TWI676797B - Optical film detecting device and optical film detecting method - Google Patents

Abstract

The disclosure provides an optical film inspection device, which is used to detect defects of the optical film. The device includes a conveying system, a first light source component, and a first photographing component. The conveying system is used for carrying and conveying the optical film. The first light source component is disposed on one side of the optical film and provides a first light source. The first light source has a first optical axis. The first photographing component is disposed on one side of the optical film, and photographs a first surface of the optical film. In addition, the first optical axis of the first light source is parallel or offset from the first surface of the optical film. The disclosure also provides a method for detecting an optical film.

Description

Optical film detection device and method

This disclosure relates to an optical film inspection device, and more particularly, to an optical film inspection device for inspecting defects of an optical film and a detection system including the same.

Optical films are widely used in various objects in life, such as anti-glare materials for lamps, window insulation materials, filter materials for digital cameras, and flat-panel displays. The flat panel display is one of the key development industries in recent years. Among them, the output value of liquid crystal displays accounts for most of the flat panel display industry.

There are many types of optical films used in liquid crystal displays. With the frequent use of liquid crystal displays in various precision electronic products, such as mobile phones, wearable devices, computers, etc., the industry's requirements for the quality of optical films are also increasing. The production process of the optical film is the fundamental factor affecting the quality of the optical film. Therefore, improving the efficiency of the production process of the optical film is one of the important topics.

Automated optical inspection (AOI) has been widely used in inspection systems for the production of optical films. It can use optical instruments to obtain the surface state of semi-finished or finished optical films, and then use computer image processing technology to detect depressions, scratches or Defects such as foreign objects. Generally speaking, after the automatic optical inspection, human labor is used for classification or screening. Therefore, if the automatic optical inspection fails to perform the desired detection according to the specific process requirements, it will lead to an increase in the processing time of subsequent personnel and increase the labor cost.

Although existing optical film inspection devices can roughly meet their originally intended uses, they have not completely met the requirements in every aspect.

According to some embodiments of the present disclosure, an optical film inspection device is provided, which is used to detect defects of the optical film. The optical film detection device includes a transport system, a first light source component, and a first photographing component. The conveying system is used for carrying and conveying the optical film. The first light source component is disposed on one side of the optical film and provides a first light source. The first light source has a first optical axis. The first photographing component is disposed on one side of the optical film, and photographs a first surface of the optical film. In addition, the first optical axis of the first light source is parallel or offset from the first surface of the optical film.

According to some embodiments of the present disclosure, a method for detecting an optical film is provided, which is used to detect defects of the optical film to be tested. The detection method of the optical film includes: carrying and conveying the optical film to be tested with a transport system, providing a first light source with a first light source component, and photographing a first surface of the optical film to be tested with a first photographing component. In addition, the first light source component is disposed on one side of the optical film to be measured, and the first light source has a first optical axis. The first light source component is disposed offset from the optical film to be measured, so that the first optical axis is parallel or offset from the first surface of the optical film to be measured.

In order to make the features or advantages of this disclosure more obvious and easy to understand, the preferred embodiments are exemplified below, and will be described in detail with the accompanying drawings.

The optical film detection device and the optical film detection method using the device according to the embodiments of the disclosure are described in detail below. It should be understood that the following description provides many different embodiments or examples for implementing different aspects of some embodiments of the present disclosure. The specific components and arrangements described below are only a simple and clear description of some embodiments of the disclosure. Of course, these are only examples and not the limitations of this disclosure. In addition, similar and / or corresponding reference numerals may be used to indicate similar and / or corresponding elements in different embodiments to clearly describe the present disclosure. However, the use of these similar and / or corresponding reference numerals is only for simply and clearly describing some embodiments of the present disclosure, and does not represent any correlation between the different embodiments and / or structures discussed.

It should be understood that, the elements or devices of the drawings may exist in various forms well known to those having ordinary knowledge in the technical field to which the invention belongs. In addition, relative terms such as "lower" or "bottom" or "higher" or "top" may be used in the embodiments to describe the relative relationship between one element and another element in the figure. It can be understood that if the illustrated device is turned upside down and turned upside down, the element described on the "lower" side will become the element on the "higher" side. The embodiments of the disclosure can be understood together with the drawings, and the drawings of the disclosure are also considered as a part of the disclosure description. It should be understood that the drawings of this disclosure are not drawn to scale. In fact, the dimensions of the components may be arbitrarily enlarged or reduced in order to clearly show the characteristics of this disclosure.

In addition, the elements or devices of the drawings may exist in various forms known to those skilled in the art to which the invention belongs. In addition, it should be understood that although the terms "first", "second", "third", etc. may be used herein to describe various elements, components, or parts, these elements, components, or parts should not be limited by these terms . These terms are only used to distinguish different elements, components, regions, layers or sections. Thus, a first element, component, region, layer or section discussed below can be termed a second element, component, region, layer or section without departing from the teachings of this disclosure.

In the text, the terms "about", "approximately", "substantially", and "approximately" are usually expressed within 20% of a given value or range, preferably within 10%, more preferably within 5%, Or within 3%, or within 2%, or within 1%, or within 0.5%. The number given here is an approximate number, that is, without approximation "about", "about", "substantially", "approximately", "about", "about", The meaning of "substantially" and "substantially". In addition, the terms "in the range of the first value to the second value" and "the range is the first value to the second value" indicate that the range includes the first value, the second value, and other values therebetween.

In some embodiments of the present disclosure, terms such as “connection” and “interconnection”, such as “joining” and “interconnecting”, may mean that two structures are in direct contact, or they may not be in direct contact, unless specifically defined. There are other structures between these two structures. Moreover, the term about joining and connecting may also include a case where both structures are movable or both structures are fixed.

In some embodiments of the present disclosure, the term “optical axis” may be defined as a central axis that is perpendicular to the light emitting surface of the light emitting element. Generally, the optical axis coincides with the mechanical center of the light emitting element.

Unless otherwise defined, all terms (including technical and scientific terms) used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this disclosure belongs. It can be understood that these terms, such as those defined in commonly used dictionaries, should be interpreted to have a meaning consistent with the relevant technology and the background or context of this disclosure, and should not be interpreted in an idealized or overly formal manner. Unless specifically defined in the disclosed embodiments.

The embodiment of the present disclosure provides an optical film inspection device, and a light source component thereof can provide a light source whose optical axis is parallel or deviated from the surface of the optical film, that is, the surface of the optical film is illuminated by a parallel light source or a side light source to detect defects on the optical film. Such as dents, water marks, scratches, or tiny bubbles. With this configuration, it is possible to more effectively detect the presence of types of defects that cannot be detected by automatic optical inspection equipment. According to some embodiments of the present disclosure, image post-processing may be further performed on the detected defects, thereby filtering out minor defects, improving detection efficiency, and reducing manual work time.

FIG. 1 is a schematic diagram of a side view structure of an optical film detection device 10 according to some embodiments of the present disclosure. It should be understood that according to some embodiments, additional features may be added to the optical film detection device 10 described below. In some embodiments, the optical film inspection device 10 may be used to detect defects on a finished product or a semi-finished product of the optical film 100. The optical film 100 may be a single-layer optical film or an optical film laminate. In some embodiments, the optical film 100 processed by the optical film detection device 10 exists in the form of a roll.

