TWI526699B - Led lighting device and carrier thereof - Google Patents

Led lighting device and carrier thereof Download PDF

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Publication number
TWI526699B
TWI526699B TW103104033A TW103104033A TWI526699B TW I526699 B TWI526699 B TW I526699B TW 103104033 A TW103104033 A TW 103104033A TW 103104033 A TW103104033 A TW 103104033A TW I526699 B TWI526699 B TW I526699B
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led
crystal region
solid crystal
electrically connected
substrate
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TW103104033A
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TW201531718A (en
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黃建中
吳志明
陳逸勳
鄭宇翔
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弘凱光電(深圳)有限公司
弘凱光電股份有限公司
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LED發光裝置及其承載座 LED lighting device and its carrier

本發明是有關一種發光裝置,且特別是有關於一種LED發光裝置及其承載座。 The present invention relates to a light-emitting device, and more particularly to an LED light-emitting device and a carrier thereof.

近幾年來,發光二極體(LED)的應用已逐漸廣泛,且隨著技術領域的不斷提升,目前已研發出高照明輝度的高功率發光二極體,其足以取代傳統的照明光源。 In recent years, the application of light-emitting diodes (LEDs) has gradually become widespread, and with the continuous improvement of the technical field, high-power light-emitting diodes with high illumination brightness have been developed, which are sufficient to replace the traditional illumination sources.

然而,由於習用LED發光裝置的構造設計,在其LED晶片與電子元件安裝上電路層之後,就只能同時檢測LED晶片與電子元件,在此檢測結果出現缺失時,將無法確實分辨缺失是由LED晶片或電子元件所造成。 However, due to the structural design of the conventional LED light-emitting device, after the circuit layer is mounted on the LED chip and the electronic component, the LED chip and the electronic component can only be detected at the same time. When the detection result is missing, the defect cannot be reliably determined. LED wafer or electronic components.

於是,本發明人有感上述缺失之可改善,乃特潛心研究並配合學理之運用,終於提出一種設計合理且有效改善上述缺失之本發明。 Therefore, the present inventors have felt that the above-mentioned deficiencies can be improved, and they have devoted themselves to research and cooperated with the application of the theory, and finally proposed a present invention which is reasonable in design and effective in improving the above-mentioned defects.

本發明之目的在於提供一種LED發光裝置及其承載座,其能單獨地檢測安裝在電路層上之LED晶片。 It is an object of the present invention to provide an LED lighting device and a carrier thereof that can individually detect an LED chip mounted on a circuit layer.

本發明提供一種LED發光裝置,包括:一基板;一電路層,其設於該基板,該電路層包含有一LED固晶區與一電子元件固晶 區,且該LED固晶區與該電子元件固晶區彼此電性連接;一LED晶片,其裝設於該LED固晶區,以電性連接於該電路層;一LED驅動元件,其裝設於該電子元件固晶區,以電性連接於該電路層;兩LED測試墊,其電性連接於該LED固晶區,且該兩LED測試墊能供一檢測電流流通該LED固晶區,以單獨地檢測該LED固晶區上的LED晶片;以及兩電極,其電性連接於該電子元件固晶區,且該兩電極能供另一檢測電流流通該LED固晶區與該電子元件固晶區,以同時檢測該LED固晶區上的LED晶片與該電子元件固晶區上的LED驅動元件,並且該兩電極能用以電性連接於一外部驅動電源,使該外部驅動電源所提供之電力經由該電路層與該LED驅動元件而令該LED晶片發光。 The invention provides an LED light-emitting device, comprising: a substrate; a circuit layer disposed on the substrate, the circuit layer comprising an LED solid crystal region and an electronic component solid crystal And the LED solid crystal region is electrically connected to the electronic component solid crystal region; an LED chip is mounted on the LED solid crystal region to be electrically connected to the circuit layer; an LED driving component is mounted The LED component is electrically connected to the circuit layer; the two LED test pads are electrically connected to the LED solid crystal region, and the two LED test pads can supply a detection current to the LED solid crystal. a region for separately detecting an LED chip on the LED solid crystal region; and two electrodes electrically connected to the electronic component die bonding region, and the two electrodes are capable of supplying another detection current to the LED solid crystal region and the An electronic component solid crystal region for simultaneously detecting an LED chip on the LED solid crystal region and an LED driving component on the solid crystal region of the electronic component, and the two electrodes can be electrically connected to an external driving power source to make the external portion The power provided by the driving power source causes the LED chip to emit light via the circuit layer and the LED driving element.

