TWI622674B - Seed chuck and crystal seed growth fruance - Google Patents

Seed chuck and crystal seed growth fruance Download PDF

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Publication number
TWI622674B
TWI622674B TW106101596A TW106101596A TWI622674B TW I622674 B TWI622674 B TW I622674B TW 106101596 A TW106101596 A TW 106101596A TW 106101596 A TW106101596 A TW 106101596A TW I622674 B TWI622674 B TW I622674B
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seed
crystal
chuck
seed chuck
single crystal
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TW106101596A
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Chinese (zh)
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TW201812121A (en
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鄧先亮
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上海新昇半導體科技有限公司
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    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B15/00Single-crystal growth by pulling from a melt, e.g. Czochralski method
    • C30B15/32Seed holders, e.g. chucks
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B29/00Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
    • C30B29/02Elements
    • C30B29/06Silicon

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)

Abstract

本發明公開了一種籽晶夾頭及直拉單晶爐,所述籽晶夾頭設置一中空結構,所述中空結構貫通所述籽晶夾頭的上下兩端。將其應用於直拉單晶爐中,使得所述直拉單晶爐中的惰性保護氣體(如氬氣)可以透過所述中空結構冷卻晶棒頭部的中間部分,與晶棒的邊緣散熱速度保持一致,使整個晶棒散熱均勻,克服晶棒邊緣散熱快,中間散熱慢的現象,提高晶棒的晶體品質。另外,所述籽晶夾頭的外徑與一晶棒的直徑相等,有利於抑制直拉單晶爐下端向上輻射傳熱,減少透過所述中空結構向上散失熱量,降低長晶的功耗,穩定控制長晶過程的熱場溫度分佈,有利於晶棒的生長,提高晶棒的晶體品質。 The invention discloses a seed crystal chuck and a straight-drawing single crystal furnace. The seed crystal chuck is provided with a hollow structure, and the hollow structure penetrates the upper and lower ends of the seed crystal chuck. It is applied to a straight-drawing single crystal furnace, so that the inert protective gas (such as argon) in the straight-drawing single crystal furnace can cool the middle part of the head of the ingot through the hollow structure, and dissipate heat from the edge of the ingot. The speed is kept consistent, so that the entire ingot is cooled uniformly, the phenomenon of rapid heat dissipation at the edge of the ingot and slow heat dissipation in the middle is overcome, and the crystal quality of the ingot is improved. In addition, the outer diameter of the seed chuck is equal to the diameter of a crystal rod, which is conducive to suppressing the upward radiation heat transfer from the lower end of the straight-drawing single crystal furnace, reducing the heat loss upward through the hollow structure, and reducing the power consumption of the crystal growth. Steady control of the thermal field temperature distribution during the growth process is beneficial to the growth of the ingot and improves the crystal quality of the ingot.

Description

籽晶夾頭及直拉單晶爐 Seed chuck and straight pull single crystal furnace

本發明涉及晶棒生長領域,具體涉及一種籽晶夾頭及直拉單晶爐。 The invention relates to the field of crystal rod growth, in particular to a seed crystal chuck and a straight-drawing single crystal furnace.

單晶矽作為一種半導體材料,一般用於製造積體電路和其他電子元件。大部分的半導體單晶矽採用直拉法製造,採用直拉法的單晶矽生長方法中,請參閱圖1a-圖1c,單晶矽在生長時採用惰性氣體如氬氣做保護氣體(圖1a、圖1b和圖1c中粗黑色箭頭表示氬氣氣流方向),多晶矽被裝進石英坩堝10內加熱熔化變為矽熔體11,把一個具有特定晶向的籽晶12固定在籽晶夾頭13的下端,籽晶夾頭13的上端透過一連接杆14連接一連動機構15,連動機構15用於控制籽晶12的運動。首先,將籽晶12與矽熔體11熔接(如圖1a所示),開始進入引晶階段;接著,透過調整矽熔體11的溫度、籽晶12向上的提升速度等,使單晶矽16經過放肩階段和轉肩階段不斷長大(如圖1b和圖1c所示)。 Monocrystalline silicon, as a semiconductor material, is generally used in the manufacture of integrated circuits and other electronic components. Most of the semiconductor single crystal silicon is manufactured by the direct pull method. For the single crystal silicon growth method using the direct pull method, please refer to FIG. 1a to FIG. 1c. During the growth of the single crystal silicon, an inert gas such as argon is used as a protective gas (Figure The thick black arrows in 1a, 1b, and 1c indicate the direction of the argon gas flow.) Polycrystalline silicon is placed in a quartz crucible 10 and heated to melt into a silicon melt 11. A seed crystal 12 with a specific crystal orientation is fixed in the seed crystal holder. The lower end of the head 13 and the upper end of the seed crystal chuck 13 are connected to a linkage mechanism 15 through a connecting rod 14. The linkage mechanism 15 is used to control the movement of the seed crystal 12. First, the seed crystal 12 is fused to the silicon melt 11 (as shown in FIG. 1 a), and the seeding stage is started. Then, the single crystal silicon is adjusted by adjusting the temperature of the silicon melt 11 and the upward speed of the seed crystal 12. 16 grows up after the shoulder-releasing phase and the shoulder-turning phase (as shown in Figure 1b and Figure 1c).

然而,在現有技術中形成的單晶矽16的前段(約100mm高度)的晶體品質均較差,無法滿足實際需要,造成較大浪費。 However, the crystal quality of the front stage (about 100 mm height) of the single crystal silicon 16 formed in the prior art is poor, which cannot meet the actual needs, resulting in greater waste.

本發明所要解決的技術問題是提供一種籽晶夾頭及直拉單 晶爐,實現在直拉法製備晶棒時,提高晶棒的晶體品質,提高整個晶棒的利用率和降低成本。 The technical problem to be solved by the present invention is to provide a seed chuck and a straight pull single The crystal furnace can improve the crystal quality of the crystal rod, increase the utilization rate of the entire crystal rod and reduce the cost when the crystal rod is prepared by the direct drawing method.

為解決上述技術問題,本發明提供的籽晶夾頭,包括:所述籽晶夾頭中設置一中空結構,所述中空結構貫通所述籽晶夾頭的上下兩端。 In order to solve the above technical problems, the seed chuck provided by the present invention includes: a hollow structure is arranged in the seed chuck, and the hollow structure penetrates the upper and lower ends of the seed chuck.

進一步的,在所述籽晶夾頭中,所述中空結構在高度方向上的截面的形狀為四邊形。 Further, in the seed chuck, a shape of a cross section of the hollow structure in a height direction is a quadrangle.

可選的,在所述籽晶夾頭中,所述四邊形為倒梯形。 Optionally, in the seed chuck, the quadrangle is an inverted trapezoid.

進一步的,在所述籽晶夾頭中,所述中空結構在寬度方向上的截面的形狀為圓形或多邊形。 Further, in the seed chuck, a cross-sectional shape of the hollow structure in a width direction is circular or polygonal.

可選的,在所述籽晶夾頭中,所述多邊形的邊數為3-12個。 Optionally, in the seed chuck, the number of sides of the polygon is 3-12.

進一步的,在所述籽晶夾頭中,所述籽晶夾頭的外徑與一晶棒的直徑相等。 Further, in the seed chuck, an outer diameter of the seed chuck is equal to a diameter of a crystal rod.

進一步的,在所述籽晶夾頭中,所述外徑的大小為100mm-600mm。 Further, in the seed chuck, the size of the outer diameter is 100 mm-600 mm.

進一步的,在所述籽晶夾頭中,所述籽晶夾頭的內徑的最大值為所述外徑的1/3至2/3。 Further, in the seed chuck, a maximum value of an inner diameter of the seed chuck is 1/3 to 2/3 of the outer diameter.

進一步的,在所述籽晶夾頭中,所述籽晶夾頭的內徑的最小值為所述外徑的1/5至1/3。 Further, in the seed chuck, a minimum value of an inner diameter of the seed chuck is 1/5 to 1/3 of the outer diameter.

