TWI593982B - Probe card inspection equipment - Google Patents

Description

Probe card detection device

BACKGROUND OF THE INVENTION 1. Field of the Invention This invention relates to a probe card detecting apparatus, and more particularly to a probe card detecting apparatus having a side panel type mother board assembly.

Please refer to FIG. 1, which shows a schematic diagram of a conventional probe card detecting device 100. The probe card detecting device 100 includes a base 110, a backing plate 120, a reversible platform 130, and a rear-mounted motherboard assembly 140. The motherboard assembly 140 includes a lower motherboard 142 and an upper motherboard 144. The motherboard assembly 140 is assembled on the reversible platform 130, wherein the lower motherboard 142 and the upper motherboard 144 are fixed hinges. The structure and the fixed pneumatic bar system (not shown) are connected such that the upper motherboard 144 can be oriented toward a pivotable direction A of the backing plate 120 (ie, the rearward pivoting direction) and The lower mother board 142 is pivoted. As shown in Fig. 1, a dial 150 is provided on the upper motherboard 144 for carrying a plurality of pogo pins. And, a probe card 160 to be detected is placed at a position corresponding to the dial 150 on the upper motherboard 144, by pivoting the upper motherboard 144 to the lower motherboard. When the 142 is overlapped, the elastic test probes on the dial 150 are electrically contacted with the corresponding contact pads on the probe cards 160 to form an electrical circuit, thereby making the probe card 160 and the probe The card detecting device 100 generates a link, and thus can detect whether or not the probe card 160 is abnormal.

However, it is known that the probe card detecting device 100 has the following disadvantages:

(1) Since the elastic test probes are disposed on the upper mother board 144, when the upper mother board 144 is downwardly covered with the lower mother board 142, the elastic test probes are obliquely oriented. The angle is in contact with the contact pad on the probe card 160, thereby causing the position of the pressing position of the elastic test probe to be offset from the contact position of the corresponding contact pad, so that the position of the contact pad cannot generate a correct circuit and cause a misjudgment. In addition, since the action of the capping exerts a lateral force on the elastic test probes each time the capping is performed, the elastic test probes are prone to skew or damage. Moreover, when the upper motherboard 144 is covered downward, the elastic test probe is located near the inside of the motherboard assembly 140 (ie, the position near the pivotal end between the upper motherboard 144 and the lower motherboard 142). The activity stroke is the shortest, and the elastic test probe near the outside of the motherboard assembly 140 (i.e., the position away from the pivotal end between the upper motherboard 144 and the lower motherboard 142) has the longest active stroke, resulting in the elastic test. The needle pressure applied to the probe card 160 by the probe is not uniform, thereby affecting the accuracy of the detection result of the probe card 160.

(2) The conventional rear-plate type motherboard assembly 140 is only applicable to a single model of the probe card 160. To detect another type of probe card, the entire set of motherboard assemblies 140 must be replaced. However, the motherboard assembly 140 has a certain weight, which is liable to cause inconvenience to personnel during handling and disassembly, and is liable to cause accidental injury during the process.

(3) Since the motherboard assembly 140 is of a rear cymbal structure, the upper motherboard 144 is blocked by the backplane 120 and is subjected to a fixed twist between the lower motherboard 142 and the upper motherboard 144. The chain structure and the fixed pneumatic bar system are limited such that the pivotable angle between the lower motherboard 142 and the upper motherboard 144 can only be an acute angle (i.e., the pivotable angle is less than 90 degrees). This means that since the operating space of the person is limited by the pivotable angle of the upper motherboard 144, the space near the inside of the motherboard assembly 140 (i.e., the pivoting end) cannot be effectively utilized.

(4) When a microscope is placed over the reversible platform 130 (not drawn) When the pins of the lower surface of the probe card 160 are observed, the reversible platform 130 must be turned in the side turn direction for observation. However, if the size of the circuit board (not shown) disposed on the motherboard assembly 140 is too large, the platform structure of the probe card detecting device 100 may be limited, so that the reversible platform 130 may not be used. Performing a lateral flip will otherwise cause structural interference between the board and the probe card detecting device 100.

