TWI673384B - Substrate neutralization mechanism and vacuum processing apparatus using the same - Google Patents

Substrate neutralization mechanism and vacuum processing apparatus using the same Download PDF

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TWI673384B
TWI673384B TW105115055A TW105115055A TWI673384B TW I673384 B TWI673384 B TW I673384B TW 105115055 A TW105115055 A TW 105115055A TW 105115055 A TW105115055 A TW 105115055A TW I673384 B TWI673384 B TW I673384B
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discharge
substrate
film
static elimination
processing
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TW201706437A (en
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廣野貴啓
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日商愛發科股份有限公司
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    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/58After-treatment
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/56Apparatus specially adapted for continuous coating; Arrangements for maintaining the vacuum, e.g. vacuum locks
    • C23C14/562Apparatus specially adapted for continuous coating; Arrangements for maintaining the vacuum, e.g. vacuum locks for coating elongated substrates
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/54Apparatus specially adapted for continuous coating
    • C23C16/545Apparatus specially adapted for continuous coating for coating elongated substrates
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/56After-treatment

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  • Chemical & Material Sciences (AREA)
  • Organic Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Chemical & Material Sciences (AREA)
  • Physical Vapour Deposition (AREA)
  • Feeding Of Articles By Means Other Than Belts Or Rollers (AREA)
  • Advancing Webs (AREA)
  • Elimination Of Static Electricity (AREA)
  • Treatments Of Macromolecular Shaped Articles (AREA)

Abstract

提供一種:於在真空中而對於膜料狀之基板等進行成膜等之處理的裝置中,能夠並不對於處理區域造成影響地來藉由簡單的構成而進行良好效率之除電的技術。本發明,係為對於在真空中而被作搬送之成膜用膜料(10)來藉由磁控管放電而進行除電的基板除電機構。在本發明中,係具備有:殼體(51),係被導入有放電氣體;和直線狀之放電電極(53),係在殼體(51)內以相對於基板搬送方向而相交叉的方式來作配置,並被施加有特定之電壓;和磁石(54A),係被配置在放電電極(53)之近旁,以因應於在成膜用膜料(10)處之帶電量的分布來使放電產生的方式,來配置磁石(54A)。 Provided is a technology capable of performing high-efficiency static elimination with a simple configuration in a device that performs film formation and the like on a film-like substrate in a vacuum without affecting the processing area. The present invention is a substrate static elimination mechanism for a film-forming film material (10) that is transported in a vacuum to discharge electricity by magnetron discharge. In the present invention, a case (51) is provided, in which a discharge gas is introduced, and a linear discharge electrode (53) intersects in the case (51) with respect to a substrate conveying direction. And a specific voltage is applied; and a magnet (54A) is arranged near the discharge electrode (53) so as to correspond to the distribution of the charge amount at the film forming material (10). A magnet (54A) is arranged so that a discharge is generated.

Description

基板除電機構及使用有此之真空處理裝置 Substrate static elimination mechanism and vacuum processing device using the same

本發明,係有關於在真空中而將基板除電之技術,特別是有關於將膜料狀之處理基板除電之技術。 The present invention relates to a technique for removing electricity from a substrate in a vacuum, and more particularly to a technique for removing electricity from a film-like processed substrate.

從先前技術起,便周知有:一面將從送出輥而連續性地送出之長條狀之膜料狀之基板披繞在冷卻用罐狀輥(can-roller)上,一面使從被與該罐狀輥作對向配置的蒸發源而來之蒸發物質被蒸鍍於原料膜料上,再將蒸鍍後之原料膜料藉由捲繞輥來作捲繞的捲繞式真空蒸鍍裝置(例如,參考專利文獻1)。 From the prior art, it has been known that a long film-shaped substrate continuously fed from a feeding roller is wrapped around a cooling can-roller, and the slave is connected with the The evaporation substance from the can-shaped roller as an evaporation source disposed oppositely is vapor-deposited on the raw material film, and the raw material film material after the evaporation is wound by a winding type vacuum evaporation device ( For example, refer to Patent Document 1).

在此種捲繞式真空蒸鍍裝置中,起因於殘存在膜料上之電荷的影響,在捲繞輥處所進行之膜料的捲繞中,會在膜料處產生有皺折,而發生無法適當地作捲繞之問題。 In such a roll-type vacuum evaporation device, wrinkles are generated at the film material during the winding of the film material due to the influence of the charge remaining on the film material, which occurs. Problems with proper winding.

因此,為了解決此問題,係提案有:設置藉由對於成膜後之膜料進行電漿處理來作除電的除電單元, 並在膜料之捲繞前藉由此除電單元來將帶電於膜料處之電荷除去的方法(參考專利文獻2)。 Therefore, in order to solve this problem, it is proposed to provide a static elimination unit for performing static elimination by performing plasma treatment on the film material after film formation. A method of removing the charges charged on the film material by the static electricity removing unit before winding the film material (refer to Patent Document 2).

另一方面,在此種先前技術中,當在膜料上而形成了薄膜之後,由於係經由複數之輥來一直搬送至捲繞輥處並作捲繞,因此,係有著膜料之成膜面會與輥相接觸並產生對於薄膜造成損傷的可能性之問題。 On the other hand, in this prior art, after a film is formed on a film material, it is transported to a winding roller through a plurality of rollers and wound, so it is formed by a film material. The surface will come into contact with the roller and raise the issue of the possibility of damage to the film.

因此,在先前技術中,作為膜料之行走機構,係提案有:在剖面圓形形狀之導引輥的輥本體處,將外徑為較輥本體而更大之剖面圓形形狀的導引部,以會使膜料之兩緣部被作載置的方式來空出有特定之間隔地而設置2個,並且在具備有與此導引管之旋轉軸相平行之旋轉軸的輔助輥之輥本體處,將外徑為較輥本體而更大之剖面圓形形狀之2個的導引部,空出有與導引輥之導引部同等程度的間隔地而作設置,而將膜料之兩端部,藉由導引輥之導引部和輔助輥之導引部來作包夾並搬送,藉由此,來成為並不對於被形成在膜料上之薄膜賦予損傷地而安定地進行搬送(參考專利文獻3)。 Therefore, in the prior art, as a running mechanism of the film material, it is proposed to guide the guide roller having a circular cross-section in a circular cross-section with a larger circular cross-section than the roller body. Two rolls are provided at a specific interval so that the two edge portions of the film material are placed, and an auxiliary roller having a rotation axis parallel to the rotation axis of the guide tube is provided. At the roller body, two guide portions having a circular cross-section having a larger outer diameter than the roller body are provided, and the guide portions of the guide roller are provided at equal intervals, and Both ends of the film material are sandwiched and carried by the guide portion of the guide roller and the guide portion of the auxiliary roller, so as to prevent damage to the film formed on the film material. On the other hand, it is conveyed stably (refer to patent document 3).

但是,在使用此種行走機構來搬送膜料的情況時,係存在有在藉由導引輥和輔助輥而作了包夾的膜料之兩端部處的起因於靜電所導致之帶電量變得較中央部分而更大的問題。 However, when the film material is transported using such a walking mechanism, there is a change in the amount of charge due to static electricity at both ends of the film material which is sandwiched by the guide roller and the auxiliary roller. It is a bigger problem than the central part.

