TWI503684B - Device and method for checking printed circuitry - Google Patents
Device and method for checking printed circuitry Download PDFInfo
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Description
本發明係關於印刷電路板(printed circuit board),特別係關於設計階段檢查線路是否走入破銅(void)區之方法與裝置。The present invention relates to printed circuit boards, and more particularly to methods and apparatus for inspecting whether a line has entered a void area during the design phase.
電子設計自動化(electronic design automation,簡稱EDA)目前多著重於檢查生產上的問題與錯誤的電路設計,雖亦能輔助偵測走線層(conductor layer)和板層(plane layer)間訊號與電壓的干擾,實務上卻是在板層上的銅箔區域內對所有的線路(net)分別做破銅檢查後交由人工逐一目視比對。此等作法曠日廢時,易流於百密一疏,具體而言其缺點在於沒有針對性,須檢查所有線路,且對跨銅箔的破銅現象束手無策。Electronic design automation (EDA) is currently focused on checking production problems and erroneous circuit designs, while also assisting in detecting signal and voltage between the conductor layer and the plane layer. The interference is actually done by making a copper-breaking inspection of all the lines (net) in the copper foil area on the board layer and then hand-by-hand visual comparison. When these methods are used in the past, they are easy to flow in a hundred meters. In particular, the disadvantage is that they are not targeted. All lines must be inspected, and there is no way to break the copper phenomenon across the copper foil.
鑒於上述問題,本發明旨在提供一種印刷電路檢查方法及一種印刷電路檢查裝置,可自動檢查線路的破銅狀況。In view of the above problems, the present invention is directed to a printed circuit inspection method and a printed circuit inspection device capable of automatically checking a copper break condition of a line.
本發明提供一種印刷電路檢查方法,步驟包含: 取得一份電路布局(layout),其記錄有第一層和第二層,第一層又記錄有多條線路,線路皆有代碼,每一條線路在座標系上對應多個座標的第一集合,第二層在座標系上亦對應多個座標的第二集合;接收一個關鍵字串;以及對每一條線路,當線路的代碼包含前述關鍵字串時,比較該第二集合和該線路對應的該第一集合。The invention provides a printed circuit inspection method, the steps comprising: Obtaining a circuit layout (recording) having a first layer and a second layer, the first layer recording a plurality of lines, each line having a code, and each line corresponding to the first set of the plurality of coordinates on the coordinate system The second layer also corresponds to the second set of the plurality of coordinates on the coordinate system; receiving a key string; and for each line, when the code of the line includes the foregoing keyword string, comparing the second set to the line corresponding to the line The first collection of.
本發明亦提供一種印刷電路檢查裝置,包含布局 模組、輸入模組和檢查模組。布局模組用以提供一份電路布局,其記錄有第一層和第二層,第一層又記錄有多條線路,線路皆有代碼,每一條線路在座標系上對應多個座標的第一集合,第二層在座標系上亦對應多個座標的第二集合。輸入模組用以接收一關鍵字串。檢查模組耦接布局模組和輸入模組,用以比較第二集合和線路其中之一對應的第一集合;此線路的代碼包含該關鍵字串。The invention also provides a printed circuit inspection device, including a layout Modules, input modules and inspection modules. The layout module is used to provide a circuit layout, which records the first layer and the second layer. The first layer records a plurality of lines, the lines have codes, and each line corresponds to a plurality of coordinates on the coordinate system. A set, the second layer also corresponding to the second set of coordinates on the coordinate system. The input module is configured to receive a keyword string. The inspection module is coupled to the layout module and the input module for comparing the first set corresponding to one of the second set and the line; the code of the line includes the keyword string.
綜上所述,本發明之印刷電路檢查方法與裝置操 作於一份電路布局,電路布局中第一層記錄有線路表(netlist),第二層則關聯於線路需遵循的某些規則。比較中選線路和第二層的座標集合(或由像素〔pixel〕組成的影像),其相異處即為破銅所在。由於線路係依據某關鍵字串中選,本發明的檢查具有針對性,符合電路設計人員的需求。In summary, the printed circuit inspection method and device operation of the present invention For a circuit layout, the first layer of the circuit layout records the netlist, and the second layer is associated with certain rules that the line must follow. Comparing the selected line and the second layer of coordinates (or an image composed of pixels), the difference is the copper break. Since the line is selected according to a certain keyword string, the inspection of the present invention is targeted and meets the needs of the circuit designer.
以上之關於本發明內容之說明及以下之實施方式之說明係用以示範與解釋本發明之精神與原理,並且提供 本發明之專利申請範圍更進一步之解釋。The above description of the present invention and the following description of the embodiments are intended to illustrate and explain the spirit and principles of the invention The scope of the patent application of the present invention is further explained.