可選的,在所述籽晶夾頭中,所述籽晶夾頭的高度為100mm-600mm。 Optionally, in the seed chuck, the height of the seed chuck is 100 mm-600 mm.

進一步的,在所述籽晶夾頭中,所述籽晶夾頭的形狀為圓柱體或棱柱體。 Further, in the seed chuck, the shape of the seed chuck is a cylinder or a prism.

進一步的,在所述籽晶夾頭中,所述棱柱體的邊數為3-12個。 Further, in the seed chuck, the number of sides of the prism is 3-12.

進一步的,在所述籽晶夾頭中,所述中空結構的中心軸與所述籽晶夾頭的中心軸重合。 Further, in the seed chuck, a central axis of the hollow structure coincides with a central axis of the seed chuck.

進一步的,在所述籽晶夾頭中,所述籽晶夾頭的材質為鉬或石墨。 Further, in the seed chuck, the material of the seed chuck is molybdenum or graphite.

可選的,在所述籽晶夾頭中,所述籽晶夾頭還包括一第一連接結構,所述第一連接結構位於所述籽晶夾頭的底部或內側壁的下半部分。 Optionally, in the seed chuck, the seed chuck further includes a first connection structure, and the first connection structure is located at a bottom portion or a lower half of an inner sidewall of the seed chuck.

進一步的,在所述籽晶夾頭中,所述第一連接結構呈“十”字形。 Further, in the seed chuck, the first connection structure is in a “T” shape.

可選的,在所述籽晶夾頭中,所述籽晶夾頭還包括一第二連接結構,所述第二連接結構位於所述籽晶夾頭的頂部或內側壁的上半部分。 Optionally, in the seed chuck, the seed chuck further includes a second connection structure, and the second connection structure is located on the top or the upper half of the inner side wall of the seed chuck.

進一步的,在所述籽晶夾頭中,所述第二連接結構呈“十”字形。 Further, in the seed chuck, the second connection structure is in a “T” shape.

根據本發明的另一面,本發明還提供一種直拉單晶爐,所述直拉單晶爐包括上述籽晶夾頭。 According to another aspect of the present invention, the present invention also provides a straight-drawing single crystal furnace including the above-mentioned seed chuck.

進一步的,在所述直拉單晶爐中,所述直拉單晶爐還包括一聯動機構,所述籽晶夾頭的上端透過一連接杆與所述聯動機構相連,所述籽晶夾頭的下端固定一籽晶,所述聯動機構用於控制所述籽晶的運動。 Further, in the straight-drawing single crystal furnace, the straight-drawing single crystal furnace further includes a linkage mechanism, and an upper end of the seed crystal chuck is connected to the linkage mechanism through a connecting rod, and the seed crystal clamp A seed crystal is fixed at the lower end of the head, and the linkage mechanism is used to control the movement of the seed crystal.

進一步的,在所述直拉單晶爐中,透過一籽晶軸或第一鋼線將所述籽晶固定在所述籽晶夾頭的下端。 Further, in the straight-drawing single crystal furnace, the seed crystal is fixed to a lower end of the seed crystal chuck through a seed crystal shaft or a first steel wire.

進一步的,在所述直拉單晶爐中,透過一第二鋼線將所述籽 晶夾頭的上端與所述連接杆相連。 Further, in the straight-drawing single crystal furnace, the seed is passed through a second steel wire. The upper end of the crystal chuck is connected to the connecting rod.

本發明透過將籽晶夾頭中設置一中空結構,所述中空結構貫通所述籽晶夾頭的上下兩端,將其應用於直拉單晶爐中,使得所述直拉單晶爐中的惰性保護氣體(如氬氣)可以透過所述中空結構冷卻晶棒頭部的中間部分,與晶棒的邊緣散熱速度保持一致,使整個晶棒散熱均勻,克服晶棒邊緣散熱快,中間散熱慢的現象,提高晶棒的晶體品質。 In the present invention, a hollow structure is provided in the seed chuck, and the hollow structure penetrates the upper and lower ends of the seed chuck, and is applied to a straight-drawing single crystal furnace, so that the straight-drawing single crystal furnace is used. The inert protective gas (such as argon) can cool the middle part of the head of the ingot through the hollow structure, keeping the same heat dissipation speed as the edge of the ingot, so that the entire ingot is radiated uniformly, and the heat dissipation at the edge of the ingot is overcome quickly. Slow phenomenon improves the crystal quality of the ingot.

進一步的,所述中空結構在高度方向上的截面的形狀為倒梯形,即所述中空結構的上底面積大於下底面積,一方面,是有利於抑制直拉單晶爐下端向上輻射傳熱,減少透過所述中空結構向上散失熱量,降低長晶的功耗,穩定控制長晶過程的熱場溫度分佈,有利於晶棒的生長,提高晶棒的晶體品質。另一方面,所述籽晶夾頭的中空結構的上底面積要大,使得更多的保護氣體能夠透過所述中空結構,更好地實現冷卻晶棒頭部的中間部分的目的,得到具有更好的晶體品質的晶棒。 Further, the shape of the cross-section of the hollow structure in the height direction is an inverted trapezoid, that is, the upper bottom area of the hollow structure is larger than the bottom bottom area. , Reducing heat loss through the hollow structure, reducing the power consumption of the crystal growth, stably controlling the thermal field temperature distribution of the crystal growth process, facilitating the growth of the crystal rod, and improving the crystal quality of the crystal rod. On the other hand, the upper and lower areas of the hollow structure of the seed chuck should be large, so that more shielding gas can pass through the hollow structure, and the purpose of cooling the middle part of the head of the crystal rod is better achieved. Ingots with better crystal quality.

更進一步的,所述籽晶夾頭的外徑與一晶棒的直徑相等,相比現有的籽晶夾頭,加大了所述籽晶夾頭的外徑,可以抑制直拉單晶爐下端向上輻射傳熱,降低長晶的功耗,穩定控制長晶過程的熱場溫度分佈,有利於晶棒的生長,提高晶棒的晶體品質。特別是,在晶棒形成的初期,籽晶向上的提升速度變化大,使得直拉單晶爐中的熱場溫度分佈波動大,透過加大所述籽晶夾頭的外徑,可以大大減少熱量散失,降低晶棒生長初期的功耗,使長晶在轉肩階段的溫度得到提前升高,減少晶棒前段品質不良的部分,有利於後續晶棒的生長,提高整個晶棒的利用率和降低成本。 Furthermore, the outer diameter of the seed chuck is equal to the diameter of a crystal rod. Compared with the existing seed chuck, the outer diameter of the seed chuck is increased, and a straight-drawing single crystal furnace can be suppressed. The lower end radiates heat upward, reduces the power consumption of the crystal, and stably controls the thermal field temperature distribution of the crystal growth process, which is beneficial to the growth of the crystal rod and improves the crystal quality of the crystal rod. In particular, in the initial stage of the formation of the ingot, the upward lifting speed of the seed crystal changes greatly, which makes the temperature distribution of the thermal field in the Czochralski single crystal furnace fluctuate greatly. By increasing the outer diameter of the seed crystal chuck, it can be greatly reduced. The heat is lost, which reduces the power consumption at the beginning of the growth of the ingot, so that the temperature of the grown crystal is increased in advance during the shoulder turning stage. And reduce costs.

