TWI609917B - Resin composition - Google Patents

Resin composition Download PDF

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TWI609917B
TWI609917B TW101117404A TW101117404A TWI609917B TW I609917 B TWI609917 B TW I609917B TW 101117404 A TW101117404 A TW 101117404A TW 101117404 A TW101117404 A TW 101117404A TW I609917 B TWI609917 B TW I609917B
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resin
resin composition
epoxy resin
mass
insulating layer
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TW201311810A (en
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Shigeo Nakamura
中村茂雄
Kazuhiko Tsurui
鶴井一彥
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Ajinomoto Co., Inc.
味之素股份有限公司
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    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08LCOMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L63/00Compositions of epoxy resins; Compositions of derivatives of epoxy resins
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K3/00Use of inorganic substances as compounding ingredients
    • C08K3/01Use of inorganic substances as compounding ingredients characterized by their specific function
    • C08K3/013Fillers, pigments or reinforcing additives
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K5/00Use of organic ingredients
    • C08K5/54Silicon-containing compounds
    • C08K5/541Silicon-containing compounds containing oxygen
    • C08K5/5415Silicon-containing compounds containing oxygen containing at least one Si—O bond
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J7/00Adhesives in the form of films or foils
    • C09J7/20Adhesives in the form of films or foils characterised by their carriers
    • C09J7/22Plastics; Metallised plastics
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J7/00Adhesives in the form of films or foils
    • C09J7/30Adhesives in the form of films or foils characterised by the adhesive composition
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J7/00Adhesives in the form of films or foils
    • C09J7/30Adhesives in the form of films or foils characterised by the adhesive composition
    • C09J7/35Heat-activated
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J7/00Adhesives in the form of films or foils
    • C09J7/40Adhesives in the form of films or foils characterised by release liners
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J2301/00Additional features of adhesives in the form of films or foils
    • C09J2301/30Additional features of adhesives in the form of films or foils characterized by the chemical, physicochemical or physical properties of the adhesive or the carrier
    • C09J2301/304Additional features of adhesives in the form of films or foils characterized by the chemical, physicochemical or physical properties of the adhesive or the carrier the adhesive being heat-activatable, i.e. not tacky at temperatures inferior to 30°C
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J2301/00Additional features of adhesives in the form of films or foils
    • C09J2301/30Additional features of adhesives in the form of films or foils characterized by the chemical, physicochemical or physical properties of the adhesive or the carrier
    • C09J2301/312Additional features of adhesives in the form of films or foils characterized by the chemical, physicochemical or physical properties of the adhesive or the carrier parameters being the characterizing feature

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  • Organic Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Medicinal Chemistry (AREA)
  • Polymers & Plastics (AREA)
  • Compositions Of Macromolecular Compounds (AREA)
  • Epoxy Resins (AREA)

Abstract

本發明提供一種樹脂組成物,其維持了玻璃轉移溫度、熱膨脹率,同時於濕式粗化步驟中之絕緣層表面之算術平均粗糙度、均方平方根粗糙度小,而可於其上形成具有充分剝離強度之鍍敷導體層。 The present invention provides a resin composition which maintains glass transition temperature and thermal expansion rate, and has a small arithmetic mean roughness and a square root mean square roughness on the surface of an insulating layer in a wet roughening step, and can be formed thereon. Plating conductor layer with sufficient peel strength.

藉由含有環氧樹脂、特定之烷氧矽烷改質樹脂、無機填充材之樹脂組成物而完成本發明。 The present invention is completed by a resin composition containing an epoxy resin, a specific alkoxysilane modified resin, and an inorganic filler.

Description

樹脂組成物 Resin composition

本發明係關於一種樹脂組成物。另外本發明係關於含有該樹脂組成物之接著薄膜、預浸片、多層印刷配線板、半導體裝置。 The present invention relates to a resin composition. The present invention also relates to an adhesive film, a prepreg, a multilayer printed wiring board, and a semiconductor device containing the resin composition.

近年來,隨著電子設備之小型化、高性能化進展,多層印刷配線板中要求增層板層之多層化、配線之微細化及高密度化。 In recent years, with the progress of miniaturization and high performance of electronic equipment, multilayer printed wiring boards have been required to increase the number of layers, finer wiring and higher density.

相對於此而有各式各樣的組合。例如,專利文獻1中揭示含有烷氧基矽烷改質樹脂之樹脂組成物。記載有由該等組成物形成之絕緣材料具備耐熱性、低熱膨脹性、難燃性。然而,其性能並非必定令人滿意者。 In contrast, there are various combinations. For example, Patent Document 1 discloses a resin composition containing an alkoxysilane modified resin. It is described that the insulating material formed of these compositions has heat resistance, low thermal expansion, and flame resistance. However, its performance is not necessarily satisfactory.

[先前技術文獻] [Prior technical literature] [專利文獻] [Patent Literature]

[專利文獻1]特開2001-261776號公報 [Patent Document 1] JP 2001-261776

本發明欲解決之課題係提供一種維持了玻璃轉移溫度、熱膨脹率,同時濕式粗化步驟中絕緣層表面之算術平均粗糙度、均方平方根粗糙度小,而可於其上形成具有充分剝離強度之鍍敷導體層之樹脂組成物。 The problem to be solved by the present invention is to provide a method that maintains the glass transition temperature and the thermal expansion rate, and at the same time has a small arithmetic mean roughness and a square root roughness of the surface of the insulating layer in the wet roughening step, and can be formed thereon with sufficient peeling. A resin composition having a strong plating conductor layer.

本發明人等為解決上述課題而積極檢討之結果,發現特徵為含有環氧樹脂、特定之烷氧基矽烷改質樹脂及無機填充材之樹脂組成物,而完成本發明。 As a result of an intensive review by the present inventors in order to solve the above-mentioned problems, the present inventors have found a resin composition characterized by containing an epoxy resin, a specific alkoxysilane modified resin, and an inorganic filler, and completed the present invention.

亦即,本發明為包含以下內容者。 That is, the present invention includes the following.

[1]一種樹脂組成物,其特徵為含有(A)環氧樹脂、(B)三官能性烷氧基矽烷改質樹脂及(C)無機填充材。 [1] A resin composition comprising (A) an epoxy resin, (B) a trifunctional alkoxysilane modified resin, and (C) an inorganic filler.

[2]如上述[1]項所記載之樹脂組成物,其中(B)三官能性烷氧基矽烷改質樹脂之至少一部分與(C)無機填充材反應形成反應物。 [2] The resin composition according to the above [1], wherein (B) at least a part of the trifunctional alkoxysilane modified resin is reacted with (C) an inorganic filler to form a reactant.

[3]如上述[2]項所記載之樹脂組成物,其係使(B)三官能性烷氧基矽烷改質樹脂與(C)無機填充材預先反應後,添加於(A)環氧樹脂中。 [3] The resin composition according to the above item [2], which is obtained by reacting (B) a trifunctional alkoxysilane modified resin with (C) an inorganic filler in advance, and then adding it to (A) an epoxy resin. In resin.

[4]如上述[1]~[3]項中任一項之樹脂組成物,其中以(C)無機填充材為100質量%時,(B)三官能性烷氧基矽烷改質樹脂為0.1~5質量%。 [4] The resin composition according to any one of the above [1] to [3], in which (C) the inorganic filler is 100% by mass, (B) the trifunctional alkoxysilane modified resin is 0.1 to 5 mass%.

[5]如上述[1]~[4]項中任一項所記載之樹脂組成物,其中(B)三官能性烷氧基矽烷改質樹脂為含有羥基之環氧樹脂中之羥基經矽烷改質之三官能性烷氧基矽烷改質環氧樹脂及/或酚樹脂之酚性羥基經矽烷改質而成之三官能性烷氧基矽烷改質酚樹脂。 [5] The resin composition according to any one of the above [1] to [4], wherein (B) the trifunctional alkoxysilane modified resin is a hydroxyl group in an epoxy resin containing a hydroxyl group via a silane Modified trifunctional alkoxysilane modified epoxy resin and / or phenolic phenolic hydroxyl group of phenol resin modified by silane modified trifunctional alkoxysilane modified phenol resin.

[6]如上述[1]~[5]項中任一項所記載之樹脂組成物,其中(B)三官能性烷氧基矽烷改質樹脂為下述式(1):

Figure TWI609917BD00001
式(1)中,R3為碳數1~10之直鏈或分支鏈之烷基,或烯丙基,R4、R5各獨立為氫、碳數1~10之直鏈或分支鏈烷基,式(1)中,m表示1~10,式(1)中,X係選自環氧樹脂或酚樹脂。 [6] The resin composition according to any one of the above [1] to [5], wherein the (B) trifunctional alkoxysilane modified resin is the following formula (1):
Figure TWI609917BD00001
In formula (1), R 3 is a straight or branched alkyl group having 1 to 10 carbon atoms, or an allyl group, and R 4 and R 5 are each independently hydrogen and a straight or branched chain having 1 to 10 carbon atoms. Alkyl group, in the formula (1), m represents 1 to 10, and in the formula (1), X is selected from an epoxy resin or a phenol resin.

[7]如上述[1]~[6]項中任一項所記載之樹脂組成物,其中(B)三官能性烷氧基矽烷改質樹脂為下述式(1):

Figure TWI609917BD00002
式(1)中,R3為碳數1~10之直鏈或分支鏈之烷基,或烯丙基,R4、R5各獨立為氫、碳數1~10之直鏈或分支鏈烷基,式(1)中,m表示1~10,式(1)中,X係選自雙酚A型環氧樹脂、雙酚F型環氧樹脂、雙酚AF型環氧樹脂、雙酚S型環氧樹脂、酚醛清漆酚樹脂。 [7] The resin composition according to any one of the above [1] to [6], wherein (B) the trifunctional alkoxysilane modified resin is the following formula (1):
Figure TWI609917BD00002
In formula (1), R 3 is a straight or branched alkyl group having 1 to 10 carbon atoms, or an allyl group, and R 4 and R 5 are each independently hydrogen and a straight or branched chain having 1 to 10 carbon atoms. Alkyl, in formula (1), m represents 1 to 10, and in formula (1), X is selected from bisphenol A epoxy resin, bisphenol F epoxy resin, bisphenol AF epoxy resin, bis Phenolic S-type epoxy resin, novolac phenol resin.

[8]如上述[1]~[7]項中任一項所記載之樹脂組成物,其中使樹脂組成物硬化形成絕緣層,且使其絕緣層表面經 粗糙化處理,並經鍍敷獲得之導體層與絕緣層之剝離強度為0.43 kgf/cm~1.0 kgf/cm,使樹脂組成物硬化形成絕緣層,且使其絕緣層表面經粗糙化處理後之算術平均粗糙度為10nm~300nm,均方平方根粗糙度為10nm~520nm。 [8] The resin composition according to any one of the above [1] to [7], wherein the resin composition is hardened to form an insulating layer, and the surface of the insulating layer is subjected to The peeling strength of the conductor layer and the insulating layer obtained by the roughening treatment and the plating is 0.43 kgf / cm ~ 1.0 kgf / cm. The resin composition is hardened to form an insulating layer, and the surface of the insulating layer is subjected to roughening treatment. The arithmetic average roughness is 10nm ~ 300nm, and the square root roughness is 10nm ~ 520nm.

[9]一種接著薄膜,其係使如上述[1]~[8]項中任一項所記載之樹脂組成物於支撐體上層形成而成。 [9] An adhesive film formed by forming the resin composition according to any one of [1] to [8] above on a support.

[10]一種預浸片,其係將如上述[1]~[8]項中任一項所記載之樹脂組成物含浸於薄片狀補強基材中而成。 [10] A prepreg obtained by impregnating the resinous composition as described in any one of the above [1] to [8] in a sheet-like reinforcing substrate.

[11]一種多層印刷配線板,其係由如上述[1]~[8]項中任一項所記載之樹脂組成物之硬化物形成絕緣層而成。 [11] A multilayer printed wiring board formed by forming an insulating layer from a cured product of the resin composition according to any one of the items [1] to [8].

[12]一種半導體裝置,其特徵係使用如上述[11]項所記載之多層印刷配線板。 [12] A semiconductor device characterized by using the multilayer printed wiring board according to the item [11].

藉由使用含有環氧樹脂、特定之烷氧基矽烷改質樹脂及無機填充材之樹脂組成物,而可提供維持了玻璃轉移溫度、熱膨脹率,同時濕式粗化步驟中絕緣層表面之算術平均粗糙度、均方平方根粗糙度小,而可於其上形成具有充分剝離強度之鍍敷導體層之樹脂組成物。 By using a resin composition containing an epoxy resin, a specific alkoxysilane modified resin, and an inorganic filler, the arithmetic of the surface of the insulating layer in the wet roughening step can be provided while maintaining the glass transition temperature and thermal expansion rate. The average roughness and the square root roughness are small, and a resin composition having a plated conductor layer having sufficient peeling strength can be formed thereon.

本發明係一種樹脂組成物,其特徵為含有(A)環氧樹脂、(B)三官能性烷氧基矽烷改質樹脂及(C)無機填充材。本發明中使用之所謂「三官能性烷氧基矽烷」意指「至少 一個矽原子上三取代有烷基及含烷氧基之氧基之矽烷化合物」。 The present invention is a resin composition characterized by containing (A) an epoxy resin, (B) a trifunctional alkoxysilane modified resin, and (C) an inorganic filler. The so-called "trifunctional alkoxysilane" used in the present invention means "at least Silane compounds that are tri-substituted with alkyl and alkoxy-containing oxy groups on one silicon atom. "

〈(A)環氧樹脂〉 〈(A) Epoxy resin〉

本發明中使用之環氧樹脂並無特別限制,列舉為雙酚A型環氧樹脂、雙酚F型環氧樹脂、雙酚S型環氧樹脂、雙酚AF型環氧樹脂、酚酚醛氫漆型環氧樹脂、第三丁基兒茶酚型環氧樹脂、萘酚型環氧樹脂、萘型環氧樹脂、萘醚型環氧樹脂、縮水甘油基胺型環氧樹脂、縮水甘油酯型環氧樹脂、甲酚酚醛氫漆型環氧樹脂、聯苯型環氧樹脂、線狀脂肪族環氧樹脂、具有丁二烯構造之環氧樹脂、脂環式環氧樹脂、雜環式環氧樹脂、含有螺環之環氧樹脂、環己烷二甲醇型環氧樹脂、三羥甲基型環氧樹脂、鹵化環氧樹脂等。該等可以一種或兩種以上組合使用。 The epoxy resin used in the present invention is not particularly limited, and examples thereof include bisphenol A type epoxy resin, bisphenol F type epoxy resin, bisphenol S type epoxy resin, bisphenol AF type epoxy resin, and phenol novolac. Lacquer type epoxy resin, third butyl catechol type epoxy resin, naphthol type epoxy resin, naphthalene type epoxy resin, naphthalene ether type epoxy resin, glycidylamine type epoxy resin, glycidyl ester Epoxy resin, cresol novolac epoxy resin, biphenyl epoxy resin, linear aliphatic epoxy resin, epoxy resin with butadiene structure, alicyclic epoxy resin, heterocyclic Epoxy resin, epoxy resin containing a spiro ring, cyclohexanedimethanol type epoxy resin, trimethylol type epoxy resin, halogenated epoxy resin, etc. These may be used singly or in combination of two or more.

該等中,就提高耐熱性、提高絕緣信賴性、提高與金屬箔之密著性之觀點而言,較好為雙酚A型環氧樹脂、萘酚型環氧樹脂、萘型環氧樹脂、聯苯型環氧樹脂、萘醚型環氧樹脂、具有丁二烯構造之環氧樹脂。具體而言,列舉為例如雙酚A型環氧樹脂(三菱化學(股)製造之「Epicoat 828EL」、「YL980」)、雙酚F型環氧樹脂(三菱化學(股)製造之「jER806H」、「YL983U」)、萘型二官能環氧樹脂(DIC(股)製造之「HP4032」、「HP4032D」、「HP4032SS」、「EXA4032SS」)、萘型四官能環氧樹脂(DIC(股)製造之「HP4700」、「HP4710」)、萘酚型環氧樹脂(東都化成( 股)製造之「ESN-475V」)、具有丁二烯構造之環氧樹脂(Daicel化學工業(股)製造之「PB-3600」)、具有聯苯構造之環氧樹脂(日本化藥(股)製造之「NC3000H」、「NC3000L」、「NC3100」,三菱化學(股)製造之「YX4000」、「YX4000H」、「YX4000HK」、「YL6121」)、蒽型環氧樹脂(三菱化學(股)製造之「YX8800」)、萘醚型環氧樹脂(DIC(股)製造之「EXA-7310」、「EXA-7311」、「EXA-7311L」、「EXA7311-G3」)等。 Among these, bisphenol A type epoxy resin, naphthol type epoxy resin, and naphthalene type epoxy resin are preferred from the viewpoints of improving heat resistance, improving insulation reliability, and improving adhesion to metal foil. 2, biphenyl epoxy resin, naphthalene ether epoxy resin, epoxy resin with butadiene structure. Specifically, for example, bisphenol A type epoxy resin ("Epicoat 828EL" and "YL980" manufactured by Mitsubishi Chemical Corporation), and bisphenol F type epoxy resin ("jER806H" manufactured by Mitsubishi Chemical Corporation) , "YL983U"), naphthalene-type bifunctional epoxy resin ("HP4032", "HP4032D", "HP4032SS", "EXA4032SS") manufactured by DIC (share) "HP4700", "HP4710"), Naphthol-type epoxy resin (Toto Kasei ( `` ESN-475V ''), epoxy resin with butadiene structure (`` PB-3600 '' by Daicel Chemical Industry Co., Ltd.), epoxy resin with biphenyl structure (Nippon Kayaku Co., Ltd. ) "NC3000H", "NC3000L", "NC3100", "YX4000", "YX4000H", "YX4000HK", "YL6121") manufactured by Mitsubishi Chemical Co., Ltd., anthracene epoxy resin (Mitsubishi Chemical Co., Ltd. "YX8800"), naphthalene ether type epoxy resin ("EXA-7310", "EXA-7311", "EXA-7311L", "EXA7311-G3") manufactured by DIC Corporation.

環氧樹脂亦可併用兩種以上,但較好含有一分子中具有兩個以上環氧基之環氧樹脂。且,更好為含有一分子中具有兩個以上之環氧基,且在溫度20℃下為液狀之芳香族系環氧樹脂的環氧樹脂、及一分子中具有三個以上之環氧基,且在溫度20℃下為固體狀之芳香族系環氧樹脂之樣態。又,本發明中所稱之芳香族系環氧樹脂意指其分子內具有芳香環構造之環氧樹脂。併用液狀環氧樹脂與固體狀環氧樹脂作為環氧樹脂時,就以接著薄膜形態使用樹脂組成物時具有適度可撓性方面,或樹脂組成物之硬化物具有適度之斷裂強度方面而言,其調配比例(液狀環氧樹脂:固體狀環氧樹脂)以質量比計,較好為1:0.1~2之範圍,更好為1:0.3~1.8之範圍,又更好為1:0.6~1.5之範圍。 The epoxy resin may be used in combination of two or more kinds, but it is preferable to contain an epoxy resin having two or more epoxy groups in one molecule. Furthermore, an epoxy resin containing an aromatic epoxy resin having two or more epoxy groups in one molecule and being liquid at a temperature of 20 ° C., and an epoxy resin having three or more molecules in one molecule are more preferable. It is a solid aromatic epoxy resin at a temperature of 20 ° C. The term "aromatic epoxy resin" as used in the present invention means an epoxy resin having an aromatic ring structure in its molecule. When a liquid epoxy resin and a solid epoxy resin are used as the epoxy resin, the resin composition has a moderate flexibility when the resin composition is used in the form of a continuous film, or a hardened product of the resin composition has a moderate fracture strength. , Its blending ratio (liquid epoxy resin: solid epoxy resin) is preferably in the range of 1: 0.1 ~ 2, more preferably in the range of 1: 0.3 ~ 1.8, and more preferably 1: The range is 0.6 ~ 1.5.

本發明之樹脂組成物中,就提高樹脂組成物之硬化物之機械強度或耐水性之觀點而言,以樹脂組成物中之不揮發成分作為100質量%時,環氧樹脂之含量較好為3~40質量%,更好為5~35質量%,又更好為10~30質量%。 In the resin composition of the present invention, from the viewpoint of improving the mechanical strength or water resistance of the hardened material of the resin composition, when the nonvolatile content in the resin composition is 100% by mass, the content of the epoxy resin is preferably 3 to 40% by mass, more preferably 5 to 35% by mass, and even more preferably 10 to 30% by mass.

