TWI612850B - 極紫外線光源及用於增強來自該極紫外線光源的功率之方法 - Google Patents
極紫外線光源及用於增強來自該極紫外線光源的功率之方法 Download PDFInfo
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- TWI612850B TWI612850B TW103108128A TW103108128A TWI612850B TW I612850 B TWI612850 B TW I612850B TW 103108128 A TW103108128 A TW 103108128A TW 103108128 A TW103108128 A TW 103108128A TW I612850 B TWI612850 B TW I612850B
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- Taiwan
- Prior art keywords
- target
- light
- target material
- distribution
- droplets
- Prior art date
Links
- 238000000034 method Methods 0.000 title claims abstract description 35
- 230000002708 enhancing effect Effects 0.000 title claims abstract description 6
- 239000013077 target material Substances 0.000 claims abstract description 136
- 238000009826 distribution Methods 0.000 claims abstract description 103
- 230000003287 optical effect Effects 0.000 claims abstract description 70
- 230000005855 radiation Effects 0.000 claims description 44
- 239000000463 material Substances 0.000 claims description 15
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 claims description 13
- 229910052751 metal Inorganic materials 0.000 claims description 5
- 239000002184 metal Substances 0.000 claims description 5
- 230000003247 decreasing effect Effects 0.000 claims description 2
- 230000008859 change Effects 0.000 abstract description 4
- 230000001427 coherent effect Effects 0.000 abstract description 4
- 238000009499 grossing Methods 0.000 abstract description 2
- 230000036278 prepulse Effects 0.000 description 14
- 239000000203 mixture Substances 0.000 description 13
- 229910052718 tin Inorganic materials 0.000 description 11
- 238000001514 detection method Methods 0.000 description 10
- 239000007788 liquid Substances 0.000 description 8
- 239000002245 particle Substances 0.000 description 8
- 230000008878 coupling Effects 0.000 description 7
- 238000010168 coupling process Methods 0.000 description 7
- 238000005859 coupling reaction Methods 0.000 description 7
- 239000007787 solid Substances 0.000 description 7
- 238000010586 diagram Methods 0.000 description 5
- 229910000807 Ga alloy Inorganic materials 0.000 description 4
- 239000012535 impurity Substances 0.000 description 4
- 238000001459 lithography Methods 0.000 description 4
- 230000008569 process Effects 0.000 description 4
- WHXSMMKQMYFTQS-UHFFFAOYSA-N Lithium Chemical compound [Li] WHXSMMKQMYFTQS-UHFFFAOYSA-N 0.000 description 3
- -1 SnBr 4 Chemical class 0.000 description 3
- 230000003321 amplification Effects 0.000 description 3
- RHZWSUVWRRXEJF-UHFFFAOYSA-N indium tin Chemical compound [In].[Sn] RHZWSUVWRRXEJF-UHFFFAOYSA-N 0.000 description 3
- 229910052744 lithium Inorganic materials 0.000 description 3
- 238000003199 nucleic acid amplification method Methods 0.000 description 3
- 238000012634 optical imaging Methods 0.000 description 3
- 238000002310 reflectometry Methods 0.000 description 3
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 3
- 229910001868 water Inorganic materials 0.000 description 3
- 229910000846 In alloy Inorganic materials 0.000 description 2
- KJTLSVCANCCWHF-UHFFFAOYSA-N Ruthenium Chemical compound [Ru] KJTLSVCANCCWHF-UHFFFAOYSA-N 0.000 description 2
- 229910001128 Sn alloy Inorganic materials 0.000 description 2
- 229910045601 alloy Inorganic materials 0.000 description 2
- 239000000956 alloy Substances 0.000 description 2
- 238000013459 approach Methods 0.000 description 2
- 230000005672 electromagnetic field Effects 0.000 description 2
- 230000005284 excitation Effects 0.000 description 2
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 description 2
- 230000003993 interaction Effects 0.000 description 2
- 230000001678 irradiating effect Effects 0.000 description 2
- 230000010355 oscillation Effects 0.000 description 2
- 229910052707 ruthenium Inorganic materials 0.000 description 2
- 239000013076 target substance Substances 0.000 description 2
- 150000003606 tin compounds Chemical class 0.000 description 2
- 238000009825 accumulation Methods 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 238000005452 bending Methods 0.000 description 1
- 229910002091 carbon monoxide Inorganic materials 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 238000012937 correction Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 229910003460 diamond Inorganic materials 0.000 description 1
