TWI674043B - Printed wiring board - Google Patents

Printed wiring board Download PDF

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Publication number
TWI674043B
TWI674043B TW104100717A TW104100717A TWI674043B TW I674043 B TWI674043 B TW I674043B TW 104100717 A TW104100717 A TW 104100717A TW 104100717 A TW104100717 A TW 104100717A TW I674043 B TWI674043 B TW I674043B
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TW
Taiwan
Prior art keywords
resin
resin composition
printed wiring
wiring board
solder resist
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TW104100717A
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Chinese (zh)
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TW201540138A (en
Inventor
Shigeo Nakamura
中村茂雄
Genjin Mago
真子玄迅
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Ajinomoto Co., Inc.
日商味之素股份有限公司
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Publication of TW201540138A publication Critical patent/TW201540138A/en
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Publication of TWI674043B publication Critical patent/TWI674043B/en

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    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/03Use of materials for the substrate
    • H05K1/0313Organic insulating material
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/03Use of materials for the substrate
    • H05K1/0313Organic insulating material
    • H05K1/0353Organic insulating material consisting of two or more materials, e.g. two or more polymers, polymer + filler, + reinforcement
    • H05K1/0373Organic insulating material consisting of two or more materials, e.g. two or more polymers, polymer + filler, + reinforcement containing additives, e.g. fillers
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/0271Arrangements for reducing stress or warp in rigid printed circuit boards, e.g. caused by loads, vibrations or differences in thermal expansion
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/22Secondary treatment of printed circuits
    • H05K3/28Applying non-metallic protective coatings
    • H05K3/285Permanent coating compositions
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/02Fillers; Particles; Fibers; Reinforcement materials
    • H05K2201/0203Fillers and particles
    • H05K2201/0206Materials
    • H05K2201/0209Inorganic, non-metallic particles

Abstract

本發明之課題在於提供一種可抑制零件實裝步驟時的翹曲之薄型印刷配線板。 An object of the present invention is to provide a thin printed wiring board capable of suppressing warpage during a component mounting step.

本發明之解決方法係一種印刷配線板,其係包含第1及第2阻焊劑層之印刷配線板,其中,令第1阻焊劑層的厚度為t1(μm)、硬化後的彈性率(23℃)為G1(GPa)、令第2阻焊劑層的厚度為t2(μm)、硬化後的彈性率(23℃)為G2(GPa),且令印刷配線板的厚度為Z(μm)時,係滿足下述條件(1)~(3)、G1為6以上,(1)Z≦250;(2)(t1+t2)/Z≧0.1;及(3)G1×〔t1/(t1+t2)〕+G2×〔t2/(t1+t2)〕≧6。 The solution of the present invention is a printed wiring board, which is a printed wiring board including first and second solder resist layers, wherein the thickness of the first solder resist layer is t 1 (μm), and the elastic modulus after hardening ( 23 ° C) is G 1 (GPa), the thickness of the second solder resist layer is t 2 (μm), the elastic modulus after hardening (23 ° C) is G 2 (GPa), and the thickness of the printed wiring board is Z (μm), satisfy the following conditions (1) to (3), G 1 is 6 or more, (1) Z ≦ 250; (2) (t 1 + t 2 ) /Z≧0.1; and (3) G 1 × [t 1 / (t 1 + t 2 )] + G 2 × [t 2 / (t 1 + t 2 )] ≧ 6.

Description

印刷配線板 Printed wiring board

本發明乃關於一種印刷配線板。 The present invention relates to a printed wiring board.

印刷配線板的最外層,於半導體晶片(以下亦稱「零件」)的實裝步驟中,為了在防止焊料附著於無需附著之部分,同時防止電路基板腐蝕,通常設置有阻焊劑層來作為保護膜。阻焊劑層一般而言,係於電路基板上設置光硬化性樹脂組成物之層,並將該層予以曝光/顯像所形成(例如,專利文獻1)。 The outermost layer of the printed wiring board is usually provided with a solder resist layer as a protection during the mounting step of the semiconductor wafer (hereinafter also referred to as a "part") in order to prevent the solder from adhering to the part that does not need to be attached and at the same time to prevent corrosion of the circuit board membrane. The solder resist layer is generally formed by providing a layer of a photocurable resin composition on a circuit board and exposing / developing the layer (for example, Patent Document 1).

[先前技術文獻] [Prior technical literature] [專利文獻] [Patent Literature]

[專利文獻1]日本特開2009-258613號公報 [Patent Document 1] Japanese Patent Laid-Open No. 2009-258613

近年來,隨著無鉛焊料對含鉛焊料的代替,零件的實裝步驟中焊料迴流溫度會上昇。又近年來,為了 達成電子機器的小型化,印刷配線板的更加薄型化日益進展。 In recent years, with the replacement of lead-free solder with lead-free solder, solder reflow temperature has increased during the component mounting step. In recent years, in order to The miniaturization of electronic equipment has been achieved, and the thickness of printed wiring boards has been further reduced.

隨著印刷配線板的薄型化進展,本發明者發現,在零件的實裝步驟中,印刷配線板會產生翹曲,且會有電路歪扭或零件的接觸不良等之問題。 As the thickness of printed wiring boards has progressed, the inventors have found that during the mounting process of the parts, the printed wiring boards may warp, and problems such as circuit distortion or poor contact of the parts may occur.

本發明係以提供一種薄型的印刷配線板為課題,其係可抑制零件實裝步驟中之翹曲者。 The subject of the present invention is to provide a thin printed wiring board, which is capable of suppressing warpage in a component mounting step.

本發明者們就上述課題不斷地專致於檢討的結果發現,藉由組合具有特定厚度與彈性率之2個阻焊劑層來使用,可解決上述課題,遂完成本發明。 The present inventors have continually devoted themselves to reviewing the above-mentioned problems and found that by combining two solder resist layers having a specific thickness and elastic modulus, the above problems can be solved, and the present invention has been completed.

意即,本發明包含以下內容。 That is, the present invention includes the following.

[1]一種印刷配線板,其係包含第1及第2阻焊劑層之印刷配線板,其中令第1阻焊劑層的厚度為t1(μm)、硬化後的彈性率(23℃)為G1(GPa)、令第2阻焊劑層的厚度為t2(μm)、硬化後的彈性率(23℃)為G2(GPa),且令印刷配線板的厚度為Z(μm)時,滿足下述條件(1)~(3):(1)Z≦250;(2)(t1+t2)/Z≧0.1;及(3)G1×〔t1/(t1+t2)〕+G2×〔t2/(t1+t2)〕≧6,且G1為6以上。 [1] A printed wiring board, which is a printed wiring board including first and second solder resist layers, wherein the thickness of the first solder resist layer is t 1 (μm), and the elastic modulus after curing (23 ° C) is When G 1 (GPa), the thickness of the second solder resist layer is t 2 (μm), the elastic modulus (23 ° C) after hardening is G 2 (GPa), and the thickness of the printed wiring board is Z (μm) , Satisfy the following conditions (1) ~ (3): (1) Z ≦ 250; (2) (t 1 + t 2 ) /Z≧0.1; and (3) G 1 × [t 1 / (t 1 + t 2 )] + G 2 × [t 2 / (t 1 + t 2 )] ≧ 6, and G 1 is 6 or more.

[2]如[1]中記載之印刷配線板,其中,第1阻焊劑層之硬化後的玻璃轉移溫度(Tg)為150℃以上。 [2] The printed wiring board according to [1], wherein the glass transition temperature (Tg) after the first solder resist layer is cured is 150 ° C or higher.

[3]如[1]或[2]中記載之印刷配線板,其中,第1阻焊劑層係將無機填充材含量為60質量%以上之樹脂組成物予以硬化所形成者。 [3] The printed wiring board according to [1] or [2], wherein the first solder resist layer is formed by curing a resin composition having an inorganic filler content of 60% by mass or more.

[4]如[1]~[3]中任一記載之印刷配線板,其中,條件(2)為0.1≦(t1+t2)/Z≦0.5。 [4] The printed wiring board according to any one of [1] to [3], wherein the condition (2) is 0.1 ≦ (t 1 + t 2 ) /Z≦0.5.

[5]如[1]~[4]中任一記載之印刷配線板,其中,G2為6以上。 [5] The printed wiring board according to any one of [1] to [4], wherein G 2 is 6 or more.

[6]如[1]~[5]中任一記載之印刷配線板,其中,令第1阻焊劑層之硬化後的彈性率(200℃)為G1’(GPa)、令第2阻焊劑層之硬化後的彈性率(200℃)為G2’(GPa)時,進一步滿足下述條件(4):(4)G1’×〔t1/(t1+t2)〕+G2’×〔t2/(t1+t2)〕≧0.2。 [6] The printed wiring board according to any one of [1] to [5], wherein the elastic modulus (200 ° C) of the first solder resist layer after hardening is G 1 ′ (GPa), and the second resistance When the elastic modulus (200 ° C) of the flux layer after hardening is G 2 ′ (GPa), the following condition (4) is further satisfied: (4) G 1 ′ × [t 1 / (t 1 + t 2 )] + G 2 '× [t 2 / (t 1 + t 2 )] ≧ 0.2.

[7]一種半導體裝置,其係包含如〔1〕~〔6〕中任一記載之印刷配線板者。 [7] A semiconductor device including the printed wiring board according to any one of [1] to [6].

[8]一種樹脂薄片組,其係印刷配線板的阻焊劑層用樹脂薄片組,其係包含具第1支持體以及與該第1支持體接合之第1樹脂組成物層所成之第1樹脂薄片、具第2支持體以及與該第2支持體接合之第2樹脂組成物層所成之第2樹脂薄片,且令第1樹脂組成物層的厚度為t1p(μm)、硬化後的 彈性率(23℃)為G1(GPa)、令第2樹脂組成物層的厚度為t2p(μm)、硬化後的彈性率(23℃)為G2(GPa),且令印刷配線板的厚度為Z(μm)時,滿足下述條件(1’)~(3’):(1’)Z≦250;(2’)(t1p+t2p)/Z≧0.1;及(3’)G1×〔t1p/(t1p+t2p)〕+G2×〔t2p/(t1p+t2p)〕≧6,且G1為6以上。 [8] A resin sheet group, which is a resin sheet group for a solder resist layer of a printed wiring board, and includes a first resin composition layer having a first support and a first resin composition layer bonded to the first support. A resin sheet, a second resin sheet having a second support, and a second resin composition layer bonded to the second support, and the thickness of the first resin composition layer is t 1p (μm), after curing, The elastic modulus (23 ° C) is G 1 (GPa), the thickness of the second resin composition layer is t 2p (μm), the cured elastic modulus (23 ° C) is G 2 (GPa), and printed wiring When the thickness of the plate is Z (μm), the following conditions (1 ') to (3') are satisfied: (1 ') Z ≦ 250; (2') (t 1p + t 2p ) /Z≧0.1; and ( 3 ') G 1 × [t 1p / (t 1p + t 2p )] + G 2 × [t 2p / (t 1p + t 2p )] ≧ 6, and G 1 is 6 or more.

根據本發明,係可提供一種薄型的印刷配線板,其係可抑制零件的實裝步驟中之翹曲。 According to the present invention, it is possible to provide a thin printed wiring board which can suppress warpage in a mounting step of a part.

[實施發明之形態] [Form of Implementing Invention] [印刷配線板] [Printed wiring board]

本發明之印刷配線板係包含第1及第2阻焊劑層,其特徵係,令第1阻焊劑層的厚度為t1(μm)、硬化後的彈性率(23℃)為G1(GPa)、令第2阻焊劑層的厚度為t2(μm)、硬化後的彈性率(23℃)為G2(GPa),且令印刷配線板的厚度為Z(μm)時,滿足下述條件(1)~(3):(1)Z≦250; (2)(t1+t2)/Z≧0.1;及(3)G1×〔t1/(t1+t2)〕+G2×〔t2/(t1+t2)〕≧6,且G1為6以上。 The printed wiring board of the present invention includes the first and second solder resist layers, and is characterized in that the thickness of the first solder resist layer is t 1 (μm), and the elastic modulus (23 ° C) after hardening is G 1 (GPa ), When the thickness of the second solder resist layer is t 2 (μm), the elastic modulus (23 ° C) after hardening is G 2 (GPa), and the thickness of the printed wiring board is Z (μm), the following is satisfied: Conditions (1) ~ (3): (1) Z ≦ 250; (2) (t 1 + t 2 ) /Z≧0.1; and (3) G 1 × [t 1 / (t 1 + t 2 )] + G 2 × [t 2 / (t 1 + t 2 )] ≧ 6, and G 1 is 6 or more.

包含組合具有特定厚度與彈性率之第1及第2阻焊劑層所成的本發明之印刷配線板,在採用高焊料迴流溫度之零件的實裝步驟中,可抑制翹曲,亦可抑制電路歪扭或零件的接觸不良等之問題的發生。 The printed wiring board of the present invention, which is formed by combining the first and second solder resist layers having a specific thickness and elastic modulus, can suppress warpage and suppress a circuit during a mounting step of a part using a high solder reflow temperature. Problems such as distortion or poor contact of parts occur.

-條件(1)- -Condition (1)-

條件(1)係關於本發明之印刷配線板的厚度Z(μm)。所謂印刷配線板的厚度Z,意指包含電路基板以及設置於該電路基板兩側之第1及第2阻焊劑層的印刷配線板全體厚度。本發明之印刷配線板的厚度(Z)從薄型化之觀點來看,係250μm以下,較佳為240μm以下,更佳為230μm以下,再更佳為220μm以下,又再更佳為210μm以下,特別佳為200μm以下,190μm以下,180μm以下,170μm以下,160μm以下或150μm以下。本發明之印刷配線板,即使在如此厚度薄時,仍可抑制實裝步驟中之翹曲。厚度(Z)的下限並未特別受限,通常為20μm以上,或30μm以上。 Condition (1) relates to the thickness Z (μm) of the printed wiring board of the present invention. The thickness Z of the printed wiring board means the entire thickness of the printed wiring board including the circuit board and the first and second solder resist layers provided on both sides of the circuit board. From the viewpoint of thinning, the thickness (Z) of the printed wiring board of the present invention is 250 μm or less, preferably 240 μm or less, more preferably 230 μm or less, still more preferably 220 μm or less, and still more preferably 210 μm or less, Particularly preferred are 200 μm or less, 190 μm or less, 180 μm or less, 170 μm or less, 160 μm or less, or 150 μm or less. The printed wiring board of the present invention can suppress warpage in the mounting step even when the thickness is so thin. The lower limit of the thickness (Z) is not particularly limited, and is usually 20 μm or more, or 30 μm or more.

-條件(2)- -Condition (2)-

條件(2)係關於本發明之印刷配線板中所含第1及第2阻焊劑層的厚度t1(μm)及t2(μm)。在此,第1 及第2阻焊劑層的厚度t1(μm)及t2(μm)乃自電路基板的基面(電路基板表面之中,無表面電路的部分)之厚度。從實裝步驟中抑制印刷配線板的翹曲之觀點來看,第1及第2阻焊劑層的厚度和(t1+t2)對印刷配線板的厚度Z之比,即(t1+t2)/Z比係0.1以上,雖也依條件(3)右邊的值,但較佳為0.15以上,更佳為0.2以上,0.22以上,0.24以上,0.26以上,0.28以上或0.3以上。(t1+t2)/Z比的上限,從獲得具有所期待之配線密度的印刷配線板之觀點來看,較佳為0.5以下,更佳為0.45以下,再更佳為0.4以下,0.39以下,0.38以下,0.37以下,0.36以下,0.36以下或0.34以下。 Condition (2) relates to the thicknesses t 1 (μm) and t 2 (μm) of the first and second solder resist layers included in the printed wiring board of the present invention. Here, the thicknesses t 1 (μm) and t 2 (μm) of the first and second solder resist layers are the thicknesses from the base surface of the circuit substrate (the portion of the surface of the circuit substrate where there is no surface circuit). From the viewpoint of suppressing warpage of the printed wiring board during the mounting step, the ratio of the thickness of the first and second solder resist layers to (t 1 + t 2 ) to the thickness Z of the printed wiring board is (t 1 + t 2 ) / Z ratio is 0.1 or more. Although it depends on the value on the right side of condition (3), it is preferably 0.15 or more, more preferably 0.2 or more, 0.22 or more, 0.24 or more, 0.26 or more, 0.28 or more, or 0.3 or more. From the viewpoint of obtaining a printed wiring board having a desired wiring density, the upper limit of the (t 1 + t 2 ) / Z ratio is preferably 0.5 or less, more preferably 0.45 or less, still more preferably 0.4 or less, and 0.39. Below, 0.38 or less, 0.37 or less, 0.36 or less, 0.36 or less, or 0.34 or less.

第1阻焊劑層的厚度t1,在滿足上述特定的(t1+t2)/Z比的情況下,並無特別限定,較佳為5μm以上,更佳為10μm以上,再更佳為15μm以上,20μm以上或25μm以上。厚度t1的上限,並無特別限定,在滿足上述特定的(t1+t2)/Z比時,並無特別限定,較佳為120μm以下,更佳為100μm以下,再更佳為80μm以下,70μm以下,60μm以下,50μm以下,40μm以下或30μm以下。 The thickness t 1 of the first solder resist layer is not particularly limited as long as it satisfies the specific (t 1 + t 2 ) / Z ratio, and is preferably 5 μm or more, more preferably 10 μm or more, and even more preferably 15 μm or more, 20 μm or more, or 25 μm or more. The upper limit of the thickness t 1 is not particularly limited. When the specific (t 1 + t 2 ) / Z ratio is satisfied, the upper limit is not particularly limited. It is preferably 120 μm or less, more preferably 100 μm or less, and even more preferably 80 μm. Below, 70 μm or less, 60 μm or less, 50 μm or less, 40 μm or less, or 30 μm or less.

第2阻焊劑層的厚度t2,在滿足上述特定的(t1+t2)/Z比的情況下,並無特別限定,係考慮第1阻焊劑層的厚度t1與印刷配線板的厚度Z來決定即可。第2阻焊劑層的厚度t2的上限通常可為120μm以下或100μm以下,厚度t2的下限通常為5μm以上或10μm以上。 The thickness t 2 of the second solder resist layer is not particularly limited when the specific (t 1 + t 2 ) / Z ratio described above is satisfied, and the thickness t 1 of the first solder resist layer and the thickness of the printed wiring board are considered. The thickness Z may be determined. The upper limit of the thickness t 2 of the second solder resist layer may be generally 120 μm or less or 100 μm or less, and the lower limit of the thickness t 2 is usually 5 μm or more or 10 μm or more.

-條件(3)- -Condition (3)-

條件(3)係關於本發明之印刷配線板中所含第1及第2阻焊劑層之硬化後的彈性率(23℃)。第1及第2阻焊劑層係如後述,可將樹脂組成物硬化而形成。所謂硬化後的彈性率(23℃),係表示使樹脂組成物硬化後之23℃中阻焊劑層的彈性率。令第1及第2阻焊劑層之硬化後的彈性率(23℃)分別為G1(GPa)及G2(GPa)時,式:G1×〔t1/(t1+t2)〕+G2×〔t2/(t1+t2)〕的值(以下亦稱為「G1及G2的厚度加重平均值」),從抑制實裝步驟中印刷配線板的翹曲之觀點來看,乃為6以上,較佳為6.2以上,更佳為6.4以上,再更佳為6.6以上,又再更佳為6.8以上。G1及G2的厚度加重平均值若為6.8以上,印刷配線板的厚度Z若為200μm以下,則即使是薄的情況下,可抑制實裝步驟中印刷配線板的翹曲。G1及G2的厚度加重平均值,從即使是使印刷配線板的厚度Z變小且使(t1+t2)/Z比更低的情況也得以抑制實裝步驟中印刷配線板的翹曲之觀點來看,係以7以上,7.5以上,8以上,8.5以上,9以上,9.5以上,10以上,10.5以上,11以上,11.5以上,12以上,12.5以上或13以上者特別佳。G1及G2的厚度加重平均值之上限,並無特別限定,通常可為40以下,30以下等。第1及第2阻焊劑層之硬化後的彈性率(23℃),係可使用拉伸試驗機而藉由拉伸加重法於23℃中測定。拉伸試驗機方面,可舉例 如(股)ORIENTEC製「RTC-1250A」。 Condition (3) relates to the elastic modulus (23 ° C) of the first and second solder resist layers contained in the printed wiring board of the present invention after hardening. The first and second solder resist layers are formed by curing a resin composition as described later. The elastic modulus (23 ° C) after curing refers to the elastic modulus of the solder resist layer at 23 ° C after the resin composition is cured. When the elastic modulus (23 ° C) of the first and second solder resist layers after hardening are G 1 (GPa) and G 2 (GPa), respectively, the formula: G 1 × [t 1 / (t 1 + t 2 ) ) + G 2 × [t 2 / (t 1 + t 2 )] value (hereinafter also referred to as "average thickness increase of G 1 and G 2 ") to suppress warpage of the printed wiring board during the mounting step From a viewpoint, it is 6 or more, preferably 6.2 or more, more preferably 6.4 or more, even more preferably 6.6 or more, and still more preferably 6.8 or more. If the average thickness increase of G 1 and G 2 is 6.8 or more, and if the thickness Z of the printed wiring board is 200 μm or less, the warpage of the printed wiring board in the mounting step can be suppressed even in a thin case. The weighted average of G 1 and G 2 reduces the thickness of the printed wiring board and reduces the (t 1 + t 2 ) / Z ratio. From a warping point of view, 7 or more, 7.5 or more, 8 or more, 8.5 or more, 9 or more, 9.5 or more, 10 or more, 10.5 or more, 11 or more, 11.5 or more, 12 or more, 12.5 or more, or 13 or more . The upper limit of the thickness-weighted average values of G 1 and G 2 is not particularly limited, and may generally be 40 or less, 30 or less. The elastic modulus (23 ° C) after curing of the first and second solder resist layers can be measured at 23 ° C by a tensile weighting method using a tensile tester. As a tensile testing machine, for example, "RTC-1250A" manufactured by ORIENTEC is available.

第1阻焊劑層之硬化後的彈性率(23℃),即G1(GPa)為6以上。G1的值為6以上且G1及G2的厚度加重平均值在上述特定的範圍下,並無特別限定,從實裝步驟中可充分抑制印刷配線板的翹曲之觀點來看,較佳為6.2以上,更佳為6.4以上,再更佳為6.6以上,又再更佳為6.8以上,特別佳為7以上,7.5以上,8以上,8.5以上,9以上,9.5以上,10以上,10.5以上,11以上,11.5以上,12以上,12.5以上或13以上。G1的上限,並無特別限定,通常可為40以下,30以下等。 The elastic modulus (23 ° C) of the first solder resist layer after hardening, that is, G 1 (GPa) is 6 or more. The value of G 1 is 6 or more and the average thickness increase of G 1 and G 2 is not particularly limited in the above-mentioned specific range. From the viewpoint of sufficiently suppressing the warpage of the printed wiring board during the mounting step, it is preferable. 6.2 or more, more preferably 6.4 or more, even more preferably 6.6 or more, and still more preferably 6.8 or more, particularly preferably 7 or more, 7.5 or more, 8 or more, 8.5 or more, 9 or more, 9.5 or more, 10 or more, 10.5 Above, 11 or more, 11.5 or more, 12 or more, 12.5 or more, or 13 or more. The upper limit of G 1 is not particularly limited, and may generally be 40 or less, 30 or less.

第2阻焊劑層之硬化後的彈性率(23℃),即G2(GPa)若G1及G2的厚度加重平均值在上述特定的範圍下,並無特別限定。例如,G2的值只要是G1及G2的厚度加重平均值在上述特定的範圍中,可決定為1~30的範圍中。從即使是使印刷配線板的厚度Z變小且使(t1+t2)/Z比更低的情況也容易抑制實裝步驟中印刷配線板的翹曲之觀點來看,G2的值係以6以上者特別佳。 The elastic modulus (23 ° C.) of the second solder resist layer after hardening, that is, G 2 (GPa) is not particularly limited as long as the average thickness increase of G 1 and G 2 is within the above-mentioned specific range. For example, as long as the value G 2 is G 1 and G 2 the thickness of the average increase in the specific range may be determined to be in the range of 1 to 30. From the viewpoint that it is easy to suppress the warpage of the printed wiring board in the mounting step even when the thickness Z of the printed wiring board is made small and the (t 1 + t 2 ) / Z ratio is lowered, the value of G 2 Those with a score of 6 or more are particularly preferred.

從可進一步抑制實裝步驟中印刷配線板的翹曲之觀點來看,係以使第1及第2阻焊劑層之硬化後的彈性率(200℃)為G1’(GPa)及G2’(GPa)時,滿足下述條件(4):(4)G1’×〔t1/(t1+t2)〕+G2’×〔t2/(t1+t2)〕≧0.2為佳。 From the viewpoint of further suppressing the warpage of the printed wiring board in the mounting step, the elastic modulus (200 ° C) after curing of the first and second solder resist layers is G 1 ′ (GPa) and G 2 When '(GPa), the following conditions (4) are satisfied: (4) G 1 ' × [t 1 / (t 1 + t 2 )] + G 2 '× [t 2 / (t 1 + t 2 )] ≧ 0.2 is preferred.

G1’×〔t1/(t1+t2)〕+G2’×〔t2/(t1+t2)〕的值 (以下亦稱為「G1’及G2’的厚度加重平均值」)係以0.22以上者更佳、0.24以上者又更佳。G1’及G2’的厚度若加重平均值為0.24以上時,即使在使印刷配線板的厚度Z更薄為200μm以下時,仍可抑制實裝步驟中印刷配線板的翹曲。G1’及G2’的厚度加重平均值,從即使是使印刷配線板的厚度Z變小且使(t1+t2)/Z比更低的情況也得以抑制實裝步驟中印刷配線板的翹曲之觀點來看,係以0.3以上,0.4以上,0.5以上,0.6以上,0.7以上,0.8以上,0.9以上,1.0以上,1.1以上,1.2以上,1.3以上或1.4以上者特別佳。G1’及G2’的厚度加重平均值之上限,並無特別限定,通常可為15以下,10以下等。此外,所謂硬化後的彈性率(200℃),係表示使樹脂組成物硬化後之200℃中阻焊劑層的彈性率,並可使用拉伸試驗機而藉由拉伸加重法於200℃中測定。 G 1 '× (t 1 / (t 1 + t 2 )] + G 2 ' × (t 2 / (t 1 + t 2 )] value (hereinafter also referred to as "thickness of G 1 'and G 2 '"Aggravated average value") is more preferably 0.22 or more, and more preferably 0.24 or more. When the weighted average of G 1 ′ and G 2 ′ is 0.24 or more, even when the thickness Z of the printed wiring board is made thinner to 200 μm or less, warpage of the printed wiring board in the mounting step can be suppressed. The average thickness increase of G 1 ′ and G 2 ′ suppresses the printed wiring in the mounting step even when the thickness Z of the printed wiring board is reduced and the (t 1 + t 2 ) / Z ratio is lowered. From the viewpoint of warpage of the plate, 0.3 or more, 0.4 or more, 0.5 or more, 0.6 or more, 0.7 or more, 0.8 or more, 0.9 or more, 1.0 or more, 1.1 or more, 1.2 or more, 1.3 or 1.3 or more are particularly preferred. The upper limit of the thickness-weighted average value of G 1 ′ and G 2 ′ is not particularly limited, and may generally be 15 or less, 10 or less. In addition, the so-called elastic modulus after hardening (200 ° C) refers to the elastic modulus of the solder resist layer at 200 ° C after the resin composition is cured, and can be stretched at 200 ° C by a tensile weighting method using a tensile tester. Determination.

