TWI745129B - Optical film detection system and optical film detection method using the same - Google Patents

Abstract

An optical film detection system includes a heat detection device and a processor. The heat detection device is configured to detect heat distribution of an optical film and an environment. The processor is configured to determine a position of a film boundary of the optical film according to the heat distribution.

Description

Optical film detection system and optical film detection method using the same

The present invention relates to a detection system and a detection method using the same, and more particularly to an optical film detection system and an optical film detection method using the same.

The conventional method of detecting optical film is to use image analysis technology. For example, automatic optical inspection (AOI) technology is used to capture the image of the optical film, and then analyze the characteristics of the optical film. However, image analysis technology usually involves a large number of data calculations and complex algorithms, and image analysis is highly sensitive to the wrinkles of the optical film itself, that is, the wrinkles of the optical film itself may cause inaccurate image analysis results. Therefore, how to propose a technology that can improve the aforementioned conventional problems is one of the goals of the industry in this technical field.

The present invention relates to an optical film detection system and an optical film detection method using the optical film detection system, which can improve the aforementioned conventional problems.

An embodiment of the present invention provides an optical film detection system. The optical film detection system includes a first thermal detection device and a processor. For the first heat detection device To detect a first heat distribution of the optical film and the environment. The processor is used for obtaining the position of the first film boundary of the optical film according to the first heat distribution.

Another embodiment of the present invention provides an optical film detection method. The optical film detection method includes the following steps. Detecting a first heat distribution of an optical film; and obtaining a position of a first film boundary of the optical film according to the first heat distribution.

In order to have a better understanding of the above and other aspects of the present invention, the following specific examples are given in conjunction with the accompanying drawings to describe in detail as follows:

10: Optical film

11: The first part

12: The second part

100, 100’, 200, 300: Optical film detection system

110,110’: The first heat detection device

120: Second heat detection device

130: processor

140: Ranging device

150: reflective element

210,210’,210”: Heat detection group

220,220’: Treatment tank

230: scroll wheel

340: First Load

340s: first surface

350: second load

A1, A1’, A2: detection axis

E11: First membrane boundary

E12: First zone boundary

E21: Second membrane boundary

E22: Second area boundary

E3: Upper boundary

E4: lower boundary

ER: Reference position

△E: Offset

L1,L1’: first distance

L2, L2’: second distance

L3: Spacing

M1, M1’: the first temperature distribution map

M11, M11’: the first image boundary

M12, M12’: the third image boundary

M2: Second temperature distribution map

M21: Second image boundary

M22: Fourth image boundary

P1, P1’: pixels

PL: plane

R1: First correction ratio

R2: Second correction ratio

S1: First heat distribution

S2: second heat distribution

S3: Measured value

W1: width

FIG. 1A shows a schematic diagram of an optical film detection system according to an embodiment of the present invention.

FIG. 1B is a schematic diagram of another viewing angle of the optical film detection system of FIG. 1A.

FIG. 2 is a schematic diagram of the first temperature distribution diagram detected by the optical film detection system of FIG. 1A.

FIG. 3 is a schematic diagram of the second temperature distribution map M2 detected by the optical film detection system of FIG. 1A.

FIG. 4A shows a schematic diagram of an optical film detection system according to another embodiment of the present invention.

FIG. 4B is a schematic diagram of the first temperature distribution diagram detected by the optical film detection system of FIG. 4A.

FIG. 5A shows a schematic diagram of an optical film detection system according to another embodiment of the invention.

Fig. 5B shows a schematic diagram of the optical film of Fig. 5A being detected by two thermal detection groups before and after passing through the processing tank.

Figure 5C shows the width change of the optical film in Figure 5B before and after the processing tank picture.

FIG. 6A is a schematic diagram of an optical film detection system according to another embodiment of the present invention.

Figure 6B shows a cross-sectional view of the optical film detection system of Figure 6A along the direction 5B-5B'.

FIG. 7 shows a flowchart of the optical film detection method of the optical film detection system in FIG. 1A.

Fig. 8 shows a flowchart of the optical film detection method of the optical film detection system of Fig. 5A.

Please refer to Figures 1A, 1B, 2 and 3, Figure 1A shows a schematic diagram of an optical film detection system 100 according to an embodiment of the present invention, and Figure 1B shows another optical film detection system 100 of Figure 1A Schematic diagram of the viewing angle, Figure 2 shows a schematic diagram of the first temperature distribution map M1 detected by the optical film detection system 100 of Figure 1A, and Figure 3 shows the optical film detection system 100 of Figure 1A A schematic diagram of the measured second temperature distribution map M2.

