TWI603370B - Device for realizing impedance matching and power distribution and semiconductor processing device - Google Patents

Device for realizing impedance matching and power distribution and semiconductor processing device Download PDF

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TWI603370B
TWI603370B TW105113940A TW105113940A TWI603370B TW I603370 B TWI603370 B TW I603370B TW 105113940 A TW105113940 A TW 105113940A TW 105113940 A TW105113940 A TW 105113940A TW I603370 B TWI603370 B TW I603370B
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impedance matching
power distribution
branch
variable capacitor
matching circuit
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TW201732864A (en
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Xiao-Yang Cheng
Gang Wei
Jing Wei
xing-cun Li
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32431Constructional details of the reactor
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
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    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/54Apparatus specially adapted for continuous coating
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32431Constructional details of the reactor
    • H01J37/32798Further details of plasma apparatus not provided for in groups H01J37/3244 - H01J37/32788; special provisions for cleaning or maintenance of the apparatus
    • H01J37/32807Construction (includes replacing parts of the apparatus)
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/34Gas-filled discharge tubes operating with cathodic sputtering
    • H01J37/3411Constructional aspects of the reactor
    • H01J37/3444Associated circuits
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03HIMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H7/00Multiple-port networks comprising only passive electrical elements as network components
    • H03H7/38Impedance-matching networks

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Description

用於實現阻抗匹配和功率分配的裝置及半導體加工裝置Device and semiconductor processing device for achieving impedance matching and power distribution

本發明屬於微電子加工技術領域,具體涉及一種用於實現阻抗匹配和功率分配的裝置及半導體加工裝置。 The invention belongs to the technical field of microelectronic processing, and in particular relates to a device and a semiconductor processing device for implementing impedance matching and power distribution.

半導體裝置通常採用射頻電源作為電漿激發源,為了將射頻電源的功率盡可能完全地傳遞至半導體裝置的反應腔室內,需要在射頻電源和反應腔室之間串聯阻抗匹配器,以實現射頻電源的輸入阻抗和輸出阻抗相匹配。 The semiconductor device usually uses a radio frequency power source as a plasma excitation source. In order to transfer the power of the radio frequency power source to the reaction chamber of the semiconductor device as completely as possible, an impedance matching device needs to be connected in series between the RF power source and the reaction chamber to implement the RF power source. The input impedance matches the output impedance.

第1圖為典型的半導體裝置的結構示意圖。請參閱第1圖,該半導體裝置包括阻抗匹配器10、電流分配器和反應腔室100,在反應腔室100的頂壁上方設置有對應於反應腔室100內的中心區域的內線圈12和對應於反應腔室100內的邊緣區域的外線圈13。阻抗匹配器10的輸入端與射頻電源11電連接,輸出端與電流分配器相連,用於實現射頻電源11的輸入阻抗和輸出阻抗的匹配。電流分配器分別與內線圈12和外線圈13電連接。具體地,如第1圖所示,電流分配器包括電流分配電路,該電流分配電路包括第一電感L1、第一可變電容C1、第一阻抗R1和第二阻抗R2,其中:第一電感L1和第一可變電容C1並聯後,再依次串聯內線圈12和第一阻抗R1,形成第一支路;外線圈13和第二阻抗R2串聯,形成第二支路。第一支路和第二支路並聯在阻抗匹配器10的輸出端和地之間。通過調節第一可變電容C1可以將射頻電流在內線圈12和外線圈13之間進行分配, 從而將射頻電源11輸出的功率在內線圈12和外線圈13之間進行分配,以便在反應腔室100內的中心區域和邊緣區域形成均勻的電漿分佈。 Figure 1 is a schematic view showing the structure of a typical semiconductor device. Referring to FIG. 1, the semiconductor device includes an impedance matching device 10, a current distributor, and a reaction chamber 100. Above the top wall of the reaction chamber 100, an inner coil 12 corresponding to a central region in the reaction chamber 100 is disposed. The outer coil 13 corresponds to an edge region within the reaction chamber 100. The input of the impedance matching device 10 is electrically connected to the RF power source 11 and the output terminal is connected to the current distributor for matching the input impedance and the output impedance of the RF power source 11. The current distributors are electrically connected to the inner coil 12 and the outer coil 13, respectively. Specifically, as shown in FIG. 1, the current divider includes a current distribution circuit including a first inductor L1, a first variable capacitor C1, a first impedance R1, and a second impedance R2, wherein: the first inductor After L1 is connected in parallel with the first variable capacitor C1, the inner coil 12 and the first impedance R1 are sequentially connected in series to form a first branch; the outer coil 13 and the second impedance R2 are connected in series to form a second branch. The first leg and the second leg are connected in parallel between the output of the impedance matcher 10 and ground. The RF current can be distributed between the inner coil 12 and the outer coil 13 by adjusting the first variable capacitor C1. The power output from the RF power source 11 is thereby distributed between the inner coil 12 and the outer coil 13 to form a uniform plasma distribution in the central region and the edge region in the reaction chamber 100.

第2圖為第1圖中電流分配電路的另一種電路圖。請參閱第2圖,電流分配電路包括第二電感L2、第三阻抗R3、第三電感L3、第二可變電容C2和第四阻抗R4。其中,第二電感L2、內線圈12和第三阻抗R3依次串聯,形成第一支路;第三電感L3和第二可變電容C2並聯後再依次與外線圈13、第四阻抗R4串聯,形成第二支路。第一支路和第二支路並聯在阻抗匹配器10的輸出端和地之間。在此情況下,通過調節第二可變電容C2可以將射頻電源11輸出的功率在內線圈12和外線圈13之間進行分配調節。 Fig. 2 is another circuit diagram of the current distribution circuit of Fig. 1. Referring to FIG. 2, the current distribution circuit includes a second inductor L2, a third impedance R3, a third inductor L3, a second variable capacitor C2, and a fourth impedance R4. The second inductor L2, the inner coil 12 and the third impedance R3 are sequentially connected in series to form a first branch; the third inductor L3 and the second variable capacitor C2 are connected in parallel, and then sequentially connected in series with the outer coil 13 and the fourth impedance R4. Form a second branch. The first leg and the second leg are connected in parallel between the output of the impedance matcher 10 and ground. In this case, the power output from the radio frequency power source 11 can be distributed and adjusted between the inner coil 12 and the outer coil 13 by adjusting the second variable capacitor C2.

由第1圖和第2圖可以直接看出:第1圖中的電流分配電路由4個電子裝置(即,第一電感L1、第一可變電容C1、第一阻抗R1和第二阻抗R2)組成;第2圖中的電流分配電路由5個電子裝置(即,第二電感L2、第三阻抗R3、第三電感L3、第二可變電容C2和第四阻抗R4)組成。電子裝置的數量較多,導致用於實現阻抗匹配和功率分配功能的電路結構比較分散,集成度低,且成本較高。 It can be directly seen from FIG. 1 and FIG. 2 that the current distribution circuit in FIG. 1 is composed of four electronic devices (ie, the first inductance L1, the first variable capacitance C1, the first impedance R1, and the second impedance R2). The composition; the current distribution circuit in FIG. 2 is composed of five electronic devices (ie, the second inductance L2, the third impedance R3, the third inductance L3, the second variable capacitance C2, and the fourth impedance R4). The number of electronic devices is large, resulting in a relatively scattered circuit structure for achieving impedance matching and power distribution functions, low integration, and high cost.

