TWI669207B - Method for bonding heterogeneous materials of semiconductor element - Google Patents

Method for bonding heterogeneous materials of semiconductor element Download PDF

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Publication number
TWI669207B
TWI669207B TW107108216A TW107108216A TWI669207B TW I669207 B TWI669207 B TW I669207B TW 107108216 A TW107108216 A TW 107108216A TW 107108216 A TW107108216 A TW 107108216A TW I669207 B TWI669207 B TW I669207B
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bonding
substrate
semiconductor element
semiconductor
heterogeneous materials
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TW107108216A
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Chinese (zh)
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TW201938353A (en
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陳燈桂
張文吉
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品化科技股份有限公司
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Priority to CN201910150517.1A priority patent/CN110265343A/en
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/6835Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
    • H01L21/6836Wafer tapes, e.g. grinding or dicing support tapes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/005Processes
    • H01L33/0095Post-treatment of devices, e.g. annealing, recrystallisation or short-circuit elimination
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2221/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof covered by H01L21/00
    • H01L2221/67Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere
    • H01L2221/683Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L2221/68304Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
    • H01L2221/68363Apparatus for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support used in a transfer process involving transfer directly from an origin substrate to a target substrate without use of an intermediate handle substrate

Abstract

本發明提供一種半導體元件的異質材料結合方法,先形成圖案化的接合膠於一第一基板,再將欲與該接合膠接合的半導體元件與該接合膠接合後令該接合膠固化,而可更易於在該半導體元件表面形成一由該接合膠固化後而得的功能層,而可提升該功能層的厚度均勻性。The invention provides a method for bonding heterogeneous materials of a semiconductor element. First, a patterned bonding paste is formed on a first substrate, and then the semiconductor element to be bonded with the bonding paste is bonded with the bonding paste to cure the bonding paste. It is easier to form a functional layer obtained by curing the adhesive on the surface of the semiconductor element, and the thickness uniformity of the functional layer can be improved.

Description

半導體元件的異質材料結合方法Method for bonding heterogeneous materials of semiconductor element

本發明是有關於一結合方法,特別是指一種用於半導體元件的異質材料結合方法。The present invention relates to a bonding method, and more particularly, to a bonding method for heterogeneous materials for semiconductor devices.

習知要於半導體元件頂面形成一層與該半導體元件頂面的材料不同的功能層時,一般可以利用黏貼、噴塗、點膠等方式形成。然而,利用黏貼方式需再考量黏膠的可靠度且不易批量製作;噴塗方式則容易造成半導體元件除了頂面之外,在周圍表面也會沾染到該功能層的材料;而以點膠方式形成功能層時,由於該功能層需有一定厚度,因此,會因為材料內聚力及表面張力的影響而造成膜厚不均的缺點,此外,還容易會有材料溢流的問題產生。以該半導體元件為發光元件,該功能層是含有可用以改變發光元件出光波長的波長轉換材料為例,若形成於發光元件頂面的該功能層的膜厚不均,則會造成出光顏色差異的問題。It is known that when a functional layer is formed on the top surface of a semiconductor element that is different from the material of the top surface of the semiconductor element, it can generally be formed by means of adhesion, spray coating, dispensing, and the like. However, the adhesive method needs to consider the reliability of the adhesive and it is not easy to produce in batches; the spray method is likely to cause the semiconductor element to contaminate the functional layer material on the surrounding surface in addition to the top surface; and it is formed by dispensing. In the case of a functional layer, since the functional layer needs to have a certain thickness, it may cause the disadvantage of uneven film thickness due to the influence of the cohesion and surface tension of the material. In addition, the problem of material overflow may easily occur. Taking the semiconductor element as a light emitting element and the functional layer containing a wavelength conversion material that can be used to change the light emitting wavelength of the light emitting element as an example, if the film thickness of the functional layer formed on the top surface of the light emitting element is uneven, the light emitting color will be different The problem.

因此,本發明之目的,即在提供一種半導體元件的異質材料結合方法。Therefore, an object of the present invention is to provide a method for bonding heterogeneous materials of a semiconductor device.

於是,本發明的半導體元件的異質材料結合方法,包含下述步驟。Then, the method for bonding heterogeneous materials of a semiconductor device according to the present invention includes the following steps.

步驟A,準備一第一基板。In step A, a first substrate is prepared.

步驟B,於該第一基板上形成一圖案化的接合膠。In step B, a patterned adhesive is formed on the first substrate.

步驟C,將至少一半導體元件的待接合表面與該接合膠接合,並將該接合膠固化形成一功能層。In step C, the surface to be bonded of at least one semiconductor element is bonded to the bonding paste, and the bonding paste is cured to form a functional layer.