The optical film detection system 100 can detect and/or obtain information of the optical film 10, such as the boundary position, width, or other characteristics related to the boundary position of the optical film 10. The optical film 10 is, for example, a single-layer film or a multi-layer film, including benefits for optical gain, alignment, compensation, steering, orthogonality, diffusion, protection, anti-sticking, scratch resistance, anti-glare, reflection suppression, high refractive index, etc. The film, for example, can be a polarizing film, a release film, a wide viewing angle film, a brightness enhancement film, a reflective film, a protective film, an oriented liquid crystal film with characteristics such as a controlled viewing angle compensation or birefringence (birefraction), a hard coat film, an anti- Reflective film, anti-adhesive film, diffusion film, anti-glare film and other films with surface treatments or a combination of the above, but not limited thereto.

In one embodiment, the optical film 10 may include a polyvinyl alcohol (PVA) resin film, which may be made by saponifying polyvinyl acetate resin. Examples of polyvinyl acetate resins include a single polymer of vinyl acetate, namely polyvinyl acetate, a copolymer of vinyl acetate, and other monomers that can be copolymerized with vinyl acetate. Examples of other monomers that can be copolymerized with vinyl acetate include unsaturated carboxylic acids (such as acrylic acid, methacrylic acid, ethyl acrylate, n-propyl acrylate, methyl methacrylate), olefins (such as ethylene, propylene, 1 -Butene, 2-methacrylic acid), vinyl ether (e.g. ethyl vinyl ether, methyl vinyl ether, n-propyl vinyl ether, isopropyl vinyl ether), unsaturated sulfonic acid (e.g. vinyl sulfonic acid, vinyl Sodium sulfonate) and so on.

The optical film detection system 100 includes a first heat detection device 110, a second heat detection device 120, a processor 130, a distance measuring device 140 and a reflective element 150. The processor 130 is, for example, any physical circuit formed by a semiconductor manufacturing process, such as a semiconductor chip, a semiconductor package, and the like.

The first heat detection device 110 is used to detect the first heat distribution S1 of the optical film 10 and the environment. The processor 130 is used for obtaining the position of the first film boundary E11 of the optical film 10 according to the first heat distribution S1. In this way, without complicated image processing equipment (eg, automatic optical inspection equipment) and/or image processing algorithms, the position of the film boundary of the optical film 10 can be obtained based on the difference between the temperature of the optical film 10 and the ambient temperature. The aforementioned "environment" refers to entities or spaces other than the optical film 10, such as the background of the optical film 10. In one embodiment, the "environment" can be air, a treatment tank, or a treatment tank liquid.

Compared with automatic optical detection, the first thermal detection device 110 is less sensitive to the optical film 10. In detail, the deformation of the optical film 10, such as wrinkles or reflexes, horizontal movement/swaying or vertical movement/swaying, does not affect the accuracy of the first heat detection device 110 to detect the heat distribution of the optical film 10, or has little effect . In this way, even if the optical film 10 is deformed, moved or shaken during the detection process, the optical film detection system 100 can accurately detect the boundary position of the optical film 10. In addition, the first heat detection device 110 does not heat the optical film 10 itself, but simply detects the heat distribution of the optical film 10 itself. As long as the temperature of the optical film 10 is relatively high or low relative to the environment, the optical film detection system 100 can detect the boundary position of the optical film 10 according to the heat distribution of the optical film 10 itself.

In one embodiment, the detection spectrum range of the first thermal detection device 110 is, for example, between 8 μm and 14 μm, and the scanning frequency is, for example, between 0.5 Hz and 64 Hz. In one embodiment, the first heat detection device 110 may be a far infrared device.

In an embodiment, the first thermal detection device 110 is, for example, a thermal imaging device, which can detect the first thermal distribution S1 of the optical film 10 and the environment, and transmit the first thermal distribution S1 to the processor 130. The processor 130 obtains the temperature distribution of the optical film 10 according to the first heat distribution S1. In an embodiment, the first heat distribution S1 includes, for example, N radiation signal intensity values. The processor 130 converts the first temperature distribution map M1 of an n × m array (ie, a two-dimensional array, where n × m =N) according to the N signal intensity values, as shown in FIG. 2. The first temperature distribution map M1 includes the heat distribution of the optical film 10 and the heat distribution of the environment. The processor 130 can obtain a temperature value corresponding to the intensity of a radiation signal according to the corresponding relationship (not shown) between the intensity value of a radiation signal and the temperature value. The aforementioned corresponding relationship is, for example, a table or a mathematical equation. As shown in FIG. 2, the first temperature distribution map M1 includes n × m pixels P1, and each pixel P1 has a color, which represents a corresponding temperature value. n and m are, for example, positive integers equal to or greater than 1, and n and m may be equal or unequal. In this embodiment, n is, for example, 32, and m is, for example, 24, but the embodiment of the present invention is not limited thereto.

