TWI535571B - A method of manufacturing a polarizer - Google Patents

A method of manufacturing a polarizer Download PDF

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TWI535571B
TWI535571B TW101110232A TW101110232A TWI535571B TW I535571 B TWI535571 B TW I535571B TW 101110232 A TW101110232 A TW 101110232A TW 101110232 A TW101110232 A TW 101110232A TW I535571 B TWI535571 B TW I535571B
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thickness
adhesive
film
optical film
optical
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TW101110232A
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TW201247418A (en
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高田弘明
古川淳
廣岩梓
清水英滿
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住友化學股份有限公司
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    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00Optical elements other than lenses
    • G02B5/30Polarising elements
    • G02B5/3025Polarisers, i.e. arrangements capable of producing a definite output polarisation state from an unpolarised input state
    • G02B5/3033Polarisers, i.e. arrangements capable of producing a definite output polarisation state from an unpolarised input state in the form of a thin sheet or foil, e.g. Polaroid
    • G02B5/3041Polarisers, i.e. arrangements capable of producing a definite output polarisation state from an unpolarised input state in the form of a thin sheet or foil, e.g. Polaroid comprising multiple thin layers, e.g. multilayer stacks
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B29WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29DPRODUCING PARTICULAR ARTICLES FROM PLASTICS OR FROM SUBSTANCES IN A PLASTIC STATE
    • B29D11/00Producing optical elements, e.g. lenses or prisms
    • B29D11/0073Optical laminates
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B27/00Layered products comprising a layer of synthetic resin
    • B32B27/06Layered products comprising a layer of synthetic resin as the main or only constituent of a layer, which is next to another layer of the same or of a different material
    • B32B27/08Layered products comprising a layer of synthetic resin as the main or only constituent of a layer, which is next to another layer of the same or of a different material of synthetic resin
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B7/00Layered products characterised by the relation between layers; Layered products characterised by the relative orientation of features between layers, or by the relative values of a measurable parameter between layers, i.e. products comprising layers having different physical, chemical or physicochemical properties; Layered products characterised by the interconnection of layers
    • B32B7/04Interconnection of layers
    • B32B7/12Interconnection of layers using interposed adhesives or interposed materials with bonding properties
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J129/00Adhesives based on homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by an alcohol, ether, aldehydo, ketonic, acetal, or ketal radical; Adhesives based on hydrolysed polymers of esters of unsaturated alcohols with saturated carboxylic acids; Adhesives based on derivatives of such polymers
    • C09J129/02Homopolymers or copolymers of unsaturated alcohols
    • C09J129/04Polyvinyl alcohol; Partially hydrolysed homopolymers or copolymers of esters of unsaturated alcohols with saturated carboxylic acids
    • GPHYSICS
    • G02OPTICS
    • G02FOPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333Constructional arrangements; Manufacturing methods
    • G02F1/1335Structural association of cells with optical devices, e.g. polarisers or reflectors
    • G02F1/133528Polarisers

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Organic Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Manufacturing & Machinery (AREA)
  • Ophthalmology & Optometry (AREA)
  • Mechanical Engineering (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Polarising Elements (AREA)

Description

偏光板之製造方法 Method for manufacturing polarizing plate

本發明係關於一種作為液晶顯示構件使用之偏光板之製造方法。 The present invention relates to a method of manufacturing a polarizing plate used as a liquid crystal display member.

形成液晶顯示裝置之核心之液晶面板通常係於液晶單元之兩面配置偏光板而構成。通常偏光板為於聚乙烯醇系樹脂製之偏光膜之一面經由接著劑貼合有透明樹脂製之保護膜之構造。多數情況下於偏光膜之另一面亦經由接著劑貼合透明樹脂膜,該側之透明樹脂膜除與相反側之保護膜同樣為僅具有對偏光膜之保護功能者以外,亦有時為除具有保護功能,還以液晶單元之光學補償或視角補償為目的而賦予有面內及/或厚度方向之相位差的所謂相位差膜。本說明書中,將此種經由接著劑貼合於偏光膜上之保護膜或相位差膜等稱為「光學膜」。用以將光學膜向偏光膜貼合之接著劑通常為液狀者,藉由該液狀接著劑之硬化反應,於偏光膜與光學膜之間表現接著力。 A liquid crystal panel that forms the core of a liquid crystal display device is usually configured by disposing a polarizing plate on both surfaces of a liquid crystal cell. In general, the polarizing plate has a structure in which a protective film made of a transparent resin is bonded to one surface of a polarizing film made of a polyvinyl alcohol-based resin via an adhesive. In many cases, the transparent resin film is bonded to the other surface of the polarizing film via an adhesive. The transparent resin film on the side is not only the protective film for the polarizing film but also the protective film. A so-called retardation film having a protective function and imparting a phase difference in the in-plane and/or thickness direction for the purpose of optical compensation or viewing angle compensation of the liquid crystal cell. In the present specification, such a protective film or a retardation film which is bonded to a polarizing film via an adhesive is referred to as an "optical film". The adhesive for bonding the optical film to the polarizing film is usually liquid, and the adhesive force is expressed between the polarizing film and the optical film by the hardening reaction of the liquid adhesive.

近年來,以電視為首之液晶顯示裝置之價格急速下降,對構成其之構件低價格化之要求變得強烈,另一方面,對品質之要求亦變得更強烈。於該潮流中,偏光板之製造中所使用之接著劑亦正自能夠應用之光學膜之種類被限定為纖維素系樹脂等特定樹脂之水系接著劑,變更為能夠應用之光學膜之種類較多之活性能量射線硬化型接著劑。使用有活性能量射線硬化型接著劑之偏光膜與光學膜之貼合例 如於日本專利特開2004-245925號公報中提出。 In recent years, the price of liquid crystal display devices, including televisions, has rapidly declined, and the demand for lowering the cost of the components constituting them has become stronger. On the other hand, the demand for quality has become stronger. In this trend, the type of the optical film that can be used in the production of the polarizing plate is limited to a water-based adhesive of a specific resin such as a cellulose resin, and the type of the optical film that can be applied is changed. A large number of active energy ray hardening type adhesives. A bonding example of a polarizing film and an optical film using an active energy ray hardening type adhesive It is proposed in Japanese Patent Laid-Open Publication No. 2004-245925.

準備液狀之活性能量射線硬化型接著劑,使用於被塗佈物上直接塗佈該液狀接著劑之模嘴塗機、或於形成於表面之凹槽內擔載液狀接著劑並將其轉印至被塗佈物表面之凹版輥,於光學膜之向偏光膜之貼合面進行預塗佈。繼而,於該接著劑塗佈面重疊偏光膜,並照射紫外線或電子束等活性能量射線,使接著劑硬化,而表現接著力。關於此種使用活性能量射線硬化型接著劑之方式,能夠應用之光學膜較多,為非常有效之方法。 Preparing a liquid active energy ray-curable adhesive, using a die coater for directly applying the liquid adhesive to the coated object, or carrying a liquid adhesive in a groove formed in the surface and The gravure roll transferred to the surface of the object to be coated is precoated on the bonding surface of the optical film to the polarizing film. Then, the polarizing film is superposed on the adhesive-coated surface, and an active energy ray such as an ultraviolet ray or an electron beam is irradiated to cure the adhesive to express an adhesive force. Regarding such an embodiment in which an active energy ray-curable adhesive is used, many optical films can be applied, which is a very effective method.

作為使用該活性能量射線硬化型接著劑之偏光板之製造方法,例如於日本專利特開2009-134190號公報中揭示有如下方法:於偏光膜之兩面分別經由接著劑重疊保護膜而獲得積層體,一邊使該積層體密接於沿該積層體之搬送方向形成為円弧狀之凸曲面之外表面,一邊照射活性能量射線。根據該方法,能夠製造可抑制於所得之偏光板容易發生之逆捲曲及波形捲曲、且具有良好性能之偏光板。 As a method of producing a polarizing plate using the active energy ray-curable adhesive, for example, Japanese Laid-Open Patent Publication No. 2009-134190 discloses a method of obtaining a laminate by superimposing a protective film on both surfaces of a polarizing film via an adhesive. The active energy ray is irradiated while the laminated body is in close contact with the outer surface of the convex curved surface which is formed in a meandering shape along the conveying direction of the laminated body. According to this method, it is possible to manufacture a polarizing plate which can suppress the occurrence of reverse curl and wave curl which are likely to occur in the obtained polarizing plate, and which has excellent performance.

於該文獻之方法中,認為於保護膜上所形成之接著劑層之厚度對所製造之偏光板之逆捲曲及波形捲曲不會造成較大影響,因此無太大必要對接著劑之塗佈厚度進行管理。然而,雖因接著劑層之厚度波動而引起之大部分為不成問題之水準,但有時會產生氣泡等缺陷,於該缺陷較大之情形時,有時偏光板之良率會降低。進而,於穩定製造廉價且更高性能之偏光板時,多數情況下活性能量射線硬化型接著劑塗佈得較先前之水系接著劑厚,又,由於其本身昂 貴,及亦期望偏光板本身之薄壁化,故而期望以成為考慮波動幅度(變動)所得之所需最低限度之厚度之方式進行管理。 In the method of the document, it is considered that the thickness of the adhesive layer formed on the protective film does not greatly affect the reverse curl and the waveform curl of the manufactured polarizing plate, so that it is not necessary to apply the adhesive to the adhesive. Thickness management. However, most of the defects caused by fluctuations in the thickness of the adhesive layer are not problematic, but defects such as bubbles may occur, and when the defects are large, the yield of the polarizing plate may be lowered. Further, in the case of stably producing an inexpensive and higher-performance polarizing plate, in many cases, the active energy ray-curable adhesive is applied thicker than the previous water-based adhesive, and, in addition, due to its own Since it is also desirable to reduce the thickness of the polarizing plate itself, it is desirable to manage it in such a manner as to obtain the minimum thickness required for the fluctuation range (variation).

作為於線內、即於偏光板之製造線內之接著劑塗佈後且偏光膜與光學膜貼合前,測定塗佈厚度以進行管理之機器,已知有紅外線膜厚計。然而,紅外線膜厚計之分辨能力存在極限,因此難以準確測定如偏光板製造線般連續進行搬送之膜上以數μm程度形成之塗佈層(接著劑層)之厚度。具體地加以說明,則為於偏光板製造線內,如後述之圖1所示,偏光膜與貼合於其至少一面之光學膜分別不具有各別之支持體地連續地被搬送,並於某處進行貼合。如此連續搬送之膜會於厚度方向與施加張力之方向(流動方向)發生微妙之搖動(振動),若欲於存在上述搖動之狀態下利用紅外線膜厚計測定塗佈層之厚度,則只能獲得±1 μm左右之精度,以其為基礎對塗佈厚度進行管理於事實上為不可能。又,若欲以紅外線膜厚計測定形成於光學膜上之接著劑層之厚度,則先不論存在光學膜所提供之紅外線吸收峰值與接著劑所提供之紅外線吸收峰值必需有明顯區別之限制,亦有時根據光學膜之種類之不同,兩者之峰值會重疊,而無法獲得測定值本身。因此,至今為止於使用有液狀接著劑之偏光板之製造中,仍不能於線內檢查塗佈於膜上之液狀接著劑之厚度。 An infrared film thickness meter is known as a machine for measuring the coating thickness after the application of the adhesive in the line, that is, after the application of the adhesive in the manufacturing line of the polarizing plate, and before the polarizing film is bonded to the optical film. However, since the resolution of the infrared film thickness meter has a limit, it is difficult to accurately measure the thickness of the coating layer (adhesive layer) formed on the film which is continuously conveyed as in the case of the polarizing plate manufacturing line by several μm. Specifically, in the polarizing plate manufacturing line, as shown in FIG. 1 described later, the polarizing film and the optical film bonded to at least one surface thereof are continuously conveyed without respective support bodies, and Fit somewhere. The film thus continuously conveyed will be slightly shaken (vibrated) in the direction of the thickness direction and the direction of the applied tension (flow direction), and if the thickness of the coating layer is to be measured by the infrared film thickness gauge in the presence of the above shaking, It is virtually impossible to manage the coating thickness based on the accuracy of about ±1 μm. Further, if the thickness of the adhesive layer formed on the optical film is to be measured by an infrared film thickness meter, there is a significant difference between the infrared absorption peak provided by the optical film and the infrared absorption peak provided by the adhesive. In some cases, depending on the type of the optical film, the peaks of the two overlap, and the measured value itself cannot be obtained. Therefore, in the manufacture of a polarizing plate using a liquid adhesive, the thickness of the liquid adhesive applied to the film cannot be checked in-line.

因此,本發明之課題在於提供於偏光膜上經由以活性能量射線硬化型接著劑為代表例之液狀接著劑貼合光學膜時,藉由於線內管理接著劑之塗佈厚度,使其厚度之波動減少,以此抑制接著劑層中之氣泡等缺陷之產生,同時能夠廉價地製造偏光板之方法。 In view of the above, it is an object of the present invention to provide an optical film by a liquid adhesive which is a representative example of an active energy ray-curable adhesive on a polarizing film, and the thickness of the adhesive is adjusted by the thickness of the in-line management adhesive. The method of suppressing the occurrence of defects such as bubbles in the adhesive layer and suppressing the generation of the polarizing plate at a low cost.

本發明者等人為解決上述課題進行了精心研究,結果發現,將液狀之接著劑塗佈於光學膜上,並使該塗佈層貼合於偏光膜而製造偏光板時,藉由以特定方法測量所塗佈之接著劑之厚度,準確地求出該厚度,基於其結果,控制塗佈時之接著劑之塗佈厚度,藉此可製造接著劑之厚度均勻且缺陷較少之偏光板,從而完成了本發明。 The present inventors have intensively studied to solve the above problems, and as a result, it has been found that when a liquid adhesive is applied to an optical film and the coating layer is bonded to a polarizing film to produce a polarizing plate, The method measures the thickness of the applied adhesive, accurately determines the thickness, and based on the result, controls the coating thickness of the adhesive at the time of coating, whereby a polarizing plate having a uniform thickness of the adhesive and less defects can be produced. Thus, the present invention has been completed.

即,本發明提供一種偏光板之製造方法,其係於聚乙烯醇系樹脂製之偏光膜上經由接著劑貼合熱塑性樹脂製之光學膜而製造偏光板者,且包括以下之(A)、(B)、(C)及(D)之各步驟。 In other words, the present invention provides a method for producing a polarizing plate, which is obtained by laminating a polarizing film made of a thermoplastic resin to an optical film made of a polyvinyl alcohol-based resin, and comprising the following (A). The steps of (B), (C) and (D).

