TW201540138A - Printed wiring board - Google Patents

Printed wiring board Download PDF

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Publication number
TW201540138A
TW201540138A TW104100717A TW104100717A TW201540138A TW 201540138 A TW201540138 A TW 201540138A TW 104100717 A TW104100717 A TW 104100717A TW 104100717 A TW104100717 A TW 104100717A TW 201540138 A TW201540138 A TW 201540138A
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TW
Taiwan
Prior art keywords
resin
resin composition
printed wiring
wiring board
solder resist
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TW104100717A
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Chinese (zh)
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TWI674043B (en
Inventor
Shigeo Nakamura
Genjin Mago
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Ajinomoto Kk
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Publication of TWI674043B publication Critical patent/TWI674043B/en

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    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/03Use of materials for the substrate
    • H05K1/0313Organic insulating material
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/03Use of materials for the substrate
    • H05K1/0313Organic insulating material
    • H05K1/0353Organic insulating material consisting of two or more materials, e.g. two or more polymers, polymer + filler, + reinforcement
    • H05K1/0373Organic insulating material consisting of two or more materials, e.g. two or more polymers, polymer + filler, + reinforcement containing additives, e.g. fillers
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/0271Arrangements for reducing stress or warp in rigid printed circuit boards, e.g. caused by loads, vibrations or differences in thermal expansion
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/22Secondary treatment of printed circuits
    • H05K3/28Applying non-metallic protective coatings
    • H05K3/285Permanent coating compositions
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/02Fillers; Particles; Fibers; Reinforcement materials
    • H05K2201/0203Fillers and particles
    • H05K2201/0206Materials
    • H05K2201/0209Inorganic, non-metallic particles

Abstract

The subject of the present invention is to provide a thin printed wiring board capable of inhibiting warpage in a component installation step. To solve the problem, the printed wiring board includes a first solder resist layer and a second solder resist layer, wherein the first solder resist layer has a thickness of t1 ([mu]m) and an elasticity rate of G1 (GPa) after being cured (23DEG C), and the second solder resist layer has a thickness of t2 ([mu]m) and an elasticity rate of G2 (GPa) after being cured (23DEG C). When the thickness of the printed wiring board is Z ([mu]m), the following equations (1)-(3) are satisfied: (1) Z ≤ 250, (2) (t1+t2)/Z ≤ 0.1, and (3) G1×(t1/(t1+t2))+G2×(t2/(t1+t2)) ≤ 6, where G1 is greater than 6.

Description

印刷配線板 Printed wiring board

本發明乃關於一種印刷配線板。 The present invention relates to a printed wiring board.

印刷配線板的最外層,於半導體晶片(以下亦稱「零件」)的實裝步驟中,為了在防止焊料附著於無需附著之部分,同時防止電路基板腐蝕,通常設置有阻焊劑層來作為保護膜。阻焊劑層一般而言,係於電路基板上設置光硬化性樹脂組成物之層,並將該層予以曝光/顯像所形成(例如,專利文獻1)。 The outermost layer of the printed wiring board is usually provided with a solder resist layer in order to prevent the solder from adhering to the portion that does not need to adhere and prevent the circuit substrate from being corroded during the mounting step of the semiconductor wafer (hereinafter also referred to as "parts"). membrane. The solder resist layer is generally formed by providing a layer of a photocurable resin composition on a circuit board, and exposing/developing the layer (for example, Patent Document 1).

[先前技術文獻] [Previous Technical Literature] [專利文獻] [Patent Literature]

[專利文獻1]日本特開2009-258613號公報 [Patent Document 1] Japanese Patent Laid-Open Publication No. 2009-258613

近年來,隨著無鉛焊料對含鉛焊料的代替,零件的實裝步驟中焊料迴流溫度會上昇。又近年來,為了 達成電子機器的小型化,印刷配線板的更加薄型化日益進展。 In recent years, with the replacement of lead-containing solder by lead-free solder, the solder reflow temperature rises during the mounting step of the part. In recent years, in order to The miniaturization of electronic equipment has been achieved, and the thickness of printed wiring boards has been increasing.

隨著印刷配線板的薄型化進展,本發明者發現,在零件的實裝步驟中,印刷配線板會產生翹曲,且會有電路歪扭或零件的接觸不良等之問題。 As the thickness of the printed wiring board progresses, the inventors have found that in the mounting step of the component, the printed wiring board is warped, and there is a problem that the circuit is twisted or the contact of the component is poor.

本發明係以提供一種薄型的印刷配線板為課題,其係可抑制零件實裝步驟中之翹曲者。 The present invention has been made in an effort to provide a thin printed wiring board which can suppress warpage in the component mounting step.

本發明者們就上述課題不斷地專致於檢討的結果發現,藉由組合具有特定厚度與彈性率之2個阻焊劑層來使用,可解決上述課題,遂完成本發明。 As a result of reviewing the above-mentioned problems, the inventors of the present invention have found that the above problems can be solved by combining two solder resist layers having a specific thickness and an elastic modulus, and the present invention has been completed.

意即,本發明包含以下內容。 That is, the present invention encompasses the following.

[1]一種印刷配線板,其係包含第1及第2阻焊劑層之印刷配線板,其中令第1阻焊劑層的厚度為t1(μm)、硬化後的彈性率(23℃)為G1(GPa)、令第2阻焊劑層的厚度為t2(μm)、硬化後的彈性率(23℃)為G2(GPa),且令印刷配線板的厚度為Z(μm)時,滿足下述條件(1)~(3):(1)Z≦250;(2)(t1+t2)/Z≧0.1;及(3)G1×〔t1/(t1+t2)〕+G2×〔t2/(t1+t2)〕≧6,且G1為6以上。 [1] A printed wiring board comprising a printed wiring board having a first and a second solder resist layer, wherein a thickness of the first solder resist layer is t 1 (μm), and an elastic modulus (23 ° C) after curing is G 1 (GPa), the thickness of the second solder resist layer is t 2 (μm), and the modulus of elasticity after hardening (23 ° C) is G 2 (GPa), and when the thickness of the printed wiring board is Z (μm) , satisfying the following conditions (1) to (3): (1) Z ≦ 250; (2) (t 1 + t 2 ) / Z ≧ 0.1; and (3) G 1 × [t 1 / (t 1 + t 2 )]+G 2 ×[t 2 /(t 1 +t 2 )]≧6, and G 1 is 6 or more.

[2]如[1]中記載之印刷配線板,其中,第1阻焊劑層之硬化後的玻璃轉移溫度(Tg)為150℃以上。 [2] The printed wiring board according to [1], wherein the glass transition temperature (Tg) after curing of the first solder resist layer is 150 ° C or higher.

[3]如[1]或[2]中記載之印刷配線板,其中,第1阻焊劑層係將無機填充材含量為60質量%以上之樹脂組成物予以硬化所形成者。 [3] The printed wiring board according to the above [1], wherein the first solder resist layer is formed by curing a resin composition having an inorganic filler content of 60% by mass or more.

[4]如[1]~[3]中任一記載之印刷配線板,其中,條件(2)為0.1≦(t1+t2)/Z≦0.5。 [4] The printed wiring board according to any one of [1] to [3] wherein the condition (2) is 0.1 ≦(t 1 + t 2 ) / Z ≦ 0.5.

[5]如[1]~[4]中任一記載之印刷配線板,其中,G2為6以上。 [5] The printed wiring board according to any one of [1] to [4] wherein G 2 is 6 or more.

[6]如[1]~[5]中任一記載之印刷配線板,其中,令第1阻焊劑層之硬化後的彈性率(200℃)為G1’(GPa)、令第2阻焊劑層之硬化後的彈性率(200℃)為G2’(GPa)時,進一步滿足下述條件(4):(4)G1’×〔t1/(t1+t2)〕+G2’×〔t2/(t1+t2)〕≧0.2。 [6] The printed wiring board according to any one of [1], wherein the elastic modulus (200 ° C) after curing of the first solder resist layer is G 1 ' (GPa), and the second resistance is obtained. When the elastic modulus (200 ° C) after hardening of the flux layer is G 2 '(GPa), the following condition (4) is further satisfied: (4) G 1 '×[t 1 /(t 1 +t 2 )]+ G 2 '×[t 2 /(t 1 +t 2 )]≧0.2.

[7]一種半導體裝置,其係包含如〔1〕~〔6〕中任一記載之印刷配線板者。 [7] A semiconductor device comprising the printed wiring board according to any one of [1] to [6].

[8]一種樹脂薄片組,其係印刷配線板的阻焊劑層用樹脂薄片組,其係包含具第1支持體以及與該第1支持體接合之第1樹脂組成物層所成之第1樹脂薄片、具第2支持體以及與該第2支持體接合之第2樹脂組成物層所成之第2樹脂薄片,且令第1樹脂組成物層的厚度為t1p(μm)、硬化後的 彈性率(23℃)為G1(GPa)、令第2樹脂組成物層的厚度為t2p(μm)、硬化後的彈性率(23℃)為G2(GPa),且令印刷配線板的厚度為Z(μm)時,滿足下述條件(1’)~(3’):(1’)Z≦250;(2’)(t1p+t2p)/Z≧0.1;及(3’)G1×〔t1p/(t1p+t2p)〕+G2×〔t2p/(t1p+t2p)〕≧6,且G1為6以上。 [8] A resin sheet group which is a resin sheet group for a solder resist layer of a printed wiring board, comprising a first resin body and a first resin composition layer joined to the first support body. a resin sheet, a second resin sheet having a second support and a second resin composition layer joined to the second support, and having a thickness of the first resin composition layer of t 1p (μm) and after curing The elastic modulus (23 ° C) is G 1 (GPa), the thickness of the second resin composition layer is t 2p (μm), and the elastic modulus after curing (23 ° C) is G 2 (GPa), and the printed wiring is made. When the thickness of the plate is Z (μm), the following conditions (1') to (3') are satisfied: (1') Z ≦ 250; (2') (t 1p + t 2p ) / Z ≧ 0.1; 3') G 1 ×[t 1p /(t 1p +t 2p )]+G 2 ×[t 2p /(t 1p +t 2p )]≧6, and G 1 is 6 or more.

根據本發明,係可提供一種薄型的印刷配線板,其係可抑制零件的實裝步驟中之翹曲。 According to the present invention, it is possible to provide a thin printed wiring board which can suppress warpage in the mounting step of a part.

[實施發明之形態] [Formation of the Invention] [印刷配線板] [Printed wiring board]

本發明之印刷配線板係包含第1及第2阻焊劑層,其特徵係,令第1阻焊劑層的厚度為t1(μm)、硬化後的彈性率(23℃)為G1(GPa)、令第2阻焊劑層的厚度為t2(μm)、硬化後的彈性率(23℃)為G2(GPa),且令印刷配線板的厚度為Z(μm)時,滿足下述條件(1)~(3):(1)Z≦250; (2)(t1+t2)/Z≧0.1;及(3)G1×〔t1/(t1+t2)〕+G2×〔t2/(t1+t2)〕≧6,且G1為6以上。 The printed wiring board of the present invention includes the first and second solder resist layers, wherein the first solder resist layer has a thickness t 1 (μm) and the cured elastic modulus (23 ° C) is G 1 (GPa). When the thickness of the second solder resist layer is t 2 (μm), and the elastic modulus after curing (23 ° C) is G 2 (GPa), and the thickness of the printed wiring board is Z (μm), the following is satisfied. Conditions (1) to (3): (1) Z ≦ 250; (2) (t 1 + t 2 ) / Z ≧ 0.1; and (3) G 1 × [t 1 / (t 1 + t 2 )] +G 2 ×[t 2 /(t 1 +t 2 )]≧6, and G 1 is 6 or more.

包含組合具有特定厚度與彈性率之第1及第2阻焊劑層所成的本發明之印刷配線板,在採用高焊料迴流溫度之零件的實裝步驟中,可抑制翹曲,亦可抑制電路歪扭或零件的接觸不良等之問題的發生。 The printed wiring board of the present invention comprising a combination of the first and second solder resist layers having a specific thickness and an elastic modulus can suppress warpage and suppress the circuit in a mounting step of a component using a high solder reflow temperature. Problems such as twisting or poor contact of parts.

-條件(1)- - Condition (1)-

條件(1)係關於本發明之印刷配線板的厚度Z(μm)。所謂印刷配線板的厚度Z,意指包含電路基板以及設置於該電路基板兩側之第1及第2阻焊劑層的印刷配線板全體厚度。本發明之印刷配線板的厚度(Z)從薄型化之觀點來看,係250μm以下,較佳為240μm以下,更佳為230μm以下,再更佳為220μm以下,又再更佳為210μm以下,特別佳為200μm以下,190μm以下,180μm以下,170μm以下,160μm以下或150μm以下。本發明之印刷配線板,即使在如此厚度薄時,仍可抑制實裝步驟中之翹曲。厚度(Z)的下限並未特別受限,通常為20μm以上,或30μm以上。 The condition (1) is the thickness Z (μm) of the printed wiring board of the present invention. The thickness Z of the printed wiring board means the entire thickness of the printed wiring board including the circuit board and the first and second solder resist layers provided on both sides of the circuit board. The thickness (Z) of the printed wiring board of the present invention is 250 μm or less, preferably 240 μm or less, more preferably 230 μm or less, still more preferably 220 μm or less, still more preferably 210 μm or less, from the viewpoint of thinning. It is particularly preferably 200 μm or less, 190 μm or less, 180 μm or less, 170 μm or less, 160 μm or less, or 150 μm or less. The printed wiring board of the present invention can suppress the warpage in the mounting step even when the thickness is as small as possible. The lower limit of the thickness (Z) is not particularly limited, and is usually 20 μm or more, or 30 μm or more.

-條件(2)- - Condition (2)-

條件(2)係關於本發明之印刷配線板中所含第1及第2阻焊劑層的厚度t1(μm)及t2(μm)。在此,第1 及第2阻焊劑層的厚度t1(μm)及t2(μm)乃自電路基板的基面(電路基板表面之中,無表面電路的部分)之厚度。從實裝步驟中抑制印刷配線板的翹曲之觀點來看,第1及第2阻焊劑層的厚度和(t1+t2)對印刷配線板的厚度Z之比,即(t1+t2)/Z比係0.1以上,雖也依條件(3)右邊的值,但較佳為0.15以上,更佳為0.2以上,0.22以上,0.24以上,0.26以上,0.28以上或0.3以上。(t1+t2)/Z比的上限,從獲得具有所期待之配線密度的印刷配線板之觀點來看,較佳為0.5以下,更佳為0.45以下,再更佳為0.4以下,0.39以下,0.38以下,0.37以下,0.36以下,0.36以下或0.34以下。 The condition (2) is the thicknesses t 1 (μm) and t 2 (μm) of the first and second solder resist layers contained in the printed wiring board of the present invention. Here, the thicknesses t 1 (μm) and t 2 (μm) of the first and second solder resist layers are the thicknesses of the base surface of the circuit board (the portion of the circuit board surface having no surface circuit). Suppressing warpage of the printed wiring board from the mounting step, the thickness of the first and second solder resist layer, and (t 1 + t 2) than the thickness of the printed wiring board of Z, i.e., (t 1 + t 2 ) The /Z ratio is 0.1 or more, and is preferably 0.15 or more, more preferably 0.2 or more, 0.22 or more, 0.24 or more, 0.26 or more, 0.28 or more, or 0.3 or more, depending on the value on the right side of the condition (3). The upper limit of the (t 1 + t 2 )/Z ratio is preferably 0.5 or less, more preferably 0.45 or less, still more preferably 0.4 or less, from the viewpoint of obtaining a printed wiring board having a desired wiring density. Hereinafter, it is 0.38 or less, 0.37 or less, 0.36 or less, 0.36 or less, or 0.34 or less.

第1阻焊劑層的厚度t1,在滿足上述特定的(t1+t2)/Z比的情況下,並無特別限定,較佳為5μm以上,更佳為10μm以上,再更佳為15μm以上,20μm以上或25μm以上。厚度t1的上限,並無特別限定,在滿足上述特定的(t1+t2)/Z比時,並無特別限定,較佳為120μm以下,更佳為100μm以下,再更佳為80μm以下,70μm以下,60μm以下,50μm以下,40μm以下或30μm以下。 The thickness t 1 of the first solder resist layer is not particularly limited as long as the specific (t 1 + t 2 )/Z ratio is satisfied, and is preferably 5 μm or more, more preferably 10 μm or more, and still more preferably 15 μm or more, 20 μm or more or 25 μm or more. The upper limit of the thickness t 1 is not particularly limited, and is not particularly limited as long as the specific (t 1 + t 2 )/Z ratio is satisfied, and is preferably 120 μm or less, more preferably 100 μm or less, still more preferably 80 μm. Hereinafter, it is 70 μm or less, 60 μm or less, 50 μm or less, 40 μm or less, or 30 μm or less.

第2阻焊劑層的厚度t2,在滿足上述特定的(t1+t2)/Z比的情況下,並無特別限定,係考慮第1阻焊劑層的厚度t1與印刷配線板的厚度Z來決定即可。第2阻焊劑層的厚度t2的上限通常可為120μm以下或100μm以下,厚度t2的下限通常為5μm以上或10μm以上。 The thickness t 2 of the second solder resist layer is not particularly limited when the specific (t 1 + t 2 )/Z ratio is satisfied, and the thickness t 1 of the first solder resist layer and the printed wiring board are considered. The thickness Z can be determined. The upper limit of the thickness t 2 of the second solder resist layer may be usually 120 μm or less or 100 μm or less, and the lower limit of the thickness t 2 is usually 5 μm or more or 10 μm or more.

-條件(3)- - Condition (3) -

條件(3)係關於本發明之印刷配線板中所含第1及第2阻焊劑層之硬化後的彈性率(23℃)。第1及第2阻焊劑層係如後述,可將樹脂組成物硬化而形成。所謂硬化後的彈性率(23℃),係表示使樹脂組成物硬化後之23℃中阻焊劑層的彈性率。令第1及第2阻焊劑層之硬化後的彈性率(23℃)分別為G1(GPa)及G2(GPa)時,式:G1×〔t1/(t1+t2)〕+G2×〔t2/(t1+t2)〕的值(以下亦稱為「G1及G2的厚度加重平均值」),從抑制實裝步驟中印刷配線板的翹曲之觀點來看,乃為6以上,較佳為6.2以上,更佳為6.4以上,再更佳為6.6以上,又再更佳為6.8以上。G1及G2的厚度加重平均值若為6.8以上,印刷配線板的厚度Z若為200μm以下,則即使是薄的情況下,可抑制實裝步驟中印刷配線板的翹曲。G1及G2的厚度加重平均值,從即使是使印刷配線板的厚度Z變小且使(t1+t2)/Z比更低的情況也得以抑制實裝步驟中印刷配線板的翹曲之觀點來看,係以7以上,7.5以上,8以上,8.5以上,9以上,9.5以上,10以上,10.5以上,11以上,11.5以上,12以上,12.5以上或13以上者特別佳。G1及G2的厚度加重平均值之上限,並無特別限定,通常可為40以下,30以下等。第1及第2阻焊劑層之硬化後的彈性率(23℃),係可使用拉伸試驗機而藉由拉伸加重法於23℃中測定。拉伸試驗機方面,可舉例 如(股)ORIENTEC製「RTC-1250A」。 The condition (3) is the modulus of elasticity (23 ° C) after curing of the first and second solder resist layers contained in the printed wiring board of the present invention. The first and second solder resist layers can be formed by curing the resin composition as will be described later. The modulus of elasticity after hardening (23 ° C) is the modulus of elasticity of the solder resist layer at 23 ° C after the resin composition is cured. When the elastic modulus (23 ° C) after curing of the first and second solder resist layers is G 1 (GPa) and G 2 (GPa), respectively, the formula: G 1 ×[t 1 /(t 1 +t 2 ) The value of +G 2 ×[t 2 /(t 1 +t 2 )] (hereinafter also referred to as "the average thickness of the thicknesses of G 1 and G 2 "), from suppressing the warpage of the printed wiring board in the mounting step In view of the above, it is 6 or more, preferably 6.2 or more, more preferably 6.4 or more, still more preferably 6.6 or more, and still more preferably 6.8 or more. When the thickness average of G 1 and G 2 is 6.8 or more and the thickness Z of the printed wiring board is 200 μm or less, the warpage of the printed wiring board in the mounting step can be suppressed even when it is thin. The thickness of G 1 and G 2 is increased by the average value, and the printed wiring board in the mounting step is suppressed even if the thickness Z of the printed wiring board is made small and the (t 1 + t 2 )/Z ratio is made lower. From the viewpoint of warpage, it is particularly preferably 7 or more, 7.5 or more, 8 or more, 8.5 or more, 9 or more, 9.5 or more, 10 or more, 10.5 or more, 11 or more, 11.5 or more, 12 or more, 12.5 or more, or 13 or more. . The upper limit of the thickness average of G 1 and G 2 is not particularly limited, and may be usually 40 or less, 30 or less, or the like. The elastic modulus (23 ° C) after curing of the first and second solder resist layers can be measured by a tensile tester at 23 ° C using a tensile tester. For the tensile tester, for example, "RTC-1250A" manufactured by ORIENTEC can be mentioned.

第1阻焊劑層之硬化後的彈性率(23℃),即G1(GPa)為6以上。G1的值為6以上且G1及G2的厚度加重平均值在上述特定的範圍下,並無特別限定,從實裝步驟中可充分抑制印刷配線板的翹曲之觀點來看,較佳為6.2以上,更佳為6.4以上,再更佳為6.6以上,又再更佳為6.8以上,特別佳為7以上,7.5以上,8以上,8.5以上,9以上,9.5以上,10以上,10.5以上,11以上,11.5以上,12以上,12.5以上或13以上。G1的上限,並無特別限定,通常可為40以下,30以下等。 The elastic modulus (23 ° C) after hardening of the first solder resist layer, that is, G 1 (GPa) is 6 or more. The value of G 1 is 6 or more, and the average thickness of G 1 and G 2 is not particularly limited as long as it is within the above specific range, and it is preferable from the viewpoint of sufficiently suppressing warpage of the printed wiring board in the mounting step. It is 6.2 or more, more preferably 6.4 or more, still more preferably 6.6 or more, and even more preferably 6.8 or more, particularly preferably 7 or more, 7.5 or more, 8 or more, 8.5 or more, 9 or more, 9.5 or more, 10 or more, 10.5. The above is 11 or more, 11.5 or more, 12 or more, 12.5 or more, or 13 or more. The upper limit of G 1 is not particularly limited, but may be usually 40 or less, 30 or less, or the like.

第2阻焊劑層之硬化後的彈性率(23℃),即G2(GPa)若G1及G2的厚度加重平均值在上述特定的範圍下,並無特別限定。例如,G2的值只要是G1及G2的厚度加重平均值在上述特定的範圍中,可決定為1~30的範圍中。從即使是使印刷配線板的厚度Z變小且使(t1+t2)/Z比更低的情況也容易抑制實裝步驟中印刷配線板的翹曲之觀點來看,G2的值係以6以上者特別佳。 The elastic modulus (23 ° C) after curing of the second solder resist layer, that is, G 2 (GPa), is not particularly limited as long as the average thickness of G 1 and G 2 is within the above specific range. For example, as long as the value G 2 is G 1 and G 2 the thickness of the average increase in the specific range may be determined to be in the range of 1 to 30. The value of G 2 is easily suppressed from the viewpoint of suppressing the warpage of the printed wiring board in the mounting step even when the thickness Z of the printed wiring board is made small and the ratio of (t 1 + t 2 )/Z is made lower. It is especially good if it is 6 or more.

從可進一步抑制實裝步驟中印刷配線板的翹曲之觀點來看,係以使第1及第2阻焊劑層之硬化後的彈性率(200℃)為G1’(GPa)及G2’(GPa)時,滿足下述條件(4):(4)G1’×〔t1/(t1+t2)〕+G2’×〔t2/(t1+t2)〕≧0.2為佳。 From the viewpoint of further suppressing the warpage of the printed wiring board in the mounting step, the elastic modulus (200 ° C) after curing of the first and second solder resist layers is G 1 '(GPa) and G 2 . In the case of '(GPa), the following condition (4) is satisfied: (4) G 1 '×[t 1 /(t 1 +t 2 )]+G 2 '×[t 2 /(t 1 +t 2 )] ≧0.2 is better.

G1’×〔t1/(t1+t2)〕+G2’×〔t2/(t1+t2)〕的值 (以下亦稱為「G1’及G2’的厚度加重平均值」)係以0.22以上者更佳、0.24以上者又更佳。G1’及G2’的厚度若加重平均值為0.24以上時,即使在使印刷配線板的厚度Z更薄為200μm以下時,仍可抑制實裝步驟中印刷配線板的翹曲。G1’及G2’的厚度加重平均值,從即使是使印刷配線板的厚度Z變小且使(t1+t2)/Z比更低的情況也得以抑制實裝步驟中印刷配線板的翹曲之觀點來看,係以0.3以上,0.4以上,0.5以上,0.6以上,0.7以上,0.8以上,0.9以上,1.0以上,1.1以上,1.2以上,1.3以上或1.4以上者特別佳。G1’及G2’的厚度加重平均值之上限,並無特別限定,通常可為15以下,10以下等。此外,所謂硬化後的彈性率(200℃),係表示使樹脂組成物硬化後之200℃中阻焊劑層的彈性率,並可使用拉伸試驗機而藉由拉伸加重法於200℃中測定。 The value of G 1 '×[t 1 /(t 1 +t 2 )]+G 2 '×[t 2 /(t 1 +t 2 )] (hereinafter also referred to as the thickness of "G 1 ' and G 2 ') It is more preferable that the average value is 0.22 or more, and more preferably 0.24 or more. When the average thickness of G 1 ' and G 2 ' is 0.24 or more, even when the thickness Z of the printed wiring board is made thinner than 200 μm, the warpage of the printed wiring board in the mounting step can be suppressed. The thickness average of G 1 ' and G 2 ' is increased, and the printed wiring in the mounting step is suppressed even if the thickness Z of the printed wiring board is made small and the ratio of (t 1 + t 2 )/Z is made lower. From the viewpoint of warpage of the sheet, it is particularly preferably 0.3 or more, 0.4 or more, 0.5 or more, 0.6 or more, 0.7 or more, 0.8 or more, 0.9 or more, 1.0 or more, 1.1 or more, 1.2 or more, 1.3 or more, or 1.4 or more. The upper limit of the thickness average of G 1 ' and G 2 ' is not particularly limited, and may be usually 15 or less, 10 or less, or the like. In addition, the modulus of elasticity after hardening (200 ° C) is the modulus of elasticity of the solder resist layer at 200 ° C after curing the resin composition, and can be used in a tensile tester at 200 ° C by a tensile weighting method. Determination.