第1阻焊劑層之硬化後的彈性率(200℃)即G1’(GPa),從可充分地抑制實裝步驟中印刷配線板的翹曲之觀點來看,係以0.2以上者為佳、0.22以上者更佳、0.24以上者又更佳、0.3以上,0.4以上,0.5以上,0.6以上,0.7以上,0.8以上,0.9以上,1.0以上,1.1以上,1.2以上,1.3以上或1.4以上者特別佳。G1’的上限,並無特別限定,通常可為15以下,10以下等。 The elastic modulus (200 ° C) of the first solder resist layer, which is G 1 ′ (GPa), is preferably 0.2 or more from the viewpoint of sufficiently suppressing warpage of the printed wiring board in the mounting step. , 0.22 or higher is better, 0.24 or higher is better, 0.3 or higher, 0.4 or higher, 0.5 or higher, 0.6 or higher, 0.7 or higher, 0.8 or higher, 0.9 or higher, 1.0 or higher, 1.1 or higher, 1.2 or higher, 1.3 or higher or 1.4 or higher Especially good. The upper limit of G 1 ′ is not particularly limited, and may generally be 15 or less, 10 or less.

第2阻焊劑層之硬化後的彈性率(200℃),即G2’(GPa),在與G1’的關係中,G1’及G2’的厚度加重平均值係以如成為上述特定的範圍之值者為佳。例如, G2’的值,只要是G1’及G2’的厚度加重平均值在上述特定的範圍下,係以在0.1~10的範圍為佳。從即使是使印刷配線板的厚度Z變小且(t1+t2)/Z比更低的情況也容易抑制實裝步驟中印刷配線板的翹曲之觀點來看,G2’的值係以0.2以上者特別佳。 Elastic modulus (200 ℃) after the second curing solder resist layers, i.e., G 2 '(GPa), with G 1' relationship, the thickness of G 1 'and G 2' is increased as the average of lines to be above A specific range value is preferred. For example, the 'value, as long as the G 1' G 2 and a thickness G 2 'is the average increase in the specific range, preferably in the line to the range of 0.1 to 10. From the viewpoint that it is easy to suppress the warpage of the printed wiring board in the mounting step even when the thickness Z of the printed wiring board is made small and the (t 1 + t 2 ) / Z ratio is lowered, the value of G 2 ′ Those with 0.2 or more are particularly preferred.

滿足上述條件(1)、(2)及(3)之本發明印刷配線板中,即使在採用高焊料迴流溫度之實裝步驟中,亦可抑制翹曲。在一實施形態中,本發明之印刷配線板,在採用波峰溫度為260℃之高焊料迴流溫度的實裝步驟中,可使印刷配線板的翹曲抑制在50μm以下。本發明中,印刷配線板的翹曲,係為以陰影疊紋(Shadow Moire)裝置觀察印刷配線板中央之25mm角部分的翹曲舉動時,其變位數據的最大高度與最小高度之差的值。在測定時,於再現IPC/JEDEC J-STD-020C(「Moisture/Reflow Sensitivity Classification For Nonhermetic Solid State Surface Mount Devices」、2004年7月)中所記載的迴流溫度曲線(無鉛組件用曲線;波峰溫度260℃、自25℃至波峰溫度為止的昇溫所要時間5分鐘)之迴流裝置通入印刷配線板1次之後,以依上述IPC/JEDEC J-STD-020C為準則的迴流溫度曲線加熱處理印刷配線板的單面,而於印刷配線板的另一面所設置的格子線求得變位數據。此外,在迴流裝置方面,可舉例如日本ANTUM(股)製「HAS-6116」,且陰影疊紋裝置方面,可舉例如Akrometrix製「TherMoire AXP」。藉由使條件(3)中右邊的值為上述的 較佳值,即使是使印刷配線板的厚度Z變小且(t1+t2)/Z比更低的情況,亦可使實裝步驟中印刷配線板的翹曲抑制在48μm以下,46μm以下,44μm以下,42μm以下或40μm以下為止。 In the printed wiring board of the present invention that satisfies the above conditions (1), (2), and (3), warpage can be suppressed even in a mounting step using a high solder reflow temperature. In one embodiment, the printed wiring board of the present invention can suppress warpage of the printed wiring board to 50 μm or less in a mounting step using a high solder reflow temperature with a peak temperature of 260 ° C. In the present invention, the warpage of the printed wiring board is the difference between the maximum height and the minimum height of the displacement data when the warpage behavior of the central 25mm corner of the printed wiring board is observed with a Shadow Moire device. value. During the measurement, the reflow temperature curve (curve for lead-free components; peak temperature) described in IPC / JEDEC J-STD-020C ("Moisture / Reflow Sensitivity Classification For Nonhermetic Solid State Surface Mount Devices", July 2004) was reproduced. 260 ° C, the time required for the temperature rise from 25 ° C to the peak temperature is 5 minutes) After the reflow device is inserted into the printed wiring board once, the printed wiring is heat-treated with the reflow temperature curve based on the above IPC / JEDEC J-STD-020C as a guide The displacement data was obtained on one side of the board and the grid lines provided on the other side of the printed wiring board. In addition, the reflow device may be, for example, "HAS-6116" manufactured by ANTU Japan, and the shadow moire device may be, for example, "TherMoire AXP" manufactured by Akrometrix. By making the value on the right in the condition (3) the above-mentioned preferred value, even if the thickness Z of the printed wiring board is made small and the (t 1 + t 2 ) / Z ratio is made lower, the mounting can be made. In the step, the warpage of the printed wiring board is suppressed to 48 μm or less, 46 μm or less, 44 μm or less, 42 μm or less, or 40 μm or less.

[印刷配線板的阻焊劑層用樹脂薄片組] [Resin sheet group for solder resist layer of printed wiring board]

本發明之印刷配線板係可將具有特定的厚度及彈性率之第1及第2阻焊劑層設置於電路基板的兩面而製造。 The printed wiring board of the present invention can be manufactured by providing first and second solder resist layers having a specific thickness and elastic modulus on both sides of a circuit board.

以下,乃就製造本發明之印刷配線板時得以使用的一組樹脂薄片(「樹脂薄片組」)來進行說明。 Hereinafter, a group of resin sheets ("resin sheet group") which can be used when manufacturing the printed wiring board of this invention is demonstrated.

本發明之印刷配線板的阻焊劑層用樹脂薄片組,係特徵係包含具第1支持體以及與該第1支持體接合之第1樹脂組成物層所成之第1樹脂薄片、與具第2支持體以及與該第2支持體接合之第2樹脂組成物層所成之第2樹脂薄片,而令第1樹脂組成物層的厚度為t1p(μm)、硬化後的彈性率(23℃)為G1(GPa)、令第2樹脂組成物層的厚度為t2p(μm)、硬化後的彈性率(23℃)為G2(GPa),且令印刷配線板的厚度為Z(μm)時,滿足下述條件(1’)~(3’):(1’)Z≦250;(2’)(t1p+t2p)/Z≧0.1;及(3’)G1×〔t1p/(t1p+t2p)〕+G2×〔t2p/(t1p+t2p)〕≧6,且G1為6以上。 The resin sheet group for a solder resist layer of a printed wiring board of the present invention is characterized by including a first resin sheet having a first support and a first resin composition layer bonded to the first support, and a first resin sheet 2 support and a second resin sheet formed of a second resin composition layer bonded to the second support, and the thickness of the first resin composition layer is t 1p (μm), and the elastic modulus after curing (23 ℃) is G 1 (GPa), the thickness of the second resin composition layer is t 2p (μm), the elastic modulus after curing (23 ° C.) is G 2 (GPa), and the thickness of the printed wiring board is Z (μm), the following conditions (1 ') ~ (3') are satisfied: (1 ') Z ≦ 250; (2 ′) (t 1p + t 2p ) /Z≧0.1; and (3 ′) G 1 × [t 1p / (t 1p + t 2p )] + G 2 × [t 2p / (t 1p + t 2p )] ≧ 6, and G 1 is 6 or more.

藉由使用該樹脂薄片組來形成第1及第2阻焊劑層,係簡便地可製造滿足條件(1)、(2)及(3)之本發明印刷配線板。 By using the resin sheet group to form the first and second solder resist layers, the printed wiring board of the present invention that satisfies the conditions (1), (2), and (3) can be easily manufactured.

條件(1’)係與上述條件(1)對應。Z的較佳範圍,係如條件(1)所說明般。 Condition (1 ') corresponds to the above condition (1). The preferable range of Z is as described in the condition (1).

條件(2’)係與上述條件(2)對應。於電路基板上積層樹脂組成物層並形成阻焊劑層時,以電路基板的表面電路存在作為起因,通常,所得之阻焊劑層的厚度會較樹脂組成物層的厚度更厚。因此藉由滿足條件(2’),並不受電路基板的表面電路的厚度或表面電路的密度影響,係容易滿足條件(2)。條件(2’)中,在決定(t1p+t2p)/Z比的較佳範圍時,係可將條件(2)中「t1」及「t2」分別解讀為「t1p」及「t2p」而適用。同樣地,在決定t1p及t2p的較佳範圍時,上述條件(2)所附加說明之t1及t2的較佳範圍說明中,係可將「t1」及「t2」各自改讀為「t1p」及「t2p」來適用。此外,決定t1p及t2p時,係以使該等與電路基板的表面電路厚度同厚或更厚來決定者佳。 Condition (2 ') corresponds to the above condition (2). When the resin composition layer is laminated on the circuit substrate to form a solder resist layer, the existence of the surface circuit of the circuit substrate is the cause. Generally, the thickness of the resulting solder resist layer is thicker than the thickness of the resin composition layer. Therefore, by satisfying the condition (2 '), it is easy to satisfy the condition (2) without being affected by the thickness of the surface circuit or the density of the surface circuit of the circuit substrate. In the condition (2 '), when determining the preferred range of the (t 1p + t 2p ) / Z ratio, the "t 1 " and "t 2 " in the condition (2) can be interpreted as "t 1p " and "T 2p ". Similarly, when determining the preferred ranges of t 1p and t 2p , in the description of the preferred ranges of t 1 and t 2 attached to the above condition (2), "t 1 " and "t 2 " Reapply as "t 1p " and "t 2p " to apply. In addition, when t 1p and t 2p are determined, it is preferable to determine the thickness of these circuits to be the same as or greater than the thickness of the surface circuit of the circuit board.

條件(3’)係與上述條件(3)對應。當阻焊劑層之硬化後的彈性率(23℃)表示使用於構成阻焊劑層之樹脂組成物的硬化後的彈性率(23℃)時,如前述,G1及G2的較佳範圍,係如就條件(3)所說明的。又,條件(3’)的右邊之值的較佳範圍,係如條件(3)所記載般。 The condition (3 ') corresponds to the above condition (3). When the elastic modulus (23 ° C) after hardening of the solder resist layer indicates the elastic modulus (23 ° C) after hardening of the resin composition constituting the solder resist layer, as described above, the preferred ranges of G 1 and G 2 are: This is as explained under Condition (3). The preferable range of the value on the right side of the condition (3 ') is as described in the condition (3).

從實裝步驟中可更加抑制印刷配線板的翹曲之觀點來看,令第1及第2樹脂組成物層之硬化後的彈性率(200℃)各自為G1’(GPa)及G2’(GPa)時,係以滿足下述條件(4’):(4’)G1’×〔t1p/(t1p+t2p)〕+G2’×〔t2p/(t1p+t2p)〕≧0.2者佳。有關條件(4’)的右邊之值的較佳範圍,係如就條件(4)所記載的,G1’及G2’的較佳範圍,係如就條件(4)與說明的。 From the viewpoint that the warpage of the printed wiring board can be more suppressed in the mounting step, the elastic modulus (200 ° C) after curing of the first and second resin composition layers are G 1 ′ (GPa) and G 2 ′, respectively. (GPa), it satisfies the following conditions (4 '): (4') G 1 '× [t 1p / (t 1p + t 2p )] + G 2 ' × [t 2p / (t 1p + t 2p )] ≧ 0.2 is preferred. The preferable range of the value on the right side of the condition (4 ′) is as described in the condition (4), and the preferable ranges of G 1 ′ and G 2 ′ are as described in the condition (4).

<樹脂組成物> <Resin composition>

第1及第2樹脂組成物層中所使用的樹脂組成物,若為硬化後可在顯示上述特定的彈性率同時具有充分的耐藥品性與絕緣性者即可,可為熱硬化性樹脂組成物,亦可為光硬化性樹脂組成物。例如,熱硬化性樹脂組成物方面,可舉出包含熱硬化性樹脂及硬化劑之樹脂組成物。熱硬化性樹脂方面,可使用形成印刷配線板的阻焊劑層時所使用的以往公知的熱硬化性樹脂,其中更以環氧樹脂為佳。因此一實施形態中,第1及第2樹脂組成物層中所使用的熱硬化性樹脂組成物係包含(a)環氧樹脂及(b)硬化劑。又,較佳的光硬化性樹脂組成物係可藉由在上述熱硬化性樹脂組成物中再加入光硬化性樹脂所形成。光硬化性樹脂方面,係可使用形成印刷配線板的阻焊劑層時所使用的以往公知的光硬化性樹脂,從容易實施曝光/顯像(光微影)形成開口之觀點來看,係以光硬化型鹼可溶性樹脂為 佳。因此一實施形態中,第1及第2樹脂組成物層中所使用的光硬化性樹脂組成物係包含(a)環氧樹脂、(b)硬化劑、及(c)光硬化型鹼可溶性樹脂。光硬化性樹脂組成物更進一步包含由(d)光聚合起始劑、(e)光增感劑及(f)稀釋劑所成之群選出的1種以上。此外,本發明中,包含光硬化性樹脂且可藉光微影而形成開口形成之樹脂組成物,即使是具有熱硬化性時,亦稱「光硬化性樹脂組成物」。第1及第2樹脂組成物層中可使用的樹脂組成物,不管熱硬化性樹脂組成物、光硬化性樹脂組成物的分類,可視需要而進一步包含(g)無機填充材、(h)熱可塑性樹脂、(i)硬化促進劑、(j)難燃劑及(k)有機填充材等之添加劑。 The resin composition used in the first and second resin composition layers may be a thermosetting resin composition as long as it exhibits the above-mentioned specific elastic modulus and has sufficient chemical resistance and insulation properties after curing. It may be a photocurable resin composition. Examples of the thermosetting resin composition include a resin composition containing a thermosetting resin and a curing agent. As the thermosetting resin, a conventionally known thermosetting resin used when forming a solder resist layer of a printed wiring board can be used, and among them, epoxy resin is more preferable. Therefore, in one embodiment, the thermosetting resin composition system used in the first and second resin composition layers contains (a) an epoxy resin and (b) a curing agent. Moreover, a preferable photocurable resin composition can be formed by adding a photocurable resin to the said thermosetting resin composition. As for the photocurable resin, a conventionally known photocurable resin used in forming a solder resist layer of a printed wiring board can be used. From the viewpoint of easily performing exposure / development (light lithography) to form an opening, it is based on Light-curing alkali-soluble resin is good. Therefore, in one embodiment, the photocurable resin composition used in the first and second resin composition layers includes (a) an epoxy resin, (b) a curing agent, and (c) a photocurable alkali-soluble resin. . The photocurable resin composition further contains one or more selected from the group consisting of (d) a photopolymerization initiator, (e) a photosensitizer, and (f) a diluent. In addition, in the present invention, a resin composition containing a photocurable resin and capable of forming an opening by light lithography is referred to as a "photocurable resin composition" even when it has thermosetting properties. Regardless of the classification of the thermosetting resin composition and the photocurable resin composition, the resin composition that can be used in the first and second resin composition layers may further include (g) an inorganic filler and (h) heat as needed. Additives such as plastic resin, (i) hardening accelerator, (j) flame retardant, and (k) organic filler.

以下,乃針對第1及第2樹脂組成物層中可作為樹脂組成物的材料使用之環氧樹脂、硬化劑、光硬化型鹼可溶性樹脂、光聚合起始劑、光增感劑、稀釋劑及添加劑進行說明。 The following are epoxy resins, hardeners, light-curing alkali-soluble resins, photopolymerization initiators, photosensitizers, and diluents that can be used as materials for the resin composition in the first and second resin composition layers. And additives.

-(a)環氧樹脂- -(a) Epoxy resin-

環氧樹脂方面,可舉例如雙酚A型環氧樹脂、雙酚F型環氧樹脂、雙酚S型環氧樹脂、雙酚AF型環氧樹脂、二環戊二烯型環氧樹脂、參酚型環氧樹脂、萘酚酚醛清漆型環氧樹脂、苯酚酚醛清漆型環氧樹脂、tert-丁基-苯二酚型環氧樹脂、萘型環氧樹脂、萘酚型環氧樹脂、蒽型環氧樹脂、環氧丙基胺型環氧樹脂、環氧丙基酯型環氧樹 脂、甲酚酚醛清漆型環氧樹脂、聯苯型環氧樹脂、線狀脂肪族環氧樹脂、具丁二烯構造之環氧樹脂、脂環式環氧樹脂、雜環式環氧樹脂、含螺環之環氧樹脂、環己烷二甲醇型環氧樹脂、萘醚型環氧樹脂及三羥甲基型環氧樹脂等。環氧樹脂可單獨使用1種或併用2種以上。 As for the epoxy resin, for example, bisphenol A type epoxy resin, bisphenol F type epoxy resin, bisphenol S type epoxy resin, bisphenol AF type epoxy resin, dicyclopentadiene type epoxy resin, Senate phenol epoxy resin, naphthol novolac epoxy resin, phenol novolac epoxy resin, tert-butyl-benzenediol epoxy resin, naphthalene epoxy resin, naphthol epoxy resin, Anthracene epoxy resin, epoxypropylamine epoxy resin, epoxypropyl ester epoxy resin Grease, cresol novolac epoxy resin, biphenyl epoxy resin, linear aliphatic epoxy resin, epoxy resin with butadiene structure, alicyclic epoxy resin, heterocyclic epoxy resin, Spiro-containing epoxy resin, cyclohexanedimethanol epoxy resin, naphthalene ether epoxy resin, and trimethylol epoxy resin. The epoxy resin may be used singly or in combination of two or more kinds.

環氧樹脂,係以包含1分子中具2個以上環氧基之環氧樹脂者為佳。令環氧樹脂的不揮發成分為100質量%時,係以至少50質量%以上為1分子中具2個以上環氧基之環氧樹脂者為佳。其中,更以包含1分子中具2個以上環氧基且在溫度20℃下液狀的環氧樹脂(以下稱為「液狀環氧樹脂」)以及1分子中具3個以上環氧基且在溫度20℃下固體狀的環氧樹脂(以下稱為「固體狀環氧樹脂」)為佳。環氧樹脂方面,併用液狀環氧樹脂與固體狀環氧樹脂,可獲得具優異可撓性之樹脂組成物。又,將樹脂組成物硬化所形成之阻焊劑層的斷裂強度也會提昇。特別是,樹脂組成物為熱硬化性樹脂組成物時,係以併用液狀環氧樹脂與固體狀環氧樹脂者為佳。樹脂組成物為光硬化性樹脂組成物時,係以使用固體狀環氧樹脂作為環氧樹脂者為佳。 The epoxy resin is preferably an epoxy resin having two or more epoxy groups in one molecule. When the non-volatile content of the epoxy resin is 100% by mass, it is preferred that at least 50% by mass or more be an epoxy resin having two or more epoxy groups in one molecule. Among them, epoxy resins having two or more epoxy groups in one molecule and being liquid at a temperature of 20 ° C (hereinafter referred to as "liquid epoxy resins") and three or more epoxy groups in one molecule are further included. In addition, a solid epoxy resin (hereinafter referred to as a "solid epoxy resin") is preferred at a temperature of 20 ° C. As for the epoxy resin, a liquid epoxy resin and a solid epoxy resin are used together to obtain a resin composition having excellent flexibility. In addition, the breaking strength of the solder resist layer formed by curing the resin composition is also improved. In particular, when the resin composition is a thermosetting resin composition, a liquid epoxy resin and a solid epoxy resin are preferably used in combination. When the resin composition is a photocurable resin composition, a solid epoxy resin is preferably used as the epoxy resin.

液狀環氧樹脂方面,係以雙酚A型環氧樹脂、雙酚F型環氧樹脂、苯酚酚醛清漆型環氧樹脂、及萘型環氧樹脂為佳,雙酚A型環氧樹脂、雙酚F型環氧樹脂、及萘型環氧樹脂更佳。液狀環氧樹脂的具體例方面,可舉出DIC(股)製的「HP4032」、「HP4032D」、 「HP4032SS」(萘型環氧樹脂)、三菱化學(股)製的「jER828EL」(雙酚A型環氧樹脂)、「jER807」(雙酚F型環氧樹脂)、「jER152」(苯酚酚醛清漆型環氧樹脂)、新日鐵住金化學(股)製的「ZX1059」(雙酚A型環氧樹脂與雙酚F型環氧樹脂的混合品)、Nagase ChemteX(股)製的「EX-721」(環氧丙基酯型環氧樹脂)。此等可單獨使用1種或併用2種以上。 For liquid epoxy resins, bisphenol A epoxy resin, bisphenol F epoxy resin, phenol novolac epoxy resin, and naphthalene epoxy resin are preferred. Bisphenol A epoxy resin, Bisphenol F-type epoxy resins and naphthalene-type epoxy resins are more preferred. Specific examples of the liquid epoxy resin include "HP4032", "HP4032D", "HP4032SS" (naphthalene type epoxy resin), "jER828EL" (bisphenol A type epoxy resin), "jER807" (bisphenol F type epoxy resin), "jER152" (phenol novolac) manufactured by Mitsubishi Chemical Corporation Varnish-type epoxy resin), `` ZX1059 '' made by Nippon Steel & Sumitomo Chemical Co., Ltd. (mixed product of bisphenol A-type epoxy resin and bisphenol F-type epoxy resin), and `` EX made by Nagase ChemteX '' -721 "(epoxypropyl ester type epoxy resin). These can be used individually by 1 type or in combination of 2 or more types.

固體狀環氧樹脂方面,係以萘型4官能環氧樹脂、甲酚酚醛清漆型環氧樹脂、二環戊二烯型環氧樹脂、參酚型環氧樹脂、萘酚酚醛清漆型環氧樹脂、聯苯型環氧樹脂、或萘醚型環氧樹脂為佳,萘型4官能環氧樹脂、聯苯型環氧樹脂、或萘醚型環氧樹脂更佳,萘型4官能環氧樹脂、聯苯型環氧樹脂又更佳。固體狀環氧樹脂的具體例方面,可舉出DIC(股)製的「HP-4700」、「HP-4710」(萘型4官能環氧樹脂)、「N-690」(甲酚酚醛清漆型環氧樹脂)、「N-695」(甲酚酚醛清漆型環氧樹脂)、「HP-7200」(二環戊二烯型環氧樹脂)、「EXA7311」、「EXA7311-G3」、「EXA7311-G4」、「EXA7311-G4S」、「HP6000」(萘醚型環氧樹脂)、日本化藥(股)製的「EPPN-502H」(參酚環氧樹脂)、「NC7000L」(萘酚酚醛清漆環氧樹脂)、「NC3000H」、「NC3000」、「NC3000L」、「NC3100」(聯苯型環氧樹脂)、新日鐵住金化學(股)製的「ESN475」(萘酚酚醛清漆型環氧樹脂)、 「ESN485V」(萘酚酚醛清漆型環氧樹脂)、三菱化學(股)製的「YX4000H」、「YL6121」(聯苯型環氧樹脂)、「YX4000HK」(聯二甲苯酚型環氧樹脂)、大阪氣體化學(股)製的「PG-100」、「CG-500」、三菱化學(股)製的「YL7800」(茀型環氧樹脂)等。 For solid epoxy resins, naphthalene type 4-functional epoxy resin, cresol novolac type epoxy resin, dicyclopentadiene type epoxy resin, ginseng phenol type epoxy resin, and naphthol novolac type epoxy resin are used. Resin, biphenyl type epoxy resin, or naphthyl ether type epoxy resin is preferred, naphthalene type 4 functional epoxy resin, biphenyl type epoxy resin, or naphthyl ether type epoxy resin is more preferred, and naphthalene type 4 functional epoxy resin Resins and biphenyl epoxy resins are even better. Specific examples of the solid epoxy resin include "HP-4700", "HP-4710" (naphthalene-type 4-functional epoxy resin), and "N-690" (cresol novolac) made by DIC. Type epoxy resin), "N-695" (cresol novolac type epoxy resin), "HP-7200" (dicyclopentadiene type epoxy resin), "EXA7311", "EXA7311-G3", " EXA7311-G4 "," EXA7311-G4S "," HP6000 "(naphthyl ether type epoxy resin)," EPPN-502H "(ginsylphenol epoxy resin)," NC7000L "(naphthol) Novolac epoxy resin), `` NC3000H '', `` NC3000 '', `` NC3000L '', `` NC3100 '' (biphenyl type epoxy resin), `` ESN475 '' (naphthol novolac type) made by Nippon Steel & Sumitomo Chemical Co., Ltd. Epoxy resin), `` ESN485V '' (naphthol novolac type epoxy resin), `` YX4000H '' made by Mitsubishi Chemical Corporation, `` YL6121 '' (biphenyl type epoxy resin), `` YX4000HK '' (dixylenol type epoxy resin) , "PG-100", "CG-500" made by Osaka Gas Chemical Co., Ltd., "YL7800" (茀 -type epoxy resin) made by Mitsubishi Chemical Co., Ltd., etc.

環氧樹脂方面,當併用液狀環氧樹脂與固體狀環氧樹脂時,該等的量比(液狀環氧樹脂:固體狀環氧樹脂)以質量比計,係以1:0.1~1:4的範圍為佳。藉由使液狀環氧樹脂與固體狀環氧樹脂的量比為該範圍,係可獲得下述效果:i)以樹脂薄片之形態使用時,具有適度的黏著性、ii)以樹脂薄片之形態使用時,可得充分的可撓性且取汲性提昇、iii)可得具有充分的斷裂強度之阻焊劑層等。從上述i)~iii)的效果之觀點來看,液狀環氧樹脂與固體狀環氧樹脂的量比(液狀環氧樹脂:固體狀環氧樹脂)以質量比計,係以1:0.3~1:3.5的範圍更佳,1:0.6~1:3的範圍又更佳,1:0.8~1:2.5的範圍特別佳。 In terms of epoxy resin, when liquid epoxy resin and solid epoxy resin are used in combination, the amount ratio (liquid epoxy resin: solid epoxy resin) is based on the mass ratio of 1: 0.1 ~ 1. : The range of 4 is preferable. By setting the amount ratio of the liquid epoxy resin to the solid epoxy resin within this range, the following effects can be obtained: i) when used in the form of a resin sheet, it has moderate adhesiveness, and ii) when it is used in a resin sheet When the form is used, sufficient flexibility can be obtained, and extractability can be improved. Iii) A solder resist layer having sufficient breaking strength can be obtained. From the viewpoint of the effects of i) to iii) above, the amount ratio of the liquid epoxy resin to the solid epoxy resin (liquid epoxy resin: solid epoxy resin) is based on a mass ratio of 1: The range of 0.3 ~ 1: 3.5 is better, the range of 1: 0.6 ~ 1: 3 is even better, and the range of 1: 0.8 ~ 1: 2.5 is particularly good.