因此,若是在使用此種行走機構而對膜料進行搬送、成膜的情況中使用上述之除電單元,則由於係藉由在膜料之寬幅方向上而均勻地產生的電漿來進行除電, 因此係無法將帶電量為大的部份充分地除電,另一方面,若是將由放電所致之電漿增強並成為將帶電量為大的部份充分地除電,則會有對於膜料上之成膜區域造成影響之虞,並且放電電極之消耗量和消耗電力會變大,進而,若是將除電單元增加,則係有著裝置構成會變得複雜、大型化的問題。 Therefore, if the above-mentioned static elimination unit is used when the film material is transported and formed using such a walking mechanism, the static elimination is performed by the plasma generated uniformly in the wide direction of the film material. , Therefore, it is impossible to fully remove the large charged part. On the other hand, if the plasma caused by the discharge is strengthened and fully charged, the part with large charged amount will be charged. The film formation area may cause an influence, and the consumption amount and power consumption of the discharge electrode may increase. Furthermore, if the static elimination unit is increased, there is a problem that the device configuration becomes complicated and large.

〔先前技術文獻〕 [Previous Technical Literature] 〔專利文獻〕 [Patent Literature]

[專利文獻1]日本專利第3795518號公報 [Patent Document 1] Japanese Patent No. 3795518

[專利文獻2]WO2006/088024號小冊 [Patent Document 2] WO2006 / 088024

[專利文獻3]日本專利第5024972號公報 [Patent Document 3] Japanese Patent No. 5024972

本發明,係為為了解決上述先前技術之課題所進行者,其目的,係在於提供一種:於在真空中而對於膜料狀之基板等進行成膜等之處理的裝置中,能夠並不對於處理區域造成影響地來藉由簡單的構成而進行良好效率之除電的技術。 The present invention has been made in order to solve the above-mentioned problems of the prior art, and an object thereof is to provide an apparatus capable of forming a film-like substrate or the like in a vacuum and processing the film in a vacuum. A technology that removes the influence of the processing area with a simple structure and achieves high-efficiency static elimination.

為了解決上述課題所進行之本發明,係為一種對於在真空中被搬送之處理基板而藉由磁控管放電來進 行除電之基板除電機構,其特徵為,係具備有:放電用容器,係被導入有放電氣體;和直線狀之放電電極,係在前述放電用容器內以相對於基板搬送方向而相交叉的方式來作配置,並被施加有特定之電壓;和磁石,係被配置在前述放電電極之近旁,作為前述磁石,係以因應於在前述處理基板處之帶電量的分布來使放電產生的方式,而以關連於前述放電電極之長邊方向來產生由放電所致之電漿為強的部分和由放電所致之電漿為弱的部分的方式,來配置該長邊方向之長度為相異的複數之磁石。 The present invention has been made in order to solve the above-mentioned problems, and is directed to a process in which a process is carried out in a vacuum by a magnetron discharge. The static elimination board static elimination mechanism is characterized by comprising: a discharge vessel to which a discharge gas is introduced; and a linear discharge electrode which intersects the substrate transfer direction in the discharge vessel. And a specific voltage is applied; and a magnet is arranged near the discharge electrode. As the magnet, the discharge is generated in accordance with the distribution of the charge amount at the processing substrate. The length of the long-side direction is arranged in such a way that the part of the plasma caused by the discharge is strong and the part of the plasma caused by the discharge is weak in relation to the long-side direction of the discharge electrode. Different plural magnets.

在本發明中,當以關連於前述放電電極之長邊方向而部分性地使放電產生的方式來配置前述磁石的情況時,亦為有效。 In the present invention, it is also effective when the magnet is arranged in such a manner that a discharge is partially generated in relation to the longitudinal direction of the discharge electrode.

在本發明中,當以在前述放電電極之對應於前述處理基板之兩緣部之部分處而使放電產生的方式來配置前述磁石的情況時,亦為有效。 In the present invention, it is also effective when the magnet is arranged in such a manner that a discharge is generated at a portion of the discharge electrode corresponding to both edge portions of the processing substrate.

在本發明中,當以關連於前述放電電極之長邊方向而產生由放電所致之電漿為強之部分和由放電所致之電漿為弱之部分的方式來配置該長邊方向之長度為相異的複數之前述磁石的情況時,亦為有效。 In the present invention, when the long-side direction of the discharge electrode is connected to generate a portion where the plasma caused by the discharge is strong and a portion where the plasma caused by the discharge is weak, the long-side direction This is also effective in the case of the aforementioned plural magnets having different lengths.

在本發明中,當前述處理基板係為膜料狀之物的情況時,亦為有效。 In the present invention, it is also effective when the processing substrate is a film-like material.

另一方面,本發明,係為一種真空處理裝置,其特徵為,係具備有:真空槽;和處理源,係被配置在前述真空槽內;和處理基板,係在前述真空槽內經由特定之搬送路 徑而被作搬送,並藉由前述處理源而被進行處理,上述之任一者之發明之基板除電機構,係被配置在前述搬送路徑之近旁。 On the other hand, the present invention is a vacuum processing apparatus, comprising: a vacuum tank; and a processing source arranged in the vacuum tank; and a processing substrate in the vacuum tank through a specific Transport route The substrate is statically moved and processed by the aforementioned processing source. The substrate elimination mechanism of any one of the inventions described above is arranged near the aforementioned transport path.

在本發明中,當係具備有在將前述處理基板作了挾持的狀態下來進行導引並使其行走之導引行走機構,並以在前述放電電極之對應於前述處理基板之藉由前述導引行走機構而被作了挾持的部分之部分處而使放電產生的方式來配置前述磁石的情況時,亦為有效。 In the present invention, a guide travel mechanism is provided for guiding and walking while holding the processing substrate in a state of being held by the processing substrate, and using the guide at the discharge electrode corresponding to the processing substrate by the guide. It is also effective in a case where the magnet is arranged in such a manner that a part of the traveling mechanism is held and a discharge is generated so as to generate a discharge.

在本發明中,當前述處理源係為成膜源的情況時,亦為有效。 In the present invention, it is also effective when the processing source is a film-forming source.

在本發明中,當以在對應於前述處理基板之非成膜區域之部分處而使放電產生的方式來配置前述磁石的情況時,亦為有效。 In the present invention, it is also effective when the magnet is arranged in such a manner that a discharge is generated at a portion corresponding to the non-film-forming region of the processing substrate.

在本發明之基板除電機構中,由於係具備有在放電用容器內以相對於基板搬送方向而相交叉的方式來作配置並被施加有特定之電壓的直線狀之放電電極;並例如以因應於在膜料狀之處理基板處之帶電量的分布來使磁控管放電產生的方式而配置有磁石,因此,例如藉由對於處理基板之帶電量為大的部份而將放電增強,於在真空中而對於處理基板進行成膜等之處理的裝置中,係能夠並不對於處理區域造成影響地而以良好效率來進行除電。 The substrate static elimination mechanism of the present invention is provided with a linear discharge electrode that is arranged in the discharge container so as to intersect with the substrate transport direction and is applied with a specific voltage; A magnet is arranged in such a manner that the distribution of the charge amount at the film-like processing substrate causes the magnetron discharge to be generated. Therefore, for example, the discharge is enhanced by a large portion of the charge amount of the processing substrate. In an apparatus that performs processing such as film formation on a processing substrate in a vacuum, it is possible to perform static elimination with good efficiency without affecting the processing area.