〈(B)三官能性烷氧基矽烷改質樹脂〉 <(B) Trifunctional alkoxysilane modified resin>

本發明中使用之(B)三官能性烷氧基矽烷改質樹脂中,所謂「三官能性烷氧基矽烷」只要是「至少一個矽原子上三取代有烷基、及含烷氧基之氧基之矽烷化合物」即無特別限制。具體而言,以R1-Si-(OR2)3表示。此處之R1為低級烷基(較好為碳數1~10之直鏈或分支鏈之烷基,更好為碳數1~8之直鏈或分支鏈之烷基,又更好為碳數1~6之直鏈或分支鏈之烷基,又更好為碳數1~4之直鏈或分支鏈之烷基,又再更好為甲基、乙基、丙基,最好為甲基),或者烯丙基。R2為氫、低級烷基(較好為碳數1~10之直鏈或分支鏈之烷基,更好為碳數1~8之直鏈或分支鏈之烷基,又更好為碳數1~6之直鏈或分支鏈之烷基,又更好為碳數1~4之直鏈或分支鏈之烷基,又再更好為甲基、乙基、丙基,最好為甲基)、烯丙基,或矽烷基。據此,(B)三官能性烷氧基矽烷改質樹脂並無特別限制,但較好為使於至少一個矽原子上三取代有烷基、及含烷氧基之氧基之矽烷化合物予以改質而成之樹脂。因此,更好為含有羥基之環氧樹脂中之羥基經矽烷改質之三官能性烷氧基矽烷改質環氧樹脂,或酚樹脂之酚性羥基經矽烷改質之三官能性烷氧基矽烷改質之酚樹脂。 In the (B) trifunctional alkoxysilane modified resin used in the present invention, as long as the "trifunctional alkoxysilane" is "a trisubstituted alkyl group on at least one silicon atom, and an alkoxy group-containing The "oxysilane compound" is not particularly limited. Specifically, it is represented by R 1 -Si- (OR 2 ) 3 . Here R 1 is a lower alkyl group (preferably a straight or branched alkyl group having 1 to 10 carbon atoms, more preferably a straight or branched alkyl group having 1 to 8 carbon atoms, and more preferably A straight or branched alkyl group having 1 to 6 carbon atoms, more preferably a straight or branched alkyl group having 1 to 4 carbon atoms, and even more preferably a methyl, ethyl, or propyl group, most preferably Is methyl), or allyl. R 2 is hydrogen, lower alkyl (preferably a straight or branched alkyl group having 1 to 10 carbons, more preferably a straight or branched alkyl group having 1 to 8 carbons, and more preferably carbon A straight or branched alkyl group of 1 to 6 is more preferably a straight or branched alkyl group of 1 to 4 carbons, and even more preferably a methyl, ethyl, or propyl group, and most preferably Methyl), allyl, or silane. According to this, the (B) trifunctional alkoxysilane modified resin is not particularly limited, but it is preferred that the silane compound is substituted with an alkyl group and an alkoxy group-containing oxy group on at least one silicon atom. Modified resin. Therefore, a trifunctional alkoxysilane modified epoxy resin in which the hydroxyl group of the epoxy resin containing the hydroxyl group is modified by silane, or a trifunctional alkoxy group modified by the phenolic hydroxyl group of the phenol resin in the silane Silane modified phenol resin.

前述含有羥基之環氧樹脂可使用各種雙酚型環氧樹脂。雙酚型環氧樹脂為雙酚類與表氯醇或β-甲基表氯醇等之鹵環氧化物之反應而獲得者。至於雙酚類列舉為酚或2,6- 二鹵酚與甲醛、乙醛、丙酮、苯乙酮、環己酮、二苯甲酮等醛類或酮類之反應物,以及利用二羥基苯基硫醚之過氧進行氧化,藉由氫醌彼此之醚化反應等而獲得者,或使該等氫化獲得之氫化雙酚。另外,前述雙酚類亦可為使4,4’-二羥基聯苯、三羥基二苯基二甲基乙烷、長鏈型雙酚類、間苯二甲酚、水楊醇(saligenin)等經部分取代而成者。該等雙酚型環氧樹脂中,就提高相溶性之觀點而言,較好為雙酚A型環氧樹脂。 As the epoxy resin containing a hydroxyl group, various bisphenol-type epoxy resins can be used. The bisphenol type epoxy resin is obtained by the reaction of bisphenols with a halogen epoxide such as epichlorohydrin or β-methylepichlorohydrin. As for the bisphenols listed as phenol or 2,6- Dihalophenol reacts with formaldehyde, acetaldehyde, acetone, acetophenone, cyclohexanone, benzophenone and other aldehydes or ketones, as well as oxidation using dioxyphenyl sulfide peroxygen, by hydrogen Those obtained by etherification reaction of quinones, or hydrogenated bisphenols obtained by hydrogenation of these. The bisphenols may be 4,4'-dihydroxybiphenyl, trihydroxydiphenyldimethylethane, long-chain bisphenols, resorcinol, or salicin. Partially replaced by others. Among these bisphenol-type epoxy resins, a bisphenol A-type epoxy resin is preferred from the viewpoint of improving compatibility.

至於前述酚樹脂較好為在酸觸媒存在下,使酚類與醛類反應獲得之酚醛清漆酚樹脂。至於酚類列舉為例如苯酚、鄰-甲酚、間-甲酚、對-甲酚、2,3-二甲苯酚、2,4-二甲苯酚、2,5-二甲苯酚、2,6-二甲苯酚、3,4-二甲苯酚、3,5-二甲苯酚、對-乙基酚、對-異丙基酚、對-第三丁基酚、對-氯酚、對-溴酚等各種者。至於醛類除福馬林以外,亦可使用仲甲醛、三噁烷、四噁烷等之甲醛產生源物質。 The aforementioned phenol resin is preferably a novolac phenol resin obtained by reacting phenols with aldehydes in the presence of an acid catalyst. As the phenols, for example, phenol, o-cresol, m-cresol, p-cresol, 2,3-xylenol, 2,4-xylenol, 2,5-xylenol, 2,6 -Xylenol, 3,4-xylenol, 3,5-xylenol, p-ethylphenol, p-isopropylphenol, p-third butylphenol, p-chlorophenol, p-bromo Phenol and others. As for the aldehydes, in addition to formalin, paraformaldehyde, trioxane, tetraoxane and other formaldehyde generating source materials can also be used.

(B)三官能性烷氧基矽烷改質樹脂為上述之含羥基之環氧樹脂中之羥基經矽烷改質之三官能性烷氧基矽烷改質環氧樹脂,或酚樹脂之酚性羥基經矽烷改質之三官能性烷氧基矽烷改質之酚樹脂時,官能基當量(環氧當量或酚性羥基當量)較好為150~350。 (B) Trifunctional alkoxysilane modified resin is a trifunctional alkoxysilane modified epoxy resin modified by silane in the above-mentioned hydroxyl-containing epoxy resin, or a phenolic hydroxyl group of phenol resin In the case of a phenol resin modified by a silane modified trifunctional alkoxysilane, the functional group equivalent (epoxy equivalent or phenolic hydroxyl equivalent) is preferably 150 to 350.

更具體而言,(B)三官能性烷氧基矽烷改質樹脂可以下述通式(1)之構造表示。 More specifically, the (B) trifunctional alkoxysilane modified resin can be represented by the structure of the following general formula (1).

Figure TWI609917BD00003
Figure TWI609917BD00003

式(1)中,R3為碳數1~10之直鏈或分支鏈之烷基,或烯丙基,較好為碳數1~5之直鏈或分支鏈之烷基,更好為碳數1~4之直鏈或分支鏈之烷基,又更好為甲基、乙基、丙基、烯丙基,又更好為甲基。R4、R5各獨立為氫、碳數1~10之直鏈或分支鏈之烷基,較好為碳數1~5之直鏈或分支鏈之烷基,更好為碳數1~4之直鏈或分支鏈,又更好為甲基、乙基、丙基、烯丙基,又再更好為甲基。 In formula (1), R 3 is a linear or branched alkyl group having 1 to 10 carbon atoms, or an allyl group, preferably a linear or branched alkyl group having 1 to 5 carbon atoms, and more preferably A linear or branched alkyl group having 1 to 4 carbon atoms is more preferably methyl, ethyl, propyl, allyl, and more preferably methyl. R 4 and R 5 are each independently hydrogen, a straight or branched alkyl group having 1 to 10 carbon atoms, preferably a straight or branched alkyl group having 1 to 5 carbon atoms, and more preferably 1 to 6 carbon atoms The straight or branched chain of 4 is more preferably methyl, ethyl, propyl, allyl, and even more preferably methyl.

式(1)中,m表示1~10。 In Formula (1), m represents 1-10.

式(1)中,X選自環氧樹脂或酚樹脂,更好選自雙酚A型環氧樹脂、雙酚F型環氧樹脂、雙酚AF型環氧樹脂、雙酚S型環氧樹脂、酚醛清漆酚樹脂。X更具體表示時,列舉為下式(2)或下式(3)。 In formula (1), X is selected from epoxy resin or phenol resin, and more preferably selected from bisphenol A type epoxy resin, bisphenol F type epoxy resin, bisphenol AF type epoxy resin, and bisphenol S type epoxy resin. Resin, novolac phenol resin. When X is more specifically expressed, it is enumerated by the following formula (2) or (3).

Figure TWI609917BD00004
(式中,n表示1~10,R6各獨立表示氫、甲基、苯基、三氟甲基,部與O原子鍵結)。
Figure TWI609917BD00004
(In the formula, n represents 1 to 10, and R 6 each independently represents hydrogen, methyl, phenyl, and trifluoromethyl, and the * part is bonded to an O atom).

Figure TWI609917BD00005
(式中,部與O原子鍵結)。
Figure TWI609917BD00005
(In the formula, the * part is bonded to an O atom).

市售三官能性烷氧基矽烷改質樹脂列舉為以下式(4)表示之「E201」(荒川化學工業(股)製造,環氧當量285)、以下式(5)表示之「P501」(荒川化學工業(股)製造,酚性羥基當量275)等。 Commercially available trifunctional alkoxysilane modified resins are listed as "E201" (manufactured by Arakawa Chemical Industries, Ltd., epoxy equivalent 285) represented by the following formula (4), and "P501" represented by the following formula (5) ( Manufactured by Arakawa Chemical Industries, Ltd., phenolic hydroxyl equivalent 275).

Figure TWI609917BD00006
(式中,n表示1~10,m表示1~10)。
Figure TWI609917BD00006
(In the formula, n represents 1 to 10, and m represents 1 to 10).

Figure TWI609917BD00007
(式中,m表示1~10)。
Figure TWI609917BD00007
(In the formula, m represents 1 to 10).

〈(C)無機填充材〉 <(C) Inorganic Filler>

本發明中使用之(C)無機填充材並無特別限制,列舉為例如二氧化矽、氧化鋁、硫酸鋇、滑石、黏土、雲母粉、氫氧化鋁、氫氧化鎂、碳酸鈣、碳酸鎂、氧化鎂、氮化硼、硼酸鋁、鈦酸鋇、鈦酸鍶、鈦酸鈣、鈦酸鎂、鈦酸鉍、氧化鈦、鋯酸鋇、鋯酸鈣等。其中,以二氧化矽較佳。另外,較好為無定形二氧化矽、粉碎二氧化矽、熔融二氧化矽、結晶二氧化矽、合成二氧化矽、中空二氧化矽等二氧化矽,更好為熔融二氧化矽。另外,二氧化矽較好為球狀者。該等可使用一種亦可以兩種以上組合使用。市售之球狀熔融二氧化矽列舉為Advantex(股)製造之「SOC2」、「SOC1」。 The (C) inorganic filler used in the present invention is not particularly limited, and examples thereof include silicon dioxide, alumina, barium sulfate, talc, clay, mica powder, aluminum hydroxide, magnesium hydroxide, calcium carbonate, magnesium carbonate, Magnesium oxide, boron nitride, aluminum borate, barium titanate, strontium titanate, calcium titanate, magnesium titanate, bismuth titanate, titanium oxide, barium zirconate, calcium zirconate, and the like. Among them, silicon dioxide is preferred. In addition, preferred is silicon dioxide such as amorphous silicon dioxide, pulverized silicon dioxide, fused silicon dioxide, crystalline silicon dioxide, synthetic silicon dioxide, and hollow silicon dioxide, and more preferably fused silicon dioxide. The silica is preferably spherical. These may be used singly or in combination of two or more kinds. Commercially available spherical fused silica is listed as "SOC2" and "SOC1" manufactured by Advantex.

無機填充材之平均粒徑並無特別限制,但無機填充材之平均粒徑之上限值,就於絕緣層上進行微細配線形成之 觀點而言,較好為5μm以下,更好為3μm以下,又更好為1μm以下,再更好為0.7μm以下,又再更好為0.5μm以下,最好為0.4μm以下,又最好為0.3m以下。另一方面,無機填充材之平均粒徑之下限值,於以環氧樹脂組成物作為樹脂組成物漆料時,就防止漆料之黏度上升,使作業性降低之觀點而言,較好為0.01μm以上,更好為0.03μm以上,又更好為0.05μm以上,再更好為0.07μm以上,最好為0.1μm以上。上述無機填充材之平均粒徑可依據米氏(Mie)散射理論,以雷射繞射.散射法測定。具體而言可以雷射繞射式粒度分佈測定裝置,以體積基準製作無機填充材之粒度分佈,以其中值直徑作為平均粒徑而測定。測定樣品可較好地使用以超音波使無機填充材分散於水中而成者。至於雷射繞射式粒度分佈測定裝置可使用堀場製作所(股)製造之LA-500、750、950等。本發明使用LA-750。 The average particle diameter of the inorganic filler is not particularly limited, but the upper limit of the average particle diameter of the inorganic filler is formed by fine wiring on the insulating layer. From a viewpoint, it is preferably 5 μm or less, more preferably 3 μm or less, still more preferably 1 μm or less, still more preferably 0.7 μm or less, still more preferably 0.5 μm or less, most preferably 0.4 μm or less, and most preferably It is 0.3 m or less. On the other hand, when the lower limit of the average particle diameter of the inorganic filler is used, when epoxy resin composition is used as the resin composition paint, it is preferable from the viewpoint of preventing increase in paint viscosity and reducing workability. It is 0.01 μm or more, more preferably 0.03 μm or more, still more preferably 0.05 μm or more, still more preferably 0.07 μm or more, and most preferably 0.1 μm or more. The average particle diameter of the inorganic filler can be diffracted by laser according to Mie scattering theory. Determination by scattering method. Specifically, a laser diffraction type particle size distribution measuring device can be used to prepare a particle size distribution of an inorganic filler on a volume basis, and use the median diameter as the average particle diameter to measure. As the measurement sample, an inorganic filler is dispersed in water by ultrasonic waves. As the laser diffraction type particle size distribution measuring device, LA-500, 750, 950, etc. manufactured by Horiba, Ltd. can be used. The present invention uses LA-750.

調配無機填充材時之含量,以樹脂組成物中之不揮發成分作為100質量%時,雖依據樹脂組成物所要求之特性而異,但較好為20~85質量%,更好為30~80質量%,又更好為40~75質量%,又再更好為50~70質量%。無機填充材之含量太少時,會有硬化物之熱膨脹率變高之傾向,含量太大時會有硬化物變脆之傾向或剝離強度下降之傾向。 When the content of the inorganic filler is formulated, and the non-volatile content in the resin composition is taken as 100% by mass, although it depends on the characteristics required of the resin composition, it is preferably 20 to 85% by mass, more preferably 30 to 80% by mass, more preferably 40 to 75% by mass, and even more preferably 50 to 70% by mass. When the content of the inorganic filler is too small, the thermal expansion rate of the cured product tends to be high, and when the content is too large, the cured product tends to become brittle or the peel strength tends to decrease.

本發明之樹脂組成物中,(B)三官能性烷氧基矽烷改質樹脂之至少一部份亦可與(C)無機填充材反應,形成反應 物。 In the resin composition of the present invention, at least a part of the (B) trifunctional alkoxysilane modified resin may also react with the (C) inorganic filler to form a reaction. Thing.

本說明書中之(B)三官能性烷氧基矽烷改質樹脂與(C)無機填充材之所謂「反應」係表示(B)三官能性烷氧基矽烷改質樹脂之烷氧基與(C)無機填充材之表面羥基之間之縮合反應,具體而言係表示水解.脫水縮合反應、脫醇縮合反應。據此,(B)三官能性烷氧基矽烷改質樹脂與(C)無機填充材反應形成之所謂「反應物」係表示(B)三官能性烷氧基矽烷改質樹脂與(C)無機填充材之縮合物。該縮合物中,(B)三官能性烷氧基矽烷改質樹脂係共價鍵結於(C)無機填充材之表面。 The so-called "reaction" of (B) trifunctional alkoxysilane modified resin and (C) inorganic filler in this specification means (B) the alkoxy group of (B) trifunctional alkoxysilane modified resin and ( C) The condensation reaction between the hydroxyl groups on the surface of the inorganic filler, specifically the hydrolysis. Dehydration condensation reaction and dealcoholization condensation reaction. Accordingly, the so-called "reactant" formed by the reaction between (B) trifunctional alkoxysilane modified resin and (C) inorganic filler means (B) trifunctional alkoxysilane modified resin and (C) Condensate of inorganic filler. In this condensate, (B) a trifunctional alkoxysilane modified resin is covalently bonded to the surface of (C) an inorganic filler.

本發明之(C)無機填充材、或者與(B)三官能性烷氧基矽烷改質樹脂之至少一部分反應而形成反應物之(C)無機填充材,在不損及本發明效果之範圍內,較好為以環氧基矽烷系偶合劑、胺基矽烷系偶合劑、巰基矽烷系偶合劑、矽烷系偶合劑、有機矽氮烷化合物、鈦酸酯系偶合劑等表面處理劑進行表面處理以提高其耐濕性者。該等可使用一種或組合兩種以上使用。具體之表面處理劑列舉為胺基丙基甲氧基矽烷、胺基丙基三乙氧基矽烷、脲基丙基三乙氧基矽烷、N-苯基胺基丙基三甲氧基矽烷、N-2(胺基乙基)胺基丙基三甲氧基矽烷等胺基矽烷系偶合劑,縮水甘油氧基丙基三甲氧基矽烷、縮水甘油氧基丙基三乙氧基矽烷、縮水甘油氧基丙基甲基二乙氧基矽烷、縮水甘油基丁基三甲氧基矽烷、(3,4-環氧基環己基)乙基三甲氧基矽烷等環氧基矽烷系偶合劑,巰基丙基三甲氧基矽烷、巰基丙基三 乙氧基矽烷等巰基矽烷系偶合劑、甲基三甲氧基矽烷、十八烷基三甲氧基矽烷、苯基三甲氧基矽烷、甲基丙烯醯氧基丙基三甲氧基矽烷、咪唑基矽烷、三嗪矽烷等矽烷系偶合劑,六甲基二矽氮烷、六苯基二矽氮烷、三矽氮烷、環三矽氮烷、1,1,3,3,5,5-六甲基環三矽氮烷等有機矽氮烷化合物,鈦酸丁酯二聚物、辛二醇酸鈦、二異丙氧基鈦雙(三乙醇戊酸酯)、二羥基雙乳酸鈦、二羥基雙(乳酸銨)鈦、雙(二辛基焦磷酸酯)伸乙基鈦酸酯、雙(二辛基焦磷酸酯)氧基乙酸酯鈦酸酯、三正丁氧基單硬脂酸鈦、鈦酸四正丁酯、鈦酸四(2-乙基己酯)、四異丙基雙(二辛基磷酸酯)鈦酸酯、四辛基雙(二-十三烷基磷酸酯)鈦酸酯、四(2,2-二烯丙氧基甲基-1-丁基)雙(二-十三烷基)磷酸酯鈦酸酯、異丙基三辛醯基鈦酸酯、異丙基三枯基苯基鈦酸酯、異丙基三異硬脂醯基鈦酸酯、異丙基異硬脂醯基二丙烯醯基鈦酸酯、異丙基二甲基丙烯醯基異硬脂醯基鈦酸酯、異丙基三(二辛基磷酸酯)鈦酸酯、異丙基三-十二烷基苯磺醯基鈦酸酯、異丙基三(二辛基焦磷酸酯)鈦酸酯、異丙基三(N-醯胺基乙基.胺基乙基)鈦酸酯等鈦酸酯矽偶合劑等。 The (C) inorganic filler of the present invention, or the (C) inorganic filler which reacts with at least a part of the (B) trifunctional alkoxysilane modified resin to form a reactant, does not impair the effect of the present invention. It is preferable that the surface is treated with a surface treating agent such as an epoxy silane-based coupling agent, an amino silane-based coupling agent, a mercapto silane-based coupling agent, a silane-based coupling agent, an organic silazane compound, or a titanate-based coupling agent. Treated to improve its moisture resistance. These can be used singly or in combination of two or more kinds. Specific surface treatment agents include aminopropylmethoxysilane, aminopropyltriethoxysilane, ureapropyltriethoxysilane, N-phenylaminopropyltrimethoxysilane, N -2 (aminoethyl) aminopropyltrimethoxysilane and other aminosilane-based coupling agents, glycidyloxypropyltrimethoxysilane, glycidyloxypropyltriethoxysilane, glycidyloxy Epoxysilane coupling agents such as propylmethyldiethoxysilane, glycidylbutyltrimethoxysilane, (3,4-epoxycyclohexyl) ethyltrimethoxysilane, mercaptopropyl Trimethoxysilane, mercaptopropyltris Mercaptosilane coupling agents such as ethoxysilane, methyltrimethoxysilane, octadecyltrimethoxysilane, phenyltrimethoxysilane, methacryloxypropyltrimethoxysilane, imidazolylsilane Silane coupling agents such as triazine silane, hexamethyldisilazane, hexaphenyldisilazane, trisilazane, cyclotrisilazane, 1,1,3,3,5,5-hexa Organosilazane compounds such as methylcyclotrisilazane, butyl titanate dimer, titanium octanoate, titanium diisopropoxy bis (triethanolvalerate), titanium dihydroxylactate, Hydroxy bis (ammonium lactate) titanium, bis (dioctyl pyrophosphate) ethylene titanate, bis (dioctyl pyrophosphate) oxyacetate titanate, tri-n-butoxy monostearate Titanate, tetra-n-butyl titanate, tetra (2-ethylhexyl) titanate, tetraisopropylbis (dioctyl phosphate) titanate, tetraoctylbis (di-tridecyl phosphate) (Ester) titanate, tetra (2,2-diallyloxymethyl-1-butyl) bis (di-tridecyl) phosphate titanate, isopropyltrioctylfluorenyl titanate, isopropyl Propyltricumylphenyl titanate, isopropyltriisostearylfluorenyl titanate, isopropyl Stearyl fluorenyl dipropenyl fluorenyl titanate, isopropyl methacryl fluorenyl isostearyl fluorenyl titanate, isopropyl tri (dioctyl phosphate) titanate, isopropyl tri- Dodecylbenzenesulfonyl titanate, isopropyl tris (dioctyl pyrophosphate) titanate, isopropyl tris (N-fluorenylaminoethyl.aminoethyl) titanate, etc. Titanate silicon coupling agent.