樹脂組成物中環氧樹脂的含量,較佳為3質量%以上,更佳為5質量%以上,再更佳為7質量%以上或9質量%以上。環氧樹脂的含量的上限並無特別限定,較佳為50質量%以下,更佳為45質量%以下,又再更佳為40質量%以下或35質量%以下。 The content of the epoxy resin in the resin composition is preferably 3% by mass or more, more preferably 5% by mass or more, and even more preferably 7% by mass or more and 9% by mass or more. The upper limit of the content of the epoxy resin is not particularly limited, but is preferably 50% by mass or less, more preferably 45% by mass or less, and still more preferably 40% by mass or less than 35% by mass.

此外,本發明中,構成樹脂組成物之各成分含量,係使樹脂組成物中不揮發成分的合計為100質量%時的值。 In addition, in this invention, content of each component which comprises a resin composition is a value when the total of the non-volatile matter in a resin composition is 100 mass%.

環氧樹脂的環氧當量,較佳為50~3000、更佳 為80~2000、再更佳為110~1000。因成為此範圍,硬化物的交聯密度充分,且具有耐熱性優異之阻焊劑層。此外,環氧當量係可依JIS K7236來測定,乃為含1當量環氧基之樹脂的質量。 Epoxy equivalent of epoxy resin, preferably 50 to 3000, more preferably It is 80 ~ 2000, and more preferably 110 ~ 1000. Because of this range, the cured product has a sufficient crosslinking density and has a solder resist layer excellent in heat resistance. The epoxy equivalent is measured in accordance with JIS K7236, and is the mass of a resin containing 1 equivalent of epoxy groups.

環氧樹脂的重量平均分子量,較佳為100~5000、更佳為250~3000、再更佳為400~1500。在此,環氧樹脂的重量平均分子量乃是藉由膠體滲透層析(GPC)法所測定之聚苯乙烯換算的重量平均分子量。 The weight average molecular weight of the epoxy resin is preferably 100 to 5000, more preferably 250 to 3000, and even more preferably 400 to 1500. Here, the weight average molecular weight of an epoxy resin is a polystyrene conversion weight average molecular weight measured by the colloidal permeation chromatography (GPC) method.

-(b)硬化劑- -(b) Hardener-

硬化劑方面,若具有硬化環氧樹脂的機能的話,並無特別限定,例如,苯酚系硬化劑、萘酚系硬化劑、活性酯系硬化劑、苯并噁嗪系硬化劑、及氰酸酯之酯系硬化劑。硬化劑可單獨使用1種或併用2種以上。 The hardening agent is not particularly limited as long as it has a function of hardening an epoxy resin. For example, a phenol-based hardener, a naphthol-based hardener, an active ester-based hardener, a benzoxazine-based hardener, and a cyanate Ester-based hardener. The hardener can be used alone or in combination of two or more.

苯酚系硬化劑及萘酚系硬化劑方面,從可獲得耐熱性及耐水性優異的阻焊劑層之觀點來看,係以具有酚醛清漆構造之苯酚系硬化劑、或具有酚醛清漆構造之萘酚系硬化劑為佳。又,從可獲得與電路基板密著性優異的阻焊劑層之觀點來看,係以含氮苯酚系硬化劑為佳,含三嗪骨架之苯酚系硬化劑更佳。其中,更以可獲得高度地滿足耐熱性、耐水性、及與電路基板之密著性的阻焊劑層之觀點來看,係以含三嗪骨架之苯酚酚醛清漆樹脂為佳。 From the viewpoint of obtaining a solder resist layer having excellent heat resistance and water resistance, phenol-based hardeners and naphthol-based hardeners are phenol-based hardeners having a novolac structure or naphthols having a novolac structure. A hardener is preferred. From the viewpoint of obtaining a solder resist layer having excellent adhesion to a circuit board, a nitrogen-containing phenol-based hardener is preferred, and a triazine skeleton-containing phenol-based hardener is more preferred. Among them, a phenol novolak resin containing a triazine skeleton is more preferred from the viewpoint of obtaining a solder resist layer that satisfies high heat resistance, water resistance, and adhesion to a circuit board.

苯酚系硬化劑及萘酚系硬化劑的具體例方面,可舉例如明和化成(股)製的「MEH-7700」、 「MEH-7810」、「MEH-7851」、日本化藥(股)製的「NHN」、「CBN」、「GPH」、東都化成(股)製的「SN170」、「SN180」、「SN190」、「SN475」、「SN485」、「SN495」、「SN375」、「SN395」、DIC(股)製的「LA7052」、「LA7054」、「LA3018」等。 Specific examples of the phenol-based hardener and naphthol-based hardener include "MEH-7700" manufactured by Meiwa Chemical Co., Ltd., "MEH-7810", "MEH-7851", "NHN", "CBN", "GPH" made by Nippon Kayaku Co., Ltd., "SN170", "SN180", "SN190" made by Tohoku Kasei Co., Ltd. , "SN475", "SN485", "SN495", "SN375", "SN395", "LA7052", "LA7054", "LA3018" made by DIC (shares), etc.

從得到耐熱性優異的阻焊劑層之觀點來看,活性酯系硬化劑亦佳。活性酯系硬化劑方面,並無特別限制,一般以使用苯酚酯類、噻吩酯類、N-羥基胺酯類、雜環羥基化合物的酯類等之反應活性高的1分子中具有2個以上酯基之化合物為佳。該活性酯系硬化劑,係以藉由羧酸化合物及/或硫代羧酸化合物與羥基化合物及/或硫醇化合物之縮合反應所得者為佳。特別是從耐熱性提昇之觀點來看,係以由羧酸化合物與羥基化合物所得之活性酯系硬化劑為佳,由羧酸化合物與苯酚化合物及/或萘酚化合物所得之活性酯系硬化劑更佳。羧酸化合物方面,可舉例如安息香酸、酢酸、琥珀酸、馬來酸、伊康酸、苯二甲酸、間苯二甲酸、對苯二甲酸、均苯四甲酸等。苯酚化合物或萘酚化合物方面,可舉例如氫醌、間苯二酚、雙酚A、雙酚F、雙酚S、酚酞啉、甲基化雙酚A、甲基化雙酚F、甲基化雙酚S、苯酚、o-甲酚、m-甲酚、p-甲酚、苯二酚、α-萘酚、β-萘酚、1,5-二羥基萘、1,6-二羥基萘、2,6-二羥基萘、二羥基二苯甲酮、三羥基二苯甲酮、四羥基二苯甲酮、1,3,5-苯三酚、1,2,4-苯三酚、二環戊二烯型二苯酚化合物、苯酚酚醛清漆等。在此,所謂「二環戊二烯型 二苯酚化合物」,係於二環戊二烯1分子中使苯酚2分子縮合所得之二苯酚化合物。 From the viewpoint of obtaining a solder resist layer excellent in heat resistance, an active ester-based hardener is also preferable. There is no particular limitation on the active ester-based hardener. Generally, two or more molecules are used in a molecule having high reactivity such as phenol esters, thiophene esters, N-hydroxyamine esters, and heterocyclic hydroxyl compounds. Ester-based compounds are preferred. The active ester-based hardener is preferably obtained by a condensation reaction between a carboxylic acid compound and / or a thiocarboxylic acid compound and a hydroxy compound and / or a thiol compound. Especially from the viewpoint of improvement of heat resistance, an active ester-based hardener obtained from a carboxylic acid compound and a hydroxy compound is preferable, and an active ester-based hardener obtained from a carboxylic acid compound and a phenol compound and / or a naphthol compound is preferable. Better. Examples of the carboxylic acid compound include benzoic acid, osmic acid, succinic acid, maleic acid, itaconic acid, phthalic acid, isophthalic acid, terephthalic acid, and pyromellitic acid. Examples of the phenol compound or naphthol compound include hydroquinone, resorcinol, bisphenol A, bisphenol F, bisphenol S, phenolphthaloline, methylated bisphenol A, methylated bisphenol F, methyl Bisphenol S, phenol, o-cresol, m-cresol, p-cresol, resorcinol, α-naphthol, β-naphthol, 1,5-dihydroxynaphthalene, 1,6-dihydroxyl Naphthalene, 2,6-dihydroxynaphthalene, dihydroxybenzophenone, trihydroxybenzophenone, tetrahydroxybenzophenone, 1,3,5-benzenetriol, 1,2,4-benzenetriol , Dicyclopentadiene-type diphenol compounds, phenol novolac, and the like. Here, the so-called "dicyclopentadiene type "Diphenol compound" is a diphenol compound obtained by condensing two molecules of phenol in one molecule of dicyclopentadiene.

具體而言,係以含二環戊二烯型二苯酚構造之活性酯化合物、含萘構造之活性酯化合物、含苯酚酚醛清漆的乙醯基化物之活性酯化合物、含苯酚酚醛清漆的苯甲醯基化物之活性酯化合物為佳,其中,更以含萘構造之活性酯化合物、含二環戊二烯型二苯酚構造之活性酯化合物更佳。所謂「二環戊二烯型二苯酚構造」,表示由伸苯基-二環戊搭烯-伸苯基所成的2價構造單位。 Specifically, it is an active ester compound containing a dicyclopentadiene-type diphenol structure, an active ester compound containing a naphthalene structure, an active ester compound containing an acetamidate of a phenol novolak, and a benzyl containing a phenol novolac. An active ester compound of a fluorenyl compound is preferable. Among them, an active ester compound containing a naphthalene structure and an active ester compound containing a dicyclopentadiene type diphenol are more preferable. The "dicyclopentadiene-type diphenol structure" means a divalent structural unit formed by phenylene-dicyclopentadiene-phenylene.

活性酯系硬化劑的市售品方面,含二環戊二烯型二苯酚構造之活性酯化合物方面,可舉出「EXB9451」、「EXB9460」、「EXB9460S」、「HPC-8000-65T」(DIC(股)製),含萘構造之活性酯化合物方面,可舉出「EXB9416-70BK」(DIC(股)製),含苯酚酚醛清漆的乙醯基化物之活性酯化合物方面,可舉出「DC808」(三菱化學(股)製),含苯酚酚醛清漆的苯甲醯基化物之活性酯化合物方面,可舉出「YLH1026」(三菱化學(股)製)等。 In terms of commercially available active ester hardeners, as for active ester compounds containing a dicyclopentadiene-type diphenol structure, "EXB9451", "EXB9460", "EXB9460S", "HPC-8000-65T" ( DIC (product), naphthalene-containing active ester compounds, "EXB9416-70BK" (product of DIC (stock)), active ester compounds containing phenol novolak ethoxylates, etc. "DC808" (manufactured by Mitsubishi Chemical Corporation), and the active ester compound of the benzamidine compound containing phenol novolac, include "YLH1026" (manufactured by Mitsubishi Chemical Corporation).

苯并噁嗪系硬化劑的具體例方面,可舉出昭和高分子(股)製的「HFB2006M」、四國化成工業(股)製的「P-d」、「F-a」。 Specific examples of the benzoxazine-based hardener include "HFB2006M" manufactured by Showa Polymer Co., Ltd., "P-d" and "F-a" manufactured by Shikoku Chemical Industry Co., Ltd.

氰酸酯酯系硬化劑方面,可舉例如雙酚A二氰酸酯、聚苯酚氰酸酯、寡聚(3-亞甲基-1,5-伸苯基氰酸酯)、4,4’-亞甲基雙(2,6-二甲基苯基氰酸酯)、4,4’-亞 乙基二苯基二氰酸酯、六氟雙酚A二氰酸酯、2,2-雙(4-氰酸酯)苯基丙烷、1,1-雙(4-氰酸酯苯基甲烷)、雙(4-氰酸酯-3,5-二甲基苯基)甲烷、1,3-雙(4-氰酸酯苯基-1-(甲基亞乙基))苯、雙(4-氰酸酯苯基)硫醚、及雙(4-氰酸酯苯基)醚等之2官能氰酸酯樹脂、由苯酚酚醛清漆及甲酚酚醛清漆等所衍生的多官能氰酸酯樹脂、此等氰酸酯樹脂其一部分經三嗪化之預聚物等。氰酸酯酯系硬化劑的具體例方面,Lonza Japan(股)製的「PT30」及「PT60」(均為苯酚酚醛清漆型多官能氰酸酯酯樹脂)、「BA230」(雙酚A二氰酸酯的一部分或全部經三嗪化且成三量體之預聚物)等。 Examples of the cyanate ester-based hardener include bisphenol A dicyanate, polyphenol cyanate, oligo (3-methylene-1,5-phenylene cyanate), 4,4 '-Methylenebis (2,6-dimethylphenylcyanate), 4,4'-Asia Ethyl diphenyl dicyanate, hexafluorobisphenol A dicyanate, 2,2-bis (4-cyanate) phenylpropane, 1,1-bis (4-cyanate phenylmethane) ), Bis (4-cyanate-3,5-dimethylphenyl) methane, 1,3-bis (4-cyanatephenyl-1- (methylethylene)) benzene, bis ( Bifunctional cyanate resins such as 4-cyanate phenyl) sulfide and bis (4-cyanate phenyl) ether; polyfunctional cyanates derived from phenol novolac and cresol novolac Resins, such as cyanate resins, a part of which is a triazinated prepolymer, and the like. Specific examples of the cyanate ester-based hardener include "PT30" and "PT60" (both phenol novolac-type polyfunctional cyanate ester resins) and "BA230" (bisphenol A bis manufactured by Lonza Japan). Some or all of the cyanate esters are triazinated and formed into trimeric prepolymers).

與環氧樹脂與硬化劑之量比,以〔環氧樹脂的環氧基之合計數〕:〔硬化劑的反應基之合計數〕的比率計,較佳為1:0.2~1:2的範圍,1:0.3~1:1.5更佳,1:0.4~1:1.2又更佳。在此,所謂硬化劑的反應基,係活性羥基、活性酯基等,會因硬化劑的種類而異。又,所謂環氧樹脂的環氧基之合計數,係指將各環氧樹脂的固形分質量以環氧當量除後所得之值就全部的環氧樹脂之合計值,所謂硬化劑的反應基之合計數,係指將各硬化劑的固形分質量以反應基當量除了之後的值就全部的硬化劑所得合計之值。藉由使環氧樹脂與硬化劑之量比為該範圍,所得之阻焊劑層的耐熱性會更加提昇。 The ratio of the amount to the epoxy resin and the hardener is preferably a ratio of [total number of epoxy groups of the epoxy resin]: [total number of reactive groups of the hardener]: 1: 0.2 to 1: 2 The range is more preferably 1: 0.3 ~ 1: 1.5, and more preferably 1: 0.4 ~ 1: 1.2. Here, the reactive groups of the hardener, such as an active hydroxyl group, an active ester group, and the like, differ depending on the type of the hardener. The total number of epoxy groups of an epoxy resin refers to the total value of all epoxy resins obtained by dividing the solid content of each epoxy resin by the epoxy equivalent. The reaction group of the so-called hardener The total count refers to the total value of all hardeners obtained by dividing the solid content of each hardener by the value of the reactive group equivalent. By setting the amount ratio of the epoxy resin to the hardener within this range, the heat resistance of the obtained solder resist layer can be further improved.

-(c)光硬化型鹼可溶性樹脂- -(c) Light-curing alkali-soluble resin-

光硬化型鹼可溶性樹脂方面,若為含鹼可溶基(例如,羧基、苯酚性羥基等)之光硬化性樹脂,並無特別限定,亦可使用形成印刷配線板的阻焊劑層時所使用的以往公知的光硬化型鹼可溶性樹脂。其中,更以光硬化型鹼可溶性樹脂方面,係以含鹼可溶基與自由基聚合性不飽和基之樹脂為佳,含羧基與自由基聚合性不飽和基之樹脂、含苯酚性羥基與自由基聚合性不飽和基之樹脂更佳。光硬化型鹼可溶性樹脂可單獨使用1種,亦可併用2種以上。 The light-curable alkali-soluble resin is not particularly limited as long as it is a light-curable resin containing an alkali-soluble group (for example, a carboxyl group, a phenolic hydroxyl group, or the like). It can also be used when forming a solder resist layer for a printed wiring board. A conventionally known photocurable alkali-soluble resin. Among them, the light-curable alkali-soluble resin is preferably a resin containing an alkali-soluble group and a radical polymerizable unsaturated group, a resin containing a carboxyl group and a radical polymerizable unsaturated group, a resin containing a phenolic hydroxyl group, and Radical polymerizable unsaturated resins are more preferred. The light-curable alkali-soluble resin may be used singly or in combination of two or more kinds.

含羧基與自由基聚合性不飽和基之樹脂方面,可舉例如使環氧樹脂與不飽和羧酸反應,再使酸酐反應所形成之酸叉索型不飽和環氧酯樹脂等。 As the resin containing a carboxyl group and a radically polymerizable unsaturated group, for example, an acid fork type unsaturated epoxy ester resin formed by reacting an epoxy resin with an unsaturated carboxylic acid and then reacting an acid anhydride with the acid anhydride may be used.

環氧樹脂方面,係以使用與(a)成分同樣者即可,從獲得良好的顯像性、絕緣信賴性之觀點來看,係以雙酚F型環氧樹脂、雙酚A型環氧樹脂、甲酚酚醛清漆型環氧樹脂為佳,雙酚F型環氧樹脂、甲酚酚醛清漆型環氧樹脂更佳。環氧樹脂可單獨使用1種,亦可併用2種以上。 In terms of epoxy resin, it is only necessary to use the same component as (a). From the viewpoint of obtaining good developability and insulation reliability, bisphenol F-type epoxy resin and bisphenol A-type epoxy resin are used. Resins and cresol novolac epoxy resins are preferred, and bisphenol F-type epoxy resins and cresol novolac epoxy resins are more preferred. An epoxy resin may be used individually by 1 type, and may use 2 or more types together.

不飽和羧酸方面,可舉例如丙烯酸、甲基丙烯酸、桂皮酸、巴豆酸等,從可獲得良好的光硬化特性之觀點來看,係以丙烯酸、甲基丙烯酸為佳。不飽和羧酸可單獨使用1種,亦可併用2種以上。 Examples of the unsaturated carboxylic acid include acrylic acid, methacrylic acid, cinnamic acid, and crotonic acid, and acrylic acid and methacrylic acid are preferred from the viewpoint of obtaining good photohardening characteristics. The unsaturated carboxylic acid may be used singly or in combination of two or more kinds.

羧酸酐方面,可舉例如無水馬來酸、無水琥珀酸、無水伊康酸、無水苯二甲酸、無水四氫苯二甲酸、無水六氫苯二甲酸、無水偏苯三甲酸、無水均苯四甲酸、 二苯甲酮四羧酸二無水物等,從可獲得良好的顯像性、絕緣信賴性之觀點來看,係以無水琥珀酸、無水四氫苯二甲酸為佳。酸酐可單獨使用1種,亦可併用2種以上。 Examples of carboxylic anhydrides include anhydrous maleic acid, anhydrous succinic acid, anhydrous itaconic acid, anhydrous phthalic acid, anhydrous tetrahydrophthalic acid, anhydrous hexahydrophthalic acid, anhydrous trimellitic acid, and anhydrous pyromellitic acid. Formic acid, From the viewpoint of obtaining good developability and insulation reliability, benzophenonetetracarboxylic acid dihydrate and the like are preferably anhydrous succinic acid and anhydrous tetrahydrophthalic acid. An acid anhydride may be used individually by 1 type, and may use 2 or more types together.

酸叉索型不飽和環氧酯樹脂,在觸媒的存在下,係藉由使不飽和羧酸與環氧樹脂反應而形成不飽和環氧酯樹脂,並使該不飽和環氧酯樹脂與酸酐反應而得。該反應係為公知,而反應溫度、反應時間、觸媒的種類或使用量等之反應條件係由該領域之業者適當地決定即可。 In the presence of a catalyst, the acid fork type unsaturated epoxy ester resin is formed by reacting an unsaturated carboxylic acid with an epoxy resin to form an unsaturated epoxy ester resin. Derived from acid anhydride reaction. This reaction system is well known, and reaction conditions such as reaction temperature, reaction time, type of catalyst, and amount of use may be appropriately determined by those skilled in the art.

酸叉索型不飽和環氧酯樹脂亦可使用市售品。市售品方面,可舉例如日本化藥(股)製「ZFR-1533H」(雙酚F型環氧樹脂、丙烯酸、及無水四氫苯二甲酸的反應物)、「ZAR-2000」(雙酚A型環氧樹脂、丙烯酸、及無水琥珀酸的反應物)、昭和電工(股)製「PR-3000」(甲酚酚醛清漆型環氧樹脂、丙烯酸、及羧酸酐的反應物)等。 A commercially available product can also be used for the acid fork type unsaturated epoxy ester resin. For commercially available products, for example, "ZFR-1533H" (reactant of bisphenol F-type epoxy resin, acrylic acid, and anhydrous tetrahydrophthalic acid) made by Nippon Kayaku Co., Ltd., and "ZAR-2000" (double Reactant of phenol A type epoxy resin, acrylic acid, and anhydrous succinic acid), "PR-3000" (reactant of cresol novolac epoxy resin, acrylic acid, and carboxylic anhydride) manufactured by Showa Denko Corporation.

含苯酚性羥基與自由基聚合性不飽和基之樹脂,例如,可使含苯酚性羥基之樹脂與含自由基聚合性不飽和基與異氰酸酯基之化合物反應來合成。 The resin containing a phenolic hydroxyl group and a radical polymerizable unsaturated group can be synthesized by, for example, reacting a resin containing a phenolic hydroxyl group with a compound containing a radical polymerizable unsaturated group and an isocyanate group.

含苯酚性羥基之樹脂方面,可舉例如苯酚酚醛清漆樹脂、甲酚酚醛清漆樹脂、雙酚A酚醛清漆樹脂、萘酚酚醛清漆樹脂,從可獲得良好的顯像性、絕緣信賴性之觀點來看,係以苯酚酚醛清漆樹脂、甲酚酚醛清漆樹脂為佳。含苯酚性羥基之樹脂可單獨使用1種,亦可併用2種以上。 Examples of the phenolic hydroxyl-containing resin include phenol novolac resin, cresol novolac resin, bisphenol A novolac resin, and naphthol novolac resin. From the viewpoint of obtaining good developability and insulation reliability, Look, it is better to use phenol novolac resin, cresol novolac resin. The phenolic hydroxyl group-containing resin may be used singly or in combination of two or more kinds.

含自由基聚合性不飽和基與異氰酸酯基之化合物方面,可舉例如使(甲基)丙烯醯基異氰酸酯、異氰酸酯乙基(甲基)丙烯酸酯;及聚異氰酸酯化合物與具有可與異氰酸酯基反應之官能基(例如,羥基)的(甲基)丙烯酸酯化合物部分性地加成反應所得之反應生成物等。在此,聚異氰酸酯化合物方面,可舉例如3-異氰酸酯-3,5,5-三甲基環己基異氰酸酯、三氯乙烯二異氰酸酯、六亞甲基二異氰酸酯、異佛爾酮二異氰酸酯、亞甲基聯苯基異氰酸酯、聚亞甲基聚苯基聚異氰酸酯等,具有可與異氰酸酯基反應之官能基的(甲基)丙烯酸酯化合物方面,可舉例如季戊四醇三(甲基)丙烯酸酯、2-羥基乙基(甲基)丙烯酸酯、N-羥甲基丙烯醯胺、丙三醇二(甲基)丙烯酸酯、二季戊四醇五(甲基)丙烯酸酯等。 For compounds containing a radically polymerizable unsaturated group and an isocyanate group, for example, a (meth) acrylfluorenyl isocyanate, an isocyanate ethyl (meth) acrylate; and a polyisocyanate compound with a compound capable of reacting with an isocyanate group A reaction product or the like obtained by a partial addition reaction of a (meth) acrylate compound having a functional group (for example, a hydroxyl group). Examples of the polyisocyanate compound include 3-isocyanate-3,5,5-trimethylcyclohexyl isocyanate, trichloroethylene diisocyanate, hexamethylene diisocyanate, isophorone diisocyanate, and methylene Examples of the (meth) acrylate compound having a functional group capable of reacting with an isocyanate group, such as biphenyl isocyanate, polymethylene polyphenyl polyisocyanate, pentaerythritol tri (meth) acrylate, 2- Hydroxyethyl (meth) acrylate, N-hydroxymethacrylamide, glycerol di (meth) acrylate, dipentaerythritol penta (meth) acrylate, and the like.

含苯酚性羥基與自由基聚合性不飽和基之樹脂,係可在觸媒的存在下,使含苯酚性羥基之樹脂與含自由基聚合性不飽和基與異氰酸酯基之化合物反應而得。該反應係為公知,而反應溫度、反應時間、觸媒的種類或使用量等之反應條件係由該領域之業者適當地決定即可。 The resin containing a phenolic hydroxyl group and a radical polymerizable unsaturated group can be obtained by reacting a resin containing a phenolic hydroxyl group with a compound containing a radical polymerizable unsaturated group and an isocyanate group in the presence of a catalyst. This reaction system is well known, and reaction conditions such as reaction temperature, reaction time, type of catalyst, and amount of use may be appropriately determined by those skilled in the art.

光硬化型鹼可溶性樹脂的聚苯乙烯換算之數平均分子量(Mn),從可獲得良好的解像性之觀點來看,較佳為500~1000000、更佳為1000~50000、再更佳為1500~35000。光硬化型鹼可溶性樹脂的Mn,例如,可藉由膠體浸透層析(GPC)法來測定。(GPC)法(聚苯乙烯換算)可測定。Mn係以例如使用(股)島津製作所製 LC-9A/RID-6A作為測定裝置,管柱方面使用昭和電工(股)製Shodex K-800P/K-804L/K-804L,移動相為氯仿等,以管柱溫度40℃進行測定,並使用標準聚苯乙烯檢量線來算出。 The polystyrene-equivalent number-average molecular weight (Mn) of the photocurable alkali-soluble resin is preferably from 500 to 1,000,000, more preferably from 1,000 to 50,000, and even more preferably from the viewpoint of obtaining good resolution. 1500 ~ 35000. The Mn of the photocurable alkali-soluble resin can be measured, for example, by a colloidal permeation chromatography (GPC) method. (GPC) method (polystyrene equivalent) can be measured. Mn is produced, for example, by Shimadzu Corporation LC-9A / RID-6A was used as a measuring device. Shodex K-800P / K-804L / K-804L manufactured by Showa Denko Corporation was used for the column. The mobile phase was chloroform. The column temperature was measured at 40 ° C. Calculated using a standard polystyrene calibration curve.

光硬化型鹼可溶性樹脂的固形分酸價,從可獲得顯示出良好的絕緣信賴性的阻焊劑層之觀點來看,較佳為100mgKOH/g以下,更佳為90mgKOH/g以下,再更佳為80mgKOH/g以下或70mgKOH/g以下。只要在能夠獲得充分的顯像性的情況下,固形分酸價以更低者為佳,從該觀點來看,光硬化型鹼可溶性樹脂方面,係以含苯酚性羥基與自由基聚合性不飽和基之樹脂特別佳。 From the viewpoint of obtaining a solder resist layer exhibiting good insulation reliability, the solid acid value of the photocurable alkali-soluble resin is preferably 100 mgKOH / g or less, more preferably 90 mgKOH / g or less, and even more preferably It is 80 mgKOH / g or less or 70 mgKOH / g or less. As long as sufficient developability can be obtained, it is preferable that the solid acid value is lower. From this viewpoint, the light-curable alkali-soluble resin is based on a phenolic hydroxyl group and a radical polymerizable polymer. Saturated resins are particularly preferred.