第1阻焊劑層之硬化後的彈性率(200℃)即G1’(GPa),從可充分地抑制實裝步驟中印刷配線板的翹曲之觀點來看,係以0.2以上者為佳、0.22以上者更佳、0.24以上者又更佳、0.3以上,0.4以上,0.5以上,0.6以上,0.7以上,0.8以上,0.9以上,1.0以上,1.1以上,1.2以上,1.3以上或1.4以上者特別佳。G1’的上限,並無特別限定,通常可為15以下,10以下等。 The elastic modulus (200 ° C) after curing of the first solder resist layer, that is, G 1 '(GPa), is preferably 0.2 or more from the viewpoint of sufficiently suppressing the warpage of the printed wiring board in the mounting step. More preferably, it is 0.22 or more, more preferably 0.24 or more, 0.3 or more, 0.4 or more, 0.5 or more, 0.6 or more, 0.7 or more, 0.8 or more, 0.9 or more, 1.0 or more, 1.1 or more, 1.2 or more, 1.3 or more, or 1.4 or more. Especially good. The upper limit of G 1 ' is not particularly limited, but may be usually 15 or less, 10 or less, or the like.

第2阻焊劑層之硬化後的彈性率(200℃),即G2’(GPa),在與G1’的關係中,G1’及G2’的厚度加重平均值係以如成為上述特定的範圍之值者為佳。例如, G2’的值,只要是G1’及G2’的厚度加重平均值在上述特定的範圍下,係以在0.1~10的範圍為佳。從即使是使印刷配線板的厚度Z變小且(t1+t2)/Z比更低的情況也容易抑制實裝步驟中印刷配線板的翹曲之觀點來看,G2’的值係以0.2以上者特別佳。 The elastic modulus (200 ° C) after hardening of the second solder resist layer, that is, G 2 '(GPa), in the relationship with G 1 ', the thickness of G 1 ' and G 2 ' is increased by an average value as described above. The value of a particular range is preferred. For example, the 'value, as long as the G 1' G 2 and a thickness G 2 'is the average increase in the specific range, preferably in the line to the range of 0.1 to 10. The value of G 2 ' is easily suppressed from the viewpoint of suppressing the warpage of the printed wiring board in the mounting step even when the thickness Z of the printed wiring board is made small and the (t 1 + t 2 )/Z ratio is lower. It is particularly good if it is 0.2 or more.

滿足上述條件(1)、(2)及(3)之本發明印刷配線板中,即使在採用高焊料迴流溫度之實裝步驟中,亦可抑制翹曲。在一實施形態中,本發明之印刷配線板,在採用波峰溫度為260℃之高焊料迴流溫度的實裝步驟中,可使印刷配線板的翹曲抑制在50μm以下。本發明中,印刷配線板的翹曲,係為以陰影疊紋(Shadow Moire)裝置觀察印刷配線板中央之25mm角部分的翹曲舉動時,其變位數據的最大高度與最小高度之差的值。在測定時,於再現IPC/JEDEC J-STD-020C(「Moisture/Reflow Sensitivity Classification For Nonhermetic Solid State Surface Mount Devices」、2004年7月)中所記載的迴流溫度曲線(無鉛組件用曲線;波峰溫度260℃、自25℃至波峰溫度為止的昇溫所要時間5分鐘)之迴流裝置通入印刷配線板1次之後,以依上述IPC/JEDEC J-STD-020C為準則的迴流溫度曲線加熱處理印刷配線板的單面,而於印刷配線板的另一面所設置的格子線求得變位數據。此外,在迴流裝置方面,可舉例如日本ANTUM(股)製「HAS-6116」,且陰影疊紋裝置方面,可舉例如Akrometrix製「TherMoire AXP」。藉由使條件(3)中右邊的值為上述的 較佳值,即使是使印刷配線板的厚度Z變小且(t1+t2)/Z比更低的情況,亦可使實裝步驟中印刷配線板的翹曲抑制在48μm以下,46μm以下,44μm以下,42μm以下或40μm以下為止。 In the printed wiring board of the present invention which satisfies the above conditions (1), (2) and (3), warpage can be suppressed even in a mounting step using a high solder reflow temperature. In one embodiment, the printed wiring board of the present invention can suppress the warpage of the printed wiring board to 50 μm or less in the mounting step of using a high solder reflow temperature of a peak temperature of 260 °C. In the present invention, the warpage of the printed wiring board is a difference between the maximum height and the minimum height of the displacement data when the warping behavior of the 25 mm corner portion of the center of the printed wiring board is observed by a Shadow Moire device. value. At the time of measurement, the reflow temperature profile described in IPC/JEDEC J-STD-020C ("Moisture/Reflow Sensitivity Classification For Nonhermetic Solid State Surface Mount Devices", July 2004) was reproduced (the curve for lead-free components; peak temperature) After the reflow device was introduced into the printed wiring board once at 260 ° C for 5 minutes from 25 ° C to the peak temperature, the printed wiring was heat-treated by the reflow profile according to the above IPC/JEDEC J-STD-020C. One side of the board, and the grid line provided on the other side of the printed wiring board determines the displacement data. In addition, for the reflow device, for example, "HAS-6116" manufactured by ANTU Co., Ltd., and the "shadowing device" may be, for example, "TherMoire AXP" manufactured by Akrometrix. By setting the value of the right side in the condition (3) to the above preferred value, even if the thickness Z of the printed wiring board is made small and the (t 1 + t 2 )/Z ratio is lower, the mounting can be performed. In the step, the warpage of the printed wiring board is suppressed to 48 μm or less, 46 μm or less, 44 μm or less, 42 μm or less, or 40 μm or less.

[印刷配線板的阻焊劑層用樹脂薄片組] [Resin sheet group for solder resist layer of printed wiring board]

本發明之印刷配線板係可將具有特定的厚度及彈性率之第1及第2阻焊劑層設置於電路基板的兩面而製造。 The printed wiring board of the present invention can be manufactured by providing the first and second solder resist layers having a specific thickness and modulus of elasticity on both surfaces of the circuit board.

以下,乃就製造本發明之印刷配線板時得以使用的一組樹脂薄片(「樹脂薄片組」)來進行說明。 Hereinafter, a set of resin sheets ("resin sheet group") which are used in the production of the printed wiring board of the present invention will be described.

本發明之印刷配線板的阻焊劑層用樹脂薄片組,係特徵係包含具第1支持體以及與該第1支持體接合之第1樹脂組成物層所成之第1樹脂薄片、與具第2支持體以及與該第2支持體接合之第2樹脂組成物層所成之第2樹脂薄片,而令第1樹脂組成物層的厚度為t1p(μm)、硬化後的彈性率(23℃)為G1(GPa)、令第2樹脂組成物層的厚度為t2p(μm)、硬化後的彈性率(23℃)為G2(GPa),且令印刷配線板的厚度為Z(μm)時,滿足下述條件(1’)~(3’):(1’)Z≦250;(2’)(t1p+t2p)/Z≧0.1;及(3’)G1×〔t1p/(t1p+t2p)〕+G2×〔t2p/(t1p+t2p)〕≧6,且G1為6以上。 The resin sheet group for a solder resist layer of a printed wiring board according to the present invention is characterized in that it comprises a first resin sheet having a first support and a first resin composition layer joined to the first support, and a first resin sheet. (2) The second resin sheet formed of the second resin composition layer joined to the second support, and the thickness of the first resin composition layer is t 1p (μm) and the modulus of elasticity after curing (23) °C) is G 1 (GPa), the thickness of the second resin composition layer is t 2p (μm), the elastic modulus after curing (23 ° C) is G 2 (GPa), and the thickness of the printed wiring board is Z. (μm), the following conditions (1') to (3') are satisfied: (1') Z ≦ 250; (2') (t 1p + t 2p ) / Z ≧ 0.1; and (3') G 1 ×[t 1p /(t 1p +t 2p )]+G 2 ×[t 2p /(t 1p +t 2p )]≧6, and G 1 is 6 or more.

藉由使用該樹脂薄片組來形成第1及第2阻焊劑層,係簡便地可製造滿足條件(1)、(2)及(3)之本發明印刷配線板。 By forming the first and second solder resist layers by using the resin sheet group, the printed wiring board of the present invention satisfying the conditions (1), (2), and (3) can be easily manufactured.

條件(1’)係與上述條件(1)對應。Z的較佳範圍,係如條件(1)所說明般。 The condition (1') corresponds to the above condition (1). The preferred range of Z is as described in Condition (1).

條件(2’)係與上述條件(2)對應。於電路基板上積層樹脂組成物層並形成阻焊劑層時,以電路基板的表面電路存在作為起因,通常,所得之阻焊劑層的厚度會較樹脂組成物層的厚度更厚。因此藉由滿足條件(2’),並不受電路基板的表面電路的厚度或表面電路的密度影響,係容易滿足條件(2)。條件(2’)中,在決定(t1p+t2p)/Z比的較佳範圍時,係可將條件(2)中「t1」及「t2」分別解讀為「t1p」及「t2p」而適用。同樣地,在決定t1p及t2p的較佳範圍時,上述條件(2)所附加說明之t1及t2的較佳範圍說明中,係可將「t1」及「t2」各自改讀為「t1p」及「t2p」來適用。此外,決定t1p及t2p時,係以使該等與電路基板的表面電路厚度同厚或更厚來決定者佳。 The condition (2') corresponds to the above condition (2). When a resin composition layer is laminated on a circuit board and a solder resist layer is formed, the surface circuit of the circuit board is present as a cause. Generally, the thickness of the obtained solder resist layer is thicker than the thickness of the resin composition layer. Therefore, by satisfying the condition (2'), it is not affected by the thickness of the surface circuit of the circuit substrate or the density of the surface circuit, and the condition (2) is easily satisfied. In the condition (2'), when the preferred range of (t 1p + t 2p )/Z ratio is determined, "t 1 " and "t 2 " in condition (2) can be interpreted as "t 1p " and Applicable to "t 2p ". Similarly, in the preferred range of t 1p and t 2p , in the description of the preferred ranges of t 1 and t 2 described in the above condition (2), "t 1 " and "t 2 " can be respectively used. It is applicable to read "t 1p " and "t 2p ". Further, it is preferable to determine t 1p and t 2p so as to be thick or thicker than the surface circuit thickness of the circuit board.

條件(3’)係與上述條件(3)對應。當阻焊劑層之硬化後的彈性率(23℃)表示使用於構成阻焊劑層之樹脂組成物的硬化後的彈性率(23℃)時,如前述,G1及G2的較佳範圍,係如就條件(3)所說明的。又,條件(3’)的右邊之值的較佳範圍,係如條件(3)所記載般。 The condition (3') corresponds to the above condition (3). When the modulus of elasticity after hardening of the solder resist layer (23 ° C) indicates the elastic modulus (23 ° C) after curing of the resin composition constituting the solder resist layer, as described above, the preferred ranges of G 1 and G 2 are As explained in condition (3). Further, the preferable range of the value on the right side of the condition (3') is as described in the condition (3).

從實裝步驟中可更加抑制印刷配線板的翹曲之觀點來看,令第1及第2樹脂組成物層之硬化後的彈性率(200℃)各自為G1’(GPa)及G2’(GPa)時,係以滿足下述條件(4’):(4’)G1’×〔t1p/(t1p+t2p)〕+G2’×〔t2p/(t1p+t2p)〕≧0.2者佳。有關條件(4’)的右邊之值的較佳範圍,係如就條件(4)所記載的,G1’及G2’的較佳範圍,係如就條件(4)與說明的。 From the viewpoint of further suppressing the warpage of the printed wiring board in the mounting step, the elastic modulus (200 ° C) after curing of the first and second resin composition layers is G 1 '(GPa) and G 2 ', respectively. In the case of (GPa), the following condition (4') is satisfied: (4') G 1 '×[t 1p /(t 1p +t 2p )]+G 2 '×[t 2p /(t 1p +t 2p )〕 ≧ 0.2 is good. The preferred range of the value on the right side of the condition (4') is as described in the condition (4), and the preferred range of G 1 ' and G 2 ' is as described in the condition (4).

<樹脂組成物> <Resin composition>

第1及第2樹脂組成物層中所使用的樹脂組成物,若為硬化後可在顯示上述特定的彈性率同時具有充分的耐藥品性與絕緣性者即可,可為熱硬化性樹脂組成物,亦可為光硬化性樹脂組成物。例如,熱硬化性樹脂組成物方面,可舉出包含熱硬化性樹脂及硬化劑之樹脂組成物。熱硬化性樹脂方面,可使用形成印刷配線板的阻焊劑層時所使用的以往公知的熱硬化性樹脂,其中更以環氧樹脂為佳。因此一實施形態中,第1及第2樹脂組成物層中所使用的熱硬化性樹脂組成物係包含(a)環氧樹脂及(b)硬化劑。又,較佳的光硬化性樹脂組成物係可藉由在上述熱硬化性樹脂組成物中再加入光硬化性樹脂所形成。光硬化性樹脂方面,係可使用形成印刷配線板的阻焊劑層時所使用的以往公知的光硬化性樹脂,從容易實施曝光/顯像(光微影)形成開口之觀點來看,係以光硬化型鹼可溶性樹脂為 佳。因此一實施形態中,第1及第2樹脂組成物層中所使用的光硬化性樹脂組成物係包含(a)環氧樹脂、(b)硬化劑、及(c)光硬化型鹼可溶性樹脂。光硬化性樹脂組成物更進一步包含由(d)光聚合起始劑、(e)光增感劑及(f)稀釋劑所成之群選出的1種以上。此外,本發明中,包含光硬化性樹脂且可藉光微影而形成開口形成之樹脂組成物,即使是具有熱硬化性時,亦稱「光硬化性樹脂組成物」。第1及第2樹脂組成物層中可使用的樹脂組成物,不管熱硬化性樹脂組成物、光硬化性樹脂組成物的分類,可視需要而進一步包含(g)無機填充材、(h)熱可塑性樹脂、(i)硬化促進劑、(j)難燃劑及(k)有機填充材等之添加劑。 The resin composition used in the first and second resin composition layers may have sufficient chemical resistance and insulation properties while exhibiting the specific elastic modulus after curing, and may be a thermosetting resin composition. The material may also be a photocurable resin composition. For example, a thermosetting resin composition is a resin composition containing a thermosetting resin and a curing agent. As the thermosetting resin, a conventionally known thermosetting resin used for forming a solder resist layer of a printed wiring board can be used, and among them, an epoxy resin is more preferable. Therefore, in one embodiment, the thermosetting resin composition used in the first and second resin composition layers contains (a) an epoxy resin and (b) a curing agent. Further, a preferred photocurable resin composition can be formed by further adding a photocurable resin to the thermosetting resin composition. In the case of the photocurable resin, a conventionally known photocurable resin used for forming a solder resist layer of a printed wiring board can be used from the viewpoint of easily forming an opening by exposure/development (photolithography). Photocuring alkali-soluble resin good. In the first embodiment, the photocurable resin composition used in the first and second resin composition layers includes (a) an epoxy resin, (b) a curing agent, and (c) a photocurable alkali-soluble resin. . The photocurable resin composition further contains one or more selected from the group consisting of (d) a photopolymerization initiator, (e) a photosensitizer, and (f) a diluent. Further, in the present invention, a resin composition containing a photocurable resin and having an opening formed by photolithography is used, and it is also called a "photocurable resin composition" even when it has thermosetting properties. The resin composition which can be used for the first and second resin composition layers may further contain (g) inorganic filler and (h) heat, depending on the classification of the thermosetting resin composition and the photocurable resin composition. Additives such as a plastic resin, (i) a hardening accelerator, (j) a flame retardant, and (k) an organic filler.

以下,乃針對第1及第2樹脂組成物層中可作為樹脂組成物的材料使用之環氧樹脂、硬化劑、光硬化型鹼可溶性樹脂、光聚合起始劑、光增感劑、稀釋劑及添加劑進行說明。 In the following, the epoxy resin, the curing agent, the photocurable alkali-soluble resin, the photopolymerization initiator, the photosensitizer, and the diluent which can be used as the resin composition in the first and second resin composition layers are used. And additives for description.

-(a)環氧樹脂- - (a) epoxy resin -

環氧樹脂方面,可舉例如雙酚A型環氧樹脂、雙酚F型環氧樹脂、雙酚S型環氧樹脂、雙酚AF型環氧樹脂、二環戊二烯型環氧樹脂、參酚型環氧樹脂、萘酚酚醛清漆型環氧樹脂、苯酚酚醛清漆型環氧樹脂、tert-丁基-苯二酚型環氧樹脂、萘型環氧樹脂、萘酚型環氧樹脂、蒽型環氧樹脂、環氧丙基胺型環氧樹脂、環氧丙基酯型環氧樹 脂、甲酚酚醛清漆型環氧樹脂、聯苯型環氧樹脂、線狀脂肪族環氧樹脂、具丁二烯構造之環氧樹脂、脂環式環氧樹脂、雜環式環氧樹脂、含螺環之環氧樹脂、環己烷二甲醇型環氧樹脂、萘醚型環氧樹脂及三羥甲基型環氧樹脂等。環氧樹脂可單獨使用1種或併用2種以上。 Examples of the epoxy resin include bisphenol A epoxy resin, bisphenol F epoxy resin, bisphenol S epoxy resin, bisphenol AF epoxy resin, and dicyclopentadiene epoxy resin. Phenol type epoxy resin, naphthol novolac type epoxy resin, phenol novolak type epoxy resin, tert-butyl-benzene diphenol type epoxy resin, naphthalene type epoxy resin, naphthol type epoxy resin,蒽 type epoxy resin, epoxy propyl amine type epoxy resin, epoxy propyl ester type epoxy tree Grease, cresol novolak type epoxy resin, biphenyl type epoxy resin, linear aliphatic epoxy resin, epoxy resin with butadiene structure, alicyclic epoxy resin, heterocyclic epoxy resin, An epoxy resin containing a spiral ring, a cyclohexane dimethanol type epoxy resin, a naphthalene ether type epoxy resin, and a trimethylol type epoxy resin. Epoxy resins may be used alone or in combination of two or more.

環氧樹脂,係以包含1分子中具2個以上環氧基之環氧樹脂者為佳。令環氧樹脂的不揮發成分為100質量%時,係以至少50質量%以上為1分子中具2個以上環氧基之環氧樹脂者為佳。其中,更以包含1分子中具2個以上環氧基且在溫度20℃下液狀的環氧樹脂(以下稱為「液狀環氧樹脂」)以及1分子中具3個以上環氧基且在溫度20℃下固體狀的環氧樹脂(以下稱為「固體狀環氧樹脂」)為佳。環氧樹脂方面,併用液狀環氧樹脂與固體狀環氧樹脂,可獲得具優異可撓性之樹脂組成物。又,將樹脂組成物硬化所形成之阻焊劑層的斷裂強度也會提昇。特別是,樹脂組成物為熱硬化性樹脂組成物時,係以併用液狀環氧樹脂與固體狀環氧樹脂者為佳。樹脂組成物為光硬化性樹脂組成物時,係以使用固體狀環氧樹脂作為環氧樹脂者為佳。 The epoxy resin is preferably one containing an epoxy resin having two or more epoxy groups in one molecule. When the non-volatile content of the epoxy resin is 100% by mass, it is preferred that at least 50% by mass or more of the epoxy resin having two or more epoxy groups in one molecule is used. In addition, an epoxy resin having two or more epoxy groups in one molecule and having a liquid at a temperature of 20 ° C (hereinafter referred to as "liquid epoxy resin") and three or more epoxy groups in one molecule are contained. Further, a solid epoxy resin (hereinafter referred to as "solid epoxy resin") at a temperature of 20 ° C is preferred. In the case of an epoxy resin, a liquid epoxy resin and a solid epoxy resin are used together to obtain a resin composition having excellent flexibility. Further, the breaking strength of the solder resist layer formed by hardening the resin composition is also improved. In particular, when the resin composition is a thermosetting resin composition, it is preferred to use a liquid epoxy resin together with a solid epoxy resin. When the resin composition is a photocurable resin composition, it is preferred to use a solid epoxy resin as the epoxy resin.

液狀環氧樹脂方面,係以雙酚A型環氧樹脂、雙酚F型環氧樹脂、苯酚酚醛清漆型環氧樹脂、及萘型環氧樹脂為佳,雙酚A型環氧樹脂、雙酚F型環氧樹脂、及萘型環氧樹脂更佳。液狀環氧樹脂的具體例方面,可舉出DIC(股)製的「HP4032」、「HP4032D」、 「HP4032SS」(萘型環氧樹脂)、三菱化學(股)製的「jER828EL」(雙酚A型環氧樹脂)、「jER807」(雙酚F型環氧樹脂)、「jER152」(苯酚酚醛清漆型環氧樹脂)、新日鐵住金化學(股)製的「ZX1059」(雙酚A型環氧樹脂與雙酚F型環氧樹脂的混合品)、Nagase ChemteX(股)製的「EX-721」(環氧丙基酯型環氧樹脂)。此等可單獨使用1種或併用2種以上。 The liquid epoxy resin is preferably a bisphenol A epoxy resin, a bisphenol F epoxy resin, a phenol novolac epoxy resin, or a naphthalene epoxy resin, and a bisphenol A epoxy resin. Bisphenol F type epoxy resin and naphthalene type epoxy resin are more preferable. Specific examples of the liquid epoxy resin include "HP4032" and "HP4032D" manufactured by DIC Co., Ltd. "HP4032SS" (naphthalene type epoxy resin), "jER828EL" (bisphenol A type epoxy resin) manufactured by Mitsubishi Chemical Corporation, "jER807" (bisphenol F type epoxy resin), "jER152" (phenol novolac) "Zeel-type epoxy resin", "ZX1059" manufactured by Nippon Steel & Sumitomo Chemical Co., Ltd. (a mixture of bisphenol A epoxy resin and bisphenol F epoxy resin), and "EX" by Nagase ChemteX Co., Ltd. -721" (epoxypropyl ester type epoxy resin). These may be used alone or in combination of two or more.

固體狀環氧樹脂方面,係以萘型4官能環氧樹脂、甲酚酚醛清漆型環氧樹脂、二環戊二烯型環氧樹脂、參酚型環氧樹脂、萘酚酚醛清漆型環氧樹脂、聯苯型環氧樹脂、或萘醚型環氧樹脂為佳,萘型4官能環氧樹脂、聯苯型環氧樹脂、或萘醚型環氧樹脂更佳,萘型4官能環氧樹脂、聯苯型環氧樹脂又更佳。固體狀環氧樹脂的具體例方面,可舉出DIC(股)製的「HP-4700」、「HP-4710」(萘型4官能環氧樹脂)、「N-690」(甲酚酚醛清漆型環氧樹脂)、「N-695」(甲酚酚醛清漆型環氧樹脂)、「HP-7200」(二環戊二烯型環氧樹脂)、「EXA7311」、「EXA7311-G3」、「EXA7311-G4」、「EXA7311-G4S」、「HP6000」(萘醚型環氧樹脂)、日本化藥(股)製的「EPPN-502H」(參酚環氧樹脂)、「NC7000L」(萘酚酚醛清漆環氧樹脂)、「NC3000H」、「NC3000」、「NC3000L」、「NC3100」(聯苯型環氧樹脂)、新日鐵住金化學(股)製的「ESN475」(萘酚酚醛清漆型環氧樹脂)、 「ESN485V」(萘酚酚醛清漆型環氧樹脂)、三菱化學(股)製的「YX4000H」、「YL6121」(聯苯型環氧樹脂)、「YX4000HK」(聯二甲苯酚型環氧樹脂)、大阪氣體化學(股)製的「PG-100」、「CG-500」、三菱化學(股)製的「YL7800」(茀型環氧樹脂)等。 The solid epoxy resin is a naphthalene type 4-functional epoxy resin, a cresol novolak type epoxy resin, a dicyclopentadiene type epoxy resin, a phenol type epoxy resin, a naphthol novolac type epoxy. Resin, biphenyl type epoxy resin, or naphthalene ether type epoxy resin is preferred, naphthalene type 4-functional epoxy resin, biphenyl type epoxy resin, or naphthalene ether type epoxy resin is better, naphthalene type 4 functional epoxy Resin and biphenyl type epoxy resin are even better. Specific examples of the solid epoxy resin include "HP-4700" manufactured by DIC Co., Ltd., "HP-4710" (naphthalene type 4-functional epoxy resin), and "N-690" (cresol novolac varnish). Type epoxy resin), "N-695" (cresol novolac type epoxy resin), "HP-7200" (dicyclopentadiene type epoxy resin), "EXA7311", "EXA7311-G3", " "EXA7311-G4S", "EXA7311-G4S", "HP6000" (naphthalene ether type epoxy resin), "EPPN-502H" ("phenol epoxy resin", "NC7000L" (naphthol) manufactured by Nippon Kayaku Co., Ltd. "Novolak epoxy resin", "NC3000H", "NC3000", "NC3000L", "NC3100" (biphenyl type epoxy resin), "ESN475" manufactured by Nippon Steel & Sumitomo Chemical Co., Ltd. (naphthol novolac type) Epoxy resin), "ESN485V" (naphthol novolak type epoxy resin), "YX4000H", "YL6121" (biphenyl type epoxy resin) and "YX4000HK" (dixylenol type epoxy resin) manufactured by Mitsubishi Chemical Corporation "PG-100", "CG-500" manufactured by Osaka Gas Chemical Co., Ltd., and "YL7800" (茀-type epoxy resin) manufactured by Mitsubishi Chemical Corporation.

環氧樹脂方面,當併用液狀環氧樹脂與固體狀環氧樹脂時,該等的量比(液狀環氧樹脂:固體狀環氧樹脂)以質量比計,係以1:0.1~1:4的範圍為佳。藉由使液狀環氧樹脂與固體狀環氧樹脂的量比為該範圍,係可獲得下述效果:i)以樹脂薄片之形態使用時,具有適度的黏著性、ii)以樹脂薄片之形態使用時,可得充分的可撓性且取汲性提昇、iii)可得具有充分的斷裂強度之阻焊劑層等。從上述i)~iii)的效果之觀點來看,液狀環氧樹脂與固體狀環氧樹脂的量比(液狀環氧樹脂:固體狀環氧樹脂)以質量比計,係以1:0.3~1:3.5的範圍更佳,1:0.6~1:3的範圍又更佳,1:0.8~1:2.5的範圍特別佳。 In the case of epoxy resin, when a liquid epoxy resin and a solid epoxy resin are used in combination, the ratio (liquid epoxy resin: solid epoxy resin) is in a mass ratio of 1:0.1 to 1 The range of 4: is better. When the ratio of the amount of the liquid epoxy resin to the solid epoxy resin is in this range, the following effects can be obtained: i) having a moderate adhesiveness when used in the form of a resin sheet, and ii) a resin sheet When the form is used, sufficient flexibility can be obtained and the pick-up property can be improved, and iii) a solder resist layer having sufficient breaking strength can be obtained. From the viewpoint of the effects of the above i) to iii), the ratio of the liquid epoxy resin to the solid epoxy resin (liquid epoxy resin: solid epoxy resin) is expressed by mass ratio: The range of 0.3~1:3.5 is better, the range of 1:0.6~1:3 is better, and the range of 1:0.8~1:2.5 is particularly good.