In addition, the processor 130 is configured to determine at least one pixel corresponding to the first film boundary E11 of the optical film 10 in the first temperature distribution map M1 according to the several temperature values of the several pixels in the first temperature distribution map M1. For example, as shown in FIG. 2, the color of the pixel P1' of the first temperature distribution map M1 and the adjacent pixel P1 (for example, a pixel that reflects the ambient temperature) are different, indicating that the pixel P1' and the adjacent pixel P1 have a temperature If there is a difference, the processor 130 determines that the pixel corresponding to the first film boundary E11 of the optical film 10 in the first temperature distribution map M1 is the pixel P1' according to the temperature difference. In an embodiment, the temperature difference is, for example, between 0 degrees Celsius and 40 degrees Celsius. When the temperature difference is greater than 2 degrees Celsius, the processor 130 can accurately distinguish the position of the first film boundary E11, and the resolution accuracy rate is higher than that of the automatic optical inspection equipment. In an embodiment, in the first temperature distribution map M1, the temperature values of the pixels corresponding to the optical film 10 area are, for example, between 23 degrees Celsius and 65 degrees Celsius, and the temperature values of the pixels corresponding to the environmental area The temperature value is, for example, between 23 degrees Celsius and 25 degrees Celsius. However, the aforementioned temperature value may depend on the type of manufacturing process of the optical film 10 and the type of environment in which it is located, and is not limited by the embodiment of the present invention.

The type and/or operation principle of the second heat detecting device 120 are the same as those of the first heat detecting device 110, and will not be repeated here. The principle of obtaining the second temperature distribution map M2 by the processor 130 is the same as the principle of obtaining the first temperature distribution map M1 described above. This will not be repeated here.

In one embodiment, as shown in FIG. 1B, the first heat detection device 110 and the second heat detection device 120 are, for example, coplanar, such as coplanar (eg, aligned with the plane PL) configuration, so that the first thermal The distance between the detection device 110 and the second heat detection device 120 relative to the optical film 10 is equal. The configuration of the first heat detection device 110 and the second heat detection device 120 of the embodiment of the present invention is not limited by the figure 1A.

In another embodiment, the first heat detection device 110 can be arranged obliquely with respect to the optical film 10. The first heat detection device 110 has a detection axis A1, which is, for example, the detection direction of the first heat detection device 110. The angle between the projection of the detection axis A1 on the XZ plane and the Z axis can be between +/-90 degrees. For example, when the angle is 0 degrees, the detection axis A1 is perpendicular to the film surface of the optical film 10, and the orientation of the first heat detection device 110 is the orientation shown in Figure 1A; when the angle is +90 degrees, the first The thermal detection device 110 is directly facing the upper boundary E3 of the optical film 10; when the angle is -90 degrees, the first thermal detection device 110 is directly facing the lower boundary E4 of the optical film 10. Similarly, the second heat detecting device 120 can be arranged obliquely with respect to the optical film 10. The second heat detection device 120 has a detection axis A2, which is, for example, the detection direction of the second heat detection device 120. The angle between the projection of the detection axis A2 on the XZ plane and the Z axis can be between +/-90 degrees. For example, when the angle is 0 degrees, the detection axis A2 is perpendicular to the film surface of the optical film 10, and the orientation of the second heat detection device 120 is the orientation shown in Figure 1A; when the angle is +90 degrees, the second The thermal detection device 120 is directly facing the upper boundary E3 of the optical film 10; when the angle is -90 degrees, the second thermal detection device 120 is directly facing the lower boundary E4 of the optical film 10.

The illustrated Z axis is, for example, perpendicular to the film surface of the optical film 10, and the XY plane is flat. The surface is, for example, parallel to the film surface of the optical film 10, the X axis is, for example, parallel to the first film boundary E11, and the Y axis is, for example, perpendicular to the first film boundary E11.

