TWI556901B - Apparatus for providing an inerting gas during soldering - Google Patents
Apparatus for providing an inerting gas during soldering Download PDFInfo
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- TWI556901B TWI556901B TW103132862A TW103132862A TWI556901B TW I556901 B TWI556901 B TW I556901B TW 103132862 A TW103132862 A TW 103132862A TW 103132862 A TW103132862 A TW 103132862A TW I556901 B TWI556901 B TW I556901B
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Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K3/00—Tools, devices, or special appurtenances for soldering, e.g. brazing, or unsoldering, not specially adapted for particular methods
- B23K3/08—Auxiliary devices therefor
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K1/00—Soldering, e.g. brazing, or unsoldering
- B23K1/0008—Soldering, e.g. brazing, or unsoldering specially adapted for particular articles or work
- B23K1/0016—Brazing of electronic components
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K1/00—Soldering, e.g. brazing, or unsoldering
- B23K1/08—Soldering by means of dipping in molten solder
- B23K1/085—Wave soldering
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K3/00—Tools, devices, or special appurtenances for soldering, e.g. brazing, or unsoldering, not specially adapted for particular methods
- B23K3/06—Solder feeding devices; Solder melting pans
- B23K3/0646—Solder baths
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
- H05K3/34—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
- H05K3/3457—Solder materials or compositions; Methods of application thereof
- H05K3/3468—Applying molten solder
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K2101/00—Articles made by soldering, welding or cutting
- B23K2101/36—Electric or electronic devices
- B23K2101/42—Printed circuits
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- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Molten Solder (AREA)
- Electric Connection Of Electric Components To Printed Circuits (AREA)
Description
文中所描述的是於軟焊時提供惰性氣體的設備及方法。明更明確地說,文中所描述的是於使用氮及/或其他惰性氣體波焊時提供惰性氣體的設備及方法。 Described herein are apparatus and methods for providing an inert gas during soldering. More specifically, what is described herein is an apparatus and method for providing an inert gas when using nitrogen and/or other inert gas waves.
工件例如印刷線路板或電路板具有越來越小的可潤濕表面,該等表面必須能以焊料塗佈並且接合。典型的波焊作業涉及軟焊浴,該等印刷電路板或工件能於輸送時透過該軟焊浴予以軟焊。習用的自動波焊設備包括助熔劑設備、預熱器及為了處理印刷電路板而設置的焊料站。該等印刷電路板沿著移動軌道或輸送帶輸送,而且其側緣藉由抓取指支撐。助流劑可使該板與助流劑的泡沫或噴霧劑接觸。接著使該電路板通過預熱區以便使該助流劑能減少待軟焊的金屬表面上的氧化物。接著使該電路板與單一或多重波的熔融焊料於空氣中或於惰性化氛圍中接觸。 Workpieces such as printed wiring boards or circuit boards have increasingly smaller wettable surfaces that must be coated and bonded with solder. Typical wave soldering operations involve solder baths that can be soldered through the solder bath during transport. Conventional automatic wave soldering equipment includes fluxing devices, preheaters, and solder stations that are provided to handle printed circuit boards. The printed circuit boards are transported along a moving track or conveyor belt and their side edges are supported by grip fingers. A glidant can contact the plate with a foam or spray of a glidant. The board is then passed through a preheating zone to enable the flow aid to reduce oxides on the metal surface to be soldered. The board is then contacted with a single or multiple wave of molten solder in air or in an inerting atmosphere.
該惰性化氛圍典型為氮(N2)及/或其他惰性氣體 而且經常被叫做N2惰性化。於惰性氣體及/或氮氛圍中軟焊將該焊料表面上的浮渣或氧化物形成減至最少。已知浮渣或氧化物層的存在會造成焊料接頭中的跳越、橋或其他缺陷。於焊料波-其係於作業時由該波焊設備所產生-近端的是多孔管,該等多孔管與該焊料波平行行進並且用以輸送該惰性氣體及/或N2氣體以提供相對低氧的氛圍,特別是在待軟焊的工件下方。 The inerting atmosphere is typically nitrogen (N 2 ) and/or other inert gases and is often referred to as N 2 inertization. Soft soldering in an inert gas and/or nitrogen atmosphere minimizes the formation of scum or oxide on the surface of the solder. It is known that the presence of a scum or oxide layer can cause jumps, bridges or other defects in the solder joint. The solder wave is generated by the wave soldering device during operation - the proximal end is a porous tube that runs parallel to the solder wave and is used to deliver the inert gas and/or N 2 gas to provide relative Low oxygen atmosphere, especially under the workpiece to be soldered.
關於無鉛波焊,由於下列原因而進一步提高包含N2的惰性化氛圍的價值。使用普通無鉛焊料的加工溫度由於常用的無鉛焊料提高的熔點而顯著高於習用錫-鉛焊料的加工溫度。此加工溫度提高促成浮渣形成。再者,無鉛焊料的成本正常遠高於習用錫-鉛焊料的成本,而且由於浮渣形成造成的焊料廢棄物相關經濟損失比無鉛波焊更明顯。此外,無鉛焊料的潤濕性能與習用的錫-鉛焊料相比本質上係差的。因此,所形成的焊料接頭的品質對無鉛焊料表面上的氧化態更敏感。 Regarding lead-free wave soldering, the value of the inerting atmosphere containing N 2 is further improved for the following reasons. The processing temperatures using conventional lead-free solders are significantly higher than the processing temperatures of conventional tin-lead solders due to the increased melting point of conventional lead-free solders. This increase in processing temperature contributes to the formation of scum. Moreover, the cost of lead-free solder is generally much higher than the cost of conventional tin-lead solder, and the economic loss associated with solder waste due to scum formation is more pronounced than that of lead-free wave soldering. In addition, the wettability of lead-free solders is inherently inferior to conventional tin-lead solders. Therefore, the quality of the solder joint formed is more sensitive to the oxidation state on the surface of the lead-free solder.
眾所周知的是波焊時的惰性化會顯著降低該熔融焊料表面上的浮渣形成。減少浮渣形成不僅節省焊料並且減少保養需求,還能改善焊料潤濕並且確保所形成的焊料接頭的品質。為了將惰性化氛圍應用於目前的波焊機,有一個常見的方法為將內部安裝擴散器的籠狀保護性外殼插入該熔融的焊料貯槽。能橫跨該焊料貯槽形成惰性氣體包層,因此,降低焊料氧化的趨勢。 It is well known that inertization during wave soldering significantly reduces scum formation on the surface of the molten solder. Reducing scum formation not only saves solder and reduces maintenance requirements, but also improves solder wetting and ensures the quality of the solder joints formed. In order to apply an inerting atmosphere to current wave soldering machines, a common method is to insert a cage-like protective housing with an internally mounted diffuser into the molten solder reservoir. An inert gas cladding can be formed across the solder reservoir, thus reducing the tendency of the solder to oxidize.
該等擴散器常由多孔管製成以將惰性氣體例如 N2及/或其他惰性氣體引進該軟焊站。然而,該等多孔管變成容易被該波焊製程期間的焊料濺落或助熔劑蒸氣凝結阻塞。一旦該擴散管被阻塞,惰性化的效率將會大幅降低。現代清潔該等擴散管例如,舉例來說,使用填充清潔溶液的超音波浴,的方法極其困難而且耗時。這些管件的清潔必須規則地進行並且會造成該等管件的物理損害。為了避免這些問題,典型為一旦其被阻塞就更換該等擴散管而非清潔。這提高終端使用者的整體成本。 These diffusers are often made of a perforated tube to introduce an inert gas such as N 2 and/or other inert gas into the soldering station. However, the porous tubes become susceptible to blockage by solder splashing or flux vapor condensation during the wave soldering process. Once the diffuser is blocked, the efficiency of inertization will be greatly reduced. Modern cleaning of such diffusing tubes, for example, using an ultrasonic bath filled with a cleaning solution, is extremely difficult and time consuming. The cleaning of these tubes must be carried out regularly and can cause physical damage to the tubes. To avoid these problems, the diffusers are typically replaced once they are blocked rather than being cleaned. This increases the overall cost of the end user.
因此,為了促成藉由N2及/或其他惰性氣體於波焊時應用惰性化,吾人所欲為下列目的之至少一或更多者的設備、方法或二者。首先,吾人所欲為該惰性化設備及方法把用於使生產規模的焊料貯槽惰性化的N2或其他惰性氣體消耗縮減至例如,但不限於,每小時12立方米(m3/hr)或更小以符合應用此技術的成本利益。其次,吾人所欲為該惰性化設備及方法把該熔融焊料表面上方的O2濃度縮減至例如,但不限於,每百萬份2500份(ppm)或更小,或2000ppm或更小,其相當於沒有電路板裝在該焊料槽上方的案例。第三,吾人所欲為該惰性化設備及方法使用易於設立並且仍能使修整成本最少化的設備。再者,吾人所欲為該設備或方法縮減或免於該多孔性擴散管的阻塞以確保穩定又持久的惰性化性能。 Accordingly, in order to facilitate the application of inertization by N 2 and/or other inert gases during wave soldering, we desire at least one or more of the following devices, methods, or both. First, we intend to reduce the consumption of N 2 or other inert gases used to inertize the production scale solder sump to, for example, but not limited to, 12 cubic meters per hour (m 3 /hr) for the inerting apparatus and method. Or smaller to meet the cost benefits of applying this technology. Secondly, it is desirable for the inerting apparatus and method to reduce the O 2 concentration above the surface of the molten solder to, for example, but not limited to, 2500 parts per million (ppm) or less, or 2000 ppm or less. This is equivalent to the case where no board is mounted above the solder bath. Thirdly, we intend to use equipment that is easy to set up and that still minimizes the cost of trimming for the inerting equipment and method. Furthermore, it is desirable for the apparatus or method to reduce or avoid clogging of the porous diffuser to ensure stable and long lasting inertization performance.
文中所述的設備及方法能完成至少一或更多以上關於使用氮及/或其他惰性氣體惰性化的目的,其可能比目 前使用的類似方法及設備更有成本效益而且對使用者更友善。 The apparatus and method described herein can accomplish at least one or more of the purposes of inerting with nitrogen and/or other inert gases, which may be Similar methods and equipment used before are more cost effective and more user friendly.
在本發明的具體實施例中,一包封內含有一或更多擴散管。於本發明的其它實施例中,一或多根擴散管被支撐在一包封的上方,以提供惰性氣體到一焊料浴的波的上方。在一特定具體實施例中,該包封係瓶狀並界定出一內部體積。操作時,把該包封的至少一部分例如,舉例來說,該基部及該頸部的下方部分,浸入一焊料貯槽中。該包封另外具有延伸至一開口的頸部及在該開口附近的蓋子。含於該包封內例如在該包封的基部內的擴散管有惰性氣體流過。該惰性氣體通過該擴散管的開口並且進入該包封的內部體積。該惰性氣體接著通過該頸部並且離開讓該惰性氣體被引導至該焊料貯槽上方的氣氛中之開口。在某些具體實施例中,該包封的至少一部分、該頸部、該蓋子或其組合可包含一無黏性塗層或材料。有一特定具體實施例中,被封閉的至少一擴散管包含該中心擴散管或存於焊料波之間的擴散管。有一替代具體實施例中,焊料貯槽中使用三個擴散管,而且把三個擴散管全都封閉。於其它實施例中,一或多根擴散管被支撐在一包封的上方,其係附加或取代那些被包含在該包封內者。在此等實施例中,其中該惰性氣體流入該包封及往上經過用於支撐一擴散管(氣體分配管)於該焊料浴上方的中空腳或管。該惰性氣體接著從該中空腳或管流入該擴散管(氣體分配管)、再由該擴散管(氣體分配管)並通過其穿孔流出而進入該焊料浴上方的空間。此等實施例特別適用於介於焊料波 之間具有窄小空間或焊料波會重疊的情形。在若干此等或其它的具體實施例中,該包封的材料包含鈦以避免該包封材料被該熔融焊料溶解。 In a particular embodiment of the invention, an envelope contains one or more diffuser tubes. In other embodiments of the invention, one or more diffuser tubes are supported over an envelope to provide an inert gas over the waves of a solder bath. In a particular embodiment, the encapsulation is in the form of a bottle and defines an internal volume. In operation, at least a portion of the envelope, such as, for example, the base and the lower portion of the neck, is immersed in a solder reservoir. The envelope additionally has a neck extending to an opening and a cover adjacent the opening. A diffuser tube contained within the envelope, for example within the base of the envelope, has an inert gas flowing therethrough. The inert gas passes through the opening of the diffuser tube and into the inner volume of the envelope. The inert gas then passes through the neck and exits the opening in the atmosphere that causes the inert gas to be directed to above the solder reservoir. In some embodiments, at least a portion of the envelope, the neck, the lid, or a combination thereof can comprise a non-stick coating or material. In a particular embodiment, the at least one diffusion tube that is enclosed comprises the central diffusion tube or a diffusion tube that is stored between the solder waves. In an alternative embodiment, three diffuser tubes are used in the solder reservoir and all three diffuser tubes are closed. In other embodiments, one or more diffusion tubes are supported above an envelope that is attached or substituted for those contained within the enclosure. In such embodiments, the inert gas flows into the envelope and up through a hollow leg or tube for supporting a diffuser (gas distribution tube) above the solder bath. The inert gas then flows from the hollow leg or tube into the diffusion tube (gas distribution tube), and then through the diffusion tube (gas distribution tube) and flows out through the perforations to enter the space above the solder bath. These embodiments are particularly suitable for use in solder waves There is a narrow space between them or a situation where solder waves overlap. In some such other or other embodiments, the encapsulated material comprises titanium to prevent the encapsulating material from being dissolved by the molten solder.