本發明又提供一種LED發光裝置的承載座,包括:一基板;一電路層,其設於該基板,該電路層包含有一LED固晶區與一電子元件固晶區,且該LED固晶區與該電子元件固晶區彼此電性連接;兩LED測試墊,其電性連接於該LED固晶區,且該兩LED測試墊能供一檢測電流僅流通該LED固晶區;以及兩電極,其電性連接於該電子元件固晶區,且該兩電極能供另一檢測電流流通該LED固晶區與該電子元件固晶區。 The present invention further provides a carrier for an LED lighting device, comprising: a substrate; a circuit layer disposed on the substrate, the circuit layer comprising an LED solid crystal region and an electronic component solid crystal region, and the LED solid crystal region And the electronic component solid crystal regions are electrically connected to each other; two LED test pads electrically connected to the LED solid crystal region, and the two LED test pads can supply a detection current only to flow the LED solid crystal region; and two electrodes The two electrodes are electrically connected to the die bonding region of the electronic component, and the two electrodes are capable of supplying another detecting current to the LED solid crystal region and the electronic component die bonding region.

綜上所述,本發明所提供的LED發光裝置及其承載座,其透過形成有LED測試墊,以供檢測電流流通LED固晶區,進而單獨地檢測LED固晶區上的LED晶片。也就是說,在LED晶片與電子元件安裝上電路層之後,能更清楚地分辨缺失是由LED晶片或是電子元件所造成。 In summary, the LED light-emitting device and the carrier thereof provided by the present invention are formed with an LED test pad for detecting current flowing through the LED solid crystal region, thereby separately detecting the LED chip on the LED solid crystal region. That is to say, after the circuit layer is mounted on the LED chip and the electronic component, it can be more clearly distinguished that the defect is caused by the LED chip or the electronic component.

為能更進一步瞭解本發明之特徵及技術內容,請參閱以下有關本發明的詳細說明與附圖,然而所附圖式僅提供參考與說明用,並非用來對本發明的權利範圍作任何的限制。 For a better understanding of the features and technical aspects of the present invention, reference should be made to the accompanying drawings .

100‧‧‧LED發光裝置 100‧‧‧LED lighting device

10‧‧‧承載座 10‧‧‧Hosting

1‧‧‧基板 1‧‧‧Substrate

11‧‧‧正面 11‧‧‧ positive

12‧‧‧背面 12‧‧‧ Back

2‧‧‧電路層 2‧‧‧ circuit layer

21‧‧‧LED固晶區 21‧‧‧LED solid crystal area

22‧‧‧電子元件固晶區 22‧‧‧Electrical component solid crystal region

3‧‧‧LED測試墊 3‧‧‧LED test pad

4‧‧‧輔助測試墊 4‧‧‧Auxiliary test pad

5‧‧‧電極 5‧‧‧Electrode

6‧‧‧輔助電極 6‧‧‧Auxiliary electrode

7‧‧‧連接墊 7‧‧‧Connecting mat

20‧‧‧LED晶片 20‧‧‧LED chip

30‧‧‧電子元件 30‧‧‧Electronic components

301‧‧‧LED驅動元件 301‧‧‧LED drive components

302‧‧‧整流元件 302‧‧‧Rectifying components

303‧‧‧功率元件 303‧‧‧Power components

40‧‧‧阻隔牆 40‧‧‧Barrier wall

50‧‧‧封裝體 50‧‧‧Package

200‧‧‧檢測設備 200‧‧‧Testing equipment

300‧‧‧外部驅動電源 300‧‧‧External drive power

400‧‧‧功能散熱板 400‧‧‧ functional heat sink

I‧‧‧檢測電流 I‧‧‧Detection current

I’‧‧‧另一檢測電流 I’‧‧‧ another detection current

圖1為本發明LED發光裝置的立體示意圖。 1 is a schematic perspective view of an LED lighting device of the present invention.

圖2為圖1的分解示意圖。 Figure 2 is an exploded perspective view of Figure 1.

圖3為圖1另一視角的分解示意圖。 3 is an exploded perspective view of another perspective of FIG. 1.

圖4為本發明透過LED測試墊而使檢測電流僅流通LED固晶區的示意圖。 FIG. 4 is a schematic diagram of the present invention for passing the LED test pad so that the detection current flows only through the LED solid crystal region.

圖5為本發明透過電極而使另一檢測電流流通LED固晶區的示意圖。 FIG. 5 is a schematic view showing another embodiment of detecting a current flowing through an LED solid crystal region through an electrode according to the present invention.

圖6為本發明LED發光裝置之電極連接外部驅動電源之示意圖。 Fig. 6 is a schematic view showing the connection of an external driving power source to the electrodes of the LED lighting device of the present invention.

圖7為本發明LED發光裝置之輔助電極連接功能散熱板之示意圖。 Fig. 7 is a schematic view showing the auxiliary electrode connection function heat dissipation plate of the LED light-emitting device of the present invention.