In some embodiments, the optical film detection device 10 may be disposed downstream of a bonding roller (not shown) for bonding a plurality of layers of optical films. In some embodiments, the optical film detection device 10 may be disposed downstream of a cutting mechanism (not shown). It should be understood that, according to actual requirements, the optical film inspection device 10 may be set at any process stage where defect inspection is required.

Referring to FIG. 1A, the optical film detection device 10 may include a transportation system 200, a first light source module 300A, and a first photographing module 400A. The transport system 200 can be used to carry and transport the optical film 100. In some embodiments, the conveying system 200 may include a guide roller, and the optical film 100 may be conveyed via the guide roller in the form of a roll. In some embodiments, the conveyor system 200 may include a conveyor belt, and the optical film 100 may be conveyed via the conveyor belt in sheet form. As shown in FIG. 1A, the transport system 200 can transport the optical film 100 along the first direction A1.

In addition, the optical film 100 may have a first surface 100a and a second surface 100b opposite to the first surface 100a. In some embodiments, the optical film 100 may be a single-layer or multi-layer film, including gain, alignment, compensation, steering, orthogonality, diffusion, protection, anti-sticking, scratch resistance, anti-glare, and reflection suppression for optics. And high-refractive films, such as polarizing films, release films, wide viewing angle films, brightness enhancement films, reflective films, protective films, and other characteristics that control viewing angle compensation or birefraction. Various surface-treated films such as an alignment liquid crystal film, a hard coat film, an anti-reflection film, an anti-adhesive film, a diffusion film, an anti-glare film, or a combination thereof, but are not limited thereto.

In some embodiments, the optical film 100 may include two protective layers and a polarizing film sandwiched between the protective layers.

In some embodiments, the protective film may have a single-layer or multi-layer structure, and is a thermoplastic resin with excellent transparency, mechanical strength, thermal stability, and moisture barrier properties. The thermoplastic resin may include a cellulose resin (for example, triacetate cellulose (TAC) or diacetate cellulose (DAC)), an acrylic resin (for example, poly (methyl methacrylate) ), PMMA), polyester resin (for example, polyethylene terephthalate (PET) or polyethylene naphthalate), olefin resin, polycarbonate resin, cycloolefin resin, oriented stretching Oriented polypropylene (OPP), polyethylene (PE), polypropylene (PP), cyclic olefin polymer (COP), cyclic olefin copolymer (COC) ) Or a combination thereof. In some embodiments, the material of the protective film may include (meth) acrylic, urethane, acrylic urethane, epoxy, polysiloxane Isothermally curable resin or UV-curable resin. In addition, the protective film may be further subjected to a surface treatment such as an anti-glare treatment, an anti-reflection treatment, a hard coating treatment, a charge prevention treatment, or Dirt treatment, etc.

In some embodiments, the polarizing film may be formed of a polyvinyl alcohol (PVA) film that adsorbs and aligns a dichroic pigment or a liquid crystal material doped with absorbing dye molecules. Polyvinyl alcohol can be formed by saponifying polyvinyl acetate. In some embodiments, the polyvinyl acetate may be a single polymer of vinyl acetate or a copolymer of vinyl acetate and other monomers. The other monomers may be unsaturated carboxylic acids, olefins, unsaturated sulfonic acids, vinyl ethers, and the like. In other embodiments, the polyvinyl alcohol can be modified polyvinyl alcohol, for example, aldehyde-modified polyvinyl formaldehyde, polyvinyl acetaldehyde, or polyvinyl butyral, and the like.

Further, referring to FIG. 1A, the first light source assembly 300A may be disposed on one side of the optical film 100 and provides a first light source 302 a having a first optical axis LX ₁ . According to some embodiments, the first optical axis LX _{1 of the} first light source 302 a is parallel or offset from the first surface 100 a of the optical film 100. In some embodiments, the first light source assembly 300A may be disposed in a direction substantially parallel to the first surface 100 a of the optical film 100. In some embodiments, the first optical axis LX _{1 does} not intersect the optical film 100 or the first surface 100 a of the optical film 100. In other words, the first light source 302a does not directly irradiate the optical film 100, thereby avoiding that the film surface is too bright, which makes it difficult to identify defects. In some embodiments, the first light source 302a may illuminate the first surface 100a in the form of scattered light.

According to the foregoing, the optical film 100 is transmitted along the first direction A1. In some embodiments, the first direction A1 and the extension line of the first optical axis LX ₁ form a first included angle θ ₁ (not shown). In some embodiments, the first included angle θ ₁ may range from about 0 degrees to about 90 degrees, from about 0 degrees to about 60 degrees, from about 0 degrees to about 45 degrees, or from about 0 degrees to about 35 degrees. In some embodiments, the first included angle θ ₁ is 0 degrees, as shown in FIG. 1A.

In addition, in some embodiments, the first light source assembly 300A may include at least one set of light emitting elements 304 opposite to each other, and the light emitting elements 304 may each provide a first light source 302a. As shown in FIG. 1A, the light emitting surfaces of the light emitting elements 304 may face each other. In some embodiments, the first optical axes LX ₁ generated by a set of light emitting elements 304 disposed oppositely may substantially overlap each other. In some embodiments, the first light source assembly 300A may include 3 to 15 groups of light-emitting elements 304 arranged oppositely, preferably 5 to 10 groups of light-emitting elements 304 arranged oppositely, but the disclosure is not limited thereto . According to some embodiments, the number of suitable light-emitting elements 304 can be adjusted according to process or product requirements (for example, defects to be detected).

It should be understood that, for the sake of clarity, only a part of the first light source 302 a and the first optical axis LX _{1 are} shown in the drawing. In fact, the light emitting elements 304 each have the first light source 302 a and the first optical axis LX ₁ .

As shown in FIG. 1A, according to some embodiments, the light-emitting elements 304 opposite to each other in a complex array may be stacked in a tower manner, that is, from a position near the optical film 100 to a position far from the optical film 100 (for example, along the figure Z direction shown), the distance between the light-emitting elements 304 gradually decreases. Specifically, the first light source assembly 300A includes a set of first light emitting elements 304 (labeled 304a for convenience) and a second set of second light emitting elements on the first light emitting element 304a. Element 304 (labeled 304b for convenience). The first light emitting elements 304a are separated by a first distance D ₁ , and the second light emitting elements 304 b are separated by a second distance D ₂ . In some embodiments, the second distance D ₂ between the second light emitting elements 304 b may be smaller than the first distance D ₁ between the first light emitting elements 304 a.

It should be understood that, only the first light-emitting element 304a and the second light-emitting element 304b are described as examples, and other groups of light-emitting elements 304 disposed on them can be correspondingly configured in the same manner.

In accordance with the foregoing, the first light source assembly 300A may have a corresponding number of light emitting elements 304 arranged in opposite groups. In some embodiments, the bottom 304 p of the light emitting element 304 closest to the first photographing component 400A of the first light source component 300A forms a projection P on the optical film 100. According to some embodiments, the bottom 304 p of the light emitting element 304 may be a portion (point or edge) of the light emitting element 304 closest to the optical film 100. In some embodiments, the connecting line between the bottom 304p and the projection P of the light emitting element 304 closest to the first photographing component 400A forms an included angle (not shown) with the first surface 100a of the optical film 100, and the included angle It can be about 90 degrees. In some embodiments, the included angle (not shown) formed by the connection line between the bottom 304p and the projection P of the other group of light-emitting elements 304 and the first surface 100a of the optical film 100 may have an equal number sequence relationship.