(A)塗佈步驟,使用具有接著劑之塗佈厚度控制機構之塗佈機,於光學膜之向偏光膜之貼合面塗佈上述接著劑;(B)測量步驟,利用將分光波長區域設為超過800 nm之範圍內之分光干涉法,於塗佈步驟前測量光學膜之厚度,並且於塗佈步驟後測量光學膜與所塗佈之接著劑之合計厚度,於線內由該等測量值之差之絕對值求出所塗佈之接著劑之厚度;(C)貼合步驟,於上述塗佈步驟中塗佈且經過上述測量 步驟之接著劑面重疊偏光膜並加壓;及(D)控制步驟,基於0.5~5 μm之範圍內設定之接著劑之設定厚度Y與測量步驟中獲得之接著劑之測量厚度X,對接著劑之塗佈厚度控制機構進行控制。 (A) a coating step of applying the above-mentioned adhesive to the bonding surface of the optical film to the polarizing film using a coating machine having a coating thickness control mechanism of an adhesive; (B) a measuring step using the spectral wavelength region The spectroscopic interference method in the range of more than 800 nm is set, the thickness of the optical film is measured before the coating step, and the total thickness of the optical film and the applied adhesive is measured after the coating step, and these are in-line by the coating step. The absolute value of the difference between the measured values is used to determine the thickness of the applied adhesive; (C) the bonding step, coating in the above coating step and passing the above measurement The adhesive surface of the step overlaps the polarizing film and is pressurized; and (D) the control step, based on the set thickness Y of the adhesive set in the range of 0.5 to 5 μm and the measured thickness X of the adhesive obtained in the measuring step, The coating thickness control mechanism of the agent is controlled.

本發明之偏光板之製造方法較佳為包括下述(D)之步驟。 The method for producing a polarizing plate of the present invention preferably comprises the following step (D).

(D)控制步驟,於上述測量步驟中獲得之接著劑之測量厚度X與0.5~5 μm之範圍內設定之接著劑之設定厚度Y之差之絕對值相對於上述Y之比例為特定值以上時,例如為5%以上時,對上述塗佈厚度控制機構進行控制。 (D) a control step in which the absolute value of the difference between the measured thickness X of the adhesive obtained in the above measuring step and the set thickness Y of the adhesive set in the range of 0.5 to 5 μm is a specific value or more with respect to the ratio of the above Y In the case of, for example, 5% or more, the coating thickness control means is controlled.

又,本發明之其他態樣之方法提供包括以下(A)、(B)、(C)及(D)之各步驟之偏光板之製造方法。 Further, the method of the aspect of the invention provides a method of producing a polarizing plate comprising the steps (A), (B), (C) and (D) below.

(A)使用具有接著劑之塗佈厚度之控制部之塗佈機,於熱塑性樹脂製之光學膜上塗佈接著劑;(B)利用將分光波長區域設定於超過800 nm之範圍內之分光干涉法,測量塗佈接著劑前之光學膜之光學厚度、與塗佈有接著劑之光學膜之光學厚度,並基於塗佈接著劑前之光學膜之光學厚度與塗佈有接著劑之光學膜之光學厚度之差求出所塗佈之接著劑之厚度;(C)於經過測量之光學膜之接著劑塗佈面,重疊聚乙烯醇系樹脂製之偏光膜,對光學膜相對於偏光膜進行加壓,使偏光膜與光學膜經由接著劑而貼合;及(D)基於0.5~5 μm之範圍內設定之接著劑之設定厚度Y與接著劑之所求出之厚度X,對控制部進行控制。 (A) applying an adhesive to an optical film made of a thermoplastic resin using a coater having a control portion having a coating thickness of an adhesive; (B) using a spectroscopic light having a spectral wavelength region set in a range exceeding 800 nm Interferometry, measuring the optical thickness of the optical film before application of the adhesive, and the optical thickness of the optical film coated with the adhesive, and based on the optical thickness of the optical film before application of the adhesive and the optical agent coated with the adhesive The difference in optical thickness of the film is used to determine the thickness of the applied adhesive; (C) the polarizing film made of a polyvinyl alcohol-based resin is superposed on the adhesive-coated surface of the measured optical film, and the optical film is polarized with respect to the polarizing film. Pressurizing the film to bond the polarizing film and the optical film via the adhesive; and (D) setting the thickness Y of the adhesive set in the range of 0.5 to 5 μm and the thickness X obtained by the adhesive, The control unit performs control.

本發明之其他態樣之方法較佳為包括下述(D)之步驟。 The method of other aspects of the invention preferably comprises the steps of (D) below.

(D)於上述接著劑之所求出之厚度X與接著劑之設定厚度Y之差之絕對值相對於0.5~5 μm之範圍內設定之接著劑之設定厚度Y之比例為特定值以上時,例如為5%以上時,對控制部進行控制。 (D) When the ratio of the absolute value of the difference between the thickness X obtained by the above-mentioned adhesive agent and the set thickness Y of the adhesive agent to the set thickness Y of the adhesive set in the range of 0.5 to 5 μm is a specific value or more For example, when it is 5% or more, the control unit is controlled.

根據本發明,於偏光膜上經由接著劑貼合光學膜時,使用特定之膜厚計測量塗佈步驟前後之膜厚度,藉此於線內瞬時測量形成於光學膜上之接著劑之厚度,將其結果傳送至塗佈機所具有之控制接著劑之塗佈厚度之機構,而控制該塗佈厚度,因此可製造接著劑之厚度均勻之偏光板。其結果,可抑制起因於接著劑之厚度不均而容易產生之氣泡等缺陷。 According to the invention, when the optical film is bonded to the polarizing film via the adhesive, the film thickness before and after the coating step is measured using a specific film thickness meter, thereby instantaneously measuring the thickness of the adhesive formed on the optical film in the line, The result is transmitted to a mechanism for controlling the coating thickness of the adhesive which the coater has, and the coating thickness is controlled, so that a polarizing plate having a uniform thickness of the adhesive can be manufactured. As a result, it is possible to suppress defects such as bubbles which are likely to occur due to uneven thickness of the adhesive.

本發明中,於聚乙烯醇系樹脂製之偏光膜上經由接著劑貼合熱塑性樹脂製之光學膜,而製造偏光板。光學膜可僅貼合於偏光膜之單面,亦可貼合於偏光膜之兩面。於偏光膜之兩面貼合光學膜之情形時,可於一光學膜之貼合中應用本發明之方法,亦可於兩面之光學膜之貼合中應用本發明之方法。 In the present invention, a polarizing plate is produced by laminating an optical film made of a thermoplastic resin to a polarizing film made of a polyvinyl alcohol-based resin via an adhesive. The optical film may be attached only to one side of the polarizing film or may be bonded to both sides of the polarizing film. When the optical film is bonded to both sides of the polarizing film, the method of the present invention can be applied to the bonding of an optical film, and the method of the present invention can be applied to the bonding of the optical films on both sides.

[偏光膜] [Polarizing film]

偏光膜為聚乙烯醇系樹脂製,且為具有如下性質之膜:於入射至該膜之光中,使具有某個方向之振動面之光穿透,且吸收具有與其正交之振動面之光,典型而言,聚乙 烯醇系樹脂上吸附配向有二色性色素。構成偏光膜之聚乙烯醇系樹脂係藉由使聚乙酸乙烯酯系樹脂進行皂化而獲得。成為聚乙烯醇系樹脂之原料之聚乙酸乙烯酯系樹脂除作為乙酸乙烯酯之均聚物之聚乙酸乙烯酯以外,亦可為乙酸乙烯酯和可與其共聚之其他單體之共聚物。可藉由對上述聚乙烯醇系樹脂製之膜實施單軸延伸、利用二色性色素之染色、及染色後之硼酸交聯處理,而製造偏光膜。作為二色性色素,可使用碘、或二色性之有機染料。單軸延伸可於利用二色性色素之染色前實施,亦可與利用二色性色素之染色同時實施,還可於利用二色性色素之染色後、例如硼酸交聯處理過程中實施。如此製造且吸附配向有二色性色素之聚乙烯醇系樹脂製之偏光膜成為偏光板之原料之一。 The polarizing film is made of a polyvinyl alcohol-based resin and is a film having a property of penetrating light having a vibration surface of a certain direction into the light incident on the film, and absorbing the vibration surface orthogonal thereto. Light, typically, poly A dichroic dye is adsorbed and aligned on the enol resin. The polyvinyl alcohol-based resin constituting the polarizing film is obtained by saponifying a polyvinyl acetate-based resin. The polyvinyl acetate-based resin which is a raw material of the polyvinyl alcohol-based resin may be a copolymer of vinyl acetate and another monomer copolymerizable therewith, in addition to the polyvinyl acetate which is a homopolymer of vinyl acetate. The polarizing film can be produced by subjecting the film made of the above polyvinyl alcohol-based resin to uniaxial stretching, dyeing with a dichroic dye, and boric acid crosslinking treatment after dyeing. As the dichroic dye, an iodine or a dichroic organic dye can be used. The uniaxial stretching can be carried out before dyeing with a dichroic dye, simultaneously with dyeing with a dichroic dye, or after dyeing with a dichroic dye, for example, a boric acid cross-linking treatment. The polarizing film made of the polyvinyl alcohol-based resin which is produced and adsorbed and has a dichroic dye is one of the raw materials of the polarizing plate.

[光學膜] [Optical film]

於該偏光膜上貼合熱塑性樹脂製之光學膜而製造偏光板。光學膜較佳為於溫度20℃下藉由D線測定之折射率處於1.4~1.7之範圍。光學膜之折射率係基於JIS K 0062:1992「化學製品之折射率測定方法」而測定。若光學膜具有該範圍之折射率,則將所製造之偏光板組入液晶面板中時之顯示特性優異。基於同樣之理由,光學膜之較佳折射率為1.45~1.67之範圍。就提高所獲得之偏光板之對比度,尤其於組入液晶面板中且設為黑顯示時,產生亮度下降等不良狀況之可能性減少之方面而言,該光學膜較佳為其霧度值處於0.001~3%左右之範圍。霧度值為以(擴散透射率/ 全光線透射率)×100(%)所定義之值,且基於JIS K 7136:2000「塑膠-透明材料之霧度之求算方法」而測定。 A polarizing plate was produced by laminating an optical film made of a thermoplastic resin on the polarizing film. The optical film preferably has a refractive index in the range of 1.4 to 1.7 as measured by a D line at a temperature of 20 °C. The refractive index of the optical film is measured based on JIS K 0062:1992 "Method for Measuring Refractive Index of Chemical Products". When the optical film has a refractive index in this range, the display characteristics of the produced polarizing plate when incorporated in a liquid crystal panel are excellent. For the same reason, the preferred refractive index of the optical film is in the range of 1.45 to 1.67. The optical film preferably has a haze value in terms of improving the contrast of the obtained polarizing plate, particularly when it is incorporated into the liquid crystal panel and is set to black, and the possibility of occurrence of a defect such as a decrease in brightness is reduced. 0.001~3% range. Haze value is (diffusion transmittance / The total light transmittance is a value defined by ×100 (%), and is measured based on JIS K 7136:2000 "Method for Calculating Haze of Plastic-Transparent Material".

作為構成上述光學膜之熱塑性樹脂,例如可舉出以下之樹脂,此處,將於溫度20℃下藉由D線測定之折射率設為nD(20℃)且一併示出。 The thermoplastic resin constituting the optical film is exemplified by the following resin. Here, the refractive index measured by a D line at a temperature of 20 ° C is n D (20 ° C) and is shown together.

環烯烴系樹脂[nD(20℃)=1.51~1.54左右]、結晶性聚烯烴系樹脂[nD(20℃)=1.46~1.50左右]、聚酯系樹脂[nD(20℃)=1.57~1.66左右]、聚碳酸酯系樹脂[nD(20℃)=1.57~1.59左右]、丙烯酸系樹脂[nD(20℃)=1.49~1.51左右]、三乙醯基纖維素系樹脂[nD(20℃)=1.48左右]等。 Cycloolefin resin [n D (20 ° C) = 1.51 to 1.54], crystalline polyolefin resin [n D (20 ° C) = 1.46 to 1.50 or so], polyester resin [n D (20 ° C) = 1.57~1.66], polycarbonate resin [n D (20 ° C) = 1.57~1.59], acrylic resin [n D (20 ° C) = 1.49~1.51], triethylenesulfonyl cellulose resin [n D (20 ° C) = 1.48 or so] and so on.

環烯烴系樹脂為以如降烯之類的環烯烴系單體為主要構成單元之聚合物,且包含使環烯烴系單體之開環聚合物氫化而獲得之樹脂、環烯烴系單體與如乙烯或丙烯之類的碳數2~10之鏈狀烯烴系單體及/或如苯乙烯之類的芳香族乙烯單體之加成聚合物等。 Cycloolefin resin A cycloolefin-based monomer such as an olefin is a polymer of a main constituent unit, and includes a resin obtained by hydrogenating a ring-opening polymer of a cycloolefin monomer, a cycloolefin monomer, and a carbon such as ethylene or propylene. A chain olefin monomer having 2 to 10 and/or an addition polymer of an aromatic vinyl monomer such as styrene.

結晶性聚烯烴系樹脂為以碳數2~10之鏈狀烯烴系單體為主要構成單元之聚合物,且包含鏈狀烯烴系單體之均聚物、使用有2種以上之鏈狀烯烴系單體之二元或三元以上之共聚物。具體而言,包含聚乙烯系樹脂、聚丙烯系樹脂、乙烯-丙烯共聚物、4-甲基-1-戊烯之均聚物、或4-甲基-1-戊烯與乙烯或者丙烯之共聚物等。 The crystalline polyolefin-based resin is a polymer having a chain olefin monomer having 2 to 10 carbon atoms as a main constituent unit, and includes a homopolymer of a chain olefin monomer and two or more kinds of chain olefins. It is a binary or ternary copolymer of a monomer. Specifically, it includes a polyethylene resin, a polypropylene resin, an ethylene-propylene copolymer, a homopolymer of 4-methyl-1-pentene, or 4-methyl-1-pentene and ethylene or propylene. Copolymers, etc.

聚酯系樹脂除包含如聚對苯二甲酸乙二酯或聚萘二甲酸乙二酯之類的芳香族聚酯系樹脂以外,亦包含脂肪族聚酯 系樹脂。聚碳酸酯系樹脂典型而言係藉由雙酚A與光氣之反應而獲得且於主鏈具有碳酸酯鍵-O-CO-O-之聚合物。丙烯酸系樹脂典型而言為以甲基丙烯酸甲酯為主要構成單元之聚合物,除包含甲基丙烯酸甲酯之均聚物以外,亦包含甲基丙烯酸甲酯與其他甲基丙烯酸酯及/或丙烯酸酯之共聚物等。三乙醯基纖維素系樹脂為纖維素之乙酸酯。 The polyester resin also contains an aliphatic polyester in addition to an aromatic polyester resin such as polyethylene terephthalate or polyethylene naphthalate. Resin. The polycarbonate resin is typically a polymer obtained by the reaction of bisphenol A with phosgene and having a carbonate bond -O-CO-O- in the main chain. The acrylic resin is typically a polymer having methyl methacrylate as a main constituent unit, and includes methyl methacrylate and other methacrylates in addition to a homopolymer containing methyl methacrylate. Acrylate copolymer and the like. The triethylenesulfonyl cellulose resin is cellulose acetate.