本發明旨在至少解決現有技術中存在的技術問題之一,提出了一種用於實現阻抗匹配和功率分配的裝置及半導體加工裝置。 The present invention is directed to at least one of the technical problems existing in the prior art, and an apparatus and a semiconductor processing apparatus for achieving impedance matching and power distribution are proposed.

為解決上述問題之一,本發明提供了一種用於實現阻抗匹配和功率分配的裝置,其包括功率分配電路和阻抗匹配電路,該阻抗匹配電路的輸入端用於與射頻電源電連接,該功率分配電路包括至少兩條支路,每條該支路包括上游端和下游端,每條該支路的上游端與該阻抗匹配電路的輸出端相連,且 其下游端用於與外接裝置相連,每條該支路上均串聯有功率分配單元,該功率分配單元僅包括一個第一可變電容。 To solve one of the above problems, the present invention provides an apparatus for implementing impedance matching and power distribution, comprising a power distribution circuit and an impedance matching circuit, the input of the impedance matching circuit being electrically connected to a radio frequency power source, the power The distribution circuit includes at least two branches, each of the branches including an upstream end and a downstream end, and an upstream end of each of the branches is connected to an output of the impedance matching circuit, and The downstream end is connected to the external device, and each of the branches is connected in series with a power distribution unit, and the power distribution unit includes only one first variable capacitor.

其中,該裝置還包括輸入埠和與該支路一一對應的輸出埠組,該阻抗匹配電路通過該輸入埠與該射頻電源相連,每個該輸出埠組均包括第一輸出埠和第二輸出埠,該第一輸出埠分別與相對應的支路的下游端以及該支路所對應的外接裝置的一端電連接,該第二輸出埠分別與位準地以及外接裝置的另一端電連接。 Wherein, the device further includes an input port and an output port group corresponding to the branch one-to-one, the impedance matching circuit is connected to the radio frequency power source through the input port, and each of the output port groups includes a first output port and a second Output 埠, the first output 电 is electrically connected to a downstream end of the corresponding branch and an end of the external device corresponding to the branch, and the second output 电 is electrically connected to the level ground and the other end of the external device respectively .

其中,該至少兩條支路所對應的外接裝置依次套置,並且至少是在位於最邊緣的該外接裝置所對應的該輸出埠組的第二輸出埠與該位準地之間串聯有第一固定電容。 The external devices corresponding to the at least two branches are sequentially disposed, and at least the second output port of the output port group corresponding to the external device located at the outermost edge is connected in series with the level ground. A fixed capacitor.

其中,除了與位於中心的該外接裝置所對應的該輸出埠組之外,在其餘每個該輸出埠組的第二輸出埠與該位準地之間均串聯有第一固定電容。 Wherein, in addition to the output group corresponding to the external device located at the center, a first fixed capacitance is connected in series between the second output port of each of the remaining output groups and the level.

其中,該阻抗匹配電路包括:第二可變電容,其串聯在該阻抗匹配電路的輸入端和輸出端之間;第三可變電容,其一端與該阻抗匹配電路的輸入端相連,另一端接位準地。 The impedance matching circuit includes: a second variable capacitor connected in series between the input end and the output end of the impedance matching circuit; and a third variable capacitor, one end of which is connected to the input end of the impedance matching circuit, and the other end Pick up the ground.

其中,該阻抗匹配電路還包括第一電感,該第一電感與該第二可變電容彼此串聯並連接在該阻抗匹配電路的輸入端和輸出端之間。 The impedance matching circuit further includes a first inductor, and the first inductor and the second variable capacitor are connected in series with each other and connected between the input end and the output end of the impedance matching circuit.

其中,該阻抗匹配電路還包括:第二固定電容,其並聯設置在該第二可變電容的兩端或並聯設置在該第三可變電容的兩端。 The impedance matching circuit further includes: a second fixed capacitor disposed in parallel at both ends of the second variable capacitor or in parallel at both ends of the third variable capacitor.

其中,用於實現阻抗匹配和功率分配的裝置還包括第一檢測器、第二檢測器、控制器和執行機構。該第一檢測器用於檢測每條該支路的電流,並將檢測結果發送至該控制器;該第二檢測器與該輸入埠、該阻抗匹配電路的輸入端和該控制器分別相連,用於檢測該射頻電源的負載阻抗,並將檢測 的電流和該第二檢測器檢測到的負載阻抗向該執行機構發送調節信號;該執行機構用於根據該調節信號調節每個該第一可變電容和該阻抗匹配電路中的阻抗可調元件。 Wherein, the means for achieving impedance matching and power distribution further includes a first detector, a second detector, a controller and an actuator. The first detector is configured to detect a current of each of the branches, and send the detection result to the controller; the second detector is connected to the input port, the input end of the impedance matching circuit, and the controller respectively, Detecting the load impedance of the RF power source and detecting The current and the load impedance detected by the second detector send an adjustment signal to the actuator; the actuator is configured to adjust each of the first variable capacitor and the impedance tunable component in the impedance matching circuit according to the adjustment signal .

其中,該第一檢測器包括與該支路一一對應的電流感測器,該電流感測器串聯在相應的該支路上。 Wherein, the first detector comprises a current sensor corresponding to the branch one-to-one, the current sensor being connected in series on the corresponding branch.

作為另一個技術方案,本發明還提供一種半導體加工裝置,其包括本發明上述各方案提供的用於實現阻抗匹配和功率分配的裝置。 As another technical solution, the present invention also provides a semiconductor processing apparatus including the apparatus for achieving impedance matching and power distribution provided by the above various aspects of the present invention.

本發明具有以下有益效果: The invention has the following beneficial effects:

本發明提供的用於實現阻抗匹配和功率分配的裝置,其每條支路上的功率分配單元僅包括一個第一可變電容,因此,當反應腔室的頂壁上部設置有兩個外接裝置(即,內線圈和外線圈)時,功率分配電路僅需要兩個第一可變電容即可,與現有技術中需要4~5個電子裝置相比,減少了電子裝置的數量,提高了該用於實現阻抗匹配和功率分配的裝置的結構緊湊性和集成度,同時降低了成本。尤其是在外接裝置的數量越多時,電子裝置的數量減少得越明顯,上述優勢也就越盡顯。 The device for achieving impedance matching and power distribution provided by the present invention, the power distribution unit on each branch includes only one first variable capacitor, and therefore, two external devices are disposed on the upper portion of the top wall of the reaction chamber ( That is, when the inner coil and the outer coil are used, the power distribution circuit only needs two first variable capacitors, which reduces the number of electronic devices and improves the use compared with the prior art requiring 4 to 5 electronic devices. The compactness and integration of the device for achieving impedance matching and power distribution while reducing costs. Especially when the number of external devices is increased, the number of electronic devices is reduced more and more, and the above advantages are more obvious.

