TWI518467B - Photoresist stripper composition, electronic device and method of fabricating the same - Google Patents
Photoresist stripper composition, electronic device and method of fabricating the same Download PDFInfo
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Description
本發明是有關於一種光阻脫除劑,且特別是有關於一種含有二級或三級醇胺、含有極性溶劑更含有醇醚類化合物的光阻脫除劑。 BACKGROUND OF THE INVENTION 1. Field of the Invention This invention relates to a photoresist removal agent, and more particularly to a photoresist removal agent containing a secondary or tertiary alcohol amine, a polar solvent, and an alcohol ether compound.
一般來說,半導體積體電路的製程基本上是透過以下步驟進行:在基板上形成材料層;將光阻塗布在該材料層上;選擇性地對光阻進行曝光及顯影,以形成圖案;以光阻圖案作為遮罩,對該材料層進行蝕刻,進而將微電路圖案轉移至光阻下層;最後,使用光阻剝除劑,將不必要的光阻層移除。 Generally, the process of the semiconductor integrated circuit is basically performed by: forming a material layer on the substrate; coating the photoresist on the material layer; selectively exposing and developing the photoresist to form a pattern; The photoresist layer is used as a mask, and the material layer is etched to transfer the microcircuit pattern to the lower photoresist layer. Finally, the photoresist layer is removed using an photoresist stripper.
對光阻剝除劑來說,其高剝除能力和低腐蝕性是兩樣基本的要求。高剝除能力確保在沖洗之後沒有光阻材料殘留在基板上;而低腐蝕性則是避免光阻下層的金屬或介電材料受損。此外,光阻剝除劑還可能額外要求高溫穩定性、低揮發性、儲存穩定性、低毒性等特性。 For photoresist strippers, their high stripping capacity and low corrosivity are two basic requirements. The high stripping capability ensures that no photoresist material remains on the substrate after rinsing; while low corrosivity is to avoid damage to the underlying metal or dielectric material of the photoresist. In addition, the photoresist stripping agent may additionally require characteristics such as high temperature stability, low volatility, storage stability, and low toxicity.
本發明提供一種光阻脫除劑,可以在去除光阻的同時對光阻下 層材料的保持良好抗腐蝕效果。本發明另外提供使用此種光阻脫除劑移除基板上的光阻的電子元件的製造方法,以及由此製造方法製作的電子元件。 The invention provides a photoresist removing agent which can remove photoresist under the photoresist The layer material maintains good corrosion resistance. The present invention further provides a method of manufacturing an electronic component using such a photoresist remover to remove photoresist on a substrate, and an electronic component produced by the manufacturing method.
本發明的光阻脫除劑包括由式1表示的醇醚類化合物、選自由式2表示的化合物、式3表示的化合物及其混合物所組成的族群的極性溶劑以及由式4表示的至少一種二級醇胺或至少一種三級醇胺:
在本發明的一種實施方式中,在光阻脫除劑中水的含量小於10重量%。 In one embodiment of the invention, the amount of water in the photoresist remover is less than 10% by weight.
在本發明的一種實施方式中,光阻脫除劑包括三級醇胺、醇醚 類化合物和極性溶劑,且在光阻脫除劑中水的含量小於10重量%。 In one embodiment of the invention, the photoresist remover comprises a tertiary alcohol amine, an alcohol ether The compound and the polar solvent, and the water content in the photoresist remover is less than 10% by weight.
在本發明的一種實施方式中,以光阻脫除劑的總量計,二級醇胺或三級醇胺佔1重量%~20重量%,醇醚類化合物佔25重量%~50重量%,極性溶劑佔30重量%~70重量%。 In one embodiment of the present invention, the secondary alcohol amine or the tertiary alcohol amine accounts for 1% by weight to 20% by weight, and the alcohol ether compound accounts for 25% by weight to 50% by weight based on the total amount of the photoresist removing agent. The polar solvent accounts for 30% by weight to 70% by weight.
在本發明的一種實施方式中,極性溶劑為碳酸丙烯酯、丙二醇或其混合物。 In one embodiment of the invention, the polar solvent is propylene carbonate, propylene glycol or a mixture thereof.