特別是,在本發明中,由於係以關連於放電電極之長邊 方向來產生由放電所致之電漿為強的部分和由放電所致之電漿為弱的部分的方式,來配置該長邊方向之長度為相異的複數之磁石,因此,係能夠對於處理基板全體性地進行除電,並且也能夠對於帶電量為大的部分而確實地進行除電,故而,係能夠謀求對於該處理基板所進行之除電的最適化。 In particular, in the present invention, since it is connected to the long side of the discharge electrode The direction is used to generate a strong part of the plasma caused by the discharge and a weak part of the plasma caused by the discharge, so that the magnets having different lengths in the longitudinal direction are arranged. The process substrate is statically removed as a whole, and it is also possible to reliably perform static elimination on a portion having a large amount of charge. Therefore, it is possible to optimize the static elimination of the processing substrate.

又,若依據本發明,則由於係並不需要將由放電所致之電漿的強度作必要以上之增大,因此,係能夠抑制對於放電電極所施加之電力,藉由此,係能夠減少放電電極之消耗量和消耗電力。 In addition, according to the present invention, since it is not necessary to increase the strength of the plasma caused by the discharge by more than necessary, it is possible to suppress the electric power applied to the discharge electrode, thereby reducing the discharge. Consumption and power consumption of electrodes.

在本發明中,當以關連於放電電極之長邊方向而部分性(例如在放電電極之對應於處理基板之兩緣部之部分處)地而使放電產生的方式來配置磁石的情況時,由於係能夠僅對於處理基板之帶電量為大的部份而使放電產生,因此係能夠謀求除電機構之簡單化和效率化。 In the present invention, when the magnet is arranged in such a manner that a discharge is generated partially (for example, at a portion of the discharge electrode corresponding to both edges of the processing substrate) in relation to the longitudinal direction of the discharge electrode, Since the discharge can be generated only for a large portion of the charged amount of the processing substrate, the simplification and efficiency of the static elimination mechanism can be achieved.

另一方面,在本發明之真空處理裝置中,係具備有:真空槽;和處理源(例如成膜源),係被配置在此真空槽內;和膜料狀之處理基板,係在真空槽內經由特定之搬送路徑而被作搬送,並藉由該處理源而被進行處理,並且,在搬送路徑之近旁處,係被配置有上述之任一者之發明之基板除電機構,因此,係可提供一種例如能夠並不對於成膜區域造成影響地來以簡單的構成而以良好效率進行除電的成膜裝置。 On the other hand, the vacuum processing apparatus of the present invention includes: a vacuum tank; and a processing source (for example, a film-forming source) arranged in the vacuum tank; and a film-like processing substrate is mounted in a vacuum The inside of the tank is transported via a specific transport path and processed by the processing source, and the substrate static elimination mechanism of any of the above inventions is arranged near the transport path. Therefore, The present invention can provide, for example, a film forming apparatus capable of performing static elimination with a simple configuration and good efficiency without affecting the film forming area.

特別是,當係具備有在將處理基板作了挾持的狀態下來進行導引並使其行走之導引行走機構,並以在除電機構 之放電電極處之對應於處理基板之藉由導引行走機構而被作了挾持的部分之部分處而使放電產生的方式來配置磁石的情況時,例如係能夠並不對於被形成在膜料狀之處理基板上的薄膜賦予損傷地而在可安定地進行搬送之成膜裝置中將該處理基板之帶電有效地除去。 In particular, when the system is provided with a guide travel mechanism that guides and guides the processing substrate in a state of holding the processing substrate, and In the case where the magnet is arranged in such a manner that a discharge is generated at a portion of the discharge electrode corresponding to a portion of the processing substrate that is held by the guide travel mechanism, for example, it is not necessary for the magnet to be formed on the film The thin film on the processing substrate is damaged, and the charging of the processing substrate is effectively removed in a film forming apparatus that can be transported stably.

1‧‧‧捲繞式成膜裝置(真空處理裝置) 1‧‧‧ roll-up film forming device (vacuum processing device)

2‧‧‧真空槽 2‧‧‧vacuum tank

3‧‧‧成膜用膜料卷 3‧‧‧Film roll for film formation

4、4A、4B‧‧‧導引行走機構 4, 4A, 4B‧‧‧Guide walking mechanism

5、5A、5B‧‧‧除電機構(基板除電機構) 5, 5A, 5B‧‧‧ static elimination mechanism (substrate static elimination mechanism)

6‧‧‧捲繞輥 6‧‧‧ Winding roller

10‧‧‧成膜用膜料(處理基板) 10‧‧‧Film for film formation (processing substrate)

30‧‧‧放電氣體 30‧‧‧discharge gas

50A、50B‧‧‧電極單元 50A, 50B‧‧‧ electrode unit

51‧‧‧殼體(放電用容器) 51‧‧‧case (discharge container)

52‧‧‧導入電極 52‧‧‧Introduction electrode

53‧‧‧放電電極 53‧‧‧discharge electrode

54A、54B‧‧‧磁石 54A, 54B‧‧‧Magnet

56‧‧‧直流電源 56‧‧‧DC Power

[圖1]係為對於身為本發明之實施形態的捲繞式成膜裝置之其中一例作展示之概略構成圖。 [Fig. 1] A schematic configuration diagram showing an example of a roll-type film-forming apparatus according to an embodiment of the present invention.

[圖2](a)、(b):對於在本實施形態中之導引行走機構之例作展示的部份剖面圖。 [Fig. 2] (a), (b): Partial cross-sectional views showing an example of the guide travel mechanism in this embodiment.

[圖3]係為對於先前技術之除電機構之例作展示者,圖3(a),係為對於其之內部構成作展示之正面圖,圖3(b),係為對於其之內部構成作展示之側面圖。 [Figure 3] is an example of the prior art static elimination mechanism. Figure 3 (a) is a front view showing its internal structure, and Figure 3 (b) is its internal structure. Side view for presentation.

[圖4]係為對於本實施形態之除電機構之例作展示者,圖4(a),係為對於其之內部構成作展示之正面圖,圖4(b),係為對於其之內部構成作展示之側面圖。 [Fig. 4] It is an example of the static elimination mechanism of this embodiment. Fig. 4 (a) is a front view showing its internal structure. Fig. 4 (b) is its internal view. Make up side view for display.

[圖5](a)、(b):對於本例之除電機構之作用作展示的示意圖。 [Figure 5] (a), (b): Schematic diagrams showing the function of the static elimination mechanism of this example.

[圖6]係為對於本實施形態之除電機構之其他例作展示者,圖6(a),係為對於其之內部構成作展示之正面圖,圖6(b),係為對於其之內部構成作展示之側面圖。 [Figure 6] It is a display of other examples of the static elimination mechanism of this embodiment. Figure 6 (a) is a front view showing its internal structure, and Figure 6 (b) is a view of it. The internal structure is shown as a side view.

[圖7](a)、(b):對於本例之除電機構之作用作 展示的示意圖。 [Figure 7] (a), (b): For the function of the static elimination mechanism of this example Shown schematic.