本發明之功效:先形成圖案化的接合膠於一第一基板,再將欲與該接合膠接合的半導體元件與該接合膠接合固化,形成一功能層於半導體元件上。而可更易於控制形成在該半導體元件表面的該功能層的厚度均勻性。The effect of the present invention: firstly forming a patterned adhesive on a first substrate, and then bonding and curing a semiconductor element to be bonded with the adhesive to the adhesive to form a functional layer on the semiconductor element. It is easier to control the thickness uniformity of the functional layer formed on the surface of the semiconductor element.

在本發明被詳細描述前,應當注意在以下的說明內容中,類似的元件是以相同的編號來表示。Before the present invention is described in detail, it should be noted that in the following description, similar elements are represented by the same numbers.

本發明半導體元件的異質材料結合方法可應用於在一半導體元件表面形成一材料與該半導體元件的接合面的材料不同之功能層之一封裝結構,該封裝結構則可視其結構及用途,決定是否再進行後續製程。The method for bonding heterogeneous materials of a semiconductor element according to the present invention can be applied to forming a packaging structure on a semiconductor element surface with a functional layer having a material different from that of a junction surface of the semiconductor element. The packaging structure can be determined according to its structure and application. Follow-up process.

參閱圖1、2,本發明半導體元件的異質材料結合方法的一第一實施例是以該半導體元件為一光電元件半成品,且該光電元件半成品於形成該功能層後仍需進行後續製程為例說明,然實際實施時並不以此態樣的半導體元件為限。Referring to FIGS. 1 and 2, a first embodiment of a method for bonding heterogeneous materials of a semiconductor element according to the present invention takes the semiconductor element as a semi-finished product of a photovoltaic element, and the semi-finished product of the photovoltaic element needs to be subjected to subsequent processes after forming the functional layer as an example. It is explained, however, that the actual implementation of the semiconductor device is not limited to this aspect.

該光電元件半成品具有一基材2、一底電極41,及一形成於該底電極41上的作動層3,該作動層3為半導體膜層結構,可於接收電能後對外發出預定波長的光。由於該光電元件半成品的相關膜層結構及材料為技術領域者所習知,且非為本發明之重點,故於此不再多加說明。The semi-finished product of the photovoltaic element has a substrate 2, a bottom electrode 41, and an actuation layer 3 formed on the bottom electrode 41. The actuation layer 3 is a semiconductor film structure, and can emit light with a predetermined wavelength after receiving electrical energy. . Since the relevant film structure and material of the semi-finished product of the photovoltaic element are well known to those skilled in the art and are not the focus of the present invention, they will not be described further here.

要說明的是,前述該光電元件半成品僅為用以說明本發明該結合方法,於實際實施時其結構並無特限制,例如,該光電元件半成品結構也可以具有水平導通結構的光電元件,如此,即可無需具有該底電極41。It should be noted that the aforementioned semi-finished photovoltaic element is only used to illustrate the bonding method of the present invention, and its structure is not particularly limited in practical implementation. For example, the semi-finished photovoltaic element structure may also have a photovoltaic element with a horizontal conduction structure. That is, it is not necessary to have the bottom electrode 41.

該第一實施包含以下步驟:The first implementation includes the following steps:

步驟11,準備一第一基板100。In step 11, a first substrate 100 is prepared.

詳細地說,該第一基板100的目的為用於形成塗層,並可於後續移除即可,可選自玻璃、陶瓷基板,或軟性基板等基板材料,但不限於此。In detail, the purpose of the first substrate 100 is to form a coating layer, which can be subsequently removed. The first substrate 100 may be selected from substrate materials such as glass, ceramic substrate, or flexible substrate, but is not limited thereto.

接著進行步驟12,於該第一基板100上形成一圖案化的接合膠101。Then, step 12 is performed to form a patterned adhesive 101 on the first substrate 100.

詳細地說,該步驟12是以網印方式,將一印刷膠材利用一具有預定圖案的網板對該第一基板100的表面印刷,而於該第一基板100形成圖案與該網板的圖案相應的該圖案化的接合膠101。由於該接合膠101是利用網印方式形成,因此,其膜厚及圖案可以藉由印刷參數的控制及網板的圖案設計,而可更精確的控制並具有更多樣的圖案變化。於本實施例中,該圖案化的接合膠101具有多個概成陣列排列並彼此間隔的接合膠塊102。其中,每一個接合膠塊102依實際應用的需要,可具有至少一鏤空區,且每一個接合膠塊102具有一膠塊接合面102a用以與後續半導體元件之第一接合面3a接合,該膠塊接合面102a與該半導體元件之第一接合面3a表面積實質相同,或者,兩接合面的表面積差異不大於10%。In detail, the step 12 is a screen printing method in which a printing adhesive is printed on the surface of the first substrate 100 using a screen having a predetermined pattern, and a pattern is formed on the first substrate 100 with the screen. The patterned adhesive 101 is corresponding to the pattern. Because the bonding glue 101 is formed by screen printing, its film thickness and pattern can be controlled by printing parameters and pattern design of the screen, which can be more precisely controlled and has more variety of pattern changes. In this embodiment, the patterned bonding glue 101 has a plurality of bonding glue blocks 102 arranged in an array and spaced from each other. Wherein, each bonding rubber block 102 may have at least one hollowed-out area according to the needs of practical applications, and each bonding rubber block 102 has a rubber bonding surface 102a for bonding with the first bonding surface 3a of the subsequent semiconductor element. The surface area of the rubber block bonding surface 102a and the first bonding surface 3a of the semiconductor element are substantially the same, or the surface area difference between the two bonding surfaces is not greater than 10%.