本發明提供的半導體加工裝置,其採用本發明提供的用於實現阻抗匹配和功率分配的裝置,不僅可以降低成本,而且可以提高裝置的集成度,減小裝置的體積。 The semiconductor processing apparatus provided by the invention adopts the apparatus for realizing impedance matching and power distribution provided by the invention, which not only can reduce the cost, but also can improve the integration degree of the apparatus and reduce the volume of the apparatus.

10‧‧‧阻抗匹配器 10‧‧‧impedance matcher

11‧‧‧射頻電源 11‧‧‧RF power supply

12‧‧‧內線圈 12‧‧‧ inner coil

13‧‧‧外線圈 13‧‧‧Outer coil

20‧‧‧輸入埠 20‧‧‧ Input埠

21、22‧‧‧輸出埠組 21, 22‧‧‧ output group

23‧‧‧功率分配電路 23‧‧‧Power distribution circuit

24‧‧‧阻抗匹配電路 24‧‧‧ impedance matching circuit

25‧‧‧電流感測器 25‧‧‧ Current Sensor

26‧‧‧檢測器 26‧‧‧Detector

27‧‧‧控制器 27‧‧‧ Controller

28‧‧‧執行機構 28‧‧‧Executive agency

30‧‧‧反應腔室 30‧‧‧Reaction chamber

31‧‧‧介質窗 31‧‧‧Media window

32‧‧‧氣體噴嘴 32‧‧‧ gas nozzle

33‧‧‧下電極基座 33‧‧‧ lower electrode base

34‧‧‧內線圈 34‧‧‧ inner coil

35‧‧‧外線圈 35‧‧‧Outer coil

36‧‧‧匹配器 36‧‧‧matcher

37、RF‧‧‧射頻電源 37, RF‧‧‧RF power supply

100‧‧‧反應腔室 100‧‧‧reaction chamber

211、212、221、222‧‧‧輸出埠 211, 212, 221, 222‧‧‧ Output埠

231、231’‧‧‧支路 231, 231’ ‧ ‧ branch road

C1、C2、C11、C11’、C12、C13‧‧‧可變電容 C1, C2, C11, C11', C12, C13‧‧‧ variable capacitors

C21、C22‧‧‧固定電容 C21, C22‧‧‧ fixed capacitor

L1、L2、L3‧‧‧電感 L1, L2, L3‧‧‧ inductance

R1、R2、R3、R4‧‧‧阻抗 R1, R2, R3, R4‧‧‧ impedance

S‧‧‧晶片 S‧‧‧ wafer

S1、S2、S3、S4、S5、S6‧‧‧步驟 S1, S2, S3, S4, S5, S6‧‧ steps

第1圖為典型的半導體裝置的結構示意圖;第2圖為第1圖中電流分配電路的另一種電路示意圖; 第3圖為本發明實施例提供的第一種用於實現阻抗匹配和功率分配的裝置應用於反應腔室時的結構示意圖;第4圖為本發明實施例提供的用於實現阻抗匹配和功率分配的裝置的工作流程圖;第5圖為本發明實施例提供的第二種用於實現阻抗匹配和功率分配的裝置的結構示意圖;第6圖為本發明實施例提供的第三種用於實現阻抗匹配和功率分配的裝置的結構示意圖;以及第7圖為本發明實施例提供的第四種用於實現阻抗匹配和功率分配的裝置的結構示意圖。 1 is a schematic structural view of a typical semiconductor device; FIG. 2 is another circuit diagram of the current distribution circuit of FIG. 1; FIG. 3 is a schematic structural diagram of a device for implementing impedance matching and power distribution according to an embodiment of the present invention, and FIG. 4 is a schematic diagram of impedance matching and power provided by an embodiment of the present invention. FIG. 5 is a schematic structural diagram of a second apparatus for implementing impedance matching and power allocation according to an embodiment of the present invention; FIG. 6 is a third embodiment of the present invention. A schematic structural diagram of an apparatus for implementing impedance matching and power allocation; and FIG. 7 is a schematic structural diagram of a fourth apparatus for implementing impedance matching and power distribution according to an embodiment of the present invention.

為使本領域的技術人員更好地理解本發明的技術方案,下面結合附圖來對本發明提供的用於實現阻抗匹配和功率分配的裝置及半導體加工裝置進行詳細描述。 In order to enable those skilled in the art to better understand the technical solutions of the present invention, the apparatus and semiconductor processing apparatus for implementing impedance matching and power distribution provided by the present invention will be described in detail below with reference to the accompanying drawings.

第3圖為本發明實施例提供的第一種用於實現阻抗匹配和功率分配的裝置應用於反應腔室時的結構示意圖。請參閱第3圖,反應腔室30包括介質窗31和氣體噴嘴32,氣體噴嘴32自反應腔室30的外部穿過介質窗31而延伸至反應腔室30內,用於向反應腔室30內輸送製程氣體;反應腔室30內的底部區域設置有用於承載晶片S的下電極基座33,下電極基座33通過匹配器36與射頻電源37電連接,射頻電源37用於向晶片S提供負偏壓;介質窗31的上方設置有對應於反應腔室30內的中心區域的內線圈34和對應於反應腔室30內的邊緣區域的外線圈35。 FIG. 3 is a schematic structural diagram of a first device for implementing impedance matching and power distribution applied to a reaction chamber according to an embodiment of the present invention. Referring to FIG. 3, the reaction chamber 30 includes a dielectric window 31 and a gas nozzle 32 extending from the outside of the reaction chamber 30 through the dielectric window 31 into the reaction chamber 30 for use in the reaction chamber 30. The process gas is internally transported; the bottom region in the reaction chamber 30 is provided with a lower electrode base 33 for carrying the wafer S, the lower electrode base 33 is electrically connected to the RF power source 37 through the matcher 36, and the RF power source 37 is used for the wafer S A negative bias is provided; an inner coil 34 corresponding to a central region within the reaction chamber 30 and an outer coil 35 corresponding to an edge region within the reaction chamber 30 are disposed above the dielectric window 31.