10‧‧‧石英坩堝 10‧‧‧Quartz Crucible

11‧‧‧矽熔體 11‧‧‧ Silicon Melt

12‧‧‧籽晶 12‧‧‧ Seed

13‧‧‧籽晶夾頭 13‧‧‧seed chuck

14‧‧‧連接杆 14‧‧‧ connecting rod

15‧‧‧連動機構 15‧‧‧ Linkage

16‧‧‧單晶矽 16‧‧‧ Monocrystalline

20‧‧‧石英坩堝 20‧‧‧Quartz Crucible

21‧‧‧矽熔體 21‧‧‧ silicon melt

22‧‧‧籽晶 22‧‧‧ Seed

23‧‧‧籽晶夾頭 23‧‧‧seed chuck

A‧‧‧中空結構 A‧‧‧ hollow structure

231‧‧‧第一連接結構 231‧‧‧First connection structure

232‧‧‧第二連接結構 232‧‧‧Second connection structure

24‧‧‧連接杆 24‧‧‧ connecting rod

25‧‧‧連動機構 25‧‧‧ Linkage

圖1a至圖1c為現有技術中直拉單晶爐的結構示意圖;圖2a為本發明實施例1中的所述籽晶夾頭的立體結構圖;圖2b為本發明實施例1中的所述籽晶夾頭的剖面結構圖;圖3a至圖3c為本發明實施例1中的直拉單晶爐的結構示意圖;圖4為本發明實施例2中的所述籽晶夾頭的立體結構圖;圖5為本發明實施例3中的所述籽晶夾頭的立體結構圖。 1a to 1c are schematic structural diagrams of a direct-drawing single crystal furnace in the prior art; FIG. 2a is a three-dimensional structural diagram of the seed chuck in Embodiment 1 of the present invention; and FIG. 2b is a perspective view of the first embodiment of the present invention. The sectional structure view of the seed chuck is shown in FIG. 3a to FIG. 3c are schematic structural diagrams of the straight-drawing single crystal furnace in Embodiment 1 of the present invention; and FIG. 4 is a perspective view of the seed chuck in Embodiment 2 of the present invention. Structural view; FIG. 5 is a perspective structural view of the seed chuck in Embodiment 3 of the present invention.

如習知技術所述,現有技術中存在單晶矽16的前段(約100mm高度)的晶體品質差的問題。申請人經過研究發現,如圖1a至圖1c所示,在現有技術中,採用直拉法製備單晶矽時,常用的籽晶夾頭13為實心的圓柱體,在長晶的引晶階段至轉肩階段,在單晶矽16的周圍的惰性氣體如氬氣的氣流方向會受到實心的籽晶夾頭13的影響,單晶矽16的中間部分氬氣氣流小,而邊緣部分氬氣氣流大(氬氣氣流方向如圖1a、圖1b和圖1c中粗黑色箭頭所示),於是,會出現單晶矽16的邊緣散熱快,中間散熱慢的現象,單晶矽16的散熱不均勻,使得固液介面(即矽熔體11和單晶矽16的介面)凸向晶體,導致其晶體品質差;另外,又因為常用的籽晶夾頭13的直徑較小,在長晶的引晶階段和放肩階段,因籽晶12向上的提升速度變化大,使得直法單晶矽爐裝置中的熱場溫度分佈波動大,大量的熱量會從直拉單晶爐的下端向上散失(圖1a、圖1b和圖1c中細線箭頭表示熱量散失方向),不利於前段單晶矽的生長,進一步使得前段的單晶矽的晶體品質變差而無法滿足實際需求,造成較大浪費。 As described in the conventional art, there is a problem in the prior art that the crystal quality of the front stage (about 100 mm height) of the single crystal silicon 16 is poor. The applicant found through research that, as shown in FIG. 1a to FIG. 1c, in the prior art, when the single-crystal silicon is prepared by the straight-draw method, the commonly used seed chuck 13 is a solid cylinder, and at the seeding stage of the crystal growth, At the turn of the shoulder stage, the flow direction of the inert gas such as argon around the single crystal silicon 16 will be affected by the solid seed chuck 13, the middle portion of the single crystal silicon 16 will have a small argon gas flow, and the edge portion will be argon. The air flow is large (the direction of the argon gas flow is shown by the thick black arrows in Figures 1a, 1b, and 1c). Therefore, the edge of the single crystal silicon 16 will dissipate heat quickly, and the heat dissipation in the middle will be slow. Uniform, so that the solid-liquid interface (that is, the interface of the silicon melt 11 and the single crystal silicon 16) is convex toward the crystal, resulting in poor crystal quality; In addition, because the diameter of the commonly used seed chuck 13 is small, In the seeding stage and the shoulder releasing stage, due to the large change in the upward lifting speed of the seed crystal 12, the thermal field temperature distribution in the straight-type single crystal silicon furnace device fluctuates greatly, and a large amount of heat will be dissipated upward from the lower end of the straight-type single crystal furnace. (The thin line arrows in Figures 1a, 1b and 1c indicate the direction of heat loss) The growth of the preceding single-crystal silicon, monocrystalline silicon so that further pre-stage of the crystal quality deterioration can not meet the actual demand, resulting in greater waste.

基於上述研究和發現,本發明提供一種籽晶夾頭,所述籽晶夾頭中設置一中空結構,所述中空結構貫通所述籽晶夾頭的上下兩端。 Based on the above research and discovery, the present invention provides a seed chuck. A hollow structure is disposed in the seed chuck, and the hollow structure penetrates the upper and lower ends of the seed chuck.

相應的,本發明還提供一種採用上述籽晶夾頭的直拉單晶爐。 Correspondingly, the present invention also provides a straight-drawing single crystal furnace using the seed crystal chuck.

本發明透過將籽晶夾頭中設置一中空結構,所述中空結構貫通所述籽晶夾頭的上下兩端,將其應用於直拉單晶爐中,使得所述直拉單晶爐中的惰性保護氣體(如氬氣)可以透過所述中空結構冷卻晶棒頭部的中間部分,與晶棒的邊緣散熱速度保持一致,使整個晶棒散熱均勻,克服晶棒邊緣散熱快,中間散熱慢的現象,提高晶棒的晶體品質。 In the present invention, a hollow structure is provided in the seed chuck, and the hollow structure penetrates the upper and lower ends of the seed chuck, and is applied to a straight-drawing single crystal furnace, so that the straight-drawing single crystal furnace is used. The inert protective gas (such as argon) can cool the middle part of the head of the ingot through the hollow structure, keeping the same heat dissipation speed as the edge of the ingot, so that the entire ingot is radiated uniformly, and the heat dissipation at the edge of the ingot is overcome quickly. Slow phenomenon improves the crystal quality of the ingot.

下面將結合流程圖和示意圖對本發明的籽晶夾頭及直拉單晶爐進行更詳細的描述,其中表示了本發明的優選實施例,應該理解本領域技術人員可以修改在此描述的本發明,而仍然實現本發明的有利效果。因此,下列描述應當被理解為對於本領域技術人員的廣泛知道,而並不作為對本發明的限制。 In the following, the seed chuck and the straight-drawing single crystal furnace of the present invention will be described in more detail with reference to flowcharts and schematic diagrams, which show the preferred embodiments of the present invention. It should be understood that those skilled in the art can modify the present invention described herein. While still achieving the advantageous effects of the present invention. Therefore, the following description should be understood as widely known to those skilled in the art, and not as a limitation on the present invention.

在下列段落中參照附圖以舉例方式更具體地描述本發明。根據下面說明和請求項書,本發明的優點和特徵將更清楚。需說明的是,附圖均採用非常簡化的形式且均使用非精准的比例,僅用以方便、明晰地輔助說明本發明實施例的目的。 The invention is described in more detail by way of example in the following paragraphs with reference to the drawings. The advantages and features of the present invention will become clearer from the following description and claims. It should be noted that the drawings are in a very simplified form and all use inaccurate proportions, which are only used to facilitate and clearly assist the description of the embodiments of the present invention.

以下列舉所述籽晶夾頭及直拉單晶爐的實施例,以清楚說明本發明的內容,應當明確的是,本發明的內容並不限制於以下實施例,其他透過本領域普通技術人員的常規技術手段的改進亦在本發明的思想範圍之內。 The examples of the seed chuck and the straight-drawing single crystal furnace are listed below to clearly explain the content of the present invention. It should be clear that the content of the present invention is not limited to the following embodiments. Improvements in conventional technical means are also within the scope of the present invention.