該等中,使用以有機矽氮烷化合物對(C)無機填充材進行表面處理者時,就提高樹脂漆料之分散性、提高以三官能性烷氧基矽烷改質樹脂對無機填充材之被覆率之觀點而言較為有利。尤其,以六甲基二矽氮烷較佳。又,使用以表面處理劑處理之(C)無機填充材時,(B)三官能性烷氧基矽烷改質樹脂亦可透過該表面處理劑共價鍵結於(C)無 機填充材之表面。 Among these, when the (C) inorganic filler is surface-treated with an organic silazane compound, the dispersibility of the resin paint is improved, and the inorganic filler is modified with a trifunctional alkoxysilane modified resin. From the viewpoint of coverage, it is more favorable. In particular, hexamethyldisilazane is preferred. When (C) an inorganic filler treated with a surface treatment agent is used, (B) a trifunctional alkoxysilane modified resin can also be covalently bonded to (C) without passing through the surface treatment agent. The surface of the machine filling material.

本發明之樹脂組成物中,(B)三官能性烷氧基矽烷改質樹脂與(C)無機填充材可直接添加於樹脂組成物中,亦可使(B)三官能性烷氧基矽烷改質樹脂與(C)無機填充材預先反應後添加。就提高在樹脂組成物中之分散性之觀點而言,以使(B)三官能性烷氧基矽烷改質樹脂與(C)無機填充材預先反應後再添加於樹脂組成物中較佳。又藉由使(B)三官能性烷氧基矽烷改質樹脂與(C)無機填充材預先反應後添加於樹脂組成物中,如上述般可適當地獲得使(B)三官能性烷氧基矽烷改質樹脂之至少一部分與(C)無機填充材反應而形成反應物之樹脂組成物。(B)三官能性烷氧基矽烷改質樹脂與(C)無機填充材預先反應之方法列舉為例如以下之方法。 In the resin composition of the present invention, (B) a trifunctional alkoxysilane modified resin and (C) an inorganic filler can be directly added to the resin composition, or (B) a trifunctional alkoxysilane can be added. The modified resin is reacted with the inorganic filler (C) in advance and added. From the viewpoint of improving the dispersibility in the resin composition, it is preferable that the (B) trifunctional alkoxysilane modified resin is reacted with the (C) inorganic filler in advance and then added to the resin composition. The (B) trifunctional alkoxysilane modified resin is reacted with the (C) inorganic filler in advance and added to the resin composition, so that the (B) trifunctional alkoxy group can be appropriately obtained as described above. A resin composition in which at least a part of the silane-modified modified resin reacts with (C) an inorganic filler to form a reactant. The method in which (B) a trifunctional alkoxysilane modified resin and (C) an inorganic filler are reacted in advance is, for example, the following method.

將(C)無機填充材投入旋轉混練機中,且一邊噴霧使(B)三官能性烷氧基矽烷改質樹脂預先與MEK混合而成者,一邊攪拌(C)無機填充材5~30分鐘,接著在50~150℃攪拌0.5~3小時,進行預先反應。更好在55~130℃攪拌0.5~3小時,又更好在60~110℃攪拌0.5~3小時,再更好在70~80℃攪拌1~3小時。隨後,列舉為餾除揮發成分之方法。除旋轉混練機以外,亦可使用滾筒式混練機、搖滾混練機、振動流動層、粉體乾燥機等,但就進行較簡便之觀點而言,以旋轉混練機較佳。旋轉混練機列舉為亨歇爾型混粉機。 Put the (C) inorganic filler into the rotary kneader, and while mixing the (B) trifunctional alkoxysilane modified resin with MEK in advance, spray the (C) inorganic filler for 5 to 30 minutes Then, it is stirred at 50 to 150 ° C for 0.5 to 3 hours to perform a preliminary reaction. It is better to stir at 55 ~ 130 ° C for 0.5 ~ 3 hours, more preferably at 60 ~ 110 ° C for 0.5 ~ 3 hours, and even more preferably at 70 ~ 80 ° C for 1 ~ 3 hours. Subsequently, a method for distilling off volatile components is listed. In addition to the rotary kneader, a drum-type kneader, a rock kneader, a vibrating fluidized bed, a powder dryer, etc. may be used, but a rotary kneader is preferred in terms of simplicity. Rotary kneaders are listed as Henschel powder mixers.

(B)三官能性烷氧基矽烷改質樹脂之含量,就防止熔 融黏度上升之觀點而言,相對於(C)無機填充材100質量%,較好為5質量%以下,更好為4質量%以下,又更好為3質量%以下。又,就提高樹脂漆料之分散性之觀點而言,較好為0.1質量%以上,更好為0.5質量%以上,又更好為1質量%以上。 (B) Trifunctional alkoxysilane modified resin content prevents melting From the viewpoint of an increase in melt viscosity, it is preferably 5 mass% or less, more preferably 4 mass% or less, and still more preferably 3 mass% or less with respect to 100 mass% of the (C) inorganic filler. From the viewpoint of improving the dispersibility of the resin paint, it is preferably 0.1% by mass or more, more preferably 0.5% by mass or more, and even more preferably 1% by mass or more.

使本發明之樹脂組成物硬化形成絕緣層,對其絕緣層表面進行粗化處理,並經鍍敷獲得之導體層與絕緣層之剝離強度可利用後述之<鍍敷導體層之拉伸剝離強度(剝離強度)之測定>中所記載之測定方法掌握。 The resin composition of the present invention is hardened to form an insulating layer. The surface of the insulating layer is roughened, and the peeling strength of the conductor layer and the insulating layer obtained by plating can be used. The measurement method described in (Measurement of Peel Strength) is grasped.

剝離強度之上限值較好為0.7kgf/cm以下,更好為0.8 kgf/cm以下,又更好為0.9kgf/cm以下,再更好為1.0kgf/cm以下。剝離強度之下限值較好為0.43kgf/cm以上,更好為0.48 kgf/cm以上,又更好為0.53 kgf/cm以上。 The upper limit of the peel strength is preferably 0.7 kgf / cm or less, more preferably 0.8 kgf / cm or less, still more preferably 0.9 kgf / cm or less, and still more preferably 1.0 kgf / cm or less. The lower limit of the peel strength is preferably 0.43 kgf / cm or more, more preferably 0.48 kgf / cm or more, and still more preferably 0.53 kgf / cm or more.

使本發明之樹脂組成物硬化形成絕緣層,對其絕緣層表面進行粗化處理後之算術平均粗糙度(Ra值)、均方平方根粗糙度(Rq值)可利用後述之<粗化後之算術平均粗糙度(Ra值)、均方平方根粗糙度(Rq值)之測定>中所記載之測定方法掌握。 The resin composition of the present invention is hardened to form an insulating layer, and the arithmetic average roughness (Ra value) and square root mean square roughness (Rq value) of the surface of the insulating layer after roughening treatment can be used as described below. The measurement methods described in "Measurement of Arithmetic Mean Roughness (Ra Value) and Mean Square Square Root Roughness (Rq Value)" are mastered.

算術平均粗糙度(Ra值)之上限值較好為300nm以下,更好為250nm以下,又更好為220nm以下,再更好為200nm以下,又再更好為190nm以下,最好為170nm以下,又最好為150nm以下。算術平均粗糙度(Ra值)之下限值較好為50nm以上,更好為30nm以上,又更好為10nm以上。 The upper limit of the arithmetic average roughness (Ra value) is preferably 300 nm or less, more preferably 250 nm or less, still more preferably 220 nm or less, still more preferably 200 nm or less, still more preferably 190 nm or less, and most preferably 170 nm. Hereinafter, it is more preferably 150 nm or less. The lower limit of the arithmetic average roughness (Ra value) is preferably 50 nm or more, more preferably 30 nm or more, and even more preferably 10 nm or more.

均方平方根粗糙度(Rq值)之上限值較好為520nm以下,更好為450nm以下,又更好為400nm以下,再更好為380nm以下,又再更好為350nm以下,最好為330nm以下,又最好為300nm以下,又在最好為250nm以下。均方平方根粗糙度(Rq值)之下限值較好為90nm以上,更好為70nm以上,又更好為50nm以上,再更好為30nm以上,又再更好為10nm以上。 The upper limit of the square root roughness (Rq value) is preferably 520 nm or less, more preferably 450 nm or less, still more preferably 400 nm or less, still more preferably 380 nm or less, and still more preferably 350 nm or less, and most preferably 330 nm or less, preferably 300 nm or less, and 250 nm or less is more preferable. The lower limit of the root mean square roughness (Rq value) is preferably 90 nm or more, more preferably 70 nm or more, more preferably 50 nm or more, still more preferably 30 nm or more, and still more preferably 10 nm or more.

〈(D)硬化促進劑〉 〈(D) Hardening accelerator〉

本發明之樹脂組成物藉由進一步含有硬化促進劑,可使環氧樹脂與硬化劑有效的硬化。至於硬化促進劑並無特別限制,列舉為胺系硬化促進劑、胍系硬化促進劑、咪唑系硬化促進劑、鏻系硬化促進劑、金屬系硬化促進劑等。該等可以一種使用或亦可組合兩種以上使用。 By further containing a hardening accelerator, the resin composition of the present invention can effectively harden an epoxy resin and a hardener. The hardening accelerator is not particularly limited, and examples thereof include amine-based hardening accelerators, guanidine-based hardening accelerators, imidazole-based hardening accelerators, fluorene-based hardening accelerators, and metal-based hardening accelerators. These may be used singly or in combination of two or more kinds.

胺系硬化促進劑並無特別限制,列舉為三乙基胺、三丁基胺等三烷基胺,4-二甲胺基吡啶、苄基二甲基胺、2,4,6-參(二甲胺基甲基)酚、1,8-二氮雜雙環(5,4,0)-十一碳烯(以下簡稱為DBU)等胺化合物等。該等可以一種使用或亦可組合兩種以上使用。 The amine-based hardening accelerator is not particularly limited, and examples thereof include trialkylamines such as triethylamine and tributylamine, 4-dimethylaminopyridine, benzyldimethylamine, and 2,4,6-ginseng ( Amine compounds such as dimethylaminomethyl) phenol, 1,8-diazabicyclo (5,4,0) -undecene (hereinafter abbreviated as DBU), and the like. These may be used singly or in combination of two or more kinds.

胍系硬化促進劑並無特別限制,列舉為例如二氰二醯胺、1-甲基胍、1-乙基胍、1-環己基胍、1-苯基胍、1-(鄰-甲苯基)胍、二甲基胍、二苯基胍、三甲基胍、四甲基胍、五甲基胍、1,5,7-三氮雜雙環[4.4.0]癸-5-烯、7-甲基-1,5,7-三氮雜雙環[4.4.0]癸-5-烯、1-甲基雙胍、1-乙基雙 胍、1-正丁基雙胍、1-正十八烷基雙胍、1,1-二甲基雙胍、1,1-二乙基雙胍、1-環己基雙胍、1-烯丙基雙胍、1-苯基雙胍、1-(鄰-甲苯基)雙胍等。該等可使用一種或亦可組合兩種以上使用。 The guanidine-based hardening accelerator is not particularly limited, and examples thereof include dicyandiamide, 1-methylguanidine, 1-ethylguanidine, 1-cyclohexylguanidine, 1-phenylguanidine, and 1- (o-tolyl group). ) Guanidine, dimethylguanidine, diphenylguanidine, trimethylguanidine, tetramethylguanidine, pentamethylguanidine, 1,5,7-triazabicyclo [4.4.0] dec-5-ene, 7 -Methyl-1,5,7-triazabicyclo [4.4.0] dec-5-ene, 1-methyl biguanide, 1-ethylbis Guanidine, 1-n-butyl biguanide, 1-n-octadecyl biguanide, 1,1-dimethyl biguanide, 1,1-diethyl biguanide, 1-cyclohexyl biguanide, 1-allyl biguanide, 1 -Phenyl biguanide, 1- (o-tolyl) biguanide and the like. These may be used singly or in combination of two or more kinds.

咪唑系硬化促進劑並無特別限制,但可列舉為2-甲基咪唑、2-十一烷基咪唑、2-十七烷基咪唑、1,2-二甲基咪唑、2-乙基-4-甲基咪唑、1,2-二甲基咪唑、2-乙基-4-甲基咪唑、2-苯基咪唑、2-苯基-4-甲基咪唑、1-苄基-2-甲基咪唑、1-苄基-2-苯基咪唑、1-氰乙基-2-甲基咪唑、1-氰乙基-2-十一烷基咪唑、1-氰乙基-2-乙基-4-甲基咪唑、1-氰乙基-2-苯基咪唑、1-氰乙基-2-十一烷基咪唑鎓偏苯三酸鹽、1-氰乙基-2-苯基咪唑鎓偏苯三酸鹽、2,4-二胺基-6-[2’-甲基咪唑基-(1’)]-乙基-s-三嗪、2,4-二胺基-6-[2’-十一烷基咪唑基-(1’)]-乙基-s-三嗪、2,4-二胺基-6-[2’-乙基-4’-甲基咪唑基-(1’)]-乙基-s-三嗪、2,4-二胺基-6-[2’-甲基咪唑基-(1’)]-乙基-s-三嗪異氰尿酸加成物、2-苯基咪唑異氰尿酸加成物、2-苯基-4,5-二羥基甲基咪唑、2-苯基-4-甲基-5-羥基甲基咪唑、2,3-二氫-1H-吡咯并[1,2-a]苯并咪唑、1-十二烷基-2-甲基-3-苯并咪唑鎓氯化物、2-甲基咪唑啉、2-苯基咪唑啉等咪唑化合物、及咪唑化合物與環氧樹脂之加成物。該等可使用一種或組合兩種以上使用。 The imidazole-based hardening accelerator is not particularly limited, and examples thereof include 2-methylimidazole, 2-undecylimidazole, 2-heptadecylimidazole, 1,2-dimethylimidazole, and 2-ethyl- 4-methylimidazole, 1,2-dimethylimidazole, 2-ethyl-4-methylimidazole, 2-phenylimidazole, 2-phenyl-4-methylimidazole, 1-benzyl-2- Methylimidazole, 1-benzyl-2-phenylimidazole, 1-cyanoethyl-2-methylimidazole, 1-cyanoethyl-2-undecylimidazole, 1-cyanoethyl-2-ethyl 4-methylimidazole, 1-cyanoethyl-2-phenylimidazole, 1-cyanoethyl-2-undecylimidazolium trimellitate, 1-cyanoethyl-2-phenyl Imidazolium trimellitate, 2,4-diamino-6- [2'-methylimidazolyl- (1 ')]-ethyl-s-triazine, 2,4-diamino-6 -[2'-undecylimidazolyl- (1 ')]-ethyl-s-triazine, 2,4-diamino-6- [2'-ethyl-4'-methylimidazolyl -(1 ')]-ethyl-s-triazine, 2,4-diamino-6- [2'-methylimidazolyl- (1')]-ethyl-s-triazine isocyanuric acid Adduct, 2-phenylimidazole isocyanuric acid adduct, 2-phenyl-4,5-dihydroxymethylimidazole, 2-phenyl-4-methyl-5-hydroxymethylimidazole, 2, 3-dihydro-1H-pyrrolo [1,2-a] benzimidazole 2-methyl-1-dodecyl benzimidazolium chloride, 2-imidazoline, 2-phenyl imidazole and imidazoline compounds, and adducts of an imidazole compound with an epoxy resin. These can be used singly or in combination of two or more kinds.

鏻系硬化促進劑並無特別限制,列舉為三苯基膦、硼酸鏻化合物、四苯基鏻四苯基硼酸鹽、正丁基鏻四苯基硼酸鹽、四丁基鏻癸酸鹽、(4-甲基苯基)三苯基鏻硫代氰酸 鹽、四苯基鏻硫代氰酸鹽、丁基三苯基鏻硫代氰酸鹽等。該等可使用一種或組合兩種以上使用。 The fluorene-based hardening accelerator is not particularly limited, and examples thereof include triphenylphosphine, phosphonium borate compounds, tetraphenylphosphonium tetraphenylborate, n-butylphosphonium tetraphenylborate, tetrabutylphosphonium decanoate, ( 4-methylphenyl) triphenylphosphonium thiocyanate Salt, tetraphenylphosphonium thiocyanate, butyltriphenylphosphonium thiocyanate, and the like. These can be used singly or in combination of two or more kinds.

本發明之樹脂組成物中,硬化促進劑(金屬系氧化促進劑除外)之含量以樹脂組成物中之不揮發成分作為100質量%時,較好為0.005~1質量%之範圍,更好為0.01~0.5質量%之範圍。未達0.005質量%時,會有硬化變慢而需拉長熱硬化時間之傾向,超過1質量%時,會有樹脂組成物之儲存安定性下降之傾向。 In the resin composition of the present invention, when the content of the hardening accelerator (excluding the metal-based oxidation accelerator) is 100% by mass of the nonvolatile component in the resin composition, it is preferably in the range of 0.005 to 1% by mass, and more preferably 0.01 to 0.5% by mass. If it is less than 0.005 mass%, the curing tends to be slow and the heat-curing time is prolonged. If it exceeds 1 mass%, the storage stability of the resin composition tends to decrease.

作為金屬系硬化促進劑並無特別限制,列舉為鈷、銅、鋅、鐵、鎳、錳、錫等金屬之有機金屬錯合物或有機金屬鹽。有機金屬錯合物之具體例列舉為乙醯基丙酮酸鈷(II)、乙醯基丙酮酸鈷(III)等有機鈷錯合物,乙醯基丙酮酸銅(II)等有機銅錯合物,乙醯基丙酮酸鋅(II)等有機鋅錯合物,乙醯基丙酮酸鐵(III)等有機鐵錯合物,乙醯基丙酮酸鎳(II)等有機鎳錯合物,乙醯基丙酮酸錳(II)等有機錳錯合物等。至於有機金屬鹽列舉為辛酸鋅、辛酸錫、環烷酸鋅、環烷酸鈷、硬脂酸錫、硬脂酸鋅等。該等可使用一種或組合兩種以上使用。 The metal-based hardening accelerator is not particularly limited, and examples thereof include organometallic complexes or organometallic salts of metals such as cobalt, copper, zinc, iron, nickel, manganese, and tin. Specific examples of the organometallic complex include organocobalt complexes such as cobalt (II) ethionylpyruvate and cobalt (III) ethidiumpyruvate, and complexes of organic copper such as copper (II) ethyruvate Compounds, organic zinc complexes such as zinc (II) acetonylpyruvate, organic iron complexes such as iron (III) acetonylpyruvate, organic nickel complexes such as nickel (II) acetonylpyruvate, Organomanganese complexes such as manganese (II) acetamidinate and the like. As the organic metal salt, zinc octoate, tin octoate, zinc naphthenate, cobalt naphthenate, tin stearate, zinc stearate, and the like are listed. These can be used singly or in combination of two or more kinds.