利用溶劑澆鑄法、熔融擠出法等由該等熱塑性樹脂製成膜,而可製成本實施形態中使用之光學膜。又,亦可將製膜後進一步經單軸或雙軸延伸者製成本實施形態中使用之光學膜。關於光學膜,亦可於向偏光膜貼合之前,對其貼合面實施如皂化處理、電暈處理、電漿處理、底塗處理或錨固塗佈處理之類的易接著處理。又,亦可於光學膜之向偏光膜之貼合面之相反側之面設置如硬塗層、防反射層或防眩層之類的各種處理層。 The film formed from these thermoplastic resins by a solvent casting method, a melt extrusion method, or the like can be used to form an optical film used in the present embodiment. Further, the optical film used in the present embodiment may be formed by further uniaxial or biaxial stretching after film formation. The optical film may be subjected to an easy subsequent treatment such as saponification treatment, corona treatment, plasma treatment, primer treatment or anchor coating treatment on the bonding surface before bonding to the polarizing film. Further, various treatment layers such as a hard coat layer, an antireflection layer or an antiglare layer may be provided on the surface of the optical film opposite to the bonding surface of the polarizing film.

光學膜通常較佳為具有5~200 μm左右之厚度。若光學膜過薄,則缺乏操作性,於偏光板製造線中發生斷裂、或誘發褶皺發生之可能性變高。另一方面,若過厚,則所獲得之偏光板變厚,重量亦變大,因此存在有損商品性之情形。基於該等理由,更佳為厚度為10~120 μm,進而較佳為10~85 μm。 The optical film usually has a thickness of about 5 to 200 μm. If the optical film is too thin, the operability is lacking, and the possibility of occurrence of breakage or occurrence of wrinkles in the polarizing plate manufacturing line becomes high. On the other hand, if it is too thick, the obtained polarizing plate becomes thick and the weight also becomes large, and there exists a case where the commercial property is impaired. For these reasons, the thickness is preferably from 10 to 120 μm, more preferably from 10 to 85 μm.

[接著劑] [adhesive agent]

於如上所述之偏光膜上貼合光學膜時,首先,於光學膜之向偏光膜之貼合面塗佈接著劑。接著劑之厚度於0.5~5 μm之範圍內設定為特定值。若其厚度低於0.5 μm,則有時 接著強度產生不均。另一方面,若其厚度超過5 μm,則不僅製造成本增大,而且根據接著劑之種類有時亦會對偏光板之色相產生影響。若於該範圍內設為相對較厚,例如為3.5 μm以上、尤其是4 μm以上,則即便其厚度稍微變動,亦難以出現因其所致之氣泡等缺陷,但另一方面,如此進行增厚有可能導致成本之增加,因此期望於可能之範圍內減薄。基於該等理由,接著劑之較佳厚度為1~4 μm,進而較佳為1.5~3.5 μm之範圍。 When the optical film is bonded to the polarizing film as described above, first, an adhesive is applied to the bonding surface of the optical film to the polarizing film. The thickness of the subsequent agent is set to a specific value within a range of 0.5 to 5 μm. If the thickness is less than 0.5 μm, sometimes Then the intensity is uneven. On the other hand, if the thickness exceeds 5 μm, not only the manufacturing cost increases, but also the hue of the polarizing plate may be affected depending on the type of the adhesive. If it is relatively thick in this range, for example, 3.5 μm or more, especially 4 μm or more, even if the thickness thereof is slightly changed, defects such as bubbles due to it are less likely to occur, but on the other hand, this is increased. Thickness is likely to result in an increase in cost, so it is desirable to reduce it to the extent possible. For these reasons, the preferred thickness of the adhesive is from 1 to 4 μm, and more preferably from 1.5 to 3.5 μm.

接著劑只要以液狀之可塗佈之狀態進行供給,則可使用先前以來偏光板之製造中所使用之各種者,但就耐候性、聚合性等觀點而言,較佳為含有陽離子聚合性之化合物、例如環氧化合物、更具體而言為如日本專利特開2004-245925號公報中記載之於分子內不具有芳香環之環氧化合物作為活性能量射線硬化性成分之一的活性能量射線硬化型接著劑。此種環氧化合物例如可為:對以雙酚A之二縮水甘油醚為代表例之芳香族環氧化合物之原料即芳香族多羥基化合物進行核氫化,並使其縮水甘油醚化而獲得之氫化環氧化合物;分子內具有至少1個鍵結於脂肪族環之環氧基之脂環式環氧化合物;以脂肪族多羥基化合物之縮水甘油醚為代表例之脂肪族環氧化合物等。又,於活性能量射線硬化型接著劑中,除以環氧化合物為代表例之陽離子聚合性化合物以外,通常可調配聚合起始劑,尤其是用於藉由活性能量射線之照射產生陽離子種或路易斯酸而使陽離子聚合性化合物之聚合開始的光陽離子聚合起始劑。進 而,亦可調配藉由加熱使聚合開始之熱陽離子聚合起始劑,以及光敏劑等各種添加劑。 The following may be used in the production of a polarizing plate as long as it is supplied in a liquid form, but it is preferable to contain cationic polymerizability from the viewpoints of weather resistance, polymerizability, and the like. The active energy ray of the compound, for example, an epoxy compound, more specifically, an epoxy compound having no aromatic ring in the molecule as described in Japanese Patent Laid-Open Publication No. 2004-245925, as one of active energy ray hardening components. Hardened adhesive. Such an epoxy compound can be obtained by subjecting an aromatic polyhydroxy compound which is a raw material of an aromatic epoxy compound represented by bisphenol G diglycidyl ether to hydrogenation, and glycidyl etherification. The hydrogenated epoxy compound; an alicyclic epoxy compound having at least one epoxy group bonded to an aliphatic ring in the molecule; an aliphatic epoxy compound represented by a glycidyl ether of an aliphatic polyhydroxy compound. Further, in the active energy ray-curable adhesive, in addition to the cationically polymerizable compound represented by an epoxy compound, a polymerization initiator may be usually blended, particularly for generating a cationic species by irradiation with an active energy ray or A photocationic polymerization initiator which starts polymerization of a cationically polymerizable compound by a Lewis acid. Enter Further, a thermal cationic polymerization initiator which starts polymerization by heating, and various additives such as a photosensitizer can be blended.

於偏光膜之兩面貼合光學膜之情形時,應用於各個光學膜之接著劑可相同亦可不同,但就生產性之觀點而言,於獲得適度之接著力之前提下,較佳為兩面均為相同之接著劑。 In the case where the optical film is bonded to both surfaces of the polarizing film, the adhesive applied to each of the optical films may be the same or different, but from the viewpoint of productivity, it is preferably provided before obtaining a moderate adhesive force, preferably two sides. All are the same adhesive.

[偏光板之製造方法] [Method of Manufacturing Polarizing Plate]

於本實施形態中,於以上說明之聚乙烯醇系樹脂製之偏光膜上經由接著劑貼合光學膜,而製造偏光板。此時,經過以下之(A)、(B)、(C)及(D)之各步驟。 In the present embodiment, a polarizing plate is produced by laminating an optical film on a polarizing film made of a polyvinyl alcohol-based resin described above via an adhesive. At this time, the following steps (A), (B), (C), and (D) are performed.

(A)塗佈步驟,使用具有接著劑之塗佈厚度控制機構之塗佈機,於光學膜之向偏光膜之貼合面塗佈接著劑;(B)測量步驟,利用將分光波長區域設為超過800 nm之範圍內之分光干涉法,於塗佈步驟前測量光學膜之厚度,並且於塗佈步驟後測量光學膜與所塗佈之接著劑之合計厚度,於線內由該等測量值之差之絕對值求出所塗佈之接著劑之厚度;(C)貼合步驟,於上述述塗步驟中塗佈且經過上述測量步驟之接著劑面重疊偏光膜並加壓;及(D)控制步驟,於上述測量步驟中所獲得之接著劑之測量厚度X與0.5~5 μm之範圍內設定之接著劑之設定厚度Y之差之絕對值相對於上述Y之比例為特定值以上時,對上述塗佈厚度控制機構進行控制。 (A) a coating step of applying an adhesive to a bonding surface of the optical film to the polarizing film using a coating machine having a coating thickness control mechanism of an adhesive; (B) a measuring step of setting a spectral wavelength region For the spectroscopic interference method in the range of more than 800 nm, the thickness of the optical film is measured before the coating step, and the total thickness of the optical film and the applied adhesive is measured after the coating step, and the measurement is performed in the line. The absolute value of the difference between the values is used to determine the thickness of the applied adhesive; (C) the bonding step, the adhesive film coated in the above-mentioned coating step and passing through the measuring step is superimposed on the polarizing film and pressurized; D) a control step in which the absolute value of the difference between the measured thickness X of the adhesive obtained in the above measuring step and the set thickness Y of the adhesive set in the range of 0.5 to 5 μm is a specific value or more with respect to the ratio of the above Y At this time, the above coating thickness control mechanism is controlled.

圖1係概略性地表示本發明中較佳地使用之製造裝置之 配置例之側視圖,圖2係表示本發明之各步驟間之關係之一例之方塊圖。以下,一邊參照該等圖,一邊對偏光板之製造方法進行詳細說明。 Figure 1 is a schematic view showing a manufacturing apparatus preferably used in the present invention. A side view of a configuration example, and Fig. 2 is a block diagram showing an example of the relationship between the steps of the present invention. Hereinafter, the method of manufacturing the polarizing plate will be described in detail with reference to the drawings.

圖1所示之製造裝置構成為一邊連續地搬送偏光膜1,一邊於其一面貼合第一光學膜2,且於另一面貼合第二光學膜3,而製造偏光板4,並捲取於捲取輥30上。如該圖所示,典型而言為於偏光膜1之兩面分別貼合有光學膜,但僅於偏光膜1之一面貼合光學膜之形態當然亦包含於本實施形態中。該情形之形態藉由自以下之說明中除去有關另一光學膜之說明便可容易地實施,此程度熟知本技藝者均可理解。 In the manufacturing apparatus shown in FIG. 1, the polarizing film 1 is continuously conveyed, the first optical film 2 is bonded to one surface, and the second optical film 3 is bonded to the other surface, and the polarizing plate 4 is manufactured and wound up. On the take-up roll 30. As shown in the figure, an optical film is usually bonded to both surfaces of the polarizing film 1, but the form in which the optical film is bonded only to one surface of the polarizing film 1 is of course included in the present embodiment. The form of this case can be easily carried out by removing the description relating to another optical film from the following description, to the extent that it is well understood by those skilled in the art.

關於第一光學膜2,首先,利用第一分光干涉式膜厚計14測量其厚度,繼而由第一塗佈機10於向偏光膜1貼合之面塗佈接著劑後,利用第二分光干涉式膜厚計15測量光學膜與所塗佈之接著劑之合計厚度,由藉由2個分光干涉式膜厚計14、15所得之測量值之差之絕對值求出所塗佈之接著劑之厚度。同樣,關於第二光學膜3,首先,利用第三分光干涉式膜厚計16測量其厚度,繼而由第二塗佈機12於向偏光膜1貼合之面塗佈接著劑後,利用第四分光干涉式膜厚計17測量光學膜與所塗佈之接著劑之合計厚度,由藉由2個分光干涉式膜厚計16、17所得之測量值之差之絕對值求出所塗佈之接著劑之厚度。 Regarding the first optical film 2, first, the thickness is measured by the first spectral interference type film thickness meter 14, and then the first coating machine 10 applies the second component after applying the adhesive to the surface to which the polarizing film 1 is bonded. The interferometric film thickness meter 15 measures the total thickness of the optical film and the applied adhesive, and determines the applied value from the absolute value of the difference between the measured values obtained by the two spectral interferometric film thickness gauges 14, 15. The thickness of the agent. Similarly, regarding the second optical film 3, first, the thickness is measured by the third spectral interference type film thickness meter 16, and then the second coating machine 12 applies the adhesive to the surface to which the polarizing film 1 is bonded, and then The quarter-light interference type film thickness meter 17 measures the total thickness of the optical film and the applied adhesive, and is determined by the absolute value of the difference between the measured values obtained by the two spectral interference type film thickness meters 16, 17. The thickness of the adhesive.

將測量接著劑塗佈前後之厚度之後的第一光學膜2及第二光學膜3各自之接著劑塗佈面重疊於偏光膜1之兩面,以 貼合用夾輥20、21夾持並於厚度方向上加壓,繼而接受來自活性能量射線照射裝置18之活性能量射線之照射,使接著劑硬化後,經過捲取前夾輥22、23,將所獲得之偏光板4捲取於捲取輥30上。 The adhesive coating surface of each of the first optical film 2 and the second optical film 3 after measuring the thickness before and after the application of the adhesive is superposed on both sides of the polarizing film 1 to The nip rollers 20 and 21 are sandwiched and pressed in the thickness direction, and then subjected to irradiation with active energy rays from the active energy ray irradiation device 18 to harden the adhesive, and then pass through the nip rollers 22 and 23 before winding. The obtained polarizing plate 4 is taken up on the take-up roll 30.

於第一塗佈機10及第二塗佈機12中,由各自設有之凹版輥11、13於第一及第二光學膜2、3上塗佈接著劑。於偏光膜1之一面、以及第一光學膜2及第二光學膜3各自之與塗佈接著劑之面相反側之面,適當設置有搬送用之導輥24。如上所述,僅於偏光膜1之一面貼合光學膜之情形時,僅使用圖1所示之第一光學膜2及第二光學膜3中之一者(例如第一光學膜2)即可。圖中之直線箭頭係指膜之流動方向,曲線箭頭係指輥之旋轉方向。 In the first coater 10 and the second coater 12, an adhesive is applied to the first and second optical films 2, 3 from the respective gravure rolls 11, 13. The guide roller 24 for conveyance is appropriately provided on one surface of the polarizing film 1 and the surface of the first optical film 2 and the second optical film 3 opposite to the surface on which the adhesive is applied. As described above, when only one surface of the polarizing film 1 is bonded to the optical film, only one of the first optical film 2 and the second optical film 3 (for example, the first optical film 2) shown in FIG. 1 is used. can. The straight arrow in the figure refers to the flow direction of the film, and the curved arrow refers to the direction of rotation of the roller.

偏光膜1多數情況下係於未圖示之偏光膜製造步驟中,使聚乙烯醇系樹脂膜經過單軸延伸、利用二色性色素之染色、及染色後之硼酸交聯處理而製造後,於該狀態下即未捲取於輥上之狀態下進行供給,當然,亦可將偏光膜製造步驟中所製造之偏光膜暫時捲取於輥上後,再由抽出機抽出。另一方面,第一光學膜2及第二光學膜3係分別自未圖示之輥藉由抽出機抽出。各膜係以相同之線速度例如10~50 m/分鐘左右之線速度以流動方向相同之方式被搬送。第一光學膜2及第二光學膜3係沿流動方向一邊施加例如50~1000 N/m左右之張力一邊被抽出。 The polarizing film 1 is usually produced in a polarizing film manufacturing step (not shown), and after the polyvinyl alcohol resin film is uniaxially stretched, dyed with a dichroic dye, and dyed with a boric acid cross-linking treatment, In this state, the supply is performed without being wound up on the roll. Of course, the polarizing film produced in the polarizing film production step may be temporarily wound up on the roll and then taken out by the extractor. On the other hand, the first optical film 2 and the second optical film 3 are respectively drawn out from a roll (not shown) by an extractor. Each film is conveyed at the same linear velocity, for example, at a linear velocity of about 10 to 50 m/min in the same flow direction. The first optical film 2 and the second optical film 3 are extracted while applying a tension of, for example, about 50 to 1000 N/m in the flow direction.