請參閱圖1,其為本發明的一實施例,需先說明的是,本實施例對應圖式所提及之相關數量與形狀,僅用以具體地說明本發明的實施方式,以便於了解其內容,而非用以侷限本發明的權利範圍。 Please refer to FIG. 1 , which is an embodiment of the present invention. It should be noted that the related numbers and shapes mentioned in the embodiments are only used to specifically describe the embodiments of the present invention, so as to facilitate understanding. The content is not intended to limit the scope of the invention.

如圖2和圖3,本實施例為一種LED發光裝置100,包括一承載座10、數個LED晶片20、數個電子元件30、一阻隔牆40、及一封裝體50。其中,上述LED晶片20與電子元件30皆裝設於承載座10上,阻隔牆40設於承載座10上且區隔LED晶片20與電子元件30,而封裝體50填設於阻隔牆40與承載座10所包圍的空間內,以將LED晶片20與電子元件30埋置於其內。 As shown in FIG. 2 and FIG. 3 , the LED lighting device 100 includes a carrier 10 , a plurality of LED chips 20 , a plurality of electronic components 30 , a barrier wall 40 , and a package 50 . The LED chip 20 and the electronic component 30 are all mounted on the carrier 10. The barrier wall 40 is disposed on the carrier 10 and partitions the LED chip 20 and the electronic component 30, and the package 50 is filled in the barrier wall 40. The space surrounded by the carrier 10 is used to embed the LED chip 20 and the electronic component 30 therein.

以下將以LED發光裝置100的承載座10構造作為說明之主軸,並於說明承載座10構造的過程中,適時介紹地LED發光裝置100的其他元件間。 Hereinafter, the carrier 10 of the LED lighting device 100 will be described as a main axis of the description, and during the description of the configuration of the carrier 10, other components of the LED lighting device 100 will be described as appropriate.

所述承載座10具有一基板1、一電路層2、兩LED測試墊3、兩輔助測試墊4、兩電極5、兩輔助電極6、及兩連接墊7。其中,所述基板1大致呈方形(如:長方形或正方形)且具有位於相反側的 一正面11與一背面12,上述電路層2、LED測試墊3、電極5、及連接墊7的厚度大致相同且皆位於基板1的正面11,而上述輔助測試墊4與輔助電極的厚度亦大致相同且皆位於基板1的背面12。 The carrier 10 has a substrate 1, a circuit layer 2, two LED test pads 3, two auxiliary test pads 4, two electrodes 5, two auxiliary electrodes 6, and two connection pads 7. Wherein, the substrate 1 is substantially square (eg, rectangular or square) and has an opposite side a front surface 11 and a back surface 12, the circuit layer 2, the LED test pad 3, the electrode 5, and the connection pad 7 are substantially the same thickness and are located on the front surface 11 of the substrate 1, and the thickness of the auxiliary test pad 4 and the auxiliary electrode are also They are substantially identical and are located on the back side 12 of the substrate 1.

所述電路層2包含有一LED固晶區21與一電子元件固晶區22,且LED固晶區21與電子元件固晶區22彼此電性連接。其中,電子元件固晶區22能區分為兩個區塊,並且電子元件固晶區22的兩個區塊位於LED固晶區21的相反兩側。進一步地說,電子元件固晶區22的兩個區塊分別大致位於基板1對角線上的兩角落處(如圖2中的基板1左側角落與右側角落)。 The circuit layer 2 includes an LED solid crystal region 21 and an electronic component solid crystal region 22, and the LED solid crystal region 21 and the electronic component solid crystal region 22 are electrically connected to each other. Wherein, the electronic component solid crystal region 22 can be divided into two blocks, and the two blocks of the electronic component solid crystal region 22 are located on opposite sides of the LED solid crystal region 21. Further, the two blocks of the electronic component solid crystal region 22 are respectively located at two corners on the diagonal of the substrate 1 (such as the left corner and the right corner of the substrate 1 in FIG. 2).

再者,所述LED晶片20裝設於LED固晶區21,藉以電性連接於上述電路層2。而所述電子元件30分為兩組,並且該兩組電子元件30分別裝設於電子元件固晶區22的兩個區塊,藉以電性連接於電路層2。其中,上述LED晶片20與電子元件30裝設於電路層2的方式可以是覆晶(flip chip)、迴焊(reflow)、超音波(ultrasonic)、表面貼裝技術(SMT)、或打線(wire bonding)等方式,在此不加以限制。 Furthermore, the LED chip 20 is mounted on the LED solid crystal region 21 to be electrically connected to the circuit layer 2 . The electronic components 30 are divided into two groups, and the two sets of electronic components 30 are respectively disposed in two blocks of the electronic component solid crystal region 22, thereby being electrically connected to the circuit layer 2. The manner in which the LED chip 20 and the electronic component 30 are mounted on the circuit layer 2 may be a flip chip, a reflow, an ultrasonic, a surface mount technology (SMT), or a wire bonding ( Wire bonding) and the like are not limited herein.