樹脂組成物中環氧樹脂的含量,較佳為3質量%以上,更佳為5質量%以上,再更佳為7質量%以上或9質量%以上。環氧樹脂的含量的上限並無特別限定,較佳為50質量%以下,更佳為45質量%以下,又再更佳為40質量%以下或35質量%以下。 The content of the epoxy resin in the resin composition is preferably 3% by mass or more, more preferably 5% by mass or more, still more preferably 7% by mass or more, or 9% by mass or more. The upper limit of the content of the epoxy resin is not particularly limited, but is preferably 50% by mass or less, more preferably 45% by mass or less, still more preferably 40% by mass or less or 35% by mass or less.

此外,本發明中,構成樹脂組成物之各成分含量,係使樹脂組成物中不揮發成分的合計為100質量%時的值。 In the present invention, the content of each component constituting the resin composition is a value when the total amount of nonvolatile components in the resin composition is 100% by mass.

環氧樹脂的環氧當量,較佳為50~3000、更佳 為80~2000、再更佳為110~1000。因成為此範圍,硬化物的交聯密度充分,且具有耐熱性優異之阻焊劑層。此外,環氧當量係可依JIS K7236來測定,乃為含1當量環氧基之樹脂的質量。 The epoxy equivalent of the epoxy resin is preferably from 50 to 3,000, more preferably It is 80~2000, and even better it is 110~1000. In this range, the cured product has a sufficient crosslinking density and a solder resist layer excellent in heat resistance. Further, the epoxy equivalent system can be measured in accordance with JIS K7236, and is a mass of a resin containing 1 equivalent of an epoxy group.

環氧樹脂的重量平均分子量,較佳為100~5000、更佳為250~3000、再更佳為400~1500。在此,環氧樹脂的重量平均分子量乃是藉由膠體滲透層析(GPC)法所測定之聚苯乙烯換算的重量平均分子量。 The weight average molecular weight of the epoxy resin is preferably from 100 to 5,000, more preferably from 250 to 3,000, still more preferably from 400 to 1,500. Here, the weight average molecular weight of the epoxy resin is a polystyrene-equivalent weight average molecular weight measured by a colloidal permeation chromatography (GPC) method.

-(b)硬化劑- - (b) hardener -

硬化劑方面,若具有硬化環氧樹脂的機能的話,並無特別限定,例如,苯酚系硬化劑、萘酚系硬化劑、活性酯系硬化劑、苯并噁嗪系硬化劑、及氰酸酯之酯系硬化劑。硬化劑可單獨使用1種或併用2種以上。 The hardener is not particularly limited as long as it has a function of curing the epoxy resin, and examples thereof include a phenol-based curing agent, a naphthol-based curing agent, an active ester-based curing agent, a benzoxazine-based curing agent, and a cyanate ester. An ester curing agent. The curing agent may be used alone or in combination of two or more.

苯酚系硬化劑及萘酚系硬化劑方面,從可獲得耐熱性及耐水性優異的阻焊劑層之觀點來看,係以具有酚醛清漆構造之苯酚系硬化劑、或具有酚醛清漆構造之萘酚系硬化劑為佳。又,從可獲得與電路基板密著性優異的阻焊劑層之觀點來看,係以含氮苯酚系硬化劑為佳,含三嗪骨架之苯酚系硬化劑更佳。其中,更以可獲得高度地滿足耐熱性、耐水性、及與電路基板之密著性的阻焊劑層之觀點來看,係以含三嗪骨架之苯酚酚醛清漆樹脂為佳。 In the case of a phenol-based curing agent and a naphthol-based curing agent, a phenol-based curing agent having a novolac structure or a naphthol having a novolak structure is used from the viewpoint of obtaining a solder resist layer excellent in heat resistance and water resistance. A hardener is preferred. Moreover, from the viewpoint of obtaining a solder resist layer excellent in adhesion to a circuit board, a nitrogen-containing phenol-based curing agent is preferred, and a benzene-based curing agent containing a triazine skeleton is more preferable. Among them, a phenol novolak resin containing a triazine skeleton is preferred from the viewpoint of obtaining a solder resist layer which satisfies high heat resistance, water resistance, and adhesion to a circuit board.

苯酚系硬化劑及萘酚系硬化劑的具體例方面,可舉例如明和化成(股)製的「MEH-7700」、 「MEH-7810」、「MEH-7851」、日本化藥(股)製的「NHN」、「CBN」、「GPH」、東都化成(股)製的「SN170」、「SN180」、「SN190」、「SN475」、「SN485」、「SN495」、「SN375」、「SN395」、DIC(股)製的「LA7052」、「LA7054」、「LA3018」等。 Specific examples of the phenolic curing agent and the naphthol-based curing agent include "MEH-7700" manufactured by Mingwa Kasei Co., Ltd., "MEN-7", "MEH-7851", "Ninon", "CBN", "GPH", and "Tosho" ("SN170", "SN190", "SN190") made by Nippon Kayaku Co., Ltd. "LA7052", "LA7054", "LA3018", etc., "SN475", "SN485", "SN495", "SN375", "SN395", DIC (share) system.

從得到耐熱性優異的阻焊劑層之觀點來看,活性酯系硬化劑亦佳。活性酯系硬化劑方面,並無特別限制,一般以使用苯酚酯類、噻吩酯類、N-羥基胺酯類、雜環羥基化合物的酯類等之反應活性高的1分子中具有2個以上酯基之化合物為佳。該活性酯系硬化劑,係以藉由羧酸化合物及/或硫代羧酸化合物與羥基化合物及/或硫醇化合物之縮合反應所得者為佳。特別是從耐熱性提昇之觀點來看,係以由羧酸化合物與羥基化合物所得之活性酯系硬化劑為佳,由羧酸化合物與苯酚化合物及/或萘酚化合物所得之活性酯系硬化劑更佳。羧酸化合物方面,可舉例如安息香酸、酢酸、琥珀酸、馬來酸、伊康酸、苯二甲酸、間苯二甲酸、對苯二甲酸、均苯四甲酸等。苯酚化合物或萘酚化合物方面,可舉例如氫醌、間苯二酚、雙酚A、雙酚F、雙酚S、酚酞啉、甲基化雙酚A、甲基化雙酚F、甲基化雙酚S、苯酚、o-甲酚、m-甲酚、p-甲酚、苯二酚、α-萘酚、β-萘酚、1,5-二羥基萘、1,6-二羥基萘、2,6-二羥基萘、二羥基二苯甲酮、三羥基二苯甲酮、四羥基二苯甲酮、1,3,5-苯三酚、1,2,4-苯三酚、二環戊二烯型二苯酚化合物、苯酚酚醛清漆等。在此,所謂「二環戊二烯型 二苯酚化合物」,係於二環戊二烯1分子中使苯酚2分子縮合所得之二苯酚化合物。 From the viewpoint of obtaining a solder resist layer excellent in heat resistance, an active ester-based hardener is also preferable. The active ester-based curing agent is not particularly limited, and two or more molecules having high reactivity such as phenol esters, thiophene esters, N-hydroxylamine esters, and esters of heterocyclic hydroxy compounds are generally used. The ester group compound is preferred. The active ester-based curing agent is preferably obtained by a condensation reaction of a carboxylic acid compound and/or a thiocarboxylic acid compound with a hydroxy compound and/or a thiol compound. In particular, from the viewpoint of heat resistance improvement, an active ester-based hardener obtained from a carboxylic acid compound and a hydroxy compound is preferred, and an active ester-based hardener obtained from a carboxylic acid compound and a phenol compound and/or a naphthol compound is preferred. Better. Examples of the carboxylic acid compound include benzoic acid, citric acid, succinic acid, maleic acid, itaconic acid, phthalic acid, isophthalic acid, terephthalic acid, and pyromellitic acid. Examples of the phenol compound or the naphthol compound include hydroquinone, resorcin, bisphenol A, bisphenol F, bisphenol S, phenol porphyrin, methylated bisphenol A, methylated bisphenol F, and methyl group. Bisphenol S, phenol, o-cresol, m-cresol, p-cresol, benzenediol, α-naphthol, β-naphthol, 1,5-dihydroxynaphthalene, 1,6-dihydroxy Naphthalene, 2,6-dihydroxynaphthalene, dihydroxybenzophenone, trihydroxybenzophenone, tetrahydroxybenzophenone, 1,3,5-benzenetriol, 1,2,4-benzenetriol , a dicyclopentadiene type diphenol compound, a phenol novolak, and the like. Here, the so-called "dicyclopentadiene type The diphenol compound is a diphenol compound obtained by condensing 2 molecules of phenol in one molecule of dicyclopentadiene.

具體而言,係以含二環戊二烯型二苯酚構造之活性酯化合物、含萘構造之活性酯化合物、含苯酚酚醛清漆的乙醯基化物之活性酯化合物、含苯酚酚醛清漆的苯甲醯基化物之活性酯化合物為佳,其中,更以含萘構造之活性酯化合物、含二環戊二烯型二苯酚構造之活性酯化合物更佳。所謂「二環戊二烯型二苯酚構造」,表示由伸苯基-二環戊搭烯-伸苯基所成的2價構造單位。 Specifically, it is an active ester compound having a dicyclopentadiene type diphenol structure, an active ester compound containing a naphthalene structure, an active ester compound of an acetylated phenolic novolac-containing acetal, and a phenol containing novolac phenol varnish. The active ester compound of the mercapto compound is preferred, and an active ester compound having a naphthalene structure or an active ester compound having a dicyclopentadiene type diphenol structure is more preferable. The "dicyclopentadiene type diphenol structure" means a divalent structural unit composed of a phenyl-dicyclopentene-phenylene group.

活性酯系硬化劑的市售品方面,含二環戊二烯型二苯酚構造之活性酯化合物方面,可舉出「EXB9451」、「EXB9460」、「EXB9460S」、「HPC-8000-65T」(DIC(股)製),含萘構造之活性酯化合物方面,可舉出「EXB9416-70BK」(DIC(股)製),含苯酚酚醛清漆的乙醯基化物之活性酯化合物方面,可舉出「DC808」(三菱化學(股)製),含苯酚酚醛清漆的苯甲醯基化物之活性酯化合物方面,可舉出「YLH1026」(三菱化學(股)製)等。 As a commercial product of the active ester-based curing agent, "EXB9451", "EXB9460", "EXB9460S", and "HPC-8000-65T" are mentioned as the active ester compound containing a dicyclopentadiene type diphenol structure. In the case of the active ester compound containing a naphthalene structure, "EXB9416-70BK" (manufactured by DIC Co., Ltd.) and an active ester compound of an acetylated phenolic phenolic aldehyde varnish may be mentioned. "DC808" (manufactured by Mitsubishi Chemical Corporation), and "YLH1026" (manufactured by Mitsubishi Chemical Corporation), etc., may be mentioned as an active ester compound of a benzoquinone-based phenol phenol varnish.

苯并噁嗪系硬化劑的具體例方面,可舉出昭和高分子(股)製的「HFB2006M」、四國化成工業(股)製的「P-d」、「F-a」。 Specific examples of the benzoxazine-based curing agent include "HFB2006M" manufactured by Showa Polymer Co., Ltd., and "P-d" and "F-a" manufactured by Shikoku Chemical Industries Co., Ltd.

氰酸酯酯系硬化劑方面,可舉例如雙酚A二氰酸酯、聚苯酚氰酸酯、寡聚(3-亞甲基-1,5-伸苯基氰酸酯)、4,4’-亞甲基雙(2,6-二甲基苯基氰酸酯)、4,4’-亞 乙基二苯基二氰酸酯、六氟雙酚A二氰酸酯、2,2-雙(4-氰酸酯)苯基丙烷、1,1-雙(4-氰酸酯苯基甲烷)、雙(4-氰酸酯-3,5-二甲基苯基)甲烷、1,3-雙(4-氰酸酯苯基-1-(甲基亞乙基))苯、雙(4-氰酸酯苯基)硫醚、及雙(4-氰酸酯苯基)醚等之2官能氰酸酯樹脂、由苯酚酚醛清漆及甲酚酚醛清漆等所衍生的多官能氰酸酯樹脂、此等氰酸酯樹脂其一部分經三嗪化之預聚物等。氰酸酯酯系硬化劑的具體例方面,Lonza Japan(股)製的「PT30」及「PT60」(均為苯酚酚醛清漆型多官能氰酸酯酯樹脂)、「BA230」(雙酚A二氰酸酯的一部分或全部經三嗪化且成三量體之預聚物)等。 Examples of the cyanate ester-based curing agent include bisphenol A dicyanate, polyphenol cyanate, oligo (3-methylene-1,5-phenylphenyl cyanate), and 4,4. '-Methylene double (2,6-dimethylphenyl cyanate), 4,4'-Asia Ethyl diphenyl dicyanate, hexafluorobisphenol A dicyanate, 2,2-bis(4-cyanate) phenylpropane, 1,1-bis(4-cyanate phenylmethane) ), bis(4-cyanate-3,5-dimethylphenyl)methane, 1,3-bis(4-cyanate phenyl-1-(methylethylidene))benzene, bis ( Bifunctional cyanate resin such as 4-cyanate phenyl) sulfide and bis(4-cyanate phenyl) ether; polyfunctional cyanate derived from phenol novolac and cresol novolak A resin, a prepolymer of a part of such a cyanate resin which is triazineated, or the like. Specific examples of the cyanate ester-based curing agent, "PT30" and "PT60" manufactured by Lonza Japan Co., Ltd. (all are phenol novolac type polyfunctional cyanate ester resins), and "BA230" (bisphenol A II) A part or all of the cyanate ester is triazineated and formed into a trimer prepolymer).

與環氧樹脂與硬化劑之量比,以〔環氧樹脂的環氧基之合計數〕:〔硬化劑的反應基之合計數〕的比率計,較佳為1:0.2~1:2的範圍,1:0.3~1:1.5更佳,1:0.4~1:1.2又更佳。在此,所謂硬化劑的反應基,係活性羥基、活性酯基等,會因硬化劑的種類而異。又,所謂環氧樹脂的環氧基之合計數,係指將各環氧樹脂的固形分質量以環氧當量除後所得之值就全部的環氧樹脂之合計值,所謂硬化劑的反應基之合計數,係指將各硬化劑的固形分質量以反應基當量除了之後的值就全部的硬化劑所得合計之值。藉由使環氧樹脂與硬化劑之量比為該範圍,所得之阻焊劑層的耐熱性會更加提昇。 The ratio of the epoxy resin to the hardener is preferably from 1:0.2 to 1:2 in terms of the ratio of [the total number of epoxy groups of the epoxy resin]: [the total number of reactive groups of the hardener]. Range, 1:0.3~1:1.5 is better, 1:0.4~1:1.2 is better. Here, the reactive group of the curing agent is an active hydroxyl group, an active ester group or the like, which varies depending on the type of the curing agent. In addition, the total number of epoxy groups of the epoxy resin is the total value of all the epoxy resins obtained by dividing the solid content of each epoxy resin by the epoxy equivalent, and the reaction group of the hardener. The total number of the hardeners is the total value of the hardeners obtained by dividing the solid content of each of the hardeners by the reaction group equivalent. By making the ratio of the epoxy resin to the hardener in this range, the heat resistance of the resulting solder resist layer is further enhanced.

-(c)光硬化型鹼可溶性樹脂- - (c) Photocuring alkali-soluble resin -

光硬化型鹼可溶性樹脂方面,若為含鹼可溶基(例如,羧基、苯酚性羥基等)之光硬化性樹脂,並無特別限定,亦可使用形成印刷配線板的阻焊劑層時所使用的以往公知的光硬化型鹼可溶性樹脂。其中,更以光硬化型鹼可溶性樹脂方面,係以含鹼可溶基與自由基聚合性不飽和基之樹脂為佳,含羧基與自由基聚合性不飽和基之樹脂、含苯酚性羥基與自由基聚合性不飽和基之樹脂更佳。光硬化型鹼可溶性樹脂可單獨使用1種,亦可併用2種以上。 In the photocurable alkali-soluble resin, the photocurable resin containing an alkali-soluble group (for example, a carboxyl group or a phenolic hydroxyl group) is not particularly limited, and may be used when a solder resist layer for forming a printed wiring board is used. A conventionally known photocurable alkali-soluble resin. Among them, the photocurable alkali-soluble resin is preferably a resin containing an alkali-soluble group and a radical polymerizable unsaturated group, a resin having a carboxyl group and a radical polymerizable unsaturated group, and a phenol-containing hydroxyl group. The radical polymerizable unsaturated group-based resin is more preferable. The photocurable alkali-soluble resin may be used alone or in combination of two or more.

含羧基與自由基聚合性不飽和基之樹脂方面,可舉例如使環氧樹脂與不飽和羧酸反應,再使酸酐反應所形成之酸叉索型不飽和環氧酯樹脂等。 The resin containing a carboxyl group and a radically polymerizable unsaturated group may, for example, be a tether-type unsaturated epoxy ester resin obtained by reacting an epoxy resin with an unsaturated carboxylic acid and then reacting an acid anhydride.

環氧樹脂方面,係以使用與(a)成分同樣者即可,從獲得良好的顯像性、絕緣信賴性之觀點來看,係以雙酚F型環氧樹脂、雙酚A型環氧樹脂、甲酚酚醛清漆型環氧樹脂為佳,雙酚F型環氧樹脂、甲酚酚醛清漆型環氧樹脂更佳。環氧樹脂可單獨使用1種,亦可併用2種以上。 In terms of epoxy resin, it is only necessary to use the same component as (a). From the viewpoint of obtaining good developability and insulation reliability, it is a bisphenol F type epoxy resin or a bisphenol A type epoxy. A resin or a cresol novolac type epoxy resin is preferred, and a bisphenol F type epoxy resin or a cresol novolak type epoxy resin is more preferable. The epoxy resin may be used alone or in combination of two or more.

不飽和羧酸方面,可舉例如丙烯酸、甲基丙烯酸、桂皮酸、巴豆酸等,從可獲得良好的光硬化特性之觀點來看,係以丙烯酸、甲基丙烯酸為佳。不飽和羧酸可單獨使用1種,亦可併用2種以上。 Examples of the unsaturated carboxylic acid include acrylic acid, methacrylic acid, cinnamic acid, and crotonic acid, and acrylic acid and methacrylic acid are preferred from the viewpoint of obtaining good photocuring properties. The unsaturated carboxylic acid may be used alone or in combination of two or more.

羧酸酐方面,可舉例如無水馬來酸、無水琥珀酸、無水伊康酸、無水苯二甲酸、無水四氫苯二甲酸、無水六氫苯二甲酸、無水偏苯三甲酸、無水均苯四甲酸、 二苯甲酮四羧酸二無水物等,從可獲得良好的顯像性、絕緣信賴性之觀點來看,係以無水琥珀酸、無水四氫苯二甲酸為佳。酸酐可單獨使用1種,亦可併用2種以上。 The carboxylic acid anhydride may, for example, be anhydrous maleic acid, anhydrous succinic acid, anhydrous itaconic acid, anhydrous phthalic acid, anhydrous tetrahydrophthalic acid, anhydrous hexahydrophthalic acid, anhydrous trimellitic acid, anhydrous benzene. Formic acid, The benzophenone tetracarboxylic acid di-anhydrous or the like is preferably anhydrous succinic acid or anhydrous tetrahydrophthalic acid from the viewpoint of obtaining good developability and insulating reliability. The acid anhydride may be used alone or in combination of two or more.

酸叉索型不飽和環氧酯樹脂,在觸媒的存在下,係藉由使不飽和羧酸與環氧樹脂反應而形成不飽和環氧酯樹脂,並使該不飽和環氧酯樹脂與酸酐反應而得。該反應係為公知,而反應溫度、反應時間、觸媒的種類或使用量等之反應條件係由該領域之業者適當地決定即可。 A tethered unsaturated epoxy ester resin, in the presence of a catalyst, forms an unsaturated epoxy ester resin by reacting an unsaturated carboxylic acid with an epoxy resin, and the unsaturated epoxy ester resin is Anhydride is obtained by reaction. The reaction is known, and the reaction conditions such as the reaction temperature, the reaction time, the type of the catalyst, and the amount used are appropriately determined by those skilled in the art.

酸叉索型不飽和環氧酯樹脂亦可使用市售品。市售品方面,可舉例如日本化藥(股)製「ZFR-1533H」(雙酚F型環氧樹脂、丙烯酸、及無水四氫苯二甲酸的反應物)、「ZAR-2000」(雙酚A型環氧樹脂、丙烯酸、及無水琥珀酸的反應物)、昭和電工(股)製「PR-3000」(甲酚酚醛清漆型環氧樹脂、丙烯酸、及羧酸酐的反應物)等。 Commercially available products can also be used as the acid-fork type unsaturated epoxy ester resin. For the commercially available product, for example, "ZFR-1533H" (a reaction product of bisphenol F type epoxy resin, acrylic acid, and anhydrous tetrahydrophthalic acid) and "ZAR-2000" (double) manufactured by Nippon Kayaku Co., Ltd. "Reactant of phenol A type epoxy resin, acrylic acid, and anhydrous succinic acid", "PR-3000" (reactive material of cresol novolac type epoxy resin, acrylic acid, and carboxylic anhydride) manufactured by Showa Denko.

含苯酚性羥基與自由基聚合性不飽和基之樹脂,例如,可使含苯酚性羥基之樹脂與含自由基聚合性不飽和基與異氰酸酯基之化合物反應來合成。 The resin containing a phenolic hydroxyl group and a radical polymerizable unsaturated group can be synthesized, for example, by reacting a resin having a phenolic hydroxyl group with a compound containing a radical polymerizable unsaturated group and an isocyanate group.

含苯酚性羥基之樹脂方面,可舉例如苯酚酚醛清漆樹脂、甲酚酚醛清漆樹脂、雙酚A酚醛清漆樹脂、萘酚酚醛清漆樹脂,從可獲得良好的顯像性、絕緣信賴性之觀點來看,係以苯酚酚醛清漆樹脂、甲酚酚醛清漆樹脂為佳。含苯酚性羥基之樹脂可單獨使用1種,亦可併用2種以上。 Examples of the phenolic hydroxyl group-containing resin include a phenol novolak resin, a cresol novolak resin, a bisphenol A novolac resin, and a naphthol novolak resin, from the viewpoint of obtaining good developability and insulation reliability. It is preferable to use a phenol novolak resin or a cresol novolak resin. The phenolic hydroxyl group-containing resin may be used alone or in combination of two or more.

含自由基聚合性不飽和基與異氰酸酯基之化合物方面,可舉例如使(甲基)丙烯醯基異氰酸酯、異氰酸酯乙基(甲基)丙烯酸酯;及聚異氰酸酯化合物與具有可與異氰酸酯基反應之官能基(例如,羥基)的(甲基)丙烯酸酯化合物部分性地加成反應所得之反應生成物等。在此,聚異氰酸酯化合物方面,可舉例如3-異氰酸酯-3,5,5-三甲基環己基異氰酸酯、三氯乙烯二異氰酸酯、六亞甲基二異氰酸酯、異佛爾酮二異氰酸酯、亞甲基聯苯基異氰酸酯、聚亞甲基聚苯基聚異氰酸酯等,具有可與異氰酸酯基反應之官能基的(甲基)丙烯酸酯化合物方面,可舉例如季戊四醇三(甲基)丙烯酸酯、2-羥基乙基(甲基)丙烯酸酯、N-羥甲基丙烯醯胺、丙三醇二(甲基)丙烯酸酯、二季戊四醇五(甲基)丙烯酸酯等。 Examples of the compound containing a radical polymerizable unsaturated group and an isocyanate group include (meth)acryl decyl isocyanate and isocyanate ethyl (meth) acrylate; and a polyisocyanate compound having a reaction with an isocyanate group. The (meth) acrylate compound of a functional group (for example, a hydroxyl group) is partially added to the reaction product obtained by the reaction, and the like. Here, examples of the polyisocyanate compound include 3-isocyanate-3,5,5-trimethylcyclohexyl isocyanate, trichloroethylene diisocyanate, hexamethylene diisocyanate, isophorone diisocyanate, and methylene. Examples of the (meth) acrylate compound having a functional group reactive with an isocyanate group, such as a phenyl phenyl isocyanate or a polymethylene polyphenyl polyisocyanate, may, for example, be pentaerythritol tri(meth) acrylate or 2- Hydroxyethyl (meth) acrylate, N-methylol acrylamide, glycerol di(meth) acrylate, dipentaerythritol penta (meth) acrylate, and the like.

含苯酚性羥基與自由基聚合性不飽和基之樹脂,係可在觸媒的存在下,使含苯酚性羥基之樹脂與含自由基聚合性不飽和基與異氰酸酯基之化合物反應而得。該反應係為公知,而反應溫度、反應時間、觸媒的種類或使用量等之反應條件係由該領域之業者適當地決定即可。 The resin containing a phenolic hydroxyl group and a radical polymerizable unsaturated group can be obtained by reacting a phenolic hydroxyl group-containing resin with a compound containing a radical polymerizable unsaturated group and an isocyanate group in the presence of a catalyst. The reaction is known, and the reaction conditions such as the reaction temperature, the reaction time, the type of the catalyst, and the amount used are appropriately determined by those skilled in the art.

光硬化型鹼可溶性樹脂的聚苯乙烯換算之數平均分子量(Mn),從可獲得良好的解像性之觀點來看,較佳為500~1000000、更佳為1000~50000、再更佳為1500~35000。光硬化型鹼可溶性樹脂的Mn,例如,可藉由膠體浸透層析(GPC)法來測定。(GPC)法(聚苯乙烯換算)可測定。Mn係以例如使用(股)島津製作所製 LC-9A/RID-6A作為測定裝置,管柱方面使用昭和電工(股)製Shodex K-800P/K-804L/K-804L,移動相為氯仿等,以管柱溫度40℃進行測定,並使用標準聚苯乙烯檢量線來算出。 The polystyrene-equivalent number average molecular weight (Mn) of the photocurable alkali-soluble resin is preferably from 500 to 1,000,000, more preferably from 1,000 to 50,000, still more preferably from the viewpoint of obtaining good resolution. 1500~35000. The Mn of the photocurable alkali-soluble resin can be measured, for example, by a colloidal permeation chromatography (GPC) method. The (GPC) method (in terms of polystyrene) can be measured. For example, the Mn system is manufactured by Shimadzu Corporation. LC-9A/RID-6A was used as a measuring device, and Shodex K-800P/K-804L/K-804L manufactured by Showa Denko Co., Ltd. was used for the column, and the mobile phase was chloroform, and the column temperature was measured at 40 ° C. Calculated using standard polystyrene calibration lines.