而且,利用第一塗佈機10及第二塗佈機12實施上述塗佈步驟(A),利用第一、第二分光干涉式膜厚計14、15及第 三、第四分光干涉式膜厚計16、17實施上述測量步驟(B),利用貼合用夾輥20、21實施上述貼合步驟(C),藉由將分光干涉式膜厚計14、15、16、17之測量結果返送至塗佈機10、12,而實施上述控制步驟(D)。塗佈機10、12所具有之凹版輥11、13為具有凹槽之輥,於該凹槽中預先填充有接著劑,並於該狀態下使光學膜2、3旋轉,藉此使接著劑轉印至光學膜2、3上。藉由調整該旋轉速度,可控制接著劑向光學膜2、3上之供給量、及塗佈厚度。於該情形時,凹版輥、尤其是凹版輥之旋轉速度之調整機構成為控制塗佈機10、12之塗佈厚度之機構(塗佈厚度控制機構或塗佈厚度之控制部)。 Further, the coating step (A) is carried out by the first coater 10 and the second coater 12, and the first and second spectral interference film thickness gauges 14, 15 and 3. The fourth spectral interference type film thickness gauges 16 and 17 perform the above-described measurement step (B), and the bonding step (C) is performed by the bonding nip rollers 20 and 21 by using the spectral interference type film thickness meter 14, The measurement results of 15, 16, and 17 are returned to the coaters 10 and 12, and the above control step (D) is carried out. The gravure rolls 11, 13 of the coaters 10, 12 are rolls having grooves in which the adhesive is pre-filled, and the optical films 2, 3 are rotated in this state, thereby making the adhesive Transfer to the optical films 2, 3. By adjusting the rotation speed, the amount of the adhesive applied to the optical films 2, 3 and the coating thickness can be controlled. In this case, the adjustment mechanism of the rotational speed of the gravure roll, particularly the gravure roll, serves as a mechanism for controlling the coating thickness of the coaters 10 and 12 (coating thickness control means or control portion for coating thickness).

基於圖2之方塊圖對該等各步驟之關係進行說明。首先,於設定(0)中,對於上述塗佈步驟(A)中塗佈之接著劑之厚度,預先於0.5~5 μm之範圍內對設定厚度Y進行設定。基於上述理由,設定厚度Y較佳為設定為1~4 μm,更佳為設定為1.5~3.5 μm。繼而,作為測量步驟(B)之前半步驟,利用分光干涉式膜厚計14、16預先測量光學膜2、3之厚度後,對控制塗佈機10、12之塗佈厚度之機構之初始條件進行設定,而進行塗佈步驟(A)。繼而,作為測量步驟(B)之後半步驟,利用分光干涉式膜厚計15、17,測量光學膜與所塗佈之接著劑之合計厚度,由前半步驟之測量值與後半步驟之測量值之差之絕對值求出所塗佈之接著劑之厚度,並作為測量厚度X加以輸出。不論該測量厚度X如何,塗佈有接著劑之光學膜2、3均於貼合步驟(C)中以各 自之接著劑塗佈面貼合於偏光膜1之兩面。另一方面,於控制步驟(D)中,將該測量厚度X與上述設定厚度Y進行對比。繼而,例如於測量厚度X與設定厚度Y之差之絕對值相對於設定厚度Y成為特定閾值以上、例如5%以上時,使塗佈機10、12之塗佈厚度控制機構運轉,以兩者之差之絕對值變小之方式、較佳為以測量厚度X與設定厚度Y之差之絕對值相對於設定厚度Y未達特定閾值、例如未達5%之方式控制塗佈厚度。此處,所謂測量厚度X與設定厚度Y之差之絕對值相對於設定厚度Y為5%以上係指滿足下式(I),於圖2中,表示為根據是否滿足該式而決定是否變更控制機構之條件。再者,本實施形態中之測量厚度X與設定厚度Y之對比方法不限定於圖2之說明中之上述方法。即,測量厚度X與設定厚度Y之對比既可不為基於測量厚度X與設定厚度Y之差者,亦可不為基於絕對值者。例如,可根據測量厚度X與設定厚度Y之差相對於設定厚度Y之比例是否為特定閾值以下或特定閾值以上、例如-5%以下或+5%以上而進行對比,亦可根據測量厚度X相對於設定厚度Y之比例是否為特定閾值以下或特定閾值以上、例如95%以下或105%以上而進行對比。上述閾值不限定於5%(或者-5%、95%等),可為更低之值、例如1%或3%,亦可為更高之值、例如7%或10%。又,上側之閾值與下側之閾值亦可採用不同之值(例如-3%以下或7%以上)。 The relationship between the steps will be described based on the block diagram of FIG. First, in the setting (0), the set thickness Y is set in advance in the range of 0.5 to 5 μm with respect to the thickness of the adhesive applied in the coating step (A). For the above reasons, the set thickness Y is preferably set to 1 to 4 μm, more preferably set to 1.5 to 3.5 μm. Then, as the first half of the measuring step (B), the initial conditions of the mechanism for controlling the coating thickness of the coaters 10 and 12 after the thicknesses of the optical films 2 and 3 are measured in advance by the spectral interference type film thickness gauges 14, 16 The setting is carried out, and the coating step (A) is carried out. Then, as the second half of the measuring step (B), the total thickness of the optical film and the applied adhesive is measured by the spectral interference type film thickness gauges 15, 17, from the measured values of the first half step and the measured values of the second half step. The absolute value of the difference is used to determine the thickness of the applied adhesive, and is output as the measured thickness X. Regardless of the measured thickness X, the optical films 2 and 3 coated with the adhesive are each in the bonding step (C). The adhesive coated surface is bonded to both sides of the polarizing film 1. On the other hand, in the control step (D), the measured thickness X is compared with the above-described set thickness Y. Then, for example, when the absolute value of the difference between the measured thickness X and the set thickness Y is equal to or greater than a predetermined threshold value, for example, 5% or more, the coating thickness control mechanisms of the coaters 10 and 12 are operated, Preferably, the absolute value of the difference is small, and the coating thickness is controlled such that the absolute value of the difference between the measured thickness X and the set thickness Y is less than a predetermined threshold value, for example, less than 5%. Here, the absolute value of the difference between the measured thickness X and the set thickness Y is 5% or more with respect to the set thickness Y, which means that the following formula (I) is satisfied, and in FIG. 2, it is indicated whether or not the change is made depending on whether or not the formula is satisfied. The conditions of the control agency. Further, the method of comparing the measured thickness X with the set thickness Y in the present embodiment is not limited to the above method in the description of Fig. 2 . That is, the comparison between the measured thickness X and the set thickness Y may not be based on the difference between the measured thickness X and the set thickness Y, or may not be based on the absolute value. For example, it may be compared according to whether the ratio of the difference between the measured thickness X and the set thickness Y to the set thickness Y is below a certain threshold or above a certain threshold, for example, -5% or less, or +5% or more, or may be based on the measured thickness X. The comparison is made with respect to whether the ratio of the set thickness Y is below a certain threshold or above a certain threshold, for example, 95% or less or 105% or more. The above threshold is not limited to 5% (or -5%, 95%, etc.), may be a lower value, such as 1% or 3%, and may be a higher value, such as 7% or 10%. Further, the upper threshold and the lower threshold may be different values (for example, -3% or less or 7% or more).

[數1] [Number 1]

以下,對構成本發明之方法之塗佈步驟(A)、測量步驟(B)、貼合步驟(C)及控制步驟(D)進行詳細說明。又,於使用活性能量射線硬化型接著劑之情形時,經過以上各步驟後,實施硬化步驟(E),因此亦對該步驟進行說明。 Hereinafter, the coating step (A), the measuring step (B), the bonding step (C), and the controlling step (D) constituting the method of the present invention will be described in detail. Further, in the case of using an active energy ray-curable adhesive, the hardening step (E) is carried out after the above respective steps, and therefore the step will be described.

(A)塗佈步驟 (A) Coating step

塗佈步驟(A)中,於經過測量步驟(B)之前半步驟(測量光學膜本身之厚度之步驟)之光學膜2、3之向偏光膜1之貼合面塗佈接著劑。此處使用之塗佈機只要具有對塗佈厚度進行控制之機構,則無特別限定,使用參照圖1加以說明之凹版輥11、13之方式具有代表性。於使用凹版輥之塗佈機中,例如有直接凹版塗佈機、封閉式刮刀塗佈機(chamber doctor coater)、間接凹版塗佈機、使用有凹版輥之吻塗機、包含複數根輥之反向輥塗機等。此外,可利用具有圓筒狀之刮刀且向塗佈部供給接著劑一邊以刮刀刮落一邊塗佈之點式塗佈機、應用狹縫模等直接供給接著劑之模嘴塗機、製作集液槽以刀一邊刮落剩餘之液體一邊塗佈之刀式塗佈機等各種塗佈機。其中,若考慮薄膜塗佈、跡線之自由度等,則於使用凹版輥之塗佈機中,較佳為直接凹版塗佈機、封閉式刮刀塗佈機、間接凹版塗佈機等,又,除凹版輥以外,亦較佳為使用狹縫模之模嘴塗機。就容易應對偏光板之寬幅化,及難以放出以液體供給之接著劑之臭氣之方面而言,進而較佳為封閉式刮刀塗佈機。 In the coating step (A), an adhesive is applied to the bonding surface of the optical films 2, 3 to the polarizing film 1 which is subjected to the first half of the measuring step (B) (the step of measuring the thickness of the optical film itself). The coater used herein is not particularly limited as long as it has a mechanism for controlling the coating thickness, and the gravure rolls 11 and 13 described with reference to Fig. 1 are typically used. In the coater using the gravure roll, there are, for example, a direct gravure coater, a chamber doctor coater, an indirect gravure coater, a kiss coater using a gravure roll, and a plurality of rolls. Reverse roll coater, etc. In addition, a dot coater that applies a cylindrical scraper and applies an adhesive to the coating section while scraping off the blade, and a die coater that directly supplies the adhesive by using a slit die or the like can be used. The liquid tank is a variety of coaters such as a knife coater coated with a knife while scraping off the remaining liquid. In consideration of the film coating, the degree of freedom of the trace, and the like, in the coater using the gravure roll, a direct gravure coater, a closed blade coater, an indirect gravure coater, etc. are preferable. In addition to the gravure roll, a die coater using a slit die is also preferred. It is easy to cope with the widening of the polarizing plate and the difficulty in releasing the odor of the adhesive supplied by the liquid, and further preferably a closed blade coater.

此處,封閉式刮刀塗佈機係指使凹版輥抵接於吸液有液狀塗料(接著劑)之封閉式刮刀,將封閉式刮刀中之塗料(接著劑)轉移至凹版輥之凹槽中,並將其轉印至作為被塗佈物之光學膜2、3上之方式的塗佈機。設計成小型者亦被稱為微型封閉式刮刀塗佈機。 Here, the closed blade coater refers to a closed blade that abuts a gravure roll against a liquid-absorbent liquid paint (adhesive), and transfers the paint (adhesive) in the closed blade to the groove of the gravure roll. And transferring it to the coating machine of the optical film 2, 3 which is a coating object. Designed to be small is also known as a micro-closed blade coater.

於使用凹版輥塗佈接著劑之情形時,接著劑層之厚度可藉由凹版輥之速度相對於線速度之比而調整。將光學膜2、3之線速度設為10~50 m/分鐘,使凹版輥相對於光學膜2、3之搬送方向進行逆向旋轉,並將凹版輥之旋轉圓周速度設為10~500 m/分鐘,藉此可調整接著劑之塗佈厚度為0.5~5 μm。此時之塗佈厚度由於亦受到凹版輥表面之空隙率影響,故而較佳為預先選擇具有適於設定厚度Y之表面之空隙率之凹版輥。再者,相對於光學膜2、3之搬送方向使凹版輥逆向旋轉之方式亦被稱為反向凹版。 In the case where the adhesive is applied using a gravure roll, the thickness of the adhesive layer can be adjusted by the ratio of the speed of the gravure roll to the linear velocity. The linear velocity of the optical films 2 and 3 is set to 10 to 50 m/min, and the gravure roll is reversely rotated with respect to the conveying direction of the optical films 2 and 3, and the circumferential speed of the gravure roll is set to 10 to 500 m/ In minutes, the coating thickness of the adhesive can be adjusted to 0.5 to 5 μm. Since the coating thickness at this time is also affected by the void ratio of the surface of the gravure roll, it is preferable to previously select a gravure roll having a void ratio suitable for setting the surface of the thickness Y. Further, the manner in which the gravure roll is reversely rotated with respect to the conveyance direction of the optical films 2, 3 is also referred to as a reverse gravure.

(B)測量步驟 (B) Measurement steps

於塗佈步驟(A)前實施之測量步驟(B)之前半步驟中,利用分光干涉法測量光學膜本身之厚度,於塗佈步驟(A)後實施之測量步驟(B)之後半步驟中利用分光干涉法測量光學膜與所塗佈之接著劑之合計厚度,由前半步驟之測定值與後半步驟之測定值之差之絕對值求出所塗佈之接著劑之厚度。此處所謂之分光干涉法係利用來自被測定物之正面之反射光與來自背面之反射光之干涉,求出膜厚之方式。 In the first half of the measuring step (B) performed before the coating step (A), the thickness of the optical film itself is measured by the spectroscopic interference method, and the half step after the measuring step (B) performed after the coating step (A) The total thickness of the optical film and the applied adhesive was measured by a spectroscopic interference method, and the thickness of the applied adhesive was determined from the absolute value of the difference between the measured value of the first half step and the measured value of the second half step. Here, the spectroscopic interference method is a method of obtaining a film thickness by using interference between reflected light from the front surface of the object to be measured and reflected light from the back surface.

即,若對塗佈接著劑前之光學膜本身照射光,則產生來自膜之正面之反射光、與來自膜之背面之反射光,該等2 種反射光若相位相同則彼此增強,若相位相反則彼此減弱,因此成為干涉光。將該干涉光於超過800 nm之範圍內所包含之波長區域(例如810~830 nm之波長區域)進行分光,並將所獲得之分光波形圖案進行傅立葉轉換,藉此獲得光學膜厚。於光學膜之膜厚本身為必要之情形時,藉由對其考慮光學膜之折射率(例如,藉由光學膜之光學膜厚除以光學膜之折射率)可求出該光學膜之膜厚。另一方面,若自塗佈有接著劑之光學膜之接著劑層側照射光,則仍產生來自接著劑層表面之反射光、與來自膜之背面之反射光,由該等產生與上述同樣之干涉光,因此藉由將其與上述同樣地進行分光,並進行傅立葉轉換,而獲得光學膜厚。於接著劑層與光學膜之合計膜厚本身為必要之情形時,必需考慮接著劑層與光學膜之積層體之平均折射率,但接著劑層之厚度為未知,因此其體積亦為未知,故而難以使用應時之平均折射率。 In other words, when the optical film itself before the application of the adhesive is irradiated with light, reflected light from the front surface of the film and reflected light from the back surface of the film are generated. The reflected lights are mutually enhanced if they have the same phase, and become weaker if they are opposite in phase. The interference light is split in a wavelength region (for example, a wavelength region of 810 to 830 nm) included in a range exceeding 800 nm, and the obtained spectral waveform pattern is subjected to Fourier transform, thereby obtaining an optical film thickness. When the film thickness of the optical film itself is necessary, the film of the optical film can be obtained by considering the refractive index of the optical film (for example, by dividing the optical film thickness of the optical film by the refractive index of the optical film) thick. On the other hand, when light is irradiated from the adhesive layer side of the optical film coated with the adhesive, the reflected light from the surface of the adhesive layer and the reflected light from the back surface of the film are generated, and the same is generated as described above. Since the interference light is split in the same manner as described above and subjected to Fourier transform, the optical film thickness is obtained. When the total thickness of the adhesive layer and the optical film itself is necessary, it is necessary to consider the average refractive index of the laminate of the adhesive layer and the optical film, but the thickness of the adhesive layer is unknown, so the volume is unknown. Therefore, it is difficult to use the average refractive index in time.