其中,所述電子元件30於本實施例中是以包含有兩組的LED驅動元件301、整流元件302(如:橋式整流器)、及功率元件303為例,但於實際應用時,電子元件30所包含的元件種類與數量可依設計者需求而加以調整,並不侷限於此。舉例來說,在一未繪示的實施例中,所述電子元件30亦可以同時包含有線性元件與非線性元件。 The electronic component 30 is exemplified in the embodiment by two sets of LED driving components 301, rectifying components 302 (eg, bridge rectifiers), and power components 303, but in practical applications, electronic components The types and quantities of components included in 30 can be adjusted according to the needs of the designer, and are not limited thereto. For example, in an unillustrated embodiment, the electronic component 30 can also include both linear components and nonlinear components.

此外,所述LED晶片20可以為兩種不同發光形態的LED晶片20,並且上述兩種不同發光形態的LED晶片20分別電性連接於所述兩組的LED驅動元件301、整流元件302、及功率元件303。再者,所述LED晶片20的態樣可以是裸晶(die)構造或是已封裝(packaged)之構造,在本實施例中不加以限制。 In addition, the LED chip 20 can be an LED chip 20 of two different illumination modes, and the LED chips 20 of the two different illumination modes are electrically connected to the two sets of the LED driving component 301, the rectifying component 302, and Power component 303. Moreover, the aspect of the LED chip 20 may be a die structure or a packaged structure, which is not limited in this embodiment.

藉此,所述兩組的LED驅動元件301、整流元件302、及功率元件303能分別用以驅動上述兩種不同發光形態的LED晶片20,藉以調整上述兩種不同發光形態的LED晶片20的發光比例,進而達到混光的效果。 Thereby, the two sets of the LED driving component 301, the rectifying component 302, and the power component 303 can respectively be used to drive the LED chips 20 of the two different illumination modes, thereby adjusting the LED wafers 20 of the two different illumination modes. The proportion of light is emitted to achieve the effect of light mixing.

所述兩LED測試墊3與電路層2的LED固晶區21為一體延伸之構造,亦即,兩LED測試墊3電性連接於LED固晶區21,並使所述兩LED測試墊3能供檢測設備200所提供的一檢測電流I僅流通LED固晶區21(如圖4),進而單獨地檢測LED固晶區21上的LED晶片20。 The two LED test pads 3 and the LED solid crystal region 21 of the circuit layer 2 are integrally extended, that is, the two LED test pads 3 are electrically connected to the LED solid crystal region 21, and the two LED test pads 3 are A detection current I that can be supplied by the detecting device 200 flows only through the LED solid crystal region 21 (see FIG. 4), thereby separately detecting the LED wafer 20 on the LED solid crystal region 21.

所述兩輔助測試墊4分別電性連接於兩LED測試墊3,進一步地說,兩輔助測試墊4設於基板1的位置大致位在兩LED測試墊3的相反側,藉以在相對應的LED測試墊3與輔助測試墊4之間形成貫穿基板1正面11與背面12之貫孔(未標示),並在所述貫孔內充填導電材料(未標示),以使輔助測試墊4能透過貫孔內的導電材料而與其所對應之LED測試墊3達成電性連接。藉此,所述兩輔助測試墊4亦能供檢測設備200所提供的檢測電流I僅流通LED固晶區21,進而單獨地檢測LED固晶區21上的LED晶片20。 The two auxiliary test pads 4 are electrically connected to the two LED test pads 3 respectively. Further, the positions of the two auxiliary test pads 4 disposed on the substrate 1 are substantially on opposite sides of the two LED test pads 3, thereby correspondingly A through hole (not labeled) penetrating through the front surface 11 and the back surface 12 of the substrate 1 is formed between the LED test pad 3 and the auxiliary test pad 4, and a conductive material (not labeled) is filled in the through hole to enable the auxiliary test pad 4 to The conductive test material in the through hole is electrically connected to the LED test pad 3 corresponding thereto. Thereby, the two auxiliary test pads 4 can also supply the detection current I provided by the detecting device 200 to only the LED solid crystal region 21, thereby separately detecting the LED wafer 20 on the LED solid crystal region 21.