實施例1: Example 1:

請參閱圖2a和圖2b,圖2a為本發明實施例1中所述籽晶夾頭的立體結構示意圖,圖2b為其剖面結構示意圖。本實施例中,所述籽晶夾頭23中設置一中空結構A,所述中空結構A貫通所述籽晶夾頭23的上下兩端,以在所述籽晶夾頭23中形成一氣流可以導通的結構。較佳的,所述籽晶夾頭23的形狀為一圓柱體,並且所述中空結構A在高度方向上的截面(即豎截面)的形狀為倒梯形,所述中空結構A在寬度方向上的截面(即橫截面)的形狀為圓形,為了使所述籽晶夾頭23能夠保持相對平穩狀態,所述中空結構A的中心軸與所述籽晶夾頭23的中心軸重合。優選的,在直拉單晶爐中,所述籽晶夾頭的外徑D1與所需的晶棒的直徑相等,比如:所需晶棒的直徑為150mm、300mm、450mm等,相應的,將所的外徑D1分別設計為150mm、300mm、450mm等,所述外徑D1的大小可以在100mm-600mm範圍之內;同時,所述籽晶夾頭23的最大內徑D2max可以為所述外徑D1的1/3至2/3,例如所述最大內徑D2max為50mm、100mm、150mm、200mm、300mm等;所述籽晶夾頭23的最小內徑D2min可以為所述外徑D1的1/5至1/3,比如所述最小內徑D2min可以為30mm、60mm、90mm、150mm等;所述籽晶夾頭23的高度H可以為100mm-600mm。所述籽晶夾頭23的外徑D1、最大內徑D2max、最小內徑D2min和高度H相匹配設定,使晶棒的晶體品質最佳。所述籽晶夾頭23的材質可以為金屬鉬或者石墨等具有耐高溫、高強度的材料。 Please refer to FIG. 2a and FIG. 2b. FIG. 2a is a schematic diagram of the three-dimensional structure of the seed chuck according to Embodiment 1 of the present invention, and FIG. 2b is a schematic diagram of its cross-sectional structure. In this embodiment, a hollow structure A is provided in the seed chuck 23, and the hollow structure A penetrates the upper and lower ends of the seed chuck 23 to form an air flow in the seed chuck 23. Conductable structure. Preferably, the shape of the seed chuck 23 is a cylinder, and the shape of the cross-section (ie, vertical cross-section) of the hollow structure A in the height direction is an inverted trapezoid, and the hollow structure A is in the width direction. The shape of the cross section (that is, the cross section) is circular. In order to maintain the seed chuck 23 in a relatively stable state, the central axis of the hollow structure A coincides with the central axis of the seed chuck 23. Preferably, in a straight-drawing single crystal furnace, the outer diameter D1 of the seed chuck is equal to the diameter of the required ingot, for example: the diameter of the required ingot is 150mm, 300mm, 450mm, etc., correspondingly, The outer diameter D1 is designed to be 150mm, 300mm, 450mm, etc., and the size of the outer diameter D1 may be in the range of 100mm-600mm; meanwhile, the maximum inner diameter D2 max of the seed chuck 23 may be The outer diameter D1 is 1/3 to 2/3, for example, the maximum inner diameter D2 max is 50mm, 100mm, 150mm, 200mm, 300mm, etc .; the minimum inner diameter D2 min of the seed chuck 23 may be the The outer diameter D1 is 1/5 to 1/3, for example, the minimum inner diameter D2 min may be 30mm, 60mm, 90mm, 150mm, etc .; the height H of the seed chuck 23 may be 100mm-600mm. The seed chuck 23 outer diameter D1, the maximum inner diameter D2 max, and the minimum inner diameter D2 min is set to match the height H, so that the best crystal quality of the ingot. The material of the seed chuck 23 may be a material having high temperature resistance and high strength, such as metallic molybdenum or graphite.

當然,上述籽晶夾頭23在實際應用時,是需要跟其他裝置結合使用的。因此,所述籽晶夾頭23還包括一第一連接結構231和第二連接結構232。較佳的,所述第一連接結構231位於所述籽晶夾頭23的底部,為了 使其受力均衡,所述第一連接結構231設計呈一“十”字形;所述第二連接結構232位於所述籽晶夾頭23的頂部,同樣設計為呈一“十”字形。例如,將上述籽晶夾頭23應用於直拉單晶爐時,因為常用的籽晶一般為圓柱體或長方體,在其上面會設置一個或多個缺口,所以,可以直接透過一籽晶軸或第一金屬線(如第一鋼線)把所述籽晶固定在所述第一連接結構231上;同時,為了能夠控制所述籽晶的運動,可以透過一籽晶軸或第二金屬線(如第二鋼線)和第二連接結構232將所述籽晶夾頭23與一連接杆相連,然後所述連接杆連接一連動結構,所述聯動機構控制所述籽晶的運動。其實,在其他實施例中,“十”字形的所述第一連接結構231和第二連接結構232還可以分別設計在所述籽晶夾頭23的內側壁的下半部分和上半部分,同樣能夠實現所述籽晶夾頭23固定所述籽晶22以及所述籽晶夾頭23與所述連接杆相連。顯然,所述第一連接結構231還可以是其它與所述籽晶相匹配的結構,比如:凹槽、小孔等,可以透過銷將所述籽晶22固定下來;同樣,所述第二連接結構232也可以是其它與所述連接杆配套設計的結構。本發明對所述第一連接結構231和第二連接結構232並不做限定,它們還可以包括本領域普通技術人員所知曉的其他結構,在此不做贅述。 Of course, the above-mentioned seed chuck 23 needs to be used in combination with other devices in practical applications. Therefore, the seed chuck 23 further includes a first connection structure 231 and a second connection structure 232. Preferably, the first connection structure 231 is located at the bottom of the seed chuck 23, in order to To balance the forces, the first connection structure 231 is designed in a “T” shape; the second connection structure 232 is located on the top of the seed chuck 23 and is also designed in a “T” shape. For example, when the above-mentioned seed chuck 23 is applied to a straight-pull single crystal furnace, since the commonly used seed crystal is generally a cylinder or a rectangular parallelepiped, one or more notches are provided on it, so it can directly pass through a seed axis. Or the first metal wire (such as the first steel wire) fixes the seed crystal on the first connecting structure 231; at the same time, in order to control the movement of the seed crystal, a seed crystal shaft or a second metal can be transmitted through A wire (such as a second steel wire) and a second connection structure 232 connect the seed crystal chuck 23 with a connecting rod, and then the connecting rod connects a linkage structure, and the linkage mechanism controls the movement of the seed crystal. In fact, in other embodiments, the “ten” shape of the first connection structure 231 and the second connection structure 232 may also be designed on the lower half and the upper half of the inner side wall of the seed chuck 23, respectively. Similarly, the seed crystal chuck 23 can be fixed to the seed crystal 22 and the seed crystal chuck 23 is connected to the connecting rod. Obviously, the first connection structure 231 may also be other structures matching the seed crystal, such as grooves, small holes, etc., and the seed crystal 22 may be fixed by a pin; similarly, the second The connecting structure 232 may also be another structure designed to be matched with the connecting rod. The present invention does not limit the first connection structure 231 and the second connection structure 232, and they may also include other structures known to those of ordinary skill in the art, and details are not described herein.

為了進一步清楚的描述和說明本發明的內容,現以直拉法製備單晶矽的生長過程為例,以詳細的描述所述籽晶夾頭應用於直拉單晶爐中的有益效果。 In order to further clearly describe and explain the content of the present invention, the growth process of preparing a single crystal silicon by a direct drawing method is taken as an example to describe in detail the beneficial effect of the seed chuck applied to a direct drawing single crystal furnace.