Specifically, as shown in FIG. 1A, a tolerance angle θ _d may be included between a connection line between the bottom 304 p and the projection P of each light-emitting element 304 and the first surface 100 a. For example, the first light source assembly 300A has five groups of light emitting elements 304 and the angle between the line 304p of the light emitting element 304 closest to the first photographing element 400A and the projection P and the first surface 100a is 90. In an embodiment of degrees, the tolerance angle θ _d may be 90/5 degrees, that is, 18 degrees. In other words, in the foregoing embodiment, the included angles between the line between the bottom 304p and the projection P of the light-emitting element 304 and the first surface 100a may be 18 degrees, 36 degrees, 54 degrees, 72 degrees, and 90 degrees, respectively.

For example, the first light source component 300A has n groups of light emitting elements 304 and the angle between the line 304p of the light emitting element 304 closest to the first photographing component 400A and the projection P and the first surface 100a is 90. In other embodiments, the tolerance angle θ _d may be 90 / n degrees. It can be understood from the previous description that the first light source assembly 300A may include 3 groups to 15 groups, n = 3 ~ 15, preferably n = 5 ~ 10.

A third distance D ₃ between the first surface 100a Additionally, in some embodiments, it is closest to the light emitting element 100 of the optical film 304 (304a) and the bottom of the optical film 100 304p. According to some embodiments, the third distance D ₃ may be a distance between the bottom 304 p and the optical film 100 along a normal direction of the optical film 100 (eg, a Z direction shown in the figure). In some embodiments, the third distance D ₃ ranges from about 10 mm to about 100 mm, or from about 10 mm to about 40 mm.

It should be noted that if the third distance D ₃ between the bottom 304p of the light-emitting element 304 (304a) and the optical film 100 is too large (for example, greater than 100 mm), the first light source 302a provided by the light-emitting element 304 may not be effectively illuminated Optical film 100; On the other hand, if the third distance D _{3 is} too small (for example, less than 10 mm), the film surface of the optical film 100 may be too bright, making it difficult to identify defects.

In some embodiments, the first surface 100a between the light emitting element 400A closest to the first imaging component 304p and the bottom 100 of the optical film 304 are separated by a fourth distance D _4. According to some embodiments, the fourth distance D ₄ may be a distance between the bottom 304 p and the optical film 100 along a normal direction of the optical film 100 (eg, a Z direction shown in the figure). In some embodiments, the fourth distance D ₄ may range from about 200 mm to about 1000 mm, from about 300 mm to about 900 mm, or from about 400 mm to about 800 mm, for example, about 500 mm.

Similarly, if the fourth distance D ₄ between the bottom 304 p of the light emitting element 304 closest to the first photographing component 400A and the optical film 100 is too large (for example, greater than 1000 mm), the first light source 302 a provided by the light emitting element 304 may fail. Effectively irradiate the optical film 100; conversely, if the fourth distance D _{4 is} too small (for example, less than 200 mm), the film surface of the optical film 100 may be too bright, making it difficult to identify defects.

In particular, in the tower-type stacked first light source module 300A, the distance and angle of each group of light-emitting elements 304 relative to the first surface 100a of the optical film 100 are different, so that a variety of angles and intensities can be generated. Light reflections can be used to filter out minor deformation defects. In some embodiments, the slight deformation defect may be a defect that can be tolerated by the optical film 100 product, that is, a defect that meets specifications.

In addition, in some embodiments, the light emitting element 304 may include a light emitting diode (LED), a micro light emitting diode (micro LED, mini LED), an organic light emitting diode (OLED), or a quantum dot organic light emitting diode. (QLED), other suitable light-emitting elements, or a combination of the foregoing, but is not limited thereto.

In some embodiments, the first light source 302a provided by the light emitting element 304 of the first light source assembly 300A may include visible light, for example, the wavelength range may be about 390 nm to about 780 nm. In some embodiments, the color temperature range of the first light source 302a provided by the light emitting element 304 may be about 3000K to about 6500K, about 4000K to about 6500K, or about 5000K to about 6000K. In addition, according to some embodiments, the intensity of the appropriate first light source 302a may be adjusted according to the process or product requirements (for example, the type of defect to be detected).

In addition, referring to FIG. 1A, the first photographing component 400A may be disposed on one side of the optical film 100 and photograph the first surface 100 a of the optical film 100. In detail, the first photographing component 400A can photograph a reflected light image generated by the first surface 100a. As shown in FIG. 1A, in some embodiments, the first light source component 300A and the first photographing component 400A may be disposed on the same side of the optical film 100, and the first light source component 300A may be disposed on the first photographing component 400A and optical Between the films 100.

In some embodiments, the first photographing component 400A may include a charge coupled device (CCD) camera or a video camera, which may convert an image into an electronic signal, that is, digitize the image digitally. In some embodiments, the first photographing assembly 400A may include a lens unit 402, and the lens unit 402 may have a central axis 402X. According to some embodiments, the central axis 402X is a central axis of the lens unit 402 in a normal direction (for example, the Z direction shown in the figure) of the first surface 100 a of the optical film 100. In some embodiments, there is a second included angle θ ₂ between the first optical axis LX _{1 of the} first light source 302 a and the central axis 402X of the lens unit 402. In some embodiments, the second included angle θ ₂ ranges from about 30 degrees to about 90 degrees, from about 45 degrees to about 90 degrees, or from about 60 degrees to about 90 degrees. In some embodiments, the second included angle θ ₂ is about 90 degrees.

Furthermore, in some embodiments, the lens unit 402 is separated from the light emitting element 304 closest to the first photographing component 400A by a fifth distance D ₅ . According to some embodiments, the fifth distance D ₅ may be a distance between the lens unit 402 and the light emitting element 304 in a normal direction of the optical film 100 (for example, a Z direction shown in the figure). In some embodiments, the fifth distance D ₅ ranges from about 50 mm to about 400 mm, or from about 100 mm to about 300 mm, for example, about 200 mm.

It should be noted that if the fifth distance D ₅ between the lens unit 402 and the light emitting element 304 closest to the first photographing component 400A is too large (for example, greater than 400 mm) or too small (for example, less than 50 mm), the first photographing component 400A may not be effective for image acquisition.

In addition, according to some embodiments, the optical film detection device 10 further includes an image determination system 500, and the image determination system 500 may be coupled to the first photographing component 400A. The image determination system 500 may further process the electronic signals generated by the images captured by the first shooting component 400A. In some embodiments, the image determination system 500 may determine whether there is a defect on the first surface 100 a of the optical film 100 according to the brightness difference of the light reflected from the first surface 100 a of the optical film 100. Specifically, the defect will generate reflections in different directions from the normal area, so that some pixels of the first shooting component 400A receive different brightness. Therefore, the defect formed in the image will be significantly different from other areas. For example, the brightness at a defect may be low, and the brightness of a flat portion without a defect may be high.