所述兩電極5分別電性連接於上述電子元件固晶區22的兩區塊,藉以令兩電極5能供檢測設備200所提供的另一檢測電流I’流通LED固晶區21與電子元件固晶區22(如圖5),藉以同時檢測上述LED固晶區21上的LED晶片20以及電子元件固晶區22上的電子元件30(如:LED驅動元件301、整流元件302、及功率元件303)。 The two electrodes 5 are respectively electrically connected to the two blocks of the electronic component solid crystal region 22, so that the two electrodes 5 can be used for the other detection current I' provided by the detecting device 200 to circulate the LED solid crystal region 21 and the electronic component. The die bonding region 22 (as shown in FIG. 5), thereby simultaneously detecting the LED chip 20 on the LED solid crystal region 21 and the electronic component 30 on the electronic component solid crystal region 22 (eg, the LED driving component 301, the rectifying component 302, and the power) Element 303).

再者,所述承載座10的兩電極5能用以電性連接於一外部驅動電源300(如:市電插座),使外部驅動電源300所提供之電力(如:交流電力)經由電路層2及電子元件30(如:LED驅動元件301、整流元件302、及功率元件303),而令電路層2上的LED晶 片20發光而能被運用。 Furthermore, the two electrodes 5 of the carrier 10 can be electrically connected to an external driving power source 300 (such as a commercial power socket), so that the power (such as AC power) provided by the external driving power source 300 is transmitted through the circuit layer 2 And the electronic component 30 (such as the LED driving component 301, the rectifying component 302, and the power component 303), and the LED crystal on the circuit layer 2 The film 20 is illuminated and can be used.

所述兩連接墊7分別電性連接於兩輔助電極6,進一步地說,兩連接墊7設於基板1的位置大致位在兩輔助電極6的相反側,藉以在相對應的連接墊7與輔助電極6之間形成貫穿基板1正面11與背面12之貫孔(未標示),並在所述貫孔內充填導電材料(未標示),以使連接墊7能透過貫孔內的導電材料而與其所對應之輔助電極6達成電性連接。 The two connection pads 7 are electrically connected to the two auxiliary electrodes 6, respectively. Further, the two connection pads 7 are disposed on the opposite side of the two auxiliary electrodes 6 at the position of the substrate 1, so that the corresponding connection pads 7 are A through hole (not labeled) penetrating through the front surface 11 and the back surface 12 of the substrate 1 is formed between the auxiliary electrodes 6, and a conductive material (not labeled) is filled in the through hole so that the connection pad 7 can penetrate the conductive material in the through hole. The auxiliary electrode 6 corresponding thereto is electrically connected.

再者,所述兩連接墊7分別鄰近於兩電極5,且每一連接墊7與其所相鄰之電極5呈間隔設置,藉以使兩電極5能分別經由打線而選擇性地連接於上述兩連接墊7,進而透過兩連接墊7而分別電性連接於兩輔助電極6。也就是說,在需要使用輔助電極6時,才須經由打線連接相鄰之電極5與連接墊7。 Furthermore, the two connection pads 7 are respectively adjacent to the two electrodes 5, and each connection pad 7 is spaced apart from the adjacent electrode 5, so that the two electrodes 5 can be selectively connected to the above two via wire bonding, respectively. The connection pads 7 are further electrically connected to the two auxiliary electrodes 6 through the two connection pads 7 respectively. That is to say, when it is necessary to use the auxiliary electrode 6, the adjacent electrode 5 and the connection pad 7 have to be connected via a wire.

藉此,當相鄰之電極5與連接墊7經由打線而彼此連接之後,所述兩輔助電極6亦能供檢測設備200所提供的另一檢測電流I’流通LED固晶區21與電子元件固晶區22(圖未示),進而同時檢測所述LED固晶區21上的LED晶片20與電子元件固晶區22上的電子元件30(如:LED驅動元件301、整流元件302、及功率元件303)。 Thereby, after the adjacent electrodes 5 and the connection pads 7 are connected to each other via the wire bonding, the two auxiliary electrodes 6 can also supply another detection current I′ provided by the detecting device 200 to the LED solid crystal region 21 and the electronic components. a die bonding region 22 (not shown), thereby simultaneously detecting the LED chip 20 on the LED solid crystal region 21 and the electronic component 30 on the electronic component die bonding region 22 (eg, the LED driving component 301, the rectifying component 302, and Power component 303).

再者,承載座10的兩輔助電極6亦能用以電性連接於外部驅動電源300(如:市電插座),使外部驅動電源300所提供之電力(如:交流電力)經由連接墊7、電極5、電路層2、及電子元件30(如:LED驅動元件301、整流元件302、及功率元件303),進而令LED晶片20發光而能被運用。 Furthermore, the two auxiliary electrodes 6 of the carrier 10 can also be electrically connected to the external driving power source 300 (eg, a commercial power socket), so that the power provided by the external driving power source 300 (eg, AC power) is connected to the connection pad 7, The electrode 5, the circuit layer 2, and the electronic component 30 (for example, the LED driving element 301, the rectifying element 302, and the power element 303) further enable the LED chip 20 to emit light and can be used.