In another embodiment, the angle between the projection of the detection axis A1 of the first thermal detection device 110 on the YZ plane and the Z axis may be between +/-90 degrees. For example, when the angle is 0 degrees, the detection axis A1 is perpendicular to the film surface of the optical film 10, and the orientation of the first heat detection device 110 is the orientation shown in Figure 1A; when the angle is +90 degrees, the first The thermal detection device 110 is directly facing the first film boundary E11 of the optical film 10; when the angle is -90 degrees, the first thermal detection device 110 is directly facing the second film boundary E21 of the optical film 10. Similarly, the angle between the projection of the detection axis A2 of the second thermal detection device 120 on the YZ plane and the Z axis can be between +/-90 degrees. For example, when the angle is 0 degrees, the detection axis A1 is perpendicular to the film surface of the optical film 10, and the orientation of the second thermal detection device 120 is the orientation shown in Figure 1A; when the angle is -90 degrees, the second The thermal detection device 120 is directly facing the second film boundary E21 of the optical film 10; when the angle is +90 degrees, the second thermal detection device 120 is directly facing the first film boundary E11 of the optical film 10.

As shown in FIG. 1A, the first heat distribution S1 detected by the first heat detection device 110 is the heat distribution of the first part 11 of the optical film 10 and the environment, and the second heat detection device 120 detects The second heat distribution S2 is the heat distribution of the second part 12 of the optical film 10 and the environment. The processor 130 is further used to: (1) determine the position of the first film boundary E11 according to the first heat distribution S1; (2) determine the position of the second film boundary E21 according to the second heat distribution S2. In the embodiment, the first film boundary E11 and the second film boundary E21 are two opposite sides of the optical film 10, and the distance between the first film boundary E11 and the second film boundary E21 is the width W1 of the optical film 10.

The processor 130 is further used to: obtain the position of the first film boundary E11 of the first section 11 and the second film boundary E21 of the second section 12 according to the distance L3 between the first section 11 and the second section 12 The width W1 between the first film boundary E11 and the second film boundary E21. The following examples are described in detail.

The first temperature distribution map M1 in Figure 2 includes a first image boundary M11 and a third image boundary M12 opposite to each other, and the second temperature distribution map M2 in Figure 3 includes a second image boundary M21 and a fourth image opposite to each other Like border M22.

The optical film 10 includes a first part 11 and a second part 12. The first image boundary M11 and the third image boundary M12 respectively correspond to the first region boundary E12 and the first film boundary E11 that are opposite to the first part 11, and the second image boundary M21 and the fourth image boundary M22 respectively correspond to The second region boundary E22 and the second film boundary E21 opposite to the second part 12 of the optical film 10. The processor 130 is further used to: (1) obtain the first distance L1′ between the first image boundary M11 and the third image boundary M12; (2) obtain the second image boundary M21 and the fourth image The second distance L2' between the boundaries M22; (3). According to the distance L3 between the first area boundary E12 and the second area boundary E22 of the optical film 10, the first distance L1' of the first temperature distribution map M1 and The second distance L2' of the second temperature profile M2 obtains the width W1 between the first film boundary E11 and the second film boundary E21.

In an embodiment, the processor 130 may obtain the actual first distance L1 of the optical film 10 according to the first distance L1' on the first temperature distribution map M1 (the first distance L1 is shown in FIG. 1A), and according to The second distance L2' on the second temperature distribution map M2 obtains the actual second distance L2 of the optical film 10 (the second distance L2 is shown in Fig. 1A), and obtain the width W1 of the optical film 10 according to the first distance L1, the second distance L2, and the interval L3. For example, the first distance L1' and the first distance L1 have a first correction ratio R1, and the second distance L2' and the second distance L2 have a second correction ratio R2. The processor 130 is used to: (1) obtain a first product value of the first distance L1' and the first correction ratio (ie, the product value of L1'×R1); (2) take the first product value as The first distance L1; (3). Obtain a second product value of the second distance L2' and the second correction ratio (ie, the product value of L2'×R2); (4). Take the second product value as the first Two distances L2; and, (5). Obtain the width W1 between the first film boundary E11 and the second film boundary E21 according to the following formula (a).

W1=L1+L2+L3.....(a)

The aforementioned first correction ratio R1 and second correction ratio R2 can be pre-stored in the processor 130, which can be set up in the relative geometric relationship between the first heat detection device 110, the second heat detection device 120, and the optical film 10 After completion, it can be obtained by experiment or calibration. Depending on the actual situation, the value of the first correction ratio R1 and/or the second correction ratio R2 can be any integer equal to 1, or greater than or less than 1.