如上所述,本來不僅必需考慮接著劑之折射率,亦必需考慮光學膜之折射率,但本發明中,因由接著劑之塗佈前後之膜厚差求出接著劑之厚度即可,故事實上可忽略光學膜之折射率。即,於測量步驟(B)之前半步驟中,對於藉由對塗佈接著劑前之光學膜照射光而獲得之光學膜厚考慮接著劑之折射率,將所得之事實上可視為該光學膜替換為接著劑之狀態之膜厚(塗佈接著劑前之光學膜之視厚度)進行輸出,於測量步驟(B)之後半步驟中,亦對於藉由自塗佈有接著劑之光學膜之接著劑層側照射光而獲得之光學膜 厚考慮接著劑之折射率,將所得之事實上可視為該光學膜替換為接著劑之狀態(其上載有原本之接著劑之狀態)之膜厚(塗佈有接著劑之光學膜之視厚度)進行輸出,若如此則可求出作為兩者之差之絕對值的接著劑之厚度。再者,於兩者之差不為負之情形時,並非必需使用絕對值,亦可將兩者之單純之差作為接著劑之厚度而求出。又,接著劑之厚度亦可藉由於求出塗佈接著劑前之光學膜之光學厚度與塗佈有接著劑之光學膜之光學厚度之差之後,使該差除以接著劑之折射率而求出。 As described above, it is necessary to consider not only the refractive index of the adhesive but also the refractive index of the optical film. However, in the present invention, the thickness of the adhesive can be determined from the difference in film thickness before and after the application of the adhesive. The refractive index of the optical film can be ignored. That is, in the first half of the measuring step (B), the optical film thickness obtained by irradiating the optical film before the application of the adhesive agent is considered as the optical film in consideration of the refractive index of the adhesive. The film thickness in the state of the adhesive (the thickness of the optical film before the application of the adhesive) is output, and in the second half of the measuring step (B), the optical film is also coated with the adhesive. The optical film obtained by irradiating light on the side of the agent layer Thickness considers the refractive index of the adhesive, and the obtained thickness can be regarded as the film thickness of the state in which the optical film is replaced with the adhesive (the state in which the original adhesive is carried) (the thickness of the optical film coated with the adhesive) The output is performed, and if so, the thickness of the adhesive which is the absolute value of the difference between the two can be obtained. Furthermore, when the difference between the two is not negative, it is not necessary to use an absolute value, and the simple difference between the two may be obtained as the thickness of the adhesive. Further, the thickness of the adhesive may be obtained by dividing the difference between the optical thickness of the optical film before the application of the adhesive and the optical thickness of the optical film coated with the adhesive, by dividing the difference by the refractive index of the adhesive. Find out.

若利用以如上所述之分光干涉法為原理之膜厚計,則可不對所塗佈之接著劑之厚度產生影響,且可精度良好地求出作為塗佈步驟前之光學膜本身之厚度與塗佈步驟後之光學膜及接著劑之合計厚度之差的接著劑之厚度。又,由接著劑之塗佈前後之膜厚差求出接著劑之厚度之本實施形態之方法亦具有如下之優點:不論光學膜與接著劑之間有無折射率差,均可求出接著劑之厚度。 According to the film thickness meter based on the above-described spectroscopic interference method, the thickness of the applied film can be accurately determined without affecting the thickness of the applied adhesive, and the thickness of the optical film itself before the coating step can be accurately obtained. The thickness of the adhesive of the difference between the total thickness of the optical film and the adhesive after the coating step. Further, the method of the present embodiment in which the thickness of the adhesive is determined from the difference in film thickness before and after the application of the adhesive has the advantage that the adhesive can be obtained regardless of the difference in refractive index between the optical film and the adhesive. The thickness.

以如上所述之分光干涉法為原理之膜厚計可自市售品中選擇適當者。市售之分光干涉式膜厚計多數為於膜厚計中自動進行基於上述原理之一系列操作,將複數次之測定值、或特定時間內之測定值平均,並作為測量值加以輸出之形式者。關於本實施形態中所使用之分光干涉式膜厚計能夠測量之膜厚,就伴隨所使用之分光波長之限制而言,通常為10 μm以上。作為用於光照射之光源,較佳為具有超過800 nm之範圍內所包含之波長區域(例如810~830 nm 之波長區域)之光之光源,可使用SLD(Super Luminescent Diode,超輻射發光二極體)等。本實施形態中,較佳為選擇離線時使膜靜置之狀態下之厚度之分辨能力為1~10 nm之水準之膜厚計。 The film thickness meter based on the spectroscopic interference method as described above can be selected from commercially available products. Commercially available spectroscopic interferometric film thickness gauges are often used in a film thickness meter to automatically perform a series of operations based on the above principle, and average the measured values or the measured values in a specific time, and output them as measured values. By. The film thickness which can be measured by the spectral interference type film thickness meter used in the present embodiment is usually 10 μm or more depending on the limitation of the wavelength of the wavelength to be used. As a light source for light irradiation, it is preferable to have a wavelength region included in a range exceeding 800 nm (for example, 810 to 830 nm) In the light source of the wavelength region, an SLD (Super Luminescent Diode) or the like can be used. In the present embodiment, it is preferable to select a film thickness gauge having a resolution of a thickness of 1 to 10 nm in a state where the film is left standing while being off-line.

又,就厚度測量值之穩定性之觀點而言,本發明中使用之分光干涉式膜厚計較佳為能夠以0.00001~1秒、尤其是0.00001~0.5秒之測量間隔測量一次者,更佳為由所獲得之資料對於連續之10~100000點之測量值求出移動平均並能夠輸出者。例如,於移動平均之次數超過100000點、且測量間隔超過0.5秒之情形時,有時測量值與實際厚度之偏差會變大。基於同樣之理由,進而較佳為使用以0.0001~0.2秒之測量間隔進行一次之測量,由所獲得之資料對於連續之10~70000點之測量值輸出移動平均之膜厚計。 Further, from the viewpoint of the stability of the thickness measurement value, the spectral interference type film thickness meter used in the present invention is preferably one capable of measuring once at a measurement interval of 0.00001 to 1 second, particularly 0.00001 to 0.5 second, more preferably From the obtained data, the moving average is obtained for the continuous measurement value of 10 to 100,000 points and can be output. For example, when the number of moving averages exceeds 100,000 points and the measurement interval exceeds 0.5 seconds, the deviation between the measured value and the actual thickness may become large. For the same reason, it is further preferred to use a measurement at a measurement interval of 0.0001 to 0.2 second, and the obtained data is output to a moving average film thickness meter for a continuous measurement value of 10 to 70,000 points.

為提高接著劑之厚度之測量精度,測量塗佈步驟前之光學膜本身之厚度之分光干涉式膜厚計之設置位置、與測量塗佈步驟後之光學膜與接著劑之合計厚度之分光干涉式膜厚計之設置位置較佳為關於光學膜之寬度方向為一致。又,基於同樣之理由,較佳為關於光學膜之長度方向(搬送方向)使厚度測量點一致。進而,基於同樣之理由,2個分光干涉式膜厚計之設置間隔較佳為沿光學膜之長度方向設為10 m以內,更佳為設為1~5 m。 In order to improve the measurement accuracy of the thickness of the adhesive, the position of the spectroscopic interferometer film thickness measuring the thickness of the optical film itself before the coating step, and the spectroscopic interference of the total thickness of the optical film and the adhesive after the coating step are measured. The arrangement position of the film thickness meter is preferably uniform with respect to the width direction of the optical film. Moreover, for the same reason, it is preferable to make the thickness measurement points coincide with respect to the longitudinal direction (transport direction) of an optical film. Further, for the same reason, the interval between the two spectral interference type film thickness gauges is preferably 10 m or less in the longitudinal direction of the optical film, and more preferably 1 to 5 m.

於以如上所述之分光干涉法為原理之膜厚計中,有時自光源(例如SLD等)發出之光為偏光,而且該偏光之程度根據各膜厚計而不同,或者該偏光為複數種之混合波。於此 種情形時、尤其是於光學膜具有300 nm以上之面內相位差值之情形時,即便測量同一光學膜,亦有時會產生0.5 μm以上之測量值之差異。於本實施形態中,如上所述,於測量步驟(B)之前半步驟中測定光學膜本身之厚度,於測量步驟(B)之後半步驟中測量光學膜與塗佈於其上之接著劑之合計厚度時,藉由使自該等於前半步驟與後半步驟中所使用之膜厚計之光源發出之偏光之振動方向(於複數之偏光之混合波之情形時為最強之偏光之振動方向)一致,有時可於某種程度上抑制基於如上所述之偏光之測量誤差。又,尤其於光學膜具有300 nm以上之面內相位差值之情形時,較佳為於分光干涉式膜厚計與光學膜之間設置近紅外偏光濾波器。於設置近紅外偏光濾波器之情形時,通常該近紅外偏光濾波器之透射軸或吸收軸以相對於光學膜之長度方向(為搬送方向,通常為快軸或慢軸)成45度之角度之方式進行配置。若以自膜厚計之光源發出之偏光之振動方向(於複數之偏光之混合波之情形時為最強之偏光之振動方向)與近紅外偏光濾波器之透射軸重疊之方式進行配置,則可提高用於膜厚測量之反射干涉光之光量。 In the film thickness meter based on the spectroscopic interference method as described above, light emitted from a light source (for example, SLD or the like) may be polarized, and the degree of the polarized light may be different depending on the thickness of each film, or the polarized light may be plural. Mixed wave of species. herein In some cases, especially when the optical film has an in-plane retardation value of 300 nm or more, even if the same optical film is measured, a difference of measured values of 0.5 μm or more may occur. In the present embodiment, as described above, the thickness of the optical film itself is measured in the first half of the measuring step (B), and the optical film and the adhesive applied thereto are measured in the second half of the measuring step (B). When the total thickness is equal, the direction of vibration of the polarized light emitted from the light source equal to the film thickness meter used in the first half step and the second half step is the same as the vibration direction of the strongest polarized light in the case of a mixed wave of a plurality of polarized lights. The measurement error based on the polarization described above can sometimes be suppressed to some extent. Further, in particular, when the optical film has an in-plane retardation value of 300 nm or more, it is preferable to provide a near-infrared polarizing filter between the spectral interference type film thickness meter and the optical film. When the near-infrared polarizing filter is disposed, the transmission axis or the absorption axis of the near-infrared polarizing filter is usually at an angle of 45 degrees with respect to the length direction of the optical film (for the transport direction, usually the fast axis or the slow axis). The way to configure. If the direction of the polarized light emitted from the light source of the film thickness (the direction of the strongest polarized light in the case of a complex wave of a plurality of polarized lights) is overlapped with the transmission axis of the near-infrared polarizing filter, Increase the amount of reflected interference light used for film thickness measurement.

(C)貼合步驟 (C) lamination step

經過以上之塗佈步驟(A)及測量步驟(B)後,實施於光學膜2、3之各個接著劑塗佈面重疊偏光膜1並加壓之貼合步驟(C)。該步驟之加壓可使用公知之方法,但就可一邊連續搬送一邊加壓之觀點而言,較佳為如圖1所示利用一對夾輥20、21進行夾持之方式。於該情形時,於偏光膜1重 疊光學膜2、3之時序、與利用一對夾輥20、21對光學膜2、3相對於偏光膜1進行加壓之時序較理想為相同,即便不同,兩者之時序之差亦以較短為宜。一對夾輥20、21之組合可為金屬輥/金屬輥、金屬輥/橡膠輥、橡膠輥/橡膠輥等中之任一種。加壓時之壓力以利用一對夾輥20、21夾持之情形時之線壓計較佳為設為150~500 N/cm左右。 After the coating step (A) and the measuring step (B) described above, the bonding step (C) in which the polarizing film 1 is superposed on each of the adhesive coating surfaces of the optical films 2 and 3 and pressurized is applied. A known method can be used for the pressurization in this step. However, from the viewpoint of pressurization while continuously transporting, it is preferable to hold the pair of nip rolls 20 and 21 as shown in Fig. 1 . In this case, the polarizing film 1 is heavy The timing of stacking the optical films 2, 3 and the timing of pressurizing the optical films 2, 3 with respect to the polarizing film 1 by the pair of nip rolls 20, 21 are preferably the same, and even if they are different, the difference between the timings of the two is Shorter is appropriate. The combination of the pair of nip rolls 20, 21 may be any one of a metal roll/metal roll, a metal roll/rubber roll, a rubber roll/rubber roll, and the like. The line pressure gauge when the pressure at the time of pressurization is sandwiched by the pair of nip rolls 20, 21 is preferably set to about 150 to 500 N/cm.

(D)控制步驟 (D) Control steps

本實施形態中,設有基於以上說明之測量步驟(B)之結果,對塗佈步驟(A)中之接著劑之塗佈厚度進行控制之控制步驟(D)。即,於塗佈步驟(A)中所塗佈之接著劑之厚度有時根據接著劑之溫度或周圍環境溫度、或者光學膜2、3之表面張力或對其施加之張力等而有若干變動,存在伴有自所期望之塗佈厚度(設定厚度Y)之偏差之情形。為修正上述塗佈厚度之偏差,以測量步驟(B)中利用分光干涉法測量之塗佈厚度(測量厚度X)為基礎,對塗佈機所具有之塗佈厚度控制機構進行控制。具體而言,於測量厚度X大於設定厚度Y時,以減小塗佈厚度之方式對塗佈厚度控制機構進行控制,於測量厚度X小於設定厚度Y時,以增大塗佈厚度之方式對塗佈厚度控制機構進行控制。 In the present embodiment, a control step (D) for controlling the coating thickness of the adhesive in the coating step (A) is provided based on the result of the measurement step (B) described above. That is, the thickness of the adhesive applied in the coating step (A) may vary depending on the temperature of the adhesive or the ambient temperature, or the surface tension of the optical films 2, 3 or the tension applied thereto. There is a case where there is a deviation from the desired coating thickness (set thickness Y). In order to correct the deviation of the above coating thickness, the coating thickness control mechanism of the coater is controlled based on the coating thickness (measured thickness X) measured by the spectroscopic interference method in the measuring step (B). Specifically, when the measured thickness X is larger than the set thickness Y, the coating thickness control mechanism is controlled to reduce the coating thickness, and when the measured thickness X is smaller than the set thickness Y, the coating thickness is increased. The coating thickness control mechanism controls.