光硬化型鹼可溶性樹脂的固形分酸價,從可獲得顯示出良好的絕緣信賴性的阻焊劑層之觀點來看,較佳為100mgKOH/g以下,更佳為90mgKOH/g以下,再更佳為80mgKOH/g以下或70mgKOH/g以下。只要在能夠獲得充分的顯像性的情況下,固形分酸價以更低者為佳,從該觀點來看,光硬化型鹼可溶性樹脂方面,係以含苯酚性羥基與自由基聚合性不飽和基之樹脂特別佳。 The solid acid value of the photocurable alkali-soluble resin is preferably 100 mgKOH/g or less, more preferably 90 mgKOH/g or less, from the viewpoint of obtaining a solder resist layer exhibiting good insulation reliability. It is 80 mgKOH/g or less or 70 mgKOH/g or less. As long as the sufficient developability is obtained, the solid acid value is preferably lower. From this point of view, the photocurable alkali-soluble resin is a phenol-containing hydroxyl group and a radical polymerizable property. Saturated base resins are particularly preferred.

樹脂組成物中光硬化型鹼可溶性樹脂的含量,從可得良好的顯像性之觀點來看,較佳為10質量%以上,更佳為15質量%以上,再更佳為20質量%以上。光硬化型鹼可溶性樹脂的含量上限,從可得耐熱性優異的阻焊劑層之觀點來看,較佳為60質量%以下,更佳為50質量%以下,再更佳為40質量%以下。 The content of the photocurable alkali-soluble resin in the resin composition is preferably 10% by mass or more, more preferably 15% by mass or more, and still more preferably 20% by mass or more from the viewpoint of obtaining good developability. . The upper limit of the content of the photocurable alkali-soluble resin is preferably 60% by mass or less, more preferably 50% by mass or less, and still more preferably 40% by mass or less from the viewpoint of obtaining a solder resist layer having excellent heat resistance.

-(d)光聚合起始劑- -(d) Photopolymerization initiator -

光聚合起始劑方面,並無特別限定,可舉例如2-芐基-2-二甲基胺基-1-(4-嗎啉基苯基)-1-丁酮、2-(二甲基胺基)-2-〔(4-甲基苯基)甲基〕-〔4-(4-嗎啉基)苯基〕-1-丁酮、2-甲基-〔4-(甲基硫代基)苯基〕-嗎啉基-1-丙酮、二苯甲酮、甲基二苯甲酮、o-苯甲醯基安息香 酸、苯甲醯基乙基醚、2,2-二乙氧基苯乙酮、2,4-二乙基硫代基氧雜蒽酮、雙(2,4,6-三甲基苯甲醯基)-苯基膦氧化物、乙基-(2,4,6-三甲基苯甲醯基)苯基膦酸鹽、4,4’-雙(二乙基胺基)二苯甲酮、1-羥基-環己基-苯基酮、2,2-二甲氧基-1,2-二苯基乙烷-1-酮、1-〔4-(2-羥基乙氧基)-苯基〕-2-羥基-2-甲基-1-丙烷-1-酮等之烷基醯苯系光聚合起始劑;雙(2,4,6-三甲基苯甲醯基)-苯基膦氧化物等之醯基膦氧化物系光聚合起始劑;1,2-辛烷二酮,1-〔4-(苯基硫代基)-,2-(O-苯甲醯基肟)〕及乙酮,1-〔9-乙基-6-(2-甲基苯甲醯基)-9H-咔唑-3-基〕-,1-(O-乙醯基肟)等之肟酯系光聚合起始劑;及鋶鹽系光聚合起始劑等,以醯基膦氧化物系光聚合起始劑、肟酯系光聚合起始劑為佳。光聚合起始劑可單獨使用1種,亦可併用2種以上。 The photopolymerization initiator is not particularly limited, and examples thereof include 2-benzyl-2-dimethylamino-1-(4-morpholinylphenyl)-1-butanone and 2-(dimethylidene). Amino)-2-[(4-methylphenyl)methyl]-[4-(4-morpholinyl)phenyl]-1-butanone, 2-methyl-[4-(methyl Thio)phenyl]-morpholinyl-1-propanone, benzophenone, methylbenzophenone, o-benzylidene benzoin Acid, benzhydryl ethyl ether, 2,2-diethoxyacetophenone, 2,4-diethylthioxanthone, bis(2,4,6-trimethylbenzene) Mercapto)-phenylphosphine oxide, ethyl-(2,4,6-trimethylbenzylidene)phenylphosphonate, 4,4'-bis(diethylamino)benzol Ketone, 1-hydroxy-cyclohexyl-phenyl ketone, 2,2-dimethoxy-1,2-diphenylethane-1-one, 1-[4-(2-hydroxyethoxy)- Alkyl benzene-based photopolymerization initiators such as phenyl]-2-hydroxy-2-methyl-1-propan-1-one; bis(2,4,6-trimethylbenzylidene)- a mercaptophosphine oxide photopolymerization initiator such as phenylphosphine oxide; 1,2-octanedione, 1-[4-(phenylthio)-, 2-(O-benzamide)肟)) and ethyl ketone, 1-[9-ethyl-6-(2-methylbenzhydryl)-9H-indazol-3-yl]-, 1-(O-ethylindenyl) The oxime-based photopolymerization initiator, and the sulfonium-based photopolymerization initiator are preferably a mercaptophosphine oxide photopolymerization initiator or an oxime ester photopolymerization initiator. The photopolymerization initiator may be used singly or in combination of two or more.

光聚合起始劑的市售品方面,可舉例如BASF JAPAN(股)製「IRGACURE 819」(雙(2,4,6-三甲基苯甲醯基)-苯基膦氧化物)、「IRGACURE 907」(2-甲基-〔4-(甲基硫代基)苯基〕-嗎啉基-1-丙酮)、「OXE-01」(1,2-辛烷二酮,1-〔4-(苯基硫代基)-,2-(O-苯甲醯基肟)〕)、「OXE-02」(乙酮,1-〔9-乙基-6-(2-甲基苯甲醯基)-9H-咔唑-3-基〕-,1-(O-乙醯基肟))等。 For the commercially available product of the photopolymerization initiator, for example, "IRGACURE 819" (bis(2,4,6-trimethylbenzylidene)-phenylphosphine oxide) manufactured by BASF JAPAN Co., Ltd., " IRGACURE 907" (2-methyl-[4-(methylthio)phenyl]-morpholinyl-1-propanone), "OXE-01" (1,2-octanedione, 1-[ 4-(phenylthio)-, 2-(O-benzylidene hydrazide)]), "OXE-02" (ethanone, 1-[9-ethyl-6-(2-methylbenzene) Mercapto)-9H-carbazol-3-yl]-, 1-(O-ethylindenyl)) and the like.

樹脂組成物中光聚合起始劑的含量,從可獲得良好的光硬化特性、絕緣信賴性之觀點來看,較佳為0.1質量%以上,更佳為0.2質量%以上,再更佳為0.3質 量%以上。光聚合起始劑的含量的上限,從防止因感度過多導致尺寸安定性的降低之觀點來看,較佳為2質量%以下,更佳為1.5質量%以下,再更佳為1質量%以下。 The content of the photopolymerization initiator in the resin composition is preferably 0.1% by mass or more, more preferably 0.2% by mass or more, and still more preferably 0.3, from the viewpoint of obtaining good photocuring properties and insulation reliability. quality More than %. The upper limit of the content of the photopolymerization initiator is preferably 2% by mass or less, more preferably 1.5% by mass or less, even more preferably 1% by mass or less from the viewpoint of preventing a decrease in dimensional stability due to excessive sensitivity. .

-(e)光增感劑- - (e) Photosensitizer -

光增感劑方面,可舉例如三級胺類、吡喃酮(pyrarizone)類、蒽類、香豆素類、氧雜蒽酮類、噻吨酮類等,以噻吨酮類為佳,2,4-二乙基硫代基氧雜蒽酮更佳。光增感劑可單獨使用1種,亦可併用2種以上。光增感劑的市售品方面,可舉例如日本化藥(股)製「DETX-S」(2,4-二乙基硫代基氧雜蒽酮)。 Examples of the photosensitizer include tertiary amines, pyrarizones, anthraquinones, coumarins, xanthones, and thioxanthones, and thioxanthones are preferred. More preferably, 2,4-diethylthioxanthone. The photosensitizer may be used alone or in combination of two or more. For the commercial product of the photosensitizer, for example, "DETX-S" (2,4-diethylthioxanthone) manufactured by Nippon Kayaku Co., Ltd. can be mentioned.

樹脂組成物中光增感劑的含量,從可獲得良好的光硬化特性之觀點來看,較佳為0.01質量%~1質量%、更佳為0.05質量%~0.5質量%。 The content of the photosensitizer in the resin composition is preferably from 0.01% by mass to 1% by mass, and more preferably from 0.05% by mass to 0.5% by mass, from the viewpoint of obtaining good photocuring properties.

-(f)稀釋劑- - (f) thinner -

稀釋劑乃是為了促進樹脂組成物的光硬化反應所使用的。稀釋劑方面,可舉例如分子內具有1個以上(甲基)丙烯醯基之室溫下為液體、固體或半固形的感光性(甲基)丙烯酸酯化合物。 The diluent is used to promote the photohardening reaction of the resin composition. The diluent may, for example, be a photosensitive (meth) acrylate compound which has a liquid, a solid or a semi-solid at room temperature, and has one or more (meth) acryloyl fluorenyl groups in the molecule.

代表的感光性(甲基)丙烯酸酯化合物方面,可舉例如2-羥基乙基丙烯酸酯、2-羥基丁基丙烯酸酯等之羥基烷基丙烯酸酯類;乙二醇、甲氧基四乙二醇、聚乙二醇、丙二醇、三環癸烷二甲醇等之二醇化合物的單或 二丙烯酸酯類;N,N-二甲基丙烯醯胺、N-羥甲基丙烯醯胺等之丙烯醯胺類;N,N-二甲基胺基乙基丙烯酸酯等之胺基烷基丙烯酸酯類;三羥甲基丙烷、季戊四醇、二季戊四醇等之多元醇或此等之氧化乙烯、氧化丙烯或ε-己內酯的加成物的多價丙烯酸酯類;苯氧基丙烯酸酯、苯氧基乙基丙烯酸酯等之苯酚類或其氧化乙烯或氧化丙烯加成物等之丙烯酸酯類;由三羥甲基丙烷三環氧丙基醚等之環氧丙基醚所衍生之環氧丙烯酸酯類;三聚氰胺丙烯酸酯類;及/或對應上述丙烯酸酯之甲基丙烯酸酯類等。其中,更以二醇化合物的單或二(甲基)丙烯酸酯類、多價(甲基)丙烯酸酯類為佳。 Examples of the photosensitive (meth) acrylate compound include hydroxyalkyl acrylates such as 2-hydroxyethyl acrylate and 2-hydroxybutyl acrylate; ethylene glycol and methoxytetraethylene a single or a diol compound of an alcohol, polyethylene glycol, propylene glycol, tricyclodecane dimethanol or the like Diacrylates; acrylamides such as N,N-dimethyl decylamine, N-methylol acrylamide; aminoalkyl groups such as N,N-dimethylaminoethyl acrylate a polyvalent acrylate such as an acrylate; a polyhydric alcohol such as trimethylolpropane, pentaerythritol or dipentaerythritol; or an adduct of such ethylene oxide, propylene oxide or ε-caprolactone; phenoxy acrylate; a phenol such as phenoxyethyl acrylate or an acrylate such as an ethylene oxide or propylene oxide addition; a ring derived from a glycopropyl ether such as trimethylolpropane triepoxypropyl ether Oxy acrylates; melamine acrylates; and/or methacrylates corresponding to the above acrylates. Among them, mono or di(meth)acrylates and polyvalent (meth)acrylates of the diol compound are more preferred.

稀釋劑可單獨使用1種,亦可併用2種以上。稀釋劑的市售品方面,可舉例如日本化藥(股)「DPHA」(二季戊四醇六丙烯酸酯)、共榮社化學工業(股)製「DCPA」(三環癸烷二甲醇二丙烯酸酯)等。 The diluent may be used singly or in combination of two or more. For the commercial product of the diluent, for example, Nippon Chemical Co., Ltd. "DPHA" (dipentaerythritol hexaacrylate) and Kyoritsu Chemical Industry Co., Ltd. "DCPA" (tricyclodecane dimethanol diacrylate) )Wait.

樹脂組成物中稀釋劑的含量,從使光硬化反應促進之觀點、防止硬化物的黏附之觀點來看,較佳為0.5質量%~10質量%、更佳為2質量%~8質量%。 The content of the diluent in the resin composition is preferably from 0.5% by mass to 10% by mass, more preferably from 2% by mass to 8% by mass, from the viewpoint of promoting the photocuring reaction and preventing adhesion of the cured product.

-(g)無機填充材- - (g) inorganic filler -

無機填充材方面,可舉例如氧化矽、氧化鋁、玻璃、菫青石、矽酸化物、硫酸鋇、滑石、黏土、雲母粉、氫氧化鋁、氫氧化鎂、碳酸鈣、碳酸鎂、氧化鎂、氮化硼、氮化鋁、氮化錳、硼酸鋁、鈦酸鋇、鈦酸鍶、鈦酸鈣、鈦酸 鎂、鈦酸鉍、氧化鈦、鋯酸鋇、鋯酸鈣、磷酸鋯、及磷酸鎢酸鋯等。此等之中,更以無定形氧化矽、溶融氧化矽、結晶氧化矽、合成氧化矽、中空氧化矽等之氧化矽特別佳。又氧化矽方面,以球狀氧化矽為佳。無機填充材可單獨使用1種,亦可組合2種以上使用。市售的球狀溶融氧化矽方面,可舉例如(股)Admatechs製「SOC1」、「SOC2」、「SOC3」及「SOC4」、電氣化學工業(股)製「UFP-30」、「UFP-80」。 Examples of the inorganic filler include cerium oxide, aluminum oxide, glass, cordierite, ceric acid, barium sulfate, talc, clay, mica powder, aluminum hydroxide, magnesium hydroxide, calcium carbonate, magnesium carbonate, magnesium oxide, and the like. Boron nitride, aluminum nitride, manganese nitride, aluminum borate, barium titanate, barium titanate, calcium titanate, titanic acid Magnesium, barium titanate, titanium oxide, barium zirconate, calcium zirconate, zirconium phosphate, zirconium tungstate phosphate, and the like. Among these, cerium oxide such as amorphous cerium oxide, molten cerium oxide, crystalline cerium oxide, synthetic cerium oxide, hollow cerium oxide or the like is particularly preferable. In addition to cerium oxide, spherical cerium oxide is preferred. The inorganic filler may be used singly or in combination of two or more. For example, "UC1", "SOC2", "SOC3" and "SOC4" manufactured by Admatechs, "UFP-30" manufactured by Electrochemical Industry Co., Ltd., and "UFP-" are commercially available. 80".

無機填充材的平均粒徑並無特別限定,因應所期望之特性來適當地決定即可。從提高無機填充材的分散性之觀點來看,無機填充材的平均粒徑,較佳為0.01μm以上,更佳為0.05μm以上。從獲得充分的絕緣信賴性之觀點來看,無機填充材的平均粒徑,較佳為4μm以下,更佳為3μm以下,再更佳為2μm以下,又再更佳為1μm以下。此外,當樹脂組成物為光硬化性樹脂組成物時,無機填充材的平均粒徑的上限,從獲得良好的光硬化特性之觀點來看,較佳為1μm以下,更佳為0.8μm以下,再更佳為0.6μm以下或0.4μm以下。無機填充材的平均粒徑乃是藉由基於米氏(Mie)散射理論之雷射繞射.散射法來測定。具體而言,藉由雷射繞射散射式粒度分佈測定裝置,可以體積基準作成無機填充材的粒度分佈,並取其中位數徑作為平均粒徑來進行測定。測定樣品,較佳係使無機填充材藉由超音波分散於水中。雷射繞射散射式粒度分佈測定裝置方面,可使用(股)堀場製作所製 「LA-500」等。 The average particle diameter of the inorganic filler is not particularly limited, and may be appropriately determined depending on desired characteristics. The average particle diameter of the inorganic filler is preferably 0.01 μm or more, and more preferably 0.05 μm or more, from the viewpoint of improving the dispersibility of the inorganic filler. The average particle diameter of the inorganic filler is preferably 4 μm or less, more preferably 3 μm or less, still more preferably 2 μm or less, still more preferably 1 μm or less from the viewpoint of obtaining sufficient insulation reliability. In addition, when the resin composition is a photocurable resin composition, the upper limit of the average particle diameter of the inorganic filler is preferably 1 μm or less, and more preferably 0.8 μm or less from the viewpoint of obtaining good photocuring properties. More preferably, it is 0.6 μm or less or 0.4 μm or less. The average particle size of the inorganic filler is by laser diffraction based on the Mie scattering theory. Determine by scattering method. Specifically, the laser diffraction scattering type particle size distribution measuring apparatus can measure the particle size distribution of the inorganic filler by volume and measure the median diameter as the average particle diameter. The sample is preferably measured by dispersing the inorganic filler in water by ultrasonic waves. For the laser diffraction scattering type particle size distribution measuring device, it can be used by the market. "LA-500" and so on.

無機填充材,從提高耐濕性及分散性之觀點來看,係以可用胺基矽烷系耦合劑、環氧矽烷系耦合劑、巰基矽烷系耦合劑、矽烷系耦合劑、有機矽氮烷化合物、鈦酸鹽系耦合劑等之1種以上的表面處理劑來處理者為佳。表面處理劑的市售品方面,可舉例如信越化學工業(股)製「KBM403」(3-環氧丙氧基丙基三甲氧基矽烷)、信越化學工業(股)製「KBM803」(3-驗基丙基三甲氧基矽烷)、信越化學工業(股)製「KBE903」(3-胺基丙基三乙氧基矽烷)、信越化學工業(股)製「KBM573」(N-苯基-3-胺基丙基三甲氧基矽烷)、信越化學工業(股)製「SZ-31」(六甲基二矽氮烷)等。 The inorganic filler is an amine decane-based coupling agent, an epoxy decane-based coupling agent, a mercapto decane-based coupling agent, a decane-based coupling agent, and an organic decazane compound from the viewpoint of improving moisture resistance and dispersibility. It is preferred to treat one or more kinds of surface treatment agents such as a titanate-based coupling agent. For the commercially available product of the surface treatment agent, for example, KBM403 (3-glycidoxypropyltrimethoxydecane) manufactured by Shin-Etsu Chemical Co., Ltd., and "KBM803" manufactured by Shin-Etsu Chemical Co., Ltd. (3) - "Ketidylpropyltrimethoxydecane", "KBE903" (3-aminopropyltriethoxydecane) manufactured by Shin-Etsu Chemical Co., Ltd., "KBM573" (N-phenyl) manufactured by Shin-Etsu Chemical Co., Ltd. 3-Aminopropyltrimethoxydecane), "SZ-31" (hexamethyldioxane) manufactured by Shin-Etsu Chemical Co., Ltd., etc.

以表面處理劑所達成的表面處理程度,可藉由無機填充材的每單位表面積之碳量來評價。無機填充材的每單位表面積之碳量,從無機填充材的分散性提昇之觀點來看,係以0.02mg/m2以上為佳,0.1mg/m2以上更佳,0.2mg/m2以上再更佳。另一方面,從防止樹脂塗漆的溶融黏度或在薄片形態下之溶融黏度上昇之觀點來看,係以1mg/m2以下為佳,0.8mg/m2以下更佳,0.5mg/m2以下再更佳。 The degree of surface treatment achieved by the surface treatment agent can be evaluated by the amount of carbon per unit surface area of the inorganic filler. The amount of carbon per unit surface area of the inorganic filler is preferably 0.02 mg/m 2 or more, more preferably 0.1 mg/m 2 or more, and 0.2 mg/m 2 or more from the viewpoint of improving the dispersibility of the inorganic filler. Better again. On the other hand, from the viewpoint of preventing the melt viscosity of the resin paint or the melt viscosity in the sheet form, it is preferably 1 mg/m 2 or less, more preferably 0.8 mg/m 2 or less, and 0.5 mg/m 2 . The following is even better.

無機填充材的每單位表面積之碳量,係可將表面處理後的無機填充材藉由溶劑(例如,甲基乙基酮(MEK))洗淨處理之後予以測定。具體而言,在溶劑方面,係可將充分量的MEK加入已經表面處理劑表面處理 之無機填充材中,在25℃超音波洗淨5分鐘。去除上清液,使固形分乾燥之後,使用碳分析計測定無機填充材的每單位表面積之碳量。碳分析計方面,可使用(股)堀場製作所製「EMIA-320V」等。 The amount of carbon per unit surface area of the inorganic filler can be measured by washing the surface-treated inorganic filler with a solvent (for example, methyl ethyl ketone (MEK)). Specifically, in terms of solvent, a sufficient amount of MEK can be added to the surface treatment of the surface treatment agent. In the inorganic filler, the ultrasonic wave was washed at 25 ° C for 5 minutes. After the supernatant was removed and the solid fraction was dried, the amount of carbon per unit surface area of the inorganic filler was measured using a carbon analyzer. For the carbon analyzer, "EMIA-320V" manufactured by Horiba Ltd. can be used.

樹脂組成物中無機填充材的含量,在可獲得顯示出所期望的彈性率之阻焊劑層下,並無特別限定。雖視環氧樹脂或硬化劑的種類而異,但若提高樹脂組成物中無機填充材的含量,則該樹脂組成物的硬化後的彈性率會有變高的傾向。例如,硬化後顯示出6GPa以上高彈性率(23℃)之樹脂組成物層,進而在形成阻焊劑層時,樹脂組成物中無機填充材的含量係以60質量%以上者為佳。硬化後的彈性率(23℃)又再更高的樹脂組成物層,進而在形成阻焊劑層時,樹脂組成物中無機填充材的含量係以65質量%以上者更佳、70質量%以上或75質量%以上者又更佳。 The content of the inorganic filler in the resin composition is not particularly limited as long as a solder resist layer exhibiting a desired elastic modulus can be obtained. Although depending on the type of the epoxy resin or the curing agent, when the content of the inorganic filler in the resin composition is increased, the elastic modulus of the resin composition after curing tends to be high. For example, a resin composition layer having a high modulus of elasticity (23 ° C) of 6 GPa or more after curing is formed, and when the solder resist layer is formed, the content of the inorganic filler in the resin composition is preferably 60% by mass or more. The resin composition layer having a higher modulus of elasticity (23 ° C) after hardening, and further, when the solder resist layer is formed, the content of the inorganic filler in the resin composition is preferably 65 mass% or more, and 70 mass% or more. Or 75 mass% or more is even better.

一實施形態中,第1樹脂組成物層,進而第1阻焊劑層中所使用的樹脂組成物中無機填充材的含量,較佳為60質量%以上,更佳為65質量%以上,再更佳為70質量%以上或75質量%以上。第1樹脂組成物層中所使用的樹脂組成物中無機填充材的含量的上限,並無特別限定,從所得之阻焊劑層的機械強度之觀點來看,通常為95質量%以下,可為90質量%以下。 In one embodiment, the content of the inorganic filler in the resin composition used in the first resin composition layer and the first solder resist layer is preferably 60% by mass or more, more preferably 65% by mass or more, and still more. Preferably, it is 70% by mass or more or 75% by mass or more. The upper limit of the content of the inorganic filler in the resin composition used in the first resin composition layer is not particularly limited, and is usually 95% by mass or less from the viewpoint of mechanical strength of the obtained solder resist layer. 90% by mass or less.

第2樹脂組成物層,進而第2阻焊劑層中所使用的樹脂組成物中無機填充材的含量,在可獲得能夠顯 示所期望的彈性率之第2阻焊劑層的情況下,係以因應所期望之特性來適當地決定即可,並以從較佳為0質量%~95質量%的範圍、更佳為20質量%~85質量%的範圍中適當地決為佳。 The content of the inorganic filler in the resin composition used in the second resin composition layer and the second solder resist layer can be obtained. In the case of the second solder resist layer having a desired modulus of elasticity, it may be appropriately determined depending on the desired characteristics, and is preferably in the range of preferably 0% by mass to 95% by mass, more preferably 20%. It is preferable to suitably determine the range of the mass % to 85% by mass.

較佳的一實施形態中,第1樹脂組成物層中所使用的樹脂組成物係熱硬化性樹脂組成物,包含上述的(a)環氧樹脂、(b)硬化劑、及(g)無機填充材。該實施形態中,第1樹脂組成物層中所使用的熱硬化性樹脂組成物,係以分別包含下述成分為佳:作為(a)環氧樹脂之液狀環氧樹脂與固體狀環氧樹脂所成的混合物(液狀環氧樹脂:固體狀環氧樹脂的質量比係以1:0.1~1:4的範圍為佳,1:0.3~1:3.5的範圍更佳,1:0.6~1:3的範圍又更佳,1:0.8~1:2.5的範圍又再更佳)、作為(b)硬化劑由苯酚系硬化劑、萘酚系硬化劑、活性酯系硬化劑及氰酸酯酯系硬化劑所成之群選出的1種以上(較佳為由苯酚系硬化劑、萘酚系硬化劑及活性酯系硬化劑所成之群選出的1種以上)、作為(g)無機填充材之氧化矽。有關包含組合該特定的成分所成之熱硬化性樹脂組成物,(a)環氧樹脂、(b)硬化劑及(g)無機填充材的較佳含量係如上述。 In a preferred embodiment, the resin composition used in the first resin composition layer is a thermosetting resin composition comprising the above (a) epoxy resin, (b) a curing agent, and (g) inorganic Filling material. In the embodiment, the thermosetting resin composition used in the first resin composition layer preferably contains the following components: a liquid epoxy resin as the (a) epoxy resin and a solid epoxy resin. A mixture of resins (liquid epoxy resin: solid epoxy resin is preferably in the range of 1:0.1 to 1:4, more preferably in the range of 1:0.3 to 1:3.5, 1:0.6~) The range of 1:3 is better, the range of 1:0.8~1:2.5 is even better), as the (b) hardener, phenolic hardener, naphthol hardener, active ester hardener and cyanic acid One or more selected from the group consisting of ester-based curing agents (preferably one or more selected from the group consisting of a phenol-based curing agent, a naphthol-based curing agent, and an active ester-based curing agent), as (g) Antimony oxide of inorganic filler. The preferred content of the (a) epoxy resin, (b) curing agent, and (g) inorganic filler in the thermosetting resin composition containing the specific components is as described above.