請參閱圖3a至圖3c,圖中示意出了直拉法製備單晶矽的初始階段、放肩階段和轉肩階段對應的所述直拉單晶爐中的結構示意圖。直拉法製備單晶矽的過程中採用惰性氣體氬氣作為保護氣體,通入惰性氣體如 氬氣,結合真空泵的抽氣,在直拉單晶爐中形成一個減壓氣氛下的氬氣流動(圖3a至圖3c中粗黑色箭頭表示氬氣流動方向)。氬氣流動一方面能夠帶走高溫熔融多晶矽揮發的氧化物,以防止氧化物顆粒掉進矽熔體,進而運動到固液介面,破壞單晶矽原子排列的一致性;另一方面,能夠及時帶走單晶矽表面的熱量,促使單晶矽的散熱和冷卻,增大單晶矽的縱向溫度梯度,有利於單晶矽生長。通常,單晶矽的製備過程中減壓氣氛的壓力為12托-20托,氬氣的流量為45slpm-80slpm(standard liter per minute,即標準升每分鐘)。 Please refer to FIG. 3a to FIG. 3c, which are schematic structural diagrams of the straight-drawing single crystal furnace corresponding to an initial stage, a shoulder-releasing stage, and a shoulder-turning stage of preparing a single-crystal silicon by a straight-drawing method. In the process of preparing single crystal silicon by the direct pulling method, an inert gas such as argon is used as a protective gas, and an inert gas such as Argon, combined with vacuum pumping, forms an argon flow under a reduced-pressure atmosphere in a straight-drawing single crystal furnace (the thick black arrows in Figs. 3a to 3c indicate the direction of argon flow). The flow of argon gas can take away the volatile oxides of high temperature molten polycrystalline silicon to prevent the oxide particles from falling into the silicon melt and then moving to the solid-liquid interface, destroying the consistency of the monocrystalline silicon atom arrangement; on the other hand, it can timely Take away the heat from the surface of the single crystal silicon, promote the heat dissipation and cooling of the single crystal silicon, and increase the vertical temperature gradient of the single crystal silicon, which is conducive to the growth of the single crystal silicon. Generally, the pressure of the decompressed atmosphere during the preparation of single crystal silicon is 12 Torr-20 Torr, and the flow rate of argon gas is 45 slpm-80 slpm (standard liter per minute, that is, standard liter per minute).

具體的製備過程為:首先,多晶矽被裝進石英坩堝20內,將一具有特定晶向的籽晶22固定在所述籽晶夾頭23的下端,所述籽晶22是由一定晶向的矽單晶切割或鑽取而成,常用的晶向為<100>、<111>、<110>、<511>等。所述籽晶22一般為圓柱體或長方體,在其上面會設置一個或多個缺口,於是,可以透過所述籽晶軸或所述第一鋼線(圖中示意圖省略)和第一連接結構231(如圖2所示)把所述籽晶22固定在所述籽晶夾頭23的下端;所述籽晶夾頭23的上端透過一連接杆24與一連動機構25相連,控制所述籽晶22的運動,合上直拉單晶爐的爐室,並對其抽真空;然後,透過石墨發熱體(圖中示意圖省略)加熱多晶矽使其熔化,等多晶矽完全熔化形成矽熔體21後,逐步降低矽熔體溫度至矽的熔點附近。 The specific preparation process is as follows: first, polycrystalline silicon is loaded into the quartz crucible 20, and a seed crystal 22 having a specific crystal orientation is fixed at the lower end of the seed crystal chuck 23, and the seed crystal 22 is formed by a certain crystal orientation. Silicon single crystal is cut or drilled, and the commonly used crystal directions are <100>, <111>, <110>, <511> and so on. The seed crystal 22 is generally a cylinder or a rectangular parallelepiped, and one or more notches are provided on the seed crystal. Therefore, the seed crystal 22 or the first steel wire (illustration omitted in the figure) and the first connection structure can be passed through. 231 (as shown in FIG. 2) fixes the seed crystal 22 to the lower end of the seed chuck 23; the upper end of the seed chuck 23 is connected to a linkage mechanism 25 through a connecting rod 24 to control the The movement of the seed crystal 22 is to close the chamber of the straight-drawing single crystal furnace and evacuate it. Then, the polycrystalline silicon is heated and melted through the graphite heating element (the diagram is omitted in the figure), and the polycrystalline silicon is completely melted to form a silicon melt 21 Then, gradually lower the silicon melt temperature to near the melting point of the silicon.

然後,透過所述連動機構25使所述籽晶夾頭23在所述連接杆24的帶動下旋轉,並將所述籽晶22慢慢下降,使其與矽熔體21熔接(如圖3a所示),即完成了單晶矽初始階段的過程;接著,透過所述聯動機構25以一定的速度向上提拉所述籽晶22,進入引晶過程,所述引晶過程的主要作用 是為了消除因熱衝擊而導致單晶矽形成的位錯缺陷,利用結晶前沿的過冷度驅動矽原子按順序排列在固液介面的矽固體上,形成單晶矽26。 Then, the seed crystal chuck 23 is rotated by the connecting rod 24 through the linkage mechanism 25, and the seed crystal 22 is slowly lowered to be fused with the silicon melt 21 (as shown in FIG. 3a). (Shown), that is, the process of the initial stage of the single crystal silicon is completed; then, the seed crystal 22 is pulled up at a certain speed through the linkage mechanism 25 to enter the seeding process, the main role of the seeding process In order to eliminate the dislocation defect caused by single crystal silicon due to thermal shock, the supercooling degree of the leading edge of the crystal is used to drive the silicon atoms to sequentially arrange on the silicon solid on the solid-liquid interface to form the single crystal silicon 26.

待所述單晶矽26提升到一定高度時,減慢所述籽晶22向上提拉的速度,同時略降低矽熔體21的溫度,進行降溫是為了促進所述單晶矽26的橫向生長,即使所述單晶矽26的直徑加大,該過程稱作為放肩階段(如圖3b所示)。 When the single crystal silicon 26 is raised to a certain height, the speed of pulling up the seed crystal 22 is reduced, and the temperature of the silicon melt 21 is slightly reduced. The temperature is lowered to promote the lateral growth of the single crystal silicon 26 Even if the diameter of the single crystal silicon 26 is increased, this process is called a shoulder-releasing stage (as shown in FIG. 3b).