(5) The mother board assembly 140 is directly placed and fixed on the table top of the reversible platform 130, and the bottom surface of the entire large area of the lower mother board 142 is used as the bearing surface. However, since the bottom surface of the lower motherboard 142 is easily scratched or worn during the handling and replacement of the motherboard assembly 140, the reference surface of the lower motherboard 142 is skewed, so that the probe card cannot be accurately conveyed. The needle level of 160. Moreover, since a single and large-area bottom surface is used as the bearing surface, the dimensional tolerance of the large-area bottom surface is difficult to accurately control at the micrometer level based on the limit of the manufacturing process, and thus the accuracy cannot be accurately conveyed. The needle position of the probe card 160.

(6) Some models of probe cards must be mounted on a speaker when testing. However, the relative bearing position of the frame of the probe card is not provided on the motherboard assembly 140. Therefore, when the upper mother board 144 is covered with the lower mother board 142, the bearing position of the probe card is not the same as the relative bearing position of the actual probe card frame. In addition, since the probe card 160 is mostly made of a material that can be wound, if the probe card 160 is supported by the upper motherboard 144, the elasticity of the probe card 160 is easily caused. The test probe was not able to successfully make electrical contact with the corresponding contact pad.

In view of the above, it is necessary to provide a probe card detecting device to solve the problems of the prior art.

In order to solve the above technical problem, an object of the present invention is to provide a probe card detecting apparatus, which can change the upper rear motherboard to the lower mother board by changing the conventional rear type mother board assembly to the side type mother board assembly. It is rotated 180 degrees without interfering with the back plate of the probe card detecting device. In addition, by designing the motherboard assembly of the present invention to fix the lower motherboard on the reversible platform of the probe card detecting device, and using a quick release structure to connect the upper motherboard and the lower motherboard By. Therefore, when the upper mother board is unfolded and placed horizontally together with the lower mother board, the upper mother board and the lower mother board can be quickly and easily separated. On the other hand, since the upper mother board of the present invention can be fully deployed to a horizontal state, the probe card can be designed to be assembled on the upper mother board. Moreover, the probe card can be assembled with the dial of the upper motherboard by first juxtaposing the probe card in parallel with the dial of the upper motherboard, and then the probe card is vertically pressed down, so that the probe is assembled. Each of the elastic test probes on the disc has the same downstroke stroke, and the needle pressure applied throughout the probe plate is also relatively even.

Another object of the present invention is to provide a probe card detecting apparatus which is preferably used when detecting a probe card carrying an organic frame. The probe card detecting device provides a parallel block and presses the parallel block over the motherboard assembly such that the parallel block and the upper bearing surface of the frame abut each other, thereby obtaining the probe card Better stability.

To achieve the above object, the present invention provides a probe card detecting apparatus comprising: a base having a reversible platform; a backing plate coupled to the base; and a motherboard assembly including a lower motherboard and a The lower motherboard is pivotally connected to the upper motherboard, wherein the lower motherboard is fixed on the reversible platform, and the upper motherboard has a pair of pivoting directions of the lower motherboard and the back panel, so that the lower motherboard A pivotable angle of the upper motherboard relative to the lower motherboard is greater than 90 degrees.

In one preferred embodiment of the invention, the pivotable direction is parallel to the backing plate.

In one preferred embodiment of the invention, the pivotable angle is 180 degrees.

In one preferred embodiment of the invention, the upper motherboard is for assembly with a dial and a probe card, and the dial is positioned between the upper motherboard and the probe card.

In a preferred embodiment of the present invention, the motherboard assembly further includes at least one connecting member for connecting the lower motherboard and the upper motherboard, the at least one connecting member includes a pivoting seat and a pivoting An arm and a pivoting shaft, wherein the pivoting seat has a first connecting hole and is fixed to one side of the lower motherboard, and the pivoting arm has a second connecting hole and is fixed to the upper motherboard One side, and the pivot shaft is configured to pass through the first connecting hole and the second connecting hole to pivotally connect the lower motherboard and the upper motherboard.