In some embodiments, the image determination system 500 may include software and hardware (central processing unit (CPU), memory, etc.), and may also include application-specific integrated circuits (ASICs). , Dedicated circuits, firmware, etc. The image processing of the image determination system 500 can be realized by the synergy of the aforementioned components.

Next, please refer to FIG. 1B. FIG. 1B shows a schematic diagram of a top view structure of the optical film detection device 10 according to some embodiments of the present disclosure. As shown in FIG. 1B, the first photographing component 400A may be disposed between the first light source components 300A. In some embodiments, the first photographing component 400A is disposed substantially in the middle of the first light source component 300A. In other words, the distance between the first photographing component 400A and the first light source components 300A on both sides is substantially the same.

Furthermore, the light emitting element 304 of the first light source module 300A has a width W ₁ , and the optical film 100 has a width W ₂ . According to some embodiments, the width W ₁ is a width of the light emitting element 304 in a direction (eg, a Y direction shown in the figure) that is substantially perpendicular to the first direction A1 transmitted by the optical film 100. In some embodiments, the width W _{1 of the} light emitting element 304 is larger than the width W _{2 of the} optical film 100. The first light source 302 a provided by the first light source assembly 300A may completely illuminate the first surface 100 a of the optical film 100.

In addition, as shown in FIG. 1B, in some embodiments, the optical film detection device 10 may have a plurality of first photographing components 400A. In some embodiments, a suitable number of first photographing components 400A may be determined according to the maximum width of the optical film 100. In detail, the full-field width of the first photographing component 400A needs to be greater than the maximum width of the optical film 100.

Generally speaking, it is difficult for a light source component illuminated by a single angle to directly identify the defect form, and it is not possible to effectively filter defects of different degrees because it cannot use light sources of other angles to supplement the light. Compared to the optical film detection device using a single-angle light source assembly, the aforementioned optical film detection device 10 can irradiate the optical film 100 with light sources of different angles and distances, and can supplement defects at multiple angles to identify defects of different degrees. This can filter out minor defects that are not intended to be detected. In some embodiments, the minimum size of the defect detectable by the optical film inspection device 10 may be about 1 pixel (for example, about 30 μm or 33 μm). In addition, in some embodiments, the optical film detection device 10 may mainly detect pit defects on the optical film 100.

Next, please refer to FIG. 2. FIG. 2 is a schematic diagram illustrating a side view of the optical film detection device 20 according to other embodiments of the present disclosure. It should be understood that the same or similar components or elements in the following will be denoted by the same or similar reference numerals, and their materials and functions are the same as or similar to those described in the foregoing, so this part will not be repeated in the following.

The optical film detection device 20 shown in FIG. 2 is substantially similar to the optical film detection device 10 shown in FIG. 1A, and the difference is that in this embodiment, the optical film detection device 20 further includes a second light source module 300B and a first light source module 300B. Two shooting components 400B. In this embodiment, the optical film detection device 20 can simultaneously detect the first surface 100 a and the second surface 100 b of the optical film 100.

In detail, the second light source module 300B and the first light source module 300B may be respectively disposed on opposite sides of the optical film 100, and the second photographing module 400B and the first photographing module 400A are also disposed on opposite sides of the optical film 100. In some embodiments, the second light source component 300B and the second photographing component 400B may be disposed on the same side of the optical film 100, and the second light source component 300B may be disposed between the second photographing component 400B and the optical film 100.

Furthermore, the second photographing component 400B can photograph the second surface 100b of the optical film 100, and the second light source component 300B can provide a second light source 302b, and the second light source 302b has a second optical axis LX ₂ . According to some embodiments, the second optical axis LX _{2 is} parallel or offset from the second surface 100 b of the optical film 100. In some embodiments, the second light source assembly 300B may be disposed in a direction substantially parallel to the second surface 100 b of the optical film 100. In some embodiments, the second optical axis LX _{2 does} not intersect the optical film 100 or the second surface 100 b of the optical film 100. In addition, in some embodiments, the second light source module 300B and the first light source module 300A are substantially symmetrically disposed with reference to the optical film 100. The arrangement of the second light source assembly 300B is substantially the same as the arrangement of the first light source assembly 300A.

In addition, in some embodiments, the first direction A1 and the extension line of the second optical axis LX ₂ transmitted by the optical film 100 form a first included angle θ ₁ ′ (not shown), and the range of the first included angle θ ₁ ′ may be About 0 degrees to about 45 degrees, about 0 degrees to about 40 degrees, or about 0 degrees to about 35 degrees. In some embodiments, the first included angle θ ₁ ′ is 0 degrees, as shown in FIG. 2.

Similarly, in some embodiments, the second light source assembly 300B may include at least one set of light emitting elements 304 opposite to each other, and the light emitting elements 304 may each provide a second light source 302b. As shown in FIG. 2, the light emitting surfaces of the light emitting elements 304 may face each other. In some embodiments, the second optical axis LX ₂ generated by a set of light emitting elements 304 disposed oppositely may substantially overlap each other. In some embodiments, the second light source assembly 300B may include 3 to 15 groups of light-emitting elements 304 disposed oppositely, preferably 5 to 10 groups of light-emitting elements 304 disposed oppositely, but the disclosure is not limited thereto . According to some embodiments, the number of suitable light-emitting elements 304 can be adjusted according to process or product requirements (for example, defects to be detected).

As shown in FIG. 2, according to some embodiments, the light emitting elements 304 opposite to each other in a plurality of arrays of the second light source module 300B may be stacked in a tower manner, that is, from a position close to the optical film 100 toward a distance from the optical film 100. At the position (for example, in the -Z direction shown in the figure), the interval between the light emitting elements 304 gradually decreases.

In addition, in some embodiments, in the second light-emitting component 300B, the top 304t of the light-emitting element 304 closest to the optical film 100 and the second surface 100b of the optical film 100 are separated by a third distance D ₃ ′. According to some embodiments, the top 304t of the light emitting element 304 may be a portion (point or edge) of the light emitting element 304 closest to the optical film 100. According to some embodiments, the third distance D ₃ ′ may be a distance between the top 304 t and the optical film 100 along a normal direction of the optical film 100 (eg, a Z direction shown in the figure). In some embodiments, the third distance D ₃ ′ ranges from about 10 mm to about 100 mm, or from about 10 mm to about 40 mm.

In some embodiments, in the second light emitting component 300B, the top 304t of the light emitting element 304 closest to the second photographing component 400B and the second surface 100b of the optical film 100 are separated by a fourth distance D ₄ ′. According to some embodiments, the fourth distance D ₄ ′ may be a distance between the top 304 t in the normal direction of the optical film 100 (for example, the Z direction shown in the figure) and the optical film 100. In some embodiments, the fourth distance D ₄ ′ may range from about 200 mm to about 1000 mm, from about 300 mm to about 900 mm, or from about 400 mm to about 800 mm, for example, about 500 mm.

In some embodiments, the second light source 302b provided by the light emitting element 304 of the second photographing component 400B may include visible light, for example, the wavelength range may be about 390 nm to about 780 nm. In some embodiments, the color temperature range of the second light source 302b provided by the light emitting element 304 may be about 3000K to about 6500K, about 4000K to about 6500K, or about 5000K to about 6000K. In addition, according to some embodiments, the intensity of the appropriate second light source 302b can be adjusted according to the process or product requirements (for example, the type of defect to be detected). In some embodiments, the wavelength and / or color temperature of the first light source 302a and the second light source 302b may be the same or different.