在本發明的一些具體實施例中,提供一包封以供於工件軟焊時供應惰性氣體,該包封包含:包含一與惰性氣體來源流體連通的內部體積之基部,包含一與該基部的內部體積流體連通的內部體積及一開口之頸部,於該開口附近的蓋子,及包含一或更多開口以供該惰性氣體流過的管件,其中該管件存於該基部內並且與惰性氣體來源流體連通;其中該惰性氣體行經該管件進入該基部的內部體積並且經過該開口排出。 In some embodiments of the invention, an envelope is provided for supplying an inert gas during soldering of the workpiece, the encapsulation comprising: a base comprising an interior volume in fluid communication with the source of inert gas, comprising a portion with the base An internal volume in fluid communication with the interior volume and a neck of an opening, a cover adjacent the opening, and a tubular member including one or more openings for the inert gas to flow through, wherein the tubular member is present in the base and is inert to the gas The source is in fluid communication; wherein the inert gas passes through the tube into the internal volume of the base and exits through the opening.
在本發明的進一步具體實施例中,提供一種用於工件軟焊時提供惰性氣體之包封,包含:一基部,其包含與惰性氣體來源流體連通的一內部體積,一或多根支撐腳,該支撐腳具有與該基部流體連通的一內部體積,及一擴散管,其與該具有一內部體積的一或多根支撐腳流體連通,且包含讓該惰性氣體流過的一或多個穿孔,其中該擴散管(氣體分配管)為該一或多根支撐腳所支撐,且其中該惰性氣體流經該基部的內部體積、經過該一或多根支撐腳的內部體積、進入該擴散管(氣體分配管)的內部體積及流出該擴散管的一或多個穿孔。 In a further embodiment of the invention, there is provided an encapsulation for providing an inert gas during soldering of a workpiece, comprising: a base comprising an internal volume in fluid communication with a source of inert gas, one or more support legs, The support foot has an internal volume in fluid communication with the base, and a diffuser tube in fluid communication with the one or more support feet having an internal volume and including one or more perforations through which the inert gas flows Wherein the diffusion tube (gas distribution tube) is supported by the one or more support legs, and wherein the inert gas flows through the internal volume of the base, through the internal volume of the one or more support legs, into the diffusion tube The internal volume of the gas distribution tube and one or more perforations that exit the diffusion tube.
在本發明的其他具體實施例中,提供一種用於工件軟焊時提供惰性氣體之設備,該設備包含:至少一於該設備底部的凹槽,該至少一凹槽係用於置於焊料貯槽的至少一 邊緣上,其中該焊料貯槽含有熔融焊料及其中該凹槽的至少一側壁及該設備的至少一壁於該焊料貯槽外側界定出一艙;至少一於該設備頂表面的開口,從該焊料貯槽發射的至少一焊料波通過該至少一開口並且觸及該工件;及一或更多包含一或更多開口的管件,該一或更多管件與惰性氣體來源流體連通,其中該等管件之至少一者存於該艙內;其中該設備係置於該焊料貯槽上方及該待軟焊的工件下方藉以形成一氛圍。 In another embodiment of the present invention, there is provided an apparatus for providing an inert gas during soldering of a workpiece, the apparatus comprising: at least one recess in the bottom of the apparatus, the at least one recess for placing in a solder reservoir At least one An edge, wherein the solder reservoir contains molten solder and at least one sidewall of the recess and at least one wall of the device defines a pod outside the solder reservoir; at least one opening in the top surface of the device, from the solder reservoir Transmitting at least one solder wave through the at least one opening and touching the workpiece; and one or more tubes including one or more openings, the one or more tubes being in fluid communication with an inert gas source, wherein at least one of the tubes The device is stored in the chamber; wherein the device is placed above the solder storage tank and under the workpiece to be soldered to form an atmosphere.
在本發明的其他具體實施例中,提供一種用於工件波焊時提供惰性化氛圍之方法,該方法包含:提供一波焊機,該波焊機包含:內含熔融焊料的焊料貯槽、至少一噴嘴及至少一從該熔融焊料浴向上經過該噴嘴產生至少一焊料波的泵;把一設備置於該焊料貯槽至少一邊緣頂上,其中該設備包含在頂表面上的至少一開口、擺在該焊料貯槽至少一邊緣頂上的至少一凹槽及多數包含一或更多開口的管件,該多數管件與惰性氣體來源流體連通,其中該工件及該熔融焊料的頂表面界定出一氛圍;使該工件沿著一路徑通行以致於該工件的至少一部分觸及經過該設備的開口發射的至少一焊料波;及經過該一或更多管件將惰性氣體引進該氛圍,其中至少一管件存於包封中;其中該包封包含:包含與惰性氣體來源流體連通的內部體積之基部;包含一內部體積及一與該基部流體連通的開口之頸部;及於該開口附近的蓋子,其中存於該包封中的管件被罩於該基部內;及其中該惰性氣體行經該管件進入該包封的內部體積及經過由該頸部和蓋子所界定 的開口進入該氛圍中。 In another embodiment of the present invention, a method for providing an inerting atmosphere for workpiece wave soldering is provided, the method comprising: providing a wave soldering machine comprising: a solder storage tank containing molten solder, at least a nozzle and at least one pump that passes at least one solder wave from the molten solder bath upwardly; placing a device on top of at least one edge of the solder reservoir, wherein the device includes at least one opening on the top surface, The solder sump has at least one groove on top of at least one edge and a plurality of tubes including one or more openings, the plurality of tubes being in fluid communication with an inert gas source, wherein the workpiece and the top surface of the molten solder define an atmosphere; Passing the workpiece along a path such that at least a portion of the workpiece touches at least one solder wave emitted through the opening of the device; and introducing inert gas into the atmosphere through the one or more tubes, wherein at least one tube is stored in the envelope Where the envelope comprises: a base comprising an internal volume in fluid communication with the source of inert gas; comprising an internal volume and a base a neck of the fluidly connected opening; and a cover adjacent the opening, wherein the tubular member stored in the envelope is encased within the base; and wherein the inert gas passes through the tubular member into the inner volume of the envelope and passes through Neck and lid defined The opening enters the atmosphere.
在本發明的其他具體實施例中,提供一種用於工件波焊時提供惰性化氛圍之方法,該方法包含:提供一波焊機,該波焊機包含:內含熔融焊料的焊料貯槽、至少一噴嘴及至少一從該熔融焊料浴向上經過該噴嘴產生至少一焊料波的泵;把一設備置於該焊料貯槽至少一邊緣頂上,其中該設備包含在頂表面上的至少一開口、擺在該焊料貯槽至少一邊緣頂上的至少一凹槽及多數包含一或更多開口的管件,該多數管件與惰性氣體來源流體連通,其中該工件及該熔融焊料的頂表面界定出一氛圍;使該工件沿著一路徑通行以致於該工件的至少一部分觸及經過該設備的開口發射的至少一焊料波;及經過該一或更多管件將惰性氣體引進該氛圍,其中至少一管件藉由一基部被支撐在該焊料波上方;該基部包含與惰性氣體來源流體連通的一內部體積,及附於其上的一或多根支撐腳,每一該支撐腳包含與該基部流體連通的一內部體積,其中該管件具有與該一或多根支撐腳流體連通的一內部體積及包含讓該惰性氣體流過的一或多個穿孔,其中該惰性氣體流經該基部的內部體積、住上經過該一或多根支撐腳的內部體積、進入該管件的內部體積及流出該管件的一或多個穿孔進入該焊料波上方的氛圍。 In another embodiment of the present invention, a method for providing an inerting atmosphere for workpiece wave soldering is provided, the method comprising: providing a wave soldering machine comprising: a solder storage tank containing molten solder, at least a nozzle and at least one pump that passes at least one solder wave from the molten solder bath upwardly; placing a device on top of at least one edge of the solder reservoir, wherein the device includes at least one opening on the top surface, The solder sump has at least one groove on top of at least one edge and a plurality of tubes including one or more openings, the plurality of tubes being in fluid communication with an inert gas source, wherein the workpiece and the top surface of the molten solder define an atmosphere; The workpiece travels along a path such that at least a portion of the workpiece touches at least one solder wave emitted through the opening of the device; and the inert gas is introduced into the atmosphere through the one or more tubes, wherein at least one of the tubes is Supported above the solder wave; the base comprising an internal volume in fluid communication with the source of inert gas, and one or more attached thereto Supporting feet, each of the support legs including an internal volume in fluid communication with the base, wherein the tubular member has an internal volume in fluid communication with the one or more support feet and one or more of the inert gas flow therethrough Perforation, wherein the inert gas flows through the interior volume of the base, the internal volume passing through the one or more support legs, the internal volume entering the tubular member, and one or more perforations exiting the tubular member into the solder wave Atmosphere.
10‧‧‧多孔管 10‧‧‧Perforated tube
10’‧‧‧擴散管 10’‧‧‧Diffuse tube
15‧‧‧內部容積 15‧‧‧ internal volume
20‧‧‧洞孔 20‧‧‧ hole
20’‧‧‧穿孔 20’‧‧‧Perforation
30‧‧‧設備 30‧‧‧ Equipment
33‧‧‧凹槽前壁 33‧‧‧ front wall of the groove
35‧‧‧頂表面 35‧‧‧ top surface
37‧‧‧凹槽後壁 37‧‧‧The back wall of the groove
40‧‧‧開口 40‧‧‧ openings
43‧‧‧側壁 43‧‧‧ side wall
45‧‧‧凹槽 45‧‧‧ Groove
47‧‧‧側壁 47‧‧‧ side wall
65‧‧‧惰性氣體來源 65‧‧‧Inert gas source
69‧‧‧內部體積 69‧‧‧ internal volume
70‧‧‧波焊設備 70‧‧‧Wave welding equipment
75‧‧‧焊料貯槽 75‧‧‧ solder storage tank
80‧‧‧熔融焊料 80‧‧‧Solid solder
90‧‧‧蓋子 90‧‧‧ cover
95‧‧‧玻璃窗 95‧‧‧glass window
97‧‧‧通風口 97‧‧‧ vents
100‧‧‧工件 100‧‧‧Workpiece
105‧‧‧工件方向 105‧‧‧Working direction
115‧‧‧焊料波 115‧‧‧ solder wave
120‧‧‧工件下方 120‧‧‧Under the workpiece
155‧‧‧擴散器 155‧‧‧Diffuser
185‧‧‧噴嘴 185‧‧‧ nozzle
530‧‧‧設備 530‧‧‧ Equipment
555‧‧‧多孔管 555‧‧‧Perforated tube
555’‧‧‧多孔管 555’‧‧‧Poly tube
555”‧‧‧多孔管 555”‧‧‧Perforated tube
567‧‧‧指部 567‧‧‧ finger
575‧‧‧焊料貯槽 575‧‧‧ solder storage tank
580‧‧‧熔融焊料 580‧‧‧Solid solder
830‧‧‧設備 830‧‧‧ Equipment
870‧‧‧焊料貯槽 870‧‧‧ solder storage tank
880‧‧‧焊料貯槽 880‧‧‧ solder storage tank
890‧‧‧蓋子 890‧‧‧ cover
895‧‧‧惰性氣體入口 895‧‧‧Inert gas inlet
897‧‧‧通風排氣管路 897‧‧‧Ventilation exhaust line
900‧‧‧移動軌道 900‧‧‧Mobile track
920‧‧‧焊料貯槽上方的氛圍 920‧‧‧ atmosphere above the solder tank
923‧‧‧工件 923‧‧‧Workpiece
925‧‧‧工件方向 925‧‧‧Workpiece orientation
930‧‧‧設備 930‧‧‧ Equipment
950‧‧‧艙 950‧‧‧ cabin
955‧‧‧多孔管 955‧‧‧Perforated tube
955’‧‧‧多孔管 955'‧‧‧Perforated tube
967‧‧‧指部 967‧‧‧ finger
969‧‧‧內部體積 969‧‧‧Internal volume
975‧‧‧焊料貯槽 975‧‧‧ solder storage tank
985‧‧‧噴嘴 985‧‧‧ nozzle
2000‧‧‧包封 2000‧‧‧Encapsulation
2010‧‧‧基部 2010‧‧‧ Base
2015‧‧‧內部體積 2015‧‧‧ internal volume
2017‧‧‧惰性氣體來源流動方向 2017‧‧‧Inert gas source flow direction
2020‧‧‧頸部 2020‧‧‧ neck
2020”‧‧‧包封 2020" ‧ ‧ encapsulation
2025‧‧‧內部體積 2025‧‧‧ internal volume
2027‧‧‧開口 2027‧‧‧ openings
2029‧‧‧惰性氣體流動方向 2029‧‧‧Inert gas flow direction
2030‧‧‧蓋子 2030‧‧‧ cover
1040‧‧‧擴散管 1040‧‧‧Diffuser tube
1050‧‧‧焊料波 1050‧‧‧ solder wave
1020‧‧‧氣體提供管線 1020‧‧‧ gas supply pipeline
1010‧‧‧基部 1010‧‧‧ base
1030‧‧‧支撐腳 1030‧‧‧Support feet
1060‧‧‧穿孔 1060‧‧‧Perforation
圖1提供擴散管之一具體實施例的等角視圖,該擴散管 包含細孔或文中所述的多孔管。 Figure 1 provides an isometric view of one embodiment of a diffuser tube, the diffuser tube Contains pores or porous tubes as described herein.