In a preferred embodiment of the present invention, when the pivoting shaft is separated from the first connecting hole and the second connecting hole, the upper mother board and the lower mother board are separated from each other.

In a preferred embodiment of the present invention, the probe card detecting device further includes a flat plate disposed on the upper mother board, and the flat plate is abutted on a frame for mounting a probe card.

In a preferred embodiment of the present invention, the lower motherboard has a movable bearing assembly, and the movable bearing assembly includes a lower bearing surface for abutting against the reversible platform. When the upper motherboard is pivoted to overlap the lower motherboard, the lower bearing surface of the movable bearing assembly abuts against the reversible platform, and when the upper motherboard faces away from the lower motherboard Upon pivoting, the movable bearing assembly is raised upwardly such that the lower bearing surface is at a longitudinal distance from the reversible platform.

In a preferred embodiment of the present invention, the reversible platform comprises at least A bearing block is used to bear a probe card.

100, 200, 300‧‧‧ probe card testing equipment

110, 210, 310‧‧‧ base

120, 220, 320‧‧‧ Backplane

130, 230, 230’, 330‧‧‧ fliptable platform

140, 240, 340‧‧‧ motherboard components

142, 242, 342‧‧‧ Motherboard

144, 244, 344‧‧‧ mother board

150, 250‧‧ ‧ dial

252‧‧‧Flexible test probe

160, 260, 360‧‧ ‧ probe card

270‧‧‧Connecting parts

272‧‧‧ pivoting seat

274‧‧‧ pivot arm

276‧‧‧ pivot shaft

2722‧‧‧First connection hole

2742‧‧‧Second connection hole

280, 380‧‧‧ machine frame

282‧‧‧ Lower flange

382‧‧‧Upper flange

2422‧‧‧Central opening

2424‧‧‧Active bearing components

2424A‧‧‧ under the bearing surface

2424B‧‧‧上上面

232‧‧‧Received block

232’‧‧‧First Block

234’‧‧‧Second reliance block

390‧‧‧flat board

392‧‧‧Locking mechanism

Θ‧‧‧ pivotable angle

A‧‧‧ pivotable direction

B‧‧‧ pivotable direction

D‧‧‧ lateral distance

H‧‧‧Longitudinal distance

1 is a schematic view showing a conventional probe card detecting device; FIG. 2 is a schematic view showing a probe card detecting device according to a first preferred embodiment of the present invention; and FIG. 3 is a side view showing a side plate of a second embodiment; 3D exploded view of the component; FIG. 4 is a top view of the probe card detecting device of FIG. 2; FIG. 5 is a schematic view showing the fliptable platform of the probe card detecting device according to the second preferred embodiment of the present invention; 6A and 6B are respectively schematic diagrams showing the operation of the movable bearing assembly of Fig. 3. Fig. 7 is a view showing a probe card detecting device according to a third preferred embodiment of the present invention; and Fig. 8 is a view showing a plan of stacking the flat plate of Fig. 7 on a mother board assembly.

The above and other objects, features and advantages of the present invention will become more <RTIgt;

Please refer to FIG. 2 and FIG. 3, wherein FIG. 2 is a schematic view showing the probe card detecting device 200 according to the first preferred embodiment of the present invention, and FIG. 3 is a side view showing the side plate motherboard assembly of FIG. The three-dimensional explosion map. The probe card detecting device 200 includes a base 210, a backing plate 220, a reversible platform 230, and a side-mounted motherboard assembly 240. The back plate 220 is coupled to a sidewall of the base 210, and the base 210 is configured to carry the reversible platform 230 and the motherboard assembly 240. The motherboard assembly 240 includes a lower motherboard 242, an upper motherboard 244, and at least one connector 270. The lower motherboard 242 is fixedly disposed on the reversible platform 230, and in the embodiment, is connected to the upper motherboard 244 by three connectors 270, but the number of the connectors 270 is only an example. The number is not limited to this, and can be set according to actual needs.