In addition, the second photographing module 400B may include a charge coupled device (CCD) camera or a video camera, which may convert an image into an electronic signal, that is, digitize the image digitally. In some embodiments, the second photographing assembly 400B may include a lens unit 402, and the lens unit 402 may have a central axis 402X ′. According to some embodiments, the central axis 402X ′ is a central axis of the lens unit 402 in a normal direction (for example, the Z direction shown in the figure) of the second surface 100 a of the optical film 100. In some embodiments, there is a second included angle θ ₂ ′ between the second optical axis LX _{2 of the} second light source 302 b and the central axis 402X ′ of the lens unit 402. In some embodiments, the second included angle θ ₂ ′ ranges from about 30 degrees to about 90 degrees, from about 45 degrees to about 90 degrees, or from about 60 degrees to about 90 degrees. In some embodiments, the second included angle θ ₂ ′ is about 90 degrees.

Furthermore, in some embodiments, the lens unit 402 is separated from the light emitting element 304 closest to the second photographing component 400B by a fifth distance D ₅ ′. According to some embodiments, the fifth distance D ₅ ′ may be a distance between the lens unit 402 and the light emitting element 304 in a normal direction of the optical film 100 (for example, a Z direction shown in the figure). In some embodiments, the fifth distance D ₅ ′ ranges from about 50 mm to about 400 mm, or from about 100 mm to about 300 mm, for example, about 200 mm.

In some embodiments, the second shooting component 400B may be further coupled to the image determination system 500. In some embodiments, the first camera module 400A and the second camera module 400B may be coupled to the same image determination system 500, that is, the image camera system 500 may simultaneously shoot the first camera module 400A and the second camera module 400B. The electronic signals generated by the received images are processed. In some embodiments, the first shooting component 400A and the second shooting component 400B may be separately coupled to different image determination systems 500.

According to the foregoing, in the optical film detection device 20, the tower-stacked first light source module 300A and the second light source module 300B can simultaneously perform multiple angles and intensities on the first surface 100a and the second surface 100b of the optical film 100. The light can be used to filter out minor deformation defects and reduce the time required for subsequent personnel screening.

Next, please refer to FIG. 3A. FIG. 3A shows a schematic side view structure diagram of the optical film detection device 30 in other embodiments according to the present disclosure. As shown in FIG. 3A, the optical film detection device 30 may include a transport system 200, a first light source module 300A, and a first photographing module 400A. In this embodiment, the conveying system 200 may include a guide roller, and the optical film 100 may be conveyed through the guide roller in the form of a roll. In this embodiment, the first light source module 300A and the first photographing module 400A may be disposed in a production section with a vertical difference.

Moreover, the transport system 200 can transport the optical film 100 along the second direction A2. In some embodiments, the section of the optical film 100 to be detected may be set in a direction substantially perpendicular to the ground (ie, the second direction A2 is substantially perpendicular to the ground), reducing the ambient light source (for example, provided in the ceiling Light source) on the accuracy of detection. In some embodiments, the section of the optical film 100 to be detected may be set in a direction within an angle of about 0 degrees to about 60 degrees with the normal direction of the ground, that is, the second direction A2 is normal to the ground. The included angle of the directions is about 0 degrees to about 60 degrees, about 0 degrees to about 45 degrees, or about 0 degrees to about 30 degrees.

As shown in FIG. 3A, the first light source assembly 300A may be disposed on one side of the optical film 100 and provides a first light source 302 a having a first optical axis LX ₁ . In some embodiments, the first light source assembly 300A may be disposed below the optical film 100 or on the side opposite to the ambient light source. According to some embodiments, the first optical axis LX _{1 of the} first light source 302 a is parallel or offset from the second surface 100 b of the optical film 100. In some embodiments, the first light source assembly 300A may be disposed in a direction substantially parallel to the second surface 100 b of the optical film 100. In some embodiments, the first optical axis LX _{1 does} not intersect the optical film 100 or the second surface 100 b of the optical film 100. In other words, the first light source 302a does not directly irradiate the optical film 100, thereby avoiding that the film surface is too bright, which makes it difficult to identify defects.

According to the foregoing, the optical film 100 is transmitted along the second direction A2. In some embodiments, the second direction A2 and the extension line LX ₁ ′ of the first optical axis LX ₁ form a third included angle θ ₃ and a third included angle θ ₃ . It may be about 0 degrees to about 90 degrees, about 0 degrees to about 60 degrees, about 0 degrees to about 45 degrees, or about 0 degrees to about 35 degrees.

In this embodiment, the first light source assembly 300A may include at least one light emitting element 304 and a cover 306 surrounding the light emitting element 304. The cover 306 can prevent the first light source 302 a provided by the light emitting element 304 from directly irradiating the second surface 100 b of the optical film 100. In some embodiments, the cover 306 may be formed of a material having light shielding properties. For example, in some embodiments, the material of the cover 306 may include a polymer material, a metal material, other suitable materials, or a combination thereof. The polymer material may include polycarbonate (PC), polymethylmethacrylate (PMMA), polyvinyl chloride (PVC), polypropylene (PP), or acrylonitrile-butyl Diene-styrene copolymer (ABS resin), polyester fiber, but not limited thereto. In some embodiments, an epoxy material or a polyester material can also be used as the coating of the cover 306. In some embodiments, the cover 306 may also contain additives, such as frosting powder or light diffusing agent, but is not limited thereto.

As mentioned above, the light emitting element 304 of the first light source assembly 300A may include a light emitting diode (LED), a micro light emitting diode (micro LED, mini LED), an organic light emitting diode (OLED), and a quantum dot organic light emitting diode. Body (QLED), other suitable light-emitting elements, or a combination of the foregoing, but is not limited thereto.

In some embodiments, the first light source 302a provided by the light emitting element 304 of the first light source assembly 300A may include visible light, for example, the wavelength range may be about 390 nm to about 780 nm, or about 520 nm to about 640 nm. In some embodiments, the first light source 302a may be yellow light. In some embodiments, the color temperature range of the first light source 302a provided by the light emitting element 304 may be about 3000K to about 6500K, about 4000K to about 6500K, or about 5000K to about 6000K. In addition, according to some embodiments, the intensity of the appropriate first light source 302a may be adjusted according to the process or product requirements (for example, the type of defect to be detected). For example, in some embodiments, the intensity of the first light source 302a may be above about 1000 Lux.

In addition, in this embodiment, the first light source component 300A and the first photographing component 400A may be disposed on opposite sides of the optical film 100, and the first photographing component 400A may photograph a refracted light image generated by the optical film 100. In detail, in this embodiment, the cover 306 can reflect the first light source 302a. When the reflected light hits the defect on the optical film 100, the unevenness of the defect will allow the light to be refracted to the first photographing component 400A. , So that defects can be easily identified. In contrast, a general optical film inspection device set up with a backlight type light source, whose light directly illuminates the film surface and transmits the film surface directly to the shooting component. The light is difficult to be refracted due to the unevenness of the defect itself, and the amount of light is too sufficient It is difficult to discern the difference in the amount of light refracted to the lens.