[圖8]係為對於本實施形態之除電機構之其他例的重要部分作展示者,圖8(a),係為對於成膜用膜料和除電機構之電極單元的內部構成作展示之概略構成圖,圖8(b),係為對於本例之除電機構之作用作展示之示意圖。 [Fig. 8] Shows the important parts of other examples of the static elimination mechanism of this embodiment, and Fig. 8 (a) shows the outline of the internal structure of the film forming film and the electrode unit of the static elimination mechanism. The structure diagram, FIG. 8 (b), is a schematic diagram showing the function of the static elimination mechanism of this example.

以下,參考圖面,對本發明之實施形態作說明。 Hereinafter, embodiments of the present invention will be described with reference to the drawings.

圖1,係為對於身為本發明之實施形態的捲繞式成膜裝置之其中一例作展示之概略構成圖。 FIG. 1 is a schematic configuration diagram showing an example of a roll-type film-forming apparatus according to an embodiment of the present invention.

以下,以圖1中所示之情況為例,來針對構件間之上下關係作說明。 In the following, the situation shown in FIG. 1 is taken as an example to explain the relationship between components.

如圖1中所示一般,本實施形態之捲繞式成膜裝置(真空處理裝置)1,係具備有真空槽2,並具備有被設置在此真空槽2內之上部處的送出、捲繞室2A、和被設置在真空槽2內之下部處的成膜室2B。 As shown in FIG. 1, generally, the roll-type film-forming apparatus (vacuum processing apparatus) 1 according to this embodiment is provided with a vacuum tank 2 and is provided with a feed and a roll provided at an upper portion of the vacuum tank 2. The winding chamber 2A and the film forming chamber 2B provided at the lower portion inside the vacuum chamber 2.

此些之送出、捲繞室2A以及成膜室2B,係分別被與未圖示之真空排氣系作連接。 These feed-out, winding chambers 2A, and film-forming chambers 2B are each connected to a vacuum exhaust system (not shown).

在送出、捲繞室2A內之例如上部處,係設置有被捲繞附著有成膜用膜料(處理基板)10之成膜用膜料卷3、和用以將被進行了成膜的成膜用膜料10作捲繞之捲繞輥6。 At the upper part of the feed-out and winding chamber 2A, a film-forming film roll 3 to which a film-forming film (process substrate) 10 is wound and attached, and a film-forming film roll 3 are provided. The film-forming material 10 is used as a winding roll 6 for winding.

在送出、捲繞室2A內之成膜用膜料卷3的膜 料搬送方向下游側處,係被設置有導引輥11、12和冷卻輥13。 Film of film-forming film roll 3 in the feeding and winding chamber 2A On the downstream side in the material conveying direction, guide rollers 11 and 12 and a cooling roller 13 are provided.

於此,冷卻輥13,係以橫跨送出、捲繞室2A和成膜室2B的方式而被作設置,並在被披掛有成膜用膜料10的狀態下,以與被配置在成膜室2B內之蒸發源(成膜源)20相對向的方式而被作配置。 Here, the cooling roller 13 is provided so as to straddle the feed-out, winding chamber 2A, and film-forming chamber 2B, and in a state where the film-forming film 10 is covered, the The evaporation source (film-forming source) 20 in the membrane chamber 2B is arranged so as to face each other.

又,在送出、捲繞室2A內之冷卻輥13的近旁處,係被設置有後述之導引行走機構4,在此導引行走機構4之膜料搬送方向下游側處,係被設置有除電機構(基板除電機構)5。 In addition, a guide and travel mechanism 4 to be described later is provided near the cooling roller 13 in the feeding and winding room 2A, and a film conveying direction downstream of the guide and travel mechanism 4 is provided at the downstream side. Static elimination mechanism (substrate static elimination mechanism) 5.

進而,在除電機構5之膜料搬送方向下游側的與捲繞輥6之間,係被設置有導引輥14。 Further, a guide roller 14 is provided between the winding roller 6 and the downstream side of the film conveyance direction of the static elimination mechanism 5.

在此種構成中,被從送出、捲繞室2A內之成膜用膜料卷3所送出的成膜用膜料10,係經由上述之導引輥11、12而被披掛在冷卻輥13上,並於在成膜室2B內而藉由蒸發源20來進行了蒸鍍之後,成為在送出、捲繞室2A內,經由導引行走機構4、除電機構5、導引輥14而藉由捲繞輥6來被作捲繞。 In this configuration, the film-forming film material 10 fed from the film-forming film roll 3 in the feeding and winding chamber 2A is hung on the cooling roller 13 through the above-mentioned guide rollers 11 and 12. After being vapor-deposited in the film-forming chamber 2B by the evaporation source 20, it is borrowed in the feed-out and winding chamber 2A via the guide travel mechanism 4, the static elimination mechanism 5, and the guide roller 14. It is wound by the winding roller 6.

圖2(a)、(b),係為對於在本實施形態中之導引行走機構之例作展示的部份剖面圖。 2 (a) and 2 (b) are partial cross-sectional views showing an example of the guide and travel mechanism in this embodiment.

圖2(a)中所示之導引行走機構4(4A),係由導引輥40A和按壓輥41所構成。 The guide travel mechanism 4 (4A) shown in FIG. 2 (a) is composed of a guide roller 40A and a pressing roller 41.

於此,導引輥40A,係具備有剖面圓形形狀之輥本體42,在此輥本體42處,係將例如由矽橡膠所成 並且外徑為較輥本體42而更大的剖面圓形形狀之2個的導引部43,以會使成膜用膜料10之成膜區域以外的身為非成膜區域之兩緣部被作載置的方式,而空出有特定之間隔地作設置。 Here, the guide roller 40A is provided with a roller body 42 having a circular shape in cross section. The roller body 42 is made of, for example, silicone rubber. In addition, the two guide portions 43 having a circular cross-section having a larger outer diameter than the roll body 42 are used so that the edges of the non-film-forming region other than the film-forming region of the film-forming film 10 are both edge portions. The way to be placed, and the space is set at a specific interval.

另一方面,按壓輥41,係在剖面圓形形狀並且具備有與導引輥40A之旋轉軸相平行的旋轉軸之輥本體44處,將外徑為較輥本體44而更大的剖面圓形形狀之2個的導引部45,空出有與導引輥40A之導引部43同等之間隔地而作設置。 On the other hand, the pressing roller 41 is formed on a roller body 44 having a circular cross-section and having a rotation axis parallel to the rotation axis of the guide roller 40A. The two guide portions 45 are formed at equal intervals to the guide portions 43 of the guide roller 40A.

之後,係構成為對於被插入至此種導引輥40A與按壓輥41之間的成膜用膜料10,而藉由未圖示之按壓手段來將按壓輥41朝向導引輥40A側作按壓,藉由此來在將成膜用膜料10之兩緣部(亦即是非成膜區域)作了包夾的狀態下而進行導引行走。 Thereafter, the film forming material 10 inserted between the guide roller 40A and the pressing roller 41 is configured to press the pressing roller 41 toward the guide roller 40A by a pressing means (not shown). Therefore, guided walking is performed in a state where both edge portions (that is, non-film-forming regions) of the film-forming film material 10 are sandwiched.

圖2(b)中所示之導引行走機構4(4B),係由導引輥40B和複數之按壓機構46所構成。 The guide travel mechanism 4 (4B) shown in FIG. 2 (b) is composed of a guide roller 40B and a plurality of pressing mechanisms 46.