本發明實施例提供的用於實現阻抗匹配和功率分配的裝置設置在射頻電源RF和內線圈34、外線圈35之間,用以實現射頻電源RF的輸入阻抗和輸出阻抗的匹配以及射頻電源RF輸出的射頻功率在內線圈34和外線圈35之間的分配,以使射頻功率經由該內線圈34和外線圈35分別耦合至反應腔室30內的中心區域和邊緣區域,從而將中心區域和邊緣區域內的製程氣體激發形成電漿,借助電漿與晶片S表面發生物理和/或化學反應,以對晶片S進行刻蝕、沉積或者其他製程操作。 The device for implementing impedance matching and power distribution provided by the embodiment of the present invention is disposed between the RF power source RF and the inner coil 34 and the outer coil 35 for matching the input impedance and the output impedance of the RF power source RF and the RF power source RF. The output RF power is distributed between the inner coil 34 and the outer coil 35 such that radio frequency power is coupled to the central and edge regions within the reaction chamber 30 via the inner coil 34 and the outer coil 35, respectively, thereby centering the central region and The process gas in the edge region is excited to form a plasma, which is physically and/or chemically reacted with the surface of the wafer S by means of plasma to etch, deposit or otherwise process the wafer S.

在本實施例中,用於實現阻抗匹配和功率分配的裝置包括功率分配電路23、阻抗匹配電路24、第一檢測器、第二檢測器26、控制器27和執行機構28。 In the present embodiment, the means for achieving impedance matching and power distribution includes a power distribution circuit 23, an impedance matching circuit 24, a first detector, a second detector 26, a controller 27, and an actuator 28.

其中,阻抗匹配電路24的輸入端用於與射頻電源RF電連接,射頻電源RF的頻率可以為400kHz、2MHz、13MHz、27MHz、4MHz、60MHz中的任意一種。功率分配電路23包括至少兩條支路(231和231’),其中,支路(231,231’)的上游端與阻抗匹配電路24的輸出端相連,支路(231,231’)的下游端用於與外接裝置相連。所謂支路(231,231’)的上游端,指的是支路(231,231’)中的與阻抗匹配電路24相連的那一端;所謂支路(231,231’)的下游端,指的是支路(231,231’)中的與外接裝置相連的那一端。即所謂上下游,是沿電路中功率的傳輸方向而言的。在本實施例中,外接裝置包括內線圈34和外線圈35,這時,支路231與內線圈34相連,支路231’與外線圈35相連。其中,內線圈34或外線圈35的結構包括但不限於平面線圈結構、立體線圈結構或部分平面部分立體的線圈結構。 The input end of the impedance matching circuit 24 is electrically connected to the RF power source RF. The frequency of the RF power source RF may be any one of 400 kHz, 2 MHz, 13 MHz, 27 MHz, 4 MHz, and 60 MHz. The power distribution circuit 23 includes at least two branches (231 and 231'), wherein the upstream end of the branch (231, 231') is connected to the output of the impedance matching circuit 24, downstream of the branch (231, 231') The end is used to connect to an external device. The upstream end of the so-called branch (231, 231') refers to the end of the branch (231, 231') that is connected to the impedance matching circuit 24; the downstream end of the so-called branch (231, 231') refers to It is the end of the branch (231, 231') that is connected to the external device. The so-called upstream and downstream, is in the direction of power transmission in the circuit. In the present embodiment, the external device includes an inner coil 34 and an outer coil 35. At this time, the branch 231 is connected to the inner coil 34, and the branch 231' is connected to the outer coil 35. The structure of the inner coil 34 or the outer coil 35 includes, but is not limited to, a planar coil structure, a three-dimensional coil structure, or a partial planar portion three-dimensional coil structure.

另外,每條支路(231,231’)上均串聯有功率分配單元,該功率分配單元僅包括一個第一可變電容(C11,C11’)。即,支路231上串聯有第一可變電容C11,支路231’上串聯有第一可變電容C11’。 In addition, a power distribution unit is connected in series to each branch (231, 231'), and the power distribution unit includes only one first variable capacitor (C11, C11'). That is, the first variable capacitor C11 is connected in series to the branch 231, and the first variable capacitor C11' is connected in series to the branch 231'.

由上可知,本發明實施例提供的用於實現阻抗匹配和功率分配的裝置,在反應腔室30的上方設置有兩個外接裝置(即,內線圈34和外線圈35)的情況下,功率分配電路23對應地僅需要兩個電子裝置(即,僅需兩個第一可變電容(C11和C11’),其中第一可變電容C11對應於內線圈34,第一可變電容C11’對應於外線圈35)即可,這與現有技術中需要4~5個電子裝置相比,減少了電子裝置的數量,提高了該用於實現阻抗匹配和功率分配的裝置的結構緊湊性和集成度,同時降低了成本。尤其是在外接裝置的數量越多時,電子裝置的數量減少得越明顯,上述優勢也就越盡顯。 It can be seen from the above that the apparatus for implementing impedance matching and power distribution provided by the embodiment of the present invention has two external devices (ie, the inner coil 34 and the outer coil 35) disposed above the reaction chamber 30, and the power is The distribution circuit 23 correspondingly requires only two electronic devices (ie, only two first variable capacitors (C11 and C11') are required, wherein the first variable capacitor C11 corresponds to the inner coil 34, and the first variable capacitor C11' Corresponding to the outer coil 35), which reduces the number of electronic devices compared to the prior art requiring 4 to 5 electronic devices, and improves the compactness and integration of the device for achieving impedance matching and power distribution. Degree, while reducing costs. Especially when the number of external devices is increased, the number of electronic devices is reduced more and more, and the above advantages are more obvious.

如第3圖所示,該用於實現阻抗匹配和功率分配的裝置還包括輸入埠20和與支路(231,231’)一一對應的輸出埠組(21,22)。在本實施例中,阻抗匹配電路24的輸入端通過輸入埠20與射頻電源RF相連。功率分配電路23包括兩條支路(231和231’),相應地,該裝置包括對應於支路231的輸出埠組21和對應於支路231’的輸出埠組22。其中,輸出埠組21包括第一輸出埠211和第二輸出埠212,第一輸出埠211分別與支路231的下游端以及該支路231所對應的外接裝置(即,內線圈34)的一端電連接,第二輸出埠212分別與位準地以及外接裝置(即,內線圈34)的另一端電連接;輸出埠組22包括第一輸出埠221和第二輸出埠222,第一輸出埠221分別與支路231’的下游端以及該支路231’所對應的外接裝置(即,外線圈35)的一端電連接,第二輸出埠222與外接裝置(即,外線圈35)的另一端電連接,以及經由第一固定電容C21與位準地電連接。上述輸入埠20、輸出埠組21的第一輸出埠211和第二輸出埠212、輸出埠組22的第一輸出埠221和第二輸出埠222均可以設置為插拔式的埠,因此,將輸出埠組21與內線圈34電連接、將輸出埠組22與外線圈35電連接、以及將輸入埠20與射頻電源電連接或斷開時,均可以採用插拔的方式進行,以便於結構整體的安裝和維護。 As shown in Fig. 3, the apparatus for achieving impedance matching and power distribution further includes an input port 20 and an output port group (21, 22) in one-to-one correspondence with the branches (231, 231'). In the present embodiment, the input of the impedance matching circuit 24 is connected to the RF power source RF via the input port 20. The power distribution circuit 23 includes two branches (231 and 231'), and accordingly, the apparatus includes an output stack 21 corresponding to the branch 231 and an output stack 22 corresponding to the branch 231'. The output port group 21 includes a first output port 211 and a second output port 212. The first output port 211 is respectively connected to the downstream end of the branch circuit 231 and the external device corresponding to the branch circuit 231 (ie, the inner coil 34). One end is electrically connected, and the second output port 212 is electrically connected to the level ground and the other end of the external device (ie, the inner coil 34); the output port group 22 includes a first output port 221 and a second output port 222, the first output The 埠221 is electrically connected to the downstream end of the branch 231' and one end of the external device (ie, the outer coil 35) corresponding to the branch 231', and the second output port 222 and the external device (ie, the outer coil 35) The other end is electrically connected and electrically connected to the level via the first fixed capacitor C21. The input port 20, the first output port 211 and the second output port 212 of the output port group 21, and the first output port 221 and the second output port 222 of the output port group 22 can be set to plug-in type, therefore, When the output unit group 21 is electrically connected to the inner coil 34, the output unit group 22 is electrically connected to the outer coil unit 35, and the input port 20 is electrically connected or disconnected from the radio frequency power source, the plugging can be performed by plugging and unplugging. The overall installation and maintenance of the structure.