As shown in FIG. 3, each of the connecting members 270 includes a pivoting seat 272 having a pair of first connecting holes 2722, a pivoting arm 274 having a second connecting hole 2742, and a pivoting shaft 276. The pivoting seat 272 is fixed to one side of the lower motherboard 242, and the pivoting arm 274 is fixed to the opposite side of the upper motherboard 244. After the pivoting shaft 276 is inserted into the pair of first connecting holes 2722 and the second connecting hole 2742, the upper motherboard 244 is pivotally connected with the lower motherboard 242; After the pivoting shaft 276 is pulled away from the pair of first connecting holes 2722 and the second connecting hole 2742, even the upper mother board 244 and the lower mother board 242 are separated from each other. It can be understood that the pivoting shaft 276 and the pair of first connecting holes 2722 and the second can be released by simply providing a simple latching mechanism on the connecting member 270 so that only the pivoting shaft 276 needs to be pressed or twisted. The fastening between the connecting holes 2742 is achieved, so that the upper mother board 244 and the lower mother board 242 are quickly disassembled. It should be noted that the structure of the connecting member 270 in the first preferred embodiment of the present invention is merely an example, and in other embodiments, a different quick-release structure may be used instead of the connecting member 270, for example, using a hinge. The structure of the fastener.

Please refer to FIG. 4, which shows a top view of the probe card detecting device 200 of FIG. In the probe card detecting device 200 of the present invention, the conventional rear plate type mother board assembly is changed to the side type mother board assembly 240, that is, the upper mother board 244 has a relative to the lower mother board. The side pivotal pivoting direction B of the 242 and the side pivotal pivoting direction B are parallel to the backing plate 220 (and the pivotable direction A of the conventional upper mother board 144 shown in FIG. 1 is toward the Back plate 120), thus enabling the upper motherboard The pivotable angle θ of the 244 relative to the lower motherboard 242 can be greater than 90 degrees, and preferably pivoted to 180 degrees, ie, the upper motherboard 244 can be fully deployed to be horizontal with the lower motherboard 242. Correspondingly, when the upper motherboard 244 is pivoted relative to the lower motherboard 242, the upper motherboard 244 is always maintained at the same lateral distance D from the back panel 220. That is, the upper motherboard 244 does not create any structural interference with the backing plate 220 of the probe card detecting device 200.

As shown in FIG. 2 and FIG. 3, the probe card detecting device 200 of the present invention can expand the upper motherboard 244 to a horizontal state relative to the lower motherboard 242, so that the user can directly probe the device. A needle card 260 is assembled on the upper motherboard 244. More specifically, the upper motherboard 244 is used to sequentially assemble a dial 250 and a probe card 260. The dial 250 is used to carry a plurality of elastic test probes (pogo pins) 252. The probe card 260 includes an opposite first surface and a second surface, the first surface having a plurality of contact pads and the second surface having a plurality of pins protruding from the second surface. When the probe card 260 is assembled to the upper motherboard 244, the first face having a plurality of contact pads is assembled in the direction of the dial 250. By assembling the probe card 260 correspondingly to the dial 250, the elastic test probes 252 on the dial 250 electrically contact the corresponding contact pads on the probe card 260 to generate a loop. The probe card 260 is coupled to the probe card detecting device 200, so that it is possible to detect whether the probe card 260 is abnormal. It should be noted that when the probe card 260 is assembled correspondingly to the dial 250, the probe card 260 is first parallel to the dial 250 of the upper motherboard 244, and then the probe card 260 is vertical. Pressing down causes the probe card 260 to be assembled with the dial 250 of the upper motherboard 244 such that each of the elastic test probes 252 on the dial 250 has the same active travel and is then applied to the probe card 260. The needle pressure averaged everywhere. In addition, since the probe card 260 is horizontally placed on the dial 250, that is, each elastic test probe 252 is stretched in a vertical direction, thereby preventing the elastic test probe 252 from being pressed laterally. Cause skew or wear problem. In addition, since the probe card 260 is assembled with the dial 250 first, the upper motherboard 244 is pivoted to overlap with the lower motherboard 242 to perform detection of the probe card 260. Therefore, even if the upper mother board 244 is opened and closed a plurality of times, the release and contraction of the elastic test probes 252 on the dial 250 are not caused, so that the elastic test probes 252 can be effectively reduced. The number of presses, which in turn increases the useful life of the elastic test probe 252.