樹脂組成物中光硬化型鹼可溶性樹脂的含量,從可得良好的顯像性之觀點來看,較佳為10質量%以上,更佳為15質量%以上,再更佳為20質量%以上。光硬化型鹼可溶性樹脂的含量上限,從可得耐熱性優異的阻焊劑層之觀點來看,較佳為60質量%以下,更佳為50質量%以下,再更佳為40質量%以下。 The content of the photocurable alkali-soluble resin in the resin composition is preferably 10% by mass or more, more preferably 15% by mass or more, and still more preferably 20% by mass or more from the viewpoint of obtaining good developability. . The upper limit of the content of the photocurable alkali-soluble resin is preferably 60% by mass or less, more preferably 50% by mass or less, and even more preferably 40% by mass or less from the viewpoint of obtaining a solder resist layer having excellent heat resistance.

-(d)光聚合起始劑- -(d) Photopolymerization initiator-

光聚合起始劑方面,並無特別限定,可舉例如2-芐基-2-二甲基胺基-1-(4-嗎啉基苯基)-1-丁酮、2-(二甲基胺基)-2-〔(4-甲基苯基)甲基〕-〔4-(4-嗎啉基)苯基〕-1-丁酮、2-甲基-〔4-(甲基硫代基)苯基〕-嗎啉基-1-丙酮、二苯甲酮、甲基二苯甲酮、o-苯甲醯基安息香 酸、苯甲醯基乙基醚、2,2-二乙氧基苯乙酮、2,4-二乙基硫代基氧雜蒽酮、雙(2,4,6-三甲基苯甲醯基)-苯基膦氧化物、乙基-(2,4,6-三甲基苯甲醯基)苯基膦酸鹽、4,4’-雙(二乙基胺基)二苯甲酮、1-羥基-環己基-苯基酮、2,2-二甲氧基-1,2-二苯基乙烷-1-酮、1-〔4-(2-羥基乙氧基)-苯基〕-2-羥基-2-甲基-1-丙烷-1-酮等之烷基醯苯系光聚合起始劑;雙(2,4,6-三甲基苯甲醯基)-苯基膦氧化物等之醯基膦氧化物系光聚合起始劑;1,2-辛烷二酮,1-〔4-(苯基硫代基)-,2-(O-苯甲醯基肟)〕及乙酮,1-〔9-乙基-6-(2-甲基苯甲醯基)-9H-咔唑-3-基〕-,1-(O-乙醯基肟)等之肟酯系光聚合起始劑;及鋶鹽系光聚合起始劑等,以醯基膦氧化物系光聚合起始劑、肟酯系光聚合起始劑為佳。光聚合起始劑可單獨使用1種,亦可併用2種以上。 The photopolymerization initiator is not particularly limited, and examples thereof include 2-benzyl-2-dimethylamino-1- (4-morpholinylphenyl) -1-butanone and 2- (dimethylformate). Methylamino) -2-[(4-methylphenyl) methyl]-[4- (4-morpholinyl) phenyl] -1-butanone, 2-methyl- [4- (methyl Thio) phenyl] -morpholinyl-1-acetone, benzophenone, methylbenzophenone, o-benzyl benzoin Acid, benzamidine ethyl ether, 2,2-diethoxyacetophenone, 2,4-diethylthioxanthone, bis (2,4,6-trimethylbenzoyl (Fluorenyl) -phenylphosphine oxide, ethyl- (2,4,6-trimethylbenzylidene) phenylphosphonate, 4,4'-bis (diethylamino) dibenzoyl Ketone, 1-hydroxy-cyclohexyl-phenyl ketone, 2,2-dimethoxy-1,2-diphenylethane-1-one, 1- [4- (2-hydroxyethoxy)- Phenyl] -2-hydroxy-2-methyl-1-propane-1-one and other alkyl-benzene-based photopolymerization initiators; bis (2,4,6-trimethylbenzyl)- Phenylphosphine oxide-based photopolymerization initiators such as phenylphosphine oxide; 1,2-octanedione, 1- [4- (phenylthio)-, 2- (O-benzidine Oxime)] and ethyl ketone, 1- [9-ethyl-6- (2-methylbenzylidene) -9H-carbazol-3-yl]-, 1- (O-acetamidooxime) Among the oxime ester-based photopolymerization initiators; and the sulfonium salt-based photopolymerization initiators, fluorenylphosphine oxide-based photopolymerization initiators and oxime ester-based photopolymerization initiators are preferred. The photopolymerization initiator may be used singly or in combination of two or more kinds.

光聚合起始劑的市售品方面,可舉例如BASF JAPAN(股)製「IRGACURE 819」(雙(2,4,6-三甲基苯甲醯基)-苯基膦氧化物)、「IRGACURE 907」(2-甲基-〔4-(甲基硫代基)苯基〕-嗎啉基-1-丙酮)、「OXE-01」(1,2-辛烷二酮,1-〔4-(苯基硫代基)-,2-(O-苯甲醯基肟)〕)、「OXE-02」(乙酮,1-〔9-乙基-6-(2-甲基苯甲醯基)-9H-咔唑-3-基〕-,1-(O-乙醯基肟))等。 Examples of commercially available photopolymerization initiators include "IRGACURE 819" (bis (2,4,6-trimethylbenzyl) -phenylphosphine oxide) manufactured by BASF JAPAN, and " IRGACURE 907 "(2-methyl- [4- (methylthio) phenyl] -morpholinyl-1-acetone)," OXE-01 "(1,2-octanedione, 1- [ 4- (phenylthio)-, 2- (O-benzylideneoxime)]), "OXE-02" (ethyl ketone, 1- [9-ethyl-6- (2-methylbenzene Formamyl) -9H-carbazol-3-yl]-, 1- (O-acetamidooxime)) and the like.

樹脂組成物中光聚合起始劑的含量,從可獲得良好的光硬化特性、絕緣信賴性之觀點來看,較佳為0.1質量%以上,更佳為0.2質量%以上,再更佳為0.3質 量%以上。光聚合起始劑的含量的上限,從防止因感度過多導致尺寸安定性的降低之觀點來看,較佳為2質量%以下,更佳為1.5質量%以下,再更佳為1質量%以下。 The content of the photopolymerization initiator in the resin composition is preferably 0.1% by mass or more, more preferably 0.2% by mass or more, and still more preferably 0.3 from the viewpoint of obtaining good photohardening characteristics and insulation reliability. quality Amount above. The upper limit of the content of the photopolymerization initiator is preferably 2% by mass or less, more preferably 1.5% by mass or less, and still more preferably 1% by mass or less from the viewpoint of preventing reduction in dimensional stability due to excessive sensitivity. .

-(e)光增感劑- -(e) Photosensitizer-

光增感劑方面,可舉例如三級胺類、吡喃酮(pyrarizone)類、蒽類、香豆素類、氧雜蒽酮類、噻吨酮類等,以噻吨酮類為佳,2,4-二乙基硫代基氧雜蒽酮更佳。光增感劑可單獨使用1種,亦可併用2種以上。光增感劑的市售品方面,可舉例如日本化藥(股)製「DETX-S」(2,4-二乙基硫代基氧雜蒽酮)。 As for the photosensitizer, for example, tertiary amines, pyrarizones, anthracenes, coumarins, xanthone, thioxanthone, etc., of which thioxanthone is preferred, 2,4-Diethylthioxanthone is more preferred. The photosensitizer may be used alone or in combination of two or more. As a commercially available product of a photosensitizer, for example, "DETX-S" (2,4-diethylthioxanthone) manufactured by Nippon Kayaku Co., Ltd. may be mentioned.

樹脂組成物中光增感劑的含量,從可獲得良好的光硬化特性之觀點來看,較佳為0.01質量%~1質量%、更佳為0.05質量%~0.5質量%。 The content of the photosensitizer in the resin composition is preferably from 0.01% by mass to 1% by mass, and more preferably from 0.05% by mass to 0.5% by mass from the viewpoint of obtaining good photohardening characteristics.

-(f)稀釋劑- -(f) Thinner-

稀釋劑乃是為了促進樹脂組成物的光硬化反應所使用的。稀釋劑方面,可舉例如分子內具有1個以上(甲基)丙烯醯基之室溫下為液體、固體或半固形的感光性(甲基)丙烯酸酯化合物。 The diluent is used to promote the photo-hardening reaction of the resin composition. As a diluent, the photosensitive (meth) acrylate compound which is liquid, solid, or semi-solid at room temperature which has one or more (meth) acryl fluorenyl group in a molecule | numerator is mentioned, for example.

代表的感光性(甲基)丙烯酸酯化合物方面,可舉例如2-羥基乙基丙烯酸酯、2-羥基丁基丙烯酸酯等之羥基烷基丙烯酸酯類;乙二醇、甲氧基四乙二醇、聚乙二醇、丙二醇、三環癸烷二甲醇等之二醇化合物的單或 二丙烯酸酯類;N,N-二甲基丙烯醯胺、N-羥甲基丙烯醯胺等之丙烯醯胺類;N,N-二甲基胺基乙基丙烯酸酯等之胺基烷基丙烯酸酯類;三羥甲基丙烷、季戊四醇、二季戊四醇等之多元醇或此等之氧化乙烯、氧化丙烯或ε-己內酯的加成物的多價丙烯酸酯類;苯氧基丙烯酸酯、苯氧基乙基丙烯酸酯等之苯酚類或其氧化乙烯或氧化丙烯加成物等之丙烯酸酯類;由三羥甲基丙烷三環氧丙基醚等之環氧丙基醚所衍生之環氧丙烯酸酯類;三聚氰胺丙烯酸酯類;及/或對應上述丙烯酸酯之甲基丙烯酸酯類等。其中,更以二醇化合物的單或二(甲基)丙烯酸酯類、多價(甲基)丙烯酸酯類為佳。 Examples of the photosensitive (meth) acrylate compounds include hydroxyalkyl acrylates such as 2-hydroxyethyl acrylate and 2-hydroxybutyl acrylate; ethylene glycol and methoxytetraethylene glycol Alcohol, polyethylene glycol, propylene glycol, tricyclodecane dimethanol, etc. Diacrylates; acrylamides such as N, N-dimethylacrylamide, N-hydroxymethacrylamide; amine alkyl groups such as N, N-dimethylaminoethylacrylate Acrylates; polyhydric alcohols such as trimethylolpropane, pentaerythritol, dipentaerythritol, and the like, or polyvalent acrylates of ethylene oxide, propylene oxide, or ε-caprolactone; phenoxy acrylates, Phenols such as phenoxyethyl acrylate or acrylates such as ethylene oxide or propylene oxide adducts; rings derived from glycidyl ether such as trimethylolpropane triglycidyl ether Oxyacrylates; melamine acrylates; and / or methacrylates corresponding to the aforementioned acrylates. Among them, mono- or di (meth) acrylates and polyvalent (meth) acrylates of diol compounds are more preferred.

稀釋劑可單獨使用1種,亦可併用2種以上。稀釋劑的市售品方面,可舉例如日本化藥(股)「DPHA」(二季戊四醇六丙烯酸酯)、共榮社化學工業(股)製「DCPA」(三環癸烷二甲醇二丙烯酸酯)等。 The diluent may be used alone or in combination of two or more. Examples of commercially available thinners include, for example, Nippon Kayaku Co., Ltd. "DPHA" (dipentaerythritol hexaacrylate), and "DCPA" (tricyclodecane dimethanol diacrylate) manufactured by Kyoeisha Chemical Industry Co., Ltd. )Wait.

樹脂組成物中稀釋劑的含量,從使光硬化反應促進之觀點、防止硬化物的黏附之觀點來看,較佳為0.5質量%~10質量%、更佳為2質量%~8質量%。 The content of the diluent in the resin composition is preferably from 0.5% by mass to 10% by mass, and more preferably from 2% by mass to 8% by mass, from the viewpoint of promoting the photo-hardening reaction and preventing the adhesion of the cured product.

-(g)無機填充材- -(g) inorganic filler-

無機填充材方面,可舉例如氧化矽、氧化鋁、玻璃、菫青石、矽酸化物、硫酸鋇、滑石、黏土、雲母粉、氫氧化鋁、氫氧化鎂、碳酸鈣、碳酸鎂、氧化鎂、氮化硼、氮化鋁、氮化錳、硼酸鋁、鈦酸鋇、鈦酸鍶、鈦酸鈣、鈦酸 鎂、鈦酸鉍、氧化鈦、鋯酸鋇、鋯酸鈣、磷酸鋯、及磷酸鎢酸鋯等。此等之中,更以無定形氧化矽、溶融氧化矽、結晶氧化矽、合成氧化矽、中空氧化矽等之氧化矽特別佳。又氧化矽方面,以球狀氧化矽為佳。無機填充材可單獨使用1種,亦可組合2種以上使用。市售的球狀溶融氧化矽方面,可舉例如(股)Admatechs製「SOC1」、「SOC2」、「SOC3」及「SOC4」、電氣化學工業(股)製「UFP-30」、「UFP-80」。 In terms of inorganic fillers, there can be mentioned, for example, silica, alumina, glass, apatite, silicic acid, barium sulfate, talc, clay, mica powder, aluminum hydroxide, magnesium hydroxide, calcium carbonate, magnesium carbonate, magnesium oxide, Boron nitride, aluminum nitride, manganese nitride, aluminum borate, barium titanate, strontium titanate, calcium titanate, titanic acid Magnesium, bismuth titanate, titanium oxide, barium zirconate, calcium zirconate, zirconium phosphate, and zirconium tungstate phosphate. Among these, amorphous silicon oxide, fused silicon oxide, crystalline silicon oxide, synthetic silicon oxide, and hollow silicon oxide are particularly preferred. In terms of silicon oxide, spherical silicon oxide is preferred. The inorganic fillers may be used singly or in combination of two or more kinds. For commercially available spherical fused silica, for example, "SOC1", "SOC2", "SOC3", and "SOC4" manufactured by Admatechs, "UFP-30" manufactured by Denki Chemical Industries, and "UFP- 80 ".

無機填充材的平均粒徑並無特別限定,因應所期望之特性來適當地決定即可。從提高無機填充材的分散性之觀點來看,無機填充材的平均粒徑,較佳為0.01μm以上,更佳為0.05μm以上。從獲得充分的絕緣信賴性之觀點來看,無機填充材的平均粒徑,較佳為4μm以下,更佳為3μm以下,再更佳為2μm以下,又再更佳為1μm以下。此外,當樹脂組成物為光硬化性樹脂組成物時,無機填充材的平均粒徑的上限,從獲得良好的光硬化特性之觀點來看,較佳為1μm以下,更佳為0.8μm以下,再更佳為0.6μm以下或0.4μm以下。無機填充材的平均粒徑乃是藉由基於米氏(Mie)散射理論之雷射繞射.散射法來測定。具體而言,藉由雷射繞射散射式粒度分佈測定裝置,可以體積基準作成無機填充材的粒度分佈,並取其中位數徑作為平均粒徑來進行測定。測定樣品,較佳係使無機填充材藉由超音波分散於水中。雷射繞射散射式粒度分佈測定裝置方面,可使用(股)堀場製作所製 「LA-500」等。 The average particle diameter of the inorganic filler is not particularly limited, and may be appropriately determined depending on the desired characteristics. From the viewpoint of improving the dispersibility of the inorganic filler, the average particle diameter of the inorganic filler is preferably 0.01 μm or more, and more preferably 0.05 μm or more. From the viewpoint of obtaining sufficient insulation reliability, the average particle diameter of the inorganic filler is preferably 4 μm or less, more preferably 3 μm or less, even more preferably 2 μm or less, and still more preferably 1 μm or less. In addition, when the resin composition is a photocurable resin composition, the upper limit of the average particle diameter of the inorganic filler is preferably 1 μm or less, more preferably 0.8 μm or less, from the viewpoint of obtaining good photohardening characteristics. It is more preferably 0.6 μm or less or 0.4 μm or less. The average particle size of the inorganic filler is based on laser diffraction based on Mie scattering theory. Scattering method. Specifically, with a laser diffraction scattering type particle size distribution measuring device, the particle size distribution of the inorganic filler can be prepared on a volume basis, and the median diameter is taken as the average particle size for measurement. For the measurement sample, the inorganic filler is preferably dispersed in water by ultrasonic waves. For laser diffraction scattering particle size distribution measurement devices, Horiba Ltd. "LA-500" and so on.

無機填充材,從提高耐濕性及分散性之觀點來看,係以可用胺基矽烷系耦合劑、環氧矽烷系耦合劑、巰基矽烷系耦合劑、矽烷系耦合劑、有機矽氮烷化合物、鈦酸鹽系耦合劑等之1種以上的表面處理劑來處理者為佳。表面處理劑的市售品方面,可舉例如信越化學工業(股)製「KBM403」(3-環氧丙氧基丙基三甲氧基矽烷)、信越化學工業(股)製「KBM803」(3-驗基丙基三甲氧基矽烷)、信越化學工業(股)製「KBE903」(3-胺基丙基三乙氧基矽烷)、信越化學工業(股)製「KBM573」(N-苯基-3-胺基丙基三甲氧基矽烷)、信越化學工業(股)製「SZ-31」(六甲基二矽氮烷)等。 From the viewpoint of improving moisture resistance and dispersibility, inorganic fillers are available in the form of amine-based silane coupling agents, epoxy silane-based coupling agents, mercapto silane-based coupling agents, silane-based coupling agents, and organic silazane compounds. And titanate-based coupling agents are preferred. Commercially available surface treatment agents include, for example, "KBM403" (3-glycidoxypropyltrimethoxysilane) manufactured by Shin-Etsu Chemical Industry Co., Ltd., and "KBM803" (3) manufactured by Shin-Etsu Chemical Industry Co., Ltd. -Testylpropyltrimethoxysilane), `` KBE903 '' (3-aminopropyltriethoxysilane) manufactured by Shin-Etsu Chemical Industry Co., Ltd., and `` KBM573 '' (N-phenyl) manufactured by Shin-Etsu Chemical Industry Co., Ltd. -3-aminopropyltrimethoxysilane), "SZ-31" (hexamethyldisilazane) manufactured by Shin-Etsu Chemical Industry Co., Ltd., and the like.

以表面處理劑所達成的表面處理程度,可藉由無機填充材的每單位表面積之碳量來評價。無機填充材的每單位表面積之碳量,從無機填充材的分散性提昇之觀點來看,係以0.02mg/m2以上為佳,0.1mg/m2以上更佳,0.2mg/m2以上再更佳。另一方面,從防止樹脂塗漆的溶融黏度或在薄片形態下之溶融黏度上昇之觀點來看,係以1mg/m2以下為佳,0.8mg/m2以下更佳,0.5mg/m2以下再更佳。 The degree of surface treatment achieved by the surface treatment agent can be evaluated by the amount of carbon per unit surface area of the inorganic filler. The carbon content per unit surface area of the inorganic filler is preferably 0.02 mg / m 2 or more, more preferably 0.1 mg / m 2 or more, and 0.2 mg / m 2 or more from the viewpoint of improving the dispersibility of the inorganic filler. Even better. On the other hand, from the viewpoint of preventing an increase in the melt viscosity of the resin paint or the melt viscosity in the form of a sheet, it is preferably 1 mg / m 2 or less, more preferably 0.8 mg / m 2 or less, and 0.5 mg / m 2 The following is even better.

無機填充材的每單位表面積之碳量,係可將表面處理後的無機填充材藉由溶劑(例如,甲基乙基酮(MEK))洗淨處理之後予以測定。具體而言,在溶劑方面,係可將充分量的MEK加入已經表面處理劑表面處理 之無機填充材中,在25℃超音波洗淨5分鐘。去除上清液,使固形分乾燥之後,使用碳分析計測定無機填充材的每單位表面積之碳量。碳分析計方面,可使用(股)堀場製作所製「EMIA-320V」等。 The amount of carbon per unit surface area of the inorganic filler can be measured after the surface-treated inorganic filler is washed with a solvent (for example, methyl ethyl ketone (MEK)). Specifically, in terms of solvents, a sufficient amount of MEK can be added to the surface treatment of the surface treatment agent. The inorganic filler was ultrasonically cleaned at 25 ° C for 5 minutes. After removing the supernatant and drying the solid content, the carbon content per unit surface area of the inorganic filler was measured using a carbon analyzer. For the carbon analysis meter, "EMIA-320V" manufactured by Horiba Ltd. can be used.

樹脂組成物中無機填充材的含量,在可獲得顯示出所期望的彈性率之阻焊劑層下,並無特別限定。雖視環氧樹脂或硬化劑的種類而異,但若提高樹脂組成物中無機填充材的含量,則該樹脂組成物的硬化後的彈性率會有變高的傾向。例如,硬化後顯示出6GPa以上高彈性率(23℃)之樹脂組成物層,進而在形成阻焊劑層時,樹脂組成物中無機填充材的含量係以60質量%以上者為佳。硬化後的彈性率(23℃)又再更高的樹脂組成物層,進而在形成阻焊劑層時,樹脂組成物中無機填充材的含量係以65質量%以上者更佳、70質量%以上或75質量%以上者又更佳。 The content of the inorganic filler in the resin composition is not particularly limited under a solder resist layer that can exhibit a desired elastic modulus. Although it depends on the kind of epoxy resin or hardener, if the content of the inorganic filler in the resin composition is increased, the elastic modulus of the resin composition after curing tends to be high. For example, a resin composition layer that exhibits a high elastic modulus (23 ° C) of 6 GPa or more after curing, and when forming a solder resist layer, the content of the inorganic filler in the resin composition is preferably 60% by mass or more. A resin composition layer having a higher elastic modulus (23 ° C) after curing, and when forming a solder resist layer, the content of the inorganic filler in the resin composition is more preferably 65% by mass or more, and 70% by mass or more. Or more preferably 75% by mass or more.

一實施形態中,第1樹脂組成物層,進而第1阻焊劑層中所使用的樹脂組成物中無機填充材的含量,較佳為60質量%以上,更佳為65質量%以上,再更佳為70質量%以上或75質量%以上。第1樹脂組成物層中所使用的樹脂組成物中無機填充材的含量的上限,並無特別限定,從所得之阻焊劑層的機械強度之觀點來看,通常為95質量%以下,可為90質量%以下。 In one embodiment, the content of the inorganic filler in the first resin composition layer and further in the resin composition used in the first solder resist layer is preferably 60% by mass or more, more preferably 65% by mass or more, and even more It is preferably 70% by mass or more or 75% by mass or more. The upper limit of the content of the inorganic filler in the resin composition used in the first resin composition layer is not particularly limited. From the viewpoint of the mechanical strength of the obtained solder resist layer, it is usually 95% by mass or less, and may be 90% by mass or less.

第2樹脂組成物層,進而第2阻焊劑層中所使用的樹脂組成物中無機填充材的含量,在可獲得能夠顯 示所期望的彈性率之第2阻焊劑層的情況下,係以因應所期望之特性來適當地決定即可,並以從較佳為0質量%~95質量%的範圍、更佳為20質量%~85質量%的範圍中適當地決為佳。 The content of the inorganic filler in the resin composition used in the second resin composition layer and further in the second solder resist layer is such that In the case of the second solder resist layer showing a desired elastic modulus, it may be appropriately determined in accordance with the desired characteristics, and it is preferably in a range from 0% to 95% by mass, and more preferably 20%. The range of mass% to 85 mass% is preferably determined as appropriate.

較佳的一實施形態中,第1樹脂組成物層中所使用的樹脂組成物係熱硬化性樹脂組成物,包含上述的(a)環氧樹脂、(b)硬化劑、及(g)無機填充材。該實施形態中,第1樹脂組成物層中所使用的熱硬化性樹脂組成物,係以分別包含下述成分為佳:作為(a)環氧樹脂之液狀環氧樹脂與固體狀環氧樹脂所成的混合物(液狀環氧樹脂:固體狀環氧樹脂的質量比係以1:0.1~1:4的範圍為佳,1:0.3~1:3.5的範圍更佳,1:0.6~1:3的範圍又更佳,1:0.8~1:2.5的範圍又再更佳)、作為(b)硬化劑由苯酚系硬化劑、萘酚系硬化劑、活性酯系硬化劑及氰酸酯酯系硬化劑所成之群選出的1種以上(較佳為由苯酚系硬化劑、萘酚系硬化劑及活性酯系硬化劑所成之群選出的1種以上)、作為(g)無機填充材之氧化矽。有關包含組合該特定的成分所成之熱硬化性樹脂組成物,(a)環氧樹脂、(b)硬化劑及(g)無機填充材的較佳含量係如上述。 In a preferred embodiment, the resin composition-based thermosetting resin composition used in the first resin composition layer includes the aforementioned (a) epoxy resin, (b) curing agent, and (g) inorganic Filling material. In this embodiment, the thermosetting resin composition used in the first resin composition layer preferably contains the following components: (a) liquid epoxy resin and solid epoxy resin as epoxy resin The mixture made of resin (liquid epoxy resin: solid epoxy resin has a mass ratio in the range of 1: 0.1 ~ 1: 4, more preferably in the range of 1: 0.3 ~ 1: 3.5, 1: 0.6 ~ The range of 1: 3 is even better, and the range of 1: 0.8 ~ 1: 2.5 is even better.) (B) Hardeners include phenol-based hardeners, naphthol-based hardeners, active ester-based hardeners, and cyanic acid. One or more selected from the group consisting of an ester-based hardener (preferably one or more selected from the group consisting of a phenol-based hardener, a naphthol-based hardener, and an active ester-based hardener), as (g) Silicon oxide for inorganic fillers. The preferable content of (a) an epoxy resin, (b) a hardening | curing agent, and (g) an inorganic filler containing the thermosetting resin composition formed by combining this specific component is as mentioned above.