通過研究發現:若第二輸出埠222直接接位準地,會造成外線圈35兩端電壓不相等,從而造成反應腔室30內的對應於外線圈35的邊緣區域的電漿分佈不均勻,不利於製程的均勻性。而在本實施例中,第二輸出埠222與位準地之間還串聯有第一固定電容C21,即,與外線圈35對應的支路231’上的第一可變電容C11’先串聯外線圈35再串聯第一固定電容C21,使得該支路231’與位準地之間形成阻抗由負到正再負的結構,從而使得外線圈35上的電流和電壓均是對稱分佈的,進而可以實現反應腔室30內的邊緣區域的電漿的均勻分佈。 It has been found through research that if the second output port 222 is directly connected to the ground, the voltage across the outer coil 35 will be unequal, resulting in uneven plasma distribution in the edge portion of the reaction chamber 30 corresponding to the outer coil 35. Not conducive to the uniformity of the process. In this embodiment, the first fixed capacitor C21 is further connected in series between the second output port 222 and the level ground, that is, the first variable capacitor C11' on the branch 231' corresponding to the outer coil 35 is connected in series. The outer coil 35 is further connected in series with the first fixed capacitor C21, so that a structure in which the impedance is negative to positive and negative again is formed between the branch 231' and the level ground, so that the current and voltage on the outer coil 35 are symmetrically distributed. Further uniform distribution of the plasma in the edge regions within the reaction chamber 30 can be achieved.

另外,在本發明實施例提供的用於實現阻抗匹配和功率分配的裝置中,電容串聯電感(即,第一可變電容C11串聯內線圈34後接位準地)的結構很容易達到串聯諧振的效果,而在這種諧振效果下相應支路231上的電流最大,第一可變電容C11和內線圈34連接點的電勢最高。由於電勢越高起輝越好,且內線圈34與氣體噴嘴32位置接近,因而擴大了電漿的起輝視窗,從而增大了反應腔室30的應用視窗。 In addition, in the apparatus for implementing impedance matching and power distribution provided by the embodiment of the present invention, the structure of the capacitor series inductance (that is, the first variable capacitor C11 is connected in series with the coil 34 and the level is connected to the ground) is easy to achieve series resonance. The effect is that the current on the corresponding branch 231 is the largest under this resonance effect, and the potential of the connection point of the first variable capacitor C11 and the inner coil 34 is the highest. The higher the potential, the better the priming, and the inner coil 34 is close to the gas nozzle 32, thereby expanding the priming window of the plasma, thereby increasing the application window of the reaction chamber 30.

阻抗匹配電路24包括第二可變電容C12、第三可變電容C13和第一電感L1。第二可變電容C12與第一電感L1彼此串聯並連接在阻抗匹配電路24的輸入端和輸出端之間;第三可變電容C13的一端與阻抗匹配電路24的輸入端相連,另一端接位準地。. The impedance matching circuit 24 includes a second variable capacitor C12, a third variable capacitor C13, and a first inductor L1. The second variable capacitor C12 and the first inductor L1 are connected in series with each other and connected between the input end and the output end of the impedance matching circuit 24; one end of the third variable capacitor C13 is connected to the input end of the impedance matching circuit 24, and the other end is connected Level. .

第一檢測器包括兩個電流感測器25。支路231和支路231’上各自均設置有一個電流感測器25,用於分別檢測所在支路(231或231’)的電流,並將檢測到的結果發送至控制器27。 The first detector includes two current sensors 25. Each of the branch 231 and the branch 231' is provided with a current sensor 25 for detecting the current of the branch (231 or 231'), and transmitting the detected result to the controller 27.

第二檢測器26與輸入埠20、阻抗匹配電路24的輸入端和控制器27分別相連,用於檢測射頻電源RF的負載阻抗,並將檢測到的負載阻抗發送至控制器27。 The second detector 26 is connected to the input port 20, the input of the impedance matching circuit 24, and the controller 27, respectively, for detecting the load impedance of the RF power source RF, and transmitting the detected load impedance to the controller 27.

控制器27與執行機構28相連,用於根據該第一檢測器檢測到的電流和第二檢測器26檢測到的負載阻抗向執行機構28發送調節信號;執行機構28用於根據該調節信號調節每個第一可變電容(C11、C11’)和阻抗匹配電路24中的阻抗可調元件,所謂阻抗可調元件是指通過調節能夠改變阻抗匹配電路24的阻抗大小的元件,在本實施例中,該阻抗可調元件包括第二可變電容C12和第三可變電容C13。執行機構28用於根據該調節信號調節第一可變電容(C11、C11’)、第二可變電容C12和第三可變電容C13,即,調節第一可變電容(C11、C11’)、第二可變電容C12和第三可變電容C13的活動端的位置,以改變各自串聯在電路中的阻抗值。具體地,執行機構28包括步進電機。 The controller 27 is coupled to the actuator 28 for transmitting an adjustment signal to the actuator 28 based on the current detected by the first detector and the load impedance detected by the second detector 26; the actuator 28 is operative to adjust based on the adjustment signal Each of the first variable capacitors (C11, C11') and the impedance tunable element in the impedance matching circuit 24, the so-called impedance tunable element, refers to an element capable of changing the impedance of the impedance matching circuit 24 by adjusting, in this embodiment The impedance tunable component includes a second variable capacitor C12 and a third variable capacitor C13. The actuator 28 is configured to adjust the first variable capacitor (C11, C11'), the second variable capacitor C12 and the third variable capacitor C13 according to the adjustment signal, that is, adjust the first variable capacitor (C11, C11') The positions of the active ends of the second variable capacitor C12 and the third variable capacitor C13 are used to change the impedance values of the respective series connected in the circuit. Specifically, the actuator 28 includes a stepper motor.