圖2a提供擴散管之一具體實施例的爆炸等角視圖,該擴散管包含細孔或文中所述的多孔管並且另外包含一包封及一蓋子。 Figure 2a provides an exploded isometric view of one embodiment of a diffuser tube comprising pores or a porous tube as described herein and additionally comprising an envelope and a lid.
圖2a’提供擴散管之一具體實施例的爆炸等角視圖,該擴散管包含細孔或文中所述的多孔管並且包含一包封及一蓋子,而且該包封的頸部部分中另外包含一或更多洞孔。 Figure 2a' provides an exploded isometric view of one embodiment of a diffuser tube comprising pores or a porous tube as described herein and comprising an envelope and a lid, and the neck portion of the envelope additionally comprises One or more holes.
圖2b提供圖2a所示的具體實施例之裝配好的等角視圖。 Figure 2b provides an assembled isometric view of the embodiment shown in Figure 2a.
圖2c提供圖2a的具體實施例之側視爆炸圖。 Figure 2c provides a side exploded view of the embodiment of Figure 2a.
圖2d提供圖2a’所示的具體實施例之側視爆炸圖。 Figure 2d provides a side exploded view of the embodiment shown in Figure 2a'.
圖3a提供該包封或保護性外罩之一具體實施例的頂視圖,其含有被封閉於帶有頂蓋的瓶頸包封中之中心擴散管。 Figure 3a provides a top view of one embodiment of the envelope or protective outer cover containing a central diffuser tube enclosed in a bottleneck enclosure with a top cover.
圖3b提供文中所述及圖3a所示的設備之具體實施例的等角視圖。 Figure 3b provides an isometric view of a particular embodiment of the apparatus described herein and illustrated in Figure 3a.
圖3c提供文中所述及圖3a所示的設備之具體實施例的側視圖,其中該中心擴散器的包封部分被浸於該熔融焊料中。 Figure 3c provides a side view of a particular embodiment of the apparatus described herein and illustrated in Figure 3a, wherein the enveloping portion of the central diffuser is immersed in the molten solder.
圖4a提供該中心擴散管被封閉而且至少一部分被浸於焊料貯槽的具體實施例之側視圖。 Figure 4a provides a side view of a particular embodiment in which the central diffuser is closed and at least a portion is immersed in a solder reservoir.
圖4b提供文中所述及圖4a所示的設備之具體實施例的頂視圖。 Figure 4b provides a top view of a particular embodiment of the apparatus described herein and illustrated in Figure 4a.
圖5a提供該中心擴散管及兩個側擴散管被封閉並且至少一部分被浸於焊料貯槽的具體實施例之側視圖。 Figure 5a provides a side view of a particular embodiment in which the central diffuser tube and the two side diffuser tubes are closed and at least a portion is immersed in a solder sump.
圖5b提供文中所述及圖5a所示的設備之具體實施例的 頂視圖。 Figure 5b provides a specific embodiment of the apparatus described herein and illustrated in Figure 5a top view.
圖6提供可配合文中所述的設備及方法使用之任意蓋子的等角視圖。 Figure 6 provides an isometric view of any of the covers that can be used in conjunction with the apparatus and methods described herein.
圖7提供可設立於該移動軌道上的任意蓋子之端視圖,在所述的具體實施例中該工件行經該移動軌道上。 Figure 7 provides an end view of any of the covers that can be set up on the moving track, in the particular embodiment the workpiece travels through the moving track.
圖8提供示範用以測量比較例1的O2濃度之位置的圖畫。 FIG. 8 provides a picture demonstrating the position of the O 2 concentration of Comparative Example 1.
圖9提供示範用以測量實施例2的O2濃度之位置的圖畫。 Figure 9 provides a picture demonstrating the position of the O 2 concentration used to measure Example 2.
圖10提供了一實施例1000的側視,其中一擴散管為一或多根支撐腳支撐在一基部上方以在一焊料浴上方提供惰性氣體,該焊料浴具有介於焊料波之間或重疊焊料波的窄小空間。 Figure 10 provides a side view of an embodiment 1000 in which a diffuser tube is supported above a base by one or more support legs to provide an inert gas over a solder bath having a solder wave or overlap A narrow space for solder waves.
圖11a,11c,及11e示出圖10中的擴散孔的底視圖。圖11b,11d,及11f示出圖11a,11c,及11e的擴散管端視圖。 Figures 11a, 11c, and 11e show bottom views of the diffusion holes of Figure 10. Figures 11b, 11d, and 11f show end view of the diffuser tubes of Figures 11a, 11c, and 11e.
此技藝之目標的至少一或多者能藉由文中所述之關於軟焊時的惰性化保護之方法及設備完成。文中所述的設備及方法提供於軟焊時的惰性化保護,特別是對於工件例如印刷電路板軟焊時該焊料的顯著移動和旋轉及該等工件表面的提高氧化可能發生的那些具體實施例。預期文中所述的設備及方法均可使用,舉例來說,以修整現有的波焊機。運轉時,在某些具體實施例中,所述的設備置於該焊料貯槽上面及該移動軌道或其他用於輸送待軟焊的工件的輸送機制下方。竊裝於該設備內的一或多個擴散管(diffuser pipes)係以流 體連通至惰性氣體來源例如氮、惰性氣體(例如,氦、氖、氬、氪、氙及其組合)、生成氣(例如,包含至多5重量%氫的氮和氫之混合物),或其組合以提供一惰性化氛圍。文中所述的設備及方法之一目的為待軟焊的工件表面及該焊料貯槽內含的熔融焊料表面所界定之氛圍中降低的氧(O2)濃度例如,但不限於,每百萬份2500份(ppm)或更小(其係在沒有電路板裝在該焊料貯槽上方時測量得到)。 At least one or more of the objects of the art can be accomplished by the methods and apparatus described herein for inertial protection during soldering. The apparatus and method described herein provide inertial protection during soldering, particularly those that may occur when soldering significant movements and rotations of workpieces, such as printed circuit boards, and increased oxidation of the surface of such workpieces. . It is contemplated that the apparatus and methods described herein can be used, for example, to trim existing wave soldering machines. In operation, in some embodiments, the apparatus is placed over the solder sump and below the moving track or other transport mechanism for transporting the workpiece to be soldered. One or more diffuser pipes smuggled into the apparatus are in fluid communication with an inert gas source such as nitrogen, an inert gas (eg, helium, neon, argon, neon, xenon, and combinations thereof), generating gas ( For example, a mixture of nitrogen and hydrogen comprising up to 5% by weight of hydrogen, or a combination thereof, to provide an inerting atmosphere. One of the devices and methods described herein is for reducing the concentration of oxygen (O 2 ) in the atmosphere defined by the surface of the workpiece to be soldered and the surface of the molten solder contained in the solder reservoir, for example, but not limited to, per million 2500 parts (ppm) or less (measured when no board is mounted over the solder tank).
文中所述的設備及方法意圖置於含熔融焊料的焊料貯槽頂上,該熔融焊料係保持於該焊料的熔點或以上(例如,高於該焊料的熔點至多50℃)。文中所述的設備具有一設置於該焊料貯槽頂上的內部容積藉以於該待軟焊的工件(其係依一方向靠該焊料貯槽上方的移動軌道輸送)與該熔融焊料表面之間界定出一氛圍。在某些具體實施例中,該等工件係藉由移動軌道或輸送帶指部撐住該設備的側緣並且使該等指部通過該等焊料波。在其他具體實施例中,當透過該波焊機輸送該等工件時將該等工件撐在托板、定位器或架子上。該焊料貯槽內具有一或更多噴嘴,該噴嘴放出一或更多由焊料泵所產生的焊料波。該焊料泵典型為變速泵,其允許終端使用者控制來自該焊料波的焊料流動並且提高或降低該焊料波的頂點或波峰以適於加工條件。於此處的一個或多個具體實施例中,一外罩(housing)或其它包封(enclosure)也可被置於該焊料泵或該焊料泵之一部份的周圍,及惰性氣體可被供應成可以創造出圍在該泵的至少一部份的惰性氛圍,於是讓浮渣的形成減至最低限。 The apparatus and method described herein are intended to be placed on top of a solder bath containing molten solder that is maintained at or above the melting point of the solder (e.g., at most 50 ° C above the melting point of the solder). The apparatus described herein has an internal volume disposed on top of the solder reservoir for defining a workpiece to be soldered (which is transported in a direction from a moving track above the solder reservoir) and a surface of the molten solder Atmosphere. In some embodiments, the workpieces support the side edges of the device by moving the track or belt fingers and passing the fingers through the solder waves. In other embodiments, the workpieces are supported on pallets, locators or shelves when the workpieces are transported through the wave soldering machine. The solder reservoir has one or more nozzles that discharge one or more solder waves generated by the solder pump. The solder pump is typically a variable speed pump that allows the end user to control the flow of solder from the solder wave and increase or decrease the apex or peak of the solder wave to suit the processing conditions. In one or more embodiments herein, a housing or other enclosure may also be placed around the solder pump or a portion of the solder pump, and an inert gas may be supplied. The inert atmosphere that surrounds at least a portion of the pump can be created, thereby minimizing the formation of scum.
該一或更多焊料波透過文中所述的設備頂表面中的一或更多開口觸及該待軟焊工件的表面。於此製程期間,該設備附帶包含一個或多個擴散管,該擴散管包含一或更多開口、孔口、狹長孔、穿孔或細孔,並且與惰性氣體來源例如N2流體連通,使該惰性氣體通過該管件的內部容積並且經過該等管件的開口或細孔離開進入該氛圍。在這樣做時,當該工件通過該焊料波時該工件的下表面、前緣、背緣及側緣被該惰性氣體均勻包覆著。 The one or more solder waves impinge on the surface of the workpiece to be soldered through one or more openings in the top surface of the apparatus described herein. During this process, the apparatus is provided with one or more diffuser tubes that include one or more openings, orifices, slots, perforations or pores, and are in fluid communication with an inert source of gas, such as N 2 , such that The inert gas exits the atmosphere through the internal volume of the tubular member and through the openings or pores of the tubular members. In doing so, the lower surface, the leading edge, the back edge, and the side edges of the workpiece are uniformly covered by the inert gas as the workpiece passes the solder wave.
在文中所述的設備及方法的特定具體實施例中,將置於該焊料貯槽頂上的設備之尺寸最小化以增強該等移動的焊料波周圍的惰性化效率。在各個不同的具體實施例中,該靜態的熔融焊料表面,或在該焊料貯槽中的設備路徑之外的區域,可藉由能忍受該焊料貯槽內含熔融焊料的溫度的高溫材料覆蓋著。 In a particular embodiment of the apparatus and method described herein, the size of the device placed on top of the solder reservoir is minimized to enhance inerting efficiency around the moving solder waves. In various embodiments, the static molten solder surface, or regions outside of the device path in the solder reservoir, may be covered by a high temperature material that can withstand the temperature of the molten solder contained in the solder reservoir.
文中所述的設備及方法包含一或更多含一內部容積及一或更多開口的擴散管,該開口可為,但不限於,細孔、洞孔、狹長孔、通氣孔、孔口、穿孔或其他允許氮及/或其他惰性氣體通過該管件的內部容積及經過該管件的開口離開的裝置。在一特定具體實施例中,該等管件具有多孔性並且包含約0.2微米(μm)或更小的平均孔徑以提供離開該多孔管的惰性化或N2氣體的層流。在各個不同具體實施例中,該等管件與惰性氣體來源流體連通,該氣體來源經過該管件的內部容積供應該惰性氣體例如,舉例來說,N2及經過該等管件的開口或細孔離開進入該貯槽的熔融焊料表面及輸送工作 所界定的區域內。 The apparatus and method described herein include one or more diffusing tubes having an internal volume and one or more openings, which may be, but are not limited to, pores, holes, slots, vents, orifices, Perforations or other means for allowing nitrogen and/or other inert gases to pass through the internal volume of the tubular member and exit through the opening of the tubular member. In a particular embodiment, the tubes are porous and comprise an average pore size of about 0.2 micrometers (μm) or less to provide a laminar flow of inerting or N 2 gas exiting the porous tube. In various embodiments, the tubes are in fluid communication with an inert gas source that supplies the inert gas through the internal volume of the tube, such as, for example, N 2 and exits through the openings or pores of the tubes Enter the molten solder surface of the sump and the area defined by the transfer operation.
