TWM432835U - Dual-window liftable probe card turnover jig - Google Patents

Dual-window liftable probe card turnover jig

Info

Publication number
TWM432835U
TWM432835U TW100223975U TW100223975U TWM432835U TW M432835 U TWM432835 U TW M432835U TW 100223975 U TW100223975 U TW 100223975U TW 100223975 U TW100223975 U TW 100223975U TW M432835 U TWM432835 U TW M432835U
Authority
TW
Taiwan
Prior art keywords
dual
window
probe card
turnover jig
card turnover
Prior art date
Application number
TW100223975U
Other languages
Chinese (zh)
Inventor
Hsing-Lung Chen
Original Assignee
Pleader-Yamaichi Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Pleader-Yamaichi Co Ltd filed Critical Pleader-Yamaichi Co Ltd
Priority to TW100223975U priority Critical patent/TWM432835U/en
Publication of TWM432835U publication Critical patent/TWM432835U/en

Links

TW100223975U 2011-12-20 2011-12-20 Dual-window liftable probe card turnover jig TWM432835U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW100223975U TWM432835U (en) 2011-12-20 2011-12-20 Dual-window liftable probe card turnover jig

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW100223975U TWM432835U (en) 2011-12-20 2011-12-20 Dual-window liftable probe card turnover jig

Publications (1)

Publication Number Publication Date
TWM432835U true TWM432835U (en) 2012-07-01

Family

ID=60623013

Family Applications (1)

Application Number Title Priority Date Filing Date
TW100223975U TWM432835U (en) 2011-12-20 2011-12-20 Dual-window liftable probe card turnover jig

Country Status (1)

Country Link
TW (1) TWM432835U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI593982B (en) * 2016-03-04 2017-08-01 中華精測科技股份有限公司 Probe card inspection equipment

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI593982B (en) * 2016-03-04 2017-08-01 中華精測科技股份有限公司 Probe card inspection equipment

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Legal Events

Date Code Title Description
MK4K Expiration of patent term of a granted utility model