需要說明的是,現有技術中,通常借助兩個控制器來分別控制阻抗匹配電路24進行阻抗匹配和功率分配電路23進行功率分配,而在本實施例中,使用同一個控制器27來控制阻抗負載匹配電路24和功率分配電路23,這與現有技術相比,可以更進一步降低成本並提高集成度。 It should be noted that, in the prior art, the impedance matching circuit 24 is separately controlled by the two controllers for impedance matching and the power distribution circuit 23 performs power allocation. In the embodiment, the same controller 27 is used to control the impedance. The load matching circuit 24 and the power distribution circuit 23 can further reduce the cost and improve the integration as compared with the prior art.

下面結合第4圖詳細說明本實施例提供的用於實現阻抗匹配和功率分配的裝置的工作過程,其具體包括以下步驟: The working process of the apparatus for implementing impedance matching and power allocation provided by this embodiment is described in detail below with reference to FIG. 4, which specifically includes the following steps:

步驟S1,第二檢測器26、控制器27、執行機構28和阻抗匹配電路24配合以進行阻抗匹配。具體地,控制器27根據第二檢測器26檢測到的負載阻抗計算第二可變電容C12和第三可變電容C13各自需要調節的調節量,並發送相應的調節信號至執行機構28,執行機構28根據該調節信號調節第二可變電容C12和第三可變電容C13的活動端的位置。 In step S1, the second detector 26, the controller 27, the actuator 28 and the impedance matching circuit 24 cooperate to perform impedance matching. Specifically, the controller 27 calculates an adjustment amount that each of the second variable capacitor C12 and the third variable capacitor C13 needs to be adjusted according to the load impedance detected by the second detector 26, and sends a corresponding adjustment signal to the actuator 28 to execute The mechanism 28 adjusts the positions of the movable ends of the second variable capacitor C12 and the third variable capacitor C13 in accordance with the adjustment signal.

步驟S2,控制器27即時根據第二檢測器26檢測到的負載阻抗判斷當前是否實現阻抗匹配,若是,則進入步驟S3;若否,則返回步驟S1。 In step S2, the controller 27 immediately determines whether impedance matching is currently performed according to the load impedance detected by the second detector 26. If yes, the process proceeds to step S3; if not, returns to step S1.

步驟S3,第一檢測器、控制器27、執行機構28和功率分配電路23配合開始進行功率分配。具體地,第一檢測器檢測每條支路(231,231’)的電 流,並將檢測結果發送至控制器27,控制器27基於每條支路(231,231’)的電流計算每條支路(231,231’)的功率,並基於該功率值計算每個第一可變電容(C11,C11’)需要調節的調節量,並發送相應的調節信號至執行機構28,執行機構28根據該調節信號調節每個第一可變電容(C11,C11’)的活動端的位置。 In step S3, the first detector, the controller 27, the actuator 28 and the power distribution circuit 23 cooperate to start power distribution. Specifically, the first detector detects the power of each branch (231, 231') Flow, and send the detection result to the controller 27, which calculates the power of each branch (231, 231') based on the current of each branch (231, 231'), and calculates each based on the power value The first variable capacitor (C11, C11') requires an adjusted adjustment amount and sends a corresponding adjustment signal to the actuator 28, and the actuator 28 adjusts each of the first variable capacitors (C11, C11') according to the adjustment signal. The location of the active end.

步驟S4,控制器27根據每條支路(231,231’)上的功率即時判斷當前是否達到要求的功率分配比例,若是,則進入步驟S5;若否,則返回步驟S3。 In step S4, the controller 27 immediately determines whether the required power allocation ratio has been reached based on the power on each of the branches (231, 231'), and if so, proceeds to step S5; if not, returns to step S3.

步驟S5,控制器27根據第二檢測器26檢測到的負載阻抗判斷當前是否實現阻抗匹配;若是,則進入步驟S6;若否,則返回步驟S1。 In step S5, the controller 27 determines whether impedance matching is currently achieved based on the load impedance detected by the second detector 26; if yes, the process proceeds to step S6; if not, returns to step S1.

步驟S6,控制器27判斷製程是否完成,若是,製程結束;若否,進入步驟S5。 In step S6, the controller 27 determines whether the process is completed, and if so, the process ends; if not, proceeds to step S5.

在步驟S4中,可以根據流過兩條支路(231,231’)的電流比例(即,流過外線圈35和內線圈34的電流比例)是否達到要求的電流分配比例,判斷兩條支路(231,231’)上的功率是否達到要求的功率分配比例。不同製程中所要求的流過外線圈35和內線圈34的電流比例也有所不同,如某製程A要求的流過外線圈35的電流與流過內線圈34的電流之比為1:3,製程B要求的流過外線圈35的電流與流過內線圈34的電流之比為1:1,製程C要求的流過外線圈35的電流與流過內線圈34的電流之比為3:1,等等,這個比例可以根據具體製程要求而被限定在一定範圍內(例如,流過外線圈35的電流與流過內線圈34的電流之比為1:9到9:1的範圍)的任意比例值。通過改變流過內線圈34的電流和流過外線圈35的電流,形成均勻的電磁場分佈,進而形成均勻的電漿分佈,從而使得製程完成後晶片S的均勻性滿足要求。 In step S4, two branches can be determined according to whether the current ratio flowing through the two branches (231, 231') (i.e., the ratio of the current flowing through the outer coil 35 and the inner coil 34) reaches the required current distribution ratio. Whether the power on the road (231, 231') reaches the required power distribution ratio. The ratio of the current flowing through the outer coil 35 and the inner coil 34 required in different processes is also different. For example, the ratio of the current flowing through the outer coil 35 required by a process A to the current flowing through the inner coil 34 is 1:3. The ratio of the current flowing through the outer coil 35 required by the process B to the current flowing through the inner coil 34 is 1:1, and the ratio of the current flowing through the outer coil 35 required by the process C to the current flowing through the inner coil 34 is 3: 1, etc., this ratio can be limited to a certain range according to specific process requirements (for example, the ratio of the current flowing through the outer coil 35 to the current flowing through the inner coil 34 is in the range of 1:9 to 9:1) Any ratio value. By changing the current flowing through the inner coil 34 and the current flowing through the outer coil 35, a uniform electromagnetic field distribution is formed, thereby forming a uniform plasma distribution, so that the uniformity of the wafer S after the completion of the process satisfies the requirements.

