CN208736941U - Avoid the electronic part test device interfered with each other and its system - Google Patents
Avoid the electronic part test device interfered with each other and its system Download PDFInfo
- Publication number
- CN208736941U CN208736941U CN201820898751.3U CN201820898751U CN208736941U CN 208736941 U CN208736941 U CN 208736941U CN 201820898751 U CN201820898751 U CN 201820898751U CN 208736941 U CN208736941 U CN 208736941U
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- China
- Prior art keywords
- test circuit
- daughter boards
- power supply
- circuit daughter
- multiple test
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Abstract
A kind of electronic part test device for avoiding interfering with each other is electrically connected to the test circuit board comprising test circuit board and electron elements test circuit, the electron elements test circuit；The test circuit board includes multiple test circuit daughter boards and a plurality of power supply line, multiple test circuit daughter boards are respectively connected to the electron elements test circuit, the a plurality of power supply line is respectively connected to multiple test circuit daughter boards, the a plurality of power supply line is routed in respectively in multiple test circuit daughter boards or in multiple test circuit daughter boards, which is isolated from each other interferes with each other to avoid multiple test circuit daughter boards.A kind of electron elements test system for avoiding interfering with each other, the electronic part test device interfered with each other, power supply unit and multiple electronic components are avoided comprising this, the power-supply controller of electric is powered respectively by a plurality of power supply line and gives multiple test circuit daughter boards and multiple electronic component, so that the multiple electronic component of electron elements test circuit test.
Description
Technical field
The utility model relates to a kind of electronic part test devices and a kind of electron elements test system, especially one kind to keep away
Exempt from the electronic part test device interfered with each other and a kind of electron elements test system for avoiding interfering with each other.
Background technique
Electronic component, such as integrated circuit (IC), memory or microprocessor can be placed in survey after fabrication is complete
It is tested on test plate (panel)；It can be placed on one test board and test multiple electronic components.After electron elements test finishes, survey
Test result is that the electronic component passed can carry out shipment, and test result is that the electronic component failed carries out eliminating pin
It ruins.
The shortcomings that above-mentioned test board test multiple electronic components, is, is connection to the power-supply wiring that these electronic components are powered
Together without being mutually isolated, such as whole power-supply wirings all can be connected by the through-hole of circuit board, blind hole or buried via hole
To the bus plane of circuit board, and power supply unit is then by bus plane while testing these electronic components powers；Therefore, such as
One of damage of these electronic components of fruit will easily pass through the power supply cloth to link together without being mutually isolated
The bus plane of line and circuit board and the test result for influencing other electronic components.
Summary of the invention
To solve the above problems, the first of the utility model is designed to provide a kind of electronic component for avoiding interfering with each other
Test device.
To solve the above problems, the second of the utility model is designed to provide a kind of electronic component for avoiding interfering with each other
Test macro.
To solve the above problems, the third of the utility model is designed to provide a kind of electronic component for avoiding interfering with each other
Test macro.
For above-mentioned first purpose for reaching the utility model, the electron elements test for avoiding interfering with each other of the utility model
Device includes: test circuit board；And electron elements test circuit, the electron elements test circuit are electrically connected to the test circuit
Plate.Wherein the test circuit board includes: multiple test circuit daughter boards, and multiple test circuit daughter boards are respectively connected to the electronics zero
Part tests circuit；And a plurality of power supply line, a plurality of power supply line are respectively connected to multiple test circuit daughter boards, a plurality of power supply line
It is routed in multiple test circuit daughter boards or in multiple test circuit daughter boards respectively, which is isolated from each other to keep away
Exempt from multiple test circuit daughter boards to interfere with each other.
For above-mentioned second purpose for reaching the utility model, the electron elements test for avoiding interfering with each other of the utility model
System includes: avoiding the electronic part test device interfered with each other；And power supply unit, the power supply unit are electrically connected to this
Avoid the electronic part test device interfered with each other.Wherein this is avoided the electronic part test device interfered with each other from including: test
Circuit board；And electron elements test circuit, the electron elements test circuit are electrically connected to the test circuit board.The wherein test
Circuit board includes: multiple test circuit daughter boards, and multiple test circuit daughter boards are respectively connected to the electron elements test circuit；And
A plurality of power supply line, a plurality of power supply line are respectively connected to multiple test circuit daughter boards and the power supply unit, a plurality of power supply
Line is routed in respectively in multiple test circuit daughter boards or in multiple test circuit daughter boards, a plurality of power supply line be isolated from each other with
Multiple test circuit daughter boards are avoided to interfere with each other.Wherein the power supply unit is powered respectively by a plurality of power supply line, and to give this more
A test circuit daughter boards.