In addition, the aforementioned distance L3 is, for example, pre-stored in the processor 130. In this example, the optical film detection system 100 can omit the distance measuring device 140 and the reflective element 150. Alternatively, the distance L3 is measured on-site by the distance measuring device 140 during the process of detecting the heat distribution of the optical film 10 by the optical film detection system 100. For example, as shown in FIGS. 1A and 1B, the distance measuring device 140 is disposed on the first thermal detection device 110 to detect the distance between the distance measuring device 140 and the reflective element 150. The value S3 measured by the distance measuring device 140 can be equal to the difference between the first area boundary E12 of the first part 11 and the second part 12 The distance L3 between the boundaries E22 of the second area, or the result of a mathematical operation (such as at least one of addition, subtraction, multiplication, and division) between the value S3 measured by the distance measuring device 140 and a correction value (not shown) Can be equal to the distance L3. In one embodiment, the value S3 is a distance value, and the product of the value S3 and the correction value is equal to the distance L3. The aforementioned correction value can be stored in the processor 130, which can be completed after the relative geometric relationship between the first heat detection device 110, the second heat detection device 120, the optical film 10, the distance measuring device 140, and the reflective element 150 is set up. , Obtained by experiment or calibration.

In addition, the distance between the distance measuring device 140 and the reflecting element 150 is adjustable, which can produce at least one of the following technical effects: (1). In conjunction with the correction value, the value S3 measured by the distance measuring device 140 is The result of the mathematical operation of the correction value is equal to the distance L3; (2). Make the value S3 measured by the distance measuring device 140 equal to the difference between the first area boundary E12 of the first part 11 and the second area boundary E22 of the second part 12 Spacing L3.

The reflective element 150 is disposed in the second thermal detection device 120, which can reflect the transmitted signal of the distance measuring device 140, so that the distance measuring device 140 can receive the reflected signal, and calculate the distance measuring device 140 and the reflecting element based on the reflected signal. The distance between 150. The reflective element 150 is, for example, a mirror, and can be any other element that can reflect the signal emitted by the distance measuring device 140. In an embodiment, the reflective element 150 may be integrated with the second heat detecting device 120. For example, the reflective element 150 may be a part of the second heat detecting device 120, such as a part of the housing of the second heat detecting device 120.

Please refer to FIGS. 4A and 4B. FIG. 4A shows a schematic diagram of an optical film detection system 100' according to another embodiment of the present invention, and FIG. 4B shows the optical film of FIG. 4A. A schematic diagram of the first temperature distribution map M1' detected by the film detection system 100'. The optical film detection system 100' includes a first heat detection device 110' and a processor 130. The optical film detection system 100' has similar or the same features as the aforementioned optical film detection system 100, except that the number of thermal detection devices of the optical film detection system 100' is one, and the distance measuring device 140 and the distance measuring device 140 are omitted. Reflective element 150. In this embodiment, the detection axis A1' of the first thermal detection device 110' is directly opposite to the midpoint of the optical film 10. However, this is not intended to limit the embodiment of the present invention. However, the detection axis A1' of the first thermal detection device 110' can directly face any position of the optical film 10, and is not limited to the middle point. In addition, the position of the first heat detection device 110' relative to the optical film 10 can be similar to the position of the first heat detection device 110 or the second heat detection device 120 relative to the optical film 10.

In this embodiment, the first heat detection device 110' can detect the first heat distribution S1' of the optical film 10 and the environment. The first heat distribution S1' is, for example, a part or all of the heat distribution of the optical film 10, which includes the first film boundary E11 and the second film boundary E21. The processor 130 obtains a first temperature distribution map M1' corresponding to the first heat distribution S1' according to the first heat distribution S1', wherein the first temperature distribution map M1' includes a third image boundary M12' and a fourth image opposite to each other The image boundary M22', wherein the third image boundary M12' and the fourth image boundary M22' correspond to the first film boundary E11 and the first area boundary E12 of the optical film 10, respectively.

The optical film detection system 100' can use the method adopted by the aforementioned optical film detection system 100 to analyze the first temperature distribution map M1' to obtain the width W1 of the optical film 10.

Please refer to Figures 5A~5C, Figure 5A shows another implementation according to the present invention Example of a schematic diagram of an optical film detection system 200, Figure 5B shows a schematic diagram of the optical film 10 of Figure 5A being detected by two thermal detection groups 210 before and after passing through the processing tank 220, and Figure 5C shows a schematic diagram of 5B is a schematic diagram of the width change of the optical film 10 before and after passing through the processing tank 220.

The optical film detection system 200 includes at least one heat detection group 210, a processor 130, at least one processing tank 220, and several rollers 230. The processing tank 220 is, for example, one of a swelling tank, a dyeing tank, a cross-linking tank, and a washing tank. But this disclosure is not limited to this. These rollers 230 can transport the optical film 10.