例如,若塗佈機為模嘴塗機,則於測量厚度X大於設定厚度Y時,降低自泵等向模嘴送液之能力,相反於測量厚度X小於設定厚度Y時,提高向模嘴送液之能力,藉此可控制塗佈厚度。又,若塗佈機為使用凹版輥之封閉式刮刀塗佈機,則於測量厚度X大於設定厚度Y時,藉由增大反 向凹版之轉速,提高旋轉圓周速度,而減少接著劑之轉印量,相反於測量厚度X小於設定厚度Y時,藉由減小反向凹版之轉速,降低旋轉圓周速度,而增加接著劑之轉印量,藉此可控制塗佈厚度。膜厚控制之程度可於實驗上根據當時之環境因素、接著劑之黏度、光學膜之表面形狀等而任意地設定。基於測量厚度X及設定厚度Y之實際之塗佈厚度控制機構之控制可使用電腦而進行,亦可手動進行。 For example, if the coating machine is a die coater, when the measured thickness X is larger than the set thickness Y, the ability to feed the liquid from the pump or the like is reduced, and when the measured thickness X is smaller than the set thickness Y, the mold is increased. The ability to deliver liquid, whereby the coating thickness can be controlled. Moreover, if the coater is a closed blade coater using a gravure roll, when the measured thickness X is larger than the set thickness Y, by increasing the inverse To the rotational speed of the intaglio plate, the rotational speed of the rotation is increased, and the transfer amount of the adhesive is reduced. Conversely, when the measured thickness X is smaller than the set thickness Y, the rotational speed is reduced by reducing the rotational speed of the reverse gravure, and the adhesive is increased. The amount of transfer, whereby the coating thickness can be controlled. The degree of film thickness control can be arbitrarily set experimentally based on the environmental factors at the time, the viscosity of the adhesive, the surface shape of the optical film, and the like. The control of the actual coating thickness control mechanism based on the measured thickness X and the set thickness Y can be performed using a computer or manually.

(E)硬化步驟 (E) hardening step

如上所述,於偏光膜1上貼合光學膜2、3後,若接著劑為活性能量射線硬化型,則經過藉由活性能量射線之照射使該接著劑硬化之硬化步驟(E)而製造偏光板4。於圖1所示之例中,該硬化步驟(E)藉由自活性能量射線照射裝置18對偏光膜1上貼合有光學膜2、3之積層體照射活性能量射線而實施。於該步驟中,使活性能量射線硬化型接著劑硬化所需之能量越過光學膜2進行照射。具體而言,作為活性能量射線,使用電子束或紫外線,且可根據接著劑之硬化反應機制而選擇。關於電子束照射裝置,因以產生之電子束不洩露至外部之方式進行遮蔽之必要性,故裝置之尺寸或重量增大。另一方面,由於紫外線照射裝置具有相對小型之構造,故而可較佳地使用利用紫外線照射進行之硬化。 As described above, after the optical films 2 and 3 are bonded to the polarizing film 1, when the adhesive is an active energy ray-curable type, the adhesive is cured by the hardening step (E) of curing the adhesive by irradiation of active energy rays. Polarizing plate 4. In the example shown in FIG. 1, the hardening step (E) is performed by irradiating the laminated body of the optical films 2 and 3 on the polarizing film 1 with the active energy ray by the active energy ray irradiation device 18. In this step, the energy required to harden the active energy ray-curable adhesive is irradiated over the optical film 2. Specifically, as the active energy ray, an electron beam or an ultraviolet ray is used, and it can be selected according to the hardening reaction mechanism of the adhesive. Regarding the electron beam irradiation device, since the generated electron beam is not shielded from the outside, the size or weight of the device is increased. On the other hand, since the ultraviolet irradiation device has a relatively small structure, it is preferable to use hardening by ultraviolet irradiation.

於圖1所示之例中,活性能量射線對偏光膜1與光學膜2、3經由接著劑貼合而成之積層體之照射係於位於照射裝 置18前後之貼合用夾輥20、21與捲取前夾輥22、23之間,於對積層體施加張力之狀態下進行。不限於此,較佳為例如日本專利特開2009-134190號公報中所揭示之於由沿搬送方向形成為圓弧狀之凸曲面、典型而言為輥之外周面支持之狀態下照射活性能量射線。尤其於藉由活性能量射線之照射產生熱而有可能對製品產生不良影響時,較佳為如後者般於積層體由輥之外周面支持之狀態下對其照射活性能量射線,於該情形時,支持積層體之輥較佳為可於10~60℃左右之範圍內調節溫度。又,活性能量射線照射裝置可於照射部位僅設置1個,亦可沿積層體之流動方向設置2個以上,設為自複數光源進行照射亦於有效提高累積光量方面較為有效。 In the example shown in FIG. 1 , the irradiation of the active energy ray to the laminate of the polarizing film 1 and the optical films 2 and 3 via the adhesive is applied to the irradiation device. The nip rollers 20 and 21 for bonding before and after the 18 are placed between the nip rollers 22 and 23 before the winding, and tension is applied to the laminated body. The present invention is not limited to this, and it is preferable to irradiate the active energy in a state in which a convex curved surface formed in an arc shape along the conveying direction, typically a peripheral surface of the roller, is supported, as disclosed in Japanese Laid-Open Patent Publication No. 2009-134190. Rays. In particular, when heat is generated by irradiation of active energy rays, which may adversely affect the product, it is preferred that the laminate is irradiated with active energy rays in a state where the laminate is supported by the outer peripheral surface of the roller as in the latter case, in which case Preferably, the roller supporting the laminate is capable of adjusting the temperature within a range of about 10 to 60 °C. Further, the active energy ray irradiation device may be provided in only one irradiation site or two or more in the flow direction of the laminate, and it is effective to increase the amount of accumulated light by irradiation from the complex light source.

於照射紫外線使接著劑硬化之情形時,所使用之紫外線光源並無特別限定,可使用於波長400 nm以下具有發光分佈之例如低壓水銀燈、中壓水銀燈、高壓水銀燈、超高壓水銀燈、化學燈、黑光燈、微波激發水銀燈、金屬鹵化物燈等。使用以環氧化合物為活性能量射線硬化性成分之接著劑之情形時,若考慮通常之聚合起始劑顯示之吸收波長,則較佳地使用具有大量400 nm以下之光之高壓水銀燈或金屬鹵化物燈作為紫外線光源。 When the ultraviolet ray is used to cure the adhesive, the ultraviolet light source to be used is not particularly limited, and can be used for, for example, a low-pressure mercury lamp, a medium-pressure mercury lamp, a high-pressure mercury lamp, an ultra-high pressure mercury lamp, a chemical lamp having a light-emitting distribution at a wavelength of 400 nm or less. Black light, microwave excited mercury lamp, metal halide lamp, etc. When an epoxy compound is used as an adhesive for an active energy ray-curable component, a high-pressure mercury lamp or metal halide having a large amount of light of 400 nm or less is preferably used in consideration of an absorption wavelength exhibited by a usual polymerization initiator. The object light acts as an ultraviolet light source.

對以環氧化合物為硬化性成分之接著劑照射紫外線使其硬化時,積層體之線速度並無特別限定,通常幾乎原樣地維持塗佈步驟(A)、貼合步驟(C)中之線速度。又,較佳為一邊對積層體之長度方向(搬送方向)施加100~1000 N/m之 張力,一邊使對聚合起始劑之活化有效之波長區域之照射量以累積光量(對積層體照射之總能量)計成為100~1500 mJ/cm2。若對接著劑之累積光量過少,則活性能量射線硬化型接著劑之硬化反應不足,難以表現出充分之接著強度,另一方面,若該累積光量過大,則藉由自光源輻射之熱及接著劑聚合時產生之熱,有可能引起活性能量射線硬化型接著劑之黃變或偏光膜之劣化。 When the ultraviolet ray is cured by irradiating ultraviolet rays with an adhesive having an epoxy compound as a curable component, the linear velocity of the laminate is not particularly limited, and the line in the coating step (A) and the bonding step (C) is usually maintained almost as it is. speed. In addition, it is preferable to apply an amount of light to the wavelength region in which the activation of the polymerization initiator is effective by applying a tension of 100 to 1000 N/m to the longitudinal direction (transport direction) of the laminate (the irradiation of the laminate) The total energy) is calculated to be 100 to 1500 mJ/cm 2 . When the amount of accumulated light to the adhesive is too small, the hardening reaction of the active energy ray-curable adhesive is insufficient, and it is difficult to exhibit sufficient adhesive strength. On the other hand, if the accumulated light amount is too large, the heat radiated from the light source and then The heat generated during the polymerization of the agent may cause yellowing of the active energy ray-curable adhesive or deterioration of the polarizing film.

又,若欲以1次之紫外線照射達到所需之累積光量,則亦有時藉由放熱使膜達到超過150℃之高溫,於該情形時,有可能引起偏光膜之劣化等。就避免上述事態之方面而言,亦如上所述沿膜之搬送方向設置複數個紫外線照射裝置,分成複數次進行照射較為有效。 In addition, if the desired amount of accumulated light is to be irradiated with ultraviolet rays once, the film may be heated to a temperature higher than 150 ° C by heat, and in this case, deterioration of the polarizing film may occur. In order to avoid the above-described state of affairs, it is also effective to provide a plurality of ultraviolet irradiation devices in the direction in which the film is transported as described above, and to perform irradiation in plural times.

有時作為目標較佳為將來自1處之紫外線照射裝置之照射量以累積光量計設為600 mJ/cm2以下,且最終獲得上述之100~1500 mJ/cm2之累積光量。 In some cases, it is preferable to set the irradiation amount of the ultraviolet irradiation device from one place to 600 mJ/cm 2 or less in terms of the cumulative light amount, and finally obtain the cumulative light amount of 100 to 1500 mJ/cm 2 described above.

以上述方式製造之偏光板可將接著劑之厚度控制於設定之範圍內,構成偏光板之膜間之接著強度之偏差較小,接著劑層中之氣泡缺陷等亦較少,作為製品之品質穩定性亦優異。 The polarizing plate manufactured in the above manner can control the thickness of the adhesive within a set range, and the variation in the bonding strength between the films constituting the polarizing plate is small, and the bubble defects in the adhesive layer are also small, and the quality of the product is small. The stability is also excellent.

[實施例] [Examples]

以下示出實施例及比較例,進一步對本發明進行具體說明,但本發明不受該等例之限定。再者,以下示出之實驗為用於確認本發明之效果而進行者,例如附注下述情形:關於在隔著偏光膜而與測定厚度之接著劑為相反側塗佈之 接著劑之厚度設定為較實際操作中所採用之最佳值厚,以使其不產生缺陷。 The invention is further illustrated by the following examples and comparative examples, but the invention is not limited by the examples. In addition, the experiment shown below is carried out for confirming the effect of this invention, for example, the following is the case where it apply|coated on the opposite side with the adhesive agent of thickness measurement with the polarizing film. The thickness of the subsequent agent is set to be thicker than the optimum value used in the actual operation so that it does not cause defects.

圖3係概略地表示以下之實施例及比較例中使用之裝置之配置之側視圖。圖3所示之配置與以上說明之圖1相比,僅以下2點不同,對不同點以外之部位附上與圖1相同之符號,因此該等部位之詳細說明請參照圖1之說明。 Fig. 3 is a side view schematically showing the arrangement of the apparatus used in the following examples and comparative examples. The arrangement shown in FIG. 3 differs from FIG. 1 described above in only the following two points, and the same reference numerals are attached to the parts other than the different points. Therefore, the detailed description of the parts will be described with reference to FIG.

圖3相對於圖1之不同點:(1)對偏光膜1之兩面分別貼合第一光學膜2及第二光學膜3後之積層體照射活性能量射線(紫外線)時,一邊使該積層體之第二光學膜3側密接於照射用捲附輥26之外周面,一邊自隔著該積層體而配置於捲附輥26之相反側之活性能量射線(紫外線)照射裝置18對積層體之第一光學膜2側照射紫外線;及(2)由於一共僅有1式(2台)分光干涉式膜厚計,故而以分光干涉式膜厚計14、15測量塗佈於第一光學膜2之接著劑之厚度,而不測量塗佈於第二光學膜3之接著劑之厚度。 3 is different from FIG. 1 : (1) When the laminated body after bonding the first optical film 2 and the second optical film 3 to both surfaces of the polarizing film 1 is irradiated with active energy rays (ultraviolet rays), the layer is laminated. The second optical film 3 side of the body is in close contact with the outer peripheral surface of the coating roll 26, and the active energy ray (ultraviolet) irradiation device 18 is disposed on the opposite side of the winding roller 26 from the laminated body. The first optical film 2 side is irradiated with ultraviolet rays; and (2) since only one type (two sets) of the spectral interference type film thickness meter is used, the measurement is applied to the first optical film by the spectral interference type film thickness gauges 14, 15 The thickness of the adhesive of 2 is not measured by the thickness of the adhesive applied to the second optical film 3.

又,作為分光干涉式膜厚計14、15,使用有Keyence股份有限公司製之分光干涉式膜厚計「SI-F80」。該分光干涉式膜厚計為利用以上說明之分光干涉法測定膜厚者,光源為SLD,其分光波長區域為810~830 nm,分辨能力為1 nm。繼而,每隔預先設定之測量間隔測量被測定物之膜厚,每到同樣預先設定之測量次數將上述中所測量之個別之膜厚值進行移動平均,將其間之平均膜厚輸出,且自動地排除預先設定之次數之測量值中判定為異常值之資料, 並輸出平均膜厚。 Further, as the spectral interference type film thickness gauges 14 and 15, a spectral interference type film thickness meter "SI-F80" manufactured by Keyence Co., Ltd. was used. The spectroscopic interference type film thickness meter is a film thickness measured by the spectroscopic interference method described above, and the light source is an SLD having a spectral wavelength region of 810 to 830 nm and a resolution of 1 nm. Then, the film thickness of the object to be measured is measured every predetermined measurement interval, and the individual film thickness values measured in the above are moved and averaged every similar measurement times, and the average film thickness is outputted therebetween, and automatically Excluding data that is determined to be an abnormal value among the measured values of the preset number of times, And output the average film thickness.

[實施例1] [Example 1]

(0)實驗中使用之材料 (0) Materials used in the experiment

於該例中,作為第一光學膜2,使用厚度40 μm、寬度1330 mm且自輥供給之三乙醯纖維素製之雙軸配向性相位差膜「KC4FR-1」[自Konica Minolta Opto股份有限公司獲得],作為第二光學膜3,使用厚度80 μm、寬度1330 mm且自輥供給之三乙醯纖維素膜「KC8UX2MW」[自Konica Minolta Opto股份有限公司獲得,折射率為1.48]。用於偏光膜1與第一光學膜2之接著之接著劑、及用於偏光膜1與第二光學膜3之接著之接著劑均為含有環氧化合物與光聚合起始劑,且實質上不含溶劑之環氧系光硬化型接著劑。 In this example, as the first optical film 2, a biaxial aligning retardation film "KC4FR-1" made of triethyl fluorene cellulose having a thickness of 40 μm and a width of 1330 mm is supplied from a roll [from Konica Minolta Opto The company obtained] as the second optical film 3, a triacetonitrile cellulose film "KC8UX2MW" (available from Konica Minolta Opto Co., Ltd., having a refractive index of 1.48) having a thickness of 80 μm and a width of 1330 mm and supplied from a roll. The adhesive for the polarizing film 1 and the first optical film 2, and the adhesive for the polarizing film 1 and the second optical film 3 are both an epoxy compound and a photopolymerization initiator, and substantially A solvent-free epoxy-based photocurable adhesive.