For the above-mentioned third purpose for reaching the utility model, the electron elements test for avoiding interfering with each other of the utility model
System includes: avoiding the electronic part test device interfered with each other；Power supply unit, the power supply unit are electrically connected to this and keep away
Exempt from the electronic part test device interfered with each other；And multiple electronic components, multiple electronic component are respectively arranged at this and avoid phase
On the electronic part test device mutually interfered.Wherein this is avoided the electronic part test device interfered with each other from including: test circuit
Plate；And electron elements test circuit, the electron elements test circuit are electrically connected to the test circuit board.The wherein test circuit
Plate includes: multiple test circuit daughter boards, and multiple test circuit daughter boards are respectively connected to the electron elements test circuit, multiple
Electronic component is respectively arranged in multiple test circuit daughter boards；And a plurality of power supply line, a plurality of power supply line are respectively connected to this
Multiple test circuit daughter boards and the power supply unit, a plurality of power supply line are routed in multiple test circuit daughter boards respectively or should
In multiple test circuit daughter boards, which is isolated from each other interferes with each other to avoid multiple test circuit daughter boards.Wherein
The power supply unit is powered respectively by a plurality of power supply line and gives multiple test circuit daughter boards and multiple electronic component, so that
The multiple electronic component of electron elements test circuit test；When the damage of one of multiple electronic component, because should
A plurality of power supply line is isolated from each other, so what remaining multiple electronic component of the electron elements test circuit test will not be damaged
The influence of the electronic component.
The effect of the utility model, is to avoid interfering with each other for multiple test circuit daughter boards.
Detailed description of the invention
Fig. 1 is the first layer wiring diagram of the test circuit board (i.e. multiple test circuit daughter boards) of the utility model.
Fig. 2 is the second layer wiring diagram of the test circuit board (i.e. multiple test circuit daughter boards) of the utility model.
Fig. 3 is the third layer wiring diagram of the test circuit board (i.e. multiple test circuit daughter boards) of the utility model.
Fig. 4 is the electronic part test device schematic diagram for avoiding interfering with each other of the utility model.
Fig. 5 is an embodiment schematic diagram of the electron elements test system for avoiding interfering with each other of the utility model.
Fig. 6 is another embodiment schematic diagram of the electron elements test system for avoiding interfering with each other of the utility model.
Wherein, appended drawing reference are as follows:
Avoid the electronic part test device 10 interfered with each other
Avoid the electron elements test system 20 interfered with each other
30 power supply unit 40 of electronic component
Test 102 electron elements test circuit 104 of circuit board
Test 106 power supply line 108 of circuit daughter boards
It is grounded 110 power-supply wiring P1~P5
Ground connection wiring GND
Specific embodiment
In order to be further understood that the utility model to reach the technology, means and effect that predetermined purpose is taken, is asked
Refering to the detailed description and accompanying drawings below in connection with the utility model, to obtain to the purpose of this utility model, feature and feature
Specific to understand, institute's accompanying drawings are only used for reference and description, are not used to limit the utility model.
In this exposure, many specific details are provided, it is thorough to specific embodiment of the utility model so as to providing
Bottom understands；However, those skilled in the art should know, in the case where those specific details of none or more,
The utility model can still be practiced；In other cases, then well-known details is not shown or described to avoid this has been obscured
The technical characteristics of utility model.Hereby in relation to the technical content and a detailed description of the utility model, schema is cooperated to be described as follows:
Fig. 4 is the electronic part test device schematic diagram for avoiding interfering with each other of the utility model.Referring to Fig. 4, this reality
A kind of to avoid the electronic part test device 10 interfered with each other include test circuit board 102 and electron elements test electricity with novel
Road 104；The test circuit board 102 includes multiple test circuit daughter boards 106, a plurality of power supply line 108 and a plurality of ground line 110.