藉由封閉該等多孔性擴散管的至少一者,文中所述的設備藉由防止該等擴散管的開口或細孔被焊料噴濺物及助熔劑蒸氣凝結阻塞而滿足此技藝的一或更多需求。關此,解決位於中心的擴散管阻塞的問題是困難的任務,因為該中心擴散管經常存於二焊料波之間。往往,該二波之間的距離大約與該擴散器的直徑相同,以致於沒有足夠空間裝設有敞開的狹長孔圍繞於該中心擴散器的保護殼。此設備之一具體實施例藉由將該中心擴散器裝於一包封中解決這個問題。該包封包含頸部頂端有一蓋子的“瓶頸”型外形,其中該包封的基部至少部分被浸於熔融焊料貯槽內並且該頸部部分露出該熔融焊料表面,像在圖3c所示的具體實施例一樣。在該等焊料波上的惰性氣體包層可從該包封頸部頂端處的開口產生。 By enclosing at least one of the porous diffusion tubes, the apparatus described herein satisfies one or more of the art by preventing the openings or pores of the diffusion tubes from being clogged by solder splatters and flux vapor condensation. More demand. In this regard, solving the problem of the diffusion tube at the center is a difficult task because the center diffusion tube is often present between the two solder waves. Often, the distance between the two waves is about the same as the diameter of the diffuser, so that there is not enough space to accommodate an open narrow hole surrounding the protective shell of the central diffuser. One embodiment of this device solves this problem by mounting the central diffuser in an envelope. The envelope comprises a "bottleneck" profile having a lid at the top end of the neck, wherein the enveloped base is at least partially immersed in the molten solder sump and the neck portion exposes the molten solder surface, as shown in Figure 3c. The same as the embodiment. An inert gas blanket on the solder waves can be created from the opening at the top end of the enveloping neck.
在文中的一或更多具體實施例中,文中所述的包封之頸部包含一或更多洞孔或其他開口。該一或更多洞孔係設計成讓焊料能通過該包封的頸部,因此特別是當該包封置於二焊料波之間時能改善該焊料貯槽內的焊料流動。該等洞孔可為圓形、橢圓形、方形、矩形或任何其他外形,附帶條件為該焊料能夠流過。同樣地,當運用多於一個洞孔時,該等洞孔可依任何排列佈置,舉例來說依沿著該頸部長度的水平線或依交錯排列。該一或更多洞孔可為任何尺寸以致於改善焊料流動的目標能完成並且取決於該包封的總體尺寸。在某些具體實施例中,該包封頸部中的一或更多洞孔可介於約1/4”至約1”的直徑,或約3/8”至約7/8”的直徑,或約1/2”至 約3/4”的直徑。 In one or more specific embodiments herein, the neck of the envelope described herein includes one or more holes or other openings. The one or more holes are designed to allow solder to pass through the encapsulated neck, thereby improving solder flow in the solder reservoir, particularly when the envelope is placed between two solder waves. The holes may be circular, elliptical, square, rectangular or any other shape with the proviso that the solder can flow therethrough. Similarly, when more than one hole is used, the holes can be arranged in any arrangement, for example by horizontal lines along the length of the neck or staggered. The one or more holes can be of any size such that the goal of improving solder flow can be accomplished and depends on the overall size of the envelope. In some embodiments, the one or more holes in the enveloping neck may be between about 1/4" to about 1" in diameter, or from about 3/8" to about 7/8" in diameter. , or about 1/2" to A diameter of about 3/4".
在本發明的某些具體實施例中,把一蓋子置於該包封的頸部上方以形成介於該頸部與該蓋子之間的開放空間並且當該惰性氣體離開該頸部頂部處的開口時能引導其流動。該蓋子可獨立於該頸部或從該頸部卸下,或其可固定於該頸部的一或更多點以便使該蓋子保持於適當位置。當該蓋子獨立於該頸部並且從該頸部卸下時,可藉由將該蓋子固定於另一表面,例如該設備的外罩或壁,的一或更多點並且藉由任何適合的附接方法使該蓋子保持於適當位置。舉例來說,該蓋子可附接於該頸部、該設備的壁或另一表面。藉由一或更多螺絲、插銷、夾子、藉由熔接或藉由另一機制。 In some embodiments of the invention, a lid is placed over the neck of the envelope to form an open space between the neck and the lid and when the inert gas exits the top of the neck It can guide its flow when opening. The lid can be detached from or detached from the neck or it can be secured to one or more points of the neck to hold the lid in place. When the cover is detached from and detached from the neck, one or more points of the cover, such as the outer cover or wall of the device, can be secured by any suitable attachment The method of holding the lid in place. For example, the cover can be attached to the neck, the wall of the device, or another surface. By one or more screws, bolts, clips, by welding or by another mechanism.
文中所述的設備及方法的優點包括下列一或多者:1)封閉該擴散器,藉以避免該等管件開口被噴濺焊料阻塞的可能性;2)該包封的頸部窄並且包含導熱性材料,該導熱性材料會變熱並且消除助熔劑蒸氣凝結及噴濺焊料凝固的機會;3)該包封的頸部能,在某些具體實施例中,以一無黏性塗層或材料塗覆以便當觸及液態助熔劑時將助熔劑殘餘物引起的塗覆減至最低限度;及4)該包封的頸部可由比含有該擴散管的基部窄的直徑製成以便符合二焊料波之間的窄空間而不會妨礙或干擾該等波的動態運動。在某些具體實施例中,較低的氧讀值,像是舉例來說低於每百萬份2000份,可藉由將至少一或更多擴散管裝於文中所述的包封中達到,其中氧測量係配合沒有電路板裝在該焊料槽上方的情況進行。 Advantages of the apparatus and method described herein include one or more of the following: 1) closing the diffuser to avoid the possibility that the tube openings are blocked by the splash solder; 2) the neck of the envelope is narrow and contains heat conduction a material that will heat up and eliminate the chance of flux vulcanization and coagulation solder solidification; 3) the encapsulated neck can, in some embodiments, be a non-stick coating or The material is coated to minimize coating caused by flux residue when in contact with the liquid flux; and 4) the neck of the envelope may be made of a diameter narrower than the base containing the diffusion tube to conform to the second solder The narrow space between the waves does not interfere with or interfere with the dynamic motion of the waves. In some embodiments, lower oxygen readings, such as, for example, less than 2000 parts per million, can be achieved by mounting at least one or more diffusion tubes in the encapsulation described herein. Wherein the oxygen measurement is performed in conjunction with the absence of a circuit board mounted over the solder bath.
有一特定具體實施例中,把該等擴散管之至少一 者裝於一保護性包封的基部內而且把該包封的至少一部分浸於維持於高溫的熔融焊料中。在各個不同具體實施例中,最接近該基部的包封頸部部分也能像熱導體一樣運作以使該頸部的上方部分維持於高溫。在各個不同具體實施例中,由於預熱或由於該包封的基部及頸部的熱傳導,排出該包封的惰性氣體是熱的,像是舉例來說約160℃至約220℃,或約170℃至約210℃,或約180℃至約200℃。在一些具體實施例中,把該惰性氣體(例如氮)供應至於周遭溫度下的擴散管並且當其行經該包封時被加熱以致於其於大約180℃至200℃離開該包封的頸部。在其他具體實施例中,可以預熱該氣體。於該波焊設備中使用熱惰性氣體對於降低軟焊缺陷,例如不完全或不一致的裝桶(barrel fill),有其助益。裝桶缺陷係由於溫度梯度造成,而且可運用熱惰性氣體將依X-Y及Z方向橫越工作的溫度梯度最小化。 In a specific embodiment, at least one of the diffusion tubes is The device is housed in a protective encapsulating base and immerses at least a portion of the encapsulant in molten solder maintained at a high temperature. In various embodiments, the portion of the enveloping neck that is closest to the base can also function like a thermal conductor to maintain the upper portion of the neck at a high temperature. In various embodiments, the encapsulated inert gas is hot due to preheating or due to heat transfer from the encapsulated base and neck, such as, for example, from about 160 ° C to about 220 ° C, or about 170 ° C to about 210 ° C, or about 180 ° C to about 200 ° C. In some embodiments, the inert gas (eg, nitrogen) is supplied to the diffusion tube at ambient temperature and heated as it passes through the envelope such that it exits the encapsulated neck at about 180 ° C to 200 ° C. . In other embodiments, the gas can be preheated. The use of hot inert gases in the wave soldering apparatus is useful for reducing solder weld defects, such as incomplete or inconsistent barrel fills. Bucket defects are caused by temperature gradients, and thermal inert gases can be used to minimize temperature gradients across the X-Y and Z directions.
有一特定具體實施例中,文中所述的設備及方法解決了於一對軟焊波之間的空間限制。關此,該頸部及蓋子的尺寸及橫截面可減小至介於約5至約8mm。該包封基部的直徑可介於約13至約20mm或約15mm。咸瞭解這些尺寸可依據該波焊設備的構型改變,並且可被放大或縮小。特別是,吾人所欲的是可以依據所用的軟焊設備的尺寸變化該包封頸部部分的高度。 In a particular embodiment, the apparatus and method described herein address the space limitations between a pair of solder balls. In this regard, the neck and lid may be reduced in size and cross-section to between about 5 and about 8 mm. The encapsulating base can have a diameter of from about 13 to about 20 mm or about 15 mm. It is understood that these dimensions can vary depending on the configuration of the wave soldering apparatus and can be enlarged or reduced. In particular, what we desire is that the height of the neck portion of the envelope can be varied depending on the size of the soldering apparatus used.
在包含中心擴散管及一或更多側擴散管的某些具體實施例中,僅將該中心擴散管裝在文中所述的包封中。在替代具體實施例中,將該中心擴散器及一或更多側擴散器 裝在文中所述的包封中。 In certain embodiments comprising a central diffuser tube and one or more side diffuser tubes, only the central diffuser tube is included in the encapsulation described herein. In an alternative embodiment, the central diffuser and one or more side diffusers Installed in the envelope described in the text.
如先前曾提及的,文中所述的設備包含一含有一或更多擴散管及一內部體積的外罩。在某些具體實施例中,該等管件可設置於多數焊料波之間、於該焊料貯槽的板入口側、於該焊料貯槽的工件出口側或其組合。在某些具體實施例中,該等管件的一或更多者可另外包含具有一內部體積的瓶狀包封以允許惰性氣體流入該擴散管及離開進入該體積,其中該包封的至少一部分觸及或被浸於該熔融焊料中。該包封另外包含一頸部,其具有一開口;及一蓋子,其允許該惰性氣體流經該頸部離開該口部和蓋子所界定的開口進入該氛圍中。在某些具體實施例中,在該包封頸部的開口上方的蓋子之橫截面為倒U、V或C形。在其他具體實施例中,例如在該等側擴散器的一或更多者(參見,舉例來說,圖5a)被密封之處,該包封沒有蓋子,因為該設備的內側提供該惰性氣體進入該設備和熔融焊料表面所界定的氣氛之方向。 As previously mentioned, the apparatus described herein includes a housing containing one or more diffuser tubes and an internal volume. In some embodiments, the tubes can be disposed between a plurality of solder waves, on a plate inlet side of the solder sump, on a workpiece exit side of the solder sump, or a combination thereof. In some embodiments, one or more of the tubular members may additionally comprise a bottle-like envelope having an internal volume to allow inert gas to flow into and out of the diffuser, wherein at least a portion of the envelope Touched or immersed in the molten solder. The envelope further includes a neck having an opening; and a cover that allows the inert gas to flow through the neck away from the opening defined by the mouth and the cover into the atmosphere. In some embodiments, the cross-section of the lid over the opening of the enveloping neck is inverted U, V or C-shaped. In other embodiments, such as where one or more of the side diffusers (see, for example, Figure 5a) are sealed, the envelope has no lid because the inside of the apparatus provides the inert gas Enter the direction of the atmosphere defined by the device and the surface of the molten solder.
在某些具體實施例中,該包封的至少一部分可為該設備的垂直壁之一部分(例如,舉例來說,供該等側擴散管的一或更多者用的包封)。一或更多擴散管放在一包封內及該軟焊浴中避免與使該多孔管浸入該焊料浴及/或直接與該焊料浴接觸的先前技藝關聯的先前問題,因為該擴散管被裝於該包封內,該包封防止熔融焊料阻塞該多孔管的開口。 In some embodiments, at least a portion of the envelope can be a portion of a vertical wall of the device (eg, for example, an envelope for one or more of the side diffusers). One or more diffusion tubes are placed in an envelope and in the solder bath to avoid previous problems associated with prior art techniques of immersing the porous tube in the solder bath and/or directly in contact with the solder bath because the diffusion tube is Installed within the envelope, the encapsulation prevents molten solder from clogging the opening of the porous tube.
在文中所述的設備及方法之一特定具體實施例中,該基部包封的至少一部分、該頸部、該蓋子或其組合包含一無黏性塗層或材料。無黏性塗層的實例是聚四氟乙烯 (PTFE)塗層,其可被找到的是註冊商標Teflon®的無黏性塗層(Teflon係由德拉威州,維明頓市的DuPont股份有限公司製造)。在文中所述的設備之一具體實施例中,該包封包含一基部、一頸部及一蓋子。在各個不同具體實施例中,所選擇的無黏性塗層應該使其整體保持於或高於無鉛波焊方法常用的熔融焊料溫度(例如,至高約260℃)。在另一特定具體實施例中,該無黏性塗層包含ThermolonTM無黏性塗層,一種無機(以礦物質為基礎的)塗層,其係由南韓的Thermolon有限公司製造,及其能讓其整體保持於450℃並且避免於提高溫度下產生有毒蒸氣。 In a particular embodiment of the apparatus and method described herein, at least a portion of the base envelope, the neck, the lid, or a combination thereof comprises a non-stick coating or material. An example of a non-stick coating is a polytetrafluoroethylene (PTFE) coating, which can be found as a non-stick coating of the registered trademark Teflon® (Teflon is limited by DuPont, Delaware State, DuPont) Made by the company). In one embodiment of the apparatus described herein, the envelope comprises a base, a neck and a cover. In various embodiments, the selected non-stick coating should be maintained at or above the molten solder temperature typically used in lead-free wave soldering methods (e.g., up to about 260 ° C). In another particular embodiment, the coating comprises a non-adhesive coating Thermolon TM cohesionless, an inorganic (mineral based in) a coating, which system, manufactured by South Korea Co. Thermolon, and can Keep it as a whole at 450 ° C and avoid creating toxic vapors at elevated temperatures.