- 239000010432 diamond Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000005670 electromagnetic radiation Effects 0.000 description 1
- 239000004744 fabric Substances 0.000 description 1
- 239000000835 fiber Substances 0.000 description 1
- 238000010304 firing Methods 0.000 description 1
- 239000006260 foam Substances 0.000 description 1
- 229910052732 germanium Inorganic materials 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 239000003595 mist Substances 0.000 description 1
- 230000000877 morphologic effect Effects 0.000 description 1
- 239000013307 optical fiber Substances 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- 210000001747 pupil Anatomy 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 238000009420 retrofitting Methods 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
- 230000002269 spontaneous effect Effects 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 238000011144 upstream manufacturing Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05G—X-RAY TECHNIQUE
- H05G2/00—Apparatus or processes specially adapted for producing X-rays, not involving X-ray tubes, e.g. involving generation of a plasma
- H05G2/001—Production of X-ray radiation generated from plasma
- H05G2/008—Production of X-ray radiation generated from plasma involving an energy-carrying beam in the process of plasma generation
- H05G2/0082—Production of X-ray radiation generated from plasma involving an energy-carrying beam in the process of plasma generation the energy-carrying beam being a laser beam
- H05G2/0086—Optical arrangements for conveying the laser beam to the plasma generation location
Landscapes
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- X-Ray Techniques (AREA)
- Lasers (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US13/843,626 | 2013-03-15 | ||
| US13/843,626 US8680495B1 (en) | 2013-03-15 | 2013-03-15 | Extreme ultraviolet light source |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW201444416A TW201444416A (zh) | 2014-11-16 |
| TWI612850B true TWI612850B (zh) | 2018-01-21 |
Family
ID=50288821
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW103108128A TWI612850B (zh) | 2013-03-15 | 2014-03-10 | 極紫外線光源及用於增強來自該極紫外線光源的功率之方法 |
Country Status (6)
| Country | Link |
|---|---|
| US (2) | US8680495B1 (enExample) |
| JP (1) | JP2016512913A (enExample) |
| KR (1) | KR20150131187A (enExample) |
| CN (1) | CN105052246B (enExample) |
| TW (1) | TWI612850B (enExample) |
| WO (1) | WO2014149436A1 (enExample) |
Families Citing this family (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2015528994A (ja) * | 2012-08-01 | 2015-10-01 | エーエスエムエル ネザーランズ ビー.ブイ. | 放射を発生させるための方法及び装置 |
| WO2014120985A1 (en) * | 2013-01-30 | 2014-08-07 | Kla-Tencor Corporation | Euv light source using cryogenic droplet targets in mask inspection |
| US9000405B2 (en) | 2013-03-15 | 2015-04-07 | Asml Netherlands B.V. | Beam position control for an extreme ultraviolet light source |
| WO2015036025A1 (de) * | 2013-09-12 | 2015-03-19 | Trumpf Laser- Und Systemtechnik Gmbh | Strahlführungseinrichtung und euv-strahlungserzeugungsvorrichtung mit einer überlagerungseinrichtung |
| US9357625B2 (en) | 2014-07-07 | 2016-05-31 | Asml Netherlands B.V. | Extreme ultraviolet light source |
| TWI739755B (zh) * | 2015-08-12 | 2021-09-21 | 荷蘭商Asml荷蘭公司 | 極紫外線光源中之目標擴張率控制 |
| US9820368B2 (en) | 2015-08-12 | 2017-11-14 | Asml Netherlands B.V. | Target expansion rate control in an extreme ultraviolet light source |
| US20170311429A1 (en) * | 2016-04-25 | 2017-10-26 | Asml Netherlands B.V. | Reducing the effect of plasma on an object in an extreme ultraviolet light source |
| US10663866B2 (en) | 2016-09-20 | 2020-05-26 | Asml Netherlands B.V. | Wavelength-based optical filtering |
| US9904068B1 (en) | 2017-01-09 | 2018-02-27 | Asml Netherlands B.V. | Reducing an optical power of a reflected light beam |
| NL2023633A (en) * | 2018-09-25 | 2020-04-30 | Asml Netherlands Bv | Laser system for target metrology and alteration in an euv light source |
| US12444901B2 (en) | 2020-04-09 | 2025-10-14 | Asml Netherlands B.V. | Seed laser system for radiation source |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7361204B1 (en) * | 2003-11-05 | 2008-04-22 | Research Foundation Of The University Of Central Florida | Generator for flux specific bursts of nano-particles |
| TW200922386A (en) * | 2007-08-31 | 2009-05-16 | Cymer Inc | Gas management system for a laser-produced-plasma EUV light source |