在上述過程中,平整的固液介面和穩定的熱場溫度分佈是影響單晶矽晶體品質的關鍵因素。因此,在發明實施例中所述籽晶夾頭23中設置一中空結構A,且所述中空結構A的豎截面的形狀為倒梯形,即所述中空結構A的上底面積大於下底面積,可以使得所述直拉單晶爐中的相對較多的惰性保護氣體(如氬氣)可以透過所述中空結構A冷卻單晶矽26頭部的中間部分,與單晶矽26的邊緣散熱速度保持一致,使整個單晶矽散熱均勻,克服單晶矽邊緣散熱快,中間散熱慢的現象,得到良好的固液介面,並且增大單晶矽的縱向溫度梯度,提高單晶矽的晶體品質。另外,因為在上述過程中所述籽晶22向上提拉的速度變化較大,矽熔體21的溫度也有所變化,則直拉單晶爐中的熱場溫度分佈也會波動較大,但是,在本發明實施例中因為所述籽晶夾頭23的外徑與後續要形成的單晶矽的直徑相等,因此,大尺寸的籽晶夾頭23會抑制直拉單晶爐下端向上輻射傳熱(圖3a至圖3c中細線箭頭表示熱輻射方向),而且所述中空結構A的下底面積較小,也是為了減少透過所述中空結構A向上散失熱量,可以很好的減少單晶矽初期的熱量散失,穩定控制長晶過程的熱場溫度分佈,降低單晶矽生長初期的功耗,有利於後續單晶矽的生長。 In the above process, the flat solid-liquid interface and stable thermal field temperature distribution are the key factors affecting the quality of single crystal silicon. Therefore, in the embodiment of the invention, a hollow structure A is provided in the seed chuck 23, and the shape of the vertical section of the hollow structure A is an inverted trapezoid, that is, the upper area area of the hollow structure A is greater than the lower area area. It can make relatively more inert protective gas (such as argon) in the straight-drawing single crystal furnace cool the middle part of the head of the single crystal silicon 26 through the hollow structure A, and dissipate heat from the edge of the single crystal silicon 26. Keep the speed uniform, make the whole single crystal silicon dissipate uniformly, overcome the phenomenon that the edge of the single crystal silicon dissipates fast, and the heat dissipation in the middle is slow, get a good solid-liquid interface, and increase the vertical temperature gradient of the single crystal silicon, improve the crystal quality. In addition, because the speed of pulling up the seed crystal 22 in the above process changes greatly, and the temperature of the silicon melt 21 also changes, the temperature distribution of the thermal field in the straight-drawing single crystal furnace also fluctuates greatly, but In the embodiment of the present invention, since the outer diameter of the seed crystal chuck 23 is equal to the diameter of the single crystal silicon to be formed subsequently, the large-sized seed crystal chuck 23 can suppress the upward radiation of the lower end of the straight pull single crystal furnace. Heat transfer (the thin line arrows in Figures 3a to 3c indicate the direction of heat radiation), and the lower bottom area of the hollow structure A is small, which is also to reduce the heat loss upward through the hollow structure A, which can reduce the single crystal well The heat loss in the early stage of silicon stabilizes the thermal field temperature distribution during the growth process of the silicon, reduces the power consumption in the early stage of single crystal silicon growth, and is beneficial to the subsequent growth of single crystal silicon.

接著,當所述單晶矽26的直徑增大至目標直徑時(約低目標直徑10毫米左右),透過提高石墨發熱體的加熱功率,增加矽熔體21的溫度,同時調整所述籽晶22向上提拉的速度、旋轉的速度以及石英坩堝的旋轉速度等,抑制所述單晶矽26的橫向生長,促進其縱向生長,使所述單晶矽26近乎等直徑生長,該階段稱作為轉肩階段(如圖3c所示)。因在前一階段(即放肩階段)為了促進單晶矽26的橫向生長,有將矽熔體21的溫度作降溫處理,而本發明實施例中的所述籽晶夾頭23的外徑與所需單晶矽的直徑相等,大大減少了直拉單晶爐下端的熱量散失,所以,在進入該轉肩階段時,直拉單晶爐的實際溫度相比現有技術中的實際溫度會高,即實際工藝中的轉肩階段的起始溫度提前升高了,可以減少單晶矽26前段品質不良部分的長度,有利於後續單晶矽的生長,提高整個單晶矽的利用率和降低成本。 Next, when the diameter of the single crystal silicon 26 is increased to a target diameter (about 10 mm lower than the target diameter), the temperature of the silicon melt 21 is increased by increasing the heating power of the graphite heating element, and the seed crystal is adjusted at the same time. The speed of the upward pull, the speed of rotation, and the speed of rotation of the quartz crucible suppress the lateral growth of the single crystal silicon 26 and promote its vertical growth, so that the single crystal silicon 26 grows to approximately the same diameter. This stage is called Turn shoulder stage (as shown in Figure 3c). In order to promote the lateral growth of the single crystal silicon 26 in the previous stage (that is, the shoulder-releasing stage), the temperature of the silicon melt 21 is reduced, and the outer diameter of the seed chuck 23 in the embodiment of the present invention is reduced. It has the same diameter as the required single crystal silicon, which greatly reduces the heat loss at the lower end of the straight-drawing single crystal furnace. Therefore, when entering the turning shoulder stage, the actual temperature of the straight-drawing single crystal furnace will be compared with the actual temperature in the prior art. High, that is, the starting temperature of the shoulder stage in the actual process is increased in advance, which can reduce the length of the bad part of the front part of the single crystal silicon 26, which is conducive to the growth of the subsequent single crystal silicon, and improves the utilization rate of the entire single crystal silicon lower the cost.

隨後便進入等徑生長過程,等徑過程是單晶矽生長的主要階段,長達數幾十小時甚至一百多小時的生長。最後,在所述石英坩堝20內矽熔體21不多時,再透過加快所述籽晶22向上的提升速度,同時適當增加加熱的功率,使單晶矽26的直徑變化至一個倒錐形,當錐尖足夠小時,它會脫離矽熔體21,這時單晶矽的生長過程結束。等單晶矽26冷卻到近乎室溫時,可將單晶矽26取下。 It then entered the equal-diameter growth process, which is the main stage of single crystal silicon growth, growing for tens of hours or even more than a hundred hours. Finally, when there is not much silicon melt 21 in the quartz crucible 20, the diameter of the single crystal silicon 26 is changed to an inverted cone by accelerating the upward lifting speed of the seed crystal 22 and appropriately increasing the heating power. When the cone tip is small enough, it will detach from the silicon melt 21, at which time the growth process of the single crystal silicon ends. When the single crystal silicon 26 cools to near room temperature, the single crystal silicon 26 can be removed.

本實施例中透過將所述籽晶夾頭中設置一中空結構A,將其應用於直拉單晶爐中,使得所述直拉單晶爐中的惰性保護氣體(如氬氣)可以透過所述中空結構A冷卻單晶矽頭部的的中間部分,與單晶矽的邊緣散熱速度保持一致,使整個單晶矽散熱均勻,克服單晶矽邊緣散熱快,中間 散熱慢的現象,形成良好的固液介面,提高單晶矽的晶體品質。 In this embodiment, a hollow structure A is provided in the seed chuck, and the hollow structure A is applied to a straight-drawing single crystal furnace, so that an inert protective gas (such as argon) in the straight-drawing single crystal furnace can pass through. The hollow structure A cools the middle part of the monocrystalline silicon head to keep the same heat dissipation speed as the edge of the monocrystalline silicon, so that the entire monocrystalline silicon can dissipate heat uniformly, and the heat dissipation of the edge of the monocrystalline silicon can be overcome quickly. The phenomenon of slow heat dissipation forms a good solid-liquid interface and improves the crystal quality of single crystal silicon.

進一步的,所述中空結構A在高度方向上的截面的形狀為倒梯形,即所述中空結構的上底面積大於下底面積,一方面,是有利於抑制直拉單晶爐下端向上輻射傳熱,減少透過所述中空結構A向上散失熱量,降低單晶矽長晶的功耗,穩定控制單晶矽長晶過程的熱場溫度分佈,有利於單晶矽的生長,提高單晶矽的晶體品質。另一方面,所述籽晶夾頭的中空結構A的上底面積要大,使得更多的保護氣體能夠透過所述中空結構,更好地實現冷卻單晶矽頭部的中間部分的目的,得到具有更好的晶體品質的單晶矽。 Further, the shape of the cross section of the hollow structure A in the height direction is an inverted trapezoid, that is, the upper bottom area of the hollow structure is larger than the lower bottom area. On the one hand, it is beneficial to suppress the upward radiation transmission of the lower end of the straight-drawing single crystal furnace. Heat, reduces the heat dissipation upward through the hollow structure A, reduces the power consumption of the single crystal silicon growth, and stably controls the thermal field temperature distribution of the single crystal silicon growth process, which is beneficial to the growth of the single crystal silicon and improves the Crystal quality. On the other hand, the upper and lower areas of the hollow structure A of the seed chuck should be large, so that more shielding gas can pass through the hollow structure and better achieve the purpose of cooling the middle portion of the single crystal silicon head. Single crystal silicon with better crystal quality was obtained.