於此,導引輥40B,係具備有與圖2(a)中所示之導引輥40A略相同之構成,並在輥本體42處,將外徑為較輥本體42而更大的剖面圓形形狀之3個的導引部43,以會使成膜用膜料10之成膜區域以外的身為非成膜區域之中央部以及兩緣部被作載置的方式,而空出有特定之間隔地作設置。 Here, the guide roller 40B has a structure that is slightly the same as that of the guide roller 40A shown in FIG. 2 (a), and the outer diameter of the roller body 42 is larger than that of the roller body 42. The three guide portions 43 having a circular shape are vacated so that the central portion and the two edge portions of the non-film-forming region other than the film-forming region of the film-forming film 10 are placed. Set at specific intervals.

另一方面,按壓機構46,係為在本體部49處被安裝在能夠以與上述導引輥40B之旋轉軸相平行的旋轉 軸47作為中心來旋轉的按壓輥48者,在本例中,係設為空出有與導引輥40B之導引部43同等之間隔地而設置3個的按壓機構46。 On the other hand, the pressing mechanism 46 is mounted on the body portion 49 so as to be capable of rotating parallel to the rotation axis of the guide roller 40B. In this example, the pressing roller 48 that rotates with the shaft 47 as the center is provided with three pressing mechanisms 46 provided at equal intervals to the guide portion 43 of the guide roller 40B.

之後,係構成為對於被插入至此種導引輥40B與按壓機構46之間的成膜用膜料10,而藉由未圖示之按壓手段來將按壓輥48朝向導引輥40B側作按壓,藉由此來將成膜用膜料10之兩緣部以及中央部(亦即是非成膜區域)作包夾並進行導引。 After that, the film forming material 10 inserted between the guide roller 40B and the pressing mechanism 46 is configured to press the pressing roller 48 toward the guide roller 40B by pressing means (not shown). Thus, the two edge portions and the central portion (that is, the non-film-forming region) of the film-forming film material 10 are sandwiched and guided.

而,若依據具備有以上之構成的導引行走機構4A、4B,則係能夠在對於成膜區域作了保護的狀態下而使成膜用膜料10安定地進行導引行走。 On the other hand, according to the guide walking mechanisms 4A and 4B having the above configuration, the film formation film 10 can be guided and guided stably while the film formation area is protected.

圖3(a)、(b),係為對於先前技術之除電機構之例作展示者,圖3(a),係為對於其之內部構成作展示之正面圖,圖3(b),係為對於其之內部構成作展示之側面圖。 Figures 3 (a) and (b) are examples of the prior art static elimination mechanism. Figure 3 (a) is a front view of its internal structure. Figure 3 (b) is a A side view showing its internal structure.

此除電機構105,係為一對型,而為在被導入有放電氣體130之金屬製之殼體151內設置有2個的相同構成之電極單元150者。 This static elimination mechanism 105 is a pair type, and is provided with two electrode units 150 having the same configuration in a metal case 151 into which the discharge gas 130 is introduced.

於此,2個的電極單元150,係分別具備有;直線棒狀之導入電極152,係包夾成膜用膜料110地而被設置在其之兩側處,並以相對於膜料搬送路徑而成為平行並且相對於膜料搬送方向而相互正交的方式來作配置;和直線圓筒狀之放電電極153,係與導入電極152同心狀地來作設置。 Here, the two electrode units 150 are respectively provided; the linear rod-shaped lead-in electrodes 152 are provided on both sides of the film-forming film 110 and are transported with respect to the film. The paths are arranged so as to be parallel and orthogonal to each other with respect to the film conveyance direction; and the linear and cylindrical discharge electrodes 153 are arranged concentrically with the introduction electrodes 152.

各電極單元150之導入電極152,係在分別被導入有水等之冷媒的放電電極153內以相對於放電電極153而被作了電性連接的狀態來作配置,並在其之周圍處,被設置有複數之例如由永久磁石所成之圓筒狀的磁石154。 The lead-in electrodes 152 of each electrode unit 150 are arranged in a state where they are electrically connected to the discharge electrodes 153 in the discharge electrodes 153 into which a refrigerant such as water is introduced, and in the surroundings. A plurality of cylindrical magnets 154 made of, for example, a permanent magnet are provided.

此些之複數之磁石154,係涵蓋成膜用膜料110之寬幅方向之全區域地而隔著遮蔽板155地被作設置,並且,係構成為使相鄰接之磁石154的極性作反轉。 The plurality of magnets 154 are provided across the entire area of the film-forming film material 110 in the wide direction of the film, with the shielding plate 155 interposed therebetween, and are configured so that the polarities of the adjacent magnets 154 function as Reverse.

又,各電極單元150之導入電極152,係成為藉由直流電源156,而在與被作了接地的殼體151之間以使導入電極152側會成為負極的方式而被施加有特定之電壓。 In addition, the lead-in electrode 152 of each electrode unit 150 is applied with a specific voltage between the lead-in electrode 152 side and the grounded case 151 by a DC power source 156. .

在此種構成中,若是一面搬送成膜用膜料110並進行成膜,一面在除電機構105處於殼體151和導入電極152之間施加特定之電壓,則在電極單元150之周圍,係涵蓋成膜用膜料110之寬幅方向全區域地而產生起因於磁控管放電所致之電漿,藉由使該電漿與成膜用膜料110相碰撞,成膜用膜料110之除電係被進行。 In this configuration, if the film-forming film material 110 is transported and formed, and a specific voltage is applied between the static elimination mechanism 105 between the case 151 and the lead-in electrode 152, the electrode unit 150 is covered around the electrode unit 150. The plasma-forming film material 110 has a wide area in a wide area to generate a plasma caused by a magnetron discharge. By causing the plasma to collide with the film-forming film material 110, the film-forming film material 110 The static elimination system is performed.

圖4(a)、(b),係為對於本實施形態之除電機構之例作展示者,圖4(a),係為對於其之內部構成作展示之正面圖,圖4(b),係為對於其之內部構成作展示之側面圖。 Figures 4 (a) and (b) are examples of the static elimination mechanism of this embodiment, and Figure 4 (a) is a front view of its internal structure. Figure 4 (b), It is a side view showing the internal structure.

此除電機構(基板除電機構)5A,係為與上述之先前技術例相同的一對型,而為在被導入有例如氬等之放電氣體30之金屬製之殼體(放電用容器)51內設置有2個的 相同構成之電極單元50A者。 This static elimination mechanism (substrate static elimination mechanism) 5A is a pair of the same type as the above-mentioned prior art example, and is housed in a metal casing (discharge container) 51 into which a discharge gas 30 such as argon is introduced. Set of 2 The electrode unit 50A having the same structure.

於此,2個的電極單元50A,係分別具備有;直線棒狀之導入電極52,係包夾成膜用膜料10地而被設置在其之兩側處,並以相對於膜料搬送路徑而成為平行並且相對於膜料搬送方向而相互正交的方式來作配置;和直線圓筒狀之放電電極53,係與導入電極52同心狀地來作設置。 Here, the two electrode units 50A are respectively provided; the linear rod-shaped lead-in electrodes 52 are provided on both sides of the film-forming film material 10 and are transported with respect to the film material. The paths are arranged so as to be parallel and orthogonal to each other with respect to the film conveyance direction. The discharge electrodes 53 and the linear and cylindrical discharge electrodes 53 are provided concentrically with the introduction electrodes 52.