本發明之樹脂組成物中,金屬系硬化促進劑之添加量以樹脂組成物中之不揮發成分作為100質量%時,基於金屬系硬化觸媒之量之金屬含量較好在25~500ppm之範圍,更好在40~200ppm之範圍。未達25ppm時,會有難以形成對於低算術平均粗糙度之絕緣層表面之密著性優異之導體層之傾向,超過500ppm時,會有樹脂組成物之儲存 安定性、絕緣性下降之傾向。 In the resin composition of the present invention, when the amount of the metal-based hardening accelerator is taken as 100% by mass of the non-volatile component in the resin composition, the metal content based on the amount of the metal-based hardening catalyst is preferably in the range of 25 to 500 ppm. , Better in the range of 40 ~ 200ppm. When it is less than 25 ppm, it is difficult to form a conductive layer having excellent adhesion to the surface of the insulating layer having a low arithmetic average roughness. When it exceeds 500 ppm, the resin composition may be stored. Tendency to decrease stability and insulation.

〈(E)硬化劑〉 <(E) Hardener>

本發明之樹脂組成物藉由進而含有硬化劑,可提高絕緣性或機械特性。至於(E)硬化劑並無特別限制,列舉為酚系硬化劑、萘酚系硬化劑、活性酯系硬化劑、苯并噁嗪系硬化劑、氰酸酯系硬化劑、酸酐系硬化劑等,就進一步降低算術平均粗糙度(Ra值)之觀點而言,以酚系硬化劑、萘酚系硬化劑、活性酯系硬化劑較佳。該等可使用一種或組合兩種以上使用。 By further containing a hardener, the resin composition of the present invention can improve insulation properties or mechanical properties. The (E) hardener is not particularly limited, and examples thereof include a phenol-based hardener, a naphthol-based hardener, an active ester-based hardener, a benzoxazine-based hardener, a cyanate-based hardener, and an anhydride-based hardener. From the viewpoint of further reducing the arithmetic average roughness (Ra value), a phenol-based hardener, a naphthol-based hardener, and an active ester-based hardener are preferred. These can be used singly or in combination of two or more kinds.

酚系硬化劑、萘酚系硬化劑並無特別限制,列舉為具有酚醛清漆構造之酚系硬化劑或具有酚醛清漆構造之萘酚系硬化劑,較好為酚酚醛清漆樹脂、含有三嗪骨架之酚酚醛清漆樹脂、萘酚酚醛清漆樹脂、萘酚芳烷基型樹脂、含有三嗪骨架之萘酚樹脂、聯苯芳烷基型酚樹脂。至於市售品,作為聯苯芳烷基型酚樹脂列舉為「MEH-7700」、「MEH-7810」、「MEH-7851」;「MEH-7851-4H」(明和化成(股)製),「GPH」(日本化藥(股)製),作為萘酚酚醛清漆樹脂,列舉為「NHN」、「CBN」(日本化藥(股)製)、作為萘酚芳烷基型樹脂列舉為「SN170」、「SN180」、「SN190」、「SN475」、「SN485」、「SN495」、「SN395」、「SN375」(東都化成(股)製),作為酚酚醛清漆樹脂列舉為「TD2090」(DIC(股)製),含有三嗪骨架之酚酚醛清漆樹脂列舉為「LA3018」、「LA7052」、「 LA7054」、「LA1356」(DIC(股)製)等。該等可使用一種或併用兩種以上。 The phenol-based hardener and the naphthol-based hardener are not particularly limited, and examples thereof include a phenol-based hardener having a novolac structure or a naphthol-based hardener having a novolac structure, preferably a phenol novolac resin and a triazine skeleton Phenol novolac resin, naphthol novolac resin, naphthol aralkyl resin, naphthol resin containing a triazine skeleton, and biphenylaralkyl phenol resin. As for commercially available products, examples of biphenylaralkyl phenol resins include "MEH-7700", "MEH-7810", and "MEH-7851"; "MEH-7851-4H" (made by Meiwa Chemical Co., Ltd.), "GPH" (manufactured by Nippon Kayaku Co., Ltd.) is listed as "naphthol novolac resin" as "NHN", "CBN" (manufactured by Nippon Kayaku Co., Ltd.), and "naphthol aralkyl resin" is listed as " "SN170", "SN180", "SN190", "SN475", "SN485", "SN495", "SN395", "SN375" (manufactured by Totsuka Kasei Co., Ltd.) are listed as "TD2090" ( (Manufactured by DIC), and phenol novolak resins containing a triazine skeleton are listed as "LA3018", "LA7052", " LA7054 "," LA1356 "(DIC (shares) system), etc. These may be used singly or in combination of two or more.

活性酯系硬化劑並無特別限制,一般較好使用酚酯類、噻吩酯類、N-羥基胺酯類、雜環羥基化合物之酯類等之一分子中具有兩個以上反應活性高之酯基之化合物。該活性酯系硬化劑較好為藉由以羧酸化合物及/或硫代羧酸化合物與羥基化合物及/或硫醇化合物之縮合反應獲得者。尤其就提高耐熱性之觀點而言,較好為由羧酸化合物與羥基化合物獲得之活性酯系硬化劑,更好為由羧酸化合物與酚化合物及/或萘酚化合物獲得之活性酯系硬化劑。至於羧酸化合物列舉為例如苯甲酸、乙酸、琥珀酸、馬來酸、衣康酸、鄰苯二甲酸、間苯二甲酸、對苯二甲酸、均苯四酸等。至於酚化合物或萘酚化合物列舉為氫醌、間苯二甲酚、雙酚A、雙酚F、雙酚S、酚酞啉(phenylphthalin)、甲基化雙酚A、甲基化雙酚F、甲基化雙酚S、酚、鄰-甲酚、間-甲酚、對-甲酚、兒茶酚、α-萘酚、β-萘酚、1,5-二羥基萘、1,6-二羥基萘、2,6-二羥基萘、二羥基二苯甲酮、三羥基二苯甲酮、四羥基二苯甲酮、間苯三酚(phloroglucin)、苯三醇、二環戊二烯基二苯酚、酚酚醛清漆樹脂等。活性酯系硬化劑可使用一種或兩種以上。至於活性酯系硬化劑亦可使用特開2004-277460號公報中揭示之活性酯系硬化劑,另亦可使用市售者。市售之活性酯系硬化劑以含二環戊二烯二苯酚構造者、酚酚醛清漆樹脂之乙醯化物、酚酚醛清漆樹脂之苯甲醯化物等較佳。具體而言, 含二環戊二烯基二苯酚構造者列舉為EXB9451、EXB9460、EXB9460S-65T、HPC-8000-65T(DIC(股)製,活性基當量約223),酚酚醛清漆樹脂之乙醯化物列舉為DC808(日本環氧樹脂(股)製,活性基當量約149),酚酚醛清漆樹脂之苯甲醯化物列舉為YLH1026(日本環氧樹脂(股)製,活性基當量約200)、YLH1030(日本環氧樹脂(股)製,活性基當量約201)、YLH1048(日本環氧樹脂(股)製,活性基當量約245)等,其中就漆料之儲存安定性、硬化物之熱膨脹率之觀點而言,以EXB9460S較佳。 The active ester-based hardener is not particularly limited. Generally, it is preferable to use a phenolic ester, a thiophene ester, an N-hydroxyamine ester, a heterocyclic hydroxy compound ester or the like having two or more highly reactive esters in the molecule. Of the compound. The active ester-based hardener is preferably obtained by a condensation reaction between a carboxylic acid compound and / or a thiocarboxylic acid compound and a hydroxy compound and / or a thiol compound. Especially from the viewpoint of improving heat resistance, an active ester-based hardener obtained from a carboxylic acid compound and a hydroxy compound is preferable, and an active ester-based hardener obtained from a carboxylic acid compound and a phenol compound and / or a naphthol compound is more preferable. Agent. As the carboxylic acid compound, for example, benzoic acid, acetic acid, succinic acid, maleic acid, itaconic acid, phthalic acid, isophthalic acid, terephthalic acid, pyromellitic acid, and the like are listed. As for the phenol compound or naphthol compound, hydroquinone, resorcinol, bisphenol A, bisphenol F, bisphenol S, phenylphthalin, methylated bisphenol A, methylated bisphenol F, Methylated bisphenol S, phenol, o-cresol, m-cresol, p-cresol, catechol, α-naphthol, β-naphthol, 1,5-dihydroxynaphthalene, 1,6- Dihydroxynaphthalene, 2,6-dihydroxynaphthalene, dihydroxybenzophenone, trihydroxybenzophenone, tetrahydroxybenzophenone, phloroglucin, benzenetriol, dicyclopentadiene Diphenol, phenol novolac resin, etc. As the active ester-based hardener, one kind or two or more kinds can be used. As the active ester-based hardener, the active ester-based hardener disclosed in Japanese Patent Application Laid-Open No. 2004-277460 can also be used, and a commercially available one can also be used. Commercially available active ester-based hardeners are preferably those containing a dicyclopentadiene diphenol structure, an acetonide of a phenol novolac resin, a benzyl compound of a phenol novolac resin, and the like. in particular, Dicyclopentadienyl diphenol-containing structures are listed as EXB9451, EXB9460, EXB9460S-65T, HPC-8000-65T (manufactured by DIC (shares), active group equivalent of about 223), and ethyl acetate of novolac resins are listed as DC808 (made by Japan Epoxy Resin Co., Ltd., with an active group equivalent of about 149), benzoic acid compounds of phenol novolac resin are listed as YLH1026 (made by Japan Epoxy Resin Co., Ltd., with an active group equivalent of about 200), YLH1030 (Japan Made of epoxy resin (share), active group equivalent of about 201), YLH1048 (made of Japan epoxy resin (share), active group equivalent of about 245), etc., among them, the viewpoints of storage stability of paint and thermal expansion rate of hardened materials In terms of EXB9460S.

含有二環戊二烯基二苯酚構造之活性酯系硬化劑更具體而言列舉為下式(6)者。 More specifically, the active ester hardener containing a dicyclopentadienyl diphenol structure is a compound of the following formula (6).

Figure TWI609917BD00008
(式中,R為苯基、萘基,k表示0或1,n為重複單位之平均,為0.05~2.5)。
Figure TWI609917BD00008
(In the formula, R is a phenyl group, a naphthyl group, k is 0 or 1, and n is an average of repeating units, and is 0.05 to 2.5).

就降低介電正切、提高耐熱性之觀點而言,R較好為萘基,另一方面,k較好為0,且,n較好為0.25~1.5。 From the viewpoint of reducing the dielectric tangent and improving the heat resistance, R is preferably a naphthyl group, on the other hand, k is preferably 0, and n is preferably 0.25 to 1.5.

至於苯并噁嗪系硬化劑並無特別限制,具體而言列舉為F-a、P-d(四國化成(股)製)、HFB2006M(昭和高分子(股)製造)等。 The benzoxazine-based hardener is not particularly limited, and specific examples include F-a, P-d (manufactured by Shikoku Kasei Co., Ltd.), HFB2006M (manufactured by Showa Polymer Co., Ltd.), and the like.

氰酸酯系硬化劑並無特別限制,列舉為酚醛清漆型( 酚酚醛清漆型、烷基酚酚醛清漆型等)氰酸酯系硬化劑、二環戊二烯型氰酸酯系硬化劑、雙酚型(雙酚A型、雙酚F型、雙酚S型等)氰酸酯系硬化劑,及該等之一部分經三嗪化而成之預聚物等。氰酸酯系硬化劑之重量平均分子量並無特別限制,較好為500~4500,更好為600~3000。氰酸酯系硬化劑之具體例列舉為例如雙酚A二氰酸酯、多酚氰酸酯(寡聚(3-亞甲基-1,5-伸苯基氰酸酯)、4,4’-亞甲基雙(2,6-二甲基苯基氰酸酯)、4,4’-亞乙基二苯基二氰酸酯、六氟雙酚A二氰酸酯、2,2-雙(4-氰酸酯基)苯基丙烷、1,1-雙(4-氰酸酯基苯基甲烷)、雙(4-氰酸酯基-3,5-二甲基苯基)甲烷、1,3-雙(4-氰酸酯基苯基-1-(甲基亞乙基))苯、雙(4-氰酸酯基苯基)硫醚、雙(4-氰酸酯基苯基)醚等二官能氰酸酯樹脂,由酚酚醛清漆、甲酚酚醛清漆、含有二環戊二烯構造之酚樹脂等衍生之多官能氰酸酯樹脂,該等氰酸酯樹脂一部分經三嗪化之預聚物等。該等可使用一種或組合兩種以上使用。市售之氰酸酯樹脂列舉為以下式(7)表示之酚酚醛清漆型多官能氰酸酯樹脂(日本LONZA(股)製,PT30,氰酸酯當量124),以下式(8)表示之雙酚A二氰酸酯之一部分或全部經三嗪化三聚物之預聚物(日本LONZA(股)製,BA230,氰酸酯當量232),以下式(9)表示之含有二環戊二烯構造之氰酸酯樹脂(日本LONZA(股)製,DT-4000、DT-7000)等。 The cyanate-based curing agent is not particularly limited, and examples thereof include novolac type ( (Phenol novolac type, alkylphenol novolac type, etc.) cyanate type hardener, dicyclopentadiene type cyanate type hardener, bisphenol type (bisphenol A type, bisphenol F type, bisphenol S Type, etc.) cyanate ester-based hardeners, and prepolymers in which some of them are triazinated. The weight average molecular weight of the cyanate-based hardener is not particularly limited, but is preferably 500 to 4500, and more preferably 600 to 3000. Specific examples of the cyanate-based curing agent include, for example, bisphenol A dicyanate, polyphenol cyanate (oligo (3-methylene-1,5-phenylene cyanate), 4,4 '-Methylenebis (2,6-dimethylphenylcyanate), 4,4'-ethylenediphenyldicyanate, hexafluorobisphenol A dicyanate, 2,2 -Bis (4-cyanate) phenylpropane, 1,1-bis (4-cyanatephenylphenylmethane), bis (4-cyanate-3,5-dimethylphenyl) Methane, 1,3-bis (4-cyanatephenyl-1- (methylethylene)) benzene, bis (4-cyanatephenyl) sulfide, bis (4-cyanate Difunctional cyanate resins such as phenyl phenyl ether, polyfunctional cyanate resins derived from phenol novolacs, cresol novolacs, phenol resins containing a dicyclopentadiene structure, etc., part of these cyanate resins Triazinated prepolymers, etc. These can be used singly or in combination of two or more. Commercially available cyanate resins are listed as phenol novolac-type polyfunctional cyanate resins represented by the following formula (7) (Japan LON30 (PT), PT30, cyanate equivalent 124), a part or all of a prepolymer of a bisphenol A dicyanate represented by the following formula (8) (Japanese) LONZA (stock), BA230, cyanate equivalent 232), a cyanate resin containing a dicyclopentadiene structure represented by the following formula (9) (Japanese LONZA (stock), DT-4000, DT-7000) Wait.

Figure TWI609917BD00009
[式中,n表示平均值而為任意數(較好為0~20)]。
Figure TWI609917BD00009
[In the formula, n represents an average value and is an arbitrary number (preferably 0 to 20)].

Figure TWI609917BD00010
Figure TWI609917BD00010

Figure TWI609917BD00011
(式中,n表示平均值而為0~5之數)。
Figure TWI609917BD00011
(In the formula, n represents an average value and is a number from 0 to 5.)

酸酐系硬化劑並無特別限制,但可列舉為苯二甲酸酐、四氫苯二甲酸酐、六氫苯二甲酸酐、甲基四氫苯二甲酸酐、甲基六氫苯二甲酸酐、甲基納地酸(nadic acid)酐、氫化甲基納地酸酐、三烷基四氫苯二甲酸酐、十二碳烯基琥珀酸酐、5-(2,5-二氧代四氫-3-呋喃基)-3-甲基-3-環己烯-1,2-二羧酸酐、偏苯三酸酐、均苯四酸酐、二苯甲酮四羧酸二酐、聯苯四羧酸二酐、萘四羧酸二酐、氧基二苯二甲酸酐、3,3’,4,4’-二苯基碸四羧酸二酐、1,3,3a,4,5,9b-六氫-5-(四氫-2,5-二氧代-3-呋喃基)-萘并[1,2-C]呋喃-1,3-二酮、乙二醇雙(偏苯三酸酐)、苯乙烯與馬來酸共聚合而成之苯乙烯.馬來酸樹脂等之聚合物型酸酐等。 The acid anhydride-based hardener is not particularly limited, and examples thereof include phthalic anhydride, tetrahydrophthalic anhydride, hexahydrophthalic anhydride, methyltetrahydrophthalic anhydride, methylhexahydrophthalic anhydride, Methyl nadic acid anhydride, hydrogenated methyl natic anhydride, trialkyltetrahydrophthalic anhydride, dodecenylsuccinic anhydride, 5- (2,5-dioxotetrahydro-3 -Furyl) -3-methyl-3-cyclohexene-1,2-dicarboxylic anhydride, trimellitic anhydride, pyromellitic anhydride, benzophenone tetracarboxylic dianhydride, biphenyltetracarboxylic dianhydride, naphthalene Tetracarboxylic dianhydride, oxydiphthalic anhydride, 3,3 ', 4,4'-diphenylphosphonium tetracarboxylic dianhydride, 1,3,3a, 4,5,9b-hexahydro-5 -(Tetrahydro-2,5-dioxo-3-furanyl) -naphtho [1,2-C] furan-1,3-dione, ethylene glycol bis (trimellitic anhydride), styrene and malay Acid copolymerized styrene. Polymeric acid anhydrides such as maleic resin.

本發明之樹脂組成物中,就提高樹脂組成物之硬化物之機械強度或耐水性之觀點而言,(A)環氧樹脂之環氧基之合計與(E)硬化劑之反應基之合計數之比,較好為1:0.2~2,更好為1:0.3~1.5,又更好為1:0.4~1。又樹脂組成物中存在之環氧樹脂之環氧基之合計數為針對全部之環氧樹脂,將各環氧樹脂之固體成分質量除以環氧當量之值合計而得之值,所謂硬化劑之反應基之合計數為針對所有硬化劑,將各硬化劑之固體成分質量除以反應基當量之值合計而得之值。 In the resin composition of the present invention, from the viewpoint of improving the mechanical strength or water resistance of the cured product of the resin composition, the total of (A) the epoxy group of the epoxy resin and (E) the total of the reactive groups of the curing agent. The number ratio is preferably 1: 0.2 ~ 2, more preferably 1: 0.3 ~ 1.5, and even more preferably 1: 0.4 ~ 1. The total number of epoxy groups of epoxy resins present in the resin composition is a value obtained by dividing the solid content mass of each epoxy resin by the epoxy equivalent value for all epoxy resins. The total number of reaction groups is a value obtained by dividing the solid content mass of each hardener by the value of the reaction group equivalents for all the hardeners.

〈(F)熱可塑性樹脂〉 <(F) Thermoplastic resin>

本發明之樹脂組成物中,可藉由進而含有(F)熱可塑 性樹脂而提高硬化物之機械強度,另外亦可提高以接著薄膜之形態使用時之薄膜成型能。至於該熱可塑性樹脂可列舉為苯氧樹脂、聚醯亞胺樹脂、聚醯胺醯亞胺樹脂、聚醚醯亞胺樹脂、聚碸樹脂、聚醚碸樹脂、聚苯醚樹脂、聚碳酸酯樹脂、聚醚醚酮樹脂、聚酯樹脂。該等熱可塑性樹脂可個別單獨使用,亦可組合兩種以上使用。熱可塑性樹脂之重量平均分子量較好為5000~200000之範圍。小於該範圍時會有無法充分發揮薄膜成型能或機械強度提高之效果,大於該範圍時氰酸酯樹脂及萘酚型環氧樹脂之相溶性不足,硬化後之表面凹凸變大,會有難以形成高密度微細配線之傾向。又本發明中之重量平均分子量係以凝膠滲透層析(GPC)法(換算聚苯乙烯)測定。以GPC法測定之重量平均分子量具體而言可使用島津製作所(股)製之LC-9A/RID-6A作為測定裝置,使用昭和電工(股)公司製造之Shodex K-800P/K-804L/K-804L作為管柱,使用氯仿作為移動相,在管柱溫度40℃下測定,使用標準聚苯乙烯之校正線算出。 The resin composition of the present invention may further contain (F) thermoplastic resin. This resin improves the mechanical strength of the cured product, and also improves the film forming performance when used in the form of a film. Examples of the thermoplastic resin include phenoxy resin, polyimide resin, polyimide resin, polyether imide resin, polyfluorene resin, polyether resin, polyphenylene ether resin, and polycarbonate. Resin, polyetheretherketone resin, polyester resin. These thermoplastic resins can be used individually or in combination of two or more. The weight average molecular weight of the thermoplastic resin is preferably in the range of 5000 to 200,000. If it is smaller than this range, the film forming ability or the effect of improving the mechanical strength cannot be fully exerted. When it is larger than this range, the compatibility of the cyanate resin and the naphthol type epoxy resin is insufficient, and the surface unevenness after hardening becomes large, making it difficult. A tendency to form high-density fine wiring. The weight average molecular weight in the present invention is measured by a gel permeation chromatography (GPC) method (equivalent to polystyrene). Specifically, the weight-average molecular weight measured by the GPC method can use LC-9A / RID-6A manufactured by Shimadzu Corporation as a measuring device, and Shodex K-800P / K-804L / K manufactured by Showa Denko Corporation -804L was used as a column, and chloroform was used as a mobile phase. The column temperature was measured at 40 ° C, and calculated using a calibration line of standard polystyrene.