10‧‧‧布局模組10‧‧‧Layout module
12‧‧‧影像處理模組12‧‧‧Image Processing Module
14‧‧‧輸入模組14‧‧‧Input module
16‧‧‧檢查模組16‧‧‧Check module
3‧‧‧座標系3‧‧‧ coordinate system
第1圖係依據本發明一實施例印刷電路檢查裝置的高階方塊圖。BRIEF DESCRIPTION OF THE DRAWINGS Figure 1 is a high level block diagram of a printed circuit inspection apparatus in accordance with an embodiment of the present invention.
第2圖係依據本發明一實施例印刷電路檢查方法的流程圖。Fig. 2 is a flow chart showing a method of inspecting a printed circuit in accordance with an embodiment of the present invention.
第3圖係一線路對應的多個座標的第一集合的示意圖。Figure 3 is a schematic illustration of a first set of coordinates corresponding to a line.
第4A圖係一板層對應的多個座標的第二集合的示意圖。Figure 4A is a schematic illustration of a second set of a plurality of coordinates corresponding to a ply.
第4B圖係一板層對應的多個座標的第三集合的示意圖。Figure 4B is a schematic diagram of a third set of a plurality of coordinates corresponding to a ply.
第4C圖係一線路對應的第一集合中一板層對應的第三集合的相對補集的示意圖。Figure 4C is a schematic diagram of the relative complement of the third set corresponding to a layer in the first set corresponding to a line.
第5A圖係一禁置貫孔區的多個座標的第二集合的示意圖。Figure 5A is a schematic illustration of a second set of coordinates of a forbidden via region.
第5B圖係一線路對應的第一集合中一禁置貫孔區對應的第二集合的相對補集的示意圖。Figure 5B is a schematic diagram of the relative complement of the second set corresponding to a forbidden through-hole region in the first set corresponding to a line.
以下在實施方式中詳細敘述本發明之詳細特徵以及優點,其內容足以使任何熟習相關技藝者了解本發明之技術內容並據以實施,且依據本說明書所揭露之內容、申請專利範圍及圖式,任何熟習相關技藝者可輕易地理解本發明相關之目的及優點。以下之實施例係進一步詳細說明本發明之觀點,但非以任何觀點限制本發明之範疇。The detailed features and advantages of the present invention are set forth in the Detailed Description of the Detailed Description of the invention. The objects and advantages associated with the present invention can be readily understood by those skilled in the art. The following examples are intended to describe the present invention in further detail, but are not intended to limit the scope of the invention.
請參見第1圖。第1圖係依據本發明一實施例印 刷電路檢查裝置的高階方塊圖。如第1圖所示,印刷電路檢查裝置包含布局模組10、影像處理模組12、輸入模組14和檢查模組16。布局模組10、影像處理模組12和檢查模組16三者相互耦接,檢查模組16另耦接輸入模組14。See Figure 1. Figure 1 is printed in accordance with an embodiment of the present invention A high-order block diagram of the brush circuit inspection device. As shown in FIG. 1, the printed circuit inspection apparatus includes a layout module 10, an image processing module 12, an input module 14, and an inspection module 16. The layout module 10, the image processing module 12, and the inspection module 16 are coupled to each other, and the inspection module 16 is coupled to the input module 14.
請配合第1圖參見第2圖。第2圖係依據本發明 一實施例印刷電路檢查方法的流程圖。如第2圖所示,於步驟S201中,布局模組10提供一份電路布局,其可為電子設計自動化中的一或多個檔案。電路布局記錄著第一層和第二層,其中第一層可以是走線層,走線層包含由多條線路構成的一張線路表。在本實施例中,第二層代表板層,可以是接地板層(ground plane)或電源板層(power plane)。一般而言,在走線層上有線路的位置需在板層中有對應導電銅箔加以保護,然而走線層和板層實為獨立個體,電路設計過程中兩者可能產生歧異,也就是所謂破銅的一種情形。Please refer to Figure 2 in conjunction with Figure 1. Figure 2 is in accordance with the present invention A flow chart of an embodiment of a printed circuit inspection method. As shown in FIG. 2, in step S201, the layout module 10 provides a circuit layout, which may be one or more files in the electronic design automation. The circuit layout records the first layer and the second layer, wherein the first layer may be a trace layer, and the trace layer includes a line list composed of a plurality of lines. In this embodiment, the second layer represents a slab layer, which may be a ground plane or a power plane. Generally speaking, the position of the line on the trace layer needs to be protected by the corresponding conductive copper foil in the layer, but the trace layer and the layer are independent individuals, and the circuit design process may be different, that is, A situation called copper breaking.