較佳的其他實施形態中,第1樹脂組成物層中所使用的樹脂組成物係光硬化性樹脂組成物,上述的(a)環氧樹脂、(b)硬化劑、(c)光硬化型鹼包含可溶性樹脂及(g)無機填充材。該實施形態中,第1樹脂 組成物層中所使用的光硬化性樹脂組成物係以分別含有下述成分為佳:作為(a)環氧樹脂之液狀環氧樹脂與固體狀環氧樹脂所成的混合物(液狀環氧樹脂:固體狀環氧樹脂的質量比係以1:0.1~1:4的範圍為佳,1:0.3~1:3.5的範圍更佳,1:0.6~1:3的範圍又更佳,1:0.8~1:2.5的範圍又再更佳)或僅只固體狀環氧樹脂、作為(b)硬化劑之由苯酚系硬化劑、萘酚系硬化劑、活性酯系硬化劑及氰酸酯酯系硬化劑所成之群選出的1種以上(較佳為苯酚系硬化劑、萘酚系硬化劑及活性酯系硬化劑所成之群選出的1種以上)、作為(c)光硬化型鹼可溶性樹脂之包含鹼可溶基與自由基聚合性不飽和基之樹脂(較佳為含羧基與自由基聚合性不飽和基之樹脂、含苯酚性羥基與自由基聚合性不飽和基之樹脂、更佳為含苯酚性羥基與自由基聚合性不飽和基之樹脂)、作為(g)無機填充材之氧化矽。有關包含組合該特定的成分所成的熱硬化性樹脂組成物,(a)環氧樹脂、(b)硬化劑、(c)光硬化型鹼可溶性樹脂及(g)無機填充材的較佳含量亦如上述,但從可獲得良好的耐熱性、絕緣信賴性及顯像性之觀點來看,在使(c)光硬化型鹼可溶性樹脂的不揮發成分為100質量%時,(a)環氧樹脂較佳為5質量%~100質量%、更佳為10質量%~85質量%者為佳。此外,第1樹脂組成物層中所使用的當樹脂組成物為光硬化性樹脂組成物時,該光硬化性樹脂組成物係以進一步含(d)光聚合起始劑、(e)光增感劑及(f)稀釋劑所成之群選出的1種以上為 佳。 In a preferred embodiment, the resin composition used in the first resin composition layer is a photocurable resin composition, the above (a) epoxy resin, (b) curing agent, and (c) photocuring type. The base contains a soluble resin and (g) an inorganic filler. In this embodiment, the first resin The photocurable resin composition used in the composition layer preferably contains the following components: a mixture of the liquid epoxy resin as the (a) epoxy resin and the solid epoxy resin (liquid ring) Oxygen resin: The mass ratio of the solid epoxy resin is preferably in the range of 1:0.1 to 1:4, the range of 1:0.3 to 1:3.5 is better, and the range of 1:0.6 to 1:3 is more preferable. 1:0.8~1:2.5 is even better) or only solid epoxy resin, phenolic hardener as a hardener (b), naphthol hardener, active ester hardener and cyanate One or more selected from the group consisting of ester-based curing agents (preferably one or more selected from the group consisting of a phenol-based curing agent, a naphthol-based curing agent, and an active ester-based curing agent), and (c) photohardening a resin containing an alkali-soluble group and a radically polymerizable unsaturated group (preferably a resin having a carboxyl group and a radical polymerizable unsaturated group, a phenol-containing hydroxyl group, and a radical polymerizable unsaturated group) The resin is more preferably a resin containing a phenolic hydroxyl group and a radical polymerizable unsaturated group, and (g) an inorganic filler. A preferred content of the thermosetting resin composition comprising the specific component, (a) epoxy resin, (b) hardener, (c) photocurable alkali-soluble resin, and (g) inorganic filler In the above, the (a) ring is obtained when the non-volatile content of the (c) photocurable alkali-soluble resin is 100% by mass from the viewpoint of obtaining good heat resistance, insulation reliability, and development. The oxygen resin is preferably from 5% by mass to 100% by mass, more preferably from 10% by mass to 85% by mass. Further, when the resin composition used in the first resin composition layer is a photocurable resin composition, the photocurable resin composition further contains (d) a photopolymerization initiator, and (e) a light gain. One or more selected from the group of the sensitizer and (f) diluent good.

從實裝步驟中可更加抑制印刷配線板的翹曲之觀點來看,第1樹脂組成物層、進而第1阻焊劑層中所使用的樹脂組成物不管熱硬化性樹脂組成物、光硬化性樹脂組成物的類別,以硬化後的玻璃轉移溫度(Tg)為150℃以上者佳、155℃以上者更佳。該Tg的上限並無特別限定,通常為300℃以下,可為250℃以下等。硬化後的樹脂組成物的Tg係可以拉伸加重法藉由熱機械分析來測定。硬化後的樹脂組成物Tg之測定中,可使用的熱機械分析裝置方面,可舉例如(股)理學製「Thermo Plus TMA8310」、Seiko Instruments(股)製「TMA-SS6100」。 From the viewpoint of the warpage of the printed wiring board, the resin composition used in the first resin composition layer and the first solder resist layer is not limited to the thermosetting resin composition or the photocurable resin. The type of the composition is preferably such that the glass transition temperature (Tg) after hardening is 150° C. or higher and 155° C. or higher. The upper limit of the Tg is not particularly limited, but is usually 300 ° C or lower, and may be 250 ° C or lower. The Tg system of the cured resin composition can be measured by thermomechanical analysis by a tensile weighting method. In the measurement of the resin composition Tg after the hardening, the thermomechanical analysis device which can be used is, for example, "Thermo Plus TMA8310" manufactured by Seiko Instruments Co., Ltd. and "TMA-SS6100" manufactured by Seiko Instruments Co., Ltd.

較佳的一實施形態中,第2樹脂組成物層中所使用的樹脂組成物係熱硬化性樹脂組成物,係含上述的(a)環氧樹脂及(b)硬化劑。該實施形態中,第2樹脂組成物層中所使用的熱硬化性樹脂組成物係以分別含有下述成分為佳:作為(a)環氧樹脂之液狀環氧樹脂與固體狀環氧樹脂所成的混合物(液狀環氧樹脂:固體狀環氧樹脂的質量比係以1:0.1~1:4的範圍為佳,1:0.3~1:3.5的範圍更佳,1:0.6~1:3的範圍又更佳,1:0.8~1:2.5的範圍又再更佳)、作為(b)硬化劑之由苯酚系硬化劑、萘酚系硬化劑、活性酯系硬化劑及氰酸酯酯系硬化劑所成之群選出的1種以上(較佳為苯酚系硬化劑、萘酚系硬化劑及活性酯系硬化劑所成之群選出的1種以上)。有 關包含組合該特定的成分之熱硬化性樹脂組成物,(a)環氧樹脂、及(b)硬化劑的較佳含量亦如上述。第2樹脂組成物層中所使用的熱硬化性樹脂組成物亦如上述,為了達成顯示出所期望的彈性率之第2阻焊劑層,係含有(g)無機填充材(較佳為氧化矽)以使樹脂組成物中的含量為0質量%~95質量%之範圍。在此,有關樹脂組成物的構成成分所稱之「含有使其為0質量%~n質量%之範圍」,包含不含該構成成分的情況以及以n質量%以下的範圍含有的情況雙方。 In a preferred embodiment, the resin composition used in the second resin composition layer is a thermosetting resin composition containing the above (a) epoxy resin and (b) a curing agent. In the embodiment, the thermosetting resin composition used in the second resin composition layer preferably contains the following components: a liquid epoxy resin as the (a) epoxy resin and a solid epoxy resin. The resulting mixture (liquid epoxy resin: the mass ratio of the solid epoxy resin is preferably in the range of 1:0.1 to 1:4, and the range of 1:0.3 to 1:3.5 is better, 1:0.6 to 1) The range of :3 is better, the range of 1:0.8~1:2.5 is even better), as the (b) hardener, the phenolic hardener, the naphthol hardener, the active ester hardener and the cyanic acid One or more selected from the group consisting of ester-based curing agents (preferably one or more selected from the group consisting of a phenol-based curing agent, a naphthol-based curing agent, and an active ester-based curing agent). Have The thermosetting resin composition containing the specific component is preferably contained, and the preferred contents of (a) epoxy resin and (b) hardener are also as described above. As described above, the thermosetting resin composition used in the second resin composition layer contains (g) an inorganic filler (preferably yttrium oxide) in order to achieve a second solder resist layer exhibiting a desired elastic modulus. The content in the resin composition is in the range of 0% by mass to 95% by mass. In the case where the constituent component of the resin composition is contained in the range of 0% by mass to n% by mass, both the case where the component is not contained and the case where it is contained in the range of n% by mass or less are included.

較佳的其他實施形態中,第2樹脂組成物層中所使用的樹脂組成物係光硬化性樹脂組成物,包含上述的(a)環氧樹脂、(b)硬化劑、及(c)光硬化型鹼可溶性樹脂。該實施形態中,第2樹脂組成物層中所使用的光硬化性樹脂組成物係以分別包含下述成分為佳:作為(a)環氧樹脂之液狀環氧樹脂與固體狀環氧樹脂所成的混合物(液狀環氧樹脂:固體狀環氧樹脂的質量比係以1:0.1~1:4的範圍為佳,1:0.3~1:3.5的範圍更佳,1:0.6~1:3的範圍又更佳,1:0.8~1:2.5的範圍又再更佳)或僅只為固體狀環氧樹脂、作為(b)硬化劑之由苯酚系硬化劑、萘酚系硬化劑、活性酯系硬化劑及氰酸酯酯系硬化劑所成之群選出的1種以上(較佳為苯酚系硬化劑、萘酚系硬化劑及活性酯系硬化劑所成之群選出的1種以上)、作為(c)光硬化型鹼可溶性樹脂之包含鹼可溶基與自由基聚合性不飽和基之樹脂(較佳為含羧基與自由 基聚合性不飽和基之樹脂、含苯酚性羥基與自由基聚合性不飽和基之樹脂、更佳為含苯酚性羥基與自由基聚合性不飽和基之樹脂)。有關包含組合該特定的成分之熱硬化性樹脂組成物,(a)環氧樹脂、(b)硬化劑及(c)光硬化型鹼可溶性樹脂的較佳含量雖如上述,但從可得良好的耐熱性、絕緣信賴性及顯像性之觀點來看,(a)環氧樹脂,當使(c)光硬化型鹼可溶性樹脂的不揮發成分為100質量%時,較佳為5質量%~100質量%、更佳為10質量%~85質量%者為佳。第2樹脂組成物層中所使用的當樹脂組成物為光硬化性樹脂組成物時,該光硬化性樹脂組成物係以進一步包含由(d)光聚合起始劑、(e)光增感劑及(f)稀釋劑所成之群選出的1種以上為佳。第2樹脂組成物層中所使用的光硬化性樹脂組成物亦如上述,為了達成顯示出所期望的彈性率之第2阻焊劑層,係以樹脂組成物中含量為0質量%~95質量%之範圍含有(g)無機填充材(較佳為氧化矽)即可。 In a preferred embodiment, the resin composition-based photocurable resin composition used in the second resin composition layer includes the above (a) epoxy resin, (b) curing agent, and (c) light. Hardening type alkali soluble resin. In the embodiment, the photocurable resin composition used in the second resin composition layer preferably contains the following components: a liquid epoxy resin as the (a) epoxy resin and a solid epoxy resin. The resulting mixture (liquid epoxy resin: the mass ratio of the solid epoxy resin is preferably in the range of 1:0.1 to 1:4, and the range of 1:0.3 to 1:3.5 is better, 1:0.6 to 1) The range of :3 is better, the range of 1:0.8~1:2.5 is even better) or only the solid epoxy resin, the phenolic hardener as the (b) hardener, the naphthol hardener, One or more selected from the group consisting of an active ester-based curing agent and a cyanate ester-based curing agent (preferably one selected from the group consisting of a phenol-based curing agent, a naphthol-based curing agent, and an active ester-based curing agent) (c) a resin containing an alkali soluble group and a radical polymerizable unsaturated group as (c) a photocurable alkali-soluble resin (preferably having a carboxyl group and being free) The resin of the radically polymerizable unsaturated group, the resin containing a phenolic hydroxyl group and a radical polymerizable unsaturated group, more preferably a resin containing a phenolic hydroxyl group and a radical polymerizable unsaturated group). The preferred content of the thermosetting resin composition containing the specific component, (a) epoxy resin, (b) curing agent, and (c) photocuring alkali-soluble resin is as described above, but is good from the above. (a) The epoxy resin, when the non-volatile content of the (c) photocurable alkali-soluble resin is 100% by mass, preferably 5% by mass, from the viewpoint of heat resistance, insulation reliability, and development. It is preferably from 100% by mass, more preferably from 10% by mass to 85% by mass. When the resin composition used in the second resin composition layer is a photocurable resin composition, the photocurable resin composition further contains (d) a photopolymerization initiator, (e) photosensitization One or more selected from the group consisting of the agent and the (f) diluent are preferred. In the photocurable resin composition used in the second resin composition layer, as described above, in order to achieve the second solder resist layer exhibiting a desired elastic modulus, the content in the resin composition is 0% by mass to 95% by mass. The range may be (g) an inorganic filler (preferably ruthenium oxide).

第2樹脂組成物層,進而第2阻焊劑層中所使用的樹脂組成物,不管熱硬化性樹脂組成物、光硬化性樹脂組成物的類別,只要是可得所期望的彈性率,硬化後的玻璃轉移溫度(Tg)並無特別限定。從實裝步驟中可更加抑制印刷配線板的翹曲之觀點來看,第2樹脂組成物層,進而第2阻焊劑層中所使用的樹脂組成物其硬化後的Tg係以150℃以上者為佳、155℃以上者更佳。該Tg的上限並無特別限定,通常為300℃以下,可為250℃以下 等。 The resin composition used in the second resin composition layer and the second solder resist layer, regardless of the type of the thermosetting resin composition or the photocurable resin composition, can be obtained as long as the desired elastic modulus is obtained. The glass transition temperature (Tg) is not particularly limited. From the viewpoint of further suppressing warpage of the printed wiring board in the mounting step, the resin composition used in the second resin composition layer and the second solder resist layer is cured at a temperature of 150 ° C or higher. Better, better than 155 °C. The upper limit of the Tg is not particularly limited, and is usually 300 ° C or lower, and may be 250 ° C or lower. Wait.

較佳的一實施形態中,第1及第2樹脂組成物層中所使用的樹脂組成物均為熱硬化性樹脂組成物。其他較佳實施形態中,第1及第2樹脂組成物層中所使用的樹脂組成物均為光硬化性樹脂組成物。再者,其他較佳實施形態中,第1樹脂組成物層中所使用的樹脂組成物係熱硬化性樹脂組成物,第2樹脂組成物層中所使用的樹脂組成物係光硬化性樹脂組成物。其他較佳實施形態中,第1樹脂組成物層中所使用的樹脂組成物係光硬化性樹脂組成物,第2樹脂組成物層中所使用的樹脂組成物係熱硬化性樹脂組成物。 In a preferred embodiment, the resin compositions used in the first and second resin composition layers are all thermosetting resin compositions. In other preferred embodiments, the resin compositions used in the first and second resin composition layers are all photocurable resin compositions. In another preferred embodiment, the resin composition used in the first resin composition layer is a thermosetting resin composition, and the resin composition used in the second resin composition layer is a photocurable resin composition. Things. In another preferred embodiment, the resin composition used in the first resin composition layer is a photocurable resin composition, and the resin composition used in the second resin composition layer is a thermosetting resin composition.

-(h)熱可塑性樹脂- - (h) thermoplastic resin -

第1及第2樹脂組成物層中所使用的樹脂組成物亦可進一步包含熱可塑性樹脂。熱可塑性樹脂方面,在形成印刷配線板的阻焊劑層時,係可使用一般可用的任意熱可塑性樹脂,可舉例如苯氧基樹脂、聚乙烯基縮醛樹脂、聚烯烴樹脂、聚丁二烯樹脂、聚醯亞胺樹脂、聚醯胺醯亞胺樹脂、聚醚碸樹脂、聚伸苯基醚樹脂及聚碸樹脂等。熱可塑性樹脂可單獨使用1種或併用2種以上。 The resin composition used in the first and second resin composition layers may further contain a thermoplastic resin. In the case of the thermoplastic resin, any thermoplastic resin generally available can be used in forming the solder resist layer of the printed wiring board, and examples thereof include a phenoxy resin, a polyvinyl acetal resin, a polyolefin resin, and a polybutadiene. Resin, polyimine resin, polyamidoximine resin, polyether oxime resin, polyphenylene ether resin and polyfluorene resin. The thermoplastic resin may be used singly or in combination of two or more.

熱可塑性樹脂的聚苯乙烯換算之重量平均分子量係以8,000~70,000的範圍為佳,10,000~60,000的範圍更佳,20,000~60,000的範圍又更佳。熱可塑性樹脂的聚苯乙烯換算之重量平均分子量係以膠體滲透層析 (GPC)法來測定。具體而言,熱可塑性樹脂的聚苯乙烯換算之重量平均分子量,係使用(股)島津製作所製LC-9A/RID-6A作為測定裝置、管柱使用昭和電工(股)製Shodex K-800P/K-804L/K-804L、移動相方面則使用氯仿等,以管柱溫度40℃進行測定,並使用標準聚苯乙烯之檢量線算出。 The polystyrene-equivalent weight average molecular weight of the thermoplastic resin is preferably in the range of 8,000 to 70,000, more preferably in the range of 10,000 to 60,000, and even more preferably in the range of 20,000 to 60,000. Polystyrene-equivalent weight average molecular weight of thermoplastic resin (GPC) method to determine. Specifically, the weight average molecular weight of the thermoplastic resin in terms of polystyrene is used as a measuring device using LC-9A/RID-6A manufactured by Shimadzu Corporation, and Shodex K-800P manufactured by Showa Denko Co., Ltd. The K-804L/K-804L and the mobile phase were measured by using a chloroform or the like at a column temperature of 40 ° C and using a calibration curve of standard polystyrene.

樹脂組成物中熱可塑性樹脂的含量,若可獲得顯示出所期望的彈性率之阻焊劑層,並無特別限定,較佳為0.1質量%以上,更佳為1質量%以上,再更佳為3質量%以上,5質量%以上或7質量%以上。熱可塑性樹脂的含量的上限並無特別限定,較佳為50質量%以下,更佳為40質量%以下,再更佳為30質量%以下。雖視環氧樹脂或硬化劑的種類、無機填充材的含量而異,但樹脂組成物中若提高熱可塑性樹脂的含量,則該樹脂組成物的硬化後的彈性率會有變低的傾向。 The content of the thermoplastic resin in the resin composition is not particularly limited as long as a solder resist layer exhibiting a desired elastic modulus is obtained, and is preferably 0.1% by mass or more, more preferably 1% by mass or more, and still more preferably 3 or more. 5% by mass or more, 5% by mass or more, or 7% by mass or more. The upper limit of the content of the thermoplastic resin is not particularly limited, but is preferably 50% by mass or less, more preferably 40% by mass or less, still more preferably 30% by mass or less. Depending on the type of the epoxy resin or the curing agent and the content of the inorganic filler, if the content of the thermoplastic resin is increased in the resin composition, the elastic modulus of the resin composition after curing tends to be low.

-(i)硬化促進劑- - (i) hardening accelerator -

第1及第2樹脂組成物層中所使用的樹脂組成物,亦可進一步包含硬化促進劑。硬化促進劑方面,係於形成印刷配線板的阻焊劑層時,以使用一般所用之任意的硬化促進劑即可,可舉例如磷系硬化促進劑、胺系硬化促進劑、咪唑系硬化促進劑、胍系硬化促進劑等,以磷系硬化促進劑、胺系硬化促進劑、咪唑系硬化促進劑為佳,胺系硬化促進劑、咪唑系硬化促進劑更佳。硬化促進劑係可單獨使 用1種,亦可組合2種以上使用。 The resin composition used in the first and second resin composition layers may further contain a curing accelerator. In the case of forming a solder resist layer of a printed wiring board, any hardening accelerator which is generally used may be used, and examples thereof include a phosphorus-based hardening accelerator, an amine-based hardening accelerator, and an imidazole-based hardening accelerator. In addition, a phosphorus-based hardening accelerator, an amine-based hardening accelerator, and an imidazole-based hardening accelerator are preferable, and an amine-based hardening accelerator and an imidazole-based hardening accelerator are more preferable. Hardening accelerators can be made separately One type may be used, or two or more types may be used in combination.

樹脂組成物中硬化促進劑的含量,若可獲得顯示出所期望的彈性率之阻焊劑層,並無特別限定,令環氧樹脂與硬化劑的不揮發成分合計量為100質量%時,係以於0.03質量%~3質量%的範圍使用為佳。 The content of the hardening accelerator in the resin composition is not particularly limited as long as a solder resist layer exhibiting a desired elastic modulus is obtained, and when the total amount of the non-volatile components of the epoxy resin and the curing agent is 100% by mass, It is preferably used in the range of 0.03 mass% to 3% by mass.

-(j)難燃劑- -(j) flame retardant -

第1及第2樹脂組成物層中所使用的樹脂組成物,亦可進一步包含難燃劑。難燃劑方面,在形成印刷配線板的阻焊劑層時,可使用一般所用的任意難燃劑,可舉例如有機磷系難燃劑、有機系氮含有磷化合物、氮化合物、聚矽氧系難燃劑、金屬氫氧化物等。難燃劑可單獨使用1種或併用2種以上。樹脂組成物中難燃劑的含量,若可獲得顯示出所期望的彈性率之阻焊劑層,並無特別限定,較佳為0.5質量%~20質量%、更佳為1質量%~15質量%。 The resin composition used in the first and second resin composition layers may further contain a flame retardant. In the case of forming a solder resist layer of a printed wiring board, any flame retardant which is generally used may be used, and examples thereof include an organic phosphorus-based flame retardant, an organic nitrogen-containing phosphorus compound, a nitrogen compound, and a polyoxygen system. Flame retardant, metal hydroxide, etc. The flame retardant may be used alone or in combination of two or more. The content of the flame retardant in the resin composition is not particularly limited as long as a solder resist layer exhibiting a desired elastic modulus is obtained, and is preferably 0.5% by mass to 20% by mass, more preferably 1% by mass to 15% by mass. .

-(k)有機填充材- -(k)Organic filler -

第1及第2樹脂組成物層中所使用的樹脂組成物,可進一步包含有機填充材。有機填充材方面,在形成印刷配線板的阻焊劑層時,可使用一般所用的任意有機填充材,舉例如橡膠粒子、聚醯胺微粒子、聚矽氧粒子等,以橡膠粒子為佳。 The resin composition used in the first and second resin composition layers may further contain an organic filler. In the case of forming the solder resist layer of the printed wiring board, any organic filler generally used may be used, for example, rubber particles, polyamide fine particles, polyoxyn oxide particles, and the like, and rubber particles are preferred.

橡膠粒子方面,若為對顯示出橡膠彈性之樹脂施予化學性交聯處理,且對有機溶劑不溶且不融之樹脂 的微粒子體的話,並無無特別限定,可舉例如丙烯腈丁二烯橡膠粒子、丁二烯橡膠粒子、丙烯酸橡膠粒子等。橡膠粒子方面,具體而言,XER-91(日本合成橡膠(股)製)、Staphiroid AC3355、AC3816、AC3816N、AC3832、AC4030、AC3364、IM101(以上,GANTSU KASEI(股)製)Pararoid EXL2655、EXL2602(以上,吳羽化學工業(股)製)等。 In the case of rubber particles, if it is a resin which is chemically cross-linked to a resin exhibiting rubber elasticity and which is insoluble and insoluble in an organic solvent The fine particle body is not particularly limited, and examples thereof include acrylonitrile butadiene rubber particles, butadiene rubber particles, and acrylic rubber particles. In terms of rubber particles, specifically, XER-91 (made by Nippon Synthetic Rubber Co., Ltd.), Staphiroid AC3355, AC3816, AC3816N, AC3832, AC4030, AC3364, IM101 (above, GANTSU KASEI (share)) Pararoid EXL2655, EXL2602 ( Above, Wu Yu Chemical Industry Co., Ltd.).

有機填充材的平均粒徑,較佳為0.005μm~1μm的範圍、更佳為0.2μm~0.6μm的範圍。有機填充材的平均粒徑係可使用動態光散射法來測定。例如,可於適當的有機溶劑中藉由超音波等使有機填充材均一地分散,並使用濃厚系粒徑分析儀(FPAR-1000;大塚電子(股)製),以質量基準作成有機填充材的粒度分佈,取其中位數徑作為平均粒徑來進行測定。 The average particle diameter of the organic filler is preferably in the range of 0.005 μm to 1 μm, more preferably in the range of 0.2 μm to 0.6 μm. The average particle size of the organic filler can be measured using a dynamic light scattering method. For example, the organic filler can be uniformly dispersed by ultrasonic waves or the like in a suitable organic solvent, and a thick filler particle size analyzer (FPAR-1000; manufactured by Otsuka Electronics Co., Ltd.) can be used to form an organic filler on a mass basis. The particle size distribution was measured by taking the median diameter as the average particle diameter.

樹脂組成物中有機填充材的含量,若可獲得顯示出所期望的彈性率之阻焊劑層,並無特別限定,較佳為0.1質量%~6質量%、更佳為0.5質量%~4質量%。 The content of the organic filler in the resin composition is not particularly limited as long as a solder resist layer exhibiting a desired elastic modulus is obtained, and is preferably 0.1% by mass to 6% by mass, more preferably 0.5% by mass to 4% by mass. .

-其他的成分- -Other ingredients -

第1及第2樹脂組成物層中所使用的樹脂組成物,可視需要而包含其他添加劑,該其他添加劑方面,可舉例如有機銅化合物、有機鋅化合物及有機鈷化合物等之有機金屬化合物、和增黏劑、消泡劑、調平劑、密著性賦予劑、及著色劑等之樹脂添加劑等。 The resin composition used in the first and second resin composition layers may contain other additives as needed, and examples of the other additives include organometallic compounds such as an organic copper compound, an organic zinc compound, and an organic cobalt compound, and A resin additive such as a tackifier, an antifoaming agent, a leveling agent, a tackifier, and a coloring agent.

<支持體> <Support>

支持體方面,不管第1支持體、第2支持體的差別,可舉例如由塑膠材料所成的薄膜、金屬箔、離型紙,以由塑膠材料所成的薄膜、金屬箔為佳。 In terms of the support, the difference between the first support and the second support may be, for example, a film made of a plastic material, a metal foil, or a release paper, and a film made of a plastic material or a metal foil is preferred.

支持體方面,使用由塑膠材料所成的薄膜時,塑膠材料方面,可舉例如聚對苯二甲酸乙二醇酯(以下簡稱「PET」)、聚萘二甲酸乙二醇酯(以下簡稱「PEN」)等之聚酯、聚碳酸酯(以下簡稱「PC」)、聚甲基丙烯酸甲基酯(PMMA)等之丙烯酸酯、環狀聚烯烴、三乙醯基纖維素(TAC)、聚醚硫醚(PES)、聚醚酮、聚醯亞胺等。其中,更以聚對苯二甲酸乙二醇酯、聚萘二甲酸乙二醇酯為佳,安價聚對苯二甲酸乙二醇酯特別佳。 In the case of a support material, when a film made of a plastic material is used, examples of the plastic material include polyethylene terephthalate (hereinafter referred to as "PET") and polyethylene naphthalate (hereinafter referred to as " Polyesters such as PEN"), polycarbonate (hereinafter referred to as "PC"), polymethyl methacrylate (PMMA), acrylate, cyclic polyolefin, triethyl fluorene cellulose (TAC), poly Ether sulfide (PES), polyether ketone, polyimine, and the like. Among them, polyethylene terephthalate and polyethylene naphthalate are preferred, and polyethylene terephthalate is particularly preferred.