在本發明的一種實施方式中,二級醇胺為N-甲基乙醇胺(N-methyl ethanolamine,NMEA)、N-乙基乙醇胺(N-ethylethanolamine)或其混合物。 In one embodiment of the invention, the secondary alcohol amine is N-methyl ethanolamine (NMEA), N-ethylethanolamine or a mixture thereof.
在本發明的一種實施方式中,三級醇胺為三乙醇胺(triethanolamine,TEA)、二甲基乙醇胺(dimethylethanolamine,DMEA)、1-(2-羥乙基)哌嗪(1-(2-hydroxyethyl)piperazine)或其混合物。 In one embodiment of the invention, the tertiary alcohol amine is triethanolamine (TEA), dimethylethanolamine (DMEA), 1-(2-hydroxyethyl)piperazine (1-(2-hydroxyethyl) ) piperazine) or a mixture thereof.
在本發明的一種實施方式中,醇醚類化合物為二乙二醇丁醚(diethylene glycol monobutyl ether,BDG)、二丙二醇甲醚(dipropylene glycol methyl ether,DPM)或其混合物。 In one embodiment of the invention, the alcohol ether compound is diethylene glycol monobutyl ether (BDG), dipropylene glycol methyl ether (DPM) or a mixture thereof.
本發明的電子元件的製造方法包括使用前述光阻脫除劑移除形成在基板上的光阻,其中該基板上形成有包括鋁、銅、鉬或含銦氧化物的結構。 The method of manufacturing an electronic component of the present invention comprises removing a photoresist formed on a substrate using the above-described photoresist removing agent, wherein a structure including aluminum, copper, molybdenum or an indium-containing oxide is formed on the substrate.
本發明的電子元件由前述的電子元件的製造方法製成。 The electronic component of the present invention is produced by the aforementioned method of manufacturing an electronic component.
基於上述,本發明提出一種光阻剝除劑,其透過二級醇胺或三級醇胺、醇醚類化合物以及二醇化合物或內酯化合物的交互作用,從而達到具有優良的光阻移除能力,且有效抑制材料腐蝕現象的效果。 Based on the above, the present invention proposes a photoresist stripping agent which penetrates a secondary alcohol amine or a tertiary alcohol amine, an alcohol ether compound, and a diol compound or a lactone compound to achieve excellent photoresist removal. Ability, and effectively inhibit the effect of corrosion of materials.
為讓本發明的上述特徵和優點能更明顯易懂,下文特舉實施例作詳細說明如下。 The above described features and advantages of the present invention will be more apparent from the following description.
在本文中,由「一數值至另一數值」表示的範圍,是一種避免在說明書中一一列舉該範圍中的所有數值的概要性表示方式。因此,某一特定數值範圍的記載,涵蓋該數值範圍內的任意數值以及由該數值範圍內的任意數值界定出的較小數值範圍,如同在說明書中明文寫出該任意數值和該較小數值範圍一樣。例如,「含量在20~80重量%」的範圍,無論說明書中是否列舉其他數值,均涵蓋「含量在30~50重量%」的範圍。 In the present specification, the range represented by "a value to another value" is a schematic representation that avoids enumerating all the values in the range in the specification. Therefore, the recitation of a particular range of values is intended to include any value in the range of values and the range of values defined by any value in the range of values, as in the specification. The scope is the same. For example, in the range of "20 to 80% by weight", the range of "30 to 50% by weight" is covered regardless of whether other values are listed in the specification.
本發明的第一實施方式提出一種光阻脫除劑,其含有醇醚類化合物、極性溶劑和二級醇胺或三級醇胺。在使用第一實施方式的光阻脫除劑移除光阻時,醇胺會和光阻材料起反應,反應後的光阻材料則透過極性溶劑和醇醚類化合物的共同作用來移除。以下將分別詳述這三種成分。 A first embodiment of the present invention proposes a photoresist removing agent containing an alcohol ether compound, a polar solvent, and a secondary alcohol amine or a tertiary alcohol amine. When the photoresist is removed using the photoresist removal agent of the first embodiment, the alcohol amine reacts with the photoresist material, and the reacted photoresist material is removed by the interaction of the polar solvent and the alcohol ether compound. These three components will be detailed separately below.