The electron elements test circuit 104 is electrically connected to the test circuit board 102；Multiple test circuit daughter boards 106
It is respectively connected to the electron elements test circuit 104；The a plurality of power supply line 108 is respectively connected to multiple test circuit daughter boards
106, which is routed in respectively in multiple test circuit daughter boards 106 or in multiple test circuit daughter boards 106
(as shown in Figures 1 to 3), which is isolated from each other interferes with each other to avoid multiple test circuit daughter boards 106；It should
A plurality of ground line 110 is respectively connected to multiple test circuit daughter boards 106, which is routed in multiple respectively
It tests in circuit daughter boards 106 or in multiple test circuit daughter boards 106 (as shown in Figures 1 to 3), a plurality of ground line 110 is each other
Isolation interferes with each other to avoid multiple test circuit daughter boards 106.
Fig. 5 is one of the electron elements test system for avoiding interfering with each other of the utility model embodiment schematic diagram.It please join
Read Fig. 5, to avoid the electron elements test system 20 interfered with each other include the electronics for avoiding interfering with each other by the utility model a kind of
Part-testing device 10 and power supply unit 40；It includes test circuit board that this, which is avoided the electronic part test device 10 interfered with each other,
102 and electron elements test circuit 104；The test circuit board 102 includes multiple test circuit daughter boards 106, a plurality of power supply line 108
And a plurality of ground line 110.
The power supply unit 40 is electrically connected to the electronic part test device for avoiding interfering with each other 10；The electronic component
Test circuit 104 is electrically connected to the test circuit board 102；Multiple test circuit daughter boards 106 are respectively connected to the electronics zero
Part tests circuit 104；The a plurality of power supply line 108 is respectively connected to multiple test circuit daughter boards 106 and the power supply unit 40,
The a plurality of power supply line 108 be routed in multiple test circuit daughter boards 106 respectively or in multiple test circuit daughter boards 106 (such as
Shown in Fig. 1~3), which is isolated from each other interferes with each other to avoid multiple test circuit daughter boards 106；The power supply
Power supply unit 40 is powered respectively by a plurality of power supply line 108 and gives multiple test circuit daughter boards 106；A plurality of 110 points of the ground line
It is not connected to multiple test circuit daughter boards 106 and the power supply unit 40, which is routed in multiple respectively
It tests in circuit daughter boards 106 or in multiple test circuit daughter boards 106 (as shown in Figures 1 to 3), a plurality of ground line 110 is each other
Isolation interferes with each other to avoid multiple test circuit daughter boards 106.
Fig. 6 is another embodiment schematic diagram of the electron elements test system for avoiding interfering with each other of the utility model.Please
Refering to Fig. 6, to avoid the electron elements test system 20 interfered with each other include the electricity that avoids interfering with each other by the utility model a kind of
Sub- part-testing device 10, power supply unit 40 and multiple electronic components 30；This is avoided the electron elements test interfered with each other from filling
It sets 10 and includes test circuit board 102 and electron elements test circuit 104；The test circuit board 102 includes multiple test circuit
Plate 106, a plurality of power supply line 108 and a plurality of ground line 110.
The power supply unit 40 is electrically connected to the electronic part test device for avoiding interfering with each other 10；Multiple electronics
Part 30 is respectively arranged on the electronic part test device for avoiding interfering with each other 10；104 electricity of electron elements test circuit
Property is connected to the test circuit board 102；Multiple test circuit daughter boards 106 are respectively connected to the electron elements test circuit 104,
Multiple electronic component 30 is respectively arranged in multiple test circuit daughter boards 106；The a plurality of power supply line 108 is respectively connected to this
Multiple test circuit daughter boards 106 and the power supply unit 40, a plurality of power supply line 108 are routed in multiple test circuit respectively
On plate 106 or in multiple test circuit daughter boards 106 (as shown in Figures 1 to 3), a plurality of power supply line 108 be isolated from each other to avoid
Multiple test circuit daughter boards 106 interfere with each other；The a plurality of ground line 110 is respectively connected to multiple test circuit daughter boards 106
And the power supply unit 40, which is routed in multiple test circuit daughter boards 106 respectively or multiple test
In circuit daughter boards 106 (as shown in Figures 1 to 3), which is isolated from each other to avoid multiple test circuit daughter boards
106 interfere with each other.