具體的說,該印刷膠材包括一主材料,該主材料可選自透光的有機或無機材料,例如,該印刷膠材可選自環氧樹脂、矽膠或是耐高溫(>150℃)抗UV的含氟高分子材料等;另外,該印刷膠材也可以是於該主材料中再進一步添加有其它功能性的添加材料,如波長轉換材料或量子點材料等,而令該圖案化的接合膠101可具有不同特性。例如當該印刷膠材是包含該主材料與波長轉換材料,而該半導體元件為一發光件時,則該圖案化的接合膠101後續可用於改變發光件對外發出的光色,以及,當該印刷膠材包含該主材料與波長轉換材料,而該半導體元件為發光件時,則該接合膠101經固化後相對於轉換後的光波長之穿透率,可以達到50%以上。Specifically, the printing material includes a main material, and the main material may be selected from light-transmitting organic or inorganic materials. For example, the printing material may be selected from epoxy resin, silicone, or high temperature resistant (> 150 ° C). UV-resistant fluorine-containing polymer materials, etc. In addition, the printing adhesive material may be further added to the main material with other functional additive materials, such as wavelength conversion materials or quantum dot materials, to pattern the pattern. The adhesive 101 may have different characteristics. For example, when the printing adhesive material includes the main material and the wavelength conversion material, and the semiconductor element is a light-emitting component, the patterned bonding adhesive 101 can be subsequently used to change the color of light emitted from the light-emitting component, and when the The printing adhesive material includes the main material and the wavelength conversion material, and when the semiconductor element is a light emitting component, the transmissivity of the bonding adhesive 101 after curing with respect to the converted light wavelength can reach more than 50%.

此外,要說明的是,形成於該接合膠塊102的該鏤空區的目的是為了後續製程的需求,例如該鏤空區可用於後續於該光電元件半成品上形成電極或進行電連接製程,因此,若後續不需再進行其它製程則可無需形成該鏤空區。In addition, it should be noted that the purpose of forming the hollowed-out area in the bonding rubber block 102 is to meet the requirements of subsequent processes. For example, the hollowed-out area can be used to form electrodes or perform electrical connection processes on the semi-finished photovoltaic device. Therefore, If subsequent processes are not required, the hollowed-out area need not be formed.

然後進行步驟13,將多個半導體元件與該圖案化的接合膠101接合並將該圖案化的接合膠101固化形成一功能層5,並於該等半導體元件的第二接合面形成一第二基板200,其中,該第二接合面遠離該第一接合面3a、該第一基板100以及該接合膠101。Then, step 13 is performed, a plurality of semiconductor elements are bonded to the patterned adhesive 101 and the patterned adhesive 101 is cured to form a functional layer 5, and a second layer is formed on the second bonding surface of the semiconductor elements. The substrate 200, wherein the second bonding surface is far from the first bonding surface 3 a, the first substrate 100 and the bonding adhesive 101.

以下細部說明該步驟13,並同時參閱圖2及圖3以為補充。該步驟13是以「單元」操作方式令「一個光電元件半成品」為一單元,該光電元件半成品可包含該至少一作動層3、該底電極41、及該子基板2,又如前所述,當選用具有水平導通的光電元件半成品時(圖未示),則該光電元件半成品可包含該子基板2及該作動層3,關於該作動層3、底電極41及子基板2之功能為習知技藝者所熟悉,茲此不贅述。分別將多個單元的光電元件半成品以其第一接合面3a朝向該等接合膠塊102的膠塊接合面102a並將該等接合膠塊102與該等光電元件半成品接合後,再將該接合膠101固化而形成該功能層5,然後,再於該等半導體元件的第二接合面上形成該第二基板200。在此實施例中,該光電元件半成品的第二接合面即是該子基板2遠離該第一基板100的表面2a。The following details the step 13 and supplements it with reference to FIGS. 2 and 3 at the same time. The step 13 uses a "unit" operation mode to make "a semi-finished photovoltaic element" into a unit, and the semi-finished photovoltaic element may include the at least one actuation layer 3, the bottom electrode 41, and the sub-substrate 2, as described above. When a semi-finished photovoltaic element semi-finished product is selected (not shown), the semi-finished photovoltaic element semi-finished product may include the sub-substrate 2 and the actuation layer 3. The functions of the actuation layer 3, the bottom electrode 41, and the sub-substrate 2 are: Those skilled in the art are familiar and will not repeat them here. The semi-finished products of the photovoltaic elements of the plurality of units are respectively oriented with the first bonding surfaces 3a of the semi-finished products of the bonding elements 102 to the bonding surfaces 102a of the bonding blocks 102, and the bonding blocks 102 are bonded to the semi-finished products of the photovoltaic elements, and then the bonding is performed. The glue 101 is cured to form the functional layer 5, and then the second substrate 200 is formed on the second bonding surfaces of the semiconductor elements. In this embodiment, the second bonding surface of the semi-finished product of the photovoltaic element is the surface 2 a of the sub-substrate 2 away from the first substrate 100.