較佳的其他實施形態中,第1樹脂組成物層中所使用的樹脂組成物係光硬化性樹脂組成物,上述的(a)環氧樹脂、(b)硬化劑、(c)光硬化型鹼包含可溶性樹脂及(g)無機填充材。該實施形態中,第1樹脂 組成物層中所使用的光硬化性樹脂組成物係以分別含有下述成分為佳:作為(a)環氧樹脂之液狀環氧樹脂與固體狀環氧樹脂所成的混合物(液狀環氧樹脂:固體狀環氧樹脂的質量比係以1:0.1~1:4的範圍為佳,1:0.3~1:3.5的範圍更佳,1:0.6~1:3的範圍又更佳,1:0.8~1:2.5的範圍又再更佳)或僅只固體狀環氧樹脂、作為(b)硬化劑之由苯酚系硬化劑、萘酚系硬化劑、活性酯系硬化劑及氰酸酯酯系硬化劑所成之群選出的1種以上(較佳為苯酚系硬化劑、萘酚系硬化劑及活性酯系硬化劑所成之群選出的1種以上)、作為(c)光硬化型鹼可溶性樹脂之包含鹼可溶基與自由基聚合性不飽和基之樹脂(較佳為含羧基與自由基聚合性不飽和基之樹脂、含苯酚性羥基與自由基聚合性不飽和基之樹脂、更佳為含苯酚性羥基與自由基聚合性不飽和基之樹脂)、作為(g)無機填充材之氧化矽。有關包含組合該特定的成分所成的熱硬化性樹脂組成物,(a)環氧樹脂、(b)硬化劑、(c)光硬化型鹼可溶性樹脂及(g)無機填充材的較佳含量亦如上述,但從可獲得良好的耐熱性、絕緣信賴性及顯像性之觀點來看,在使(c)光硬化型鹼可溶性樹脂的不揮發成分為100質量%時,(a)環氧樹脂較佳為5質量%~100質量%、更佳為10質量%~85質量%者為佳。此外,第1樹脂組成物層中所使用的當樹脂組成物為光硬化性樹脂組成物時,該光硬化性樹脂組成物係以進一步含(d)光聚合起始劑、(e)光增感劑及(f)稀釋劑所成之群選出的1種以上為 佳。 In another preferred embodiment, the resin composition-based photocurable resin composition used in the first resin composition layer is (a) an epoxy resin, (b) a curing agent, and (c) a photocuring type. The alkali contains a soluble resin and (g) an inorganic filler. In this embodiment, the first resin The photocurable resin composition used in the composition layer preferably contains the following components: (a) a mixture of a liquid epoxy resin and a solid epoxy resin (liquid ring) The mass ratio of oxygen resin: solid epoxy resin is preferably in the range of 1: 0.1 ~ 1: 4, more preferably in the range of 1: 0.3 ~ 1: 3.5, and more preferably in the range of 1: 0.6 ~ 1: 3. The range of 1: 0.8 ~ 1: 2.5 is even better) or only solid epoxy resin, phenol-based hardener, naphthol-based hardener, active ester-based hardener, and cyanate ester as (b) hardener One or more selected from the group consisting of an ester-based hardener (preferably one or more selected from the group consisting of a phenol-based hardener, a naphthol-based hardener, and an active ester-based hardener), and (c) light curing Type alkali-soluble resins containing alkali-soluble groups and radically polymerizable unsaturated groups (preferably resins containing carboxyl groups and radically polymerizable unsaturated groups, resins containing phenolic hydroxyl groups and radically polymerizable unsaturated groups) A resin, more preferably a resin containing a phenolic hydroxyl group and a radically polymerizable unsaturated group), and (g) silica as an inorganic filler. The preferable content of the thermosetting resin composition containing (a) an epoxy resin, (b) a hardener, (c) a photocurable alkali-soluble resin, and (g) an inorganic filler in combination with the specific component As described above, from the viewpoint of obtaining good heat resistance, insulation reliability, and developability, when (c) the non-volatile content of the photocurable alkali-soluble resin is 100% by mass, (a) the ring The oxygen resin is preferably 5 mass% to 100 mass%, and more preferably 10 mass% to 85% by mass. In addition, when the resin composition used in the first resin composition layer is a photocurable resin composition, the photocurable resin composition further contains (d) a photopolymerization initiator and (e) photoincrease. One or more selected from the group consisting of sensitizer and (f) diluent are good.

從實裝步驟中可更加抑制印刷配線板的翹曲之觀點來看,第1樹脂組成物層、進而第1阻焊劑層中所使用的樹脂組成物不管熱硬化性樹脂組成物、光硬化性樹脂組成物的類別,以硬化後的玻璃轉移溫度(Tg)為150℃以上者佳、155℃以上者更佳。該Tg的上限並無特別限定,通常為300℃以下,可為250℃以下等。硬化後的樹脂組成物的Tg係可以拉伸加重法藉由熱機械分析來測定。硬化後的樹脂組成物Tg之測定中,可使用的熱機械分析裝置方面,可舉例如(股)理學製「Thermo Plus TMA8310」、Seiko Instruments(股)製「TMA-SS6100」。 From the viewpoint that the warpage of the printed wiring board can be further suppressed in the mounting step, the resin composition used in the first resin composition layer and further the first solder resist layer does not matter the thermosetting resin composition and the photocurable resin. The type of the composition is preferably a glass transition temperature (Tg) after curing of 150 ° C or higher, more preferably 155 ° C or higher. The upper limit of the Tg is not particularly limited, but is usually 300 ° C or lower, and may be 250 ° C or lower. The Tg of the cured resin composition can be measured by a thermomechanical analysis by a tensile weighting method. Examples of thermomechanical analysis devices that can be used for the measurement of the cured resin composition Tg include, for example, "Thermo Plus TMA8310" manufactured by Rigaku, and "TMA-SS6100" manufactured by Seiko Instruments.

較佳的一實施形態中,第2樹脂組成物層中所使用的樹脂組成物係熱硬化性樹脂組成物,係含上述的(a)環氧樹脂及(b)硬化劑。該實施形態中,第2樹脂組成物層中所使用的熱硬化性樹脂組成物係以分別含有下述成分為佳:作為(a)環氧樹脂之液狀環氧樹脂與固體狀環氧樹脂所成的混合物(液狀環氧樹脂:固體狀環氧樹脂的質量比係以1:0.1~1:4的範圍為佳,1:0.3~1:3.5的範圍更佳,1:0.6~1:3的範圍又更佳,1:0.8~1:2.5的範圍又再更佳)、作為(b)硬化劑之由苯酚系硬化劑、萘酚系硬化劑、活性酯系硬化劑及氰酸酯酯系硬化劑所成之群選出的1種以上(較佳為苯酚系硬化劑、萘酚系硬化劑及活性酯系硬化劑所成之群選出的1種以上)。有 關包含組合該特定的成分之熱硬化性樹脂組成物,(a)環氧樹脂、及(b)硬化劑的較佳含量亦如上述。第2樹脂組成物層中所使用的熱硬化性樹脂組成物亦如上述,為了達成顯示出所期望的彈性率之第2阻焊劑層,係含有(g)無機填充材(較佳為氧化矽)以使樹脂組成物中的含量為0質量%~95質量%之範圍。在此,有關樹脂組成物的構成成分所稱之「含有使其為0質量%~n質量%之範圍」,包含不含該構成成分的情況以及以n質量%以下的範圍含有的情況雙方。 In a preferred embodiment, the resin composition-based thermosetting resin composition used in the second resin composition layer contains the above-mentioned (a) epoxy resin and (b) curing agent. In this embodiment, the thermosetting resin composition used in the second resin composition layer preferably contains the following components: (a) liquid epoxy resin and solid epoxy resin as epoxy resin The resulting mixture (the mass ratio of liquid epoxy resin: solid epoxy resin is preferably in the range of 1: 0.1 ~ 1: 4, more preferably in the range of 1: 0.3 ~ 1: 3.5, 1: 0.6 ~ 1 : The range of 3 is even better, and the range of 1: 0.8 to 1: 2.5 is even better.) (B) Hardeners from phenol-based hardeners, naphthol-based hardeners, active ester-based hardeners, and cyanic acid One or more selected from the group consisting of an ester-based hardener (preferably one or more selected from the group consisting of a phenol-based hardener, a naphthol-based hardener, and an active ester-based hardener). Have Regarding the thermosetting resin composition containing the specific component, the preferable content of (a) the epoxy resin and (b) the hardener is as described above. The thermosetting resin composition used in the second resin composition layer is also the same as described above. In order to achieve the second solder resist layer showing a desired elastic modulus, it contains (g) an inorganic filler (preferably silicon oxide). The content of the resin composition is in a range of 0% by mass to 95% by mass. Here, the term “contained in the range of 0% by mass to n% by mass” of the constituents of the resin composition includes both cases where the constituents are not included and cases where the constituents are contained in a range of n% by mass or less.

較佳的其他實施形態中,第2樹脂組成物層中所使用的樹脂組成物係光硬化性樹脂組成物,包含上述的(a)環氧樹脂、(b)硬化劑、及(c)光硬化型鹼可溶性樹脂。該實施形態中,第2樹脂組成物層中所使用的光硬化性樹脂組成物係以分別包含下述成分為佳:作為(a)環氧樹脂之液狀環氧樹脂與固體狀環氧樹脂所成的混合物(液狀環氧樹脂:固體狀環氧樹脂的質量比係以1:0.1~1:4的範圍為佳,1:0.3~1:3.5的範圍更佳,1:0.6~1:3的範圍又更佳,1:0.8~1:2.5的範圍又再更佳)或僅只為固體狀環氧樹脂、作為(b)硬化劑之由苯酚系硬化劑、萘酚系硬化劑、活性酯系硬化劑及氰酸酯酯系硬化劑所成之群選出的1種以上(較佳為苯酚系硬化劑、萘酚系硬化劑及活性酯系硬化劑所成之群選出的1種以上)、作為(c)光硬化型鹼可溶性樹脂之包含鹼可溶基與自由基聚合性不飽和基之樹脂(較佳為含羧基與自由 基聚合性不飽和基之樹脂、含苯酚性羥基與自由基聚合性不飽和基之樹脂、更佳為含苯酚性羥基與自由基聚合性不飽和基之樹脂)。有關包含組合該特定的成分之熱硬化性樹脂組成物,(a)環氧樹脂、(b)硬化劑及(c)光硬化型鹼可溶性樹脂的較佳含量雖如上述,但從可得良好的耐熱性、絕緣信賴性及顯像性之觀點來看,(a)環氧樹脂,當使(c)光硬化型鹼可溶性樹脂的不揮發成分為100質量%時,較佳為5質量%~100質量%、更佳為10質量%~85質量%者為佳。第2樹脂組成物層中所使用的當樹脂組成物為光硬化性樹脂組成物時,該光硬化性樹脂組成物係以進一步包含由(d)光聚合起始劑、(e)光增感劑及(f)稀釋劑所成之群選出的1種以上為佳。第2樹脂組成物層中所使用的光硬化性樹脂組成物亦如上述,為了達成顯示出所期望的彈性率之第2阻焊劑層,係以樹脂組成物中含量為0質量%~95質量%之範圍含有(g)無機填充材(較佳為氧化矽)即可。 In another preferred embodiment, the resin composition-based photocurable resin composition used in the second resin composition layer includes the aforementioned (a) epoxy resin, (b) curing agent, and (c) light. Hardening alkali soluble resin. In this embodiment, the photocurable resin composition used in the second resin composition layer preferably contains the following components: (a) liquid epoxy resin and solid epoxy resin as epoxy resin The resulting mixture (the mass ratio of liquid epoxy resin: solid epoxy resin is preferably in the range of 1: 0.1 ~ 1: 4, more preferably in the range of 1: 0.3 ~ 1: 3.5, 1: 0.6 ~ 1 : The range of 3 is even better, and the range of 1: 0.8 to 1: 2.5 is even better) or only solid epoxy resin, phenol-based hardener, naphthol-based hardener, (b) hardener, One or more selected from the group consisting of an active ester-based hardener and a cyanate ester-based hardener (preferably one selected from the group consisting of a phenol-based hardener, a naphthol-based hardener, and an active ester-based hardener (Above), (c) A resin containing an alkali-soluble group and a radical polymerizable unsaturated group (preferably containing a carboxyl group and Resin having a polymerizable unsaturated group, resin containing a phenolic hydroxyl group and a radical polymerizable unsaturated group, and more preferably resin containing a phenolic hydroxyl group and a radical polymerizable unsaturated group). Regarding the thermosetting resin composition containing the specific component, the preferable content of (a) epoxy resin, (b) hardener, and (c) light-curable alkali-soluble resin is as described above, but it is good from From the viewpoints of heat resistance, insulation reliability, and developability, (a) epoxy resin is preferably 5% by mass when the nonvolatile content of (c) photocurable alkali-soluble resin is 100% by mass. ~ 100% by mass, more preferably 10% to 85% by mass. When the resin composition is a photocurable resin composition used in the second resin composition layer, the photocurable resin composition further includes (d) a photopolymerization initiator and (e) photosensitization. One or more selected from the group consisting of an agent and (f) a diluent are preferred. The photocurable resin composition used in the second resin composition layer is also the same as above. In order to achieve the second solder resist layer showing a desired elastic modulus, the content of the resin composition is 0% to 95% by mass. The range may include (g) an inorganic filler (preferably silicon oxide).

第2樹脂組成物層,進而第2阻焊劑層中所使用的樹脂組成物,不管熱硬化性樹脂組成物、光硬化性樹脂組成物的類別,只要是可得所期望的彈性率,硬化後的玻璃轉移溫度(Tg)並無特別限定。從實裝步驟中可更加抑制印刷配線板的翹曲之觀點來看,第2樹脂組成物層,進而第2阻焊劑層中所使用的樹脂組成物其硬化後的Tg係以150℃以上者為佳、155℃以上者更佳。該Tg的上限並無特別限定,通常為300℃以下,可為250℃以下 等。 Regardless of the type of the thermosetting resin composition or the photocurable resin composition, the resin composition used in the second resin composition layer and further in the second solder resist layer, as long as the desired elastic modulus is obtained, after curing, The glass transition temperature (Tg) is not particularly limited. From the viewpoint that the warpage of the printed wiring board can be more suppressed in the mounting step, the Tg of the second resin composition layer and further the resin composition used in the second solder resist layer after curing is 150 ° C or higher. Good, those above 155 ° C are more preferred. The upper limit of the Tg is not particularly limited, but is usually 300 ° C or lower, and may be 250 ° C or lower. Wait.

較佳的一實施形態中,第1及第2樹脂組成物層中所使用的樹脂組成物均為熱硬化性樹脂組成物。其他較佳實施形態中,第1及第2樹脂組成物層中所使用的樹脂組成物均為光硬化性樹脂組成物。再者,其他較佳實施形態中,第1樹脂組成物層中所使用的樹脂組成物係熱硬化性樹脂組成物,第2樹脂組成物層中所使用的樹脂組成物係光硬化性樹脂組成物。其他較佳實施形態中,第1樹脂組成物層中所使用的樹脂組成物係光硬化性樹脂組成物,第2樹脂組成物層中所使用的樹脂組成物係熱硬化性樹脂組成物。 In a preferred embodiment, the resin compositions used in the first and second resin composition layers are both thermosetting resin compositions. In other preferred embodiments, the resin composition used in the first and second resin composition layers is a photocurable resin composition. In another preferred embodiment, the resin composition is a thermosetting resin composition used in the first resin composition layer, and the resin composition is a photocurable resin composition used in the second resin composition layer. Thing. In other preferred embodiments, the resin composition used in the first resin composition layer is a photocurable resin composition, and the resin composition used in the second resin composition layer is a thermosetting resin composition.

-(h)熱可塑性樹脂- -(h) Thermoplastic resin-

第1及第2樹脂組成物層中所使用的樹脂組成物亦可進一步包含熱可塑性樹脂。熱可塑性樹脂方面,在形成印刷配線板的阻焊劑層時,係可使用一般可用的任意熱可塑性樹脂,可舉例如苯氧基樹脂、聚乙烯基縮醛樹脂、聚烯烴樹脂、聚丁二烯樹脂、聚醯亞胺樹脂、聚醯胺醯亞胺樹脂、聚醚碸樹脂、聚伸苯基醚樹脂及聚碸樹脂等。熱可塑性樹脂可單獨使用1種或併用2種以上。 The resin composition used in the first and second resin composition layers may further include a thermoplastic resin. In terms of thermoplastic resins, when forming a solder resist layer of a printed wiring board, any generally available thermoplastic resin can be used, such as phenoxy resin, polyvinyl acetal resin, polyolefin resin, and polybutadiene. Resin, polyimide resin, polyimide resin, polyether resin, polyphenylene ether resin, polyimide resin, etc. The thermoplastic resin may be used singly or in combination of two or more kinds.

熱可塑性樹脂的聚苯乙烯換算之重量平均分子量係以8,000~70,000的範圍為佳,10,000~60,000的範圍更佳,20,000~60,000的範圍又更佳。熱可塑性樹脂的聚苯乙烯換算之重量平均分子量係以膠體滲透層析 (GPC)法來測定。具體而言,熱可塑性樹脂的聚苯乙烯換算之重量平均分子量,係使用(股)島津製作所製LC-9A/RID-6A作為測定裝置、管柱使用昭和電工(股)製Shodex K-800P/K-804L/K-804L、移動相方面則使用氯仿等,以管柱溫度40℃進行測定,並使用標準聚苯乙烯之檢量線算出。 The polystyrene equivalent weight average molecular weight of the thermoplastic resin is preferably in the range of 8,000 to 70,000, more preferably in the range of 10,000 to 60,000, and even more preferably in the range of 20,000 to 60,000. Polystyrene-equivalent weight average molecular weight of thermoplastic resin is based on colloidal permeation chromatography (GPC) method. Specifically, the polystyrene-equivalent weight average molecular weight of the thermoplastic resin is measured using LC-9A / RID-6A manufactured by Shimadzu Corporation, and Shodex K-800P / manufactured by Showa Denko Corporation is used for the string. For K-804L / K-804L and mobile phase, chloroform was used to measure at a column temperature of 40 ° C, and calculated using a standard polystyrene calibration curve.

樹脂組成物中熱可塑性樹脂的含量,若可獲得顯示出所期望的彈性率之阻焊劑層,並無特別限定,較佳為0.1質量%以上,更佳為1質量%以上,再更佳為3質量%以上,5質量%以上或7質量%以上。熱可塑性樹脂的含量的上限並無特別限定,較佳為50質量%以下,更佳為40質量%以下,再更佳為30質量%以下。雖視環氧樹脂或硬化劑的種類、無機填充材的含量而異,但樹脂組成物中若提高熱可塑性樹脂的含量,則該樹脂組成物的硬化後的彈性率會有變低的傾向。 The content of the thermoplastic resin in the resin composition is not particularly limited as long as a solder resist layer exhibiting a desired elasticity is obtained, preferably 0.1 mass% or more, more preferably 1 mass% or more, and even more preferably 3 More than mass%, more than 5 mass% or more than 7 mass%. The upper limit of the content of the thermoplastic resin is not particularly limited, but is preferably 50% by mass or less, more preferably 40% by mass or less, and even more preferably 30% by mass or less. Although it varies depending on the type of the epoxy resin or the hardener and the content of the inorganic filler, if the content of the thermoplastic resin is increased in the resin composition, the cured composition tends to have a lower elastic modulus.

-(i)硬化促進劑- -(i) Hardening accelerator-

第1及第2樹脂組成物層中所使用的樹脂組成物,亦可進一步包含硬化促進劑。硬化促進劑方面,係於形成印刷配線板的阻焊劑層時,以使用一般所用之任意的硬化促進劑即可,可舉例如磷系硬化促進劑、胺系硬化促進劑、咪唑系硬化促進劑、胍系硬化促進劑等,以磷系硬化促進劑、胺系硬化促進劑、咪唑系硬化促進劑為佳,胺系硬化促進劑、咪唑系硬化促進劑更佳。硬化促進劑係可單獨使 用1種,亦可組合2種以上使用。 The resin composition used in the first and second resin composition layers may further include a hardening accelerator. In the case of a hardening accelerator, when forming a solder resist layer of a printed wiring board, any hardening accelerator generally used may be used, and examples thereof include a phosphorus-based hardening accelerator, an amine-based hardening accelerator, and an imidazole-based hardening accelerator. As the guanidine-based hardening accelerator, a phosphorus-based hardening accelerator, an amine-based hardening accelerator, or an imidazole-based hardening accelerator is preferred, and an amine-based hardening accelerator or an imidazole-based hardening accelerator is more preferred. Hardening accelerator can be used alone Use 1 type, or you can combine 2 or more types.

樹脂組成物中硬化促進劑的含量,若可獲得顯示出所期望的彈性率之阻焊劑層,並無特別限定,令環氧樹脂與硬化劑的不揮發成分合計量為100質量%時,係以於0.03質量%~3質量%的範圍使用為佳。 The content of the hardening accelerator in the resin composition is not particularly limited as long as a solder resist layer showing a desired elasticity is obtained. When the total amount of the non-volatile components of the epoxy resin and the hardener is 100% by mass, it is based on It is preferably used in the range of 0.03 mass% to 3 mass%.

-(j)難燃劑- -(j) Flame retardant-

第1及第2樹脂組成物層中所使用的樹脂組成物,亦可進一步包含難燃劑。難燃劑方面,在形成印刷配線板的阻焊劑層時,可使用一般所用的任意難燃劑,可舉例如有機磷系難燃劑、有機系氮含有磷化合物、氮化合物、聚矽氧系難燃劑、金屬氫氧化物等。難燃劑可單獨使用1種或併用2種以上。樹脂組成物中難燃劑的含量,若可獲得顯示出所期望的彈性率之阻焊劑層,並無特別限定,較佳為0.5質量%~20質量%、更佳為1質量%~15質量%。 The resin composition used in the first and second resin composition layers may further contain a flame retardant. In terms of flame retardants, any flame retardant generally used in forming a solder resist layer of a printed wiring board can be used, and examples thereof include organic phosphorus-based flame retardants, organic nitrogen-containing phosphorus compounds, nitrogen compounds, and polysiloxanes. Flame retardants, metal hydroxides, etc. The flame retardant can be used alone or in combination of two or more. The content of the flame retardant in the resin composition is not particularly limited as long as a solder resist layer exhibiting a desired elasticity is obtained, and is preferably 0.5% to 20% by mass, and more preferably 1% to 15% by mass. .

-(k)有機填充材- -(k) Organic Filler-

第1及第2樹脂組成物層中所使用的樹脂組成物,可進一步包含有機填充材。有機填充材方面,在形成印刷配線板的阻焊劑層時,可使用一般所用的任意有機填充材,舉例如橡膠粒子、聚醯胺微粒子、聚矽氧粒子等,以橡膠粒子為佳。 The resin composition used in the first and second resin composition layers may further include an organic filler. In terms of organic fillers, in forming a solder resist layer of a printed wiring board, any organic fillers generally used can be used, such as rubber particles, polyamide fine particles, and polysiloxane particles. Rubber particles are preferred.

橡膠粒子方面,若為對顯示出橡膠彈性之樹脂施予化學性交聯處理,且對有機溶劑不溶且不融之樹脂 的微粒子體的話,並無無特別限定,可舉例如丙烯腈丁二烯橡膠粒子、丁二烯橡膠粒子、丙烯酸橡膠粒子等。橡膠粒子方面,具體而言,XER-91(日本合成橡膠(股)製)、Staphiroid AC3355、AC3816、AC3816N、AC3832、AC4030、AC3364、IM101(以上,GANTSU KASEI(股)製)Pararoid EXL2655、EXL2602(以上,吳羽化學工業(股)製)等。 In the case of rubber particles, if the resin exhibits rubber elasticity is chemically cross-linked and is insoluble and insoluble in organic solvents The fine particles are not particularly limited, and examples thereof include acrylonitrile butadiene rubber particles, butadiene rubber particles, and acrylic rubber particles. In terms of rubber particles, specifically, XER-91 (made by Japan Synthetic Rubber Co., Ltd.), Staphiroid AC3355, AC3816, AC3816N, AC3832, AC4030, AC3364, IM101 (above, manufactured by GANTSU KASEI), Pararoid EXL2655, EXL2602 ( Above, Wu Yu Chemical Industry Co., Ltd.).

有機填充材的平均粒徑,較佳為0.005μm~1μm的範圍、更佳為0.2μm~0.6μm的範圍。有機填充材的平均粒徑係可使用動態光散射法來測定。例如,可於適當的有機溶劑中藉由超音波等使有機填充材均一地分散,並使用濃厚系粒徑分析儀(FPAR-1000;大塚電子(股)製),以質量基準作成有機填充材的粒度分佈,取其中位數徑作為平均粒徑來進行測定。 The average particle diameter of the organic filler is preferably in a range of 0.005 μm to 1 μm, and more preferably in a range of 0.2 μm to 0.6 μm. The average particle diameter of an organic filler can be measured using a dynamic light scattering method. For example, an organic filler can be uniformly dispersed in a suitable organic solvent by ultrasonic waves, etc., and an organic filler can be prepared on a mass basis using a thick particle size analyzer (FPAR-1000; manufactured by Otsuka Electronics Co., Ltd.). The particle size distribution is determined by taking the median diameter as the average particle diameter.

樹脂組成物中有機填充材的含量,若可獲得顯示出所期望的彈性率之阻焊劑層,並無特別限定,較佳為0.1質量%~6質量%、更佳為0.5質量%~4質量%。 The content of the organic filler in the resin composition is not particularly limited as long as a solder resist layer exhibiting a desired elasticity is obtained, and is preferably 0.1% by mass to 6% by mass, and more preferably 0.5% by mass to 4% by mass. .

-其他的成分- -Other ingredients-

第1及第2樹脂組成物層中所使用的樹脂組成物,可視需要而包含其他添加劑,該其他添加劑方面,可舉例如有機銅化合物、有機鋅化合物及有機鈷化合物等之有機金屬化合物、和增黏劑、消泡劑、調平劑、密著性賦予劑、及著色劑等之樹脂添加劑等。 The resin composition used in the first and second resin composition layers may include other additives as necessary. Examples of the other additives include organometallic compounds such as organic copper compounds, organic zinc compounds, and organic cobalt compounds, and Resin additives such as tackifiers, defoamers, leveling agents, adhesion imparting agents, and coloring agents.

<支持體> <Support body>

支持體方面,不管第1支持體、第2支持體的差別,可舉例如由塑膠材料所成的薄膜、金屬箔、離型紙,以由塑膠材料所成的薄膜、金屬箔為佳。 Regarding the support, regardless of the difference between the first support and the second support, for example, a film made of a plastic material, a metal foil, and a release paper, and a film made of a plastic material and a metal foil are preferred.

支持體方面,使用由塑膠材料所成的薄膜時,塑膠材料方面,可舉例如聚對苯二甲酸乙二醇酯(以下簡稱「PET」)、聚萘二甲酸乙二醇酯(以下簡稱「PEN」)等之聚酯、聚碳酸酯(以下簡稱「PC」)、聚甲基丙烯酸甲基酯(PMMA)等之丙烯酸酯、環狀聚烯烴、三乙醯基纖維素(TAC)、聚醚硫醚(PES)、聚醚酮、聚醯亞胺等。其中,更以聚對苯二甲酸乙二醇酯、聚萘二甲酸乙二醇酯為佳,安價聚對苯二甲酸乙二醇酯特別佳。 For the support, when using a thin film made of a plastic material, for example, polyethylene terephthalate (hereinafter referred to as "PET"), polyethylene naphthalate (hereinafter referred to as "" PEN ") and other polyesters, polycarbonates (hereinafter referred to as" PC "), polymethyl methacrylate (PMMA) and other acrylates, cyclic polyolefins, triethyl cellulose (TAC), polymer Ether sulfide (PES), polyether ketone, polyimide, etc. Among them, polyethylene terephthalate and polyethylene naphthalate are more preferable, and valence polyethylene terephthalate is particularly preferable.

支持體方面,使用金屬箔時,金屬箔方面,可舉例如銅箔、鋁箔等,並以銅箔為佳。銅箔方面,可使用由銅的單一金屬所成之箔,亦可使用銅與其他金屬(例如,錫、鉻、銀、鎂、鎳、鋯、矽、鈦等)之合金所成之箔。 For the support, when a metal foil is used, for the metal foil, copper foil, aluminum foil, etc. may be mentioned, and copper foil is preferred. As for the copper foil, a foil made of a single metal of copper can be used, or a foil made of an alloy of copper and other metals (for example, tin, chromium, silver, magnesium, nickel, zirconium, silicon, titanium, etc.) can be used.

支持體可於與樹脂組成物層接合的面施予消光處理、電暈處理。又,支持體方面,亦可使用在與樹脂組成物層接合的面具有離型層之附離型層之支持體。於附離型層之支持體的離型層上使用之離型劑方面,可舉例如醇酸樹脂、聚烯烴樹脂、胺基甲酸酯樹脂、及聚矽氧樹脂 所成之群選出的1種以上的離型劑。 The support may be subjected to a matting treatment or a corona treatment on the surface bonded to the resin composition layer. Moreover, as a support body, you may use the support body which has a release layer on the surface joined to the resin composition layer, and the release layer. Examples of the release agent used on the release layer of the support with the release layer include alkyd resin, polyolefin resin, urethane resin, and silicone resin. One or more release agents selected by the group.