在該中心擴散管存於具有C-形、U-形或V-形蓋子的瓶狀包封並且進一步存於一或更多對軟焊波之間的一特定具體實施例中,由於該熔融焊料的連續動態運動使溶於該焊料貯槽中的助熔劑能直接觸及設於第一個和第二個波之間的包封頸部、蓋子或二者。當該包封頸部及/或蓋子表面上的液態助熔劑汽化或熱分解時,固態助熔劑殘餘物可能留在該包封頸部表面及/或蓋子的後面。因此可將一無黏性塗層施敷於該包封基部、頸部、蓋子或其任何組合以縮短該設備例行保養的時間和花費。該無黏性塗層也可施敷於該設備內表面的至少一部分或該頂蓋的內表面,以便易於清理。 In the particular embodiment in which the central diffuser is stored in a bottle-like envelope having a C-shaped, U-shaped or V-shaped cover and further stored between one or more pairs of solder waves, due to the melting The continuous dynamic movement of the solder allows the flux dissolved in the solder reservoir to be in direct contact with the enveloping neck, cover or both disposed between the first and second waves. When the liquid flux on the surface of the enveloping neck and/or cover is vaporized or thermally decomposed, the solid flux residue may remain behind the surface of the enveloping neck and/or behind the lid. Thus, a non-stick coating can be applied to the encapsulating base, neck, lid or any combination thereof to reduce the time and expense of routine maintenance of the device. The non-stick coating can also be applied to at least a portion of the inner surface of the device or the inner surface of the cap for ease of cleaning.
於其它具體實施例中,該中心擴散管(氣體分配管)被昇高位於該焊料貯槽的焊料波的上方,尤其當介於焊料波之間的空間相當窄小,當焊料波重疊,或當焊料波的高度變化的情形下。於此具體實施例中,一具有可供惰性氣體 流過的一內部體積的基部被提供。選擇性的,該基部可包括一附加的擴散管於其內部,以讓該惰性氣體流過該附加的擴散管並流出進入該基部的內部體積。當附加的擴散管被包含於該基部內時,該惰性氣體可藉由該附加的擴散管的任一端或兩端被提供給該附加的擴散管。當附加的擴散管未被包含於該基部內時,該惰性氣體較佳的在與該基部的兩末端等距離位置被提供給該基部,以允許該氣體的平均流分佈。該基部包含接於其上且由其往上垂直延伸的一或多個支撐腳或管。的一或多個支撐腳也包含可供惰性氣體流過的一內部體積,該一或多個支撐腳的內部體積該基部的內部體積流體連通。該基部的至少一部份及選擇性的該一或多個支撐腳的至少一部份係浸於被內含於該焊料貯槽的熔融焊料內。該中心擴散管被固定於該一或多個支撐腳上且具有與該一或多個支撐腳流體連通的內部體積,於是該擴散管(氣體分配管)位於該焊料波的波位的上方且該焊料波從該擴散管(氣體分配管)下方的該一或多個支撐腳之間通過及圍繞該一或多個支撐腳。在此方式下,焊料可更自由地在該焊料貯槽內流動且可以更簡單地到達該貯槽的外邊緣。該基部、支撐腳及擴散管(氣體分配管)可以有多種變化形式及具有多種變化的截面形狀。例如,各自可以是圓形、橢圓形、正方形、四方形、三角形或其它幾何形狀,且形狀可以是對稱的、不對稱的或不規則的。該基部、支撐腳及擴散管各自可具有相同或不同的截面形狀。當該基部及擴散管的截面形狀為圓形時,該基部可具有一直徑例如介於約0.25至約1.25英吋,或介於約0.5 至約1.0英吋、或約0.5至約0.75英吋。類似地,該擴散管可具有一直徑例如介於約0.125至約1.0英吋,或介於約0.125至約0.5英吋、或約0.125至約0.375英吋。此處所提到的尺寸僅是示範性目的,本項技藝人士可以認知到該基部、支撐腳及擴散管的尺寸可以大程度的改變且除了其它因素外依含有它們的該焊料貯槽的尺寸及該貯槽內的焊料波的高度而定。 In other embodiments, the central diffuser (gas distribution tube) is raised above the solder wave of the solder reservoir, especially when the space between the solder waves is relatively narrow, when the solder waves overlap, or when In the case of a change in the height of the solder wave. In this embodiment, one has an inert gas supply A base of an internal volume that flows through is provided. Optionally, the base may include an additional diffuser tube therein to allow the inert gas to flow through the additional diffuser tube and out into the internal volume of the base. When an additional diffusion tube is contained within the base, the inert gas may be supplied to the additional diffusion tube by either or both ends of the additional diffusion tube. When an additional diffuser tube is not included in the base, the inert gas is preferably supplied to the base at equidistant positions from both ends of the base to allow for an average flow distribution of the gas. The base includes one or more support feet or tubes attached thereto and extending vertically therethrough. The one or more support feet also include an internal volume through which the inert gas flows, the internal volume of the one or more support feet being in fluid communication with the internal volume of the base. At least a portion of the base and optionally at least a portion of the one or more support legs are immersed in molten solder contained within the solder reservoir. The central diffuser is secured to the one or more support legs and has an internal volume in fluid communication with the one or more support feet, such that the diffuser (gas distribution tube) is above the wave position of the solder wave and The solder wave passes between and surrounds the one or more support legs between the diffusion tube (gas distribution tube). In this manner, the solder can flow more freely within the solder sump and can more easily reach the outer edge of the sump. The base, the support legs, and the diffusion tube (gas distribution tube) can have various variations and a variety of varying cross-sectional shapes. For example, each may be circular, elliptical, square, square, triangular or other geometric shape, and the shape may be symmetrical, asymmetrical or irregular. The base, the support legs, and the diffuser tubes may each have the same or different cross-sectional shapes. When the cross-sectional shape of the base and the diffuser tube is circular, the base may have a diameter of, for example, about 0.25 to about 1.25 inches, or about 0.5. Up to about 1.0 inch, or about 0.5 to about 0.75 inches. Similarly, the diffuser tube can have a diameter of, for example, from about 0.125 to about 1.0 inch, or from about 0.125 to about 0.5 inches, or from about 0.125 to about 0.375 inches. The dimensions mentioned herein are for exemplary purposes only, and those skilled in the art will recognize that the dimensions of the base, support legs, and diffuser can vary widely and, among other things, the size of the solder reservoir containing them and The height of the solder wave in the sump depends on the height.
於此具體實施例中,該中心擴散管的每一端被蓋住或包封,且可包含穿孔、洞、縫隙或其它足以讓惰性氣體流通過的開口。該等開口可以被安排成一或多行,或可具有任何其它規則的或不規則的安排。於一特別具體實施例中,該等開口順著該管件的底部被安排成一單一行,於是流出該等開口的惰性氣體被往下導向該焊料貯槽的焊料的頂表面。於另一具體實施例中,該等開口被安排成偏離該管件的底部中心線的平行兩行,各自偏離約0至45°方向,或各自偏離約30°方向,於是從該擴散管(氣體分配管)流出進入該焊料貯槽的熔融焊料上方的氛圍的惰性氣體被往外及往下導向。於此具體實施例中,診等開口的行可彼此分開約30°至120°,或約60°至90°。於若干具體實施例中,該等開口可以是多條縫隙,每一條約3.0至約1.5mm長,較佳地約0.5至約1.0mm長。該等縫隙之間分隔開約0.5至約5mm,較佳地約1.0mm。此處所描述的通過該基部、支撐腳及昇高的擴散管(氣體分配管)的氣體流可變化,但典型地介於每小時約0.5至約8.0立方米的範圍。 In this particular embodiment, each end of the central diffuser tube is capped or encapsulated and may include perforations, holes, slits or other openings sufficient for the passage of inert gas. The openings may be arranged in one or more rows or may have any other regular or irregular arrangement. In a particular embodiment, the openings are arranged in a single row along the bottom of the tubular member such that the inert gas flowing out of the openings is directed downwardly toward the top surface of the solder of the solder reservoir. In another embodiment, the openings are arranged in two parallel rows offset from the bottom centerline of the tubular member, each offset from about 0 to 45°, or each offset from about 30°, so that the diffuser (gas) The inert gas of the atmosphere flowing out of the molten solder entering the solder sump is guided outward and downward. In this particular embodiment, the rows of openings, such as a diagnosis, may be separated from each other by about 30 to 120 degrees, or about 60 to 90 degrees. In some embodiments, the openings may be a plurality of slits, each having a length of 3.0 to about 1.5 mm, preferably about 0.5 to about 1.0 mm long. The slits are separated by between about 0.5 and about 5 mm, preferably about 1.0 mm. The gas flow described herein through the base, the support feet, and the elevated diffuser (gas distribution tube) can vary, but is typically in the range of from about 0.5 to about 8.0 cubic meters per hour.
在文中所述的設備及方法又另一具體實施例中,該設備另外包含一安裝於該移動軌道上的任意蓋子藉以形成供該等工件通過用的隧道。該任意蓋子另外包含一與該軟焊機的通風排氣管路流體連通的通風孔以便從該蓋子下方的氛圍收集助熔劑蒸氣。有一具體實施例中,該任意蓋子係由有一中心孔連至該機械的通風排氣管路之單層金屬蓋製成。在另一具體實施例中,該任意蓋子係由雙層金屬片製成,而且該雙層空間係連至該爐的通風排氣管路,由此形成一邊界氣阱。有一特定具體實施例中,該二層金屬片之間的距離可介於約1/8”至約¼”。當一工件或電路板通過該蓋子下方時,該軟焊區內產生的助熔劑蒸氣可透過該邊界阱收集,同時環繞該焊料貯槽的空氣也可被捕集於該雙層空間中,藉以確保良好的惰性化性能。有關該焊料貯槽頂端上沒有工件或電路板的案例,從該惰性化設備中之如本文所述般封閉的一或更多擴散器產生的惰性氣體可被吸至該蓋子的雙層空間下方的體積內,藉以形成一邊界惰性氣體簾以使空氣進入該體積減至最低限度。 In still another embodiment of the apparatus and method described herein, the apparatus additionally includes a cover mounted to the moving track to form a tunnel for passage of the workpieces. The optional cover additionally includes a venting opening in fluid communication with the venting line of the soft welder to collect flux vapor from the atmosphere below the cover. In one embodiment, the optional cover is formed from a single layer of metal cover having a central bore to the mechanical venting vent line. In another embodiment, the optional cover is formed from a double layer of sheet metal and the double layer space is attached to the venting line of the furnace thereby forming a boundary gas trap. In a particular embodiment, the distance between the two metal sheets can be between about 1/8" and about 1⁄4". When a workpiece or circuit board passes under the cover, flux vapor generated in the soldering zone can be collected through the boundary well, and air surrounding the solder storage tank can also be trapped in the double layer space to ensure Good inerting properties. With respect to the absence of a workpiece or circuit board on the top of the solder reservoir, inert gas generated from one or more diffusers enclosed in the inerting apparatus as described herein can be drawn below the double layer space of the lid. Within the volume, a boundary inert gas curtain is formed to minimize the entry of air into the volume.
圖1提供文中所述的設備及方法的多孔管或擴散器之一具體實施例。多孔管10係描述成具有一內部容積15的圓柱管,該內部容積15允許惰性氣體例如氮及/或其他氣體例如,但不限於,另一惰性氣體(例如,氬、氦、氖,等等)、氫或其組合流流過,並且與惰性氣體來源流體(未顯示)連通。有一具體實施例中,多孔管10係由不銹鋼製成。然而,其他多孔管10用的材料也可應用,只要該等材料對於該焊料沒有 反應性。多孔管10係透過氣體導管或其他裝置(未顯示)與該惰性氣體來源流體連通。多孔管10另外包含多數穿孔、細孔或洞孔20(在此一般通稱為"穿孔"),彼等允許氣體從該內部容積15流入該軟焊浴、該包封的內部體積(未顯示)、該熔融焊料(未顯示)的表面及該待軟焊的工件(未顯示)下方所界定的氛圍或其組合。儘管多孔管10據顯示呈圓柱形並且具有圓形橫截面,但是預期其他幾何形狀,例如,但不限於,環形、方形、矩形、橢圓形,等等均可使用。 Figure 1 provides a specific embodiment of a porous tube or diffuser of the apparatus and method described herein. The perforated tube 10 is depicted as a cylindrical tube having an internal volume 15 that allows an inert gas such as nitrogen and/or other gases such as, but not limited to, another inert gas (eg, argon, helium, neon, etc. The hydrogen, or a combination thereof, flows through and is in communication with an inert gas source fluid (not shown). In one embodiment, the perforated tube 10 is made of stainless steel. However, materials for other porous tubes 10 are also applicable as long as the materials are not for the solder. Reactivity. The perforated tube 10 is in fluid communication with the source of inert gas through a gas conduit or other means (not shown). The perforated tube 10 additionally includes a plurality of perforations, pores or holes 20 (generally referred to herein as "perforations") that allow gas to flow from the interior volume 15 into the solder bath, the internal volume of the envelope (not shown). The surface of the molten solder (not shown) and the atmosphere defined by the workpiece to be soldered (not shown) or a combination thereof. While the porous tube 10 is shown to be cylindrical and has a circular cross section, other geometries are contemplated, such as, but not limited to, circular, square, rectangular, elliptical, and the like.