以下再參閱圖2及圖3進一步說明。該功能層5具有多個由該等接合膠塊102固化後形成的固化塊51,且每一個固化塊51具有至少一與該接合膠塊102之鏤空區相應的鏤空區511。該第二基板200則選擇易於移除的材料,例如光解黏膠帶、或是熱解黏膠帶。於本實施例中,該第二基板200是以照UV光後可解黏的光解黏膠帶(UV tape)為例說明。Hereinafter, referring to FIG. 2 and FIG. 3 for further description. The functional layer 5 has a plurality of curing blocks 51 formed by curing the bonding rubber blocks 102, and each curing block 51 has at least one hollowed-out area 511 corresponding to the hollowed-out area of the bonding rubber block 102. The second substrate 200 is made of a material that can be easily removed, such as a photo-deadhesive tape or a thermal de-adhesive tape. In this embodiment, the second substrate 200 is described by taking a UV tape that can be debonded after being irradiated with UV light as an example.

接著進行步驟14,將該第一基板100移除,並自每一個該固化塊51的該鏤空區511形成一個上電極42或多個上電極42(圖未示)。Then, step 14 is performed, the first substrate 100 is removed, and an upper electrode 42 or a plurality of upper electrodes 42 (not shown) are formed from the hollow area 511 of each of the curing blocks 51.

詳細的說,該步驟14是利用機械剝離或雷射燒蝕等方式將該第一基板100移除令該功能層5的表面露出。由於利用機械剝離或雷射燒蝕等方式移除暫時基板等為本技術領域者所習知,因此不再多加贅述。Specifically, in step 14, the first substrate 100 is removed by mechanical peeling or laser ablation to expose the surface of the functional layer 5. Since the removal of the temporary substrate by mechanical peeling or laser ablation is well known to those skilled in the art, it will not be described in detail.

接著,可利用網印方式或是點膠方式於該等固化塊51的鏤空區511形成導電材料,並將導電材料固化後即可分別於該等鏤空區511形成與該作動層3連接的該等上電極42,而得到多個光電元件。Then, a conductive material may be formed in the hollowed-out areas 511 of the solidified blocks 51 by screen printing or dispensing. After the conductive material is cured, the conductive materials may be formed in the hollowed-out areas 511 and connected to the active layer 3 respectively. Waiting on the electrode 42 to obtain a plurality of photovoltaic elements.

最後,進行步驟15,令該等光電元件與該第二基板200分離。Finally, step 15 is performed to separate the photovoltaic elements from the second substrate 200.

具體的說,於本實施例中該第二基板200是選自光解黏膠帶,因此,該步驟15是利用UV光照射該第二基板200,令該第二基板200於UV光照射的區域喪失黏性,使該區域的該等光電元件自該第二基板200脫落而與該第二基板200分離,即可得到單個於該作動層3頂面形成有該功能層5的光電元件。Specifically, in this embodiment, the second substrate 200 is selected from a photo-debonding tape. Therefore, the step 15 is to irradiate the second substrate 200 with UV light, so that the second substrate 200 is in a region irradiated by UV light. The adhesiveness is lost, and the photovoltaic elements in the area are separated from the second substrate 200 and separated from the second substrate 200, so that a single photovoltaic element having the functional layer 5 formed on the top surface of the operating layer 3 can be obtained.

參閱圖4、5,本發明半導體元件的異質材料結合方法一第二實施例,其實施流程與該第一實施例大致相同,不同處在於該第二實施例於該步驟13是將形成於晶圓上的複數光電元件半成品,直接與該等接合膠塊102黏接。且於該步驟14之後為實施步驟16,不實施如圖1的該步驟15。Referring to FIGS. 4 and 5, a second embodiment of a method for bonding heterogeneous materials of a semiconductor device according to the present invention is substantially the same as the first embodiment, except that the second embodiment is formed in the crystal at step 13. The semi-finished products of the plurality of optoelectronic elements on the circle are directly bonded to the bonding rubber blocks 102. After step 14, step 16 is performed, and step 15 shown in FIG. 1 is not performed.

