TWI662283B - Electronic component testing apparatus avoiding mutual interferences and system for the same - Google Patents

Abstract

An electronic component test device for avoiding mutual interference includes a test circuit board and an electronic component test circuit. The electronic component test circuit is electrically connected to the test circuit board. The test circuit board includes a plurality of test circuit daughter boards and a plurality of test circuit sub-boards. Power lines, the test circuit sub-boards are connected to the electronic component test circuit, the power lines are respectively connected to the test circuit sub-boards, and the power lines are respectively routed on the test circuit sub-boards or the tests In the circuit sub-board, the power lines are isolated from each other to prevent the test circuit sub-boards from interfering with each other.

Description

Electronic component test device and system for avoiding mutual interference

The invention relates to an electronic component testing device and an electronic component testing system, in particular to an electronic component testing device to avoid mutual interference and an electronic component testing system to avoid mutual interference.

Electronic parts, such as integrated circuits (ICs), memory, or microprocessors, are placed on test boards for testing after they are manufactured; multiple test parts can be placed and tested on one test board. After the electronic parts are tested, the electronic parts that pass the test can be shipped, and the electronic parts that fail the test are eliminated and destroyed.

The disadvantage of the above test board for testing multiple electronic parts is that the power supply wiring for supplying these electronic parts is connected together without being isolated from each other. For example, all power supply wirings are connected through the through holes, blind holes or buried holes of the circuit board. To the power supply layer of the circuit board, and the power supply supplies power to the electronic parts for testing through the power supply layer at the same time; therefore, if one of the electronic parts is damaged, it will be easily connected through each other without each other. The isolated power wiring and the power layer of the circuit board affect the test results of other electronic parts.

In order to solve the above problems, a first object of the present invention is to provide an electronic component testing device that avoids mutual interference.

In order to solve the above problems, a second object of the present invention is to provide an electronic component test system that avoids mutual interference.

In order to solve the above problems, a third object of the present invention is to provide an electronic component test system that avoids mutual interference.

To achieve the above-mentioned first object of the present invention, the electronic component testing device of the present invention which avoids mutual interference includes: a test circuit board; and an electronic component test circuit, the electronic component test circuit is electrically connected to the test circuit board. The test circuit board includes: a plurality of test circuit sub-boards, the test circuit sub-boards are respectively connected to the electronic component test circuit; and a plurality of power lines, the power lines are respectively connected to the test circuit sub-boards, the The power lines are respectively routed on or in the test circuit sub-boards, and the power lines are isolated from each other to avoid the test circuit sub-boards from interfering with each other.

In order to achieve the above-mentioned second object of the present invention, the electronic component test system for avoiding mutual interference of the present invention includes: an electronic component test device for avoiding mutual interference; and a power supply device which is electrically connected to the avoidance of mutual interference Interfering electronic parts testing device. The electronic component test device for avoiding mutual interference includes: a test circuit board; and an electronic component test circuit, and the electronic component test circuit is electrically connected to the test circuit board. The test circuit board includes: a plurality of test circuit daughter boards, the test circuit daughter boards are respectively connected to the electronic component test circuit; and a plurality of power lines, the power cables are respectively connected to the test circuit daughter boards and the test circuit boards. Power supply, the power lines are respectively routed on or in the test circuit sub-boards, and the power lines are isolated from each other To avoid these test circuit boards from interfering with each other. The power supply supplies power to the test circuit daughter boards through the power lines.

In order to achieve the third object of the present invention, the electronic component test system for avoiding mutual interference of the present invention includes: an electronic component test device for avoiding mutual interference; and a power supply, the power supply is electrically connected to the avoidance of mutual interference Electronic component testing device; and a plurality of electronic components, each of which is disposed on the electronic component testing device to avoid mutual interference. The electronic component test device for avoiding mutual interference includes: a test circuit board; and an electronic component test circuit, and the electronic component test circuit is electrically connected to the test circuit board. The test circuit board includes a plurality of test circuit sub-boards, the test circuit sub-boards are respectively connected to the electronic component test circuit, and the electronic parts are respectively disposed on the test circuit sub-boards; and a plurality of power lines, The power lines are respectively connected to the test circuit sub-boards and the power supply, and the power lines are respectively routed on the test circuit sub-boards or in the test circuit sub-boards. The power lines are isolated from each other to avoid The test circuit daughter boards interfere with each other. The power supply supplies power to the test circuit sub-boards and the electronic parts through the power lines, so that the electronic part test circuit tests the electronic parts. When one of the electronic parts is damaged, because The power lines are isolated from each other, so the electronic part test circuit tests that the remaining electronic parts are not affected by the damaged electronic part.

