學膜之間。The optical film detection device according to item 1 of the scope of patent application, wherein the first light source component and the first photographing component are disposed on the same side of the optical film, and the first light source component is disposed on the first photographing component and Between the optical films. 如申請專利範圍第5項所述之光學膜檢測裝置,其中該第一光源組件包括至少一組相對設置的發光元件。The optical film detection device according to item 5 of the patent application scope, wherein the first light source component includes at least one group of light emitting elements disposed oppositely. 如申請專利範圍第6項所述之光學膜檢測裝置,其中該第一光源組件包括3組至15組之相對設置的發光元件;或該第一光源組件的相對設置的發光源件以塔型方式堆疊。The optical film detection device according to item 6 of the patent application scope, wherein the first light source component includes 3 to 15 groups of light emitting elements disposed oppositely; or the light source components of the first light source component disposed oppositely are in a tower shape Way to stack. 如申請專利範圍第6項所述之光學膜檢測裝置,其中該第一光源組件包括一組相對設置的第一發光元件,以及設置於該一組第一發光元件上的一組相對設置的第二發光元件,其中該一組第一發光元件之間相隔一第一距離,該一組第二發光元件之間相隔一第二距離,其中該第二距離小於該第一距離。The optical film detection device according to item 6 of the scope of patent application, wherein the first light source component includes a set of first light emitting elements disposed oppositely, and a set of first light emitting elements disposed on the first light emitting element. Two light-emitting elements, wherein the first light-emitting elements of the group are separated by a first distance, and the second light-emitting elements of the group are separated by a second distance, wherein the second distance is smaller than the first distance. 如申請專利範圍第6項所述之光學膜檢測裝置,其中該組相對設置的發光元件具有一寬度,該寬度大於該光學膜的幅寬。The optical film detection device according to item 6 of the scope of the patent application, wherein the group of light-emitting elements disposed opposite each other has a width that is greater than the width of the optical film. 如申請專利範圍第6項所述之光學膜檢測裝置,其中最靠近該光學膜的發光元件底部與該光學膜的該第一表面具有一第三距離,其中該第三距離為沿著該光學膜的法線方向上之底部與該光學膜之間的距離;或該第三距離範圍為10mm至100mm。The optical film detection device according to item 6 of the scope of patent application, wherein the bottom of the light-emitting element closest to the optical film has a third distance from the first surface of the optical film, and the third distance is along the optical The distance between the bottom of the film in the normal direction and the optical film; or the third distance ranges from 10 mm to 100 mm. 如申請專利範圍第6項所述之光學膜檢測裝置,其中最靠近該第一拍攝組件的該發光元件304的底部與該光學膜的該第一表面之間相隔一第四距離,其中該第四距離為沿著該光學膜的法線方向上之底部與該光學膜之間的距離;或該第四距離範圍為200mm至1000mm。The optical film detection device according to item 6 of the scope of patent application, wherein a fourth distance is separated between the bottom of the light emitting element 304 closest to the first photographing component and the first surface of the optical film, wherein the first The four distances are the distance between the bottom along the normal direction of the optical film and the optical film; or the fourth distance ranges from 200 mm to 1000 mm. 如申請專利範圍第1項所述之光學膜檢測裝置,更包括一影像判斷系統,該影像判斷系統與該第一拍攝組件耦接,且該影像判斷系統根據從該光學膜的該第一表面反射的光線的亮度差異,判斷缺陷是否存在。The optical film detection device according to item 1 of the patent application scope further includes an image determination system, the image determination system is coupled to the first shooting component, and the image determination system is based on the first surface from the optical film. The difference in brightness of the reflected light determines whether a defect exists. 如申請專利範圍第5項所述之光學膜檢測裝置,更包括一第二光源組件以及一第二拍攝組件,其中該第二光源組件與該第一光源組件設置於該光學膜的相對兩側,該第二拍攝組件與該第一拍攝組件設置於該光學膜的相對兩側。