本實施方式中,醇醚類化合物由式1表示:
舉例來說,醇醚類化合物可以是乙二醇單甲醚、乙二醇單乙醚、乙二醇單異丙醚、乙二醇單丁醚、二乙二醇單甲醚、二乙二醇單乙醚、二乙二醇單異丙醚、二乙二醇單丁醚、三乙二醇單甲醚、三乙二醇單乙醚、三乙二醇單異丙醚、三乙二醇單丁醚、丙二醇單甲醚、二丙二醇單甲醚、三丙二醇單甲醚或前述化合物的任意混合產物,但不限於此。 For example, the alcohol ether compound may be ethylene glycol monomethyl ether, ethylene glycol monoethyl ether, ethylene glycol monoisopropyl ether, ethylene glycol monobutyl ether, diethylene glycol monomethyl ether, diethylene glycol. Monoethyl ether, diethylene glycol monoisopropyl ether, diethylene glycol monobutyl ether, triethylene glycol monomethyl ether, triethylene glycol monoethyl ether, triethylene glycol monoisopropyl ether, triethylene glycol monobutyl Ether, propylene glycol monomethyl ether, dipropylene glycol monomethyl ether, tripropylene glycol monomethyl ether or any combination of the foregoing compounds, but is not limited thereto.
在本發明的具體實施例中,醇醚類化合物為二乙二醇丁醚(diethylene glycol monobutyl ether,BDG)或二丙二醇甲醚(dipropylene glycol methyl ether,DPM)。 In a specific embodiment of the invention, the alcohol ether compound is diethylene glycol monobutyl ether (BDG) or dipropylene glycol methyl ether (DPM).
本實施方式中,極性溶劑是由式2表示的化合物、式3表示的化合物和其混合物組成的族群中選出的:
在鹼性環境下,式2表示的化合物可以還原為式3表示的化合物。就此觀點而言,X1和X2可以是相同的基團。 The compound represented by Formula 2 can be reduced to the compound represented by Formula 3 under an alkaline environment. In this regard, X 1 and X 2 may be the same group.
舉例來說,式3表示的化合物可以是丙二醇(propylene glycol,PG),其可視為碳酸丙烯酯和醇胺反應的產物,相應地,式2表示的化合物的具體例可以是碳酸丙烯酯(Propylene carbonate,PC)。 For example, the compound represented by Formula 3 may be propylene glycol (PG), which may be regarded as a product of a reaction of propylene carbonate and an alcohol amine. Accordingly, a specific example of the compound represented by Formula 2 may be propylene carbonate (Propylene). Carbonate, PC).
至於二級醇胺或三級醇胺,則可以由式4表示:
舉例來說,二級醇胺可以是N-甲基乙醇胺(N-methylethanol amine)、N-乙基乙醇胺、二乙醇胺或前述化合物的任意混合產物;而三級醇胺可以是三乙醇胺(triethanolamine,TEA)、二甲基乙醇胺(dimethylethanolamine,DMEA)、二乙基乙醇胺、甲基二乙醇胺、N-甲基二乙醇胺或1-(2-羥乙基)哌嗪(1-(2-hydroxyethyl)piperazine)或前述化合物的任意混合產物,但不限於此。 For example, the secondary alcohol amine may be N-methylethanol amine, N-ethylethanolamine, diethanolamine or any combination of the foregoing compounds; and the tertiary alcohol amine may be triethanolamine (triethanolamine, TEA), dimethylethanolamine (DMEA), diethylethanolamine, methyldiethanolamine, N-methyldiethanolamine or 1-(2-hydroxyethyl)piperazine (1-(2-hydroxyethyl)piperazine Or any mixture of the foregoing compounds, but is not limited thereto.
在本發明的具體實施例中,二級醇胺是N-甲基乙醇胺;三級醇胺是三乙醇胺、二甲基乙醇胺或1-(2-羥乙基)哌嗪。 In a particular embodiment of the invention, the secondary alcohol amine is N-methylethanolamine; the tertiary alcohol amine is triethanolamine, dimethylethanolamine or 1-(2-hydroxyethyl)piperazine.
發明人發現,在式2或式3表示的化合物和二級或三級醇胺混合使用時,能提供良好的光阻脫除效果,且在移除光阻時,對鋁、銅、鉬或含銦氧化物的腐蝕程度非常低。以下〈實驗〉部分將進一步證明之。 The inventors have found that when a compound represented by Formula 2 or Formula 3 is used in combination with a secondary or tertiary alcoholamine, it provides a good photoresist removal effect, and when removing the photoresist, aluminum, copper, molybdenum or The degree of corrosion of indium containing oxides is very low. The following <Experiment> section will further prove it.