另,所述所述LED發光裝置100亦能透過兩輔助電極6而電性連接於其他裝置,進而具有更多元的運用方式。舉例來說,請參閱圖7並請適時參酌圖2和圖3所示,本實施例的LED發光裝置100可固定一功能散熱板400上並透過兩輔助電極6電性連接於功能散熱板400。 In addition, the LED light-emitting device 100 can also be electrically connected to other devices through the two auxiliary electrodes 6, thereby having more modes of operation. For example, please refer to FIG. 7 and please refer to FIG. 2 and FIG. 3 as appropriate. The LED lighting device 100 of the present embodiment can be fixed to a functional heat dissipation plate 400 and electrically connected to the functional heat dissipation plate 400 through the two auxiliary electrodes 6. .

其中,上述功能散熱板400具有調光或其他可運用LED發光裝置100之LED晶片20的功能,藉以使LED發光裝置100能依據不同之需求而被彈性地運用。另,所述LED發光裝置100與其相搭配裝置(如:功能散熱板400)之間的安裝方式,其可以是直接焊接固定或者其他如螺鎖、卡扣、黏接等方式實施,在此不加以限制。 The functional heat sink 400 has the function of dimming or other LED chips 20 that can use the LED lighting device 100, so that the LED lighting device 100 can be flexibly utilized according to different needs. In addition, the mounting manner between the LED lighting device 100 and its matching device (such as the functional heat dissipation plate 400) may be directly soldered or fixed, such as screw locking, snapping, bonding, etc., Limit it.

須說明的是,由於承載座10安裝LED晶片20之後,LED晶片20將與電子元件30位於同一平面(如:基板1的正面11),因此,所述LED晶片20與電子元件30之間的干擾問題須慎重地被考慮。有鑒於此,本實施例在承載座10的基板1正面11上形成有阻隔牆40,藉以隔離LED晶片20與電子元件30,進而降低兩者之間的熱干擾與電磁干擾。 It should be noted that, after the LED chip 20 is mounted on the carrier 10, the LED chip 20 will be in the same plane as the electronic component 30 (eg, the front surface 11 of the substrate 1), and therefore, between the LED chip 20 and the electronic component 30. Interference problems must be carefully considered. In view of this, in the present embodiment, a barrier wall 40 is formed on the front surface 11 of the substrate 1 of the carrier 10 to isolate the LED chip 20 from the electronic component 30, thereby reducing thermal interference and electromagnetic interference between the two.

附帶說明一點,本實施例承載座10的基板1較佳為採用陶瓷基板而非金屬板,其原因在於:使用金屬板並不利於將電路層2、LED測試墊3、輔助測試墊4、電極5、輔助電極6、及連接墊7形成在金屬板的表面。但於實際應用時,基板1的材質並不侷限於此。 Incidentally, the substrate 1 of the carrier 10 of the present embodiment preferably uses a ceramic substrate instead of a metal plate because the use of the metal plate is not advantageous for the circuit layer 2, the LED test pad 3, the auxiliary test pad 4, and the electrode. 5. The auxiliary electrode 6 and the connection pad 7 are formed on the surface of the metal plate. However, the material of the substrate 1 is not limited to this in practical applications.

[本發明實施例的可能功效] [Possible effects of embodiments of the present invention]

綜上所述,本發明實施例所提供的LED發光裝置,其承載座透過形成有LED測試墊,以供檢測電流流通LED固晶區,進而單獨地檢測LED固晶區上的LED晶片。也就是說,在LED晶片與電子元件安裝上電路層之後,能更清楚地分辨缺失是由LED晶片或是電子元件所造成。再者,所述LED發光裝置的承載座透過形成有輔助測試墊,藉以使檢測設備能經由承載座的背面單獨地檢測LED晶片。 In summary, the LED lighting device provided by the embodiment of the present invention has an LED test pad formed through the carrier for detecting current to flow through the LED solid crystal region, thereby separately detecting the LED chip on the LED solid crystal region. That is to say, after the circuit layer is mounted on the LED chip and the electronic component, it can be more clearly distinguished that the defect is caused by the LED chip or the electronic component. Furthermore, the carrier of the LED lighting device is formed with an auxiliary test pad, so that the detecting device can individually detect the LED chip via the back surface of the carrier.