The effect of the present invention is to avoid mutual interference of the test circuit daughter boards.

In order to further understand the technology, means and effects adopted by the present invention to achieve the intended purpose, please refer to the following detailed description and accompanying drawings of the present invention. It is believed that the purpose, features and characteristics of the present invention can be obtained in-depth and Specific understanding, however, the drawings are provided for reference and description only, and are not intended to limit the present invention.

10‧‧‧Electronic component test device to avoid mutual interference

20‧‧‧Electronic component test system to avoid mutual interference

30‧‧‧Electronic parts

40‧‧‧ Power Supply

102‧‧‧test circuit board

104‧‧‧Electronic component test circuit

106‧‧‧test circuit daughter board

108‧‧‧Power cord

110‧‧‧ ground wire

P1 ~ P5‧‧‧Power wiring

GND‧‧‧ Ground wiring

FIG. 1 is a first layer wiring diagram of the test circuit board (ie, the test circuit daughter boards) of the present invention.

FIG. 2 is a second layer wiring diagram of the test circuit board (ie, the test circuit daughter boards) of the present invention.

FIG. 3 is a third layer wiring diagram of the test circuit board (ie, the test circuit daughter boards) of the present invention.

FIG. 4 is a schematic diagram of an electronic component testing device for avoiding mutual interference according to the present invention.

FIG. 5 is a schematic diagram of an embodiment of an electronic component test system for avoiding mutual interference according to the present invention.

FIG. 6 is a schematic diagram of another embodiment of the electronic component test system for avoiding mutual interference according to the present invention.

In this disclosure, many specific details are provided in order to provide a thorough understanding of specific embodiments of the invention; however, those skilled in the art should know that without one or more of these specific details, The present invention can be practiced; in other cases, well-known details are not shown or described to avoid obscuring the main technical features of the present invention. The technical content and detailed description of the present invention are described below with reference to the drawings: Please refer to FIG. 4, which is a schematic diagram of the electronic component test device of the present invention to avoid mutual interference. An electronic component testing device 10 of the present invention that avoids mutual interference includes a test circuit board 102 and an electronic component test circuit 104. The test circuit board 102 includes a plurality of test circuit sub-boards 106, a plurality of power lines 108, and a plurality of grounds. Line 110.

The electronic component test circuit 104 is electrically connected to the test circuit board 102; the test circuit sub-boards 106 are respectively connected to the electronic part test circuit 104; the power lines 108 are respectively connected to the test circuit sub-boards 106, the The power lines 108 are respectively routed on the test circuit sub-boards 106 or in the test circuit sub-boards 106 (as shown in FIGS. 1 to 3). The power lines 108 are isolated from each other to avoid the test circuit sub-boards 106. The ground wires 110 are respectively connected to the test circuit sub-boards 106, and the ground wires 110 are respectively routed on the test circuit sub-boards 106 or in the test circuit sub-boards 106 (as shown in FIGS. 1 to 3). (Shown), the ground lines 110 are isolated from each other to prevent the test circuit boards 106 from interfering with each other.

Please refer to FIG. 5, which is a schematic diagram of an embodiment of the electronic component test system for avoiding mutual interference according to the present invention. An electronic component test system 20 to avoid mutual interference of the present invention includes an electronic component test device 10 and a power supply 40 to avoid mutual interference. The electronic component test device 10 to avoid mutual interference includes a test circuit board 102 and an electronic device. Part test circuit 104; the test circuit board 102 includes a plurality of test circuit daughter boards 106, a plurality of power lines 108, and a plurality of ground lines 110.

The power supply 40 is electrically connected to the electronic component test device 10 which avoids mutual interference; the electronic component test circuit 104 is electrically connected to the test circuit board 102; the test circuit daughter boards 106 are respectively connected to the electronic component test Circuit 104; the power lines 108 are connected to the test circuit sub-boards 106 and the power supply 40, respectively, and the power lines 108 are respectively routed on the test circuit sub-boards 106 or in the test circuit sub-boards 106 (As shown in Figs. 1 to 3), the power lines 108 are isolated from each other to prevent the test circuit sub-boards 106 from interfering with each other; the power supply 40 supplies power to the test circuit sub-boards 106 through the power lines 108 respectively. The ground wires 110 are respectively connected to the test circuit sub-boards 106 and the power supply 40, and the ground wires 110 are respectively routed on the test circuit sub-boards 106 or in the test circuit sub-boards 106 (such as As shown in FIGS. 1 to 3), the ground wires 110 are isolated from each other to prevent the test circuit sub-boards 106 from interfering with each other.