本發明之樹脂組成物中調配(F)熱可塑性樹脂時,樹脂組成物中之熱可塑性樹脂之含量並無特別限制,但相對於樹脂組成物中之不揮發分100質量%,較好為0.1~10質量%,更好為1~5質量%。熱可塑性樹脂之含量太少時會有無法發揮薄膜成型能或提高機械強度之效果之傾向,太多時熔融黏度上升時,會有濕式粗化步驟後之絕緣層表面之算術平均粗糙度增大之傾向。 When the (F) thermoplastic resin is blended in the resin composition of the present invention, the content of the thermoplastic resin in the resin composition is not particularly limited, but it is preferably 0.1% by mass with respect to 100% by mass of the nonvolatile matter in the resin composition. ~ 10 mass%, more preferably 1 to 5 mass%. When the content of the thermoplastic resin is too small, the film forming ability or the effect of improving the mechanical strength tends to be insufficient. When the content of the thermoplastic resin is too high, the arithmetic average roughness of the surface of the insulating layer after the wet roughening step increases. Great tendency.

〈(G)橡膠粒子〉 <(G) Rubber particles>

本發明之樹脂組成物可藉由進而含有(G)橡膠粒子,而提高鍍敷剝離強度,亦可獲得鑽孔加工性之提高、介電正切之下降、應力緩和效果。本發明中可使用之橡膠粒子為例如不溶解於調製該樹脂組成物之漆料時使用之有機溶劑中,且與必要成分氰酸酯樹脂或環氧樹脂等亦不相溶者。據此,該橡膠粒子係以分散狀態存在於本發明之樹脂組成物之漆料中。該橡膠粒子一般係使橡膠成分之分子量大到無法溶解於有機溶劑或樹脂中之程度,成為粒子狀而調製。 The resin composition of the present invention can further improve the plating peeling strength by further containing (G) rubber particles, and can also improve the drilling processability, reduce the dielectric tangent, and reduce the stress. The rubber particles that can be used in the present invention are, for example, those which are insoluble in an organic solvent used when preparing a paint for the resin composition, and are incompatible with cyanate resin or epoxy resin, which are essential components. Accordingly, the rubber particles are present in a dispersed state in the paint of the resin composition of the present invention. The rubber particles are generally prepared by making the molecular weight of the rubber component so large that it cannot be dissolved in an organic solvent or resin, and the particles are in the form of particles.

本發明中可使用之橡膠粒子之較佳例列舉為蕊殼型橡膠粒子、交聯丙烯腈丁二烯橡膠粒子、交聯苯乙烯丁二烯橡膠粒子、丙烯酸橡膠粒子等。蕊殼型橡膠粒子為具有蕊層與殼層之橡膠粒子,列舉為例如外層之殼層以玻璃狀聚合物構成,內層之蕊層以橡膠狀聚合物構成之二層構造,或外層之殼層以玻璃狀聚合物構成,中間層以橡膠狀聚合物構成,蕊層以玻璃狀聚合物構成之三層構造者等。玻璃狀聚合物層為例如以甲基丙烯酸甲酯之聚合物等構成,橡膠狀聚合物層為例如以丙烯酸丁酯聚合物(丁基橡膠)等構成。橡膠粒子亦可組合兩種以上使用。蕊殼型橡膠粒子之具體例列舉為STAFILOID AC3832、AC3816N、IM-401改1、IM-401改7-17(商品名,GANTZ化成(股)製)、METAPLENE KW-4426(商品名,三菱縲縈(股)製)。交聯丙烯腈丁二烯橡膠(NBR)粒子之具體例列舉 為XER-91(平均粒徑0.5μm,JSR(股)製)等。交聯苯乙烯丁二烯橡膠(SBR)粒子之具體例列舉為XSK-500(平均粒徑0.5μm,JSR(股)製)等。丙烯酸橡膠粒子之具體例可列舉為METAPLENE W300A(平均粒徑0.1μm)、W450A(平均粒徑0.2μm)(三菱縲縈(股)製造)。 Preferable examples of the rubber particles usable in the present invention include core-shell type rubber particles, crosslinked acrylonitrile butadiene rubber particles, crosslinked styrene butadiene rubber particles, acrylic rubber particles, and the like. Core-shell type rubber particles are rubber particles having a core layer and a shell layer. For example, the shell layer of the outer layer is composed of a glass-like polymer, the core layer of the inner layer is a two-layer structure composed of a rubber-like polymer, or the shell of the outer layer The layer is composed of a glass-like polymer, the intermediate layer is composed of a rubber-like polymer, and the core layer is composed of a three-layer structure composed of a glass-like polymer. The glassy polymer layer is formed of, for example, a polymer of methyl methacrylate, and the rubbery polymer layer is formed of, for example, butyl acrylate polymer (butyl rubber). The rubber particles may be used in combination of two or more. Specific examples of the core-shell type rubber particles are STAFILOID AC3832, AC3816N, IM-401 to 1, IM-401 to 7-17 (trade name, manufactured by GANTZ Kasei Co., Ltd.), and METAPLENE KW-4426 (trade name, Mitsubishi Corporation萦 (shares) system). Specific examples of crosslinked acrylonitrile butadiene rubber (NBR) particles XER-91 (average particle diameter: 0.5 μm, manufactured by JSR (strand)) and the like. Specific examples of the cross-linked styrene butadiene rubber (SBR) particles include XSK-500 (average particle diameter: 0.5 μm, manufactured by JSR). Specific examples of the acrylic rubber particles include METAPLENE W300A (average particle diameter of 0.1 μm) and W450A (average particle diameter of 0.2 μm) (manufactured by Mitsubishi Chemical Corporation).

調配之橡膠粒子之平均粒徑較好為0.005~1μm之範圍,更好為0.2~0.6μm之範圍。本發明中使用之橡膠粒子之平均粒徑可使用動態光散射法測定。例如,利用超音波等將橡膠粒子均勻分散於適當有機溶劑中,使用濃厚系粒徑分析儀(FPAR-1000;大塚電子(股)製造),以質量基準作成橡膠粒子之粒度分佈,且將其中值直徑作為平均粒徑予以測定。 The average particle diameter of the prepared rubber particles is preferably in the range of 0.005 to 1 μm, and more preferably in the range of 0.2 to 0.6 μm. The average particle diameter of the rubber particles used in the present invention can be measured using a dynamic light scattering method. For example, the rubber particles are uniformly dispersed in an appropriate organic solvent by using ultrasonic waves, etc., and the particle size distribution of the rubber particles is prepared on a mass basis using a thick particle size analyzer (FPAR-1000; manufactured by Otsuka Electronics Co., Ltd.), and The value diameter is measured as an average particle diameter.

橡膠粒子之含量相對於樹脂組成物中之不揮發分100質量%,較好為1~10質量%,更好為2~5質量%。 The content of the rubber particles is preferably 1 to 10% by mass, and more preferably 2 to 5% by mass based on 100% by mass of the nonvolatile matter in the resin composition.

〈(H)難燃劑〉 <(H) flame retardant>

本發明之樹脂組成物可藉由進而含有(H)難燃劑,而賦予難燃性。至於難燃劑列舉為例如有機磷系難燃劑、有機系含氮之磷化合物、氮化合物、矽系難燃劑、金屬氧化物等。有機磷系難燃劑列舉為三光(股)製造之HCA、HCA-HQ、HCA-NQ等菲型磷化合物,昭和高分子(股)製造之HFB-2006M等含磷之苯并噁嗪化合物、味之素精密技術(股)製造之REOFOS 30、50、65、90、110、TPP、RPD、BAPP、CPD、TCP、TXP、TBP、TOP、KP140、TIBP,北興化 學工業(股)製造之TPPO、PPQ,CLARIANT(股)製造之OP930,大八化學(股)製造之PX200等之磷酸酯化合物,東都化成(股)製造之FX289、FX305、TX0712等之含磷之環氧樹脂,東都化成(股)製造之ERF001等之含有磷之苯氧樹脂,日本環氧樹脂(股)製造之YL7613等之含有磷之環氧樹脂等。有機系含氮之磷化合物列舉為四國化成工業(股)製造之SP670、SP703等磷酸酯醯胺化合物、大塚化學(股)公司製造之SPB100、SPE100,伏見製藥所(股)製造之FP-系列等之磷腈(phosphazene)化合物等。金屬氫氧化物列舉為宇都材料(股)製造之UD65、UD650、UD653等之氫氧化鎂,巴工業(股)公司製造之B-30、B-325、B-315、B-308、B-303、UFH-20等之氫氧化鋁等。 The resin composition of the present invention can impart flame retardancy by further containing (H) a flame retarder. Examples of the flame retardant include organic phosphorus-based flame retardants, organic nitrogen-containing phosphorus compounds, nitrogen compounds, silicon-based flame retardants, metal oxides, and the like. Organophosphorus-based flame retardants include phenanthrene phosphorus compounds such as HCA, HCA-HQ, and HCA-NQ manufactured by Sanko, and phosphorus-containing benzoxazine compounds such as HFB-2006M manufactured by Showa High Polymers. REOFOS 30, 50, 65, 90, 110, TPP, RPD, BAPP, CPD, TCP, TXP, TBP, TOP, KP140, TIBP manufactured by Ajinomoto Precision Technology Co., Ltd. Phosphate compounds such as TPPO and PPQ manufactured by Gakuin Industry Co., Ltd., OP930 manufactured by CLARIANT Co., Ltd., PX200 manufactured by Da Yah Chemical Co., Ltd., and phosphorus-containing compounds such as FX289, FX305, TX0712 manufactured by Todo Chemical Co., Ltd. Epoxy resin, phosphorus-containing phenoxy resins such as ERF001 manufactured by Totsu Kasei Co., Ltd., and phosphorus-containing epoxy resins such as YL7613 manufactured by Japan Epoxy Resins Co., Ltd. Organic nitrogen-containing phosphorus compounds are listed as phosphate ester compounds such as SP670 and SP703 manufactured by Shikoku Chemical Industries, Ltd., SPB100 and SPE100 manufactured by Otsuka Chemical Co., Ltd., and FP- manufactured by Fushimi Pharmaceutical Co., Ltd. Series of phosphazene compounds and the like. The metal hydroxides are listed as magnesium hydroxides such as UD65, UD650, and UD653 manufactured by Utsu Materials, and B-30, B-325, B-315, B-308, and B- 303, UFH-20, etc.

難燃劑之含量相對於樹脂組成物中之不揮發分100質量%,較好為0.5~10質量%,更好為1~5質量%。 The content of the flame retardant is based on 100% by mass of the nonvolatile matter in the resin composition, preferably 0.5 to 10% by mass, and more preferably 1 to 5% by mass.

〈其他成分〉 〈Other ingredients〉

本發明之樹脂組成物在不妨礙本發明效果之範圍內,可視需要調配其他成分。至於其他成分可列舉為如乙烯基苯化合物、丙烯酸化合物、馬來醯亞胺化合物、嵌段異氰酸酯化合物之熱硬化性樹脂,矽粉、尼龍粉、氟粉等有機填充劑,Oluben、Benton等增黏劑,聚矽氧系、氟系、高分子系消泡劑或平流劑,咪唑系、噻唑系、三唑系、矽烷系偶合劑等密著性賦予劑,酞菁.藍、酞菁.綠、碘.綠、順式偶氮黃、碳黑等著色劑等。 The resin composition of the present invention may be blended with other components as long as the effect of the present invention is not hindered. As for the other components, there can be mentioned thermosetting resins such as vinylbenzene compounds, acrylic compounds, maleimide compounds, and block isocyanate compounds, organic fillers such as silicon powder, nylon powder, and fluorine powder. Oluben, Benton, etc. Adhesive, polysiloxane-based, fluorine-based, polymer-based defoamer or advection agent, imidazole-based, thiazole-based, triazole-based, silane-based coupling agents and other adhesion-imparting agents, phthalocyanine. Blue, phthalocyanine. Green and iodine. Colorants such as green, cis azo yellow, and carbon black.

本發明之樹脂組成物之調製方法並無特別限制,列舉為例如將調配之成分添加視需要之溶劑等,且使用旋轉混練機等混合之方法等。 The method for preparing the resin composition of the present invention is not particularly limited, and examples thereof include a method of adding a component to be prepared, a solvent as required, and the like, and mixing using a rotary kneader or the like.

本發明之樹脂組成物之用途並無特別限制,但可使用於接著薄膜、預浸片等之絕緣樹脂薄片,電路基板(層合板、多層印刷配線板等)、抗焊劑、底部填充材、黏晶材、半導體封裝材、埋孔樹脂、零件埋入樹脂等之以樹脂組成物為必要之用途之廣範圍中。其中,在多層印刷配線板之製造中,可較好地使用作為用以形成絕緣層之樹脂組成物(多層印刷配線板之絕緣層用樹脂組成物),可較好地使用作為用以藉由鍍敷形成導體層之樹脂組成物(藉由鍍敷形成導體層之多層印刷配線板之絕緣層用樹脂組成物),可更好地使用作為用以形成增層之樹脂組成物(多層印刷配線板之增層用樹脂組成物)。本發明之樹脂組成物亦可以漆料狀態塗佈於電路基板上而形成絕緣層,但工業上一般較好以接著薄膜、預浸片等薄片狀層合材料之形態使用。樹脂組成物之軟化點就薄片狀層合材料之層合性之觀點而言較好為40~150℃。 The use of the resin composition of the present invention is not particularly limited, but it can be used for insulating resin sheets such as films, prepregs, circuit boards (laminates, multilayer printed wiring boards, etc.), solder resist, underfill materials, adhesives, etc. Crystal materials, semiconductor packaging materials, buried-hole resins, and embedded resins are used in a wide range of applications where a resin composition is necessary. Among them, in the manufacture of a multilayer printed wiring board, a resin composition for forming an insulating layer (resin composition for an insulating layer of a multilayer printed wiring board) can be preferably used, and it can be suitably used as The resin composition for forming a conductor layer by plating (the resin composition for an insulating layer of a multilayer printed wiring board by which the conductor layer is formed by plating) can be better used as a resin composition for forming an additional layer (multilayer printed wiring) Resin composition for buildup of boards). The resin composition of the present invention can also be coated on a circuit board to form an insulating layer in a paint state, but it is generally preferred to use it in the form of a sheet-like laminated material such as a film and a prepreg in the industry. The softening point of the resin composition is preferably from 40 to 150 ° C from the viewpoint of the lamination property of the sheet-like laminate.

〈接著薄膜〉 <Adhesive film>

本發明之接著薄膜可藉本技藝者公知之方法,例如,將樹脂組成物溶解於有機溶劑中調製樹脂漆料,使用模嘴塗佈器等,將該樹脂漆料塗佈於支撐體上,再經加熱,或者以熱風吹拂等將有機溶劑乾燥,形成樹脂組成物層而製 造。 The adhesive film of the present invention can be prepared by a method known to those skilled in the art, for example, the resin composition is dissolved in an organic solvent to prepare a resin varnish, and the resin varnish is applied to a support using a die applicator, etc. It is then prepared by heating or drying the organic solvent with hot air to form a resin composition layer. Made.

有機溶劑列舉為例如丙酮、甲基乙基酮、環己酮等酮類,乙酸乙酯、乙酸丁酯、溶纖素乙酸酯、丙二醇單甲醚乙酸酯、卡必醇乙酸酯等乙酸酯類,溶纖素、丁基卡必醇等卡必醇類,甲苯、二甲苯等芳香族烴類,二甲基甲醯胺、二甲基乙醯胺、N-甲基吡咯烷酮等醯胺系溶劑等。有機溶劑亦可組合兩種以上使用。 Examples of organic solvents include ketones such as acetone, methyl ethyl ketone, and cyclohexanone; ethyl acetate, butyl acetate, cellosolve acetate, propylene glycol monomethyl ether acetate, and carbitol acetate. Acetates, carbitols such as lyocells, butyl carbitol, aromatic hydrocarbons such as toluene and xylene, dimethylformamide, dimethylacetamide, N-methylpyrrolidone, etc. Amine-based solvents. The organic solvent may be used in combination of two or more.

乾燥條件並無特別限制,但以使有機溶劑對樹脂組成物層之含量成為10質量%以下,較好成為5質量%以下之方式乾燥。漆料中之有機溶劑量雖因有機溶劑之沸點而有不同,但例如藉由使含有30~60質量%之有機溶劑之漆料在50~150℃乾燥3~10分鐘左右,可形成樹脂組成物層。 The drying conditions are not particularly limited, but drying is performed so that the content of the organic solvent to the resin composition layer becomes 10% by mass or less, and preferably 5% by mass or less. Although the amount of organic solvent in the paint varies depending on the boiling point of the organic solvent, for example, by drying a paint containing 30 to 60% by mass of an organic solvent at 50 to 150 ° C for about 3 to 10 minutes, a resin composition can be formed. Physical layer.

接著薄膜中形成之樹脂組成物層之厚度較好為導體層之厚度以上。電路基板所具有之導體層之厚度通常為5~70μm之範圍,故樹脂組成物層較好具有10~100μm之厚度。 The thickness of the resin composition layer formed in the next film is preferably equal to or greater than the thickness of the conductor layer. The thickness of the conductor layer of the circuit substrate is usually in the range of 5 to 70 μm, so the resin composition layer preferably has a thickness of 10 to 100 μm.

支撐體列舉為聚乙烯、聚丙烯、聚氯化乙烯等聚烯烴之薄膜、聚對苯二甲酸乙二酯(以下有時簡稱為「PET」)、聚萘二甲酸乙二酯等聚酯之薄膜,聚碳酸酯薄膜、聚醯亞胺薄膜等各種塑膠薄膜。且亦可使用脫模紙或銅箔、鋁箔等之金屬箔等。支撐體及後述之保護薄膜亦可施以消光處理、電暈處理等表面處理。且,亦可藉聚矽氧樹脂系脫模劑、醇酸樹脂系脫模劑、氟樹脂系脫模劑等脫模劑施以脫模處理。 Examples of the support include polyolefin films such as polyethylene, polypropylene, and polyvinyl chloride, polyethylene terephthalate (hereinafter sometimes referred to as "PET"), and polyesters such as polyethylene naphthalate. Film, polycarbonate film, polyimide film and other plastic films. In addition, release foil, metal foil such as copper foil, aluminum foil, etc. can also be used. The support and a protective film described later may be subjected to surface treatments such as matting treatment and corona treatment. In addition, a release treatment may be performed using a release agent such as a silicone resin-based release agent, an alkyd resin-based release agent, or a fluororesin-based release agent.

支撐體之厚度並無特別限制,較好為10~150μm,更好為25~50μm。 The thickness of the support is not particularly limited, but is preferably 10 to 150 μm, and more preferably 25 to 50 μm.

樹脂組成物層之未密著支撐體之面可依照支撐體進而層合保護薄膜。保護薄膜之厚度並無特別限制,但可為例如1~40 μm。藉由層合保護薄膜,可防止於樹脂組成物層表面附著塵埃或傷痕。接著薄膜亦可捲繞成輥狀貯存。 The surface of the resin composition layer that is not in contact with the support may be laminated with a protective film according to the support. The thickness of the protective film is not particularly limited, but may be, for example, 1 to 40 μm. By laminating the protective film, dust or scratches can be prevented from adhering to the surface of the resin composition layer. The film can then be rolled into a roll and stored.

〈使用接著薄膜之多層印刷配線板〉 〈Multilayer printed wiring board using film bonding〉

接著,說明使用如上述製造之接著薄膜製造多層印刷配線板之方法之一例。 Next, an example of a method for manufacturing a multilayer printed wiring board using the adhesive film manufactured as described above will be described.