支持體的市售品方面,可舉例如LINTEC(股)製「SK-1」、「AL-5」、「AL-7」、東麗(股)製「NS80A」、三菱樹脂(股)製「R310-16B」等。 As for the commercially available products of the support, for example, SK-1, AL-5, and AL-7 made by LINTEC (stock), NS80A made by Toray (stock), and Mitsubishi Resin (stock) "R310-16B" and so on.

支持體的厚度,並無特別限定,以5μm~75μm的範圍為佳,10μm~60μm的範圍更佳,10μm~45μm的範圍又更佳。此外,使用附離型層之支持體時,附離型層之支持體全體的厚度係以上述範圍者為佳。 The thickness of the support is not particularly limited, but a range of 5 μm to 75 μm is preferred, a range of 10 μm to 60 μm is more preferred, and a range of 10 μm to 45 μm is more preferred. In addition, when a support with a release layer is used, the thickness of the entire support of the release layer is preferably within the above range.

樹脂薄片,不管第1樹脂薄片、第2樹脂薄片之區別,例如,可藉由將樹脂組成物溶解於有機溶劑中來調製樹脂塗漆,使用模具塗布機等將此樹脂塗漆塗佈於支持體上,並使樹脂塗漆乾燥所製作。 Regardless of the difference between the first resin sheet and the second resin sheet, for example, the resin coating can be prepared by dissolving the resin composition in an organic solvent, and the resin coating can be applied to a support using a mold coater or the like. It is made by drying the resin paint.

有機溶劑方面,可舉例如丙酮、甲基乙基酮及環己酮等之酮類、酢酸乙基、酢酸丁基、賽路蘇乙酸酯、丙二醇單甲基醚乙酸酯及卡必醇乙酸酯等之酢酸酯類、賽路蘇及丁基卡必醇等之卡必醇類、甲苯及二甲苯等之芳香族烴類、二甲基甲醯胺、二甲基乙醯胺及N-甲基吡咯啶酮等之醯胺系溶劑等。有機溶劑可單獨使用1種或併用2種以上。 In terms of organic solvents, ketones such as acetone, methyl ethyl ketone, and cyclohexanone, ethyl acetate, butyl acetate, celex acetate, propylene glycol monomethyl ether acetate, and carbitol Acetates such as acetates, carbitols such as cyrus and butyl carbitol, aromatic hydrocarbons such as toluene and xylene, dimethylformamide, dimethylacetamide, and Amidamine-based solvents such as N-methylpyrrolidone and the like. The organic solvents may be used alone or in combination of two or more.

樹脂塗漆的乾燥係可藉由加熱、熱風吹附等之公知的乾燥方法來實施。雖也視樹脂塗漆中有機溶劑的沸點而異,但例如在使用含30質量%~60質量%之有機溶劑的樹脂塗漆時,可藉由使其在50℃~150℃下乾燥3分鐘~10分鐘,而於支持體上形成樹脂組成物層。 The drying of the resin coating can be performed by a known drying method such as heating or hot air blowing. Although it depends on the boiling point of the organic solvent in the resin coating, for example, when using a resin coating containing 30% to 60% by mass of an organic solvent, it can be dried at 50 ° C to 150 ° C for 3 minutes. ~ 10 minutes, and a resin composition layer was formed on the support.

樹脂薄片,不管第1樹脂薄片、第2樹脂薄片之區別,於樹脂組成物層之不與支持體接合的面(意即,與支持體呈反對側的面),可進一步包含保護薄膜。保護薄膜乃作用於防止樹脂組成物層表面之髒污等的附著或損傷。保護薄膜的材料方面,可使用與就支持體所說明的材料相同者。保護薄膜的厚度,並未特別限定,例如1μm~40μm。樹脂薄片,係於製造印刷配線板時,藉由剝除保護薄膜而得以使用。 Regardless of the difference between the first resin sheet and the second resin sheet, the resin sheet may further include a protective film on the surface of the resin composition layer that is not bonded to the support (that is, the surface on the opposite side to the support). The protective film acts to prevent adhesion or damage of dirt and the like on the surface of the resin composition layer. As the material of the protective film, the same materials as those described for the support can be used. The thickness of the protective film is not particularly limited, and is, for example, 1 μm to 40 μm. The resin sheet is used for producing a printed wiring board by peeling off the protective film.

[印刷配線板的製造方法] [Manufacturing method of printed wiring board]

在可獲得滿足上述條件(1)、(2)及(3)之印刷配線板的情況下,製造本發明之印刷配線板的方法並無特別限定。以下,係使用上述的印刷配線板的阻焊劑層用樹脂薄片來製作印刷配線板之方法作為製造本發明之印刷配線板的方法之較佳例而予以說明。 In the case where a printed wiring board that satisfies the above conditions (1), (2), and (3) can be obtained, the method of manufacturing the printed wiring board of the present invention is not particularly limited. Hereinafter, a method for manufacturing a printed wiring board using the resin sheet for a solder resist layer of the printed wiring board described above will be described as a preferred example of a method for manufacturing the printed wiring board of the present invention.

較佳的一實施形態中,本發明之印刷配線板係使用上述印刷配線板的阻焊劑層用樹脂薄片組,藉由包含下述步驟(I)~(III)之方法來製造。 In a preferred embodiment, the printed wiring board of the present invention is manufactured by a method including the following steps (I) to (III) using the resin sheet group for a solder resist layer of the printed wiring board.

(I)於具有第1及第2主面之電路基板的第1主面上,將包含第1支持體及與該第1支持體接合之第1樹脂組成物層的第1樹脂薄片,以第1樹脂組成物層與電路基板的第1主面接合之方式進行積層的步驟 (I) A first resin sheet including a first support and a first resin composition layer bonded to the first support on a first main surface of a circuit substrate having first and second main surfaces, and The step of laminating the first resin composition layer and the first main surface of the circuit board

(II)於電路基板的第2主面上,將包含第2支持體及與該第2支持體接合之第2樹脂組成物層的第2樹脂薄 片,以第2樹脂組成物層與電路基板的第2主面接合之方式進行積層的步驟 (II) A second resin sheet including a second support and a second resin composition layer bonded to the second support on the second main surface of the circuit board Sheet, and a step of laminating so that the second resin composition layer is bonded to the second main surface of the circuit board

(III)使第1及第2樹脂組成物層硬化而形成第1及第2阻焊劑層的步驟 (III) A step of curing the first and second resin composition layers to form the first and second solder resist layers

-步驟(I)- -Step (I)-

步驟(I)中,係於具有第1及第2主面之電路基板的第1主面,將包含第1支持體及與該第1支持體接合之第1樹脂組成物層的第1樹脂薄片,以第1樹脂組成物層與電路基板的第1主面接合之方式進行積層。 In step (I), a first resin including a first support and a first resin composition layer bonded to the first support is attached to a first main surface of a circuit substrate having first and second main surfaces. The sheet is laminated so that the first resin composition layer is bonded to the first main surface of the circuit board.

步驟(I)中,使用之第1樹脂薄片係如上述〔印刷配線板的阻焊劑層用樹脂薄片組〕中所載。 In the step (I), the first resin sheet used is as described in the above [Resin sheet group for solder resist layer of printed wiring board].

本發明中,所謂「電路基板」意指製造印刷配線板時,再於兩面形成有阻焊劑層之基板,可舉例如,具有對向之第1及第2主面且於該第1及第2主面雙方具有經圖型加工之電路配線的基板。以電路配線的層數為首的層構成並無特別限定,視所期望之印刷配線板的特性適當地決定即可。 In the present invention, the "circuit board" refers to a substrate on which a solder resist layer is formed on both sides when a printed wiring board is manufactured. 2 Both sides of the main surface are provided with a patterned circuit wiring board. The layer configuration including the number of layers of circuit wiring is not particularly limited, and may be appropriately determined depending on the desired characteristics of the printed wiring board.

電路基板的厚度,在可獲得滿足上述條件(1)及(2)之印刷配線板的情況下,並無特別限定,較佳為240μm以下,更佳為220μm以下,再更佳為200μm以下。根據本發明,即使是在使用更薄的電路基板時,亦可抑制實裝步驟中印刷配線板的翹曲。即使是使用例如190μm以下,180μm以下,170μm以下,160μm以下, 150μm以下,140μm以下,130μm以下,120μm以下,110μm以下或100μm以下的厚度之電路基板的情況下,亦可抑制實裝步驟中之翹曲。電路基板的厚度之下限並無特別限定,從印刷配線板製造時取汲性提昇之觀點來看,較佳為10μm以上,更佳為20μm以上。此外,所謂電路基板的厚度,乃為表面電路的厚度也包含之電路基板全體的厚度。在此,令電路基板的厚度之中去除表面電路的厚度所得之值為t3(μm)時,上述Z、t1、t2與該t3滿足t1+t2+t3=Z之關係。 The thickness of the circuit board is not particularly limited when a printed wiring board that satisfies the above conditions (1) and (2) can be obtained. The thickness is preferably 240 μm or less, more preferably 220 μm or less, and still more preferably 200 μm or less. According to the present invention, even when a thinner circuit board is used, warping of the printed wiring board in the mounting step can be suppressed. For example, when using a circuit board with a thickness of 190 μm or less, 180 μm or less, 170 μm or less, 160 μm or less, 150 μm or less, 140 μm or less, 130 μm or less, 120 μm or less, 110 μm or less or 100 μm or less in thickness, it is possible to suppress Warping. The lower limit of the thickness of the circuit board is not particularly limited. From the viewpoint of improving the drawability during the production of the printed wiring board, it is preferably 10 μm or more, and more preferably 20 μm or more. In addition, the thickness of the circuit board refers to the thickness of the entire circuit board including the thickness of the surface circuit. Here, when the value obtained by excluding the thickness of the surface circuit from the thickness of the circuit substrate is t 3 (μm), the above Z, t 1 , t 2 and t 3 satisfy t 1 + t 2 + t 3 = Z relationship.

電路基板的表面電路的厚度,並無特別限定,從印刷配線板的薄型化之觀點來看,較佳為40μm以下,更佳為30μm以下,再更佳為25μm以下,又再更佳為20μm以下,18μm以下,16μm以下,14μm以下,12μm以下或10μm以下。表面電路的厚度的下限並無特別限定,通常可為1μm以上、3μm以上、5μm以上。 The thickness of the surface circuit of the circuit board is not particularly limited. From the viewpoint of reducing the thickness of the printed wiring board, it is preferably 40 μm or less, more preferably 30 μm or less, still more preferably 25 μm or less, and still more preferably 20 μm. Below, 18 μm or less, 16 μm or less, 14 μm or less, 12 μm or less, or 10 μm or less. The lower limit of the thickness of the surface circuit is not particularly limited, and it may be generally 1 μm or more, 3 μm or more, and 5 μm or more.

電路基板的熱膨脹係數,從抑制電路歪扭或裂隙的產生之觀點來看,較佳為16ppm/℃以下,更佳為14ppm/℃以下,再更佳為12ppm/℃以下。電路基板熱膨脹係數的下限雖也視阻焊劑層之形成中使用的樹脂組成物之組成而異,但較佳為-2ppm/℃以上,更佳為0ppm/℃以上、再更佳為4ppm/℃以上。本發明中,電路基板的熱膨脹係數係以拉伸加重法藉由熱機械分析(TMA)所得之平面方向25~150℃的線熱膨脹係數。電路基板的線熱膨脹係數測定中可使用的熱機械分析裝置方面,可舉例 如(股)理學製「Thermo Plus TMA8310」、Seiko Instruments(股)製「TMA-SS6100」。 The thermal expansion coefficient of the circuit board is preferably 16 ppm / ° C or less, more preferably 14 ppm / ° C or less, and even more preferably 12 ppm / ° C or less from the viewpoint of suppressing the occurrence of circuit distortion or cracks. Although the lower limit of the thermal expansion coefficient of the circuit board also varies depending on the composition of the resin composition used in the formation of the solder resist layer, it is preferably -2 ppm / ° C or more, more preferably 0 ppm / ° C or more, and even more preferably 4 ppm / ° C. the above. In the present invention, the thermal expansion coefficient of the circuit substrate is a linear thermal expansion coefficient in the plane direction of 25 to 150 ° C. obtained by thermomechanical analysis (TMA) by a tensile weighting method. Examples of thermo-mechanical analysis devices that can be used for measuring the linear thermal expansion coefficient of circuit boards For example, "Thermo Plus TMA8310" manufactured by Rigaku and "TMA-SS6100" manufactured by Seiko Instruments.

電路基板的彎曲彈性率,並無特別限定。本發明中,不管電路基板的彎曲彈性率,係可抑制實裝步驟中之翹曲。 The flexural modulus of the circuit board is not particularly limited. In the present invention, it is possible to suppress warpage in the mounting step regardless of the bending elasticity of the circuit board.

電路基板與第1樹脂薄片之積層,例如,可藉由自第1支持體側將第1樹脂薄片加熱壓著於電路基板來進行。將第1樹脂薄片加熱壓著於電路基板之構件(以下,亦稱為「加熱壓著構件」)方面,可舉例如經加熱之金屬板(SUS鏡板等)或金屬輥(SUS輥)等。此外,並非是將加熱壓著構件直接加壓於第1樹脂薄片上,而是於起因於電路基板表面電路凹凸上,介由耐熱橡膠等之彈性材而使第1樹脂薄片充分地追隨而予以加壓者為佳。 The lamination of the circuit board and the first resin sheet can be performed, for example, by heating and pressing the first resin sheet onto the circuit board from the first support side. As a member for heating and pressing the first resin sheet onto a circuit board (hereinafter, also referred to as a "heating and pressing member"), for example, a heated metal plate (SUS mirror plate, etc.) or a metal roller (SUS roller). In addition, the first resin sheet is not directly pressed against the first resin sheet, but is caused by the unevenness of the circuit on the surface of the circuit board. The first resin sheet is sufficiently followed by an elastic material such as heat-resistant rubber. Pressure is better.

加熱壓著溫度,較佳為80℃~160℃、更佳為100℃~140℃的範圍,加熱壓著壓力,較佳為0.098MPa~1.77MPa、更佳為0.29MPa~1.47MPa的範圍,加熱壓著時間,較佳為20秒鐘~400秒鐘、更佳為30秒鐘~300秒鐘的範圍。積層,較佳係以於壓力26.7hPa以下的減壓條件下實施。 The heating and pressing temperature is preferably in the range of 80 ° C to 160 ° C, more preferably in the range of 100 ° C to 140 ° C, and the heating and pressing pressure is preferably in the range of 0.098MPa to 1.77MPa and more preferably in the range of 0.29MPa to 1.47MPa The heating and pressing time is preferably in the range of 20 seconds to 400 seconds, and more preferably 30 seconds to 300 seconds. The lamination is preferably carried out under a reduced pressure of a pressure of 26.7 hPa or less.

積層係可透過市售的真空積層機來進行。市售的真空積層機方面,可舉例如(股)名機製作所製的真空加壓式積層機、Nichigo-Morton(股)製的真空施用器(vacuum applicator)等。 Lamination can be performed by a commercially available vacuum laminator. Commercially available vacuum laminators include, for example, a vacuum pressurized laminator manufactured by Nagaku Seisakusho, a vacuum applicator made by Nichigo-Morton, and the like.

積層之後,常壓下(大氣壓下),例如,藉 由將加熱壓著構件自第1支持體側加壓來進行經積層之第1接著薄片的平滑化處理。平滑化處理的加壓條件係可為與上述積層的加熱壓著條件同樣的條件。平滑化處理可藉由市售的積層機來實施。此外,積層與平滑化處理,亦可使用上述的市售的真空積層機連續性進行。 After lamination, at atmospheric pressure (atmospheric pressure), for example, by The heat-pressing member is pressed from the first support side to smooth the first laminated sheet after lamination. The pressing conditions for the smoothing treatment may be the same conditions as those for the heat-pressing conditions of the laminate. The smoothing process can be performed by a commercially available laminator. The lamination and smoothing treatment can also be performed continuously using the above-mentioned commercially available vacuum laminator.

-步驟(II)- -Step (II)-

步驟(II)中,係於電路基板的第2主面,將包含第2支持體及與該第2支持體接合之第2樹脂組成物層的第2樹脂薄片,以第2樹脂組成物層與電路基板的第2主面接合之方式進行積層。 In step (II), the second resin sheet including the second support and the second resin composition layer bonded to the second support is attached to the second main surface of the circuit board, and the second resin composition layer is used. Lamination is performed so as to be bonded to the second main surface of the circuit board.

步驟(II)中,使用的第2樹脂薄片係如上述〔印刷配線板的阻焊劑層用樹脂薄片組〕中所載。 The second resin sheet used in step (II) is as described in the above [Resin sheet group for solder resist layer of printed wiring board].

電路基板與第2樹脂薄片的積層,係可與步驟(I)同樣地實施。電路基板與第2樹脂薄片的積層之後,可將步驟(I)中已說明的平滑化處理實施於第2樹脂薄片中。 The lamination of the circuit board and the second resin sheet can be performed in the same manner as in step (I). After the circuit substrate and the second resin sheet are laminated, the smoothing process described in step (I) may be performed on the second resin sheet.

步驟(I)與步驟(II),係可使用市售的真空積層機而同時實施。 Step (I) and step (II) can be performed simultaneously using a commercially available vacuum laminator.

第1及第2支持體可於步驟(III)之前去除。或,第1及第2支持體亦可於步驟(III)之後去除(使用熱硬化性樹脂組成物層的情況),亦可於步驟(III)之間去除(使用光硬化性樹脂組成物層的情況)。 The first and second supports can be removed before step (III). Alternatively, the first and second supports may be removed after step (III) (when using a thermosetting resin composition layer), or may be removed between steps (III) (using a photocurable resin composition layer) Case).

-步驟(III)- -Step (III)-

步驟(III)中,使第1及第2樹脂組成物層硬化而形成第1及第2阻焊劑層。 In step (III), the first and second resin composition layers are hardened to form the first and second solder resist layers.

樹脂組成物層的硬化條件並無特別限定,使用形成印刷配線板的阻焊劑層時一般所採用的條件即可。 The hardening conditions of the resin composition layer are not particularly limited, and the conditions generally used when forming a solder resist layer of a printed wiring board may be used.

第1及第2樹脂組成物層的至少一方為熱硬化性樹脂組成物層時,步驟(III)包含使熱硬化性樹脂組成物層熱硬化而形成阻焊劑層。 When at least one of the first and second resin composition layers is a thermosetting resin composition layer, step (III) includes thermally curing the thermosetting resin composition layer to form a solder resist layer.

熱硬化之條件,會因熱硬化性樹脂組成物層中所用樹脂組成物的組成等而異,硬化溫度為120℃~240℃的範圍(較佳為150℃~210℃的範圍、更佳為170℃~190℃的範圍)、硬化時間為5分鐘~150分鐘的範圍(較佳為10分鐘~120分鐘、更佳為15分鐘~90分鐘)。熱硬化係以於大氣壓下(常壓下)進行者佳。此外,熱硬化可實施複數次。例如,可於後述步驟(IV)之前實施步驟(III)複數次,可於後述步驟(IV)之前實施1次以上的步驟(III),再於步驟(IV)及(V)之後,實施1次以上的熱硬化。熱硬化實施n次時,前述「硬化後的彈性率」表示實施了n次熱硬化後的彈性率。 The conditions for heat curing vary depending on the composition of the resin composition used in the thermosetting resin composition layer, and the curing temperature is in the range of 120 ° C to 240 ° C (preferably in the range of 150 ° C to 210 ° C, more preferably) A range of 170 ° C to 190 ° C) and a curing time in a range of 5 minutes to 150 minutes (preferably 10 minutes to 120 minutes, and more preferably 15 minutes to 90 minutes). The heat curing is preferably performed at atmospheric pressure (under normal pressure). In addition, heat curing may be performed a plurality of times. For example, step (III) may be performed a plurality of times before step (IV) described later, step (III) may be performed more than once before step (IV) described later, and then after step (IV) and (V), 1 may be performed. More than two times of heat curing. When the heat curing is performed n times, the "elasticity after hardening" refers to the elastic modulus after n times of heat curing.

第1及第2樹脂組成物層的至少一方為光硬化性樹脂組成物層時,步驟(III)包含將光硬化性樹脂組成物層予以曝光、顯像、烘烤而形成阻焊劑層。 When at least one of the first and second resin composition layers is a photocurable resin composition layer, step (III) includes exposing, developing, and baking the photocurable resin composition layer to form a solder resist layer.

光硬化性樹脂組成物層的曝光,例如,可使用遮罩圖型對光硬化性樹脂組成物層的既定部分照射活性 光線來實施。藉此,可使照射部的光硬化性樹脂組成物光硬化。活性光線方面,可舉例如紫外線、可見光線、電子線、X線等,特別以紫外線為佳。紫外線的照射量並無特別限定,可為使用光硬化性樹脂組成物而形成阻焊劑層時一般所使用的範圍,但較佳為10mJ/cm2~1000mJ/cm2。光硬化性樹脂組成物層上存在支持體時,可自支持體上曝光。 The exposure of the photocurable resin composition layer can be performed by irradiating a predetermined portion of the photocurable resin composition layer with active light using a mask pattern, for example. Thereby, the photocurable resin composition of an irradiation part can be photocured. As for the active light, for example, ultraviolet rays, visible rays, electron rays, X-rays, and the like are particularly preferred. The amount of ultraviolet radiation is not particularly limited, and may be a range generally used when forming a solder resist layer using a photocurable resin composition, but it is preferably 10 mJ / cm 2 to 1000 mJ / cm 2 . When a support is present on the photocurable resin composition layer, it can be exposed from the support.

顯像係使用顯像液,亦可去除未經光硬化的部分(未曝光部)後予以實施。藉此,可形成所期望的圖型。此外,若光硬化性樹脂組成物層上存在支持體時,可將該支持體去除之後進行顯像即可。顯像液方面,係以鹼性顯像液為佳,可舉例如碳酸鈉水溶液、氫氧化鈉水溶液。顯像方法方面,可舉例如噴霧、搖動浸漬、擦刷、刮削等。 The developing system uses a developing solution, and can also be carried out by removing the uncured portion (unexposed portion). Thereby, a desired pattern can be formed. If a support is present on the photocurable resin composition layer, the support may be removed and then developed. As the developing solution, an alkaline developing solution is preferred, and examples thereof include an aqueous solution of sodium carbonate and an aqueous solution of sodium hydroxide. As the development method, for example, spraying, shaking dipping, brushing, scraping, and the like can be mentioned.

烘烤之條件雖因光硬化性樹脂組成物層中所用之樹脂組成物的組成等而異,但烘烤溫度可為120℃~240℃的範圍(較佳為150℃~210℃的範圍、更佳為170℃~190℃的範圍)、烘烤時間可為5分鐘~150分鐘的範圍(較佳為10分鐘~120分鐘、更佳為15分鐘~90分鐘)。烘烤係以於大氣壓下(常壓下)進行為佳。此外,烘烤可實施複數次。烘烤實施n次時,前述的「硬化後的彈性率」表示實施了n次烘烤之後的彈性率。 The baking conditions vary depending on the composition of the resin composition used in the photocurable resin composition layer, but the baking temperature may be in the range of 120 ° C to 240 ° C (preferably in the range of 150 ° C to 210 ° C, The range is more preferably 170 ° C to 190 ° C), and the baking time may be in the range of 5 minutes to 150 minutes (preferably 10 minutes to 120 minutes, and more preferably 15 minutes to 90 minutes). The baking is preferably performed at atmospheric pressure (under normal pressure). In addition, baking may be performed multiple times. When the baking is performed n times, the aforementioned "elasticity rate after hardening" refers to the elasticity rate after n times of baking.

第1及第2樹脂組成物層的一側為熱硬化性樹脂組成物層、另一側為光硬化性樹脂組成物層時,對光 硬化性樹脂組成物層實施烘烤,係可與熱硬化性樹脂組成物層的熱硬化同時實施。 When one side of the first and second resin composition layers is a thermosetting resin composition layer and the other side is a photocurable resin composition layer, The curing of the curable resin composition layer can be performed simultaneously with the thermal curing of the thermosetting resin composition layer.

藉由使用本發明之樹脂薄片組來實施步驟(I)~(III),可簡單地製造滿足上述的條件(1)、(2)及(3)的印刷配線板。 By performing the steps (I) to (III) using the resin sheet group of the present invention, a printed wiring board that satisfies the conditions (1), (2), and (3) described above can be easily manufactured.

-其他的步驟- -Other steps-

印刷配線板的製造方法,可進一步包含(IV)形成開口部之步驟、(V)無電鍍銅處理之步驟。此等之步驟(IV)及(V)係用於印刷配線板的製造,並可依熟知該領域之業者所習知的各種方法來實施。此外,將第1及第2支持體於步驟(III)之後剝離時(使用熱硬化性樹脂組成物層的情況),該第1及第2支持體之剝離係可於步驟(III)與步驟(IV)之間、步驟(IV)與步驟(V)之間、或步驟(V)之後實施。 The method for manufacturing a printed wiring board may further include (IV) a step of forming an opening, and (V) a step of electroless copper plating. These steps (IV) and (V) are used for the manufacture of printed wiring boards, and can be carried out according to various methods known to those skilled in the art. In addition, when the first and second supports are peeled after step (III) (in the case of using a thermosetting resin composition layer), the peeling of the first and second supports can be performed in steps (III) and steps. (IV), between step (IV) and step (V), or after step (V).

步驟(IV)係形成開口部之步驟。藉此,可於於使用熱硬化性樹脂組成物所形成的阻焊劑層上形成開口部。此外,如有需要,為了於使用光硬化性樹脂組成物所形成的阻焊劑層上形成開口部,亦可實施步驟(IV)。步驟(IV)乃是因應構成阻焊劑層之樹脂組成物的組成等,可使用例如鑽孔、雷射、電漿等來實施。開口部的尺寸或形狀係可視零件實裝基板(亦稱為「半導體裝置」)的設計來適當決定。 Step (IV) is a step of forming an opening. Thereby, an opening can be formed in the solder resist layer formed using the thermosetting resin composition. In addition, if necessary, step (IV) may be performed in order to form an opening in the solder resist layer formed using the photocurable resin composition. Step (IV) is performed according to the composition of the resin composition constituting the solder resist layer, and can be performed using, for example, drilling, laser, or plasma. The size or shape of the opening is appropriately determined depending on the design of the component mounting substrate (also referred to as "semiconductor device").

以雷射來形成開口部時,雷射光源方面,可 舉例如碳酸氣體雷射、YAG雷射、準分子雷射等。其中,更以加工速度、成本之觀點來看,,係以碳酸氣體雷射為佳。 When the opening is formed by a laser, Examples include carbon dioxide gas lasers, YAG lasers, excimer lasers, and the like. Among them, in terms of processing speed and cost, carbon dioxide gas laser is preferred.

步驟(V)是無電鍍銅處理之步驟。步驟(IV)中,於所形成之開口部內部,一般乃附著著樹脂殘渣(污斑)。該污斑會成為電氣接續不良的原因,因此,步驟(V)中,乃實施去除污斑之處理(無電鍍銅處理)。 Step (V) is a step of electroless copper plating. In the step (IV), a resin residue (smudge) is generally attached inside the formed opening. This stain may cause a poor electrical connection. Therefore, in step (V), a stain removal treatment (electroless copper plating treatment) is performed.