支持體方面,使用金屬箔時,金屬箔方面,可舉例如銅箔、鋁箔等,並以銅箔為佳。銅箔方面,可使用由銅的單一金屬所成之箔,亦可使用銅與其他金屬(例如,錫、鉻、銀、鎂、鎳、鋯、矽、鈦等)之合金所成之箔。 In the case of using a metal foil, the metal foil may, for example, be a copper foil or an aluminum foil, and a copper foil is preferable. As the copper foil, a foil made of a single metal of copper may be used, or a foil made of an alloy of copper and other metals (for example, tin, chromium, silver, magnesium, nickel, zirconium, hafnium, titanium, etc.) may be used.

支持體可於與樹脂組成物層接合的面施予消光處理、電暈處理。又,支持體方面,亦可使用在與樹脂組成物層接合的面具有離型層之附離型層之支持體。於附離型層之支持體的離型層上使用之離型劑方面,可舉例如醇酸樹脂、聚烯烴樹脂、胺基甲酸酯樹脂、及聚矽氧樹脂 所成之群選出的1種以上的離型劑。 The support can be subjected to a matting treatment or a corona treatment on a surface joined to the resin composition layer. Further, as the support, a support having an release layer of a release layer on a surface joined to the resin composition layer may be used. The release agent to be used on the release layer of the support of the release layer may, for example, be an alkyd resin, a polyolefin resin, a urethane resin, or a polyoxymethylene resin. One or more kinds of release agents selected from the group formed.

支持體的市售品方面,可舉例如LINTEC(股)製「SK-1」、「AL-5」、「AL-7」、東麗(股)製「NS80A」、三菱樹脂(股)製「R310-16B」等。 For the commercial products of the support, for example, "SK-1", "AL-5", "AL-7" manufactured by LINTEC Co., Ltd., "NS80A" manufactured by Toray Co., Ltd., and Mitsubishi Resin Co., Ltd. "R310-16B" and so on.

支持體的厚度,並無特別限定,以5μm~75μm的範圍為佳,10μm~60μm的範圍更佳,10μm~45μm的範圍又更佳。此外,使用附離型層之支持體時,附離型層之支持體全體的厚度係以上述範圍者為佳。 The thickness of the support is not particularly limited, and is preferably in the range of 5 μm to 75 μm, more preferably in the range of 10 μm to 60 μm, and even more preferably in the range of 10 μm to 45 μm. Further, when the support of the release layer is used, the thickness of the entire support of the release layer is preferably in the above range.

樹脂薄片,不管第1樹脂薄片、第2樹脂薄片之區別,例如,可藉由將樹脂組成物溶解於有機溶劑中來調製樹脂塗漆,使用模具塗布機等將此樹脂塗漆塗佈於支持體上,並使樹脂塗漆乾燥所製作。 The resin sheet can be prepared by dissolving the resin composition in an organic solvent, for example, by dissolving the resin composition in an organic solvent, and applying the resin coating to a support using a die coater or the like. It is made by drying the resin and drying it.

有機溶劑方面,可舉例如丙酮、甲基乙基酮及環己酮等之酮類、酢酸乙基、酢酸丁基、賽路蘇乙酸酯、丙二醇單甲基醚乙酸酯及卡必醇乙酸酯等之酢酸酯類、賽路蘇及丁基卡必醇等之卡必醇類、甲苯及二甲苯等之芳香族烴類、二甲基甲醯胺、二甲基乙醯胺及N-甲基吡咯啶酮等之醯胺系溶劑等。有機溶劑可單獨使用1種或併用2種以上。 Examples of the organic solvent include ketones such as acetone, methyl ethyl ketone and cyclohexanone, ethyl phthalate, butyl phthalate, 赛 succinate, propylene glycol monomethyl ether acetate, and carbitol. a phthalic acid ester such as acetate, a carbitol such as sucrose or butyl carbitol, an aromatic hydrocarbon such as toluene or xylene, dimethylformamide or dimethylacetamide. A guanamine-based solvent such as N-methylpyrrolidone. The organic solvent may be used alone or in combination of two or more.

樹脂塗漆的乾燥係可藉由加熱、熱風吹附等之公知的乾燥方法來實施。雖也視樹脂塗漆中有機溶劑的沸點而異,但例如在使用含30質量%~60質量%之有機溶劑的樹脂塗漆時,可藉由使其在50℃~150℃下乾燥3分鐘~10分鐘,而於支持體上形成樹脂組成物層。 The drying of the resin coating can be carried out by a known drying method such as heating, hot air blowing or the like. Although depending on the boiling point of the organic solvent in the resin coating, for example, when painting with a resin containing 30% by mass to 60% by mass of an organic solvent, it can be dried at 50 ° C to 150 ° C for 3 minutes. ~10 minutes, a resin composition layer was formed on the support.

樹脂薄片,不管第1樹脂薄片、第2樹脂薄片之區別,於樹脂組成物層之不與支持體接合的面(意即,與支持體呈反對側的面),可進一步包含保護薄膜。保護薄膜乃作用於防止樹脂組成物層表面之髒污等的附著或損傷。保護薄膜的材料方面,可使用與就支持體所說明的材料相同者。保護薄膜的厚度,並未特別限定,例如1μm~40μm。樹脂薄片,係於製造印刷配線板時,藉由剝除保護薄膜而得以使用。 The resin sheet may further include a protective film on the surface of the resin composition layer that is not bonded to the support (that is, the surface opposite to the support), regardless of the difference between the first resin sheet and the second resin sheet. The protective film acts to prevent adhesion or damage such as dirt on the surface of the resin composition layer. The material of the protective film can be the same as that described for the support. The thickness of the protective film is not particularly limited, and is, for example, 1 μm to 40 μm. The resin sheet is used by peeling off the protective film when manufacturing a printed wiring board.

[印刷配線板的製造方法] [Manufacturing method of printed wiring board]

在可獲得滿足上述條件(1)、(2)及(3)之印刷配線板的情況下,製造本發明之印刷配線板的方法並無特別限定。以下,係使用上述的印刷配線板的阻焊劑層用樹脂薄片來製作印刷配線板之方法作為製造本發明之印刷配線板的方法之較佳例而予以說明。 When a printed wiring board that satisfies the above conditions (1), (2), and (3) is obtained, the method of manufacturing the printed wiring board of the present invention is not particularly limited. Hereinafter, a method of producing a printed wiring board using a resin sheet for a solder resist layer of the above-described printed wiring board will be described as a preferred example of a method of manufacturing the printed wiring board of the present invention.

較佳的一實施形態中,本發明之印刷配線板係使用上述印刷配線板的阻焊劑層用樹脂薄片組,藉由包含下述步驟(I)~(III)之方法來製造。 In a preferred embodiment, the printed wiring board of the present invention is produced by a method comprising the following steps (I) to (III) using the resin sheet group for a solder resist layer of the printed wiring board.

(I)於具有第1及第2主面之電路基板的第1主面上,將包含第1支持體及與該第1支持體接合之第1樹脂組成物層的第1樹脂薄片,以第1樹脂組成物層與電路基板的第1主面接合之方式進行積層的步驟 (I) a first resin sheet including a first support and a first resin composition layer joined to the first support on the first main surface of the circuit board having the first and second main faces Step of laminating the first resin composition layer and the first main surface of the circuit board

(II)於電路基板的第2主面上,將包含第2支持體及與該第2支持體接合之第2樹脂組成物層的第2樹脂薄 片,以第2樹脂組成物層與電路基板的第2主面接合之方式進行積層的步驟 (II) Thin second resin including the second support and the second resin composition layer joined to the second support on the second main surface of the circuit board Step of laminating the second resin composition layer so as to be bonded to the second main surface of the circuit board

(III)使第1及第2樹脂組成物層硬化而形成第1及第2阻焊劑層的步驟 (III) Step of curing the first and second resin composition layers to form the first and second solder resist layers

-步驟(I)- -Step (I)-

步驟(I)中,係於具有第1及第2主面之電路基板的第1主面,將包含第1支持體及與該第1支持體接合之第1樹脂組成物層的第1樹脂薄片,以第1樹脂組成物層與電路基板的第1主面接合之方式進行積層。 In the step (I), the first resin including the first support and the first resin composition layer joined to the first support is formed on the first main surface of the circuit board having the first and second main faces. The sheet is laminated such that the first resin composition layer is bonded to the first main surface of the circuit board.

步驟(I)中,使用之第1樹脂薄片係如上述〔印刷配線板的阻焊劑層用樹脂薄片組〕中所載。 In the step (I), the first resin sheet to be used is contained in the above-mentioned [resin sheet group for a solder resist layer of a printed wiring board).

本發明中,所謂「電路基板」意指製造印刷配線板時,再於兩面形成有阻焊劑層之基板,可舉例如,具有對向之第1及第2主面且於該第1及第2主面雙方具有經圖型加工之電路配線的基板。以電路配線的層數為首的層構成並無特別限定,視所期望之印刷配線板的特性適當地決定即可。 In the present invention, the term "circuit board" means a substrate on which a solder resist layer is formed on both sides when manufacturing a printed wiring board, and for example, the first and second main surfaces are opposed to each other, and the first and second main surfaces are 2 Both sides of the main surface have a substrate for circuit wiring processed by the pattern. The layer configuration including the number of layers of the circuit wiring is not particularly limited, and may be appropriately determined depending on the characteristics of the desired printed wiring board.

電路基板的厚度,在可獲得滿足上述條件(1)及(2)之印刷配線板的情況下,並無特別限定,較佳為240μm以下,更佳為220μm以下,再更佳為200μm以下。根據本發明,即使是在使用更薄的電路基板時,亦可抑制實裝步驟中印刷配線板的翹曲。即使是使用例如190μm以下,180μm以下,170μm以下,160μm以下, 150μm以下,140μm以下,130μm以下,120μm以下,110μm以下或100μm以下的厚度之電路基板的情況下,亦可抑制實裝步驟中之翹曲。電路基板的厚度之下限並無特別限定,從印刷配線板製造時取汲性提昇之觀點來看,較佳為10μm以上,更佳為20μm以上。此外,所謂電路基板的厚度,乃為表面電路的厚度也包含之電路基板全體的厚度。在此,令電路基板的厚度之中去除表面電路的厚度所得之值為t3(μm)時,上述Z、t1、t2與該t3滿足t1+t2+t3=Z之關係。 The thickness of the circuit board is not particularly limited as long as the printed wiring board satisfying the above conditions (1) and (2) is obtained, and is preferably 240 μm or less, more preferably 220 μm or less, still more preferably 200 μm or less. According to the present invention, even when a thinner circuit substrate is used, warpage of the printed wiring board in the mounting step can be suppressed. Even when a circuit board having a thickness of, for example, 190 μm or less, 180 μm or less, 170 μm or less, 160 μm or less, 150 μm or less, 140 μm or less, 130 μm or less, 120 μm or less, 110 μm or less, or 100 μm or less is used, the mounting step can be suppressed. Warping. The lower limit of the thickness of the circuit board is not particularly limited, and is preferably 10 μm or more, and more preferably 20 μm or more from the viewpoint of improving the pick-up property at the time of production of the printed wiring board. Further, the thickness of the circuit board is the thickness of the entire circuit board including the thickness of the surface circuit. Here, when the value obtained by removing the thickness of the surface circuit from the thickness of the circuit substrate is t 3 (μm), the above Z, t 1 , t 2 and the t 3 satisfy t 1 + t 2 + t 3 = Z. relationship.

電路基板的表面電路的厚度,並無特別限定,從印刷配線板的薄型化之觀點來看,較佳為40μm以下,更佳為30μm以下,再更佳為25μm以下,又再更佳為20μm以下,18μm以下,16μm以下,14μm以下,12μm以下或10μm以下。表面電路的厚度的下限並無特別限定,通常可為1μm以上、3μm以上、5μm以上。 The thickness of the surface circuit of the circuit board is not particularly limited, and is preferably 40 μm or less, more preferably 30 μm or less, still more preferably 25 μm or less, and still more preferably 20 μm from the viewpoint of reducing the thickness of the printed wiring board. Hereinafter, it is 18 μm or less, 16 μm or less, 14 μm or less, 12 μm or less, or 10 μm or less. The lower limit of the thickness of the surface circuit is not particularly limited, and may be usually 1 μm or more, 3 μm or more, or 5 μm or more.

電路基板的熱膨脹係數,從抑制電路歪扭或裂隙的產生之觀點來看,較佳為16ppm/℃以下,更佳為14ppm/℃以下,再更佳為12ppm/℃以下。電路基板熱膨脹係數的下限雖也視阻焊劑層之形成中使用的樹脂組成物之組成而異,但較佳為-2ppm/℃以上,更佳為0ppm/℃以上、再更佳為4ppm/℃以上。本發明中,電路基板的熱膨脹係數係以拉伸加重法藉由熱機械分析(TMA)所得之平面方向25~150℃的線熱膨脹係數。電路基板的線熱膨脹係數測定中可使用的熱機械分析裝置方面,可舉例 如(股)理學製「Thermo Plus TMA8310」、Seiko Instruments(股)製「TMA-SS6100」。 The thermal expansion coefficient of the circuit board is preferably 16 ppm/° C. or less, more preferably 14 ppm/° C. or less, and still more preferably 12 ppm/° C. or less from the viewpoint of suppressing the occurrence of cracks or cracks in the circuit. The lower limit of the thermal expansion coefficient of the circuit board varies depending on the composition of the resin composition used for forming the solder resist layer, but is preferably -2 ppm/° C or more, more preferably 0 ppm/° C. or more, still more preferably 4 ppm/° C. the above. In the present invention, the coefficient of thermal expansion of the circuit substrate is a linear thermal expansion coefficient of 25 to 150 ° C in the plane direction obtained by thermomechanical analysis (TMA) by a tensile weighting method. The thermomechanical analysis device that can be used in the measurement of the linear thermal expansion coefficient of the circuit substrate can be exemplified For example, "Thermo Plus TMA8310" is a scientific research system and "TMA-SS6100" manufactured by Seiko Instruments.

電路基板的彎曲彈性率,並無特別限定。本發明中,不管電路基板的彎曲彈性率,係可抑制實裝步驟中之翹曲。 The bending elastic modulus of the circuit board is not particularly limited. In the present invention, regardless of the bending elastic modulus of the circuit board, warpage in the mounting step can be suppressed.

電路基板與第1樹脂薄片之積層,例如,可藉由自第1支持體側將第1樹脂薄片加熱壓著於電路基板來進行。將第1樹脂薄片加熱壓著於電路基板之構件(以下,亦稱為「加熱壓著構件」)方面,可舉例如經加熱之金屬板(SUS鏡板等)或金屬輥(SUS輥)等。此外,並非是將加熱壓著構件直接加壓於第1樹脂薄片上,而是於起因於電路基板表面電路凹凸上,介由耐熱橡膠等之彈性材而使第1樹脂薄片充分地追隨而予以加壓者為佳。 The laminate of the circuit board and the first resin sheet can be performed, for example, by heating and pressing the first resin sheet on the circuit board from the first support side. The member for heating and pressing the first resin sheet on the circuit board (hereinafter also referred to as "heating and pressing member") may, for example, be a heated metal plate (such as a SUS mirror plate) or a metal roll (SUS roll). In addition, the first resin sheet is not sufficiently adhered to the first resin sheet due to the surface unevenness of the circuit board, and the first resin sheet is sufficiently followed by the elastic material such as heat-resistant rubber. The person who pressurizes is better.

加熱壓著溫度,較佳為80℃~160℃、更佳為100℃~140℃的範圍,加熱壓著壓力,較佳為0.098MPa~1.77MPa、更佳為0.29MPa~1.47MPa的範圍,加熱壓著時間,較佳為20秒鐘~400秒鐘、更佳為30秒鐘~300秒鐘的範圍。積層,較佳係以於壓力26.7hPa以下的減壓條件下實施。 The heating and pressing temperature is preferably in the range of 80 ° C to 160 ° C, more preferably in the range of 100 ° C to 140 ° C, and the heating pressing pressure is preferably in the range of 0.098 MPa to 1.77 MPa, more preferably 0.29 MPa to 1.47 MPa. The heating pressing time is preferably in the range of 20 seconds to 400 seconds, more preferably 30 seconds to 300 seconds. The lamination is preferably carried out under reduced pressure of 26.7 hPa or less.

積層係可透過市售的真空積層機來進行。市售的真空積層機方面,可舉例如(股)名機製作所製的真空加壓式積層機、Nichigo-Morton(股)製的真空施用器(vacuum applicator)等。 The laminate can be carried out through a commercially available vacuum laminator. For example, a vacuum press laminator manufactured by Nippon Machine Co., Ltd., a vacuum applicator manufactured by Nichigo-Morton Co., Ltd., or the like can be used.

積層之後,常壓下(大氣壓下),例如,藉 由將加熱壓著構件自第1支持體側加壓來進行經積層之第1接著薄片的平滑化處理。平滑化處理的加壓條件係可為與上述積層的加熱壓著條件同樣的條件。平滑化處理可藉由市售的積層機來實施。此外,積層與平滑化處理,亦可使用上述的市售的真空積層機連續性進行。 After lamination, under normal pressure (at atmospheric pressure), for example, borrow The smoothing treatment of the laminated first succeeding sheet is performed by pressurizing the heating and pressing member from the first support side. The pressurization conditions of the smoothing treatment may be the same conditions as the above-described laminated heating press conditions. The smoothing process can be carried out by a commercially available laminator. Further, the lamination and smoothing treatment can also be carried out continuously using the commercially available vacuum laminator described above.

-步驟(II)- -Step (II)-

步驟(II)中,係於電路基板的第2主面,將包含第2支持體及與該第2支持體接合之第2樹脂組成物層的第2樹脂薄片,以第2樹脂組成物層與電路基板的第2主面接合之方式進行積層。 In the step (II), the second resin sheet including the second support and the second resin composition layer joined to the second support is a second resin composition layer on the second main surface of the circuit board. Lamination is performed so as to be bonded to the second main surface of the circuit board.

步驟(II)中,使用的第2樹脂薄片係如上述〔印刷配線板的阻焊劑層用樹脂薄片組〕中所載。 In the step (II), the second resin sheet to be used is contained in the above-mentioned [resin sheet group for a solder resist layer of a printed wiring board).

電路基板與第2樹脂薄片的積層,係可與步驟(I)同樣地實施。電路基板與第2樹脂薄片的積層之後,可將步驟(I)中已說明的平滑化處理實施於第2樹脂薄片中。 The lamination of the circuit board and the second resin sheet can be carried out in the same manner as in the step (I). After the circuit board and the second resin sheet are laminated, the smoothing treatment described in the step (I) can be carried out in the second resin sheet.

步驟(I)與步驟(II),係可使用市售的真空積層機而同時實施。 Step (I) and step (II) can be carried out simultaneously using a commercially available vacuum laminator.

第1及第2支持體可於步驟(III)之前去除。或,第1及第2支持體亦可於步驟(III)之後去除(使用熱硬化性樹脂組成物層的情況),亦可於步驟(III)之間去除(使用光硬化性樹脂組成物層的情況)。 The first and second supports can be removed prior to step (III). Alternatively, the first and second supports may be removed after the step (III) (when the thermosetting resin composition layer is used) or may be removed between the steps (III) (using the photocurable resin composition layer) Case).

-步驟(III)- -Step (III)-

步驟(III)中,使第1及第2樹脂組成物層硬化而形成第1及第2阻焊劑層。 In the step (III), the first and second resin composition layers are cured to form first and second solder resist layers.

樹脂組成物層的硬化條件並無特別限定,使用形成印刷配線板的阻焊劑層時一般所採用的條件即可。 The curing conditions of the resin composition layer are not particularly limited, and the conditions generally employed in forming the solder resist layer of the printed wiring board may be used.

第1及第2樹脂組成物層的至少一方為熱硬化性樹脂組成物層時,步驟(III)包含使熱硬化性樹脂組成物層熱硬化而形成阻焊劑層。 When at least one of the first and second resin composition layers is a thermosetting resin composition layer, the step (III) includes thermally curing the thermosetting resin composition layer to form a solder resist layer.

熱硬化之條件,會因熱硬化性樹脂組成物層中所用樹脂組成物的組成等而異,硬化溫度為120℃~240℃的範圍(較佳為150℃~210℃的範圍、更佳為170℃~190℃的範圍)、硬化時間為5分鐘~150分鐘的範圍(較佳為10分鐘~120分鐘、更佳為15分鐘~90分鐘)。熱硬化係以於大氣壓下(常壓下)進行者佳。此外,熱硬化可實施複數次。例如,可於後述步驟(IV)之前實施步驟(III)複數次,可於後述步驟(IV)之前實施1次以上的步驟(III),再於步驟(IV)及(V)之後,實施1次以上的熱硬化。熱硬化實施n次時,前述「硬化後的彈性率」表示實施了n次熱硬化後的彈性率。 The heat curing conditions vary depending on the composition of the resin composition used in the thermosetting resin composition layer, and the curing temperature is in the range of 120 ° C to 240 ° C (preferably in the range of 150 ° C to 210 ° C, more preferably The range of 170 ° C to 190 ° C) and the hardening time are in the range of 5 minutes to 150 minutes (preferably 10 minutes to 120 minutes, more preferably 15 minutes to 90 minutes). Thermal curing is preferred at atmospheric pressure (under normal pressure). In addition, thermal hardening can be performed multiple times. For example, the step (III) may be carried out plural times before the step (IV) described later, and the step (III) may be carried out once or more before the step (IV) described later, and after the steps (IV) and (V), the method 1 may be carried out. More than one time of thermal hardening. When the thermosetting is performed n times, the above-mentioned "elasticity after hardening" means the elastic modulus after n times of thermal curing.

第1及第2樹脂組成物層的至少一方為光硬化性樹脂組成物層時,步驟(III)包含將光硬化性樹脂組成物層予以曝光、顯像、烘烤而形成阻焊劑層。 When at least one of the first and second resin composition layers is a photocurable resin composition layer, the step (III) includes exposing, developing, and baking the photocurable resin composition layer to form a solder resist layer.

光硬化性樹脂組成物層的曝光,例如,可使用遮罩圖型對光硬化性樹脂組成物層的既定部分照射活性 光線來實施。藉此,可使照射部的光硬化性樹脂組成物光硬化。活性光線方面,可舉例如紫外線、可見光線、電子線、X線等,特別以紫外線為佳。紫外線的照射量並無特別限定,可為使用光硬化性樹脂組成物而形成阻焊劑層時一般所使用的範圍,但較佳為10mJ/cm2~1000mJ/cm2。光硬化性樹脂組成物層上存在支持體時,可自支持體上曝光。 The exposure of the photocurable resin composition layer can be carried out, for example, by irradiating a predetermined portion of the photocurable resin composition layer with active light rays using a mask pattern. Thereby, the photocurable resin composition of the irradiation portion can be photocured. Examples of the active light include ultraviolet rays, visible rays, electron beams, and X-rays, and particularly ultraviolet rays. The amount of the ultraviolet ray to be irradiated is not particularly limited, and may be a range generally used when a solder resist layer is formed using a photocurable resin composition, but is preferably 10 mJ/cm 2 to 1000 mJ/cm 2 . When a support is present on the photocurable resin composition layer, it can be exposed from the support.

顯像係使用顯像液,亦可去除未經光硬化的部分(未曝光部)後予以實施。藉此,可形成所期望的圖型。此外,若光硬化性樹脂組成物層上存在支持體時,可將該支持體去除之後進行顯像即可。顯像液方面,係以鹼性顯像液為佳,可舉例如碳酸鈉水溶液、氫氧化鈉水溶液。顯像方法方面,可舉例如噴霧、搖動浸漬、擦刷、刮削等。 The development system uses a developing solution, and can also be carried out after removing the portion (unexposed portion) which has not been photohardened. Thereby, the desired pattern can be formed. Further, when a support is present on the photocurable resin composition layer, the support may be removed and developed. In the case of the developing solution, an alkaline developing solution is preferred, and examples thereof include an aqueous solution of sodium carbonate and an aqueous solution of sodium hydroxide. Examples of the development method include spraying, shaking, scouring, scraping, and the like.

烘烤之條件雖因光硬化性樹脂組成物層中所用之樹脂組成物的組成等而異,但烘烤溫度可為120℃~240℃的範圍(較佳為150℃~210℃的範圍、更佳為170℃~190℃的範圍)、烘烤時間可為5分鐘~150分鐘的範圍(較佳為10分鐘~120分鐘、更佳為15分鐘~90分鐘)。烘烤係以於大氣壓下(常壓下)進行為佳。此外,烘烤可實施複數次。烘烤實施n次時,前述的「硬化後的彈性率」表示實施了n次烘烤之後的彈性率。 The baking condition varies depending on the composition of the resin composition used in the photocurable resin composition layer, and the baking temperature may be in the range of 120 ° C to 240 ° C (preferably in the range of 150 ° C to 210 ° C, More preferably, it is in the range of 170 ° C to 190 ° C. The baking time may be in the range of 5 minutes to 150 minutes (preferably 10 minutes to 120 minutes, more preferably 15 minutes to 90 minutes). Baking is preferably carried out under atmospheric pressure (under normal pressure). In addition, baking can be carried out multiple times. When the baking is performed n times, the above-mentioned "elasticity after hardening" means the elastic modulus after n times of baking.

第1及第2樹脂組成物層的一側為熱硬化性樹脂組成物層、另一側為光硬化性樹脂組成物層時,對光 硬化性樹脂組成物層實施烘烤,係可與熱硬化性樹脂組成物層的熱硬化同時實施。 When one side of the first and second resin composition layers is a thermosetting resin composition layer and the other side is a photocurable resin composition layer, the light is applied Baking of the curable resin composition layer can be carried out simultaneously with thermal hardening of the thermosetting resin composition layer.

藉由使用本發明之樹脂薄片組來實施步驟(I)~(III),可簡單地製造滿足上述的條件(1)、(2)及(3)的印刷配線板。 By carrying out the steps (I) to (III) by using the resin sheet group of the present invention, it is possible to easily manufacture a printed wiring board which satisfies the above conditions (1), (2) and (3).

-其他的步驟- -Other steps -

印刷配線板的製造方法,可進一步包含(IV)形成開口部之步驟、(V)無電鍍銅處理之步驟。此等之步驟(IV)及(V)係用於印刷配線板的製造,並可依熟知該領域之業者所習知的各種方法來實施。此外,將第1及第2支持體於步驟(III)之後剝離時(使用熱硬化性樹脂組成物層的情況),該第1及第2支持體之剝離係可於步驟(III)與步驟(IV)之間、步驟(IV)與步驟(V)之間、或步驟(V)之後實施。 The method for producing a printed wiring board may further include (IV) a step of forming an opening and (V) a step of electroless copper plating. These steps (IV) and (V) are used in the manufacture of printed wiring boards and can be carried out in accordance with various methods well known to those skilled in the art. Further, when the first and second supports are peeled off after the step (III) (when the thermosetting resin composition layer is used), the peeling of the first and second supports may be in the step (III) and the step. Between (IV), between step (IV) and step (V), or after step (V).