詳細的說,該步驟13是直接利用以半導體製程形成於一晶圓(此時該晶圓即視為該第二基板200)的複數個分別具有該底電極41與該作動層3的光電元件半成品,將該等光電元件半成品以第一接合面3a與該等接合膠塊102的膠塊接合面102a黏接;該步驟16則是利用切割方式切割該第二基板200(晶圓),令該等光電元件彼此分離,而得到單個於該作動層3頂面形成有該功能層5的光電元件。值得注意的是,當選用具有水平導通的光電元件半成品時(圖未示),則該等底電極41可以省卻。In detail, the step 13 is to directly use a plurality of photovoltaic elements having the bottom electrode 41 and the active layer 3 formed on a wafer (the wafer is regarded as the second substrate 200) by a semiconductor process. The semi-finished product, the semi-finished products of the optoelectronic elements are bonded with the first bonding surface 3a and the rubber block bonding surface 102a of the bonding rubber blocks 102; in step 16, the second substrate 200 (wafer) is cut by a cutting method, so that The photovoltaic elements are separated from each other, and a single photovoltaic element having the functional layer 5 formed on the top surface of the actuation layer 3 is obtained. It is worth noting that when a semi-finished photovoltaic element semi-finished product is selected (not shown), the bottom electrodes 41 can be omitted.

此外,要說明的是,當前述該第一實施例及該第二實施例的該等半導體元件於形成該功能層5的表面後續無需進行其它製程時,於執行該步驟14時僅需將該第一基板100移除,不需再形成該等上電極42,即可進行該步驟15或步驟16。In addition, it should be noted that when the semiconductor elements of the first embodiment and the second embodiment described above do not need to perform other processes on the surface forming the functional layer 5 afterwards, it is only necessary to execute After the first substrate 100 is removed, the step 15 or step 16 can be performed without forming the upper electrodes 42 again.

以下參考圖4及圖6來說明本發明異質材料結合方法的一第三實施例。該第三實施例包含步驟71~75,該步驟71~75分別與該第二實施例的該步驟11~16相近似,相同部份茲此不贅述。該第三實施例的特別之處在於:該步驟73的該等光電元件半成品非以「單元」操作的方式與該等接合膠塊102黏合,而是先準備一第二基板200,將該等光電元件半成品以與位於該第一基板100表面之該等接合膠塊102相對應的位置,固定於該第二基板200的表面,再將載有該等光電元件半成品的該第二基板200與載有該等接合膠塊102的該第一基板100對位黏合並固化,或是先準備一第二基板200,複數個該等光電元件半成品已預先固定於該第二基板200的表面,該第一基板100表面之該等接合膠塊102以與位於該等光電元件半成品相對應的位置,成形於該第一基板100的表面,再將載有該等光電元件半成品的該第二基板200與載有該等接合膠塊102的該第一基板100對位黏合並固化。A third embodiment of the method for bonding heterogeneous materials according to the present invention is described below with reference to FIGS. 4 and 6. The third embodiment includes steps 71 to 75, and the steps 71 to 75 are similar to the steps 11 to 16 of the second embodiment, respectively, and the same parts are not described herein. The third embodiment is special in that the semi-finished products of the optoelectronic elements in step 73 are not bonded to the bonding rubber blocks 102 in a "unit" operation manner, but a second substrate 200 is first prepared, and The semi-finished photoelectric element is fixed on the surface of the second substrate 200 at a position corresponding to the bonding rubber blocks 102 on the surface of the first substrate 100, and then the second substrate 200 carrying the semi-finished photovoltaic element and the semi-finished product are loaded. The first substrate 100 carrying the bonding rubber blocks 102 is aligned and solidified, or a second substrate 200 is prepared first. A plurality of semi-finished products of the optoelectronic components have been fixed on the surface of the second substrate 200 in advance. The bonding rubber blocks 102 on the surface of the first substrate 100 are formed on the surface of the first substrate 100 at positions corresponding to the semi-finished products of the photovoltaic elements, and then the second substrate 200 carrying the semi-finished products of the photovoltaic elements is loaded. It is aligned with the first substrate 100 on which the bonding rubber blocks 102 are loaded, and is cured.

也就是說,該第三實施例不同於該第二實施例之處在於,該等光電元件半成品並非是經由半導體製程直接形成在原成長晶圓,而是將該等半導體半成品轉移至一不同於原成長晶圓的基板(即該第二基板200),再將該等光電元件半成品固定(晶)於該第二基板200以進行後續步驟。本實施例中該第二基板200可以選用不同於原成長的晶圓且散熱性較佳的材料,例如氧化鋁或氮化鋁,而可更提升切割後相互分離的光電元件的可靠度及效能,對於應用於半導體元件間距(<0.1mm)與半導體元件表面積(<0.01mm2)較小時的異質材料接合,本方法可更易於提升製程良率與生產效率。That is, the third embodiment is different from the second embodiment in that the semi-finished products of photovoltaic elements are not directly formed on the original growth wafer through a semiconductor process, but the semi-finished products of semiconductors are transferred to a The substrate (that is, the second substrate 200) of the growing wafer is then fixed (crystallized) on the semi-finished products of the optoelectronic elements on the second substrate 200 for subsequent steps. In this embodiment, the second substrate 200 can be made of a material different from the original grown wafer and has better heat dissipation properties, such as alumina or aluminum nitride, which can further improve the reliability and efficiency of the photovoltaic elements separated from each other after cutting. For the bonding of heterogeneous materials applied when the semiconductor element pitch (<0.1mm) and the semiconductor element surface area (<0.01mm2) are small, this method can more easily improve the process yield and production efficiency.