各電極單元50A之導入電極52,係在分別被導入有水等之冷媒的放電電極53內以相對於放電電極53而被作了電性連接的狀態來作配置,並在其之周圍處,被設置有2個的例如由永久磁石所成之圓筒狀的磁石54A。 The lead-in electrodes 52 of each of the electrode units 50A are arranged in a state where they are electrically connected to the discharge electrodes 53 in the discharge electrodes 53 to which refrigerants such as water are respectively introduced, and are arranged around them. Two cylindrical magnets 54A made of, for example, a permanent magnet are provided.

本例,係為以關連於放電電極53之長邊方向而部分性地使放電產生的方式來配置有複數(在本實施形態中,係為2個)的磁石54A者。 In this example, a plurality of (in this embodiment, two) magnets 54A are arranged so that a discharge is partially generated in relation to the longitudinal direction of the discharge electrode 53.

於此,作為磁石54A,係可使用一體型者,亦可使用由複數之小片所成者。又,2個的磁石54A,係可使用形成有同一之磁路者,亦可使用形成有相異之磁路者。 Here, as the magnet 54A, an integrated type may be used, or a plurality of small pieces may be used. The two magnets 54A may be those in which the same magnetic circuit is formed, or those in which different magnetic circuits are formed.

此些之2個的磁石54A,係空出有與圖2(a)中所示之導引行走機構4A的導引部43同等之間隔、亦即是空出有與成膜用膜料10之寬幅同等之間隔地,而被作設置,並且,係構成為使相鄰接之磁石54A的極性作反轉。 These two magnets 54A are vacated with the same interval as the guide 43 of the guide travel mechanism 4A shown in FIG. 2 (a), that is, vacated with the film material 10 for film formation. The widths are set at equal intervals, and the polarities of the adjacent magnets 54A are reversed.

又,各電極單元50A之導入電極52,係成為藉由直 流電源56,而在與被作了接地的殼體51之間以使導入電極52側會成為負極的方式而被施加有特定之電壓。 The lead-in electrode 52 of each electrode unit 50A is The current source 56 is applied with a specific voltage to the grounded case 51 so that the lead-in electrode 52 side becomes a negative electrode.

圖5(a)、(b),係為對於本例之除電機構之作用作展示的示意圖。 Figures 5 (a) and (b) are schematic diagrams showing the function of the static elimination mechanism of this example.

如同圖5(a)中所示一般,在本例中,2個的磁石54A,係空出有與導引行走機構4A的導引部43同等之間隔、亦即是空出有與成膜用膜料10之寬幅同等之間隔地,而被作設置。 As shown in FIG. 5 (a), in this example, the two magnets 54A are vacated with the same interval as the guide 43 of the guide travel mechanism 4A, that is, vacated with the film formation. The film material 10 is set at equal intervals.

故而,在本例中,當對於電極單元50A之導入電極52施加了電壓的情況時,係如同圖5(b)中所示一般,僅在2個的磁石54A之近旁處產生有電漿15,其結果,係成為只有成膜用膜料10之兩緣部的非成膜區域會被曝露在電漿15中並被進行除電。 Therefore, in this example, when a voltage is applied to the lead-in electrode 52 of the electrode unit 50A, as shown in FIG. 5 (b), the plasma 15 is generated only near the two magnets 54A. As a result, only non-film-forming regions on both edges of the film-forming film material 10 are exposed to the plasma 15 and static-eliminated.

圖6(a)、(b),係為對於本實施形態之除電機構之其他例作展示者,圖6(a),係為對於其之內部構成作展示之正面圖,圖6(b),係為對於其之內部構成作展示之側面圖。以下,針對與上述例相對應之部分,係附加相同之符號,並省略詳細說明。 Figures 6 (a) and (b) are illustrations showing other examples of the static elimination mechanism of this embodiment, and Figure 6 (a) is a front view showing the internal structure thereof, and Figure 6 (b) Is a side view showing its internal structure. In the following, parts corresponding to the above examples are denoted by the same reference numerals, and detailed descriptions are omitted.

本例之除電機構(基板除電機構)5B,係為在殼體51內設置有2個的相同構成之電極單元50B者。 The static elimination mechanism (substrate static elimination mechanism) 5B of this example is one in which two electrode units 50B of the same configuration are provided in the case 51.

又,此除電機構5B,其之基本構成係與上述之除電機構5A相同,僅在磁石54B之數量以及配置位置上為與上述之除電機構5A相異。 The basic structure of the static elimination mechanism 5B is the same as that of the static elimination mechanism 5A described above, and is different from the static elimination mechanism 5A described above only in the number and arrangement position of the magnets 54B.

亦即是,本例之除電機構5B,係在上述之殼 體51內被設置有相同構成之2個的電極單元50B,各電極單元50B,係在上述之放電電極53內被配置有導入電極52,並在其之周圍處,被設置有3個的例如由永久磁石所成之圓筒狀的磁石54B。 That is, the static elimination mechanism 5B of this example is attached to the shell described above. The body 51 is provided with two electrode units 50B of the same configuration, and each electrode unit 50B is provided with the lead-in electrode 52 in the above-mentioned discharge electrode 53 and, in the periphery thereof, 3 with A cylindrical magnet 54B made of a permanent magnet.

於此,作為磁石54B,係可使用一體型者,亦可使用由複數之小片所成者。又,3個的磁石54B,係可使用形成有同一之磁路者,亦可使用形成有相異之磁路者。 Here, as the magnet 54B, an integrated type may be used, or a plurality of small pieces may be used. In addition, the three magnets 54B may be those in which the same magnetic circuit is formed, or those in which different magnetic circuits are formed.

此些之3個的磁石54B,係以與圖2(b)中所示之導引行走機構4B的相鄰接之導引部43同等之間隔,而被設置在與成膜用膜料10之中央部以及兩緣部相對應的部份處,並且,係構成為使相鄰接之磁石54B的極性作反轉。 These three magnets 54B are provided at the same interval as the adjacent guide portions 43 of the guide travel mechanism 4B shown in FIG. 2 (b), and are provided on the film forming material 10 The central portion and portions corresponding to the two edge portions are configured to invert the polarities of the adjacent magnets 54B.

又,各電極單元50B之導入電極52,係成為藉由直流電源56,而在與被作了接地的殼體51之間以使導入電極52側會成為負極的方式而被施加有特定之電壓。 In addition, the lead-in electrode 52 of each electrode unit 50B is applied with a specific voltage between the lead-through electrode 52 side and the grounded case 51 by a DC power source 56. .

圖7(a)、(b),係為對於本例之除電機構之作用作展示的示意圖。 Figures 7 (a) and (b) are schematic diagrams showing the function of the static elimination mechanism of this example.

如同圖7(a)中所示一般,在本例之情況中,由於3個的磁石54B係空出有與導引行走機構4B之相鄰接之導引部43同等之間隔地而被作設置,因此,當對於電極單元50B之導入電極52施加了電壓的情況時,係如同圖7(b)中所示一般,僅在3個的磁石54B之近旁處產生有 電漿15,其結果,係成為只有成膜用膜料10之中央部以及兩緣部的非成膜區域會被曝露在電漿15中並被進行除電。 As shown in FIG. 7 (a), in the case of this example, since the three magnets 54B are vacated with the same intervals as the guide 43 of the guide travel mechanism 4B, Therefore, when a voltage is applied to the lead-in electrode 52 of the electrode unit 50B, as shown in FIG. 7 (b), only three magnets 54B are generated. As a result, the plasma 15 is formed so that only the non-film-forming regions at the central portion and the two edge portions of the film-forming film material 10 are exposed to the plasma 15 and are statically removed.