首先,使用真空層合機,將接著薄膜層合於電路基板之單面或兩面上。電路基板上使用之基板列舉為例如玻璃環氧基板、金屬基板、聚酯基板、聚醯亞胺基板、BT樹脂基板、熱硬化型聚苯醚基板等。又,此處所謂電路基板意指在如上述之基板之單面或兩面上形成經圖型加工之導體層(電路)者。且在交互層合導體層與絕緣層之多層印刷配線板中,該多層印刷配線板之最外層之單面或兩面亦可經圖型加工成為導體層(電路)者,且包含於此處所稱之電路基板中。有導體層表面亦可藉由黑化處理、銅蝕刻處理等施以預粗化處理。 First, using a vacuum laminator, the adhesive film was laminated on one or both sides of a circuit board. Examples of the substrate used on the circuit substrate include a glass epoxy substrate, a metal substrate, a polyester substrate, a polyimide substrate, a BT resin substrate, and a thermosetting polyphenylene ether substrate. The term "circuit board" as used herein means a patterned conductor layer (circuit) formed on one or both sides of the substrate as described above. And in a multilayer printed wiring board that alternately laminates a conductor layer and an insulating layer, one or both sides of the outermost layer of the multilayer printed wiring board can also be patterned into a conductor layer (circuit), and is included herein as referred to herein Circuit board. The surface of the conductor layer may be pre-roughened by blackening treatment, copper etching treatment, or the like.

上述層合中,接著薄膜具有保護薄膜時,在去除該保護薄膜後,可視需要預加熱接著薄膜及電路基板,且邊加壓及加熱接著薄膜邊壓著電路基板。本發明之接著薄膜中,較好使用以真空層合法在減壓下層合於電路基板上之方 法。層合條件並無特別限制,例如壓著溫度(層合溫度)較好為70~140℃,壓著壓力較好為1~11kgf/cm2(9.8×104~107.9×104N/m2),且較好在空氣壓20mmHg(26.7hPa)以下之減壓下層合。另外,層合方法可為批式亦可為輥的連續式。真空層合可使用市售之真空層合機。市售之真空層合機可列舉為例如NICHIGO MORTON(股)製之真空塗佈機、名機製作所(股)製造之真空加壓式層合機、日立工業(股)製造之輥式乾燥塗佈、日立AIC(股)製造之真空層合機等。 In the above-mentioned lamination, when the adhesive film has a protective film, after removing the protective film, the adhesive film and the circuit substrate may be preheated as necessary, and the circuit substrate may be pressed while pressing and heating the adhesive film. In the adhesive film of the present invention, a method in which a vacuum lamination method is used to laminate a circuit substrate under reduced pressure is preferably used. The lamination conditions are not particularly limited, for example, the pressing temperature (laminating temperature) is preferably 70 to 140 ° C, and the pressing pressure is preferably 1 to 11 kgf / cm 2 (9.8 × 10 4 to 107.9 × 10 4 N / m 2 ), and preferably laminated under a reduced pressure of an air pressure of 20 mmHg (26.7 hPa) or less. The lamination method may be a batch method or a continuous method of a roll. For vacuum lamination, a commercially available vacuum laminator can be used. Commercially available vacuum laminators include, for example, a vacuum coater made by NICHIGO MORTON, a vacuum pressurized laminator made by Meiji Seisakusho, and a roll dry coating made by Hitachi Kogyo. Fabrics, vacuum laminators manufactured by Hitachi AIC, etc.

且,在減壓下進行加熱及加壓之層合步驟亦可使用一般真空熱壓機進行。例如,可藉由自支撐體層側壓製經加熱之SUS等金屬板進行。壓製條件係使減壓度通常為1×10-2MPa以下,較好為1×10-3MPa以下之減壓下。加熱及加壓可以一階段進行,但就控制樹脂滲入之觀點而言,較好分成兩階段以上之條件進行。例如,以第一階段之壓製在溫度70~150℃,壓力在1~15kgf/cm2之範圍,第二階段之壓製在溫度150~200℃,壓力在1~40kgf/cm2之範圍進行較佳。各階段之時間較好進行30~120分鐘。市售之真空熱壓機列舉為例如MNPC-V-750-5-200(名機製作所(股)製)、VH1-1603(北川精機(股)製)等。 The laminating step of heating and pressing under reduced pressure can also be performed using a general vacuum hot press. For example, it can be performed by pressing a heated metal plate such as SUS from the support layer side. The pressing conditions are such that the degree of reduced pressure is usually 1 × 10 -2 MPa or less, and preferably 1 × 10 -3 MPa or less. The heating and pressing may be performed in one stage, but from the viewpoint of controlling resin penetration, it is preferably performed in two or more stages. For example, in the first stage of pressing at a temperature of 70 to 150 ° C, the pressure is in the range of 1 to 15 kgf / cm 2 , and in the second stage of pressing at a temperature of 150 to 200 ° C, the pressure is in the range of 1 to 40 kgf / cm 2 good. The time of each stage is preferably 30 ~ 120 minutes. Commercially available vacuum hot presses include, for example, MNPC-V-750-5-200 (made by Meiki Seisakusho Co., Ltd.), VH1-1603 (made by Kitagawa Seiki Co., Ltd.), and the like.

將接著薄膜層合於電路基板上後,冷卻至室溫附近後,剝離支撐體之情況下,可藉由剝離、熱硬化而於電路基板上形成絕緣層。熱硬化之條件只要依據樹脂組成物中之樹脂成分種類、含量等適當選擇即可,但較好在150℃~220℃下20分鐘~180分鐘,更好在160℃~210℃下30~ 120分鐘之範圍內選擇。 After the adhesive film is laminated on the circuit substrate, and after cooling to a temperature near room temperature, when the support is peeled off, an insulating layer can be formed on the circuit substrate by peeling and thermal curing. The conditions for heat curing may be appropriately selected according to the type and content of the resin component in the resin composition, but it is preferably 20 minutes to 180 minutes at 150 ° C to 220 ° C, and more preferably 30 to 160 ° C to 210 ° C. Choose within 120 minutes.

形成絕緣層後,在硬化前未剝離支撐體之情況下,則在此時剝離。接著視需要,對在電路基板上形成之絕緣層上進行開孔,形成通孔、貫穿孔。開孔可利用例如鑽孔、雷射、電漿等習知方法,且可視需要組合該等方法進行,但最一般方法為利用二氧化碳氣體雷射、YAG雷射等雷射進行開孔。 After the insulating layer is formed, if the support is not peeled before curing, it is peeled at this time. Then, if necessary, a hole is formed in the insulating layer formed on the circuit substrate to form a through hole and a through hole. The drilling can be performed by conventional methods such as drilling, laser, plasma, etc., and can be combined according to the needs, but the most common method is to use carbon dioxide gas laser, YAG laser and other lasers for drilling.

接著,利用乾式鍍敷或濕式鍍敷在絕緣層上形成導體層。乾式鍍敷可使用蒸鍍、濺鍍、離子電鍍等習知方法。濕式鍍敷之情況係藉由絕緣層表面依序進行以膨潤液進行膨潤處理,以氧化劑進行粗化處理及以中和液進行中和處理,形成凹凸之投錨。以膨潤液進行之膨潤處理係使絕緣層在50~80℃膨潤液中浸漬5~20分鐘進行。至於膨潤液列舉為鹼性溶液、界面活性劑溶液等,較好為鹼性溶液,至於該鹼性溶液列舉為例如氫氧化鈉溶液、氫氧化鉀溶液等。市售膨潤液可列舉為例如日本ATOTECH(股)製造之Swelling Dip Securiganth P、Swelling Dip Securiganth SBU等。利用氧化劑進行之粗化處理係使絕緣層在60~80℃氧化劑溶液中浸漬10分鐘~30分鐘進行。氧化劑可列舉為例如使過錳酸鉀或過錳酸鈉溶解於氫氧化鈉之水溶液中而成之鹼性過錳酸溶液、重鉻酸鹽、臭氧、過氧化氫/硫酸、硝酸等。且,鹼性過錳酸溶液中之過錳酸鹽濃度較好為5~10重量%。市售之氧化劑列舉為例如日本ATOTECH(股)製造之CONCENTRATE.COMPACT CP、 DOSING SOLUTION SECURIGANTH P等鹼性過錳酸溶液。以中和液進行之中和處理係在30~50℃中和液中浸漬3~10分鐘進行。至於中和液較好為酸性水溶液,市售品列舉為日本ATOTECH(股)製造之REDUCTION SOLUTION SECURIGANTH P。 Next, a conductive layer is formed on the insulating layer by dry plating or wet plating. For the dry plating, conventional methods such as vapor deposition, sputtering, and ion plating can be used. In the case of wet plating, the surface of the insulating layer is sequentially subjected to a swelling treatment with a swelling solution, a roughening treatment with an oxidizing agent, and a neutralization treatment with a neutralizing solution to form an uneven anchor. The swelling treatment with a swelling liquid is performed by immersing the insulating layer in a swelling liquid at 50 to 80 ° C. for 5 to 20 minutes. The swelling liquid is exemplified by an alkaline solution, a surfactant solution, and the like, preferably an alkaline solution, and the alkaline solution is exemplified by a sodium hydroxide solution, a potassium hydroxide solution, and the like. Examples of commercially available swelling liquids include Swelling Dip Securiganth P, Swelling Dip Securiganth SBU, etc. manufactured by ATOTECH Japan. The roughening treatment by the oxidant is performed by immersing the insulating layer in an oxidant solution at 60 to 80 ° C for 10 to 30 minutes. Examples of the oxidizing agent include an alkaline permanganic acid solution obtained by dissolving potassium permanganate or sodium permanganate in an aqueous solution of sodium hydroxide, dichromate, ozone, hydrogen peroxide / sulfuric acid, nitric acid, and the like. In addition, the permanganate concentration in the alkaline permanganic acid solution is preferably 5 to 10% by weight. Commercially available oxidants are listed as, for example, CONCENTRATE manufactured by ATOTECH Japan. COMPACT CP, DOSING SOLUTION SECURIGANTH P and other alkaline permanganic acid solutions. Neutralization treatment with a neutralizing solution is performed by immersing in a neutralizing solution at 30 to 50 ° C for 3 to 10 minutes. As for the neutralization solution, an acidic aqueous solution is preferred, and commercially available products are REDUCTION SOLUTION SECURIGANTH P manufactured by ATOTECH Japan.

接著,組合無電解鍍敷與電解鍍敷形成導體層。且亦可形成與導體層相反圖型之鍍敷抗蝕劑,僅以無電解鍍敷形成導體層。至於隨後之圖型形成方法,可使用例如本技藝者已知之削減法、半加成法等。 Next, the electroless plating and electrolytic plating are combined to form a conductor layer. In addition, a plating resist having a pattern opposite to that of the conductor layer may be formed, and the conductor layer may be formed only by electroless plating. As for the subsequent pattern formation method, for example, a reduction method, a semi-addition method, and the like known to those skilled in the art can be used.

〈預浸片〉 <Prepreg sheet>

本發明之預浸片可利用熱熔融法或溶劑法將本發明之樹脂組成物含浸於由纖維組成之薄片狀補強基材中,藉由加熱半硬化而製造。亦即,成為使本發明之樹脂組成物含浸於由纖維組成之薄片狀補強基材中之狀態之預浸片。由纖維組成之薄片狀補強基材可使用例如由玻璃布或芳醯胺纖維等之作為預浸片用纖維常用之纖維所成者。 The prepreg sheet of the present invention can be produced by impregnating the resin composition of the present invention in a sheet-like reinforcing substrate composed of fibers by a hot melt method or a solvent method, and heating and semi-hardening it. That is, it is a prepreg in a state where the resin composition of the present invention is impregnated in a sheet-like reinforcing substrate composed of fibers. As the sheet-like reinforcing substrate composed of fibers, for example, a fiber commonly used as a fiber for prepregs such as glass cloth or aramide fiber can be used.

熱熔融法為不使樹脂溶解於有機溶劑中,而是暫時塗佈於與該樹脂之剝離性良好之塗佈紙上,使之層合於薄片狀補強基材,或者不使樹脂溶解於有機溶劑中,而藉模嘴塗佈器直接塗佈於薄片狀補強基材上,而製造預浸片之方法。且溶劑法係與接著薄膜同樣使樹脂溶解於有機溶劑中,調製樹脂漆料,將薄片狀補強基材浸漬於該漆料中,使樹脂漆料含浸於薄片狀補強基材中,隨後經乾燥之方法。 The hot-melt method does not dissolve the resin in an organic solvent, but temporarily coats the coated paper with good releasability from the resin, and laminates it on a sheet-like reinforcing substrate, or does not dissolve the resin in an organic solvent. The method of manufacturing a prepreg by directly coating a thin-shaped reinforcing substrate with a die applicator. And the solvent method is the same as that of the film, the resin is dissolved in an organic solvent, the resin paint is prepared, the sheet-like reinforcing substrate is immersed in the paint, the resin paint is impregnated in the sheet-like reinforcing substrate, and then dried Method.

〈使用預浸片之多層印刷配線板〉 〈Multilayer printed wiring board using prepregs〉

接著,說明使用如上述製造之預浸片製造多層印刷配線板方法之一例。將一片或視需要之多片本發明之預浸片重疊在電路基板上,透過脫模薄膜以金屬壓板夾持,在加壓.加熱條件下真空壓製層合。加壓.加熱條件較好為壓力係5~40kgf/cm2(49×104~392×104N/m2),溫度為120~200℃下20~100分鐘。且與接著薄膜同樣,亦可藉真空層合法將預浸片層合於電路基板上後,經加熱硬化。隨後,以與上述記載之方法同樣地,使硬化後之預浸片表面經粗化後,以鍍敷形成導體層,可製造多層印刷配線板。 Next, an example of a method for manufacturing a multilayer printed wiring board using the prepreg manufactured as described above will be described. One piece or as many pieces of the prepreg according to the present invention are superimposed on a circuit substrate, held by a metal plate through a release film, and laminated under vacuum under pressure and heating. Pressure. The heating conditions are preferably a pressure of 5 to 40 kgf / cm 2 (49 × 10 4 to 392 × 10 4 N / m 2 ), and a temperature of 120 to 200 ° C. for 20 to 100 minutes. And like the adhesive film, the prepreg can be laminated on the circuit substrate by vacuum lamination, and then heat-hardened. Subsequently, in the same manner as described above, the surface of the cured prepreg is roughened, and then a conductor layer is formed by plating to manufacture a multilayer printed wiring board.

〈半導體裝置〉 <Semiconductor device>

藉由使用本發明之多層印刷配線板可製造半導體裝置。藉由將半導體晶粒安裝於本發明之多層印刷配線板之導通部位,可製造半導體裝置。所謂「導通部位」為「多層印刷配線板中傳導電訊號之部位」,其位置可為表面,亦可為埋入之部位均無妨。且,半導體晶粒只要是以半導體作為材料之電性電路元件即無特別限制。 A semiconductor device can be manufactured by using the multilayer printed wiring board of the present invention. A semiconductor device can be manufactured by mounting a semiconductor die on a conducting portion of the multilayer printed wiring board of the present invention. The so-called "conducting part" is "a part that conducts electric signals in a multilayer printed wiring board", and the position may be either a surface or an embedded part. In addition, the semiconductor crystal grain is not particularly limited as long as it is an electrical circuit element using a semiconductor as a material.

製造本發明之半導體裝置時之半導體晶粒之安裝方法只要是使半導體晶粒發揮有效功能即無特別限制。具體而言,為打線接合安裝方法、覆晶安裝方法、利用無凸塊式增層(Bumpless Build Up Layer,BBUL)之安裝方法、利用異向性導電薄膜(ACF)之安裝方法、利用非導電性薄膜 (NCF)之安裝方法等。 The mounting method of the semiconductor die when the semiconductor device of the present invention is manufactured is not particularly limited as long as the semiconductor die performs an effective function. Specifically, it is a wire bonding installation method, a flip chip installation method, an installation method using a bumpless build up layer (BBUL), an installation method using an anisotropic conductive film (ACF), and a non-conductive method. Sex film (NCF) installation method.

所謂「利用無凸塊式增層(BBUL)之安裝方法」為「將半導體晶粒直接埋入於多層印刷配線板之凹部中,將半導體晶粒與印刷配線板上之配線連接之安裝方法」,進而,大致區分為以下之BBUL方法1)、BBUL方法2)之安裝方法。 The so-called "mounting method using bumpless build-up (BBUL)" is "mounting method of directly embedding semiconductor die in recesses of a multilayer printed wiring board and connecting semiconductor die to wiring on the printed wiring board" Furthermore, it can be roughly divided into the following BBUL method 1) and BBUL method 2) installation methods.

BBUL方法1)使用底部填充劑將半導體晶粒安裝在多層印刷配線板凹部中之安裝方法。 BBUL method 1) A mounting method for mounting a semiconductor die in a recess of a multilayer printed wiring board using an underfill.

BBUL方法2)使用接著薄膜或預浸片,將半導體晶粒安裝在多層印刷配線板凹部中之安裝方法。 BBUL method 2) A mounting method in which a semiconductor die is mounted in a recess of a multilayer printed wiring board using an adhesive film or a prepreg.

BBUL方法1)具體包含以下步驟。 The BBUL method 1) specifically includes the following steps.

步驟1)設置自多層印刷配線板之兩面去除導體層者,以雷射、機械鑽孔形成貫穿孔。 Step 1) A person who removes the conductor layer from both sides of the multilayer printed wiring board is provided, and a through hole is formed by laser and mechanical drilling.

步驟2)於多層印刷配線板之單面貼合黏著膠帶,以在貫穿孔之中將半導體晶粒之底面固定於黏著膠帶上之方式配置。此時之半導體晶粒較好比貫穿孔之高度低。 Step 2) Adhere the adhesive tape on one side of the multilayer printed wiring board, and arrange it so that the bottom surface of the semiconductor die is fixed to the adhesive tape in the through hole. The semiconductor crystal grains at this time are preferably lower than the height of the through holes.

步驟3)將底部填充劑注入、填充於貫穿孔與半導體晶粒之間隙,將半導體晶粒固定於貫穿孔內。 Step 3) An underfill is injected and filled in the gap between the through hole and the semiconductor die, and the semiconductor die is fixed in the through hole.

步驟4)隨後剝離黏著膠帶,使半導體晶粒之底面露出。 Step 4) Then peel the adhesive tape to expose the bottom surface of the semiconductor die.

步驟5)於半導體晶粒之底面側層合本發明之接著薄膜或預浸片,被覆半導體晶粒。 Step 5) The adhesive film or prepreg of the present invention is laminated on the bottom side of the semiconductor die to cover the semiconductor die.

步驟6)使接著薄膜或預浸片硬化後,以雷射進行穿孔,使半導體晶粒底面之黏合墊露出,經上述所示之粗化 處理,進行無電解鍍敷、電解鍍敷,而與配線連接。亦可視需要進一步層合接著薄膜或預浸片。 Step 6) After the adhesive film or prepreg is hardened, perforation is performed by laser to expose the bonding pad on the bottom surface of the semiconductor die, and roughened as shown above. Treatment, electroless plating, electrolytic plating, and connection to wiring. If necessary, further laminating the film or prepreg.

BBUL方法2)具體包含以下步驟。 The BBUL method 2) specifically includes the following steps.

步驟1)於多層印刷配線板兩面之導體層上形成光阻膜,以光微影法僅在光阻膜之單面形成開口部。 Step 1) A photoresist film is formed on the conductor layers on both sides of the multilayer printed wiring board, and an opening portion is formed only on one side of the photoresist film by a photolithography method.

步驟2)以蝕刻液去除於開口部露出之導體層,使絕緣層露出,隨後去除兩面之光阻膜。 Step 2) The conductive layer exposed at the opening is removed with an etchant to expose the insulating layer, and then the photoresist films on both sides are removed.

步驟3)使用雷射或鑽孔機,完全去除露出之絕緣層,進行開孔,形成凹部。較好為雷射能量可以使銅之雷射吸收率降低、使絕緣層之雷射吸收率增高之方式調整能量之雷射,更好為二氧化碳雷射。藉由使用該種雷射,可使雷射不會貫穿導體層之開口部之對面之導體層,而僅去除絕緣層。 Step 3) Use a laser or drilling machine to completely remove the exposed insulating layer and make a hole to form a recess. It is preferable that the laser energy can adjust the laser energy in such a manner that the laser absorption rate of copper can be reduced and the laser absorption rate of the insulation layer can be increased, and more preferably a carbon dioxide laser. By using such a laser, it is possible to prevent the laser from penetrating the conductor layer opposite to the opening portion of the conductor layer, and only remove the insulating layer.

步驟4)使半導體晶粒之底面朝向開口部側配置於凹部,自開口部側層合本發明之接著薄膜或預浸片,被覆半導體晶粒,並埋入半導體晶粒與凹部之間隙。此時之半導體晶粒較好比凹部之高度低。 Step 4) The bottom surface of the semiconductor crystal grains is arranged in the recessed portion toward the opening portion side, and the adhesive film or prepreg of the present invention is laminated from the opening portion side to cover the semiconductor crystal grains and embed the gap between the semiconductor crystal grains and the recessed portions. The semiconductor crystal grains at this time are preferably lower than the height of the concave portion.