另外,要說明的是,於一些實施例中,當該第一基板100為透明且於形成該功能層5後無需再於該作動層3上進行其它製程時,則該等接合膠塊102與該等半導體元件3貼合後,也可無需移除該第一基板100,而是將該第一基板100與該第二基板200複合後的元件視為一模組,並令該第一基板100作為一保護該等半導體元件及固化塊51的保護層。此方式對應用於半導體元件間距(<0.1mm)與半導體元件表面積(<0.01mm 2)較小時的異質材料接合,可更易於提升製程良率與生產效率。舉例來說,當該功能層5包含波長轉換材料時,該第一基板100相對於轉換後的光波長穿透率大於50%。 In addition, it should be noted that, in some embodiments, when the first substrate 100 is transparent and there is no need to perform other processes on the actuation layer 3 after the functional layer 5 is formed, the bonding rubber blocks 102 and After the semiconductor elements 3 are bonded, it is not necessary to remove the first substrate 100, but the component after the first substrate 100 and the second substrate 200 are combined can be regarded as a module, and the first substrate can be made. 100 serves as a protective layer for protecting the semiconductor elements and the curing block 51. This method corresponds to the bonding of heterogeneous materials when the semiconductor element pitch (<0.1mm) and the semiconductor element surface area (<0.01mm 2 ) are small, which can more easily improve the process yield and production efficiency. For example, when the functional layer 5 includes a wavelength conversion material, the transmittance of the first substrate 100 with respect to the converted light wavelength is greater than 50%.

配合參閱圖1、5、6、7,於一些實施例中,該步驟12、72也可以是利用多次網板印刷的方式,而於該第一基板100印刷形成具有不同圖案、或是不同材料、或是不同組合成份的圖案化的接合膠101。例如,可以利用3次或多次網印,將3種或多種分別摻合可發出不同波長的波長轉換材料的印刷膠材,分別形成於該第一基板100,而於該第一基板100形成3或多種具有預定圖案分佈並可分別發出不同波長的接合膠塊102。圖7中是以光色波長轉換後可發出紅光、綠光、藍光3種不同波長的接合膠塊102以交錯排列方式,以及因為波長轉換材料摻合濃度相異而可形成波長轉換後具有色溫相異的3種或多種白光光色之接合膠塊102(圖7中,以R、G、B表示可發出不同波長的接合膠塊102,以W 1~W 3表示可發出不同色溫白光的接合膠塊102)為例說明,實際實施時不以此結構態樣為限。因此,以該第一實施例的該步驟16或該第三實施例的步驟75為例,可沿每一個接合膠塊102的間隙切割(如沿圖7所示的A-A、B-B線切割),而得到具有該功能層5為紅色(或其它光色)之最小發光單元102b;或者,可沿圖7所示的A’-A’、B’-B’線切割,以形成具有複數個不同或部份相同的波長轉換材料的功能層5所組成的複合發光單元102c。其中,每一個複合發光單元102c所包含的最小發光單元102b的個數,可依實際需要及應用而決定其切割方式,不以本圖式所揭露的方式為限。 With reference to FIGS. 1, 5, 6, and 7, in some embodiments, steps 12 and 72 may also be performed by multiple screen printing methods, and the first substrate 100 may be printed with different patterns or different patterns. Materials, or patterned adhesive 101 with different combinations. For example, three or more screen printings may be used to form three or more types of printing adhesives that are respectively mixed with wavelength conversion materials that emit different wavelengths, and are formed on the first substrate 100 and formed on the first substrate 100, respectively. Three or more types of bonding rubber blocks 102 having a predetermined pattern distribution and emitting different wavelengths, respectively. In FIG. 7, the bonding rubber blocks 102 which can emit three different wavelengths of red light, green light, and blue light after light color wavelength conversion are arranged in a staggered manner, and the wavelength conversion material can be formed after the wavelength conversion material has different concentrations. Three or more types of white rubber light-emitting adhesive blocks 102 (in Fig. 7, R, G, and B are used to indicate that the adhesive rubber blocks 102 can emit different wavelengths, and W 1 to W 3 are used to indicate that they can emit white light with different color temperatures) As an example, the bonding rubber block 102) is not limited to this structural aspect in actual implementation. Therefore, taking step 16 of the first embodiment or step 75 of the third embodiment as an example, it can be cut along the gap of each bonding rubber block 102 (such as cutting along the AA and BB lines shown in FIG. 7), The minimum light emitting unit 102b having the functional layer 5 of red (or other light color) is obtained; or, it can be cut along the lines A'-A 'and B'-B' shown in FIG. 7 to form a plurality of different Or a composite light emitting unit 102c composed of the functional layer 5 of the same wavelength conversion material. Among them, the number of the smallest light-emitting units 102b included in each composite light-emitting unit 102c can be determined according to actual needs and applications, and is not limited to the methods disclosed in this figure.