On the other hand, in the prior art (as shown in FIG. 1), since the probe card 160 is assembled on the lower motherboard 142, in order to use a microscope mounted above the reversible platform 130 (not shown) When viewing the pins located on the probe card 160, the entire fliptable platform 130 must be flipped laterally to direct the pin faces of the probe card 160 toward the microscope. However, the above method has a structural interference with the probe card detecting device 100 when the size of the circuit board of the motherboard assembly 140 is too large. Compared with the prior art, the present invention directly assembles the probe card 260 on the upper motherboard 244, and the first face (ie, the stitch face) of the probe card 260 is directly facing after assembly. The direction of the microscope. Therefore, the pin of the probe card 260 can be observed without laterally pivoting the reversible platform 230, thereby avoiding structural damage with the probe card detecting device 200 caused by flipping the reversible platform 230. The problem of interference.

As can be seen from the above, since the probe card 260 is assembled on the upper motherboard 244 in the probe card detecting device 200 of the present invention, the lower motherboard 242 is only used as a platform for bearing abutment, and Limited by the type of probe card that is detected, it can be permanently locked to the reversible platform 230 of the probe card inspection device 200. This means that when you want to replace the probe card of different models, you only need to replace the upper motherboard 244 to detect different types of probe cards. More specifically, the present invention only needs to unfold the upper mother board 244 in a horizontal state, and with the use of the connecting member 270 which can be quickly disassembled, the upper mother board 244 and the lower side can be easily and safely used. Mother board 242 fast Separate to achieve the effect of replacing the motherboard of different types of probe cards. Compared with the prior art, in order to detect different types of probe cards, it is necessary to replace the entire set of motherboard components. The present invention adopts the method of replacing only the mother board 244, thereby effectively reducing the burden on the personnel in handling and replacement.

As shown in FIG. 3, the lower motherboard 242 includes a central opening 2422. The lower surface of the central opening 2422 is a mesa of the reversible platform 230. The reversible platform 230 is provided with at least one bearing block 232 for providing The probe card 260 bears against the probe card 260 and holds the probe card 260 at a preferred detection reference surface. It can be understood that, in different embodiments, the mode can be set on the reversible platform according to the thickness of the single point of the detected probe card (ie, the height of the probe card from the mesa of the flippable platform). Grouped anchor blocks. For example, please refer to FIG. 5, which shows a schematic diagram of a reversible platform 230' of a probe card detecting device in accordance with a preferred embodiment of the present invention. In order to cooperate with the detection of probe cards having different thicknesses, the reversible platform 230' is provided with four higher-height first bearing blocks 232' at relatively thinner thickness points, and at relatively thicker thickness points. The position is set to 4 lower second bearing blocks 234'.

Please refer to FIG. 3 and FIGS. 6A and 6B , wherein FIGS. 6A and 6B respectively illustrate the operation of the movable bearing assembly 2424 of FIG. 3 . As shown in FIG. 3, a probe card 260 of a particular type is used in conjunction with a speaker 280 for reinforcing the overall structure of the probe card 260. Since the frame 280 is made of a steel material, the frame 280 can provide the integral component formed by the probe card 260 in combination with the frame 280, compared to the probe card 260 using the splicable material. The stability is maintained at the preferred test level. Accordingly, in addition to providing the abutment block 232 to provide the abutment of the probe card 260, the present invention further provides an element that abuts the frame 280. As shown in FIG. 3, at least a lower flange 282 (such as the four lower flanges 282 shown in FIG. 3) is provided at a position where the frame 280 is in contact with the lower motherboard 242, by the same. The lower flange 282 abuts against the lower motherboard 242, thereby enabling better stability when detecting the probe card 260.