(A)塗佈步驟 (A) Coating step

將聚乙烯醇上吸附配向有碘之厚度25 μm之偏光膜1、作為第一光學膜2之上述相位差膜、及作為第二光學膜3之上述三乙醯纖維素膜,分別以15 m/分鐘之線速度且以流動方向相同之方式進行供給。於經過後述之測量步驟(B)之前半步驟(測量光學膜本身之厚度之步驟)之相位差膜2之向偏光膜1貼合之面,使用具備凹版輥11之第一塗佈機10[富士機械股份有限公司製之「微型封閉式刮刀」]塗佈上述環氧系光硬化型接著劑。又,於三乙醯纖維素薄膜3之向偏光膜1貼合之面,亦使用具備凹版輥13之第二塗佈機12[同樣為富士機械股份有限公司製之「微型封閉式刮刀」]塗佈上述環氧系光硬化型接著劑。 The polarizing film 1 having a thickness of 25 μm having iodine adsorbed on the polyvinyl alcohol, the retardation film as the first optical film 2, and the above-mentioned triacetyl cellulose film as the second optical film 3 were respectively 15 m. The line speed of /min is supplied in the same manner as the flow direction. The first coater 10 having the gravure roll 11 is used for the surface of the retardation film 2 which is subjected to the first half of the measuring step (B) (the step of measuring the thickness of the optical film itself) to be applied to the polarizing film 1 [ "Micro-closed doctor blade" manufactured by Fuji Machinery Co., Ltd.] is coated with the epoxy-based photocurable adhesive. Further, a second coater 12 having a gravure roll 13 is also used on the surface of the triacetonitrile cellulose film 3 to be bonded to the polarizing film 1, [the same is a "micro-closed blade" manufactured by Fuji Machinery Co., Ltd.] The above epoxy-based photocurable adhesive is applied.

使設置於塗佈機10、12之凹版輥11、13相對於膜之搬送方向進行逆向旋轉。繼而,於三乙醯纖維素膜3側之第二塗佈機12中設定為其所具備之凹版輥13之旋轉圓周速度為15 m/分鐘,且於膜上以約4.5 μm之厚度塗佈接著劑。其係由於未測量以第二塗佈機12所塗佈之接著劑之厚度,從而亦未進行其膜厚控制,故而以幾乎不會出現缺陷之厚度塗佈接著劑。另一方面,於相位差膜2側,第一塗佈機10所具備之凹版輥11之旋轉圓周速度之初始設定為21 m/分鐘,且以約2.6 μm之厚度塗佈接著劑。 The gravure rolls 11 and 13 provided in the coaters 10 and 12 are rotated in the reverse direction with respect to the conveyance direction of the film. Then, the second coater 12 on the side of the triacetone cellulose film 3 was set to have a gravure roll 13 having a rotational peripheral speed of 15 m/min and coated on the film at a thickness of about 4.5 μm. Follow-up agent. Since the thickness of the adhesive applied by the second coater 12 is not measured, and thus the film thickness control is not performed, the adhesive is applied in a thickness where almost no defects occur. On the other hand, on the side of the retardation film 2, the circumferential speed of the rotation of the gravure roll 11 provided in the first coater 10 was initially set to 21 m/min, and the adhesive was applied at a thickness of about 2.6 μm.

(B)測量步驟 (B) Measurement steps

於第一塗佈機10之上游側配置第一分光干涉式膜厚計14,於第一塗佈機10之下游側配置第二分光干涉式膜厚計15,兩塗佈機之沿膜流動方向之間隔為1.67 m。而且,設定為利用第一分光干涉式膜厚計14以0.0002秒之間隔測量相位差膜2之厚度,對[{(22)2}2]2=216=65536次之連續之測量值(約13.1秒鐘)之每一個依序輸出移動平均值(前半步驟)。又,設定為經過上述塗佈步驟後,藉由所配置之第二分光干涉式膜厚計15,自相位差膜2之接著劑塗佈面側仍以0.0002秒之間隔測量相位差膜2與接著劑之合計厚度,對65536次之連續之測量值(約13.1秒鐘)之每一個依序輸出移動平均值(後半步驟之一)。因此,開始之後,經過獲得65536次份之測量值之約13.1秒後,每0.0002秒自第一分光干涉式膜厚計14輸出相位差膜2之厚度之移動平均值,且設定為自第二分光干涉式膜厚計15輸出相位差膜2 與接著劑之合計厚度之移動平均值,且分別以每秒將值抽出,該時間點之前者之值(設相位差膜2之厚度之測量值=A)與後者之值(設相位差膜2與接著劑之合計厚度之測量值=B)之差(B-A)作為測量厚度X依序被記錄(後半步驟之二)。之後,設置後述之控制步驟(D),一邊對上述測量厚度X進行控制一邊進行約150分鐘之操作,求出其間獲得之測量厚度X(資料數為約150分鐘×60個/分鐘,為約9000個)之平均值及標準偏差,結果示於表1。 The first spectral interference type film thickness meter 14 is disposed on the upstream side of the first coater 10, and the second spectral interference type film thickness meter 15 is disposed on the downstream side of the first coater 10, and the flow of the two coaters along the film The spacing between the directions is 1.67 m. Further, it is set to measure the thickness of the retardation film 2 at intervals of 0.0002 second by the first spectral interference type film thickness meter 14, and the continuous measurement value of [{(2 2 ) 2 } 2 ] 2 = 2 16 = 65536 times. Each of the (about 13.1 seconds) outputs a moving average (first half of the steps). Further, after the coating step is performed, the retardation film 2 is measured at intervals of 0.0002 seconds from the adhesive-coated surface side of the retardation film 2 by the second spectral interference type film thickness meter 15 disposed. The total thickness of the subsequent agents was sequentially output as a moving average (one of the latter half steps) for each of 65536 consecutive measurements (about 13.1 seconds). Therefore, after the start, after about 13.1 seconds of obtaining the measurement of 65,536 times, the moving average of the thickness of the retardation film 2 is output from the first spectral interferometric film thickness gauge 14 every 0.0002 seconds, and is set to be the second. The spectral interferometric film thickness meter 15 outputs a moving average of the total thickness of the retardation film 2 and the adhesive, and extracts the value in each second, respectively, and the value before the time point (the measured value of the thickness of the retardation film 2) =A) The difference (BA) from the value of the latter (the measured value of the total thickness of the retardation film 2 and the adhesive = B) is recorded as the measured thickness X in sequence (second in the second half). Thereafter, a control step (D) to be described later is provided, and while the measurement thickness X is controlled, the operation is performed for about 150 minutes, and the measured thickness X obtained therebetween is obtained (the number of data is about 150 minutes × 60 cells/minute, which is about The average value and standard deviation of 9000) are shown in Table 1.

(C)貼合步驟 (C) lamination step

對塗佈有接著劑之相位差膜2及三乙醯纖維素膜3,將各自之接著劑塗佈面與偏光膜1重疊,利用貼合用夾輥20、21將該等以240 N/cm之線壓進行夾持。通過夾輥20、21後之相位差膜2/偏光膜1/三乙醯纖維素膜3之積層體係以其三乙醯纖維素膜3側密接於設定為20℃之照射用捲附輥26之外周面之方式進行如下搬送,即,沿長軸方向施加600 N/m之張力,以與貼合前相同之線速度15 m/分鐘一邊對其相位差膜2側照射來自紫外線照射裝置18之紫外線一邊進行搬送。紫外線照射裝置18為GS Yuasa股份有限公司製,自2盞其所具備之紫外線燈「EHAN1700NAL高壓水銀燈」照射紫外線。關於紫外線之累積光量,2盞燈合計為330 mJ/cm2。如此使接著劑層硬化,製作於偏光膜1之單面貼合有相位差膜2、於另一面貼合有三乙醯纖維素膜3之偏光板4,並捲取於捲取輥30上。 The retardation film 2 and the triacetyl cellulose film 3 to which the adhesive is applied are superposed on each of the adhesive application surfaces and the polarizing film 1, and the bonding nip rollers 20 and 21 are used as 240 N/. The line pressure of cm is clamped. The laminated system of the retardation film 2 / the polarizing film 1 / triacetyl cellulose film 3 after the nip rolls 20 and 21 is adhered to the side of the triethylene cellulose film 3 to the irradiation roll 26 set at 20 ° C. The outer peripheral surface was conveyed by applying a tension of 600 N/m in the longitudinal direction, and irradiating the retardation film 2 side from the ultraviolet irradiation device 18 at the same linear velocity of 15 m/min as before the bonding. The ultraviolet light is transported. The ultraviolet irradiation device 18 is manufactured by GS Yuasa Co., Ltd., and is irradiated with ultraviolet rays from the ultraviolet light "EHAN1700NAL high pressure mercury lamp" which is provided in the factory. Regarding the cumulative amount of ultraviolet light, the total of 2 lamps is 330 mJ/cm 2 . In this manner, the adhesive layer is cured, and the polarizing plate 4 on which the retardation film 2 is bonded to the other surface of the polarizing film 1 and the triacetyl cellulose film 3 is bonded to the other surface is wound up on the winding roller 30.

(D)控制步驟 (D) Control steps

於控制步驟中,上述測量步驟中所求出之測量厚度X與設定厚度Y=2.6 μm相比相差5%以上之情形時,即,|X-Y|0.13 μm之情形時,一邊將設置於第一塗佈機10之凹版輥11之旋轉圓周速度以0.5 m/分鐘為單位進行增減速,一邊將接著劑之塗佈厚度控制為接近設定厚度Y。 In the control step, when the measured thickness X obtained in the above measuring step differs from the set thickness Y=2.6 μm by more than 5%, that is, |XY| In the case of 0.13 μm, the coating circumferential thickness of the gravure roll 11 provided in the first coater 10 is increased and decreased in units of 0.5 m/min, and the coating thickness of the adhesive is controlled to be close to the set thickness Y.

[比較例1] [Comparative Example 1]

實施例1中,不設置控制步驟(D),即,即便測量步驟(B)中所獲得之測量厚度X發生變化,亦不改變第一塗佈機10所具備之凹版輥11之旋轉速度,而製造積層體,繼而同樣進行紫外線照射而製作偏光板。將進行約150分鐘之操作時之測量厚度X之平均值及標準偏差示於表1。 In the first embodiment, the control step (D) is not provided, that is, even if the measured thickness X obtained in the measuring step (B) is changed, the rotation speed of the gravure roll 11 provided in the first coater 10 is not changed, Then, a laminate was produced, and then ultraviolet irradiation was performed to prepare a polarizing plate. The average value and standard deviation of the measured thickness X when the operation was performed for about 150 minutes are shown in Table 1.

[比較例2] [Comparative Example 2]

實施例1中,嘗試不設置第一分光干涉式膜厚計14,且作為第二分光干涉式膜厚計15設置大塚電子股份有限供公司製之分光波長區域為230~800 nm之反射分光膜厚計「FE-2900CCD」,於測量步驟(B)中,利用該反射分光膜厚計直接測量接著劑之塗佈厚度,除此以外,與實施例1同樣地製作偏光板。然而,由於作為第一光學膜2使用之三乙醯纖維素製之相位差膜之折射率(1.48)與接著劑之折射率(1.49)接近,故而無法測量接著劑之厚度,因此無法控制接著劑之塗佈厚度。 In the first embodiment, it is attempted that the first spectral interference type film thickness meter 14 is not provided, and as the second spectral interference type film thickness meter 15, a reflection light-splitting film having a wavelength range of 230 to 800 nm manufactured by Otsuka Electronics Co., Ltd. is provided. In the measurement step (B), a polarizing plate was produced in the same manner as in Example 1 except that the coating thickness of the adhesive was directly measured by the reflection spectroscopic film thickness meter. However, since the refractive index (1.48) of the retardation film made of triacetyl cellulose used as the first optical film 2 is close to the refractive index (1.49) of the adhesive, the thickness of the adhesive cannot be measured, and thus it is impossible to control the subsequent The coating thickness of the agent.

[實施例2] [Embodiment 2]

實施例1中,代替三乙醯纖維素製之雙軸配向性相位差膜「KC4FR-1」,而使用厚度38 μm、寬度1330 mm之雙軸 延伸聚對苯二甲酸乙二酯膜[自三菱樹脂股份有限公司獲得,面內相位差值為1000 nm]作為第一光學膜2,除此以外,與實施例1同樣地製作偏光板。將進行約150分鐘之操作時之測量厚度X之平均值及標準偏差示於表1。 In the first embodiment, a biaxially oriented retardation film "KC4FR-1" made of triacetyl cellulose was used, and a double shaft having a thickness of 38 μm and a width of 1330 mm was used. A polarizing plate was produced in the same manner as in Example 1 except that the polyethylene terephthalate film (the in-plane retardation value of 1000 nm was obtained from Mitsubishi Plastics Co., Ltd.) was used as the first optical film 2. The average value and standard deviation of the measured thickness X when the operation was performed for about 150 minutes are shown in Table 1.

[實施例3] [Example 3]

實施例2中,對於分光干涉式膜厚計14及15,分別於分光干涉式膜厚計與雙軸延伸聚對苯二甲酸乙二酯膜之間,以偏光濾波器之吸收軸成為相對於雙軸延伸聚對苯二甲酸乙二酯膜之流動方向而向右旋轉45度之方向之方式設置偏光濾波器[Edmund Optics公司製,自Edmund Optics Japan股份有限公司獲得之近紅外偏光濾波器,功能波長區域為750~800 nm],除此以外,與實施例2同樣地製造積層體,繼而同樣進行紫外線照射,製作偏光板。將進行約150分鐘之操作時之測量厚度X之平均值及標準偏差示於表1。 In the second embodiment, for the spectral interference type film thickness gauges 14 and 15, respectively, between the spectral interference type film thickness meter and the biaxially oriented polyethylene terephthalate film, the absorption axis of the polarization filter is relative to A polarizing filter is provided in such a manner that the flow direction of the biaxially-oriented polyethylene terephthalate film is rotated by 45 degrees to the right [Ndmund Optics Co., Ltd., a near-infrared polarizing filter obtained from Edmund Optics Japan Co., Ltd., A laminate was produced in the same manner as in Example 2 except that the functional wavelength region was 750 to 800 nm. Then, ultraviolet irradiation was performed in the same manner to prepare a polarizing plate. The average value and standard deviation of the measured thickness X when the operation was performed for about 150 minutes are shown in Table 1.

[比較例3] [Comparative Example 3]

實施例3中,不設置控制步驟(D),即,即便測量步驟(B)中所獲得之測量厚度X發生變化,亦不改變第一塗佈機10所具備之凹版輥11之旋轉速度,而製造積層體,繼而同樣進行紫外線照射,製作偏光板。將進行約150分鐘之操作時之測量厚度X之平均值及標準偏差示於表1。 In the third embodiment, the control step (D) is not provided, that is, even if the measured thickness X obtained in the measuring step (B) is changed, the rotation speed of the gravure roll 11 provided in the first coater 10 is not changed, A laminate was produced, and then ultraviolet irradiation was performed in the same manner to prepare a polarizing plate. The average value and standard deviation of the measured thickness X when the operation was performed for about 150 minutes are shown in Table 1.