無電鍍銅處理,係可組合乾式無電鍍銅處理、濕式無電鍍銅處理或此等之組合來實施。 The electroless copper plating treatment can be implemented by combining dry electroless copper plating treatment, wet electroless copper plating treatment, or a combination thereof.

乾式無電鍍銅處理方面,可舉例如使用電漿之無電鍍銅處理等。使用電漿的無電鍍銅處理係可使用市售的電漿無電鍍銅處理裝置來實施。市售的電漿無電鍍銅處理裝置之中,更以在印刷配線板的製造用途上的較佳例,可舉出(股)Nissin製的微波電漿裝置、積水化學工業(股)製的常壓電漿蝕刻裝置等。 As for the dry-type electroless copper treatment, for example, electroless copper treatment using a plasma can be mentioned. The electroless copper electroplating treatment system using a plasma can be implemented using a commercially available electroless copper electroplating treatment apparatus. Among the commercially available plasma electroless copper treatment devices, more preferable examples of the manufacturing use of printed wiring boards include microwave plasma devices manufactured by Nissin and products manufactured by Sekisui Chemical Industry Co., Ltd. Normal piezoelectric slurry etching equipment.

濕式無電鍍銅處理方面,可舉例如使用氧化劑溶液之無電鍍銅處理等。使用氧化劑溶液來進行無電鍍銅處理時,係以依序進行以膨潤液之膨潤處理、以氧化劑溶液之氧化處理、以中和液之中和處理者為佳。膨潤液方面,可舉例如ATOTECH JAPAN(股)製的「Swelling Dip Securiganth P」、「Swelling Dip Securiganth SBU」等。膨潤處理乃是將形成有開口部的基板加熱至60℃~80℃,浸漬於膨潤液5分鐘~10分鐘來進行者為佳。氧化劑 溶液方面,係以鹼性過錳酸水溶液為佳,可舉例如在氫氧化鈉之水溶液中溶解了過錳酸鉀、過錳酸鈉之溶液。以氧化劑溶液所為的氧化處理,乃是藉由將膨潤處理後的基板浸漬於加熱至60℃~80℃之氧化劑溶液中10分鐘~30分鐘來進行者為佳。鹼性過錳酸水溶液的市售品方面,可舉例如ATOTECH JAPAN(股)製的「Concentrate Compact CP」、「Dosing Solution Securiganth P」等。以中和液所為的中和處理,乃是藉由將氧化處理後的基板浸漬於30℃~50℃的中和液中3分鐘~10分鐘來進行者為佳。中和液方面,係以酸性的水溶液為佳,市售品方面,可舉例如ATOTECH JAPAN(股)製的「Reduction Solution Securiganth P」。 For the wet electroless copper plating treatment, for example, an electroless copper plating treatment using an oxidizing agent solution can be mentioned. When using an oxidant solution to perform electroless copper plating, it is preferable to perform a swelling treatment with a swelling solution, an oxidation treatment with an oxidant solution, and a neutralization treatment in order. As for the swelling liquid, for example, "Swelling Dip Securiganth P" and "Swelling Dip Securiganth SBU" manufactured by ATOTECH JAPAN (stock) are mentioned. The swelling treatment is preferably performed by heating the substrate on which the openings are formed to 60 ° C to 80 ° C, and immersing the substrate in a swelling liquid for 5 to 10 minutes. Oxidant As the solution, an alkaline aqueous solution of permanganic acid is preferable, and for example, a solution in which potassium permanganate and sodium permanganate are dissolved in an aqueous solution of sodium hydroxide. The oxidation treatment using the oxidant solution is preferably performed by immersing the substrate after swelling treatment in an oxidant solution heated to 60 ° C to 80 ° C for 10 minutes to 30 minutes. Examples of commercially available products of the alkaline permanganic acid aqueous solution include "Concentrate Compact CP" and "Dosing Solution Securiganth P" manufactured by ATOTECH Japan. The neutralization treatment with the neutralization solution is preferably performed by immersing the substrate after the oxidation treatment in a neutralization solution at 30 ° C to 50 ° C for 3 minutes to 10 minutes. As the neutralizing solution, an acidic aqueous solution is preferred. For commercially available products, for example, "Reduction Solution Securiganth P" manufactured by ATOTECH JAPAN is available.

組合乾式無電鍍銅處理與濕式無電鍍銅處理來實施時,可先實施乾式無電鍍銅處理,亦可先實施濕式無電鍍銅處理。 When the combination of dry electroless copper plating and wet electroless copper plating is implemented, the dry electroless copper plating may be performed first, or the wet electroless copper plating may be performed first.

以上,雖說明了使用本發明之樹脂薄片組來製造印刷配線板之方法,但只要是可獲得滿足上述的條件(1)、(2)及(3)之印刷配線板,製造本發明之印刷配線板之方法並無特別限定。例如,可於電路基板的兩面塗佈樹脂組成物的塗漆,使其乾燥、硬化來製造印刷配線板。 Although the method of manufacturing a printed wiring board using the resin sheet set of the present invention has been described above, as long as a printed wiring board that satisfies the conditions (1), (2), and (3) described above can be obtained, the printing of the present invention is manufactured. The method of the wiring board is not particularly limited. For example, a printed circuit board can be manufactured by applying a coating of a resin composition to both surfaces of a circuit board, drying and curing the same.

[半導體裝置] [Semiconductor device]

使用本發明之印刷配線板可製造半導體裝置。本發明 之印刷配線板即使是薄型的,在採用高焊料迴流溫度之零件的實裝步驟中,也可以抑制翹曲,有利於減輕電路歪扭或零件的接觸不良等問題。 A semiconductor device can be manufactured using the printed wiring board of the present invention. this invention Even if the printed wiring board is thin, it can suppress warpage during the mounting process of parts with high solder reflow temperature, which is helpful to reduce problems such as circuit distortion or poor contact of parts.

半導體裝置方面,可舉出供電氣製品(例如,電腦、行動電話、數位相機及電視等)及交通工具(例如,自動二輪車、汽車、電車、船舶及飛機等)等之各種半導體裝置。 Examples of the semiconductor device include various semiconductor devices such as power supply gas products (for example, computers, mobile phones, digital cameras, and televisions) and vehicles (for example, motorcycles, automobiles, trams, ships, and airplanes).

[實施例] [Example]

以下,藉由實施例以具體地說明本發明,但本發明並不受限於此等之實施例。此外,以下中的「份」及「%」在無其他明確表示的情況下,各自意指「質量份」及「質量%」。 Hereinafter, the present invention will be specifically described by examples, but the present invention is not limited to these examples. In addition, "part" and "%" in the following respectively mean "mass part" and "mass%" unless otherwise clearly indicated.

首先,乃就各種測定方法、評價方法進行說明。 First, various measurement methods and evaluation methods will be described.

[評價用基板的調製] [Preparation of evaluation substrate] (1)電路基板的準備 (1) Preparation of circuit board

將兩面形成有電路之玻璃布基材環氧樹脂兩面積層板以微蝕刻劑(MEC(股)製「CZ8100」)蝕刻1μm,進行表面電路的粗化處理,準備電路基板。兩面形成有電路之玻璃布基材環氧樹脂兩面積層板方面,有關實施例1、2及4和比較例1及2係使用三菱氣體化學(股)製「HL832NSF-LCA」(大小100mm×150mm、厚度100μm、 熱膨脹率4ppm/℃、彎曲彈性率34GPa、表面銅電路的厚度16μm)、實施例3和比較例3及4是使用日立化成工業(股)製「E679FGR」(大小100mm×150mm、厚度200μm、熱膨脹率14ppm/K、彎曲彈性率26GPa、表面銅電路的厚度16μm(實施例3及比較例3)、8μm(比較例4))。 A glass cloth substrate epoxy resin two-area laminate on which circuits were formed on both sides was etched with a micro etchant ("CZ8100" made by MEC (strand)) for 1 µm, and a surface circuit was roughened to prepare a circuit board. For glass cloth substrate epoxy resin two-area laminates with circuits formed on both sides, Examples 1, 2 and 4 and Comparative Examples 1 and 2 use "HL832NSF-LCA" (size 100mm x 150mm) manufactured by Mitsubishi Gas Chemical Co., Ltd. , Thickness 100μm, The thermal expansion coefficient is 4 ppm / ° C, the flexural modulus is 34 GPa, and the thickness of the surface copper circuit is 16 μm.) Example 3 and Comparative Examples 3 and 4 use "E679FGR" (size 100 mm x 150 mm, thickness 200 μm, thermal expansion) manufactured by Hitachi Chemical Industries, Ltd. The rate was 14 ppm / K, the flexural modulus was 26 GPa, and the thickness of the surface copper circuit was 16 μm (Example 3 and Comparative Example 3), 8 μm (Comparative Example 4)).

(2)樹脂薄片的積層 (2) Lamination of resin sheet

於上述(1)得知之電路基板,係於下述製作例中乃將已製作之樹脂薄片,使用批次式真空加壓積層機(Nichigo-Morton(股)製的2 stage build-up laminator「CVP700」)而以樹脂組成物層與電路基板接著之方式,積層於電路基板的兩面。積層經30秒鐘減壓並使氣壓為13hPa以下後,實施以100℃、壓力0.74MPa使其壓著30秒鐘。接著,於常壓下、100℃、壓力0.5MPa熱加壓60秒鐘進行平滑化處理。 The circuit board obtained in the above (1) is a resin vacuum sheet lamination machine (2 stage build-up laminator made by Nichigo-Morton Co., Ltd.) in the following production example. CVP700 ") and the resin composition layer and the circuit substrate are bonded to each other on both sides of the circuit substrate. After the laminate was decompressed for 30 seconds and the air pressure was 13 hPa or less, it was pressed at 100 ° C and a pressure of 0.74 MPa for 30 seconds. Next, a smoothing treatment was performed by hot pressing under normal pressure at 100 ° C. and a pressure of 0.5 MPa for 60 seconds.

此外,於電路基板的兩面積層之第1及第2樹脂薄片的組合係如表1所示。 In addition, the combination of the first and second resin sheets on the two area layers of the circuit board is shown in Table 1.

接著,如以下所述,使樹脂組成物層硬化而形成阻焊劑層。 Next, as described below, the resin composition layer is cured to form a solder resist layer.

-使用含熱硬化性樹脂組成物層之樹脂薄片1及2的情況-(3)樹脂組成物層的熱硬化 -When using resin sheets 1 and 2 containing a thermosetting resin composition layer-(3) Thermal curing of the resin composition layer

自上述(2)所得之基板剝離支持體。接著,在180 ℃、30分鐘之硬化條件下使樹脂組成物層熱硬化形成阻焊劑層。 The support was peeled from the substrate obtained in the above (2). Then, at 180 The resin composition layer was thermally hardened at a temperature of 30 ° C for 30 minutes to form a solder resist layer.

(4)開口部的形成 (4) Formation of openings

使用CO2雷射加工機(三菱電機(股)製「ML605GTWIII-5200U」),以下述條件1形成開口徑60μm之圓孔、以下述條件2形成開口徑500μm之圓孔。 Using a CO 2 laser processing machine ("ML605GTWIII-5200U" manufactured by Mitsubishi Electric Corporation), circular holes having an opening diameter of 60 μm were formed under the following condition 1 and circular holes having an opening diameter of 500 μm were formed under the following condition 2.

條件1:遮罩徑0.9mm、脈衝寬幅19μs、能量0.24mJ、拍攝數2、脈衝間歇模式 Condition 1: mask diameter 0.9mm, pulse width 19μs, energy 0.24mJ, number of shots 2, pulse intermittent mode

條件2:遮罩徑10mm、脈衝寬幅15μs、能量18mJ、拍攝數4、脈衝間歇模式 Condition 2: Mask diameter 10mm, pulse width 15μs, energy 18mJ, number of shots 4, pulse intermittent mode

(5)無電鍍銅處理 (5) Electroless copper treatment

開口部的形成後,將電路基板浸漬於膨潤液(ATOTECH JAPAN(股)製「Swelling Dip Securiganth P」、含二乙二醇單丁基醚及氫氧化鈉之水溶液)60℃、5分鐘,浸漬於氧化劑溶液(ATOTECH JAPAN(股)製「Concentrate Compact CP」、KMnO4:60g/L、NaOH:40g/L之水溶液)80℃、10分鐘,最後是中和液(ATOTECH JAPAN(股)製「Reduction Solution Securiganth P」、硫酸羥基胺水溶液)40℃、5分鐘。之後,於100℃乾燥30分鐘,接著使其進一步於180℃熱硬化,製作評價基板。 After the openings were formed, the circuit board was immersed in a swelling liquid ("Swelling Dip Securiganth P" manufactured by ATOTECH JAPAN Co., Ltd., an aqueous solution containing diethylene glycol monobutyl ether and sodium hydroxide) at 60 ° C for 5 minutes, and immersed In an oxidant solution ("Concentrate Compact CP" manufactured by ATOTECH JAPAN), KMnO 4 : 60 g / L, NaOH: 40 g / L aqueous solution at 80 ° C for 10 minutes, and finally a neutralizing solution (ATOTECH JAPAN (stock) " Reduction Solution Securiganth P ", aqueous hydroxylamine sulfate solution) at 40 ° C for 5 minutes. Then, it dried at 100 degreeC for 30 minutes, and was made to heat-harden further at 180 degreeC, and the evaluation board | substrate was produced.

-使用含光硬化性樹脂組成物層之樹脂薄片3、4及5的情況- -When using resin sheets 3, 4 and 5 containing a photocurable resin composition layer- (3’)樹脂組成物層的曝光、顯像及烘烤 (3 ') Exposure, development, and baking of the resin composition layer

將上述(2)所得之基板靜置於室溫1小時。之後,使用遮罩圖型,以可形成開口徑60μm與500μm之圓孔之方式,自支持體上曝光100mJ/cm2之紫外線。曝光係使用圖型形成裝置(USHIO電機(股)製「UX-2240」)予以實施。接著,在室溫下靜置30分鐘,將支持體剝離。 The substrate obtained in (2) above was allowed to stand at room temperature for 1 hour. Then, using a mask pattern, 100 mJ / cm 2 of ultraviolet light was exposed from the support in such a manner that circular holes having an opening diameter of 60 μm and 500 μm can be formed. The exposure was performed using a pattern forming device ("UX-2240" manufactured by USHIO Electric Co., Ltd.). Then, it stood still at room temperature for 30 minutes, and the support was peeled.

就所得之基板,於樹脂組成物層的全面上,將顯像液(30℃之2質量%氫氧化鈉水溶液)以噴霧壓0.2MPa噴霧40秒鐘予以顯像。此外,有關使用樹脂薄片4之比較例2,在顯像液方面係使用30℃、1質量%碳酸鈉水溶液。 With respect to the obtained substrate, a developing solution (a 2% by mass sodium hydroxide aqueous solution at 30 ° C) was sprayed on the entire surface of the resin composition layer at a spray pressure of 0.2 MPa for 40 seconds for development. In Comparative Example 2 using the resin sheet 4, a 30 ° C, 1% by mass sodium carbonate aqueous solution was used for the developing solution.

顯像之後,在80℃乾燥30分鐘,接著於180℃烘烤90分鐘,得到評價基板。 After development, it was dried at 80 ° C for 30 minutes, and then baked at 180 ° C for 90 minutes to obtain an evaluation substrate.

[評價用硬化物的調製] [Preparation of hardened material for evaluation]

評價用硬化物係以下述流程步驟調製。 The hardened | cured material for evaluation was prepared by the following procedure.

-使用含熱硬化性樹脂組成物層樹脂薄片1及2的情況- -When using thermosetting resin composition layer-containing resin sheets 1 and 2-

將樹脂薄片1及2之樹脂組成物層以與附離型層之PET薄膜(LINTEC(股)製「PET501010」;以下亦稱為「評價用支持體」)之離型面相接的方式進行配置,使用真空積層機(Nichigo-Morton(股)製「VP160」)予以 積層。積層條件係抽真空20秒鐘、壓著溫度80℃、壓著壓力0.2MPa、加壓時間20秒鐘。 The resin composition layers of the resin sheets 1 and 2 were contacted with the release surface of a PET film with a release layer ("PET501010" manufactured by LINTEC Corporation; hereinafter also referred to as "evaluation support"). Placed using a vacuum laminator ("VP160" manufactured by Nichigo-Morton Co., Ltd.) Build up. The lamination conditions were a vacuum for 20 seconds, a pressing temperature of 80 ° C, a pressing pressure of 0.2 MPa, and a pressing time of 20 seconds.

自所得之積層體剝離來自樹脂薄片之支持體後,以180℃、90分鐘之硬化條件使樹脂組成物層熱硬化。接著,剝離評價用支持體,得到評價用硬化物。 After the support from the resin sheet was peeled from the obtained laminate, the resin composition layer was thermally cured under a curing condition of 180 ° C. for 90 minutes. Then, the support for evaluation was peeled, and the hardened | cured material for evaluation was obtained.

-使用含光硬化性樹脂組成物層之樹脂薄片3、4及5的情況- -When using resin sheets 3, 4 and 5 containing a photocurable resin composition layer-

將樹脂薄片3、4及5之樹脂組成物層與上述〔評價用硬化物的調製1〕同樣地實施,積層於附離型層之PET薄膜(LINTEC(股)製「PET501010」;亦稱為「評價用支持體」)的離型面。 The resin composition layers of the resin sheets 3, 4 and 5 were implemented in the same manner as in the above-mentioned [Preparation of hardened material for evaluation 1], and laminated on a PET film with a release layer ("PET501010" manufactured by LINTEC Corporation); also called "Evaluation support").

將所得之積層體靜置於室溫1小時後,自支持體上對樹脂組成物層曝光100mJ/cm2之紫外線。剝離來自樹脂薄片之支持體後,以80℃、30分鐘接著180℃、90分鐘的烘烤條件處理樹脂組成物層。接著,剝離評價用支持體,得到評價用硬化物。 After the obtained laminated body was allowed to stand at room temperature for 1 hour, the resin composition layer was exposed to ultraviolet rays of 100 mJ / cm 2 from the support. After peeling off the support from the resin sheet, the resin composition layer was treated under baking conditions of 80 ° C, 30 minutes, and 180 ° C, 90 minutes. Then, the support for evaluation was peeled, and the hardened | cured material for evaluation was obtained.

<翹曲之評價> <Evaluation of warpage>

先將評價用基板通過一次再現波峰溫度260℃之焊料迴流溫度的迴流裝置(日本ANTUM(股)製「HAS-6116」)(迴流溫度曲線乃依IPC/JEDEC J-STD-020C為準則)。接著,使用陰影疊紋裝置(Akrometrix製「TherMoire AXP」),以依IPC/JEDEC J-STD-020C (波峰溫度260℃)為準的迴流溫度曲線加熱評價基板下面,基於配置於評價基板上面的格子線,測定評價基板中央之25mm角部分的變位。 First, the substrate for evaluation was passed through a reflow device ("HAS-6116" manufactured by Japan Antum Corporation) at a solder reflow temperature with a peak temperature of 260 ° C (the reflow temperature curve is based on IPC / JEDEC J-STD-020C). Next, a shadow moire device ("TherMoire AXP" by Akrometrix) was used to comply with IPC / JEDEC J-STD-020C The reflow temperature curve based on (peak temperature: 260 ° C) was used to heat the lower surface of the evaluation substrate, and based on the grid lines arranged on the upper surface of the evaluation substrate, the displacement at a 25 mm angle in the center of the evaluation substrate was measured.

所得之變位數據的最大高度與最小高度之差異,令在全溫度範圍下為50μm以上者「×」、若未達50μm則為「○」。 The difference between the maximum height and the minimum height of the obtained displacement data is “×” for 50 μm or more in the entire temperature range, and “○” for less than 50 μm.

<彈性率之測定> <Measurement of elasticity>

將評價用硬化物切出啞鈴狀,得到試驗片。將該試驗片使用ORIENTEC公司製拉伸試驗機「RTC-1250A」進行拉伸強度測定,求得23℃及200℃中的彈性率。測定乃依據JIS K7127來實施。 The hardened body for evaluation was cut out into a dumbbell shape to obtain a test piece. This test piece was measured for tensile strength using a tensile tester "RTC-1250A" manufactured by ORIENTEC Corporation, and the elastic modulus at 23 ° C and 200 ° C was determined. The measurement was performed in accordance with JIS K7127.

<玻璃轉移點溫度(Tg)之測定> <Measurement of glass transition point temperature (Tg)>

將評價用硬化物切成寬幅5mm、長度15mm之試驗片。就該試驗片使用熱機械分析裝置(Seiko Instruments(股)製「TMA-SS6100」),進行以拉伸加重法所為的熱機械分析。詳細而言,係將試驗片裝設於前述裝置之後,以荷重1g、昇溫速度5℃/分之測定條件連續測定2次。第2次測定中,從尺寸變化訊號的斜率變化之點算出玻璃轉移點溫度Tg(℃)。 The cured product for evaluation was cut into a test piece having a width of 5 mm and a length of 15 mm. A thermomechanical analysis device ("TMA-SS6100" manufactured by Seiko Instruments) was used for this test piece, and a thermomechanical analysis by a tensile weight method was performed. Specifically, after the test piece was installed in the aforementioned device, the measurement was performed twice under a measurement condition of a load of 1 g and a temperature increase rate of 5 ° C./min. In the second measurement, the glass transition point temperature Tg (° C) was calculated from the point where the slope of the dimensional change signal changed.

實施例及比較例中使用的樹脂薄片1、2、3、4及5,係以下述流程步驟製作。 The resin sheets 1, 2, 3, 4, and 5 used in the examples and comparative examples were produced by the following procedure.

<製作例1>樹脂薄片1之製作 <Production Example 1> Production of Resin Sheet 1

將雙酚A型環氧樹脂(三菱化學(股)製「jER828EL」、環氧當量約185)12份、萘型環氧樹脂(DIC(股)製「HP4032SS」、環氧當量約144)3份、聯二甲苯酚型環氧樹脂(三菱化學(股)製「YX4000HK」、環氧當量約185)6份、聯苯型環氧樹脂(日本化藥(股)製「NC3000H」、環氧當量約288)25份、苯氧基樹脂(三菱化學(股)製「YX6954BH30」、固形分30質量%之MEK與環己酮的1:1溶液)10份,邊攪拌溶解於溶劑石油腦15份中邊加熱使其溶解。冷卻至室溫為止之後,朝其中,混合含三嗪骨架之苯酚酚醛清漆系硬化劑(DIC(股)製「LA-7054」、羥基當量125、固形分60%之MEK溶液)20份、萘酚系硬化劑(新日鐵住金化學(股)製「SN485」、羥基當量215、固形分60%之MEK溶液)10份、硬化促進劑(4-二甲基胺基吡啶(DMAP)、固形分5質量%之MEK溶液)0.4份、難燃劑(三光(股)製「HCA-HQ」、10-(2,5-二羥基苯基)-10-氫-9-氧雜-10-膦菲-10-氧化物、平均粒徑2μm)3份、以胺基矽烷系耦合劑(信越化學工業(股)製「KBM573」)所表面處理之球狀氧化矽(平均粒徑1μm、(股)Admatechs製「SOC4」、每單位表面積之碳量0.47mg/m2)240份,以高速旋轉攪拌機均一地分散,調製樹脂塗漆1。 12 parts of bisphenol A epoxy resin ("jER828EL" manufactured by Mitsubishi Chemical Corporation, epoxy equivalent of about 185), naphthalene epoxy resin ("HP4032SS" manufactured by DIC (equity), about 144 epoxy equivalent) 3 Parts, bixylenol type epoxy resin ("YX4000HK" manufactured by Mitsubishi Chemical Corporation, epoxy equivalent about 185) 6 parts, biphenyl type epoxy resin ("NC3000H" manufactured by Nippon Kayaku Co., Ltd., epoxy resin Approximately 288) 25 parts, 10 parts of phenoxy resin ("YX6954BH30" manufactured by Mitsubishi Chemical Corporation), 30% by mass of MEK and cyclohexanone in a solid content of 10 parts), dissolved in the solvent petroleum brain 15 while stirring The portion is heated to dissolve. After cooling to room temperature, 20 parts of a phenol novolac hardener ("LA-7054" manufactured by DIC Corporation), a hydroxyl equivalent of 125, and a 60% solids MEK solution were mixed therein, and naphthalene was mixed therein. 10 parts of phenolic hardener ("SN485" manufactured by Nippon Steel & Sumitomo Chemical Co., Ltd., hydroxyl equivalent 215, MEK solution with 60% solids content), hardening accelerator (4-dimethylaminopyridine (DMAP), solid form 0.4 parts by mass of 5% by weight of MEK solution), flame retardant ("HCA-HQ" manufactured by Sanko Co., Ltd., 10- (2,5-dihydroxyphenyl) -10-hydro-9-oxa-10- Phosphaphenanthrene-10-oxide, average particle size 2 μm) 3 parts, spherical silicon oxide (average particle size 1 μm, ( ) 240 parts of "SOC4" manufactured by Admatechs, carbon content per unit surface area of 0.47 mg / m 2 ), 240 parts, and uniformly dispersed with a high-speed rotary mixer to prepare a resin coating 1.

支持體方面,係準備厚度38μm之PET薄膜 (東麗(股)製「NS80A」)。於該支持體的平滑面,均一地塗佈樹脂塗漆1,使乾燥後的樹脂組成物層厚度為16μm,使其於80℃~120℃(平均100℃)乾燥3分鐘,製作樹脂薄片1。 For the support, a PET film with a thickness of 38 μm is prepared (Toray (shares) system "NS80A"). On the smooth surface of the support, a resin paint 1 was uniformly applied, the thickness of the dried resin composition layer was 16 μm, and the resin composition layer was dried at 80 ° C. to 120 ° C. (average 100 ° C.) for 3 minutes to prepare a resin sheet 1. .

<製作例2>樹脂薄片2之製作 <Preparation Example 2> Production of Resin Sheet 2

除了使用苯氧基樹脂(三菱化學(股)製「YX6954BH30」、固形分30質量%之MEK/環己酮=1/1溶液)30份來取代苯氧基樹脂(三菱化學(股)製「YX6954BH30」、固形分30質量%之MEK/環己酮=1/1溶液)10份之點、使用以胺基矽烷系耦合劑(信越化學工業(股)製「KBM573」)所表面處理之球狀氧化矽(平均粒徑0.5μm、(股)Admatechs製「SOC2」、每單位表面積之碳量0.39mg/m2)75份來取代以胺基矽烷系耦合劑(信越化學工業(股)製「KBM573」)所表面處理之球狀氧化矽(平均粒徑1μm、(股)Admatechs製「SOC4」、每單位表面積之碳量0.47mg/m2)240份之點、和將溶劑石油腦的使用量從15份變更為10份之點以外,其餘係與製作例1同樣地實施,調製樹脂塗漆2,並製作樹脂薄片2。 In addition to using 30 parts of a phenoxy resin ("YX6954BH30" manufactured by Mitsubishi Chemical Corporation) and a solid content of 30% by mass of MEK / cyclohexanone = 1/1 solution, the phenoxy resin (manufactured by Mitsubishi Chemical Corporation) YX6954BH30 ", 10 parts of MEK / cyclohexanone = 1/1 solution with a solid content of 30% by mass, using a ball surface-treated with an aminosilane-based coupling agent (" KBM573 "manufactured by Shin-Etsu Chemical Industry Co., Ltd.) 75 parts of silicon oxide (average particle size: 0.5 μm, (SOC2) manufactured by Admatechs, carbon content per unit surface area: 0.39 mg / m 2 ) instead of an aminosilane-based coupling agent (made by Shin-Etsu Chemical Industry Co., Ltd.) "KBM573") 240 points of spherical silica (average particle size 1 μm, "SOC4" manufactured by Admatechs, 0.47 mg / m 2 carbon per unit surface area), and Except for the point where the usage amount was changed from 15 parts to 10 parts, the rest was carried out in the same manner as in Production Example 1, a resin varnish 2 was prepared, and a resin sheet 2 was produced.