Please refer to FIG. 6, which is a schematic diagram of another embodiment of the electronic component test system for avoiding mutual interference according to the present invention. An electronic component testing system 20 according to the present invention that avoids mutual interference includes An electronic component test device 10, a power supply 40, and a plurality of electronic components 30 to avoid mutual interference; the electronic component test device 10 to avoid mutual interference includes a test circuit board 102 and an electronic component test circuit 104; the test circuit The board 102 includes a plurality of test circuit daughter boards 106, a plurality of power lines 108, and a plurality of ground lines 110.

The power supply 40 is electrically connected to the electronic component testing device 10 to avoid mutual interference; the electronic components 30 are respectively disposed on the electronic component testing device 10 to avoid mutual interference; the electronic component test circuit 104 is electrically connected to The test circuit board 102; the test circuit sub-boards 106 are respectively connected to the electronic component test circuit 104, and the electronic parts 30 are respectively disposed on the test circuit sub-boards 106; the power cords 108 are respectively connected to the test circuits The test circuit sub-board 106 and the power supply 40, and the power lines 108 are respectively routed on the test circuit sub-board 106 or in the test circuit sub-board 106 (as shown in FIGS. 1 to 3). The lines 108 are isolated from each other to prevent the test circuit sub-boards 106 from interfering with each other; the ground lines 110 are respectively connected to the test circuit sub-boards 106 and the power supply 40, and the ground lines 110 are respectively routed to the test circuits On the sub-board 106 or in the test circuit sub-boards 106 (as shown in FIGS. 1 to 3), the ground wires 110 are isolated from each other to avoid the test circuit sub-boards 106 from interfering with each other.

The power supply 40 supplies power to the test circuit boards 106 and the electronic components 30 through the power lines 108 respectively, so that the electronic component test circuit 104 tests the electronic components 30; When one of them is damaged, because the power lines 108 are isolated from each other, the electronic component test circuit 104 tests that the remaining electronic components 30 are not affected by the damaged electronic component 30.

Please refer to FIG. 1, which is a first layer wiring diagram of the test circuit board (ie, the test circuit daughter boards) of the present invention; please refer to FIG. 2, which is the test circuit board (ie, the test boards) of the present invention Test circuit sub-board) second-layer wiring diagram; please refer to FIG. 3, which is a third-layer wiring diagram of the test circuit board (ie, the test circuit sub-boards) of the present invention. P1 ~ P5 are marked in the figure as the power wiring, which means that these power Source lines 108; labeled GND are ground wiring, that is, these ground lines 110. The power lines 108 are parallel to each other, and the ground lines 110 are parallel to each other.

In addition, the power lines 108 described above are respectively routed on the test circuit sub-boards 106 or in the test circuit sub-boards 106, and the power lines 108 are respectively routed on the test circuit sub-circuits by using printed circuit board technology. Board 106 or in the test circuit sub-boards 106; the above-mentioned ground wires 110 are respectively routed on the test circuit sub-boards 106 or in the test circuit sub-boards 106, which are grounded using printed circuit board technology The lines 110 are respectively routed on or within the test circuit sub-boards 106. The power lines 108 and the ground lines 110 are linear lines with the same width, and the power lines 108 and the ground lines 110 have a plurality of isolation sections with the same width to isolate each other.

Furthermore, the present invention may also include a plurality of power supplies 40, the power supplies 40 are isolated from each other, the power supplies 40 are electrically connected to the electronic component testing device 10 to avoid mutual interference, and the power supplies Lines 108 are connected to the test circuit sub-boards 106 and the power supplies 40, respectively, and the ground lines 110 are connected to the test circuit sub-boards 106 and the power supplies 40, respectively. The power supplies 40 pass through The power cords 108 supply power to the test circuit boards 106 and the electronic parts 30, respectively. When one of the electronic parts 30 is damaged, the power cords 108 and the power supplies 40 are connected to each other. Isolated, so the electronic component test circuit 104 tests the remaining electronic components 30 without being affected by the damaged electronic components 30.

The effect of the present invention is to avoid mutual interference between the test circuit boards 106.

However, the above are only preferred embodiments of the present invention. When the scope of implementation of the present invention cannot be limited, that is, all equivalent changes and modifications made in accordance with the scope of patent application of the present invention shall still be covered by the patent of the present invention. The scope intends to protect the scope. The present invention may have many other embodiments. Without departing from the spirit and essence of the present invention, those skilled in the art can make according to the present invention. Various corresponding changes and modifications, but these corresponding changes and modifications should all fall within the protection scope of the claims attached to the present invention. In summary, when the present invention is known to have industrial applicability, novelty, and progress, and the structure of the present invention has not been seen in similar products and public use, it fully meets the requirements for the application of invention patents, and is filed in accordance with the Patent Law.