The power supply unit 40 is powered respectively by a plurality of power supply line 108 to be given multiple test circuit daughter boards 106 and is somebody's turn to do
Multiple electronic components 30, so that the electron elements test circuit 104 tests multiple electronic component 30；When multiple electronic component
When one of 30 damage, because a plurality of power supply line 108 is isolated from each other, the electron elements test circuit 104 test
The influence for the electronic component 30 that remaining multiple electronic component 30 will not be damaged.
Fig. 1 is the first layer wiring diagram of the test circuit board (i.e. multiple test circuit daughter boards) of the utility model, Fig. 2
It is the second layer wiring diagram of the test circuit board (i.e. multiple test circuit daughter boards) of the utility model, Fig. 3 is that this is practical new
The third layer wiring diagram of the test circuit board (i.e. multiple test circuit daughter boards) of type.Fig. 1~3 are please referred to, indicate P1 in figure
~P5 is power-supply wiring, the as a plurality of power supply line 108；Indicating GND is ground connection wiring, as a plurality of ground line 110.This is more
Power supply line 108 is parallel to each other, and a plurality of ground line 110 is parallel to each other.
Furthermore the above-mentioned a plurality of power supply line 108 is routed in multiple test circuit daughter boards 106 respectively or multiple test
It is that a plurality of power supply line 108 is routed in multiple test circuit respectively using printed-board technology in circuit daughter boards 106
On plate 106 or in multiple test circuit daughter boards 106；The above-mentioned a plurality of ground line 110 is routed in multiple test circuit respectively
It is to be distinguished a plurality of ground line 110 using printed-board technology on daughter board 106 or in multiple test circuit daughter boards 106
It is routed in multiple test circuit daughter boards 106 or in multiple test circuit daughter boards 106.The a plurality of power supply line 108 and should
A plurality of ground line 110 is all threadiness of same size, and a plurality of power supply line 108 is each other and a plurality of ground line 110
Have multiple isolation regions of same size to be isolated each other each other.
Furthermore the utility model can also include multiple power supply units 40, and multiple power supply units 40 are isolated from each other, more
A power supply unit 40 is electrically connected to the electronic part test device for avoiding interfering with each other 10, which divides
It is not connected to multiple test circuit daughter boards 106 and those power supply units 40, it is more which is respectively connected to this
A test circuit daughter boards 106 and those power supply units 40, those power supply units 40 are supplied respectively by a plurality of power supply line 108
Electricity gives multiple test circuit daughter boards 106 and multiple electronic component 30；When one of multiple electronic component 30 damages
When, because a plurality of power supply line 108 and those power supply units 40 are all isolated from each other, the electron elements test circuit 104
Test the influence for the electronic component 30 that remaining multiple electronic component 30 will not be damaged.
The effect of the utility model, is to avoid interfering with each other for multiple test circuit daughter boards 106.
So as described above, the only preferred embodiment of the utility model, when the model that cannot limit the utility model implementation
It encloses, i.e., all equivalent changes and modifications etc. made according to present utility model application the scope of the patents should still belong to the special of the utility model
Sharp covering scope is intended to the scope of protection.The utility model can also have other various embodiments, without departing substantially from the utility model essence
Mind and its essence in the case where, those skilled in the art when can be made according to the utility model it is various it is corresponding change and
Deformation, but these corresponding changes and modifications all should belong to the protection scope of the utility model the attached claims.To sum up institute
It states, when knowing that the utility model had industry applications, novelty and progressive, and the construction of the utility model is not also seen
It similar product and openly uses, complies fully with creation patent application important document, hence file an application according to Patent Law.
Claims (9)
1. a kind of electronic part test device for avoiding interfering with each other, characterized by comprising:
Test circuit board；And
Electron elements test circuit, the electron elements test circuit are electrically connected to the test circuit board, wherein the test circuit
Plate includes:
Multiple test circuit daughter boards, multiple test circuit daughter boards are respectively connected to the electron elements test circuit；And
A plurality of power supply line, a plurality of power supply line are respectively connected to multiple test circuit daughter boards, which is routed respectively
In multiple test circuit daughter boards or in multiple test circuit daughter boards, which is isolated from each other to avoid multiple
Test circuit daughter boards interfere with each other.