在本發明的一實施例中,以光阻脫除劑的總量計,二級醇胺或三級醇胺佔其1重量%~20重量%,又以4重量%~10重量%為最佳。醇醚類化合物佔25重量%~55重量%,又以35重量%~50重量%為最佳。極性溶劑佔30重量%~70重量%,又以40重量%~55重量%為最佳。 In an embodiment of the invention, the secondary alcohol amine or the tertiary alcohol amine accounts for 1% by weight to 20% by weight, and 4% by weight to 10% by weight, based on the total amount of the photoresist removing agent. good. The alcohol ether compound accounts for 25% by weight to 55% by weight, and more preferably 35% by weight to 50% by weight. The polar solvent accounts for 30% by weight to 70% by weight, and preferably 40% by weight to 55% by weight.
此外,雖然第一實施方式的光阻脫除劑對材料的腐蝕程度很小,但本發明並不因此排除腐蝕抑制劑的適用。舉例來說,仍然可以在光阻脫除劑中加入諸如唑類、有機酚類或糖醇類化合物的腐蝕抑制劑。 Further, although the photoresist removal agent of the first embodiment has a small degree of corrosion of the material, the present invention does not thereby exclude the application of the corrosion inhibitor. For example, corrosion inhibitors such as azoles, organic phenols or sugar alcohol compounds can still be added to the photoresist remover.
另有一點值得注意的是,第一實施方式的光阻脫除劑可以僅含有少量的水,例如低於15重量%,低於10重量%,低於7重量%,甚或低於5重量%。或者,此光阻脫除劑也可以是一種不含水的非水系光阻脫除劑。發明人發現,水的少量添加有助於光阻的脫除,但隨水量增加,將致使醇胺活化而提升對金屬的腐蝕性;且與此同時,極性溶劑的比例相對下降以致於光阻的脫除能力變得較差。 It is also worth noting that the photoresist removal agent of the first embodiment may contain only a small amount of water, such as less than 15% by weight, less than 10% by weight, less than 7% by weight, or even less than 5% by weight. . Alternatively, the photoresist remover may be a non-aqueous, non-aqueous photoresist remover. The inventors have found that a small addition of water contributes to the removal of the photoresist, but as the amount of water increases, the alcoholamine is activated to increase the corrosiveness to the metal; and at the same time, the proportion of the polar solvent is relatively reduced so that the photoresist The ability to remove becomes poor.
本發明的第二實施方式提出一種電子元件的製造方法和通過該製造方法製造的電子元件。對此電子元件沒有特別限制,重點在於,在其製造過程中,於形成某一材料層之後,使用第一實施方式的光阻脫除劑來移除此材料層上層的殘餘光阻。其中,此方法特別適用於材料層含銅、鋁、鉬或透明導電氧化物(例如含銦氧化物)的情況。 A second embodiment of the present invention proposes a method of manufacturing an electronic component and an electronic component manufactured by the manufacturing method. The electronic component is not particularly limited, and an important point is that, in the manufacturing process, after forming a certain material layer, the photoresist removing agent of the first embodiment is used to remove the residual photoresist of the upper layer of the material layer. Among them, this method is particularly suitable for the case where the material layer contains copper, aluminum, molybdenum or a transparent conductive oxide such as indium oxide.
〈實驗〉 <experiment>
下文將參照實驗例,更具體地描述本發明。雖然描述了以下實驗,但是在不逾越本發明範疇的情況下,可適當地改變所用材料、其量及比率、處理細節以及處理流程等等。因此,不應根據下文所述的實驗對本發明作出限制性的解釋。 The present invention will be more specifically described below with reference to experimental examples. Although the following experiments are described, the materials used, the amounts and ratios thereof, the processing details, the processing flow, and the like can be appropriately changed without departing from the scope of the invention. Therefore, the invention should not be construed restrictively based on the experiments described below.