如前所述,電路布局中有一套隱含的有限的座標 系,第一層和第二層皆與之對應。具體而言,走線層上每條線路都對應走線層影像中的一個狹長區域(線路具有寬度),此區域的像素對應座標系上多個座標的第一集合,如第3圖所示。在第3圖中,一條線路對應座標系3上可標記為(2,c)、(2,d)、(3,c)以迄(6,d)等的座標構成的斜線區域。同理,板層(的影像)也會對應座標系上多個座標的第二集合。這裡所稱板層影像指的是正片(positive),也就是以肉眼觀察板層時其實 際的樣貌。於步驟S203中,影像處理模組12取得座標系中與第二集合互補的第三集合,也就是板層上沒有任何銅箔或元件的區域所對應的多個座標。換句話說,步驟S203相當於影像處理模組12取得板層影像的負片(negative)。舉例而言,第4A圖中斜線區域所示的板層影像正片和第4B圖中斜線區域所示的板層影像負片在有限的座標系3中係絕對互補(absolute complement)關係。As mentioned earlier, there is a set of implicit finite coordinates in the circuit layout. The first layer and the second layer correspond to each other. Specifically, each line on the trace layer corresponds to a narrow area (the line has a width) in the image of the trace layer, and the pixels of the area correspond to the first set of coordinates on the coordinate system, as shown in FIG. . In Fig. 3, a line corresponds to a slashed area on the coordinate system 3 which can be marked as (2, c), (2, d), (3, c) with coordinates up to (6, d). Similarly, the layer (image) also corresponds to the second set of coordinates on the coordinate system. The layer image referred to here refers to the positive (positive), that is, when the layer is observed with the naked eye. The appearance of the situation. In step S203, the image processing module 12 obtains a third set of coordinates in the coordinate system that is complementary to the second set, that is, a plurality of coordinates corresponding to the area of the layer that does not have any copper foil or components. In other words, step S203 corresponds to the negative processing of the slice layer image by the image processing module 12. For example, the ply image positive film shown in the shaded area in FIG. 4A and the ply image negative film shown in the oblique line area in FIG. 4B are in an absolute complement relationship in the limited coordinate system 3.
於步驟S205中,輸入模組接收一個關鍵字串。 線路表中每條線路皆有其代碼或命名;當命名符合特定規則時,如時脈(clock)訊號線皆以「CLK_」開頭,使用者輸入「CLK」為關鍵字串即可搜尋出所有的時脈訊號線。在一實施例中,關鍵字串係由使用者輸入。在另一實施例中,本發明的印刷電路檢查裝置預設有一或多個關鍵字串。In step S205, the input module receives a keyword string. Each line in the line table has its code or name; when the naming conforms to a specific rule, for example, the clock signal line starts with "CLK_", and the user inputs "CLK" as a keyword string to search for all the lines. Clock signal line. In an embodiment, the keyword string is entered by the user. In another embodiment, the printed circuit inspection apparatus of the present invention presets one or more key strings.
於步驟S207中,檢查模組16比較符合關鍵字串 的一條線路對應的第一集合和板層對應的第二集合。具體而言,檢查模組16取得第一集合中第三集合的相對補集(relative complement),也就是計算第一集合減去第三集合的差。以影像處理而言,檢查模組16對此條線路的影像(如第3圖)以板層影像的負片(如第4B圖)進行邏輯非(NOT)運算,得到如第4C圖中的斜線區域。於步驟S209中,檢查模組16判斷線路的影像是否有改變,如線路的面積是否減少,亦即比較第一集合和前述相對補集。當判斷第一集合不等於前述相 對補集時,如第4C圖的斜線區域相較第3圖者少了座標為(4,c)和(4,d)的兩塊破銅,則檢查模組16於步驟S211中記錄線路上的至少一個錯誤點,如前述相對補集中缺少的座標,並回到步驟S207繼續檢查其他符合關鍵字串的線路。錯誤點的記錄係供後續處理,如在一實施例中,布局模組10可顯示鄰近錯誤點的部分的電路布局,或在另一實施例中,檢查模組16可自動修改與錯誤點有關的部分的電路布局。於步驟S209中,當判斷第一集合等於前述相對補集時,檢查模組16回到步驟S207繼續檢查其他符合關鍵字串的線路。In step S207, the checking module 16 compares the matching keyword string. The first set corresponding to one line and the second set corresponding to the board layer. Specifically, the checking module 16 obtains a relative complement of the third set in the first set, that is, calculates a difference between the first set minus the third set. In terms of image processing, the inspection module 16 performs a logical non-NO operation on the image of the line (such as FIG. 3) as a negative of the layer image (eg, FIG. 4B) to obtain a slash as shown in FIG. 4C. region. In step S209, the checking module 16 determines whether there is a change in the image of the line, such as whether the area of the line is reduced, that is, comparing the first set and the aforementioned relative complement. When judging that the first set is not equal to the aforementioned phase For the complement, if the diagonal line area of FIG. 4C is less than the two pieces of copper broken with coordinates (4, c) and (4, d), the inspection module 16 records the line in step S211. At least one error point on the above, such as the missing coordinates in the foregoing relative set, and returning to step S207 to continue checking other lines that match the keyword string. The recording of the error points is for subsequent processing. For example, in an embodiment, the layout module 10 can display the circuit layout of the portion adjacent to the error point, or in another embodiment, the inspection module 16 can automatically modify the error point. The part of the circuit layout. In step S209, when it is determined that the first set is equal to the aforementioned relative complement, the checking module 16 returns to step S207 to continue checking other lines that match the key string.