The optical film detection device according to item 5 of the scope of patent application, further comprising a second light source component and a second photographing component, wherein the second light source component and the first light source component are disposed on opposite sides of the optical film. The second photographing component and the first photographing component are disposed on opposite sides of the optical film. 如申請專利範圍第13項所述之光學膜檢測裝置,其中該第二光源的波長範圍為390nm至780nm;或該第二光源的色溫範圍為3000K至6500K。The optical film detection device according to item 13 of the scope of patent application, wherein the wavelength range of the second light source is 390nm to 780nm; or the color temperature range of the second light source is 3000K to 6500K. 如申請專利範圍第13項所述之光學膜檢測裝置,其中該第二拍攝組件對該光學膜的一第二表面進行拍攝,該第二光源組件提供一第二光源,該第二光源具有一第二光軸,且該第二光軸平行或偏離該光學膜的該第二表面。The optical film detection device according to item 13 of the patent application scope, wherein the second photographing component photographs a second surface of the optical film, the second light source component provides a second light source, and the second light source has a A second optical axis, and the second optical axis is parallel or offset from the second surface of the optical film. 如申請專利範圍第1項所述之光學膜檢測裝置,其中該第一光源組件與該第一拍攝組件設置於該光學膜的相對兩側。The optical film detection device according to item 1 of the scope of patent application, wherein the first light source component and the first photographing component are disposed on opposite sides of the optical film. 如申請專利範圍第16項所述之光學膜檢測裝置,其中該第一光源組件包括至少一發光元件以及圍繞該發光元件的一罩體。The optical film detection device according to item 16 of the application, wherein the first light source component includes at least one light emitting element and a cover surrounding the light emitting element. 如申請專利範圍第16項所述之光學膜檢測裝置,其中該第一光源組件的該第一光軸與該光學膜之間具有一第一最小距離,該第一最小距離的範圍為5cm至60cm。The optical film detection device according to item 16 of the scope of patent application, wherein a first minimum distance between the first optical axis of the first light source component and the optical film is in a range of 5 cm to 60cm. 如申請專利範圍第16項所述之光學膜檢測裝置,其中該第一拍攝組件具有一鏡頭單元,該鏡頭單元與該光學膜之間具有一第二最小距離,該第二最小距離的範圍為5cm至100cm。The optical film detection device according to item 16 of the scope of patent application, wherein the first shooting component has a lens unit, and a second minimum distance between the lens unit and the optical film, and the range of the second minimum distance is 5cm to 100cm. 一種光學膜的檢測方法,其係用於檢測一待測光學膜之缺陷,包括: 以一輸送系統承載及輸送該待測光學膜; 以一第一光源組件提供一第一光源,其中該第一光源組件設置於該待測光學膜的一側,且該第一光源具有一第一光軸;以及 以一第一拍攝組件對該待測光學膜的一第一表面進行拍攝,其中該第一光源組件係偏移該待測光學膜設置,使得該第一光軸平行或偏離該待測光學膜的該第一表面。An optical film inspection method, which is used to detect a defect of an optical film to be tested, includes: carrying and transporting the optical film to be tested by a transport system; providing a first light source with a first light source component, wherein the first A light source component is disposed on one side of the optical film under test, and the first light source has a first optical axis; and a first photographing component is used to photograph a first surface of the optical film under test, wherein the first A light source assembly is offset from the optical film to be tested, so that the first optical axis is parallel or offset from the first surface of the optical film to be tested. 如申請專利範圍第20項所述之光學膜的檢測方法,其中該第一光源係以散射光的形式照射於該待測光學膜的該第一表面。The method for detecting an optical film according to item 20 of the application, wherein the first light source irradiates the first surface of the optical film to be measured in the form of scattered light. 如申請專利範圍第20項所述之光學膜的檢測方法,其中該待測光學膜沿一第一方向傳送,該第一方向與該第一光軸的延伸線形成一第一夾角,該第一夾角的範圍為0度至90度。The method for detecting an optical film according to item 20 of the scope of patent application, wherein the optical film to be measured is transmitted in a first direction, the first direction and a first optical axis extension line forming a first angle, the first An included angle ranges from 0 degrees to 90 degrees. 