在實驗1~實驗5中,發明人配製了多種光阻脫除劑,並測試這些光阻脫除劑的光阻去除能力,和它們對不同材料的腐蝕速率,其結果分別彙整於表1至表5。其中,光阻去除能力的評估標準是:使用光阻脫除劑清洗基板以後,以掃描式電子顯微鏡觀察基板,在倍率4k下即觀察到明顯的光阻殘留判定為X;在倍率20k下才觀察到明顯殘留判定為△;在倍率20k下仍然觀察不到明顯殘留判定為○。至於材料的腐蝕速率之測定,則是在固定50℃下浸泡含金屬佈線(材料如Cu、Mo、Al或其合金)之玻璃基板20分鐘。觀察並量測待測液中溶解的金屬離子濃度,作為比較的依據。 In Experiments 1 to 5, the inventors prepared a variety of photoresist removers, and tested the photoresist removal capabilities of these photoresist removers, and their corrosion rates for different materials, the results are summarized in Table 1 to table 5. Among them, the evaluation criteria of the photoresist removal ability is: after cleaning the substrate with a photoresist remover, the substrate is observed by a scanning electron microscope, and a significant photoresist residue is observed as X at a magnification of 4 k; at a magnification of 20 k It was observed that the apparent residue was judged as Δ; at the magnification of 20 k, no significant residue was observed to be judged as ○. As for the measurement of the corrosion rate of the material, the glass substrate containing the metal wiring (material such as Cu, Mo, Al or alloy thereof) was immersed at a fixed temperature of 20 ° C for 20 minutes. Observe and measure the concentration of dissolved metal ions in the test solution as a basis for comparison.
此外,表格中所使用的縮寫全稱詳列如下。 In addition, the full abbreviations used in the table are detailed below.
實驗1(實驗例1-1~1-4和比較例1-1~1-2) Experiment 1 (Experimental Examples 1-1 to 1-4 and Comparative Examples 1-1 to 1-2)
實驗1基本上是改變光阻脫除劑中的極性溶劑成分所得的實驗結果。從表1可以看出,以碳酸丙烯酯作為極性溶劑的實驗例1-1、1-2,其光阻去除能力和抑制材料(尤其是Cu和IGZO中的Zn)的腐蝕現象的效果,均優於以NMF或NMP作為極性溶劑的比較例1-1、1-2。 Experiment 1 is basically an experimental result obtained by changing the polar solvent component in the photoresist remover. It can be seen from Table 1 that the experimental examples 1-1 and 1-2 using propylene carbonate as a polar solvent have the effects of photoresist removal ability and corrosion of materials (especially Zn in Cu and IGZO). It is superior to Comparative Examples 1-1 and 1-2 using NMF or NMP as a polar solvent.
此外,實驗例1-3、1-4也是以碳酸丙烯酯作為極性溶劑,不過在光阻脫除劑中更加入了腐蝕抑制劑。因此,其抑制腐蝕現象的效果更好了。不過,比較實驗例1-1、1-2和實驗例1-3、1-4可以發現,即使不添加腐蝕抑制劑,光阻脫除劑仍然可以達到幾乎相同的抑制腐蝕的效果。這證實了碳酸丙烯酯、醇醚類化合物和三級醇胺搭配使用的優越效果。 Further, Experimental Examples 1-3 and 1-4 also used propylene carbonate as a polar solvent, but a corrosion inhibitor was further added to the photoresist remover. Therefore, its effect of suppressing corrosion is better. However, comparing Experimental Examples 1-1, 1-2 and Experimental Examples 1-3, 1-4, it was found that the photoresist removal agent can achieve almost the same corrosion inhibiting effect even without the addition of a corrosion inhibitor. This confirmed the superior effect of the combination of propylene carbonate, alcohol ether compounds and tertiary alcohol amines.
實驗2(實驗例2-1~2-2和比較例2-1) Experiment 2 (Experimental Examples 2-1 to 2-2 and Comparative Example 2-1)
實驗2是改變光阻脫除劑中的醇胺成分所得的實驗結果。從表2可以看出,即使同樣使用碳酸丙烯酯作為極性溶劑,在醇胺的使用為非三級醇胺時,對銅金屬佈線會有較高的腐蝕情況,而使用三級醇胺的情況下則實質上對銅佈線的腐蝕就較輕微。 Experiment 2 is an experimental result obtained by changing the alcohol amine component in the photoresist remover. It can be seen from Table 2 that even if propylene carbonate is also used as the polar solvent, when the use of the alcoholamine is a non-tertiary alcohol amine, there is a high corrosion condition to the copper metal wiring, and the use of the tertiary alcohol amine is used. Underneath, the corrosion of the copper wiring is substantially slight.