穿孔20係經設計以致於該氣體流動能,舉例來說,利用圖1的具體實施例所示的圓孔依窄細的方式引導並且佈滿該軟焊貯槽(未顯示)的全長。在另一具體實施例中,穿孔20可為長形孔或狹縫。在各個不同具體實施例中,穿孔20可被截角或導角以將氣體流動從內部容積15進一步導入該軟焊浴(未顯示)及/或焊料浴與工件之間的間隙。穿孔20的平均孔徑可介於0.05微米至100微米,或0.1至10微米,或0.2至5.0微米。在一特定具體實施例中,該穿孔20的平均孔徑為約0.2微米或更小。使多孔管10上的穿孔的尺寸及數目率最適化,以尋求離開該多孔管的氣態N2的層流。在各個不同具體實施例中,為了使從被惰性化的軟焊區(例如,工件、輸送帶等等)的邊界侵入的空氣減至最少限度較佳為N2及/或其他惰性氣體的層流。 The perforations 20 are designed such that the gas flow energy, for example, is guided in a narrow manner by the circular aperture shown in the embodiment of Figure 1 and fills the full length of the solder reservoir (not shown). In another embodiment, the perforations 20 can be elongated holes or slits. In various embodiments, the perforations 20 can be truncated or angled to further introduce gas flow from the interior volume 15 into the solder bath (not shown) and/or the gap between the solder bath and the workpiece. The perforations 20 may have an average pore size of from 0.05 microns to 100 microns, or from 0.1 to 10 microns, or from 0.2 to 5.0 microns. In a particular embodiment, the perforations 20 have an average pore size of about 0.2 microns or less. The porous tube size and number of perforations 10 on the optimized, to seek to leave the porous tube of the gaseous stream in the second N layer. In various embodiments, the layer of N 2 and/or other inert gases is preferably minimized in order to minimize intrusion of air from the boundary of the inerted solder zone (e.g., workpiece, conveyor belt, etc.). flow.
圖2a、2a’、2b、2c及2d提供包含一擴散管10’的包封2000,該擴散管10’包含前述一或更多穿孔20’,的兩個爆炸等角視圖、一個組裝等角視圖及兩個爆炸側視圖。如 文中所述,該封閉的擴散管可呈中心擴散管、一或更多側擴散管或其任何組合的方式使用。擴散管10’具有一或更多穿孔20’並且裝於該包封的基部2010。基部2010與惰性氣體來源流體連通(沒顯示)並且容置擴散管10’並且包含一內部體積2015,使惰性氣體來源能依照箭頭2017所示流入該內部體積2015及流入該擴散管10’。咸相信把該多孔管裝於該包封內能讓擴散器開口被助熔劑及焊料阻塞的機會降至最低限度。儘管擴散管10’及其周圍的基部2010據顯示是圓柱形並且具有圓形橫截面,但是預期其他幾何形狀,例如,但不限於,環狀、方形、矩形、橢圓形等等也可使用。包封2000另外包含在基部2010附近的頸部2020及與該基部的內部體積流體連通的內部體積2025。包封2000另外包含在頸部2020的口部附近的蓋子2030,該口部界定出一開口2027,該惰性氣體按照箭頭2029所示經過該開口2027向外流。操作時,惰性氣體從一來源(沒顯示)通入基部2010的內部體積2015,經過該擴散管10’,經過穿孔20’排出,並且依照箭頭2029所示的方向進入頸部2020的內部體積2025(參見圖2a、2a’、2c及2d)。在一些具體實施例中,如圖2a’及2d所示,包封2000的頸部2020可包含一或更多焊料能通過的洞孔2023,由此改善該軟焊設備內的焊料流動。 Figures 2a, 2a', 2b, 2c and 2d provide an envelope 2000 comprising a diffuser 10' comprising two exploding isosceles views of the one or more perforations 20', an assembled equiangular angle View and two explosion side views. Such as As described herein, the closed diffuser can be used in the form of a central diffuser, one or more side diffusers, or any combination thereof. The diffuser 10' has one or more perforations 20' and is mounted to the encapsulated base 2010. The base 2010 is in fluid communication with an inert gas source (not shown) and houses the diffuser 10' and includes an internal volume 2015 that allows the source of inert gas to flow into the internal volume 2015 and into the diffuser 10' as indicated by arrow 2017. It is believed that the installation of the porous tube in the envelope minimizes the chance of the diffuser opening being blocked by the flux and solder. While the diffuser 10' and its surrounding base 2010 are shown to be cylindrical and have a circular cross section, other geometries are contemplated, such as, but not limited to, loops, squares, rectangles, ellipses, and the like. The enclosure 2000 additionally includes a neck 2020 adjacent the base 2010 and an interior volume 2025 in fluid communication with the interior volume of the base. The enclosure 2000 additionally includes a cover 2030 adjacent the mouth of the neck 2020 that defines an opening 2027 through which the inert gas flows outwardly as indicated by arrow 2029. In operation, the inert gas is passed from a source (not shown) into the internal volume 2015 of the base 2010, through the diffuser 10', through the perforations 20', and into the interior volume 2025 of the neck 2020 in the direction indicated by arrow 2029. (See Figures 2a, 2a', 2c and 2d). In some embodiments, as shown in Figures 2a' and 2d, the neck 2020 of the encapsulation 2000 can include one or more holes 2023 through which the solder can pass, thereby improving solder flow within the soldering apparatus.
圖3a、3b及3c分別提供文中所述的包封之一具體實施例的頂視圖、等角視圖及側視圖。參照圖3a及3c,把設備30置於波焊設備70上以於波焊操作時提供惰性氣體氛圍。波焊設備70包含一含有熔融焊料80的焊料貯槽75,及 一或更多發射一或更多焊料波(沒顯示)的噴嘴185,該等焊料波係由焊料泵(沒顯示)產生。參照圖3a至3c,設備30具有可自該設備的其餘部分移除的頂表面35,藉以使終端使用者較容易移除浮渣。頂表面35另外包含至少一開口40,從該焊料貯槽75內含的熔融焊料80經過該至少一開口40發射之至少一焊料波通過噴嘴185並且觸及沿著一移動軌道(沒顯示)通過的工件。參照圖3a至3c,設備30另外包含在擺在焊料貯槽75邊緣頂上的設備30底部上之至少一凹槽45。在某些具體實施例中,設備30可包含多於一凹槽讓設備30能置於焊料貯槽75頂上並且把前面和後面的擴散器155設置於圖3a及3c所示的焊料槽區以外。文中所述的設備的其他具體實施例可能僅具有一凹槽以把前面的擴散器155設置於該焊料槽區以外。文中所述的設備的又另一具體實施例沒有一或更多凹槽而是多數指部,該等指部讓該設備能被置於焊料貯槽上並且將所有擴散器設置於焊料槽區例如圖4a及4b及圖5a及5b所描繪的具體實施例內側。再參照圖3a至3c,凹槽45的側壁及前壁33或後壁37界定出讓多孔管10’能置於設備30內的艙。多孔管10’係經由配管(圖3a中的虛線所示)流體連通至惰性氣體來源65。如先前提及的,配合文中所述的設備及方法使用的惰性氣體可包含氮、氫、另一惰性氣體(例如,氦、氬、氖、氪、氙等等)或其組合。在某些具體實施例中,在被引進多孔管10’之前預先加熱該惰性氣體。咸瞭解圖3a至3c所示的具體實施例可依據該軟焊機的構型變化。 Figures 3a, 3b and 3c provide top, isometric and side views, respectively, of one embodiment of the encapsulation described herein. Referring to Figures 3a and 3c, the apparatus 30 is placed on the wave soldering apparatus 70 to provide an inert gas atmosphere during the wave soldering operation. The wave soldering apparatus 70 includes a solder tank 75 containing molten solder 80, and One or more nozzles 185 that emit one or more solder waves (not shown) that are generated by a solder pump (not shown). Referring to Figures 3a through 3c, the device 30 has a top surface 35 that is removable from the remainder of the device, thereby making it easier for the end user to remove the dross. The top surface 35 additionally includes at least one opening 40 through which at least one solder wave emitted from the molten solder 80 contained in the solder reservoir 75 through the at least one opening 40 passes through the nozzle 185 and touches a workpiece that passes along a moving track (not shown). . Referring to Figures 3a through 3c, the apparatus 30 additionally includes at least one recess 45 on the bottom of the device 30 that is placed atop the edge of the solder reservoir 75. In some embodiments, device 30 can include more than one recess to allow device 30 to be placed on top of solder reservoir 75 and to place front and rear diffusers 155 outside of the solder bath regions shown in Figures 3a and 3c. Other embodiments of the apparatus described herein may only have a recess to position the front diffuser 155 outside of the solder bath area. Yet another embodiment of the apparatus described herein does not have one or more grooves but a plurality of fingers that allow the device to be placed on the solder reservoir and to place all of the diffusers in the solder bath region, for example The inside of the embodiment depicted in Figures 4a and 4b and Figures 5a and 5b. Referring again to Figures 3a through 3c, the side walls of the recess 45 and the front or rear wall 33 or rear wall 37 define a compartment in which the perforated tube 10' can be placed within the apparatus 30. The perforated tube 10' is in fluid communication with an inert gas source 65 via a pipe (shown in phantom in Figure 3a). As previously mentioned, the inert gas used in conjunction with the apparatus and methods described herein may comprise nitrogen, hydrogen, another inert gas (eg, helium, argon, neon, xenon, krypton, etc.) or a combination thereof. In some embodiments, the inert gas is preheated prior to introduction into the porous tube 10'. It is understood that the specific embodiment shown in Figures 3a to 3c can vary depending on the configuration of the soldering machine.
現在參照圖3b及3c,設備30另外包含由該熔融 焊料表面(沒顯示)、該工件(沒顯示)、前壁33、後壁37及側壁43和47所界定的內部體積69。設備30另外包含具有至少一竊裝於包封中之具有多數穿孔(沒顯示)的擴散管10’,其中該基部2010的至少一部分係浸於該熔融焊料貯槽內並且用以將該基部2010及在中心的頸部2020加熱至高於該熔融焊料的熔點之溫度。 Referring now to Figures 3b and 3c, apparatus 30 additionally includes the melting The inner surface 69 defined by the solder surface (not shown), the workpiece (not shown), the front wall 33, the rear wall 37, and the side walls 43 and 47. Apparatus 30 further includes a diffuser tube 10' having at least one perforation (not shown) that is smuggled into the enclosure, wherein at least a portion of the base 2010 is immersed in the molten solder sump and used to The neck 2020 at the center is heated to a temperature above the melting point of the molten solder.
圖3b提供文中所述的設備30之具體實施例的等角視圖。參照圖3b及3c,把設備30置於波焊設備70上以於波焊操作時提供惰性氣體氛圍。波焊設備70包含一含有熔融焊料80的焊料貯槽75,及一或更多發射一或更多焊料波115的噴嘴185,該等焊料波115係由焊料泵(沒顯示)產生。設備30具有可自該設備的其餘部分移除的頂表面35,藉以使終端使用者較容易移除浮渣。頂表面35另外包含至少一開口40,從該焊料貯槽75內含的熔融焊料80經過該至少一開口40發射之至少一焊料波通過噴嘴185並且觸及沿著一移動軌道(沒顯示)通過的工件100。多數指部(沒顯示),該等指部讓該設備能被置於焊料貯槽上。多孔管10’係經由配管流體連通至一惰性氣體來源(沒顯示)。如先前提及的,配合文中所述的設備及方法使用的惰性氣體可包含氮、氫、另一惰性氣體(例如,氦、氬、氖、氪、氙等等)或其組合。在某些具體實施例中,在被引進多孔管10’之前預先加熱該惰性氣體。咸瞭解圖3a至3c所示的具體實施例可依據該軟焊機的構型變化。 Figure 3b provides an isometric view of a particular embodiment of the apparatus 30 described herein. Referring to Figures 3b and 3c, the apparatus 30 is placed on the wave soldering apparatus 70 to provide an inert gas atmosphere during the wave soldering operation. The wave soldering apparatus 70 includes a solder reservoir 75 containing molten solder 80, and one or more nozzles 185 that emit one or more solder waves 115 that are generated by a solder pump (not shown). The device 30 has a top surface 35 that is removable from the remainder of the device, thereby making it easier for the end user to remove the dross. The top surface 35 additionally includes at least one opening 40 through which at least one solder wave emitted from the molten solder 80 contained in the solder reservoir 75 through the at least one opening 40 passes through the nozzle 185 and touches a workpiece that passes along a moving track (not shown). 100. Most fingers (not shown) allow the device to be placed on the solder reservoir. The perforated tube 10' is in fluid communication via a conduit to an inert gas source (not shown). As previously mentioned, the inert gas used in conjunction with the apparatus and methods described herein may comprise nitrogen, hydrogen, another inert gas (eg, helium, argon, neon, xenon, krypton, etc.) or a combination thereof. In some embodiments, the inert gas is preheated prior to introduction into the porous tube 10'. It is understood that the specific embodiment shown in Figures 3a to 3c can vary depending on the configuration of the soldering machine.