As mentioned above, the first photographing module 400A may include a photosensitive coupling device (CCD) camera or a video camera, which may convert an image into an electronic signal, that is, digitize the image digitally. In some embodiments, the first photographing assembly 400A may include a lens unit 402, and the lens unit 402 may have a central axis 402X. According to some embodiments, the central axis 402X is a central axis of the lens unit 402 in a normal direction of the first surface 100 a of the optical film 100. In some embodiments, there is a fourth included angle θ ₄ between the first optical axis LX _{1 of the} first light source 302 a and the central axis 402X of the lens unit 402. In some embodiments, the fourth included angle θ ₄ ranges from about 0 degrees to about 90 degrees, from about 30 degrees to about 80 degrees, or from about 45 degrees to about 70 degrees.

In addition, in some embodiments, a fifth included angle θ ₅ exists between the central axis 402X of the lens unit 402 and the first surface 100 a or the second surface 100 b of the optical film 100. In some embodiments, the fifth included angle θ ₅ ranges from about 0 degrees to about 90 degrees, from about 30 degrees to about 90 degrees, or from about 45 degrees to about 90 degrees. It should be noted that if the range of the fifth included angle θ ₅ is too large (for example, greater than 90 degrees), the first imaging component 400A may not be able to effectively identify defects.

Furthermore, there is a first minimum distance D ₆ between the first optical axis LX ₁ of the first light source 302 a provided by the first light source assembly 300A and the optical film 100. In some embodiments, the first minimum distance D ₆ ranges from about 5 cm to about 60 cm, about 10 cm to about 50 cm, or about 20 cm to about 40 cm, for example, about 30 cm. It should be noted that the distance between the first optical axis LX ₁ and the optical film 100 should not be too large, otherwise the first light source 302a may fail to reflect to the optical film 100, which may cause insufficient light sources.

In addition, the lens unit 402 of the first photographing module 400A and the optical film 100 have a second minimum distance D ₇ . In some embodiments, the second minimum distance D ₇ ranges from about 5 cm to about 100 cm, about 20 cm to about 80 cm, or about 40 cm to about 70 cm, for example, about 50 cm. It should be noted that the distance between the lens unit 402 and the optical film 100 should not be too large or too small, otherwise the lens unit 402 may not be able to take images effectively.

As mentioned above, according to some embodiments, the optical film detection device 30 further includes an image determination system 500, and the image determination system 500 may be coupled to the first photographing component 400A. The image determination system 500 may further process the electronic signals generated by the images captured by the first shooting component 400A.

In some embodiments, the image determination system 500 may determine whether there is a defect on the first surface 100 a of the optical film 100 according to the brightness difference of the light refracted from the optical film 100. Specifically, when there is a defect such as a foreign object or a bubble on the optical film 100, the light emitted from the first light source module 300A will be scattered by the foreign object or the bubble, and a part of the scattered light will enter the first photographing module 400A. On the other hand, in the case where there are no defects such as foreign objects or bubbles, since the scattered light does not occur, the image captured by the first imaging module 400A becomes dark. Therefore, the defects are significantly different from other areas in the formed image. For example, the brightness at a defect may be higher, and the brightness of a flat portion without a defect may be lower.

In some embodiments, the image determination system 500 may include software and hardware (central processing unit (CPU), memory, etc.), and may also include special application integrated circuits (ASIC), dedicated circuits, firmware, and the like. The image processing of the image determination system 500 can be realized by the synergy of the aforementioned components.

Next, please refer to FIG. 3B. FIG. 3B shows a schematic diagram of a top view structure of the optical film detection device 30 according to some embodiments of the present disclosure. As shown in FIG. 3B, in some embodiments, compared to the first light source component 300A, the first photographing component 400A may be disposed downstream. However, in other embodiments, the first light source component 300A and the first photographing component 400A may partially overlap in the normal direction of the optical film 100.

Moreover, the light emitting element 304 may have a width W ₁ , and the optical film 100 may have a width W ₂ . According to some embodiments, the width W ₁ of the light emitting element 304 in the optical film are substantially in the direction (e.g., Y direction shown in the drawing) 100 transmits the second direction A2 perpendicular to the width. In some embodiments, the width W _{1 of the} light emitting element 304 is larger than the width W _{2 of the} optical film 100. The first light source 302 a provided by the first light source assembly 300A may completely illuminate the first surface 100 a of the optical film 100.

In addition, it should be understood that although in the embodiment shown in FIG. 3B, only one first photographing component 400A is shown, in other embodiments, the optical film detection device 30 may have a plurality of first photographing components 400A. . In some embodiments, a suitable number of first photographing components 400A may be determined according to the maximum width of the optical film 100. In detail, the full-field width of the first photographing component 400A needs to be greater than the maximum width of the optical film 100.

According to the foregoing, the optical film detection device 30 can mainly target the air bubbles on the optical film 100, especially the micro air bubbles and scratches, by using the first light source module 300A and the first photographing module 400A configured with the optical film 100 at a specific relative position. Defects such as dirt or water marks can also be detected. The light source can irradiate the surface of the optical film 100 in the form of scattered light, which improves the detection efficiency of the aforementioned defects and reduces the missed detection rate.

Next, please refer to FIG. 4. FIG. 4 shows a flowchart of the steps of the optical film detection method 10A in some embodiments according to the present disclosure. The optical film detection method 10A can be implemented by the optical film detection device of the foregoing embodiment, which can be used to detect defects of the optical film 100 to be tested. Here, an example of the optical film detection method 10A using the optical film detection device 10 is described below.

It should be understood that according to some embodiments, additional operation steps may be provided before, during, and / or after the detection method 10A of the optical film is performed. According to other embodiments, some of the stages (or steps) may be deleted or replaced as appropriate, or the order of the steps may be reversed depending on the situation.

As shown in FIG. 4, the optical film detection method 10A may include the following steps: carrying and transporting the optical film 100 to be tested with the transport system 200 (step S12); and providing the first light source 302 a with the first light source assembly 300A (step S14) ; And photographing the first surface 100a of the optical film 100 to be measured with the first photographing module 400A (step S16).

In detail, in step S12, the conveyance system 200 may convey the optical film 100 to be tested along the first direction A1. According to the foregoing, in some embodiments, the first direction A1 transmitted by the optical film 100 and the extension line of the first optical axis LX ₁ of the first light source 302 a form a first included angle θ ₁ (not shown). In some embodiments, the first included angle θ ₁ is about 0 degrees.

In step S14, the first light source 100 disposed offset lines assembly 300A tested optical film, such that the first axis of the first light source 302a may be parallel or divergent LX ₁ measured first surface 100a of the optical film 100. According to some embodiments, the first light source 302a irradiates the first surface 100a of the optical film 100 to be measured in the form of scattered light.

In addition, in step S16, the first shooting component 400A may be set so that a second included angle θ _{2 is formed} between the central axis 402X of the lens unit 402 and the first optical axis LX ₁ . In some embodiments, the second included angle θ ₂ ranges from about 30 degrees to about 90 degrees, from about 45 degrees to about 90 degrees, or from about 60 degrees to about 90 degrees. In some embodiments, the second included angle θ ₂ is about 90 degrees.

