TWI610061B - 三維測量裝置 - Google Patents

三維測量裝置 Download PDF

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Publication number
TWI610061B
TWI610061B TW105116968A TW105116968A TWI610061B TW I610061 B TWI610061 B TW I610061B TW 105116968 A TW105116968 A TW 105116968A TW 105116968 A TW105116968 A TW 105116968A TW I610061 B TWI610061 B TW I610061B
Authority
TW
Taiwan
Prior art keywords
light
grid
stripe pattern
image data
light intensity
Prior art date
Application number
TW105116968A
Other languages
English (en)
Chinese (zh)
Other versions
TW201719112A (zh
Inventor
Nobuyuki Umemura
Tsuyoshi Ohyama
Norihiko Sakaida
Manabu Okuda
Original Assignee
Ckd Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ckd Corp filed Critical Ckd Corp
Publication of TW201719112A publication Critical patent/TW201719112A/zh
Application granted granted Critical
Publication of TWI610061B publication Critical patent/TWI610061B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2518—Projection by scanning of the object
    • G01B11/2527—Projection by scanning of the object with phase change by in-plane movement of the patern

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
TW105116968A 2015-11-27 2016-05-31 三維測量裝置 TWI610061B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2015231661A JP6062523B1 (ja) 2015-11-27 2015-11-27 三次元計測装置

Publications (2)

Publication Number Publication Date
TW201719112A TW201719112A (zh) 2017-06-01
TWI610061B true TWI610061B (zh) 2018-01-01

Family

ID=57800032

Family Applications (1)

Application Number Title Priority Date Filing Date
TW105116968A TWI610061B (zh) 2015-11-27 2016-05-31 三維測量裝置

Country Status (6)

Country Link
JP (1) JP6062523B1 (ja)
CN (1) CN107923736B (ja)
DE (1) DE112016005425T5 (ja)
MX (1) MX366402B (ja)
TW (1) TWI610061B (ja)
WO (1) WO2017090268A1 (ja)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7371443B2 (ja) * 2019-10-28 2023-10-31 株式会社デンソーウェーブ 三次元計測装置

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW200712435A (en) * 2005-09-21 2007-04-01 Omron Tateisi Electronics Co Pattern light irradiation device, three-dimensional shape measuring device, and method of pattern light irradiation
JP2007113958A (ja) * 2005-10-18 2007-05-10 Yamatake Corp ３次元計測装置、３次元計測方法、及び３次元計測プログラム
CN101246228A (zh) * 2008-02-01 2008-08-20 黑龙江科技学院 一种三维测量系统中相移光栅

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8878929B2 (en) * 2009-05-27 2014-11-04 Koh Young Technology Inc. Three dimensional shape measurement apparatus and method
JP2013124938A (ja) * 2011-12-15 2013-06-24 Ckd Corp 三次元計測装置
JP5643241B2 (ja) * 2012-02-14 2014-12-17 Ckd株式会社 三次元計測装置
JP6346427B2 (ja) * 2013-10-30 2018-06-20 キヤノン株式会社 画像処理装置、画像処理方法

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW200712435A (en) * 2005-09-21 2007-04-01 Omron Tateisi Electronics Co Pattern light irradiation device, three-dimensional shape measuring device, and method of pattern light irradiation
JP2007113958A (ja) * 2005-10-18 2007-05-10 Yamatake Corp ３次元計測装置、３次元計測方法、及び３次元計測プログラム
CN101246228A (zh) * 2008-02-01 2008-08-20 黑龙江科技学院 一种三维测量系统中相移光栅

Also Published As

Publication number Publication date
CN107923736B (zh) 2020-01-24
DE112016005425T5 (de) 2018-08-16
JP6062523B1 (ja) 2017-01-18
TW201719112A (zh) 2017-06-01
JP2017096866A (ja) 2017-06-01
CN107923736A (zh) 2018-04-17
MX366402B (es) 2019-07-08
WO2017090268A1 (ja) 2017-06-01
MX2018001490A (es) 2018-08-01

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