更進一步的,所述籽晶夾頭的外徑與所述單晶矽的直徑相等,相比現有的籽晶夾頭,加大了所述籽晶夾頭的外徑,可以抑制直拉單晶爐下端向上輻射傳熱,降低單晶矽長晶的功耗,穩定控制單晶矽長晶過程的熱場溫度分佈,有利於單晶矽的生長,提高單晶矽的晶體品質。特別是,在單晶矽形成的初期,籽晶向上的提升速度變化大,使得直拉單晶爐中的熱場溫度分佈波動大,透過加大所述籽晶夾頭的外徑,可以大大減少熱量散失,降低單晶矽生長初期的功耗,使長晶在轉肩階段的溫度得到提前升高,減少單晶矽前段品質不良的部分,有利於後續單晶矽的生長,提高整個單晶矽的利用率和降低成本。 Furthermore, the outer diameter of the seed chuck is equal to the diameter of the single crystal silicon. Compared with the existing seed chuck, the outer diameter of the seed chuck is increased, and the straight pull single can be suppressed. The lower end of the furnace radiates heat upward, reduces the power consumption of the single crystal silicon growth, and stably controls the thermal field temperature distribution of the single crystal silicon growth, which is beneficial to the growth of the single crystal silicon and improves the crystal quality of the single crystal silicon. In particular, in the initial stage of the formation of the single crystal silicon, the upward lifting speed of the seed crystal changes greatly, so that the thermal field temperature distribution in the straight-pull single crystal furnace fluctuates greatly. By increasing the outer diameter of the seed crystal chuck, it can greatly increase Reduce heat dissipation, reduce power consumption in the early stage of growth of single crystal silicon, increase the temperature of the growth of the crystal in the shoulder stage in advance, reduce the bad quality of the front part of the single crystal silicon, which is conducive to the subsequent growth of the single crystal silicon and improve the entire single crystal silicon. Utilization and cost reduction of crystalline silicon.

實施例2: Example 2:

請參閱圖4,示出了本實施例中所述籽晶夾頭的立體結構圖。第二實施例的籽晶夾頭與第一實施例的籽晶夾頭的結構基本相同,兩者的形狀都為一圓柱體結構,外徑與所需晶棒的直徑相等,其中空結構B的 豎截面的形狀都為倒梯形,其區別在於:所述第二實施例中所述籽晶夾頭23的中空結構B的橫截面的形狀為六邊形。在其他實施例中,所述中空結構的橫截面的形狀還可以為其他多邊形,如三角形、四邊形、八邊形、十二邊形等,所述多邊形的邊數可以為3-12個。 Please refer to FIG. 4, which illustrates a three-dimensional structure view of the seed chuck according to the embodiment. The structure of the seed chuck of the second embodiment is basically the same as that of the seed chuck of the first embodiment. Both of them have a cylindrical structure, the outer diameter is equal to the diameter of the required crystal rod, and the hollow structure B of The shapes of the vertical sections are inverted trapezoids, and the difference is that the shape of the cross section of the hollow structure B of the seed chuck 23 in the second embodiment is a hexagon. In other embodiments, the shape of the cross section of the hollow structure may also be other polygons, such as a triangle, a quadrangle, an octagon, a dodecagon, etc., and the number of sides of the polygon may be 3-12.

因此,當本實施例中所述籽晶夾頭23應用於直拉單晶爐中時,同樣具有如實施例1中所述的有益效果。 Therefore, when the seed chuck 23 is used in a straight-drawing single crystal furnace in this embodiment, it also has the beneficial effects as described in the first embodiment.

實施例3: Example 3:

請參閱圖5,示出了本實施例中所述籽晶夾頭的立體結構圖。第三實施例的籽晶夾頭與第一實施例的籽晶夾頭的結構基本相同,兩者的中空結構A是相同的,所述中空結構A的豎截面的形狀都為倒梯形,所述中空結構A的橫截面的形狀都為圓形,其區別在於:所述第三實施例中所述籽晶夾頭23的形狀為一六棱柱體,所述六棱柱體的底部最長的對角線(即所述籽晶夾頭23的外徑)與所需晶棒的直徑相等。在其他實施例中,所述籽晶夾頭23的外形還可以為其他的棱柱體,所述棱柱體的邊數可以為3-12個。 Please refer to FIG. 5, which illustrates a three-dimensional structure diagram of the seed chuck according to the embodiment. The structure of the seed chuck of the third embodiment is basically the same as that of the seed chuck of the first embodiment, and the hollow structure A of the two is the same. The shape of the vertical cross section of the hollow structure A is an inverted trapezoid. The shapes of the cross-sections of the hollow structures A are all circular. The difference is that the shape of the seed chuck 23 in the third embodiment is a hexagonal prism, and the longest pair of the bottom of the hexagonal prism is opposite. The angle (that is, the outer diameter of the seed chuck 23) is equal to the diameter of the desired crystal rod. In other embodiments, the shape of the seed chuck 23 may be other prisms, and the number of sides of the prisms may be 3-12.

因此,當本實施例中所述籽晶夾頭23應用於直拉單晶爐中時,同樣能夠實現如實施例1中所述的有益效果。 Therefore, when the seed chuck 23 is used in a straight-drawing single crystal furnace in this embodiment, the beneficial effects as described in Embodiment 1 can also be achieved.

綜上,本發明透過將籽晶夾頭中設置一中空結構,所述中空結構貫通所述籽晶夾頭的上下兩端,將其應用於直拉單晶爐中,使得所述直拉單晶爐中的惰性保護氣體(如氬氣)可以透過所述中空結構冷卻晶棒頭部的中間部分,與晶棒的邊緣散熱速度保持一致,使整個晶棒散熱均勻,克服晶棒邊緣散熱快,中間散熱慢的現象,提高晶棒的晶體品質。 In summary, the present invention provides a hollow structure in the seed chuck, and the hollow structure penetrates the upper and lower ends of the seed chuck, and is applied to a straight-drawing single crystal furnace, so that the straight-drawing single The inert protective gas (such as argon) in the crystal furnace can cool the middle part of the head of the crystal rod through the hollow structure, keeping the same heat dissipation speed as the edge of the crystal rod, making the entire crystal rod uniformly dissipate heat, and overcoming the rapid cooling of the edge of the crystal rod. The phenomenon of slow heat dissipation in the middle improves the crystal quality of the ingot.

進一步的,所述中空結構在高度方向上的截面的形狀為倒梯形,即所述中空結構的上底面積大於下底面積,一方面,是有利於抑制直拉單晶爐下端向上輻射傳熱,減少透過所述中空結構向上散失熱量,降低長晶的功耗,穩定控制長晶過程的熱場溫度分佈,有利於晶棒的生長,提高晶棒的晶體品質。另一方面,所述籽晶夾頭的中空結構的上底面積要大,使得更多的保護氣體能夠透過所述中空結構,更好地實現冷卻晶棒頭部的中間部分的目的,得到具有更好的晶體品質的晶棒。 Further, the shape of the cross section of the hollow structure in the height direction is an inverted trapezoid, that is, the upper bottom area of the hollow structure is larger than the lower bottom area. On the one hand, it is beneficial to suppress the upward radiation heat transfer from the lower end of the straight-drawing single crystal furnace. , Reducing heat loss through the hollow structure, reducing the power consumption of the crystal growth, stably controlling the thermal field temperature distribution of the crystal growth process, facilitating the growth of the crystal rod, and improving the crystal quality of the crystal rod. On the other hand, the upper and lower areas of the hollow structure of the seed chuck should be large, so that more shielding gas can pass through the hollow structure, and the purpose of cooling the middle part of the head of the crystal rod is better achieved. Ingots with better crystal quality.