綜上所述,本發明將欲形成於該半導體元件表面且與該表面的構成材料不同的該功能層5,先利用網印方式於該第一基板100形成多個接合膠塊102,由於該等接合膠塊102是利用網印方式形成,因此,後續將該等接合膠塊102連接於該等半導體元件,並經固化後所形成的該功能層5的厚度均勻性佳。而當該半導體元件為一發光件,該功能層5是含有波長轉換材料時,由於以本方法形成於該發光件表面的該功能層5的整體厚度均勻性佳,因此,可提升該發光件最終對外發出之光色均勻性。此外,由於該功能層5是經由接合膠塊102硬化後而得,而該等接合膠塊102的圖案可藉由印刷網板的設計預先控制,且厚度也可藉由網印參數控制,而可具有更佳的製程便利性,故確實能達成本發明之目的。In summary, according to the present invention, the functional layer 5 to be formed on the surface of the semiconductor element and having a different material from the surface is firstly formed with a plurality of bonding rubber blocks 102 on the first substrate 100 by screen printing. The iso-bonding block 102 is formed by screen printing. Therefore, the thickness of the functional layer 5 formed after the bonding-block 102 is subsequently connected to the semiconductor elements and cured is good. When the semiconductor element is a light-emitting element and the functional layer 5 contains a wavelength conversion material, since the overall thickness of the functional layer 5 formed on the surface of the light-emitting element by this method is good, the light-emitting element can be improved. Uniformity of light color finally emitted to the outside. In addition, since the functional layer 5 is obtained after the bonding rubber block 102 is hardened, the pattern of the bonding rubber block 102 can be controlled in advance by the design of the printing screen, and the thickness can also be controlled by the screen printing parameters. Can have better process convenience, so it can indeed achieve the purpose of cost invention.

惟以上所述者,僅為本發明之較佳實施例而已,當不能以此限定本發明實施之範圍,凡是依本發明申請專利範圍及專利說明書內容所作之簡單的等效變化與修飾,皆仍屬本發明專利涵蓋之範圍內。However, the above are only the preferred embodiments of the present invention. When the scope of implementation of the present invention cannot be limited by this, all simple equivalent changes and modifications made in accordance with the scope of the patent application and the content of the patent specification of the present invention are Still within the scope of the invention patent.

11~16‧‧‧步驟11 ~ 16‧‧‧step

51‧‧‧固化塊51‧‧‧cured block

71~75‧‧‧步驟71 ~ 75‧‧‧step

511‧‧‧鏤空區511‧‧‧hollow area

2‧‧‧子基板2‧‧‧ daughter board

100‧‧‧第一基板100‧‧‧first substrate

2a‧‧‧表面2a‧‧‧ surface

101‧‧‧接合膠101‧‧‧Adhesive

3‧‧‧作動層3‧‧‧action layer

102、R、G、B、W1~W3‧‧‧接合膠塊102, R, G, B, W 1 ~ W 3 ‧‧‧

3a‧‧‧元件第一接合面3a‧‧‧Element first joint surface

102a‧‧‧膠塊接合面102a‧‧‧Plastic block joint surface

41‧‧‧底電極41‧‧‧ bottom electrode

102b‧‧‧最小發光單元102b‧‧‧Minimal light emitting unit

42‧‧‧上電極42‧‧‧up electrode

102c‧‧‧複合發光單元102c‧‧‧ composite light emitting unit

5‧‧‧功能層5‧‧‧ functional layer

200‧‧‧第二基板200‧‧‧ second substrate

本發明之其他的特徵及功效,將於參照圖式的實施方式中清楚地呈現,其中: 圖1是一文字流程圖,說明本發明的第一實施例; 圖2是一流程示意圖,輔助說明圖1; 圖3是一俯視示意圖,輔助說明圖2中的接合塊; 圖4是一文字流程圖,說明本發明的第二實施例; 圖5是一流程示意圖,輔助說明圖4; 圖6是一文字流程圖,說明本發明的第三實施例;及 圖7是一俯視示意圖,說明結合膠的另一排列態樣。Other features and effects of the present invention will be clearly presented in the embodiment with reference to the drawings, wherein: FIG. 1 is a text flow chart illustrating the first embodiment of the present invention; FIG. 2 is a schematic flow chart to assist the explanatory diagram 1; FIG. 3 is a schematic plan view to help explain the bonding block in FIG. 2; FIG. 4 is a text flow chart to explain the second embodiment of the present invention; FIG. 5 is a schematic flow chart to help explain FIG. 4; A flowchart illustrates a third embodiment of the present invention; and FIG. 7 is a schematic plan view illustrating another arrangement of the bonding glue.