在另一實施例中,第二層係至少一個禁置貫孔區 (via keepout),規定著走線層上露銅(因此不能有線路,有線路為破銅的另一種情形)但不能放置貫孔(via)的區域,如第5A圖的斜線區域所示。由於禁置貫孔區照定義已是空乏無物,不需影像處理模組12取得其負片即可與符合關鍵字串的線路對應的第一集合比較。檢查模組16取得第一集合中禁置貫孔區對應的第二集合的相對補集,或對某條線路的影像(如第3圖)以第二層的影像(如第5A圖)進行NOT運算,可得到如第5B圖中的斜線區域,其相較於第3圖者缺少的座標為(3,c)和(4,c)的兩塊即為破銅發生處。In another embodiment, the second layer is at least one prohibited through hole region (via keepout), which specifies the area where copper is exposed on the trace layer (so there is no line, and the line is broken for copper), but the area of the via cannot be placed, as shown by the shaded area in Figure 5A. Since the definition of the forbidden through-hole area is already empty, the image processing module 12 does not need to obtain its negative film to compare with the first set corresponding to the line of the keyword string. The checking module 16 obtains the relative complement of the second set corresponding to the forbidden through-hole area in the first set, or performs the image of the second layer (such as FIG. 3) with the image of the second layer (as shown in FIG. 5A). The NOT operation can obtain a slashed area as shown in Fig. 5B, which is the place where the copper break occurs when the two coordinates of the coordinates (3, c) and (4, c) which are missing from the third figure.
綜上所述,本發明之印刷電路檢查方法與裝置可 自動檢查電路布局中特定線路的破銅狀況,特別是線路跨越板層銅箔或碰觸到禁置貫孔區的情形,避免了以人工地毯式 搜索和修正的不效率。In summary, the printed circuit inspection method and device of the present invention can be Automatically check the copper-breaking condition of a particular line in the circuit layout, especially when the line crosses the copper foil of the board or touches the forbidden through-hole area, avoiding the artificial carpet type Inefficiency in search and correction.
雖然本發明以前述之實施例揭露如上,然其並非用以限定本發明。在不脫離本發明之精神和範圍內,所為之更動與潤飾,均屬本發明之專利保護範圍。關於本發明所界定之保護範圍請參考所附之申請專利範圍。Although the present invention has been disclosed above in the foregoing embodiments, it is not intended to limit the invention. It is within the scope of the invention to be modified and modified without departing from the spirit and scope of the invention. Please refer to the attached patent application for the scope of protection defined by the present invention.
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US4578810A (en) * | 1983-08-08 | 1986-03-25 | Itek Corporation | System for printed circuit board defect detection |
TW201301072A (en) * | 2011-06-27 | 2013-01-01 | Hon Hai Prec Ind Co Ltd | System and method for checking layout of printed circuit board |
CN103021899A (en) * | 2012-12-21 | 2013-04-03 | 日月光半导体(昆山)有限公司 | Semiconductor product detection machine and detection method thereof |
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US4578810A (en) * | 1983-08-08 | 1986-03-25 | Itek Corporation | System for printed circuit board defect detection |
TW201301072A (en) * | 2011-06-27 | 2013-01-01 | Hon Hai Prec Ind Co Ltd | System and method for checking layout of printed circuit board |
CN103021899A (en) * | 2012-12-21 | 2013-04-03 | 日月光半导体(昆山)有限公司 | Semiconductor product detection machine and detection method thereof |
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