實驗3(實驗例3-1和比較例3-1) Experiment 3 (Experimental Example 3-1 and Comparative Example 3-1)
實驗3是針對含有二級醇胺的光阻脫除劑的實驗結果。由於二級醇胺對銅的反應性本就較三級醇胺強,因此,銅在此實驗中的腐蝕速率均比使用三級醇胺的前幾個實驗來得高。儘管如此,從表3仍可以看出,以丙二醇作為極性溶劑時(實驗例3-1),光阻脫除劑抑制腐蝕現象的效果仍然優於以NMF作為極性溶劑的比較例3-1。這說明丙二醇也屬於適當的極性溶劑選擇。 Experiment 3 is an experimental result for a photoresist remover containing a secondary alcohol amine. Since the reactivity of the secondary alcohol amine to copper is stronger than that of the tertiary alcohol amine, the corrosion rate of copper in this experiment is higher than that of the previous experiments using the tertiary alcohol amine. Nevertheless, it can be seen from Table 3 that when propylene glycol is used as the polar solvent (Experimental Example 3-1), the effect of the photoresist removing agent on suppressing the corrosion phenomenon is still superior to Comparative Example 3-1 using NMF as the polar solvent. This indicates that propylene glycol is also a suitable polar solvent choice.
實驗4(實驗例4-1~4-2和比較例4-1~4-4) Experiment 4 (Experimental Examples 4-1 to 4-2 and Comparative Examples 4-1 to 4-4)
實驗4以碳酸丙烯酯或丙二醇作為極性溶劑,測試在光阻脫除劑中添加不同含量的水的實驗結果。從表4可以看出,在水的含量只有7重量%時,無論極性溶劑是碳酸丙烯酯(實驗例4-1)或丙二醇(實驗例4-2),各種材料的腐蝕速率均保持在較低的範圍之內,而一旦水的添加量高於15重量%,銅的腐蝕速率立刻遽增,IGZO的腐蝕速率也同時大為提高,且與此同時,極性溶劑的比例相對下降以致於光阻的脫除能力變得較差。 Experiment 4 was conducted using propylene carbonate or propylene glycol as a polar solvent to test the experimental results of adding different amounts of water to the photoresist remover. As can be seen from Table 4, when the water content is only 7% by weight, the corrosion rate of each material is kept constant regardless of whether the polar solvent is propylene carbonate (Experimental Example 4-1) or propylene glycol (Experimental Example 4-2). Within the low range, once the amount of water added is higher than 15% by weight, the corrosion rate of copper increases immediately, and the etching rate of IGZO is also greatly increased, and at the same time, the proportion of polar solvent is relatively decreased so that light The ability to remove the barrier becomes poor.
綜上所述,本發明提出一種光阻剝除劑,其透過二級醇胺或三級醇胺、醇醚類化合物以及內酯類化合物或二醇類化合物的交互作用,從而達到具有優良的光阻移除能力,且有效抑制材料腐蝕現象的效果。這種光阻剝除劑可以無須再加入腐蝕抑制劑,因此有利於使用後的光阻剝除劑的再回收。 In summary, the present invention provides a photoresist stripping agent which is excellent in the interaction of a secondary alcohol amine or a tertiary alcohol amine, an alcohol ether compound, and a lactone compound or a glycol compound. The photoresist removal ability is effective and the effect of corrosion of the material is effectively suppressed. The photoresist stripping agent can eliminate the need to add a corrosion inhibitor, thereby facilitating the recycling of the photoresist stripper after use.
雖然已以實施例對本發明作說明如上,然而,其並非用以限定本發明。任何所屬技術領域中具有通常知識者,在不脫離本發明的精神和範圍的前提內,當可作些許的更動與潤飾。故本申請案的保護範圍當以後附的申請專利範圍所界定者為準。 Although the present invention has been described above by way of examples, it is not intended to limit the invention. Any changes and modifications may be made without departing from the spirit and scope of the invention. Therefore, the scope of protection of this application is subject to the definition of the scope of the patent application attached.
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