2. avoiding the electronic part test device interfered with each other as described in claim 1, which is characterized in that the test circuit board
Also include: a plurality of ground line, a plurality of ground line are respectively connected to multiple test circuit daughter boards, a plurality of ground line difference cloth
In multiple test circuit daughter boards or in multiple test circuit daughter boards, which is isolated from each other more to avoid this line
A test circuit daughter boards interfere with each other.
3. avoiding the electronic part test device interfered with each other as claimed in claim 2, which is characterized in that a plurality of power supply line
It is parallel to each other；The a plurality of ground line is parallel to each other.
4. a kind of electron elements test system for avoiding interfering with each other, characterized by comprising:
Avoid the electronic part test device interfered with each other；And
Power supply unit, the power supply unit are electrically connected to the electronic part test device for avoiding interfering with each other, and wherein should
The electronic part test device interfered with each other is avoided to include:
Test circuit board；And
Electron elements test circuit, the electron elements test circuit are electrically connected to the test circuit board, wherein the test circuit
Plate includes:
Multiple test circuit daughter boards, multiple test circuit daughter boards are respectively connected to the electron elements test circuit；
A plurality of power supply line, a plurality of power supply line are respectively connected to multiple test circuit daughter boards and the power supply unit, this is a plurality of
Power supply line is routed in respectively in multiple test circuit daughter boards or in multiple test circuit daughter boards, a plurality of power supply line each other every
It is interfered with each other to avoid multiple test circuit daughter boards,
Wherein the power supply unit is powered respectively by a plurality of power supply line and gives multiple test circuit daughter boards.
5. avoiding the electron elements test system interfered with each other as claimed in claim 4, which is characterized in that the test circuit board
Also include: a plurality of ground line, a plurality of ground line are respectively connected to multiple test circuit daughter boards and the power supply unit, this is more
Item ground line is routed in respectively in multiple test circuit daughter boards or in multiple test circuit daughter boards, and a plurality of ground line is each other
Isolation interferes with each other to avoid multiple test circuit daughter boards.
6. avoiding the electron elements test system interfered with each other as claimed in claim 5, which is characterized in that a plurality of power supply line
It is parallel to each other；The a plurality of ground line is parallel to each other.
7. avoiding the electron elements test system interfered with each other as claimed in claim 4, which is characterized in that the power supply unit
It is powered respectively by a plurality of power supply line and gives multiple electronic components, so that the multiple electronics zero of the electron elements test circuit test
Part, wherein multiple electronic component is respectively arranged on the electronic part test device for avoiding interfering with each other.
8. avoiding the electron elements test system interfered with each other as claimed in claim 7, which is characterized in that the test circuit board
Also include: a plurality of ground line, a plurality of ground line are respectively connected to multiple test circuit daughter boards and the power supply unit, this is more
Item ground line is routed in respectively in multiple test circuit daughter boards or in multiple test circuit daughter boards, and a plurality of ground line is each other
Isolation interferes with each other to avoid multiple test circuit daughter boards.
9. avoiding the electron elements test system interfered with each other as claimed in claim 8, which is characterized in that a plurality of power supply line
It is parallel to each other；The a plurality of ground line is parallel to each other.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820898751.3U CN208736941U (en) | 2018-06-11 | 2018-06-11 | Avoid the electronic part test device interfered with each other and its system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820898751.3U CN208736941U (en) | 2018-06-11 | 2018-06-11 | Avoid the electronic part test device interfered with each other and its system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN208736941U true CN208736941U (en) | 2019-04-12 |
Family
ID=66023606
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201820898751.3U Expired - Fee Related CN208736941U (en) | 2018-06-11 | 2018-06-11 | Avoid the electronic part test device interfered with each other and its system |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN208736941U (en) |
-
2018
- 2018-06-11 CN CN201820898751.3U patent/CN208736941U/en not_active Expired - Fee Related
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20190412 |