如同以上所述一般,在本實施形態之除電機構5A、5B中,由於係能夠僅進行成膜用膜料10之非成膜區域的除電,因此,係並不會對於成膜區域造成影響,而能夠以良好效率來進行除電,並且,係能夠提供一種例如相較於圖3(a)、(b)中所示之先前技術而在構成上更為簡單的除電機構5A、5B。 As described above, in the static elimination mechanisms 5A and 5B of this embodiment, since only the non-film forming region of the film forming film 10 can be removed, the system does not affect the film forming region. In addition, it is possible to perform static elimination with good efficiency, and it is possible to provide a static elimination mechanism 5A, 5B that is simpler in configuration than the prior art shown in FIGS. 3 (a) and (b), for example.

又,若依據本實施形態,則由於係並不需需將由放電所致之電漿的強度作必要以上之增大,因此,係能夠抑制對於導入電極52所施加之電力,藉由此,係能夠減少導入電極52以及放電電極53之消耗量和消耗電力。 In addition, according to this embodiment, it is not necessary to increase the strength of the plasma caused by the discharge by more than necessary. Therefore, the power applied to the introduction electrode 52 can be suppressed. The consumption amount and power consumption of the introduction electrode 52 and the discharge electrode 53 can be reduced.

圖8(a)、(b),係為對於本實施形態之除電機構之其他例的重要部分作展示者,圖8(a),係為對於成膜用膜料和除電機構之電極單元的內部構成作展示之概略構成圖,圖8(b),係為對於本例之除電機構之作用作展示之示意圖。以下,針對與上述例相對應之部分,係附加相同之符號,並省略詳細說明。 Figures 8 (a) and (b) show the important parts of other examples of the static elimination mechanism of this embodiment, and Figure 8 (a) shows the structure of the film material and the electrode unit of the static elimination mechanism The internal structure is shown as a schematic structure diagram, and FIG. 8 (b) is a schematic diagram showing the function of the static elimination mechanism of this example. In the following, parts corresponding to the above examples are denoted by the same reference numerals, and detailed descriptions are omitted.

在被適用有本發明之捲繞式成膜裝置中,係會有隔著遮罩10a來在成膜用膜料10上進行成膜的情況(參考圖8(a))。 In the roll-type film-forming apparatus to which the present invention is applied, there is a case where a film is formed on the film-forming film 10 through a mask 10a (see FIG. 8 (a)).

於此情況,成膜用膜料10上之相鄰接的遮罩10a之 間之區域,係成為成膜區域,遮罩10a上之區域,係成為非成膜區域。 In this case, one of the adjacent masks 10a on the film-forming film 10 The interval region is a film-forming region, and the region on the mask 10a is a non-film-forming region.

在使用此種遮罩10a而藉由蒸鍍來進行導電材料之成膜的情況時,係會有身為非成膜區域之遮罩10a之部分的帶電量成為較成膜區域之帶電量而更大的情況。 When such a mask 10a is used to form a conductive material by vapor deposition, the charge amount of the portion of the mask 10a which is a non-film-formed area becomes higher than that of the film-formed area. Bigger case.

於此種情況,雖然亦能夠使用上述之除電機構5A、5B來僅對於非成膜區域進行除電,但是,在本例中,係構成為使用下述一般之電極單元50C來進行除電。 In this case, although the above-mentioned static elimination mechanisms 5A and 5B can also be used to neutralize only the non-film-forming area, in this example, it is configured to perform static elimination using the following general electrode unit 50C.

如同圖8(a)中所示一般,本例之電極單元50C,係涵蓋成膜用膜料10之寬幅方向之全區域地而隔著遮蔽板55地被設置有複數之磁石54C、54c。 As shown in FIG. 8 (a), the electrode unit 50C of this example is provided with a plurality of magnets 54C and 54c covering the entire area in the wide direction of the film-forming film 10 and a shielding plate 55 therebetween. .

於此,係關連於導入電極52(放電電極53)之長邊方向而配置有長度為相異之複數之磁石54C、54c。 Here, a plurality of magnets 54C and 54c having different lengths are arranged in relation to the longitudinal direction of the introduction electrode 52 (the discharge electrode 53).

具體而言,在導入電極52之對應於成膜用膜料10之遮罩10a的部份處,係被配置有長度為長之磁石54C,在導入電極52之對應於成膜用膜料10之成膜區域的部份處,係被配置有長度為較此磁石54C而更短的磁石54c。另外,相鄰接之磁石54C、54c,係構成為使極性相互反轉。 Specifically, at the portion of the introduction electrode 52 corresponding to the mask 10a of the film-forming film material 10, a magnet 54C having a long length is arranged, and at the portion of the introduction electrode 52 corresponding to the film-forming film material 10 A portion of the film formation region is provided with a magnet 54c having a length shorter than that of the magnet 54C. In addition, the adjacent magnets 54C and 54c are configured so that their polarities are reversed from each other.

於此,作為磁石54C、54c,係可使用一體型者,亦可使用由複數之小片所成者。 Here, as the magnets 54C and 54c, an integrated type may be used, or a plurality of small pieces may be used.

若是在此種本例中而對於導入電極52施加電壓,則如同圖8(b)中所示一般,由被配置有長度為長之磁石54C的部份之放電所致之電漿16的強度,係成為 較由被配置有長度為短之磁石54c的部份之放電所致之電漿17的強度而更強。 If the voltage is applied to the lead-in electrode 52 in this example, as shown in FIG. 8 (b), the strength of the plasma 16 caused by the discharge of the portion where the long magnet 54C is arranged is shown. , Department becomes It is stronger than the strength of the plasma 17 caused by the discharge of the portion where the short magnets 54c are arranged.

而,若依據具備有此種構成之本例,則由於係能夠在對於成膜用膜料10而全體性地進行除電的同時亦對於帶電量為大之非成膜區域而確實地進行除電,因此,係能夠謀求對於成膜用膜料10之除電的最適化。 Moreover, according to this example having such a structure, since the film forming film 10 can be removed statically as a whole, and the non-film forming region having a large charge amount can be surely removed, Therefore, it is possible to optimize the static elimination of the film-forming film material 10.

如上述一般,若依據本實施形態,則係可提供一種能夠藉由簡單之構成來以良好效率進行除電的捲繞式成膜裝置。 As described above, according to this embodiment, it is possible to provide a roll-type film-forming apparatus capable of performing static elimination with good efficiency by a simple configuration.

另外,本發明,係並不被限定於上述之實施形態,而可進行各種之變更。 In addition, the present invention is not limited to the above-mentioned embodiment, and various changes can be made.

例如,在上述實施形態中,雖係以一對型之基板除電機構為例來作了說明,但是,本發明係並不被限定於此,而亦可適用在單根型之基板除電機構或者是2對型之基板除電機構中。 For example, in the above-mentioned embodiment, although a pair of substrate static elimination mechanisms have been described as an example, the present invention is not limited to this, but can also be applied to a single substrate static elimination mechanism or It is a two-pair type substrate static elimination mechanism.