參照圖3c,或文中所界定的設備30之具體實施例的側視圖,設備30係藉由將凹槽45鋪設於所示的焊料貯 槽75之至少一邊緣上而置於波焊設備70頂上。焊料貯槽75內具有熔融焊料80。移動軌道(沒顯示)依所示的箭頭105所指的往上方向輸送待焊接的工件100。使用至少一或更多焊料泵(沒顯示)以透過噴嘴185產生多數焊料波115。該多數焊料波115透過設備30的開口觸及工件100的下側。使被引進該封閉的多孔性擴散管的惰性氣體留在焊料貯槽75外側的艙(沒顯示)中。在圖3c所示的具體實施例中,把擴散管155設置於該焊料貯槽75的入口及出口。在又另一具體實施例中,該等擴散管10’之一或更多者可朝向垂直於該等焊料波(沒顯示)方向的方向。把該等擴散管10’的至少一者竊裝於一包封中,該包封包含具有一內部體積的基部2010、具有一內部體積的頸部2020及一開口2027,以及在該頸部2027的開口附近的蓋子2030。該包封的至少一部分例如該基部2010及頸部2020係浸於該焊料80中。惰性氣體注滿工件100下方120及熔融焊料80表面上方所示的區域或氛圍。 Referring to Figure 3c, or a side view of a particular embodiment of apparatus 30 as defined herein, apparatus 30 is constructed by placing grooves 45 in the illustrated solder reservoir. At least one edge of the slot 75 is placed atop the wave soldering device 70. The solder sump 75 has molten solder 80 therein. The moving track (not shown) conveys the workpiece 100 to be welded in the upward direction indicated by the arrow 105 shown. At least one or more solder pumps (not shown) are used to generate a plurality of solder waves 115 through the nozzles 185. The majority of the solder wave 115 penetrates the underside of the workpiece 100 through the opening of the device 30. The inert gas introduced into the closed porous diffusion tube is left in a chamber (not shown) outside the solder storage tank 75. In the embodiment illustrated in Figure 3c, a diffuser 155 is disposed at the inlet and outlet of the solder reservoir 75. In yet another embodiment, one or more of the diffuser tubes 10' can be oriented in a direction that is perpendicular to the direction of the solder waves (not shown). At least one of the diffuser tubes 10' is smuggled into an envelope comprising a base 2010 having an internal volume, a neck 2020 having an internal volume, and an opening 2027, and at the neck 2027 Cover 2030 near the opening. At least a portion of the envelope, such as the base 2010 and neck 2020, is immersed in the solder 80. The inert gas fills the area 120 below the surface of the workpiece 100 and the area or atmosphere shown above the surface of the molten solder 80.
圖4a及4b提供文中所述的設備930之具體實施例的側視及頂視圖,其中第一多孔管955、第二多孔管955’及中心擴散管10’在該焊料貯槽975內側,而且中心擴散管10’係裝於一包封內,其中該包封的至少一部分係浸在焊料貯槽975內。設備930沒有凹槽能將該前面及後面或第一及第二擴散器設於該焊料貯槽975以外例如圖3a至3c所描繪者。而是,設備930具有多數指部967,那使該設備930能被置於焊料貯槽975頂上。據顯示設備930係由材料例如金屬的雙壁建構,該雙壁界定出至少一竊裝所示的多孔管例如955及955’ 之至少一者的艙950。工件923依照箭頭925所指的方向行經設備930上方並且與從噴嘴985發射的多數熔融焊料波接觸。該多數多孔管與惰性氣體來源例如N2(沒顯示)流體連通,該惰性氣體來源通過該等管件提供惰性氣體氛圍或N2氛圍,進入艙950,進入930材料的雙層所界定的體積並且進入焊料貯槽975中熔融焊料表面、該工件923及設備930的壁所界定的內部體積969。 Figures 4a and 4b provide side and top views of a particular embodiment of the apparatus 930 described herein, wherein a first porous tube 955, a second porous tube 955', and a central diffuser 10' are inside the solder reservoir 975, Moreover, the central diffuser 10' is housed in an envelope wherein at least a portion of the envelope is immersed in the solder reservoir 975. The device 930 has no grooves to provide the front and rear or first and second diffusers outside of the solder reservoir 975, such as those depicted in Figures 3a through 3c. Rather, device 930 has a plurality of fingers 967 that enable the device 930 to be placed atop solder reservoir 975. The display device 930 is shown to be constructed of a double wall of material, such as metal, that defines at least one compartment 950 that tampers at least one of the illustrated porous tubes, such as 955 and 955'. The workpiece 923 travels over the device 930 in the direction indicated by arrow 925 and is in contact with most of the molten solder waves emitted from the nozzle 985. Most of the porous tube and N 2 source such as an inert gas (not shown) in fluid communication with, the sources of inert gas or an inert gas atmosphere such a N 2 atmosphere through a tube, into the chamber 950, 930 into the double volume of material as defined in and The interior volume 969 defined by the molten solder surface, the workpiece 923, and the walls of the apparatus 930 enters the solder reservoir 975.
圖5a及5b提供一具體實施例的側視及頂視圖,其中第一多孔管555、第二多孔管555’及第三多孔管555”在該焊料貯槽575內側,而且各自多孔管被封閉於一包封中,其中包封2020”基部的至少一部分係浸於該熔融焊料580內並且把該包封加熱至高於該焊料熔點的溫度。設備530沒有凹槽能將該第一及第二擴散器設於該焊料貯槽區575以外。設備530具有多數指部567,那使該設備530能被置於焊料貯槽575頂上。 Figures 5a and 5b provide side and top views of a particular embodiment in which a first porous tube 555, a second porous tube 555' and a third porous tube 555" are inside the solder reservoir 575, and each of the porous tubes Enclosed in an envelope wherein at least a portion of the base of the encapsulation 2020" is immersed in the molten solder 580 and the envelope is heated to a temperature above the melting point of the solder. The device 530 has no grooves to provide the first and second diffusers outside of the solder sump region 575. Device 530 has a plurality of fingers 567 that enable the device 530 to be placed atop solder reservoir 575.
圖6提供任意蓋子90的等角視圖,該蓋子90置於該設備30及移動軌道(沒顯示)上方以致於該工件能徑經那裡。據顯示任意蓋子90具有能觀看的玻璃窗95。任意蓋子90另外具有一與該軟焊機的通風排氣管路(沒顯示)流體連通以除去該軟焊站氛圍內的任何助熔劑的通風口97。 Figure 6 provides an isometric view of any cover 90 placed over the apparatus 30 and the moving track (not shown) such that the workpiece can pass therethrough. It is shown that any cover 90 has a glazing 95 that can be viewed. Any cover 90 additionally has a vent 97 that is in fluid communication with the venting line (not shown) of the soldering machine to remove any flux within the atmosphere of the soldering station.
圖7提供設備830之一具體實施例,該設備830另外包含在該焊料貯槽880頂上的任意蓋子890藉以形成一隧道供保持於移動軌道900上的工件(沒顯示)通過。圖7提供設備830之一端視圖。在某些具體實施例中,任意蓋子890 與波焊機(沒顯示)的通風排氣管路流體連通。任意蓋子890係由金屬片或其他適當材料的雙層構成,而且該雙層空間係連至該爐的通風排氣管路897,其形成一邊界氣阱。在某些具體實施例中,該二薄片層之間的距離可介於,但不限於,1/8”至1/4”。在圖7所示的具體實施例中,任意蓋子890可包含一與惰性氣體來源(沒顯示)流體連通的惰性氣體入口895以進一步協助將助熔劑蒸氣和空氣流出該軟焊區。在某些具體實施例中,當一電路板通過蓋子890下方時,該軟焊區內產生的助熔劑蒸氣可透過該邊界阱予以控制,同時也可將圍繞於焊料貯槽870的空氣捕集於蓋子890下方的雙層空間中,那有助於確保良好的惰性化氛圍。在該焊料貯槽870沒被工件覆蓋的例子中,該多數多孔管(沒顯示)所產生的惰性氣體可被吸入該蓋子890的雙層空間中藉以形成一邊界惰性氣體簾以使空氣從外部環境進入該焊料貯槽870上方的氛圍920中減至最低限度。 FIG. 7 provides an embodiment of apparatus 830 that additionally includes any cover 890 on top of the solder reservoir 880 to form a tunnel for passage of workpieces (not shown) retained on the moving track 900. FIG. 7 provides an end view of device 830. In some embodiments, any cover 890 It is in fluid communication with a venting line of a wave soldering machine (not shown). Any cover 890 is constructed of a double sheet of sheet metal or other suitable material and is attached to a venting vent 897 of the furnace which forms a boundary gas trap. In some embodiments, the distance between the two lamella layers can be between, but not limited to, 1/8" to 1/4". In the particular embodiment illustrated in Figure 7, any cover 890 can include an inert gas inlet 895 in fluid communication with an inert source of gas (not shown) to further assist in the flow of flux vapor and air out of the solder joint. In some embodiments, when a circuit board passes under the cover 890, the flux vapor generated in the solder pad can be controlled through the boundary well, and the air surrounding the solder reservoir 870 can also be trapped. In the double space below the lid 890, that helps ensure a good inerting atmosphere. In the example where the solder reservoir 870 is not covered by the workpiece, the inert gas generated by the plurality of porous tubes (not shown) can be drawn into the two-layer space of the cover 890 to form a boundary inert gas curtain to allow air to pass from the external environment. The atmosphere 920 entering the solder sump 870 is minimized.
圖10提供了一實施例1000的側視,其中該中心擴散管1040在焊料波1050的表面的上方。在此實施例中惰性氣體係經過氣體提供管線1020被提供給基部1010。該基部的兩末端被包封且具有惰性氣體流經其間的一內部體積。該惰性氣體接著往上流經支撐腳1030的內部體積並進入擴散管(或氣體分配管)1040的內部體積。最後,該惰性氣體流出及往下通過該擴散管(或氣體分配管)1040的穿孔(未示於圖中)再進入熔融焊料表面(未示於圖中)的上方的氛圍。 FIG. 10 provides a side view of an embodiment 1000 in which the central diffuser 1040 is above the surface of the solder wave 1050. In this embodiment the inert gas system is supplied to the base 1010 via a gas supply line 1020. Both ends of the base are encapsulated and have an internal volume through which an inert gas flows. The inert gas then flows upward through the internal volume of the support foot 1030 and into the internal volume of the diffusion tube (or gas distribution tube) 1040. Finally, the inert gas flows out and passes through the perforations (not shown) of the diffuser (or gas distribution tube) 1040 to enter the atmosphere above the molten solder surface (not shown).
圖11a,b,c,d,e,及f進一步示出圖10中的擴散 器的架構,其係藉由下列視向提供:由該基部(未示於圖中)往上看該擴散管(或氣體分配管)1040的視圖(圖11a,11c,及11e),及由該末端看該擴散管(或氣體分配管)1040的視圖(圖11b,11d,及11f)。如圖11a及b所示,該穿孔1060順著該擴散管(或氣體分配管)1040的底部中心線被配置成一直線。在如圖11c及d所示的一替代性實施例中,該穿孔1060配置成二行且對該擴散管(或氣體分配管)1040的底部中心線呈60°角。在如圖11e及f所示的又一替代性實施例中,該穿孔1060配置成三行且對該擴散管(或氣體分配管)1040的底部中心線彼此呈等角度間隔並且最外面兩行之間呈90°間隔。 Figures 11a, b, c, d, e, and f further illustrate the diffusion in Figure 10 The architecture of the device is provided by viewing the view of the diffuser (or gas distribution tube) 1040 (Figs. 11a, 11c, and 11e) from the base (not shown), and The end looks at the view of the diffuser (or gas distribution tube) 1040 (Figs. 11b, 11d, and 11f). As shown in Figures 11a and b, the perforations 1060 are arranged in a straight line along the bottom centerline of the diffuser (or gas distribution tube) 1040. In an alternative embodiment as shown in Figures 11c and d, the perforations 1060 are arranged in two rows and at an angle of 60 to the bottom centerline of the diffuser (or gas distribution tube) 1040. In still another alternative embodiment as shown in Figures 11e and f, the perforations 1060 are configured in three rows and the bottom centerlines of the diffuser (or gas distribution tube) 1040 are equiangularly spaced from each other and the outermost two rows There is a 90° interval between them.
儘管該設備及方法已經詳細地並且引用其特定實例及具體實施例敘述過,但是熟悉此技藝者將顯而易見其中可完成多種不同變化及修飾而不會悖離其精神及範疇。 Although the device and method have been described in detail and by reference to the specific examples and embodiments thereof, it will be apparent to those skilled in the art
如圖8所示,獲得沒有電路板裝載於該焊料貯槽上方而且沒有頂蓋(如圖6所示)的焊料貯槽頂部空間四周的氧(O2)濃度測量值。參照圖8,於下列位置進行測量:點a(接近第一焊料波的左邊緣);點b(接近第一個波的中間表面);點c(介於二焊料波之間);點d(接近第二個波的中間表面);及點e(接近第二焊料波的右邊緣)。 As shown in Figure 8, oxygen (O 2 ) concentration measurements around the headspace of the solder bath without the board loaded over the solder bath and without the top cover (shown in Figure 6) were obtained. Referring to Figure 8, measurements are taken at the following points: point a (close to the left edge of the first solder wave); point b (close to the middle surface of the first wave); point c (between the two solder waves); point d (close to the middle surface of the second wave); and point e (close to the right edge of the second solder wave).