In addition, as shown in FIG. 4, according to some embodiments, the optical film detection method 10A further includes determining whether the optical film 100 to be tested has a defect using the image determination system 500 (step S18). The image determination system 500 can make a determination based on the brightness difference of the light reflected from the first surface 100 a of the optical film 100 to be measured.

Next, please refer to FIG. 5. FIG. 5 shows a flowchart of the steps of the optical film detection method 10B in some embodiments according to the present disclosure. As shown in FIG. 5, compared to the optical film detection method 10A, the optical film detection method 10B may further include the following steps before step S12 of carrying and transporting the optical film 100 to be tested by the transport system 200: The optical film standard samples are inspected, and the image parameters of qualified defects are recorded by the image determination system 500 (step 22); the optical film standard samples with unqualified defects are detected, and the images of the defective images are recorded by the image determination system 500 The parameters (step 24); and adjusting the brightness threshold for detecting the defects of the optical film 100 to be tested using the image parameters of the qualified defect and the image parameters of the unqualified defect (step 26).

The foregoing steps 22 to 26 can be further used to make the image determination system 500 perform parameter adjustment on the image captured by the first shooting component 400A. Specifically, the defects can be divided into qualified defects and unqualified defects. Qualified defects can be defined as minor defects that can be tolerated in the process or product, and unqualified defects can be defined as defects that are not allowed in the process or product. For example, More serious depressions. It should be understood that according to different embodiments, the judgment criteria of qualified defects and unqualified defects may be different according to the actual needs of optical film products.

In steps 22 and 24, according to the actual requirements of the optical film product, an optical film standard sample with qualified defects and an optical film standard sample with unqualified defects may be appropriately prepared. In some embodiments, the image parameters of the pass and fail defects can be recorded by the memory in the image determination system 500, for example, the brightness parameter (gray level value).

In step 26, the brightness threshold used to detect the defects of the optical film 100 to be tested can be adjusted based on the image parameters obtained in steps 22 and 24. Specifically, in some embodiments, the threshold of each pixel of the defective defects to be filtered out can be adjusted to the maximum number of gray levels. For example, in some embodiments, the pixel threshold of a non-conforming defect may be adjusted to 255 bits.

In addition, according to some embodiments, after the optical film detection method 10B determines whether the optical film 100 to be tested has a defect in step S18 using the image determination system 500, the method may further include screening the detected images with an image post-processing system (not shown). Defects (step 28).

In some embodiments, the image post-processing system adjusts a size threshold for screening defects detected by the foregoing steps according to the image parameters of the qualified defects and the image parameters of the unqualified defects. Specifically, due to the different defect types, the edges of some qualified defects that have been filled with light may produce unfilterable noise, and then be classified as unqualified defects. Therefore, it can be further filtered by the image post-processing system. For detected defects, for example, the size threshold of the defect can be further set to filter out such noise.

In detail, please refer to FIG. 6, which illustrates a calculation method of the size threshold of the image post-processing system in some embodiments according to the disclosure. According to some embodiments, the size threshold SV (denoted by * in the figure) of a defect for an image post-processing system can be calculated by the following formula (I): (A-B) / 2 + B Formula (I).

In the formula (I), A is the size (threshold value) of a defective defect, and B is the size (threshold value) of a qualified defect. With the setting of the defect size threshold SV of the image post-processing system, it is possible to further filter the qualified defects that are mistakenly classified as unqualified defects after being filled with light.

In summary, according to some embodiments of the present disclosure, the light source component of the optical film detection device may provide a light source with an optical axis parallel or off the surface of the optical film, that is, the surface of the optical film is illuminated by a parallel light source or a side light source to detect Defects on the optical film, such as dents, scratches, water marks, or tiny air bubbles. With this configuration, it is possible to more effectively detect the presence of defect types that cannot be detected by automatic optical inspection equipment. According to some embodiments of the present disclosure, it is possible to further supplement the light for the minor defects or to screen the detected defects, thereby filtering out the minor defects to be excluded, so as to improve the detection efficiency and reduce the labor time.

Although the embodiments and advantages of this disclosure have been disclosed as above, it should be understood that anyone with ordinary knowledge in the technical field can make changes, substitutions, and decorations without departing from the spirit and scope of this disclosure. In addition, the scope of protection of this disclosure is not limited to the processes, machines, manufacturing, material composition, devices, methods and steps in the specific embodiments described in the description. Any person with ordinary knowledge in the technical field to which this disclosure pertains may disclose content from this disclosure To understand the current or future development of processes, machines, manufacturing, material composition, devices, methods and steps, as long as they can implement substantially the same functions or achieve approximately the same results in the embodiments described herein, they can be used according to this disclosure. Therefore, the scope of protection of this disclosure includes the aforementioned processes, machines, manufacturing, material composition, devices, methods and steps. In addition, each patent application scope constitutes a separate embodiment, and the protection scope of this disclosure also includes a combination of each patent application scope and embodiment. The scope of protection of this disclosure shall be determined by the scope of the appended patent application.

10, 20, 30‧‧‧Optical film detection device

10A, 10B‧‧‧Optical film detection method

100‧‧‧ Optical Film

100a‧‧‧first surface

100b‧‧‧Second surface

200‧‧‧ Conveying System

300A‧‧‧First light source assembly 300B‧‧‧Second light source assembly 302a‧‧‧First light source

302b‧‧‧Second light source

304, 304a, 304b‧‧‧light-emitting elements

304p‧‧‧ bottom

304t‧‧‧Top

306‧‧‧ cover

400A‧‧‧First shooting kit

400B‧‧‧Second shooting kit

402‧‧‧lens unit

402X, 402X’‧‧‧ center axis

500‧‧‧image judgment system

A‧‧‧Unqualified defect size

A1‧‧‧First direction

A2‧‧‧Second direction

B‧‧‧ size of qualified defect

D ₁ ‧‧‧ the first distance

D ₂ ‧‧‧Second Distance

D ₃ , D ₃ '‧‧‧ third distance

D ₄ , D ₄ '‧‧‧ fourth distance

D ₅ , D ₅ '‧‧‧ fifth distance

D ₆ ‧‧‧ sixth distance

D ₇ ‧‧‧seventh distance

LX ₁ ‧‧‧First optical axis

LX ₁ '‧‧‧ extension line

LX ₂ ‧‧‧Second optical axis

S12 ~ S18, S22 ~ S28‧‧‧step

SV‧‧‧Threshold

P‧‧‧ Projection

W ₁ ‧‧‧Width

W ₂ ‧‧‧Width

θ ₁ , θ ₁ '‧‧‧ the first included angle

θ ₂ , θ ₂ '‧‧‧ the second angle

θ ₃ ‧‧‧ third angle

θ ₄ ‧‧‧ fourth angle

θ ₅ ‧‧‧ fifth included angle

θ _d ‧‧‧ tolerance angle

FIG. 1A is a schematic diagram of a side view of an optical film detection device according to some embodiments of the disclosure; FIG. 1B is a schematic diagram of a top-view structure of an optical film detection device according to some embodiments of the disclosure; FIG. FIG. 3A shows a schematic side view structure of an optical film detection device in some embodiments according to the disclosure; FIG. 3A shows a schematic side view structure of an optical film detection device in some embodiments according to the disclosure; FIG. 3B shows some embodiments according to the disclosure, Schematic diagram of the top view structure of an optical film detection device; FIG. 4 shows a flowchart of steps of a method for detecting an optical film according to some embodiments of the present disclosure; FIG. 5 shows a method of detecting an optical film according to some embodiments of the present disclosure; Step flowchart; FIG. 6 shows a calculation method of a size threshold of an image post-processing system in some embodiments of the present disclosure.