On the other hand, as described in the prior art, if the large-area bottom plate of the lower mother board is used as the bearing surface of the integral mother board assembly, the flatness of the bottom board of the lower mother board is easily caused by the limitation of processing and manufacturing. Can not be controlled to the micron level, which causes the problem of skewing when the probe card bears against the bottom plate, thus affecting the accuracy of the detection. Accordingly, the present invention utilizes a small area and multi-piece movable bearing assembly 2424 as an element that bears against the lower flanges 282 of the frame 280. In manufacturing, a medium-sized plate can be precisely ground so that the flatness and thickness of the entire plate are controlled to a precise block gauge tolerance level, and then the plate is cut into a plurality of small plates to serve as a plurality of small plates. The lower flanges 282 of the frame 280 of the present invention or the movable bearing members 2424 thereby ensure the level of each bearing surface. In addition, in order to prevent the lower bearing plate 242 from being attached to the reversible platform 230, the lower bearing surface 2424A of the movable bearing member 2424 is damaged by impact or friction, as shown in FIG. 6A. The movable bearing assembly 2424 of the present invention is designed such that when no external force is applied to the upper bearing surface 2424B of the movable bearing assembly 2424 (ie, when the upper motherboard 244 faces away from the lower motherboard 242) Pivoting, the movable bearing assembly 2424 is raised upwardly such that the lower bearing surface 2424A of the movable bearing assembly 2424 is at a longitudinal distance H from the reversible platform 230. In addition, as shown in FIG. 6B, when the upper motherboard 244 is pivoted to overlap the lower motherboard 242, the lower flanges 282 of the frame 280 are superimposed on the movable bearing components. The upper bearing surface 2424B of the 2424 is such that the lower bearing surface 2424A of each movable bearing member 2424 abuts against the reversible platform 230, thereby providing the probe card 260 and the frame 280. The overall assembly is preferably stable and maintained at a preferred test level.

Please refer to FIG. 7 and FIG. 8 , wherein FIG. 7 shows the third comparison according to the present invention. A schematic diagram of the probe card detecting device 300 of the preferred embodiment, and FIG. 8 shows a schematic view of the planar plate of FIG. 7 stacked on the motherboard assembly. The probe card detecting device 300 includes a base 310, a back plate 320, a reversible platform 330, and a side-mounted motherboard assembly 340. The backplane 320 is coupled to one of the sidewalls of the base 310, and the base 310 is configured to carry the reversible platform 330 and the motherboard assembly 340. The motherboard assembly 240 includes a lower motherboard 342, an upper motherboard 344, and at least one connector (not labeled). It is to be understood that the probe card detecting device 300 of the third preferred embodiment of the present invention includes all the components of the probe card detecting device 200 of the first preferred embodiment, and thus will not be described herein. The probe card detecting device 300 of the third preferred embodiment is different from the probe card detecting device 200 of the first preferred embodiment in that the probe card detecting device 300 further includes a flat plate 390 for placing Above the upper mother board 344 of the motherboard assembly 340, an upward bearing surface of the frame 380 on which the probe card 360 is mounted is provided. The planar plate 390 is pivotally coupled to the lower motherboard 342. Specifically, the upper motherboard 344 and the planar panel 390 are pivotally connected to opposite sides of the lower motherboard 342, respectively, such that the upper motherboard 344 and the planar panel 390 are opposite to the lower motherboard 342. Perform a pivotal movement.

As shown in FIGS. 7 and 8, the frame 380 on which the probe card 360 is mounted has a plurality of upper flanges 382 on the other surface of the lower motherboard 342. As before, the upper flanges 382 are bearing planes having a block gauge tolerance level formed by precision machining. When the probe card 360 is detected, the upper motherboard 344 is first overlaid on the lower motherboard 342, and then the planar panel 390 is overlaid on the upper motherboard 344, and by a The latching mechanism 392 latches the flat panel 390 with the motherboard assembly 340 such that the probe card 360 is maintained on a preferred detection reference surface to obtain a more accurate detection value.