如申請專利範圍第20項所述之光學膜的檢測方法,其中該第一拍攝組件具有一鏡頭單元,該第一光軸與該鏡頭單元的一中心軸之間具有一第二夾角,該第二夾角的範圍為30度至90度。The method for detecting an optical film according to item 20 of the patent application scope, wherein the first shooting component has a lens unit, and a second included angle is formed between the first optical axis and a central axis of the lens unit. The two included angles range from 30 degrees to 90 degrees. 如申請專利範圍第20項所述之光學膜的檢測方法,其中該第一光源組件與該第一拍攝組件設置於該待測光學膜的同一側,且該第一光源組件設置於該第一拍攝組件與該待測光學膜之間。The method for detecting an optical film according to item 20 of the scope of patent application, wherein the first light source component and the first photographing component are disposed on the same side of the optical film to be measured, and the first light source component is disposed on the first Between the photographing component and the optical film to be tested. 如申請專利範圍第20項所述之光學膜的檢測方法,更包括以一影像判斷系統判斷該待測光學膜是否具有缺陷,該影像判斷系統係根據從該待測光學膜的該第一表面反射的光線的亮度差異進行判別。According to the method for detecting an optical film according to item 20 of the patent application scope, the method further includes determining whether the optical film to be tested has a defect by using an image judgment system. The image judgment system is based on the first surface from the optical film to be tested. The difference in brightness of the reflected light is discriminated. 如申請專利範圍第20項所述之光學膜的檢測方法,其中該第一光源組件與該第一拍攝組件設置於該光學膜的相對兩側,且該第一光源組件包括至少一發光元件以及圍繞該發光元件的一罩體。The method for detecting an optical film according to item 20 of the patent application, wherein the first light source component and the first photographing component are disposed on opposite sides of the optical film, and the first light source component includes at least one light emitting element and A cover surrounding the light emitting element. 如申請專利範圍第20項所述之光學膜的檢測方法,其中在以該輸送系統承載及輸送該待測光學膜的步驟之前更包括: 對一具有合格缺陷的光學膜標準樣品進行檢測,藉由該影像判斷系統紀錄該合格缺陷的影像參數; 對一具有不合格缺陷的光學膜標準樣品進行檢測,藉由該影像判斷系統紀錄該不合格缺陷的影像參數;以及 藉由該合格缺陷的影像參數與該不合格缺陷的影像參數,調整用於檢測該待測光學膜之缺陷的亮度閾值。The method for detecting an optical film according to item 20 of the patent application scope, wherein before the step of carrying and conveying the optical film to be tested by the conveying system, the method further comprises: detecting an optical film standard sample with qualified defects, and borrowing An image parameter of the qualified defect is recorded by the image determination system; an optical film standard sample having an unqualified defect is detected, and an image parameter of the unqualified defect is recorded by the image determination system; and an image of the qualified defect is recorded by the image determination system. The parameters and the image parameters of the unqualified defect adjust the brightness threshold for detecting the defect of the optical film to be tested. 如申請專利範圍第27項所述之光學膜的檢測方法,更包括以一影像後處理系統篩選一經檢出之缺陷。The method for detecting an optical film according to item 27 of the patent application scope further includes screening an detected defect with an image post-processing system. 如申請專利範圍第28項所述之光學膜的檢測方法,其中該影像後處理系統係根據該合格缺陷的影像參數與該不合格缺陷的影像參數,調整用於篩選該經檢出之缺陷的一尺寸閾值。The method for detecting an optical film according to item 28 of the scope of application for a patent, wherein the image post-processing system adjusts the parameters for screening the detected defects according to the image parameters of the qualified defects and the image parameters of the unqualified defects. A size threshold. 如申請專利範圍第29項所述之光學膜的檢測方法,其中該尺寸閾值的設定符合以下公式(I): (A-B)/2+B 式(I) ,其中A為該不合格缺陷的尺寸,B為該合格缺陷的尺寸。The inspection method of the optical film according to item 29 of the scope of the patent application, wherein the setting of the size threshold is in accordance with the following formula (I): (AB) / 2 + B formula (I), where A is the size of the unqualified defect , B is the size of the qualified defect.
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