步驟(IV)係形成開口部之步驟。藉此,可於於使用熱硬化性樹脂組成物所形成的阻焊劑層上形成開口部。此外,如有需要,為了於使用光硬化性樹脂組成物所形成的阻焊劑層上形成開口部,亦可實施步驟(IV)。步驟(IV)乃是因應構成阻焊劑層之樹脂組成物的組成等,可使用例如鑽孔、雷射、電漿等來實施。開口部的尺寸或形狀係可視零件實裝基板(亦稱為「半導體裝置」)的設計來適當決定。 Step (IV) is a step of forming an opening. Thereby, an opening portion can be formed on the solder resist layer formed using the thermosetting resin composition. Further, if necessary, in order to form an opening on the solder resist layer formed using the photocurable resin composition, the step (IV) may be carried out. The step (IV) is carried out in accordance with, for example, drilling, laser, plasma, or the like in accordance with the composition of the resin composition constituting the solder resist layer. The size or shape of the opening portion can be appropriately determined depending on the design of the component mounting substrate (also referred to as "semiconductor device").

以雷射來形成開口部時,雷射光源方面,可 舉例如碳酸氣體雷射、YAG雷射、準分子雷射等。其中,更以加工速度、成本之觀點來看,,係以碳酸氣體雷射為佳。 When a laser is used to form an opening, the laser source can be Examples are carbon dioxide gas lasers, YAG lasers, excimer lasers, and the like. Among them, from the viewpoint of processing speed and cost, it is preferable to use a carbon dioxide gas laser.

步驟(V)是無電鍍銅處理之步驟。步驟(IV)中,於所形成之開口部內部,一般乃附著著樹脂殘渣(污斑)。該污斑會成為電氣接續不良的原因,因此,步驟(V)中,乃實施去除污斑之處理(無電鍍銅處理)。 Step (V) is a step of electroless copper plating. In the step (IV), resin residues (stains) are generally adhered to the inside of the formed opening. This stain causes a cause of poor electrical connection. Therefore, in the step (V), the stain removing treatment (electroless copper plating treatment) is performed.

無電鍍銅處理,係可組合乾式無電鍍銅處理、濕式無電鍍銅處理或此等之組合來實施。 The electroless copper plating treatment can be carried out by combining a dry electroless copper plating treatment, a wet electroless copper plating treatment, or a combination thereof.

乾式無電鍍銅處理方面,可舉例如使用電漿之無電鍍銅處理等。使用電漿的無電鍍銅處理係可使用市售的電漿無電鍍銅處理裝置來實施。市售的電漿無電鍍銅處理裝置之中,更以在印刷配線板的製造用途上的較佳例,可舉出(股)Nissin製的微波電漿裝置、積水化學工業(股)製的常壓電漿蝕刻裝置等。 Examples of the dry electroless copper plating treatment include, for example, electroless copper plating treatment using plasma. The electroless copper plating process using plasma can be carried out using a commercially available plasma electroless copper plating apparatus. Among the commercially available plasma electroless copper plating apparatuses, a microwave electric plasma apparatus manufactured by Nissin and a Sekisui Chemical Industry Co., Ltd. are used as a preferred example of the production of the printed wiring board. Normal piezoelectric plasma etching device, etc.

濕式無電鍍銅處理方面,可舉例如使用氧化劑溶液之無電鍍銅處理等。使用氧化劑溶液來進行無電鍍銅處理時,係以依序進行以膨潤液之膨潤處理、以氧化劑溶液之氧化處理、以中和液之中和處理者為佳。膨潤液方面,可舉例如ATOTECH JAPAN(股)製的「Swelling Dip Securiganth P」、「Swelling Dip Securiganth SBU」等。膨潤處理乃是將形成有開口部的基板加熱至60℃~80℃,浸漬於膨潤液5分鐘~10分鐘來進行者為佳。氧化劑 溶液方面,係以鹼性過錳酸水溶液為佳,可舉例如在氫氧化鈉之水溶液中溶解了過錳酸鉀、過錳酸鈉之溶液。以氧化劑溶液所為的氧化處理,乃是藉由將膨潤處理後的基板浸漬於加熱至60℃~80℃之氧化劑溶液中10分鐘~30分鐘來進行者為佳。鹼性過錳酸水溶液的市售品方面,可舉例如ATOTECH JAPAN(股)製的「Concentrate Compact CP」、「Dosing Solution Securiganth P」等。以中和液所為的中和處理,乃是藉由將氧化處理後的基板浸漬於30℃~50℃的中和液中3分鐘~10分鐘來進行者為佳。中和液方面,係以酸性的水溶液為佳,市售品方面,可舉例如ATOTECH JAPAN(股)製的「Reduction Solution Securiganth P」。 The wet electroless copper plating treatment may, for example, be an electroless copper treatment using an oxidizing agent solution. When the electroless copper plating treatment is performed using the oxidizing agent solution, it is preferred to carry out the swelling treatment of the swelling liquid, the oxidation treatment with the oxidizing agent solution, and the neutralizing treatment with the neutralizing liquid. Examples of the swelling liquid include "Swelling Dip Securiganth P" and "Swelling Dip Securiganth SBU" manufactured by ATOTECH JAPAN Co., Ltd., and the like. The swelling treatment is preferably performed by heating the substrate on which the opening is formed to 60° C. to 80° C. and immersing it in the swelling liquid for 5 minutes to 10 minutes. Oxidant The solution is preferably an alkaline permanganic acid aqueous solution, and for example, a solution in which potassium permanganate or sodium permanganate is dissolved in an aqueous solution of sodium hydroxide. The oxidation treatment using the oxidizing agent solution is preferably carried out by immersing the swelled substrate in an oxidizing agent solution heated to 60 ° C to 80 ° C for 10 minutes to 30 minutes. For the commercial product of the alkaline permanganic acid aqueous solution, for example, "Concentrate Compact CP" manufactured by ATOTECH JAPAN Co., Ltd., "Dosing Solution Securiganth P", or the like can be mentioned. The neutralization treatment using the neutralizing liquid is preferably carried out by immersing the substrate after the oxidation treatment in a neutralization liquid at 30 ° C to 50 ° C for 3 minutes to 10 minutes. In the case of the neutralization liquid, an acidic aqueous solution is preferred, and a commercially available product may be, for example, "Reduction Solution Securiganth P" manufactured by ATOTECH JAPAN Co., Ltd.

組合乾式無電鍍銅處理與濕式無電鍍銅處理來實施時,可先實施乾式無電鍍銅處理,亦可先實施濕式無電鍍銅處理。 When the dry electroless copper plating treatment and the wet electroless copper plating treatment are combined, the dry electroless copper plating treatment may be performed first, or the wet electroless copper plating treatment may be performed first.

以上,雖說明了使用本發明之樹脂薄片組來製造印刷配線板之方法,但只要是可獲得滿足上述的條件(1)、(2)及(3)之印刷配線板,製造本發明之印刷配線板之方法並無特別限定。例如,可於電路基板的兩面塗佈樹脂組成物的塗漆,使其乾燥、硬化來製造印刷配線板。 As described above, the method of manufacturing a printed wiring board using the resin sheet group of the present invention has been described, but the printing of the present invention can be produced as long as a printed wiring board satisfying the above conditions (1), (2), and (3) can be obtained. The method of the wiring board is not particularly limited. For example, a coating of a resin composition can be applied to both surfaces of a circuit board, and dried and hardened to produce a printed wiring board.

[半導體裝置] [semiconductor device]

使用本發明之印刷配線板可製造半導體裝置。本發明 之印刷配線板即使是薄型的,在採用高焊料迴流溫度之零件的實裝步驟中,也可以抑制翹曲,有利於減輕電路歪扭或零件的接觸不良等問題。 A semiconductor device can be manufactured using the printed wiring board of the present invention. this invention Even if the printed wiring board is thin, it is possible to suppress warpage in the mounting step of the component using the high solder reflow temperature, and it is advantageous in that the circuit is twisted or the contact failure of the component is reduced.

半導體裝置方面,可舉出供電氣製品(例如,電腦、行動電話、數位相機及電視等)及交通工具(例如,自動二輪車、汽車、電車、船舶及飛機等)等之各種半導體裝置。 Examples of the semiconductor device include various semiconductor devices such as power supply products (for example, computers, mobile phones, digital cameras, and televisions) and vehicles (for example, motorcycles, automobiles, electric cars, ships, and airplanes).

[實施例] [Examples]

以下,藉由實施例以具體地說明本發明,但本發明並不受限於此等之實施例。此外,以下中的「份」及「%」在無其他明確表示的情況下,各自意指「質量份」及「質量%」。 Hereinafter, the present invention will be specifically described by way of examples, but the invention is not limited thereto. In addition, the terms "parts" and "%" in the following terms mean "parts by mass" and "% by mass" unless otherwise stated.

首先,乃就各種測定方法、評價方法進行說明。 First, various measurement methods and evaluation methods will be described.

[評價用基板的調製] [Modulation of Evaluation Substrate] (1)電路基板的準備 (1) Preparation of circuit board

將兩面形成有電路之玻璃布基材環氧樹脂兩面積層板以微蝕刻劑(MEC(股)製「CZ8100」)蝕刻1μm,進行表面電路的粗化處理,準備電路基板。兩面形成有電路之玻璃布基材環氧樹脂兩面積層板方面,有關實施例1、2及4和比較例1及2係使用三菱氣體化學(股)製「HL832NSF-LCA」(大小100mm×150mm、厚度100μm、 熱膨脹率4ppm/℃、彎曲彈性率34GPa、表面銅電路的厚度16μm)、實施例3和比較例3及4是使用日立化成工業(股)製「E679FGR」(大小100mm×150mm、厚度200μm、熱膨脹率14ppm/K、彎曲彈性率26GPa、表面銅電路的厚度16μm(實施例3及比較例3)、8μm(比較例4))。 A two-layer laminate of a glass cloth substrate epoxy resin having a circuit formed on both sides thereof was etched by a microetching agent ("CZ8100" manufactured by MEC Co., Ltd.) to a thickness of 1 μm, and a surface circuit was roughened to prepare a circuit board. For the two-layer laminates of the glass cloth substrate epoxy resin on both sides of the circuit, the first, second and fourth and the comparative examples 1 and 2 are made of Mitsubishi Gas Chemical Co., Ltd. "HL832NSF-LCA" (size 100mm × 150mm) , thickness 100μm, The thermal expansion coefficient was 4 ppm/° C., the bending elastic modulus was 34 GPa, and the thickness of the surface copper circuit was 16 μm. Example 3 and Comparative Examples 3 and 4 were “E679FGR” (100 mm × 150 mm, thickness 200 μm, thermal expansion) manufactured by Hitachi Chemical Co., Ltd. The ratio was 14 ppm/K, the bending elastic modulus was 26 GPa, the thickness of the surface copper circuit was 16 μm (Example 3 and Comparative Example 3), and 8 μm (Comparative Example 4).

(2)樹脂薄片的積層 (2) Lamination of resin sheets

於上述(1)得知之電路基板,係於下述製作例中乃將已製作之樹脂薄片,使用批次式真空加壓積層機(Nichigo-Morton(股)製的2 stage build-up laminator「CVP700」)而以樹脂組成物層與電路基板接著之方式,積層於電路基板的兩面。積層經30秒鐘減壓並使氣壓為13hPa以下後,實施以100℃、壓力0.74MPa使其壓著30秒鐘。接著,於常壓下、100℃、壓力0.5MPa熱加壓60秒鐘進行平滑化處理。 The circuit board obtained in the above (1) is a two-stage build-up laminator manufactured by Nichigo-Morton Co., Ltd. in the following production example. The CVP 700") is laminated on both surfaces of the circuit board so that the resin composition layer and the circuit board are next. After the laminate was decompressed for 30 seconds and the gas pressure was 13 hPa or less, the laminate was pressed at 100 ° C and a pressure of 0.74 MPa for 30 seconds. Next, it was subjected to a smoothing treatment under normal pressure at 100 ° C and a pressure of 0.5 MPa for 60 seconds.

此外,於電路基板的兩面積層之第1及第2樹脂薄片的組合係如表1所示。 Further, the combination of the first and second resin sheets on the two-area layers of the circuit board is shown in Table 1.

接著,如以下所述,使樹脂組成物層硬化而形成阻焊劑層。 Next, as described below, the resin composition layer is cured to form a solder resist layer.

-使用含熱硬化性樹脂組成物層之樹脂薄片1及2的情況-(3)樹脂組成物層的熱硬化 - In the case of using the resin sheets 1 and 2 containing a thermosetting resin composition layer - (3) Thermal hardening of the resin composition layer

自上述(2)所得之基板剝離支持體。接著,在180 ℃、30分鐘之硬化條件下使樹脂組成物層熱硬化形成阻焊劑層。 The substrate was peeled off from the substrate obtained in the above (2). Then, at 180 The resin composition layer was thermally hardened under a hardening condition of ° C for 30 minutes to form a solder resist layer.

(4)開口部的形成 (4) Formation of the opening

使用CO2雷射加工機(三菱電機(股)製「ML605GTWIII-5200U」),以下述條件1形成開口徑60μm之圓孔、以下述條件2形成開口徑500μm之圓孔。 Using a CO 2 laser processing machine ("ML605GTWIII-5200U" manufactured by Mitsubishi Electric Corporation), a circular hole having an opening diameter of 60 μm was formed under the following condition 1, and a circular hole having an opening diameter of 500 μm was formed under the following condition 2.

條件1:遮罩徑0.9mm、脈衝寬幅19μs、能量0.24mJ、拍攝數2、脈衝間歇模式 Condition 1: Mask diameter 0.9mm, pulse width 19μs, energy 0.24mJ, number of shots 2, pulse pause mode

條件2:遮罩徑10mm、脈衝寬幅15μs、能量18mJ、拍攝數4、脈衝間歇模式 Condition 2: mask diameter 10mm, pulse width 15μs, energy 18mJ, number of shots 4, pulse pause mode

(5)無電鍍銅處理 (5) Electroless copper plating

開口部的形成後,將電路基板浸漬於膨潤液(ATOTECH JAPAN(股)製「Swelling Dip Securiganth P」、含二乙二醇單丁基醚及氫氧化鈉之水溶液)60℃、5分鐘,浸漬於氧化劑溶液(ATOTECH JAPAN(股)製「Concentrate Compact CP」、KMnO4:60g/L、NaOH:40g/L之水溶液)80℃、10分鐘,最後是中和液(ATOTECH JAPAN(股)製「Reduction Solution Securiganth P」、硫酸羥基胺水溶液)40℃、5分鐘。之後,於100℃乾燥30分鐘,接著使其進一步於180℃熱硬化,製作評價基板。 After the formation of the opening, the circuit board was immersed in a swelling liquid ("Swelling Dip Securiganth P" manufactured by Atotech JAPAN Co., Ltd., an aqueous solution containing diethylene glycol monobutyl ether and sodium hydroxide) at 60 ° C for 5 minutes, and impregnated. In the oxidizing agent solution (Concentrate Compact CP, manufactured by ATOTECH JAPAN Co., Ltd., KMnO 4 : 60 g/L, NaOH: 40 g/L), at 80 ° C for 10 minutes, and finally neutralized solution (ATOTECH JAPAN Co., Ltd.) Reduction Solution Securiganth P", aqueous solution of hydroxylamine sulfate) at 40 ° C for 5 minutes. Thereafter, it was dried at 100 ° C for 30 minutes, and then further thermally cured at 180 ° C to prepare an evaluation substrate.

-使用含光硬化性樹脂組成物層之樹脂薄片3、4及5的情況- - In the case of using the resin sheets 3, 4 and 5 containing the photocurable resin composition layer - (3’)樹脂組成物層的曝光、顯像及烘烤 (3') Exposure, development and baking of the resin composition layer

將上述(2)所得之基板靜置於室溫1小時。之後,使用遮罩圖型,以可形成開口徑60μm與500μm之圓孔之方式,自支持體上曝光100mJ/cm2之紫外線。曝光係使用圖型形成裝置(USHIO電機(股)製「UX-2240」)予以實施。接著,在室溫下靜置30分鐘,將支持體剝離。 The substrate obtained in the above (2) was allowed to stand at room temperature for 1 hour. Thereafter, using a mask pattern, ultraviolet rays of 100 mJ/cm 2 were exposed from the support so as to form circular holes having an opening diameter of 60 μm and 500 μm. The exposure system was implemented using a pattern forming device ("US-2O Motor Co., Ltd.""UX-2240"). Then, it was allowed to stand at room temperature for 30 minutes to peel off the support.

就所得之基板,於樹脂組成物層的全面上,將顯像液(30℃之2質量%氫氧化鈉水溶液)以噴霧壓0.2MPa噴霧40秒鐘予以顯像。此外,有關使用樹脂薄片4之比較例2,在顯像液方面係使用30℃、1質量%碳酸鈉水溶液。 With respect to the obtained substrate, a developing solution (2% by mass aqueous sodium hydroxide solution at 30 ° C) was sprayed at a spray pressure of 0.2 MPa for 40 seconds on the entire surface of the resin composition layer. Further, in Comparative Example 2 using the resin sheet 4, a 30 ° C, 1% by mass aqueous sodium carbonate solution was used for the developing liquid.

顯像之後,在80℃乾燥30分鐘,接著於180℃烘烤90分鐘,得到評價基板。 After the development, the film was dried at 80 ° C for 30 minutes, and then baked at 180 ° C for 90 minutes to obtain an evaluation substrate.

[評價用硬化物的調製] [Modulation of cured product for evaluation]

評價用硬化物係以下述流程步驟調製。 The hardened material for evaluation was prepared by the following procedure.

-使用含熱硬化性樹脂組成物層樹脂薄片1及2的情況- - When using the thermosetting resin composition layer resin sheets 1 and 2 -

將樹脂薄片1及2之樹脂組成物層以與附離型層之PET薄膜(LINTEC(股)製「PET501010」;以下亦稱為「評價用支持體」)之離型面相接的方式進行配置,使用真空積層機(Nichigo-Morton(股)製「VP160」)予以 積層。積層條件係抽真空20秒鐘、壓著溫度80℃、壓著壓力0.2MPa、加壓時間20秒鐘。 The resin composition layers of the resin sheets 1 and 2 are placed in contact with the release surface of the PET film ("PET501010" manufactured by LINTEC Co., Ltd.; hereinafter referred to as "evaluation support"). The configuration was carried out using a vacuum laminator ("VP160" manufactured by Nichigo-Morton Co., Ltd.). Laminated. The lamination conditions were evacuation for 20 seconds, pressing temperature of 80 ° C, pressing pressure of 0.2 MPa, and pressurization time of 20 seconds.

自所得之積層體剝離來自樹脂薄片之支持體後,以180℃、90分鐘之硬化條件使樹脂組成物層熱硬化。接著,剝離評價用支持體,得到評價用硬化物。 After the obtained laminate was peeled off from the support of the resin sheet, the resin composition layer was thermally cured at 180 ° C for 90 minutes. Next, the support for evaluation was peeled off, and the hardened material for evaluation was obtained.

-使用含光硬化性樹脂組成物層之樹脂薄片3、4及5的情況- - In the case of using the resin sheets 3, 4 and 5 containing the photocurable resin composition layer -

將樹脂薄片3、4及5之樹脂組成物層與上述〔評價用硬化物的調製1〕同樣地實施,積層於附離型層之PET薄膜(LINTEC(股)製「PET501010」;亦稱為「評價用支持體」)的離型面。 The resin composition layers of the resin sheets 3, 4, and 5 were carried out in the same manner as in the above [Preparation 1 of the cured product for evaluation], and a PET film ("PET501010" manufactured by LINTEC Co., Ltd.) was also laminated on the release layer. The release surface of the "evaluation support").

將所得之積層體靜置於室溫1小時後,自支持體上對樹脂組成物層曝光100mJ/cm2之紫外線。剝離來自樹脂薄片之支持體後,以80℃、30分鐘接著180℃、90分鐘的烘烤條件處理樹脂組成物層。接著,剝離評價用支持體,得到評價用硬化物。 After the obtained laminate was allowed to stand at room temperature for 1 hour, the resin composition layer was exposed to ultraviolet rays of 100 mJ/cm 2 from the support. After the support from the resin sheet was peeled off, the resin composition layer was treated at 80 ° C for 30 minutes, followed by 180 ° C for 90 minutes. Next, the support for evaluation was peeled off, and the hardened material for evaluation was obtained.

<翹曲之評價> <evaluation of warpage>

先將評價用基板通過一次再現波峰溫度260℃之焊料迴流溫度的迴流裝置(日本ANTUM(股)製「HAS-6116」)(迴流溫度曲線乃依IPC/JEDEC J-STD-020C為準則)。接著,使用陰影疊紋裝置(Akrometrix製「TherMoire AXP」),以依IPC/JEDEC J-STD-020C (波峰溫度260℃)為準的迴流溫度曲線加熱評價基板下面,基於配置於評價基板上面的格子線,測定評價基板中央之25mm角部分的變位。 First, the evaluation substrate was passed through a reflow device ("HAS-6116" manufactured by ANTM Co., Ltd.) which reproduces the solder reflow temperature at a peak temperature of 260 ° C (the reflow temperature curve is based on IPC/JEDEC J-STD-020C). Next, use a shadow overlay device ("TherMoire AXP" by Akrometrix) to IPC/JEDEC J-STD-020C The reflow temperature profile (the peak temperature of 260 ° C) was used to heat the evaluation substrate, and the displacement of the 25 mm corner portion in the center of the evaluation substrate was measured based on the lattice line disposed on the upper surface of the evaluation substrate.

所得之變位數據的最大高度與最小高度之差異,令在全溫度範圍下為50μm以上者「×」、若未達50μm則為「○」。 The difference between the maximum height and the minimum height of the obtained displacement data is "x" for 50 μm or more in the full temperature range, and "○" if it is less than 50 μm.

<彈性率之測定> <Measurement of elastic modulus>

將評價用硬化物切出啞鈴狀,得到試驗片。將該試驗片使用ORIENTEC公司製拉伸試驗機「RTC-1250A」進行拉伸強度測定,求得23℃及200℃中的彈性率。測定乃依據JIS K7127來實施。 The cured product for evaluation was cut out into a dumbbell shape to obtain a test piece. The test piece was subjected to tensile strength measurement using a tensile tester "RTC-1250A" manufactured by ORIENTEC Co., Ltd., and the elastic modulus at 23 ° C and 200 ° C was determined. The measurement was carried out in accordance with JIS K7127.

<玻璃轉移點溫度(Tg)之測定> <Measurement of glass transition point temperature (Tg)>

將評價用硬化物切成寬幅5mm、長度15mm之試驗片。就該試驗片使用熱機械分析裝置(Seiko Instruments(股)製「TMA-SS6100」),進行以拉伸加重法所為的熱機械分析。詳細而言,係將試驗片裝設於前述裝置之後,以荷重1g、昇溫速度5℃/分之測定條件連續測定2次。第2次測定中,從尺寸變化訊號的斜率變化之點算出玻璃轉移點溫度Tg(℃)。 The cured product for evaluation was cut into test pieces having a width of 5 mm and a length of 15 mm. A thermomechanical analysis apparatus ("TMA-SS6100" manufactured by Seiko Instruments Co., Ltd.) was used for the test piece, and thermomechanical analysis by a tensile weighting method was performed. Specifically, after the test piece was placed in the above apparatus, the test piece was continuously measured twice under the measurement conditions of a load of 1 g and a temperature increase rate of 5 ° C /min. In the second measurement, the glass transition point temperature Tg (° C.) was calculated from the point where the slope of the dimensional change signal was changed.

實施例及比較例中使用的樹脂薄片1、2、3、4及5,係以下述流程步驟製作。 The resin sheets 1, 2, 3, 4, and 5 used in the examples and the comparative examples were produced in the following flow steps.

<製作例1>樹脂薄片1之製作 <Production Example 1> Production of Resin Sheet 1

將雙酚A型環氧樹脂(三菱化學(股)製「jER828EL」、環氧當量約185)12份、萘型環氧樹脂(DIC(股)製「HP4032SS」、環氧當量約144)3份、聯二甲苯酚型環氧樹脂(三菱化學(股)製「YX4000HK」、環氧當量約185)6份、聯苯型環氧樹脂(日本化藥(股)製「NC3000H」、環氧當量約288)25份、苯氧基樹脂(三菱化學(股)製「YX6954BH30」、固形分30質量%之MEK與環己酮的1:1溶液)10份,邊攪拌溶解於溶劑石油腦15份中邊加熱使其溶解。冷卻至室溫為止之後,朝其中,混合含三嗪骨架之苯酚酚醛清漆系硬化劑(DIC(股)製「LA-7054」、羥基當量125、固形分60%之MEK溶液)20份、萘酚系硬化劑(新日鐵住金化學(股)製「SN485」、羥基當量215、固形分60%之MEK溶液)10份、硬化促進劑(4-二甲基胺基吡啶(DMAP)、固形分5質量%之MEK溶液)0.4份、難燃劑(三光(股)製「HCA-HQ」、10-(2,5-二羥基苯基)-10-氫-9-氧雜-10-膦菲-10-氧化物、平均粒徑2μm)3份、以胺基矽烷系耦合劑(信越化學工業(股)製「KBM573」)所表面處理之球狀氧化矽(平均粒徑1μm、(股)Admatechs製「SOC4」、每單位表面積之碳量0.47mg/m2)240份,以高速旋轉攪拌機均一地分散,調製樹脂塗漆1。 Bisphenol A type epoxy resin ("JER828EL" manufactured by Mitsubishi Chemical Corporation, epoxy equivalent: 185) 12 parts, naphthalene type epoxy resin ("HD4032SS" manufactured by DIC Co., Ltd., epoxy equivalent of about 144) 3 Separate, bi-xylenol type epoxy resin ("XX4000HK" manufactured by Mitsubishi Chemical Corporation, epoxy resin equivalent: 185), 6 parts, biphenyl type epoxy resin ("30003000" made by Nippon Kayaku Co., Ltd., epoxy Equivalent to 288) 25 parts, 10 parts of phenoxy resin ("XX6954BH30" manufactured by Mitsubishi Chemical Corporation, 1:1 solution of MEK and cyclohexanone in 30% by mass), and dissolved in solvent petroleum brain 15 while stirring The mixture was heated to dissolve it. After cooling to room temperature, 20 parts of a phenol novolac-based curing agent ("LA-7054" manufactured by DIC Co., Ltd., a hydroxyl group equivalent of 125, and a 60% solid MEK solution) containing a triazine skeleton was mixed therein, and naphthalene was added. Phenolic curing agent ("SN485" manufactured by Nippon Steel & Sumitomo Chemical Co., Ltd., hydroxyl equivalent 215, 60% MEK solution), hardening accelerator (4-dimethylaminopyridine (DMAP), solid form 5% by mass of MEK solution) 0.4 parts, flame retardant ("HCA-HQ", 10-(2,5-dihydroxyphenyl)-10-hydro-9-oxa-10-, manufactured by Sanguang Co., Ltd. A spherical cerium oxide surface-treated with an average particle diameter of 1 μm, (phosphonophene-10-oxide, average particle diameter: 2 μm), and an amine decane-based coupling agent ("KBM573" manufactured by Shin-Etsu Chemical Co., Ltd.) In the company, "SOC4" manufactured by Admatechs, with a carbon content of 0.47 mg/m 2 per unit surface area, 240 parts, was uniformly dispersed by a high-speed rotary mixer to prepare a resin paint 1 .