Each heat detection group 210 includes a first heat detection device 110, a second heat detection device 120, a distance measuring device 140, and a reflection element 150. To avoid the complexity of the diagram, the measurement is not shown in Figure 5B. Distance device 140 and reflective element 150. The heat detection group 210 can use the same method described above to detect the width W1 of the optical film 10. Each heat detection group 210 can be arranged at different positions to detect the width change of the optical film 10 through different processing grooves 220.

Taking two adjacent heat detection groups 210 as an example, the two adjacent heat detection groups 210 can be respectively arranged at the upstream and downstream positions of the corresponding processing tank 220 to detect the width of the optical film 10 before and after the processing tank 220 . For example, as shown in FIG. 5A, the plurality of heat detection groups 210 include heat detection groups 210' and 210", and the plurality of processing tanks 220 include the processing tank 220'. The heat detection group 210' is disposed in the processing tank 220' upstream to detect the width W1' of the optical film 10 before passing through the processing tank 220' (width W1' is shown in Figure 5C), and the thermal detection group 210" is arranged downstream of the processing tank 220' to detect The width W1" of the photometric film 10 after passing through the processing tank 220' (the width W1" is shown in FIG. 5C).

The processor 130 can control the movement of the optical film 10 according to the width W1' and the width W1". For example, the processor 130 is used to: (1) determine the ratio of the width W1' to the width W1" (ie, W1"/W1' The value of) is equal to a preset value of the ratio, where the preset value of the ratio can be any value within a range of values. The embodiment of the present invention does not limit the foregoing value range, which may be based on the type, manufacturing process, and specification requirements of the optical film 10 Other parameters that affect the width of the optical film are determined; (2). When the ratio of the width W1' to the width W1" is not equal to the preset value of this ratio, it means that the width of the optical film 10 is not within the required specifications. Change the rollers 230 At least one movement parameter (for example, changing the position, rotation speed, rotation direction and/or angle of the roller 230, etc.) to adjust the width of the optical film 10. In the actual optical film manufacturing process, the processor 130 can continuously detect the latest change in the width of the optical film 10 and change the movement parameters of at least one of the rollers 230 (if necessary) according to the change in the width of the optical film 10, until the optical film The width change of 10 conforms to the preset value of the ratio.

Please refer to FIGS. 6A and 6B. FIG. 6A shows a schematic diagram of an optical film detection system 300 according to another embodiment of the present invention, and FIG. 6B shows the optical film detection system 300 of FIG. 6A along the direction 6B- Sectional view of 6B'.

The optical film detection system 300 includes a first heat detection device 110, a second heat detection device 120, a processor 130, a plurality of rollers 230 (not shown), a first carrier 340 and a second carrier 350. The first carrier 340 has a first surface 340s, the first surface 340s is adjacent to and facing the optical film 10, and the first heat detection device 110 is disposed on the first surface 340s to reduce the number of components. The structure of the second carrier 350 is the same as or similar to that of the first carrier 340, and will not be repeated here. The relative relationship between the second heat detection device 120 and the second carrier 350 is the same as or similar to that of the first heat detection device 110 and the first carrier. The relative relationship of the piece 340 will not be repeated here. In one embodiment, the first carrier 340 and the second carrier 350 may be an edge position control device.

As shown in FIG. 6B, based on the aforementioned principle, the first thermal detection device 110 can continuously detect the position of the first film boundary E11 of the optical film 10. In addition, the processor 130 can control the movement of the optical film 10 according to the position of the first film boundary E11 of the optical film 10. For example, the processor 130 is used to: (1) obtain the position of the first film boundary E11 of the optical film 10 according to the first heat distribution S1; (2) obtain the position and the reference position of the first film boundary E11 ER offset △E; (3). Determine whether the offset △E of the optical film 10 is equal to a preset offset amount. The preset offset amount can be any value in a numerical range. The embodiment of the present invention does not Limit the foregoing numerical range, which may be determined by the type, manufacturing process, specification requirements of the optical film 10, or other parameters that will affect the boundary position of the optical film; and, (4). When the offset ΔE of the optical film 10 is not equal to this The preset amount of deviation indicates that the optical film 10 has deviated from the preset position, and the movement parameters of at least one of the rollers 230 (not shown) are changed (for example, the position, rotation speed, rotation direction and/or angle of the roller 230 are changed) Etc.) to adjust the position of the first film boundary E11 of the optical film 10. In the actual optical film manufacturing process, the processor 130 can continuously detect the latest position change of the first film boundary E11 of the optical film 10 and change at least one of these rollers 230 according to the latest position change of the first film boundary E11 of the optical film 10 The movement parameters of the user (if necessary) until the latest position change of the first film boundary E11 of the optical film 10 meets the offset preset amount.