Claims (9)

一種半導體元件的異質材料結合方法,包括:步驟A,準備一第一基板;步驟B,於該第一基板上形成一圖案化的接合膠;及步驟C,將至少一半導體元件的待接合表面與該接合膠接合並將該接合膠固化,以令該接合膠形成一功能層,並將一第二基板接合於該至少一半導體元件遠離該第一基板的表面,令該至少一半導體元件夾設固定於該第一基板與該第二基板之間,其中,該至少一半導體元件具有一由半導體材料構成的作動層,該作動層可於接收電能後對外發出預定波長的光,該接合膠是接合於該作動層表面,包含一主材料及分散於該主材料的添加材料,該主材料選自透光的有機或無機材料,該添加材料為波長轉換材料,且該膠合膠的材料與該待接合表面的材料不同;步驟D,移除該第一基板;及步驟E,令該至少一半導體元件與該第二基板分離。A method for bonding heterogeneous materials of a semiconductor element includes: step A, preparing a first substrate; step B, forming a patterned bonding adhesive on the first substrate; and step C, bonding at least one surface of the semiconductor element to be bonded It is bonded with the bonding glue and cured, so that the bonding glue forms a functional layer, and a second substrate is bonded to a surface of the at least one semiconductor element away from the first substrate, so that the at least one semiconductor element is clamped. It is fixed between the first substrate and the second substrate, wherein the at least one semiconductor element has an actuation layer made of a semiconductor material, the actuation layer can emit light with a predetermined wavelength to the outside after receiving electrical energy, and the bonding adhesive It is bonded to the surface of the actuation layer, and includes a main material and an additive material dispersed in the main material. The main material is selected from light-transmitting organic or inorganic materials, the additive material is a wavelength conversion material, and the material of the glue and the The materials to be joined are different; step D, removing the first substrate; and step E, separating the at least one semiconductor element from the second substrate. 如請求項第1項所述半導體元件的異質材料結合方法,其中,該步驟B是利用網板印刷方式形成該圖案化的接合膠。The method for bonding heterogeneous materials of a semiconductor device according to claim 1, wherein the step B is to form the patterned adhesive using a screen printing method. 如請求項第1項所述半導體元件的異質材料結合方法,其中,該第一基板可選自玻璃、氧化鋁、氮化鋁,或軟性基板。The method for bonding heterogeneous materials of a semiconductor device according to claim 1, wherein the first substrate can be selected from glass, alumina, aluminum nitride, or a flexible substrate. 如請求項第1項所述半導體元件的異質材料結合方法,其中,該步驟D是利用機械剝離或雷射燒蝕,將該第一基板移除。The method for bonding heterogeneous materials of a semiconductor device according to claim 1, wherein the step D is to remove the first substrate by mechanical peeling or laser ablation. 如請求項第1項所述半導體元件的異質材料結合方法,其中,該接合膠具有多個彼此間隔並成陣列排列的接合膠塊,該步驟C是將多個半導體元件分別與該等接合膠塊接合。The method for bonding heterogeneous materials of a semiconductor element according to claim 1, wherein the bonding glue has a plurality of bonding glue blocks spaced apart from each other and arranged in an array, and the step C is to separately separate the plurality of semiconductor elements from the bonding glue. Block junction. 如請求項第5項所述半導體元件的異質材料結合方法,其中,每一個接合膠塊具有至少一令與該接合膠塊相應結合的半導體元件的表面裸露的鏤空區。The method for bonding heterogeneous materials of a semiconductor device according to claim 5, wherein each bonding rubber block has at least one hollowed-out area on the surface of the semiconductor device correspondingly bonded to the bonding rubber block. 如請求項第1項所述半導體元件的異質材料結合方法,其中,該接合膠具有多個接合膠塊,且該等接合膠塊的波長轉換材料可為部份不同。According to the method for bonding heterogeneous materials of a semiconductor element according to claim 1, wherein the bonding adhesive has a plurality of bonding rubber blocks, and the wavelength conversion materials of the bonding rubber blocks may be partially different. 如請求項第1項所述半導體元件的異質材料結合方法,還包含一步驟F,該步驟F是切割該第二基板,以令該等半導體元件彼此分離。According to the method of claim 1, the method further includes a step F. The step F is to cut the second substrate to separate the semiconductor elements from each other. 如請求項第1項所述半導體元件的異質材料結合方法,其中,該第一基板為透明,且該第一基板相對於轉換後的光波長穿透率大於50%。According to the method of claim 1, the first substrate is transparent, and the transmittance of the first substrate with respect to the converted light wavelength is greater than 50%.
TW107108216A 2018-03-12 2018-03-12 Method for bonding heterogeneous materials of semiconductor element TWI669207B (en)

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