需要說明的是,儘管在本實施例中阻抗匹配電路24採用第3圖所示的電路結構,但是,本發明並不侷限於此,在實際應用中,阻抗匹配電路24還可以採用其他電路結構,舉例如下: It should be noted that although the impedance matching circuit 24 adopts the circuit structure shown in FIG. 3 in the present embodiment, the present invention is not limited thereto. In practical applications, the impedance matching circuit 24 may also adopt other circuit structures. For example,

請參閱第5圖,其中示出了本發明實施例提供的第二種用於實現阻抗匹配和功率分配的裝置的結構示意圖。與第3圖所示的阻抗匹配電路24相比,第5圖中的阻抗匹配電路24省去了第3圖中的第一電感L1,其同樣可以實現阻抗匹配,而且電子裝置更少,因此,本實施例提供的用於實現阻抗匹配和功率分配的裝置的體積會進一步減小,成本會進一步降低。 Referring to FIG. 5, there is shown a schematic structural diagram of a second apparatus for implementing impedance matching and power distribution according to an embodiment of the present invention. Compared with the impedance matching circuit 24 shown in FIG. 3, the impedance matching circuit 24 in FIG. 5 omits the first inductance L1 in FIG. 3, which can also achieve impedance matching and has fewer electronic devices. The volume of the device for achieving impedance matching and power distribution provided by this embodiment is further reduced, and the cost is further reduced.

請參閱第6圖,其中示出了本發明實施例提供的第三種用於實現阻抗匹配和功率分配的裝置的結構示意圖。與第5圖相比,第6圖中的阻抗匹配電路24還包括第二固定電容C22,第二固定電容C22並聯設置在第二可變電容C12的兩端,從而可以進行更高精度的阻抗匹配調整,減少了超調問題的發生,使得阻抗匹配調整過程的穩定性更好。 Referring to FIG. 6, there is shown a schematic structural diagram of a third apparatus for implementing impedance matching and power distribution according to an embodiment of the present invention. Compared with FIG. 5, the impedance matching circuit 24 in FIG. 6 further includes a second fixed capacitor C22, and the second fixed capacitor C22 is disposed in parallel at both ends of the second variable capacitor C12, so that a higher precision impedance can be performed. Matching adjustments reduce the occurrence of overshoot problems, making the stability of the impedance matching adjustment process better.

請參閱第7圖,其中示出了本發明實施例提供的第四種用於實現阻抗匹配和功率分配的裝置的結構示意圖。與第5圖相比,第7圖中的阻抗匹配電路24還包括第二固定電容C22,第二固定電容C22並聯設置在第三可變電容C13的兩端,從而可以減小對第二可變電容C12的電流限制,實現了該裝置的高功率應用。 Referring to FIG. 7, a schematic structural diagram of a fourth apparatus for implementing impedance matching and power distribution according to an embodiment of the present invention is shown. Compared with FIG. 5, the impedance matching circuit 24 in FIG. 7 further includes a second fixed capacitor C22, and the second fixed capacitor C22 is disposed in parallel at both ends of the third variable capacitor C13, so that the second can be reduced. The current limitation of the variable capacitor C12 enables high power applications of the device.

另外需要說明的是,本發明實施例提供的用於實現阻抗匹配和功率分配的裝置,並不侷限於應用兩個外接裝置的情況,也可以用於至少三個外接裝置的情況,具體電路設計原理與應用兩個外接裝置時的設計原理相類似,在此不再詳述;並且,外接裝置並不侷限於線圈的這種情況,還可以為其他能夠採用的裝置。 It should be noted that the apparatus for implementing impedance matching and power allocation provided by the embodiments of the present invention is not limited to the case of applying two external devices, and may also be used for the case of at least three external devices, and the specific circuit design. The principle is similar to the design principle when two external devices are applied, and will not be described in detail herein; and the external device is not limited to the case of the coil, and may be other devices that can be used.

進一步需要說明的是,當至少三個外接裝置依次套置時,至少三個外接裝置分別對應於反應腔室30的沿徑向劃分的一個中心區域和至少兩個環形區域,每個外接裝置均用以激發相應區域內的氣體形成電漿。與上文的工作原理相同,為了提高反應腔室30內的電漿的均勻性,室少在位於最邊緣的該外接裝置對應的該輸出埠組的第二輸出埠與位準地之間串聯有第一固定電容C21;為了進一步提高反應腔室30內的電漿分佈的均勻性,除了與位於中心的該外接裝置對應的該輸出埠組,在其餘每個該輸出埠組的第二輸出埠與位準地之間均串聯有第一固定電容C21。 It should be further noted that when at least three external devices are sequentially placed, at least three external devices respectively correspond to a central region of the reaction chamber 30 that is radially divided and at least two annular regions, each of which is externally connected. It is used to excite the gas in the corresponding area to form a plasma. As in the above working principle, in order to improve the uniformity of the plasma in the reaction chamber 30, the chamber is less connected in series between the second output 埠 and the level ground of the output 埠 group corresponding to the external device located at the extreme edge. There is a first fixed capacitor C21; in order to further improve the uniformity of the plasma distribution in the reaction chamber 30, in addition to the output group corresponding to the external device located at the center, the second output of each of the remaining output groups A first fixed capacitor C21 is connected in series between the 埠 and the level ground.

作為另外一個技術方案,本實施例還提供一種半導體加工裝置,其採用本發明上述實施例提供的用於實現阻抗匹配和功率分配的裝置。 As another technical solution, the embodiment further provides a semiconductor processing apparatus using the apparatus for achieving impedance matching and power distribution provided by the above embodiments of the present invention.

本發明實施例提供的半導體體加工裝置,由於其採用了上述實施例提供的用於實現阻抗匹配和功率分配的裝置,因此不僅可以降低成本,而且可以提高裝置的集成度,減小裝置的體積。 The semiconductor body processing apparatus provided by the embodiment of the present invention can reduce the cost and reduce the integration of the apparatus and reduce the volume of the apparatus because it adopts the apparatus for implementing impedance matching and power distribution provided by the above embodiments. .

可以理解的是,以上實施方式僅僅是為了說明本發明的原理而採用的示例性實施方式,然而本發明並不侷限於此。對於本領域內的普通技術人員而言,在不脫離本發明的精神和實質的情況下,可以做出各種變型和改進,這些變型和改進也視為本發明的保護範圍。 It is to be understood that the above embodiments are merely exemplary embodiments employed to explain the principles of the invention, but the invention is not limited thereto. Various modifications and improvements can be made by those skilled in the art without departing from the spirit and scope of the invention. These modifications and improvements are also considered to be within the scope of the invention.