步驟5)使接著薄膜或預浸片硬化後,以雷射進行開孔,使半導體晶粒之底面之黏合墊露出。 Step 5) After the adhesive film or prepreg is hardened, a laser is used to make holes to expose the bonding pads on the bottom surface of the semiconductor die.

步驟6)藉由進行上述所示之粗化處理、無電解鍍敷、電解鍍敷,而連接配線,視需要再層合接著薄膜或預浸片。 Step 6) Connect the wiring by performing the roughening treatment, electroless plating, and electrolytic plating described above, and then laminate the film or prepreg as necessary.

半導體晶粒之安裝方法中,就半導體裝置之小型化、傳送損失減輕之觀點、或由於不使用焊料而無須對半導體 晶粒施加熱履歷,進而將來不會產生焊料與樹脂變形之觀點而言,較好利用無凸塊式增層(BBUL)之安裝方法,更好為BBUL方法1)、BBUL方法2),又更好為BBUL方法2)。 In the method of mounting a semiconductor die, from the viewpoint of miniaturization of a semiconductor device and reduction of transmission loss, or because no solder is used, the semiconductor is not required. From the viewpoint of applying thermal history to the die, so that solder and resin deformation will not occur in the future, it is better to use the bumpless build-up (BBUL) installation method, more preferably BBUL method 1), BBUL method 2), and Better for BBUL method 2).

[實施例] [Example]

以下,以實施例具體說明本發明,但本發明並不受限於該等實施例。 Hereinafter, the present invention will be specifically described with examples, but the present invention is not limited to these examples.

〈測定方法.評價方法〉 <test methods. Evaluation method>

首先針對各種測定方法.評價方法加以說明。 First of all, for various determination methods. The evaluation method is explained.

〈剝離強度及算術平均粗糙度(Ra值)、均方平方根粗糙度(Rq值)測定用樣品之調製〉 <Preparation of samples for measurement of peel strength, arithmetic average roughness (Ra value), and root mean square square root roughness (Rq value)> (1)內層電路基板之底層處理 (1) Bottom layer processing of inner circuit board

以MEC(股)製造之CZ8100,將形成內層電路之玻璃布基材環氧樹脂兩面貼銅層合板(銅箔厚度18μm,基板厚0.3mm,松下電工(股)製R5715ES)之兩面蝕刻1μm,進行銅表面之粗化處理。 CZ8100 made of MEC (copper) will etch 1 μm on both sides of a copper laminated board (copper foil thickness of 18 μm, substrate thickness of 0.3 mm, and Matsushita Electric Works Co., Ltd. R5715ES) on both sides of the glass cloth substrate epoxy resin that forms the inner circuit , Roughening the copper surface.

(2)接著薄膜之層合 (2) Laminating the film

使用批式真空加壓層合機MVLP-500(名機(股)製造之商品名),將實施例及比較例中製作之接著薄膜層合於內層電路基板之兩面上。層合係減壓30秒使氣壓成為13hPa 以下,隨後30秒鐘,在100℃、壓力0.74MPa下予以壓製而進行。 Using the batch-type vacuum pressure laminator MVLP-500 (trade name manufactured by Meiki Co., Ltd.), the adhesive films produced in the examples and comparative examples were laminated on both sides of the inner-layer circuit board. Laminated system is decompressed for 30 seconds to make the air pressure 13 hPa Hereinafter, it was carried out by pressing at 100 ° C. and a pressure of 0.74 MPa for 30 seconds.

(3)樹脂組成物之粗化 (3) Roughening of resin composition

經層合之接著薄膜,在實施例1~4中係剝離PET薄膜後,在100℃、30分鐘,接著在180℃、30分鐘之硬化條件下使樹脂組成物硬化,於實施例5中係以相同條件熱硬化後剝離PET薄膜,形成絕緣層。 After laminating the adhesive film, the PET film was peeled off in Examples 1 to 4, and then the resin composition was cured at 100 ° C for 30 minutes, and then at 180 ° C for 30 minutes. After thermal curing under the same conditions, the PET film was peeled to form an insulating layer.

(4)粗化處理 (4) Roughening

將形成絕緣層之內層電路基板浸漬於膨潤液之日本ATOTECH(股)製造之含有二乙二醇單丁醚之Swelling Dip Securiganth P(二醇醚類,氫氧化鈉之水溶液)中,實施例1~4中係在60℃下浸漬5分鐘,實施例5係在60℃下浸漬10分鐘,接著,浸漬於作為粗化液之日本ATOTECH(股)之CONCENTRATE COMPACT P(KMnO4:60g/L。NaOH:40g/L之水溶液)中,於實施例1~4中係在80℃浸漬15分鐘,實施例5係在80℃浸漬20分鐘,最後在40℃下浸漬於作為中和液之日本ATOTECH(股)製造之REDUCTION SOLUTION SECURIGANTH P(戊二醛,硫酸之水溶液)中5分鐘。在80℃乾燥30分鐘後,針對該粗化處理後之絕緣層表面,進行算術平均粗糙度(Ra值)、均方平方根粗糙度(Rq值)之測定。 The inner circuit board forming the insulating layer was immersed in Swelling Dip Securiganth P (glycol ether, aqueous sodium hydroxide solution) containing diethylene glycol monobutyl ether manufactured by Japan ATOTECH Co., Ltd. in a swelling liquid. Examples 1 to 4 were immersed at 60 ° C for 5 minutes, Example 5 was immersed at 60 ° C for 10 minutes, and then immersed in CONCENTRATE COMPACT P (KMnO 4 : 60g / L) of Japan ATOTECH Co., Ltd. as a roughening solution. NaOH: 40g / L aqueous solution), immersed at 80 ° C for 15 minutes in Examples 1 to 4, immersed at 80 ° C for 20 minutes, and finally immersed in Japan as a neutralizing solution at 40 ° C REDUCTION SOLUTION SECURIGANTH P (glutaraldehyde, aqueous solution of sulfuric acid) manufactured by ATOTECH Co., Ltd. for 5 minutes. After drying at 80 ° C for 30 minutes, the surface of the insulating layer after the roughening treatment was measured for arithmetic mean roughness (Ra value) and mean square root roughness (Rq value).

(5)利用半加成製程進行之鍍敷 (5) Plating by semi-additive process

為了在絕緣層表面形成電路,而將內層電路基板在40℃下浸漬於含有PdCl2之無電解鍍敷用溶液中5分鐘,接著在25℃下浸漬於無電解銅鍍敷液中20分鐘。在150℃加熱30分鐘進行退火處理後,形成蝕刻抗蝕劑,利用蝕刻形成圖型後,進行硫酸銅電解鍍敷,形成35±5μm厚之導體層。接著,在200℃進行退火處理60分鐘。針對該電路基板進行鍍敷導體層之拉伸剝離強度(剝離強度)之測定。 To form a circuit on the surface of the insulating layer, the inner circuit board was immersed in an electroless plating solution containing PdCl 2 at 40 ° C for 5 minutes, and then immersed in an electroless copper plating solution at 25 ° C for 20 minutes. . After annealing at 150 ° C. for 30 minutes, an etching resist is formed, and a pattern is formed by etching, and then copper sulfate electrolytic plating is performed to form a conductor layer having a thickness of 35 ± 5 μm. Then, annealing treatment was performed at 200 ° C for 60 minutes. The circuit board was measured for the tensile peel strength (peel strength) of the plated conductor layer.

〈鍍敷導體層之拉伸剝離強度(剝離強度)之測定〉 <Measurement of the tensile peel strength (peel strength) of the plated conductor layer>

於電路基板之導體層中切出寬度10mm、長度100mm之部分的切痕,剝離其一端並以治具(TSE股份有限公司,AUTOCOM型試驗機AC-50C-SL)夾住,在室溫下,測定以50mm/分鐘之速度朝垂直方向拉伸剝離35mm時之荷重(kgf/cm)。 Cut out a cut of 10mm in width and 100mm in length in the conductor layer of the circuit board, peel off one end and clamp it with a jig (TSE Co., Ltd., AUTOCOM-type testing machine AC-50C-SL), at room temperature , The load (kgf / cm) was measured at a speed of 50 mm / minute when 35 mm was peeled in the vertical direction.

〈粗化後之算術平均粗糙度(Ra值)、均方平方根粗糙度(Rq值)之測定〉 〈Measurement of arithmetic mean roughness (Ra value) and mean square square root roughness (Rq value) after roughening〉

使用非接觸型表面粗糙度計(VEECO儀器公司製造之WYKO NT3300),利用VSI接觸模式、50倍透鏡,以測定範圍作為121μm×92μm所得之數值求得Ra值、Rq值。接著,分別求得10點之平均值測定。 Using a non-contact type surface roughness meter (WYKO NT3300 manufactured by VEECO Instruments Co., Ltd.), a VSI contact mode, a 50-times lens, and a measurement range of 121 μm × 92 μm were used to obtain Ra and Rq values. Next, an average value of 10 points was measured.

〈平均熱膨脹率及玻璃轉移溫度之測定〉 <Measurement of average thermal expansion coefficient and glass transition temperature>

使實施例及比較例中獲得之接著薄膜在200℃加熱90分鐘進行熱硬化,剝離PET薄膜而獲得薄片狀之硬化物。將該硬化物切斷成寬度約5mm、長度約15mm之試驗片,使用熱機械分析裝置Thermo Plus TMA8310(Rigaku(股)製),以拉伸加重法進行熱機械分析。將試驗片安裝於前述裝置上後,以荷重1g、升溫速度5℃/分鐘之測定條件連續測定兩次。算出第二次測定之自25℃至150℃之平均熱膨脹率(ppm)。又由第二次測定之尺寸變化訊號之斜率產生變化之點,算出玻璃轉移溫度(℃)。 The adhesive films obtained in Examples and Comparative Examples were heated at 200 ° C. for 90 minutes for thermal curing, and the PET film was peeled to obtain a sheet-like cured product. This cured product was cut into test pieces having a width of about 5 mm and a length of about 15 mm. The thermo-mechanical analysis was performed using a thermo-mechanical analyzer Thermo Plus TMA8310 (manufactured by Rigaku Co., Ltd.) by a tensile weight method. After the test piece was mounted on the aforementioned device, the measurement was performed twice continuously under the measurement conditions of a load of 1 g and a heating rate of 5 ° C./minute. Calculate the average thermal expansion rate (ppm) from 25 ° C to 150 ° C for the second measurement. The glass transition temperature (° C) was calculated from the point where the slope of the dimensional change signal was changed for the second measurement.

〈製造例1〉 <Manufacturing Example 1>

將球狀二氧化矽(ADMATECHS(股)製之「SOC2」,平均粒徑0.5μm)100質量份投入亨歇爾型混粉機中,邊噴霧使3官能性烷氧基矽烷改質樹脂(荒川化學工業(股)製之「E201」,環氧當量285)1.8質量份預先與MEK 1.8質量份混合而成之溶液邊攪拌球狀二氧化矽10分鐘,再於75℃攪拌1小時後,餾除揮發成分,製作製造物1。 100 parts by mass of spherical silicon dioxide ("SOC2" manufactured by ADMATECHS Co., Ltd., with an average particle diameter of 0.5 µm) was put into a Henschel mixer, and the trifunctional alkoxysilane modified resin ( A solution of 1.8 parts by mass of "E201" manufactured by Arakawa Chemical Industries, Ltd. (epoxy equivalent: 285) and 1.8 parts by mass of MEK was stirred with spherical silica for 10 minutes, and then stirred at 75 ° C for 1 hour. The volatile components were distilled off to prepare a manufactured product 1.

〈製造例2〉 <Manufacturing Example 2>

將球狀二氧化矽(ADMATECHS(股)製之「SOC2」,平均粒徑0.5μm)100質量份投入亨歇爾型混粉機中,邊噴霧使3官能性烷氧基矽烷改質樹脂(荒川化學工業(股)製之「P501」,酚性羥基當量275)1.8質量份預先與MEK 1.8質量份混合而成之溶液邊攪拌球狀二氧化矽10分鐘,再於 75℃攪拌1小時後,餾除揮發成分,製作製造物2。 100 parts by mass of spherical silicon dioxide ("SOC2" manufactured by ADMATECHS Co., Ltd., with an average particle diameter of 0.5 µm) was put into a Henschel mixer, and the trifunctional alkoxysilane modified resin ( "P501" manufactured by Arakawa Chemical Industries, Ltd., 275 phenolic hydroxyl equivalents (1.8) parts by mass and 1.8 parts by mass of MEK were mixed in advance while stirring the spherical silica for 10 minutes. After stirring at 75 ° C. for 1 hour, the volatile components were distilled off to prepare a product 2.

〈製造例3〉 <Manufacturing Example 3>

將球狀二氧化矽(ADMATECHS(股)製之「SOC2」,平均粒徑0.5μm)100質量份投入亨歇爾型混粉機中,邊噴霧使4官能性烷氧基矽烷改質樹脂(荒川化學工業(股)製之「E202C」(下式(10)),環氧當量285)1.8質量份預先與MEK 1.8質量份混合而成之溶液邊攪拌球狀二氧化矽10分鐘,再於75℃攪拌1小時後,餾除揮發成分,製作製造物3。 100 parts by mass of spherical silicon dioxide ("SOC2" manufactured by ADMATECHS Co., Ltd., with an average particle diameter of 0.5 µm) was put into a Henschel mixer, and the 4-functional alkoxysilane modified resin ( 1.8 parts by mass of "E202C" (Equation (10)) manufactured by Arakawa Chemical Industries, Ltd. (epoxy equivalent: 285) and 1.8 parts by mass of MEK were mixed in advance while stirring the spherical silica for 10 minutes. After stirring at 75 ° C. for 1 hour, the volatile components were distilled off to produce a product 3.

Figure TWI609917BD00012
(式中,n表示1~10,m表示1~10)。
Figure TWI609917BD00012
(In the formula, n represents 1 to 10, and m represents 1 to 10).

〈製造例4〉 <Manufacturing Example 4>

將球狀二氧化矽(ADMATECHS(股)製之「SOC2」,平均粒徑0.5μm)100質量份投入亨歇爾型混粉機中,邊噴霧使4官能性烷氧基矽烷改質樹脂(荒川化學工業(股)製之「P502」(下式(11)),酚性羥基當量300)1.8質量份預先與MEK 1.8質量份混合而成之溶液邊攪拌球狀二氧化矽10 分鐘,再於75℃攪拌1小時後,餾除揮發成分,製作製造物4。 100 parts by mass of spherical silicon dioxide ("SOC2" manufactured by ADMATECHS Co., Ltd., with an average particle diameter of 0.5 µm) was put into a Henschel mixer, and the 4-functional alkoxysilane modified resin ( 1.8 parts by mass of "P502" (formula (11)) manufactured by Arakawa Chemical Industries, Ltd. (300 phenolic hydroxyl equivalents) and 1.8 parts by mass of MEK are mixed in advance while stirring spherical silica 10 After being stirred at 75 ° C. for 1 hour, the volatile components were distilled off to prepare a product 4.

Figure TWI609917BD00013
(式中,m表示1~10)。
Figure TWI609917BD00013
(In the formula, m represents 1 to 10).

〈實施例1〉 <Example 1>

邊將萘型環氧樹脂(環氧當量144,DIC(股)製造之「HP4700」)5質量份、液狀雙酚A型環氧樹脂(環氧當量180,三菱化學(股)製造之「jER828EL」)14質量份、聯苯型環氧樹脂(環氧當量269,日本化藥(股)製造之「NC3000H」)14質量份於溶劑石油腦30質量份中攪拌邊加熱溶解,隨後冷卻至室溫,製作混合物1。接著,將橡膠粒子(GANTZ化成(股)製造,STAFILOID AC3816N)1.5質量份在室溫下於溶劑石油腦6質量份中靜置膨潤12小時,製作混合物2。於混合物1中直接添加混合物2、球狀二氧化矽(ADMATECHS(股)製之「SOC2」,平均粒徑 0.5μm)100質量份、3官能性烷氧基矽烷改質樹脂(荒川化學工業(股)製之「E201」,環氧當量285)1.8質量份,接著添加難燃劑(三光(股)製造之「HCA-HQ」,10-(2,5-二羥基苯基)-10-氫-9-氧雜-10-磷雜菲-10-氧化物,平均粒徑1μm)5質量份,以三根輥混練且分散。接著,混合酚酚醛清漆系硬化劑(DIC(股)製造之「LA-7054」,酚性羥基當量124之不揮發分60質量%之甲基乙基酮(以下簡稱為「MEK」)溶液)10質量份、萘系酚樹脂(酚性羥基當量215,新日鐵化學(股)製之「SN485」,不揮發分60質量%之MEK溶液)10質量份、苯氧樹脂(重量平均分子量35000,三菱化學(股)製造之「YL7553」不揮發分30質量%之MEK與環己酮之1:1溶液)7質量份、作為硬化促進劑之4-二甲胺基吡啶之5質量%MEK溶液2質量份、甲基乙基酮(MEK)4質量份,以旋轉混練機均勻分散,製作樹脂漆料。接著,將該樹脂漆料以乾燥後之樹脂組成物層厚度成為40μm之方式,以模嘴塗佈器均勻塗佈於施加醇酸系脫模處理之聚對苯二甲酸乙二酯薄膜(厚度38μm)之脫模面上,再80~110℃(平均95℃)乾燥5分鐘(樹脂組成物層中之殘留溶劑量:約2質量%)。接著,邊於樹脂組成物層之表面貼合厚度15μm之聚丙烯薄膜,邊捲成輥狀。將輥狀接著薄膜切成寬度507mm,獲得507×336mm尺寸之薄片狀接著薄膜。 5 parts by mass of naphthalene-type epoxy resin (epoxy equivalent 144, "HP4700" manufactured by DIC Corporation), liquid bisphenol A-type epoxy resin (epoxy equivalent 180, manufactured by Mitsubishi Chemical Corporation) jER828EL ") 14 parts by mass, 14 parts by mass of biphenyl epoxy resin (epoxy equivalent 269," NC3000H "manufactured by Nippon Kayaku Co., Ltd.) was dissolved in 30 parts by mass of solvent petroleum naphthalene, heated to dissolve, and then cooled to At room temperature, mixture 1 was prepared. Next, 1.5 parts by mass of rubber particles (STAFILOID AC3816N manufactured by GANTZ Kasei Co., Ltd.) were allowed to stand and swell in 6 parts by mass of solvent naphtha at room temperature for 12 hours to prepare a mixture 2. Add Mixture 2 and Spherical Silicon Dioxide ("SOC2" made by ADMATECHS Co., Ltd.) directly to Mixture 1. Average particle size 0.5 μm) 100 parts by mass of a trifunctional alkoxysilane modified resin ("E201" manufactured by Arakawa Chemical Industries, Ltd., epoxy equivalent 285) 1.8 parts by mass, followed by the addition of a flame retardant (manufactured by Mitsuko Corporation) "HCA-HQ", 5 parts by mass of 10- (2,5-dihydroxyphenyl) -10-hydro-9-oxa-10-phosphaphenanthrene-10-oxide, with an average particle size of 1 μm. Three rollers are kneaded and dispersed. Next, a phenol novolac-based hardener ("LA-7054" manufactured by DIC Corporation), and a 60% by mass non-volatile methyl ethyl ketone (hereinafter referred to as "MEK") solution of phenolic hydroxyl equivalent 124 were mixed. 10 parts by mass, naphthalene-based phenol resin (phenolic hydroxyl equivalent 215, "SN485" manufactured by Nippon Steel Chemical Co., Ltd., non-volatile 60% by mass MEK solution), 10 parts by mass, phenoxy resin (weight average molecular weight 35000 , 7 parts by mass of a non-volatile MEK and cyclohexanone 1: 1 solution of 30% by mass of "YL7553" manufactured by Mitsubishi Chemical Corporation, and 5% by mass of 4-dimethylaminopyridine as a hardening accelerator 2 parts by mass of the solution and 4 parts by mass of methyl ethyl ketone (MEK) were uniformly dispersed with a rotary kneader to prepare a resin paint. Next, the resin varnish was uniformly applied to a polyethylene terephthalate film (thickness) to which an alkyd-based mold release treatment was applied with a die applicator so that the thickness of the dried resin composition layer became 40 μm. 38 μm) on the release surface, and then dried at 80 to 110 ° C. (average 95 ° C.) for 5 minutes (the amount of residual solvent in the resin composition layer: about 2% by mass). Next, a 15 μm-thick polypropylene film was bonded to the surface of the resin composition layer and rolled into a roll shape. The roll-shaped adhesive film was cut into a width of 507 mm to obtain a sheet-shaped adhesive film having a size of 507 × 336 mm.

