TWI560440B - - Google Patents

Info

Publication number
TWI560440B
TWI560440B TW104102635A TW104102635A TWI560440B TW I560440 B TWI560440 B TW I560440B TW 104102635 A TW104102635 A TW 104102635A TW 104102635 A TW104102635 A TW 104102635A TW I560440 B TWI560440 B TW I560440B
Authority
TW
Taiwan
Application number
TW104102635A
Other versions
TW201530124A (zh
Inventor
chun-sheng Zhang
wei-hong Guo
Fei Cheng
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of TW201530124A publication Critical patent/TW201530124A/zh
Application granted granted Critical
Publication of TWI560440B publication Critical patent/TWI560440B/zh

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Nonlinear Science (AREA)
  • General Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • General Health & Medical Sciences (AREA)
  • Signal Processing (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Optics & Photonics (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
TW104102635A 2014-01-31 2015-01-27 電子構件檢查裝置 TW201530124A (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2014016477A JP6176789B2 (ja) 2014-01-31 2014-01-31 電子部品検査装置

Publications (2)

Publication Number Publication Date
TW201530124A TW201530124A (zh) 2015-08-01
TWI560440B true TWI560440B (zh) 2016-12-01

Family

ID=53730634

Family Applications (1)

Application Number Title Priority Date Filing Date
TW104102635A TW201530124A (zh) 2014-01-31 2015-01-27 電子構件檢查裝置

Country Status (3)

Country Link
JP (1) JP6176789B2 (zh)
CN (1) CN104820299A (zh)
TW (1) TW201530124A (zh)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108369648B (zh) * 2015-10-16 2022-10-28 迈克罗斯肯科技公司 用于增强型数字显微镜的系统、介质、方法和设备
CN105259178B (zh) * 2015-11-20 2019-03-15 云南卡索实业有限公司 一种剪切类线性痕迹激光检测系统
TWI588469B (zh) * 2016-04-26 2017-06-21 住華科技股份有限公司 自動檢測系統及應用其自動檢測方法
CN108872251A (zh) * 2018-08-02 2018-11-23 北京兆维科技开发有限公司 一种显示屏的图像采集机构和系统
CN108897153B (zh) * 2018-08-10 2024-08-23 宁波舜宇仪器有限公司 液晶面板导电粒子自动视觉检测装置
CN110445964B (zh) * 2019-07-22 2024-08-02 广东电网有限责任公司广州供电局 摄像装置及电缆故障解剖系统
KR20210116777A (ko) * 2020-03-13 2021-09-28 (주)테크윙 전자부품 처리장비용 촬영장치
CN114324360A (zh) * 2021-12-31 2022-04-12 深圳鼎晶科技有限公司 一种aoi压痕检测系统及方法
JP7336814B1 (ja) * 2022-02-15 2023-09-01 株式会社新川 検査装置、実装装置、検査方法、及びプログラム

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW200415910A (en) * 2002-11-01 2004-08-16 Photon Dynamics Inc Method and apparatus for flat patterned media inspection

Family Cites Families (10)

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Publication number Priority date Publication date Assignee Title
JPS63259521A (ja) * 1987-04-16 1988-10-26 Olympus Optical Co Ltd 複合型合焦検出装置
JP2000100883A (ja) * 1998-09-21 2000-04-07 Seiko Epson Corp 半導体検査装置
JP2002277729A (ja) * 2001-03-21 2002-09-25 Olympus Optical Co Ltd 顕微鏡用オートフォーカス装置および方法
JP5038191B2 (ja) * 2008-03-04 2012-10-03 有限会社共同設計企画 電子部品検査方法およびそれに用いられる装置
KR20090131000A (ko) * 2008-06-17 2009-12-28 아주하이텍(주) 플렉시블 인쇄회로기판의 통합 검사 시스템 및 그 방법
JP4716148B1 (ja) * 2010-03-30 2011-07-06 レーザーテック株式会社 検査装置並びに欠陥分類方法及び欠陥検出方法
CN102338755A (zh) * 2010-07-15 2012-02-01 鸿富锦精密工业（深圳）有限公司 电子元件接触点失效分析方法
KR20120015172A (ko) * 2010-08-11 2012-02-21 엘지디스플레이 주식회사 표시장치의 검사장치 및 그의 검사방법
KR20130051796A (ko) * 2011-11-10 2013-05-21 (주)쎄미시스코 기판 검사장치
JP2013145123A (ja) * 2012-01-13 2013-07-25 Seiwa Optical Co Ltd 広角反射同軸照明付光学系

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW200415910A (en) * 2002-11-01 2004-08-16 Photon Dynamics Inc Method and apparatus for flat patterned media inspection

Also Published As

Publication number Publication date
CN104820299A (zh) 2015-08-05
JP2015143628A (ja) 2015-08-06
JP6176789B2 (ja) 2017-08-09
TW201530124A (zh) 2015-08-01

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees