CN105335583B - Layout checks system and method - Google Patents
Layout checks system and method Download PDFInfo
- Publication number
- CN105335583B CN105335583B CN201510861988.5A CN201510861988A CN105335583B CN 105335583 B CN105335583 B CN 105335583B CN 201510861988 A CN201510861988 A CN 201510861988A CN 105335583 B CN105335583 B CN 105335583B
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- CN
- China
- Prior art keywords
- layout
- characteristic electron
- numerical value
- specific component
- shelves
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F30/00—Computer-aided design [CAD]
- G06F30/30—Circuit design
- G06F30/39—Circuit design at the physical level
- G06F30/392—Floor-planning or layout, e.g. partitioning or placement
Abstract
The invention discloses a kind of layouts to check system and method, wherein layout inspection system includes memory unit and processing unit.Memory unit is to store layout shelves.Processing unit electric property coupling memory unit and to execute following steps.By choosing a plurality of characteristic electron character strings in a plurality of part names.Part name corresponds to a plurality of parts in the layout shelves.Characteristic electron character string is converted into a plurality of characteristic electron numerical value.By characteristic electron numerical value to determine an at least specific component compared with reference value.List an at least specific component.Layout provided by the invention checks that system and method can accurately and efficiently list the part of specific electronic characteristics numerical value and its affiliated route in circuit design, so as to shorten the design time of circuit layout and the possibility of the artificial careless mistake of reduction.
Description
Technical field
The present invention relates to a kind of topology, in particular to a kind of layout checks system and method.
Background technique
In printed circuit board (Printed Circuit Board, PCB) circuit design, zero ohms are placed sometimes
(Ohm) resistance is in route, to retain the subsequent position for being replaced as other electronic components.
However, uniline may be in circuit design archives across many different pages, layout engineer must be with people
Work mode checks the Zero-ohm resistor placed in route.Not only the easy quality that leads to the problem of because of artificial careless mistake is bad, and lacks
Weary efficiency.
Summary of the invention
For the defects in the prior art, technical problem to be solved by the invention is to provide a kind of layout inspection system and
Its method promotes the efficiency for checking cloth intra-office specific component.
A technical solution of the invention provides a kind of layout inspection method, comprises the steps of, by a plurality of component names
A plurality of characteristic electron character strings are chosen in title.A plurality of parts in the corresponding layout shelves of part name.By characteristic electron character
String is converted to a plurality of characteristic electron numerical value.By characteristic electron numerical value to determine an at least specific component compared with reference value.Column
An at least specific component out.
In an embodiment of the disclosure of invention, at least characteristic electron numerical value etc. of a wherein at least specific component
In reference value.
In an embodiment of the disclosure of invention, by selecting part in layout shelves.
In an embodiment of the disclosure of invention, wherein the step of listing an at least specific component includes: list to
Line name, part name and the material number of a few specific component each.
In an embodiment of the disclosure of invention, wherein characteristic electron numerical value is resistance value.
Another technical solution of this disclosure is to provide a kind of layout inspection system, and it includes memory unit and processing are single
Member.Memory unit is to store layout shelves.Processing unit electric property coupling memory unit and to execute following steps.By plural number
A plurality of characteristic electron character strings are chosen in a part name.Part name corresponds to a plurality of parts in the layout shelves.It will be electric
Sub-feature character string is converted to a plurality of characteristic electron numerical value.Characteristic electron numerical value is determined that at least one is special compared with reference value
Determine part.List an at least specific component.
In an embodiment of the disclosure of invention, an at least characteristic electron numerical value for an at least specific component is equal to
The reference value.
In an embodiment of the disclosure of invention, the processing unit is also to execute: being somebody's turn to do by selecting in the layout shelves
A little parts.
In an embodiment of the disclosure of invention, wherein the step of listing an at least specific component includes:
List at least a line name of specific component each, a part name and a material number.
In an embodiment of the disclosure of invention, wherein those characteristic electron numerical value are resistance value.
In conclusion the disclosure of invention can accurately and efficiently list specific electronic characteristics numerical value in circuit design
Part and its affiliated route.In this way, can not only shorten the design time of circuit layout, can also reduce artificial careless mistake can
Energy.
Above-mentioned explanation will be explained in detail with embodiment below, and the technical solution of this disclosure is provided
It is further to explain.
Detailed description of the invention
In order to allow above and other purpose, feature, advantage and embodiment of the invention to be clearer and more comprehensible, appended diagram is said
It is bright as follows:
Fig. 1 to illustrate the invention one embodiment of disclosure layout check system schematic；And
The layout inspection method flow chart of Fig. 2 one embodiment of disclosure to illustrate the invention.
100: layout inspection system
110: processing unit
120: memory unit
200: layout inspection method
S202~S208: step
Specific embodiment
In order to keep the narration of this disclosure more detailed with it is complete, can refer to attached drawing and various implementations as described below
Example.But provided embodiment is not intended to limit the invention covered range；The description of step is also non-to hold to limit it
Capable sequence, it is any by reconfiguring, it is produced that there is equal and other effects device, it is all the range that the present invention is covered.
In embodiment and claim, unless be particularly limited in interior text for article, otherwise " one " with
"the" can refer to single or a plurality of.It will be further appreciated that "comprising" used herein, " comprising ", " having "
And similar vocabulary, indicate its documented feature, region, integer, step, operation, element and/or component, but be not excluded for its institute
It states or additional one or more other feature, region, integer, step, operation, element, component and/or group therein.
The error or range for being commonly index value about " about " used herein, " about " or " substantially about " are about
Within 20 percent, preferably it is within about 10, and is more preferably then about within percentage five.Wen Zhongruo is without clear
Illustrate, mentioned by numerical value all regard as approximation, i.e. error or model as represented by " about ", " about " or " substantially about "
It encloses.
In addition, about " coupling " used herein and " connection ", can refer to two or multiple element mutually directly put into effect
Body contact or in electrical contact, body of mutually putting into effect indirectly contact or in electrical contact, or through wireless connection, and " coupling " also can refer to
Two or multiple element mutual operation or movement.
Please refer to Fig. 1 and Fig. 2.Fig. 1 to illustrate the invention one embodiment of disclosure layout check system 100 illustrate
Figure.200 flow chart of layout inspection method of Fig. 2 one embodiment of disclosure to illustrate the invention.Layout inspection method 200 has
Multiple step S202~S208 can be applied to layout as described in Figure 1 and check system 100.So it is familiar with those skilled in the art of the invention
It will be understood that mentioned step can adjust it according to actual needs in addition to especially chatting its bright sequence person in the above-described embodiments
Tandem, or even can simultaneously or partially be performed simultaneously.For example preceding announcement of specific implementation, is not repeated to describe herein.Layout
Inspection system 100 includes processing unit 110 and memory unit 120.Memory unit 120 is to store layout shelves.
110 electric property coupling memory unit 120 of processing unit, and to execute following steps.Step S202, processing unit
110 by choosing a plurality of characteristic electrons (such as resistance value, capacitance) character string in a plurality of part names.Above-mentioned part name
A plurality of parts (such as resistance, capacitor) corresponding to layout shelves.For example, part is resistance, and part name can be
" 1k_5%_2 " represents the information of part." 1k " indicates that resistance value is 1 kilohm (Ohm), and " 5% " indicates resistance value tolerance
It (Tolerance) is 5 percent, " 2 " indicate there are two part tools pin (Pin).In addition, in order to distinguish in same layout shelves
Different resistance, each resistance have corresponding part number, such as R4502, R1310 etc..
Specifically, processing unit 110 can be selected according to condition (such as part number contains " R ") above-mentioned part (such as
Resistance).Then, the part name of selected part is selected characteristic electron character string (such as 1k) by processing unit 110.Therefore,
Processing unit 110 can efficiently select the resistance value of all resistance in layout shelves.
In step S204, characteristic electron character string is converted to a plurality of characteristic electron numerical value by processing unit 110.It is specific and
Speech, due to the characteristic electron character string selected attribute be character string, processing unit 110 attribute can be converted to numerical value with into
The subsequent calculating process of row.For example, characteristic electron character string " 1k " can be converted to characteristic electron numerical value by processing unit 110
“1000”。
In step S206, processing unit 110 is by characteristic electron numerical value to determine an at least specific component compared with reference value.
For example, if user is intended to find out the resistance of all zero ohms in layout shelves, reference value can be set as zero.Processing unit 110
All characteristic electron numerical value of step S204 are determined to the resistance (that is, specific component) of all zero ohms compared with reference value.
In one embodiment, processing unit 110 subtracts each other characteristic electron numerical value with reference value, and checks and subtract each other whether result is equal to zero,
To determine whether characteristic electron numerical value is equal to reference value.Above-mentioned reference value, manner of comparison can be designed according to actual demand, this announcement
Content is not limited.
In step S208, processing unit 110 lists specific component.In one embodiment, processing unit 110 lists specific zero
Line name, part name and the material number of part each.For example, processing unit 110 is listed step S206 and is determined
Zero-ohm resistor, the line name belonging to it, part name, material number etc..In one embodiment, processing unit 110 arranges
Specific component (such as Zero-ohm resistor) quantity of each route out.
In implementation, processing unit 110 can be independent microprocessor (Microcontroller) or central processing unit
(Central Processing Unit, CPU).Memory unit 120 can be hard disk (Hard Disk), CD (Optical
) or flash memory (Flash Memory) Disc.
In conclusion this disclosure is able to accurately and efficiently list special in circuit design via above-described embodiment
Determine the part and its affiliated route of characteristic electron numerical value.In this way, can not only shorten the design time of circuit layout, can also drop
The possibility of low artificial careless mistake.