| US20120243566A1 (en) * | 2010-02-19 | 2012-09-27 | Gigaphoton Inc | System and method for generating extreme ultraviolet light |
| US8304752B2 (en) * | 2009-04-10 | 2012-11-06 | Cymer, Inc. | EUV light producing system and method utilizing an alignment laser |
| TW201251517A (en) * | 2011-06-08 | 2012-12-16 | Cymer Inc | Systems and methods for buffer gas flow stabilization in a laser produced plasma light source |
| EP2538759A1 (en) * | 2010-02-19 | 2012-12-26 | Gigaphoton Inc. | Extreme-ultraviolet light source device and method for generating extreme-ultraviolet light |
| WO2013029906A1 (en) * | 2011-09-02 | 2013-03-07 | Asml Netherlands B.V. | Radiation source |
Family Cites Families (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6972421B2 (en) * | 2000-06-09 | 2005-12-06 | Cymer, Inc. | Extreme ultraviolet light source |
| US7491954B2 (en) * | 2006-10-13 | 2009-02-17 | Cymer, Inc. | Drive laser delivery systems for EUV light source |
| US7928416B2 (en) | 2006-12-22 | 2011-04-19 | Cymer, Inc. | Laser produced plasma EUV light source |
| JP5156192B2 (ja) * | 2006-01-24 | 2013-03-06 | ギガフォトン株式会社 | 極端紫外光源装置 |
| JP5358060B2 (ja) * | 2007-02-20 | 2013-12-04 | ギガフォトン株式会社 | 極端紫外光源装置 |
| JP2010103499A (ja) * | 2008-09-29 | 2010-05-06 | Komatsu Ltd | 極端紫外光源装置および極端紫外光生成方法 |
| JP5426317B2 (ja) * | 2008-10-23 | 2014-02-26 | ギガフォトン株式会社 | 極端紫外光光源装置 |
| JP5368261B2 (ja) * | 2008-11-06 | 2013-12-18 | ギガフォトン株式会社 | 極端紫外光源装置、極端紫外光源装置の制御方法 |
| JP5603135B2 (ja) * | 2009-05-21 | 2014-10-08 | ギガフォトン株式会社 | チャンバ装置におけるターゲット軌道を計測及び制御する装置及び方法 |
| US8173985B2 (en) * | 2009-12-15 | 2012-05-08 | Cymer, Inc. | Beam transport system for extreme ultraviolet light source |
| JP2013004258A (ja) * | 2011-06-15 | 2013-01-07 | Gigaphoton Inc | 極端紫外光生成装置及び極端紫外光の生成方法 |
| US9072153B2 (en) * | 2010-03-29 | 2015-06-30 | Gigaphoton Inc. | Extreme ultraviolet light generation system utilizing a pre-pulse to create a diffused dome shaped target |
| JP2012199512A (ja) * | 2011-03-10 | 2012-10-18 | Gigaphoton Inc | 極端紫外光生成装置及び極端紫外光生成方法 |
| US8604452B2 (en) * | 2011-03-17 | 2013-12-10 | Cymer, Llc | Drive laser delivery systems for EUV light source |
| JP2013140771A (ja) * | 2011-12-09 | 2013-07-18 | Gigaphoton Inc | ターゲット供給装置 |
-
2013
- 2013-03-15 US US13/843,626 patent/US8680495B1/en not_active Expired - Fee Related
-
2014
- 2014-02-25 JP JP2016500394A patent/JP2016512913A/ja active Pending
- 2014-02-25 WO PCT/US2014/018422 patent/WO2014149436A1/en not_active Ceased
- 2014-02-25 KR KR1020157028568A patent/KR20150131187A/ko not_active Withdrawn
- 2014-02-25 CN CN201480014562.XA patent/CN105052246B/zh not_active Expired - Fee Related
- 2014-03-06 US US14/199,261 patent/US8866110B2/en not_active Expired - Fee Related
- 2014-03-10 TW TW103108128A patent/TWI612850B/zh not_active IP Right Cessation
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7361204B1 (en) * | 2003-11-05 | 2008-04-22 | Research Foundation Of The University Of Central Florida | Generator for flux specific bursts of nano-particles |
| TW200922386A (en) * | 2007-08-31 | 2009-05-16 | Cymer Inc | Gas management system for a laser-produced-plasma EUV light source |
| US8304752B2 (en) * | 2009-04-10 | 2012-11-06 | Cymer, Inc. | EUV light producing system and method utilizing an alignment laser |
| US20120243566A1 (en) * | 2010-02-19 | 2012-09-27 | Gigaphoton Inc | System and method for generating extreme ultraviolet light |
| EP2538759A1 (en) * | 2010-02-19 | 2012-12-26 | Gigaphoton Inc. | Extreme-ultraviolet light source device and method for generating extreme-ultraviolet light |
| TW201251517A (en) * | 2011-06-08 | 2012-12-16 | Cymer Inc | Systems and methods for buffer gas flow stabilization in a laser produced plasma light source |
| WO2013029906A1 (en) * | 2011-09-02 | 2013-03-07 | Asml Netherlands B.V. | Radiation source |
Also Published As
| Publication number | Publication date |
|---|---|
| CN105052246A (zh) | 2015-11-11 |
| US20140264092A1 (en) | 2014-09-18 |
| JP2016512913A (ja) | 2016-05-09 |
| TW201444416A (zh) | 2014-11-16 |
| CN105052246B (zh) | 2017-06-13 |
| WO2014149436A1 (en) | 2014-09-25 |
| US8866110B2 (en) | 2014-10-21 |
| KR20150131187A (ko) | 2015-11-24 |
| US8680495B1 (en) | 2014-03-25 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MM4A | Annulment or lapse of patent due to non-payment of fees |