Claims (30)

An optical film detection device is used to detect a defect of an optical film. The optical film detection device includes: a conveying system for carrying and conveying the optical film; a first light source component disposed on an optical film; A first light source is provided, wherein the first light source has a first optical axis; and a first photographing component is disposed on one side of the optical film and photographs a first surface of the optical film, Wherein, the first optical axis of the first light source is parallel or offset from the first surface of the optical film. The optical film detection device according to item 1 of the scope of patent application, wherein the optical film is transmitted in a first direction, and the first direction forms a first angle with the extension line of the first optical axis. The range is 0 degrees to 90 degrees. The optical film detection device according to item 1 of the application, wherein the first optical axis does not intersect the first surface of the optical film. The optical film detection device according to item 1 of the scope of patent application, wherein the first photographing component has a lens unit, a second angle between the first optical axis and a central axis of the lens unit, and the second The included angle ranges from 30 degrees to 90 degrees. The optical film detection device according to item 1 of the scope of patent application, wherein the first light source component and the first photographing component are disposed on the same side of the optical film, and the first light source component is disposed on the first photographing component and Between the optical films. The optical film detection device according to item 5 of the patent application scope, wherein the first light source component includes at least one group of light emitting elements disposed oppositely. The optical film detection device according to item 6 of the patent application scope, wherein the first light source component includes 3 to 15 groups of light emitting elements disposed oppositely; or the light source components of the first light source component disposed oppositely are in a tower shape Way to stack. The optical film detection device according to item 6 of the scope of patent application, wherein the first light source component includes a set of first light emitting elements disposed oppositely, and a set of first light emitting elements disposed on the first light emitting element. Two light-emitting elements, wherein the first light-emitting elements of the group are separated by a first distance, and the second light-emitting elements of the group are separated by a second distance, wherein the second distance is smaller than the first distance. The optical film detection device according to item 6 of the scope of the patent application, wherein the group of light-emitting elements disposed opposite each other has a width that is greater than the width of the optical film. The optical film detection device according to item 6 of the scope of patent application, wherein the bottom of the light-emitting element closest to the optical film has a third distance from the first surface of the optical film, and the third distance is along the optical The distance between the bottom of the film in the normal direction and the optical film; or the third distance ranges from 10 mm to 100 mm. The optical film detection device according to item 6 of the scope of patent application, wherein a fourth distance is separated between the bottom of the light emitting element 304 closest to the first photographing component and the first surface of the optical film, wherein the first The four distances are the distance between the bottom along the normal direction of the optical film and the optical film; or the fourth distance ranges from 200 mm to 1000 mm. The optical film detection device according to item 1 of the patent application scope further includes an image determination system, the image determination system is coupled to the first shooting component, and the image determination system is based on the first surface from the optical film. The difference in brightness of the reflected light determines whether a defect exists. The optical film detection device according to item 5 of the scope of patent application, further comprising a second light source component and a second photographing component, wherein the second light source component and the first light source component are disposed on opposite sides of the optical film. The second photographing component and the first photographing component are disposed on opposite sides of the optical film. The optical film detection device according to item 13 of the scope of patent application, wherein the wavelength range of the second light source is 390nm to 780nm; or the color temperature range of the second light source is 3000K to 6500K. The optical film detection device according to item 13 of the patent application scope, wherein the second photographing component photographs a second surface of the optical film, the second light source component provides a second light source, and the second light source has a A second optical axis, and the second optical axis is parallel or offset from the second surface of the optical film. The optical film detection device according to item 1 of the scope of patent application, wherein the first light source component and the first photographing component are disposed on opposite sides of the optical film. The optical film detection device according to item 16 of the application, wherein the first light source component includes at least one light emitting element and a cover surrounding the light emitting element. The optical film detection device according to item 16 of the scope of patent application, wherein a first minimum distance between the first optical axis of the first light source component and the optical film is in a range of 5 cm to 60cm. The optical film detection device according to item 16 of the scope of patent application, wherein the first shooting component has a lens unit, and a second minimum distance between the lens unit and the optical film, and the range of the second minimum distance is 5cm to 100cm. An optical film inspection method, which is used to detect a defect of an optical film to be tested, includes: carrying and transporting the optical film to be tested by a transport system; providing a first light source with a first light source component, wherein the first A light source component is disposed on one side of the optical film under test, and the first light source has a first optical axis; and a first photographing component is used to photograph a first surface of the optical film under test, wherein the first A light source assembly is offset from the optical film to be tested, so that the first optical axis is parallel or offset from the first surface of the optical film to be tested. The method for detecting an optical film according to item 20 of the application, wherein the first light source irradiates the first surface of the optical film to be measured in the form of scattered light. The method for detecting an optical film according to item 20 of the scope of patent application, wherein the optical film to be measured is transmitted in a first direction, the first direction and a first optical axis extension line forming a first angle, the first An included angle ranges from 0 degrees to 90 degrees. The method for detecting an optical film according to item 20 of the patent application scope, wherein the first shooting component has a lens unit, and a second included angle is formed between the first optical axis and a central axis of the lens unit. The two included angles range from 30 degrees to 90 degrees. The method for detecting an optical film according to item 20 of the scope of patent application, wherein the first light source component and the first photographing component are disposed on the same side of the optical film to be measured, and the first light source component is disposed on the first Between the photographing component and the optical film to be tested. According to the method for detecting an optical film according to item 20 of the patent application scope, the method further includes determining whether the optical film to be tested has a defect by using an image judgment system. The image judgment system is based on the first surface from the optical film to be tested. The difference in brightness of the reflected light is discriminated. The method for detecting an optical film according to item 20 of the patent application, wherein the first light source component and the first photographing component are disposed on opposite sides of the optical film, and the first light source component includes at least one light emitting element and A cover surrounding the light emitting element. The method for detecting an optical film according to item 20 of the patent application scope, wherein before the step of carrying and conveying the optical film to be tested by the conveying system, the method further comprises: detecting an optical film standard sample with qualified defects, and borrowing An image parameter of the qualified defect is recorded by the image determination system; an optical film standard sample having an unqualified defect is detected, and an image parameter of the unqualified defect is recorded by the image determination system; and an image of the qualified defect is recorded by the image determination system. The parameters and the image parameters of the unqualified defect adjust the brightness threshold for detecting the defect of the optical film to be tested. The method for detecting an optical film according to item 27 of the patent application scope further includes screening an detected defect with an image post-processing system. The method for detecting an optical film according to item 28 of the scope of application for a patent, wherein the image post-processing system adjusts the parameters for screening the detected defects according to the image parameters of the qualified defects and the image parameters of the unqualified defects. A size threshold. The inspection method of the optical film according to item 29 of the scope of the patent application, wherein the setting of the size threshold is in accordance with the following formula (I): (AB) / 2 + B formula (I), where A is the size of the unqualified defect , B is the size of the qualified defect.