另,所述LED發光裝置的承載座透過形成有連接墊與輔助電極,藉以令設計者能視需求而選擇性地透過打線連接電極其相鄰 之連接墊,進而能達到電極與相對應之輔助電極彼此電性連接之效果。 In addition, the carrier of the LED lighting device is formed with a connection pad and an auxiliary electrode, so that the designer can selectively connect the electrode adjacent to the wire by the wire as needed. The connection pad can further achieve the effect of electrically connecting the electrode and the corresponding auxiliary electrode to each other.

以上所述僅為本發明之較佳可行實施例,其並非用以侷限本發明之專利範圍,凡依本發明申請專利範圍所做之均等變化與修飾,皆應屬本發明之涵蓋範圍。 The above are only the preferred embodiments of the present invention, and are not intended to limit the scope of the invention, and the equivalent variations and modifications of the scope of the invention are intended to be within the scope of the invention.

10‧‧‧承載座 10‧‧‧Hosting

1‧‧‧基板 1‧‧‧Substrate

11‧‧‧正面 11‧‧‧ positive

12‧‧‧背面 12‧‧‧ Back

2‧‧‧電路層 2‧‧‧ circuit layer

21‧‧‧LED固晶區 21‧‧‧LED solid crystal area

22‧‧‧電子元件固晶區 22‧‧‧Electrical component solid crystal region

3‧‧‧LED測試墊 3‧‧‧LED test pad

5‧‧‧電極 5‧‧‧Electrode

7‧‧‧連接墊 7‧‧‧Connecting mat

20‧‧‧LED晶片 20‧‧‧LED chip

30‧‧‧電子元件 30‧‧‧Electronic components

301‧‧‧LED驅動元件 301‧‧‧LED drive components

302‧‧‧整流元件 302‧‧‧Rectifying components

303‧‧‧功率元件 303‧‧‧Power components

200‧‧‧檢測設備 200‧‧‧Testing equipment

I‧‧‧檢測電流 I‧‧‧Detection current

Claims (10)