Please refer to FIG. 7, which shows a flowchart of the optical film detection method of the optical film detection system 100 in FIG. 1A.

In step S110, the first heat detection device 110 detects the first heat distribution S1 of the optical film 10 and the environment.

In step S120, the processor 130 determines the position of the first film boundary E11 of the optical film 10 according to the first heat distribution S1. The optical film 10 includes a first part 11 having a first film boundary E11 and a first area boundary E12 opposite to each other.

In step S130, the second heat detection device 120 detects the second heat distribution S2 of the optical film 10 and the environment.

In step S140, the processor 130 determines the position of the second film boundary E21 of the optical film 10 according to the second heat distribution S2. The optical film 10 includes a second part 12 having a second film boundary E21 and a second area boundary E22 opposite to each other.

In step S150, the processor 130 obtains the first film boundary E11 and the second film boundary E11 according to the distance L3 between the first area boundary E12 and the second area boundary E22, the position of the first film boundary E11 and the position of the second film boundary E21 The width W1 between the two membrane boundaries E21. The detailed process of obtaining the width W1 in step S150 has been described above, and will not be repeated here.

In addition, although not shown, after step S150, the optical film detection method of the optical film detection system 100 further includes several steps: the processor 130 obtains the ratio of the two widths W1, determines whether the ratio is equal to a preset ratio, and When the ratio is not equal to the preset value of the ratio, the movement of the optical film 10 is controlled to change the width W1 of the optical film 10. In addition, the method of controlling the movement of the optical film 10 has been described above, and will not be repeated here.

The optical film detection method of the optical film detection system 200 in FIG. 5A is the same as or similar to the optical film detection method of the optical film detection system 100 described above, and will not be repeated here.

Please refer to FIG. 8, which shows a flowchart of the optical film detection method of the optical film detection system 300 in FIG. 6A.

In step S210, the first heat detection device 110 detects the first heat distribution S1 of the optical film 10 and the environment.

In step S220, the processor 130 determines the position of the first film boundary E11 of the optical film 10 according to the first heat distribution S1. The optical film 10 includes a first part 11 having a first film boundary E11 and a first area boundary E12 opposite to each other.

In step S230, as shown in FIG. 6B, the processor 130 obtains an offset ΔE between the position of the first film boundary E11 and a reference position ER.

In step S240, the processor 130 determines whether the offset ΔE of the optical film 10 is equal to a preset offset amount. When the offset ΔE is not equal to the offset preset amount, it means that the optical film 10 has deviated from the preset position, and the process goes to step S250; when the offset ΔE is equal to the offset preset amount, it means that the optical film 10 is at the preset position , The process returns to step S210, and the processor 130 continues to detect the latest change in the position of the first film boundary E11 of the optical film 10.

In step S250, the processor 130 controls the movement of the optical film 10. The method of controlling the movement of the optical film 10 has been described above, and will not be repeated here.

In summary, although the present invention has been disclosed in the above embodiments, it is not To limit the present invention. Those with ordinary knowledge in the technical field to which the present invention belongs can make various changes and modifications without departing from the spirit and scope of the present invention. Therefore, the protection scope of the present invention shall be subject to those defined by the attached patent application scope.

10: Optical film

11: The first part

12: The second part

100: Optical film detection system

110: The first heat detection device

120: Second heat detection device

130: processor

140: Ranging device

150: reflective element

E11: First membrane boundary

E12: First zone boundary

E21: Second membrane boundary

E22: Second area boundary

L1: first distance

L2: second distance

L3: Spacing

S1: First heat distribution

S2: second heat distribution

S3: Measured value

W1: width

Claims (20)