<製作例3)>樹脂薄片3之製作 <Production Example 3) Production of Resin Sheet 3

混合聯二甲苯酚型環氧樹脂(三菱化學(股)製「YX4000HK」、環氧當量185、不揮發成分30質量%之 MEK與環己酮的1:1溶液)100份、下述合成例1合成之光硬化型鹼可溶性樹脂A 73份、光聚合起始劑(BASF JAPAN(股)製「OXE-02」、乙酮,1-〔9-乙基-6-(2-甲基苯甲醯基)-9H-咔唑-3-基〕-,1-(0-乙醯基肟)、不揮發成分10質量%之MEK溶液)18份、以胺基矽烷系耦合劑(信越化學工業(股)製「KBM573」)所表面處理之球狀氧化矽(平均粒徑0.5μm、(股)Admatechs製「SOC2」、每單位表面積之碳量0.39mg/m2)120份、以胺基矽烷系耦合劑(信越化學工業(股)製「KBM573」)所表面處理之球狀氧化矽(平均粒徑0.1μm、電氣化學工業(股)製「UFP-30」)20份、稀釋劑(日本化藥(股)製「DPHA」、二季戊四醇六丙烯酸酯)10份、硬化促進劑(四國化成(股)製「2P4MZ」、2-苯基-4-甲基咪唑、不揮發成分2.5質量%之MEK溶液)8.8份、橡膠粒子(GANTSU KASEI(股)製「AC3816N」)2.4份、光增感劑(日本化藥(股)製「DETX-S」、2、4-二乙基硫代基氧雜蒽酮、不揮發成分10質量%之MEK溶液)4.4份、二乙二醇單乙基醚縮醛10份,以高速旋轉攪拌機均一地分散,調製樹脂塗漆3。 100 parts of mixed xylenol-type epoxy resin ("YX4000HK" manufactured by Mitsubishi Chemical Corporation, epoxy equivalent 185, non-volatile content 30% by mass MEK and cyclohexanone) 100 parts, the following synthesis example 1 73 parts of synthetic photocurable alkali-soluble resin A, photopolymerization initiator ("OXE-02" made by BASF JAPAN), ethyl ketone, 1- [9-ethyl-6- (2-methylbenzene Formamyl) -9H-carbazol-3-yl]-, 1- (0-ethylammonium oxime), 18 parts of non-volatile matter in 10% by mass of MEK solution) 18 parts, with an aminosilane-based coupling agent (Shin-Etsu Chemical 120 parts of spherical silicon oxide (average particle size 0.5 μm, (SOC2) manufactured by Admatechs, 0.39 mg / m 2 carbon per unit surface area) surface treated by industrial ("KBM573") 20 parts of spherical silica (average particle size 0.1 μm, "UFP-30" manufactured by Denki Chemical Industry Co., Ltd.), surface-treated spherical silicon oxide based coupling agent ("KBM573" manufactured by Shin-Etsu Chemical Industry Co., Ltd.), thinner (10 parts of `` DPHA '' manufactured by Nippon Kayaku Co., Ltd., dipentaerythritol hexaacrylate), hardening accelerator (2P4MZ manufactured by Shikoku Kasei Co., Ltd., 2-phenyl-4-methylimidazole, non-volatile components 2.5% by mass of MEK solution) 8.8 parts, rubber particles (GA 2.4 parts of "NT38 KASEI (AC3816N)", photosensitizer ("DETX-S", manufactured by Nippon Kayaku Co., Ltd.), 2, 4-diethylthioxanthone, non-volatile content 10 4.4% by mass of MEK solution) and 10 parts of diethylene glycol monoethyl ether acetal were uniformly dispersed with a high-speed rotary mixer to prepare a resin paint 3.

支持體方面,係準備厚度16μm之PET薄膜(三菱樹脂(股)製「R310-16B」)。於該支持體上均一地塗佈樹脂塗漆3以使乾燥後的樹脂組成物層的厚度為23μm,在75℃~120℃(平均100℃)使其乾燥5分鐘,製作樹脂薄片3。 For the support, a PET film with a thickness of 16 μm ("R310-16B" manufactured by Mitsubishi Resin Co., Ltd.) was prepared. A resin varnish 3 was uniformly applied to the support so that the thickness of the dried resin composition layer was 23 μm, and dried at 75 ° C. to 120 ° C. (average 100 ° C.) for 5 minutes to prepare a resin sheet 3.

(合成例1)光硬化型鹼可溶性樹脂A之合成 (Synthesis example 1) Synthesis of photocurable alkali-soluble resin A

於300mL之分離式燒瓶中,量取卡必醇乙酸酯25g、3-異氰酸基-3,5,5-三甲基環己基異氰酸酯(EVONIK(股)製)50g,在40℃加熱攪拌。又,量取季戊四醇三丙烯酸酯含有物(東亞合成(股)製「M306」)92.23g、卡必醇乙酸酯25g、二月桂酸二丁基錫(東京化成工業(股)製)0.45g、氫醌(東京化成工業(股)製)0.4g,以攪拌機((股)THINKY製「泡取練太郎」)混合8分鐘,得到混合液1。將所得的混合液1,使用滴下漏斗,花費1小時以上滴入上述300mL之分離式燒瓶內。之後,以40℃加熱攪拌30分鐘,得到3-異氰酸基-3,5,5-三甲基環己基異氰酸酯與季戊四醇三丙烯酸酯的反應物193.08g。 In a 300 mL separable flask, measure 25 g of carbitol acetate and 50 g of 3-isocyanato-3,5,5-trimethylcyclohexyl isocyanate (manufactured by EVONIK) and heat at 40 ° C. Stir. In addition, 92.23 g of pentaerythritol triacrylate content ("M306" manufactured by Toa Kosei Co., Ltd.), 25 g of carbitol acetate, 0.45 g of dibutyltin dilaurate (manufactured by Tokyo Chemical Industry Co., Ltd.), and hydrogen were measured. 0.4 g of quinone (manufactured by Tokyo Chemical Industry Co., Ltd.) was mixed for 8 minutes with a blender ("Burnori Ritaro" manufactured by THINKY Co., Ltd.) to obtain a mixed solution 1. The obtained mixed liquid 1 was dropped into the above 300 mL separable flask using a dropping funnel over 1 hour. Thereafter, it was heated and stirred at 40 ° C. for 30 minutes to obtain 193.08 g of a reaction product of 3-isocyanato-3,5,5-trimethylcyclohexyl isocyanate and pentaerythritol triacrylate.

另一方面,於500mL之分離式燒瓶中,量取卡必醇乙酸酯132.26g、苯酚酚醛清漆樹脂(DIC(股)製「TD-2090」)132.26g,以75℃攪拌直到完全溶解為止。接著,加入上述反應物193.08g,以IR在85℃加熱攪拌直到異氰酸酯基消失為止。冷卻至40℃之後,加入乙醇(純正化學(股)製)3.11g,再攪拌2小時以上,得到包含丙烯酸酯基與苯酚性羥基之光硬化型鹼可溶性樹脂A(丙烯酸酯變性苯酚樹脂)460.71g。所得之光硬化型鹼可溶性樹脂A的性狀如下。 On the other hand, in a 500 mL separable flask, 132.26 g of carbitol acetate and 132.26 g of phenol novolac resin ("TD-2090" manufactured by DIC Corporation) were measured and stirred at 75 ° C until completely dissolved. . Next, 193.08 g of the above-mentioned reactant was added, and the mixture was heated and stirred at 85 ° C. until the isocyanate group disappeared. After cooling to 40 ° C, 3.11 g of ethanol (manufactured by Pure Chemical Co., Ltd.) was added, and the mixture was stirred for more than 2 hours to obtain a light-curable alkali-soluble resin A (acrylate-modified phenol resin) containing acrylate groups and phenolic hydroxyl groups. 46.71 g. The properties of the obtained photocurable alkali-soluble resin A are as follows.

.固形分60質量%之溶劑溶解品 . 60% by mass of solvent-soluble product

.丙烯酸酯基的比率18% . 18% acrylic group

.聚苯乙烯換算之數平均分子量(Mn):4000 . Polystyrene-equivalent number average molecular weight (Mn): 4000

.羥基當量:246 . Hydroxyl equivalent: 246

<製作例4>樹脂薄片4之製作 <Preparation Example 4> Production of Resin Sheet 4

混合聯二甲苯酚型環氧樹脂(三菱化學(股)製「YX4000HK」、環氧當量185、不揮發成分30質量%之MEK與環己酮的1:1溶液)80份、含丙烯酸酯基與羧基之光硬化型鹼可溶性樹脂(日本化藥(股)製「ZFR-1533H」、雙酚F型環氧丙烯酸酯、固形分68%之二乙二醇單乙基醚乙酸酯溶液、酸價70mgKOH/g)147份、光聚合起始劑(BASF JAPAN(股)製「IRGACURE 907」、2-甲基-〔4-(甲基硫代基)苯基〕嗎啉基-1-丙酮)2.5份、以胺基矽烷系耦合劑(信越化學工業(股)製「KBM573」)所表面處理之球狀氧化矽(平均粒徑0.5μm、(股)Admatechs製「SOC2」、每單位表面積之碳量0.39mg/m2)80份、以胺基矽烷系耦合劑(信越化學工業(股)製「KBM573」)所表面處理之球形氧化矽(平均粒徑0.1μm、電氣化學工業(股)製「UFP-30」)20份、稀釋劑(共榮社化學工業(股)製「DCPA」、三環癸烷二甲醇二丙烯酸酯)10份、硬化促進劑(四國化成(股)製「2P4MZ」、2-苯基-4-甲基咪唑、不揮發成分2.5質量%之MEK溶液)8.8份、橡膠粒子(GANTSU KASEI(股)製「AC3816N」)2.4份、光增感劑(日本 化藥(股)製「DETX-S」、2、4-二乙基硫代基氧雜蒽酮、不揮發成分10質量%之MEK溶液)2份、二乙二醇單乙基醚縮醛(有機溶劑)3份,以高速旋轉攪拌機均一地分散,調製樹脂塗漆4。 80 parts of mixed xylenol-type epoxy resin ("YX4000HK" manufactured by Mitsubishi Chemical Corporation, epoxy equivalent 185, non-volatile content 30% by mass of MEK and cyclohexanone), acrylate group-containing Photocurable alkali-soluble resin with carboxyl group ("ZFR-1533H" manufactured by Nippon Kayaku Co., Ltd., bisphenol F-type epoxy acrylate, diethylene glycol monoethyl ether acetate solution with a solid content of 68%, Acid value 70mgKOH / g) 147 parts, photopolymerization initiator ("IRGACURE 907" made by BASF JAPAN), 2-methyl- [4- (methylthio) phenyl] morpholinyl-1- Acetone) 2.5 parts, spherical silicon oxide (average particle diameter 0.5 μm, (share) Admatechs SOC2), surface treated with amine-based silane coupling agent ("KBM573" manufactured by Shin-Etsu Chemical Co., Ltd.), per unit Surface area carbon content 0.39mg / m 2 ) 80 parts, spherical silicon oxide (average particle size 0.1 μm, electrical chemical industry ( 20 parts of `` UFP-30 ''), thinner (`` DCPA '' made by Kyoeisha Chemical Industry Co., Ltd., tricyclodecane dimethanol diacrylate) 10 parts, hardening accelerator (Shikoku Chemical Co., Ltd. ) System "2 `` P4MZ '', 2.8 parts of 2-phenyl-4-methylimidazole, 2.5% by mass of non-volatile MEK solution), 2.4 parts of rubber particles (`` AC3816N '' manufactured by GANTSU KASEI Co., Ltd.), photosensitizer (Japanese version) 2 parts of "DETX-S" made by pharmaceutical (stock), 2,4-diethylthioxanthone, MEK solution with 10% by mass of non-volatile content), diethylene glycol monoethyl ether acetal ( Organic solvent) 3 parts, and uniformly dispersed with a high-speed rotary mixer to prepare a resin coating 4.

支持體方面,係準備厚度16μm之PET薄膜(三菱樹脂(股)製「R310-16B」)。於該支持體上均一地塗佈樹脂塗漆4使乾燥後的樹脂組成物層的厚度為23μm,在75℃~120℃(平均100℃)使其乾燥5分鐘,製作樹脂薄片4。 For the support, a PET film with a thickness of 16 μm ("R310-16B" manufactured by Mitsubishi Resin Co., Ltd.) was prepared. A resin varnish 4 was uniformly applied to the support so that the thickness of the dried resin composition layer was 23 μm, and dried at 75 ° C. to 120 ° C. (average 100 ° C.) for 5 minutes to prepare a resin sheet 4.

<製作例5>樹脂薄片5之製作 <Production Example 5> Production of Resin Sheet 5

除了均一地塗佈樹脂塗漆3使乾燥後的樹脂組成物層的厚度為8μm,並在75~120℃(平均100℃)使其乾燥2分鐘以外,其餘係與製作例3同樣地實施,製作樹脂薄片5。 Except that the resin paint 3 was uniformly applied so that the thickness of the dried resin composition layer was 8 μm, and the resin composition layer was dried at 75 to 120 ° C. (average 100 ° C.) for 2 minutes, the rest was implemented in the same manner as in Production Example 3. Manufacture resin sheet 5.

將所得之樹脂薄片1~5如下述表1所示般予以組合,準備樹脂薄片組1~6。又,就各樹脂薄片組中所使用的樹脂薄片1~5,乃遵照上述〔評價用硬化物的調製〕調製評價用硬化物,測定彈性率、玻璃轉移溫度(Tg)。將結果一併顯示於表1。 The obtained resin sheets 1 to 5 were combined as shown in Table 1 below to prepare resin sheet groups 1 to 6. In addition, the resin flakes 1 to 5 used in each resin flake group were prepared in accordance with the above-mentioned [Preparation of hardened material for evaluation], and measured the elastic modulus and glass transition temperature (Tg). The results are shown in Table 1 together.

<實施例1> <Example 1>

使用樹脂薄片組1,依上述〔評價用基板的調製〕得到評價用基板。將評價結果顯示於表2。 Using the resin sheet group 1, the evaluation substrate was obtained in accordance with the above-mentioned [Preparation of the evaluation substrate]. The evaluation results are shown in Table 2.

<實施例2> <Example 2>

使用樹脂薄片組2,依上述〔評價用基板的調製〕得到評價用基板。將評價結果顯示於表2。 Using the resin sheet group 2, the evaluation substrate was obtained in accordance with the above-mentioned [Preparation of the evaluation substrate]. The evaluation results are shown in Table 2.

<實施例3> <Example 3>

使用樹脂薄片組1,依上述〔評價用基板的調製〕得到評價用基板。將評價結果顯示於表2。 Using the resin sheet group 1, the evaluation substrate was obtained in accordance with the above-mentioned [Preparation of the evaluation substrate]. The evaluation results are shown in Table 2.

<實施例4> <Example 4>

使用樹脂薄片組3,依上述〔評價用基板的調製〕得到評價用基板。將評價結果顯示於表2。 Using the resin sheet group 3, a substrate for evaluation was obtained in accordance with the above [Preparation of the substrate for evaluation]. The evaluation results are shown in Table 2.

<比較例1> <Comparative example 1>

使用樹脂薄片組4,依上述〔評價用基板的調製〕得到評價用基板。將評價結果顯示於表2。 Using the resin sheet group 4, the evaluation substrate was obtained in accordance with the above-mentioned [Preparation of the evaluation substrate]. The evaluation results are shown in Table 2.

<比較例2> <Comparative example 2>

使用樹脂薄片組5,依上述〔評價用基板的調製〕得到評價用基板。將評價結果顯示於表2。 Using the resin sheet group 5, an evaluation substrate was obtained in accordance with the above-mentioned [Preparation of the evaluation substrate]. The evaluation results are shown in Table 2.

<比較例3> <Comparative example 3>

使用樹脂薄片組4,依上述〔評價用基板的調製〕得到評價用基板。將評價結果顯示於表2。 Using the resin sheet group 4, the evaluation substrate was obtained in accordance with the above-mentioned [Preparation of the evaluation substrate]. The evaluation results are shown in Table 2.

<比較例4> <Comparative Example 4>

使用樹脂薄片組6,依上述〔評價用基板的調製〕得到評價用基板。將評價結果顯示於表2。 Using the resin sheet group 6, the substrate for evaluation was obtained in accordance with the above [preparation of the substrate for evaluation]. The evaluation results are shown in Table 2.

Claims (10)

一種印刷配線板,其係包含第1及第2阻焊劑層之印刷配線板,其中第1阻焊劑層包含樹脂組成物,該組成物硬化後的彈性率(23℃)G1(GPa)為6以上,令第1阻焊劑層的厚度為t1(μm)、令第2阻焊劑層的厚度為t2(μm)、硬化後的彈性率(23℃)為G2(GPa),且令印刷配線板的厚度為Z(μm)時,滿足下述條件(1)~(3):(1)Z≦250;(2)(t1+t2)/Z≧0.1;及(3)G1×〔t1/(t1+t2)〕+G2×〔t2/(t1+t2)〕≧6。 A printed wiring board is a printed wiring board including first and second solder resist layers, wherein the first solder resist layer includes a resin composition, and the elastic modulus (23 ° C) G 1 (GPa) of the composition after hardening is 6 or more, the thickness of the first solder resist layer is t 1 (μm), the thickness of the second solder resist layer is t 2 (μm), and the elastic modulus (23 ° C) after hardening is G 2 (GPa), and When the thickness of the printed wiring board is Z (μm), the following conditions (1) to (3) are satisfied: (1) Z ≦ 250; (2) (t 1 + t 2 ) /Z≧0.1; and (3 ) G 1 × [t 1 / (t 1 + t 2 )] + G 2 × [t 2 / (t 1 + t 2 )] ≧ 6. 如請求項1中記載之印刷配線板,其中,第1阻焊劑層之硬化後的玻璃轉移溫度(Tg)為150℃以上。 The printed wiring board according to claim 1, wherein the glass transition temperature (Tg) after the first solder resist layer is cured is 150 ° C or higher. 如請求項1中記載之印刷配線板,其中,第1阻焊劑層係將無機填充材含量為60質量%以上之樹脂組成物予以硬化所形成者。 The printed wiring board according to claim 1, wherein the first solder resist layer is formed by curing a resin composition having an inorganic filler content of 60% by mass or more. 如請求項1中記載之印刷配線板,其中,條件(2)為0.1≦(t1+t2)/Z≦0.5。 The printed wiring board according to claim 1, wherein the condition (2) is 0.1 ≦ (t 1 + t 2 ) /Z≦0.5. 如請求項1中記載之印刷配線板,其中,G2為6以上。 The printed wiring board according to claim 1, wherein G 2 is 6 or more. 如請求項1中記載之印刷配線板,其中,第2阻焊劑層包含樹脂組成物,該組成物硬化後的彈性率(23℃) 為6以上。 The printed wiring board according to claim 1, wherein the second solder resist layer contains a resin composition, and the elasticity (23 ° C) of the composition after hardening It is 6 or more. 如請求項1中記載之印刷配線板,其中,令第1阻焊劑層之硬化後的彈性率(200℃)為G1’(GPa)、令第2阻焊劑層之硬化後的彈性率(200℃)為G2’(GPa)時,進一步滿足下述條件(4):(4)G1’×〔t1/(t1+t2)〕+G2’×〔t2/(t1+t2)〕≧0.2。 The printed wiring board according to claim 1, wherein the elastic modulus (200 ° C) after the hardening of the first solder resist layer is G 1 ′ (GPa), and the elastic modulus after the hardening of the second solder resist layer ( When 200 ° C) is G 2 ′ (GPa), the following condition (4) is further satisfied: (4) G 1 ′ × [t 1 / (t 1 + t 2 )] + G 2 ′ × [t 2 / ( t 1 + t 2 )] ≧ 0.2. 一種半導體裝置,其係包含如請求項1~7中任一項記載之印刷配線板。 A semiconductor device including the printed wiring board according to any one of claims 1 to 7. 一種樹脂薄片組,其係印刷配線板的阻焊劑層用樹脂薄片組,其係包含具第1支持體以及與該第1支持體接合之第1樹脂組成物層所成之第1樹脂薄片、與具第2支持體以及與該第2支持體接合之第2樹脂組成物層所成之第2樹脂薄片,構成第1樹脂組成物層之樹脂組成物其硬化後的彈性率(23℃)G1(GPa)為6以上,令第1樹脂組成物層的厚度為t1p(μm)、令第2樹脂組成物層的厚度為t2p(μm)、硬化後的彈性率(23℃)為G2(GPa),且令印刷配線板的厚度為Z(μm)時,滿足下述條件(1’)~(3’):(1’)Z≦250;(2’)(t1p+t2p)/Z≧0.1;及(3’)G1×〔t1p/(t1p+t2p)〕+G2×〔t2p/(t1p+t2p)〕≧6。 A resin sheet group is a resin sheet group for a solder resist layer of a printed wiring board. The resin sheet group includes a first resin sheet having a first support and a first resin composition layer bonded to the first support. Elasticity (23 ° C) of the second resin sheet formed from the second resin sheet having the second support and the second resin composition layer bonded to the second support, and the resin composition constituting the first resin composition layer after curing. G 1 (GPa) is 6 or more, the thickness of the first resin composition layer is t 1p (μm), the thickness of the second resin composition layer is t 2p (μm), and the elastic modulus after curing (23 ° C) When G 2 (GPa) and the thickness of the printed wiring board is Z (μm), the following conditions (1 ′) to (3 ′) are satisfied: (1 ′) Z ≦ 250; (2 ′) (t 1p + t 2p ) /Z≧0.1; and (3 ′) G 1 × [t 1p / (t 1p + t 2p )] + G 2 × [t 2p / (t 1p + t 2p )] ≧ 6. 如請求項9中記載之樹脂薄片組,其中,構成第2樹脂組成物層之樹脂組成物其硬化後的彈性率(23℃)為6以上。 The resin sheet group according to claim 9, wherein the resin composition constituting the second resin composition layer has an elastic modulus (23 ° C) after curing of 6 or more.
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Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6852332B2 (en) * 2015-10-28 2021-03-31 味の素株式会社 Adhesive film
JP6728760B2 (en) * 2016-02-25 2020-07-22 味の素株式会社 Resin sheet with support
JP6748663B2 (en) * 2017-03-31 2020-09-02 太陽インキ製造株式会社 Curable composition, dry film, cured product and printed wiring board
JP6825580B2 (en) * 2018-01-12 2021-02-03 味の素株式会社 Manufacturing method of printed wiring board
CN113068313A (en) * 2021-03-05 2021-07-02 江西展耀微电子有限公司 Manufacturing method of circuit board, circuit board manufactured by manufacturing method and electronic equipment

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20070221400A1 (en) * 2006-03-27 2007-09-27 Fujitsu Limited Multilayer interconnection substrate, semiconductor device, and solder resist
TW200938044A (en) * 2007-10-15 2009-09-01 Shinko Electric Ind Co Method for manufacturing wiring board
US20100132982A1 (en) * 2008-12-02 2010-06-03 Samsung Electro-Mechanics Co., Ltd. Package substrate including solder resist layer having pattern parts and method of fabricating the same
US7859110B2 (en) * 2006-04-28 2010-12-28 Sumitomo Bakelite Co., Ltd. Solder resist material, wiring board using the solder resist material, and semiconductor package
US20110108982A1 (en) * 2009-11-09 2011-05-12 Hynix Semiconductor Inc. Printed circuit board
JP2012146990A (en) * 2012-02-22 2012-08-02 Sumitomo Bakelite Co Ltd Multilayer circuit board, method of manufacturing the same, and semiconductor device
US20120250268A1 (en) * 2009-12-14 2012-10-04 Taiyo Holdings Co., Ltd. Photosensitive resin composition, dry film thereof, and printed wiring board using them
JP2013102062A (en) * 2011-11-09 2013-05-23 Ibiden Co Ltd Semiconductor mounting member and method for manufacturing the same
JP2013247333A (en) * 2012-05-29 2013-12-09 Kyocer Slc Technologies Corp Wiring board and manufacturing method of the same

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE60217477T2 (en) * 2001-01-29 2007-10-11 Jsr Corp. COMPOSITE PARTICLES FOR DIELECTRICS, ULTRAFINE RESIN COMPOSITES, COMPOSITION FOR THE PRODUCTION OF DIELECTRICS AND THE USE THEREOF
JP3914239B2 (en) * 2005-03-15 2007-05-16 新光電気工業株式会社 Wiring board and method for manufacturing wiring board
JP5352175B2 (en) 2008-03-26 2013-11-27 太陽ホールディングス株式会社 Photosensitive resin composition, cured product thereof, and printed wiring board having solder resist layer made of the cured product
JP4473935B1 (en) * 2009-07-06 2010-06-02 新光電気工業株式会社 Multilayer wiring board
JP6123152B2 (en) * 2010-12-08 2017-05-10 味の素株式会社 Resin composition
JP2012198361A (en) * 2011-03-22 2012-10-18 Fujifilm Corp Photosensitive composition, photosensitive film, method for forming permanent pattern, permanent pattern, and printed board
JP2013115171A (en) * 2011-11-28 2013-06-10 Hitachi Chemical Co Ltd Printed wiring board, manufacturing method thereof, and thermosetting resin composition
KR102031014B1 (en) * 2012-07-13 2019-10-11 닛뽄 가야쿠 가부시키가이샤 Alkali development type resin, and photosensitive resin composition using same

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20070221400A1 (en) * 2006-03-27 2007-09-27 Fujitsu Limited Multilayer interconnection substrate, semiconductor device, and solder resist
US7859110B2 (en) * 2006-04-28 2010-12-28 Sumitomo Bakelite Co., Ltd. Solder resist material, wiring board using the solder resist material, and semiconductor package
TW200938044A (en) * 2007-10-15 2009-09-01 Shinko Electric Ind Co Method for manufacturing wiring board
US20100132982A1 (en) * 2008-12-02 2010-06-03 Samsung Electro-Mechanics Co., Ltd. Package substrate including solder resist layer having pattern parts and method of fabricating the same
US20110108982A1 (en) * 2009-11-09 2011-05-12 Hynix Semiconductor Inc. Printed circuit board
US20120250268A1 (en) * 2009-12-14 2012-10-04 Taiyo Holdings Co., Ltd. Photosensitive resin composition, dry film thereof, and printed wiring board using them
JP2013102062A (en) * 2011-11-09 2013-05-23 Ibiden Co Ltd Semiconductor mounting member and method for manufacturing the same
JP2012146990A (en) * 2012-02-22 2012-08-02 Sumitomo Bakelite Co Ltd Multilayer circuit board, method of manufacturing the same, and semiconductor device
JP2013247333A (en) * 2012-05-29 2013-12-09 Kyocer Slc Technologies Corp Wiring board and manufacturing method of the same

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