又,關於在磁控管放電中所使用之磁石,係除了永久磁石之外,亦可使用電磁石。 Regarding magnets used in magnetron discharge, in addition to permanent magnets, electromagnets can also be used.

進而,本發明,係並不僅是可適用在藉由蒸鍍來進行成膜之裝置中,而亦可適用在例如濺鍍裝置或蝕刻裝置等之各種的真空處理裝置中。 Furthermore, the present invention is applicable not only to an apparatus for forming a film by vapor deposition, but also to various vacuum processing apparatuses such as a sputtering apparatus and an etching apparatus.

更進而,在上述實施形態中,作為處理基板,雖係以一連串之長條的膜料為例來作了說明,但是,本發明係並不被限定於此,只要是能夠在真空中進行搬送之基板,則例如亦可對於由被作了切割的膜料或者是平板 狀之玻璃所成者作適用。 Furthermore, in the above embodiment, although a series of long film materials have been described as examples of the processing substrate, the present invention is not limited to this, as long as it can be carried in a vacuum For the substrate, for example, it can also be used to cut the film material or flat plate. Applicable to those made of glass.

另一方面,在圖8(a)、(b)所示之例中,雖係為了使由放電所致之電漿的強度相異,而使用有長度為相異之磁石,但是,例如係亦可使用由磁力為強之釹等所成的磁石,來使由放電所致之電漿的強度有所相異。 On the other hand, in the example shown in Figs. 8 (a) and (b), although the strength of the plasma caused by the discharge is different, magnets having different lengths are used. It is also possible to use magnets made of neodymium, which has a strong magnetic force, to vary the strength of the plasma caused by the discharge.

Claims (8)

一種基板除電機構,係為對於在真空中被搬送之處理基板而藉由磁控管放電來進行除電之基板除電機構,其特徵為,係具備有:放電用容器,係被導入有放電氣體;和直線狀之放電電極,係在前述放電用容器內以相對於基板搬送方向而相交叉的方式來作配置,並被施加有特定之電壓;和磁石,係被配置在前述放電電極之近旁,作為前述磁石,係以因應於在前述處理基板處之帶電量的分布來使放電產生的方式,而以關連於前述放電電極之長邊方向來產生由放電所致之電漿為強的部分和由放電所致之電漿為弱的部分的方式,來配置該長邊方向之長度為相異的複數之磁石。 A substrate static elimination mechanism is a substrate static elimination mechanism that performs static elimination by using a magnetron to discharge a processing substrate transferred in a vacuum. The substrate static elimination mechanism is provided with: a discharge container, which is introduced with a discharge gas; The linear discharge electrodes are arranged in the discharge container so as to intersect with the substrate conveying direction, and a specific voltage is applied. The magnets are arranged near the discharge electrodes. As the magnet, the discharge is generated in accordance with the distribution of the charge amount at the processing substrate, and the plasma-induced strong portion due to the discharge is generated in a direction related to the long side of the discharge electrode and The plurality of magnets having different lengths in the long-side direction are arranged in such a manner that the plasma is a weak part caused by the discharge. 如申請專利範圍第1項所記載之基板除電機構,其中,係以關連於前述放電電極之長邊方向而部分性地使放電產生的方式,來配置前述磁石。 According to the substrate static elimination mechanism described in item 1 of the scope of the patent application, the magnet is disposed so that a discharge is partially generated in relation to the longitudinal direction of the discharge electrode. 如申請專利範圍第1項或第2項所記載之基板除電機構,其中,係以在前述放電電極之對應於前述處理基板之兩緣部之部分處而使放電產生的方式,來配置前述磁石。 The substrate static elimination mechanism as described in item 1 or 2 of the scope of the patent application, wherein the magnet is arranged in such a manner that a discharge is generated at a portion of the discharge electrode corresponding to the two edge portions of the processing substrate. . 如申請專利範圍第1項或第2項所記載之基板除電機構,其中,前述處理基板,係為膜料狀者。 The substrate static elimination mechanism according to item 1 or item 2 of the patent application scope, wherein the aforementioned processing substrate is a film material. 一種真空處理裝置,其特徵為,係具備有: 真空槽;和處理源,係被配置在前述真空槽內;和處理基板,係在前述真空槽內經由特定之搬送路徑而被作搬送,並藉由前述處理源而被進行處理;和基板除電機構,係被配置在前述搬送路徑之近旁,前述基板除電機構,係為對於在真空中被搬送之處理基板而藉由磁控管放電來進行除電之基板除電機構,並具備有:放電用容器,係被導入有放電氣體;和直線狀之放電電極,係在前述放電用容器內以相對於基板搬送方向而相交叉的方式來作配置,並被施加有特定之電壓;和磁石,係被配置在前述放電電極之近旁,作為前述磁石,係以因應於在前述處理基板處之帶電量的分布來使放電產生的方式,而以關連於前述放電電極之長邊方向來產生由放電所致之電漿為強的部分和由放電所致之電漿為弱的部分的方式,來配置該長邊方向之長度為相異的複數之磁石。 A vacuum processing device, characterized in that: A vacuum tank; and a processing source, which are arranged in the vacuum chamber; and a processing substrate, which is transported in the vacuum tank via a specific transfer path, and is processed by the processing source; and the substrate is de-energized The mechanism is disposed near the conveying path, and the substrate static electricity removing mechanism is a substrate static electricity removing mechanism for discharging the process substrate in a vacuum by magnetron discharge, and is provided with a discharge container. A discharge gas is introduced; and a linear discharge electrode is arranged in the discharge container so as to intersect with the substrate conveying direction, and a specific voltage is applied; and a magnet is The magnet is arranged near the discharge electrode, and the magnet is caused by the discharge in a manner that the discharge is generated in accordance with the distribution of the charge amount on the processing substrate, and the discharge electrode is caused by the long side direction of the discharge electrode. In a manner that the plasma is a strong part and the plasma is a weak part caused by the discharge, the lengths of the long sides are arranged to have different magnets with different lengths. . 如申請專利範圍第5項所記載之真空處理裝置,其中,係具備有在將前述處理基板作了挾持的狀態下來進行導引並使其行走之導引行走機構,以在前述放電電極之對應於前述處理基板之藉由前述導引行走機構而被作了挾持的部分之部分處而使放電產生的方式,來配置前述磁石。 The vacuum processing device described in item 5 of the scope of application for a patent, wherein the vacuum processing device is provided with a guide travel mechanism that guides the processing substrate while holding the processing substrate in a state to support the corresponding processing of the discharge electrode. The magnet is arranged in such a manner that a discharge is generated at a portion of the processing substrate where the portion is held by the guide travel mechanism. 如申請專利範圍第5項或第6項所記載之真空處理裝置,其中,前述處理源,係為成膜源。 The vacuum processing device as described in item 5 or item 6 of the patent application scope, wherein the aforementioned processing source is a film-forming source. 如申請專利範圍第7項所記載之真空處理裝置,其中,係以在對應於前述處理基板之非成膜區域之部分處而使放電產生的方式,來配置前述磁石。 The vacuum processing apparatus according to item 7 of the scope of the patent application, wherein the magnet is disposed so that a discharge is generated at a portion corresponding to the non-film-forming region of the processing substrate.
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JPH1154757A (en) * 1997-07-30 1999-02-26 Advanced Display:Kk Thin film transistor manufacturing method and device
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