〈實施例2〉 <Example 2>

除將實施例1之3官能性烷氧基矽烷改質樹脂(荒川化學工業(股)製之「E201」,環氧當量285)1.8質量份變更為3官能性烷氧基矽烷改質樹脂(荒川化學工業(股)製之「P501」,酚性羥基當量275)1.8質量份,餘均相同,製作樹脂漆料。接著使用該樹脂漆料,與實施例1全部同樣地獲得接著薄膜。 Except changing 1.8 parts by mass of the trifunctional alkoxysilane modified resin ("E201" manufactured by Arakawa Chemical Industries, Ltd., epoxy equivalent 285) of Example 1 to the trifunctional alkoxysilane modified resin ( 1.8 parts by mass of "P501" manufactured by Arakawa Chemical Industry Co., Ltd., phenolic hydroxyl equivalent 275), the rest are the same, and resin varnish is produced. Next, using this resin paint, it carried out similarly to Example 1, and obtained the adhesive film.

〈實施例3〉 <Example 3>

除添加製造物1代替直接添加實施例1之球狀二氧化矽(ADMATECHS(股)製之「SOC2」,平均粒徑0.5μm)100質量份與3官能性烷氧基矽烷改質樹脂(荒川化學工業(股)製造之「E201」,環氧當量285)1.8質量份以外,餘均相同,製作樹脂漆料。接著使用該樹脂漆料,與實施例1全部同樣地獲得接著薄膜。 In addition to adding product 1, instead of directly adding 100 parts by mass of spherical silicon dioxide ("SOC2" manufactured by ADMATECHS Co., Ltd., with an average particle diameter of 0.5 µm) and trifunctional alkoxysilane modified resin (Arakawa Except for 1.8 parts by mass of "E201" (epoxy equivalent 285) manufactured by Chemical Industry Co., Ltd., the rest are the same, and resin paint is produced. Next, using this resin paint, it carried out similarly to Example 1, and obtained the adhesive film.

〈實施例4〉 <Example 4>

除添加製造物2代替直接添加實施例1之球狀二氧化矽(ADMATECHS(股)製之「SOC2」,平均粒徑0.5μm)100質量份與3官能性烷氧基矽烷改質樹脂(荒川化學工業(股)製之「E201」,環氧當量285)1.8質量份以外,餘均相同,製作樹脂漆料。接著使用該樹脂漆料,與實施例1全部同樣地獲得接著薄膜。 In addition to adding product 2 instead of directly adding 100 parts by mass of spherical silicon dioxide ("SOC2" manufactured by ADMATECHS Co., Ltd., with an average particle diameter of 0.5 µm) of Example 1 and a trifunctional alkoxysilane modified resin (Arakawa Except for "E201" manufactured by Chemical Industry Co., Ltd., which has an epoxy equivalent of 285) and 1.8 parts by mass, the rest are the same, and resin paint is produced. Next, using this resin paint, it carried out similarly to Example 1, and obtained the adhesive film.

〈實施例5〉 <Example 5>

邊將萘型環氧樹脂(環氧當量144,DIC(股)製造之「EXA4032SS」)8質量份、聯二甲酚型環氧樹脂(環氧當量190,三菱化學(股)製之「YX4000HK」)10質量份、改質萘型環氧樹脂(環氧當量約330,新日鐵化學(股)製造之「ESN-475V」)9質量份於溶劑石油腦33質量份中攪拌邊加熱溶解。冷卻至室溫後,接著,添加將作為橡膠粒子之STAFILOID(GANTZ化成(股)製,AC3816N)1.5質量份在室溫下於溶劑石油腦6質量份中靜置膨潤12小時而成者、及球狀二氧化矽(ADMATECHS(股)製之「SOC2」,平均粒徑0.5μm)140質量份,再添加1.4質量份之3官能性烷氧基矽烷改質樹脂(荒川化學工業(股)製之「P501」,酚性羥基當量275),以三根輥混練且分散。接著,混合活性酯硬化劑(DIC(股)製造之「HPC-8000-65T」,活性基當量約223之不揮發分65質量%之甲苯溶液)45質量份、苯氧樹脂(重量平均分子量35000,三菱化學(股)製之「YL7553」不揮發分30質量%之MEK與環己酮之1:1溶液)5質量份、作為硬化促進劑之4-二甲胺基吡啶之5質量%MEK溶液4質量份、甲基乙基酮(MEK)4質量份,以旋轉混練機均勻分散,製作樹脂漆料。接著使用該樹脂漆料,與實施例1完全相同,獲得接著薄膜。 8 parts by mass of naphthalene-type epoxy resin (epoxy equivalent 144, "EXA4032SS" manufactured by DIC Corporation), bixylenol-type epoxy resin (epoxy equivalent 190, Mitsubishi Chemical Corporation "" YX4000HK " ") 10 parts by mass of modified naphthalene-type epoxy resin (epoxy equivalent of about 330," ESN-475V "manufactured by Nippon Steel Chemical Co., Ltd.) 9 parts by mass was dissolved in 33 parts by mass of solvent petroleum naphtha while heating and dissolving. . After cooling to room temperature, next, 1.5 mass parts of STAFILOID (GANTZ Kasei Co., Ltd., AC3816N) as rubber particles was added and left to swell in 6 mass parts of solvent petroleum naphtha at room temperature for 12 hours, and 140 parts by mass of spherical silicon dioxide ("SOC2" manufactured by ADMATECHS Co., Ltd., with an average particle diameter of 0.5 μm), and 1.4 parts by mass of a trifunctional alkoxysilane modified resin (manufactured by Arakawa Chemical Industries, Ltd.) "P501", phenolic hydroxyl equivalent 275), kneaded and dispersed with three rollers. Next, 45 parts by mass of an active ester hardener ("HPC-8000-65T" manufactured by DIC Corporation, a toluene solution of 65% by mass of a nonvolatile matter with an active group equivalent of about 223), and a phenoxy resin (weight average molecular weight 35000) , 5 parts by mass of MEK and 1: 1 solution of cyclohexanone with 30% by mass of "YL7553" made by Mitsubishi Chemical Corporation, and 5% by mass of MEK with 4-dimethylaminopyridine as a hardening accelerator 4 parts by mass of the solution and 4 parts by mass of methyl ethyl ketone (MEK) were uniformly dispersed with a rotary kneader to prepare a resin paint. This resin paint was then used in exactly the same manner as in Example 1 to obtain an adhesive film.

〈比較例1〉 <Comparative Example 1>

除未添加實施例1之3官能性烷氧基矽烷改質樹脂(荒川化學工業(股)製之「E201」,環氧當量285)以外,餘 全部相同,製作樹脂漆料。接著使用該樹脂漆料,與實施例1完全相同,獲得接著薄膜。 Except that the 3-functional alkoxysilane modified resin of Example 1 ("E201" manufactured by Arakawa Chemical Industries, Ltd., epoxy equivalent 285) was not added, the rest All are the same, and a resin paint is made. This resin paint was then used in exactly the same manner as in Example 1 to obtain an adhesive film.

〈比較例2〉 <Comparative Example 2>

除將實施例1之3官能性烷氧基矽烷改質樹脂(荒川化學工業(股)製之「E201」,環氧當量285)1.8質量份變更為4官能烷氧基矽烷改質樹脂(荒川化學工業(股)製之「E202C」(上式(10)),環氧當量285)1.8質量份以外,餘全部相同,製作樹脂漆料。接著使用該樹脂漆料,與實施例1完全相同,獲得接著薄膜。 Except changing 1.8 parts by mass of the trifunctional alkoxysilane modified resin ("E201" manufactured by Arakawa Chemical Industries, Ltd., epoxy equivalent 285) of Example 1 to a 4-functional alkoxysilane modified resin (Arakawa Except for 1.8 parts by mass of "E202C" (Equation (10)), epoxy equivalent 285) manufactured by Chemical Industry Co., Ltd., the rest are the same, and resin paint is produced. This resin paint was then used in exactly the same manner as in Example 1 to obtain an adhesive film.

〈比較例3〉 <Comparative Example 3>

除將實施例1之3官能性烷氧基矽烷改質樹脂(環氧當量285,荒川化學工業(股)製造之E201)1.8質量份變更為4官能烷氧基矽烷改質樹脂(荒川化學工業(股)製之「P502」(上式(11)),酚性羥基當量300)1.8質量份以外,餘全部相同,製作樹脂漆料。接著使用該樹脂漆料,與實施例1完全相同,獲得接著薄膜。 Except changing 1.8 parts by mass of the trifunctional alkoxysilane modified resin of Example 1 (epoxy equivalent 285, E201 manufactured by Arakawa Chemical Industries, Ltd.) to a 4-functional alkoxysilane modified resin (Arakawa Chemical Industries) Except for 1.8 parts by mass of "P502" (the above formula (11)) made by (stock), the phenolic hydroxyl equivalent is 300), and the rest are the same, and a resin paint is produced. This resin paint was then used in exactly the same manner as in Example 1 to obtain an adhesive film.

〈比較例4〉 <Comparative Example 4>

除添加製造物3代替直接添加實施例1之球狀二氧化矽(ADMATECHS(股)製之「SOC2」,平均粒徑0.5μm)100質量份與3官能性烷氧基矽烷改質樹脂(荒川化學工業(股)製之「E201」,環氧當量285)1.8質量份以外,餘均相同 ,製作樹脂漆料。接著使用該樹脂漆料,與實施例1全部同樣地獲得接著薄膜。 In addition to adding product 3 instead of directly adding 100 parts by mass of spherical silicon dioxide ("SOC2" manufactured by ADMATECHS Co., Ltd., with an average particle diameter of 0.5 μm) and trifunctional alkoxysilane modified resin (Arakawa Except for "E201" manufactured by Chemical Industry Co., Ltd., epoxy equivalent 285) 1.8 parts by mass, the rest are the same , Making resin paint. Next, using this resin paint, it carried out similarly to Example 1, and obtained the adhesive film.

〈比較例5〉 <Comparative Example 5>

除添加製造物4代替直接添加實施例1之球狀二氧化矽(ADMATECHS(股)製之「SOC2」,平均粒徑0.5μm)100質量份與3官能性烷氧基矽烷改質樹脂(荒川化學工業(股)製之「E201」,環氧當量285)1.8質量份以外,餘均相同,製作樹脂漆料。接著使用該樹脂漆料,與實施例1全部同樣地獲得接著薄膜。 In addition to adding the product 4, instead of directly adding 100 parts by mass of spherical silicon dioxide ("SOC2" manufactured by ADMATECHS Co., Ltd., with an average particle diameter of 0.5 m) and a trifunctional alkoxysilane modified resin (Arakawa Except for "E201" manufactured by Chemical Industry Co., Ltd., which has an epoxy equivalent of 285) and 1.8 parts by mass, the rest are the same, and resin paint is produced. Next, using this resin paint, it carried out similarly to Example 1, and obtained the adhesive film.

〈比較例6〉 <Comparative Example 6>

除將實施例1之3官能性烷氧基矽烷改質樹脂(荒川化學工業(股)製之「E201」,環氧當量285)1.8質量份變更為環氧系矽烷偶合劑(信越化學工業(股)製之「KBM403」)0.6質量份以外,餘全部相同,製作樹脂漆料。接著使用該樹脂漆料,與實施例1完全相同,獲得接著薄膜。 Except changing 1.8 parts by mass of the trifunctional alkoxysilane modified resin ("E201" manufactured by Arakawa Chemical Industries, Ltd., epoxy equivalent 285) of Example 1 to an epoxy-based silane coupling agent (Shin-Etsu Chemical Industry ( "KBM403" (manufactured in stock) except 0.6 parts by mass, the rest are the same, and resin paint is made. This resin paint was then used in exactly the same manner as in Example 1 to obtain an adhesive film.

結果示於表1。 The results are shown in Table 1.

Figure TWI609917BD00014
Figure TWI609917BD00014

由表1之結果,可知實施例1~5之樹脂組成物為低算術平均粗糙度、低均方平方根粗糙度且可獲得剝離強度充分之值。另一方面,比較例1由於未含有(B)成分,故算術平均粗糙度、均方平方根粗糙度變大,剝離強度亦低。比較例2~6中,不含(B)成分,算術平均粗糙度、均方平方根粗糙度變大,於鍍敷時鼓起而使剝離強度成為顯著較小之值。 From the results in Table 1, it can be seen that the resin compositions of Examples 1 to 5 have low arithmetic mean roughness, low mean square root roughness, and can obtain values with sufficient peel strength. On the other hand, since Comparative Example 1 does not contain the component (B), the arithmetic average roughness and the square root roughness increase, and the peel strength is also low. In Comparative Examples 2 to 6, the component (B) was not included, and the arithmetic average roughness and the square root roughness increased, and they bulged during plating to make the peeling strength significantly smaller.

[產業上之可能利用性] [Possibility of industrial use]

本發明可提供一種一方面維持玻璃轉移溫度、熱膨脹率,一方面使濕式粗化步驟中絕緣層表面之算術平均粗糙度、均方平方根粗糙度小,且可於其上形成具有充分強度之鍍敷導體層之樹脂組成物。進而可提供使用該等之接著薄膜、預浸片、多層印刷配線板、半導體裝置。進而亦可提供搭載該等之電腦、行動電話、數位相機、電視等電器製品,或電動自行車、汽車、電車、船舶、飛機等乘載工具。 The invention can provide a glass transition temperature and a thermal expansion rate on the one hand, and the arithmetic mean roughness and the root mean square root roughness of the insulating layer surface in the wet roughening step on the other hand can be made small, and can be formed thereon with sufficient strength. A resin composition for plating a conductor layer. Furthermore, using such an adhesive film, a prepreg, a multilayer printed wiring board, and a semiconductor device can be provided. Furthermore, electrical appliances such as computers, mobile phones, digital cameras, televisions, or electric bicycles, automobiles, trams, ships, and airplanes can be provided.

Claims (13)

一種樹脂組成物,其特徵為含有(A)環氧樹脂、(B)三官能性烷氧基矽烷改質樹脂及(C)無機填充材的樹脂組成物,(A)環氧樹脂含有在溫度20℃下為液狀的環氧樹脂、及在溫度20℃下為固體狀的環氧樹脂,其調配比例(液狀環氧樹脂:固體狀環氧樹脂)為1:0.1~2,其中以樹脂組成物中之不揮發成分作為100質量%時,(C)無機填充材的含量為20~85質量%。 A resin composition characterized by a resin composition containing (A) an epoxy resin, (B) a trifunctional alkoxysilane modified resin, and (C) an inorganic filler, wherein (A) the epoxy resin is contained at a temperature The liquid epoxy resin at 20 ° C and the solid epoxy resin at a temperature of 20 ° C, the blending ratio (liquid epoxy resin: solid epoxy resin) is 1: 0.1 ~ 2, of which When the non-volatile content in the resin composition is 100% by mass, the content of the (C) inorganic filler is 20 to 85% by mass. 如申請專利範圍第1項之樹脂組成物,其中(B)三官能性烷氧基矽烷改質樹脂之至少一部分與(C)無機填充材反應形成反應物。 For example, the resin composition of the first patent application range, wherein (B) at least a part of the trifunctional alkoxysilane modified resin is reacted with (C) an inorganic filler to form a reactant. 如申請專利範圍第2項之樹脂組成物,其係使(B)三官能性烷氧基矽烷改質樹脂與(C)無機填充材預先反應後,添加於(A)環氧樹脂中而成。 For example, the resin composition of the second patent application range is formed by reacting (B) a trifunctional alkoxysilane modified resin with (C) an inorganic filler in advance and adding it to (A) an epoxy resin. . 如申請專利範圍第1項之樹脂組成物,其中以(C)無機填充材為100質量%時,(B)三官能性烷氧基矽烷改質樹脂為0.1~5質量%。 For example, if the resin composition of the first patent application range is (C) the inorganic filler is 100% by mass, the (B) trifunctional alkoxysilane modified resin is 0.1 to 5% by mass. 如申請專利範圍第1項之樹脂組成物,其中(B)三官能性烷氧基矽烷改質樹脂為含有羥基之環氧樹脂中之羥基經矽烷改質而成之三官能性烷氧基矽烷改質環氧樹脂及/或酚樹脂之酚性羥基經矽烷改質而成之三官能性烷氧基矽烷改質酚樹脂。 For example, the resin composition of item 1 of the patent application range, wherein (B) the trifunctional alkoxysilane modified resin is a trifunctional alkoxysilane modified by a silane in a hydroxyl group-containing epoxy resin. Modified epoxy resin and / or phenolic phenolic hydroxyl group modified by silane trifunctional alkoxysilane modified phenol resin. 如申請專利範圍第1項之樹脂組成物,其中(B)三官 能性烷氧基矽烷改質樹脂為下述式(1):
Figure TWI609917BC00001
式(1)中,R3為碳數1~10之直鏈或分支鏈之烷基,或烯丙基,R4、R5各獨立為氫、碳數1~10之直鏈或分支鏈烷基,式(1)中,m表示1~10,式(1)中,X係選自環氧樹脂或酚樹脂。
For example, the resin composition of the first patent application range, wherein the (B) trifunctional alkoxysilane modified resin is the following formula (1):
Figure TWI609917BC00001
In formula (1), R 3 is a straight or branched alkyl group having 1 to 10 carbon atoms, or an allyl group, and R 4 and R 5 are each independently hydrogen and a straight or branched chain having 1 to 10 carbon atoms. Alkyl group, in the formula (1), m represents 1 to 10, and in the formula (1), X is selected from an epoxy resin or a phenol resin.
如申請專利範圍第1項之樹脂組成物,其中(B)三官能性烷氧基矽烷改質樹脂為下述式(1):
Figure TWI609917BC00002
式(1)中,R3為碳數1~10之直鏈或分支鏈之烷基,或烯丙基,R4、R5各獨立為氫、碳數1~10之直鏈或分支鏈烷基,式(1)中,m表示1~10,式(1)中,X係選自雙酚A型環氧樹脂、雙酚F型環氧樹脂、雙酚AF型環氧樹脂、雙酚S型環氧樹脂、酚醛清漆酚樹脂。
For example, the resin composition of the first patent application range, wherein the (B) trifunctional alkoxysilane modified resin is the following formula (1):
Figure TWI609917BC00002
In formula (1), R 3 is a straight or branched alkyl group having 1 to 10 carbon atoms, or an allyl group, and R 4 and R 5 are each independently hydrogen and a straight or branched chain having 1 to 10 carbon atoms. Alkyl, in formula (1), m represents 1 to 10, and in formula (1), X is selected from bisphenol A epoxy resin, bisphenol F epoxy resin, bisphenol AF epoxy resin, bis Phenolic S-type epoxy resin, novolac phenol resin.
如申請專利範圍第1項之樹脂組成物,其中使樹脂組成物硬化形成絕緣層,且使其絕緣層表面經粗糙化處理 ,並經鍍敷獲得之導體層與絕緣層之剝離強度為0.43kgf/cm~1.0kgf/cm,使樹脂組成物硬化形成絕緣層,且使其絕緣層表面經粗糙化處理後之算術平均粗糙度為10nm~300nm,均方平方根粗糙度為10nm~520nm。 For example, the resin composition of the scope of patent application, wherein the resin composition is hardened to form an insulating layer, and the surface of the insulating layer is roughened. And the peeling strength of the conductor layer and the insulating layer obtained by plating is 0.43kgf / cm ~ 1.0kgf / cm, the resin composition is hardened to form an insulating layer, and the arithmetic average roughness of the surface of the insulating layer after roughening treatment The degree is 10nm ~ 300nm, and the square root roughness is 10nm ~ 520nm. 如申請專利範圍第1項之樹脂組成物,其係多層印刷配線板之絕緣層形成用。 For example, the resin composition of the scope of application for patent No. 1 is for forming an insulating layer of a multilayer printed wiring board. 一種接著薄膜,其係使如申請專利範圍第1~9項中任一項之樹脂組成物於支撐體上層形成而成。 An adhesive film is formed by forming a resin composition as described in any one of claims 1 to 9 on an upper layer of a support. 一種預浸片,其係將如申請專利範圍第1~9項中任一項之樹脂組成物含浸於薄片狀補強基材中。 A prepreg sheet is prepared by impregnating a resin composition as described in any one of claims 1 to 9 in a sheet-like reinforcing substrate. 一種多層印刷配線板,其係以如申請專利範圍第1~9項中任一項之樹脂組成物之硬化物形成絕緣層。 A multilayer printed wiring board is formed of a hardened product of a resin composition as described in any one of claims 1 to 9 of the patent application scope to form an insulating layer. 一種半導體裝置,其特徵係使用如申請專利範圍第12項之多層印刷配線板。 A semiconductor device characterized by using a multilayer printed wiring board such as the item 12 in the patent application scope.
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