支持體方面,係準備厚度38μm之PET薄膜 (東麗(股)製「NS80A」)。於該支持體的平滑面,均一地塗佈樹脂塗漆1,使乾燥後的樹脂組成物層厚度為16μm,使其於80℃~120℃(平均100℃)乾燥3分鐘,製作樹脂薄片1。 For the support, a PET film with a thickness of 38 μm is prepared. (Toray (share) system "NS80A"). The resin paint 1 was uniformly applied to the smooth surface of the support, and the thickness of the resin composition layer after drying was 16 μm, and dried at 80 ° C to 120 ° C (average 100 ° C) for 3 minutes to prepare a resin sheet 1 .

<製作例2>樹脂薄片2之製作 <Production Example 2> Production of Resin Sheet 2

除了使用苯氧基樹脂(三菱化學(股)製「YX6954BH30」、固形分30質量%之MEK/環己酮=1/1溶液)30份來取代苯氧基樹脂(三菱化學(股)製「YX6954BH30」、固形分30質量%之MEK/環己酮=1/1溶液)10份之點、使用以胺基矽烷系耦合劑(信越化學工業(股)製「KBM573」)所表面處理之球狀氧化矽(平均粒徑0.5μm、(股)Admatechs製「SOC2」、每單位表面積之碳量0.39mg/m2)75份來取代以胺基矽烷系耦合劑(信越化學工業(股)製「KBM573」)所表面處理之球狀氧化矽(平均粒徑1μm、(股)Admatechs製「SOC4」、每單位表面積之碳量0.47mg/m2)240份之點、和將溶劑石油腦的使用量從15份變更為10份之點以外,其餘係與製作例1同樣地實施,調製樹脂塗漆2,並製作樹脂薄片2。 In place of phenoxy resin (Mitsubishi Chemical Co., Ltd.), 30 parts of phenoxy resin ("XX6954BH30" manufactured by Mitsubishi Chemical Co., Ltd., 30% by mass of MEK/cyclohexanone = 1/1 solution) The surface treated with an amine decane-based coupling agent ("KBM573" manufactured by Shin-Etsu Chemical Co., Ltd.) was used for 10 parts of YX6954BH30", a solid content of 30% by mass of MEK/cyclohexanone = 1/1 solution). 75 parts of cerium oxide (average particle diameter: 0.5 μm, "SOC2" manufactured by Admatechs, 0.39 mg/m 2 of carbon per unit surface area) was substituted for the amine decane-based coupling agent (Shin-Etsu Chemical Co., Ltd.) "KBM573") The spherical cerium oxide (average particle size: 1 μm, "SOC4" manufactured by Admatechs, 0.47 mg/m 2 per unit surface area) treated with 240 parts of the surface, and the solvent petroleum brain The resin paint 2 was prepared in the same manner as in Production Example 1 except that the amount of use was changed from 15 parts to 10 parts, and the resin sheet 2 was produced.

<製作例3)>樹脂薄片3之製作 <Production Example 3> Production of Resin Sheet 3

混合聯二甲苯酚型環氧樹脂(三菱化學(股)製「YX4000HK」、環氧當量185、不揮發成分30質量%之 MEK與環己酮的1:1溶液)100份、下述合成例1合成之光硬化型鹼可溶性樹脂A 73份、光聚合起始劑(BASF JAPAN(股)製「OXE-02」、乙酮,1-〔9-乙基-6-(2-甲基苯甲醯基)-9H-咔唑-3-基〕-,1-(0-乙醯基肟)、不揮發成分10質量%之MEK溶液)18份、以胺基矽烷系耦合劑(信越化學工業(股)製「KBM573」)所表面處理之球狀氧化矽(平均粒徑0.5μm、(股)Admatechs製「SOC2」、每單位表面積之碳量0.39mg/m2)120份、以胺基矽烷系耦合劑(信越化學工業(股)製「KBM573」)所表面處理之球狀氧化矽(平均粒徑0.1μm、電氣化學工業(股)製「UFP-30」)20份、稀釋劑(日本化藥(股)製「DPHA」、二季戊四醇六丙烯酸酯)10份、硬化促進劑(四國化成(股)製「2P4MZ」、2-苯基-4-甲基咪唑、不揮發成分2.5質量%之MEK溶液)8.8份、橡膠粒子(GANTSU KASEI(股)製「AC3816N」)2.4份、光增感劑(日本化藥(股)製「DETX-S」、2、4-二乙基硫代基氧雜蒽酮、不揮發成分10質量%之MEK溶液)4.4份、二乙二醇單乙基醚縮醛10份,以高速旋轉攪拌機均一地分散,調製樹脂塗漆3。 Mixed bi-xylenol type epoxy resin ("YX4000HK" manufactured by Mitsubishi Chemical Co., Ltd., epoxy equivalent 185, 1:1 solution of MEK and cyclohexanone having a nonvolatile content of 30% by mass) 100 parts, the following synthesis example 1 Synthetic photocuring alkali-soluble resin A 73 parts, photopolymerization initiator ("OXE-02" manufactured by BASF JAPAN Co., Ltd., ethyl ketone, 1-[9-ethyl-6-(2-methylbenzene) Mercapto)-9H-carbazol-3-yl]-, 1-(0-ethenylhydrazine), 10% by mass of MEK solution with nonvolatile content) 18 parts, with amine decane-based coupling agent (Shin-Etsu Chemical) In the industrial (stock) system "KBM573"), spherical cerium oxide (average particle diameter: 0.5 μm, "SOC2" manufactured by Admatechs, carbon content per unit surface area: 0.39 mg/m 2 ) 120 parts, amine 20 parts of spherical cerium oxide (average particle diameter: 0.1 μm, "UFP-30" manufactured by Electrochemical Industry Co., Ltd.) and thinner treated by a sulfonium-based coupling agent ("KBM573" manufactured by Shin-Etsu Chemical Co., Ltd.) ("DPHA", dipentaerythritol hexaacrylate) manufactured by Nippon Kayaku Co., Ltd., 10 parts, hardening accelerator (2P4MZ, 4-phenyl-4-methylimidazole, non-volatile content, manufactured by Shikoku Kasei Co., Ltd.) 2.5% by mass of MEK solution) 8.8 parts, rubber particles (GA NTSU KASEI ("AC3816N") (2.4 parts), photo-sensitizer ("TX-S" made by Nippon Kayaku Co., Ltd., 2, 4-ethylthioxyxanthone, non-volatile component 10 4.4 parts by mass of MEK solution) and 10 parts of diethylene glycol monoethyl ether acetal were uniformly dispersed by a high-speed rotary mixer to prepare a resin paint 3.

支持體方面,係準備厚度16μm之PET薄膜(三菱樹脂(股)製「R310-16B」)。於該支持體上均一地塗佈樹脂塗漆3以使乾燥後的樹脂組成物層的厚度為23μm,在75℃~120℃(平均100℃)使其乾燥5分鐘,製作樹脂薄片3。 For the support, a PET film ("R310-16B" manufactured by Mitsubishi Plastics Co., Ltd.) having a thickness of 16 μm was prepared. The resin paint 3 was uniformly applied to the support so that the thickness of the dried resin composition layer was 23 μm, and it was dried at 75 ° C to 120 ° C (average 100 ° C) for 5 minutes to prepare a resin sheet 3.

(合成例1)光硬化型鹼可溶性樹脂A之合成 (Synthesis Example 1) Synthesis of photocurable alkali-soluble resin A

於300mL之分離式燒瓶中,量取卡必醇乙酸酯25g、3-異氰酸基-3,5,5-三甲基環己基異氰酸酯(EVONIK(股)製)50g,在40℃加熱攪拌。又,量取季戊四醇三丙烯酸酯含有物(東亞合成(股)製「M306」)92.23g、卡必醇乙酸酯25g、二月桂酸二丁基錫(東京化成工業(股)製)0.45g、氫醌(東京化成工業(股)製)0.4g,以攪拌機((股)THINKY製「泡取練太郎」)混合8分鐘,得到混合液1。將所得的混合液1,使用滴下漏斗,花費1小時以上滴入上述300mL之分離式燒瓶內。之後,以40℃加熱攪拌30分鐘,得到3-異氰酸基-3,5,5-三甲基環己基異氰酸酯與季戊四醇三丙烯酸酯的反應物193.08g。 In a separate flask of 300 mL, 25 g of carbitol acetate and 50 g of 3-isocyanato-3,5,5-trimethylcyclohexyl isocyanate (manufactured by EVONIK Co., Ltd.) were weighed and heated at 40 ° C. Stir. Further, 92.23 g of a pentaerythritol triacrylate-containing material ("M306" manufactured by Toagosei Co., Ltd.), 25 g of carbitol acetate, and 0.45 g of dibutyltin dilaurate (manufactured by Tokyo Chemical Industry Co., Ltd.) and hydrogen were weighed. 0.4 g of 醌 (manufactured by Tokyo Chemical Industry Co., Ltd.) was mixed for 8 minutes with a stirrer ("Hot-Taro" manufactured by THINKY Co., Ltd.) to obtain a mixed solution 1. The obtained mixed solution 1 was dropped into the above-mentioned 300 mL separation flask using a dropping funnel over 1 hour. Thereafter, the mixture was heated and stirred at 40 ° C for 30 minutes to obtain 193.08 g of a reaction product of 3-isocyanato-3,5,5-trimethylcyclohexyl isocyanate and pentaerythritol triacrylate.

另一方面,於500mL之分離式燒瓶中,量取卡必醇乙酸酯132.26g、苯酚酚醛清漆樹脂(DIC(股)製「TD-2090」)132.26g,以75℃攪拌直到完全溶解為止。接著,加入上述反應物193.08g,以IR在85℃加熱攪拌直到異氰酸酯基消失為止。冷卻至40℃之後,加入乙醇(純正化學(股)製)3.11g,再攪拌2小時以上,得到包含丙烯酸酯基與苯酚性羥基之光硬化型鹼可溶性樹脂A(丙烯酸酯變性苯酚樹脂)460.71g。所得之光硬化型鹼可溶性樹脂A的性狀如下。 On the other hand, 132.26 g of carbitol acetate and 132.26 g of phenol novolak resin ("TD-2090" manufactured by DIC) were weighed in a 500 mL separation flask, and stirred at 75 ° C until completely dissolved. . Next, 193.08 g of the above reactant was added, and the mixture was stirred with IR at 85 ° C until the isocyanate group disappeared. After cooling to 40 ° C, 3.11 g of ethanol (manufactured by Pure Chemical Co., Ltd.) was added, and the mixture was further stirred for 2 hours or more to obtain a photocurable alkali-soluble resin A (acrylate-modified phenol resin) containing an acrylate group and a phenolic hydroxyl group. g. The properties of the obtained photocurable alkali-soluble resin A are as follows.

.固形分60質量%之溶劑溶解品 . 60% by mass solid solvent dissolved product

.丙烯酸酯基的比率18% . Acrylate group ratio of 18%

.聚苯乙烯換算之數平均分子量(Mn):4000 . Polystyrene-converted average molecular weight (Mn): 4000

.羥基當量:246 . Hydroxyl equivalent: 246

<製作例4>樹脂薄片4之製作 <Production Example 4> Production of Resin Sheet 4

混合聯二甲苯酚型環氧樹脂(三菱化學(股)製「YX4000HK」、環氧當量185、不揮發成分30質量%之MEK與環己酮的1:1溶液)80份、含丙烯酸酯基與羧基之光硬化型鹼可溶性樹脂(日本化藥(股)製「ZFR-1533H」、雙酚F型環氧丙烯酸酯、固形分68%之二乙二醇單乙基醚乙酸酯溶液、酸價70mgKOH/g)147份、光聚合起始劑(BASF JAPAN(股)製「IRGACURE 907」、2-甲基-〔4-(甲基硫代基)苯基〕嗎啉基-1-丙酮)2.5份、以胺基矽烷系耦合劑(信越化學工業(股)製「KBM573」)所表面處理之球狀氧化矽(平均粒徑0.5μm、(股)Admatechs製「SOC2」、每單位表面積之碳量0.39mg/m2)80份、以胺基矽烷系耦合劑(信越化學工業(股)製「KBM573」)所表面處理之球形氧化矽(平均粒徑0.1μm、電氣化學工業(股)製「UFP-30」)20份、稀釋劑(共榮社化學工業(股)製「DCPA」、三環癸烷二甲醇二丙烯酸酯)10份、硬化促進劑(四國化成(股)製「2P4MZ」、2-苯基-4-甲基咪唑、不揮發成分2.5質量%之MEK溶液)8.8份、橡膠粒子(GANTSU KASEI(股)製「AC3816N」)2.4份、光增感劑(日本 化藥(股)製「DETX-S」、2、4-二乙基硫代基氧雜蒽酮、不揮發成分10質量%之MEK溶液)2份、二乙二醇單乙基醚縮醛(有機溶劑)3份,以高速旋轉攪拌機均一地分散,調製樹脂塗漆4。 Mixed dimethyl phenol type epoxy resin ("YX4000HK" manufactured by Mitsubishi Chemical Corporation, epoxy equivalent 185, 1:1 solution of MEK and cyclohexanone having a nonvolatile content of 30% by mass) 80 parts, containing acrylate group Photocurable alkali-soluble resin with carboxyl group (ZFR-1533H, manufactured by Nippon Kayaku Co., Ltd.), bisphenol F-type epoxy acrylate, and 68% diethylene glycol monoethyl ether acetate solution. 147 parts of acid value 70 mgKOH/g), photopolymerization initiator (IRGACURE 907, manufactured by BASF JAPAN Co., Ltd., 2-methyl-[4-(methylthio)phenyl]morpholinyl-1- Alumina spheroidal cerium oxide (average particle diameter: 0.5 μm, (stock) Admatechs "SOC2", per unit) of an amine-based decane-based coupling agent ("KBM573" manufactured by Shin-Etsu Chemical Co., Ltd.) The amount of carbon on the surface area is 0.39 mg/m 2 ) 80 parts, and the spherical cerium oxide surface-treated with an amino decane-based coupling agent ("KBM573" manufactured by Shin-Etsu Chemical Co., Ltd.) (average particle diameter: 0.1 μm, electrical chemical industry ( 20 parts of "UFP-30"), 10 parts of thinner ("DCPA" manufactured by Kyoeisha Chemical Industry Co., Ltd., tricyclodecane dimethanol diacrylate), and hardening accelerator (Four countries) )"2" 8.8 parts of P4MZ", 2-phenyl-4-methylimidazole, 2.5% by mass of MEK solution of nonvolatile matter), 2.4 parts of rubber particles ("AC3816N" manufactured by GANTSU KASEI), and photosensitizer (Japan) "DETX-S", 2, 4-diethylthioxanthone, 10% by mass of MEK solution of non-volatile content) 2 parts, diethylene glycol monoethyl ether acetal 3 parts of organic solvent) was uniformly dispersed by a high-speed rotary mixer to prepare a resin paint 4.

支持體方面,係準備厚度16μm之PET薄膜(三菱樹脂(股)製「R310-16B」)。於該支持體上均一地塗佈樹脂塗漆4使乾燥後的樹脂組成物層的厚度為23μm,在75℃~120℃(平均100℃)使其乾燥5分鐘,製作樹脂薄片4。 For the support, a PET film ("R310-16B" manufactured by Mitsubishi Plastics Co., Ltd.) having a thickness of 16 μm was prepared. The resin paint 4 was uniformly applied to the support, and the thickness of the resin composition layer after drying was 23 μm, and dried at 75 ° C to 120 ° C (average 100 ° C) for 5 minutes to prepare a resin sheet 4.

<製作例5>樹脂薄片5之製作 <Production Example 5> Production of Resin Sheet 5

除了均一地塗佈樹脂塗漆3使乾燥後的樹脂組成物層的厚度為8μm,並在75~120℃(平均100℃)使其乾燥2分鐘以外,其餘係與製作例3同樣地實施,製作樹脂薄片5。 The resin coating layer 3 was uniformly applied so that the thickness of the dried resin composition layer was 8 μm, and it was dried at 75 to 120 ° C (average 100 ° C) for 2 minutes, and the same procedure as in Production Example 3 was carried out. A resin sheet 5 was produced.

將所得之樹脂薄片1~5如下述表1所示般予以組合,準備樹脂薄片組1~6。又,就各樹脂薄片組中所使用的樹脂薄片1~5,乃遵照上述〔評價用硬化物的調製〕調製評價用硬化物,測定彈性率、玻璃轉移溫度(Tg)。將結果一併顯示於表1。 The obtained resin sheets 1 to 5 were combined as shown in the following Table 1, and resin sheet groups 1 to 6 were prepared. In the resin sheets 1 to 5 used in the resin sheet group, the cured product for evaluation was prepared in accordance with the above [Preparation of cured product for evaluation], and the modulus of elasticity and the glass transition temperature (Tg) were measured. The results are shown together in Table 1.

<實施例1> <Example 1>

使用樹脂薄片組1,依上述〔評價用基板的調製〕得到評價用基板。將評價結果顯示於表2。 Using the resin sheet group 1, the evaluation substrate was obtained in accordance with the above [modulation of the evaluation substrate]. The evaluation results are shown in Table 2.

<實施例2> <Example 2>

使用樹脂薄片組2,依上述〔評價用基板的調製〕得到評價用基板。將評價結果顯示於表2。 Using the resin sheet group 2, the evaluation substrate was obtained in accordance with the above [modulation of the evaluation substrate]. The evaluation results are shown in Table 2.

<實施例3> <Example 3>

使用樹脂薄片組1,依上述〔評價用基板的調製〕得到評價用基板。將評價結果顯示於表2。 Using the resin sheet group 1, the evaluation substrate was obtained in accordance with the above [modulation of the evaluation substrate]. The evaluation results are shown in Table 2.

<實施例4> <Example 4>

使用樹脂薄片組3,依上述〔評價用基板的調製〕得到評價用基板。將評價結果顯示於表2。 Using the resin sheet group 3, the evaluation substrate was obtained in accordance with the above [modulation of the evaluation substrate]. The evaluation results are shown in Table 2.

<比較例1> <Comparative Example 1>

使用樹脂薄片組4,依上述〔評價用基板的調製〕得到評價用基板。將評價結果顯示於表2。 Using the resin sheet group 4, the evaluation substrate was obtained in accordance with the above [modulation of the evaluation substrate]. The evaluation results are shown in Table 2.

<比較例2> <Comparative Example 2>

使用樹脂薄片組5,依上述〔評價用基板的調製〕得到評價用基板。將評價結果顯示於表2。 Using the resin sheet group 5, the evaluation substrate was obtained in accordance with the above [modulation of the evaluation substrate]. The evaluation results are shown in Table 2.

<比較例3> <Comparative Example 3>

使用樹脂薄片組4,依上述〔評價用基板的調製〕得到評價用基板。將評價結果顯示於表2。 Using the resin sheet group 4, the evaluation substrate was obtained in accordance with the above [modulation of the evaluation substrate]. The evaluation results are shown in Table 2.

<比較例4> <Comparative Example 4>

使用樹脂薄片組6,依上述〔評價用基板的調製〕得到評價用基板。將評價結果顯示於表2。 Using the resin sheet group 6, the evaluation substrate was obtained in accordance with the above [modulation of the evaluation substrate]. The evaluation results are shown in Table 2.

Claims (8)

一種印刷配線板,其係包含第1及第2阻焊劑層之印刷配線板,其中令第1阻焊劑層的厚度為t1(μm)、硬化後的彈性率(23℃)為G1(GPa)、令第2阻焊劑層的厚度為t2(μm)、硬化後的彈性率(23℃)為G2(GPa),且令印刷配線板的厚度為Z(μm)時,滿足下述條件(1)~(3):(1)Z≦250;(2)(t1+t2)/Z≧0.1;及(3)G1×〔t1/(t1+t2)〕+G2×〔t2/(t1+t2)〕≧6,且G1為6以上。 A printed wiring board comprising a printed wiring board of a first and a second solder resist layer, wherein a thickness of the first solder resist layer is t 1 (μm), and an elastic modulus after hardening (23 ° C) is G 1 ( GPa), the thickness of the second solder resist layer is t 2 (μm), and the elastic modulus after curing (23 ° C) is G 2 (GPa), and when the thickness of the printed wiring board is Z (μm), the following is satisfied. Conditions (1) to (3): (1) Z ≦ 250; (2) (t 1 + t 2 ) / Z ≧ 0.1; and (3) G 1 × [t 1 / (t 1 + t 2 ) ]+G 2 ×[t 2 /(t 1 +t 2 )]≧6, and G 1 is 6 or more. 如請求項1中記載之印刷配線板,其中,第1阻焊劑層之硬化後的玻璃轉移溫度(Tg)為150℃以上。 The printed wiring board according to claim 1, wherein the glass transition temperature (Tg) after curing of the first solder resist layer is 150 ° C or higher. 如請求項1中記載之印刷配線板,其中,第1阻焊劑層係將無機填充材含量為60質量%以上之樹脂組成物予以硬化所形成者。 The printed wiring board according to claim 1, wherein the first solder resist layer is formed by curing a resin composition having an inorganic filler content of 60% by mass or more. 如請求項1中記載之印刷配線板,其中,條件(2)為0.1≦(t1+t2)/Z≦0.5。 The printed wiring board according to claim 1, wherein the condition (2) is 0.1 ≦(t 1 + t 2 ) / Z ≦ 0.5. 如請求項1中記載之印刷配線板,其中,G2為6以上。 The printed wiring board according to claim 1, wherein G 2 is 6 or more. 如請求項1中記載之印刷配線板,其中,令第1阻焊劑層之硬化後的彈性率(200℃)為G1’(GPa)、令第2阻焊劑層之硬化後的彈性率(200℃)為G2’(GPa) 時,進一步滿足下述條件(4):(4)G1’×〔t1/(t1+t2)〕+G2’×〔t2/(t1+t2)〕≧0.2。 The printed wiring board according to claim 1, wherein the elastic modulus (200 ° C) after curing of the first solder resist layer is G 1 ' (GPa), and the elastic modulus after curing of the second solder resist layer ( When 200 ° C) is G 2 '(GPa), the following condition (4) is further satisfied: (4) G 1 '×[t 1 /(t 1 +t 2 )]+G 2 '×[t 2 /( t 1 + t 2 )] ≧ 0.2. 一種半導體裝置,其係包含如請求項1~6中任一項記載之印刷配線板。 A semiconductor device comprising the printed wiring board according to any one of claims 1 to 6. 一種樹脂薄片組,其係印刷配線板的阻焊劑層用樹脂薄片組,其係包含具第1支持體以及與該第1支持體接合之第1樹脂組成物層所成之第1樹脂薄片、與具第2支持體以及與該第2支持體接合之第2樹脂組成物層所成之第2樹脂薄片,令第1樹脂組成物層的厚度為t1p(μm)、硬化後的彈性率(23℃)為G1(GPa)、令第2樹脂組成物層的厚度為t2P(μm)、硬化後的彈性率(23℃)為G2(GPa),且令印刷配線板的厚度為Z(μm)時,滿足下述條件(1’)~(3’):(1’)Z≦250;(2’)(t1p+t2p)/Z≧0.1;及(3’)G1×〔t1p/(t1p+t2p)〕+G2×〔t2p/(t1p+t2p)〕≧6,且G1為6以上。 A resin sheet group which is a resin sheet group for a solder resist layer of a printed wiring board, comprising a first resin sheet having a first support and a first resin composition layer joined to the first support, The second resin sheet formed of the second resin composition layer having the second support and the second support is made to have a thickness of the first resin composition layer of t 1p (μm) and an elastic modulus after curing. (23 ° C) is G 1 (GPa), the thickness of the second resin composition layer is t 2P (μm), and the elastic modulus after curing (23 ° C) is G 2 (GPa), and the thickness of the printed wiring board is made. When Z (μm), the following conditions (1') to (3') are satisfied: (1') Z ≦ 250; (2') (t 1p + t 2p ) / Z ≧ 0.1; and (3') G 1 ×[t 1p /(t 1p +t 2p )]+G 2 ×[t 2p /(t 1p +t 2p )]≧6, and G 1 is 6 or more.
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JP6852332B2 (en) * 2015-10-28 2021-03-31 味の素株式会社 Adhesive film
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Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IL151941A0 (en) * 2001-01-29 2003-04-10 Jsr Corp Composite particles for dielectrics, ultrafine particle-resin composite particles, dielectric-forming composition and applications thereof
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CN101433134B (en) * 2006-04-28 2012-05-30 住友电木株式会社 Solder resist material, wiring board using the solder resist material, and semiconductor package
JP5094323B2 (en) * 2007-10-15 2012-12-12 新光電気工業株式会社 Wiring board manufacturing method
JP5352175B2 (en) 2008-03-26 2013-11-27 太陽ホールディングス株式会社 Photosensitive resin composition, cured product thereof, and printed wiring board having solder resist layer made of the cured product
KR20100062550A (en) * 2008-12-02 2010-06-10 삼성전기주식회사 A package substrate including solder resist layers having pattern and a fabricating method the same
JP4473935B1 (en) * 2009-07-06 2010-06-02 新光電気工業株式会社 Multilayer wiring board
KR101096039B1 (en) * 2009-11-09 2011-12-19 주식회사 하이닉스반도체 Printed circuit board and semiconductor package by using the same
JP5415923B2 (en) * 2009-12-14 2014-02-12 太陽ホールディングス株式会社 Photosensitive resin composition, dry film thereof, and printed wiring board using them
JP6123152B2 (en) * 2010-12-08 2017-05-10 味の素株式会社 Resin composition
JP2012198361A (en) * 2011-03-22 2012-10-18 Fujifilm Corp Photosensitive composition, photosensitive film, method for forming permanent pattern, permanent pattern, and printed board
JP5861400B2 (en) * 2011-11-09 2016-02-16 イビデン株式会社 Semiconductor mounting materials
JP2013115171A (en) * 2011-11-28 2013-06-10 Hitachi Chemical Co Ltd Printed wiring board, manufacturing method thereof, and thermosetting resin composition
JP2012146990A (en) * 2012-02-22 2012-08-02 Sumitomo Bakelite Co Ltd Multilayer circuit board, method of manufacturing the same, and semiconductor device
JP5955102B2 (en) * 2012-05-29 2016-07-20 京セラ株式会社 Wiring board and manufacturing method thereof
JP6111248B2 (en) * 2012-07-13 2017-04-05 日本化薬株式会社 Alkali developable resin and photosensitive resin composition using the same

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