Although this disclosure is disclosed above with embodiment, however, it is not to limit the invention, any to be familiar with this
Those skilled in the art, in the spirit and scope for not departing from this disclosure, when can be used for a variety of modifications and variations, therefore guarantor of the invention
Range is protected subject to view claim institute defender.
Claims (2)
1. a kind of layout inspection method, which is characterized in that the layout inspection method includes:
By choosing a plurality of characteristic electron character strings in a plurality of part names, wherein in the corresponding layout shelves of the part name
A plurality of parts；
The characteristic electron character string is converted into a plurality of characteristic electron numerical value；
By the characteristic electron numerical value to determine an at least specific component compared with a reference value；And
List an at least specific component；
An at least characteristic electron numerical value for an at least specific component is equal to the reference value；
The layout inspection method also includes: by selecting the part in the layout shelves；
Described the step of listing an at least specific component, includes: listing a route name of described at least specific component each
Title, a part name and a material number；
The characteristic electron numerical value is resistance value.
2. a kind of layout inspection system, which is characterized in that the layout inspection system includes:
One memory unit, to store a layout shelves；And
One processing unit, memory unit described in electric property coupling and to execute following steps:
By choosing a plurality of characteristic electron character strings in a plurality of part names, wherein the part name corresponds to the layout shelves
Interior a plurality of parts；
The characteristic electron character string is converted into a plurality of characteristic electron numerical value；
By the characteristic electron numerical value to determine an at least specific component compared with a reference value；And
List an at least specific component；
An at least characteristic electron numerical value for an at least specific component is equal to the reference value；
The processing unit is also to execute: by selecting the part in the layout shelves；
Described the step of listing an at least specific component, includes: listing a route name of described at least specific component each
Title, a part name and a material number；
The characteristic electron numerical value is resistance value.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510861988.5A CN105335583B (en) | 2015-11-30 | 2015-11-30 | Layout checks system and method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510861988.5A CN105335583B (en) | 2015-11-30 | 2015-11-30 | Layout checks system and method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN105335583A CN105335583A (en) | 2016-02-17 |
| CN105335583B true CN105335583B (en) | 2019-04-19 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201510861988.5A Active CN105335583B (en) | 2015-11-30 | 2015-11-30 | Layout checks system and method |
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| CN (1) | CN105335583B (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107729584A (en) * | 2016-08-11 | 2018-02-23 | 英业达科技有限公司 | Signal line check device and method |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1658198A (en) * | 2004-02-16 | 2005-08-24 | 华硕电脑股份有限公司 | Computer system for checking circuit arrangement |
| CN101201863A (en) * | 2006-12-15 | 2008-06-18 | 英业达股份有限公司 | Method for generating drilling table and storage medium capable of reading by computer |
| CN101751490A (en) * | 2008-12-15 | 2010-06-23 | 英业达股份有限公司 | Method for testing distribution of drill holes |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6769099B2 (en) * | 2002-04-12 | 2004-07-27 | Sun Microsystems, Inc. | Method to simplify and speed up design rule/electrical rule checks |
| JP2004171076A (en) * | 2002-11-18 | 2004-06-17 | Sanyo Electric Co Ltd | Layout design device, layout design method and layout design program for semiconductor integrated circuit |
| JP4823337B2 (en) * | 2009-06-30 | 2011-11-24 | 株式会社東芝 | Design support apparatus and design support method |
| TWI457781B (en) * | 2010-04-06 | 2014-10-21 | Himax Tech Ltd | Layout vs. schematic checking method |
| CN102298111A (en) * | 2010-06-23 | 2011-12-28 | 英业达股份有限公司 | Method for checking power circuit of circuit board |
| US9330215B2 (en) * | 2014-03-19 | 2016-05-03 | Taiwan Semiconductor Manufacturing Co., Ltd. | Method and system for verifying the design of an integrated circuit having multiple tiers |
| US9104835B2 (en) * | 2013-10-11 | 2015-08-11 | Taiwan Semiconductor Manufacturing Co., Ltd. | Systems and methods for determining effective capacitance to facilitate a timing analysis |
| TWI503684B (en) * | 2013-11-29 | 2015-10-11 | Inventec Corp | Device and method for checking printed circuitry |
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2015
- 2015-11-30 CN CN201510861988.5A patent/CN105335583B/en active Active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1658198A (en) * | 2004-02-16 | 2005-08-24 | 华硕电脑股份有限公司 | Computer system for checking circuit arrangement |
| CN101201863A (en) * | 2006-12-15 | 2008-06-18 | 英业达股份有限公司 | Method for generating drilling table and storage medium capable of reading by computer |
| CN101751490A (en) * | 2008-12-15 | 2010-06-23 | 英业达股份有限公司 | Method for testing distribution of drill holes |
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| Publication number | Publication date |
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| CN105335583A (en) | 2016-02-17 |
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