An optical film detection system, comprising: a first heat detection device for detecting a first heat distribution of an optical film and an environment, wherein the temperature of the optical film is different from an environmental temperature of the environment And a processor for determining the position of a first film boundary of the optical film according to the first heat distribution. The optical film detection system according to claim 1, further comprising: a second heat detection device for detecting a second heat distribution of the optical film and the environment; wherein, the processor is further used for : Obtain the position of a second film boundary of the optical film according to the second heat distribution. The optical film detection system according to claim 2, wherein the first heat distribution is a heat distribution of a first part of the optical film, and the second heat distribution is a heat distribution of a second part of the optical film . The optical film detection system according to claim 2, wherein the first film boundary and the second film boundary are two opposite sides of the optical film. The optical film detection system according to claim 2, wherein a first part of the optical film has a first film boundary and a first area boundary opposite to each other, and the light A second part of the academic film has a second film boundary and a second area boundary opposite to each other; the processor is further used for: obtaining a first temperature distribution map corresponding to the first heat distribution according to the first heat distribution , Wherein the first temperature distribution map includes a first image boundary and a third image boundary; according to the second heat distribution, a second temperature distribution map corresponding to the second heat distribution is obtained, wherein the first The two temperature distribution maps include a second image boundary and a fourth image boundary relative to each other; obtaining a first distance between the first image boundary and the third image boundary; obtaining the second image boundary and A second distance between the fourth image boundary; and based on a distance between the first area boundary and the second area boundary, the first distance and the second distance, the first film boundary and the two The width between the membrane boundaries. The optical film detection system according to claim 2, wherein a first part of the optical film has the opposite first film boundary and a first area boundary, and a second part of the optical film has the opposite first film boundary Two film boundaries and a second area boundary; the processor is further used to: according to a distance between the first area boundary and the second area boundary, the position of the first film boundary and the position of the second film boundary , Obtain a width between the first film boundary and the second film boundary. The optical film detection system according to claim 6, further comprising: a distance measuring device for detecting the distance. The optical film detection system according to claim 6, wherein the processor is further used to: obtain a ratio of two widths; determine whether the ratio is equal to a preset ratio; and when the ratio is not equal to the ratio preset Value, control the movement of the optical film to change the width of the optical film. The optical film detection system according to claim 1, wherein the processor is further used to: obtain an offset between the position of the first film boundary and a reference position; and determine whether the offset of the optical film is equal to A preset amount of offset; and when the offset is not equal to the preset amount of offset, controlling the movement of the optical film to change the position of the boundary of the first film. The optical film detection system according to any one of claims 1 to 9, further comprising: at least one processing tank and a plurality of rollers, wherein the rollers are used to transmit the optical film. The optical film detection system according to claim 10, wherein the first thermal detection device has a detection axis, and the angle between the detection axis and the optical film is between +/-90 degrees. An optical film detection method includes: detecting a first heat distribution of an optical film and an environment, wherein the temperature of the optical film is different from an environmental temperature of the environment; and judging the first heat distribution according to the first heat distribution The position of a first film boundary of the optical film. The optical film detection method according to claim 12, further comprising: detecting a second heat distribution of the optical film and the environment; and obtaining a second film boundary of the optical film according to the second heat distribution Location. The optical film detection method according to claim 13, wherein the first heat distribution is a heat distribution of a first part of the optical film, and the second heat distribution is a heat distribution of a second part of the optical film . The optical film detection method according to claim 13, wherein the first film boundary and the second film boundary are two opposite sides of the optical film. The optical film detection method according to claim 13, wherein a first part of the optical film has the first film boundary and a first area boundary opposite to each other, and a second part of the optical film has the opposite first film boundary Two film boundaries and a second area boundary; the optical film detection method further includes: obtaining a first temperature distribution map corresponding to the first heat distribution according to the first heat distribution, wherein the first temperature distribution map includes relative A first image boundary and a third image boundary; according to the second heat distribution, a second temperature distribution map corresponding to the second heat distribution is obtained, wherein the second temperature distribution map includes a second Image boundary and a fourth image boundary; obtain a first distance between the first image boundary and the third image boundary; obtain a first distance between the second image boundary and the fourth image boundary Two distances; and According to a distance between the first region boundary and the second region boundary, the first distance and the second distance, the width between the first film boundary and the second film boundary is obtained. The optical film detection method according to claim 13, wherein a first part of the optical film has the first film boundary and a first area boundary opposite to each other, and a second part of the optical film has the opposite first film boundary The second film boundary and the second area boundary further include: obtaining the first film boundary according to a distance between the first area boundary and the second area boundary, the position of the first film boundary and the position of the second film boundary A width between the membrane boundary and the two membrane boundaries. The optical film detection method according to claim 17, further comprising: detecting the distance. The optical film detection method according to claim 17, further comprising: obtaining a ratio of two widths; judging whether the ratio is equal to a preset ratio; and when the ratio is not equal to the preset ratio, controlling the optical film The movement of the membrane to change the width of the first membrane boundary. The optical film detection method according to claim 12, further comprising: obtaining an offset between the position of the first film boundary and a reference position; determining whether the offset of the optical film is equal to a preset offset And when the offset is not equal to the preset offset, the movement of the optical film is controlled to change the position of the boundary of the first film.

Images