[偏光板之缺陷評價試驗] [Polarization evaluation test of polarizing plate]

上述實施例及比較例中,以1330 mm之寬度所獲得之偏光板中,將兩端各除去40 mm寬度部分之中央之1250 mm寬度部分作為有效寬度,對於該有效寬度內跨及流動方向 3300 mm長度之面(1.25 m×3.3 m≒4 m2),以目視觀察將亮點之部位進行標記,進而對該標記部位以放大倍率100倍之放大鏡觀察並確認是否為氣泡,若為氣泡,則按照以下之要領求出其大小。即,若觀察到之氣泡為近似橢圓形(包含圓),則將最長徑設為氣泡之大小,若氣泡為線狀,則將其線長設為氣泡之大小。繼而,計數大小為100 μm以上之氣泡之數,於該數為每1 m2少於0.3個之情形時,即,觀察之4 m2面積中為0個或1個之情形時設為「OK」,於該數為每1 m2為0.3個以上之情形時,即,觀察之4 m2面積中為2個以上之情形時設為「NG」,將結果與主要之變量一併匯總於表1。表中,位於光學膜欄之「TAC」係指三乙醯纖維素,「PET」係指聚對苯二甲酸乙二酯。再者,關於以放大鏡觀察到之100 μm以上之大小之氣泡,以使該氣泡進入之方式將膜切成40 mm×40 mm之尺寸,並以顯微鏡進行觀察,結果確認為均位於夾於偏光膜1與第一光學膜2之間之接著劑層中。 In the above embodiments and comparative examples, in the polarizing plate obtained by the width of 1330 mm, the 1250 mm width portion at the center of each of the 40 mm width portions is taken as the effective width, and the effective width span and the flow direction are 3300. The surface of the mm length (1.25 m × 3.3 m ≒ 4 m 2 ), the portion of the bright spot is marked by visual observation, and the marked portion is observed with a magnifying glass having a magnification of 100 times to confirm whether it is a bubble, and if it is a bubble, Find the size according to the following methods. That is, if the observed bubble is approximately elliptical (including a circle), the longest diameter is set to the size of the bubble, and if the bubble is linear, the line length is set to the size of the bubble. Then, the number of bubbles having a size of 100 μm or more is counted when the number is less than 0.3 per 1 m 2 , that is, when 0 or 1 of the observed 4 m 2 area is set, "OK", when the number is 0.3 or more per 1 m 2 , that is, when the observed 4 m 2 area is two or more, it is set to "NG", and the result is summarized together with the main variable. In Table 1. In the table, "TAC" in the optical film column refers to triacetyl cellulose, and "PET" refers to polyethylene terephthalate. Further, regarding the bubble of a size of 100 μm or more observed by a magnifying glass, the film was cut into a size of 40 mm × 40 mm in such a manner that the bubble entered, and observed by a microscope, and it was confirmed that both were sandwiched by polarized light. In the adhesive layer between the film 1 and the first optical film 2.

註)OK:大小為100 μm以上之氣泡之數為每1 m2少於0.3個。 NG:大小為100 μm以上之氣泡之數量為每1 m2為0.3個以上。 Note) OK: The number of bubbles having a size of 100 μm or more is less than 0.3 per 1 m 2 . NG: The number of bubbles having a size of 100 μm or more is 0.3 or more per 1 m 2 .

如表1所示,可知未設置控制步驟(D)之比較例1及3中,接著劑之測量厚度發生變動,伴隨於此,於所獲得之偏光板觀察到氣泡缺陷,與此相對,設置有控制步驟(D)且於接著劑之測量厚度X與設定厚度Y相比相差5%以上時改變塗佈厚度之實施例1及2中,與設定厚度Y相比,測量厚度被抑制為大致5%以內之變動,氣泡缺陷亦較少。進而,於分光干涉式膜厚計與光學膜2之間設置有特定之偏光濾波器之實施例3中,進一步接近設定厚度,亦可抑制其變動。另一方面,若如比較例2般使用分光波長區域為800 nm以下之相對較寬之範圍之反射分光膜厚計,則於幾乎無接著劑之折射率與光學膜之折射率之差之情形時,無法測量接著劑之塗佈厚度。 As shown in Table 1, in Comparative Examples 1 and 3 in which the control step (D) was not provided, the measured thickness of the adhesive was changed, and as a result, a bubble defect was observed in the obtained polarizing plate, and the bubble defect was set. In the first and second embodiments in which the coating thickness is changed when the measured thickness (X) of the adhesive is changed by 5% or more compared with the set thickness Y, the measured thickness is suppressed to be substantially smaller than the set thickness Y. Within 5% of the change, there are fewer bubble defects. Further, in the third embodiment in which a specific polarization filter is provided between the spectral interference type film thickness meter and the optical film 2, the thickness is further increased and the fluctuation can be suppressed. On the other hand, when the reflection spectroscopic film thickness meter having a relatively wide range of the spectral wavelength region of 800 nm or less is used as in Comparative Example 2, the difference between the refractive index of the adhesive agent and the refractive index of the optical film is hard. When it is not possible to measure the coating thickness of the adhesive.

1‧‧‧偏光膜 1‧‧‧ polarizing film

2‧‧‧第一光學膜 2‧‧‧First optical film

3‧‧‧第二光學膜 3‧‧‧Second optical film

4‧‧‧偏光板 4‧‧‧Polar plate

10‧‧‧第一塗佈機 10‧‧‧First coater

11‧‧‧凹版輥 11‧‧‧ gravure roll

12‧‧‧第二塗佈機 12‧‧‧Second coating machine

13‧‧‧凹版輥 13‧‧‧ gravure roll

14‧‧‧第一分光干涉式膜厚計 14‧‧‧First Spectroscopic Interferometric Film Thickness Gauge

15‧‧‧第二分光干涉式膜厚計 15‧‧‧Second Spectral Interferometer Thickness Gauge

16‧‧‧第三分光干涉式膜厚計 16‧‧‧ Third Spectral Interferometer Thickness Gauge

17‧‧‧第四分光干涉式膜厚計 17‧‧‧Fourth optical interferometric film thickness meter

18‧‧‧活性能量射線(紫外線)照射裝置 18‧‧‧Active energy ray (ultraviolet) irradiation device

20、21‧‧‧貼合用夾輥 20, 21‧‧‧ nip rollers for lamination

22、23‧‧‧捲取前夾輥 22, 23‧‧‧ Rolling front nip rollers

24‧‧‧導輥 24‧‧‧guide roller

26‧‧‧照射用捲附輥 26‧‧‧Feed roll for irradiation

30‧‧‧捲取輥 30‧‧‧Winding roller

圖1係表示本發明中較佳地使用之製造裝置之配置例之概略側視圖。 Fig. 1 is a schematic side view showing an arrangement example of a manufacturing apparatus preferably used in the present invention.

圖2係表示本發明之各步驟間之關係之一例之方塊圖。 Fig. 2 is a block diagram showing an example of the relationship between the steps of the present invention.

圖3係表示實施例中使用之製造裝置之配置之概略側視圖。 Fig. 3 is a schematic side view showing the configuration of a manufacturing apparatus used in the embodiment.

1‧‧‧偏光膜 1‧‧‧ polarizing film

2‧‧‧第一光學膜 2‧‧‧First optical film

3‧‧‧第二光學膜 3‧‧‧Second optical film

4‧‧‧偏光板 4‧‧‧Polar plate

10‧‧‧第一塗佈機 10‧‧‧First coater

11‧‧‧凹版輥 11‧‧‧ gravure roll

12‧‧‧第二塗佈機 12‧‧‧Second coating machine

13‧‧‧凹版輥 13‧‧‧ gravure roll

14‧‧‧第一分光干涉式膜厚計 14‧‧‧First Spectroscopic Interferometric Film Thickness Gauge

15‧‧‧第二分光干涉式膜厚計 15‧‧‧Second Spectral Interferometer Thickness Gauge

16‧‧‧第三分光干涉式膜厚計 16‧‧‧ Third Spectral Interferometer Thickness Gauge

17‧‧‧第四分光干涉式膜厚計 17‧‧‧Fourth optical interferometric film thickness meter

18‧‧‧活性能量射線(紫外線)照射裝置 18‧‧‧Active energy ray (ultraviolet) irradiation device

20、21‧‧‧貼合用夾輥 20, 21‧‧‧ nip rollers for lamination

22、23‧‧‧捲取前夾輥 22, 23‧‧‧ Rolling front nip rollers

24‧‧‧導輥 24‧‧‧guide roller

Claims (3)

一種偏光板之製造方法,其係製造偏光板者,且包括以下之步驟:(A)使用具有接著劑之塗佈厚度之控制部之塗佈機,於熱塑性樹脂製之光學膜上塗佈上述接著劑;(B)使用分光干涉式膜厚計,於分光干涉式膜厚計與光學膜之間設置有近紅外偏光濾波器之狀態,利用將分光波長區域設定於超過800nm之範圍內之分光干涉法,測量塗佈上述接著劑之前之上述光學膜之光學厚度與塗佈有上述接著劑之光學膜之光學厚度,基於塗佈上述接著劑之前之光學膜之光學厚度與塗佈有上述接著劑之光學膜之光學厚度之差求出所塗佈之上述接著劑之厚度;(C)於經過上述測量之上述光學膜之接著劑塗佈面,重疊聚乙烯醇系樹脂製之偏光膜,將上述光學膜相對於上述偏光膜進行加壓,使上述偏光膜與上述光學膜經由上述接著劑而貼合;及(D)基於在0.5~5μm之範圍內設定之上述接著劑之設定厚度Y與上述接著劑之所求出之厚度X,對上述控制部進行控制。 A method for producing a polarizing plate, which comprises the steps of: (A) applying a coating machine having a coating thickness of an adhesive to a film made of a thermoplastic resin; (B) using a spectroscopic interference type film thickness meter, a state in which a near-infrared polarizing filter is provided between the spectral interference type film thickness meter and the optical film, and a spectral range in which the spectral wavelength region is set to be more than 800 nm is used. An interferometry method for measuring an optical thickness of the optical film before applying the adhesive and an optical thickness of an optical film coated with the adhesive, based on an optical thickness of the optical film before applying the adhesive, and coating the above The difference in optical thickness of the optical film of the agent is determined as the thickness of the applied adhesive; (C) the polarizing film made of a polyvinyl alcohol-based resin is superposed on the adhesive-coated surface of the optical film subjected to the above measurement, The optical film is pressed against the polarizing film to bond the polarizing film and the optical film via the adhesive; and (D) is set based on the range of 0.5 to 5 μm. The control portion is controlled by the set thickness Y of the agent and the thickness X obtained by the above-mentioned adhesive. 如請求項1之方法,其中於上述接著劑之所求出之厚度X與上述接著劑之設定厚度Y之差之絕對值相對於上述接著劑之設定厚度Y之比例為特定值以上時,對上述控制部進行控制。 The method of claim 1, wherein when the ratio of the absolute value of the difference between the thickness X obtained by the adhesive agent and the set thickness Y of the adhesive agent to the set thickness Y of the adhesive is a specific value or more, The control unit performs control. 如請求項1之方法,其中於上述接著劑之所求出之厚度X 與上述接著劑之設定厚度Y之差之絕對值相對於上述接著劑之設定厚度Y之比例為5%以上時,對上述控制部進行控制。 The method of claim 1, wherein the thickness X obtained by the above adhesive is The control unit is controlled when the ratio of the absolute value of the difference between the set thickness Y of the adhesive agent to the set thickness Y of the adhesive is 5% or more.
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Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2013051553A1 (en) * 2011-10-07 2013-04-11 住友化学株式会社 Method for manufacturing polarizer
CN107027324B (en) 2014-07-10 2019-08-02 住友化学株式会社 Polarization plates
JP6659217B2 (en) 2014-12-04 2020-03-04 住友化学株式会社 Manufacturing method of polarizing plate
JP6964965B2 (en) * 2016-04-20 2021-11-10 日東電工株式会社 A polarizing plate, a method for manufacturing the same, and an image display device using the polarizing plate.
WO2018003425A1 (en) * 2016-06-30 2018-01-04 東京エレクトロン株式会社 Optical film forming method, computer storage medium and optical film forming device
KR102344905B1 (en) 2016-06-30 2021-12-28 도쿄엘렉트론가부시키가이샤 Coating processing apparatus, coating processing method, and computer storage medium
JP6306675B1 (en) 2016-11-28 2018-04-04 住友化学株式会社 Method for producing polarizing laminated film with protective film and method for producing polarizing plate
JP7219137B2 (en) * 2019-03-28 2023-02-07 日東電工株式会社 Method for manufacturing polarizing film
JP7311291B2 (en) * 2019-03-28 2023-07-19 日東電工株式会社 Method for manufacturing polarizing film
JP7315357B2 (en) * 2019-03-28 2023-07-26 日東電工株式会社 Method for manufacturing polarizing film

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63227331A (en) * 1987-03-17 1988-09-21 新日本製鐵株式会社 Manufacture of weldable laminated metallic plate
US5853801A (en) * 1995-09-04 1998-12-29 Fuji Photo Film Co., Ltd. Process for the preparation of continuous optical compensatory sheet
JP4243952B2 (en) * 2002-12-26 2009-03-25 新日本石油株式会社 Optical element manufacturing method
JP2004286446A (en) * 2003-03-19 2004-10-14 Nippon Petrochemicals Co Ltd Manufacturing method of optical element
JP2005010760A (en) * 2003-05-26 2005-01-13 Nitto Denko Corp Adhesive for polarizing plate, polarizing plate and its manufacturing method, optical film, and image display device
WO2005033754A1 (en) * 2003-09-30 2005-04-14 Nitto Denko Corporation Process for manufacturing polarizing plate, polarizing plate, optical film and image display
JP4902983B2 (en) * 2005-11-01 2012-03-21 ボイス ペ−パ− パテント ゲ−エムベ−ハ− Coating apparatus and coating method
JP2007169797A (en) * 2005-12-19 2007-07-05 Mitsubishi Heavy Ind Ltd Apparatus for producing coated sheet and method for producing the same
JP2009075192A (en) * 2007-09-19 2009-04-09 Jsr Corp Method for manufacturing polarizing plate
JP4861968B2 (en) * 2007-11-30 2012-01-25 住友化学株式会社 Manufacturing method of polarizing plate
TWI541569B (en) * 2008-03-31 2016-07-11 住友化學股份有限公司 Apparatus and method for manufacturing polarizing plate
JP5098060B2 (en) * 2008-10-27 2012-12-12 フジコピアン株式会社 Photocurable adhesive composition and polarizing plate using the same
JP5521607B2 (en) * 2009-03-13 2014-06-18 株式会社リコー Film thickness measuring method, film thickness measuring apparatus, image forming apparatus having the film thickness measuring apparatus, photoconductive photoreceptor manufacturing method, and photoconductive photoreceptor

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