Claims (9)

An electronic component testing device to avoid mutual interference includes: a test circuit board; and an electronic component test circuit, the electronic component test circuit is electrically connected to the test circuit board, wherein the test circuit board includes: a plurality of test circuit sub-circuits Boards, the test circuit sub-boards are respectively connected to the electronic component test circuit; and a plurality of power lines, the power lines are respectively connected to the test circuit sub-boards, and the power lines are respectively routed to the test circuit sub-boards Inside, the power lines are isolated from each other to avoid the test circuit sub-boards from interfering with each other, wherein the test circuit sub-boards of the test circuit board form a multilayer circuit board; the power lines are routed in the multilayer circuit board On at least one circuit board layer. As described in item 1 of the scope of the patent application, the electronic component test device for avoiding mutual interference, wherein the test circuit board further includes: a plurality of ground wires, the ground wires are respectively connected to the test circuit daughter boards, and the ground wires They are respectively routed on the test circuit sub-boards or in the test circuit sub-boards, and the ground wires are isolated from each other to avoid the test circuit sub-boards from interfering with each other. As described in item 2 of the scope of patent application, the electronic component testing device for avoiding mutual interference, wherein the power lines are parallel to each other; the ground lines are parallel to each other. An electronic component test system for avoiding mutual interference includes: an electronic part test device for avoiding mutual interference; and a power supply device electrically connected to the electronic part test device for avoiding mutual interference, wherein the avoidance of mutual interference An interference electronic component test device includes: a test circuit board; and an electronic component test circuit, the electronic component test circuit is electrically connected to the test circuit board, wherein the test circuit board includes: a plurality of test circuit daughter boards, the The test circuit sub-boards are respectively connected to the electronic component test circuit; and a plurality of power lines are respectively connected to the test circuit sub-boards and the power supply, and the power lines are respectively routed to the test circuit sub-boards. In the board, the power lines are isolated from each other to avoid the test circuit sub-boards from interfering with each other, wherein the power supply supplies power to the test circuit sub-boards through the power lines respectively; wherein the test circuits of the test circuit board The daughter board constitutes a multi-layer circuit board; at least one of the power lines is routed in the multi-layer circuit board. Plate layer. As described in item 4 of the scope of patent application, the electronic component test system for avoiding mutual interference, wherein the test circuit board further includes: a plurality of ground wires, the ground wires are respectively connected to the test circuit daughter boards and the power supply The ground wires are respectively routed on the test circuit sub-boards or in the test circuit sub-boards, and the ground lines are isolated from each other to avoid the test circuit sub-boards from interfering with each other. As described in item 5 of the scope of patent application, the electronic component test system for avoiding mutual interference, wherein the power lines are parallel to each other; the ground lines are parallel to each other. An electronic component test system that avoids mutual interference includes: an electronic component test device that avoids mutual interference; a power supply that is electrically connected to the electronic component test device that avoids mutual interference; and a plurality of electronic parts The electronic parts are respectively arranged on the electronic part test device for avoiding mutual interference, wherein the electronic part test device for avoiding mutual interference includes: a test circuit board; and an electronic part test circuit, the electronic part test circuit is electrically Connected to the test circuit board, wherein the test circuit board includes a plurality of test circuit sub-boards, the test circuit sub-boards are respectively connected to the electronic component test circuit, and the electronic components are respectively disposed on the test circuit sub-boards ; And a plurality of power cords, the power cords are respectively connected to the test circuit sub-boards and the power supply, the power cords are respectively routed in the test circuit sub-boards, and the power cords are isolated from each other to avoid the The test circuit sub-boards interfere with each other, and the power supply is supplied through the power lines respectively. Giving the test circuit board and the electronic parts, so that the electronic part test circuit tests the electronic parts; when one of the electronic parts is damaged, because the power lines are isolated from each other, the electronic part is tested The remaining electronic components of the circuit are not affected by the damaged electronic components. The test circuit sub-boards of the test circuit board form a multilayer circuit board. The power lines are routed in the multilayer circuit board. At least one circuit board layer. As described in item 7 of the scope of the patent application, the electronic component test system for avoiding mutual interference, wherein the test circuit board further includes a plurality of ground wires, and the ground wires are respectively connected to the test circuit daughter boards and the power supply. The ground wires are respectively routed on the test circuit sub-boards or in the test circuit sub-boards, and the ground lines are isolated from each other to avoid the test circuit sub-boards from interfering with each other. As described in item 8 of the scope of patent application, the electronic component test system for avoiding mutual interference, wherein the power lines are parallel to each other; the ground lines are parallel to each other.