以表1及2所示的氧濃度測量為基礎評估該中心 擴散器的兩種不同設計。表1是關於第一種設計的結果。在第一種設計中,把該中心擴散器封閉於一金屬保護管內。該保護管含有多排敞開的狹長孔以允許惰性氣體流動並且藉由PTFE塗層塗覆以提供該無黏性的性質。在表2中,該中心擴散管也被封在有狹長孔且經塗覆的保護管中,但是其表面沒有多排狹長孔,該擴散管有兩個面向下的縱長狹長孔。 Evaluate the center based on the oxygen concentration measurements shown in Tables 1 and 2. Two different designs of diffusers. Table 1 is the result of the first design. In the first design, the central diffuser is enclosed within a metal protective tube. The protective tube contains a plurality of rows of open elongated holes to allow inert gas to flow and is coated by a PTFE coating to provide the non-stick properties. In Table 2, the central diffuser tube is also enclosed in a slitted and coated protective tube, but without a plurality of rows of elongated holes on its surface, the diffuser tube has two longitudinally elongated slits facing downward.
在以上的表1及2中,以每小時立方米(m3/hr)提供流速並且三個流速讀值是表示左/中/右或前/中/後擴散器。把測得的氧濃度表示成百分比。在氧測量的期間,把該焊料貯槽溫度保持於260℃並且產生兩個焊料波而且通風設備完全打開。如表1及2所示,兩個案例的氧濃度高於2000ppm或0.2%的目標水準相當多。這些高氧讀值的理由是該二波之間的空間太緊密,以致於該中心擴散器的位置無法最佳化。進行短時間的助流劑測試(1至2小時)。已發現經塗覆PTFE的保護管能藉由助熔劑及焊料有效減少污染,但是可能無法完全消除污染,因為沒有加熱該保護管。 In Tables 1 and 2 above, the flow rate is provided in cubic meters per hour (m 3 /hr) and the three flow rate readings are for the left/middle/right or front/middle/back diffusers. The measured oxygen concentration is expressed as a percentage. During the oxygen measurement, the solder sump temperature was maintained at 260 ° C and two solder waves were generated and the ventilator was fully opened. As shown in Tables 1 and 2, the target levels of oxygen concentrations above 2000 ppm or 0.2% in both cases were quite large. The reason for these high oxygen readings is that the space between the two waves is too tight, so that the position of the central diffuser cannot be optimized. Perform a short-term glidant test (1 to 2 hours). It has been found that a PTFE coated protective tube can effectively reduce contamination by fluxing and soldering, but may not completely eliminate contamination because the protective tube is not heated.
本實施例證實將該中心擴散管竊裝於根據本發明的包封中之結果,該包封類似於圖2a至2c所描繪並且被設計成能降低氧濃度及防止擴散器阻塞。在本實驗中,該中心多孔管係竊裝於一包封中並且設置於二焊料波之間。咸相信此配置可藉由焊料噴濺物的凝固及擴散器表面上的助熔劑蒸氣凝結來避免阻塞問題。如實施例1,進行氧濃度測量時沒有工件或蓋子在該焊料貯槽上方。在不同N2流量配置下在圖9指定的位置測量該焊料貯槽周圍9個位置處的O2濃度。在實施例2中,圖9的位置b0及d0與圖8的位置b及d相當。在該O2測量的期間,使該焊料貯槽溫度保持於260℃並且產生兩個焊料波而且通過該爐管路通風設備完全打開。以每小 時立方米(m3/hr)提供流速並且三個流速讀值是表示左/中/右或前/中/後擴散器。測得的數據是表示成百分比的氧濃度。如表3所示,在大部分案例中,氧濃度均低於目標水準,例如2000ppm或0.2%。此外,根據使用助熔劑的兩天測試,沒有觀察到擴散器阻塞。以下表3中提供關於氧濃度測量的結果。 This example demonstrates the result of stealing the central diffuser tube in an envelope in accordance with the present invention, which is similar to that depicted in Figures 2a through 2c and is designed to reduce oxygen concentration and prevent diffuser clogging. In this experiment, the central porous tube was smuggled into an envelope and placed between two solder waves. It is believed that this configuration can avoid clogging problems by solidification of solder splatters and flux vapor condensation on the diffuser surface. As in Example 1, no oxygen or gas concentration measurements were taken over the solder reservoir. The O 2 concentration at nine locations around the solder reservoir was measured at the position specified in Figure 9 under different N 2 flow configurations. In the second embodiment, the positions b 0 and d 0 of Fig. 9 correspond to the positions b and d of Fig. 8 . During this O 2 measurement, the solder sump temperature was maintained at 260 ° C and two solder waves were generated and fully vented through the furnace line venting device. The flow rate is provided in cubic meters per hour (m 3 /hr) and the three flow rate readings are for the left/middle/right or front/middle/back diffusers. The measured data is expressed as a percentage of oxygen concentration. As shown in Table 3, in most cases, the oxygen concentration is below the target level, such as 2000 ppm or 0.2%. In addition, no diffuser blockage was observed based on the two-day test using the flux. The results regarding the oxygen concentration measurement are provided in Table 3 below.
沿著該包封頸部有洞孔的中心擴散器設計也同樣測量氧濃度,該包封類似於圖2a’及2d描繪者。在有頂蓋及有和沒有工件的情況下測得結果。沒有裝載工件時氧濃度 係於大約2000ppm(0.20%)的預期範圍中,及有工件時大約500至600ppm(0.05至0.06%)。此外,觀察到該中心擴散器周圍有良好的焊料流動。 The oxygen diffuser was also measured along a central diffuser design having a hole in the neck of the envelope, similar to that depicted in Figures 2a' and 2d. The results were measured with a top cover and with and without a workpiece. Oxygen concentration when no workpiece is loaded It is in the expected range of approximately 2000 ppm (0.20%) and approximately 500 to 600 ppm (0.05 to 0.06%) in the presence of the workpiece. In addition, good solder flow around the central diffuser was observed.
本實施例證實由於該中心擴散管竊裝於根據本發明的包封中的結果使浮渣形成減少。該設備係於6m3/hr的左、中及右擴散管的氮流速及於4.0bar的氮壓力下運轉。浮渣形成係在有和沒有工件及有和沒有蓋子在該焊料貯槽上方的情況下藉由測量每天(6小時的運轉時間)收集到的浮渣量求得。使用的工件是具有350mm乘450mm的尺寸之板子。將浮渣收集結果載於以下的表4中,並且與沒用設備提供惰性氣體的基線做比較。如表4所示,在大部分案例中浮渣形成明顯降低了。 This example demonstrates that scum formation is reduced as a result of the central diffuser being stolen in the envelope in accordance with the present invention. The equipment was operated at a nitrogen flow rate of 6 m 3 /hr left, center and right diffuser tubes and at a nitrogen pressure of 4.0 bar. Scum formation was determined by measuring the amount of scum collected per day (6 hours of run time) with and without the workpiece and with and without the lid above the solder reservoir. The workpiece used was a board having a size of 350 mm by 450 mm. The scum collection results are shown in Table 4 below and compared to the baseline for the inert gas provided by the equipment. As shown in Table 4, scum formation was significantly reduced in most cases.
根據本發明的設備及方法的其他益處包括製造及材料成本降低,改善的焊料接點品質及簡化轉為無鉛軟焊技術的過渡階段。關於製造及材料成本,已觀察到焊料消耗減少20至40%,浮渣形成滅少40至90%,助熔劑消耗減少10至30%,及設備保養減少70至80%,以及較低的後段裝配板清理成本,減少的板缺陷及修復,及較高生產力的可用時間。本文所揭示的設備之另一益處是其可輕易放大或縮小規 模並且可建構成配合具有多變的不同尺寸之焊料槽。特別是,文中所述的包封頸部小到足以配合介於兩個焊料波之間的極窄空間,而且整個擴散器包封設計可依水平、垂直或依二維度調整以配合預期的應用。 Other benefits of the apparatus and method in accordance with the present invention include reduced manufacturing and material costs, improved solder joint quality, and simplified transition to lead-free soldering techniques. Regarding manufacturing and material costs, it has been observed that solder consumption is reduced by 20 to 40%, scum formation is reduced by 40 to 90%, flux consumption is reduced by 10 to 30%, equipment maintenance is reduced by 70 to 80%, and lower rear sections are observed. Assembly board cleaning costs, reduced board defects and repairs, and higher productivity available time. Another benefit of the device disclosed herein is that it can be easily enlarged or reduced. The mold can be constructed to match solder slots of varying sizes. In particular, the enveloping neck described herein is small enough to fit into a very narrow space between two solder waves, and the entire diffuser encapsulation design can be adjusted horizontally, vertically or in two dimensions to match the intended application. .
以上已經給多個不同措辭下過定義。只要是申請專利範圍中使用之措辭沒在以下下定義,應該給予其熟於此藝之士給予申請時印好之公開及獲准之專利表達的措辭之最廣泛定義。再者,對於所有允許併入的權限只要是此揭示內容與本案沒有不一致,本案中列舉的所有專利、測試程序及其他文件均以引用的方式完全併入。 The above has been defined for a number of different wordings. As long as the wording used in the scope of the patent application is not defined below, the broadest definition of the wording of the published and approved patent expressions printed by the artist at the time of application should be given. Furthermore, all patents, test procedures, and other documents listed in this application are fully incorporated by reference, insofar as the disclosure of the disclosure is not inconsistent with the present disclosure.
本發明的某些具體實施例及特徵使用一組數值上限及一組數值下限來描述。為求簡潔,只有某些範圍有在本文中明確揭示。然而,理應明白除非另行指明,否則從任何下限至任何上限的範圍都考慮在內。同樣地,從任何下限開始的範圍均可與任何其他下限組合以列出沒明確列舉出來的範圍,而且從任何上限開始的範圍均可與任何其他上限組合以列出沒明確列舉出來的範圍。此外,即使是沒有明確敍述,一範圍也包括其端點之間的每一點或個別值。因此,每一點或個別值均可將其本身視為下限或上限而與任何其他點或個別值或任何其他下限或上限組合,以列出沒明確列舉出來的範圍。所有數值均是"約"或"大約"的指示值,並且將普通熟悉此技藝者能預想到的實驗誤差及變化都考慮進來。 Certain embodiments and features of the invention are described using a set of numerical upper limits and a set of numerical lower limits. For the sake of brevity, only certain ranges are explicitly disclosed in this article. However, it should be understood that the range from any lower limit to any upper limit is taken into account unless otherwise stated. Likewise, ranges from any lower limit can be combined with any other lower limit to the extent that is not explicitly recited, and the range from any of the upper limits can be combined with any other upper limit to the extent that is not explicitly recited. In addition, even if not explicitly stated, a range includes every point or individual value between the endpoints. Accordingly, each point or individual value may be considered as a lower or upper limit and combined with any other point or individual value or any other lower or upper limit to list the ranges not explicitly recited. All values are indicative of "about" or "approximately" and the experimental errors and variations that would be apparent to those skilled in the art are contemplated.
儘管前述係關於本發明的具體實施例及其替代具體實施例,但是熟悉此藝者可預期本發明的多種不同變 化、修飾及替換而不會悖離其意欲的精神及範疇。吾人所欲為本發明僅受後附申請專利範圍的措辭所限制。 Although the foregoing is directed to specific embodiments of the invention, and alternative embodiments thereof, those skilled in the art can Modification, modification and replacement without digressing the spirit and scope of their desires. The invention is intended to be limited only by the wording of the scope of the appended claims.
1040‧‧‧擴散管 1040‧‧‧Diffuser tube
1050‧‧‧焊料波 1050‧‧‧ solder wave
1020‧‧‧氣體提供管線 1020‧‧‧ gas supply pipeline
1010‧‧‧基部 1010‧‧‧ base
1030‧‧‧支撐腳 1030‧‧‧Support feet
1060‧‧‧穿孔 1060‧‧‧Perforation
Claims (11)
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US14/039,552 US20140027495A1 (en) | 2012-04-18 | 2013-09-27 | Apparatus And Method For Providing An Inerting Gas During Soldering |
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2014
- 2014-09-17 SG SG10201405819TA patent/SG10201405819TA/en unknown
- 2014-09-22 MY MYUI2014702698A patent/MY189324A/en unknown
- 2014-09-23 TW TW103132862A patent/TWI556901B/en active
- 2014-09-24 KR KR20140127495A patent/KR20150035417A/en not_active Application Discontinuation
- 2014-09-26 CN CN201410503233.3A patent/CN104511677A/en active Pending
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2017
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US5568894A (en) * | 1993-06-04 | 1996-10-29 | Electrovert Ltd. | Applying flux to a solder wave for wave soldering an element |
CN1117565A (en) * | 1993-12-22 | 1996-02-28 | 乔治·克劳德方法的研究开发空气股份有限公司 | Gas injection apparatus and process to form a controlled atmosphere in a confined space |
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TW200902200A (en) * | 2007-01-18 | 2009-01-16 | Linde Ag | Device and method of selective soldering |
CN102275024A (en) * | 2010-03-12 | 2011-12-14 | 气体产品与化学公司 | Apparatus and method for providing an inerting gas during soldering |
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TW201302363A (en) * | 2011-06-17 | 2013-01-16 | Air Prod & Chem | Apparatus and method for providing an inerting gas during soldering |
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MY189324A (en) | 2022-02-04 |
TW201511878A (en) | 2015-04-01 |
KR20150035417A (en) | 2015-04-06 |
KR20170039631A (en) | 2017-04-11 |
SG10201405819TA (en) | 2015-04-29 |
CN104511677A (en) | 2015-04-15 |
KR20180022757A (en) | 2018-03-06 |
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