更進一步的,所述籽晶夾頭的外徑與一晶棒的直徑相等,相比現有的籽晶夾頭,加大了所述籽晶夾頭的外徑,可以抑制直拉單晶爐下端向上輻射傳熱,降低長晶的功耗,穩定控制長晶過程的熱場溫度分佈,有利於晶棒的生長,提高晶棒的晶體品質。特別是,在晶棒形成的初期,籽晶向上的提升速度變化大,使得直拉單晶爐中的熱場溫度分佈波動大,透過加大所述籽晶夾頭的外徑,可以大大減少熱量散失,降低晶棒生長初期的功耗,使長晶在轉肩階段的溫度得到提前升高,減少晶棒前段品質不良的部分,有利於後續晶棒的生長,提高整個晶棒的利用率和降低成本。 Furthermore, the outer diameter of the seed chuck is equal to the diameter of a crystal rod. Compared with the existing seed chuck, the outer diameter of the seed chuck is increased, and a straight-drawing single crystal furnace can be suppressed. The lower end radiates heat upward, reduces the power consumption of the crystal, and stably controls the thermal field temperature distribution of the crystal growth process, which is beneficial to the growth of the crystal rod and improves the crystal quality of the crystal rod. In particular, in the initial stage of the formation of the ingot, the upward lifting speed of the seed crystal changes greatly, which makes the temperature distribution of the thermal field in the Czochralski single crystal furnace fluctuate greatly. By increasing the outer diameter of the seed crystal chuck, it can be greatly reduced. The heat is lost, which reduces the power consumption at the beginning of the growth of the ingot, so that the temperature of the grown crystal is increased in advance during the shoulder turning stage, and the bad quality of the front part of the ingot is reduced, which is conducive to the growth of the subsequent ingot and the utilization of the entire ingot. And reduce costs.

顯然,在上述實施例中僅為本發明的較佳實施例而已,在上述所述籽晶夾頭的基礎上,還能夠得出多種類似的籽晶夾頭,以避免現有技術中出現晶棒散熱不均勻、晶棒前段品質不良的現象。因此,上述實施例並不用以限制本發明。本領域的技術人員可以對本發明進行各種改動和變型而不脫離本發明的精神和範圍。這樣,倘若本發明的這些修改和變型屬於本發明請求項及其等同技術的範圍之內,則本發明也意圖包含這些改動和變型在內。 Obviously, the above embodiments are only the preferred embodiments of the present invention. On the basis of the above-mentioned seed chucks, a variety of similar seed chucks can be obtained to avoid crystal rods in the prior art. Uneven heat dissipation and poor quality of the front part of the ingot. Therefore, the above embodiments are not intended to limit the present invention. Those skilled in the art can make various modifications and variations to the present invention without departing from the spirit and scope of the present invention. In this way, if these modifications and variations of the present invention fall within the scope of the claims of the present invention and their equivalent technologies, the present invention also intends to include these modifications and variations.

Claims (21)

一種籽晶夾頭,所述籽晶夾頭中設置一中空結構,所述中空結構貫通所述籽晶夾頭的上下兩端,所述籽晶夾頭還包括一第一連接結構,所述第一連接結構位於所述籽晶夾頭的底部或內側壁的下半部分。A seed chuck, in which a hollow structure is arranged, the hollow structure penetrates the upper and lower ends of the seed chuck, and the seed chuck further includes a first connection structure, the The first connection structure is located at the bottom or the lower half of the inner side wall of the seed chuck. 如請求項1所述的籽晶夾頭,其中所述中空結構在高度方向上的截面的形狀為四邊形。The seed chuck according to claim 1, wherein a shape of a cross section of the hollow structure in a height direction is a quadrangle. 如請求項2所述的籽晶夾頭,其中所述四邊形為倒梯形。The seed chuck according to claim 2, wherein the quadrangle is an inverted trapezoid. 如請求項1所述的籽晶夾頭,其中所述中空結構在寬度方向上的截面的形狀為圓形或多邊形。The seed chuck according to claim 1, wherein a shape of a cross section of the hollow structure in a width direction is a circle or a polygon. 如請求項4所述的籽晶夾頭,其中所述多邊形的邊數為3-12個。The seed chuck according to claim 4, wherein the number of sides of the polygon is 3-12. 如請求項1至5任意一項所述的籽晶夾頭,其中所述籽晶夾頭的外徑與一晶棒的直徑相等。The seed chuck according to any one of claims 1 to 5, wherein an outer diameter of the seed chuck is equal to a diameter of a crystal rod. 如請求項6所述的籽晶夾頭,其中所述外徑的大小為100mm-600mm。The seed chuck according to claim 6, wherein the size of the outer diameter is 100mm-600mm. 如請求項7所述的籽晶夾頭,其中所述籽晶夾頭的內徑的最大值為所述外徑的1/3至2/3。The seed chuck according to claim 7, wherein a maximum value of an inner diameter of the seed chuck is 1/3 to 2/3 of the outer diameter. 如請求項8所述的籽晶夾頭,其中所述籽晶夾頭的內徑的最小值為所述外徑的1/5至1/3。The seed chuck according to claim 8, wherein the minimum value of the inner diameter of the seed chuck is 1/5 to 1/3 of the outer diameter. 如請求項1所述的籽晶夾頭,其中所述籽晶夾頭的高度為100mm-600mm。The seed chuck according to claim 1, wherein a height of the seed chuck is 100 mm to 600 mm. 如請求項1所述的籽晶夾頭,其中所述籽晶夾頭的形狀為圓柱體或棱柱體。The seed chuck according to claim 1, wherein the shape of the seed chuck is a cylinder or a prism. 如請求項11所述的籽晶夾頭,其中所述棱柱體的邊數為3-12個。The seed chuck according to claim 11, wherein the number of sides of the prism is 3-12. 如請求項1所述的籽晶夾頭,其中所述中空結構的中心軸與所述籽晶夾頭的中心軸重合。The seed chuck according to claim 1, wherein a central axis of the hollow structure coincides with a central axis of the seed chuck. 如請求項1所述的籽晶夾頭,其中所述籽晶夾頭的材質為鉬或石墨。The seed chuck according to claim 1, wherein the material of the seed chuck is molybdenum or graphite. 如請求項1所述的籽晶夾頭,其中所述第一連接結構呈十字形。The seed chuck according to claim 1, wherein the first connection structure has a cross shape. 如請求項1所述的籽晶夾頭,其中所述籽晶夾頭還包括一第二連接結構,所述第二連接結構位於所述籽晶夾頭的頂部或內側壁的上半部分。The seed chuck according to claim 1, wherein the seed chuck further comprises a second connection structure, and the second connection structure is located on the top or the upper half of the inner side wall of the seed chuck. 如請求項16所述的籽晶夾頭,其中所述第二連接結構呈十字形。The seed chuck according to claim 16, wherein the second connection structure is cross-shaped. 一種採用如請求項1-17任意一項所述的籽晶夾頭的直拉單晶爐。A straight-drawing single crystal furnace using the seed chuck according to any one of claims 1-17. 如請求項18所述的直拉單晶爐,其中所述直拉單晶爐還包括一連動機構,所述籽晶夾頭的上端透過一連接杆與所述連動機構相連,所述籽晶夾頭的下端固定一籽晶,所述連動機構用於控制所述籽晶的運動。The straight-drawing single crystal furnace according to claim 18, wherein the straight-drawing single crystal furnace further includes a linkage mechanism, and an upper end of the seed crystal chuck is connected to the linkage mechanism through a connecting rod, and the seed crystal A seed crystal is fixed at the lower end of the chuck, and the linkage mechanism is used to control the movement of the seed crystal. 如請求項19所述的直拉單晶爐,其中透過一籽晶軸或者第一鋼線將所述籽晶固定在所述籽晶夾頭的下端。The straight-drawing single crystal furnace according to claim 19, wherein the seed crystal is fixed to a lower end of the seed crystal chuck through a seed crystal shaft or a first steel wire. 如請求項19所述的直拉單晶爐,其中透過一籽晶軸或者第二鋼線將所述籽晶夾頭的上端與所述連接杆相連。The straight-drawing single crystal furnace according to claim 19, wherein an upper end of the seed crystal chuck is connected to the connecting rod through a seed crystal shaft or a second steel wire.
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