20:輸入埠 21、22:輸出埠組 23:功率分配電路 24:阻抗匹配電路 25:電流感測器 26:檢測器 27:控制器 28:執行機構 30:反應腔室 31:介質窗 32:氣體噴嘴 33:下電極基座 34:內線圈 35:外線圈 36:匹配器 37、RF:射頻電源 211、212、221、222:輸出埠 231、231’:支路 C11、C11’、 C12、C13:可變電容 C21:固定電容 L1:電感 S:晶片20: Input 埠 21, 22: Output 埠 group 23: Power distribution circuit 24: Impedance matching circuit 25: Current sensor 26: Detector 27: Controller 28: Actuator 30: Reaction chamber 31: Media window 32: Gas nozzle 33: lower electrode base 34: inner coil 35: outer coil 36: matcher 37, RF: radio frequency power supply 211, 212, 221, 222: output 埠 231, 231': branches C11, C11', C12, C13: Variable capacitor C21: Fixed capacitor L1: Inductor S: Wafer

Claims (10)

一種用於實現阻抗匹配和功率分配的裝置,包括功率分配電路和阻抗匹配電路,該阻抗匹配電路的輸入端用於與射頻電源電連接,該功率分配電路包括至少兩條支路,每條該支路包括上游端和下游端,每條該支路的上游端與該阻抗匹配電路的輸出端相連,且其下游端用於與外接裝置相連,其特徵在於,每條該支路上均串聯有功率分配單元,該功率分配單元僅包括一個第一可變電容;該裝置還包括與該支路一一對應的輸出埠組,每個該輸出埠組均包括第一輸出埠和第二輸出埠,該第一輸出埠分別與相對應的支路的下游端以及該支路所對應的外接裝置的一端電連接,該第二輸出埠分別與位準地以及外接裝置的另一端電連接;至少是在位於最邊緣的該外接裝置所對應的該輸出埠組的第二輸出埠與該位準地之間串聯有第一固定電容。 An apparatus for implementing impedance matching and power distribution, comprising a power distribution circuit and an impedance matching circuit, wherein an input end of the impedance matching circuit is electrically connected to a radio frequency power supply, the power distribution circuit includes at least two branches, each of the The branch includes an upstream end and a downstream end, and an upstream end of each branch is connected to an output end of the impedance matching circuit, and a downstream end thereof is connected to the external device, wherein each branch is connected in series a power distribution unit, the power distribution unit includes only one first variable capacitor; the device further includes an output port group corresponding to the branch one-to-one, each of the output port groups including a first output port and a second output port The first output port is electrically connected to a downstream end of the corresponding branch and an end of the external device corresponding to the branch, and the second output port is electrically connected to the level ground and the other end of the external device respectively; The first fixed capacitor is connected in series between the second output port of the output port group corresponding to the external device located at the outermost edge and the level ground. 如申請專利範圍第1項所述的用於實現阻抗匹配和功率分配的裝置,其特徵在於,該裝置還包括輸入埠,該阻抗匹配電路通過該輸入埠與該射頻電源相連。 The apparatus for achieving impedance matching and power distribution according to claim 1, wherein the apparatus further includes an input port through which the impedance matching circuit is connected to the RF power source. 如申請專利範圍第2項所述的用於實現阻抗匹配和功率分配的裝置,其特徵在於,該至少兩條支路所對應的外接裝置依次套置。 The device for implementing impedance matching and power distribution according to claim 2, wherein the external devices corresponding to the at least two branches are sequentially disposed. 如申請專利範圍第3項所述的用於實現阻抗匹配和功率分配的裝置,其特徵在於,除了與位於中心的該外接裝置所對應的該輸出埠組之外,在其餘每個該輸出埠組的第二輸出埠與該位準地之間均串聯有第一固定電容。 The apparatus for achieving impedance matching and power distribution according to claim 3, characterized in that, in addition to the output group corresponding to the external device located at the center, each of the outputs 埠A first fixed capacitance is connected in series between the second output 组 of the group and the level ground. 如申請專利範圍第1項至第4項中任意一項所述的用於實現阻抗匹配和功率分配的裝置,其特徵在於,該阻抗匹配電路包括:第二可變電容,其串聯在該阻抗匹配電路的輸入端和輸出端之間; 第三可變電容,其一端與該阻抗匹配電路的輸入端相連,另一端接位準地。 The apparatus for achieving impedance matching and power distribution according to any one of claims 1 to 4, wherein the impedance matching circuit comprises: a second variable capacitor connected in series to the impedance Matching between the input and output of the circuit; The third variable capacitor has one end connected to the input end of the impedance matching circuit and the other end connected to the ground. 如申請專利範圍第5項所述的用於實現阻抗匹配和功率分配的裝置,其特徵在於,該阻抗匹配電路還包括第一電感,該第一電感與該第二可變電容彼此串聯並連接在該阻抗匹配電路的輸入端和輸出端之間。 The device for implementing impedance matching and power distribution according to claim 5, wherein the impedance matching circuit further includes a first inductor, and the first inductor and the second variable capacitor are connected in series and connected to each other. Between the input and output of the impedance matching circuit. 如申請專利範圍第5項所述的用於實現阻抗匹配和功率分配的裝置,其特徵在於,該阻抗匹配電路還包括:第二固定電容,其並聯設置在該第二可變電容的兩端或並聯設置在該第三可變電容的兩端。 The device for implementing impedance matching and power distribution according to claim 5, wherein the impedance matching circuit further comprises: a second fixed capacitor disposed in parallel at both ends of the second variable capacitor Or in parallel at both ends of the third variable capacitor. 如申請專利範圍第2項至第4項中任意一項所述的用於實現阻抗匹配和功率分配的裝置,其特徵在於,該裝置還包括第一檢測器、第二檢測器、控制器和執行機構,該第一檢測器用於檢測每條該支路的電流,並將檢測結果發送至該控制器;該第二檢測器與該輸入埠、該阻抗匹配電路的輸入端和該控制器分別相連,用於檢測該射頻電源的負載阻抗,並將檢測結果發送至該控制器;該控制器與該執行機構相連,用於根據該第一檢測器檢測到的電流和該第二檢測器檢測到的負載阻抗向該執行機構發送調節信號;該執行機構用於根據該調節信號調節每個該第一可變電容和該阻抗匹配電路中的阻抗可調元件。 The apparatus for achieving impedance matching and power distribution according to any one of claims 2 to 4, characterized in that the apparatus further comprises a first detector, a second detector, a controller, and An actuator, the first detector is configured to detect a current of each branch, and send the detection result to the controller; the second detector and the input port, the input end of the impedance matching circuit, and the controller respectively Connected to detect a load impedance of the RF power source, and send the detection result to the controller; the controller is connected to the actuator for detecting the current detected by the first detector and the second detector The resulting load impedance sends an adjustment signal to the actuator; the actuator is configured to adjust each of the first variable capacitor and the impedance tunable element in the impedance matching circuit based on the adjustment signal. 如申請專利範圍第8項所述的用於實現阻抗匹配和功率分配的裝置,其特徵在於,該第一檢測器包括與該支路一一對應的電流感測器,該電流感測器串聯在相應的該支路上。 The device for implementing impedance matching and power distribution according to claim 8 is characterized in that the first detector comprises a current sensor corresponding to the branch one-to-one, the current sensor is connected in series On the corresponding branch road. 一種半導體加工設備,其特徵在於,包括如申請專利範圍第1項至第9項中任意一項所述的用於實現阻抗匹配和功率分配的裝置。A semiconductor processing apparatus, comprising the apparatus for achieving impedance matching and power distribution according to any one of claims 1 to 9.
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