一種LED發光裝置,包括:一基板;一電路層,其設於該基板,該電路層包含有一LED固晶區與一電子元件固晶區,且該LED固晶區與該電子元件固晶區彼此電性連接;一LED晶片,其裝設於該LED固晶區,以電性連接於該電路層;一LED驅動元件,其裝設於該電子元件固晶區,以電性連接於該電路層;兩LED測試墊,其電性連接於該LED固晶區,且該兩LED測試墊能供一檢測電流僅流通該LED固晶區,以單獨地檢測該LED固晶區上的LED晶片;以及兩電極,其電性連接於該電子元件固晶區,且該兩電極能供另一檢測電流流通該LED固晶區與該電子元件固晶區,以同時檢測該LED固晶區上的LED晶片與該電子元件固晶區上的LED驅動元件,並且該兩電極能用以電性連接於一外部驅動電源,使該外部驅動電源所提供之電力經由該電路層與該LED驅動元件而令該LED晶片發光。 An LED light-emitting device comprises: a substrate; a circuit layer disposed on the substrate, the circuit layer comprising an LED solid crystal region and an electronic component solid crystal region, and the LED solid crystal region and the electronic component solid crystal region Electrically connected to each other; an LED chip is mounted on the LED solid crystal region to be electrically connected to the circuit layer; an LED driving component is mounted on the electronic component solid crystal region to be electrically connected to the LED device a circuit layer; two LED test pads electrically connected to the LED solid crystal region, and the two LED test pads can supply a detection current only to circulate the LED solid crystal region to separately detect the LED on the LED solid crystal region a chip; and two electrodes electrically connected to the die bonding region of the electronic component, and the two electrodes can supply another detecting current to flow the LED solid crystal region and the electronic component solid crystal region to simultaneously detect the LED solid crystal region The LED chip and the LED driving component on the solid crystal region of the electronic component, and the two electrodes can be electrically connected to an external driving power source, so that the power provided by the external driving power source is driven by the LED layer and the LED The component causes the LED chip to emit light. 如請求項1所述之LED發光裝置,其中,該基板具有一正面與一背面,並且該電路層、該兩LED測試墊、及該兩電極皆位於該基板的正面,該電路層的LED固晶區與該兩LED測試墊為一體延伸之構造。 The LED lighting device of claim 1, wherein the substrate has a front surface and a back surface, and the circuit layer, the two LED test pads, and the two electrodes are located on a front surface of the substrate, and the LED of the circuit layer is solid. The crystal region and the two LED test pads are integrally extended. 如請求項1所述之LED發光裝置,其中,該電子元件固晶區能區分為兩個區塊,並且該電子元件固晶區的兩個區塊位於該LED固晶區的相反兩側。 The LED lighting device of claim 1, wherein the electronic component solid crystal region can be divided into two blocks, and two blocks of the electronic component solid crystal region are located on opposite sides of the LED solid crystal region. 如請求項3所述之LED發光裝置,其中,該基板大致呈方形,並且該電子元件固晶區的兩個區塊分別大致位於該基板對角線 上的兩角落處。 The LED lighting device of claim 3, wherein the substrate is substantially square, and the two blocks of the electronic component solid crystal region are respectively located substantially at the diagonal of the substrate On the two corners. 如請求項2至4中任一請求項所述之LED發光裝置,其進一步包括有兩輔助測試墊,該兩輔助測試墊位於該基板的背面且分別電性連接於該兩LED測試墊。 The LED lighting device of any one of claims 2 to 4, further comprising two auxiliary test pads, the two auxiliary test pads being located on the back of the substrate and electrically connected to the two LED test pads, respectively. 如請求項2至4中任一請求項所述之LED發光裝置,其進一步包括有兩連接墊與兩輔助電極,該兩連接墊位於該基板的正面,該兩輔助電極位於該基板的背面且分別電性連接於該兩連接墊,該兩連接墊分別與該兩電極呈間隔設置,並且該兩電極能經由與該兩連接墊連接而分別電性連接於該兩輔助電極。 The LED lighting device of any of claims 2 to 4, further comprising two connection pads and two auxiliary electrodes, the two connection pads being located on the front side of the substrate, the two auxiliary electrodes being located on the back side of the substrate The two connection pads are respectively electrically connected to the two electrodes, and the two electrodes are respectively electrically connected to the two auxiliary electrodes by being connected to the two connection pads. 一種LED發光裝置的承載座,包括:一基板;一電路層,其設於該基板,該電路層包含有一LED固晶區與一電子元件固晶區,且該LED固晶區與該電子元件固晶區彼此電性連接;其中,該LED固晶區用以供一LED晶片安裝於其上並且彼此電性連接;兩LED測試墊,其電性連接於該LED固晶區,且該兩LED測試墊能供一檢測電流僅流通該LED固晶區,以單獨地檢測該LED固晶區所用以承載的該LED晶片;以及兩電極,其電性連接於該電子元件固晶區,且該兩電極能供另一檢測電流流通該LED固晶區與該電子元件固晶區。 A carrier for an LED lighting device comprises: a substrate; a circuit layer disposed on the substrate, the circuit layer comprising an LED solid crystal region and an electronic component solid crystal region, and the LED solid crystal region and the electronic component The solid crystal regions are electrically connected to each other; wherein the LED solid crystal region is used for mounting an LED chip thereon and electrically connected to each other; and two LED test pads electrically connected to the LED solid crystal region, and the two The LED test pad can supply a detection current only to flow through the LED solid crystal region to separately detect the LED chip used for carrying the LED solid crystal region; and two electrodes electrically connected to the electronic component solid crystal region, and The two electrodes are capable of supplying another detection current to the LED solid crystal region and the electronic component die bonding region. 如請求項7所述之LED發光裝置的承載座,其中,該基板具有一正面與一背面,並且該電路層、該兩LED測試墊、及該兩電極皆位於該基板的正面,該電路層的LED固晶區與該兩LED測試墊為一體延伸之構造。 The carrier of the LED lighting device of claim 7, wherein the substrate has a front surface and a back surface, and the circuit layer, the two LED test pads, and the two electrodes are located on a front surface of the substrate, the circuit layer The LED solid crystal region is integrally formed with the two LED test pads. 如請求項8所述之LED發光裝置的承載座,其進一步包括有兩輔助測試墊,該兩輔助測試墊位於該基板的背面且分別電性連接於該兩LED測試墊。 The carrier of the LED lighting device of claim 8, further comprising two auxiliary test pads, the two auxiliary test pads being located on the back of the substrate and electrically connected to the two LED test pads respectively. 如請求項8所述之LED發光裝置的承載座,其進一步包括有 兩連接墊與兩輔助電極,該兩連接墊位於該基板的正面,該兩輔助電極位於該基板的背面且分別電性連接於該兩連接墊,該兩連接墊分別與該兩電極呈間隔設置,並且該兩電極能經由與該兩連接墊連接而分別電性連接於該兩輔助電極。 The carrier of the LED lighting device of claim 8, further comprising Two connection pads and two auxiliary electrodes are disposed on the front surface of the substrate, and the two auxiliary electrodes are located on the back surface of the substrate and electrically connected to the two connection pads respectively, and the two connection pads are respectively spaced apart from the two electrodes And the two electrodes can be electrically connected to the two auxiliary electrodes respectively by being connected to the two connection pads.
TW103104033A 2014-02-07 2014-02-07 Led lighting device and carrier thereof TWI526699B (en)

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