In summary, in the probe card detecting device of the present invention, the upper mother board can be pivoted relative to the lower mother board by changing the conventional rear slab type mother board assembly to the side sill type mother board assembly. And does not interfere with the back plate of the probe card detecting device. Further, by designing the motherboard assembly of the present invention to fix the lower motherboard on the reversible platform of the probe card detecting device, and using a quick release structure to connect the upper motherboard and the lower motherboard. Therefore, when the upper mother board is unfolded horizontally, the upper mother board and the lower mother board can be quickly and easily separated. On the other hand, since the upper mother board of the present invention can be fully deployed to a horizontal state, the probe card can be designed to be assembled on the upper mother board. In other words, the probe card can be assembled with the dial of the upper motherboard by first juxtaposing the probe card in parallel with the dial of the upper motherboard, and then pressing the probe card vertically downward. Each of the elastic test probes on the dial has the same depression stroke and the needle pressure applied across the probe plate is also relatively even. Furthermore, by providing the movable bearing assembly on the lower mother board, the lower bearing surface when the probe card is actually provided can be protected, thereby obtaining a more accurate detection value. Moreover, when detecting the probe card with the organic frame, by providing a parallel block for being laminated on the upper side of the motherboard assembly, the parallel block and the upper bearing surface of the frame abut each other, thereby making the The probe card achieves better stability.

While the invention has been described above in terms of the preferred embodiments, the invention is not intended to limit the invention, and the invention may be practiced without departing from the spirit and scope of the invention. The scope of protection of the present invention is therefore defined by the scope of the appended claims.

200‧‧‧Probe card testing equipment

210‧‧‧Base

220‧‧‧ Backplane

230‧‧‧Fliptable platform

240‧‧‧ Motherboard components

242‧‧‧Lower motherboard

244‧‧‧Upper motherboard

260‧‧‧ probe card

Θ‧‧‧ pivotable angle

B‧‧‧ pivotable direction

Claims (8)

A probe card detecting device comprising: a base having a reversible platform; a back plate coupled to the base; and a motherboard assembly including a lower motherboard and a pivotally coupled to the lower motherboard The upper mother board, wherein the lower mother board is fixed on the reversible platform, and the upper mother board has a pair of pivoting directions of the lower mother board and the back board, so that the upper mother board is opposite to the lower mother board A pivotable angle of the panel is greater than 90 degrees, wherein the upper motherboard is for assembly with a dial and a probe card, and the dial is positioned between the upper motherboard and the probe card. The probe card detecting device of claim 1, wherein the pivotable direction is parallel to the backing plate. The probe card detecting device of claim 1, wherein the pivotable angle is 180 degrees. The probe card detecting device of claim 1, wherein the motherboard assembly further comprises at least one connecting member for connecting the lower motherboard and the upper motherboard, the at least one connecting member comprising a pivotal connection a pivoting arm, a pivoting arm and a pivoting shaft, wherein the pivoting socket has a first connecting hole and is fixed to one side of the lower motherboard, and the pivoting arm has a second connecting hole and is fixed thereto The other side of the upper motherboard, and the pivoting shaft is configured to be inserted into the first connecting hole and the second connecting hole to pivotally connect the lower motherboard and the upper motherboard. The probe card detecting device of claim 4, wherein the upper mother board and the lower mother board are separated from each other after the pivot shaft is separated from the first connecting hole and the second connecting hole respectively. . The probe card detecting device according to claim 1, further comprising a flat panel and setting Above the upper motherboard, the planar panel abuts against a frame for mounting a probe card. The probe card detecting device of claim 1, wherein the lower motherboard has a movable bearing assembly, and the movable bearing assembly includes a lower bearing for abutting against the reversible platform Abutting, when the upper motherboard is pivoted to overlap the lower motherboard, the lower bearing surface of the movable bearing assembly abuts against the reversible platform, and when the upper motherboard faces away from the When the direction of the lower motherboard is pivoted, the movable bearing assembly is lifted upward such that the lower bearing surface is at a longitudinal distance from the reversible platform. The probe card detecting device of claim 1, wherein the reversible platform comprises at least one bearing block for bearing a probe card.